Disinfection equipment control method and system based on instrument identification

By segmenting the outline and matching feature points of the images of medical devices to be disinfected, accurately identifying the device type and obtaining an adaptive disinfection plan, the problem of difficulty in accurately obtaining the device type in the prior art is solved, and the adaptability and disinfection effect of the disinfection plan are improved.

CN120147641APending Publication Date: 2025-06-13NANFANG HOSPITAL OF SOUTHERN MEDICAL UNIV
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Patent Information

Application Number
CN202510274305.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-10
Publication Date
2025-06-13

AI Technical Summary

Technical Problem

The prior art is difficult to accurately obtain the types of medical devices to be disinfected, resulting in the inability to accurately apply the adapted disinfection scheme.

Method used

By obtaining the image of the instrument to be disinfected, the overall outline of the instrument is extracted and divided into a single closed outline, the characteristic points at the contour turning point are extracted, and the preset instrument profile is matched in the database to determine the instrument type and obtain the corresponding disinfection plan.

Benefits of technology

It realizes that the instrument type can still be accurately identified when the instrument is blocked or partially displayed, thereby improving the adaptability of the disinfection plan and ensuring effective disinfection effect.

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Abstract

The invention discloses a disinfection equipment control method and system based on instrument identification, and belongs to the technical field of disinfection equipment control. The overall contour of a to-be-disinfected instrument is segmented to obtain a plurality of single closed contours; the first contour turning point feature points are matched with the second contour turning point feature points of the instrument contours of various types of instruments preset in the database, the instrument type is matched for each single closed contour according to the matching result, and finally a preset disinfection scheme is obtained according to the instrument type for disinfection. The instrument type can still be analyzed for part of the displayed geometric structures, so that the suitability of obtaining the preset disinfection scheme is improved, and the to-be-disinfected instrument is effectively disinfected.
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Description

Technical Field

[0001] The present invention relates to the technical field of disinfection equipment control, and particularly to a control method and system for disinfection equipment based on instrument recognition. Background Art

[0002] The sterility of medical devices (such as scalpels, hemostatic forceps, etc.) directly affects the physical health of patients. Therefore, disinfecting medical devices is an extremely important and necessary step; Different medical devices will have different disinfection schemes (such as disinfection steps, disinfection tools used, and various disinfection parameters, etc.). Therefore, in disinfection equipment, disinfection will be carried out according to the type of instrument to be disinfected using the corresponding disinfection scheme; Accurately obtaining the type of instrument to be disinfected is an important prerequisite for accurately obtaining the adapted disinfection scheme. Therefore, how to accurately obtain the type of instrument to be disinfected is an urgent problem to be solved. Summary of the Invention

[0003] In order to solve the technical problems existing in the prior art, the present invention provides a control method for disinfection equipment based on instrument recognition, including the following steps: Obtain an image of the instrument to be disinfected, and extract the overall contour of the instrument to be disinfected in the image of the instrument to be disinfected; Segment the overall contour of the instrument to be disinfected to obtain a plurality of single closed contours; Extract the feature points at the first contour turning points of each single closed contour, and analyze the first position information set of each feature point at the first contour turning point. The first position information set includes the first relative position information of the corresponding feature point at the first contour turning point and other feature points at the first contour turning points in the single closed contour where it is located; Obtain the instrument contours of various types of instruments previously entered in the database, extract the feature points at the second contour turning points corresponding to each instrument according to the instrument contours, and analyze the second position information set of each feature point at the second contour turning point. The second position information set includes the second relative position information of the corresponding feature point at the second contour turning point and other feature points at the second contour turning points in the instrument contour where it is located; According to each first position information set and each second position information set, match similar points for each feature point at the first contour turning point from the feature points at the second contour turning points; According to the similar points matched by each feature point at the first contour turning point, match the corresponding instrument type for each single closed contour to obtain the instrument types existing in the image of the instrument to be disinfected; Obtain the corresponding preset disinfection scheme from the database according to the instrument types existing in the image of the instrument to be disinfected for disinfection.

[0004] Further, the extraction of the overall contour of the instrument to be disinfected in the image of the instrument to be disinfected is specifically as follows: Perform image preprocessing on the image of the instrument to be disinfected; Extract the edges in the image of the instrument to be disinfected through an edge detection algorithm to obtain an edge image; Extract all closed contours through the image contour function of OpenCV to obtain the overall contour of the instrument to be disinfected.

[0005] Further, the extraction of the feature points at the first contour turning points for each of the single closed contours is specifically as follows: Extract multiple feature points on the single closed contour; Calculate vectors for each pair of adjacent feature points; Calculate the angle between adjacent vectors through the dot product formula of vectors; If the angle between two adjacent vectors is greater than or equal to a preset threshold, then the feature point between these two adjacent vectors is used as the feature point at the first contour turning point.

[0006] Further, the analysis of the first position information set of each feature point at the first contour turning point is specifically as follows: Take the currently analyzed feature point at the first contour turning point as the first turning point, and take the first turning point and other feature points at the first contour turning points in the single closed contour where it is located as the second turning points; Establish a coordinate system with the first turning point as the origin, and obtain the coordinate information of each second turning point; Calculate the angle information and distance information of each second turning point relative to the first turning point according to the coordinate information of each second turning point, and take the angle information and distance information corresponding to the same second turning point as the first relative position information; Collect the first relative position information to obtain the first position information set of the first turning point.

[0007] Further, according to each first position information set and each second position information set, matching similar points for each feature point at the first contour turning point from the feature points at the second contour turning points is specifically as follows: Calculate the angle difference value and distance difference value between each first relative position information and each second relative position information one by one. If the angle difference value is less than the preset angle difference threshold and the distance difference value is less than the preset distance difference threshold, then the corresponding first relative position information and the corresponding second relative position information are similar, and the second relative position information is used as the matching position information of the first position information set corresponding to the first relative position information; In each set of first position information, analyze the set of second position information from which the matching position information originates the most, and use the feature points of the second contour turning point corresponding to this set of second position information as the similarity points of the feature points of the first contour turning point corresponding to the corresponding set of first position information.

[0008] Furthermore, obtaining the types of instruments existing in the instrument image to be disinfected by matching the similarity points corresponding to each feature point of the first contour turning point for each monomer closed contour specifically includes: In each monomer closed contour, analyze the instrument contour from which the similarity points originate the most, and use the type of instrument corresponding to this instrument contour as the type of the instrument to be disinfected corresponding to the corresponding monomer closed contour.

[0009] Furthermore, performing disinfection by obtaining the corresponding preset disinfection plan from the database according to the types of instruments existing in the instrument image to be disinfected further includes: If the instruments to be disinfected in the instrument image to be disinfected are of the same type of instrument, disinfect them with the preset disinfection plan corresponding to this type of instrument; if there are multiple types of instruments in the instrument image to be disinfected, determine whether the preset disinfection plans corresponding to various instruments to be disinfected are all the same. If so, disinfect them with the corresponding preset disinfection plan. If not, classify the instruments to be disinfected according to the preset disinfection plan and send them to the user for classification before disinfection.

[0010] The present invention also provides a disinfection equipment control system based on instrument recognition, including: A contour analysis module, configured to obtain an instrument image to be disinfected, extract the overall contour of the instrument to be disinfected in the instrument image to be disinfected, and segment the overall contour of the instrument to be disinfected to obtain a plurality of monomer closed contours; A first analysis module, configured to extract feature points of the first contour turning point for each of the monomer closed contours, and analyze a set of first position information of each feature point of the first contour turning point. The set of first position information includes the first relative position information of the corresponding feature point of the first contour turning point and other feature points of the first contour turning point in the monomer closed contour where it is located; A second analysis module, configured to obtain the instrument contours of various types of instruments pre-entered from a database, extract the feature points of the second contour turning point corresponding to each instrument according to the instrument contours, and analyze a set of second position information of each feature point of the second contour turning point. The set of second position information includes the second relative position information of the corresponding feature point of the second contour turning point and other feature points of the second contour turning point in the instrument contour where it is located; A similarity point matching module, configured to match similarity points for each feature point of the first contour turning point from each feature point of the second contour turning point according to each set of first position information and each set of second position information; An instrument type analysis module, which is used to match the corresponding instrument type for each single closed contour according to the similar points matched by the feature points at each first contour turning point, so as to obtain the instrument types existing in the image of the instrument to be disinfected; A disinfection control module, which is used to obtain the corresponding preset disinfection plan from the database according to the instrument types existing in the image of the instrument to be disinfected for disinfection.

[0011] Further, the first position information set for analyzing the feature points at each first contour turning point is specifically: Taking the feature point at the current first contour turning point to be analyzed as the first turning point, and taking the first turning point and other feature points at the first contour turning points in the single closed contour where it is located as the second turning points; Establishing a coordinate system with the first turning point as the origin, and obtaining the coordinate information of each second turning point; Calculating the angle information and distance information of each second turning point relative to the first turning point according to the coordinate information of each second turning point, and taking the angle information and distance information obtained corresponding to the same second turning point as the first relative position information; Collecting the first relative position information to obtain the first position information set of the first turning point.

[0012] Further, the method of matching the corresponding instrument type for each single closed contour according to the similar points matched by the feature points at each first contour turning point to obtain the instrument types existing in the image of the instrument to be disinfected is specifically: Analyzing the instrument contour from which the most similar points are derived in each single closed contour, and taking the instrument type corresponding to this instrument contour as the instrument type of the instrument to be disinfected corresponding to the single closed contour.

[0013] Compared with the prior art, the beneficial effects of the present invention are as follows: By segmenting the overall contour of the instrument to be disinfected to obtain multiple single closed contours, for each single closed contour, matching the feature points at the first contour turning point with the feature points at the second contour turning points of the instrument contours of various types preset in the database, and matching the instrument type for each single closed contour according to the matching result, and finally obtaining the preset disinfection plan according to the instrument type for disinfection, it can still analyze the instrument type for some geometric structures shown when the instrument is blocked, thereby improving the adaptability of obtaining the preset disinfection plan, and thus effectively disinfecting the instrument to be disinfected; By calculating the angular difference value and the distance difference value between each first relative position information and each second relative position information one by one, the matching position information of the second relative position information similar to each first relative position information is obtained as the matching position information of the first position information set corresponding to the first relative position information. The second contour turning feature point corresponding to the second position information set with the most sources corresponding to the matching position information is used as the similarity point of the first contour turning feature point corresponding to the first position information set, improving the matching accuracy of the first contour turning feature point of the single closed contour and the second contour turning feature point of the preset instrument contour, thereby improving the accuracy of instrument recognition and ensuring the adaptability of the obtained preset disinfection plan. By judging the type of the instrument to be disinfected in the image of the instrument to be disinfected, it is further judged whether all the preset disinfection plans corresponding to various instruments to be disinfected are the same. When they are different, the instruments to be disinfected are classified and sent to the user according to the preset disinfection plan for classification before disinfection, effectively avoiding insufficient disinfection effect or damage of the instrument due to misusing other disinfection plans. Brief Description of the Drawings

[0014] The drawings here are incorporated into the specification and form a part of this specification, indicating the embodiments that conform to the present invention, and are used together with the specification to explain the principles of the present invention.

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0016] Figure 1 is a flowchart of a disinfection equipment control method based on instrument recognition according to the present invention; Figure 2 is an example diagram of the contour of the instrument without occlusion with two scalpels as an example of the present invention; Figure 3 is an example diagram of the contour of the instrument with occlusion with two scalpels as an example of the present invention; Figure 4 is an example diagram of obtaining multiple single closed contours by segmenting the overall contour of the instrument to be disinfected with two scalpels as an example of the present invention. Detailed Description of the Embodiments

[0017] Next, in combination with the accompanying drawings in the embodiments of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of the present invention.

[0018] It should be noted that all directional indications (such as up, down, left, right, front, back...) in the embodiments of the present invention are only used to explain the relative position relationship and movement conditions between components in a specific posture (as shown in the accompanying drawings). If this specific posture changes, the directional indications will also change accordingly.

[0019] In addition, the descriptions involving "first", "second", etc. in the present invention are only for descriptive purposes, and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions between various embodiments can be combined with each other, but it must be based on the fact that those of ordinary skill in the art can implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0020] Embodiment 1 Refer to Figure 1 As shown, a method for controlling a disinfection device based on instrument recognition provided by the present invention specifically includes the following steps: S1. Obtain an image of the instrument to be disinfected, and extract the overall contour of the instrument to be disinfected in the image of the instrument to be disinfected.

[0021] The overall contour of the instrument to be disinfected is composed of the instrument contour shown in the image of the instrument to be disinfected. For example, if there are two scalpels shown in the image of the instrument to be disinfected, and the two scalpels are completely separated and not overlapped and stacked, the overall contour of the instrument to be disinfected is the complete contour of these two scalpels, as Figure 2 shown; if the two scalpels are cross-stacked, the overall contour of the instrument to be disinfected is shown as the complete contour of the scalpel at the top and the contour of the scalpel at the bottom divided into two parts, as Figure 3 shown; In some embodiments, the extraction of the overall contour of the instrument to be disinfected in the image of the instrument to be disinfected can be achieved through the following steps: Perform image preprocessing on the image of the instrument to be disinfected; Extract the edges in the image of the instrument to be disinfected through an edge detection algorithm to obtain an edge image; All closed contours are extracted through the image contour function of OpenCV to obtain the overall contour of the instrument to be disinfected.

[0022] S2. Segment the overall contour of the instrument to be disinfected to obtain a plurality of single closed contours.

[0023] The single closed contours are obtained by segmenting according to the contour lines in the overall contour of the instrument to be disinfected. As Figure 4 shown, the overall contour of the instrument to be disinfected of two scalpels is segmented into 5 single closed contours along the contour lines.

[0024] S3. Extract the first contour turning point features of each single closed contour, and analyze the first position information set of each first contour turning point feature. The first position information set includes the first relative position information of the corresponding first contour turning point feature and other first contour turning point features in the single closed contour where it is located. S4. Obtain the instrument contours of various types of instruments pre-entered from the database, extract the second contour turning point features corresponding to each instrument according to the instrument contours, and analyze the second position information set of each second contour turning point feature. The second position information set includes the second relative position information of the corresponding second contour turning point feature and other second contour turning point features in the instrument contour where it is located. The first contour turning point feature is the feature point at the turning position in the corresponding single closed contour; the second contour turning point feature is the feature point at the turning position in the corresponding instrument contour; both the first relative position information and the second relative position information include angle information and distance information, and the angle information contains direction information.

[0025] To better illustrate the concept of the first position information set of each first contour turning point feature in this solution, the following is an example: In the single closed contour A, there are first contour turning point features a, b, and c. Then the position information set of a includes the angle, direction, and distance of b relative to a, and the angle, direction, and distance of c relative to a. The second position information set has the same logic as the first position information set and will not be elaborated here.

[0026] In some embodiments, the extraction of the first contour turning point features of each single closed contour is specifically as follows: S311. Extract a plurality of feature points on the single closed contour; S312. Calculate vectors for each pair of adjacent feature points; S313. Calculate the angle between adjacent vectors through the dot product formula of vectors; S314. If the included angle between two adjacent vectors is greater than or equal to a preset threshold, then the feature points between these two adjacent vectors are used as the feature points at the first contour turning points.

[0027] The extraction logic for extracting the feature points at the second contour turning points corresponding to each instrument according to the instrument contour is the same as that of the feature points at the first contour turning points, and will not be elaborated here.

[0028] In some embodiments, the analysis of the first position information set of each first contour turning point is specifically as follows: S321. Use the currently analyzed feature point at the first contour turning point as the first turning point, and use the first turning point and other feature points at the first contour turning points in the monomer closed contour where it is located as the second turning points; S322. Establish a coordinate system with the first turning point as the origin, and obtain the coordinate information of each second turning point; S323. Calculate the angle information and distance information of each second turning point relative to the first turning point according to the coordinate information of each second turning point, and use the angle information and distance information corresponding to the same second turning point as the first relative position information; S324. Aggregate each first relative position information to obtain the first position information set of the first turning point.

[0029] In the calculation of the angle information and distance information of each second turning point relative to the first turning point according to the coordinate information of each second turning point, the calculation of the angle and distance relative to the origin through the coordinates of a point is a prior art and will not be elaborated here.

[0030] The acquisition logic for analyzing the second position information set of each second contour turning point is the same as that of the first position information set, and will not be elaborated here.

[0031] S5. According to each first position information set and each second position information set, match similar points for each feature point at the first contour turning point from the feature points at the second contour turning points.

[0032] In some embodiments, the matching of similar points for each feature point at the first contour turning point from the feature points at the second contour turning points according to each first position information set and each second position information set is specifically as follows: S51. Calculate the angle difference value and distance difference value between each first relative position information and each second relative position information one by one. If the angle difference value is less than the preset angle difference threshold and the distance difference value is less than the preset distance difference threshold, then the corresponding first relative position information and the corresponding second relative position information are similar, and the second relative position information is used as the matching position information of the first position information set corresponding to the first relative position information; S52. In each set of first position information, analyze the set of second position information from which the matching position information originates the most, and use the feature points at the second contour turning points corresponding to this set of second position information as the similarity points of the feature points at the first contour turning points corresponding to the corresponding set of first position information.

[0033] For example, in a set of first position information, according to the foregoing analysis, there are 3 matching position information a, b, and c. If a and b are the second relative position information in the set of second position information A, then the set of second position information from which the matching position information in the set of first position information originates the most is the set of second position information A, and the feature points at the second contour turning points corresponding to the set of second position information A are used as the similarity points of the feature points at the first contour turning points corresponding to this set of first position information. S6. According to the similarity points matched by the feature points at each first contour turning point, match the corresponding instrument types for each monomer closed contour to obtain the instrument types existing in the image of the instrument to be disinfected.

[0034] In some embodiments, the step of matching the corresponding instrument types for each monomer closed contour according to the similarity points matched by the feature points at each first contour turning point to obtain the instrument types existing in the image of the instrument to be disinfected is specifically: In each monomer closed contour, analyze the instrument contour from which the similarity points originate the most, and use the instrument type corresponding to this instrument contour as the instrument type of the instrument to be disinfected corresponding to the corresponding monomer closed contour.

[0035] S7. Obtain the corresponding preset disinfection plan from the database according to the instrument types existing in the image of the instrument to be disinfected for disinfection.

[0036] The step of obtaining the corresponding preset disinfection plan from the database according to the instrument types existing in the image of the instrument to be disinfected for disinfection further includes: If the instrument to be disinfected in the image of the instrument to be disinfected is of the same instrument type, disinfect it with the preset disinfection plan corresponding to this type of instrument; if there are multiple instrument types in the image of the instrument to be disinfected, determine whether the preset disinfection plans corresponding to various instruments to be disinfected are all the same. If so, disinfect it with the corresponding preset disinfection plan. If not, classify the instruments to be disinfected according to the preset disinfection plan and send them to the user for classification before disinfection.

[0037] Embodiment 2 The present invention also provides a disinfection equipment control system based on instrument recognition provided by the present invention, specifically including: The contour analysis module is used to obtain the image of the instrument to be disinfected, extract the overall contour of the instrument to be disinfected in the image of the instrument to be disinfected, and segment the overall contour of the instrument to be disinfected to obtain a plurality of single closed contours; The first analysis module is used to extract the first contour turning point feature points from each of the single closed contours, and analyze the first position information set of each first contour turning point feature point. The first position information set includes the first relative position information of the corresponding first contour turning point feature point and other first contour turning point feature points in the single closed contour where it is located; The second analysis module is used to obtain the instrument contours of various types of instruments pre-entered from the database, extract the second contour turning point feature points corresponding to each instrument according to the instrument contours, and analyze the second position information set of each second contour turning point feature point. The second position information set includes the second relative position information of the corresponding second contour turning point feature point and other second contour turning point feature points in the instrument contour where it is located; The similarity point matching module is used to match similar points for each first contour turning point feature point from each second contour turning point feature point according to each first position information set and each second position information set; The instrument type analysis module is used to match the corresponding instrument type for each single closed contour according to the similar points matched by each first contour turning point feature point to obtain the instrument types existing in the image of the instrument to be disinfected; The disinfection control module is used to obtain the corresponding preset disinfection plan from the database according to the instrument types existing in the image of the instrument to be disinfected for disinfection.

[0038] Embodiment III The present invention also provides an electronic device, including: a processor, a sending device, an input device, an output device, and a memory. The processor can be implemented in ways such as a general-purpose CPU (Central Processing Unit, central processor), a microprocessor, an application-specific integrated circuit, or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided by the embodiments of the present application. The memory can be implemented in forms such as a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM), and is used to store computer program codes. The computer program codes include computer instructions. When the processor executes the computer instructions, the electronic device executes the method in any of the above possible implementation manners.

[0039] Embodiment IV The present invention also provides a computer-readable storage medium, in which a computer program is stored. The computer program includes program instructions, and when the program instructions are executed by a processor of an electronic device, the processor is caused to execute the method according to any one of the above possible implementation manners.

[0040] The beneficial effects of the present invention are as follows: By segmenting the overall contour of the instrument to be disinfected to obtain a plurality of monomer closed contours, for each monomer closed contour, the characteristic points at the first contour turning points are matched with the characteristic points at the second contour turning points of the instrument contours of various types preset in the database, and the instrument type is matched for each monomer closed contour according to the matching result. Finally, the preset disinfection plan is obtained according to the instrument type for disinfection, so that when the instrument is blocked, the instrument type can still be analyzed for the partially displayed geometric structure, thereby improving the adaptability of obtaining the preset disinfection plan, and thus effectively disinfecting the instrument to be disinfected; By calculating the angular difference value and the distance difference value between each first relative position information and each second relative position information one by one, the second relative position information similar to each first relative position information is obtained as the matching position information of the first position information set corresponding to the first relative position information, and the characteristic point at the second contour turning point of the second position information set corresponding to the matching position information with the most sources is used as the similar point of the characteristic point at the first contour turning point of the corresponding first position information set, improving the matching accuracy of the characteristic point at the first contour turning point of the monomer closed contour and the characteristic point at the second contour turning point of the preset instrument contour, and further improving the accuracy of instrument recognition, thereby ensuring the adaptability of the obtained preset disinfection plan; By judging the type of the instrument to be disinfected in the image of the instrument to be disinfected, it is further judged whether the preset disinfection plans corresponding to various instruments to be disinfected are all the same. When they are not the same, the instruments to be disinfected are classified and sent to the user according to the preset disinfection plan for classification and then disinfection, effectively avoiding insufficient disinfection effect or damage of the instrument due to incorrect use of other disinfection plans.

[0041] In the description of the specification, the descriptions referring to terms such as "one embodiment", "example", "specific example", etc. mean that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0042] In addition, each functional unit in various embodiments of the present application may be integrated into one processing unit, may exist physically alone for each unit, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of a software functional unit. If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it may be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, may be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods in various embodiments of the present application. The foregoing storage medium includes: various media that can store programs, such as USB flash drives, mobile hard disks, read-only memories (ROM), random access memories (RAM), magnetic disks, or optical discs.

[0043] The above are only specific embodiments of the present invention, enabling those skilled in the art to understand or implement the present invention. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to these embodiments shown herein, but rather will conform to the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A disinfection equipment control method based on equipment identification, characterized in that: The following steps are involved: Acquire an image of the device to be sterilized, and extract the overall outline of the device to be sterilized in the image of the device to be sterilized; Segmenting the overall contour of the device to be sterilized to obtain a plurality of single closed contours; Extracting a first contour turning point feature point from each of the monomer closed contours, and analyzing a first position information set of each first contour turning point feature point, wherein the first position information set includes first relative position information of the first contour turning point feature point and other first contour turning point feature points in the monomer closed contour where the first contour turning point feature point is located; Obtaining the instrument contours of various types of instruments entered in advance from the database, extracting the second contour turning point feature points corresponding to each instrument according to the instrument contours, and analyzing the second position information set of each second contour turning point feature point, wherein the second position information set includes second relative position information of the corresponding second contour turning point feature point and other second contour turning point feature points in the instrument contour where the feature point is located; Matching similar points from each second contour turning point feature point for each first contour turning point feature point according to each first position information set and each second position information set; According to the similar points matched by the feature points at the turning points of each first contour, the corresponding instrument type is matched for each monomer closed contour to obtain the instrument type existing in the image of the instrument to be sterilized; According to the type of equipment present in the image of the equipment to be sterilized, a corresponding preset disinfection scheme is obtained from the database for disinfection.

2. The disinfection equipment control method based on equipment identification according to claim 1, characterized in that: The step of extracting the overall contour of the device to be sterilized in the image of the device to be sterilized is specifically as follows: Perform image preprocessing on the image of the instrument to be sterilized; Extracting the edge in the image of the instrument to be sterilized by an edge detection algorithm to obtain an edge image; All closed contours are extracted through the image contour function of OpenCV to obtain the overall contour of the instrument to be sterilized.

3. The disinfection equipment control method based on equipment identification according to claim 1, characterized in that: The step of extracting the first contour turning point feature point from each of the monomer closed contours is specifically as follows: Extract multiple feature points on the closed contour of a monomer; Calculate the vector for each pair of adjacent feature points; Calculate the angle between adjacent vectors using the dot product formula of the vectors; If the angle between two adjacent vectors is greater than or equal to a preset threshold, the feature point between the two adjacent vectors is used as the first contour turning point feature point.

4. The disinfection equipment control method based on equipment identification according to claim 1, characterized in that: The analysis of the first position information set of the feature points at the turning points of the first contours is specifically as follows: The feature point at the turning point of the first contour to be analyzed is taken as the first turning point, and the first turning point and other feature points at the turning points of the first contour in the monomer closed contour where the first turning point and the first turning point are taken as the second turning point; Establish a coordinate system with the first turning point as the origin, and obtain coordinate information of each second turning point; Calculate the angle information and distance information of each second turning point relative to the first turning point according to the coordinate information of each second turning point, and use the angle information and distance information corresponding to the same second turning point as the first relative position information; The first relative position information is aggregated to obtain a first position information set of the first turning point.

5. The disinfection equipment control method based on equipment identification according to claim 1, characterized in that: The matching of similar points from the feature points at the turning points of the second contours for the feature points at the turning points of the first contours according to the first position information sets and the second position information sets is specifically as follows: Calculate the angle difference value and the distance difference value between each first relative position information and each second relative position information one by one, if the angle difference value is less than a preset angle difference threshold and the distance difference value is less than a preset distance difference threshold, then the corresponding first relative position information is similar to the corresponding second relative position information, and use the second relative position information as the matching position information of the first position information set corresponding to the first relative position information; In each first position information set, the second position information set from which the matching position information comes the most is analyzed, and the second contour turning point feature point corresponding to the second position information set is used as the similarity point of the first contour turning point feature point corresponding to the first position information set.

6. The disinfection equipment control method based on equipment identification according to claim 1, characterized in that: The method of matching the corresponding instrument type for each monomer closed contour according to the similar points matched by the feature points at the turning points of each first contour to obtain the instrument type existing in the image of the instrument to be sterilized is specifically as follows: In each monomer closed contour, the instrument contour from which the most similar points are derived is analyzed, and the instrument type corresponding to the instrument contour is used as the instrument type of the to-be-sterilized instrument corresponding to the corresponding monomer closed contour.

7. The disinfection equipment control method based on equipment identification according to claim 1, characterized in that: The method of obtaining a corresponding preset disinfection scheme from a database according to the type of equipment present in the image of the equipment to be disinfected for disinfection also includes: If the instruments to be sterilized in the image of the instruments to be sterilized are of the same type, they are disinfected according to the preset disinfection scheme corresponding to the instruments; if there are multiple types of instruments in the image of the instruments to be sterilized, it is determined whether the preset disinfection schemes corresponding to the various instruments to be sterilized are all the same. If so, they are disinfected according to the corresponding preset disinfection schemes. If not, the instruments to be sterilized are classified according to the preset disinfection schemes and sent to the user for classification before disinfection.

8. A disinfection equipment control system based on device identification, using the disinfection equipment control method based on device identification as described in any one of claims 1 to 7, characterized in that: include: A contour analysis module, used to obtain an image of the device to be sterilized, extract the overall contour of the device to be sterilized in the image of the device to be sterilized, and segment the overall contour of the device to be sterilized to obtain a plurality of monomer closed contours; A first analysis module is used to extract the first contour turning point feature points for each of the monomer closed contours, and analyze the first position information set of each first contour turning point feature point, wherein the first position information set includes first relative position information of the first contour turning point feature point and other first contour turning point feature points in the monomer closed contour where the first contour turning point feature point is located; A second analysis module is used to obtain the instrument contours of various types of instruments entered in advance from the database, extract the second contour turning point feature points corresponding to each instrument according to the instrument contours, and analyze the second position information set of each second contour turning point feature point, wherein the second position information set includes second relative position information of the corresponding second contour turning point feature point and other second contour turning point feature points in the instrument contour where the feature point is located; A similar point matching module, for matching similar points from each second contour turning point feature point for each first contour turning point feature point according to each first position information set and each second position information set; An instrument type analysis module, used to match the corresponding instrument type for each monomer closed contour according to the similar points matched by the feature points at the turning points of each first contour to obtain the instrument type existing in the image of the instrument to be sterilized; The disinfection control module is used to obtain the corresponding preset disinfection scheme from the database according to the type of equipment present in the image of the equipment to be disinfected, and then perform disinfection.

9. The disinfection equipment control system based on equipment identification according to claim 8, characterized in that: The analysis of the first position information set of the feature points at the turning points of the first contours is specifically as follows: The feature point at the turning point of the first contour to be analyzed is taken as the first turning point, and the first turning point and other feature points at the turning points of the first contour in the monomer closed contour where the first turning point and the first turning point are taken as the second turning point; Establish a coordinate system with the first turning point as the origin, and obtain coordinate information of each second turning point; Calculate the angle information and distance information of each second turning point relative to the first turning point according to the coordinate information of each second turning point, and use the angle information and distance information corresponding to the same second turning point as the first relative position information; The first relative position information is aggregated to obtain a first position information set of the first turning point.

10. The disinfection equipment control system based on equipment identification according to claim 8, characterized in that: The method of matching the corresponding instrument type for each monomer closed contour according to the similar points matched by the feature points at the turning points of each first contour to obtain the instrument type existing in the image of the instrument to be sterilized is specifically as follows: In each monomer closed contour, the instrument contour from which the most similar points are derived is analyzed, and the instrument type corresponding to the instrument contour is used as the instrument type of the to-be-sterilized instrument corresponding to the corresponding monomer closed contour.