Efficient and intelligent capacitor key test system

Abstract

The invention relates to the field of capacitor key testing, in particular to an efficient and intelligent capacitor key testing system. An efficient and intelligent capacitor key test system comprises a batch division module, a first sampling test module, a second sampling test module and a test result discrimination module. According to the method, the test strategy of the current batch is dynamically adjusted by analyzing the test data of the recent batches of capacitor keys; according to the method based on data driving, the sampling inspection proportion and the test key point can be adaptively adjusted according to the historical performance of the batches, and it is ensured that the capacitive keys of each batch can be detected in a targeted mode; compared with a traditional fixed sampling inspection method, the method has the advantages that potential quality problems can be identified more accurately, quality missing inspection caused by an unreasonable sampling inspection strategy is avoided, and the quality control precision and reliability of the capacitor keys are remarkably improved.

Description

Technical Field

[0001] The present invention relates to the field of capacitive button testing, and particularly to an efficient and intelligent capacitive button testing system. Background Art

[0002] In modern electronic devices, capacitive buttons are widely used in smartphones, tablets, household appliances, and other consumer electronic products due to their advantages such as fast response speed, high sensitivity, and long service life. However, with the widespread application of capacitive buttons, quality problems that occur during the production process have gradually emerged. For example, during the production process of capacitive buttons, due to the similarity of processing techniques, buttons in the same batch often have similar characteristics. To a certain extent, this characteristic leads to the regular occurrence of functional disorders, and the existing testing processes cannot fully utilize this feature. At the same time, the quality inspection of capacitive buttons usually adopts traditional sampling inspection methods, that is, a certain number of samples are randomly selected from the production batch for testing. Although this method can reflect the overall quality of the product to a certain extent, it has obvious limitations. The traditional sampling inspection method cannot dynamically adjust the sampling inspection strategy according to the historical data of the batch, resulting in a fixed sampling ratio and being unable to conduct targeted inspections for potential problems in different batches. On the other hand, most of the existing capacitive button testing systems rely on manual operation and fixed programs, lacking intelligence and adaptability. When facing capacitive buttons of different batches and different processing techniques, they cannot automatically adjust the testing strategy and parameters, making it difficult to accurately evaluate the actual performance of the product.

[0003] In view of the problems existing in the prior art, the present invention proposes an efficient and intelligent capacitive button testing system. Through intelligent testing strategies and data analysis methods, this system makes full use of the regularity of functional disorders of capacitive buttons in the prior art and solves the limitations of the sampling inspection method, significantly improving the quality control level and testing efficiency of capacitive buttons. Summary of the Invention

[0004] The present invention dynamically adjusts the testing strategy of the current batch by analyzing the testing data of capacitive buttons in recent several batches. This data-driven method can adaptively adjust the sampling ratio and testing focus according to the historical performance of the batch, ensuring that capacitive buttons in each batch can be subjected to targeted inspections. Compared with the traditional fixed sampling inspection method, the present invention can more accurately identify potential quality problems, avoid quality omissions caused by unreasonable sampling inspection strategies, and significantly improve the quality control accuracy and reliability of capacitive buttons.

[0005] An efficient and intelligent capacitive button testing system includes:

[0006] The batch division module is used to divide the capacitive buttons into several batches according to the test sequence when testing the capacitive buttons, and set the number of capacitive buttons in one batch to N;

[0007] The first sampling test module includes a historical test result analysis unit and a first sampling test unit; the historical test result analysis unit is used to analyze the test results of the capacitive buttons in the most recent batches of capacitive buttons before testing the capacitive buttons in the current batch, obtain the long-term quality fluctuation value and the short-term quality fluctuation value, and calculate and obtain a value based on the long-term quality fluctuation value and the short-term quality fluctuation value ; the first sampling test unit is used to randomly select capacitive buttons for the current batch of capacitive buttons, and conduct a comprehensive test on any one of the capacitive buttons to obtain the compliance status of the basic functions, anti-interference functions, waterproof functions, and temperature adaptation functions of the current capacitive button; then, based on the compliance status of each function of the capacitive buttons, calculate and obtain the compliance rates of the basic functions, anti-interference functions, waterproof functions, and temperature adaptation functions of the current batch of capacitive buttons;

[0008] The second sampling test module includes a sampling ratio adjustment unit and a second sampling test unit; the sampling ratio adjustment unit is used to adjust the sampling ratio of each function of the current batch according to the comprehensive compliance rate of each function of the capacitive buttons in the most recent batch and the compliance rate of each function of the capacitive buttons in the current batch; the second sampling test unit is used to conduct a sampling test on the other N - capacitive buttons in the current batch by applying the calculated sampling ratio of each function of the current batch to obtain the compliance rate of each function of the other N - capacitive buttons in the current batch;

[0009] The test result discrimination module is used to calculate the average value of the two compliance rates corresponding to each function according to the compliance rates of each function of the capacitive buttons in the current batch obtained and the compliance rates of each function of the other N - capacitive buttons, respectively obtain the comprehensive compliance rate of each function of the capacitive buttons in the current batch, and judge whether the comprehensive compliance rate of each function meets the corresponding compliance rate threshold. If so, it is judged that the capacitive buttons in the current batch are qualified; if not, it is judged that the capacitive buttons in the current batch are unqualified.

[0010] Preferably, in the first sampling test module, the specific operation for conducting a comprehensive test on the capacitive buttons is as follows:

[0011] The basic function tests of the capacitive button are carried out under a variety of preset test scenarios respectively. The test scenarios include a normal environment, an electromagnetic interference environment, a high humidity environment and an extreme temperature environment. The basic function tests include capacitance value measurement, response time test and sensitivity test. For any one test scenario, it is judged whether the capacitance value measurement, response time test and sensitivity test carried out by the capacitive button in the current test scenario all meet the standard conditions. If so, it is judged that the function corresponding to the capacitive button in the current test scenario meets the standard; if not, it is judged that the function corresponding to the capacitive button in the current test scenario does not meet the standard. Among them, the normal environment corresponds to the basic function, the electromagnetic interference environment corresponds to the anti-interference function, the high humidity environment corresponds to the waterproof function, and the extreme temperature environment corresponds to the temperature adaptation function.

[0012] Preferably, in the first sampling test module, the test results of the capacitive buttons in the most recent batches are analyzed to obtain the long-term quality fluctuation value and the short-term quality fluctuation value. The specific operations are as follows:

[0013] Based on the comprehensive pass rates of each function of the capacitive buttons in the most recent batches , = 1, 2, …, ; = 1, 2, 3, 4; to successively represent the comprehensive pass rates of the basic function, anti-interference function, waterproof function and temperature adaptation function of the capacitive buttons in the most recent batches;

[0014] Respectively use the formula to calculate and obtain the average comprehensive pass rates of each function of the capacitive buttons in the most recent batches; Subsequently, respectively use the formula to calculate and obtain the standard deviations of the comprehensive pass rates of each function of the capacitive buttons in the most recent batches;

[0015] At the same time, based on the comprehensive pass rates of each function of the capacitive buttons in the most recent batches, respectively use the formula to calculate the average comprehensive pass rates of each function of the last batches of capacitive buttons; Subsequently, respectively use the formula to calculate and obtain the standard deviations of the comprehensive pass rates of each function of the last batches of capacitive buttons;

[0016] Use the formula Calculate and obtain the long-term quality fluctuation values of the most recent batches , and use the formula to calculate and obtain the short-term quality fluctuation values of the most recent batches .

[0017] Preferably, in the first sampling test module, calculate and obtain a value based on the long-term quality fluctuation value and the short-term quality fluctuation value. The specific operations are as follows:

[0018] Set the reference sampling value to , and use the formula to calculate and obtain a value .

[0019] Preferably, in the second sampling test module, adjust the sampling inspection ratios of the various functions of the current batch respectively. The specific operations are as follows:

[0020] Based on the comprehensive passing rate of the various functions of the capacitor keys in the most recent batch , set the basic sampling inspection ratio to ; for any function, if the comprehensive passing rate of the current function is between and , then take the first reference sampling inspection ratio of the current function; if the comprehensive passing rate of the current function is greater than or equal to , then use the formula to calculate and obtain the first reference sampling inspection ratio of the current function; if the comprehensive passing rate of the current function is less than or equal to , then use the formula to calculate and obtain the first reference sampling inspection ratio of the current function;

[0021] For the passing rates of the various functions of the capacitor keys in the current batch , for any function, if the passing rate of the current function is between and , then take the second reference sampling inspection ratio of the current function; if the passing rate of the current function is greater than or equal to , then use the formula to calculate and obtain the second reference sampling inspection ratio of the current function; if the passing rate of the current function is less than or equal to , then use the formula to calculate and obtain the second reference sampling ratio of the current function ; finally, use the formula to calculate and obtain the sampling ratio of the current function .

[0022] Preferably, in the second sampling test module, for the other N - capacitive buttons in the current batch, the specific operation of sampling test is as follows by applying the sampling ratios of each function of the current batch obtained by calculation:

[0023] Based on the obtained sampling ratio of the basic function , anti - interference function , waterproof function and temperature adaptation function , select the maximum sampling ratio among them and denote it as , then select capacitive buttons from the other N - capacitive buttons in the current batch, and randomly conduct basic function tests on the selected capacitive buttons according to the sampling quantity of each function in the corresponding scenarios.

[0024] Preferably, in the batch division module and the first sampling test module, the value of N and are obtained through the simulated annealing algorithm.

[0025] Preferably, in the batch division module and the first sampling test module, the value of N and are obtained by using the simulated annealing algorithm, which specifically includes the following steps:

[0026] Step 1: Combine the value of N and into a numerical combination, randomly select an initial numerical combination as the current solution, and set the initial temperature, the maximum number of iterations, and the temperature decay coefficient; use the fitness function to calculate the fitness value of the current solution, where represents the test efficiency of applying the current solution to conduct capacitive button tests; represents the deviation of the test results of applying the current solution to conduct capacitive button tests; the goal of this fitness function is to maximize the test efficiency, minimize the value, and minimize the test result deviation;

[0027] Step 2: Add or subtract a random value to the current solution to generate a neighborhood solution; use the objective function to calculate the fitness value of the neighborhood solution and compare it with the fitness value of the current solution; if the fitness value of the current solution is less than the fitness value of the neighborhood solution, update the current solution to the selected neighborhood solution; if the fitness value of the current solution is greater than the fitness value of the neighborhood solution, update the neighborhood solution according to the probability Decide whether to accept the neighborhood solution as the current solution; where represents the fitness value of the neighborhood solution, represents the fitness value of the current solution, Indicates the current temperature; using the formula Update the temperature and get the temperature for the next iteration ,in is the temperature attenuation coefficient;

[0028] Step 3: Repeat step 2 until the maximum number of iterations is reached, and the current solution finally obtained is the optimal numerical combination.

[0029] The present invention has the following advantages:

[0030] 1. The present invention dynamically adjusts the test strategy of the current batch by analyzing the test data of several recent batches of capacitive buttons. This data-driven method can adaptively adjust the sampling ratio and test focus according to the historical performance of the batch, ensuring that each batch of capacitive buttons can be targeted. Compared with the traditional fixed sampling method, the present invention can more accurately identify potential quality problems, avoid quality omissions caused by unreasonable sampling strategies, and significantly improve the quality control accuracy and reliability of capacitive buttons.

[0031] 2. The present invention introduces an intelligent algorithm to optimize the key parameters in the sampling strategy; through the intelligent algorithm, the system can select the best test parameters to ensure that the test efficiency is maximized while minimizing the deviation of the test results; in addition, the system also has a real-time data analysis function, which can dynamically adjust the test strategy of subsequent batches according to the test results of the current batch; this intelligent testing method not only improves the test efficiency, but also ensures the accuracy of the test results through comprehensive functional testing, providing an efficient and reliable solution for the production of capacitive buttons. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 This is a schematic diagram of the structure of an efficient and intelligent capacitive button testing system used in an embodiment of the present invention. DETAILED DESCRIPTION

[0033] In order to enable persons skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention.

[0034] An efficient and intelligent capacitive button testing system, as Figure 1 shown, includes:

[0035] A batch division module, which is used to divide capacitive buttons into several batches according to the test sequence when testing capacitive buttons, and set the number of capacitive buttons in one batch to N; Processing capacitive buttons in batches can effectively manage the test process, avoid the complexity and inefficiency brought by processing a large number of buttons at one time. Batch processing makes the number of buttons in each batch relatively fixed, facilitating unified quality control and data analysis for each batch; This batch processing method can ensure the consistency and comparability of test results, facilitating the discovery of quality differences and potential problems between batches; On the other hand, the batch division module can dynamically adjust the test strategy according to the historical data of batches; For example, if the test results of a certain batch show more quality problems, the system can automatically adjust the test focus of subsequent batches, increase the sampling ratio or adjust the test items; At the same time, the batch division module optimizes the value of the batch number N through the simulated annealing algorithm;

[0036] The first sampling test module, including a historical test result analysis unit and a first sampling test unit; The historical test result analysis unit is used to analyze the test results of the capacitive buttons in the most recent batches before testing the capacitive buttons in the current batch. These results include the pass rates of the basic functions, anti-interference functions, waterproof functions, and temperature adaptation functions of each batch, obtain the long-term quality fluctuation value and the short-term quality fluctuation value, and calculate and obtain the value based on the long-term and short-term quality fluctuation values, and dynamically calculate the sampling quantity of the current batch ; If the quality fluctuation is large, the system will increase the value to more comprehensively evaluate the quality of the current batch; If the quality fluctuation is small, the can be appropriately reduced to improve the test efficiency; The first sampling test unit is the execution part of the first sampling test module. The first sampling test unit is used to randomly select capacitive buttons for the capacitive buttons in the current batch. Random sampling ensures the representativeness of the sample and avoids the influence of human factors on the test results. Conduct a comprehensive test on any one of the capacitive buttons to obtain the pass situation of the basic functions, anti-interference functions, waterproof functions, and temperature adaptation functions of the current capacitive button; Subsequently, based on the pass situation of each function of the capacitive buttons, calculate and obtain the current batch The passing rates of the basic functions, anti-interference functions, waterproof functions, and temperature adaptation functions of the capacitive buttons; the historical test result analysis unit and the first sampling test unit cooperate with each other in the capacitive button test system to jointly achieve efficient evaluation and dynamic optimization of the quality of capacitive buttons; the historical test result analysis unit dynamically adjusts the sampling strategy through the analysis of historical data to provide scientific guidance for the first sampling test unit; the first sampling test unit obtains the key quality indicators of the current batch through random sampling and comprehensive testing to provide data support for the subsequent test process; this modular design not only improves the test efficiency but also ensures the accuracy and reliability of quality control;

[0037] The second sampling test module, including a sampling ratio adjustment unit and a second sampling test unit; the sampling ratio adjustment unit is used to adjust the sampling ratios of each function of the current batch according to the comprehensive passing rate of each function of the capacitive buttons in the most recent batch and the passing rates of each function of the current batch of capacitive buttons. The role of this unit is to optimize the allocation of test resources and ensure the pertinence and efficiency of the test; the second sampling test unit is the execution part of the second sampling test module. The second sampling test unit is used to perform sampling tests on the other N - capacitive buttons in the current batch by applying the sampling ratios of each function of the current batch obtained through calculation, and obtain the passing rates of each function of the other N - capacitive buttons in the current batch; the sampling ratio adjustment unit and the second sampling test unit cooperate with each other in the capacitive button test system to jointly achieve efficient evaluation and dynamic optimization of the quality of capacitive buttons; the sampling ratio adjustment unit dynamically adjusts the sampling ratio through the analysis of historical data and current batch data to ensure the reasonable allocation of test resources; the second sampling test unit then performs sampling tests on the remaining capacitive buttons according to the adjusted sampling ratio to further verify the overall quality level of the current batch;

[0038] The test result discrimination module is used to, according to the obtained passing rates of each function of the current batch of capacitive buttons and the other N - For the pass rates of each function of the capacitive buttons, for any one function, calculate the average of the two pass rates corresponding to this function, and respectively obtain the comprehensive pass rate of each function of the capacitive buttons in the current batch. Determine whether the comprehensive pass rates of each function all meet the corresponding pass rate thresholds. If so, determine that the capacitive buttons in the current batch are qualified; if not, determine that the capacitive buttons in the current batch are unqualified. This module calculates the comprehensive pass rate of each function by analyzing the test results of the first sampling test unit and the second sampling test unit, and determines whether these pass rates meet the preset thresholds, so as to determine the overall quality status of the capacitive buttons in the current batch. Through this scientific determination method, the test result discrimination module provides a strong guarantee for the high-quality production of capacitive buttons;

[0039] This system dynamically analyzes the quality fluctuation law in the production process and makes full use of the historical data between batches to optimize the test strategy. The system first divides the capacitive buttons by batch and calculates the long-term and short-term quality fluctuation values based on the test results of several recent batches. Based on these fluctuation values, the system dynamically adjusts the sampling ratio and test focus of the current batch to ensure that the test resources are accurately allocated to the key functions. By comprehensively testing some samples and combining with sampling tests for the remaining buttons, the system can quickly and accurately evaluate the overall quality level of each batch. Finally, based on the threshold judgment of the comprehensive pass rate, the system determines whether the batch is qualified, thus effectively identifying potential quality problems, improving production efficiency, reducing the defective rate, and significantly enhancing the reliability and user experience of the capacitive buttons.

[0040] In the first sampling test module, a comprehensive test is carried out on the capacitive buttons. The specific operations are as follows:

[0041] The basic function tests of the capacitive buttons are carried out respectively under a variety of preset test scenarios. The test scenarios include normal environment, electromagnetic interference environment, high humidity environment, and extreme temperature environment. The basic function tests include capacitance value measurement, response time test, and sensitivity test. For any one test scenario, determine whether the capacitance value measurement, response time test, and sensitivity test carried out by the capacitive button in the current test scenario all meet the standard conditions. If so, determine that the function corresponding to the capacitive button in the current test scenario is qualified; if not, determine that the function corresponding to the capacitive button in the current test scenario is unqualified. Among them, the normal environment corresponds to the basic function, the electromagnetic interference environment corresponds to the anti-interference function, the high humidity environment corresponds to the waterproof function, and the extreme temperature environment corresponds to the temperature adaptation function.

[0042] In the first sampling test module, for the most recent test results of the capacitive buttons in several batches, analyze them to obtain the long-term quality fluctuation value and the short-term quality fluctuation value. The specific operations are as follows:

[0043] Based on the most recent The comprehensive passing rate of each function of the capacitor keys in each batch , = 1, 2, …, ; = 1, 2, 3, 4; to successively represent the comprehensive passing rates of the basic function, anti-interference function, waterproof function, and temperature adaptation function of the capacitor keys in the most recent batches;

[0044] respectively use the formula to calculate and obtain the average comprehensive passing rate of each function of the capacitor keys in the most recent batches ; Subsequently, respectively use the formula to calculate and obtain the standard deviation of the comprehensive passing rate of each function of the capacitor keys in the most recent batches ;

[0045] At the same time, based on the comprehensive passing rates of each function of the capacitor keys in the most recent batches , respectively use the formula to calculate the average comprehensive passing rate of each function of the capacitor keys in the last batches ; Subsequently, respectively use the formula to calculate and obtain the standard deviation of the comprehensive passing rate of each function of the capacitor keys in the last batches ;

[0046] Use the formula to calculate and obtain the long-term quality fluctuation value of the most recent batches , use the formula to calculate and obtain the short-term quality fluctuation value of the most recent batches .

[0047] In the first sampling test module, calculate and obtain the value based on the long-term quality fluctuation value and the short-term quality fluctuation value. The specific operation is as follows:

[0048] Set the reference sampling value to , and use the formula to calculate and obtain the value .

[0049] In the second sampling test module, adjust the sampling ratio of each function of the current batch respectively. The specific operation is as follows:

[0050] Based on the comprehensive passing rate of each function of the capacitor keys in the most recent batch , set the basic sampling ratio to ; for any function, if the comprehensive pass rate of the current function is located to , then take the first reference sampling ratio of the current function; if the comprehensive pass rate of the current function is greater than or equal to , then use the formula to calculate and obtain the first reference sampling ratio of the current function; if the comprehensive pass rate of the current function is less than or equal to , then use the formula to calculate and obtain the first reference sampling ratio of the current function;

[0051] For the pass rates of each function of the current batch of capacitive buttons, for any function, if the pass rate of the current function is located to , then take the second reference sampling ratio of the current function; if the pass rate of the current function is greater than or equal to , then use the formula to calculate and obtain the second reference sampling ratio of the current function; if the pass rate of the current function is less than or equal to , then use the formula to calculate and obtain the second reference sampling ratio of the current function; finally, use the formula to calculate and obtain the sampling ratio of the current function.

[0052] In the second sampling test module, for the other N - capacitive buttons in the current batch, the specific operation of sampling test by applying the calculated sampling ratios of each function of the current batch is as follows:

[0053] Based on the obtained sampling ratio of the basic function , anti - interference function , waterproof function and temperature adaptation function , select the maximum sampling ratio among them and denote it as , then select from the other N - capacitive buttons in the current batch, and according to the sampling quantity of each function Randomly conduct basic function tests on the selected capacitive buttons in the corresponding scenarios.

[0054] In the batch division module and the first sampling test module, the values of N and are obtained through the simulated annealing algorithm.

[0055] In the batch division module and the first sampling test module, the values of N and are obtained by using the simulated annealing algorithm, and the specific steps are as follows:

[0056] Step 1: Combine the values of N and into a numerical combination, randomly select an initial numerical combination as the current solution, and set the initial temperature, the maximum number of iterations, and the temperature decay coefficient; use the fitness function to calculate the fitness value of the current solution , where represents the test efficiency of applying the current solution to conduct capacitive button tests; represents the deviation of the test results of applying the current solution to conduct capacitive button tests; the goal of this fitness function is to maximize the test efficiency, minimize the value of and minimize the deviation of the test results;

[0057] Step 2: Add or subtract a random value to the current solution to generate a neighborhood solution; use the objective function to calculate the fitness value of the neighborhood solution and compare it with the fitness value of the current solution; if the fitness value of the current solution is less than the fitness value of the neighborhood solution, update the current solution to the selected generated neighborhood solution; if the fitness value of the current solution is greater than the fitness value of the neighborhood solution, decide whether to accept the neighborhood solution as the current solution according to the probability ; where represents the fitness value of the neighborhood solution, represents the fitness value of the current solution, represents the current temperature; use the formula to update the temperature and obtain the temperature for the next iteration, where is the temperature decay coefficient;

[0058] Step 3: Repeat Step 2 until the maximum number of iterations is reached, and the finally obtained current solution is the optimal numerical combination.

[0059] It should be understood that those of ordinary skill in the art can make improvements or transformations according to the above description, and all such improvements and transformations should fall within the protection scope of the appended claims of the present invention. The parts not described in detail in this specification belong to the well-known prior art of those skilled in the art.

Claims

1. An efficient and intelligent capacitive button testing system, characterized in that: include: The batch division module is used to divide the capacitive buttons into several batches according to the test sequence when testing the capacitive buttons, and set the number of capacitive buttons in one batch to N; The first sampling test module includes a historical test result analysis unit and a first sampling test unit; the historical test result analysis unit is used to analyze the most recent The test results of batches of capacitive buttons are analyzed to obtain long-term quality fluctuation values ​​and short-term quality fluctuation values, and the values ​​are calculated based on the long-term quality fluctuation values ​​and short-term quality fluctuation values. ; The first sampling test unit is used to randomly select the capacitive buttons of the current batch. Capacitive buttons, A comprehensive test is performed on any capacitive button among the capacitive buttons to obtain the compliance status of the basic function, anti-interference function, waterproof function and temperature adaptability function of the current capacitive button; then based on The compliance status of each function of the capacitive buttons is calculated to obtain the current batch The compliance rate of basic functions, anti-interference function, waterproof function and temperature adaptability function of each capacitive button; The second sampling test module includes a sampling ratio adjustment unit and a second sampling test unit; The sampling ratio adjustment unit is used to adjust the sampling ratio of each function of the capacitive buttons in the latest batch according to the comprehensive compliance rate of each function of the current batch. The compliance rate of each function of the capacitive buttons is adjusted to adjust the sampling ratio of each function of the current batch; the second sampling test unit is used to adjust the sampling ratio of each function of the current batch for the other N- Capacitive buttons, apply the calculated sampling ratio of each function in the current batch, perform sampling tests, and obtain the other N- The compliance rate of each function of each capacitive button; The test result identification module is used to obtain the current batch The compliance rate of each function of the capacitive buttons and other N- The compliance rate of each function of each capacitive button is calculated. For any function, the average of the two compliance rates corresponding to the function is calculated, and the comprehensive compliance rate of each function of the current batch of capacitive buttons is obtained respectively, and it is determined whether the comprehensive compliance rate of each function meets the corresponding compliance rate threshold. If so, the current batch of capacitive buttons is determined to be qualified; if not, the current batch of capacitive buttons is determined to be unqualified.

2. The efficient and intelligent capacitive button testing system according to claim 1, characterized in that: In the first sampling test module, the capacitive buttons are fully tested. The specific operations are as follows: The basic function test of the capacitive button is performed in a variety of pre-set test scenarios, including a normal environment, an electromagnetic interference environment, a high humidity environment and an extreme temperature environment. The basic function test includes capacitance value measurement, response time test and sensitivity test. For any test scenario, it is determined whether the capacitance value measurement, response time test and sensitivity test of the capacitive button in the current test scenario all meet the standard conditions. If so, it is determined that the corresponding function of the capacitive button in the current test scenario meets the standard. If not, it is determined that the corresponding function of the capacitive button in the current test scenario does not meet the standard. Among them, the normal environment corresponds to the basic function, the electromagnetic interference environment corresponds to the anti-interference function, the high humidity environment corresponds to the waterproof function, and the extreme temperature environment corresponds to the temperature adaptation function.

3. The efficient and intelligent capacitive button testing system according to claim 2, characterized in that: In the first sampling test module, the most recent The test results of batches of capacitive buttons are analyzed to obtain long-term quality fluctuation values ​​and short-term quality fluctuation values. The specific operations are as follows: Based on recent The comprehensive compliance rate of each function of the capacitive buttons in each batch , =1, 2, …, ; =1, 2, 3, 4; to In order, it means the most recent The comprehensive compliance rate of basic functions, anti-interference function, waterproof function and temperature adaptability function of each batch of capacitive buttons; Use the formulas Calculate the nearest The average comprehensive compliance rate of each function of the capacitive buttons in each batch ; Then use the formula Calculate the nearest The standard deviation of the comprehensive compliance rate of each function of the capacitive buttons in a batch ; Based on the recent The comprehensive compliance rate of each function of the capacitive buttons in each batch , respectively using the formula After calculating The average comprehensive compliance rate of each function of the capacitive buttons in each batch ; Then use the formula After calculating the acquisition The standard deviation of the comprehensive compliance rate of each function of the capacitive buttons in a batch ; Using the formula Calculate the nearest Long-term quality fluctuation value of batches , using the formula Calculate the nearest Short-term quality fluctuation value of batches .

4. The efficient and intelligent capacitive button testing system according to claim 3, characterized in that: In the first sampling test module, the value is calculated based on the long-term quality fluctuation value and the short-term quality fluctuation value. , the specific operations are as follows: Set the base sampling value to , using the formula Calculate and obtain values .

5. The efficient and intelligent capacitive button testing system according to claim 4, characterized in that: In the second sampling test module, the sampling ratio of each function of the current batch is adjusted respectively. The specific operations are as follows: Based on the comprehensive compliance rate of each function of the latest batch of capacitive buttons , set the basic sampling ratio to ; For any function, if the comprehensive compliance rate of the current function lie in to If the first reference sampling ratio of the current function is between ; If the comprehensive compliance rate of the current function Greater than or equal to , then use the formula Calculate the first reference sampling ratio for the current function ; If the comprehensive compliance rate of the current function Less than or equal to , then use the formula Calculate the first reference sampling ratio for the current function ; For the current batch The compliance rate of each function of the capacitive buttons For any function, if the current function's compliance rate lie in to If the ratio is between , the second reference sampling ratio of the current function is taken ; If the current function's compliance rate Greater than or equal to , then use the formula Calculate the second reference sampling ratio for the current function ; If the current function's compliance rate Less than or equal to , then use the formula Calculate the second reference sampling ratio for the current function ; Finally, use the formula Calculate the sampling ratio of the current function .

6. The efficient and intelligent capacitive button testing system according to claim 5, characterized in that: In the second sampling test module, for the other N- The specific operation of sampling test for each function of the current batch of capacitive buttons is as follows: The sampling ratio based on the basic functions obtained , Anti-interference function , waterproof function and temperature adaptation function , select the maximum sampling ratio and record it as , followed by other N- Select from the capacitive buttons Capacitive buttons, and sample the number of each function Perform basic function tests on selected capacitive buttons randomly in corresponding scenarios.

7. The efficient and intelligent capacitive button testing system according to claim 6, characterized in that: In the batch partitioning module and the first sampling test module, the value of N and The value of is obtained through simulated annealing algorithm.

8. The efficient and intelligent capacitive button testing system according to claim 7, characterized in that: In the batch partitioning module and the first sampling test module, the simulated annealing algorithm is used to obtain the value of N and The specific steps include: Step 1: Add the value of N and The values ​​of form a numerical combination, randomly select an initial numerical combination as the current solution, set the initial temperature, maximum number of iterations and temperature attenuation coefficient; use the fitness function Calculate the fitness value of the current solution ,in, Indicates the test efficiency of capacitive button test using the current solution; Indicates the test result deviation of capacitive button test using the current solution; the goal of this fitness function is to maximize the test efficiency and minimize and minimizing the bias in test results; Step 2: Add or subtract a random value to the current solution to generate a neighborhood solution; use the objective function to calculate the fitness value of the neighborhood solution and compare it with the fitness value of the current solution; if the fitness value of the current solution is less than the fitness value of the neighborhood solution, update the current solution to the selected neighborhood solution; if the fitness value of the current solution is greater than the fitness value of the neighborhood solution, update the neighborhood solution according to the probability Decide whether to accept the neighborhood solution as the current solution; where represents the fitness value of the neighborhood solution, represents the fitness value of the current solution, Indicates the current temperature; using the formula Update the temperature and get the temperature for the next iteration ,in is the temperature attenuation coefficient; Step 3: Repeat step 2 until the maximum number of iterations is reached, and the current solution finally obtained is the optimal numerical combination.

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