Satellite orbit outer side data outlier elimination method, device, equipment and medium

Abstract

The invention discloses a satellite orbit outer side data outlier elimination method, device and equipment and a medium, and the method comprises the steps: obtaining outer side data, and dividing the outer side data into n segments; taking one section, and eliminating outliers of outside data according to a second order difference method; performing orbit fitting function evaluation on outlier-removed outer side data; and after evaluation is completed, the steps are repeated, and outliers of the next section of outside data are removed. According to the method, the outside data is segmented, the azimuth angle, the pitch angle, the distance data and the time are distinguished by adopting the second-order difference method, outliers are eliminated comprehensively, outlier elimination conditions are evaluated through the orbit fitting function, outlier elimination can be further optimized, and the problems of inaccurate measurement, large error and high accuracy in measurement in the outside data can be effectively eliminated. And the outliers with large jump can be used for effectively correcting radar actual measurement outer side data, so that error data or interference data can be accurately eliminated, and the satellite orbit determination precision can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of outlier rejection for data outside the satellite orbit during satellite orbit determination, and in particular, to a method, device, equipment and medium for outlier rejection of data outside the satellite orbit. Background Art

[0002] Currently, with the development of commercial spaceflight, more and more enterprises own or plan their own satellite constellations, bringing more convenience to enterprises by using commercial satellites. Whether the orbital parameters of the satellite are correct directly affects various aspects such as the mission planning of the satellite, the data transmission of satellite data, the processing of collected data, and the on-orbit maintenance of the satellite. Therefore, the orbital parameters are the basis for the operation of the satellite and are closely related to the commercial value of the satellite.

[0003] The orbital parameters of a satellite are a dynamically changing process. The satellite's on-orbit operation is affected by universal gravitation, earth gravity, and various perturbing forces, resulting in continuous changes in the orbital parameters. Satellite orbit determination is the determination of the satellite's orbital parameters. Out-of-orbit data orbit determination is one of the most commonly used methods in satellite orbit determination. The quality of the out-of-orbit data will directly affect the accuracy of orbit determination. Using a certain method to reject the out-of-orbit data often results in inaccurate measurement, large errors, and still existing outliers with large jumps, affecting the accuracy and accuracy of satellite orbit determination data.

[0004] The patent document with the literature number CN117870699A discloses a data processing method and device for orbit determination of orbital satellites. This solution realizes the technical effect of improving the orbit determination accuracy of orbital satellites by jointly determining the orbit using navigation satellite data and ground measurement data. However, it has the problem of not effectively rejecting data outliers. Summary of the Invention

[0005] In view of the above problems, the purpose of the present invention is to provide a method, device, equipment and medium for outlier rejection of data outside the satellite orbit, which rejects outliers in the data outside the satellite orbit during satellite orbit determination and improves the accuracy of satellite orbit determination.

[0006] Embodiments of the present invention provide a method, device, equipment and medium for outlier rejection of data outside the satellite orbit.

[0007] First aspect: A method for outlier rejection of data outside the satellite orbit, comprising:

[0008] S1. Obtain out-of-orbit data and divide the out-of-orbit data into n segments;

[0009] S2. Take one of the segments and reject outliers in the out-of-orbit data according to the second-order difference method;

[0010] S3. Evaluate the orbit fitting function for the outlier-rejected out-of-orbit data;

[0011] S4. After completing the evaluation, repeat S2 - S3 to eliminate the outlier data in the next outer segment.

[0012] Optionally: The outer data includes the azimuth angle, elevation angle, distance data, and time of the satellite relative to the measuring station.

[0013] Optionally: In S2, eliminating the outlier data of the outer data by the second - order difference method includes the steps:

[0014] S21. Calculate the difference between adjacent outer data based on time to form a new sequence L;

[0015] where dr is the difference between adjacent outer data, and dt is the time difference between adjacent outer data;

[0016] S22. Take the difference between adjacent data of the new sequence L again to form a new sequence K;

[0017] S23. Calculate the variance of the new sequence K and compare it with the difference threshold to eliminate the outer data that exceeds the difference threshold.

[0018] Optionally: In S3, evaluating the orbit - fitting function for the outlier - removed outer data includes the steps:

[0019] S31. Solve the satellite ephemeris data based on the outlier - removed outer data and the measuring station information;

[0020] S32. Form an orbit - fitting function based on the satellite ephemeris data to obtain an orbit - fitting surface;

[0021] S33. Compare the distance between the outlier - removed outer data and the orbit - fitting surface, and evaluate the outlier - removed outer data based on the distance.

[0022] Optionally: The orbit - fitting function has the formula:

[0023] ax 2 +by 2 +cz 2 +dx + ey+fz + j = 0

[0024] where a, b, c, d, e, f, j are function parameters.

[0025] Optionally: In S33, evaluating the outlier - removed outer data based on the distance includes:

[0026] Set an evaluation threshold. When there is outlier - removed outer data with a distance exceeding the evaluation threshold, adjust the difference threshold, continue to use the second - order difference method to eliminate the outlier data of the outer data, and then perform the orbit - fitting function evaluation until all outlier - removed outer data meet the evaluation threshold.

[0027] Optionally: After completing the outlier rejection and evaluation of the n segments of outer data, obtain the mean data of each segment of outer data, iteratively use the second-order difference method to reject the outliers in the mean data, and perform an orbital fitting function evaluation.

[0028] Second aspect: An apparatus for rejecting outliers in satellite orbit outer data, comprising:

[0029] An input module, which obtains outer data, the number of segments, a difference threshold, and an evaluation threshold;

[0030] A second-order difference calculation module, which performs a second-order difference calculation on the segmented outer data, rejects outliers, and obtains outlier-rejected outer data;

[0031] An orbital fitting evaluation module, which performs an orbital fitting function evaluation on the outlier-rejected outer data;

[0032] An output module; outputs the evaluated outer data and outliers.

[0033] Third aspect: An electronic device, comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein when the processor executes the program, the steps of the method provided in the first aspect are implemented.

[0034] Fourth aspect: A non-transitory computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the method provided in the first aspect are implemented.

[0035] Advantages of the present invention:

[0036] 1. By segmenting the outer data, the present invention uses the second-order difference method to distinguish azimuth angle, elevation angle, distance data, and time to reject outliers. The outlier rejection is comprehensive. By evaluating the outlier-rejected situation through the orbital fitting function, the outlier rejection can be further optimized. It can effectively reject the outliers with inaccurate measurement, large error, and large jump in the outer data, can effectively correct the radar-measured outer data, accurately reject the error data or interference data, and improve the satellite orbit determination accuracy.

[0037] 2. The present invention adopts a secondary iteration method, which can discover and remove entire segments of outliers, further effectively correct the radar-measured outer data, accurately reject the error data or interference data, and improve the satellite orbit determination accuracy. Description of the Drawings

[0038] Figure 1 It is a schematic flowchart of a method for rejecting outliers in satellite orbit outer data according to the present invention;

[0039] Figure 2 It is a schematic principle flowchart of a method for rejecting outliers in satellite orbit outer data according to the present invention;

[0040] Figure 3 This is a schematic structural diagram of a device for removing outliers from data outside the satellite orbit according to the present invention;

[0041] Figure 4 This is a schematic structural diagram of an electronic device according to the present invention. Detailed implementation manners

[0042] The embodiments of the present invention will be described in detail below. The examples of the embodiments are shown in the drawings, where the same or similar symbols represent the same or similar elements or elements with the same or similar functions from beginning to end. The embodiments described below by referring to the drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation to the present invention.

[0043] During the satellite orbit determination process, the quality of the data outside the orbit will directly affect the accuracy of orbit determination. Using various methods to remove outliers with inaccurate measurements, large errors, and large jumps in the data outside the orbit is a key link in the preprocessing of satellite orbit determination data.

[0044] In view of the above problems, the present invention provides a method for removing outliers from data outside the satellite orbit. Figure 1 This is a schematic flow diagram of a method for removing outliers from data outside the satellite orbit provided by an embodiment of the present invention. The method includes:

[0045] S1. Obtain the data outside the orbit and divide the data outside the orbit into n segments;

[0046] The data outside the orbit is obtained by a measuring station observing a satellite to obtain the azimuth angle, elevation angle, distance, etc. of the satellite relative to the measuring station during the observation period. The orbit of the satellite can be fitted through continuous data outside the orbit, so as to obtain the orbit parameters of the satellite and realize satellite orbit determination.

[0047] Because the total amount of data outside the orbit is huge, when using it, the data outside the orbit can be divided into n segments and processed in segments, which can improve the processing speed and efficiency.

[0048] S2. Select one of the segments and remove the outliers from the data outside the orbit according to the second-order difference method.

[0049] One segment can be selected according to the time series, and the outliers in the data outside the orbit are removed according to the second-order difference method. Specifically, it includes the steps:

[0050] S21. Calculate the difference between adjacent data outside the orbit based on time in one segment of data Form a new sequence L; where dr is the difference between adjacent data outside the orbit (calculated separately for azimuth angle, elevation angle, and distance), and dt is the time difference between adjacent data outside the orbit.

[0051] S22. Calculate the difference between adjacent data in the new sequence L again to form a new sequence K;

[0052] S23. Calculate the variance of the new sequence K and compare it with the difference threshold. If the variances obtained from the outer data of this segment are all within the threshold range, perform an orbit fitting function evaluation; if the variance of the outer data of this segment exceeds the threshold, eliminate the outer data that exceeds the threshold. After elimination, obtain the outer data segment without outliers and perform an orbit fitting function evaluation.

[0053] S3. Perform an orbit fitting function evaluation on the outer data without outliers. Since the satellite orbit is elliptical, the orbit fitting function uses a three-dimensional elliptic equation, and the formula is:

[0054] ax 2 +by 2 +cz 2 +dx + ey + fz + j = 0 (1)

[0055] Among them, a, b, c, d, e, f, j are function parameters.

[0056] Specifically, performing an orbit fitting function evaluation on the outer data without outliers includes the steps of:

[0057] S31. Calculate the satellite ephemeris data based on the outer data without outliers and the station information. The station information refers to information such as the position of the tracking and control station, which is the reference benchmark position information for obtaining the outer data. The satellite ephemeris data can be calculated based on the outer data without outliers and the station information.

[0058] S32. Form an orbit fitting function based on the satellite ephemeris data to obtain an orbit fitting surface. The function parameters a, b, c, d, e, f, j of formula (1) can be obtained based on the satellite ephemeris data by the least squares method. The fitting function uses the standard equation of an ellipsoid surface because the theoretical orbit of the satellite is an ellipse, and formula (1) presents an ellipsoid surface for satellite orbit fitting.

[0059] S33. Compare the distance between the outer data without outliers and the orbit fitting surface, and evaluate the outer data without outliers based on the distance.

[0060] Comparing the distance between the outer data without outliers and the orbit fitting surface and evaluating the outer data without outliers based on the distance includes:

[0061] Set an evaluation threshold. When there is outer data without outliers with a distance exceeding the evaluation threshold, adjust the difference threshold, continue to use the second-order difference method to eliminate the outliers of the outer data, and then perform an orbit fitting function evaluation until all the outer data without outliers meet the evaluation threshold.

[0062] S4. After completing the evaluation, repeat S2 - S3 to eliminate the outliers of the next segment of outer data.

[0063] The complete principle process is as Figure 2As shown, after removing the outlier data of n segments through the above method, the mean data of each segment of the outlier data can be calculated, and then the calculation is performed by secondary iteration to continue removing the data with all segments being outliers. The removal method can also be to first remove the outlier data of the mean data by the second-order difference method and then perform the evaluation of the orbit fitting function.

[0064] The present invention also provides a device for removing outlier data of satellite orbits, as Figure 3 shown, the device includes:

[0065] An input module, which acquires outlier data, the number of segments, the difference threshold, and the evaluation threshold;

[0066] A second-order difference calculation module, which performs a second-order difference calculation on the segmented outlier data, removes outliers, and acquires outlier-removed outlier data;

[0067] An orbit fitting evaluation module, which performs an evaluation of the orbit fitting function on the outlier-removed outlier data;

[0068] An output module; outputs the evaluated outlier data and outliers.

[0069] Through the above device settings, when in use, according to the outlier data acquired by the input module, the set number of segments, the difference threshold, and the evaluation threshold, the second-order difference calculation module is used to perform a second-order difference calculation, remove outliers, and acquire outlier-removed outlier data. Then, the orbit fitting evaluation module is used to perform an evaluation of the orbit fitting function on the outlier-removed outlier data. Finally, the evaluated outlier data and outliers are output through the output module, which can correct the outlier data measured by the radar, remove error data or interference data, and improve the satellite orbit determination accuracy.

[0070] The present invention also provides an electronic device, Figure 4 which is a schematic structural diagram of the electronic device provided by the embodiment of the present invention. As Figure 4 shown, the electronic device may include: a processor, a communication interface, a memory, and a communication bus. Among them, the processor, the communication interface, and the memory communicate with each other through the communication bus. The processor can call the logical instructions in the memory, for example, to execute the following method:

[0071] S1. Acquire outlier data and divide the outlier data into n segments;

[0072] S2. Take one of the segments and remove the outlier data of the outlier data according to the second-order difference method;

[0073] S3. Perform an evaluation of the orbit fitting function on the outlier-removed outlier data;

[0074] S4. After completing the evaluation, repeat S2 - S3 to eliminate the outlier data in the next segment of the outer side.

[0075] In addition, when the logical instructions in the above-mentioned memory are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs that can store program codes.

[0076] The embodiments of the present invention also provide a non-transitory computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it is configured to execute the methods provided in the above-mentioned various embodiments, for example, including:

[0077] S1. Obtain the outer side data and divide the outer side data into n segments;

[0078] S2. Take one of the segments and eliminate the outlier data of the outer side data according to the second-order difference method;

[0079] S3. Evaluate the orbit fitting function for the outer side data after removing outliers;

[0080] S4. After completing the evaluation, repeat S2 - S3 to eliminate the outlier data in the next segment of the outer side.

[0081] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. One can select some or all of the modules according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art can understand and implement it without creative efforts.

[0082] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, and of course, it can also be implemented by hardware. Based on such an understanding, the essence of the above technical solution, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0083] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features. And these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for removing outliers from satellite orbit outer data, characterized in that: include: S1, obtain the outer data and divide the outer data into n segments; S2, select one of the segments and remove the outlier data using the second-order difference method; S3, evaluating the orbital fitting function for the data outside the de-wilding value; S4. After completing the evaluation, repeat S2-S3 to remove the next segment of outlier data.

2. A method for removing outliers in satellite orbit outer data according to claim 1, characterized in that: The external data includes the azimuth, elevation, distance data and time of the satellite relative to the measuring station.

3. The method for eliminating outliers in satellite orbit outer data according to claim 1, characterized in that: The second-order difference method in S2 eliminates outlier data outliers, including the following steps: S21, calculate the difference between adjacent outer data based on time Form a new sequence L; Among them, dr is the difference between adjacent outer data, and dt is the time difference between adjacent outer data; S22, performing interpolation between adjacent data of the new sequence L to form a new sequence K; S23, calculating the variance of the new sequence K, and comparing it with the difference threshold, and eliminating the outer data exceeding the difference threshold.

4. A method for removing outliers in satellite orbit outer data according to claim 3, characterized in that: In S3, the track fitting function is evaluated for the data outside the de-wilding value, including the steps of: S31, calculating satellite ephemeris data based on the outlier outer data and the station information; S32, forming an orbit fitting function according to the satellite ephemeris data, and obtaining an orbit fitting surface; S33, comparing the distance between the outer data of the de-outlined value and the track fitting surface, and evaluating the outer data of the de-outlined value based on the distance.

5. A method for removing outliers in satellite orbit outer data according to claim 4, characterized in that: The orbital fitting function is formulated as follows: ax 2 +by 2 +cz 2 +dx+ey+fz+j=0 Among them, a, b, c, d, e, f, j are function parameters.

6. A method for removing outliers in satellite orbit outer data according to claim 4, characterized in that: In S33, the data outside the de-wilding value is evaluated according to the distance, including: An evaluation threshold is set. When there is data outside the de-outlining value whose distance exceeds the evaluation threshold, the difference threshold is adjusted, and the second-order difference method is continued to be used to eliminate the outliers of the data outside. Then, the orbit fitting function is evaluated until all the data outside the de-outlining value meet the evaluation threshold.

7. The method for eliminating outliers in satellite orbit outer data according to claim 1, characterized in that: After completing the outlier elimination and evaluation of n segments of outer data, the mean data of each segment of outer data is obtained, the second-order difference method is iteratively used to eliminate the outliers of the mean data, and the orbit fitting function is evaluated.

8. A device for removing outliers from satellite orbit outer data applied to the method according to any one of claims 1 to 7, characterized in that: The device comprises: Input module, obtains outer data, number of segments, difference threshold and evaluation threshold; The second-order difference calculation module performs second-order difference calculation on the segment outer data, removes outliers, and obtains the outlier outer data; Track fitting evaluation module, which evaluates the track fitting function for the data outside the outlier value; Output module; outputs the evaluated outlier data and outliers.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the steps of a method for eliminating outliers in satellite orbit outer data as described in any one of claims 1 to 7 are implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of a method for eliminating outliers in satellite orbit outer side data as described in any one of claims 1 to 7 are implemented.

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