Electromagnetic environment test stationing optimization method, device, equipment and medium

Abstract

The invention provides an electromagnetic environment test stationing optimization method, device and equipment and a medium, and relates to the technical field of electromagnetic monitoring, and the method comprises the steps: obtaining building structure information and machine room arrangement information of a target machine room; a plurality of grid division schemes are obtained; determining test sampling points in each grid based on the machine room arrangement information; obtaining a plurality of test point distribution schemes based on the test sampling points of each grid in the grid division scheme; respectively calculating an evaluation index of each test point distribution scheme; and determining an optimal test point distribution scheme. According to the method, the building structure information and the arrangement information of the target machine room are acquired, and equipment arrangement analysis and sampling point selection are performed based on a plurality of grid division schemes, so that efficient test point distribution for the electromagnetic environment of the machine room can be realized; by evaluating the evaluation index value of the test point distribution scheme corresponding to each grid division scheme, the optimal test point distribution scheme is determined, so that uniform distribution and comprehensive coverage of test points are ensured, and the test accuracy and efficiency are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic monitoring, and in particular, to an optimization method, device, equipment and medium for electromagnetic environment test point layout. Background Art

[0002] As a special building where indoor equipment of core safety systems of signal specialties such as train dispatching command and centralized traffic control system, train operation control system, section blocking system, interlocking system, signal centralized monitoring system, and signal power supply equipment are centrally deployed, the railway signal machine room has high requirements for the quality of the electromagnetic environment. If the electromagnetic environment quality of the railway signal machine room is too poor, it is very easy to affect the normal operation of the equipment deployed inside the railway signal machine room, thereby affecting the train operation efficiency and endangering the train operation safety. Therefore, it is of great significance to test the electromagnetic environment of the railway signal machine room, which helps to ensure the stable operation of railway signal equipment in a complex electromagnetic environment and guarantee the safety of railway train operation.

[0003] At present, the test of the electromagnetic environment of the railway signal machine room mainly includes three steps: point layout, measurement and evaluation. However, there is particularly a lack of systematic guidance for the point layout position, and the point layout principle is highly subjective, making it difficult to ensure the uniformity of the point layout, and thus ensuring the effectiveness of the subsequent test and evaluation results. Summary of the Invention

[0004] The purpose of the present invention is to provide an optimization method, device, equipment and medium for electromagnetic environment test point layout to improve the above problems. To achieve the above purpose, the technical solutions adopted by the present invention are as follows:

[0005] In a first aspect, the present application provides an optimization device for electromagnetic environment test point layout, including:

[0006] Obtain the building structure information and machine room layout information of the target machine room;

[0007] Based on the building structure information and preset grid information, determine multiple grid sizes, and respectively divide the target machine room into multiple grids based on the multiple grid sizes to obtain multiple grid division schemes;

[0008] Based on the machine room layout information, determine the test sampling points in each grid, and the test sampling point is the point with the farthest distance from all the machine room electronic equipment in the grid where it is located;

[0009] Based on the test sampling points of each grid in the grid division scheme, obtain multiple test point layout schemes;

[0010] Calculate the evaluation indexes of each test point layout scheme respectively;

[0011] Based on the evaluation indexes of each test point layout scheme, determine the optimal test point layout scheme.

[0012] In a second aspect, the present application further provides an electromagnetic environment test point layout optimization device, including:

[0013] An acquisition unit, configured to acquire the building structure information and the machine room layout information of the target machine room;

[0014] A first determination unit, configured to determine multiple grid sizes based on the building structure information and the preset grid information, and divide the target machine room into multiple grids respectively based on the multiple grid sizes to obtain multiple grid division schemes;

[0015] A second determination unit, configured to determine the test sampling points in each grid based on the machine room layout information, where the test sampling point is the point with the farthest distance from all the machine room electronic devices in the grid where it is located;

[0016] A composition unit, configured to obtain multiple test point layout schemes based on the test sampling points of each grid in the grid division scheme;

[0017] A first calculation unit, configured to calculate the evaluation indexes of each test point layout scheme respectively;

[0018] A third determination unit, configured to determine the optimal test point layout scheme based on the evaluation indexes of each test point layout scheme.

[0019] In a third aspect, the present application further provides an electromagnetic environment test point layout optimization device, including:

[0020] A memory, configured to store a computer program;

[0021] A processor, configured to implement the steps of the electromagnetic environment test point layout optimization method when executing the computer program.

[0022] In a fourth aspect, the present application further provides a readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the above-mentioned electromagnetic environment test point layout optimization method are implemented.

[0023] The beneficial effects of the present invention are as follows:

[0024] By acquiring the building structure information and layout information of the target machine room, and performing equipment layout analysis and sampling point selection based on multiple grid division schemes, the present invention can achieve efficient test point layout for the electromagnetic environment of the machine room; by evaluating the evaluation index values of the test point layout schemes corresponding to each grid division scheme, the optimal test point layout scheme is determined, so as to ensure uniform distribution and comprehensive coverage of the test points, and improve the accuracy and efficiency of the test.

[0025] Other features and advantages of the present invention will be described in the following specification, and in part will be obvious from the specification, or can be understood by implementing the embodiments of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the drawings required in the embodiments. It should be understood that the following drawings only show some embodiments of the present invention, and therefore should not be regarded as a limitation of the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0027] Figure 1 It is a schematic flowchart of the electromagnetic environment test point layout optimization method described in the embodiments of the present invention;

[0028] Figure 2 It is a schematic diagram of the irregular computer room grid division described in the embodiments of the present invention;

[0029] Figure 3 It is a schematic diagram of the distribution of electronic devices in the first type of central grid computer room described in the embodiments of the present invention;

[0030] Figure 4 It is a schematic diagram of the distribution of electronic devices in the second type of central grid computer room described in the embodiments of the present invention;

[0031] Figure 5 It is a schematic diagram of the test sampling points in the standard railway signal computer room described in the embodiments of the present invention;

[0032] Figure 6 It is a schematic diagram of the structure of the electromagnetic environment test point layout optimization device described in the embodiments of the present invention;

[0033] Figure 7 It is a schematic diagram of the structure of the electromagnetic environment test point layout optimization equipment described in the embodiments of the present invention.

[0034] Reference numerals in the figures: 10, acquisition unit; 20, first determination unit; 30, second determination unit; 40, composition unit; 50, first calculation unit; 60, third determination unit; 800, electromagnetic environment test point layout optimization equipment; 801, processor; 802, memory; 803, multimedia component; 804, I / O interface; 805, communication component. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0035] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Apparently, the described embodiments are some, but not all, of the embodiments of the present invention. The components of the embodiments of the present invention usually described and illustrated in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed present invention, but merely represents selected embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts fall within the scope of protection of the present invention.

[0036] It should be noted that similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. At the same time, in the description of the present invention, the terms "first", "second", etc. are only used for distinguishing descriptions and cannot be understood as indicating or implying relative importance.

[0037] Embodiment 1:

[0038] This embodiment provides an optimization method for electromagnetic environment test point layout.

[0039] See Figure 1 , which shows that this method includes step S10, step S20, step S30, step S40, and step S50.

[0040] Step S10. Obtain the building structure information and computer room layout information of the target computer room;

[0041] Specifically, obtaining the building structure information and computer room layout information of the target computer room can comprehensively master the space layout, structural characteristics, and distribution of equipment and facilities of the target computer room. This provides an accurate data basis for subsequent grid division and sampling point selection.

[0042] Step S20. Determine multiple grid sizes based on the building structure information and preset grid information, and divide the target computer room into multiple grids respectively based on the multiple grid sizes to obtain multiple grid division schemes;

[0043] Specifically, considering that when performing grid division, problems such as over-dense or over-sparse division may occur. An over-dense grid distribution will lead to overly fine division, increasing the number and cost of sampling points; while an over-sparse grid distribution may result in insufficient test coverage, leading to large deviations in test results. Therefore, in this application, by presetting the grid size range and grid number range, a reasonable balance can be achieved between accuracy and cost, ensuring that the test point layout is both accurate and efficient.

[0044] Step S20 specifically includes steps S21, S22, S23, S24, S25, S26 and S27:

[0045] Step S21. Determine the external contour of the target computer room based on the building structure information;

[0046] Step S22. Discretize the external contour into multiple two-dimensional point coordinates;

[0047] Step S23. Calculate the centroid of the external contour based on the multiple two-dimensional point coordinates to obtain the target centroid;

[0048] Step S24. Determine the minimum circumscribed rectangle containing the external contour with the target centroid as the reference, and both the length and width of the minimum circumscribed rectangle are integers;

[0049] Step S25. Determine the greatest common divisor based on the length and width of the minimum circumscribed matrix as the initial size of the grid, and the grid is a square;

[0050] Step S26. Adjust the initial size of the grid multiple times based on the preset grid information, and divide the target computer room based on the grid with the adjusted size to obtain corresponding multiple computer room division results;

[0051] Step S27. Retain the division results in which the number of grids in the computer room division results meets the preset range to obtain multiple grid division schemes;

[0052] Specifically, determine the minimum circumscribed rectangle of the computer room external contour, and obtain the greatest common divisor of the length and width of the circumscribed rectangle as the initial size of the grid. The initial size can be adjusted multiple times. In this application, the adjustment range of the initial size is: the ratio of the initial size to the aspect ratio of the circumscribed rectangle length and width is between 80% and 125%, and the number of square grids obtained by dividing the minimum circumscribed rectangle according to this initial size, that is, the initial grid number, should be within the preset grid number range. If it is not within this range, this initial size is not considered. In the actual use scenario, for an extra-large computer room, if the computer room is divided into multiple rooms by walls and doors and windows as a whole, the layout design can be carried out separately for each room as an independent individual.

[0053] As Figure 2 shown, taking a special-shaped computer room as an example, first obtain the circumscribed rectangle of this special-shaped computer room, with the length and width being 21m and 15m respectively. The length and width of the circumscribed rectangle must be integers, and the greatest common divisor 3m of the length and width of the circumscribed rectangle can be selected as the initial size for division. When the initial size is 3m, the corresponding number of initial grids obtained by division is 35.

[0054] Step S30. Determine the test sampling points in each grid based on the computer room layout information, where the test sampling point is the point that is farthest from all the computer room electronic devices in the grid where it is located.

[0055] Specifically, in this application, according to the layout positions of the computer room electronic devices included in each grid, the determination methods of the corresponding sampling points in the grid are different.

[0056] Specifically, step S30 specifically includes steps S31, S32, S33, S34, S35, S36, S37, S38, S39, S310, S311, S312, and S313:

[0057] Step S31. Classify each grid based on the computer room layout information to obtain invalid grids, corner grids, and central grids respectively. Among them, the invalid grid is the grid that does not contain the computer room area at all, the corner grid is the grid that contains the walls, doors, and windows of the computer room, and the central grid is the grid that only contains the computer room electronic devices.

[0058] Specifically, considering the different impacts of different computer room electronic devices on the electromagnetic environment test, the present invention classifies the sampling grid areas into three categories: the grid containing non-computer room electronic devices such as walls, doors, windows, air conditioners, and lightning protection boxes is used as the corner grid; the grid that only contains the computer room electronic devices in the computer room is used as the central grid; and the grid that does not contain the computer room area at all is used as the invalid grid and deleted.

[0059] In this application, it is considered that the open space in the grid except for the walls, doors, windows, and computer room electronic devices is the effective layout area. As Figure 2 shown, through division and deletion, the irregularly shaped computer room is finally divided into 35 grids, among which, 10 are central grids, 22 are corner grids, and 3 are invalid grids that can be directly deleted without consideration.

[0060] Step S32. When the grid is a corner grid, use the effective layout area in the corner grid as the target area, and determine the minimum circumscribed rectangle of the target area as the target rectangle. The effective layout area is the grid in the corner grid that does not contain the walls, doors, windows, and computer room electronic devices of the computer room.

[0061] Step S33. First equal division operation: Divide the target rectangle into four small rectangles equally, and calculate the centroid of each small rectangle to obtain a plurality of first centroids.

[0062] Step S34. First calculation operation: Calculate the sum of the distances from the first centroids located in the effective layout area to each edge of the effective layout area to obtain the first distance sum.

[0063] Step S35. First screening operation: Take the smallest rectangle corresponding to the largest first distance and the corresponding first centroid as the target rectangle;

[0064] Step S36. Repeat the first equal division operation, the first calculation operation, and the first screening operation until the side length of the target rectangle is less than the set threshold, and take the centroid of the target rectangle as the test sampling point of the corner grid;

[0065] Specifically, for the corner grid, at most one point is selected as the test sampling point in each grid. First, regard the effective layout area in each corner grid as a polygon, generate the minimum circumscribed rectangle of the effective layout area, and take the minimum circumscribed rectangle as the target rectangle; divide the target rectangle into 4 smaller rectangles, and calculate the centroids of each divided rectangle. For the rectangle whose centroid is within the effective layout area, calculate the sum of the distances from its centroid to each edge of the effective layout area; take the rectangle corresponding to the largest sum of distances as the target rectangle again, and continuously repeat calculation steps such as equal division and distance sum calculation until the maximum side length of the target rectangle is less than 0.1 m, calculate the centroid of the current target rectangle, and take it as the test sampling point.

[0066] Specifically, for the central grid, multiple test sampling points can be taken in each central grid, and for different distribution situations of the computer room electronic equipment, there are differences in the process of obtaining the test sampling points. As Figure 3 shown, it is the first distribution situation of the computer room electronic equipment in the central grid, where the computer room electronic equipment is located at the center of the grid, and the side line of the effective layout area may contain more than or equal to 2 complete grid boundaries. Among them, d1, d3, and d4 are the distances between test sampling point 1 and the grid boundary and the edge of the computer room electronic equipment, and d2, d5, and d6 are the distances between test sampling point 2 and the grid boundary and the edge of the computer room electronic equipment. As Figure 4 shown, it is the second distribution situation of the computer room electronic equipment in the central grid. The computer room electronic equipment is located at the grid boundary, and the side line of the effective layout area contains at most 2 complete grid boundaries. d1, d2, d3, and d4 are the distances between the test sampling point and the grid boundary and the edge of the computer room electronic equipment.

[0067] Step S37. When the grid is a central grid, divide the central grid into the first type of central grid and the second type of central grid based on the position of the computer room electronic equipment in the grid. In the first type of central grid, the computer room electronic equipment is located in the middle of the grid, and in the second type of central grid, the computer room electronic equipment is located at the grid boundary;

[0068] Step S38. When the grid is the first type of central grid, divide the first type of central grid with the computer room electronic equipment as the boundary to obtain the to-be-processed grids after division;

[0069] Step S39. Take each to-be-processed grid as the target rectangle;

[0070] Step S310. Second equal division operation: Divide the target rectangle into four small rectangles equally, and calculate the centroid of each small rectangle to obtain multiple second centroids;

[0071] Step S311. Second calculation operation: Calculate the sum of the distances from the second centroids located within the effective layout area to the edge of the electronic equipment in the target computer room to obtain a second distance sum;

[0072] Step S312. Second screening operation: Take the small rectangle corresponding to the second centroid with the largest second distance sum as the target rectangle;

[0073] Step S313. Repeat the second equal division operation, the second calculation operation, and the second screening operation until the side length of the target rectangle is less than the set threshold, and take the centroid of each target rectangle as the test sampling point of the central grid;

[0074] Specifically, for Figure 3 the central grid in this case, first, with the electronic equipment in the computer room as the boundary, divide the effective layout area into multiple sub-polygons. For each sub-polygon, perform the same calculation process as the test sampling point of the above corner grid, that is, steps S33 to S36, and obtain a test sampling point within each sub-polygon respectively.

[0075] For Figure 4 the central grid in this case, directly perform the same calculation process as the test sampling point of the above corner grid, that is, steps S33 to S36, to obtain the only test sampling point within the current central grid.

[0076] Specifically, after determining the position of the test sampling point, in order to comprehensively reflect the three-dimensional distribution of the internal environment of the computer room, it is also necessary to further determine the height of the test sampling point in order to collect electromagnetic environment data at different heights. The steps for determining the height of the test sampling point include steps S1 to S4:

[0077] Step S1. Determine the height range of the points in the computer room based on the computer room layout information. The height range of the points in the computer room needs to cover the highest and lowest points of the settings of the electronic equipment in the computer room and the walls, doors, and windows of the computer room;

[0078] Step S2. Divide the height range based on the preset height stratification to obtain multiple sampling point heights;

[0079] Step S3. Further divide the relevant intervals corresponding to the sampling point heights based on the height of the electronic equipment in the computer room to obtain multiple optimized heights;

[0080] Step S4. Randomly assign sampling point heights and optimized heights to all test sampling points to obtain the layout height of each test sampling point;

[0081] Specifically, by determining the height range of the test sampling points and combining the preset height stratification and optimized distribution, it is possible to achieve a comprehensive coverage of the sampling points from the plane to the three-dimensional space, adapt to the actual situation of the electronic equipment and structure in the computer room, effectively avoid missing key areas, and at the same time improve the representativeness and accuracy of the sampling data. Randomly allocate the heights of the sampling points to eliminate human bias and ensure that the acquisition of electromagnetic environment data is more objective and comprehensive.

[0082] Step S40. Based on the test sampling points of each grid in the grid division scheme, obtain multiple test layout schemes;

[0083] Step S50. Calculate the evaluation indexes of each test layout scheme respectively;

[0084] Specifically, for multiple test layout schemes, it is necessary to determine the optimal test layout scheme by calculating the evaluation indexes, so as to ensure the scientificity, rationality and efficiency of the distribution of test sampling points.

[0085] Specifically, Step S51, Step S52, Step S53, Step S54 and Step S55:

[0086] Step S51. Calculate the Euclidean distance between each test sampling point and the nearest test sampling point in the test layout scheme to obtain the first distance;

[0087] Step S52. Calculate the Euclidean distance between the vertical projection point of each test sampling point on the nearest electronic equipment in the computer room in the test layout scheme to obtain the second distance;

[0088] Step S53. Calculate the sum of all the first distances and obtain the variance to get the first value;

[0089] Step S54. Calculate the sum of all the second distances and obtain the variance to get the second value;

[0090] Step S55. Calculate the sum of the first value and the second value to get the index value;

[0091] Specifically, the calculation formula of the index value is:

[0092] E j =Var(D point (S j (k)))+Var(D equip (S j (k)))

[0093] Among them, E j is the index value of the jth test layout scheme; Var() is the variance calculation function; S j (k) is the kth test sampling point in the jth test layout scheme; Dpoint (S j (k)) represents calculating the Euclidean distance between the k-th test sampling point and the nearest test sampling point in the j-th test point layout scheme; D equip (S j (k)) represents calculating the Euclidean distance between the k-th test sampling point and the perpendicular projection point on the outer shell of the nearest computer room electronic equipment in the j-th test point layout scheme.

[0094] Step S60. Determine the optimal test point layout scheme based on the evaluation indexes of each test point layout scheme;

[0095] Specifically, it can be seen from the above index value calculation formula that the closer the index value is to 0, the more evenly the test equipment can cover the target computer room and obtain more reliable test data under this test point layout scheme. Therefore, the test point layout scheme with the smallest index value will be selected as the optimal test point layout scheme, and the test sampling points in the optimal test point layout scheme will be used as the actual test points.

[0096] As Figure 5 shown, taking a standard railway signal computer room of 8m×16m as an example, the figure shows the optimal test point layout scheme. Among them, the grid size is a square with a side length of 3m. Correspondingly, the standard railway signal computer room is divided into 18 grids, including 14 corner grids and 4 central grids, with a total of 21 test points.

[0097] Embodiment 2:

[0098] As Figure 6 shown, this embodiment provides an electromagnetic environment test point layout optimization device, which includes:

[0099] An acquisition unit 10, configured to acquire the building structure information and computer room layout information of the target computer room;

[0100] A first determination unit 20, configured to determine multiple grid sizes based on the building structure information and preset grid information, and divide the target computer room into multiple grids respectively based on the multiple grid sizes to obtain multiple grid division schemes;

[0101] A second determination unit 30, configured to determine the test sampling points in each grid based on the computer room layout information, where the test sampling points are the points that are farthest from all computer room electronic equipment in the grid where they are located;

[0102] A composition unit 40, configured to obtain multiple test point layout schemes based on the test sampling points of each grid in the grid division scheme;

[0103] A first calculation unit 50, configured to calculate the evaluation indexes of each test point layout scheme respectively;

[0104] The third determination unit 60 is configured to determine an optimal test point layout scheme based on the evaluation indexes of each test point layout scheme.

[0105] In a specific implementation manner disclosed in the present application, the first determination unit 20 includes:

[0106] A fourth determination unit, configured to determine the external contour of the target computer room based on the building structure information;

[0107] A discretization unit, configured to discretize the external contour into a plurality of two-dimensional point coordinates;

[0108] A second calculation unit, configured to calculate the centroid of the external contour based on the plurality of two-dimensional point coordinates to obtain a target centroid;

[0109] A fifth determination unit, configured to determine a minimum circumscribed rectangle including the external contour with the target centroid as a reference, where the length and width of the minimum circumscribed rectangle are both integers;

[0110] A sixth determination unit, configured to determine the greatest common divisor based on the length and width of the minimum circumscribed matrix as the initial size of the grid, and the grid is a square;

[0111] An adjustment unit, configured to perform multiple adjustments on the initial size of the grid based on preset grid information, and divide the target computer room based on the grid with the adjusted size to obtain corresponding multiple computer room division results;

[0112] A first acting unit, configured to retain the division results in the computer room division results where the number of grids meets a preset range to obtain a plurality of grid division schemes.

[0113] In a specific implementation manner disclosed in the present application, the second determination unit 30 includes:

[0114] A processing unit, configured to perform classification processing on each grid based on the computer room layout information to obtain invalid grids, corner grids, and central grids respectively, where the invalid grids are grids that do not contain any computer room areas, the corner grids are grids that contain computer room walls, doors, and windows, and the central grids are grids that only contain computer room electronic equipment;

[0115] A second acting unit, configured to, when the grid is a corner grid, use the effective layout area in the corner grid as the target area, and determine the minimum circumscribed rectangle of the target area as the target rectangle, where the effective layout area is the grid in the corner grid that does not contain computer room walls, doors, windows, and computer room electronic equipment;

[0116] A first equal division unit, configured to perform a first equal division operation: equally divide the target rectangle into four small rectangles, and calculate the centroid of each small rectangle to obtain a plurality of first centroids;

[0117] A third calculation unit for a first calculation operation: calculating the sum of the distances from the first centroid located within the effective layout area to the edges of the effective layout point area to obtain a first distance sum;

[0118] A third acting unit for a first screening operation: taking the small rectangle corresponding to the first centroid with the largest first distance sum as the target rectangle;

[0119] A first repeating unit for repeating the first equal division operation, the first calculation operation, and the first screening operation until the side length of the target rectangle is less than a set threshold, and taking the centroid of the target rectangle as the test sampling point of the corner grid.

[0120] In a specific embodiment disclosed in the present application, the second determination unit 30 includes:

[0121] A first division unit for, when the grid is a central grid, dividing the central grid into a first type of central grid and a second type of central grid based on the position of the computer room electronic equipment in the grid. In the first type of central grid, the computer room electronic equipment is located at the middle position of the grid, and in the second type of central grid, the computer room electronic equipment is located at the boundary position of the grid;

[0122] A fourth acting unit for, when the grid is the first type of central grid, dividing the first type of central grid with the computer room electronic equipment as the boundary to obtain the divided grid to be processed;

[0123] A fifth acting unit for taking each grid to be processed as the target rectangle;

[0124] A second equal division unit for a second equal division operation: equally dividing the target rectangle into four small rectangles and calculating the centroid of each small rectangle to obtain a plurality of second centroids;

[0125] A fourth calculation unit for a second calculation operation: calculating the sum of the distances from the second centroid located within the effective layout area to the edge of the computer room electronic equipment of the target computer room to obtain a second distance sum;

[0126] A sixth acting unit for a second screening operation: taking the small rectangle corresponding to the second centroid with the largest second distance sum as the target rectangle;

[0127] A second repeating unit for repeating the second equal division operation, the second calculation operation, and the second screening operation until the side length of the target rectangle is less than a set threshold, and taking the centroid of each target rectangle as the test sampling point of the central grid.

[0128] In a specific embodiment disclosed in the present application, the first calculation unit 50 includes:

[0129] A fifth calculation unit for calculating the Euclidean distance between each test sampling point and the nearest test sampling point in the test layout scheme to obtain a first distance;

[0130] A sixth calculation unit, configured to calculate the Euclidean distance of the vertical projection point of each test sampling point in the test point layout scheme on the nearest electronic equipment in the computer room, so as to obtain a second distance;

[0131] A seventh calculation unit, configured to calculate the sum of all the first distances and obtain the variance, so as to obtain a first value;

[0132] An eighth calculation unit, configured to calculate the sum of all the second distances and obtain the variance, so as to obtain a second value;

[0133] A ninth calculation unit, configured to calculate the sum of the first value and the second value, so as to obtain an index value.

[0134] In a specific implementation manner disclosed in the present application, the device further includes:

[0135] A seventh determination unit, configured to determine the height range of the computer room layout based on the computer room layout information, and the height range of the computer room layout needs to include the highest point and the lowest point of the installation positions of the computer room electronic equipment and the computer room wall doors and windows;

[0136] A second division unit, configured to divide the height range based on a preset height stratification, so as to obtain a plurality of sampling point heights;

[0137] A third division unit, configured to further divide the relevant interval corresponding to the sampling point height corresponding to the height of the computer room electronic equipment, so as to obtain a plurality of optimized heights;

[0138] An obtaining unit, configured to randomly assign the sampling point height and the optimized height to all the test sampling points, so as to obtain the layout height of each test sampling point.

[0139] It should be noted that regarding the device in the above embodiments, the specific manners in which each module performs operations have been described in detail in the embodiments related to the method, and will not be elaborated herein.

[0140] Embodiment 3:

[0141] Corresponding to the above method embodiment, in this embodiment, an electromagnetic environment test point layout optimization device is further provided. An electromagnetic environment test point layout optimization device described below can be mutually corresponding and referred to with an electromagnetic environment test point layout optimization method described above.

[0142] Figure 7 It is a block diagram of an electromagnetic environment test point layout optimization device 800 shown according to an exemplary embodiment. As Figure 7As shown, the electromagnetic environment test point layout optimization device 800 may include: a processor 801 and a memory 802. The electromagnetic environment test point layout optimization device 800 may also include one or more of a multimedia component 803, an I / O interface 804, and a communication component 805.

[0143] Among them, the processor 801 is used to control the overall operation of the electromagnetic environment test point layout optimization device 800 to complete all or part of the steps in the above electromagnetic environment test point layout optimization method. The memory 802 is used to store various types of data to support the operation of the electromagnetic environment test point layout optimization device 800. These data may include, for example, instructions for any application or method operating on the electromagnetic environment test point layout optimization device 800, as well as application-related data, such as contact data, sent and received messages, pictures, audio, video, and so on. The memory 802 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, a magnetic disk, or an optical disc. The multimedia component 803 may include a screen and an audio component. The screen may be a touch screen, for example, and the audio component is used to output and / or input audio signals. For example, the audio component may include a microphone for receiving external audio signals. The received audio signal may be further stored in the memory 802 or sent through the communication component 805. The audio component also includes at least one speaker for outputting audio signals. The I / O interface 804 provides an interface between the processor 801 and other interface modules, and the other interface modules may be a keyboard, a mouse, buttons, etc. These buttons may be virtual buttons or physical buttons. The communication component 805 is used for wired or wireless communication between the electromagnetic environment test point layout optimization device 800 and other devices. Wireless communication, such as Wi-Fi, Bluetooth, near field communication (NFC), 2G, 3G, or 4G, or a combination of one or more of them. Accordingly, the communication component 805 may include: a Wi-Fi module, a Bluetooth module, and an NFC module.

[0144] In an exemplary embodiment, the electromagnetic environment test point layout optimization device 800 may be implemented by one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components, and is used to execute the above-mentioned electromagnetic environment test point layout optimization method.

[0145] In another exemplary embodiment, a computer-readable storage medium including program instructions is further provided. When the program instructions are executed by a processor, the steps of the above-mentioned electromagnetic environment test point layout optimization method are implemented. For example, the computer-readable storage medium may be the above-mentioned memory 802 including program instructions, and the above-mentioned program instructions may be executed by the processor 801 of the electromagnetic environment test point layout optimization device 800 to complete the above-mentioned electromagnetic environment test point layout optimization method.

[0146] Embodiment 4:

[0147] Corresponding to the above method embodiment, a readable storage medium is further provided in this embodiment. A readable storage medium described below can be correspondingly referred to with an electromagnetic environment test point layout optimization method described above.

[0148] A readable storage medium has a computer program stored thereon. When the computer program is executed by a processor, the steps of the electromagnetic environment test point layout optimization method of the above method embodiment are implemented.

[0149] The readable storage medium may specifically be various readable storage media such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disc that can store program codes.

[0150] The foregoing is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

[0151] As described above, it is only the specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of changes or substitutions, which should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A method for optimizing the layout of electromagnetic environment test points, characterized in that: include: Acquire the building structure information and layout information of the target computer room, wherein the layout information of the computer room includes the layout information of the electronic equipment in the computer room and the layout information of the walls, doors and windows in the computer room; Determine a plurality of grid sizes based on the building structure information and the preset grid information, and divide the target computer room into a plurality of grids based on the plurality of grid sizes to obtain a plurality of grid division schemes; Determine a test sampling point in each grid based on the computer room layout information, wherein the test sampling point is the point farthest from all electronic equipment in the computer room in the grid; Based on the test sampling points of each grid in the grid division scheme, multiple test point layout schemes are obtained; Calculate the evaluation index of each test point layout plan respectively; Based on the evaluation indicators of each test point layout plan, determine the optimal test point layout plan.

2. The electromagnetic environment test point optimization method according to claim 1 is characterized in that , based on the building structure information and the preset grid information, multiple grid sizes are determined, and based on the multiple grid sizes, the target computer room is divided into multiple grids to obtain multiple grid division schemes, wherein the preset grid information includes a grid size range and a grid number range, including: Determine the outer contour of the target computer room based on the building structure information; Discretizing the outer contour into a plurality of two-dimensional point coordinates; Calculating the center of gravity of the external contour based on the multiple two-dimensional point coordinates to obtain the target center of gravity; Determine a minimum circumscribed rectangle containing the external contour based on the target gravity center, wherein the length and width of the minimum circumscribed rectangle are both integers; Determining a greatest common factor based on the length and width of the minimum circumscribed matrix as an initial size of a grid, wherein the grid is a square; Adjusting the initial size of the grid multiple times based on the preset grid information, and dividing the target computer room based on the grid after the size adjustment to obtain corresponding multiple computer room division results; The division results in which the number of grids in the computer room division results meets a preset range are retained to obtain multiple grid division schemes.

3. The electromagnetic environment test point optimization method according to claim 1 is characterized in that ,Determining the test sampling points in each grid based on the computer room layout information, including: Classify each grid based on the layout information of the computer room to obtain invalid grids, corner grids and center grids, respectively, wherein the invalid grid is a grid that does not contain the computer room area at all, the corner grid is a grid that contains the walls, doors and windows of the computer room, and the center grid is a grid that only contains the electronic equipment in the computer room; When the grid is the corner grid, the effective point distribution area in the corner grid is used as the target area, and the minimum circumscribed rectangle of the target area is determined and used as the target rectangle, and the effective point distribution area is the grid in the corner grid that does not include the walls, doors and windows of the computer room and the electronic equipment in the computer room; First division operation: dividing the target rectangle into four small rectangles, and calculating the centroid of each small rectangle to obtain multiple first centroids; The first calculation operation is to calculate the sum of the distances from the first center of gravity in the effective layout area to the edges of the effective layout area to obtain a first distance sum; First screening operation: taking the small rectangle corresponding to the largest first distance and the corresponding first center of gravity as the target rectangle; The first dividing operation, the first calculating operation and the first screening operation are repeated until the side length of the target rectangle is less than a set threshold, and the centroid of the target rectangle is used as a test sampling point of the corner grid.

4. The electromagnetic environment test point optimization method according to claim 3 is characterized in that ,Based on the layout information of the computer room, each grid is classified and processed to obtain invalid grids, corner grids and center grids, respectively, and then include: When the grid is the central grid, the central grid is divided into a first type of central grid and a second type of central grid based on the position of the electronic equipment in the computer room in the grid, wherein the electronic equipment in the computer room in the first type of central grid is located in the middle of the grid, and the electronic equipment in the computer room in the second type of central grid is located at the boundary of the grid; When the grid is a first-type central grid, the first-type central grid is divided by using the electronic equipment in the computer room as a boundary to obtain divided grids to be processed; Take each processed grid as the target rectangle; Second equal division operation: dividing the target rectangle into four small rectangles, and calculating the centroid of each small rectangle to obtain multiple second centroids; Second calculation operation: calculating the sum of distances from the second center of gravity located in the effective layout area to the edge of the electronic equipment in the target computer room to obtain a second distance sum; Second screening operation: taking the small rectangle corresponding to the largest second distance and the corresponding second center of gravity as the target rectangle; The second dividing operation, the second calculating operation and the second screening operation are repeated until the side length of the target rectangle is less than a set threshold, and the centroid of each target rectangle is used as a test sampling point of the central grid.

5. An electromagnetic environment test point optimization device, characterized in that: include: An acquisition unit, used to acquire the building structure information and layout information of the target computer room; A first determining unit is used to determine a plurality of grid sizes based on the building structure information and the preset grid information, and divide the target computer room into a plurality of grids based on the plurality of grid sizes to obtain a plurality of grid division schemes; A second determining unit is used to determine a test sampling point in each grid based on the computer room layout information, wherein the test sampling point is a point farthest from all electronic equipment in the computer room in the grid; A composition unit, used to obtain multiple test point layout schemes based on the test sampling points of each grid in the grid division scheme; A first calculation unit is used to calculate the evaluation index of each test point layout scheme respectively; The third determination unit is used to determine the optimal test point layout plan based on the evaluation indicators of each test point layout plan.

6. The electromagnetic environment test point optimization device according to claim 5, characterized in that: The preset grid information includes a grid size range and a grid quantity range, and the first determining unit includes: A fourth determining unit, configured to determine an external outline of the target computer room based on the building structure information; A discrete unit, used for discretizing the external contour into a plurality of two-dimensional point coordinates; A second calculation unit is used to calculate the center of gravity of the external contour based on the multiple two-dimensional point coordinates to obtain the target center of gravity; A fifth determining unit, configured to determine a minimum circumscribed rectangle containing the external contour based on the target gravity center, wherein the length and width of the minimum circumscribed rectangle are both integers; a sixth determining unit, configured to determine a greatest common factor based on the length and width of the minimum circumscribed matrix as an initial size of a grid, wherein the grid is a square; An adjusting unit, configured to adjust the initial size of the grid multiple times based on the preset grid information, and divide the target computer room based on the grid after the size adjustment to obtain a corresponding plurality of computer room division results; The first unit is used to retain the division results whose grid numbers meet a preset range in the computer room division results, and obtain multiple grid division schemes.

7. The electromagnetic environment test point optimization device according to claim 5, characterized in that: The second determining unit includes: A processing unit is used to classify each grid based on the layout information of the computer room to obtain invalid grids, corner grids and center grids, wherein the invalid grid is a grid that does not contain the computer room area at all, the corner grid is a grid that contains the walls, doors and windows of the computer room, and the center grid is a grid that only contains electronic equipment in the computer room; The second is used as a unit, when the grid is the corner grid, to use the effective point distribution area in the corner grid as the target area, and to determine the minimum circumscribed rectangle of the target area as the target rectangle, wherein the effective point distribution area is the grid in the corner grid that does not include the walls, doors and windows of the computer room and the electronic equipment in the computer room; A first dividing unit, used for a first dividing operation: dividing the target rectangle into four small rectangles, and calculating the centroid of each small rectangle to obtain a plurality of first centroids; A third calculation unit is used for a first calculation operation: calculating the sum of distances from a first centroid located in the effective layout area to each edge of the effective layout area to obtain a first distance sum; The third is used as a unit for the first screening operation: the small rectangle corresponding to the largest first distance and the corresponding first center of gravity is used as the target rectangle; The first repeating unit is used to repeat the first dividing operation, the first calculating operation and the first screening operation until the side length of the target rectangle is less than a set threshold, and the centroid of the target rectangle is used as a test sampling point of the corner grid.

8. The electromagnetic environment test point optimization device according to claim 7, characterized in that: The second determining unit includes: A first division unit is used for, when the grid is the central grid, dividing the central grid into a first type of central grid and a second type of central grid based on the position of the electronic equipment in the computer room in the grid, wherein the electronic equipment in the computer room in the first type of central grid is located in the middle of the grid, and the electronic equipment in the computer room in the second type of central grid is located at the boundary of the grid; The fourth unit is used for dividing the first type of central grid by taking the electronic equipment in the computer room as a boundary to obtain the divided grids to be processed when the grid is a first type of central grid; The fifth is used as a unit for taking each to-be-processed grid as a target rectangle; A second equal division unit, used for a second equal division operation: dividing the target rectangle into four small rectangles, and calculating the centroid of each small rectangle to obtain a plurality of second centroids; A fourth calculation unit is used for a second calculation operation: calculating the sum of distances from a second center of gravity located in the effective arrangement area to an edge of electronic equipment in the target computer room to obtain a second distance sum; The sixth is used as a unit for a second screening operation: a small rectangle corresponding to the largest second distance and the corresponding second centroid is used as a target rectangle; The second repeating unit is used to repeat the second dividing operation, the second calculating operation and the second screening operation until the side length of the target rectangle is less than a set threshold, and the centroid of each target rectangle is used as a test sampling point of the central grid.

9. An electromagnetic environment test point optimization device, characterized in that: include: Memory for storing computer programs; A processor is used to implement the steps of the electromagnetic environment test point optimization method as described in any one of claims 1 to 4 when executing the computer program.

10. A readable storage medium, characterized in that: The readable storage medium stores a computer program, which, when executed by a processor, implements the steps of the electromagnetic environment test point optimization method according to any one of claims 1 to 4.

Images