Super capacitor system test method and system based on hybrid energy storage thermal power generating unit

Abstract

The invention relates to the technical field of super-capacitor testing, in particular to a super-capacitor system testing method and system based on a hybrid energy storage thermal power generating unit, and the method comprises the steps: obtaining the interference degree of each process according to the difference between voltages on a voltage fitting curve of each process; according to the distribution difference of data in the resistance data sequence, the sudden change temperature of each process is obtained, and according to the interference degree of each process, the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all moments and the sudden change temperature, the correction voltage at each moment in each process is obtained; and completing the measurement of the electric quantity of the super-capacitor system through the correction voltage at each moment in each process and the capacitance of the super-capacitor system. According to the invention, by correcting the measured voltage, the accuracy of electric quantity measurement of the capacitance system is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of supercapacitor testing, and in particular to a supercapacitor system testing method and system based on a hybrid energy storage thermal power unit. Background Art

[0002] The supercapacitor system test based on hybrid energy storage thermal power units is a comprehensive experiment involving power systems, energy storage technologies and electrical equipment performance evaluation. The purpose of this type of test is to evaluate the application effect of supercapacitors in thermal power generating units, especially in terms of load fluctuations, frequency regulation, backup power supply, etc. Hybrid energy storage systems are usually composed of a variety of energy storage devices (such as supercapacitors, batteries, flywheel energy storage, etc.) in order to fully utilize the advantages of different energy storage technologies and achieve optimal operation of the system.

[0003] During the test of the supercapacitor system of thermal power units, the measurement of the supercapacitor's charge plays a very important role in the stability of the system and the analysis of efficiency conversion; however, in the conventional measurement of the supercapacitor's charge, the supercapacitor's charge can be obtained through voltage and capacitance; due to the interference of temperature and external noise, the collected voltage signal has errors, which leads to large errors in the measured charge of the supercapacitor system, reducing the accuracy of the supercapacitor system test. Summary of the invention

[0004] The present invention provides a supercapacitor system testing method and system based on a hybrid energy storage thermal power unit, which are used to solve the existing problems.

[0005] The purpose of the present invention can be achieved through the following technical solutions: The first aspect of the present invention is to provide a supercapacitor system testing method based on a hybrid energy storage thermal power unit, comprising: Acquire voltage data and resistance data of the supercapacitor system at all times in each process; each process of the supercapacitor system is a charging process or a discharging process; Perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; obtain the interference degree of each process according to the difference between the voltages on the voltage fitting curve of each process; The time series temperature data of the supercapacitor system is obtained, and the resistance data at all times in each process are sorted in chronological order to form a resistance data sequence. According to the distribution difference of the data in the resistance data sequence, a data is selected from the resistance data sequence and recorded as the final segmentation data; the temperature corresponding to the final segmentation data is recorded as the mutation temperature of each process; according to the difference between the temperature at each time in each process and the reference temperature, the difference between the corresponding voltages at all times and the mutation temperature, the voltage at all times is adjusted to obtain the adjusted voltage; wherein the reference temperature is a preset temperature; Perform curve fitting on all adjusted voltages in each process to obtain an adjusted voltage fitting curve for each process; perform interpolation of missing data based on all adjusted voltages in each process to obtain an adjusted voltage at each moment; perform correction on the adjusted voltage at each moment based on the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the degree of interference in each process to obtain a corrected voltage at each moment in each process; The charge of the supercapacitor at each moment in each process is obtained through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; the charge of the supercapacitor at each moment in each process is used as the measured value of the charge of the supercapacitor system.

[0006] Furthermore, performing exponential curve fitting on the voltage data at all times in each process to obtain a voltage fitting curve for each process; and obtaining the interference degree of each process according to the difference between the voltages on the voltage fitting curve of each process, including: The voltage data at all times in each process are fitted with an exponential curve using the least squares method to obtain a voltage fitting curve for each process; According to the fitting value at each moment in the voltage fitting curve of each process and the obtained voltage value, the voltage residual value at all moments in each process is calculated respectively; according to the voltage residual value at all moments in each process, the standard deviation and determination coefficient of the voltage residual value in each process are calculated; The interference degree of each process is obtained through the standard deviation and determination coefficient of the voltage residual value of each process; the interference degree is specifically expressed by the formula:

[0007] In the formula, represents the standard deviation of the voltage residual value for each process, The coefficient of determination of the voltage residual value for each process, Indicates the degree of interference to each process.

[0008] Furthermore, selecting a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence and recording it as the final segmented data includes: Select any data in the resistance data sequence and record it as the segmented data. Record the segmented data and the resistance data at all previous moments as the front resistance set; record the resistance data at all moments after the segmented data as the back resistance set; obtain the segmentation degree of the segmented data according to the difference in data distribution between the front resistance set and the back resistance set; the segmentation degree is specifically expressed by the formula:

[0009] In the formula, represents the mean of all data in the previous resistance set, represents the mean of all data in the post-resistance set, represents the standard deviation of all data in the previous resistance set, Represents the standard deviation of all data in the post-resistance set, represents an exponential function with a natural constant as base, is the absolute value symbol, Indicates the degree of segmentation of the segmented data; Each resistance data in the resistance data sequence is sequentially used as segmentation data, the segmentation degree of each resistance data in the resistance data sequence is calculated respectively, and the resistance data with the largest segmentation degree in the resistance data sequence is used as the final segmentation data.

[0010] Further, the voltage at all times is adjusted according to the difference between the temperature at each time in each process and the reference temperature, the difference between the corresponding voltages at all times and the sudden change temperature to obtain the adjusted voltage, including:

[0011]

[0012] In the formula, represents the reference temperature, represents any temperature in each process, represents the mutation temperature of each process, Indicates the temperature in each process The corresponding voltage, Indicates the reference temperature of each process The corresponding voltage, represents the temperature coefficient of voltage, Indicates the temperature in each process Corresponding to the adjusted voltage, Indicates temperature With reference temperature The difference between is the preset temperature.

[0013] Further, performing curve fitting on all adjusted voltages in each process to obtain an adjusted voltage fitting curve for each process; interpolating missing data according to all adjusted voltages in each process to obtain the adjusted voltage at each moment, includes: According to the adjusted voltage corresponding to all temperatures in each process, the missing data is interpolated using a linear interpolation algorithm to obtain the adjusted voltage at each moment; According to the adjusted voltages corresponding to all temperatures in each process, curve fitting is performed by the least square method to obtain the adjusted voltage fitting curve of each process.

[0014] Furthermore, the voltage adjusted at each moment is corrected according to the difference between the voltage adjusted at each moment and the voltage corresponding to the adjusted voltage fitting curve and the interference degree of each process to obtain the corrected voltage at each moment in each process, including:

[0015] In the formula, Indicates the adjusted voltage at each moment in each process, represents the fitted voltage at each moment in each process, Indicates the corrected voltage at each moment in each process, Indicates the degree of interference to each process, represents the linear normalization function; The fitting voltage at each moment in each process is the voltage corresponding to the voltage fitting curve at each moment.

[0016] Furthermore, obtaining the supercapacitor capacity at each moment in each process by correcting the voltage at each moment in each process and the capacitance of the supercapacitor system includes:

[0017] In the formula, represents the capacitance of the supercapacitor system, Indicates the corrected voltage at each moment in each process, Indicates the supercapacitor charge at each moment in each process.

[0018] The second aspect of the present invention is to provide a supercapacitor system test system based on a hybrid energy storage thermal power unit, comprising: Data acquisition module: used to obtain voltage data and resistance data of the supercapacitor system at all times in each process; each process of the supercapacitor system is a charging process or a discharging process; Interference analysis module: used to perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; according to the difference between the voltages on the voltage fitting curve of each process, the interference degree of each process is obtained; Voltage adjustment module: used to obtain the time-series temperature data of the supercapacitor system, sort the resistance data at all times in each process in chronological order to form a resistance data sequence, select a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and record it as the final segmentation data; record the temperature corresponding to the final segmentation data as the mutation temperature of each process; adjust the voltage at all times according to the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all times and the mutation temperature, and obtain the adjusted voltage; wherein the reference temperature is a preset temperature; Voltage correction module: used to perform curve fitting on all adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; interpolate missing data based on all adjusted voltages in each process to obtain the adjusted voltage at each moment; correct the adjusted voltage at each moment based on the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the degree of interference in each process to obtain the corrected voltage at each moment in each process; Measurement test module: used to obtain the supercapacitor power at each moment in each process through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; and use the supercapacitor power at each moment in each process as the measured value of the supercapacitor system power.

[0019] The third aspect of the present invention is to provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the supercapacitor system testing method based on a hybrid energy storage thermal power unit when executing the computer program.

[0020] A fourth aspect of the present invention is to provide a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the supercapacitor system testing method based on a hybrid energy storage thermal power unit is implemented.

[0021] Compared with the prior art, the invention has the following beneficial effects: according to the difference between the voltages on the voltage fitting curve of each process, the interference degree of each process is obtained, and the accuracy of the analysis of the noise interference of the voltage data is improved; according to the distribution difference of the data in the resistance data sequence, the mutation temperature is obtained; according to the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all moments and the mutation temperature, the voltage at all moments is adjusted to obtain the adjusted voltage, and the influence of the temperature on the voltage is compensated by the change of temperature; curve fitting is performed on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; missing data is interpolated according to all the adjusted voltages in each process to obtain the adjusted voltage at each moment; according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the interference degree of each process, the adjusted voltage at each moment is corrected to obtain the corrected voltage at each moment in each process, and the voltage error is reduced; the supercapacitor electric quantity at each moment in each process is obtained through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; the supercapacitor electric quantity at each moment in each process is used as the measured value of the electric quantity of the supercapacitor system; and the accuracy of the electric quantity measurement of the supercapacitor system is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 The present invention provides a schematic flow chart of the steps of a supercapacitor system testing method based on a hybrid energy storage thermal power unit; Figure 2 The present invention provides a module flow diagram of a supercapacitor system testing system based on a hybrid energy storage thermal power unit. DETAILED DESCRIPTION

[0024] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0025] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0026] In view of the problems existing in the background technology, a supercapacitor system testing method and system based on hybrid energy storage thermal power units are studied and designed, which has important practical significance.

[0027] like Figure 1 As shown, the first aspect of the present invention is to provide a supercapacitor system testing method based on a hybrid energy storage thermal power unit, comprising the following steps: Step S001: Collecting the voltage and resistance data of the supercapacitor system at all times in each process.

[0028] It should be noted that in order to analyze and obtain the power data of the supercapacitor system at each moment, it is necessary to obtain all voltage and resistance data of the supercapacitor system during the charging and discharging process, and analyze the power data of the supercapacitor at each moment through the voltage and resistance data.

[0029] Specifically, at a preset time interval Use a digital multimeter to obtain the voltage data of the supercapacitor system at all times in each process; The resistance data of the supercapacitor system at all times in each process is obtained by an AC impedance spectrometer. Each process of the supercapacitor system is a charging process or a discharging process. In this embodiment, the preset time interval seconds, where the preset time interval There is no specific limitation and implementers can decide based on specific circumstances.

[0030] At this point, the voltage data and resistance data of the supercapacitor system at all times in each process are obtained.

[0031] Step S002: Obtain the interference degree of each process according to the difference between the voltages on the voltage fitting curve of each process; obtain the mutation temperature of each process according to the distribution difference of the data in the resistance data sequence; obtain the corrected voltage at each moment in each process according to the interference degree of each process, the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all moments and the mutation temperature.

[0032] It should be noted that, during the charging and discharging process of the capacitor, the voltage data gradually rises and eventually approaches the external power supply voltage, and the voltage during the charging process shows an exponential growth; while during the discharging process of the capacitor, the voltage data gradually decreases and eventually approaches zero, and the voltage during the discharging process shows an exponential decay. When the voltage data is disturbed during the charging and discharging process, the collected voltage data may show a weaker trend of exponential change, so the degree of interference can be analyzed by the change characteristics of the acquired voltage data.

[0033] Specifically, the voltage data at all times in each process are fitted with an exponential curve by the least square method to obtain a voltage fitting curve for each process; wherein the least square method is a well-known technology and will not be described in detail here.

[0034] According to the fitting value at each moment in the voltage fitting curve of each process and the obtained voltage value, the voltage residual values ​​at all moments in each process are calculated respectively; according to the voltage residual values ​​at all moments in each process, the standard deviation and determination coefficient of the voltage residual values ​​in each process are calculated; wherein, the process of obtaining the standard deviation and the determination coefficient are all well-known technologies and will not be described in detail here.

[0035] The interference degree of each process is obtained through the standard deviation and determination coefficient of the voltage residual value of each process; the interference degree is specifically expressed by the formula:

[0036] In the formula, represents the standard deviation of the voltage residual value for each process, The coefficient of determination of the voltage residual value for each process, Indicates the degree of interference to each process.

[0037] Among them, when the standard deviation of each process is larger, it means that the fluctuation of the data is larger, and the interference degree of each process is greater; conversely, the interference degree of each process is smaller. The determination coefficient of each process represents the fitting effect of each process. When the determination coefficient is close to 1, it means that the fitting effect of each process is better, that is, the interference degree of each process is smaller; when the determination coefficient is smaller, that is, the farther away from 1, it means that the fitting effect of each process is worse, that is, the interference degree of each process is greater.

[0038] So far, the interference degree of each process is obtained through the above method.

[0039] It should be noted that during the charging process, the current of the supercapacitor is relatively large at the beginning, and gradually decreases as the charging progresses; while during the discharging process, the current of the supercapacitor is relatively large at the beginning, and gradually decreases as the voltage decreases. Therefore, during the charging and discharging processes, the current is very large at the beginning, and gradually decreases as time goes by. Since each process generates heat, the more heat is generated, the higher the temperature, which increases the resistance and reduces the voltage.

[0040] It should be further explained that, since the temperature is relatively low in each process, when the temperature is relatively low, it has almost no effect on the resistance of the supercapacitor. When the temperature rises to a certain temperature value, the resistance will be affected by the temperature and change. The higher the temperature, the greater the resistance of the supercapacitor. Therefore, the temperature corresponding to the resistance mutation point is first determined by the change in resistance. For the resistance mutation point, the resistance data can be divided into two data sets for difference analysis to obtain the resistance mutation point.

[0041] Specifically, the time series temperature data of the supercapacitor system is collected by a temperature sensor; the resistance data in each process is sorted in chronological order to form a resistance data sequence; any data in the resistance data sequence is selected and recorded as segmented data, and the segmented data and the resistance data at all previous moments are recorded as a front resistance set; the resistance data at all moments after the segmented data are recorded as a rear resistance set; according to the difference in data distribution between the front resistance set and the rear resistance set, the segmentation degree of the segmented data is obtained; the segmentation degree is specifically expressed by the formula:

[0042] In the formula, represents the mean of all data in the previous resistance set, represents the mean of all data in the post-resistance set, represents the standard deviation of all data in the previous resistance set, Represents the standard deviation of all data in the post-resistance set, represents an exponential function with a natural constant as base, is the absolute value symbol, Indicates the degree of segmentation of the segmented data.

[0043] Each resistance data in the resistance data sequence is sequentially used as segmentation data, and the segmentation degree of each resistance data in the resistance data sequence is calculated respectively; and the resistance data with the largest segmentation degree in the resistance data sequence is used as the final segmentation data. When each resistance data in the resistance data sequence is sequentially used as segmentation data, the last resistance data is not analyzed as segmentation data.

[0044] Among them, the greater the data difference between the current resistance set and the subsequent resistance set, the more suitable the segmented data is as the final segmented data; and the more concentrated the data in the current resistance set and the more concentrated the data in the subsequent resistance set, the more the two sets divided by the segmented data can determine the mutation point of the resistance, that is, when the temperature reaches a certain value, the resistance increases with the increase of temperature.

[0045] So far, the final segmented data in the resistance data sequence in each process is obtained through the above method.

[0046] The temperature corresponding to the final segmented data is recorded as the mutation temperature of each process.

[0047] According to the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all moments and the mutation temperature, the voltage at all moments is adjusted to obtain the adjusted voltage; the specific formula is:

[0048]

[0049] In the formula, represents the reference temperature, represents any temperature in each process, represents the mutation temperature of each process, Indicates the temperature in each process The corresponding voltage, Indicates the reference temperature of each process The corresponding voltage, represents the temperature coefficient of voltage, Indicates the temperature in each process Corresponding to the adjusted voltage, Indicates temperature With reference temperature The difference between; wherein the reference temperature is a preset temperature, in this embodiment, the reference temperature for In this embodiment, the reference temperature is not specifically limited and can be determined by the implementer according to the specific situation.

[0050] It should be noted that during the data processing process, data may be missing due to equipment failure or network delay, so the missing data needs to be filled through interpolation method.

[0051] According to the adjusted voltage corresponding to all temperatures in each process, the missing data is interpolated using a linear interpolation algorithm to obtain the adjusted voltage at each moment; wherein the linear interpolation algorithm is a well-known technology and will not be described in detail here. According to the adjusted voltage corresponding to all temperatures in each process, the least squares method is used to perform curve fitting to obtain the adjusted voltage fitting curve of each process; wherein the least squares method is a well-known technology and will not be described in detail here.

[0052] It should be noted that when the interference degree of each process is greater, the data fluctuation is more drastic, that is, the interference degree of external noise is greater, and the degree of correction required is greater; conversely, when the interference degree of each process is smaller, the interference degree of external noise is smaller, that is, the degree of correction required is smaller. Therefore, the voltage can be corrected according to the interference degree.

[0053] Specifically, according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the interference degree of each process, the adjusted voltage at each moment is corrected to obtain the corrected voltage at each moment in each process; the corrected voltage is specifically expressed by the formula:

[0054] In the formula, Indicates the adjusted voltage at each moment in each process, represents the fitted voltage at each moment in each process, Indicates the corrected voltage at each moment in each process, Indicates the degree of interference to each process, Represents a linear normalized function, where the fitting voltage at each moment in each process is the voltage corresponding to the voltage fitting curve at each moment.

[0055] in, It represents the difference between the adjusted voltage and the fitted voltage, which indicates the range of the correction adjustment. for The adjustment coefficient is, that is, the greater the interference, the greater the correction adjustment, and vice versa.

[0056] So far, the corrected voltage at each moment in each process is obtained through the above method.

[0057] Step S003: The charge of the supercapacitor is measured by the corrected voltage at each moment in each process and the capacitance of the supercapacitor system.

[0058] Through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system, the supercapacitor capacity at each moment in each process is obtained; the specific formula is:

[0059] In the formula, represents the capacitance of the supercapacitor system, Indicates the corrected voltage at each moment in each process, Indicates the supercapacitor charge at each moment in each process.

[0060] At this point, the supercapacitor capacity at each moment in each process is obtained.

[0061] It should be noted that in order to verify the accuracy of the supercapacitor power at each moment in each process obtained using the innovative method, a generator set model is constructed using power system simulation software (MATLAB / Simulink), the charging / discharging process is simulated in the simulation model, and the supercapacitor power at several moments is obtained using conventional methods to form a set of sequences, recorded as conventional power sequences; then the supercapacitor power at several moments is obtained using the innovative method of the present invention to form a set of sequences, recorded as innovative power sequences; then a high-precision reference device (such as a laboratory-grade power analyzer) obtains the measurement results of the supercapacitor power at several moments to form a set of sequences, recorded as comparison power sequences; by comparing the power sequences, the errors between the conventional power sequences and the innovative power sequences are calculated respectively, and by comparing the power measurement errors, the improvement effect of the innovative method on the accuracy of real-time acquisition of supercapacitor power is evaluated.

[0062] like Figure 2 As shown, the second aspect of the present invention is to provide a supercapacitor system test system based on a hybrid energy storage thermal power unit, comprising the following modules: Data acquisition module 101: used to obtain voltage data and resistance data of the supercapacitor system at all times in each process; each process of the supercapacitor system is a charging process or a discharging process; Interference analysis module 102: used to perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; and obtain the interference degree of each process according to the difference between the voltages on the voltage fitting curve of each process; Voltage adjustment module 103: used to obtain the time series temperature data of the supercapacitor system, sort the resistance data at all times in each process in chronological order to form a resistance data sequence, select a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and record it as the final segmentation data; record the temperature corresponding to the final segmentation data as the mutation temperature of each process; adjust the voltage at all times according to the difference between the temperature at each time in each process and the reference temperature, the difference between the corresponding voltages at all times and the mutation temperature, and obtain the adjusted voltage; wherein the reference temperature is a preset temperature; Voltage correction module 104: used to perform curve fitting on all adjusted voltages in each process to obtain an adjusted voltage fitting curve for each process; interpolate missing data based on all adjusted voltages in each process to obtain an adjusted voltage at each moment; correct the adjusted voltage at each moment based on the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the degree of interference in each process to obtain a corrected voltage at each moment in each process; The measurement test module 105 is used to obtain the supercapacitor power at each moment in each process through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; and use the supercapacitor power at each moment in each process as the measured value of the supercapacitor system power.

[0063] The third aspect of the present invention is to provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, a supercapacitor system testing method based on a hybrid energy storage thermal power unit is implemented.

[0064] A fourth aspect of the present invention is to provide a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, a supercapacitor system testing method based on a hybrid energy storage thermal power unit is implemented.

[0065] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, optical storage, etc.) containing computer-usable program code.

[0066] The present invention is described with reference to flowcharts and / or block diagrams of methods, systems, and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the process in the flowchart. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0067] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0068] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable device. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0069] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents, and any modifications or equivalent replacements that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the present invention.

Claims

1. A supercapacitor system test method based on a hybrid energy storage thermal power unit, characterized in that: include: Acquire voltage data and resistance data of the supercapacitor system at all times in each process; each process of the supercapacitor system is a charging process or a discharging process; Perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; According to the difference between the voltages on the voltage fitting curve of each process, the interference degree of each process is obtained; The time series temperature data of the supercapacitor system is obtained, and the resistance data at all times in each process are sorted in chronological order to form a resistance data sequence. According to the distribution difference of the data in the resistance data sequence, a data is selected from the resistance data sequence and recorded as the final segmentation data; the temperature corresponding to the final segmentation data is recorded as the mutation temperature of each process; according to the difference between the temperature at each time in each process and the reference temperature, the difference between the corresponding voltages at all times and the mutation temperature, the voltage at all times is adjusted to obtain the adjusted voltage; wherein the reference temperature is a preset temperature; Perform curve fitting on all adjusted voltages in each process to obtain an adjusted voltage fitting curve for each process; perform interpolation of missing data based on all adjusted voltages in each process to obtain an adjusted voltage at each moment; perform correction on the adjusted voltage at each moment based on the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the degree of interference in each process to obtain a corrected voltage at each moment in each process; The charge of the supercapacitor at each moment in each process is obtained through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; the charge of the supercapacitor at each moment in each process is used as the measured value of the charge of the supercapacitor system.

2. The supercapacitor system testing method based on a hybrid energy storage thermal power unit according to claim 1 is characterized in that: The voltage data at all times in each process are subjected to exponential curve fitting to obtain a voltage fitting curve for each process; According to the difference between the voltages on the voltage fitting curve of each process, the interference degree of each process is obtained, including: The voltage data at all times in each process are fitted with an exponential curve using the least squares method to obtain a voltage fitting curve for each process; According to the fitting value at each moment in the voltage fitting curve of each process and the obtained voltage value, the voltage residual value at all moments in each process is calculated respectively; according to the voltage residual value at all moments in each process, the standard deviation and determination coefficient of the voltage residual value in each process are calculated; The interference degree of each process is obtained through the standard deviation and determination coefficient of the voltage residual value of each process; the interference degree is specifically expressed by the formula: In the formula, represents the standard deviation of the voltage residual value for each process, The coefficient of determination of the voltage residual value for each process, Indicates the degree of interference to each process.

3. The supercapacitor system testing method based on a hybrid energy storage thermal power unit according to claim 1 is characterized in that: The step of selecting a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence and recording it as the final segmentation data includes: Select any data in the resistance data sequence and record it as the segmented data. Record the segmented data and the resistance data at all previous moments as the front resistance set; record the resistance data at all moments after the segmented data as the back resistance set; obtain the segmentation degree of the segmented data according to the difference in data distribution between the front resistance set and the back resistance set; the segmentation degree is specifically expressed by the formula: In the formula, represents the mean of all data in the previous resistance set, represents the mean of all data in the post-resistance set, represents the standard deviation of all data in the previous resistance set, Represents the standard deviation of all data in the post-resistance set, represents an exponential function with a natural constant as base, is the absolute value symbol, Indicates the degree of segmentation of the segmented data; Each resistance data in the resistance data sequence is sequentially used as segmentation data, the segmentation degree of each resistance data in the resistance data sequence is calculated respectively, and the resistance data with the largest segmentation degree in the resistance data sequence is used as the final segmentation data.

4. The supercapacitor system testing method based on a hybrid energy storage thermal power unit according to claim 1 is characterized in that: The step of adjusting the voltage at all times according to the difference between the temperature at each time in each process and the reference temperature, the difference between the corresponding voltages at all times, and the sudden change temperature to obtain the adjusted voltage includes: In the formula, represents the reference temperature, represents any temperature in each process, represents the mutation temperature of each process, Indicates the temperature in each process The corresponding voltage, Indicates the reference temperature of each process The corresponding voltage, represents the temperature coefficient of voltage, Indicates the temperature in each process Corresponding to the adjusted voltage, Indicates temperature With reference temperature The difference between is the preset temperature.

5. The supercapacitor system testing method based on hybrid energy storage thermal power unit according to claim 4 is characterized in that: The method of performing curve fitting on all adjusted voltages in each process to obtain an adjusted voltage fitting curve for each process; and interpolating missing data according to all adjusted voltages in each process to obtain the adjusted voltage at each moment, includes: According to the adjusted voltage corresponding to all temperatures in each process, the missing data is interpolated using a linear interpolation algorithm to obtain the adjusted voltage at each moment; According to the adjusted voltages corresponding to all temperatures in each process, curve fitting is performed by the least square method to obtain the adjusted voltage fitting curve of each process.

6. The supercapacitor system testing method based on a hybrid energy storage thermal power unit according to claim 1 is characterized in that: The method corrects the adjusted voltage at each moment according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the interference degree of each process to obtain the corrected voltage at each moment in each process, including: In the formula, Indicates the adjusted voltage at each moment in each process, represents the fitted voltage at each moment in each process, Indicates the corrected voltage at each moment in each process, Indicates the degree of interference to each process, represents the linear normalization function; The fitting voltage at each moment in each process is the voltage corresponding to the voltage fitting curve at each moment.

7. The supercapacitor system testing method based on a hybrid energy storage thermal power unit according to claim 1 is characterized in that: The method of obtaining the supercapacitor capacity at each moment in each process by using the corrected voltage at each moment in each process and the capacitance of the supercapacitor system includes: In the formula, represents the capacitance of the supercapacitor system, Indicates the corrected voltage at each moment in each process, Indicates the supercapacitor charge at each moment in each process.

8. The supercapacitor system test system based on hybrid energy storage thermal power unit is characterized by: include: Data acquisition module: used to obtain the voltage data and resistance data of the supercapacitor system at all times in each process; Each process of the supercapacitor system is a charging process or a discharging process; Interference analysis module: used to perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; according to the difference between the voltages on the voltage fitting curve of each process, the interference degree of each process is obtained; Voltage adjustment module: used to obtain the time-series temperature data of the supercapacitor system, sort the resistance data at all times in each process in chronological order to form a resistance data sequence, select a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and record it as the final segmentation data; record the temperature corresponding to the final segmentation data as the mutation temperature of each process; adjust the voltage at all times according to the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all times and the mutation temperature, and obtain the adjusted voltage; wherein the reference temperature is a preset temperature; Voltage correction module: used to perform curve fitting on all adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; interpolate missing data based on all adjusted voltages in each process to obtain the adjusted voltage at each moment; correct the adjusted voltage at each moment based on the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the degree of interference in each process to obtain the corrected voltage at each moment in each process; Measurement test module: used to obtain the supercapacitor power at each moment in each process through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; and use the supercapacitor power at each moment in each process as the measured value of the supercapacitor system power.

9. An electronic device, characterized in that: It comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the supercapacitor system testing method based on a hybrid energy storage thermal power unit as claimed in any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the supercapacitor system testing method based on a hybrid energy storage thermal power unit according to any one of claims 1 to 7 is implemented.

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