Transient electromagnetic signal acquisition method and system in strong interference environment

Abstract

The invention relates to the technical field of detection, in particular to a transient electromagnetic signal acquisition method and system in a strong interference environment. The method comprises the following steps: acquiring an interference object corresponding to a transient electromagnetic instrument at a measured position; taking minimization of interference factors generated by the interference object to the transient electromagnetic instrument as a target, taking the condition that the state of the interference object meets the safe operation condition of the interference object as a constraint, and adjusting the current state of the interference object to obtain a target state of the interference object; determining the maximum emission magnetic moment of the transient electromagnetic instrument when the transient electromagnetic instrument is measured at the measured position according to an interference factor generated on the transient electromagnetic instrument when the interference object runs in the target state; and controlling the transient electromagnetic instrument to operate at the maximum emission magnetic moment so as to acquire the transient electromagnetic signal at the measured position.

Description

Technical Field

[0001] The present application relates to the field of detection technology, and particularly to a method and system for collecting transient electromagnetic signals in a strong interference environment. Background Art

[0002] The Transient Electromagnetic Method (TEM) is an electromagnetic induction method. By transmitting a primary pulsed magnetic field underground and observing the secondary induced eddy current field in the underground medium using coils or grounding electrodes during the interval of the primary pulsed magnetic field, a method for detecting the resistivity of the medium is achieved. Its working principle is as follows: 1) Transmitting a primary pulsed magnetic field: A transmitting coil carrying a current of a certain waveform is set on the ground or in the air to generate a transient electromagnetic field. 2) Generation and decay of the induced current: When the transient electromagnetic field propagates and encounters different media, an induced current will be generated in the underground conductive rock ore body. After the power is cut off, the induced current decays with time due to heat loss. 2) Observing the secondary field: Using a receiving coil or grounding electrode to observe the secondary field (transient field) generated by the decay of the induced current, and analyzing the electrical properties of the underground medium by measuring the received induced electromotive force.

[0003] However, during the actual measurement process, the transient electromagnetic instrument may be interfered by various interference sources at the measured position, and these interferences will affect the accuracy and reliability of the measurement results. Traditional methods for collecting transient electromagnetic signals may not consider interference factors or may not be able to effectively handle the influence brought by a strong interference environment, resulting in large errors in the measurement results or abnormal measurement. Summary of the Invention

[0004] Based on this, in view of the above technical problems, it is necessary to provide a method and system for collecting transient electromagnetic signals in a strong interference environment that can improve the accuracy of collecting transient electromagnetic signals.

[0005] In a first aspect, the present application provides a method for collecting transient electromagnetic signals in a strong interference environment, the method comprising:

[0006] Obtaining the interference sources corresponding to the transient electromagnetic instrument at the measured position;

[0007] Taking the minimization of the interference factor generated by the interference source on the transient electromagnetic instrument as the objective, and taking the condition that the state of the interference source satisfies the safe operation condition of the interference source as the constraint, adjusting the current state of the interference source to obtain the target state of the interference source;

[0008] Determining the maximum emission magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interference source operating in the target state;

[0009] Control the transient electromagnetic instrument to operate with the maximum transmitting magnetic moment to collect the transient electromagnetic signals at the measured position.

[0010] In one embodiment, according to the interference factor generated by the interfering object when operating in the target state on the transient electromagnetic instrument, determining the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position includes:

[0011] According to the interference factor generated by the interfering object when operating in the target state on the transient electromagnetic instrument, determining the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position;

[0012] If the state of the transient electromagnetic instrument can affect the state of the interfering object, then according to the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position, and the upper limit value of the target magnetic moment that the interfering object can withstand when in the target state, determining the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position;

[0013] If the state of the transient electromagnetic instrument fails to affect the state of the interfering object, then determining the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position as the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position.

[0014] In one embodiment, according to the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position, and the upper limit value of the target magnetic moment that the interfering object can withstand when in the target state, determining the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position includes:

[0015] If, according to the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position, it is less than the upper limit value of the target magnetic moment that the interfering object can withstand when in the target state, then taking the upper limit value of the transmitable magnetic moment as the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position;

[0016] If, according to the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position, it is greater than or equal to the upper limit value of the target magnetic moment that the interfering object can withstand when in the target state, then taking the upper limit value of the target magnetic moment as the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position.

[0017] In one embodiment, according to the interference factor generated by the interfering object when operating in the target state on the transient electromagnetic instrument, determining the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position includes:

[0018] According to the interference factor generated by the interfering object when operating in the target state on the transient electromagnetic instrument, using the genetic algorithm to determine the upper limit value of the transmitable magnetic moment of the transient electromagnetic instrument when measuring at the measured position.

[0019] In one embodiment, determining the upper limit value of the magnetic moment that an interference object can withstand when in the target state includes:

[0020] For each interference object, determine the upper limit value of the magnetic moment that the interference object can withstand when in the target state according to the target state and historical fault records of the interference object;

[0021] Take the minimum value of the corresponding upper limit values of the magnetic moment among the interference objects as the target magnetic upper limit value that the interference object can withstand when in the target state.

[0022] In one embodiment, if the interference object is a power supply device, then determining the upper limit value of the magnetic moment that the interference object can withstand when in the target state according to the target state and historical fault records of the interference object includes:

[0023] Analyze the power supply stability index of the power supply device according to the target state and historical fault records of the interference object to obtain the upper limit value of the magnetic moment that the interference object can withstand.

[0024] In one embodiment, if the interference object is a communication device, then determining the upper limit value of the magnetic moment that the interference object can withstand according to the target state and historical fault records of the interference object includes:

[0025] Analyze the bit error rate index, signal attenuation index, and signal-to-noise ratio index of the communication device according to the target state and historical fault records of the interference object to obtain the upper limit value of the magnetic moment that the interference object can withstand.

[0026] In one embodiment, if the interference object is a sensor device, then determining the upper limit value of the magnetic moment that the interference object can withstand according to the target state and historical fault records of the interference object includes:

[0027] Analyze the measurement accuracy index, signal strength index, operating temperature index, and operating humidity index of the sensor device according to the target state and historical fault records of the interference object to obtain the upper limit value of the magnetic moment that the interference object can withstand.

[0028] In one embodiment, the target state of the interference object includes at least one of electrical dimension parameters, spatial position dimension parameters, operating state dimension parameters, and electromagnetic shielding dimension parameters.

[0029] In a second aspect, the present application also provides a transient electromagnetic signal acquisition system in a strong interference environment, including:

[0030] An object determination module for obtaining the interference object corresponding to the transient electromagnetic instrument at the measured position;

[0031] The object state determination module is used to adjust the current state of the interfering object with the goal of minimizing the interference factor generated by the interfering object on the transient electromagnetic instrument, subject to the condition that the state of the interfering object satisfies the safe operation conditions of the interfering object, so as to obtain the target state of the interfering object.

[0032] The maximum magnetic moment determination module is used to determine the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interfering object when operating in the target state.

[0033] The acquisition module is used to control the transient electromagnetic instrument to operate with the maximum transmitting magnetic moment to acquire the transient electromagnetic signal at the measured position.

[0034] For the above transient electromagnetic signal acquisition method and system in a strong interference environment, the present application obtains the interfering object corresponding to the transient electromagnetic instrument at the measured position and adjusts the state of the interfering object to minimize its interference factor on the transient electromagnetic instrument, which can effectively reduce the influence of interference on the measurement result. This makes the measurement result more accurate, reduces the error introduced by interference, thereby improving the accuracy of transient electromagnetic signal acquisition and making the measurement result closer to the true value. When adjusting the state of the interfering object, it is subject to the condition that it satisfies the safe operation conditions, ensuring the safety and reliability of the entire measurement process. It avoids other problems caused by improper adjustment of the state of the interfering object, making the method more feasible and stable in practical applications, and ensuring the consistency and repeatability of the measurement results in a complex environment.

[0035] Determining the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interfering object in the target state realizes the optimization of measurement parameters. This way of dynamically determining the transmitting magnetic moment according to the actual interference situation can fully consider the characteristics of different interference environments, ensure that the most suitable measurement parameters can be found in a strong interference environment, and thus improve the overall performance of the measurement. Brief Description of the Drawings

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for describing the embodiments of the present application or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0037] Figure 1 It is a flowchart of the transient electromagnetic signal acquisition method in a strong interference environment in an embodiment;

[0038] Figure 2Schematic flowchart of steps for determining the maximum transmitting magnetic moment when a transient electromagnetic instrument makes measurements at a measured position in an embodiment;

[0039] Figure 3 Schematic flowchart of steps for determining the upper limit value of the magnetic moment that an interference object can withstand when it is in a target state in an embodiment;

[0040] Figure 4 Schematic diagram of a transient electromagnetic signal acquisition system in a strong interference environment in an embodiment. Specific embodiments

[0041] In order to make the objectives, technical solutions, and advantages of the present application clearer and more understandable, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0042] In an exemplary embodiment, as Figure 1 shown, a transient electromagnetic signal acquisition method in a strong interference environment is provided. Taking the application of this method to a computer device as an example, the method includes:

[0043] S101, obtaining an interference object corresponding to the transient electromagnetic instrument at the measured position.

[0044] Among them, the interference object is an object that affects the measurement accuracy of the transient electromagnetic instrument.

[0045] Optionally, the interference object includes a power supply device, a sensor device, a communication device, and a metal structure.

[0046] It can be understood that for the power supply device: such as a nearby substation, distribution box, or power supply of a large motor, etc. These devices generate electromagnetic radiation during operation, and their frequency components and intensities may interfere with the normal measurement of the transient electromagnetic instrument. An electromagnetic radiation detection instrument can be used to scan the surrounding environment within the working frequency band of the transient electromagnetic instrument to detect electromagnetic interference signals from the power supply device, thereby determining it as an interference object.

[0047] For the sensor device: for example, other types of electromagnetic sensors or electronic sensors in the same measurement area. They may generate electromagnetic fields that interfere with the transient electromagnetic instrument due to their own working principles. By analyzing the device layout at the measurement site and the technical parameters of the sensors, sensor devices that may cause interference can be identified.

[0048] Communication equipment: including wireless communication base stations, mobile phone signal towers, and nearby mobile phones, walkie-talkies, etc. that are in use. The high-frequency signals emitted by these devices may cause aliasing with the signal frequency of the transient electromagnetic instrument or interfere with its signal processing process. Use a spectrum analyzer to monitor the wireless signals in the measurement environment to determine the communication equipment that interferes with the transient electromagnetic instrument.

[0049] Metal structures: such as underground metal pipes, metal building frames, etc. When the electromagnetic field emitted by the transient electromagnetic instrument acts on these metal structures, induced currents will be generated on the metal surface, which will in turn form a secondary electromagnetic field, interfering with the reception and analysis of the target signal by the transient electromagnetic instrument. The distribution of metal structures around the measured location can be understood through geological exploration data or on-site physical detection, and they can be listed as interference objects.

[0050] S102, with the goal of minimizing the interference factor generated by the interference object on the transient electromagnetic instrument, and with the state of the interference object meeting the safe operation conditions of the interference object as a constraint, adjust the current state of the interference object to obtain the target state of the interference object.

[0051] It can be understood that during the transient electromagnetic measurement process, the interference object will have a negative impact on the measurement accuracy of the transient electromagnetic instrument. In order to obtain accurate and reliable measurement results, it is necessary to minimize this interference as much as possible. Optimizing and adjusting with the goal of minimizing the interference factor is based on the need to improve the measurement quality.

[0052] However, when adjusting the state of the interference object, the safe operation of the interference object itself cannot be ignored. Because the interference object usually operates stably and safely under specific design parameters and working conditions. If these factors are not considered and adjusted randomly, it may cause damage, failure of the interference object or even lead to safety accidents, such as overload, overheating, short circuit of power equipment, or excessive stress and deformation of mechanical structures. Therefore, the safe operation conditions of the interference object must be used as a constraint condition to limit the scope of adjustment.

[0053] Among them, the safe operation conditions of the interference object can include:

[0054] 1) Conditions related to electrical characteristics

[0055] Voltage range: The interference object needs to work within a specified voltage range. Too high a voltage may cause insulation breakdown and component damage of the equipment, while too low a voltage may cause the equipment to fail to start properly or operate unstably. For example, common industrial equipment usually requires the voltage to fluctuate within ±10% of the rated value to ensure the normal operation of the equipment.

[0056] Current Limitation: The current during the operation of the device shall not exceed its rated current; otherwise, the device will overheat severely, accelerating its aging and even triggering safety accidents such as short circuits and fires. For some high-power motors, if they operate under overload for a long time with excessive current, the motor windings will overheat and damage the insulation layer.

[0057] Frequency Requirement: For some devices sensitive to frequency, such as certain communication devices and electronic instruments, the frequency of the input power supply must be within a specific range; otherwise, the device may experience performance degradation, abnormal operation, etc. For example, the standard frequency of the power system is 50Hz, and some imported devices may require a frequency conversion device to adapt the power supply frequency to ensure safe operation.

[0058] 2) Environmental Related Conditions

[0059] Temperature Range: The interference object usually has a suitable operating temperature range. Beyond this range, it will affect the performance and lifespan of the device. High temperature may lead to poor heat dissipation of the device, causing component performance degradation and accelerating aging; low temperature may make some materials brittle and lubricants ineffective, etc. For example, electronic devices generally operate optimally in an environmental temperature range of -20°C to 50°C.

[0060] Humidity Requirement: Environmental humidity also has an important impact on the device. Excessive humidity may cause the device to get damp inside, leading to problems such as short circuits and corrosion; too low humidity may generate static electricity, damaging the electronic components in the device. Generally, the suitable humidity range for the device is around 40%-60% relative humidity.

[0061] Dust and Corrosive Gases: In some harsh industrial environments, dust and corrosive gases may enter the device, affecting its heat dissipation, blocking the ventilation openings, or corroding the metal parts and circuit components of the device. For example, in chemical workshops, coal mines and other places, the device needs to have a certain dust and corrosion protection ability to ensure safe operation.

[0062] 3) Mechanical and Physical Property Related Conditions

[0063] Rotation Speed Limitation: For interference objects with rotating parts, such as motors and fans, there is a maximum allowable rotation speed. Exceeding this speed, the rotating parts may be damaged due to excessive centrifugal force, even triggering safety accidents. For example, the rotation speed of a car engine usually has a redline limit, and exceeding this speed will cause serious damage to the engine.

[0064] Pressure and Stress Limits: For devices such as pressure vessels and pipelines, the internal pressure must be controlled within the design pressure range; otherwise, dangerous situations such as explosions and leaks may occur. In addition, some mechanical structures will bear various stresses during operation, such as tensile, compressive, and bending stresses, and these stresses shall not exceed the allowable stress of the material to avoid problems such as structural deformation and fracture.

[0065] Vibration and shock tolerance: During operation, the device may be subject to external vibrations and shocks, such as during transportation or when working in an environment with vibration sources. The device needs to have a certain level of vibration and shock tolerance; otherwise, internal components may become loose or fall off, affecting the normal operation of the device.

[0066] 4) Conditions related to electromagnetic compatibility

[0067] Electromagnetic radiation limit: The electromagnetic radiation generated by the interfering object itself cannot exceed a certain standard; otherwise, it will interfere with other surrounding electronic devices, communication systems, etc., and may also have an adverse impact on human health. For example, devices such as mobile phones and wireless routers need to meet relevant electromagnetic radiation standards to ensure that they do not cause excessive electromagnetic pollution to the surrounding environment during normal use.

[0068] Electromagnetic immunity: The interfering object should have a certain level of electromagnetic immunity, that is, it should be able to operate normally in a certain electromagnetic interference environment without being affected by external electromagnetic interference and experiencing problems such as malfunction or performance degradation. For example, electronic devices in strong electromagnetic environments such as substations need to adopt measures such as shielding and filtering to improve their electromagnetic immunity to ensure the safe operation of the devices.

[0069] Furthermore, with the goal of minimizing the interference factor generated by the interfering object on the transient electromagnetic instrument and with the state of the interfering object meeting the safe operation conditions as a constraint, the adjustment of the current state of the interfering object can be carried out from the following multiple dimensions:

[0070] First, the dimension of electrical parameters

[0071] For power supply equipment: 1) Voltage: Adjust the amplitude, stability, and waveform of the power supply output voltage to reduce electromagnetic interference to the transient electromagnetic instrument while meeting its own safe operation requirements. For example, control the ripple coefficient of the power supply voltage at a low level to avoid large voltage fluctuations. 2) Frequency: For variable-frequency power supplies, reasonably select the operating frequency to avoid frequency bands close to the operating frequency of the transient electromagnetic instrument or prone to harmonic interference. 3) Power: Optimize the power supply output power according to the actual load demand to prevent electromagnetic abnormal interference caused by power overload or insufficiency.

[0072] For communication equipment: 1) Transmit power: Adjust the transmit power of the communication equipment to minimize electromagnetic radiation interference to the transient electromagnetic instrument while ensuring communication quality. 2) Frequency bandwidth: Reasonably set the operating frequency bandwidth of the communication equipment to avoid overlapping with the operating frequency band of the transient electromagnetic instrument or generating adjacent-frequency interference.

[0073] Second, the dimension of spatial position

[0074] For metal structures: 1) Distance: Change the relative distance between the metal structure and the transient electromagnetic instrument. Generally speaking, the farther the distance, the smaller the interference such as electromagnetic induction and scattering. For example, move large metal pipes, metal brackets, etc. away from the measurement area of the transient electromagnetic instrument as much as possible. 2) Orientation: Adjust the orientation of the metal structure so that the angle between it and the magnetic field direction of the transient electromagnetic instrument is in a state of minimum interference. For example, make the long side of the metal structure parallel to the direction of the magnetic field emitted by the transient electromagnetic instrument to reduce electromagnetic induction interference in the vertical direction.

[0075] For sensor devices: 1) Installation location: Optimize the installation location of the sensor to avoid it being in the strong magnetic field area or electromagnetic interference sensitive area of the transient electromagnetic instrument. For example, install temperature sensors, pressure sensors, etc. at positions far from the transmitting coil and receiving coil of the transient electromagnetic instrument.

[0076] Third, the operating state dimension

[0077] For power supply devices: 1) Operating mode: For power supply devices with multiple operating modes, such as uninterruptible power supplies (UPS), under the condition of ensuring power supply safety, select an operating mode with less interference to the transient electromagnetic instrument, such as online interactive or standby type, etc.

[0078] For communication devices: 1) Communication protocol: Adjust the communication protocol or data transmission rate of the communication device to reduce the electromagnetic noise and interference generated during communication. For example, adopt a more advanced modulation and demodulation method or reduce the baud rate of data transmission. 2) Operating time: According to the measurement time arrangement of the transient electromagnetic instrument, reasonably plan the operating time of the communication device to avoid performing operations prone to interference such as high-power and high-frequency data transmission during the measurement of the transient electromagnetic instrument.

[0079] For sensor devices: 1) Sampling frequency: Adjust the sampling frequency of the sensor so that it does not generate synchronous interference or harmonic interference with the operating frequency of the transient electromagnetic instrument. For example, set the sampling frequency of the sensor to a non-integer multiple of the operating frequency of the transient electromagnetic instrument. 2) Operating cycle: For sensors with periodic operation, reasonably adjust their operating cycle to avoid coincidence with the measurement cycle of the transient electromagnetic instrument or resonance phenomenon.

[0080] Fourth, the electromagnetic shielding dimension

[0081] For power supply devices: 1) Shielding measures: Add an electromagnetic shielding cover to the power supply device, and select appropriate shielding materials and structures, such as using a metal material with high magnetic permeability to make the shielding cover to reduce the external leakage of electromagnetic energy inside the power supply.

[0082] For communication devices: 1) Shielded cable: Use a communication cable with good shielding performance and ensure that the shielding layer of the cable is well grounded to prevent electromagnetic leakage during the transmission of communication signals from interfering with the transient electromagnetic instrument.

[0083] For metal structures: 1) Shielding coating: Apply an electromagnetic shielding coating on the surface of the metal structure to change the reflection and absorption characteristics of the metal structure for electromagnetic waves, and reduce its scattering and interference with transient electromagnetic signals.

[0084] Optionally, with the goal of minimizing the interference factor generated by the interfering object on the transient electromagnetic instrument and subject to the condition that the state of the interfering object meets the safe operation conditions of the interfering object, when adjusting the current state of the interfering object to obtain the target state of the interfering object, linear programming algorithms, non-linear programming algorithms, genetic algorithms, particle swarm optimization algorithms, etc. can be used.

[0085] S103. Determine the maximum transmitting magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interfering object when operating in the target state.

[0086] Among them, the interference factor is used to quantify the interference degree of the interfering object on the transient electromagnetic instrument, and usually various factors are comprehensively considered. It mainly includes:

[0087] I. Electromagnetic characteristic-related factors

[0088] 1) Electromagnetic radiation intensity: The electromagnetic radiation intensity emitted by the interfering object is an important factor. The higher the electromagnetic radiation intensity, the greater the possible interference to the transient electromagnetic instrument. The interference factor F usually increases with the increase of the electromagnetic radiation intensity I, showing a functional relationship F = f(I), and f'(I)>0, that is, F increases monotonically with I.

[0089] 2) Frequency correlation: The frequency relationship between the interfering object and the transient electromagnetic instrument is crucial. When their operating frequencies are close or there is a harmonic relationship, the interference will be more serious. Use △f to represent the frequency difference, and the interference factor F and △f may show a non-linear relationship, such as F = g(△f). When △f is small, g'(△f)<0, and the interference factor increases rapidly; when △f is large, g'(△f)≈0, and the interference factor remains basically unchanged.

[0090] 3) Waveform characteristics: Different electromagnetic waveforms (such as sine wave, square wave, pulse wave, etc.) of the interfering object have different interference effects on the transient electromagnetic instrument. Due to its sudden change and rich spectral components, the pulse wave may cause more complex and stronger interference. It can be measured by the waveform complexity index C, and there may be a positive correlation between the interference factor F and C, such as F = h(C), and h'(C)>0.

[0091] II. Spatial position-related factors:

[0092] 1) Distance: The distance d between the interfering object and the transient electromagnetic instrument is an important factor affecting interference. Generally, the farther the distance, the smaller the interference. The interference factor F and the distance d usually show an inverse proportional relationship or a decay relationship similar to inverse proportionality.

[0093] 2) Azimuth angle: The relative azimuth angle between the interfering object and the transient electromagnetic instrument also affects the degree of interference. When the magnetic field direction of the interference source is perpendicular to the plane of the receiving coil of the transient electromagnetic instrument, the interference is small; when they are parallel, the interference is large. The interference factor F and the azimuth angle may show a trigonometric function relationship.

[0094] III. Environmental factors:

[0095] 1) Medium characteristics: The electromagnetic characteristics of the surrounding medium (such as conductivity σ, permeability μ, etc.) affect electromagnetic propagation and interference effects. In a medium with high conductivity, electromagnetic signals attenuate faster, but may cause more scattering and reflection, increasing the complexity of interference. The interference factor F may have a complex functional relationship with the conductivity and permeability of the medium.

[0096] 2) Environmental noise: Other electromagnetic noises or mechanical vibrations in the surrounding environment and other factors may also interfere with the transient electromagnetic instrument. These interferences can be comprehensively represented by an environmental noise factor N, and the interference factor F will increase with the increase of N.

[0097] In summary, the interference factor F is a complex function of multiple variables, including electromagnetic radiation intensity I, frequency difference △f, waveform complexity C, distance d, azimuth angle θ, conductivity σ of the medium, permeability μ, environmental noise factor N, etc.

[0098] Furthermore, a mathematical model is established to describe the relationship between the interference factor and the transmitting magnetic moment. Assuming the interference factor is I and the transmitting magnetic moment is M, the relationship between them may be a functional relationship I = f(M) derived through electromagnetic theory, or an empirical formula obtained by fitting experimental data. For example, in some simple cases, the interference factor may be proportional to the square of the transmitting magnetic moment, that is, I = kM 2 , where k is the proportionality constant.

[0099] First, determine the interference threshold: According to the measurement accuracy requirements of the transient electromagnetic instrument and the actual application scenario, determine an acceptable maximum interference factor threshold Imax. That is to say, when the interference factor exceeds this threshold, the measurement results of the transient electromagnetic instrument will be affected unacceptably and become inaccurate or unreliable.

[0100] Secondly, solve for the maximum transmitting magnetic moment: Substitute the interference threshold Imax into the interference model I = f(M), and solve the equation Imax = f(M) to obtain the maximum transmitting magnetic moment Mmax. If the interference model is I = kM 2, given Imax and k, the maximum emission magnetic moment can be calculated as Mmax = kImax. For more complex interference models, such as I = aM 3 + bM 2 + cM + d (where a, b, c, and d are constants), it is necessary to use numerical calculation methods or mathematical software to solve the equation Imax = aMmax 3 + bMmax 2 + cMmax + d to obtain the value of Mmax.

[0101] In addition, in addition to the limitations of interference factors, there may be other constraints, which may further limit the value range of the emission magnetic moment. For example, the power limitation of the transient electromagnetic instrument and the physical characteristics of the coil, etc. These constraints may include limited power supply of the transient electromagnetic instrument, so that the emission magnetic moment cannot exceed a power-related upper limit value Mpower, and at the same time, the bearing capacity of the coil also limits that the emission magnetic moment cannot exceed an upper limit value Mcoil related to the coil characteristics. At this time, the final maximum emission magnetic moment Mmax needs to be determined under the condition of satisfying all constraints, that is, Mmax = min{Msolution, Mpower, Mcoil}, where Msolution is the maximum emission magnetic moment calculated according to the interference factor.

[0102] S104, control the transient electromagnetic instrument to operate with the maximum emission magnetic moment to collect the transient electromagnetic signal at the measured position.

[0103] It can be understood that in transient electromagnetic method measurement, the larger the emission magnetic moment, the stronger the induced current generated in the underground medium, and thus the stronger the secondary magnetic field signal generated. This helps to increase the amplitude of the received transient electromagnetic signal, making the effective signal easier to stand out from the noise, thereby improving the signal-to-noise ratio and providing a more reliable basis for subsequent data processing and interpretation. A larger emission magnetic moment can make the emitted electromagnetic wave propagate deeper and stimulate the electromagnetic response of deeper strata. For application scenarios such as deep geological exploration, this means that deeper geological information can be obtained, expanding the detection range and helping to understand the underground geological structure more comprehensively.

[0104] Optionally, according to the maximum emission magnetic moment determined in the previous steps, accurately set the parameters related to the emission magnetic moment in the operation interface or control program of the transient electromagnetic instrument (transient electromagnetic instrument). This may include adjusting the current intensity of the emission coil, the turn ratio (if adjustable), and other hardware or software parameters that affect the magnetic moment output. For example, if the emission magnetic moment is proportional to the current, calculate the current value corresponding to the maximum emission magnetic moment, and then set the emission current of the transient electromagnetic instrument to this value.

[0105] Subsequently, the transient electromagnetic instrument records the collected transient electromagnetic signal data in a certain format. These data may include the signal amplitudes at different times, phase information, and timestamps related to the acquisition time, etc. The recorded data should be able to fully reflect the variation process of the transient electromagnetic signal over time, providing a basis for subsequent data analysis and interpretation.

[0106] In an exemplary embodiment, according to the interference factor generated by the interference object when operating in the target state on the transient electromagnetic instrument, determining the maximum transmit magnetic moment of the transient electromagnetic instrument when measuring at the measured position includes:

[0107] S201, according to the interference factor generated by the interference object when operating in the target state on the transient electromagnetic instrument, determining the upper limit value of the transmit magnetic moment that the transient electromagnetic instrument can have when measuring at the measured position.

[0108] It can be understood that the interference factor reflects the degree of interference of the interference object on the transient electromagnetic instrument. Generally speaking, there is a certain relationship between the interference factor and the transmit magnetic moment of the transient electromagnetic instrument. When the interference object is in the target state, by analyzing this relationship, the upper limit value of the magnetic moment that the transient electromagnetic instrument can emit can be determined without making the interference exceed the acceptable range.

[0109] In an implementable manner, assume that through experiments or theoretical analysis, the relationship between the interference factor I and the transmit magnetic moment M is I = aM + b (a and b are constants), and at the same time, the maximum acceptable interference factor Imax is set. Then, from Imax = aM + b, the upper limit value of the transmit magnetic moment Mp = (Imax - b) / a can be solved.

[0110] S202, if the state of the transient electromagnetic instrument can affect the state of the interference object, then according to the upper limit value of the transmit magnetic moment that the transient electromagnetic instrument can have when measuring at the measured position, and the upper limit value of the target magnetic moment that the interference object can withstand when in the target state, determining the maximum transmit magnetic moment of the transient electromagnetic instrument when measuring at the measured position.

[0111] It can be understood that some interference objects can not only interfere with the transient electromagnetic instrument, but also be interfered by the transient electromagnetic instrument, such as the above-mentioned power supply equipment, sensor equipment, and communication equipment.

[0112] Specifically, for power supply equipment: such as equipment like motors, cables, switches, etc. In complex environments such as underground coal mines, these equipment will generate electromagnetic noise 1 when operating. The electromagnetic field emitted by the transient electromagnetic instrument during operation may in turn affect the electromagnetic environment of these equipment, causing changes in the electromagnetic noise they generate, and further affecting their own operating states or signal transmissions, etc.

[0113] Sensor device: If there are other instrument devices for electromagnetic detection in the same area, the electromagnetic field of the transient electromagnetic instrument may interfere with the measurement results of other devices, causing deviations or distortions in the signals received by other devices. At the same time, other electromagnetic detection devices may also interfere with the transient electromagnetic instrument, forming a relationship of mutual influence.

[0114] Communication device: The electromagnetic radiation generated during the operation of the transient electromagnetic instrument may be coupled into nearby communication devices, resulting in situations such as noise, distortion, or error codes in the communication signals, affecting the communication quality and the accuracy of data transmission. For example, it may make the wireless communication signal unstable, or cause errors in data transmission in wired communication devices.

[0115] Not only the limitation of interference on measurement (i.e., the upper limit value of the transmissible magnetic moment obtained previously) needs to be considered, but also the maximum magnetic moment value that the interference object itself can withstand. An excessive or too small transmissible magnetic moment may affect the normal operation of the interference object. Therefore, the final maximum transmissible magnetic moment should take a suitable value between the upper limit value of the transmissible magnetic moment and the target magnetic upper limit value that the interference object can withstand.

[0116] In one implementable manner, according to the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position, and the target magnetic upper limit value that the interference object can withstand when in the target state, determine the maximum transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position, including: If the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position is less than the target magnetic upper limit value that the interference object can withstand when in the target state, then use the upper limit value of the transmissible magnetic moment as the maximum transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position; If the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position is greater than or equal to the target magnetic upper limit value that the interference object can withstand when in the target state, then use the target magnetic upper limit value as the maximum transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position.

[0117] Exemplarily, let the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position be Mup, and determine the target magnetic upper limit value that the interference object can withstand when in the target state be Mtolerate. Then the final maximum transmissible magnetic moment Mmax = min(Mup, Mtolerate). If Mup < Mtolerate, using Mup as the maximum transmissible magnetic moment can not only ensure that the interference is within an acceptable range but also will not affect the interference object; if Mup > Mtolerate, then only Mtolerate can be used as the maximum transmissible magnetic moment, otherwise it will exceed the tolerance of the interference object.

[0118] S203. If the state of the transient electromagnetic instrument fails to affect the state of the interference object, then the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position is determined as the maximum transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position.

[0119] It can be understood that some interference objects can interfere with the transient electromagnetic instrument, but are not affected by the transient electromagnetic instrument. For example, the above-mentioned metal structure. In this case, there is no need to consider the upper limit of the interference object's tolerance. At this time, the upper limit value of the transmissible magnetic moment determined according to the interference factor before is the maximum transmissible magnetic moment at which the transient electromagnetic instrument can measure safely and effectively under the current interference conditions.

[0120] In an exemplary embodiment, determining the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position according to the interference factor generated by the interference object when operating in the target state includes: using a genetic algorithm to determine the upper limit value of the transmissible magnetic moment when the transient electromagnetic instrument measures at the measured position according to the interference factor generated by the interference object when operating in the target state.

[0121] Optionally, first, construct an objective function: aiming to minimize the interference factor generated by the interference object on the transient electromagnetic instrument. Let the interference factor be I, then the objective function can be expressed as minimize I. The interference factor I is a function of the state x=(x1, x2, xn) of the interference object and the transmissible magnetic moment M of the transient electromagnetic instrument, that is, I = f(x, M), where x represents the state parameters of the interference object, covering the parameters in multiple dimensions mentioned above, such as electrical parameters, spatial position, operating state, and electromagnetic shielding and other dimensions of parameters.

[0122] Secondly, determine the constraint conditions:

[0123] I. Electrical parameter dimension: 1) For power supply equipment, let the power supply voltage be V, Vmin ≤ V ≤ Vmax; the power supply frequency be F, Fmin ≤ F ≤ Fmax; the power supply power be P, Pmin ≤ P ≤ Pmax. 2) For communication equipment, let the transmit power be Pt, Ptmin ≤ Pt ≤ Ptmax; the frequency bandwidth be B, Bmin ≤ B ≤ Bmax.

[0124] II. Spatial position dimension: 1) For metal structures, let the distance be d, dmin ≤ d ≤ dmax; the azimuth angle be θ, θmin ≤ θ ≤ θmax. 2) For sensor equipment, let the installation position coordinates be (xs, ys, zs), satisfying the corresponding position range

[0125] III. Operating Status Dimension: 1) For the power supply device working mode m, m ∈ {mode1, mode2, modek}. 2) For the communication device, communication protocol p, p ∈ {protocol1, protocol2, ..., protocoli}; working time t, satisfying the time arrangement constraint. 3) For the sensor device, sampling frequency fs, fsmin ≤ fs ≤ fsmax; working period Ts, Tsmin ≤ Ts ≤ Tsmax.

[0126] IV. Electromagnetic Shielding Dimension: 1) For the power supply device, shielding effectiveness Sv, Svmin ≤ Sv ≤ Svmax. 2) For the communication device, shielding cable grounding resistance Rg, Rgmin ≤ Rg ≤ Rgmax. 3) For the metal structure, shielding coating thickness h, hmin ≤ h ≤ hmax.

[0127] Furthermore, the application of the genetic algorithm

[0128] 1) Encoding: Encode the state parameters x of the interference object and the transmitting magnetic moment M of the transient electromagnetic instrument as chromosomes. For example, for binary encoding, assuming that both x and M are within a certain range, their ranges can be divided into discrete binary encoding segments.

[0129] 2) Initializing the population: Generate an initial set of chromosomes, representing different combinations of interference object states and transmitting magnetic moments, to form the initial population Po.

[0130] 3) Fitness function: For each chromosome c = (x, M), calculate its corresponding interference factor I = f(x, M), and consider the satisfaction of the constraint conditions. The fitness function Fitness(c) can be designed as: Fitness(c) = 1 / I if all constraints are satisfied, 0 otherwise.

[0131] 4) Genetic operations, including:

[0132] 41) Selection: According to the fitness function, use selection methods such as roulette wheel or tournament to select excellent individuals from the current population.

[0133] 42) Crossover: Perform a crossover operation on the selected individuals, exchange some genes, and generate new individuals, simulating gene recombination in the biological reproduction process. For example, for two individuals C1 = (x1, M1) and C2 = (x2, M2), a single-point or multi-point crossover operation can be performed at a certain position to generate new individuals Cnew1 and Cnew2.

[0134] Mutation: Perform a mutation operation on the genes of individuals with a certain mutation probability Pn, for example, change the value of a certain binary bit, to introduce new state combinations and avoid falling into local optima.

[0135] 43) Continuously repeat the genetic operation to update the population until the termination condition is met, such as reaching the maximum number of iterations N_max or reaching a satisfactory fitness level. In each generation, record the best individual c_best and its corresponding interference factor I_best and emission magnetic moment M_best.

[0136] In an exemplary embodiment, as Figure 3 shown, determining the upper limit value of the magnetic moment that the interference object can withstand when in the target state includes:

[0137] S301. For each interference object, based on the target state and historical fault records of the interference object, determine the upper limit value of the magnetic moment that the interference object can withstand when in the target state.

[0138] It can be understood that for each interference object, its target state and historical fault records need to be comprehensively considered. The target state contains various parameter information of the interference object during normal operation, while the historical fault records reflect the abnormal situations under different external influences.

[0139] In one implementable way, use statistical analysis methods to analyze the historical fault data. Methods such as regression analysis and probability distribution fitting can be used to find the relationship between the probability of fault occurrence and the external magnetic field intensity. Establish an electromagnetic model of the interference object, and based on its target state and physical structure, analyze the influence of the external magnetic field on it through electromagnetic theory (such as Maxwell's equations) and numerical simulation (such as finite element analysis), and then determine the upper limit value of the magnetic moment that can be withstood.

[0140] S302. Take the minimum value among the corresponding upper limit values of the magnetic moment that can be withstood in each interference object as the target magnetic upper limit value that the interference object can withstand when in the target state.

[0141] It can be understood that since there are multiple interference objects and each interference object has its own upper limit value of the magnetic moment that can be withstood, but in actual measurement, the stability of the entire system needs to be ensured. Therefore, the most vulnerable interference object, that is, the one that can withstand the smallest external magnetic field, needs to be considered. Take the minimum value among the corresponding upper limit values of the magnetic moment that can be withstood in each interference object as the target magnetic upper limit value that the interference object can withstand when in the target state.

[0142] Correspondingly, if there is only one interference object, take the upper limit value of the magnetic moment of this interference object as the target magnetic upper limit value that the interference object can withstand when in the target state.

[0143] In this embodiment, in a complex measurement system, the target magnetic moment upper limit value that the interference object can withstand when in the target state can be accurately determined, providing guarantee for the normal operation of the transient electromagnetic instrument and the reliability of the measurement results.

[0144] In an exemplary embodiment, if the interference object is a power supply device, then according to the target state and historical fault records of the interference object, the upper limit value of the magnetic moment that the interference object can withstand is determined, including: analyzing the power supply stability index of the power supply device according to the target state and historical fault records of the interference object to obtain the upper limit value of the magnetic moment that the interference object can withstand.

[0145] Optionally, first, collect the historical fault data of the power supply device, including the electromagnetic environment magnetic moment value (denoted as M_i) corresponding to each fault occurrence, as well as the fault type and severity information (which can be represented by a quantified fault level index F_i, and the larger the F_i value, the more severe the fault).

[0146] At the same time, real-time monitor the current operating parameters of the power supply device, such as the fluctuation range of the output voltage (denoted as ΔV), the stability index of the output current (such as the current ripple coefficient r_i), the temperature change of the internal key components (denoted as T_j), etc. These parameters can comprehensively reflect the current usage state of the power supply device.

[0147] For the historical fault data, a weighted regression analysis method is adopted. Different weights w_i are assigned to faults of different severities, and the more severe the fault, the greater the weight. The regression model is constructed as follows:

[0148] F = β_0 + β_1M + ε

[0149] Where F is the comprehensive fault risk index, M is the magnetic moment, β_0 and β_1 are regression coefficients, and ε is the error term. The regression coefficients are solved by the least squares method to minimize the weighted sum of squared errors. After obtaining the regression equation, according to the set acceptable maximum comprehensive fault risk index F_{max}, the corresponding upper limit value of the magnetic moment M_{limit} is inversely deduced.

[0150] For the current usage state data, an evaluation function based on multiple parameters is established. For example, the principal component analysis (PCA) method is used to perform dimensionality reduction on parameters such as the output voltage fluctuation range, current ripple coefficient, and key component temperature change to obtain several main comprehensive indicators (denoted as P_a), and then a linear or non-linear evaluation function is constructed to evaluate the current state of the power supply device. The evaluation function is:

[0151] S = α0 + ∑(k = 1 to m)αk * Pk

[0152] Where S is the power supply stability index of the power supply device, and α0 and αk are coefficients. These coefficients are determined through training with a large amount of experimental data or historical operation data. According to the set minimum acceptable stability index S_min, the upper limit value of the magnetic moment M_flimit2 that can be withstood in the current state is solved.

[0153] Finally, comprehensively consider the upper limit value of the magnetic moment obtained based on historical fault data and the current usage status. A weighted average method can be used to determine the final tolerable upper limit value of the magnetic moment M_flimit:

[0154] M_flimit = γ * M_flimit1 + (1 - γ) * M_flimit2

[0155] Among them, γ is a weight coefficient determined according to experience or further data analysis, and its value range is between 0 and 1. In this way, the upper limit value of the tolerable magnetic moment of the power supply device can be determined more accurately in combination with the characteristics of the power supply device.

[0156] In an exemplary embodiment, if the interference object is a communication device, then according to the target state and historical fault records of the interference object, determine the upper limit value of the magnetic moment that the interference object can tolerate, including: Analyze the bit error rate index, signal attenuation index, and signal-to-noise ratio index of the communication device according to the target state and historical fault records of the interference object to obtain the upper limit value of the magnetic moment that the interference object can tolerate.

[0157] First, conduct long-term monitoring of the communication device and collect signal transmission performance data in different electromagnetic environments (i.e., environments with different magnetic moment values). These data include but are not limited to key indicators such as bit error rate (BER), signal attenuation (Attenuation), and signal-to-noise ratio (SNR). Let the collected magnetic moment value sequence be M = [M1, M2, Mn], the corresponding bit error rate sequence be BER = [BER1, BER2, BERn], the signal attenuation sequence be Att = [Att1, Att2, Attn], and the signal-to-noise ratio sequence be SNR = [SNR1, SNR2,., SNRn].

[0158] For the bit error rate data, a logistic regression model is used to establish the relationship between the magnetic moment and the bit error rate. The form of the logistic regression model is: P(BER = 1|M) = 1 / (1 + e^(-(β0 + β1 * M))), where P(BER = 1|M) represents the probability of bit error when the magnetic moment is M, and β0 and β1 are parameters to be estimated. Solve β0 and β1 by the maximum likelihood estimation method to maximize the likelihood function of the observed bit error rate data under this model.

[0159] For the signal attenuation data, a polynomial regression model can be used:

[0160] Att = α0 + α1M + α2M^2 + + αkMk + ε, where α0, α1, αk are regression coefficients, and ε is the error term. Solve these coefficients by the least squares method to minimize the sum of squared residuals.

[0161] For the signal-to-noise ratio data, an exponential regression model is adopted: SNR = γ0e^(-γ1M) + ε, and γ0 and γ1 are also solved by the least squares method or other appropriate methods.

[0162] Then, according to the performance requirements of the communication device, the upper limit of the acceptable bit error rate BER_max, the upper limit of signal attenuation Att_max, and the lower limit of signal-to-noise ratio SNR_min are set.

[0163] For the bit error rate model, solve the value range of M that satisfies P(BER = 1|M) ≤ BER_max to obtain the upper limit value of magnetic moment MBER.

[0164] For the signal attenuation model, solve the value range of M that satisfies Att ≤ Att_max to obtain the upper limit value of magnetic moment MAtt.

[0165] For the signal-to-noise ratio model, solve the value range of M that satisfies SNR ≥ SNR_min to obtain the upper limit value of magnetic moment MSNR.

[0166] Finally, considering these three upper limit values of magnetic moment comprehensively, a weighted average method can be used to determine the final acceptable upper limit value of magnetic moment M_limit for the communication device:

[0167] M_limit = ω1 * MBER + ω2 * MAtt + ω3 * MSNR

[0168] Among them, ω1 + ω2 + ω3 = 1, and ω1, ω2, and ω3 are weight coefficients determined according to the importance of each index.

[0169] In this way, combining the characteristics of the communication device and complex mathematical algorithms, the acceptable upper limit value of magnetic moment is determined.

[0170] In an exemplary embodiment, if the interference object is a sensor device, then according to the target state and historical fault records of the interference object, determine the acceptable upper limit value of magnetic moment of the interference object, including: analyzing the measurement accuracy index, signal strength index, working temperature index, and working humidity index of the sensor device according to the target state and historical fault records of the interference object to obtain the acceptable upper limit value of magnetic moment of the interference object.

[0171] Optionally, 1. Data collection: Collect historical fault data: Collect relevant data when the sensor device fails during past operations, including the magnetic moment value \(M_{h,i}\) of the environment where the fault occurs (\(i = 1, 2,\cdots, n\), \(n\) is the number of historical fault records), the fault type (such as excessive measurement deviation, signal interruption, etc., which can be encoded as \(T_{h,i}\)), and the measurement data \(D_{h,i}\) of the sensor for a period of time before the fault occurs (such as the temperature measurement value sequence of a temperature sensor, the pressure measurement value sequence of a pressure sensor, etc.). Real-time operation data: Real-time monitor the current operation parameters of the sensor device, such as the measurement accuracy index \(A\) (which can be calculated from the deviation between multiple measurement values and the true value), the signal strength index \(S\) (for sensors that output electrical signals, it can be determined according to the amplitude of the signal), the operating temperature \(T\) (the temperature of the sensor itself), the operating humidity \(H\), etc. These parameters can reflect the current usage status of the sensor.

[0172] 2. Analysis based on historical fault data: Fault classification and weight setting: Classify the collected fault types and assign different weights \(w_{t,j}\) (\(j\) represents the category of the fault type) according to the impact degree of the fault on the sensor performance and usage. The greater the impact, the higher the weight.

[0173] Build a fault risk model: Use the decision tree algorithm to build a relationship model between fault risk and magnetic moment. Take the magnetic moment value \(M_{k,i}\), the fault type code \(T_{h,i}\), and the measurement data \(D_{h,i}\), etc. as input features, and the fault risk level (which can be quantified according to the severity of the fault) as the output. By training the decision tree model, obtain the influence relationship between magnetic moment and fault risk under different conditions. Determine the initial value of the magnetic moment upper limit: According to the set acceptable maximum fault risk level \(R_{cont}\), inversely deduce the corresponding initial value of the magnetic moment upper limit \(M_{thresh - h}\) in the decision tree model.

[0174] 3. Analysis based on real-time operation data: Data dimensionality reduction: Use the principal component analysis (PCA) algorithm to perform dimensionality reduction on multi-parameter data such as the real-time monitored measurement accuracy index \(A\), signal strength index \(S\), operating temperature \(T\), operating humidity \(H\), etc., to obtain several main comprehensive indicators \(PCk\) (\(k = 1, 2,\cdots, m\), \(m\) is the number of principal components after dimensionality reduction).

[0175] Construct a performance evaluation function: Establish a non-linear regression model, such as a neural network model, with the principal component PC and the current magnetic moment value M as inputs, and the sensor performance evaluation index P (which can be determined by comprehensively considering factors such as measurement accuracy and signal stability) as the output. Train the neural network with a large amount of historical real-time operation data so that it can accurately reflect the impact of the magnetic moment on the sensor performance under the current operating state. Determine the real-time value of the magnetic moment upper limit: According to the set minimum acceptable sensor performance evaluation index Pnin, solve the real-time value of the magnetic moment upper limit Mlimit-r that can be tolerated under the current state in the trained neural network model.

[0176] 4. Comprehensively determine the magnetic moment upper limit value

[0177] Use the Analytic Hierarchy Process (AHP) to determine the weights of historical fault data and real-time operation data in the determination of the final magnetic moment upper limit value. Construct judgment matrices respectively, compare the importance of historical fault data and real-time operation data pairwise, and obtain the weights wh and wr (wh + wr = 1) through steps such as calculating the eigenvector and consistency test. The final magnetic moment upper limit value Mlimit that the sensor device can tolerate is calculated by the following formula: Mlimit = whMlimit-h + wrMlimit-r.

[0178] In this embodiment, by the above method combining multiple mathematical algorithms, the characteristics of the sensor device can be more accurately determined to determine the magnetic moment upper limit value it can tolerate.

[0179] It should be understood that although the steps in the flowcharts involved in the above embodiments are shown in sequence according to the arrows, these steps do not necessarily need to be executed in the order indicated by the arrows. Unless there is a clear indication in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages. These steps or stages do not necessarily need to be executed at the same moment, but can be executed at different moments. The execution order of these steps or stages does not necessarily need to be sequential, but can be executed alternately or in turn with at least a part of other steps or steps in other steps.

[0180] Based on the same inventive concept, an embodiment of the present application further provides a transient electromagnetic signal acquisition system in a strong interference environment for implementing the transient electromagnetic signal acquisition method in the strong interference environment described above. The implementation solutions provided by this system to solve problems are similar to those described in the above method. Therefore, the specific limitations in one or more embodiments of the transient electromagnetic signal acquisition system in a strong interference environment provided below can refer to the limitations on the transient electromagnetic signal acquisition method in a strong interference environment above, and will not be repeated here.

[0181] In an exemplary embodiment, as Figure 4 shown, a transient electromagnetic signal acquisition system in a strong interference environment is provided, including:

[0182] An object determination module 11, configured to obtain an interference object corresponding to the transient electromagnetic instrument at the measured position;

[0183] An object state determination module 2, configured to, with the goal of minimizing the interference factor generated by the interference object on the transient electromagnetic instrument and with the constraint that the state of the interference object meets the safe operation conditions of the interference object, adjust the current state of the interference object to obtain the target state of the interference object;

[0184] A maximum magnetic moment determination module 13, configured to determine the maximum emission magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interference object when operating in the target state;

[0185] An acquisition module 14, configured to control the transient electromagnetic instrument to operate with the maximum emission magnetic moment to acquire the transient electromagnetic signal at the measured position.

[0186] Each module in the above transient electromagnetic signal acquisition system in a strong interference environment can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in the processor in the computer device in hardware form or be independent of it, or can be stored in the memory in the computer device in software form, so that the processor can call and execute the operations corresponding to the above respective modules.

[0187] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, data processing logics based on quantum computing, artificial intelligence (AI) processors, etc., without limitation.

[0188] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered to be within the scope recorded in the present application.

[0189] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all fall within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims

1. A method for collecting transient electromagnetic signals in a strong interference environment, characterized in that: The method comprises: Obtaining the interference object corresponding to the transient electromagnetic instrument at the measured position; With the goal of minimizing the interference factor generated by the interference object on the transient electromagnetic instrument and with the constraint that the state of the interference object meets the safe operation conditions of the interference object, the current state of the interference object is adjusted to obtain the target state of the interference object; Determine the maximum emission magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interference object on the transient electromagnetic instrument when the interference object operates in the target state; The transient electromagnetic instrument is controlled to operate at the maximum transmitting magnetic moment to collect the transient electromagnetic signal at the measured position.

2. The method according to claim 1, characterized in that Determining the maximum emission magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interference object when operating in the target state on the transient electromagnetic instrument includes: Determine an upper limit value of the transmittable magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to an interference factor generated by the interference object on the transient electromagnetic instrument when the interference object operates in the target state; If the state of the transient electromagnetic instrument can affect the state of the interference object, then according to the upper limit value of the transmittable magnetic moment when the transient electromagnetic instrument is measured at the measured position, and the upper limit value of the target magnetic moment that the interference object can withstand when it is in the target state, determine the maximum transmittable magnetic moment when the transient electromagnetic instrument is measured at the measured position; If the state of the transient electromagnetic instrument fails to affect the state of the interference object, the upper limit value of the transmittable magnetic moment of the transient electromagnetic instrument when measuring at the measured position is determined as the maximum transmittable magnetic moment of the transient electromagnetic instrument when measuring at the measured position.

3. The method according to claim 2, characterized in that According to the upper limit value of the transmittable magnetic moment when the transient electromagnetic instrument is measured at the measured position, and the upper limit value of the target magnetic moment that the interference object can withstand when it is in the target state, determining the maximum transmittable magnetic moment when the transient electromagnetic instrument is measured at the measured position, including: If the upper limit value of the transmittable magnetic moment when measured at the measured position according to the transient electromagnetic instrument is less than the upper limit value of the target magnetic moment that the interference object can withstand when it is in the target state, the upper limit value of the transmittable magnetic moment is used as the maximum transmittable magnetic moment when measured at the measured position by the transient electromagnetic instrument; If the upper limit value of the transmittable magnetic moment when measured at the measured position according to the transient electromagnetic instrument is greater than or equal to the target magnetic upper limit value that the interference object can withstand when it is in the target state, the target magnetic upper limit value is used as the maximum transmittable magnetic moment when measured at the measured position by the transient electromagnetic instrument.

4. The method according to claim 2, characterized in that: Determining the upper limit of the transmittable magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interference object on the transient electromagnetic instrument when the interference object operates in the target state includes: According to the interference factor generated by the interference object on the transient electromagnetic instrument when operating in the target state, a genetic algorithm is used to determine the upper limit value of the transmittable magnetic moment of the transient electromagnetic instrument when measuring at the measured position.

5. The method according to claim 2, characterized in that: Determining an upper limit value of the magnetic moment that the interfering object can withstand when in the target state includes: For each interference object, according to the target state and historical fault records of the interference object, determine the upper limit value of the magnetic moment that the interference object can withstand when it is in the target state; The minimum value among the upper limit values ​​of the magnetic moment corresponding to each interfering object is used as the target upper limit value of magnetic moment that the interfering object can bear when it is in the target state.

6. The method according to claim 5, characterized in that If the interference object is a power supply device, then according to the target state and historical fault records of the interference object, the upper limit value of the magnetic moment that the interference object can withstand when it is in the target state includes: According to the target state and historical fault records of the interference object, the power supply stability index of the power supply device is analyzed to obtain the upper limit value of the magnetic moment that the interference object can withstand.

7. The method according to claim 5, characterized in that If the interference object is a communication device, determining the upper limit of the magnetic moment that the interference object can withstand according to the target state and historical fault records of the interference object includes: According to the target state and historical fault records of the interference object, the bit error rate index, signal attenuation index and signal-to-noise ratio index of the communication equipment are analyzed to obtain the upper limit value of the magnetic moment that the interference object can bear.

8. The method according to claim 5, characterized in that If the interference object is a sensor device, determining the upper limit of the magnetic moment that the interference object can withstand according to the target state and historical fault records of the interference object includes: According to the target state and historical fault records of the interference object, the measurement accuracy index, signal strength index, working temperature index and working humidity index of the sensor device are analyzed to obtain the upper limit value of the magnetic moment that the interference object can withstand.

9. The method according to any one of claims 1 to 8, characterized in that The target state of the interference object includes at least one of an electrical dimension parameter, a spatial position dimension parameter, an operating state dimension parameter, and an electromagnetic shielding dimension parameter.

10. A transient electromagnetic signal acquisition system in a strong interference environment, characterized in that: The system comprises: An object determination module is used to obtain an interference object corresponding to the transient electromagnetic instrument at the measured position; An object state determination module is used to adjust the current state of the interference object with the goal of minimizing the interference factor generated by the interference object on the transient electromagnetic instrument and with the constraint that the state of the interference object meets the safe operation conditions of the interference object to obtain the target state of the interference object; A maximum magnetic moment determination module, used to determine the maximum emission magnetic moment of the transient electromagnetic instrument when measuring at the measured position according to the interference factor generated by the interference object on the transient electromagnetic instrument when the interference object operates in the target state; The acquisition module is used to control the transient electromagnetic instrument to operate at the maximum transmitting magnetic moment to acquire the transient electromagnetic signal at the measured position.

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