Power amplifier tube temperature compensation method, device and equipment based on nuclear magnetic resonance and medium

Abstract

The invention relates to a power amplifier tube temperature compensation method and device based on nuclear magnetic resonance, equipment and a medium, and the method comprises the steps: judging whether the actual quiescent current of a current power amplifier tube is deviated from the target quiescent current or not before a nuclear magnetic resonance power amplifier is enabled and a pulse is transmitted; if deviation exists between the actual quiescent current and the target quiescent current, eliminating the deviation by adjusting the grid voltage of a power amplifier tube so as to perform transient compensation on temperature change caused by the deviation in a transmission pulse; and after the current pulse emission is completed, the grid voltage of the power amplifier tube is reset. The grid voltage of the power amplifier tube is adjusted in the emission protection time slot after the power amplifier is enabled each time, and the current static current error of the power amplifier tube is eliminated in real time, so that the thermal accumulation of the junction temperature of the power amplifier tube is avoided, and the problem that the power amplifier tube is damaged due to the rated junction temperature accumulation caused by the thermal positive feedback of the power amplifier tube is solved.

Description

Technical Field

[0001] The present application relates to the technical field of power amplifiers, and in particular, to a method, device, equipment and medium for temperature compensation of power amplifier tubes based on nuclear magnetic resonance. Background Technique

[0002] The nuclear magnetic resonance radio frequency power amplifier is a typical pulsed power amplifier with a power in the order of dozens of kilowatts and generates a large amount of heat during operation. Without temperature compensation, the gate voltage remains constant. As the radio frequency emission heat dissipation occurs, the junction temperature of the radio frequency power amplifier tube increases rapidly, which will further lead to an increase in the static current, an increase in the conduction angle, and a decrease in efficiency. As a result, the heat dissipation further increases. Eventually, at the end of the radio frequency pulse, the junction temperature, conduction angle, static current, and heat dissipation reach their maximum values, and the efficiency reaches its minimum value. Although the junction temperature will drop during the reception stage without heat dissipation (at this time, the static current is 0), due to the problem of heat capacity, in the case of high average power (high duty cycle) emission, the junction temperature does not have time to return to the reference temperature before the next emission time slot starts, and the junction temperature accumulation of the next emission time slot begins again. This causes a positive thermal feedback. When the cumulative increase in the rated junction temperature exceeds the limit value of the power amplifier tube, it will lead to the damage of the power amplifier tube. That is to say, the positive thermal feedback of the power amplifier tube will cause the cumulative increase in the rated junction temperature and thus damage the power amplifier tube.

[0003] In addition, since the power of the nuclear magnetic resonance power amplifier is much greater than that of commercial radio frequency power amplifier tubes, this means that the nuclear magnetic resonance power amplifier is usually composed of the power synthesis of more than ten radio frequency power amplifier tubes, so the circuit board area is relatively large. The traditional solution uses the temperature sensor signal as the input for compensation. If a trade-off needs to be made between uniformity and cost in terms of the number of sensors, even if each power amplifier tube is equipped with a sensor, there is still a large thermal resistance and heat capacity between the temperature of the sensor and the PN junction of the power amplifier tube. In the pulsed working mode, there will be a large difference between the temperature of the temperature sensor and the junction temperature of the power amplifier tube, and accurate compensation cannot be carried out.

[0004] For the above problems, no effective solution has been proposed yet. Summary of the Invention

[0005] The present application provides a method, device, equipment and medium for temperature compensation of power amplifier tubes based on nuclear magnetic resonance to solve the above technical problem of "the positive thermal feedback of the power amplifier tube will cause the cumulative increase in the rated junction temperature and thus damage the power amplifier tube".

[0006] According to one aspect of the embodiments of the present application, the present application provides a method for temperature compensation of a power amplifier tube based on nuclear magnetic resonance, including: before the nuclear magnetic resonance power amplifier is enabled and a transmit pulse is sent, determining whether there is a deviation between the actual quiescent current and the target quiescent current of the current power amplifier tube; if there is a deviation between the actual quiescent current and the target quiescent current, eliminating the deviation by adjusting the gate voltage of the power amplifier tube to perform transient compensation for the temperature change caused by the deviation within one transmit pulse; after the current pulse transmission is completed, resetting the gate voltage of the power amplifier tube.

[0007] Optionally, determining whether there is a deviation between the actual quiescent current and the target quiescent current of the current power amplifier tube includes: obtaining the target quiescent current of the nuclear magnetic resonance power amplifier; detecting the actual quiescent current of the current power amplifier tube; calculating the deviation value between the actual quiescent current and the target quiescent current; if the deviation value between the actual quiescent current and the target quiescent current is less than or equal to the target threshold, determining that there is no deviation between the actual quiescent current and the target quiescent current, and if the deviation value between the actual quiescent current and the target quiescent current is greater than the target threshold, determining that there is a deviation between the actual quiescent current and the target quiescent current.

[0008] Optionally, detecting the actual quiescent current of the current power amplifier tube includes: obtaining the voltage signal generated on the current detection device, where the current detection device is connected in series in the drain bias circuit of the RF power amplifier; determining the original current value corresponding to the voltage signal and determining the original current value as the actual quiescent current.

[0009] Optionally, if there is a deviation between the actual quiescent current and the target quiescent current, eliminating the deviation by adjusting the gate voltage of the power amplifier tube includes: if there is a deviation between the actual quiescent current and the target quiescent current, obtaining the deviation value; determining the gate voltage calibration value corresponding to the deviation value; using the gate voltage calibration value to adjust the gate voltage of the power amplifier tube.

[0010] Optionally, determining the gate voltage calibration value corresponding to the deviation value includes: obtaining a preset look-up table and determining the gate voltage calibration value corresponding to the deviation value from the preset look-up table, where the preset look-up table includes the corresponding relationship between the current deviation value and the voltage calibration value obtained through experiments in advance; or obtaining a preset fitting curve and determining the gate voltage calibration value corresponding to the deviation value from the preset fitting curve, where the preset fitting curve is obtained by fitting the current deviation value and the voltage calibration value in advance.

[0011] According to another aspect of the embodiments of the present application, the present application provides a temperature compensation device for a power amplifier tube based on nuclear magnetic resonance, including: a judgment module, configured to judge whether there is a deviation between the actual static current and the target static current of the current power amplifier tube before the nuclear magnetic resonance power amplifier is enabled and a transmission pulse is emitted; an adjustment module, configured to, if there is a deviation between the actual static current and the target static current, eliminate the deviation by adjusting the gate voltage of the power amplifier tube, so as to perform transient compensation for the temperature change caused by the deviation within one transmission pulse; and a reset module, configured to reset the gate voltage of the power amplifier tube after the current pulse transmission is completed.

[0012] Optionally, the adjustment module includes: a calculation sub-module, configured to, if there is a deviation between the actual static current and the target static current, obtain the deviation value; a determination sub-module, configured to determine the gate voltage calibration value corresponding to the deviation value; and an adjustment sub-module, configured to adjust the gate voltage of the power amplifier tube by using the gate voltage calibration value.

[0013] Optionally, the determination sub-module includes: a first acquisition unit, configured to acquire a preset look-up table and determine the gate voltage calibration value corresponding to the deviation value from the preset look-up table, where the preset look-up table includes the corresponding relationship between the current deviation value and the voltage calibration value obtained through experiments in advance; or a second acquisition unit, configured to acquire a preset fitting curve and determine the gate voltage calibration value corresponding to the deviation value from the preset fitting curve, where the preset fitting curve is obtained by fitting the current deviation value and the voltage calibration value in advance.

[0014] According to another aspect of the embodiments of the present application, the present application provides an electronic device, including a memory, a processor, a communication interface, and a communication bus. A computer program that can run on the processor is stored in the memory. The memory and the processor communicate through the communication bus and the communication interface. When the processor executes the computer program, the steps of the above method are implemented.

[0015] According to another aspect of the embodiments of the present application, the present application further provides a computer-readable medium having non-volatile program code executable by a processor, and the program code enables the processor to execute the above method.

[0016] The above technical solutions provided by the embodiments of the present application have the following advantages compared with the related technologies:

[0017] The present application provides a temperature compensation method for power amplifier tubes based on nuclear magnetic resonance, including: before enabling the nuclear magnetic resonance power amplifier and transmitting pulses, determining whether there is a deviation between the actual static current and the target static current of the current power amplifier tube; if there is a deviation between the actual static current and the target static current, eliminating the deviation by adjusting the gate voltage of the power amplifier tube, so as to perform transient compensation for the temperature change caused by the deviation within one transmission pulse; after the current pulse transmission is completed, resetting the gate voltage of the power amplifier tube. By adjusting the gate voltage of the power amplifier tube during the transmission protection time slot after each enabling of the amplifier, the error of the static current of the current power amplifier tube is eliminated in real time, thereby avoiding the thermal accumulation of the junction temperature of the power amplifier tube and solving the problem that the thermal positive feedback of the power amplifier tube will cause the rated junction temperature to accumulate and damage the power amplifier tube. Description of the Drawings

[0018] The drawings here are incorporated into the specification and form a part of this specification, showing embodiments consistent with the present application, and are used together with the specification to explain the principles of the present application.

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments or related technologies. Obviously, for those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0020] Figure 1 It is a flowchart of an optional temperature compensation method for power amplifier tubes based on nuclear magnetic resonance provided according to an embodiment of the present application;

[0021] Figure 2 It is a schematic diagram of the thermal positive feedback of an optional nuclear magnetic resonance power amplifier provided according to an embodiment of the present application;

[0022] Figure 3 It is another optional schematic diagram of the operation of a power amplifier tube based on nuclear magnetic resonance provided according to an embodiment of the present application;

[0023] Figure 4 It is a schematic diagram of the comparison before and after the temperature compensation of an optional power amplifier tube provided according to an embodiment of the present application;

[0024] Figure 5 It is a block diagram of an optional temperature compensation device for power amplifier tubes based on nuclear magnetic resonance provided according to an embodiment of the present application;

[0025] Figure 6 It is a schematic diagram of the structure of an optional electronic device provided according to an embodiment of the present application. Detailed Embodiments

[0026] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Apparently, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without creative efforts shall fall within the scope of protection of the present application.

[0027] In subsequent descriptions, the suffixes such as "module", "component", or "unit" used to represent elements are only for the convenience of description of the present application, and they have no specific meaning in themselves. Therefore, "module" and "component" can be used interchangeably.

[0028] The nuclear magnetic resonance radio frequency power amplifier is a typical pulsed power amplifier with a power in the order of dozens of kilowatts, and it generates a large amount of heat during operation. Without temperature compensation, the gate voltage remains constant. As the radio frequency emission heat dissipation occurs, the junction temperature of the radio frequency power amplifier tube increases rapidly, which will in turn lead to an increase in the static current, an increase in the conduction angle, and a decrease in efficiency. As a result, the heat dissipation further increases. Finally, at the end of the radio frequency pulse, the junction temperature, conduction angle, static current, and heat dissipation reach their maximum values, and the efficiency reaches its minimum value. Although the junction temperature will drop during the reception stage without heat dissipation (at this time, the static current is 0), due to the problem of heat capacity, in the case of high average power (high duty cycle) emission, the junction temperature does not have time to return to the reference temperature before the next emission time slot starts, and the junction temperature accumulation of the next emission time slot begins again. This causes thermal positive feedback. If the cumulative increase in the rated junction temperature exceeds the limit value of the power amplifier tube, it will cause the power amplifier tube to be damaged. That is to say, the thermal positive feedback of the power amplifier tube will cause the cumulative increase in the rated junction temperature and thus damage the power amplifier tube.

[0029] In addition, since the power of the nuclear magnetic resonance power amplifier is much greater than that of commercial radio frequency power amplifier tubes, this means that the nuclear magnetic resonance power amplifier is usually synthesized by the power of more than ten radio frequency power amplifier tubes, so the circuit board area is relatively large. The traditional solution uses the temperature sensor signal as the input for compensation. If the number of sensors needs to be balanced between uniformity and cost, even if each power amplifier tube is equipped with a sensor, there is still a large thermal resistance and heat capacity between the temperature of the sensor and the PN junction of the power amplifier tube. In the pulsed operating mode, there will be a large difference between the temperature of the temperature sensor and the junction temperature of the power amplifier tube, and accurate compensation cannot be performed.

[0030] To solve the problems mentioned in the background art, according to one aspect of the embodiments of the present application, a method for compensating the temperature of a power amplifier tube based on nuclear magnetic resonance is provided, as Figure 1 shown, including:

[0031] Step 101, before enabling the nuclear magnetic resonance power amplifier and before transmitting a pulse, determine whether there is a deviation between the actual static current of the current power amplifier tube and the target static current;

[0032] Step 103: If there is a deviation between the actual static current and the target static current, eliminate the deviation by adjusting the gate voltage of the power amplifier tube, so as to perform transient compensation for the temperature change caused by the deviation within one emission pulse.

[0033] Step 105: After the current pulse emission is completed, reset the gate voltage of the power amplifier tube.

[0034] This application aims to perform temperature compensation for a nuclear magnetic resonance power amplifier. Because during the operation of a nuclear magnetic resonance power amplifier, there is a (thermal) positive feedback, as Figure 2 shown. In actual operation, due to the heat generated by the amplifier during operation, the temperature of the cold plate will increase. At this time, the static current increases under a fixed gate voltage. The increase in the cold plate temperature will cause the conduction angle of the power amplifier tube of the amplifier to increase, and the increase in the conduction angle will cause the amplifier efficiency to decrease, which in turn leads to more heat generation. Under the positive feedback of heat accumulation, until the junction temperature exceeds the rated maximum junction temperature of the power amplifier tube, resulting in damage to the power amplifier tube.

[0035] The nuclear magnetic resonance radio frequency transceiver system is similar to a time-division multiplexing duplex communication system, where the transceiver does not work simultaneously. The pulse width of the transmission time slot ranges from a few microseconds to several hundred milliseconds. Between the establishment of the transmission enable signal and the transmission of the radio frequency, there is usually a time of dozens of microseconds for the establishment of the transmission channel, which is usually called the transmission protection time slot. During the transmission protection time slot, the static current increases from 0 amperes to the static current (about 20 - 30 us). This application adjusts the gate voltage of the power amplifier tube during the transmission protection time slot (i.e., before the radio frequency transmission) after each enable of the power amplifier, eliminates the error of the static current of the current power amplifier tube, thereby avoiding the thermal accumulation of the junction temperature of the power amplifier tube, and solves the problem that the thermal positive feedback of the power amplifier tube will cause the rated junction temperature to accumulate and damage the power amplifier tube.

[0036] This application first needs to monitor whether the nuclear magnetic resonance power amplifier is enabled to determine whether to enter the transmission protection time slot. Whenever it is determined to enter the transmission protection time slot, it is judged whether there is a deviation in the actual static current of the current power amplifier tube. If there is a deviation, it means that temperature compensation is required. If there is no deviation, it means that temperature compensation is not required. For the case where temperature compensation is required, the preferred solution provided by this application is to eliminate the error of the static current by adjusting the gate voltage. Since there is a direct relationship between the static current and the junction temperature, compared with the temperature sensor that is relatively far away, for example, for an LDMOS (Laterally Diffused Metal Oxide Semiconductor) power amplifier tube, there is a "law" - level heat capacity between the temperature sensor and the PN junction, which will cause the transient junction temperature to be integrated and transmitted to the sensor after integration. Therefore, the sensor can only be used for steady - state detection and compensation. This application can more accurately reflect the current junction temperature state through static current sampling, and the compensation will be more precise, achieving an effect of transient compensation.

[0037] This application also solves the compensation error caused by the transient and steady - state temperature differences between the sensor temperature and the power amplifier tube junction temperature due to position differences in the traditional temperature sensor compensation scheme.

[0038] In each transmission protection time slot, this application judges the difference between the actual static current and the reference static current (i.e., the target static current), finds the corresponding gate voltage calibration value for compensation through a look - up table or a fitting curve, and adjusts the gate voltage before transmitting the radio frequency to make the static current zero the deviation from the reference value before radio frequency transmission. It is adjusted once in each transmission protection time slot, avoiding thermal positive feedback. That is to say, through the adjustment in each transmission protection time slot, the thermal accumulation in the current transmission time slot is avoided from affecting the next transmission protection time slot.

[0039] This application utilizes the mapping relationships between the junction temperature and the static current, the gate voltage and the static current, the static current and the conduction angle, and the conduction angle and the efficiency to determine the gate voltage calibration value. By detecting the static current before pulsed radio frequency transmission, the static current parameters are extracted to achieve precise compensation. Moreover, the compensation value provided in this embodiment is updated once in each transmission cycle, improving the compensation accuracy.

[0040] The existing temperature compensation scheme is similar to integral compensation and is a steady-state compensation. This application is more inclined to an approximate transient temperature compensation. Compared with the existing temperature compensation scheme, this application is only applicable to NMR power amplifiers similar to Time Division Duplexing (TDD), and is not applicable to Frequency Division Duplexing (FDD) systems. It compensates for the signal acquisition and the static current of the MOSFET, utilizing the monotonic relationship between the MOSFET junction temperature and the static current. Due to the time division multiplexing mode, there is a time slot of dozens of microseconds between the power amplifier turning on and the official transmission. The current in this time slot is the static current, which is related to the current gate voltage and junction temperature. Since the positions of each MOSFET on the board are different, this current can reflect the difference in the junction temperature of MOSFETs at different positions. By comparing the measured static current with the reference current and adjusting the gate voltage compensation value according to the look-up table, precise compensation can be achieved within this transmission window, and the compensation value for each MOSFET is different, thus achieving precise compensation.

[0041] As an optional embodiment, determining whether there is a deviation between the actual static current and the target static current of the current power amplifier tube includes: obtaining the target static current of the nuclear magnetic resonance power amplifier; detecting the actual static current of the current power amplifier tube; calculating the deviation value between the actual static current and the target static current; if the deviation value between the actual static current and the target static current is less than or equal to the target threshold, it is determined that there is no deviation between the actual static current and the target static current, and if the deviation value between the actual static current and the target static current is greater than the target threshold, it is determined that there is a deviation between the actual static current and the target static current.

[0042] The target static current is the current consumed by the nuclear magnetic resonance power amplifier itself without external influence, and is actually a reference benchmark current. This target static current is usually provided by the manufacturer or measured by professional equipment during equipment debugging.

[0043] The target threshold can be set according to the actual situation, representing the allowable error range.

[0044] Exemplarily, if the actual static current is the same as or very close to the target static current (within the allowable error range), it is determined that there is no deviation in the actual static current. If the actual static current differs significantly from the target static current and exceeds the allowable error range, it is determined that there is a deviation between the actual static current and the target static current.

[0045] The actual static current refers to the current that still exists in the circuit when the power amplifier device is not transmitting or receiving signals. In a nuclear magnetic resonance power amplifier, the magnitude of the static current can reflect the working state of the power amplifier, such as whether there is leakage or whether the power amplifier tubes are overloaded. Next, the detection of the actual static current will be described.

[0046] Since there is a direct correspondence between the junction temperature of the power amplifier tube and the actual static current, collecting the static current can be regarded as accurately collecting the junction temperature of the power amplifier tube.

[0047] As an alternative embodiment, detecting the actual static current of the current power amplifier tube includes: obtaining a voltage signal generated on the current detection device, where the current detection device is connected in series in the drain bias circuit of the RF power amplifier; determining the original current value corresponding to the voltage signal, and determining the original current value as the actual static current.

[0048] The current detection device provided in this application is a Hall sensor. A Hall sensor is a sensor based on the Hall effect. It uses the interaction between a magnetic field and a current to detect the current. When a current passes through a conductor, a magnetic field is generated around the conductor. If a Hall element is placed near the conductor at this time and an external magnetic field perpendicular to the current direction is applied, then a potential difference will be generated on both sides of the Hall element, and this potential difference is called the Hall voltage. The magnitude of the Hall voltage is proportional to the current passing through the conductor and also proportional to the intensity of the external magnetic field, but is independent of the resistance of the conductor itself.

[0049] Exemplarily, in a nuclear magnetic resonance power amplifier, the Hall sensor can be connected in series in the drain bias circuit of the RF power amplifier to detect the magnitude of the actual static current. When the actual static current passes through the Hall sensor, a voltage signal proportional to the current magnitude will be generated, and the actual static current of the power amplifier tube can be obtained through this voltage signal.

[0050] Because the voltage signal generated by the Hall sensor is proportional to the current passing through it, the obtained voltage signal can be converted into the corresponding original current value according to the sensitivity of the Hall sensor (i.e., the proportional relationship between the voltage signal and the current), and the original current value is the actual static current of the power amplifier tube.

[0051] Optionally, the actual static current can also be detected by the method of series resistance conversion. Specifically: by connecting a resistor with a known resistance value in series on the power supply line of the power amplifier, the static current can be converted into a voltage signal linear with the current; according to Ohm's law, voltage is equal to current multiplied by resistance, so the magnitude of the actual static current can be deduced by measuring the voltage across the resistor. To improve the measurement accuracy, high-precision resistors and voltage measurement circuits are usually required.

[0052] Optionally, the actual static current can also be detected through analog-to-digital conversion, specifically as follows: A voltage signal is obtained using the series resistor described above, and the voltage signal is input into an ADC (Analog-to-Digital Converter). The voltage signal can be converted into a digital signal. The digital signal can be processed and analyzed by a processor or a computer, thereby achieving precise measurement and monitoring of the static current.

[0053] Since there is a direct correspondence between the static current and the junction temperature, by detecting the actual static current of the power amplifier transistor in this application, the defect of inaccurate detection caused by using a sensor to detect the temperature of the power amplifier transistor is avoided. Because there is a large thermal resistance and heat capacity between the temperature of the temperature sensor and the junction temperature of the power amplifier transistor, the detected temperature and the junction temperature of the power amplifier transistor have a large difference, and the compensation according to the information of the temperature sensor will not be accurate enough.

[0054] The transient junction temperature compensation depends on the accuracy of the current, envelope detection, and junction temperature model, and also needs to rely on the substrate temperature provided by the sensor. There are also problems of poor accuracy and low dynamic range.

[0055] As an optional embodiment, if there is a deviation between the actual static current and the target static current, the deviation is eliminated by adjusting the gate voltage of the power amplifier transistor, including: if there is a deviation between the actual static current and the target static current, the deviation value is obtained; the gate voltage calibration value corresponding to the deviation value is determined; and the gate voltage of the power amplifier transistor is adjusted using the gate voltage calibration value.

[0056] The deviation value provided by this application = actual static current - target static current. Since the target static current is the current value that the power amplifier transistor should have in the ideal operating state, and the actual static current is the current value of the power amplifier transistor measured currently, the positive or negative of the deviation value can determine the adjustment direction of the gate voltage. If the actual static current is too large, the gate voltage should be appropriately reduced; if the actual static current is too small, the gate voltage should be appropriately increased.

[0057] The gate voltage calibration value corresponding to the deviation value can be obtained through a pre-generated look-up table or a fitting curve. The specific determination method will be described below.

[0058] Optionally, after adjusting the gate voltage of the power amplifier transistor, the actual static current of the power amplifier transistor can be measured again to ensure that the adjusted actual static current value is the same as or close to the target static current.

[0059] It should be noted that each type of RF power amplifier tube has its own grid voltage - current curve. By controlling the grid voltage, the static current can be controlled, and the static current is a single - variable function of the conduction angle, while the conduction angle is a single - variable function of the efficiency. That is to say, by changing the grid voltage, the efficiency can be changed, and the intermediate relationship can be obtained through measurement. On the other hand, the static current increases as the junction temperature increases, and the static current can be restored by reducing the grid voltage, and the corrected voltage can be obtained through testing. That is to say, through testing, the corresponding relationship between the junction temperature, static current, and corrected voltage of the power amplifier tube can be obtained.

[0060] Figure 3 The figure shows a schematic diagram of the operation of a power amplifier tube based on nuclear magnetic resonance provided by this application. The entire operation process includes: power amplifier startup; initial grid voltage configuration; scanning; power amplifier enabling (entering the transmission time slot); static current sampling; calculating the grid voltage calibration value; grid voltage calibration value configuration; RF transmission; power amplifier disabling; entering the reception time slot; stopping scanning when the transmission ends, and continuing power amplifier enabling if the transmission has not ended until the transmission ends. Among them, static current sampling, calculating the grid voltage calibration value, and grid voltage calibration value configuration are the contents of temperature compensation.

[0061] As an optional embodiment, determining the gate voltage calibration value corresponding to the deviation value includes: obtaining a preset look - up table and determining the gate voltage calibration value corresponding to the deviation value from the preset look - up table, where the preset look - up table includes the corresponding relationship between the current deviation value and the voltage calibration value obtained through prior experiments; or obtaining a preset fitting curve and determining the gate voltage calibration value corresponding to the deviation value from the preset fitting curve, where the preset fitting curve is obtained by fitting the current deviation value and the voltage calibration value in advance.

[0062] This application provides two methods to determine the gate voltage calibration value corresponding to the deviation value, which are determined through a preset look - up table and a preset fitting curve respectively.

[0063] The preset look - up table is generally obtained by sorting a large amount of experimental data in a laboratory environment, and these experimental data record the gate voltage calibration values corresponding to different current deviation values.

[0064] The preset fitting curve is obtained by fitting a large amount of experimental data through mathematical methods (such as the least - squares method, polynomial fitting, etc.), and these experimental data record the corresponding relationship between the current deviation value and the gate voltage calibration value.

[0065] Both the preset look - up table and the preset fitting curve can be obtained through narrow - pulse static current testing in an incubator. In the actual use process, as long as the deviation value is determined, the corresponding gate voltage calibration value can be found in the preset look - up table or the preset fitting curve, and then the gate voltage of the power amplifier tube can be adjusted according to the gate voltage calibration value.

[0066] By means of a preset look-up table and a preset fitting curve, the gate voltage calibration value for corresponding compensation can be conveniently and quickly found, thereby ensuring the normal operation and optimized performance of the power amplifier tube under different environmental conditions.

[0067] Figure 4 This is a comparison schematic diagram of the power amplifier tube before and after temperature compensation provided by this application. As shown in the figure, the comparison contents include quiescent current, current, gate voltage, conduction angle, efficiency, and heat dissipation. Among them, each part corresponds to two curves. The solid line represents the change before compensation, and the dashed line represents the change after compensation. It can be seen from the solid line in the figure that during the enabling stage, when the quiescent current increases (i.e., there is a deviation), the conduction angle increases, the efficiency decreases, and the heat dissipation increases. If the deviation of the quiescent current is eliminated, the conduction angle, efficiency, and heat dissipation can all be maintained at a stable value and will not increase the junction temperature. Before each radio frequency transmission, making the deviation of the quiescent current zero can well suppress the increase in junction temperature.

[0068] This application provides a method for temperature compensation of a power amplifier tube based on nuclear magnetic resonance, including: before the nuclear magnetic resonance power amplifier is enabled and a transmission pulse is sent, determining whether there is a deviation between the actual quiescent current of the current power amplifier tube and the target quiescent current; if there is a deviation between the actual quiescent current and the target quiescent current, eliminating the deviation by adjusting the gate voltage of the power amplifier tube, so as to perform transient compensation on the temperature change caused by the deviation within one transmission pulse; after the current pulse transmission is completed, resetting the gate voltage of the power amplifier tube. By adjusting the gate voltage of the power amplifier tube during the transmission protection time slot after each enabling of the amplifier, the error of the quiescent current of the current power amplifier tube is eliminated in real time, thereby avoiding the thermal accumulation of the junction temperature of the power amplifier tube and solving the problem that the thermal positive feedback of the power amplifier tube will cause the rated junction temperature to accumulate and damage the power amplifier tube.

[0069] According to another aspect of the embodiments of this application, this application provides a device for temperature compensation of a power amplifier tube based on nuclear magnetic resonance, as Figure 5 shown, including:

[0070] A judgment module 502, configured to determine whether there is a deviation between the actual quiescent current of the current power amplifier tube and the target quiescent current before the nuclear magnetic resonance power amplifier is enabled and a transmission pulse is sent;

[0071] An adjustment module 504, configured to, if there is a deviation between the actual quiescent current and the target quiescent current, eliminate the deviation by adjusting the gate voltage of the power amplifier tube, so as to perform transient compensation on the temperature change caused by the deviation within one transmission pulse;

[0072] A reset module 506, configured to reset the gate voltage of the power amplifier tube after the current pulse transmission is completed.

[0073] It should be noted that the judgment module 502 in this embodiment can be used to execute step 101 in the embodiment of the present application, the adjustment module 504 in this embodiment can be used to execute step 103 in the embodiment of the present application, and the homing module 506 in this embodiment can be used to execute step 105 in the embodiment of the present application.

[0074] Optionally, the judgment module 502 includes:

[0075] An acquisition sub-module, configured to acquire a target static current of the nuclear magnetic resonance power amplifier;

[0076] A detection sub-module, configured to detect an actual static current of the current power amplifier tube;

[0077] A calculation sub-module, configured to calculate a deviation value between the actual static current and the target static current;

[0078] A determination sub-module, configured to determine that there is no deviation between the actual static current and the target static current if the deviation value between the actual static current and the target static current is less than or equal to the target threshold, and determine that there is a deviation between the actual static current and the target static current if the deviation value between the actual static current and the target static current is greater than the target threshold.

[0079] Optionally, the detection sub-module is specifically configured to acquire a voltage signal generated on the current detection device, where the current detection device is connected in series in the drain bias circuit of the RF power amplifier; determine an original current value corresponding to the voltage signal, and determine the original current value as the actual static current.

[0080] Optionally, the adjustment module 504 includes: a calculation sub-module, configured to acquire a deviation value if there is a deviation between the actual static current and the target static current; a determination sub-module, configured to determine a gate voltage calibration value corresponding to the deviation value; an adjustment sub-module, configured to adjust the gate voltage of the power amplifier tube by using the gate voltage calibration value.

[0081] Optionally, the determination sub-module includes: a first acquisition unit, configured to acquire a preset look-up table, and determine a gate voltage calibration value corresponding to the deviation value from the preset look-up table, where the preset look-up table includes a corresponding relationship between a current deviation value and a voltage calibration value obtained through experiments in advance; or a second acquisition unit, configured to acquire a preset fitting curve, and determine a gate voltage calibration value corresponding to the deviation value from the preset fitting curve, where the preset fitting curve is obtained by fitting the current deviation value and the voltage calibration value in advance.

[0082] It should be noted here that the examples and application scenarios implemented by the above modules and the corresponding steps are the same, but are not limited to the content disclosed in the above embodiments.

[0083] According to another aspect of the embodiments of the present application, the present application provides an electronic device, such asFigure 6 As shown in the figure, it includes a memory 601, a processor 603, a communication interface 605 and a communication bus 607. A computer program that can run on the processor 603 is stored in the memory 601. The memory 601 and the processor 603 communicate through the communication interface 605 and the communication bus 607. When the processor 603 executes the computer program, the steps of the above method are implemented.

[0084] In the above electronic device, the memory and the processor communicate through a communication bus and a communication interface. The communication bus can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. This communication bus can be divided into an address bus, a data bus, a control bus, etc.

[0085] The memory can include a Random Access Memory (RAM), and can also include a non-volatile memory, such as at least one disk memory. Optionally, the memory can also be at least one storage device located far from the aforementioned processor.

[0086] The above-mentioned processor can be a general-purpose processor, including a Central Processing Unit (CPU), a Network Processor (NP), etc.; it can also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0087] According to another aspect of the embodiments of the present application, a computer-readable medium having non-volatile program code executable by a processor is also provided.

[0088] Optionally, specific examples in this embodiment can refer to the examples described in the above embodiments, and will not be elaborated here.

[0089] When implementing the embodiments of the present application, the above-mentioned various embodiments can be referred to, and corresponding technical effects can be achieved.

[0090] It will be appreciated that the embodiments described herein may be implemented using hardware, software, firmware, middleware, microcode, or any combination thereof. For a hardware implementation, the processing unit may be implemented in one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers, microprocessors, other electronic units for performing the functions described in this application, or any combination thereof.

[0091] For a software implementation, the techniques described herein may be implemented by units that execute the functions described herein. The software code may be stored in a memory and executed by a processor. The memory may be implemented within the processor or externally to the processor.

[0092] Those of ordinary skill in the art will appreciate that the units and algorithm steps of the examples described in connection with the embodiments disclosed herein can be implemented in electronic hardware, or in a combination of computer software and electronic hardware. Whether these functions are executed in hardware or software depends on the specific application and design constraints of the technical solution. Skilled artisans may use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of this application.

[0093] Those skilled in the art can clearly understand that for the sake of convenience and brevity of description, the specific working processes of the systems, devices, and units described above may refer to the corresponding processes in the foregoing method embodiments and will not be elaborated herein.

[0094] In the embodiments provided in this application, it should be understood that the disclosed devices and methods may be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the modules is only a logical functional division, and there may be other division methods in actual implementation. For example, multiple modules or components may be combined or integrated into another system, or some features may be ignored or not executed. Another point is that the couplings or direct couplings or communication connections shown or discussed with each other may be through some interfaces, and the indirect couplings or communication connections of the devices or units may be in electrical, mechanical, or other forms.

[0095] The unit described as a separation component may or may not be physically separated. The component shown as a unit may or may not be a physical unit, that is, it may be located in one place or distributed across multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0096] In addition, in each embodiment of this application, each functional unit can be integrated into a processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit.

[0097] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the embodiment of this application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in each embodiment of this application. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical discs that can store program codes. It should be noted that in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including a..." does not exclude the existence of additional identical elements in the process, method, article or device including the said element.

[0098] The above description is only the specific implementation manners of this application, enabling those skilled in the art to understand or implement this application. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application will not be limited to these embodiments shown herein, but rather to the broadest scope consistent with the principles and novel features claimed herein.

Claims

1. A method for temperature compensation of a power amplifier tube based on nuclear magnetic resonance, characterized in that: include: Before the nuclear magnetic resonance power amplifier is enabled and a pulse is emitted, it is determined whether there is a deviation between the actual quiescent current of the current power amplifier tube and the target quiescent current; If there is the deviation between the actual quiescent current and the target quiescent current, the deviation is eliminated by adjusting the gate voltage of the power amplifier tube, so as to perform transient compensation for the temperature change caused by the deviation within one transmission pulse; After the current pulse emission is completed, the gate voltage of the power amplifier tube is reset.

2. The method according to claim 1, characterized in that The determining whether there is a deviation between the actual quiescent current of the current power amplifier tube and the target quiescent current includes: Acquiring the target quiescent current of the nuclear magnetic resonance power amplifier; Detecting the actual static current of the current power amplifier tube; Calculating a deviation value between the actual quiescent current and the target quiescent current; If the deviation value between the actual quiescent current and the target quiescent current is less than or equal to the target threshold, it is determined that there is no deviation between the actual quiescent current and the target quiescent current; if the deviation value between the actual quiescent current and the target quiescent current is greater than the target threshold, it is determined that there is a deviation between the actual quiescent current and the target quiescent current.

3. The method according to claim 2, characterized in that The detecting the actual static current of the current power amplifier tube includes: Acquiring a voltage signal generated by a current detection device, wherein the current detection device is connected in series in a drain bias circuit of a radio frequency power amplifier; An original current value corresponding to the voltage signal is determined, and the original current value is determined as the actual static current.

4. The method according to claim 1, characterized in that: If there is a deviation between the actual quiescent current and the target quiescent current, eliminating the deviation by adjusting the gate voltage of the power amplifier tube includes: If there is a deviation between the actual quiescent current and the target quiescent current, obtaining a deviation value; determining a gate voltage calibration value corresponding to the deviation value; The gate voltage of the power amplifier tube is adjusted using the gate voltage calibration value.

5. The method according to claim 4, characterized in that The determining of a gate voltage calibration value corresponding to the deviation value comprises: Obtaining a preset lookup table, and determining the gate voltage calibration value corresponding to the deviation value from the preset lookup table, wherein the preset lookup table includes a correspondence between current deviation values ​​and voltage calibration values ​​obtained in advance through experiments; or A preset fitting curve is obtained, and the gate voltage calibration value corresponding to the deviation value is determined from the preset fitting curve, wherein the preset fitting curve is obtained by fitting the current deviation value and the voltage calibration value in advance.

6. A power amplifier tube temperature compensation device based on nuclear magnetic resonance, characterized in that: include: A judgment module is used to judge whether there is a deviation between the actual quiescent current of the current power amplifier tube and the target quiescent current before the nuclear magnetic resonance power amplifier is enabled and the pulse is emitted; an adjustment module, configured to eliminate the deviation by adjusting the gate voltage of the power amplifier tube if there is the deviation between the actual quiescent current and the target quiescent current, so as to perform transient compensation for the temperature change caused by the deviation within one transmission pulse; The homing module is used to reset the gate voltage of the power amplifier tube after the current pulse transmission is completed.

7. The device according to claim 6, characterized in that The adjustment module comprises: a calculation submodule, configured to obtain a deviation value if there is a deviation between the actual quiescent current and the target quiescent current; A determination submodule, used to determine a gate voltage calibration value corresponding to the deviation value; The adjustment submodule is used to adjust the gate voltage of the power amplifier tube using the gate voltage calibration value.

8. The device according to claim 7, characterized in that The determination submodule comprises: a first acquisition unit, configured to acquire a preset lookup table, and determine the gate voltage calibration value corresponding to the deviation value from the preset lookup table, wherein the preset lookup table includes a correspondence between current deviation values ​​and voltage calibration values ​​obtained in advance through experiments; or The second acquisition unit is used to acquire a preset fitting curve and determine the gate voltage calibration value corresponding to the deviation value from the preset fitting curve, wherein the preset fitting curve is obtained by pre-fitting the current deviation value and the voltage calibration value.

9. An electronic device, comprising a memory, a processor, a communication interface and a communication bus, wherein the memory stores a computer program that can be run on the processor, and the memory and the processor communicate through the communication bus and the communication interface, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

10. A computer readable medium having a non-volatile program code executable by a processor, characterized in that: The program code enables the processor to execute the method according to any one of claims 1 to 5.

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