Optical phase delay reflection film and plating method and clamp thereof
By plating metal silver, silicon oxide, titanium pentoxide and aluminum oxide film layers on the reflective phase retardation mirror, combined with specific plating methods and clamp design, the problem of difficult control of the reflection phase difference at the high-reflection film at the incident angle of 45° is solved, and an optical phase retardation reflective film with high reflectivity and expected polarization characteristics is achieved, improving the stability and accuracy of the optical system.
CN120143328AActive Publication Date: 2025-06-13BEIJING CHUANGSI FILMING CO LTD
Patent Information
- Application Number
- CN202510216295.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-26
- Publication Date
- 2025-06-13
- Estimated Expiration
- 2045-02-26
Smart Images
Figure CN120143328A_ABST
Abstract
The invention provides an optical phase delay reflecting film, a plating method thereof and a fixture, the optical phase delay reflecting film is composed of a metal Ag film layer, a SiO2 film layer, a Ti3O5 film layer and an Al2O3 film layer which are plated on a reflecting phase delay mirror, and by means of the middle refractive index characteristic of Al2O3, the reflection characteristic of Ag, the high refractive index characteristic of Ti3O5 and the low refractive index characteristic of SiO2, the optical phase delay reflecting film can be obtained through the high refractive index characteristic of Ti3O5 and the low refractive index characteristic of Al2O3. According to the optical phase delay reflecting mirror, the reflectivity of the optical phase delay reflecting film is increased, when linearly polarized light enters the surface of the reflecting phase delay mirror plated with the optical phase delay reflecting film at an angle of 45 degrees, it can be ensured that light waves obtained after the linearly polarized light is overlapped have the expected polarization characteristic, and therefore the measuring precision and the stability of a system are improved.
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Citation Information
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