Optical sensor and light receiving module

By setting orthogonal reference planes and designing aperture units and light receiving units in the light receiving optical system of the optical sensor, the problem of difficulty in taking into account both resolution and dynamic range in the prior art is solved, and an optical sensor with high resolution and wide dynamic range is realized.

CN120077296APending Publication Date: 2025-05-30DENSO CORP
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Patent Information

Application Number
CN202380073929.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2022-10-21
Filing Date
2023-09-08
Publication Date
2025-05-30

AI Technical Summary

Technical Problem

When existing optical sensors process irradiated beams irradiated in dots by multiple light sources, their resolution is reduced, making it difficult to take into account both resolution and dynamic range.

Method used

An optical sensor is adopted to provide orthogonal first reference plane and second reference plane in the light receiving optical system to act on the reflected beam, and through the design of the aperture unit and the light receiving unit, the transmittance attenuation of the reflected beam and the suppression of the external light mixing.

Benefits of technology

This achieves ensuring dynamic range while maintaining high resolution, improving the overall performance of the optical sensor.

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Abstract

The invention provides an optical sensor and a light receiving module. The optical sensor is a light-receiving optical system that causes positive refractive powers different on reference surfaces (S1, S2) to act on a reflected beam that is elongated along a first reference surface (S1) with respect to the first reference surface (S1) and a second reference surface (S2) that are orthogonal to each other, and is provided with: a light-receiving optical system that attenuates the transmittance of the reflected beam as the distance from an optical axis (ROA) along the second reference surface (S2) is from the first reference surface (S1) to the second reference surface (S2); an aperture unit which is aligned with a focal point of the light receiving optical system on the second reference surface (S2) and forms an optical opening along the first reference surface (S1), the optical opening allowing a reflected beam optically acted from the light receiving optical system to pass therethrough; and a light receiving unit which is aligned with a focal point of the light receiving optical system on the first reference surface (S1), and which receives a reflected beam that has passed through the optical opening by means of a plurality of light receiving elements arranged in a two-dimensional direction along the reference surfaces (S1, S2).
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Description

[0001] Cross-reference to related applications

[0002] This application is based on Japanese Patent Application No. 2022-169375 filed on October 21, 2022, and the entire contents of the base application are incorporated herein by reference. Technical field

[0003] The present disclosure relates to an optical sensor and a light-receiving module applied to the optical sensor. Background art

[0004] The optical sensor disclosed in Patent Document 1 performs sensing by irradiating a sensing area facing the outside with an irradiation beam and receiving a reflected beam from the sensing area for the irradiation beam.

[0005] Prior art documents

[0006] Patent documents

[0007] Patent Document 1: Specification of U.S. Patent No. 10,663,586 Summary of the invention

[0008] The optical sensor disclosed in Patent Document 1 allows reflected beams for irradiation beams pointwise irradiated from a plurality of light sources to pass through a plurality of openings of an aperture respectively, and causes a plurality of light-receiving elements in a light-receiving unit to receive light, thereby ensuring a dynamic range. However, in the arrangement surface on which the respective light-receiving elements are arranged, the light-receiving areas capable of receiving the reflected beams are divided into dots corresponding to the respective irradiation beams, so the resolution is reduced.

[0009] An object of the present invention is to provide an optical sensor that ensures a dynamic range while taking resolution into account, and a light-receiving module for the optical sensor.

[0010] Hereinafter, the technical means of the present disclosure for solving the problems will be described.

[0011] A first aspect of the present disclosure is an optical sensor that irradiates a linear irradiation beam toward a sensing area facing the outside, receives a reflected beam from the sensing area for the irradiation beam on the optical axis, and thereby performs sensing, and includes:

[0012] A light-receiving optical system that applies positive optical powers different on a first reference plane and a second reference plane orthogonal to each other to a reflected beam elongated along the first reference plane, and attenuates the transmittance of the reflected beam more as it is farther from the optical axis along the second reference plane,

[0013] An aperture unit, which is positioned opposite to the focal point of the light-receiving optical system on the second reference plane, and forms an optical opening along the first reference plane through which a reflected beam that has undergone an optical action by the light-receiving optical system passes; and

[0014] A light-receiving unit, which is positioned opposite to the focal point of the light-receiving optical system on the first reference plane, and receives the reflected beam that has passed through the optical opening through a plurality of light-receiving elements arranged in a two-dimensional direction along the first reference plane and the second reference plane.

[0015] A second aspect of the present disclosure is a light-receiving module, which is applied to the optical sensor of the first aspect and is formed by encapsulating the light-receiving optical system together with the light-receiving unit and the aperture unit.

[0016] According to these first and second aspects, the aperture unit positioned opposite to the focal point on the second reference plane based on the light-receiving optical system forms an optical opening along the first reference plane through which a reflected beam that has undergone an optical action by the light-receiving optical system passes. Therefore, the light-receiving unit positioned opposite to the focal point on the first reference plane based on the light-receiving optical system receives the reflected beam that has passed through the optical opening through a plurality of light-receiving elements arranged in a two-dimensional direction along the first reference plane and the second reference plane. Thus, a light-receiving area that can receive the reflected beam that has passed through the optical opening corresponding to the linear irradiation beam can be continuous in the direction along the first reference plane in the light-receiving unit. Therefore, the resolution in the light-receiving unit can be ensured.

[0017] Moreover, in the light-receiving optical system of the first and second aspects, the transmittance of the reflected beam is attenuated more as it is farther from the optical axis along the second reference plane. The reflected beam that has undergone the transmittance attenuation effect can suppress the intrusion of external light in the direction along the first reference plane as it passes through the optical opening of the aperture unit, and is received by the light-receiving unit after the intensity distribution in the direction along the second reference plane. Therefore, it is possible to ensure the dynamic range while taking into account the resolution in the light-receiving unit. Description of the Drawings

[0018] Figure 1 is a schematic diagram showing the overall configuration of the optical sensor of the first embodiment.

[0019] Figure 2 is a schematic diagram showing the irradiation unit and the scanning unit of the first embodiment.

[0020] Figure 3 is a schematic diagram showing the light-receiving unit and the scanning unit of the first embodiment.

[0021] Figure 4 is a schematic diagram showing an enlarged view of the irradiation unit of the first embodiment.

[0022] Figure 5It is a schematic diagram showing the light-receiving part of the first embodiment in an enlarged manner.

[0023] Figure 6 It is a schematic diagram showing the light-receiving part of the first embodiment in an enlarged manner.

[0024] Figure 7 It is a coordinate diagram showing the characteristics of the light-receiving part of the first embodiment.

[0025] Figure 8 It is a schematic diagram showing the light-receiving part of the first embodiment in an enlarged manner.

[0026] Figure 9 It is a schematic diagram showing the light-receiving part of the first embodiment.

[0027] Figure 10 It is a schematic diagram showing the light-receiving part of the first embodiment.

[0028] Figure 11 It is a coordinate diagram showing the characteristics of the light-receiving part of the first embodiment.

[0029] Figure 12 It is a schematic diagram showing the overall configuration of the optical sensor of the second embodiment.

[0030] Figure 13 It is a schematic diagram showing the light-receiving part and the scanning part of the second embodiment.

[0031] Figure 14 It is a schematic diagram showing the overall configuration of the optical sensor of the third embodiment.

[0032] Figure 15 It is a schematic diagram showing the light-receiving part and the scanning part of the third embodiment.

[0033] Figure 16 It is a schematic diagram showing the light-receiving part of the third embodiment in an enlarged manner.

[0034] Figure 17 It is a schematic diagram showing the overall configuration of the optical sensor of the fourth embodiment.

[0035] Figure 18 It is a schematic diagram showing the light-receiving part and the scanning part of the fourth embodiment.

[0036] Figure 19 It is a schematic diagram showing the overall configuration of the optical sensor of the fifth embodiment.

[0037] Figure 20 It is a schematic diagram showing the light-receiving part and the scanning part of the fifth embodiment.

[0038] Figure 21 It is a schematic diagram showing the light-receiving part and the scanning part of a modification of the second embodiment. Detailed implementation manners

[0039] Hereinafter, multiple implementation manners of the present disclosure will be described based on the drawings. In addition, in each implementation manner, the same reference numerals are assigned to corresponding components, so that repeated descriptions may sometimes be omitted. In addition, when only a part of the configuration is described in each implementation manner, for the other parts of the configuration, the configurations of other previously described implementation manners can be applied. Moreover, not only the combinations of the configurations explicitly shown in the description of each implementation manner, but also the configurations of multiple implementation manners can be partially combined with each other as long as the combination does not cause particular obstacles even if not explicitly shown.

[0040] (First implementation manner)

[0041] As Figure 1 shown, the optical sensor 10 of the first implementation manner of the present disclosure is a LiDAR (Light Detection and Ranging / Laser Imaging Detection and Ranging) mounted on a vehicle as a moving body. In addition, in the following description, unless otherwise stated, the front, rear, up, down, left, and right directions are defined based on the vehicle on the horizontal plane. In addition, the horizontal direction represents the tangential direction with respect to the horizontal plane, and the vertical direction represents the vertical direction with respect to the horizontal plane.

[0042] The optical sensor 10 is disposed, for example, at at least one part of the vehicle such as the front part, the left and right side parts, the rear part, and the upper roof. The optical sensor 10 irradiates a beam IB toward a sensing area SA corresponding to the disposed part in the outside of the vehicle. The optical sensor 10 performs sensing by receiving a reflected beam RB that is the irradiated beam IB irradiated toward such a sensing area SA and reflected by a target in the area SA. Therefore, the irradiated beam IB that becomes the reflected beam RB usually selects light in the near-infrared region that is difficult for people in the outside world to visually recognize.

[0043] The optical sensor 10 senses a target in the sensing area SA by receiving the reflected beam RB. Here, the sensing of the target is, for example, at least one of the distance from the optical sensor 10 to the target, the direction in which the target exists, and the reflection intensity of the reflected beam RB from the target. In particular, the targets to be sensed by the optical sensor 10 applied to a vehicle may be, for example, at least one of moving objects such as pedestrians, cyclists, animals other than humans, and other vehicles. In addition, the targets to be sensed by the optical sensor 10 applied to a vehicle may be, for example, at least one of stationary objects such as guardrails, road signs, structures beside the road, and fallen objects on the road.

[0044] In the optical sensor 10, a three-dimensional orthogonal coordinate system is defined by an X-axis, a Y-axis, and a Z-axis, which are three mutually orthogonal axes. In particular, in the optical sensor 10 applied to a vehicle, the Y-axis direction is set as the vertical direction of the vehicle. In addition, in the optical sensor 10 applied to a vehicle, the X-axis direction and the Z-axis direction are set as different horizontal directions of the vehicle. Therefore, as Figure 1 , Figure 5 , Figure 6 shows, in the optical sensor 10, the first reference plane S1 serving as a reference is defined as the YZ plane including the Y-axis and the Z-axis as a so-called tangent plane. And, as Figure 2 , Figure 3 , Figure 5 , Figure 6 shows, in the optical sensor 10, the second reference plane S2 serving as a reference orthogonal to the first reference plane S1 is defined as the XZ plane including the X-axis and the Z-axis. Moreover, as Figures 4 to 6 shows, in the optical sensor 10, the third reference plane S3 serving as a reference orthogonal to the first reference plane S1 and the second reference plane S2 is defined as the XY plane including the X-axis and the Y-axis.

[0045] As Figures 1 to 3 shows, the optical sensor 10 is configured to include a housing portion 11, an irradiation portion 21, a scanning portion 31, a light receiving portion 41, and a control portion 51. As Figure 1 shows, the housing portion 11 forms the exterior of the optical sensor 10. The housing portion 11 includes a light-shielding housing 12 and a cover plate 15. In addition, in Figure 1 , a cross-section orthogonal to the right side portion (the irradiation portion 21 side and the light receiving portion 41 side) with respect to the single-dot chain line in the Y-axis direction is actually shown for the left side portion (the cover plate 15 side).

[0046] The light-shielding housing 12 is formed of a light-shielding material such as synthetic resin or metal. The light-shielding housing 12 is generally box-shaped. The light-shielding housing 12 is constructed by a single component or a combination of multiple components. The light-shielding housing 12 houses the irradiation portion 21, the scanning portion 31, and the light receiving portion 41 inside. And, the light-shielding housing 12 may also house the control portion 51 inside as Figure 1 shows.

[0047] The cover plate 15 is formed mainly of a base material such as synthetic resin or glass having translucency in the near-infrared region. The cover plate 15 is generally flat or has a curved shape. The cover plate 15 closes the entire through-hole provided in the light-shielding housing 12.

[0048] As Figure 1 , Figure 2As shown, the irradiation unit 21 includes a light projection unit 22 and an irradiation optical system 26. The light projection unit 22 is disposed within the housing unit 11 and emits a laser in the near-infrared region that forms the irradiation beam IB. For this purpose, as Figure 4 shown, the light projection unit 22 has a plurality of laser oscillation elements 24 on a light projection array substrate. Each laser oscillation element 24 is arranged in a one-dimensional single row in the Y-axis direction. Each laser oscillation element 24 is, for example, an edge-emitting laser or a surface-emitting laser, etc. Each laser oscillation element 24 emits a laser that forms a part of the irradiation beam IB.

[0049] The light projection unit 22 forms a light projection window 25 on one side of the light projection array substrate that is virtually defined by a rectangular contour that is long and strip-shaped in the Y-axis direction. The light projection window 25 is configured as an aggregate of the laser oscillation openings of each laser oscillation element 24. Thus, the laser output from the laser oscillation openings of each laser oscillation element 24 is Figure 1 projected from the light projection window 25 as an irradiation beam IB that is simulated to be linear and long and strip-shaped in the Y-axis direction in the shown sensing region SA. The irradiation beam IB within the housing unit 11 may also include non-light-emitting portions corresponding to the arrangement intervals of each laser oscillation element 24 in the Y-axis direction. In this case, in the sensing region SA, it is sufficient to form a linear irradiation beam IB in which the non-light-emitting portions are macroscopically eliminated by the optical action of the irradiation optical system 26 described later.

[0050] As Figure 1 、 Figure 2 shown, the irradiation optical system 26 is disposed within the housing unit 11 between the light projection unit 22 and the scanning mirror 32 of the scanning unit 31. The irradiation optical system 26 projects the irradiation beam IB from the light projection unit 22 toward the scanning mirror 32. Therefore, the irradiation optical system 26 guides the irradiation beam IB projected from the light projection unit 22 to the scanning mirror 32 on the irradiation optical axis IOA in the Z-axis direction. To achieve such light guiding, the irradiation optical system 26 has an irradiation lens 27 held by a light-shielding housing 12. The irradiation lens 27 is formed mainly of a lens substrate such as synthetic resin or glass that has light transmissivity in the near-infrared region.

[0051] Here, particularly for the irradiation lens 27 of the first embodiment, a pair of a front-stage cylindrical lens 27a and a rear-stage rotationally symmetric lens 27b is selected. The cylindrical lens 27a is a plano-convex cylindrical type with the generatrix direction being the X-axis direction and the positive optical power direction being the Y-axis direction. The rotationally symmetric lens 27b is a biconvex type with the positive optical power direction being an arbitrary direction around the Z-axis. The irradiation optical system 26 causes positive optical powers that are different in the Y-axis direction and the X-axis direction to act on the irradiation beam IB through the combination of these cylindrical lens 27a and rotationally symmetric lens 27b.

[0052] As Figures 1 to 3As shown, the scanning unit 31 includes a scanning mirror 32 and a scanning motor 35. The scanning mirror 32 is disposed in the housing unit 11 across between the cover plate 15 and the light-receiving optical system 42 of the light-receiving unit 41 from between the cover plate 15 and the irradiation optical system 26. The scanning mirror 32 scans the irradiation beam IB projected from the irradiation optical system 26 toward the sensing area SA, and reflects the reflected beam RB from the sensing area SA with respect to the irradiation beam IB toward the light-receiving optical system 42.

[0053] The scanning mirror 32 is formed mainly of a base material such as synthetic resin or glass, for example. The scanning mirror 32 has an overall flat plate shape. The scanning mirror 32 forms the reflecting surface 33 into a rectangular profile that is long in the Y-axis direction by vapor-depositing a reflecting film such as aluminum, silver, or gold on one side of the mirror base material.

[0054] The scanning mirror 32 has a rotation axis 34 that is rotatably held by the light-shielding housing 12. The rotation axis 34 is disposed to extend in the Y-axis direction in which the reflecting surface 33 is long. The scanning mirror 32 adjusts the normal direction of the reflecting surface 33 around the rotation center line CM by rotating around the rotation center line CM set to extend in the Y-axis direction. Therefore, the scanning mirror 32 can swing within a limited rotation angle range DR by, for example, a mechanical or electrical limiter or the like. Thereby, the irradiation beam IB reflected by the scanning mirror 32 is restricted from deviating from the outer contour of the cover plate 15.

[0055] The scanning mirror 32 is provided to be shared by the irradiation unit 21 and the light-receiving unit 41. Therefore, the reflecting surface 33 in the scanning mirror 32 is provided commonly for the irradiation beam IB and the reflected beam RB. On the reflecting surface 33, the portion that reflects the irradiation beam IB and the portion that reflects the reflected beam RB are configured to be separated from each other or at least a part of each other overlaps.

[0056] As Figure 1 、 Figure 2 shown, the irradiation beam IB is reflected by the reflecting surface 33 whose normal direction is adjusted according to the rotational drive of the scanning mirror 32, and thereby scans the sensing area SA in terms of time and space through the cover plate 15. The scanning of the irradiation beam IB on the sensing area SA is substantially restricted to the horizontal direction according to the rotational drive of the scanning mirror 32 around the rotation center line CM. Thereby, the rotation angle range DR of the scanning mirror 32 defines the horizontal field of view angle in the sensing area SA.

[0057] The irradiation beam IB is reflected by a target present in the sensing area SA, thereby becoming a reflected beam RB that returns to the optical sensor 10. The reflected beam RB passes through the cover plate 15 again and is incident on the reflecting surface 33 of the scanning mirror 32. Here, the speeds of the irradiation beam IB and the reflected beam RB are sufficiently high relative to the rotational speed of the scanning mirror 32. As a result, the reflected beam RB is reflected from the reflecting surface 33 on the scanning mirror 32 at substantially the same rotational angle as the irradiation beam IB, and thus can be simulated to guide light to the light-receiving optical system 42 in a manner reverse to that of the irradiation beam IB.

[0058] As Figure 1 shown, the scanning motor 35 is disposed around the scanning mirror 32 within the housing portion 11. The scanning motor 35 is, for example, a voice coil motor, a brushed DC motor, or a stepping motor. The output shaft of the scanning motor 35 is directly coupled to the rotation axis 34 of the scanning mirror 32, or is indirectly coupled via a drive mechanism such as a speed reducer. The scanning motor 35 is held by the light-shielding housing 12 so as to be able to drive the output shaft and the rotation axis 34 to rotate together. The scanning motor 35 rotationally drives the rotation axis 34 within the rotation angle range DR.

[0059] As Figure 1 、 Figure 3 shown, the light-receiving unit 41 includes a light-receiving optical system 42 and a light-receiving unit 45. The light-receiving optical system 42 is disposed within the housing portion 11 between the scanning mirror 32 and the light-receiving unit 45. The light-receiving optical system 42 is positioned below the irradiation optical system 26 in the Y-axis direction.

[0060] The light-receiving optical system 42 images the reflected beam RB from the scanning mirror 32 onto the light-receiving unit 45. Therefore, the light-receiving optical system 42 causes the light-receiving unit 45 to receive the reflected beam RB reflected from the scanning mirror 32 on the light-receiving optical axis ROA in the Z-axis direction. At this time, the reflected beam RB is guided along the light-receiving optical axis ROA throughout the entire rotation angle range DR of the scanning mirror 32 as a linear beam in the near-infrared region that is elongated in the Y-axis direction and corresponds to the irradiation beam IB. Therefore, the light-receiving optical system 42 has a light-receiving lens 43 held by the light-shielding housing 12. The light-receiving lens 43 is formed mainly of a lens substrate such as synthetic resin or glass having light transmissibility in the near-infrared region.

[0061] Here, particularly in the light-receiving lens 43 of the first embodiment, a pair of a front-stage rotationally symmetric lens 43a and a rear-stage cylindrical lens 43b is selected. The rotationally symmetric lens 43a is a biconvex type with the positive optical power direction being an arbitrary direction around the Z-axis. The cylindrical lens 43b is a plano-convex cylindrical type with the generatrix direction being the Y-axis direction and the positive optical power direction being the X-axis direction. The light-receiving optical system 42 causes different positive optical powers in the Y-axis direction and the X-axis direction to act on the reflected beam RB that is long and strip-shaped in the Y-axis direction through the combination of these rotationally symmetric lens 43a and cylindrical lens 43b. That is, with the first reference plane S1 and the second reference plane S2 that are orthogonal to each other as references, the light-receiving optical system 42 causes different positive optical powers on the first reference plane S1 and the second reference plane S2 to act on the reflected beam RB that is long and strip-shaped along the first reference plane S1.

[0062] The light-receiving unit 45 is positioned below the light-projecting unit 22 in the Y-axis direction within the housing portion 11. The light-receiving unit 45 outputs a light-receiving signal by receiving the reflected beam RB imaged by the light-receiving optical system 42. For this purpose, as Figure 5 shown, the light-receiving unit 45 has a plurality of light-receiving elements 46 on the light-receiving array substrate. Each light-receiving element 46 is arranged in multiple columns in two dimensions in the Y-axis direction and the X-axis direction. That is, each light-receiving element 46 is arranged in a two-dimensional direction along the first reference plane S1 and the second reference plane S2.

[0063] As Figure 1 、 Figure 3 、 Figure 5 shown, in the light-receiving unit 45, the light-receiving surface on which the respective light-receiving elements 46 are arranged and which receives the reflected beam RB is formed as an arrangement surface 47 having a rectangular profile that is orthogonal to the Z-axis direction and long and strip-shaped in the Y-axis direction on one side of the light-receiving array substrate. That is, with the third reference plane S3 that is orthogonal to the first reference plane S1 and the second reference plane S2 as a reference, the arrangement surface 47 of each light-receiving element 46 in the light-receiving unit 45 is positioned in a posture along the third reference plane S3. Such an arrangement surface 47 is constructed as an aggregate of the incident surfaces of each light-receiving element 46.

[0064] In the light-receiving unit 45, each light-receiving element 46 is mainly composed of a single-photon avalanche diode (SPAD: Single Photon Avalanche Diode). Therefore, in the light-receiving unit 45, as the unit for reading out the light-receiving signal from each light-receiving element 46, in Figure 5A plurality of light-receiving pixels 48 indicated by being surrounded by thick lines are each configured to include a set number of light-receiving elements 46. Here, by constructing each light-receiving pixel 48 with a plurality of light-receiving elements 46 having different numbers in the Y-axis direction and the X-axis direction, particularly in the first embodiment, these light-receiving pixels 48 are arranged one-dimensionally in a single row in the Y-axis direction. That is, in the arrangement surface 47 of the light-receiving unit 45, the light-receiving pixels 48 are arranged in a one-dimensional direction along the first reference plane S1.

[0065] In the light-receiving unit 45 configured as described above, for each light-receiving pixel 48, the signal value of the light-receiving signal varies following the number of responses of the light-receiving element 46 that responds to the reflected beam RB. In the light-receiving unit 45 that bundles the set number of light-receiving elements 46 for each light-receiving pixel 48 with such light-receiving signals, the dynamic range can be improved by the detailed configuration described later. Therefore, as Figure 1 , Figure 3 shown, the light-receiving unit 45 has an output circuit 49 in order to sample the light-receiving signals read from the set number of light-receiving elements 46 for each light-receiving pixel 48 and output them to the control unit 51.

[0066] Figure 1 The control unit 51 shown controls the sensing of the target in the sensing area SA. The control unit 51 is configured mainly by at least one computer including a processor and a memory. The control unit 51 may be entirely housed in the housing part 11 ( Figure 1 example). The control unit 51 may be entirely arranged in a vehicle outside the housing part 11. The control device 1 may also be dispersedly arranged across the inside of the housing part 11 and the vehicle outside the housing part 11.

[0067] The control unit 51 is connected to the light-projecting unit 22, the scanning motor 35, and the light-receiving unit 45. The control unit 51 rotationally drives the scanning mirror 32 in synchronization with the irradiation timing of the irradiation beam IB from the light-projecting unit 22, and controls the reading and output of the light-receiving signals in the light-receiving unit 45. Thus, the control unit 51 generates sensing data such as image data that senses the target in the sensing area SA based on the light-receiving signals output from the light-receiving unit 45.

[0068] (Detailed configuration)

[0069] Next, the detailed configuration of the light-receiving unit 41 will be described.

[0070] As Figure 1 , Figure 3 , Figure 6As shown, the light-receiving optical system 42 in the light-receiving unit 41 further includes an apodization element 420. The apodization element 420 is disposed between the rotationally symmetric lens 43a at the front stage and the cylindrical lens 43b at the rear stage in the light-receiving optical system 42 within the housing portion 11. The apodization element 420 is aligned with the conjugate points conjugate to the arrangement surface 47 of each light-receiving element 46 in the light-receiving unit 45.

[0071] The apodization element 420 is a flat apodization filter having an optical property of forming a transmittance distribution in the near-infrared region. Therefore, the apodization element 420 is formed, for example, with a light-filtering base material such as synthetic resin or glass as the main body to have a transmittance distribution in the near-infrared region. The apodization element 420 is held by the light-shielding housing 12 and extends orthogonally to the Z-axis direction. That is, the apodization element 420 in the light-receiving optical system 42 is positioned along the third reference plane S3.

[0072] As Figure 6 , Figure 7 shown, in the apodization element 420, the transmittance of the reflected beam RB decreases in a Gaussian distribution as it moves from the central portion on the light-receiving optical axis ROA toward the outer peripheral portion in the X-axis direction. That is, the farther the apodization element 420 in the light-receiving optical system 42 is from the light-receiving optical axis ROA along the second reference plane S2, the more the transmittance of the reflected beam RB is attenuated. Here, Figure 6 a gray scale showing the shallowness of the transmittance of the reflected beam RB as it attenuates is shown. However, in the apodization element 420 of the first embodiment, in Figure 6 the outermost peripheral portion 421 of the frame-shaped portion shown hatched (also refer to Figure 1 , Figure 3 the white-painted illustration), the transmittance of the reflected beam RB is substantially limited to 0 by being covered with a light-shielding film.

[0073] As Figure 1 , Figure 3 shown, the light-receiving optical system 42 in the light-receiving unit 41 further includes a band-pass element 422. The band-pass element 422 is disposed at a position within the housing portion 11 on the rear stage side of the cylindrical lens 43b of the light-receiving optical system 42 and on the front stage side of the light-receiving unit 45.

[0074] The band-pass element 422 is a flat band-pass filter that is given optical characteristics in such a way that the transmission of the reflected beam RB that has undergone optical action from the lenses 43a and 43b in the light-receiving optical system 42 is limited to the near-infrared region of the set frequency band of the irradiation beam IB. Therefore, the band-pass element 422 is mainly made of a light-filtering substrate such as synthetic resin or glass, and is formed to be transparent to the near-infrared region, while having a substantially zero transmittance for other frequency bands. The band-pass element 422 is held by the light-shielding housing 12 and extends orthogonally to the Z-axis direction. That is, the band-pass element 422 in the light-receiving optical system 42 is positioned along the third reference plane S3 (see Figure 5 , Figure 6 ).

[0075] As Figure 1 , Figure 3 , Figure 8 , Figure 9 shown, an aperture unit 410 is also provided in the light-receiving unit 41. The aperture unit 410 is disposed in the frame unit 11 between the band-pass element 422, which is at the last stage of the light-receiving optical system 42, and the light-receiving unit 45. As Figure 9 shown, the aperture unit 410 is positioned at the focal point PF2 on the second reference plane S2 based on the light-receiving optical system 42. In particular, in the first embodiment, it is positioned at the combined focal point of parallel beams on this second reference plane S2 based on each of the lenses 43a and 43b.

[0076] As Figure 1 , Figure 3 , Figure 8 , Figure 9 shown, the aperture unit 410 is a flat optical aperture having an optical opening 411 that is locally given light-transmitting properties in the near-infrared region. Such an aperture unit 410 can also be mainly made of a light-transmitting substrate for the near-infrared region such as synthetic resin or glass, and is formed in a state where the surface of the light-transmitting substrate on the outer peripheral side of the optical opening 411 is covered with a light-shielding film such as a metal film, a resist film, a dielectric film, or a coating film. The aperture unit 410 can be mainly made of a light-shielding substrate such as synthetic resin or metal, and is formed to have a substantially zero transmittance on the outer peripheral side of the optical opening 411 that penetrates the light-shielding substrate.

[0077] The aperture unit 410 is held by the light-shielding housing 12 and extends orthogonally to the Z-axis direction. That is, the aperture unit 410 in the light-receiving optical system 42 is positioned along the third reference plane S3. The reflected beam RB that has undergone optical action from the elements 43a, 420, 43b, and 422 in the light-receiving optical system 42 is incident on the optical opening 411 formed by such an aperture unit 410. Therefore, the optical opening 411 allows the incident reflected beam RB to pass through and emits it toward the subsequent light-receiving unit 45 side.

[0078] The optical aperture 411 in the aperture unit 410 has a rectangular profile that is elongated in the Y-axis direction. That is, the optical aperture 411 in the aperture unit 410 is formed along the first reference plane S1. Thus, Figure 9 The shown aperture unit 410 is positioned within the allowable distance on both sides along the receiving optical axis ROA from the focal point PF2 on the second reference plane S2 based on the receiving optical system 42 when the dimension Δa (refer to Figure 8 ) of the optical aperture 411 in the X-axis direction along the second reference plane S2 is defined as the allowable distance. The dimension Δa that becomes the allowable distance under this definition can be set to be greater than or equal to the depth of focus on the second reference plane S2. Also, the aperture unit 410 can be positioned within the depth of focus on the second reference plane S2 on both sides along the receiving optical axis ROA from the focal point PF2 on the second reference plane S2 based on the receiving optical system 42.

[0079] As Figure 10 shown, in the light-receiving unit 41, the arrangement plane 47 of the light-receiving units 45 is positioned at the focal point PF1 on the first reference plane S1 based on the receiving optical system 42. Particularly in the first embodiment, it is positioned at the combined focal point for parallel beams on the first reference plane S1 based on each of the lenses 43a, 43b. Thus, if the dimension Δp (refer to Figure 5 ) of the light-receiving pixels 48 in the X-axis direction along the second reference plane S2 is defined as the allowable distance, the arrangement plane 47 is positioned within the allowable distance on both sides along the receiving optical axis ROA from the focal point PF1 on the first reference plane S1 based on the receiving optical system 42. The dimension Δp that becomes the allowable distance under this definition can be set to be greater than or equal to the depth of focus on the first reference plane S1. Moreover, the arrangement plane 47 can also be positioned within the depth of focus on the first reference plane S1 on both sides along the receiving optical axis ROA from the focal point PF1 on the first reference plane S1 based on the receiving optical system 42.

[0080] With such a configuration, in the light-receiving unit 45, the reflected beam RB that has passed through the optical aperture 411 of the aperture unit 410 is received on the arrangement plane 47 with an intensity distribution corresponding to the transmittance distribution in the apodization element 420 as Figure 11 shown. Thus, in the X-axis direction along the second reference plane S2, the light-receiving region RA defined within the range where the light-receiving intensity distribution of the reflected beam RB is 1 / e2 of the peak intensity can be adjusted to be smaller than the effective region EA effective according to the aforementioned pixel dimension Δp (also refer to Figure 5 ) in the arrangement plane 47. In addition, based on such a light-receiving intensity distribution, the reflected beam RB with the peak intensity is used for sensing of a distant target or a low-reflectivity target, while the edge intensity near both ends of the light-receiving region RA can be used for sensing of a near target or a high-reflectivity target.

[0081] (Function and effect)

[0082] Next, the function and effect of the first embodiment described above will be described.

[0083] According to the first embodiment, the aperture unit 410 facing the focal point PF2 on the second reference plane S2 based on the light-receiving optical system 42 forms an optical aperture 411 along the first reference plane S1 through which the reflected beam RB that has received an optical action from the light-receiving optical system 42 passes. Therefore, the light-receiving unit 45 facing the focal point PF1 on the first reference plane S1 based on the light-receiving optical system 42 receives the reflected beam RB that has passed through the optical aperture 411 through a plurality of light-receiving elements 46 arranged in a two-dimensional direction along the first reference plane S1 and the second reference plane S2. As a result, the light-receiving area RA that can receive the reflected beam RB corresponding to the linear irradiation beam IB and that has passed through the optical aperture 411 can be continuous in the Y-axis direction along the first reference plane S1 in the light-receiving unit 45. Therefore, the resolution in the light-receiving unit 45 can be ensured.

[0084] Moreover, the farther the light-receiving optical system 42 of the first embodiment is from the light-receiving optical axis ROA along the second reference plane S2, the more the transmittance of the reflected beam RB is attenuated. The reflected beam RB that has been subjected to the transmittance attenuation effect passes through the optical aperture 411 of the aperture unit 410, and can suppress the mixing of external light in the Y-axis direction along the first reference plane S1, and is received by the light-receiving unit 45 with an intensity distribution in the X-axis direction along the second reference plane S2. Therefore, the resolution and the dynamic range in the light-receiving unit 45 can be taken into account.

[0085] According to the first embodiment, the apodization element 420 that attenuates the transmittance of the reflected beam RB as it is farther from the light-receiving optical axis ROA along the second reference plane S2 is located at the conjugate point with respect to the arrangement plane 47 of the light-receiving elements 46 in the light-receiving unit 45. As a result, the light-receiving area RA of the reflected beam RB with an intensity distribution in the X-axis direction along the second reference plane S2 can be accurately formed on the arrangement plane 47 of the light-receiving elements 46. Therefore, the reliability of the effect of ensuring the dynamic range can be improved.

[0086] According to the first embodiment, the size Δa of the optical aperture 411 in the X-axis direction along the second reference plane S2 is set as the allowable distance, and the aperture unit 410 is aligned within this allowable distance along the received light optical axis ROA from the focal point PF2 on the second reference plane S2 based on the received light optical system 42. Thereby, the aperture unit 410 can reliably exert the optical effect of making the reflected beam RB with external light mixing suppressed in the Y-axis direction along the first reference plane S1 have an intensity distribution in the X-axis direction along the second reference plane S2. Therefore, the reliability of the effect of ensuring the dynamic range can be improved.

[0087] The band-pass element 422 of the received light optical system 42 in the first embodiment limits the transmission of the reflected beam RB to the set frequency band of the irradiation beam IB. Thereby, for the reflected beam RB having an intensity distribution in the X-axis direction along the second reference plane S2, not only can the function of suppressing external light mixing in the Y-axis direction along the first reference plane S1 based on the aperture unit 410 be exerted, but also the function of suppressing external light mixing based on the transmission limitation in the band-pass element 422 can be exerted. Therefore, the reliability of the effect of ensuring the dynamic range can be improved.

[0088] According to the first embodiment, a plurality of light-receiving pixels 48 that are units for reading the received light signal are configured to each include a set number of light-receiving elements 46. Therefore, the arrangement surface 47 of the light-receiving elements 46 in the light-receiving unit 45 takes the size Δp of the light-receiving pixels 48 in the X-axis direction along the second reference plane S2 as the allowable distance, and is aligned within this allowable distance along the received light optical axis ROA from the focal point PF1 on the first reference plane S1 based on the received light optical system 42. Thereby, the light-receiving region RA that can receive the reflected beam RB after imaging can be continuously formed in the X-axis direction along the first reference plane S1 on the arrangement surface 47 having a set number of light-receiving elements 46 for each light-receiving pixel 48. Therefore, the reliability of the effect of ensuring the resolution can be improved.

[0089] According to the first embodiment, SPADs as the light-receiving elements 46 are arranged in the two-dimensional direction along the first reference plane S1 and the second reference plane S2. Thereby, especially in the direction along the second reference plane S2, the dynamic range can be reliably ensured in response to the light-receiving elements 46 corresponding to the reflected beam RB with an intensity distribution.

[0090] (Second Embodiment)

[0091] As Figure 12 、 Figure 13 shown, the second embodiment is a modification of the first embodiment.

[0092] In the light-receiving unit 2041 of the second embodiment, in the light-receiving optical system 2042 within the housing portion 11, an aperture unit 410 is disposed on the subsequent stage side of the cylindrical lens 43b and on the preceding stage side of the band-pass element 422. Thus, the optical aperture 411 of the aperture unit 410 allows the reflected beam RB that has undergone optical action by the elements 43a, 420, and 43b in the light-receiving optical system 42 to pass through toward the band-pass element 422 and the light-receiving unit 45 side.

[0093] A collimating element 2424 is added to the light-receiving optical system 2042 of the second embodiment. The collimating element 2424 is disposed within the housing portion 11 at a position on the subsequent stage side of the aperture unit 410 and on the preceding stage side of the band-pass element 422. The collimating element 2424 is a collimating lens that collimates the reflected beam RB that has passed through the aperture unit 410 into a substantially parallel beam or an approximate beam thereof and then makes it incident on the band-pass element 422.

[0094] The collimating element 2424 is formed with a lens substrate such as synthetic resin or glass that has light transmissibility in the near-infrared region as the main body. Therefore, similar to the first embodiment, the band-pass element 422 can also be joined in an overlapping manner with the band-pass element 422 on the subsequent stage side having a filter substrate as the main body. The collimating element 2424 can also be covered with a filter film of the band-pass element 422, and this filter film has light transmissibility in the near-infrared region and substantially zero transmittance for other frequency bands.

[0095] Here, in particular, the collimating element 2424 of the second embodiment is selected as a plano-convex cylindrical collimating lens with the generatrix direction as the Y-axis direction and the positive focal power direction as the X-axis direction. Thus, the collimating element 2424 applies different positive focal powers in the Y-axis direction and the X-axis direction to the reflected beam RB that is elongated in the Y-axis direction. That is, the collimating element 2424 applies different positive focal powers on the first reference plane S1 and the second reference plane S2 to the reflected beam RB that is elongated along the first reference plane S1. Thereby, the band-pass element 422 restricts the transmission of the reflected beam RB that has undergone optical action by the collimating element 2424 in the light-receiving optical system 2042 to the near-infrared region.

[0096] In this way, the collimating element 2424 of the light-receiving optical system 2042 of the second embodiment collimates the reflected beam RB that has passed through the aperture unit 410 and makes it pass through the band-pass element 422. Thereby, it is possible to suppress the case where the reflected beam RB whose intensity distribution is in the X-axis direction along the second reference plane S2 is restricted from passing through the band-pass element 422 due to the incident angle to the optical sensor 10. Therefore, the reliability of ensuring the effect of the dynamic range can be improved. And according to the second embodiment, the same operational effects as those of the first embodiment can also be achieved.

[0097] (Third Embodiment)

[0098] As Figures 14 to 16 shown, the third embodiment is a modified example of the first embodiment.

[0099] In the light-receiving unit 3045 of the third embodiment, an inclined axis XZA is defined. The inclined axis XZA is orthogonal to the Y axis and is inclined at an acute angle around the Y axis on one side and at an obtuse angle around the Y axis on the opposite side with respect to the light-receiving optical axis ROA (i.e., the Z axis) and the X axis, respectively. Under this definition, the arrangement surface 3047 of each light-receiving element 46 in the light-receiving unit 3045 is positioned in a posture that extends in the set direction of the inclined axis XZA and the Y-axis direction. Thus, the arrangement surface 3047 is also arranged inclinedly with respect to the first reference plane S1 and with respect to the third reference plane S3. Here, in a cross-section that is orthogonal to the Y axis and includes the light-receiving optical axis ROA (refer to Figure 15 ), either side of the two sides sandwiching the light-receiving optical axis ROA in the X-axis direction where the arrangement surface 3047 is closer to the light-receiving optical axis ROA can be either side.

[0100] In the inclinedly arranged arrangement surface 3047, as Figure 16 shown, each light-receiving element 46 is in a state of being arranged in the set direction of the inclined axis XZA and the Y-axis direction, which are two-dimensional directions along the first reference plane S1 and the second reference plane S2. And each light-receiving pixel 48 formed by a set number of light-receiving elements 46 is also in a state of being arranged in the Y-axis direction, which is a one-dimensional direction along the first reference plane S1, on the inclinedly arranged arrangement surface 3047. Moreover, as Figure 15 shown, the retroreflection component RC of the reflected beam RB based on the inclinedly arranged arrangement surface 47 has its reflection direction adjusted by this inclined arrangement so that it not only deviates from the light-receiving optical axis ROA but also deviates from the optical opening 411 of the aperture unit 410.

[0101] In this way, in the light-receiving unit 3045 of the third embodiment, the arrangement surface 3047 of the light-receiving elements 46 is arranged inclinedly with respect to the first reference plane S1. Thereby, the retroreflection component RC of the reflected beam RB based on the light-receiving unit 3045 can be guided in a direction deviating from the light-receiving optical axis ROA, suppressing the generation of a ghost beam caused by ROA in this retroreflection component. Therefore, ensuring the resolution and dynamic range is not easily hindered by the ghost beam.

[0102] In the light receiving unit 3045 of the third embodiment, the retroreflective component RC of the reflected beam RB based on the arrangement surface 3047 of the light receiving element 46 is guided to deviate from the optical opening 411 in the aperture unit 410 by the inclined arrangement of the arrangement surface 3047. Thereby, it is possible to suppress the mixing of the reflected beam RB, which is a ghost beam caused by the reflected beam RB of the intensity distribution in the X-axis direction along the second reference plane S2 entering the optical opening 411 through retroreflection in the light receiving unit 3045 and being further reflected by the aperture unit 410. Therefore, in particular, ensuring the dynamic range is not easily hindered by the ghost beam.

[0103] Moreover, according to the third embodiment, the same effects as those of the first embodiment can also be achieved. In addition, the third embodiment can also be implemented in combination with the second embodiment.

[0104] (Fourth Embodiment)

[0105] As Figure 17 、 Figure 18 shown, the fourth embodiment is a modification of the first embodiment.

[0106] In the light receiving portion 4041 of the fourth embodiment, a module housing 4412 is provided. The module housing 4412 is formed of a light-shielding material such as synthetic resin, metal, or ceramic. The module housing 4412 is integrally formed in a box shape smaller than the light-shielding housing 12 and is thus disposed within the frame portion 11. The module housing 4412 is constructed from a single component or a combination of multiple components. The module housing 4412 houses the light receiving unit 45 and the aperture unit 410 and holds them inside. Thereby, the light receiving unit 45 and the aperture unit 410 are encapsulated together to form the light receiving module 4450.

[0107] The entire through-hole provided in the module housing 4412 is closed by the module cover 4413. Therefore, the light receiving unit 45 and the aperture unit 410 are sealed in a state of being mounted in the module housing 4412. The module cover 4413 is formed mainly of a light-transmissive material such as synthetic resin or glass in the near-infrared region. The module cover 4413 is integrally formed in a flat plate shape. In the module cover 4413, the aperture unit 410 is overlapped and joined to the emission surface for emitting the reflected beam RB. In the module cover 4413, the incident surface where the reflected beam RB enters from the band-pass element 422 can also be covered with an antireflection film that prevents reflection of the beam RB and the like.

[0108] According to such a fourth embodiment, the same effects as those of the first embodiment can also be achieved. In addition, the fourth embodiment can also be implemented in combination with at least one of the second and third embodiments.

[0109] (Fifth Embodiment)

[0110] As Figure 19 , Figure 20 shown, the fifth embodiment is a modified example of the fourth embodiment.

[0111] In addition to the aperture unit 410 and the light receiving unit 45, the module housing 5412 of the fifth embodiment houses the light receiving optical system 42 and holds it inside. Thus, the light receiving optical system 42 is encapsulated together with the aperture unit 410 and the light receiving unit 45, thereby constituting the light receiving module 5450.

[0112] The entire through-hole provided in the module housing 5412 is closed by the frontmost rotationally symmetric lens 43a in the light receiving optical system 42. Thus, together with the aperture unit 410 and the light receiving unit 45, the elements 420, 43b, 422 on the rear stage side of the rotationally symmetric lens 43a in the light receiving optical system 42 are sealed in the state of being mounted in the module housing 5412.

[0113] According to such a fifth embodiment, the same effects as those of the first embodiment can also be achieved. In addition, the fifth embodiment can also be implemented in combination with at least one of the second and third embodiments.

[0114] (Other Embodiments)

[0115] As described above, a plurality of embodiments have been described, but the present disclosure is not limited to these embodiments for interpretation, and can be applied to various embodiments and combinations within the scope not departing from the gist of the present disclosure.

[0116] In a variation, it may also be that the X-axis direction is set as the vertical direction of the vehicle, and the Y-axis direction and the Z-axis direction are set as the horizontal directions of the vehicle. In a modified example, the light receiving element 46 may also be mainly composed of a photodiode other than SPAD, for example. In a modified example, the light receiving pixels 48 composed of a set number of light receiving elements 46 may also be arranged in a two-dimensional direction.

[0117] In the light receiving optical systems 42, 2042 of the modified example, the apodizing element 420 may also be arranged at a position on the front stage side of the rotationally symmetric lens 43a. In the apodizing element 420 in the modified example, the light shielding film that substantially limits the transmittance to 0 may also be omitted from the outermost peripheral portion 421. In the light receiving optical system 42 of the modified example, the band-pass element 422 may also be arranged at any position among the front stage side of the rotationally symmetric lens 43a, between the rotationally symmetric lens 43a and the apodizing element 420, and between the apodizing element 420 and the cylindrical lens 43b. In a modified example, the band-pass element 422 may also be omitted from the light receiving optical system 42. In a modified example, as Figure 21 shown, the collimating element 2424 may also be omitted from the light receiving optical system 2042.

[0118] In the modified example, for the light-receiving lens 43 combined with the rotationally symmetric lens 43a, as long as the different positive optical powers and focal positions in the Y-axis direction and the X-axis direction described in the first embodiment can be achieved by this combination, for example, an aspheric lens or other rotationally asymmetric lenses can also be selected. In the modified example, as the light-receiving lens 43, as long as the different positive optical powers and focal positions in the Y-axis direction and the X-axis direction described in the first embodiment can be achieved, a single lens or three or more lenses can also be selected.

[0119] In the modified example, for the irradiation lens 27 combined with the rotationally symmetric lens 27b, as long as the different positive optical powers in the Y-axis direction and the X-axis direction described in the first embodiment can be achieved by this combination, for example, an aspheric lens or other rotationally asymmetric lenses can also be selected. In the modified example, as long as the irradiation lens 27 can achieve the different positive optical powers in the Y-axis direction and the X-axis direction described in the first embodiment, a single lens or three or more lenses can also be selected.

[0120] In the modified example, in addition to the mechanical swing type limited to scanning with respect to the horizontal direction as described in the first embodiment, the scanning unit 31 can also adopt various driving methods such as a mechanical swing type limited to scanning with respect to the vertical direction, or a mechanical swing type in both the horizontal direction and the vertical direction. In the modified example, the scanning unit 31 can also adopt various scanning methods such as a rotary type, a MEMS (Micro Electro Mechanical Systems) type, or a Lissajous type.

[0121] (Supplementary Explanation)

[0122] In this specification, a plurality of technical ideas listed below and their multiple combinations are disclosed.

[0123] (Technical Idea 1)

[0124] An optical sensor that irradiates a linear irradiation beam (IB) toward an external sensing area (SA), and receives a reflected beam (RB) from the sensing area for the irradiation beam on an optical axis (ROA), thereby performing sensing, and includes:

[0125] A light-receiving optical system (42, 2042) that, based on a first reference plane (S1) and a second reference plane (S2) that are orthogonal to each other, causes different positive optical powers on the first reference plane and the second reference plane to act on the reflected beam that is elongated along the first reference plane, and the transmittance of the reflected beam is attenuated more as it is farther from the optical axis along the second reference plane.

[0126] An aperture unit (410) is positioned opposite to the focal point (PF2) of the light-receiving optical system on the second reference plane, and forms an optical opening (411) along the first reference plane through which the reflected beam that has undergone optical action by the light-receiving optical system passes; and

[0127] A light-receiving unit (45, 3045) is positioned opposite to the focal point (PF1) of the light-receiving optical system on the first reference plane, and receives the reflected beam that has passed through the optical opening through a plurality of light-receiving elements (46) arranged in a two-dimensional direction along the first reference plane and the second reference plane.

[0128] (Technical idea 2)

[0129] The optical sensor according to Technical idea 1, wherein,

[0130] The light-receiving optical system has a tapering element (420) that is positioned opposite to the conjugate point of the arrangement plane (47, 3047) of the light-receiving elements in the light-receiving unit, and the transmittance of the reflected beam is attenuated more as it is farther from the optical axis along the second reference plane.

[0131] (Technical idea 3)

[0132] The optical sensor according to Technical idea 1 or 2, wherein,

[0133] The aperture unit sets the size (Δa) of the optical opening in the direction along the second reference plane as an allowable distance and is positioned within this allowable distance along the optical axis from the focal point (PF2) of the light-receiving optical system on the second reference plane.

[0134] (Technical idea 4)

[0135] The optical sensor according to Technical ideas 1 to 3, wherein,

[0136] The light-receiving optical system has a band-pass element (422) that limits the transmission of the reflected beam to a set frequency band of the irradiation beam.

[0137] (Technical idea 5)

[0138] The optical sensor according to Technical idea 4, wherein,

[0139] The light-receiving optical system (2042) has a collimating element (2424) that collimates the reflected beam that has passed through the aperture unit and allows it to pass through the band-pass element.

[0140] (Technical idea 6)

[0141] The optical sensor according to Technical Ideas 1 to 5, wherein,

[0142] The light receiving unit has a plurality of light receiving pixels (48), and the light receiving pixels (48) are constituted by including a set number of the light receiving elements and serve as units for reading out light receiving signals.

[0143] The arrangement surface (47, 3047) of the light receiving elements in the light receiving unit sets the size (Δp) of the light receiving pixels in the direction along the second reference plane as an allowable distance and is positioned within the allowable distance along the optical axis from the focal point (PF1) of the light receiving optical system on the first reference plane.

[0144] (Technical Idea 7)

[0145] The optical sensor according to any one of Technical Ideas 1 to 6, wherein,

[0146] The single photon avalanche diodes serving as the light receiving elements are arranged in a two-dimensional direction along the first reference plane and the second reference plane.

[0147] (Technical Idea 8)

[0148] The optical sensor according to any one of Technical Ideas 1 to 7, wherein,

[0149] The arrangement surface (3047) of the light receiving elements in the light receiving unit (3045) is arranged inclined with respect to the first reference plane.

[0150] (Technical Idea 9)

[0151] The optical sensor according to Technical Idea 8, wherein,

[0152] In the light receiving unit, the retroreflection component (RC) of the reflected beam based on the arrangement surface (3047) of the light receiving elements deviates from the optical opening due to the inclined arrangement of the arrangement surface.

[0153] (Technical Idea 10)

[0154] The optical sensor according to any one of Technical Ideas 1 to 9, wherein,

[0155] The optical sensor includes a scanning unit (31) that scans the irradiation beam toward the sensing area and reflects the reflected beam toward the light receiving optical system.

[0156] (Technical Idea 11)

[0157] The optical sensor according to any one of Technical Ideas 1 to 10, wherein,

[0158] The light receiving unit is encapsulated together with the aperture unit to form a light receiving module (4450).

[0159] (Technical idea 12)

[0160] The optical sensor according to any one of Technical ideas 1 to 10, wherein

[0161] The light receiving optical system is encapsulated together with the light receiving unit and the aperture unit to form a light receiving module (5450).

[0162] (Technical idea 13)

[0163] A light receiving module applied to the optical sensor according to any one of Technical ideas 1 to 12, the light receiving module is formed by encapsulating the light receiving optical system together with the light receiving unit and the aperture unit.

Claims

1. An optical sensor irradiates a linear irradiation beam (IB) towards a sensing area (SA) facing the outside world, and receives a reflected beam (RB) for the irradiation beam from the sensing area on an optical axis (ROA), thereby performing sensing. Characterized in that: It comprises: A light-receiving optical system (42, 2042) applies positive optical powers different on a first reference plane (S1) and a second reference plane (S2) orthogonal to each other to the reflected beam in a strip shape along the first reference plane, and attenuates the transmittance of the reflected beam more as it is farther from the optical axis along the second reference plane. An aperture unit (410) is positioned opposite to a focal point (PF2) of the light-receiving optical system on the second reference plane, and forms an optical aperture (411) for the reflected beam that has received an optical effect from the light-receiving optical system to pass through along the first reference plane. And A light-receiving unit (45, 3045) is positioned opposite to a focal point (PF1) of the light-receiving optical system on the first reference plane, and receives the reflected beam that has passed through the optical aperture through a plurality of light-receiving elements (46) arranged in a two-dimensional direction along the first reference plane and the second reference plane.

2. The optical sensor according to claim 1, Characterized in that: The light-receiving optical system has a tapering element (420), which is positioned opposite to a conjugate point of an arrangement plane (47, 3047) of the light-receiving elements in the light-receiving unit, and attenuates the transmittance of the reflected beam more as it is farther from the optical axis along the second reference plane.

3. The optical sensor according to claim 1 or 2, Characterized in that: The aperture unit sets a size (Δa) of the optical aperture in a direction along the second reference plane as an allowable distance and is positioned within the allowable distance along the optical axis from a focal point (PF2) of the light-receiving optical system on the second reference plane.

4. The optical sensor according to claim 1 or 2, Characterized in that: The light-receiving optical system has a band-pass element (422) that limits the transmittance of the reflected beam to a set frequency band of the irradiation beam.

5. The optical sensor according to claim 4, Characterized in that: The light-receiving optical system (2042) has a collimating element (2424), which collimates the reflected beam that has passed through the aperture unit and makes it pass through the band-pass element.

6. The optical sensor according to claim 1 or 2, Characterized in that: The light-receiving unit has a plurality of light-receiving pixels (48), and the light-receiving pixels (48) are composed of a set number of the light-receiving elements and serve as units for reading out light-receiving signals. The arrangement surfaces (47, 3047) of the light-receiving elements in the light-receiving unit set the size (Δp) of the light-receiving pixels in the direction along the second reference plane as an allowable distance and are positioned within the allowable distance along the optical axis from the focal point (PF1) of the light-receiving optical system on the first reference plane.

7. The optical sensor according to claim 1 or 2, wherein, single-photon avalanche diodes as the light-receiving elements are arranged in a two-dimensional direction along the first reference plane and the second reference plane.

8. The optical sensor according to claim 1 or 2, wherein, the arrangement surface (3047) of the light-receiving elements in the light-receiving unit (3045) is disposed inclined with respect to the first reference plane.

9. The optical sensor according to claim 8, wherein, in the light-receiving unit, the retroreflection component (RC) of the reflected beam based on the arrangement surface (3047) of the light-receiving elements deviates from the optical aperture due to the inclined arrangement of the arrangement surface.

10. The optical sensor according to claim 1 or 2, wherein, the optical sensor includes a scanning unit (31) that scans the irradiation beam toward the sensing area and reflects the reflected beam toward the light-receiving optical system.

11. The optical sensor according to claim 1 or 2, wherein, the light-receiving unit is encapsulated together with the aperture unit to form a light-receiving module (4450).

12. The optical sensor according to claim 1 or 2, wherein, the light-receiving optical system is encapsulated together with the light-receiving unit and the aperture unit to form a light-receiving module (5450).

13. A light-receiving module, wherein, applied to the optical sensor according to claim 1 or 2, the light-receiving module is formed by encapsulating the light-receiving optical system together with the light-receiving unit and the aperture unit.

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