Direct current feeder protection test system and method

Abstract

The invention provides a DC feeder protection test system and method, and relates to the technical field of DC protection, the system comprises a control module, and the control module is connected with an input module, a generation module and an acquisition module; the input module sets a test parameter set; the generation module generates a test waveform sequence through the test parameter set; the acquisition module acquires the action of the waveform acting on the to-be-tested equipment; the generation module is connected with the output module, and the output module sequentially transmits the test waveforms in the test waveform sequence to the to-be-tested device; the control module determines the action of the to-be-tested equipment through the collected signal, obtains the current test parameter when tripping occurs, and marks the test parameter as a tripping parameter. The fixed value of the to-be-tested equipment is preset as a test parameter, and the returned test parameter is a measured value due to the fact that the test waveform is known during tripping; only whether tripping occurs within a certain period of time after the current waveform is output is checked, the time from waveform emission to tripping does not need to be measured, and the instantaneous value of the waveform at the tripping moment does not need to be concerned.

Description

Technical Field

[0001] The present invention relates to the technical field of direct current protection, and in particular to a direct current feeder protection test system and method. Background Art

[0002] Urban rail transit systems usually use a DC power supply system to provide power for trains. The train contacts the contact network and contact rails laid on the track through a pantograph or collector shoe, and the current is introduced into the train to provide traction power or vehicle auxiliary power.

[0003] In order to effectively distinguish the normal load current and fault short-circuit current in the DC power supply system, in addition to the conventional current quick-break protection and overcurrent protection, current rise rate protection and current increment protection (DDL protection for short) are also used to quickly identify the fault current and cut off the fault current before the fault current rises to a larger value; DDL protection can effectively reduce the breaking load of the circuit breaker when a fault occurs, which can not only effectively protect the circuit breaker and reduce the damage caused by the arc to the circuit breaker, but also reduce the loss caused by the fault current flowing through various equipment, especially reducing the risk of injury to on-site workers or reducing the degree of injury.

[0004] In order to ensure that the DC power supply system is in normal working condition, regular tests are carried out on the DC protection devices. In view of the importance of DDL protection to personal safety and equipment safety, it is very necessary to carry out tests on the DC protection devices that realize the DDL protection function. Since there are multiple fixed values ​​for DDL protection, such as current rise rate value, return delay, increment value, rise rate value return value, etc., quantitative testing is required to measure multiple fixed values. However, when a short circuit fault occurs, the fault current changes rapidly, and the current amplitude rise time is generally on the order of 10 to 100 milliseconds. It is extremely difficult to perform fixed value tests on DC protection devices that realize the DDL protection function by simulating fault current. Summary of the invention

[0005] The purpose of the present invention is to provide a DC feeder protection test system and method, and the technical problem to be solved is how to implement quantitative testing of a DC feeder protection device.

[0006] The present invention is achieved through the following technical solutions: A first aspect provides a DC feeder protection test system, comprising a control module, wherein the control module is connected to an input module, a generation module and a collection module; The above-mentioned input module is used to set test parameters, obtain a test data set, and transmit the test parameter set to the control module; The above-mentioned generating module is used to generate a test waveform through a test parameter, and to generate a test waveform sequence from a test parameter set; The acquisition module is used to acquire the action of the test waveform acting on the device under test to obtain an acquisition signal; The generating module is connected to an output module, and the output module is used to transmit the test waveforms in the test waveform sequence to the device under test in sequence; The control module is used to determine the action of the device under test through the acquisition signal of the acquisition module. When the device under test trips, the test waveform currently acting on the device under test is obtained, the corresponding test parameters are obtained, and the test parameters are marked as tripping parameters.

[0007] The test parameters are set through the above input module, and the test parameters are input into the device under test as the fixed value of the device under test to control the test conditions (including waveform type, amplitude, frequency, etc.). Each fixed value of the device under test can be tested one by one, or some fixed values ​​of the device under test can be tested, so as to simulate various working conditions that may be encountered in actual operation, and ensure the accuracy and repeatability of the test results; from the input of test parameters to the generation and output of test waveforms, and then to the acquisition of the response of the device under test and the analysis of the results, the whole process does not require human intervention, which reduces the impact of human errors on the test results and improves the test efficiency; the acquisition module can collect the actions of the device under test under the action of the test waveform in real time, especially when the device When a tripping action occurs, the control module can quickly capture and record the test waveform that causes the tripping action and its corresponding test parameters, so that the test personnel can intuitively understand the behavior of the device under test under different test parameters. Since the test waveform is a known variable, when a tripping action occurs, the test parameter (i.e., fixed value) that causes the tripping action can be known to complete the quantitative test. Since the test waveforms are output one by one, the test system only checks whether a tripping action occurs within a certain time after the current test waveform is output, without measuring the time from the test waveform being sent to the tripping action of the device under test, nor does it need to care about the instantaneous value of the test waveform at the moment of tripping. The delay from the sending of the tripping signal to the completion of the tripping action does not affect the measurement accuracy.

[0008] Furthermore, the control module is used to configure the closing time. When the device under test performs a closing action, after the closing action is completed, an output instruction is generated, and the output instruction delays the closing time and is sent to the output module; The output module is used to output the next test waveform in the test waveform sequence after receiving an output instruction.

[0009] When a test waveform acts on the above-mentioned device under test, the device under test trips. When the test waveform ends on the device under test, the device under test starts closing to prepare for the arrival of the next test waveform, ensuring that each test is performed under the same conditions, thereby improving the reliability and repeatability of the test results. In actual power systems, the device under test usually monitors the state of the power grid for a period of time after closing. By configuring the closing time, the response of the device under test in different time periods after closing can be tested, which helps to discover possible problems such as delayed response or malfunction, improves the test coverage, and facilitates a more comprehensive evaluation of the performance of the device under test.

[0010] Furthermore, the test system also includes a storage module, and the storage module is connected to the control module; The storage module is used to store the test parameter set acting on the device under test and the tripping parameters marked on the test parameters to obtain the test results.

[0011] The storage module can persistently store the test parameter set and tripping parameters, which means that the test data will not be lost when the test is completed, facilitating subsequent data analysis and report generation.

[0012] Furthermore, the interval time between adjacent test waveforms in the above test waveform sequence is greater than the tripping time of the tripping action.

[0013] In order to avoid overlapping of test waveforms, the interval time of adjacent test waveforms is set to be greater than the tripping time, thereby ensuring the accuracy of the test results. If the interval time of adjacent test waveforms is too short, the influence of the previous test waveform may not completely disappear, and the next test waveform may have already begun to take effect. This overlap will interfere with the accuracy of the test results, making it difficult to accurately determine whether the tripping action is caused by a single test waveform or the combined effect of multiple test waveforms. Setting the interval time of adjacent test waveforms to be greater than the tripping time allows each test waveform to be performed in an independent environment that is not affected by the previous test, which helps to improve the accuracy of the response of the device under test to each test waveform.

[0014] Since the interval time between two adjacent waveforms in the above waveform sequence is much larger than the tripping action delay, when the tripping action is collected, the test waveform that causes the tripping can be determined. Since the waveform characteristics of the test waveform are known variables, the test parameters (i.e., constants) that cause the tripping can be known. When the test waveform sequence gradually changes with certain characteristics, the setting of the tripping parameters (i.e., test parameters) can be determined by collecting the time of the tripping action, thereby completing the quantitative test.

[0015] Furthermore, the acquisition module uses a photoelectric sensor, which is used to be set corresponding to the gate indicator light on the device to be tested.

[0016] The above-mentioned photoelectric sensor can realize signal acquisition of the device under test without being connected to the device under test, thus avoiding secondary failures caused by line changes and reducing the probability of failure of the device under test.

[0017] A second aspect provides a DC feeder protection test method, which acts on the above-mentioned test system; The test method includes the following steps: Set up the test parameter set; After receiving the test task, a test waveform sequence is generated through a preset test parameter set; Transmitting the test waveforms in the test waveform sequence to the device under test in sequence for testing; Collecting the action of the device under test when the test waveform acts on the device under test to obtain a collected signal; The action of the device under test is obtained through the above-mentioned acquisition signal. When the above-mentioned device under test trips, the test waveform currently acting on the device under test is obtained, the corresponding test parameter is obtained, and the test parameter is marked as the tripping parameter.

[0018] Furthermore, the closing time is pre-configured; After obtaining the tripping parameters, the device under test is closed to obtain a closing completion signal, which is then transmitted to the test system. After receiving the closing completion signal, the above test system delays the closing time and outputs the next test waveform in the test waveform sequence.

[0019] Furthermore, the interval time between adjacent test waveforms in the above test waveform sequence is greater than the tripping time of the tripping action.

[0020] Compared with the prior art, the present invention has the following advantages and beneficial effects: The test parameters are set through the above input module, and the test parameters are input into the device under test as the fixed value of the device under test to control the test conditions (including waveform type, amplitude, frequency, etc.). Each fixed value of the device under test can be tested one by one, or some fixed values ​​of the device under test can be tested, so as to simulate various working conditions that may be encountered in actual operation, and ensure the accuracy and repeatability of the test results; from the input of test parameters to the generation and output of test waveforms, and then to the acquisition of the response of the device under test and the analysis of the results, the whole process does not require human intervention, which reduces the impact of human errors on the test results and improves the test efficiency; the acquisition module can collect the actions of the device under test under the action of the test waveform in real time, especially when the device When a tripping action occurs, the control module can quickly capture and record the test waveform that causes the tripping action and its corresponding test parameters, so that the test personnel can intuitively understand the behavior of the device under test under different test parameters. Since the test waveform is a known variable, when a tripping action occurs, the test parameter (i.e., fixed value) that causes the tripping action can be known to complete the quantitative test. Since the test waveforms are output one by one, the test system only checks whether a tripping action occurs within a certain time after the current test waveform is output, without measuring the time from the test waveform being sent to the tripping action of the device under test, nor does it need to care about the instantaneous value of the test waveform at the moment of tripping. The delay from the sending of the tripping signal to the completion of the tripping action does not affect the measurement accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and should not be regarded as limiting the scope. For those of ordinary skill in the art, other relevant drawings can be obtained based on these drawings without creative work. In the drawings: Figure 1 It is the system connection block diagram; Figure 2 The electrical connection diagram of the specific test system for reference example.

[0022] Marks and corresponding parts names in the attached drawings: 1. Control module; 11. Controller; 2. Input module; 21. Touch screen; 22. Universal signal acquisition interface; 3. Acquisition module; 31. Photoelectric sensor; 4. Generation module; 41. Digital-to-analog converter; 42. Signal conditioning circuit; 43. Operational amplifier; 44. High-voltage generator; 5. Output module; 51. Connector; 6. Equipment under test; 7. Storage module. DETAILED DESCRIPTION

[0023] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with embodiments and drawings. The exemplary embodiments of the present invention and their description are only used to explain the present invention and are not intended to limit the present invention.

[0024] The device under test in the following embodiments can realize the DDL protection function, and it is necessary to perform quantitative measurement on multiple fixed values ​​of the device under test.

[0025] Embodiment 1, as Figure 1 As shown, this embodiment 1 provides a DC feeder protection test system, including a control module 1, wherein the control module 1 is connected to an input module 2, a generation module 4 and a collection module 3; The input module 2 is used to set test parameters, obtain a test data set, and transmit the test parameter set to the control module 1; The generating module 4 is used to generate a test waveform through a test parameter, and to generate a test waveform sequence through a test parameter set; The acquisition module 3 is used to acquire the action of the test waveform acting on the device under test 6 to obtain an acquisition signal; The generating module 4 is connected to an output module 5, and the output module 5 is used to sequentially transmit the test waveforms in the test waveform sequence to the device under test 6; The control module 1 is used to determine the action of the device under test 6 through the acquisition signal of the acquisition module 3. When the device under test 6 trips, the test waveform currently acting on the device under test 6 is obtained, the corresponding test parameters are obtained, and the test parameters are marked as tripping parameters.

[0026] The test parameters are set by the input module 2, and the test parameters are input into the device under test 6 as the fixed value of the device under test 6 to control the test conditions (including waveform type, amplitude, frequency, etc.). Each fixed value of the device under test 6 can be tested one by one, and some fixed values ​​of the device under test 6 can also be tested, so as to simulate various working conditions that may be encountered in actual operation, and ensure the accuracy and repeatability of the test results; from the input of the test parameters to the generation and output of the test waveform, and then to the acquisition of the response of the device under test 6 and the analysis of the results, the whole process does not require human intervention, which reduces the impact of human errors on the test results and improves the test efficiency; the acquisition module 3 can collect the action of the device under test 6 under the action of the test waveform in real time, especially when the device trips, the control module 1 can quickly capture and record the test waveform causing the tripping action and its corresponding test parameters, so that the test personnel can intuitively understand the behavior of the device under test 6 under different test parameters. Since the test waveform is a known variable, when the tripping action occurs, the test parameter (i.e., the fixed value) causing the tripping action can be known.

[0027] Embodiment 2, based on embodiment 1, the control module 1 is used to configure the closing time, when the device under test 6 performs a closing action, after the closing action is completed, an output instruction is generated, and the output instruction delays the closing time and is sent to the output module 5; The output module 5 is used to output the next test waveform in the test waveform sequence after receiving an output instruction.

[0028] When a test waveform acts on the above-mentioned device under test 6, the device under test 6 trips. When the test waveform ends on the device under test 6, the device under test 6 starts closing to prepare for the arrival of the next test waveform, ensuring that each test is performed under the same conditions, thereby improving the reliability and repeatability of the test results. In actual power systems, the device under test 6 usually monitors the state of the power grid for a period of time after closing. By configuring the closing time, the response of the device under test 6 in different time periods after closing can be tested, which helps to discover possible problems such as delayed response or malfunction, improves the test coverage, and facilitates a more comprehensive evaluation of the performance of the device under test 6.

[0029] Embodiment 3, based on any of the above embodiments, the test system further includes a storage module 7, and the storage module 7 is connected to the control module 1; The storage module 7 is used to store the test parameter set acting on the device under test 6 and the tripping parameters marked on the test parameters to obtain the test results.

[0030] The storage module 7 is capable of persistently storing the test parameter set and the tripping parameters, which means that the test data will not be lost when the test is finished, thus facilitating subsequent data analysis and report generation.

[0031] Embodiment 4: based on any of the above embodiments, the interval time between adjacent test waveforms in the above test waveform sequence is greater than the tripping time of the tripping action.

[0032] In order to avoid overlapping of test waveforms, the interval time of adjacent test waveforms is set to be greater than the tripping time, thereby ensuring the accuracy of the test results. If the interval time of adjacent test waveforms is too short, the influence of the previous test waveform may not completely disappear, and the next test waveform may have already begun to take effect. This overlap will interfere with the accuracy of the test results, making it difficult to accurately determine whether the tripping action is caused by a single test waveform or the combined effect of multiple test waveforms. Setting the interval time of adjacent test waveforms to be greater than the tripping time allows each test waveform to be performed in an independent environment that is not affected by the previous test, which helps to improve the accuracy of the response of the device under test 6 to each test waveform.

[0033] Since the interval time between two adjacent waveforms in the above waveform sequence is much larger than the tripping action delay, when the tripping action is collected, the test waveform that causes the tripping can be determined. Since the waveform characteristics of the test waveform are known variables, the test parameters (i.e., constants) that cause the tripping can be known. When the test waveform sequence gradually changes with certain characteristics, the setting of the tripping parameters (i.e., test parameters) can be determined by collecting the time of the tripping action, thereby completing the quantitative test.

[0034] Embodiment 5: Based on any of the above embodiments, the acquisition module 3 adopts a photoelectric sensor 31, and the photoelectric sensor 31 is used to be set corresponding to the gate indicator light on the device under test 6.

[0035] The above-mentioned photoelectric sensor 31 can realize signal collection of the device under test 6 without being connected to the device under test 6, thereby avoiding secondary failures caused by line changes and reducing the probability of failure of the device under test 6.

[0036] An application scenario for reference, using a test system to measure a device under test with a DDL protection function 6; combined Figure 2 The test system is arranged on the chassis, and the input module 2 can be a panel, on which a power switch, a touch screen 21, a signal output interface, a universal signal acquisition interface 22, a status indicator light, etc. are arranged; the test work is controlled by the input module 2, and the touch screen 21 is used to feedback the test status and related data to the operator; when the universal signal acquisition interface 22 is connected to the photoelectric sensor 31, it can be judged whether the circuit breaker is tripped by detecting the gate indicator light state (opening / closing); when the normally open (closed) contact is connected, it can also be judged whether the circuit breaker is tripped by the opening and closing of the electrical contacts; the photoelectric sensor 31 is installed on the cabinet surface of the DC switch cabinet through the attached magnetic adsorption bracket, and the opening and closing signals can be collected by aiming the probe of the photoelectric sensor 31 at the gate indicator light, avoiding the possibility of secondary faults caused by changing the line, and reducing the probability of failure of the equipment 6 to be tested after construction.

[0037] The generating module 4 may be composed of a digital-to-analog converter 41 (DAC), a signal conditioning circuit 42, an operational amplifier 43 and a high-voltage generator 44. The high-voltage generator 44 is used to provide a high-voltage signal to the isolation transmitter of the device under test 6, which is mainly used to simulate line pressure, prompt the device under test 6 to complete line testing and automatically reclose, and is also used to verify the working condition of the voltage transmitter; the output module 5 may use a connector 51; the acquisition module 3 may use a photoelectric sensor 31; the signal output interface and the input end of the isolation transmitter of the DC switch cabinet (device under test 6) are connected through a signal output line, and the photoelectric sensor 31 and the universal signal acquisition interface 22 are connected through a signal acquisition line. The photoelectric sensor 31 is adsorbed on the cabinet surface of the DC switch cabinet and faces the gate indicator light of the DC switch cabinet; the input end of the signal conditioning circuit 42 is connected to the output end of the digital-to-analog converter 41 and the control module 1, the output end of the signal conditioning circuit 42 is connected to the input end of the operational amplifier 43 and the high-voltage generator 44, the output end of the operational amplifier 43 and the high-voltage generator 44 is connected to the input end of the connector 51, and the connector 51 is connected to the signal output interface.

[0038] During the test, turn on the power switch and initialize the test system. The test system is configured with a corresponding test parameter set. Enter the type of device 6 to be tested, the name of the substation, the set value, the corresponding shunt of the device 6 to be tested and other conditions on the touch screen 21, and the test system will give the corresponding test parameter set; send the test parameter set to the control module 1, and the control module 1 sends the test parameter set to the generation module 4. The generation module 4 generates multiple analog current signals according to the specified slope, size, and duration, and generates multiple analog voltage signals according to the proportion, high voltage, and duration. The analog current signal and the analog voltage signal together constitute a test waveform. The output module 5 sends the test waveform to the device to be tested 6, and synchronously detects whether the acquisition module 3 has collected the tripping action; when the tripping action is collected, it means that the DC circuit breaker is tripped, and it automatically closes after a delay. When the acquisition module 3 detects that the circuit breaker is closed again, after a certain delay, the test of the next test parameter starts.

[0039] Since the generated analog current signal is a small signal, its signal amplitude is at the millivolt level and needs to be changed quickly and accurately according to the test requirements, in order to control the cost of the test system and take into account factors such as long-term stability and durability in field use, an analog-digital circuit hybrid method is used to generate the test waveform. Unlike the conventional method of finally forming a waveform by outputting the level point by point through DAC, the analog-digital circuit hybrid method used by the test system does not require filtering to obtain a very smooth waveform. Considering that the parameters of the generation module 4 may drift during long-term use, a self-calibration circuit can be designed in the test system, and an internal feedback test is performed on the corresponding circuit before each test begins. Calibration is performed through software self-learning to ensure that the test system can have very high accuracy and stability during long-term use and under various external environmental conditions; the analog-digital circuit hybrid method also greatly reduces the amount of calculation and resource overhead of the controller 11, and adopts a lower controller 11 clock frequency to reduce the possibility of interference with other circuits, thereby reducing the power consumption of the test system.

[0040] The test system has a data storage function and is customized according to the characteristics of the on-site equipment. On the one hand, it can directly generate test parameters according to the selected substation, reducing the steps of manual parameter input, greatly improving on-site operation efficiency and reducing labor costs; on the other hand, the test results can be automatically stored and exported, avoiding the tediousness and possibility of errors in manually recording test data.

[0041] Embodiment 6: This embodiment 6 provides a DC feeder protection test method, which is applied to the above-mentioned test system; The test method includes the following steps: Set up the test parameter set; After receiving the test task, a test waveform sequence is generated through a preset test parameter set; The test waveforms in the test waveform sequence are sequentially transmitted to the device under test 6 for testing; Collecting the action of the device under test 6 when the test waveform acts on the device under test 6 to obtain a collection signal; The action of the device under test 6 is obtained through the above-mentioned acquisition signal. When the above-mentioned device under test 6 trips, the test waveform currently acting on the device under test 6 is obtained, the corresponding test parameter is obtained, and the test parameter is marked as the tripping parameter.

[0042] In a specific embodiment, the closing time is preconfigured; After the tripping parameters are obtained, the device under test 6 is closed to obtain a closing completion signal, and the closing completion signal is transmitted to the test system; After receiving the closing completion signal, the above test system delays the closing time and outputs the next test waveform in the test waveform sequence.

[0043] In a specific embodiment, the interval time between adjacent test waveforms in the above test waveform sequence is greater than the tripping time of the tripping action.

[0044] An application scenario for reference, in which measurements are performed in the form of waveform sequences. The current test signal of the test system uses waveforms with different parameter gradients, and is tested by outputting them one by one at a certain time interval. When the output test waveform gradients to meet the protection tripping logic, the switch of the DC switch cabinet trips. After the tripping action is detected, the current waveform information is recorded to obtain the corresponding test parameters; all parameters involved in the device under test 6 can be set and adjusted to adapt to the differences between different devices under test 6. After multiple waveform gradients with different parameter adjustments, the test system can obtain the measured values ​​of various preset values ​​of the device under test 6, thereby completing the test.

[0045] Since the test waveforms are output one by one, the test system only checks whether tripping occurs within a certain period of time after the current test waveform is output, without measuring the time from the test waveform being sent to the tripping action of the device under test 6, nor caring about the instantaneous value of the test waveform at the moment of tripping. Therefore, the delay from the sending of the tripping signal to the completion of the tripping action has no effect on the measurement accuracy. The method and characteristics of the present invention are highly suitable for scenarios where preventive relay protection tests are carried out at maintenance sites.

[0046] After actual on-site testing, this test system has shortened the test time of a single DC switch cabinet from the original 25 to 30 minutes to about 2 to 3 minutes, thereby improving work efficiency. During the test, there is no need to manually switch on and off protection components, and quantitative testing can be achieved. The test system can simulate voltage and current signals at the same time. When collecting trip feedback signals, there is no need to change the wiring and structure of the device under test 6. The trip signal collection circuit has no electrical connection with the device under test 6. After the test, there is no need to restore the electrical wiring of the signal collection circuit, which is not easy to cause secondary faults, thereby improving the convenience and reliability of the test. Through customized development, the fixed value parameters of each traction substation on site are embedded, and there is no need for manual parameter input. After the test is completed, the test results are automatically recorded without manual recording, thus avoiding test failures or recording errors caused by human errors, and also ensuring the integrity of the test operation, avoiding intentional or unintentional mistakes by on-site operators. The test system uses a hybrid analog-digital circuit to generate test waveforms. Compared with the prior art, high-quality test waveforms can be obtained without the use of a low-pass filter, and commands are output to the DAC through the controller 11. The analog current generated by the operational amplifier 43 directly controls the signal slope. The controller 11 The amount of calculation is much lower than that of the signal generating circuit in the prior art, which reduces the power consumption and cost of the test system. A self-calibration circuit can be designed inside it. The system performs self-calibration before each test. Through the control software learning algorithm, various parameters are fine-tuned to ensure that even if the parameters of the electrical components drift to a certain extent during long-term use, the output signal can be very accurate and reliable, ensuring the stability and reliability of the long-term use of the device; according to the waveform information of the input DC switch cabinet, combined with whether the DC switch has a tripping action, the relay protection setting and the state of the DC switch cabinet are judged; since the test waveforms are output one by one, only whether a trip occurs within a certain period of time after the current test waveform is output is checked, and the instantaneous value of the waveform at the time of tripping does not need to be concerned, so the delay from the issuance of the tripping signal to the completion of the tripping action has no effect on the measurement accuracy; the analog electrical signal (millivolt current signal and kilovolt voltage signal) output by the test system is provided to the input end of the isolation transmitter of the DC switch cabinet, connecting the voltage transmitter and the current transmitter, the DC relay protection device, the DC circuit breaker, and the system composed of various signal cables; the test system can also have its own power supply inside, so that the test can be carried out when the external power supply on site is out of power.

[0047] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A DC feeder protection test system, characterized in that: It comprises a control module (1), wherein the control module (1) is connected to an input module (2), a generation module (4) and a collection module (3); The input module (2) is used to set test parameters, obtain a test data set, and transmit the test parameter set to the control module (1); The generating module (4) is used to generate a test waveform through a test parameter, and to generate a test waveform sequence through a test parameter set; The acquisition module (3) is used to acquire the action of the test waveform acting on the device to be tested (6) to obtain an acquisition signal; The generating module (4) is connected to an output module (5), and the output module (5) is used to sequentially transmit the test waveforms in the test waveform sequence to the device to be tested (6); The control module (1) is used to determine the action of the device under test (6) through the acquisition signal of the acquisition module (3); when the device under test (6) trips, the test waveform currently acting on the device under test (6) is obtained, the corresponding test parameter is obtained, and the test parameter is marked as a trip parameter; The control module (1) is used to configure the closing time. When the device under test (6) performs a closing action, an output instruction is generated after the closing action is completed, and the output instruction delays the closing time and is sent to the output module (5).

2. A DC feeder protection test system according to claim 1, characterized in that: The output module (5) is used for outputting the next test waveform in the test waveform sequence after receiving an output instruction.

3. A DC feeder protection test system according to claim 1, characterized in that: The test system further comprises a storage module (7), wherein the storage module (7) is connected to the control module (1); The storage module (7) is used to store a test parameter set acting on the device to be tested (6) and a trip parameter marked on the test parameter to obtain a test result.

4. A DC feeder protection test system according to claim 1, characterized in that: The interval time between adjacent test waveforms in the test waveform sequence is greater than the tripping time of the tripping action.

5. A DC feeder protection test system according to claim 1, characterized in that: The acquisition module (3) uses a photoelectric sensor (31), and the photoelectric sensor (31) is used to be set corresponding to the gate indicator light on the device to be tested (6).

6. A DC feeder protection test method, characterized in that: The test method acts on the test system according to any one of claims 1 to 5; The test method includes the following steps: Set up the test parameter set; After receiving the test task, a test waveform sequence is generated through a preset test parameter set; Transmitting the test waveforms in the test waveform sequence to the device under test (6) in sequence for testing; Collecting the action of the device under test (6) when the test waveform acts on the device under test (6) to obtain a collected signal; The action of the device under test (6) is acquired through the acquisition signal, and when the device under test (6) trips, the test waveform currently acting on the device under test (6) is acquired to obtain the corresponding test parameter, which is marked as the trip parameter.

7. A DC feeder protection test method according to claim 6, characterized in that: Pre-configure closing time; After the tripping parameters are obtained, a closing operation is performed on the device to be tested (6), a closing completion signal is obtained, and the closing completion signal is transmitted to the test system; After receiving the closing completion signal, the test system delays the closing time and outputs the next test waveform in the test waveform sequence.

8. A DC feeder protection test method according to claim 6, characterized in that: The interval time between adjacent test waveforms in the test waveform sequence is greater than the tripping time of the tripping action.

Images