Insulating material testing method and system based on near external spectrum

Abstract

The invention relates to the technical field of material detection, and discloses an insulating material testing method and system based on near external spectrum.The method comprises the steps that non-contact spectral measurement is conducted on an insulating material through near external spectrum equipment, spectral data are obtained, and environmental influences are corrected; meanwhile, testing physical attributes and correcting environmental influence to obtain material performance data; and combining the spectral data and the material performance data into a multi-dimensional evaluation matrix, calculating an insulation performance score based on the matrix, and judging the performance grade of the insulation material. According to the invention, by introducing a near external spectrum-based nondestructive testing technology and a multi-dimensional matrix analysis method, the limitation of a traditional destructive testing method is overcome, and more comprehensive and more accurate performance evaluation of the insulating material is realized.

Description

Technical Field

[0001] The present invention relates to the technical field of material detection, and in particular to a method and system for testing insulating materials based on near-external spectroscopy. Background Art

[0002] The wide application of insulating materials in power equipment, electronic components and high-voltage transmission systems places extremely high demands on the accurate evaluation of their insulation properties. In recent years, nondestructive testing technology based on near-infrared and near-external spectroscopy has gradually become a new trend in the field of insulating material testing.

[0003] Near Infrared Spectroscopy (NIR) has high penetration and sensitivity, and can quickly capture the spectral characteristic data of materials and reflect the microstructure and chemical composition inside the materials. However, it is difficult to fully evaluate the electrical properties of materials by relying solely on spectral data. Therefore, the joint analysis of spectral data and physical performance data is a forward-looking testing method. Summary of the invention

[0004] In view of this, the present invention proposes an insulation material testing method and system based on near-external spectroscopy, aiming to provide an insulation material evaluation scheme combining near-external spectroscopy technology and physical performance testing. This scheme not only uses the high sensitivity and high penetration of near-external spectroscopy technology to capture the spectral characteristic data of insulation materials, but also combines physical performance testing to achieve a comprehensive evaluation of the electrical properties of insulation materials. Through this method, the performance of insulation materials in practical applications can be more accurately predicted, and the safety and reliability of power equipment, electronic components and high-voltage transmission systems can be improved.

[0005] The present invention proposes a method for testing insulating materials based on near-external spectroscopy, comprising:

[0006] Using a near-external spectral device to perform non-contact spectral measurement on an insulating material, obtaining spectral measurement data of the insulating material within a near-external spectral range, and recording environmental measurement data during spectral measurement, and correcting the spectral measurement data according to the environmental measurement data to obtain spectral data; the spectral measurement data includes reflection measurement data, transmission measurement data, and scattering measurement data;

[0007] Testing the physical properties of the insulating material to obtain physical data, while recording environmental test data of the measuring environment, and correcting the physical data according to the environmental test data to obtain material performance data; the physical data includes electrical strength, arc resistance and dielectric loss tangent;

[0008] The spectral data and material performance data are combined into a multidimensional evaluation matrix; insulation performance scoring calculation is performed based on the multidimensional matrix, and the insulation performance level of the insulation material is determined according to the calculation result.

[0009] Preferably, the environmental measurement data includes temperature and humidity;

[0010] The reflection measurement data is corrected by the following calculation:

[0011]

[0012] Wherein, DR represents the corrected reflection measurement data, DmR represents the measured reflection data, Rq represents the surface roughness parameter; H represents the ambient humidity, in %; T represents the ambient temperature, in K;

[0013] The transmission measurement data is corrected by the following calculation:

[0014] D T =D mT ·e -αT ·(1+βH)·e -δkd ;

[0015] Wherein, DT represents the corrected transmission measurement data; DmT represents the measured transmission data; k represents the absorption coefficient; d represents the material thickness;

[0016] The scatterometry data is corrected by the following calculation formula:

[0017]

[0018] Wherein, DS represents the corrected scattering measurement data; DmS represents the measured scattering data; r represents the particle radius; Ms represents the microscopic inhomogeneity coefficient.

[0019] Preferably, the corrected reflection measurement data, transmission measurement data and scattering measurement data are normalized to obtain reflection normalized data, transmission normalized data and scattering normalized data;

[0020] The weights wR, wT, wS are assigned based on the spectral sensitivity of the reflection normalized data, the transmission normalized data and the scattering normalized data, and the total spectral data is calculated:

[0021] D total =w R ·D norm，R +w T ·D norm，T +w S ·D norm，S ;

[0022] Wherein, Dtotal represents the total spectral data; Dnorm,R represents the reflection normalized data; Dnorm,T represents the transmission normalized data; Dnorm,S represents the scattering normalized data; wR+wT+wS=1.

[0023] Preferably, the electrical strength is corrected by the following calculation formula:

[0024] C s = Cm - γtan(δ) + ζE;

[0025] Where Cm represents the measured electrical intensity; tan(δ) represents the dielectric loss tangent; γ and ζ represent the correction factors related to the dielectric constant and material parameters, respectively; and E represents the ambient electric field intensity in V / m.

[0026] Preferably, the arc resistance is corrected by the following calculation formula:

[0027] A s =A m ·ln(1+κT e );

[0028] Among them, As represents the corrected arc resistance; Am represents the measured arc resistance; Te represents the arc environment temperature, the unit is K; κ represents the correction factor related to the arc resistance performance of the material.

[0029] Preferably, when the spectral data and material performance data are combined into a multidimensional evaluation matrix, it includes:

[0030] The fused total spectral data Dtotal at different wavelength points λk is expressed as the total spectral feature vector:

[0031] The fused total spectral feature vector is combined with the reflection measurement data, transmission measurement data, scattering measurement data and dielectric loss tangent to form a multidimensional evaluation matrix M:

[0032]

[0033] Wherein, each column in the multidimensional evaluation matrix M corresponds to a data set of a measurement point; tan(δ) represents the dielectric loss tangent; and n represents the number of measurement points.

[0034] Preferably, when performing insulation performance score calculation based on the multidimensional matrix, it includes:

[0035] Based on the multidimensional evaluation matrix M, the correlation coefficients Ri,j between the spectral data Dtotal,j and each physical number Asj, Csj, and tan(δj) are calculated respectively, and the physical properties are calculated according to the absolute values ​​of the correlation coefficients Ri,j to obtain the insulation performance score;

[0036] The calculation formula of the correlation coefficient Ri,j is:

[0037]

[0038] Where μD represents the average value of all spectral measurement points; μi represents the mean value of the i-th physical property; Ri,j represents the linear correlation between the spectral data and the i-th physical property.

[0039] Preferably, the physical property is calculated according to the absolute value of the correlation coefficient Ri,j to obtain the insulation performance score, including:

[0040] The insulation performance score is calculated according to the following formula:

[0041]

[0042] Among them, Sp * represents the insulation performance score; wi represents the weight coefficient related to the physical property, satisfying Mij ​​represents the specific data value of the i-th parameter at the j-th measurement point.

[0043] Preferably, determining the insulation performance level of the insulation material according to the calculation result includes:

[0044] The final evaluation result determines the insulation performance level through the preset threshold:

[0045] If Sp ≥ λ1, the evaluation is excellent;

[0046] If λ2≤Sp<λ1, the evaluation is good;

[0047] If Sp<λ2, the assessment is unqualified;

[0048] Among them, λ1 and λ2 represent the evaluation thresholds of the insulation material performance.

[0049] The present invention also proposes an insulation material testing system based on near-external spectroscopy, which is used to implement the above insulation material testing method based on near-external spectroscopy, including:

[0050] A spectrum measurement module is used to perform non-contact near-external spectrum measurement on insulating materials, obtain spectrum measurement data, and record environmental measurement data;

[0051] A physical test module, used to measure the physical properties of the insulating material, including arc resistance, electrical strength and dielectric loss tangent, and record measurement environment data;

[0052] A data correction module, used to correct the spectrum measurement data and physical data according to the environmental measurement data and the environmental test data to obtain corrected spectrum data and material performance data;

[0053] A data analysis module for constructing a multidimensional evaluation matrix based on the corrected spectral data and material performance data;

[0054] The performance evaluation module is used to calculate the insulation performance score through a multi-dimensional evaluation matrix and compare it with a preset threshold to determine the insulation performance level of the insulation material.

[0055] Compared with the prior art, the present invention has the following beneficial effects:

[0056] The present invention provides an insulating material testing method and testing system based on near-external spectroscopy, which realizes efficient, non-destructive and accurate performance evaluation of insulating materials through joint analysis of spectral data and physical performance data. The specific technical effects include:

[0057] Non-destructive testing: Use near-field spectroscopy equipment to achieve non-contact measurement of insulating materials, avoiding damage to samples caused by traditional destructive testing, and can be directly used for finished product and large-scale sample testing.

[0058] Multi-dimensional data fusion: By collecting reflection spectrum, transmission spectrum and scattering spectrum data, and combining them with physical data such as arc resistance, electrical strength and dielectric loss tangent, a multi-dimensional evaluation matrix is ​​formed, which can more comprehensively reflect the insulation performance of the material.

[0059] Environmental factor correction: During the measurement of spectral data and physical data, environmental parameters such as temperature and humidity are recorded, and the measurement results are corrected based on the environmental correction formula to improve the accuracy and repeatability of the test.

[0060] Automated insulation performance score calculation: Adopts a score calculation formula based on a multi-dimensional evaluation matrix, uses mathematical methods to comprehensively analyze the spectrum and physical properties of each measurement point, and automatically calculates the insulation performance score, which helps to quickly determine whether the material meets electrical safety standards.

[0061] Applicable to various insulating materials: It can be applied to various types of insulating materials such as epoxy resin, polyester film, ceramic-based composite materials, etc., and has a wide range of applicability.

[0062] High precision and repeatability: The high sensitivity and environmental correction of spectral measurement data improve the accuracy and repeatability of test results and reduce the impact of manual measurement errors on the results.

[0063] In summary, the present invention overcomes the limitations of traditional destructive detection methods by introducing nondestructive testing technology based on near-external spectroscopy and multidimensional matrix analysis methods, and achieves a more comprehensive and accurate performance evaluation of insulating materials, which has significant practical value and promotion prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0064] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present invention. Moreover, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0065] Figure 1 It is a flow chart of the insulating material testing method based on near-external spectrum of the present invention;

[0066] Figure 2 It is a functional block diagram of the insulation material testing method system based on near-external spectrum of the present invention. DETAILED DESCRIPTION

[0067] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided in order to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art. It should be noted that, in the absence of conflict, the embodiments of the present invention and the features described in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0068] See also Figure 1 This embodiment provides an insulating material testing method based on near-external spectroscopy, including:

[0069] Using a near-external spectral device to perform non-contact spectral measurement on an insulating material, obtaining spectral measurement data of the insulating material within a near-external spectral range, and recording environmental measurement data during spectral measurement, and correcting the spectral measurement data according to the environmental measurement data to obtain spectral data; the spectral measurement data includes reflection measurement data, transmission measurement data, and scattering measurement data;

[0070] Testing the physical properties of the insulating material to obtain physical data, while recording environmental test data of the measuring environment, and correcting the physical data according to the environmental test data to obtain material performance data; the physical data includes electrical strength, arc resistance and dielectric loss tangent;

[0071] The spectral data and material performance data are combined into a multidimensional evaluation matrix; insulation performance scoring calculation is performed based on the multidimensional matrix, and the insulation performance level of the insulation material is determined according to the calculation result.

[0072] It can be understood that this embodiment proposes an innovative insulation material testing method based on near-external spectroscopy technology, which aims to evaluate the performance of insulation materials through precise spectral analysis technology. The specific steps include:

[0073] First, the non-contact spectral measurement process of the insulating material is performed using advanced near-external spectral equipment. In this process, detailed spectral measurement data of the insulating material in the near-external spectral range can be obtained. At the same time, it is also necessary to record the environmental measurement data during the spectral measurement, which includes but is not limited to environmental factors such as temperature and humidity. Subsequently, the obtained spectral measurement data is accurately corrected using these environmental measurement data to ensure the accuracy of the data, thereby obtaining corrected spectral data. These spectral data cover reflection measurement data, transmission measurement data, and scattering measurement data, which together form the basis for a comprehensive understanding of the spectral characteristics of insulating materials.

[0074] Secondly, the physical properties of the insulating material are tested in detail to obtain relevant physical data. During the test, it is also necessary to record the detailed environmental test data of the measurement environment, which also includes environmental factors such as temperature and humidity. Then, the physical data is corrected as necessary based on these environmental test data to ensure the accuracy of the data, and finally the corrected material performance data is obtained. These physical data include but are not limited to key performance indicators such as electrical strength, arc resistance and dielectric loss tangent, which are important parameters for evaluating the performance of insulating materials.

[0075] Finally, the corrected spectral data and material performance data are combined to construct a multi-dimensional evaluation matrix. This matrix combines the multi-faceted data of spectral characteristics and physical properties, providing a comprehensive perspective for the performance evaluation of insulating materials. Based on this multi-dimensional evaluation matrix, the insulation performance score calculation can be performed, and the comprehensive performance of insulating materials can be analyzed and evaluated through a series of algorithms and models. Finally, based on the results of the score calculation, the insulation performance level of the insulating material can be determined, thus providing a scientific basis for the selection and application of materials.

[0076] In some embodiments of the present application, the environmental measurement data includes temperature and humidity;

[0077] The reflection measurement data is corrected by the following calculation:

[0078]

[0079] Wherein, DR represents the corrected reflection measurement data, DmR represents the measured reflection data, Rq represents the surface roughness parameter; H represents the ambient humidity in %; T represents the ambient temperature in K.

[0080] It is understandable that the present embodiment not only pays attention to the accuracy of the spectral measurement data, but also deeply considers the environmental factors, such as the possible influence of temperature and humidity on the measurement results. In order to ensure the accuracy of the test results, we introduced the surface roughness parameter, and the addition of this parameter further corrected the reflection measurement data. Through this method of comprehensively considering multiple factors and making corresponding corrections, the test method of the present embodiment can more accurately reflect the real performance of the insulating material in practical applications. Therefore, the present embodiment not only improves the accuracy and reliability of the test, but also provides a more scientific and reasonable basis for the selection and application of insulating materials.

[0081] The transmission measurement data is corrected by the following calculation:

[0082] D T =D mT ·e -αT ·(1+βH)·e -δkd ;

[0083] Wherein, DT represents the corrected transmission measurement data; DmT represents the measured transmission data; k represents the absorption coefficient; and d represents the material thickness.

[0084] It is understandable that this embodiment also takes into account the transmission performance of the insulating material and provides a corresponding correction method. Transmission measurement data is an important indicator for evaluating the transparency and optical properties of insulating materials. In actual testing, transmission measurement data may be affected by material thickness and absorption coefficient. In order to accurately reflect the transmission performance of the insulating material, this embodiment introduces absorption coefficient and material thickness as correction parameters. By incorporating these parameters into the correction calculation, we can obtain more accurate transmission measurement data, thereby further improving the accuracy and reliability of the test.

[0085] The scatterometry data is corrected by the following calculation formula:

[0086]

[0087] Wherein, DS represents the corrected scattering measurement data; DmS represents the measured scattering data; r represents the particle radius; Ms represents the microscopic inhomogeneity coefficient.

[0088] It is understandable that the present embodiment also pays attention to the scattering properties of insulating materials and provides corresponding correction methods. Scattering measurement data is crucial for evaluating the microstructure and optical properties of insulating materials. However, in actual measurements, scattering data may be affected by various factors, such as particle radius and microscopic heterogeneity. In order to more accurately reflect the scattering properties of insulating materials, the present embodiment introduces particle radius and microscopic heterogeneity coefficient as correction parameters. By incorporating these factors into the correction calculation, we can effectively reduce measurement errors and improve the accuracy of scattering measurement data. This method of comprehensively considering multiple factors and making corresponding corrections makes the test method of this embodiment have higher accuracy and reliability in evaluating the scattering properties of insulating materials.

[0089] In some embodiments of the present application, the corrected reflection measurement data, transmission measurement data and scattering measurement data are normalized to obtain reflection normalized data, transmission normalized data and scattering normalized data;

[0090] The weights wR, wT, wS are assigned based on the spectral sensitivity of the reflection normalized data, the transmission normalized data and the scattering normalized data, and the total spectral data is calculated:

[0091] D total =w R ·D norm，R +w T ·D norm，T +w S ·D norm，S ;

[0092] Wherein, Dtotal represents the total spectral data; Dnorm,R represents the reflection normalized data; Dnorm,T represents the transmission normalized data; Dnorm,S represents the scattering normalized data; wR+wT+wS=1.

[0093] It is understandable that the present embodiment also proposes a comprehensive evaluation method that comprehensively considers reflection, transmission and scattering performance. By normalizing these three measurement data, we can eliminate the dimensional differences between different measurement data so that they can be compared and evaluated on the same scale. On this basis, we assign corresponding weights to each measurement data according to the spectral sensitivity and calculate the total spectral data. This method not only improves the comprehensiveness and accuracy of the evaluation, but also provides a more scientific basis for the selection and application of insulating materials. By comprehensively considering the reflection, transmission and scattering properties, and performing corresponding corrections and normalization processes on them, the test method of the present embodiment can more comprehensively reflect the true performance of insulating materials, and provide strong support for the research and application of related fields.

[0094] In some embodiments of the present application, the electrical strength is corrected by the following calculation formula:

[0095] C s =C m -γtan(δ)+ζE;

[0096] Where Cm represents the measured electrical intensity; tan(δ) represents the dielectric loss tangent; γ and ζ represent the correction factors related to the dielectric constant and material parameters, respectively; and E represents the ambient electric field intensity in V / m.

[0097] It is understandable that the present embodiment also deeply considers the key performance indicator of electrical strength and provides a corresponding correction method. Electrical strength is a physical quantity that measures the ability of insulating materials to resist electrical breakdown under the action of an electric field, and is one of the important indicators for evaluating the performance of insulating materials. However, in actual tests, the measurement results of electrical strength may be affected by various factors, such as dielectric loss, dielectric constant, and environmental electric field strength. In order to accurately reflect the electrical strength of insulating materials, the present embodiment introduces dielectric loss tangent, dielectric constant related correction coefficient, and environmental electric field strength as correction parameters. By incorporating these factors into the correction calculation, we can effectively reduce measurement errors and improve the accuracy of electrical strength measurement data. This method of comprehensively considering multiple factors and making corresponding corrections makes the test method of the present embodiment have higher accuracy and reliability in evaluating the electrical strength of insulating materials.

[0098] In some embodiments of the present application, the arc resistance is corrected by the following calculation formula:

[0099] A s =A m ·ln(1+κT e );

[0100] Among them, As represents the corrected arc resistance; Am represents the measured arc resistance; Te represents the arc environment temperature, the unit is K; K represents the correction factor related to the arc resistance performance of the material.

[0101] It is understandable that the present embodiment also deeply considers the key performance indicator of arc resistance of insulating materials and provides corresponding correction methods. Arc resistance is an important parameter for evaluating the ability of insulating materials to resist damage under the action of arcs. However, in actual tests, the measurement results of arc resistance may be affected by the arc environment temperature and the arc resistance of the material. In order to accurately reflect the arc resistance of insulating materials, the present embodiment introduces the arc environment temperature and the correction coefficient related to the arc resistance of the material as correction parameters. By incorporating these factors into the correction calculation, we can obtain more accurate arc resistance measurement data, thereby further improving the accuracy and reliability of the test. This method of comprehensively considering multiple factors and making corresponding corrections makes the test method of this embodiment have higher accuracy and practicality in evaluating the arc resistance of insulating materials, and provides a more scientific basis for the selection and application of insulating materials.

[0102] In some embodiments of the present application, when the spectral data and the material performance data are combined into a multidimensional evaluation matrix, it includes:

[0103] The fused total spectral data Dtotal at different wavelength points λk is expressed as the total spectral feature vector:

[0104] The fused total spectral feature vector is combined with the reflection measurement data, transmission measurement data, scattering measurement data and dielectric loss tangent to form a multidimensional evaluation matrix M:

[0105]

[0106] Wherein, each column in the multidimensional evaluation matrix M corresponds to a data set of a measurement point; tan(δ) represents the dielectric loss tangent; and n represents the number of measurement points.

[0107] It is understandable that this embodiment also proposes a comprehensive evaluation method that combines spectral data and material performance data. By combining the eigenvectors of the total spectral data at different wavelengths with the reflection, transmission, scattering measurement data and the dielectric loss tangent, we constructed a multidimensional evaluation matrix. This matrix not only contains the spectral characteristic information of the insulating material, but also incorporates its electrical performance data, thus providing us with a more comprehensive and in-depth evaluation perspective. This method can more accurately reflect the comprehensive performance of the insulating material and provide more reliable data support for the selection, optimization and application of the material. By comprehensively considering the spectral characteristics and electrical properties, the test method of this embodiment shows higher accuracy and practicality in the field of evaluation of insulating materials.

[0108] In some embodiments of the present application, when performing insulation performance score calculation based on the multidimensional matrix, it includes:

[0109] Based on the multidimensional evaluation matrix M, the correlation coefficients Ri,j between the spectral data Dtotal,j and each physical number Asj, Csj, and tan(δj) are calculated respectively, and the physical properties are calculated according to the absolute values ​​of the correlation coefficients Ri,j to obtain the insulation performance score;

[0110] The calculation formula of the correlation coefficient Ri,j is:

[0111]

[0112] Wherein, μD represents the average value of all spectral measurement points; μi represents the mean value of the i-th physical property; Ri,j represents the linear correlation degree between the spectral data and the i-th physical property.

[0113] It is understandable that the present embodiment also proposes a method for calculating the insulation performance score based on a multidimensional evaluation matrix. In the multidimensional evaluation matrix, we integrate the spectral data and various physical property data of the insulating material, such as arc resistance, electrical strength and dielectric loss tangent. In order to evaluate the comprehensive performance of the insulating material, we calculated the correlation coefficient between the spectral data and each physical property. These correlation coefficients reflect the linear correlation between the spectral data and the physical properties, and provide us with an important basis for evaluating the performance of the insulating material. By calculating the absolute value of the correlation coefficient, we quantified the physical properties and obtained the insulation performance score. This method not only takes into account the spectral characteristics of the insulating material, but also comprehensively considers a variety of physical properties, so as to more accurately reflect the comprehensive performance of the material. This scoring calculation method based on a multidimensional evaluation matrix provides a more scientific basis and reliable evaluation means for the selection, optimization and application of insulating materials.

[0114] In some embodiments of the present application, the physical property is calculated according to the absolute value of the correlation coefficient Ri,j to obtain the insulation performance score, including:

[0115] The insulation performance score is calculated according to the following formula:

[0116]

[0117] Where Sp* represents the insulation performance score; wi represents the weight coefficient related to the physical property, satisfying Mij ​​represents the specific data value of the i-th parameter at the j-th measurement point.

[0118] It is understandable that this embodiment also proposes a specific insulation performance score calculation method. In this method, we use the correlation coefficient calculated previously, combined with the weight coefficient related to the physical property, to quantitatively score the performance of the insulating material. The introduction of the weight coefficient allows us to flexibly adjust the importance of different physical properties in the evaluation according to actual needs. In this way, the insulation performance score we obtain is not only more accurate, but also has more practical application value. This method provides a new perspective and tool for the selection, optimization and performance evaluation of insulating materials, which will help promote the further development of insulating material research and application.

[0119] In some embodiments of the present application, when determining the insulation performance level of the insulation material according to the calculation results, it includes:

[0120] The final evaluation result determines the insulation performance level through the preset threshold:

[0121] If Sp ≥ λ1, the evaluation is excellent;

[0122] If λ2≤Sp<λ1, the evaluation is good;

[0123] If Sp<λ2, the evaluation is unqualified;

[0124] Among them, λ1 and λ2 represent the evaluation thresholds of the insulation material performance.

[0125] It is understandable that this embodiment also proposes a method for determining the grade of insulating materials based on insulation performance scores. By comparing the insulation performance scores with preset thresholds, we can divide the performance of insulating materials into different levels, such as "excellent", "good" and "unqualified". This grade determination method not only provides a clearer basis for the selection of insulating materials, but also helps to quickly screen out insulating materials with excellent performance in practical applications. By setting reasonable evaluation thresholds, we can ensure the accuracy and reliability of the evaluation results and provide strong support for the research and application of insulating materials. This method of comprehensively considering multiple factors and making corresponding corrections and evaluations makes the testing method of this embodiment have higher accuracy and practicality in the field of performance evaluation of insulating materials, and provides a strong impetus for research and development in related fields.

[0126] See also Figure 2 This embodiment further proposes an insulation material testing system based on near-external spectroscopy, which is used to implement the above insulation material testing method based on near-external spectroscopy, including:

[0127] A spectrum measurement module is used to perform non-contact near-external spectrum measurement on insulating materials, obtain spectrum measurement data, and record environmental measurement data;

[0128] A physical test module, used to measure the physical properties of the insulating material, including arc resistance, electrical strength and dielectric loss tangent, and record measurement environment data;

[0129] A data correction module, used to correct the spectrum measurement data and physical data according to the environmental measurement data and the environmental test data to obtain corrected spectrum data and material performance data;

[0130] A data analysis module for constructing a multidimensional evaluation matrix based on the corrected spectral data and material performance data;

[0131] The performance evaluation module is used to calculate the insulation performance score through a multi-dimensional evaluation matrix and compare it with a preset threshold to determine the insulation performance level of the insulation material.

[0132] It is understandable that this embodiment also proposes a complete insulating material testing system based on near-external spectroscopy. The system realizes non-contact near-external spectroscopy measurement of insulating materials through a spectral measurement module, can accurately obtain spectral data, and record relevant environmental data. At the same time, the physical test module is responsible for measuring various physical properties of insulating materials, such as arc resistance, electrical strength and dielectric loss tangent, and also records the measurement environmental data. The data correction module uses environmental data to correct the spectral measurement data and physical data to eliminate the influence of environmental factors and obtain more accurate data. On this basis, the data analysis module constructs a multidimensional evaluation matrix to provide a basis for subsequent insulation performance evaluation. Finally, the performance evaluation module uses a multidimensional evaluation matrix to calculate the insulation performance score and compare it with a preset threshold to determine the insulation performance level of the insulating material. The introduction of this system not only realizes a comprehensive evaluation of the performance of insulating materials, but also improves the accuracy and practicality of the evaluation, providing strong support for the research and application of insulating materials.

[0133] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.

[0134] The present application is described with reference to flowcharts and / or block diagrams of methods, devices (systems) and computer program products according to embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0135] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0136] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0137] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for testing insulating materials based on near-external spectroscopy, characterized in that: include: Using a near-external spectral device to perform non-contact spectral measurement on an insulating material, obtaining spectral measurement data of the insulating material within a near-external spectral range, and recording environmental measurement data during spectral measurement, and correcting the spectral measurement data according to the environmental measurement data to obtain spectral data; the spectral measurement data includes reflection measurement data, transmission measurement data, and scattering measurement data; Testing the physical properties of the insulating material to obtain physical data, while recording environmental test data of the measuring environment, and correcting the physical data according to the environmental test data to obtain material performance data; the physical data includes electrical strength, arc resistance and dielectric loss tangent; The spectral data and material performance data are combined into a multidimensional evaluation matrix; insulation performance scoring calculation is performed based on the multidimensional matrix, and the insulation performance level of the insulation material is determined according to the calculation result.

2. The insulating material testing method based on near-external spectroscopy according to claim 1, characterized in that: The environmental measurement data includes temperature and humidity; The reflection measurement data is corrected by the following calculation: Wherein, DR represents the corrected reflection measurement data, DmR represents the measured reflection data, Rq represents the surface roughness parameter; H represents the ambient humidity, in %; T represents the ambient temperature, in K; The transmission measurement data is corrected by the following calculation: D T =D mT ·e -αT ·(1+βH)·e -δkd ; Wherein, DT represents the corrected transmission measurement data; DmT represents the measured transmission data; k represents the absorption coefficient; d represents the material thickness; The scatterometry data is corrected by the following calculation formula: Wherein, DS represents the corrected scattering measurement data; DmS represents the measured scattering data; r represents the particle radius; Ms represents the microscopic inhomogeneity coefficient.

3. The insulating material testing method based on near-external spectroscopy according to claim 2, characterized in that: Normalizing the corrected reflection measurement data, transmission measurement data, and scattering measurement data to obtain reflection normalized data, transmission normalized data, and scattering normalized data; The weights wR, wT, wS are assigned based on the spectral sensitivity of the reflection normalized data, the transmission normalized data and the scattering normalized data, and the total spectral data is calculated: D total =w R ·D norm，R +w T ·D nrom，T +w S ·D norm，S ; Wherein, Dtotal represents the total spectral data; Dnorm,R represents the reflection normalized data; Dnorm,T represents the transmission normalized data; Dnorm,S represents the scattering normalized data; wR+wT+wS=1.

4. The insulating material testing method based on near-external spectrum according to claim 3 is characterized in that: The electrical strength is corrected by the following calculation: C s =C m -γtan(δ)+ζE; Where Cm represents the measured electrical intensity; tan(δ) represents the dielectric loss tangent; γ and ζ represent the correction factors related to the dielectric constant and material parameters, respectively; and E represents the ambient electric field intensity in V / m.

5. The insulating material testing method based on near-external spectrum according to claim 4 is characterized in that: The arc resistance is corrected by the following calculation formula: A s =A m ·ln(1+κT e ); Among them, As represents the corrected arc resistance; Am represents the measured arc resistance; Te represents the arc environment temperature, the unit is K; κ represents the correction factor related to the arc resistance performance of the material.

6. The insulating material testing method based on near-external spectrum according to claim 5 is characterized in that: When the spectral data and material performance data are combined into a multi-dimensional evaluation matrix, it includes: The fused total spectral data Dtotal at different wavelength points λk is expressed as the total spectral feature vector: The fused total spectral feature vector is combined with the reflection measurement data, transmission measurement data, scattering measurement data and dielectric loss tangent to form a multidimensional evaluation matrix M: Wherein, each column in the multidimensional evaluation matrix M corresponds to a data set of a measurement point; tan(δ) represents the dielectric loss tangent; and n represents the number of measurement points.

7. The insulating material testing method based on near-external spectrum according to claim 6 is characterized in that: When calculating the insulation performance score based on the multidimensional matrix, it includes: Based on the multidimensional evaluation matrix M, the correlation coefficients Ri,j between the spectral data Dtotal,j and each physical number Asj, Csj, and tan(δj) are calculated respectively, and the physical properties are calculated according to the absolute values ​​of the correlation coefficients Ri,j to obtain the insulation performance score; The calculation formula of the correlation coefficient Ri,j is: Where μD represents the average value of all spectral measurement points; μi represents the mean value of the i-th physical property; Ri,j represents the linear correlation between the spectral data and the i-th physical property.

8. The insulating material testing method based on near-external spectrum according to claim 7 is characterized in that: The physical properties are calculated according to the absolute value of the correlation coefficient Ri,j to obtain the insulation performance score, including: The insulation performance score is calculated according to the following formula: Among them, Sp * represents the insulation performance score; wi represents the weight coefficient related to the physical property, satisfying Mij ​​represents the specific data value of the i-th parameter at the j-th measurement point.

9. The insulating material testing method based on near-external spectrum according to claim 8, characterized in that: When determining the insulation performance level of an insulating material based on calculation results, it includes: The final evaluation result determines the insulation performance level through the preset threshold: If Sp ≥ λ1, the evaluation is excellent; If λ2≤Sp<λ1, the evaluation is good; If Sp<λ2, the assessment is unqualified; Among them, λ1 and λ2 represent the evaluation thresholds of the insulation material performance.

10. An insulating material testing system based on near-external spectroscopy, used to implement the insulating material testing method based on near-external spectroscopy according to any one of claims 1 to 9, characterized in that: include: A spectrum measurement module is used to perform non-contact near-external spectrum measurement on insulating materials, obtain spectrum measurement data, and record environmental measurement data; A physical test module, used to measure the physical properties of the insulating material, including arc resistance, electrical strength and dielectric loss tangent, and record measurement environment data; A data correction module, used to correct the spectrum measurement data and physical data according to the environmental measurement data and the environmental test data to obtain corrected spectrum data and material performance data; A data analysis module for constructing a multidimensional evaluation matrix based on the corrected spectral data and material performance data; The performance evaluation module is used to calculate the insulation performance score through a multi-dimensional evaluation matrix and compare it with a preset threshold to determine the insulation performance level of the insulation material.

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