Adjustable microwave device test fixture

Abstract

The invention provides an adjustable microwave device test clamp which comprises an interlayer, a first sliding block, a second sliding block, a first fixing nut, a second fixing nut, a first sliding block adjusting bolt, a second sliding block adjusting bolt, a first SMA connector and a second SMA connector. The first sliding block adjusting bolt and the first fixing nut jointly form a first lead screw structure to adjust the relative position of the interlayer and the first sliding block. The second sliding block adjusting bolt and the second fixing nut jointly form a second lead screw structure so as to adjust the relative position of the interlayer and the second sliding block. The micro-strip circuit is installed on the interlayer, the first sliding block and the second sliding block, a tested component is placed on the micro-strip circuit, and the positions of the first sliding block and the second sliding block relative to the interlayer are adjusted by adjusting the first sliding block adjusting bolt and the second sliding block adjusting bolt so that the tested component can be matched with the micro-strip circuit in size. According to the technical scheme, the technical problems that in the prior art, packaging sizes of microwave devices are diversified, the same testing clamp needs to be developed independently, a large amount of manpower and material resources are consumed, and the testing period is prolonged are solved.

Description

Technical Field

[0001] The invention relates to the technical field of component testing, and in particular to an adjustable microwave device testing fixture. Background Art

[0002] With the development of miniaturization and integration of microwave devices, most microwave devices are currently surface-mount devices, which cannot be directly connected to coaxial test cables and connected to the test system for testing. In microwave device testing, fixed-size test fixtures are generally used. Due to the diverse package sizes of microwave devices, different test fixtures need to be developed separately, which consumes a lot of manpower and material resources and prolongs the test cycle. Summary of the invention

[0003] The present invention provides an adjustable microwave device test fixture, which can solve the technical problem in the prior art that due to the diverse packaging sizes of microwave devices, different test fixtures need to be developed separately, which consumes a lot of manpower and material resources and prolongs the test cycle.

[0004] According to one aspect of the present invention, an adjustable microwave device test fixture is provided, and the adjustable microwave device test fixture includes: an interlayer, the interlayer has a first interlayer threaded hole and a second interlayer threaded hole; a first slider and a second slider, the first slider has a first accommodating cavity and a first positioning hole, and the second slider has a second accommodating cavity and a second positioning hole; a first fixing nut and a second fixing nut, the first fixing nut has a first threaded hole, and the first fixing nut is fixedly arranged in the first accommodating cavity, the second fixing nut has a second threaded hole, and the second fixing nut is fixedly arranged in the second accommodating cavity; a first slider adjusting bolt, the first slider adjusting bolt passes through the first threaded hole, the first interlayer threaded hole and the second positioning hole in sequence, and the first slider adjusting bolt and the first fixing nut together constitute a first screw structure to adjust the relative position of the interlayer and the first slider The invention relates to a method for manufacturing a microstrip circuit comprising: a first slider adjusting bolt, the second slider adjusting bolt passing through the second threaded hole, the second interlayer threaded hole and the first positioning hole in sequence, the second slider adjusting bolt and the second fixing nut jointly forming a second lead screw structure to adjust the relative position of the interlayer and the second slider; a first SMA connector and a second SMA connector, the first SMA connector being fixedly arranged on the first slider, and the second SMA connector being fixedly arranged on the second slider; wherein the microstrip circuit is mounted on the interlayer, the first slider and the second slider, the microstrip circuit is connected to an external test cable through the first SMA connector and the second SMA connector, the components to be tested are placed on the microstrip circuit, and the positions of the first slider and the second slider relative to the interlayer are adjusted by adjusting the first slider adjusting bolt and the second slider adjusting bolt so that the components to be tested match the size of the microstrip circuit.

[0005] Furthermore, the adjustable microwave device test fixture also includes a first limiting bolt and a second limiting bolt, the first slider also has a first limiting hole, and the second slider also has a second limiting hole. The first limiting bolt passes through the first limiting hole to tighten the first slider adjustment bolt, and the second limiting bolt passes through the second limiting hole to tighten the second slider adjustment bolt.

[0006] Furthermore, the first SMA connector is fixedly connected to the first slider via screws, and the second SMA connector is fixedly connected to the second slider via screws.

[0007] Furthermore, a groove is engraved on the surface of the microstrip circuit, and the groove is used to place the inner conductors of the first SMA connector and the second SMA connector.

[0008] Furthermore, the interlayer, the first slider and the second slider are all made of brass material with gold-plated surface.

[0009] By applying the technical solution of the present invention, an adjustable microwave device test fixture is provided. The adjustable microwave device test fixture is provided with an interlayer 10, a first slider 20, a second slider 30, a first fixing nut 40, a second fixing nut, a first slider adjusting bolt 50 and a second slider adjusting bolt 60. The first slider adjusting bolt 50 and the first fixing nut 40 together constitute a first screw structure to adjust the relative position of the interlayer 10 and the first slider 20. The second slider adjusting bolt 60 and the second fixing nut together constitute a second screw structure to adjust the relative position of the interlayer 10 and the second slider 30. The first slider adjusting bolt 50 and the second slider adjusting bolt 60 are adjusted to adjust the position of the first slider 20 and the second slider 30 relative to the interlayer 10 so that the measured components match the size of the microstrip circuit. Therefore, compared with the prior art, the adjustable microwave device test fixture provided by the present invention can meet the test requirements of microwave devices of different package sizes by adjusting the relative position of the slider and the interlayer, and there is no need to customize the test fixture according to different package sizes, which effectively reduces the cost and test cycle. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] The included drawings are used to provide a further understanding of the embodiments of the present invention, which constitute a part of the specification, are used to illustrate the embodiments of the present invention, and together with the text description, explain the principles of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0011] Figure 1 An overall schematic diagram of an adjustable microwave device test fixture provided according to a specific embodiment of the present invention is shown;

[0012] Figure 2A three-dimensional assembly diagram of an adjustable microwave device test fixture provided according to a specific embodiment of the present invention is shown.

[0013] The above drawings include the following reference numerals:

[0014] 10. interlayer; 20. first slider; 30. second slider; 40. first fixing nut; 50. first slider adjustment bolt; 60. second slider adjustment bolt; 70. first SMA connector; 80. second SMA connector; 90. first limiting bolt; 100. second limiting bolt. DETAILED DESCRIPTION

[0015] It should be noted that, in the absence of conflict, the embodiments in this application and the features in the embodiments can be combined with each other. The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0016] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0017] Unless otherwise specifically stated, the relative arrangement of the parts and steps described in these embodiments, numerical expressions and numerical values ​​do not limit the scope of the present invention. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to the actual proportional relationship. The technology, method and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, method and equipment should be regarded as a part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0018] like Figure 1 and Figure 2 As shown, according to a specific embodiment of the present invention, an adjustable microwave device test fixture is provided, the adjustable microwave device test fixture comprising an interlayer 10, a first slider 20, a second slider 30, a first fixing nut 40, a second fixing nut, a first slider adjusting bolt 50, a second slider adjusting bolt 60, a first SMA connector 70 and a second SMA connector 80, the interlayer 10 has a first interlayer threaded hole and a second interlayer threaded hole, the first slider 20 has a first accommodating cavity and a first positioning hole, the second slider 30 has a second accommodating cavity and a second positioning hole, the first fixing nut 40 has a first threaded hole, the first fixing nut 40 is fixedly arranged in the first accommodating cavity, the second fixing nut has a second threaded hole, the second fixing nut is fixedly arranged in the second accommodating cavity, the first slider adjusting bolt 50 passes through the first threaded hole, the first interlayer threaded hole and the second positioning hole in sequence, the first slider adjusting bolt 50 and the first fixing nut 40 are connected to the first slider adjusting bolt 50, and the first slider adjusting bolt 50 and the first fixing nut 40 are connected to the first slider adjusting bolt 50. 0 together constitute a first lead screw structure to adjust the relative position of the interlayer 10 and the first slider 20, the second slider adjusting bolt 60 passes through the second threaded hole, the second interlayer threaded hole and the first positioning hole in sequence, the second slider adjusting bolt 60 and the second fixing nut together constitute a second lead screw structure to adjust the relative position of the interlayer 10 and the second slider 30, the first SMA connector 70 is fixedly arranged on the first slider 20, and the second SMA connector 80 is fixedly arranged on the second slider 30; wherein, the microstrip circuit is installed on the interlayer 10, the first slider 20 and the second slider 30, the microstrip circuit is connected to the external test cable through the first SMA connector 70 and the second SMA connector 80, the components to be tested are placed on the microstrip circuit, and the positions of the first slider 20 and the second slider 30 relative to the interlayer 10 are adjusted by adjusting the first slider adjusting bolt 50 and the second slider adjusting bolt 60 so that the components to be tested match the size of the microstrip circuit.

[0019] By applying this configuration, an adjustable microwave device test fixture is provided. The adjustable microwave device test fixture is provided with an interlayer 10, a first slider 20, a second slider 30, a first fixing nut 40, a second fixing nut, a first slider adjusting bolt 50 and a second slider adjusting bolt 60. The first slider adjusting bolt 50 and the first fixing nut 40 together constitute a first screw structure to adjust the relative position of the interlayer 10 and the first slider 20. The second slider adjusting bolt 60 and the second fixing nut together constitute a second screw structure to adjust the relative position of the interlayer 10 and the second slider 30. The first slider adjusting bolt 50 and the second slider adjusting bolt 60 are adjusted to adjust the position of the first slider 20 and the second slider 30 relative to the interlayer 10 so that the measured components match the size of the microstrip circuit. Therefore, compared with the prior art, the adjustable microwave device test fixture provided by the present invention can meet the test requirements of microwave devices of different package sizes by adjusting the relative position of the slider and the interlayer, and there is no need to customize the test fixture according to different package sizes, which effectively reduces the cost and test cycle.

[0020] Furthermore, in the present invention, after the relative position of the slider and the interlayer is adjusted into place, in order to fix the relative position of the slider and the interlayer, the adjustable microwave device test fixture also includes a first limiting bolt 90 and a second limiting bolt 100, the first slider 20 also has a first limiting hole, and the second slider 30 also has a second limiting hole, the first limiting bolt 90 passes through the first limiting hole to tighten the first slider adjusting bolt 50, and the second limiting bolt 100 passes through the second limiting hole to tighten the second slider adjusting bolt 60.

[0021] As a specific embodiment of the present invention, the first SMA connector 70 is fixedly connected to the first slider 20 by screws, and the second SMA connector 80 is fixedly connected to the second slider 30 by screws.

[0022] Furthermore, in order to achieve the connection between the microstrip circuit and the SMA connector, a groove is engraved on the surface of the microstrip circuit, and the groove is used to place the inner conductors of the first SMA connector 70 and the second SMA connector 80 .

[0023] Furthermore, in the present invention, in order to ensure good electrical conductivity and corrosion resistance, the interlayer 10, the first slider 20 and the second slider 30 are all made of brass material with gold-plated surface.

[0024] In order to further understand the present invention, the following Figure 1 and Figure 2 The adjustable microwave device testing fixture provided by the present invention is described in detail.

[0025] like Figure 1 and Figure 2As shown, according to a specific embodiment of the present invention, an adjustable microwave device test fixture is provided, the test fixture includes an interlayer 10, a first slider 20, a second slider 30, a first fixing nut 40, a second fixing nut, a first slider adjusting bolt 50, a second slider adjusting bolt 60, a first SMA connector 70, a second SMA connector 80, a first limiting bolt 90 and a second limiting bolt 100, the interlayer 10 has a first interlayer threaded hole and a second interlayer threaded hole, the first slider 20 has a first accommodating cavity and a first positioning hole, the second slider 30 has a second accommodating cavity and a second positioning hole, the first fixing nut 40 has a first threaded hole, the first fixing nut 40 is fixedly arranged in the first accommodating cavity, the second fixing nut has a second threaded hole, the second fixing nut is fixedly arranged in the second accommodating cavity, the first slider adjusting bolt 50 passes through the first threaded hole, the first interlayer threaded hole and the second positioning hole in sequence, and the first slider adjusting bolt 50 and the second A fixing nut 40 together constitutes a first screw structure to adjust the relative position of the interlayer 10 and the first slider 20, the second slider adjusting bolt 60 passes through the second threaded hole, the second interlayer threaded hole and the first positioning hole in sequence, the second slider adjusting bolt 60 and the second fixing nut together constitute a second screw structure to adjust the relative position of the interlayer 10 and the second slider 30, the first SMA connector 70 is fixedly arranged on the first slider 20, and the second SMA connector 80 is fixedly arranged on the second slider 30; wherein, the microstrip circuit is installed on the interlayer 10, the first slider 20 and the second slider 30, the microstrip circuit is connected to the external test cable through the first SMA connector 70 and the second SMA connector 80, the components to be tested are placed on the microstrip circuit, and the positions of the first slider 20 and the second slider 30 relative to the interlayer 10 are adjusted by adjusting the first slider adjusting bolt 50 and the second slider adjusting bolt 60 so that the components to be tested match the size of the microstrip circuit. The first slider 20 also has a first limiting hole, and the second slider 30 also has a second limiting hole. The first limiting bolt 90 passes through the first limiting hole to tighten the first slider adjusting bolt 50 , and the second limiting bolt 100 passes through the second limiting hole to tighten the second slider adjusting bolt 60 .

[0026] The first slider 20 is connected to one side of the interlayer 10 through the first slider adjusting bolt 50 as an input end slider assembly, the first fixing nut is installed in the side mounting groove of the first slider 20, the second slider 30 is connected to the other side of the interlayer 10 through the second slider adjusting bolt 60 as an output end slider assembly, the second fixing nut is installed in the side mounting groove of the second slider 30, the first SMA connector 70 is installed on the first slider 20, the second SMA connector 80 is installed on the second slider 30, the microstrip circuit is installed on the interlayer 10, the first slider 20 and the second slider 30, and is connected to the external test cable through the first SMA connector 70 and the second SMA connector 80.

[0027] The component under test is placed on the microstrip circuit, and the first slider adjusting bolt 50 and the second slider adjusting bolt 60 are adjusted to match the size of the component under test with the microstrip circuit, thereby completing the connection.

[0028] The first limiting bolt 90 is installed on the top of the first slider adjusting bolt 50. By tightening the first limiting bolt 90, pressure is applied to the first slider adjusting bolt 50, so that the relative position of the first slider 20 and the interlayer 10 is fixed. The second limiting bolt 100 is installed on the top of the second slider adjusting bolt 60. By tightening the second limiting bolt 100, pressure is applied to the second slider adjusting bolt 60, so that the relative position of the second slider 30 and the interlayer 10 is fixed, thereby improving the reliability of the test process.

[0029] The surface of the microstrip circuit is engraved with grooves for placing the inner conductors of the first SMA connector 70 and the second SMA connector 80. The inner conductors of the first SMA connector 70 and the second SMA connector 80 should have a rectangular cross section to improve the connection stability with the microstrip circuit.

[0030] The interlayer 10, the first slider 20 and the second slider 30 are made of brass material with gold-plated surface to ensure good electrical conductivity and corrosion resistance.

[0031] In summary, the present invention provides an adjustable microwave device test fixture, which includes an interlayer and a slider assembly, the slider assembly includes a slider and a slider adjusting bolt; the slider assemblies are arranged in pairs on the side of the interlayer, which are an input end slider assembly and an output end slider assembly respectively; the slider is provided with an accommodating cavity, and a fixing nut is arranged in the accommodating cavity, and the slider adjusting bolt and the fixing nut together constitute a lead screw structure, by which the position of the slider relative to the interlayer can be adjusted to adapt to microwave devices of different sizes; the slider is also provided with a limiting hole, by which the slider bolt can be fixed to improve the stability of the test process; the adjustable microwave device test fixture of the present invention can well meet the testing requirements of microwave devices of different sizes, thereby reducing the manpower cost and time cost of developing the fixture.

[0032] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0033] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present invention.

[0034] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An adjustable microwave device test fixture, It is characterized in that The adjustable microwave device test fixture comprises: An interlayer (10), wherein the interlayer (10) has a first interlayer threaded hole and a second interlayer threaded hole; A first slider (20) and a second slider (30), wherein the first slider (20) has a first accommodating cavity and a first positioning hole, and the second slider (30) has a second accommodating cavity and a second positioning hole; A first fixing nut (40) and a second fixing nut, wherein the first fixing nut (40) has a first threaded hole and is fixedly disposed in the first accommodating cavity, and the second fixing nut has a second threaded hole and is fixedly disposed in the second accommodating cavity; a first slider adjusting bolt (50), the first slider adjusting bolt (50) passing through the first threaded hole, the first interlayer threaded hole and the second positioning hole in sequence, the first slider adjusting bolt (50) and the first fixing nut (40) together forming a first screw structure for adjusting the relative position of the interlayer (10) and the first slider (20); a second slider adjusting bolt (60), the second slider adjusting bolt (60) passing through the second threaded hole, the second interlayer threaded hole and the first positioning hole in sequence, the second slider adjusting bolt (60) and the second fixing nut together forming a second screw structure to adjust the relative position of the interlayer (10) and the second slider (30); A first SMA connector (70) and a second SMA connector (80), wherein the first SMA connector (70) is fixedly disposed on the first slider (20), and the second SMA connector (80) is fixedly disposed on the second slider (30); The microstrip circuit is mounted on the interlayer (10), the first slider (20) and the second slider (30); the microstrip circuit is connected to an external test cable via the first SMA connector (70) and the second SMA connector (80); a component to be tested is placed on the microstrip circuit; and the positions of the first slider (20) and the second slider (30) relative to the interlayer (10) are adjusted by adjusting the first slider adjusting bolt (50) and the second slider adjusting bolt (60) so that the size of the component to be tested matches that of the microstrip circuit.

2. The adjustable microwave device test fixture according to claim 1, It is characterized in that The adjustable microwave device test fixture further comprises a first limiting bolt (90) and a second limiting bolt (100); the first slider (20) further comprises a first limiting hole; the second slider (30) further comprises a second limiting hole; the first limiting bolt (90) passes through the first limiting hole to tighten the first slider adjusting bolt (50); the second limiting bolt (100) passes through the second limiting hole to tighten the second slider adjusting bolt (60).

3. The adjustable microwave device test fixture according to claim 2, It is characterized in that The first SMA connector (70) is fixedly connected to the first slider (20) by means of screws, and the second SMA connector (80) is fixedly connected to the second slider (30) by means of screws.

4. The adjustable microwave device test fixture according to claim 3, It is characterized in that The surface of the microstrip circuit is engraved with grooves, and the grooves are used to place the inner conductors of the first SMA connector (70) and the second SMA connector (80).

5. The adjustable microwave device test fixture according to claim 4, It is characterized in that The interlayer (10), the first sliding block (20) and the second sliding block (30) are all made of brass material, with the surface plated with gold.

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