Chip sampling method, chip and battery system

Abstract

This invention discloses a chip sampling method, a chip, and a battery system. The chip sampling method includes: acquiring programming data, which includes an identification signal at the beginning of the transmission direction and a programming signal at the end of the transmission direction; sampling the identification signal according to the frequency of the chip's own sampling signal; determining an identification threshold based on the identification signal; and determining the content of the programming signal using the identification threshold. The technical solution of this application can effectively reduce discrepancies in data parsing and improve the accuracy of decoded data content.

Description

Technical Field

[0001] This invention relates to the field of chip technology, and more specifically to a chip sampling method, a chip, and a battery system. Background Technology

[0002] When programming data into the protection chip, the system's 200kHz clock is normally used to count the programming communications in order to parse the content sent by the host.

[0003] However, due to differences in manufacturing processes, the system clock frequency of each chip will vary. Generally, the clock frequency of a chip is approximately 130KHz-315.2KHz. When the data is decoded using the chip's own clock frequency, differences will occur, leading to errors in the decoded data. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a chip sampling method that can effectively reduce discrepancies in data parsing and improve the accuracy of decoded data content.

[0005] This application provides a chip sampling method, the chip sampling method comprising:

[0006] Acquire programming data, which includes an identification signal at the beginning of the transmission direction and a programming signal at the end of the transmission direction;

[0007] The identification signal is sampled according to the frequency of the chip's own sampling signal, and an identification threshold is determined based on the identification signal;

[0008] The content of the burned signal is determined using the identification threshold.

[0009] In one aspect, the step of sampling the identification signal according to the frequency of the chip's own sampling signal and determining the identification threshold based on the identification signal includes:

[0010] The identification signal is sampled at the rising edge of the clock of the sampling signal to obtain the number of samplings;

[0011] The identification threshold is determined based on the number of samplings.

[0012] In one aspect, the step of determining the identification threshold based on the number of samples includes:

[0013] The identification threshold is obtained by subtracting one from the number of samplings.

[0014] In one aspect, the data being programmed uses single-wire communication, and the data being programmed is a rectangular wave composed of high and low levels, where the length of the low level represents the data, and the high level distinguishes the interval data.

[0015] In one aspect, the identification signal includes a preheating bit at the beginning and an identification bit after the preheating bit, both of which are at a low level;

[0016] The step of sampling the identification signal at the rising edge of the clock of the sampling signal to obtain the number of samplings includes:

[0017] The identification bit is sampled at the rising edge of the clock of the sampling signal, and the number of low levels collected at the rising edge of the clock of the sampling signal within the identification bit is counted as the number of samplings.

[0018] In one aspect, the first low level in the programming signal is 0, the second low level is 1, the duration of the first low level is greater than the duration of the second low level, and the duration of the low level of the identification bit is equal to the duration of the first low level.

[0019] In one aspect, the clock period of the sampling signal is t, the duration of the first low level is T1, and the duration of the second low level is T2, then (T1-T2)≥4t is satisfied.

[0020] In one aspect, the step of determining the content of the burned signal using the identification threshold includes:

[0021] Values ​​greater than or equal to the recognition threshold are defined as 0, and values ​​less than the recognition threshold are defined as 1.

[0022] In addition, to solve the above problems, this application also provides a chip that uses the chip sampling method described above to identify the programmed data.

[0023] In addition, to solve the above problems, this application also provides a battery system, the battery system including a battery and a chip, the chip being connected to the battery, and the chip using the chip sampling method described above to identify the programmed data.

[0024] The beneficial effects of this invention are reflected in the following: An identification signal is added to the programmed data. This identification signal is sampled using the frequency of the chip's own sampling signal to obtain an identification threshold. Therefore, the identification threshold is related to the frequency of the chip's own sampling signal; the identification threshold changes with the frequency of the sampling signal. An increase in the sampling signal frequency increases the identification threshold, while a decrease in the sampling signal frequency decreases the identification threshold. Thus, even if the frequency of the sampling signal changes, the content of the programmed signal can still be identified using the identification threshold, effectively reducing discrepancies in data parsing and improving the accuracy of decoded data. Attached Figure Description

[0025] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the accompanying drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn to scale.

[0026] Figure 1 This is a schematic diagram of the chip sampling method in this application;

[0027] Figure 2 This is a schematic diagram of the process steps in the chip sampling method of this application to determine the recognition threshold by the number of samplings;

[0028] Figure 3 For this application Figure 2 A schematic diagram illustrating the process steps of the chip sampling method to calculate the recognition threshold through the number of samplings;

[0029] Figure 4 This is a schematic diagram of the process steps for determining the number of samples in the chip sampling method of this application;

[0030] Figure 5 This is a schematic diagram of the process steps in the chip sampling method of this application to determine the content of the burned signal by identifying a threshold;

[0031] Figure 6 This is a timing diagram illustrating how the chip sampling method of this application acquires and programs data using the chip's clock signal to derive the identification threshold. Detailed Implementation

[0032] The embodiments of the technical solution of the present invention will now be described in detail with reference to the accompanying drawings. These embodiments are merely illustrative of the technical solution of the present invention and are therefore intended to limit the scope of protection of the present invention.

[0033] It should be noted that, unless otherwise stated, the technical or scientific terms used in this application should have the ordinary meaning as understood by one of ordinary skill in the art to which this invention pertains.

[0034] In existing technologies, due to process variations, chip clock frequencies can deviate. For the same duration of low-level signals, chips with faster frequencies will count higher, while chips with slower frequencies will count lower. This results in different decoded data content being obtained when different chips interpret the same length of data signal.

[0035] Therefore, such as Figure 1As shown, this application provides a chip sampling method, which is applied to the sampling and identification of programmed data on a chip. The chip can be a battery protection chip, and the programmed data may include battery protection voltage, charging protection time, etc. The chip sampling method includes:

[0036] Step S100: Acquire programming data. The programming data includes an identification signal at the beginning of the transmission direction and a programming signal at the end of the transmission direction. The identification signal is mainly used to determine the identification threshold. The identification signal may also include the programming content, such as address information. The identification signal is located before the programming signal, so that when the chip acquires programming data, it first obtains the identification signal and then the programming signal. This facilitates determining the identification threshold through the identification signal, and then analyzing and sampling the programming signal based on the identification threshold.

[0037] Step S200: The identification signal is sampled according to the frequency of the chip's own sampling signal, and an identification threshold is determined based on the identification signal. The frequency of the sampling signal refers to the clock frequency of the sampling signal, and the frequency of the sampling signal is positively correlated with the size of the identification threshold. After determining the identification threshold through the identification signal, the content of the burned signal is analyzed and identified based on the identification threshold.

[0038] Step S300: Determine the content of the programming signal based on the identification threshold. The identification threshold can vary with the clock frequency of the chip's own sampling signal. For high frequencies, the identification threshold can be increased, and for low frequencies, the identification threshold can be decreased. In this way, even if the frequency of the signal changes, the identified content can remain basically the same for the same programming data.

[0039] In this embodiment, an identification signal is added to the programmed data. This identification signal is sampled using the frequency of the chip's own sampling signal to obtain an identification threshold. Therefore, the identification threshold is related to the frequency of the chip's own sampling signal; it changes with the frequency of the sampling signal. An increase in the sampling signal frequency increases the identification threshold, while a decrease in the sampling signal frequency decreases the identification threshold. Thus, even if the sampling signal frequency changes, the content of the programmed signal can still be identified using the identification threshold, effectively reducing discrepancies in data parsing and improving the accuracy of decoded data.

[0040] like Figure 2 and Figure 6 As shown, in one embodiment of this application, the step of sampling the identification signal according to the frequency of the chip's own sampling signal and determining the identification threshold based on the identification signal includes:

[0041] Step S210: Sample the identification signal at the rising edge of the sampling signal clock to obtain the number of samplings; the sampling signal is a clock signal with a certain period. When the rising edge of the sampling signal arrives, the burned data is sampled and the number of samplings is recorded.

[0042] Step S220: Determine the recognition threshold based on the number of samples. It is known that the higher the frequency of the sampled signal, the higher the number of samples, and the higher the corresponding recognition threshold; similarly, the lower the frequency of the sampled signal, the lower the number of samples, and the lower the corresponding recognition threshold. Therefore, the frequency of the sampled signal determines the number of samples, and the number of samples, in turn, determines the recognition threshold. By determining the recognition threshold, the content in the burned signal can be effectively identified.

[0043] See again Figure 6 As shown, the sampling signal is CLK, the burning data is HDQ, and the number of samplings is CNT. It can be seen that during the stage when the identification signal of the burning data arrives, each sampling signal CLK is sampled once on the rising edge, and the sampling data is gradually accumulated. It can be seen that the number of samplings is n.

[0044] like Figure 3 As shown, in one embodiment of this application, the step of determining the recognition threshold based on the number of samplings includes:

[0045] Step S221: Subtract one from the number of samples to obtain the recognition threshold. Since the clock signals for the programmed data and the chip's sampling signals are asynchronous, the input of the programmed data may miss the clock sampling window of the sampling signal. Therefore, subtracting one from the number of samples yields the recognition threshold. By subtracting one from the number of samples, the asynchronous nature of the programmed data and the sampling signal is compensated for, improving the accuracy of the recognition threshold.

[0046] In one embodiment of this application, data is programmed using single-wire communication. The programmed data is a rectangular wave composed of high and low levels. The length of the low level represents data, and the high level distinguishes between data intervals. Single-wire communication can be understood as HDQ (High-Speed ​​Data Queue), a serial communication protocol used to connect the host processor and the battery management chip in a battery management system. The length of the low level represents 0 and 1. For example, a longer low level represents 0, and a shorter low level represents 1. After acquiring a high level, the sampling signal does not read data; a high level can be used to separate two low levels, thus distinguishing between two data points.

[0047] In one embodiment of this application, the identification signal includes a preheating bit at the beginning and an identification bit following the preheating bit. Both the preheating bit and the identification bit are at a low level. The identification signal has 8 bits of data. The preheating bit occupies one data bit at the beginning, followed by the identification bit, which also occupies one data bit. The remaining 6 bits can be data content or address information. A high-level interval can be used between the preheating bit and the identification bit. The low-level duration of the preheating bit is usually relatively long, and the preheating bit is used to prompt for sampling of the identification bit. The programming signal is also 8 bits of data, with the first 7 bits being data bits and the last bit being a read / write bit.

[0048] like Figure 4 As shown, the step of sampling the identification signal at the rising edge of the sampling signal clock to obtain the number of samples includes:

[0049] Step S211: Sample the identification bit at the rising edge of the sampling signal clock, and count the number of low-level signals sampled at the rising edge of the sampling signal within the identification bit as the sampling count. The sampling signal is sampled at the rising edge, and only low-level signals are sampled. The sampling count is incremented by 1 for each rising edge of the sampling signal. The number of low-level samples is the sampling count.

[0050] In one embodiment of this application, the first low level in the programming signal is 0, the second low level is 1, and the duration of the first low level is greater than the duration of the second low level. The duration of the low level of the identification bit is equal to the duration of the first low level. That is, the long low level duration is 0, and the short low level duration is 1. The duration of the low level can be effectively distinguished by the identification threshold, thus completing the identification of 0 and 1 code values.

[0051] In one embodiment of this application, the clock period of the sampling signal is t, the duration of the first low level is T1, and the duration of the second low level is T2, then (T1-T2)≥4t. It can be understood that the duration of the first low level is greater than that of the second low level, and this time difference is at least four times the clock period of the sampling signal. This avoids the first and second low levels being too close, making it difficult to distinguish between 0 and 1.

[0052] For example, the first low level is t(HW0), and the second low level is t(HW1). The minimum duration of t(HW0) and the maximum duration of t(HW1) differ by 36µs, with a calculation cycle of 9µs. In the slowest clock scenario, this difference represents 4 counting cycles, reducing the possibility of overlapping count values ​​between t(HW0) and t(HW1). The maximum duration of the first low level is 145µs, and the minimum duration is 86µs; the maximum duration of the second low level is 50µs, and the minimum duration is 0.5µs.

[0053] like Figure 5As shown, in one embodiment of this application, the step of determining the content of the programming signal based on an identification threshold includes:

[0054] Step 310: Data values ​​greater than or equal to the recognition threshold are defined as 0, and data values ​​less than the recognition threshold are defined as 1. The recognition threshold effectively distinguishes the data content in the burned signal, using it as a dividing point to determine 0 and 1.

[0055] This application also provides a chip that uses the chip sampling method described above to identify the programmed data.

[0056] In this embodiment, an identification signal is added to the programmed data. The identification signal is sampled using the frequency of the chip's own sampling signal to obtain an identification threshold. Therefore, the identification threshold is related to the frequency of the chip's own sampling signal; it changes with the frequency of the sampling signal. An increase in the sampling signal frequency increases the identification threshold, while a decrease in the sampling signal frequency decreases the identification threshold. Thus, even if the frequency of the sampling signal changes, the content of the programmed signal can still be identified using the identification threshold, effectively reducing discrepancies in data parsing and improving the accuracy of decoded data.

[0057] This application also provides a battery system, which includes a battery and a chip. The chip is connected to the battery and uses the chip sampling method described above to identify the programmed data.

[0058] In the battery system of this embodiment, an identification signal is added to the programmed data. This identification signal is sampled using the frequency of the chip's own sampling signal to obtain an identification threshold. Therefore, the identification threshold is related to the frequency of the chip's own sampling signal; it changes with the frequency of the sampling signal. An increase in the sampling signal frequency increases the identification threshold, while a decrease in the sampling signal frequency decreases the identification threshold. Thus, even if the frequency of the sampling signal changes, the content of the programmed signal can still be identified using the identification threshold, effectively reducing discrepancies in data parsing and improving the accuracy of decoded data.

[0059] The specific embodiments and beneficial effects of the chip in this application are described in the above-described chip sampling method, and will not be repeated here.

[0060] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention, and they should all be covered within the scope of the claims and specification of the present invention.

Claims

1. A chip sampling method, characterized in that, The chip sampling method includes: Acquire programming data, which includes an identification signal at the beginning of the transmission direction and a programming signal at the end of the transmission direction; The identification signal is sampled according to the frequency of the chip's own sampling signal, and an identification threshold is determined based on the identification signal; The content of the burned signal is determined using the identification threshold. The step of sampling the recognition signal according to the frequency of the chip's own sampling signal and determining the recognition threshold based on the recognition signal includes: The identification signal is sampled at the rising edge of the clock of the sampling signal to obtain the number of samplings; The identification threshold is determined based on the number of samples. The step of determining the recognition threshold based on the number of samplings includes: The identification threshold is obtained by subtracting one from the number of samplings.

2. The chip sampling method according to claim 1, characterized in that, The data being programmed uses single-wire communication. The programmed data is a rectangular wave composed of high and low levels. The length of the low level represents the data, and the high level distinguishes the interval data.

3. The chip sampling method according to claim 2, characterized in that, The identification signal includes a preheating bit at the beginning and an identification bit after the preheating bit, both of which are at a low level; The step of sampling the identification signal at the rising edge of the clock of the sampling signal to obtain the number of samplings includes: The identification bit is sampled at the rising edge of the clock of the sampling signal, and the number of low levels collected at the rising edge of the clock of the sampling signal within the identification bit is counted as the number of samplings.

4. The chip sampling method according to claim 3, characterized in that, In the programming signal, the first low level is 0, the second low level is 1, the duration of the first low level is greater than the duration of the second low level, and the duration of the low level of the identification bit is equal to the duration of the first low level.

5. The chip sampling method according to claim 4, characterized in that, The clock period of the sampling signal is t, the duration of the first low level is T1, and the duration of the second low level is T2. Then, the following condition is satisfied: (T1-T2)≥4t.

6. The chip sampling method according to any one of claims 1 to 5, characterized in that, The step of determining the content of the burned signal using the recognition threshold includes: Values ​​greater than or equal to the recognition threshold are defined as 0, and values ​​less than the recognition threshold are defined as 1.

7. A chip, characterized in that, The chip uses the chip sampling method as described in any one of claims 1 to 6 to identify the burned data.

8. A battery system, characterized in that, The battery system includes a battery and a chip, the chip being connected to the battery, and the chip using the chip sampling method as described in any one of claims 1 to 6 to identify the programmed data.

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