Optimal module test method and system, electronic equipment and medium
By performing locking control and automated tests on the preferred module, the problem of inefficient testing of the preferred module is solved, and an efficient and safe test process is achieved.
Patent Information
- Application Number
- CN202510233797.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-28
- Publication Date
- 2025-06-03
AI Technical Summary
The test efficiency of the preferred module is inefficient and requires manual execution of the test according to the type of multiple protection system, resulting in high complexity and low efficiency.
By locking the target preferred module, a test signal based on the preset test truth table is generated and automated tests are carried out to achieve a test process without manual and regular operation.
The test efficiency of the preferred module is improved, and the disturbance of the test process to the special safety facilities of the nuclear power plant is avoided, ensuring the safety and efficiency of the test.
Smart Images
Figure CN120085589A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of nuclear power technology, and in particular, to a method, system, electronic device and medium for testing a preferred module. Background Art
[0002] In a nuclear power plant, the preferred module is particularly important for reasonably scheduling the drive instructions of each protection system. The main function of the preferred module is to perform priority logic processing on the drive signals from different protection systems, so as to drive the operation of safety dedicated facilities, thereby ensuring the safe operation of the nuclear power plant. Therefore, in order to prevent the preferred logic in the preferred module from malfunctioning and causing the inability to control the safety dedicated facilities, the regular test of the preferred module is particularly important. However, since one preferred module often corresponds to multiple types of protection systems, the test of the preferred module needs to be completed according to the type of the corresponding protection system. This process needs to be manually executed due to the complexity of the work content, and the test efficiency of the preferred module is low.
[0003] Therefore, how to solve the problem of low test efficiency of the preferred module in the related art has become a technical problem that needs to be urgently solved by those skilled in the art. Summary of the Invention
[0004] Based on the above problems, in order to solve the problem of low test efficiency of the preferred module in the related art, the embodiments of the present application provide a method, system, electronic device and medium for testing a preferred module.
[0005] The embodiments of the present application disclose the following technical solutions:
[0006] In a first aspect, the embodiments of the present application provide a method for testing a preferred module, which is applied to a target preferred module. The method includes:
[0007] Performing a locking control on the target preferred module so that the target preferred module maintains its current output value;
[0008] Generating a test signal according to a preset test truth table corresponding to the target preferred module;
[0009] Performing an automated test on the target preferred module based on the test signal to obtain a test result.
[0010] In a possible implementation manner, the performing an automated test on the target preferred module based on the test signal to obtain a test result includes:
[0011] Injecting the test signal into the target preferred module to obtain a test readback value fed back by the target preferred module for the test signal;
[0012] Performing a comparison test based on the test readback value and a preset expected value to obtain a test result;
[0013] When the test readback value is different from the preset expected value, the test result is determined to be a module optimization logic abnormality; when the test readback value is the same as the preset expected value, the test result is determined to be a module optimization logic normality.
[0014] In a possible implementation, after performing a comparison test based on the test readback value and a preset expected value and obtaining a test result, the method further includes:
[0015] When the test result shows that the module optimization logic is normal, releasing the locking control for the target optimization module;
[0016] In a possible implementation, the total test duration for the target preferred module is not greater than a preset duration threshold.
[0017] In a possible implementation, the target optimization module is connected to a plurality of protection systems, and the method further includes:
[0018] When receiving a protection driving instruction from the protection system, suspending the test on the target preferred module and responding to the protection driving instruction;
[0019] In a possible implementation, the method further includes:
[0020] Obtaining device parameters of the target optimal module;
[0021] Perform reliability evaluation based on the device parameters to obtain a reliability score of the target preferred module;
[0022] Determining an automatic test cycle according to the reliability score of the target preferred module;
[0023] Through the automatic test cycle, the target optimization module is periodically tested.
[0024] In a second aspect, an embodiment of the present application provides a preferred module test system, which is applied to a target preferred module, and the system includes:
[0025] A locking control module, used for performing locking control on the target optimization module so that the target optimization module maintains its current output value;
[0026] A signal generating module, used for generating a test signal according to a preset test truth table corresponding to the target optimization module;
[0027] The automatic test module is used to perform an automatic test on the target optimization module based on the test signal to obtain a test result.
[0028] In a possible implementation, the automatic test module is specifically configured to:
[0029] Inject the test signal into the target optimization module to obtain a test feedback value fed back by the target optimization module for the test signal;
[0030] Conduct a comparison test based on the test feedback value and a preset expected value to obtain a test result;
[0031] Wherein, when the test feedback value is different from the preset expected value, it is determined that the test result is that the module optimization logic is abnormal; when the test feedback value is the same as the preset expected value, it is determined that the test result is that the module optimization logic is normal.
[0032] In a third aspect, an embodiment of the present application provides an electronic device, which includes: a processor, a memory, and a system bus;
[0033] The processor and the memory are connected through the system bus;
[0034] The memory is used to store one or more programs, and the one or more programs include instructions, and when the instructions are executed by the processor, the processor executes any possible optimization module test method in the first aspect.
[0035] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, it implements any possible optimization module test method in the first aspect.
[0036] Compared with the prior art, the present application has the following beneficial effects: The embodiment of the present application provides an optimization module test method, system, electronic device and medium, and the method is applied to a target optimization module. In this method, in order to prevent the test process from disturbing the dedicated safety facilities of the nuclear power plant, it is necessary to first perform a locking control on the target optimization module to keep its current output value. Subsequently, according to a preset test truth table set in the target optimization module, a specific test signal is generated. Finally, the generated test signal is injected into the target optimization module for an automated test, enabling the target optimization module to automatically execute the automatic test logic represented in the test signal, and there is no need to perform a regular test on the optimization module by means of manual regular operation, effectively improving the test efficiency for the optimization module. Description of the Drawings
[0037] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0038] Figure 1 Schematic diagram of an interface for a preferred module application scenario provided by an embodiment of the present application;
[0039] Figure 2 Schematic diagram of the preferred logic inside a preferred module provided by an embodiment of the present application;
[0040] Figure 3 Schematic diagram of the process of a preferred module test method provided by an embodiment of the present application;
[0041] Figure 4 Schematic diagram of a preset test truth table provided by an embodiment of the present application;
[0042] Figure 5 Schematic diagram of the process of another preferred module test method provided by an embodiment of the present application;
[0043] Figure 6 Schematic diagram of the structure of a preferred module test system provided by an embodiment of the present application;
[0044] Figure 7 Schematic diagram of the structure of a preferred module test electronic device provided by an embodiment of the present application. Detailed implementation manners
[0045] To make the purpose, technical solutions and advantages of the present application more clear and understandable, the following will further describe the present application in detail with reference to specific embodiments and the accompanying drawings. It should be particularly noted that the embodiments described in the embodiments of the present application are only a part of the embodiments of the present application, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts belong to the scope of protection of the present application.
[0046] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of this application should have the ordinary meanings understood by those with ordinary skills in the field to which this application belongs. The "first", "second" and similar terms used in the embodiments of this application do not indicate any order, quantity or importance, but are only used to distinguish different components. The terms such as "including" or "comprising" mean that the elements or objects appearing before this word cover the elements or objects listed after this word and their equivalents, without excluding other elements or objects. The terms such as "connected" or "linked" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The terms such as "upper", "lower", "left" and "right" are only used to represent relative position relationships. When the absolute position of the object being described changes, the relative position relationship may also change accordingly.
[0047] See Figure 1 and Figure 2 , Figure 1 is a schematic diagram of the interface of a preferred module application scenario provided by the embodiments of this application. Figure 2 is a schematic diagram of the preferred logic inside a preferred module provided by the embodiments of this application. As described above, the main function of the preferred module is to perform priority logic processing on the drive signals from different protection systems, so as to drive the operation of the dedicated safety facilities, thereby ensuring the safe operation of the nuclear power plant. Therefore, in order to prevent the preferred logic in the preferred module from malfunctioning and causing the inability to control the dedicated safety facilities, the regular test of the preferred module is particularly important. From Figure 1 and Figure 2 it can be seen that since a preferred module often corresponds to multiple types of protection systems, and the preferred logic involved in its multiple types of protection systems is relatively complex, the test of the preferred module needs to be completed according to the type of the corresponding protection system. This process needs to be manually executed due to the complexity of the work content, and the test efficiency of the preferred module is low.
[0048] Therefore, how to solve the problem of low test efficiency of the preferred module in the related technology has become a technical problem that needs to be urgently solved by those skilled in the art.
[0049] To solve the above problems, an embodiment of the present application provides a preferred module test method, system, electronic device, and medium. The method is applied to a target preferred module. In this method, in order to prevent the test process from disturbing the dedicated safety facilities of the nuclear power plant, it is necessary to first perform a locking control on the target preferred module to maintain its current output value. Subsequently, according to a preset test truth table pre-set in the target preferred module, a specific test signal is generated. Finally, the generated test signal is injected into the target preferred module for an automated test, enabling the target preferred module to automatically execute the automatic test logic represented in the test signal, without the need to achieve regular tests for the preferred module through manual regular operations, effectively improving the test efficiency for the preferred module.
[0050] To enable those skilled in the art to better understand the solution of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the scope of protection of the present application.
[0051] See Figure 3 , which is a schematic flowchart of a preferred module test method provided by an embodiment of the present application, specifically including the following steps:
[0052] S101: Perform a locking control on the target preferred module to enable the target preferred module to maintain its current output value.
[0053] It can be Figure 1 seen that in the application scenario based on a nuclear power plant, one end of the preferred module is connected to multiple protection systems, and the other end is connected to the dedicated safety facilities of the nuclear power plant. The preferred module can prioritize the facility drive instructions issued by multiple protection systems, thereby reasonably controlling the dedicated safety facilities. Therefore, in order to prevent the target preferred module from disturbing the dedicated safety facilities during the test process, at the initial stage of testing the target preferred module, it is necessary to perform a locking control on the target preferred module to keep the output of the target preferred module in the state before the experiment, that is, to maintain its current output value. In this way, even if other input signals are injected during the test process, the target preferred module will not immediately respond to the signal change, thus avoiding unnecessary disturbance to on-site equipment, which meets the actual operation requirements of the nuclear power plant.
[0054] In the actual application scenario, the locking operation on the target preferred module can be performed through a logic circuit, a software program, or a hardware locking device, or multiple locking control paths can be set to ensure the stable implementation of the locking function. The specific implementation manner of the locking function in this embodiment is not limited.
[0055] S102: Generate a test signal according to the preset test truth table corresponding to the target optimization module.
[0056] In the target optimization module, a preset test truth table for generating test signals is pre-configured. In the embodiments of the present application, this truth table lists all possible input combinations and their corresponding output results, so as to show the logical relationship between different input signals and output signals. For the specific content form of the truth table, reference can be made to Figure 4 the schematic diagram of a provided preset test truth table.
[0057] As Figure 4 can be seen, the truth table shows the logical relationship between different input signals (such as T_SFONFA, T_SFONFB, T_DON, etc.) and output signals (such as OON_D, OOFF_D). The test signal generated through this preset test truth table can verify whether the optimization logic in the target optimization module can work as expected. Each row in the table represents a test case, so as to ensure that all possible situations can be covered. In particular, during the process of generating a test signal based on the preset test truth table, in order to prevent the test signal from disturbing the on-site equipment (dedicated safety facilities), before injecting the test signal into the target optimization module, the connection between the target optimization module and the on-site signal (the signal of the protection system) must be disconnected, so as to ensure that the entire test process will not cause disturbance to other equipment and meet the operation requirements of nuclear power plants.
[0058] In the subsequent test process based on the test signal, an automated test is performed on the target optimization module using the test signal generated based on the preset test truth table. By checking each row of the truth table one by one to confirm whether each input combination produces the correct output, the optimization logic of the target optimization module can be effectively tested for correctness.
[0059] S103: Perform an automated test on the target optimization module based on the test signal to obtain a test result.
[0060] Finally, inject the test signal generated based on the preset test truth table into the target optimization module for operation to control the target optimization module to perform an automated test and obtain a test result. Specifically, during the process of performing an automated test based on the test signal, after injecting the test signal into the target optimization module, a monitoring program needs to be run to continuously detect the test readback value fed back by the target optimization module for the test signal. After obtaining the corresponding test readback value, determine the corresponding preset expected value in the preset test truth table according to the type of the test signal, and compare the readback value with the preset expected value to obtain the final test result.
[0061] Among them, when the test readback value is different from the preset expected value, it indicates that the current optimization logic of the target optimization module cannot output the expected result. At this time, the test result is determined to be "abnormal optimization logic of the module". Similarly, when the test readback value is the same as the preset expected value, it indicates that the current optimization logic of the target optimization module can output the expected result under specific types of test signals. At this time, the test result is determined to be "normal optimization logic of the module". Correspondingly, when the test result is "normal optimization logic of the module", the locking control for the target optimization module can be released, and the connection between the target optimization module and the dedicated safety facilities can be restored, so as to ensure the normal operation of the safety system. When the test result is "abnormal optimization logic of the module", it is necessary to generate a warning signal about the abnormal optimization logic of the target optimization module and feedback the warning signal to the remote terminal of the nuclear power plant for subsequent maintenance.
[0062] On the other hand, in actual application scenarios, the safety system of a nuclear power plant often needs to respond to protection instructions within an extremely short time to ensure that in emergency situations (such as reactor coolant leakage, steam pipe rupture, etc.), measures can be taken quickly to prevent safety accidents. In the embodiments of the present application, although the connection between the overall test process of the target optimization module and the dedicated safety facilities on site is disconnected, if the overall test time is too long, it may still cause instability of the overall system of the optimization module and even unnecessary disturbances when the connection is restored. Therefore, in the embodiments of the present application, when performing an automated test on the target module, it is necessary to control the total time of the overall test process not to exceed a preset duration threshold (0.5 ms in actual application scenarios) to ensure that the test process has no disturbance to the on-site equipment.
[0063] In addition, in actual application scenarios, the design of the safety system of a nuclear power plant always needs to take safety as the core element. However, during the test process of the target optimization module, in order to prevent disturbances, the connection between the target optimization module and the dedicated safety facilities needs to be disconnected. At this time, the optimization module cannot immediately respond to the protection instructions of the protection system for the safety facilities. Therefore, in order to handle emergencies that occur in the nuclear power plant during the test process, during the automated test of the target optimization module, if a drive instruction (such as reactor shutdown, cooling system startup, etc.) issued by its protection system is received, it is necessary to immediately terminate the test of the target optimization module and restore the connection between the target optimization module and the dedicated safety facilities, so as to ensure that the drive instruction from the protection system can be immediately executed without being interfered by the test process and improve the safety of the optimization module test.
[0064] In actual application scenarios, it is often necessary to conduct periodic tests on the target optimization module, and the frequency of periodic tests for each optimization module is determined by the reliability of the module itself. Therefore, in order to ensure that a specific periodic test frequency can be adopted for each optimization module, the embodiment of the present application also sets a logic for periodic tests in the automatic test logic for the optimization module. Next, this process will be introduced in combination with the specific embodiment drawings.
[0065] See Figure 5 , which is a schematic flowchart of another optimization module test method provided by the embodiment of the present application, specifically including the following steps:
[0066] S201: Obtain the device parameters of the target optimization module;
[0067] The reliability evaluation of the target optimization module needs to be carried out based on the device parameters of the target optimization module. Among them, the device parameters include hardware parameters (such as CPU load, memory usage rate, I / O channel status), software parameters (program execution cycle, communication delay, error log), and environmental parameters (temperature, humidity, radiation dose). The device parameters of the optimization module can be obtained through the module's own maintenance log and real-time monitoring data. The embodiment does not limit the acquisition method of the device parameters.
[0068] S202: Conduct a reliability evaluation based on the device parameters to obtain the reliability score of the target optimization module.
[0069] In the process of conducting a reliability evaluation based on the device parameters obtained above, the reliability score can be determined based on a reliability evaluation model, such as the Weibull distribution, exponential distribution, or Markov model. Input the device parameters into the reliability model to calculate the reliability index of the optimization module (such as the mean time between failures), and then calculate the reliability score according to the reliability index.
[0070] S203: Determine the automatic test cycle according to the reliability score of the target optimization module;
[0071] S204: Conduct a periodic test on the target optimization module through the regular test duration.
[0072] For different reliability scores, the corresponding automatic test cycles will also vary. The lower the reliability score, the shorter the automatic test cycle, and the higher the cycle test frequency for the preferred module. For example, when the reliability score is greater than 90, the automatic test cycle can be set to six days, that is, an automated test for the preferred logic is performed every six days. When the reliability score is between 70 and 90, the automatic test cycle can be set to 3 days, that is, a preferred logic test is performed every three days to achieve periodic testing for the target preferred module.
[0073] The embodiment of the present application provides a method, system, electronic device, and medium for testing a preferred module. The method is applied to a target preferred module. In this method, in order to prevent the test process from disturbing the dedicated safety facilities of the nuclear power plant, it is necessary to first perform a locking control on the target preferred module to maintain its current output value. Subsequently, according to a preset test truth table pre-set in the target preferred module, a specific test signal is generated. Finally, the generated test signal is injected into the target preferred module for automated testing, enabling the target preferred module to automatically execute the automatic test logic represented in the test signal, and there is no need to achieve regular testing for the preferred module through manual regular operations, effectively improving the test efficiency for the preferred module.
[0074] The following introduces a preferred module test system provided by the embodiment of the present application. A preferred module test system described below can be mutually corresponding and referred to with a preferred module test method described above.
[0075] See Figure 6 , which is a schematic structural diagram of a preferred module test system provided by the embodiment of the present application, specifically including the following modules:
[0076] The locking control module 100 is used to perform locking control on the target preferred module so that the target preferred module maintains its current output value;
[0077] The signal generation module 200 is used to generate a test signal according to the preset test truth table corresponding to the target preferred module;
[0078] The automatic test module 300 is used to perform automated testing on the target preferred module based on the test signal to obtain a test result.
[0079] In a possible implementation manner, the automatic test module 300 is specifically used for:
[0080] Inject the test signal into the target preferred module to obtain a test readback value fed back by the target preferred module for the test signal;
[0081] A comparison test is performed based on the test readback value and the preset expected value to obtain a test result. Among them, when the test readback value is different from the preset expected value, it is determined that the test result is a module preference logic anomaly; when the test readback value is the same as the preset expected value, it is determined that the test result is a module preference logic normal.
[0082] See Figure 7 , which is a schematic structural diagram of a preferred module test electronic device provided by an embodiment of the present application, including:
[0083] A memory 11 for storing computer programs;
[0084] A processor 12 for implementing the steps of a preferred module test method described in any of the above method embodiments when executing the computer program.
[0085] In this embodiment, the device can be an in-vehicle computer, a PC (Personal Computer), or a terminal device such as a smart phone, a tablet computer, a handheld computer, or a portable computer.
[0086] The device may include a memory 11, a processor 12, and a bus 13.
[0087] Among them, the memory 11 includes at least one type of readable storage medium, and the readable storage medium includes flash memory, a hard disk, a multimedia card, a card-type memory (such as an SD or DX memory, etc.), a magnetic memory, a magnetic disk, an optical disk, etc. The memory 11 may be an internal storage unit of the device in some embodiments, such as the hard disk of the device. The memory 11 may also be an external storage device of the device in other embodiments, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, a Flash Card, etc. equipped on the device. Further, the memory 11 may also include both an internal storage unit and an external storage device of the device. The memory 11 can be used not only to store application software installed on the device and various types of data, such as program codes for executing the preferred module test method, but also to temporarily store data that has been output or will be output. The processor 12 may be a central processing unit (CPU) in some embodiments.
[0088] In some embodiments, the processor 12 may be a central processing unit (CPU), a controller, a microcontroller, a microprocessor, or other data processing chips, which is used to run the program code stored in the memory 11 or process data, such as executing the program code of the fault prediction method, etc.
[0089] The bus 13 may be a peripheral component interconnect (PCI) bus, an extended industry standard architecture (EISA) bus, or the like. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of simplicity of representation, Figure 7 only a thick line is used to represent it in the figure, but it does not mean that there is only one bus or one type of bus.
[0090] Furthermore, the device may further include a network interface 14. The network interface 14 may optionally include a wired interface and / or a wireless interface (such as a WI-FI interface, a Bluetooth interface, etc.), which is generally used to establish a communication connection between the device and other electronic devices.
[0091] Optionally, the device may further include a user interface 15. The user interface 15 may include a display, an input unit such as a keyboard. Optionally, the user interface 15 may further include a standard wired interface and a wireless interface. Optionally, in some embodiments, the display may be an LED display, a liquid crystal display, a touch liquid crystal display, and an OLED (organic light-emitting diode) toucher, etc. Among them, the display may also be appropriately referred to as a display screen or a display unit, which is used to display the information processed in the device and the visual user interface.
[0092] Figure 7 Only the device having components 11-15 is shown. Those skilled in the art can understand that Figure 7 the shown structure does not constitute a limitation on the device, and it may include fewer or more components than shown, or combine some components, or have different component arrangements.
[0093] Based on the same inventive concept, corresponding to any of the above-described embodiment methods, an embodiment of the present application further provides a computer-readable storage medium storing computer instructions for causing the computer to execute the preferred module test method as described in any of the above embodiments.
[0094] The computer-readable media of the embodiments of the present application include permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. The information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette tapes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information accessible by a computing device.
[0095] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute the preferred module test method described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be elaborated here.
[0096] It should be noted that the embodiments in this specification are all described in a progressive manner. The same or similar parts among the embodiments can be referred to each other, and the differences between each embodiment and other embodiments are emphasized. In particular, for methods, systems, electronic devices, and media, since they are basically similar to the method embodiments, the descriptions are relatively simple. For the relevant parts, refer to the partial descriptions of the method embodiments. The methods, systems, electronic devices, and media described above are only illustrative. The units described as separate components may or may not be physically separated, and the components prompted as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art can understand and implement it without creative efforts.
[0097] The above is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed in the present application should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.
Claims
1. A preferred module test method, characterized in that: Applied in the target optimization module, the method includes: Performing locking control on the target optimization module so that the target optimization module maintains its current output value; Generate a test signal according to a preset test truth table corresponding to the target optimization module; An automated test is performed on the target optimization module based on the test signal to obtain a test result.
2. The method according to claim 1, characterized in that The step of performing an automated test on the target optimization module based on the test signal to obtain a test result includes: Injecting the test signal into the target optimization module to obtain a test readback value fed back by the target optimization module with respect to the test signal; Perform a comparison test based on the test readback value and the preset expected value to obtain a test result; When the test readback value is different from the preset expected value, the test result is determined to be a module optimization logic abnormality; when the test readback value is the same as the preset expected value, the test result is determined to be a module optimization logic normality.
3. The method according to claim 2, characterized in that After performing a comparison test based on the test readback value and the preset expected value and obtaining the test result, the method further includes: When the test result shows that the module optimization logic is normal, releasing the locking control for the target optimization module; 4. The method according to claim 1, characterized in that The total test duration for the target preferred module is not greater than a preset duration threshold.
5. The method according to claim 1, characterized in that The target optimization module is connected to a plurality of protection systems, and the method further comprises: When receiving a protection driving instruction from the protection system, suspending the test on the target preferred module and responding to the protection driving instruction; 6. The method according to claim 1, characterized in that The method further comprises: Obtaining device parameters of the target optimal module; Perform reliability evaluation based on the device parameters to obtain a reliability score of the target preferred module; Determining an automatic test cycle according to the reliability score of the target preferred module; Through the automatic test cycle, the target optimization module is periodically tested.
7. A preferred modular test system, characterized in that: Applied in the target optimization module, the system includes: A locking control module, used for performing locking control on the target optimization module so that the target optimization module maintains its current output value; A signal generating module, used for generating a test signal according to a preset test truth table corresponding to the target optimization module; The automatic test module is used to perform an automatic test on the target optimization module based on the test signal to obtain a test result.
8. The system according to claim 7, characterized in that The automatic test module is specifically used for: Injecting the test signal into the target optimization module to obtain a test readback value fed back by the target optimization module with respect to the test signal; Perform a comparison test based on the test readback value and the preset expected value to obtain a test result; When the test readback value is different from the preset expected value, the test result is determined to be a module optimization logic abnormality; when the test readback value is the same as the preset expected value, the test result is determined to be a module optimization logic normality.
9. An electronic device, characterized in that: The device comprises: a processor, a memory and a system bus; The processor and the memory are connected via the system bus; The memory is used to store one or more programs, wherein the one or more programs include instructions, and when the instructions are executed by the processor, the processor performs the preferred modular test method according to any one of claims 1-6.
10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the preferred module test method described in any one of claims 1 to 6 is implemented.