Multi-channel digital magnetic flux leakage composite probe array type testing device and method

Abstract

The invention provides a multichannel digital magnetic flux leakage composite probe array type testing device and method. The device comprises a data processing unit, an upper computer, a key selector, a downloader and a digital magnetic flux leakage composite probe array, wherein the digital magnetic flux leakage composite probe array comprises a base, a data transmission chip, digital magnetic flux leakage composite probes and a data output interface; the key selector is used for switching connection between the downloader and each digital magnetic flux leakage composite probe; the downloader is used for burning the driving program into each digital magnetic flux leakage composite probe; the data transmission chip is used for performing signal buffering and noise suppression processing on probe data of each driven digital magnetic flux leakage composite probe and then outputting the probe data to the data processing unit; the data processing unit is used for processing probe data and transmitting the probe data to the upper computer; and the upper computer is used for visualizing and displaying the processed probe data. According to the invention, the probe data of the digital magnetic flux leakage composite probe can be quickly checked in batches, and the test and production efficiency of the digital magnetic flux leakage composite probe is improved.

Description

Technical Field

[0001] The present application relates to the technical field of pipeline magnetic flux leakage detection, and in particular to a multi-channel digital magnetic flux leakage composite probe array testing device and method. Background Art

[0002] The production and testing of pipeline magnetic flux leakage equipment sensors is relatively low in mechanization. The process from sensor to probe packaging includes: sensor program download and testing, sensor packaging and testing, and sensor testing after being made into a probe. The above processes are all purely manual, especially the sensor testing process cannot be separated from human participation.

[0003] Small equipment has fewer probes installed. For example, a small-diameter pipeline magnetic leakage internal detector commonly used in industry is installed with more than a dozen probes. The time spent on production testing of a dozen probes is still within an acceptable range. However, large equipment has dozens or hundreds of probes installed. Currently, the commonly used large-diameter pipeline magnetic leakage internal detector generally has more than 100 probes installed. The production and testing tasks of these probes are relatively cumbersome, and it often takes a lot of time to simply make these probes.

[0004] The commonly used probe test method now is to test each probe one by one, that is, the downloader can only download the program to one probe at a time. After the program is downloaded, the single probe is connected to the host computer to observe whether the probe works normally, and then the program of the second probe is downloaded and tested. The probe test is repeated in this way. Combined with the above content, it can be seen that it takes at least three test processes to convert from one sensor to one probe. This repetition will take a lot of time and have low production efficiency. Summary of the invention

[0005] In view of the problems in the prior art, the embodiments of the present application provide a multi-channel digital magnetic flux leakage composite probe array testing device and method, which can at least partially solve the problems in the prior art.

[0006] In a first aspect, the present application provides a multi-channel digital magnetic flux leakage composite probe array test device, comprising: a digital magnetic flux leakage composite probe array, a data processing unit, a host computer, a key selector and a downloader;

[0007] The digital magnetic flux leakage composite probe array includes a base, a data transmission chip, a plurality of digital magnetic flux leakage composite probes and a plurality of data output interfaces;

[0008] The key selector is connected to the downloader and the digital magnetic flux leakage composite probe array, and is used to switch the connection between the downloader and each of the digital magnetic flux leakage composite probes;

[0009] The downloader is used to burn the driver into each of the digital magnetic flux leakage composite probes to drive each of the digital magnetic flux leakage composite probes;

[0010] The multiple data output interfaces and the data transmission chip are arranged on the base, and each of the digital magnetic flux leakage composite probes is connected to the data transmission chip via a corresponding data output interface;

[0011] The data transmission chip is connected to the data processing unit and is used for performing signal buffering and noise suppression processing on the probe data of each driven digital magnetic flux leakage composite probe and then outputting the data to the data processing unit;

[0012] The data processing unit is connected to the host computer and is used to process the probe data and transmit it to the host computer;

[0013] The host computer is used to visualize and display the processed probe data.

[0014] Furthermore, the data processing unit includes: an FPGA processing module and an MCU processing module;

[0015] The FPGA processing module is connected to the MCU processing module, and is used to sequentially process the probe data of each digital magnetic flux leakage composite probe and transmit the processed probe data to the MCU processing module according to the FSMC protocol;

[0016] The MCU processing module is connected to the host computer and is used to transmit the processed probe data to the host computer in sequence according to the USB protocol.

[0017] Furthermore, the host computer includes a visualization module and a display module;

[0018] The visualization module is used to analyze the processed probe data and generate visualization graphics;

[0019] The display module is used to display the visual graphics.

[0020] Furthermore, the data transmission chip is a 74HCT541 chip, and each 74HCT541 chip supports connection to 8 of the data output interfaces.

[0021] Furthermore, the key selector includes a selection switch and a digital tube.

[0022] Furthermore, the data transmission protocol followed between the digital magnetic flux leakage composite probe and the data processing unit is the IIC communication protocol.

[0023] Furthermore, there are multiple digital magnetic flux leakage composite probe arrays, each of which includes 20 digital magnetic flux leakage composite probes and corresponding 20 data output interfaces. Each digital magnetic flux leakage composite probe array acts as an independent entity to exchange data with the data processing unit.

[0024] Furthermore, it also includes: a power module;

[0025] The power module is connected to the data processing unit and connected to the digital magnetic flux leakage composite probe array through a power interface, and is used to supply power to the digital magnetic flux leakage composite probe array and the data processing unit.

[0026] Furthermore, the power supply module outputs 5V direct current.

[0027] In a second aspect, the present application provides a multi-channel digital magnetic flux leakage composite probe array testing method, which is applied to the multi-channel digital magnetic flux leakage composite probe array testing device described in any of the above embodiments, comprising:

[0028] The downloader switches the connection with each of the digital magnetic flux leakage composite probes through the key selector, and burns the driver into each of the digital magnetic flux leakage composite probes to drive each of the digital magnetic flux leakage composite probes;

[0029] The data transmission chip performs signal buffering and noise suppression processing on the probe data of each driven digital magnetic flux leakage composite probe and then outputs the data to the data processing unit;

[0030] The data processing unit processes the probe data and transmits the data to the host computer;

[0031] The host computer visualizes and displays the processed probe data.

[0032] The multi-channel digital magnetic flux leakage composite probe array test device and method provided in the present application include a digital magnetic flux leakage composite probe array, a data processing unit, a host computer, a key selector and a downloader; the digital magnetic flux leakage composite probe array includes a base, a data transmission chip, multiple digital magnetic flux leakage composite probes and multiple data output interfaces; the key selector is connected to the downloader and the digital magnetic flux leakage composite probe array, and is used to switch the connection between the downloader and each of the digital magnetic flux leakage composite probes; the downloader is used to burn the driver program into each of the digital magnetic flux leakage composite probes to drive each of the digital magnetic flux leakage composite probes; the multiple data output interfaces and the data transmission chip Arranged on the base, each of the digital magnetic flux leakage composite probes is connected to the data transmission chip via a corresponding data output interface; the data transmission chip is connected to the data processing unit, and is used for performing signal buffering and noise suppression processing on the probe data of each of the driven digital magnetic flux leakage composite probes and then outputting the data to the data processing unit; the data processing unit is connected to the host computer, and is used for processing the probe data and transmitting the probe data to the host computer; the host computer is used for visualizing and displaying the processed probe data, thereby realizing rapid batch viewing of the probe data of the digital magnetic flux leakage composite probes and improving the testing and production efficiency of the digital magnetic flux leakage composite probes.

[0033] Among them, the data processing unit can improve the processing performance, flexibly adapt to different application requirements, and improve safety; the host computer can provide a tactical and intuitive visual interface, so that testers can quickly judge abnormal situations; the key selector can control the interconnection of each digital magnetic leakage composite probe and the downloader interface, which is convenient for program downloading, improves production efficiency, and optimizes the program download process; the data transmission chip can enhance the signal driving capability to ensure that the signal is not distorted or attenuated during transmission, protecting the upstream circuit from the impact of downstream circuit load changes. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0035] Figure 1 It is a structural schematic diagram of a multi-channel digital magnetic flux leakage composite probe array test device provided in one embodiment of the present application;

[0036] Figure 2 It is a structural schematic diagram of a digital magnetic flux leakage composite probe array provided in one embodiment of the present application;

[0037] Figure 3 is a structural diagram of a data processing unit provided in one embodiment of the present application;

[0038] Figure 4 is a working schematic diagram of a data processing unit provided in one embodiment of the present application;

[0039] Figure 5 It is a structural diagram of a host computer provided in an embodiment of the present application;

[0040] Figure 6 It is a schematic diagram of a process of generating a visualization graphic by a visualization module provided in an embodiment of the present application;

[0041] Figure 7 It is a structural schematic diagram of a multi-channel digital magnetic flux leakage composite probe array test device provided in an embodiment of the present application;

[0042] Figure 8 It is a structural schematic diagram of a multi-channel digital magnetic flux leakage composite probe array test device provided in an embodiment of the present application;

[0043] Fig. 9 It is a flow chart of a multi-channel digital magnetic flux leakage composite probe array testing method provided in one embodiment of the present application. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the embodiments of the present application are further described in detail below in conjunction with the accompanying drawings. Here, the illustrative embodiments of the present application and their descriptions are used to explain the present application, but are not intended to limit the present application. It should be noted that, in the absence of conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0045] Figure 1 FIG. 1 is a schematic diagram of the structure of a multi-channel digital magnetic flux leakage composite probe array test device provided in an embodiment of the present application. Figure 1 As shown, the multi-channel digital magnetic flux leakage composite probe array test device provided by the present application includes: a digital magnetic flux leakage composite probe array 1, a data processing unit 2, a host computer 3, a key selector 4 and a downloader 5;

[0046] Figure 2 FIG. 1 is a structural diagram of a digital magnetic flux leakage composite probe array 1 provided in an embodiment of the present application. Figure 2 As shown, the digital magnetic flux leakage composite probe array 1 includes a base 12, a data transmission chip 14, a plurality of digital magnetic flux leakage composite probes 11 and a plurality of data output interfaces 13;

[0047] The button selector 4 is connected to the downloader 5 and the digital magnetic flux leakage composite probe array 1, and is used to switch the connection between the downloader 5 and each of the digital magnetic flux leakage composite probes 11;

[0048] The downloader 5 is used to burn the driver into each of the digital magnetic flux leakage composite probes 11 to drive each of the digital magnetic flux leakage composite probes 11;

[0049] The multiple data output interfaces 13 and the data transmission chip 14 are arranged on the base 12, and each of the digital magnetic flux leakage composite probes 11 is connected to the data transmission chip 14 via the corresponding data output interface 13;

[0050] The data transmission chip 14 is connected to the data processing unit 2 and is used for performing signal buffering and noise suppression processing on the probe data of each driven digital magnetic flux leakage composite probe 11 and then outputting it to the data processing unit 2;

[0051] The data processing unit 2 is connected to the host computer 3 and is used to process the probe data and transmit it to the host computer 3;

[0052] The host computer 3 is used to visualize and display the processed probe data.

[0053] Specifically, each digital magnetic flux leakage composite probe 11 corresponds to an independent data output interface 13, which is distributed in an array on the base 12 and connected to the data processing unit 2 through the data output interface 13. When the digital magnetic flux leakage composite probe 11 works normally, it sends probe data to the data processing unit 2 through the data output interface 13, so that the data processing unit 2 analyzes the received probe data to determine whether the digital magnetic flux leakage composite probe 11 is qualified. Among them, the probe data includes the data of all sensors on the probe.

[0054] In order to enhance the signal driving capability, ensure that the signal is not distorted or attenuated during transmission, and protect the upstream circuit from the influence of the load change of the downstream circuit, a data transmission chip 14 is installed on the base 12 of the digital magnetic flux leakage composite probe array 1. The probe data of each digital magnetic flux leakage composite probe 11 is processed by the data transmission chip 14 for signal buffering and noise suppression, and then transmitted to the data processing unit 2, so that the signal quality can be guaranteed even when the connecting line is long.

[0055] The digital magnetic flux leakage composite probe array 1 realizes the interconnection of each probe with the downloader 5 interface through the key selector 4. The key selector 4 is connected to the probe No. 1 in the default state. Each time the key is pressed, the number on the key selector 4 is increased by 1, and the downloader 5 is connected to the probe with the corresponding digital serial number. After the program download is completed, it is no longer necessary to disconnect the downloader 5 from the probe. The connection is controlled by the key, which facilitates program downloading and improves production efficiency.

[0056] The data transmission between the digital magnetic flux leakage composite probe 11 and the data processing unit 2 follows the data transmission protocol, which is a collection of rules and standards that need to be followed.

[0057] The data processing unit 2 is connected to the host computer 3. The data processing unit 2 receives the probe data from the digital magnetic flux leakage composite probe 11, processes and analyzes it in sequence, and then transmits the processed probe data to the host computer 3; the host computer 3 receives the processed probe data from the data processing unit 2, and uses visualization technology to display the processed probe data in multiple dimensions, so that the user can intuitively observe and analyze the changes and trends of the probe data, thereby providing support for further monitoring and decision-making.

[0058] In one embodiment, if Figure 7 As shown, when the program is downloaded, the computer 100, the downloader 5, the key selector 4 and the digital magnetic flux leakage composite probe array 1 are operated as follows: Figure 7 The connection is made in the connection mode. No additional power supply is required when downloading the driver program. The computer 100 can provide the power required by the probe. After the connection is completed, the probe enters the initial power-on state. At this time, the key selector 4 selects probe No. 1 by default, and the digital tube displays 1 by default. At this time, the program can be downloaded to probe No. 1. After waiting for a few seconds, the program download of probe No. 1 is completed. The downloader 5 is connected to probe No. 2 through the key selector 4. At this time, the driver program can be downloaded to probe No. 2. This can be done by analogy until the program download is completed after the drivers of all probes.

[0059] In one embodiment, the key selector 4 includes a selection switch and a digital tube.

[0060] Specifically, the key selector 4 is composed of an 8-bit selection switch and a 3-bit digital tube. The selector supports a maximum of 256 probes, and the maximum number displayed by the 3-bit digital tube is 256. When connected to the 256th probe, pressing the key will connect to the first probe and start the second cycle.

[0061] In one embodiment, the data transmission protocol followed between the digital magnetic flux leakage composite probe 11 and the data processing unit 2 is the IIC communication protocol.

[0062] In one embodiment, a multi-channel digital magnetic flux leakage composite probe array testing device may include multiple digital magnetic flux leakage composite probe arrays 1, each of which may include 20 digital magnetic flux leakage composite probes 11 and corresponding 20 data output interfaces 13, and each digital magnetic flux leakage composite probe array 1 acts as an independent entity to exchange data with the data processing unit 2.

[0063] In one embodiment, if Figure 2As shown, 20 digital magnetic flux leakage composite probes 11 are arranged in 4 rows and 5 columns on the base 12, and are arranged in the order of serial numbers 1 to 20. This serial number is the order followed by the digital magnetic flux leakage composite probe array 1 when downloading the driver and outputting data.

[0064] In one embodiment, the data transmission chip 14 is a 74HCT541 chip, and each 74HCT541 chip supports connecting to eight of the data output interfaces 13 .

[0065] Specifically, if Figure 2 As shown, when the digital magnetic flux leakage composite probe array 1 can include 20 digital magnetic flux leakage composite probes 11 and corresponding 20 data output interfaces 13, the digital magnetic flux leakage composite probe array 1 is installed with three 74HCT541 chips, each of which supports connection to eight data output interfaces 13, providing data transmission services for the eight digital magnetic flux leakage composite probes 11.

[0066] Figure 3 is a schematic diagram of the structure of a data processing unit 2 provided in an embodiment of the present application, such as Figure 3 As shown, the data processing unit 2 includes: an FPGA processing module 21 and an MCU processing module 22;

[0067] The FPGA processing module 21 is connected to the MCU processing module 22, and is used to sequentially process the probe data of each digital magnetic flux leakage composite probe 11 and transmit the processed probe data to the MCU processing module 22 according to the FSMC protocol;

[0068] The MCU processing module 22 is connected to the host computer 3 and is used to transmit the processed probe data to the host computer 3 in sequence according to the USB protocol.

[0069] Specifically, the FPGA (Field-Programmable Gate Array) processing module 21 is an FPGA processor with programmable characteristics, allowing users to implement different logic functions through reprogramming. The logic circuits in the FPGA processing module 21 can be executed in parallel, thereby providing higher processing performance. This feature enables the FPGA processing module 21 to flexibly adapt to different application requirements, and also has the characteristics of low power consumption, high performance, flexibility, and can support multiple communication protocols.

[0070] The MCU (Microcontroller Unit) processing module 22 is an MCU processor, which has the advantages of low power consumption, high performance, high security and rich interfaces. Through programming, the MCU chip can flexibly control the functions and performance of these ports to meet different application requirements and support multiple communication protocols.

[0071] like Figure 4 The figure shows the working diagram of the data processing unit 2. The FPGA processing module 21 serves as the data comprehensive processing center. After the data of the digital magnetic flux leakage composite probe array 1 is sent, the probe data of the digital magnetic flux leakage composite probe 11 is received according to the corresponding data transmission protocol. After all the data are processed in sequence, they are temporarily stored in the buffer area of ​​the FPGA processing module 21 to prepare for subsequent batch transmission. The effective data sent by the magnetic flux leakage sensor of the digital magnetic flux leakage composite probe 11 is 8 bits each time, and 1 bit of data is transmitted in one clock cycle. In order to improve the data transmission efficiency, the data is first converted from 1 bit width data to 8 bit width, and then processed into 16 bit data. Finally, the processed probe data is transmitted to the MCU processing module 22 in a data format with a bit width of 16 bits according to the FSMC protocol;

[0072] The MCU processing module 22 is a bridge for data transmission between the FPGA processing module 21 of the data processing unit 2 and the host computer 3. It sets the baud rate, data bit, stop bit, check bit and other parameters of data transmission internally, arranges the processed probe data in sequence and outputs it to the host computer 3 according to the USB protocol, and realizes the serial communication function through USB-to-Serial.

[0073] In one embodiment, the MCU processing module 22 is used to receive instruction data sent by the host computer 3 .

[0074] In one embodiment, the processing operations of the probe data by the FPGA processing module 21 include but are not limited to data filtering, signal enhancement, data format conversion, data splicing, and anomaly detection, etc. For example, valid information is extracted from the data sent by the probe, and preliminary analysis is performed to determine whether the data is complete and conforms to a predetermined format.

[0075] Figure 5 is a schematic diagram of the structure of the host computer 3 provided in an embodiment of the present application, such as Figure 5 As shown, the host computer 3 includes a visualization module 31 and a display module 32;

[0076] The visualization module 31 is used to analyze the processed probe data and generate visualization graphics;

[0077] The display module 32 is used to display the visual graphics.

[0078] Specifically, the upper computer 3 is used to monitor the probe data and can provide an intuitive visualization interface. The visualization module 31 visualizes the data collected from the lower computer (such as the data processing unit 2) and displays the generated visualization graph to the operator through the display module 32. The visualization graph on the display module 32 enables the tester to quickly determine abnormal conditions.

[0079] In one embodiment, the visualization graphics may be in the form of charts, real-time curves, images, and reports.

[0080] In one embodiment, the visualization graph is a specific waveform generated by the host computer 3 using the data of each sensor of each digital magnetic flux leakage composite probe 11. The position of the probe data of each digital magnetic flux leakage composite probe 11 on the display module 32 is fixed, and each sensor of each digital magnetic flux leakage composite probe 11 corresponds to a waveform. The digital magnetic flux leakage composite probe 11 contains different numbers of sensors according to different shapes and sizes, and the number of waveforms generated is not exactly the same, but the position on the display module 32 is fixed.

[0081] In one embodiment, if Figure 6 The figure shows a flow chart of the visualization module 31 generating visualization graphics. The MCU processing module 22 sends the data to the host computer 3 in sequence. The host computer 3 receives the data in sequence and determines the frame header and frame tail in the received data. The frame header and frame tail are specific characters. The data between the frame header and the frame tail are the data of the digital magnetic flux leakage composite probe array 1. Then, the data of each digital magnetic flux leakage composite probe array 1 is parsed. Each digital magnetic flux leakage composite probe array 1 includes 20 digital magnetic flux leakage composite probes 11. Each digital magnetic flux leakage composite probe 11 has 8 sensors, which are 4 magnetic signal sensors and 4 eddy current coil sensors. Each magnetic signal sensor has 3 directional components. Therefore, 1 digital magnetic flux leakage composite probe 11 corresponds to 16 signals. All signals are displayed on the host computer 3 to detect all digital magnetic flux leakage composite probes 11, which greatly improves the test efficiency.

[0082] In one embodiment, the display module 32 also provides a function of sending control instructions to achieve interaction between the host computer 3 and the data processing unit 2 .

[0083] Figure 8 FIG. 1 is a schematic diagram of the structure of a multi-channel digital magnetic flux leakage composite probe array test device provided in an embodiment of the present application. Figure 8 As shown, the multi-channel digital magnetic flux leakage composite probe array test device provided by the present application also includes: a power supply module 6;

[0084] The power module 6 is connected to the data processing unit 2 and connected to the digital magnetic flux leakage composite probe array 1 through a power interface, and is used to supply power to the digital magnetic flux leakage composite probe array 1 and the data processing unit 2 .

[0085] Specifically, the input end of the power module 6 is a wide range DC voltage of 9 to 36 V, with a minimum of 9 V and a maximum of 36 V. Any DC voltage within this range can be used. After all the connection lines are connected, the power module 6 supplies power to the multi-channel digital magnetic flux leakage composite probe array test device to test each digital magnetic flux leakage composite probe 11.

[0086] In one embodiment, the power module 6 outputs 5V direct current.

[0087] Specifically, the power supply required by the digital magnetic flux leakage composite probe array 1 and the data processing unit 2 is strictly required, and both are DC 5V regulated power supplies. The output port of the power module 6 outputs a constant DC voltage of 5V, which is directly connected to the digital magnetic flux leakage composite probe array 1 and the data processing unit 2. When the multi-channel digital magnetic flux leakage composite probe array test device includes multiple digital magnetic flux leakage composite probe arrays 1, two adjacent digital magnetic flux leakage composite probe arrays 1 are connected to each other to achieve 5V DC power sharing.

[0088] The present application provides a multi-channel digital magnetic flux leakage composite probe array test device, which includes a digital magnetic flux leakage composite probe array, a data processing unit and a host computer; the digital magnetic flux leakage composite probe array includes a base, multiple digital magnetic flux leakage composite probes and multiple data output interfaces; each of the digital magnetic flux leakage composite probes is arranged on the base, and connected to the data processing unit through the corresponding data output interface, so as to output the probe data to the data processing unit; the data processing unit is connected to the host computer, so as to process the probe data and transmit it to the host computer; the host computer is used to visualize and display the processed probe data, so as to realize the rapid batch viewing of the probe data of the digital magnetic flux leakage composite probe, and improve the testing and production efficiency of the digital magnetic flux leakage composite probe. Among them, the processing performance can be improved by the data processing unit, which can flexibly adapt to different application requirements and improve safety; the host computer can provide a tactical and intuitive visual interface, so that the test personnel can quickly judge abnormal situations.

[0089] In addition, the key selector can control the interconnection between each digital magnetic leakage composite probe and the downloader interface, which facilitates program downloading, improves production efficiency, and optimizes the program download process; the data transmission chip can enhance the signal driving capability to ensure that the signal is not distorted or attenuated during transmission, protecting the upstream circuit from changes in the downstream circuit load; the power supply module improves the flexibility of the power supply.

[0090] In addition, the present application also provides a multi-channel digital magnetic flux leakage composite probe array testing method, which completes the multi-channel digital magnetic flux leakage composite probe array testing by using the multi-channel digital magnetic flux leakage composite probe array testing device described in the above embodiment.

[0091] Fig. 9 FIG. 1 is a flow chart of a multi-channel digital magnetic flux leakage composite probe array testing method provided in an embodiment of the present application. Fig. 9 As shown, the multi-channel digital magnetic flux leakage composite probe array testing method provided by the present application includes:

[0092] S901: the downloader switches the connection with each of the digital magnetic flux leakage composite probes through the key selector, and burns the driver into each of the digital magnetic flux leakage composite probes to drive each of the digital magnetic flux leakage composite probes;

[0093] The digital magnetic flux leakage composite probe array interconnects each probe with the downloader interface through a key selector. The key selector is connected to probe No. 1 in the default state. Each time the key is pressed, the number on the key selector increases by 1, and the downloader is connected to the probe with the corresponding digital serial number. After the program is downloaded, there is no need to disconnect the downloader from the probe. The connection is controlled by keys, which facilitates program downloading and improves production efficiency.

[0094] S902: the data transmission chip performs signal buffering and noise suppression processing on the probe data of each driven digital magnetic flux leakage composite probe and outputs the data to the data processing unit;

[0095] Specifically, each digital magnetic flux leakage composite probe corresponds to an independent data output interface, which is distributed in an array on the base and connected to the data processing unit through the data output interface. When the digital magnetic flux leakage composite probe works normally, the probe data is sent to the data processing unit through the data output interface, so that the data processing unit analyzes the received probe data to determine whether the digital magnetic flux leakage composite probe is qualified. Among them, the probe data includes the data of all sensors on the probe.

[0096] In order to enhance the signal driving capability, ensure that the signal is not distorted or attenuated during transmission, and protect the upstream circuit from the impact of downstream circuit load changes, a data transmission chip is installed at the base of the digital magnetic flux leakage composite probe array. The probe data of each digital magnetic flux leakage composite probe is processed by the data transmission chip for signal buffering and noise suppression before being transmitted to the data processing unit. This ensures signal quality even when the connecting line is long.

[0097] The data transmission between the digital magnetic flux leakage composite probe and the data processing unit follows the data transmission protocol, which is a collection of rules and standards that need to be followed.

[0098] S903: The data processing unit processes the probe data and transmits the data to the host computer;

[0099] Specifically, the data processing unit is connected to the host computer, and the data processing unit receives probe data from the digital magnetic flux leakage composite probe, processes and analyzes the probe data in sequence, and then transmits the processed probe data to the host computer.

[0100] S904: The host computer visualizes and displays the processed probe data.

[0101] Specifically, the host computer receives the processed probe data from the data processing unit, and uses visualization technology to display the processed probe data in multiple dimensions, so that users can intuitively observe and analyze the changes and trends of the probe data, thereby providing support for further monitoring and decision-making.

[0102] The present application provides a multi-channel digital magnetic flux leakage composite probe array test method, wherein each digital magnetic flux leakage composite probe outputs probe data to the data processing unit; the data processing unit processes the probe data and transmits it to the host computer; the host computer visualizes and displays the processed probe data, thereby realizing rapid batch viewing of the probe data of the digital magnetic flux leakage composite probe, and improving the testing and production efficiency of the digital magnetic flux leakage composite probe. Among them, by processing the probe data by the data processing unit and transmitting it to the host computer, the processing performance can be improved, it can flexibly adapt to different application requirements, and it can improve safety; by visualizing and displaying the processed probe data by the host computer, it can provide a tactical and intuitive visual interface, so that testers can quickly judge abnormal situations.

[0103] In addition, the key selector can control the interconnection between each digital magnetic leakage composite probe and the downloader interface, which facilitates program downloading, improves production efficiency, and optimizes the program download process; the data transmission chip can enhance the signal driving capability to ensure that the signal is not distorted or attenuated during transmission, protecting the upstream circuit from changes in the downstream circuit load; the power supply module improves the flexibility of the power supply.

[0104] In the description of this specification, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", etc. are used only for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present application, unless otherwise specified, "multiple" means two or more.

[0105] The descriptions with reference to the terms "one embodiment", "a specific embodiment", "some embodiments", "for example", "example", "specific example", or "some examples" etc. mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. The order of steps involved in each embodiment is used to schematically illustrate the implementation of the present application, and the order of steps therein is not limited and may be appropriately adjusted as needed.

[0106] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood by specific circumstances.

[0107] The specific embodiments described above further illustrate the purpose, technical solutions and beneficial effects of the present application. It should be understood that the above description is only a specific embodiment of the present application and is not intended to limit the scope of protection of the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A multi-channel digital magnetic flux leakage composite probe array test device, characterized in that: include: Digital magnetic flux leakage composite probe array, data processing unit, host computer, key selector and downloader; The digital magnetic flux leakage composite probe array includes a base, a data transmission chip, a plurality of digital magnetic flux leakage composite probes and a plurality of data output interfaces; The key selector is connected to the downloader and the digital magnetic flux leakage composite probe array, and is used to switch the connection between the downloader and each of the digital magnetic flux leakage composite probes; The downloader is used to burn the driver into each of the digital magnetic flux leakage composite probes to drive each of the digital magnetic flux leakage composite probes; The multiple data output interfaces and the data transmission chip are arranged on the base, and each of the digital magnetic flux leakage composite probes is connected to the data transmission chip via a corresponding data output interface; The data transmission chip is connected to the data processing unit and is used for performing signal buffering and noise suppression processing on the probe data of each driven digital magnetic flux leakage composite probe and then outputting the data to the data processing unit; The data processing unit is connected to the host computer and is used to process the probe data and transmit it to the host computer; The host computer is used to visualize and display the processed probe data.

2. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: The data processing unit includes: an FPGA processing module and an MCU processing module; The FPGA processing module is connected to the MCU processing module, and is used to sequentially process the probe data of each digital magnetic flux leakage composite probe and transmit the processed probe data to the MCU processing module according to the FSMC protocol; The MCU processing module is connected to the host computer and is used to transmit the processed probe data to the host computer in sequence according to the USB protocol.

3. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: The host computer includes a visualization module and a display module; The visualization module is used to analyze the processed probe data and generate visualization graphics; The display module is used to display the visual graphics.

4. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: The data transmission chip is a 74HCT541 chip, and each 74HCT541 chip supports connection to 8 data output interfaces.

5. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: The key selector comprises a selection switch and a digital tube.

6. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: The data transmission protocol followed between the digital magnetic flux leakage composite probe and the data processing unit is the IIC communication protocol.

7. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: There are multiple digital magnetic flux leakage composite probe arrays, each of which includes 20 digital magnetic flux leakage composite probes and corresponding 20 data output interfaces. Each digital magnetic flux leakage composite probe array acts as an independent entity to exchange data with the data processing unit.

8. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 1, characterized in that: Also includes: Power module; The power module is connected to the data processing unit and connected to the digital magnetic flux leakage composite probe array through a power interface, and is used to supply power to the digital magnetic flux leakage composite probe array and the data processing unit.

9. The multi-channel digital magnetic flux leakage composite probe array test device according to claim 8, characterized in that: The power supply module outputs 5V direct current.

10. A multi-channel digital magnetic flux leakage composite probe array testing method, applied to the multi-channel digital magnetic flux leakage composite probe array testing device according to any one of claims 1 to 9, characterized in that: include: The downloader switches the connection with each of the digital magnetic flux leakage composite probes through the key selector, and burns the driver into each of the digital magnetic flux leakage composite probes to drive each of the digital magnetic flux leakage composite probes; The data transmission chip performs signal buffering and noise suppression processing on the probe data of each driven digital magnetic flux leakage composite probe and then outputs the data to the data processing unit; The data processing unit processes the probe data and transmits the data to the host computer; The host computer visualizes and displays the processed probe data.

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