Chip testing method, device, computer device, readable storage medium and program product

Abstract

This application relates to a chip testing method, apparatus, computer device, computer-readable storage medium, and computer program product. The method includes: parsing a script file written in a first programming language based on an interpreter that executes the first programming language, to obtain a chip testing task and parameter information of a test object corresponding to the chip testing task; sending the parameter information to a first server to instruct the first server to run a first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in a second programming language based on a compiler that executes the second programming language; receiving the test data, and determining a test result corresponding to the chip testing task according to the test data. Using this method can improve efficiency and flexibility.

Description

Technical Field

[0001] The present application relates to the field of semiconductor technology, and in particular, to a chip testing method, device, computer device, computer-readable storage medium, and computer program product. Background Art

[0002] With the continuous development of semiconductor technology, the complexity and integration level of chips continue to increase, and the chip testing link becomes increasingly critical and challenging. Generally, test programs for specific chips can be developed according to the characteristics and testing requirements of the chips, and the chips can be tested by running the test programs.

[0003] In related technologies, test programs are developed based on C language or C++ language. However, when dealing with large-scale or complex test data, a large number of underlying details need to be processed during the development of test programs in this way, resulting in high development difficulty, large workload, and low efficiency. Summary of the Invention

[0004] Based on this, it is necessary to provide a chip testing method, device, computer device, computer-readable storage medium, and computer program product that can improve efficiency and flexibility for the above technical problems.

[0005] In a first aspect, the present application provides a chip testing method, which is applied to a terminal. The method includes:

[0006] Based on an interpreter that executes a first programming language dependency, parse a script file written in the first programming language to obtain a chip testing task and parameter information of a test object corresponding to the chip testing task;

[0007] Send the parameter information to a first server to instruct the first server to run a first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in a second programming language based on a compiler that executes a second programming language dependency;

[0008] Receive the test data and determine a test result corresponding to the chip testing task according to the test data.

[0009] In one embodiment, the obtaining the chip testing task and parameter information of a test object corresponding to the chip testing task includes:

[0010] Obtain a chip testing task, determine a test object and a first interface corresponding to the chip testing task, and obtain object parameter information of the test object and interface parameter information of the first interface;

[0011] Running the first compiled text according to the parameter information includes:

[0012] Receiving the object parameter information and the interface parameter information, calling a second interface that matches the interface parameter information, and running the first compiled text according to the object parameter information.

[0013] In one embodiment, sending the parameter information to the first server includes:

[0014] Converting the format of the object parameter information and the interface parameter information according to a preset format conversion method to obtain the converted parameter information;

[0015] Sending the converted parameter information to the first server.

[0016] In one embodiment, receiving the object parameter information and the interface parameter information, and calling a second interface that matches the interface parameter information includes:

[0017] Receiving the converted parameter information, and converting the format of the converted parameter information according to the preset format conversion method to obtain the object parameter information and the interface parameter information;

[0018] Verifying the interface parameter information, and calling a second interface that matches the interface parameter information when the verification passes.

[0019] In one embodiment, before parsing the script file written in the first programming language based on the interpreter dependent on the first programming language, it further includes:

[0020] Responding to a test instruction sent by the second server, and obtaining a script file written in the first programming language according to the test instruction;

[0021] The method further includes:

[0022] Determining the test environment information corresponding to the chip test task, and determining a third interface that matches the test environment information;

[0023] Sending the interface parameter information of the third interface to the second server to instruct the second server to call a fourth interface that matches the third interface to run a second compiled text, where the second compiled text is obtained by compiling a program file that matches the test environment information based on a compiler dependent on the second programming language.

[0024] In one embodiment, the parameter information includes a configuration file, and obtaining the parameter information of the test object corresponding to the chip test task includes:

[0025] Obtaining the object parameter information and task parameter information of the test object corresponding to the chip test task;

[0026] Generating a configuration file according to the object parameter information and task parameter information;

[0027] The step of instructing the first server to run the first compiled text according to the parameter information includes:

[0028] Instructing the first server to install the configuration file and run the first compiled text according to the configuration file.

[0029] In a second aspect, the present application further provides a chip testing device, which is applied to a terminal. The device includes:

[0030] An obtaining module, configured to parse a script file written in the first programming language based on an interpreter dependent on the execution of the first programming language, and obtain a chip test task and parameter information of a test object corresponding to the chip test task;

[0031] A sending module, configured to send the parameter information to a first server, so as to instruct the first server to run a first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in the second programming language based on a compiler dependent on the execution of the second programming language;

[0032] A receiving module, configured to receive the test data and determine a test result corresponding to the chip test task according to the test data.

[0033] In one embodiment, the obtaining module is further configured to:

[0034] Obtain a chip test task, determine a test object and a first interface corresponding to the chip test task, and obtain object parameter information of the test object and interface parameter information of the first interface;

[0035] The sending module is further configured to:

[0036] Receive the object parameter information and interface parameter information, call a second interface matching the interface parameter information, and compile a program file written in the second programming language according to the object parameter information.

[0037] In one embodiment, the sending module is further configured to:

[0038] Convert the object parameter information and the interface parameter information according to a preset format conversion method to obtain the converted parameter information;

[0039] Send the converted parameter information to the first server.

[0040] In one embodiment, the sending module is further configured to:

[0041] Receive the converted parameter information, and convert the converted parameter information according to the preset format conversion method to obtain the object parameter information and the interface parameter information;

[0042] Verify the interface parameter information, and call a second interface that matches the interface parameter information when the verification passes.

[0043] In one embodiment, the device is further configured to:

[0044] In response to receiving a test instruction sent by the second server, obtain a script file written in the first programming language according to the test instruction;

[0045] The device is further configured to:

[0046] Determine the test environment information corresponding to the chip test task, and determine a third interface that matches the test environment information;

[0047] Send the interface parameter information of the third interface to the second server to instruct the second server to call a fourth interface that matches the third interface to run a second compiled text, where the second compiled text is obtained by compiling a program file that matches the test environment information based on a compiler on which the second programming language depends.

[0048] In one embodiment, the parameter information includes a configuration file, and the obtaining module is further configured to:

[0049] Obtain the object parameter information and task parameter information of the test object corresponding to the chip test task;

[0050] Generate a configuration file according to the object parameter information and the task parameter information;

[0051] The sending module is further configured to:

[0052] Instruct the first server to install the configuration file and run a first compiled text according to the configuration file.

[0053] In a third aspect, embodiments of the present disclosure also provide a computer device. The computer device includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the steps of the method described in any one of the embodiments of the present disclosure are implemented.

[0054] In a fourth aspect, embodiments of the present disclosure also provide a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, and when the computer program is executed by a processor, the steps of the method described in any one of the embodiments of the present disclosure are implemented.

[0055] In a fifth aspect, embodiments of the present disclosure also provide a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the steps of the method described in any one of the embodiments of the present disclosure are implemented.

[0056] The above chip testing method, device, computer device, computer-readable storage medium, and computer program product parse a script file based on an interpreter that executes a first programming language-dependent interpreter, obtain chip testing tasks and parameter information of the test object, and send the parameter information to a first server. The first server runs a first compiled text based on the parameter information to test the test object and obtain test data. The terminal receives the test data and determines the test result, thereby realizing the testing of the chip. During the chip testing process, the terminal executes test process actions such as parameter passing, data processing, and data analysis based on the first programming language, and the first server executes the testing task based on the second programming language, realizing the functional division of the entire testing task. Executing the test process based on an interpreted language ensures the efficiency of the test process, and the script development difficulty is low. There is no need to handle a large number of underlying details, effectively reducing the data processing workload and improving the test process development efficiency. When modification or iterative adjustment is required, adjusting the script file written in the first programming language has a low workload and high flexibility; executing the test action based on a compiled language ensures the security and reliability of the test process. For high-performance requirement scenarios such as large-scale testing or complex testing, it can also quickly and accurately complete the testing of the chip, obtain test data, and is applicable to more application scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for describing the embodiments of the present application or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0058] Figure 1Schematic diagram of the chip testing method in an embodiment;

[0059] Figure 2 Schematic diagram of the chip testing architecture in an embodiment;

[0060] Figure 3 Interaction schematic diagram of the chip testing method in an embodiment;

[0061] Figure 4 Topological schematic diagram of the server structure in an embodiment;

[0062] Figure 5 Schematic diagram of the chip testing method in another embodiment;

[0063] Figure 6 Structural block diagram of the chip testing device in an embodiment;

[0064] Figure 7 Internal structure diagram of a computer device in an embodiment. Detailed implementation manners

[0065] In order to make the objectives, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0066] In an exemplary embodiment, as Figure 1 shown, a chip testing method is provided. Taking the application of this method to a terminal as an example for illustration, the method includes:

[0067] Step S110, based on an interpreter that depends on a first programming language, parse a script file written in the first programming language to obtain a chip testing task and parameter information of a test object corresponding to the chip testing task;

[0068] Exemplarily, based on an interpreter that depends on a first programming language, parse a script file written in the first programming language. In some examples, the first programming language includes an interpreted programming language, which has concise syntax and high iteration efficiency. When executing, it needs to be parsed and executed line by line through an interpreter. The first programming language may include, but is not limited to, Python, JavaScript, etc., and can be specifically determined according to the actual application scenario.

[0069] Optionally, different chip testing tasks may correspond to different script files. In some examples, after receiving a test instruction, the terminal obtains the corresponding script file according to the test instruction and parses it. Exemplarily, a process for parsing the script file and performing subsequent operations can be used as the terminal.

[0070] In some examples, the parameter information of the test object corresponding to the chip test task may include, but is not limited to, object parameter information, interface parameter information, task parameter information, etc., and can be specifically determined according to the actual application scenario. In some possible implementation manners, the parameter information may further include a configuration file obtained by processing the basic parameter information, etc.

[0071] Step S120: Send the parameter information to the first server to instruct the first server to run the first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in the second programming language based on a compiler that executes the second programming language dependency;

[0072] Exemplarily, there is a communication connection between the terminal and the first server. In some examples, the communication between the terminal and the first server can be established through a socket, and the communication protocol can adopt the TCP / IP protocol. After the terminal determines the parameter information, it sends the parameter information to the first server.

[0073] Optionally, the first server runs the first compiled text according to the parameter information to test the test object to obtain test data. Among them, the first compiled text is obtained by compiling a program file written in the second programming language based on a compiler that executes the second programming language dependency. In some examples, the second programming language includes a compiled programming language, which has high running performance and strong code reliability, and needs to be compiled by a compiler before execution, and runs directly after generating an executable file (such as the first compiled text). The second programming language may include, but is not limited to, C, C++, C#, etc., and can be specifically determined according to the actual application program.

[0074] In some examples, different test tasks and different parameter information may correspond to different program files, which can be specifically determined according to the actual application scenario. In some possible implementation manners, the corresponding program file can be determined according to the parameter information, and after compilation, the test task is executed.

[0075] Exemplarily, after the test is completed, the execution result, that is, the test data, is sent to the terminal.

[0076] Step S130: Receive the test data and determine the test result corresponding to the chip test task according to the test data.

[0077] Exemplarily, the terminal receives the test data and determines the test result corresponding to the chip test task according to the test data. In some examples, the test data is the result after the first compiled text runs, and the test result needs to be further parsed and processed.

[0078] Optionally, the test data is parsed according to the test task to determine the test result. In some examples, the test result may include, but is not limited to, passing the test, failing the test, etc., and can be specifically determined according to the actual application scenario. In one example, when the test result is failing, a warning message may be sent.

[0079] In the embodiment of the present disclosure, based on the interpreter that executes the first programming language, the script file is parsed to obtain the chip test task and the parameter information of the test object, and the parameter information is sent to the first server. The first server runs the first compiled text according to the parameter information to test the test object, obtains the test data, and the terminal receives the test data and determines the test result, thereby realizing the test of the chip. During the chip test process, the terminal executes test process actions such as parameter passing, data processing, and data analysis based on the first programming language, and the first server executes the test task based on the second programming language, realizing the functional division of the entire test task. Executing the test process based on the interpreted language ensures the efficiency of the test process, and the script development difficulty is low, without the need to handle a large number of underlying details, effectively reducing the data processing workload and improving the test process development efficiency. When modification or iterative adjustment is required, adjusting the script file written in the first programming language has a low workload and high flexibility; executing the test action based on the compiled language ensures the security and reliability of the test process. For high-performance requirement scenarios such as large-scale tests or complex tests, it can also quickly and accurately complete the test of the chip, obtain the test data, and is applicable to more application scenarios.

[0080] In one embodiment, the obtaining of the chip test task and the parameter information of the test object corresponding to the chip test task includes:

[0081] Obtain the chip test task, determine the test object and the first interface corresponding to the chip test task, and obtain the object parameter information of the test object and the interface parameter information of the first interface;

[0082] The running of the first compiled text according to the parameter information includes:

[0083] Receive the object parameter information and the interface parameter information, call the second interface that matches the interface parameter information, and run the first compiled text according to the object parameter information.

[0084] Exemplarily, the terminal obtains a chip test task and determines a first interface corresponding to the chip test task. Among them, the terminal may be provided with multiple first interfaces, which have a one-to-one mapping relationship with the second interfaces of the first server. According to the chip test task, the corresponding first interface can be determined. In one example, different chip test tasks may correspond to different first interfaces, which can be specifically set according to the task type, task purpose, etc. of the chip test task. For example, when the chip test task is a current test, the first interface corresponding to the current test of the terminal can be determined, and different first interfaces correspond to different interface parameter information. In a possible implementation manner, the first interface may be an API interface, and the interface parameter information may include API_Type.

[0085] Optionally, the object parameter information of the test object may include, but is not limited to, chip parameters, test variables, etc., which can be specifically determined according to the actual application scenario. The first server receives the object parameter information and the interface parameter information, determines the second interface on the first server side that matches the first interface according to the interface parameter information, and calls the second interface to run the first compilation text. In one example, different test tasks and different interfaces may correspond to different first compilation texts for implementing different test functions, which can be specifically determined according to the actual application scenario.

[0086] In the embodiment of the present disclosure, the terminal is provided with a first interface, the first server is provided with a second interface, and the first interface and the second interface match. During the chip test process, through the corresponding relationship between the interfaces, the corresponding interface can be called to implement the compilation of the program text and the execution of the test, realizing the dynamic parsing of the script file, having low syntax requirements for the script file, reducing the development workload, and improving the development efficiency of the test program; for scenarios such as large-scale tests or complex tests, the test tasks can be executed quickly and accurately, ensuring the efficiency and reliability of the test.

[0087] In one embodiment, the sending the parameter information to the first server includes:

[0088] Performing format conversion on the object parameter information and the interface parameter information according to a preset format conversion method to obtain the converted parameter information;

[0089] Sending the converted parameter information to the first server.

[0090] Exemplarily, when sending parameter information, format conversion is performed on the parameter information. In some examples, the object parameter information and the interface parameter information are format-converted according to a preset format conversion method to obtain the converted parameter information. The preset format conversion method can be determined according to the actual application scenario. For example, when the amount of parameter information to be transmitted is large, the preset format conversion method can be set to serialization processing, encoding compression processing, etc. to reduce the amount of data sent.

[0091] Optionally, the converted parameter information is packaged and sent to the first server. In one example, packaging can be performed according to a preset method.

[0092] In the embodiments of the present disclosure, when sending parameter information, format conversion is performed through a preset format conversion method, and the format-converted parameter information is sent, so that the information sent can be format-converted according to the actual application scenario. When the amount of data sent is large, format conversion can be performed to reduce the amount of data sent and improve the test efficiency, which is applicable to more application scenarios.

[0093] In one embodiment, receiving the object parameter information and the interface parameter information, and invoking a second interface that matches the interface parameter information includes:

[0094] Receiving the converted parameter information, and performing format conversion on the converted parameter information according to the preset format conversion method to obtain the object parameter information and the interface parameter information;

[0095] Verifying the interface parameter information, and invoking a second interface that matches the interface parameter information when the verification passes.

[0096] Exemplarily, after receiving the converted parameter information, the first server performs format conversion on the converted parameter information according to the preset format conversion method, and restores the converted parameter information to the object parameter information and the interface parameter information. In some examples, the preset format conversion method is used to restore the converted parameter information to the original data. For example, if the converted parameter information is obtained through serialization processing, after the first server receives the converted parameter information, it can be restored through deserialization processing to obtain the object parameter information and the interface parameter information.

[0097] Optionally, the first server verifies the interface parameter information to determine whether there is a second interface that matches the interface parameter information. If there is, it can be considered that the verification passes, and the interface is invoked to execute the test task. In some possible implementation manners, if not, it can be considered that the verification fails, and an error message is sent to the terminal.

[0098] In an embodiment of the present disclosure, the first server verifies the interface parameter information and calls the second interface when the verification passes, thereby ensuring the reliability of the test execution process. By verifying the parameter information, the accuracy of interface calls is improved, and it is applicable to more application scenarios.

[0099] In one embodiment, before parsing the script file written in the first programming language based on the interpreter that executes the first programming language dependency, it further includes:

[0100] In response to receiving a test instruction sent by the second server, obtain the script file written in the first programming language according to the test instruction;

[0101] The method further includes:

[0102] Determine the test environment information corresponding to the chip test task, and determine the third interface that matches the test environment information;

[0103] Send the interface parameter information of the third interface to the second server to instruct the second server to call the fourth interface that matches the third interface to run the second compiled text, where the second compiled text is obtained by compiling the program file that matches the test environment information based on the compiler that executes the second programming language dependency.

[0104] Exemplarily, a second server is further provided for setting and adjusting the test environment. In some possible implementation manners, at the start of the test task, the second server sends a test instruction to the terminal, and there is a communication connection between the second server and the terminal. The terminal obtains the corresponding script file written in the first programming language according to the test instruction. In one example, the test instruction may include test task information, and different test task information may correspond to different script files.

[0105] Optionally, when adjusting the environment information, determine the test environment information corresponding to the chip test task. Exemplarily, the terminal can obtain the test environment information by parsing the script file. In some possible implementation manners, the terminal is provided with a third interface, which corresponds one-to-one with the fourth interface of the second server and is used to execute different test environment adjustment tasks.

[0106] In some possible implementations, a corresponding third interface is determined according to the test environment information, and the interface parameter information of the third interface is sent to the second server. The second server calls a matching fourth interface to run the second compiled text according to the received interface parameter information. Exemplarily, the second compiled text is obtained by compiling a program text that matches the test environment information by a compiler, and the program text can be written in a second programming language. In one example, the second programming language in the first server and the second programming language in the second server can correspond to different compiled programming languages, which can be specifically determined according to the actual application scenario.

[0107] In the embodiments of the present disclosure, the terminal also communicates with the second server. By setting the terminal interface and the second server interface, the adjustment and setting of the test environment can be realized, further reducing the data processing workload and improving the test process development efficiency.

[0108] Figure 2 FIG. is a schematic diagram of a chip test architecture shown according to an exemplary embodiment. Refer to Figure 2As shown, an intermediate encapsulation layer is set to realize the conversion between the first interface of the terminal and the second interface of the first server. Specifically, the communication between the terminal and the first server is established through the socket, using the TCP / IP protocol, wherein the terminal can be a Python process and the first server can be a C++ process. The first server is responsible for listening to the terminal connection; the terminal initiates the connection with the first server through the IP and port number. The first server receives the test instruction of the second server and initializes the environment variables. In an example, the second server can be a C# process, corresponding to the robot handler, and the test instruction can be the SOT (start of test) instruction. The first server starts a thread and waits for the socket message. The terminal calls the corresponding first interface according to the test task, converts the parameter information, and sends it to the first server after packaging. In an example, the terminal serializes the parameters of the interface through json, packages the data, and sends it to the first server. For example, the packaged data is API_Type + json_args. Taking get_yml_file(file) packaging as an example, the format of get_yml_file(file) is get_yml_file; file. After receiving the socket message, the first server performs format conversion to obtain interface parameter information and object parameter information. In one example, the first server deserializes the json string and then obtains API_type (interface parameter information) and object parameter information. The first server enters the processor function and executes different functions according to the interface parameter information, such as executing the vdd_set function through a C++ process. The first server returns the execution result to the terminal. If the execution is successful, it returns OK; otherwise, it returns errorCode. After the terminal parses the return value of the first server, it parses whether the return value includes OK to determine whether it is successful. In one example, the first server returns the test result to the second server, that is, EOT, which means that ATE (corresponding to the first server) returns the test result to the handler, that is, the binned result is returned to the handler.

[0109] Figure 3 FIG. 1 is an interactive schematic diagram of a chip testing method according to an exemplary embodiment. Figure 3As shown, the second server listens for terminals and uses the TCP / IP protocol; the first server listens for terminals and uses the TCP / IP protocol; the terminal enables two clients to communicate with the second server and the first server respectively. In one example, different port numbers can be corresponding, for example, corresponding to port numbers 8888 and 9999; the terminal communicates with the second server, and the second server is responsible for controlling environmental temperature, humidity, air pressure, etc.; the terminal communicates with the first server, and the first server is responsible for testing related processes, such as IIC communication, Force, measure, etc.; the terminal waits for the processing result of the first server. In one possible implementation, the terminal corresponds to a Python process, the first server corresponds to an ATE process, that is, a C++ process, and the second server corresponds to a handler process (PLC), that is, a C# process.

[0110] Figure 4 It is a topological schematic diagram of a server structure shown according to an exemplary embodiment. The main control computer and the second server communicate with the test machine computer through a network switch, and the test machine computer is connected to the test environment to execute test tasks.

[0111] In one embodiment, the parameter information includes a configuration file, and the obtaining of the parameter information of the test object corresponding to the chip test task includes:

[0112] Obtain the object parameter information and task parameter information of the test object corresponding to the chip test task;

[0113] Generate a configuration file according to the object parameter information and the task parameter information;

[0114] The instructing the first server to run the first compilation text according to the parameter information includes:

[0115] Instruct the first server to install the configuration file and run the first compilation text according to the configuration file.

[0116] Exemplarily, the parameter information can include a configuration file. The terminal obtains the object parameter information and task parameter information of the test object. In some examples, the object parameter information can include but is not limited to test variables, etc., and the task parameter information can include but is not limited to expression operations, etc., which can be specifically determined according to the actual application scenario.

[0117] Optionally, a configuration file is generated according to the object parameter information and the task parameter information. In one example, since the terminal and the first server run based on different types of programming languages, the information corresponding to the test task in the script file can be converted into a task that can be processed by the second programming language through the configuration file.

[0118] In some possible implementation manners, the conversion process of the parameter information and the configuration file can be determined in advance according to the actual application scenario. By setting the parameter configuration method and the operation mode of the first server in different test scenarios, the generation method of the configuration file is set.

[0119] Exemplarily, after receiving the configuration file, the first server installs the configuration file and runs the first compiled text. In some examples, the configuration file is parsed by the first compiled text, and the corresponding operation process is sequentially executed to complete the test task.

[0120] In the embodiments of the present disclosure, a configuration file is generated according to the object parameter information and the task parameter information corresponding to the chip test task, and sent to the first server to instruct the first server to install the configuration file and run the first compiled text based on the second programming language to execute the test task, so that the chip test task can be executed quickly and accurately, and anomalies can be detected in time during the parsing process, reducing the risk of runtime crashes and ensuring the reliability and stability of the test process.

[0121] Figure 5 FIG. is a flowchart of a chip test method shown according to an exemplary embodiment. Refer to Figure 5 As shown, the terminal determines a script file according to a test instruction, such as a python script; parses the script file, and generates an expression tree (i.e., task parameter information) and a variable tree (i.e., object parameter information). Checks whether there is a corresponding interface for the expression operation in the first server. If so, continue; otherwise, return and report an error; converts the expression operations and variable assignments supported in the first server into the required configuration file, where the variables are stored in the ATE.json file and the expression operations are saved in the handler.xml; the program text corresponding to the first programming language in the first server parses the configuration file, installs the configuration file, and sequentially executes the corresponding operation process.

[0122] It should be understood that although the steps in the flowcharts of the above-described embodiments are shown in sequence according to the arrows, these steps do not necessarily have to be executed in the order indicated by the arrows. Unless otherwise clearly stated in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowcharts of the above-described embodiments may include multiple steps or multiple stages. These steps or stages do not necessarily have to be executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or steps in other steps.

[0123] Based on the same inventive concept, an embodiment of the present application further provides a chip testing device for implementing the chip testing method involved above. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the chip testing device provided below can refer to the limitations on the chip testing method in the above text and will not be repeated here.

[0124] In an exemplary embodiment, as Figure 6 shown, a chip testing device 600 is provided. The device is applied to a terminal and includes:

[0125] An acquisition module 610, configured to parse a script file written in the first programming language based on an interpreter dependent on the execution of the first programming language, and obtain a chip testing task and parameter information of a test object corresponding to the chip testing task;

[0126] A sending module 620, configured to send the parameter information to a first server, so as to instruct the first server to run a first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in the second programming language based on a compiler dependent on the execution of the second programming language;

[0127] A receiving module 630, configured to receive the test data and determine a test result corresponding to the chip testing task according to the test data.

[0128] In one of the embodiments, the acquisition module is further configured to:

[0129] Obtain a chip testing task, determine a test object and a first interface corresponding to the chip testing task, and obtain object parameter information of the test object and interface parameter information of the first interface;

[0130] The sending module is further configured to:

[0131] Receive the object parameter information and the interface parameter information, call a second interface matching the interface parameter information, and compile a program file written in the second programming language according to the object parameter information.

[0132] In one of the embodiments, the sending module is further configured to:

[0133] Perform format conversion on the object parameter information and the interface parameter information according to a preset format conversion method to obtain converted parameter information;

[0134] Send the converted parameter information to the first server.

[0135] In one embodiment, the sending module is further configured to:

[0136] Receive the converted parameter information, perform format conversion on the converted parameter information according to the preset format conversion method, and obtain the object parameter information and the interface parameter information;

[0137] Verify the interface parameter information, and call a second interface that matches the interface parameter information if the verification passes.

[0138] In one embodiment, the device is further configured to:

[0139] In response to receiving a test instruction sent by a second server, obtain a script file written in a first programming language according to the test instruction;

[0140] The device is further configured to:

[0141] Determine the test environment information corresponding to the chip test task, and determine a third interface that matches the test environment information;

[0142] Send the interface parameter information of the third interface to the second server to instruct the second server to call a fourth interface that matches the third interface to run a second compiled text, where the second compiled text is obtained by compiling a program file that matches the test environment information based on a compiler on which a second programming language depends.

[0143] In one embodiment, the parameter information includes a configuration file, and the obtaining module is further configured to:

[0144] Obtain the object parameter information and the task parameter information of the test object corresponding to the chip test task;

[0145] Generate a configuration file according to the object parameter information and the task parameter information;

[0146] The sending module is further configured to:

[0147] Instruct the first server to install the configuration file and run a first compiled text according to the configuration file.

[0148] Each module in the above chip test device can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in or independent of a processor in a computer device in the form of hardware, or stored in a memory in a computer device in the form of software, so as to facilitate the processor to call and execute the operations corresponding to the above respective modules.

[0149] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structural diagram may be as shown in Figure 7 . The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O), and a communication interface. Among them, the processor, the memory, and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data involved in the method described in this embodiment, such as parameter information. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with external terminals through a network connection. When the computer program is executed by the processor, it implements a chip testing method.

[0150] Those skilled in the art can understand that Figure 7 the structure shown in is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0151] In one embodiment, a computer device is further provided, including a memory and a processor. A computer program is stored in the memory, and when the processor executes the computer program, the steps in the above method embodiments are implemented.

[0152] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by the processor, the steps in the above method embodiments are implemented.

[0153] In one embodiment, a computer program product is provided, including a computer program. When the computer program is executed by the processor, the steps in the above method embodiments are implemented.

[0154] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use, and processing of relevant data need to comply with relevant regulations.

[0155] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in this application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in this application can be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, data processing logics based on quantum computing, artificial intelligence (AI) processors, etc., without limitation.

[0156] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as within the scope recorded in this application.

[0157] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation to the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all fall within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims

1. A chip testing method, characterized in that, Applied to a terminal, the method includes: In response to receiving a test instruction sent by a second server, obtain a script file written in a first programming language according to the test instruction; Based on an interpreter on which the first programming language depends, parse the script file written in the first programming language to obtain a chip test task and parameter information of a test object corresponding to the chip test task; Send the parameter information to a first server to instruct the first server to run a first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in a second programming language based on a compiler on which the second programming language depends; Receive the test data and determine a test result corresponding to the chip test task according to the test data; The method further includes: determining test environment information corresponding to the chip test task, and determining a third interface that matches the test environment information; sending interface parameter information of the third interface to the second server to instruct the second server to call a fourth interface that matches the third interface to run a second compiled text, where the second compiled text is obtained by compiling a program file that matches the test environment information based on a compiler on which the second programming language depends.

2. The method according to claim 1, wherein The obtaining the chip test task and parameter information of the test object corresponding to the chip test task includes: Obtain a chip test task, determine a test object and a first interface corresponding to the chip test task, and obtain object parameter information of the test object and interface parameter information of the first interface; The running the first compiled text according to the parameter information includes: Receive the object parameter information and the interface parameter information, and call a second interface that matches the interface parameter information, and run the first compiled text according to the object parameter information.

3. The method according to claim 2, wherein The sending the parameter information to the first server includes: Perform format conversion on the object parameter information and the interface parameter information according to a preset format conversion method to obtain converted parameter information; Send the converted parameter information to the first server.

4. The method according to claim 3, wherein The receiving the object parameter information and the interface parameter information and calling a second interface that matches the interface parameter information includes: Receive the converted parameter information, and perform format conversion on the converted parameter information according to the preset format conversion method to obtain the object parameter information and the interface parameter information; Verify the interface parameter information, and call a second interface that matches the interface parameter information when the verification passes.

5. The method according to claim 1, wherein The parameter information includes a configuration file, and the obtaining the parameter information of the test object corresponding to the chip test task includes: Obtain object parameter information and task parameter information of a test object corresponding to the chip test task; Generate a configuration file according to the object parameter information and the task parameter information; The instructing the first server to run the first compiled text according to the parameter information includes: to instruct the first server to install the configuration file and run a first compiled text according to the configuration file.

6. A chip testing device, characterized in that, The device is applied to a terminal, and the device includes: an acquisition module, configured to, in response to receiving a test instruction sent by a second server, obtain a script file written in a first programming language according to the test instruction; based on an interpreter on which the first programming language depends, parse the script file written in the first programming language to obtain a chip test task and parameter information of a test object corresponding to the chip test task; a sending module, configured to send the parameter information to a first server to instruct the first server to run a first compiled text according to the parameter information, test the test object to obtain test data, and send the test data to the terminal, where the first compiled text is obtained by compiling a program file written in a second programming language based on a compiler on which the second programming language depends; a receiving module, configured to receive the test data and determine a test result corresponding to the chip test task according to the test data; The device is further configured to: determine test environment information corresponding to the chip test task, and determine a third interface that matches the test environment information; send interface parameter information of the third interface to the second server to instruct the second server to call a fourth interface that matches the third interface to run a second compiled text, where the second compiled text is obtained by compiling a program file that matches the test environment information based on a compiler on which the second programming language depends.

7. The device according to claim 6, characterized in that, The acquisition module is further configured to: obtain a chip test task, determine a test object and a first interface corresponding to the chip test task, and obtain object parameter information of the test object and interface parameter information of the first interface; The sending module is further configured to: receive the object parameter information and the interface parameter information, call a second interface that matches the interface parameter information, and compile a program file written in the second programming language according to the object parameter information.

8. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

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