IV test device and method for solar cell

Abstract

The embodiment of the invention provides an IV testing device and method of a solar cell, and belongs to the technical field of performance testing of the solar cell. The IV testing device of the solar cell comprises a carrying platform; an upper wire row assembly; the upper wire row assembly comprises a first fixing frame and a plurality of detection wires distributed in the first fixing frame, the first fixing frame comprises a first side and a second side which are opposite to each other, and the detection wires extend from the first side to the second side; the interval between the plurality of detection lines is matched with the fine grid interval on the first surface of the photovoltaic module; and the lifting assembly is used for driving the first fixing frame to ascend or descend relative to the carrying table. According to the embodiment of the invention, the IV characteristic of the photovoltaic module is tested through the plurality of detection lines, so that the plurality of detection lines are in contact with the fine grid on the first surface of the photovoltaic module. The contact mode of the plurality of detection lines and the fine grid increases the opportunity of contact between the detection lines and the fine grid, can ensure that the fine grid is in contact with the detection lines, and ensures that a stable and accurate test result is obtained.

Description

Technical Field

[0001] This application relates to the technical field of performance testing of solar cells, and particularly to an IV testing device and method for solar cells. Background Art

[0002] The development of solar cells from front multi-main grids to no-main grids can further increase the light-receiving area and save the cost of silver paste. However, when performing IV (current-voltage) testing on no-main grid cells, currently, probes are used for detection. It is difficult to ensure contact between some fine grid lines and the probes, resulting in the inability to collect current and affecting the test results; it is easy to cause a waste of more time costs during the fine grid testing of no-main grid cell wafers.

[0003] It should be noted that the above content is not necessarily prior art and does not limit the patent protection scope of this application. Summary of the Invention

[0004] Embodiments of this application provide an IV testing device and method for solar cells to solve or alleviate one or more of the above-mentioned technical problems.

[0005] As an aspect of the embodiments of this application, embodiments of this application provide an IV testing device for solar cells, including: A carrier stage for carrying the photovoltaic module to be tested; An upper wire row assembly; the upper wire row assembly includes a first fixing frame and detection wires distributed within the first fixing frame, and the intervals between multiple detection wires are adapted to the fine grid pitch on the first surface of the photovoltaic module; A lifting assembly for driving the first fixing frame to rise or fall relative to the carrier stage.

[0006] In one implementation, the carrier stage includes: A bearing frame; A second fixing frame fixed to the bearing frame; the second fixing frame includes a third side and a fourth side arranged opposite to each other; Multiple probe mounting strips extending from the third side to the fourth side; Multiple probes mounted below the multiple probe mounting strips, and the distribution of the multiple probes is adapted to the fine grid distribution on the second surface of the photovoltaic module; the second surface is the side opposite to the first surface.

[0007] In one implementation, the multiple probe mounting strips are fixed to the second fixing frame, and the photovoltaic module to be tested is placed on the upper surface formed by the multiple probe mounting strips. The upper surface is curved downward in an arc along the direction towards the third side and the fourth side from the central area, and the area of the central area is adapted to the area of the photovoltaic module.

[0008] In one embodiment, the first fixed frame includes: An upper frame, which is used for fixedly connecting with the lifting component; A plurality of connecting members, each connecting member including an opposite first end and a second end, the first end being fixedly connected to the upper frame; A tensioning shaft, which is arranged on the first side and / or the second side and is rotatably connected to the second end of the connecting member, and the detection line surrounds the tensioning shaft for at least one turn and then is fixed to the upper frame.

[0009] In one embodiment, the upper wire row assembly further includes: a plurality of servo motors, which are fixed to the upper frame, and one servo motor corresponds to one detection line, and the output shaft of the servo motor is fixedly connected to the end of the detection line.

[0010] In one embodiment, it further includes: A vibration generating device, which is used to make multiple detection lines vibrate; A frequency receiving device, which is used to receive the vibration frequency signal and send the vibration frequency signal to the control terminal so that the control terminal processes the vibration frequency signal.

[0011] In one embodiment, the vibration generating device includes: A lever, on the upper surface of which there are a plurality of paddle claws, and the distribution of the paddle claws is adapted to the distribution of the multiple detection lines.

[0012] In one embodiment, the vibration generating device further includes: a horizontal moving component, which includes a moving platform that moves above the carrier, and the lever is arranged on the moving platform.

[0013] As another aspect of the embodiments of the present application, the embodiments of the present application provide a method for IV testing of a solar cell, including: Obtaining the tension detection results of multiple detection lines in the upper wire row assembly; When the detection result shows that the tension meets the preset conditions, placing the photovoltaic component to be tested on the carrier; Controlling the lifting component to drive the upper wire row assembly to be close to the upper surface of the photovoltaic component to be tested to obtain the IV test result of the photovoltaic component to be tested.

[0014] In one embodiment, obtaining the tension detection results of multiple detection lines in the upper wire row assembly includes: Moving the vibration generating device below the multiple detection lines; Moving the vibration generating device to make the multiple detection lines vibrate; Based on the vibration frequency signal collected by the frequency receiving device, determining the tension detection results of the multiple detection lines in the upper wire row assembly.

[0015] In the embodiments of the present application, the IV characteristics of a photovoltaic module are tested by means of multiple detection lines, such that the multiple detection lines are in contact with the fine grids on the first surface of the photovoltaic module. The contact mode between the multiple detection lines and the fine grids increases the chance of contact between the detection lines and the fine grids, ensuring that the fine grids are in contact with the detection lines and ensuring stable and accurate test results. Description of the Drawings In the drawings, unless otherwise specified, the same reference numerals throughout the several views refer to the same or similar components or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings only depict some embodiments disclosed in the present application and should not be regarded as limiting the scope of the present application.

[0016] Figure 1 A schematic structural diagram of an IV test device for a solar cell provided by an embodiment of the present application is shown.

[0017] Figure 2 A schematic structural diagram of an upper row component provided by an embodiment of the present application is shown.

[0018] Figure 3 A schematic structural diagram of a stage provided by an embodiment of the present application is shown.

[0019] Figure 4 A schematic structural diagram of another perspective of the stage provided by an embodiment of the present application is shown.

[0020] Figure 5 A schematic structural diagram of an IV test device for a solar cell provided by another embodiment of the present application is shown.

[0021] Figure 6 A schematic flowchart of an IV test method for a solar cell provided by an embodiment of the present application is shown. Detailed Description of the Embodiments

[0022] In order to make the objectives, technical solutions and advantages of the present application more clear and understandable, the present application will be further described in detail below with reference to the drawings and embodiments. It should be noted that, without conflict, the embodiments in the present application and the features in the embodiments may be combined with each other. The present application will be described in detail below with reference to the drawings and embodiments.

[0023] It should be noted that the terms "first", "second", etc. in the description, claims and the above drawings of this application are used to distinguish similar objects, and do not necessarily describe a specific order or sequence. It should be understood that these terms can be interchanged under appropriate circumstances, so that the embodiments of this application described here can be implemented in an order other than those illustrated or described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or are inherent to these processes, methods, products or devices.

[0024] In this application, when it comes to numerical intervals (i.e., numerical ranges), unless otherwise specified, the distribution of the optional numerical values within the numerical interval is considered continuous, and includes the two numerical endpoints of the numerical interval (i.e., the minimum value and the maximum value), as well as each numerical value between these two numerical endpoints. Unless otherwise specified, when the numerical interval only refers to the integers within the numerical interval, it includes the two endpoint integers of the numerical range, as well as each integer between the two endpoints, which is equivalent to directly listing each integer. When providing multiple numerical ranges to describe features or characteristics, these numerical ranges can be combined. In other words, unless otherwise specified, the numerical ranges disclosed in this application should be understood to include any and all sub-ranges subsumed therein. The "numerical value" in the numerical interval can be any quantitative value, such as a number, a percentage, a ratio, etc. The "numerical interval" allows for a broad inclusion of quantitative intervals such as percentage intervals, ratio intervals, and ratio value intervals.

[0025] Next, exemplary embodiments according to this application will be described in more detail with reference to the drawings. It should be noted that these exemplary embodiments can be implemented in many different forms and should not be construed as being limited only to the embodiments described herein.

[0026] An embodiment of this application provides an IV (current-voltage) test device for a solar cell. Figure 1 The structural schematic diagram of the IV test device for a solar cell provided by an embodiment of this application is shown, as Figure 1 shown, the IV test device for a solar cell includes a stage 100, an upper wire row assembly, and a lifting assembly 300.

[0027] The stage 100 is used to carry the photovoltaic module to be tested; the photovoltaic module to be tested is placed on the stage 100 to facilitate the IV test of the photovoltaic module.

[0028] The IV test of a solar cell is an important means to evaluate the performance of a solar cell. It is based on the principles of the photovoltaic effect and circuit measurement. By measuring the current response of the solar cell at different voltages, the current-voltage (IV) curve is obtained. By analyzing the IV curve, we can obtain important parameters such as the open-circuit voltage, short-circuit current, fill factor, and conversion efficiency of the solar cell. The open-circuit voltage reflects the voltage value of the solar cell at the maximum output power, and the short-circuit current represents the ability of the solar cell at the maximum output current. The fill factor describes the "fullness" of the IV curve, which reflects the performance of the solar cell near the maximum power point. The conversion efficiency is the efficiency of the solar cell in converting light energy into electrical energy.

[0029] The upper wire row assembly includes a first fixing frame 210 and detection wires 220 distributed within the first fixing frame 210. The first fixing frame 210 includes opposite first and second sides, and the detection wires 220 extend from the first side to the second side; the intervals between the multiple detection wires 220 are adapted to the fine grid pitch on the first surface of the photovoltaic module.

[0030] In one example, the detection wires 220 can be copper wires or molybdenum wires.

[0031] In the embodiment of the present application, the IV characteristics of the photovoltaic module are tested by means of multiple detection wires 220, so that the multiple detection wires 220 are in contact with the fine grids on the first surface of the photovoltaic module, and the current and voltage of the photovoltaic module under illumination are obtained, thereby performing a current-voltage test. The contact mode of the multiple detection wires 220 with the fine grids increases the chance of contact between the detection wires 220 and the fine grids, which can ensure that the fine grids are in contact with the detection wires 220 and ensure stable and accurate test results.

[0032] Furthermore, the multiple detection wires 220 can be fixed in a frame form such as the first fixing frame 210, etc., avoiding the situation that the photovoltaic module is blocked by fixing the multiple probe mounting bars 130 in sequence with fixing strips, which affects the power generation of the photovoltaic module.

[0033] The lifting assembly 300 is used to drive the first fixing frame 210 to rise or fall relative to the stage 100.

[0034] It can be understood that before the photovoltaic module is placed on the stage 100, the first fixing frame 210 is controlled to rise to a certain position to facilitate the placement of the photovoltaic module. After the photovoltaic module is placed properly, the first fixing frame 210 is then controlled to descend until the detection wires 220 are in contact with the fine grids on the first surface of the photovoltaic module to complete the IV test. After the test is completed, the first fixing frame 210 is controlled to rise to remove the tested photovoltaic module.

[0035] The lifting assembly 300 can be Figure 1The structure shown in [description] can also be any other structure that those skilled in the art can currently or will be able to conceive in the future and can drive the first fixed frame 210 to rise and fall above the stage 100.

[0036] In one example, a detection line 220 can be set corresponding to one fine grid, and the distance between adjacent detection lines 220 is equal to the fine grid pitch. When the first fixed frame 210 descends once, the IV test of the first surface of the photovoltaic module can be completed.

[0037] In one example, a detection line 220 can be set corresponding to two (in other cases, it can also be 3, 4, etc.) fine grids. The distance between adjacent detection lines 220 is 2 times the fine grid pitch. After the first fixed frame 210 descends once and the test is completed, then move the first fixed frame 210 by 1 / 2 the distance of the detection line 220 in the direction where the detection lines 220 are arranged, so that the detection lines 220 move to the fine grid adjacent to the original aligned fine grid, thereby completing the IV test of the first surface of the photovoltaic module through 2 tests.

[0038] In one example, the first surface can be the front and / or back of the photovoltaic module. In the case where the photovoltaic module is a bifacial cell, the front and back of the photovoltaic module can be used as the first surface respectively for testing one by one.

[0039] In one example, the first surface can be the front of the photovoltaic module. If there are still fine grids on the back of the photovoltaic module, a probe mounting strip 130 can be set below the stage 100 to contact the fine grids on the back of the photovoltaic module, test the fine grids on the back of the photovoltaic module, and can complete the test simultaneously with the fine grids on the front of the photovoltaic module.

[0040] In one embodiment, as Figure 2 and Figure 3 shown, the stage 100 includes a carrier frame 110, a second fixed frame 120, a plurality of probe mounting strips 130 and a plurality of probes 140.

[0041] The carrier frame 110 can be fixed to the ground or fixed to the frame, depending on the actual test environment. If the carrier frame 110 is fixed to the frame, the height of the carrier frame 110 is slightly lower. If the carrier frame 110 is fixed to the ground, the height of the carrier frame 110 is slightly higher. The prerequisite is that the carrier frame 110 can be stably placed.

[0042] The second fixing frame 120 is fixed on the carrier frame 110. The second fixing frame 120 is used to fix a plurality of probe mounting bars 130. The second fixing frame 120 can be integrally formed with the carrier frame 110 or can be a separate device fixedly connected. The second fixing frame 120 is separately arranged from the carrier frame 110, which can facilitate first firmly fixing the probe mounting bars 130 and the probes 140 to the second fixing frame 120, and then fixing the completed second fixing frame 120 to the carrier frame 110, facilitating the installation of the IV test device.

[0043] The second fixing frame 120 includes a third side and a fourth side arranged oppositely; a plurality of probe mounting bars 130 extend from the third side to the fourth side. There can be a spacing between the plurality of probe mounting bars 130 to facilitate light transmission and avoid affecting the power generation efficiency of the photovoltaic module and the test results.

[0044] A plurality of probes 140 are fixed below the plurality of probe mounting bars 130, and the distribution of the plurality of probe mounting bars 130 is adapted to the fine grid distribution on the second surface of the photovoltaic module; the second surface is the side opposite to the first surface.

[0045] A plurality of probes 140 can pass through the probe mounting bars 130, so that the ends of the probes 140 are exposed on the surface of the probe mounting bars 130 to contact the fine grid of the photovoltaic module. One fine grid can be arranged corresponding to a plurality of probes 140.

[0046] It can be understood that in this case, the first surface is the front side of the photovoltaic module, and the second surface is the back side of the photovoltaic module.

[0047] In the embodiment of the present application, by setting the distribution of a plurality of probes 140 on the stage 100, the IV test can be simultaneously performed on the front side and the back side of the photovoltaic module, improving the test efficiency.

[0048] In one example, a light-transmitting window 111 can be provided on the side wall of the carrier frame 110 to facilitate light to irradiate in from the light-transmitting window 111 on the side wall, avoiding completely blocking the back side of the photovoltaic module and affecting the test results of the photovoltaic module, causing the test results of the photovoltaic module to deviate from the actual application environment and reducing the reference significance of the test results.

[0049] In one implementation manner, a plurality of probe mounting bars 130 are fixed on the second fixing frame 120, and the photovoltaic module to be tested is placed on the upper surface formed by the plurality of probe mounting bars 130. The upper surface is curved downward in an arc along the direction towards the third side and the fourth side from the central region, and the area of the central region is adapted to the area of the photovoltaic module.

[0050] The central region remains flush so that the probe mounting bars 130 in the central region can all contact the fine grid of the photovoltaic module.

[0051] In one example, the probe 140 can be arranged only at the position corresponding to the central region of the upper surface, and no probe 140 is arranged in the region outside the central region.

[0052] The upper surface is curved downward in an arc along the direction towards the third side and the fourth side from the central region, which can make it more convenient for the multiple detection lines 220 in the upper wire row assembly to be in full contact with the photovoltaic module, and avoid the situation that part of the region in the upper wire row assembly is not in contact with the upper surface, resulting in difficulty for the detection line 220 to contact the photovoltaic module.

[0053] Furthermore, the setting that the upper surface is curved downward in an arc along the direction towards the third side and the fourth side from the central region can also make the detection line 220 continue to exert a downward force on the first fixing frame 210 after contacting the photovoltaic module during the process of the upper wire row assembly descending, so as to press the detection line 220 downward, which can better ensure the contact between the detection line 220 and the fine grid of the photovoltaic module.

[0054] In one implementation manner, as Figure 4 shown, the first fixing frame 210 includes an upper frame 211, a plurality of connecting members 212 and a tensioning shaft 213.

[0055] The upper frame 211 is used for fixedly connecting with the lifting assembly 300. The upper frame 211 can be provided with an edge convenient for fixing with the lifting assembly 300.

[0056] The connecting member 212 includes an opposite first end and a second end. The first end is fixedly connected with the upper frame 211; the second end is rotatably connected with the tensioning shaft 213, so that the tensioning shaft 213 can rotate. The detection line 220 surrounds the tensioning shaft 213 at least one circle and then is fixed to the upper frame 211. After the detection line 220 is pulled up, the tensioning shaft 213 rotates, thereby increasing the tension of the detection line 220 between the first side and the second side. By pulling up the detection line 220, the tension of the detection line 220 can be correspondingly adjusted to keep the multiple detection lines 220 all have appropriate tension to contact the fine grid of the photovoltaic module. If the tension of the detection line 220 is small, it is difficult to ensure that the detection line 220 has a pressure towards the fine grid, and it is easy to deform, resulting in affecting the test results.

[0057] In one example, the detection line 220 can also be fixedly connected with the tensioning shaft 213, and by rotating the tensioning shaft 213, multiple detection lines 220 are simultaneously tensioned.

[0058] In the embodiment of the present application, through the setting of the tensioning shaft 213, the tension of the detection line 220 can be adjusted to ensure that the tensions of the multiple detection lines 220 all meet the test requirements.

[0059] The tensioning shaft 213 can be a cylindrical circular roller.

[0060] In one example, in the first fixed frame 210, the tensioning shaft 213 on either the first side or the second side can be rotatably connected to the connecting member 212, while the tensioning shaft 213 on the other side is fixedly connected to the connecting member 212. By adjusting the tensioning shaft 213 on one side, the tension of the detection line 220 can be adjusted. This method can prevent the rotation of the tensioning shaft 213 on the opposite side during the adjustment process, which may affect the adjustment efficiency.

[0061] In one example, in the first fixed frame 210, the tensioning shafts 213 on both the first side and the second side can be rotatably connected to the connecting member 212. By adjusting the tensioning shaft 213 on either side, the tension of the detection line 220 can be adjusted.

[0062] In one implementation, the upper wire row assembly further includes: a plurality of servo motors 230. The plurality of servo motors 230 are fixed to the upper frame 211, and one servo motor 230 corresponds to one detection line 220. The output shaft of the servo motor 230 is fixedly connected to the end of the detection line 220.

[0063] One servo motor 230 is provided corresponding to one detection line 220. The servo motor 230 can drive the corresponding detection line 220 to be pulled up, thereby adjusting the tension of the detection line 220.

[0064] It can be understood that the servo motor 230 can be provided only at one end of the detection line 220, or can be provided at both ends of the detection line 220 respectively.

[0065] In one implementation, as Figure 5 shown, the IV test device for solar cells further includes a vibration generating device (not shown in the figure) and a frequency receiving device 400.

[0066] The vibration generating device is used to vibrate the plurality of detection lines 220; the frequency receiving device 400 is used to receive the vibration frequency signal and send the vibration frequency signal to the control terminal, so that the control terminal processes the vibration frequency signal.

[0067] In the embodiment of the present application, the vibration generating device vibrates the detection line 220 to generate a vibration frequency, and then the vibration frequency signal is collected to measure the tension of the detection line 220. Based on the specific tension data, it is determined whether the tension of the detection line 220 needs to be adjusted, making the test process of the IV test device more stable and the test results more reliable.

[0068] The vibration generating device can be any device that can vibrate the detection line 220. For example, it can be a tuning fork. The vibration generating device can vibrate the plurality of detection lines 220 simultaneously or one by one.

[0069] The control terminal has data processing capabilities and can determine whether it is necessary to adjust the tension of the detection lines 220, which detection line 220 needs to be adjusted, and the magnitude of the adjustment amount based on the received frequency.

[0070] There is the following relationship between the vibration frequency and the tension:

[0071] Among them, f is the vibration frequency, F is the tension, k is a constant coefficient, L is the length of the detection line 220, which can be the length between two opposite tensioning shafts 213.

[0072] In one example, the servo motor 230 can be communicatively connected to the control terminal so that the control terminal can control the start and output of the servo motor 230.

[0073] In one embodiment, the vibration generating device includes a lever 510. A plurality of paddle claws (not shown in the figure) are provided on the upper surface of the lever 510, and the distribution of the paddle claws is adapted to the distribution of the plurality of detection lines 220. When the lever 510 is horizontally moved, the paddle claws contact the detection lines 220 and drive the detection lines 220 to vibrate.

[0074] In one embodiment, the vibration generating device further includes: a horizontal movement assembly 520. The horizontal movement assembly 520 includes a moving platform 521. The moving platform 521 moves above the carrier 100, and the lever 510 is disposed on the moving platform 521.

[0075] In one example, the bottom of the lever 510 is a flat surface to be stably placed on the moving platform 521. When the horizontal movement assembly 520 moves, it drives the lever 510 to move, thereby causing the detection lines 220 to vibrate.

[0076] The embodiment of the present application further provides an IV test method for a solar cell, which is applied to the IV test device for a solar cell in any one of the above embodiments. Figure 6 The flowchart showing the IV test method for a solar cell provided by the embodiment of the present application is as Figure 6 shown. The IV test method for a solar cell includes: S610, obtaining the tension detection results of multiple detection lines in the upper row assembly.

[0077] S620, when the detection result shows that the tension meets the preset conditions, placing the photovoltaic component to be tested on the carrier.

[0078] S630, controlling the lifting assembly to drive the upper row assembly to close to the upper surface of the photovoltaic component to be tested, and obtaining the IV test result of the photovoltaic component to be tested.

[0079] In the embodiment of the present application, after detecting the tension of multiple detection lines first, the IV test of the photovoltaic module is then carried out to ensure that the tension of the multiple detection lines in the test device meets the preset conditions and satisfies the conditions for accurately measuring the IV test of the photovoltaic module.

[0080] The preset condition may be that the tension values of the multiple detection lines are within a preset difference range, then it is determined that the tensions of the multiple detection lines are basically the same and can all meet the requirements for carrying out the IV test.

[0081] By using the IV test method for the photovoltaic module provided by the embodiment of the present application, the obtained IV test result of the photovoltaic module is more stable and reliable, and it is not easy to have omissions, resulting in the situation that the test result cannot correctly represent the optical performance of the photovoltaic module.

[0082] In one implementation manner, step S610 includes: Move the vibration generating device below the multiple detection lines; Move the vibration generating device to make the multiple detection lines vibrate; Based on the vibration frequency signal collected by the frequency receiving device, determine the tension detection result of the multiple detection lines in the upper row assembly.

[0083] Based on the relationship between the vibration frequency and the tension, the embodiment of the present application uses the cooperation of the vibration generating device and the frequency generating device to test the tension of the detection line. The obtained tension test result is accurate, has an intuitive reference value, and is convenient for adjusting the tension of the detection line based on the tension test result.

[0084] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0085] For ease of description, the orientation or positional relationship indicated by orientation terms such as "front, rear, top, bottom, left, right", "horizontal, vertical, perpendicular, horizontal" and "top, bottom", etc. is usually based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description. Without contrary description, these orientation terms do not indicate and imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation on the protection scope of the present application; the orientation terms "inside, outside" refer to the inside and outside relative to the contour of each component itself. For example, if the device in the drawing is inverted, the device described as "above other devices or structures" or "on top of other devices or structures" will be positioned as "below other devices or structures" or "beneath other devices or structures" afterwards. Thus, the exemplary term "above" can include both the orientations of "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and corresponding interpretations are made for the relative spatial descriptions used here.

[0086] Unless otherwise clearly specified and defined, terms such as "install", "connect", "couple", "fix", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection, an electrical connection, or a communication connection; it can be directly connected, or indirectly connected through an intermediate medium, and can be the internal communication of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0087] Unless otherwise clearly specified and defined, the first feature being "above" or "below" the second feature can include the direct contact between the first and second features, or can also include the situation where the first and second features are not in direct contact but in contact through other features between them. Moreover, the first feature being "above", "over" and "on top of" the second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is at a higher horizontal level than the second feature. The first feature being "beneath", "under" and "below" the second feature includes the first feature being directly below and obliquely below the second feature, or simply indicating that the first feature is at a lower horizontal level than the second feature.

[0088] Unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present application. At the same time, it should be understood that, for the sake of convenience of description, the dimensions of the various parts shown in the drawings are not drawn in actual proportional relationship. Technologies, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, such technologies, methods, and devices should be regarded as part of the authorization specification. In all the examples shown and discussed here, any specific value should be construed as merely exemplary, rather than as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that like reference numerals and letters denote like items in the following drawings, and thus, once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0089] It should also be noted that the "one embodiment", "another embodiment", "embodiment", etc. mentioned in this specification refer to the specific features, structures, or characteristics described in connection with that embodiment being included in at least one embodiment generally described in the present application. The same expression appearing in multiple places in the specification does not necessarily refer to the same embodiment. Further, when describing a specific feature, structure, or characteristic in connection with any embodiment, it is intended that the implementation of such feature, structure, or characteristic in combination with other embodiments also fall within the scope of the present application.

[0090] In the above embodiments, the descriptions of the various embodiments have their own emphases. For parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0091] It should also be noted that the above are only the preferred embodiments of the present application, and do not limit the scope of patent protection of the present application. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present application, or directly or indirectly applied in other related technical fields, shall be similarly included in the scope of patent protection of the present application.

Claims

1. A solar cell IV test device, characterized in that: include: A carrier, the carrier being used to carry the photovoltaic module to be tested; An upper line row assembly; the upper line row assembly comprises a first fixing frame and detection lines distributed in the first fixing frame, and the intervals between the plurality of detection lines are adapted to the fine grid spacing of the first surface of the photovoltaic assembly; A lifting assembly is used to drive the first fixing frame to rise or fall relative to the carrier.

2. The IV test device for solar cells according to claim 1, characterized in that: The carrier comprises: Carrying frame; A second fixing frame, the second fixing frame being fixed on the supporting frame; the second fixing frame comprising a third side and a fourth side which are arranged opposite to each other; a plurality of probe mounting strips extending from the third side to the fourth side; A plurality of probes are installed below the plurality of probe installation strips, and the distribution of the plurality of probes is adapted to the distribution of fine grids on the second surface of the photovoltaic component; the second surface is a surface opposite to the first surface.

3. The IV test device for solar cells according to claim 2, characterized in that: The multiple probe mounting bars are fixed on the second fixed frame, and the photovoltaic component to be tested is placed on the upper surface formed by the multiple probe mounting bars. The upper surface is bent downward in an arc from the central area along the direction toward the third side and the fourth side, and the area of ​​the central area is adapted to the area of ​​the photovoltaic component.

4. The IV testing device for solar cells according to claim 1, characterized in that: The first fixing frame includes: An upper frame, the upper frame being used for being fixedly connected to the lifting assembly; A plurality of connecting members, each of which includes a first end and a second end opposite to each other, wherein the first end is fixedly connected to the upper frame; A tensioning shaft is arranged on the first side and / or the second side and is rotatably connected to the second end of the connecting member. The detection line surrounds the tensioning shaft at least once and is then fixed to the upper frame.

5. The IV testing device for solar cells according to claim 4, characterized in that: The upper wire row assembly further includes: a plurality of servo motors, the plurality of servo motors are fixed to the upper frame, and one servo motor corresponds to one detection line, and the output shaft of the servo motor is fixedly connected to the end of the detection line.

6. The IV testing device for solar cells according to any one of claims 1 to 5, characterized in that: Also includes: A vibration generating device, the vibration generating device is used to make the plurality of detection wires vibrate; A frequency receiving device is used to receive a vibration frequency signal and send the vibration frequency signal to a control terminal so that the control terminal processes the vibration frequency signal.

7. The IV testing device for solar cells according to claim 6, characterized in that: The vibration generating device comprises: A shifting rod, wherein the upper surface of the shifting rod is provided with a plurality of shifting claws, and the distribution of the shifting claws is adapted to the distribution of the plurality of detection lines.

8. The IV testing device for solar cells according to claim 7, characterized in that: The vibration generating device further comprises: a horizontal moving component, the horizontal moving component comprises a moving platform, the moving platform moves above the carrier, and the shifting rod is arranged on the moving platform.

9. A method for IV testing of a solar cell, characterized in that: include: Obtaining tension test results of multiple detection wires in the upper wire assembly; When the detection result shows that the tension meets the preset condition, placing the photovoltaic module to be tested on the carrier; The lifting assembly is controlled to drive the upper line row assembly to stick to the upper surface of the photovoltaic assembly to be tested, so as to obtain the IV test result of the photovoltaic assembly to be tested.

10. The IV testing method of solar cells according to claim 9, characterized in that: The obtaining of the tension detection results of the plurality of detection wires in the upper wire row assembly comprises: moving the vibration generating device below the plurality of detection lines; Moving the vibration generating device to cause the plurality of detection wires to vibrate; Based on the vibration frequency signal collected by the frequency receiving device, the tension detection results of the multiple detection wires in the upper wire row assembly are determined.

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