Inspection point location determination method and device and electronic equipment

CN120128812APending Publication Date: 2025-06-10LENOVO (BEIJING) LTD
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Patent Information

Application Number
CN202510229601.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-27
Publication Date
2025-06-10

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Abstract

The invention discloses an inspection point location determination method and device and electronic equipment. The inspection point location determination method comprises the following steps: obtaining an observation area corresponding to each to-be-detected point location in a target inspection scene; determining at least one overlapped observation area based on the observation area corresponding to each point location to be detected; and determining a target inspection point location from the at least one overlapped observation area.
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