Test box and test system

Abstract

The invention discloses a test box and a test system. The test box comprises a box body used for accommodating a to-be-tested piece and providing a test environment; the signal processing device is used for collecting and processing a test signal provided by the to-be-tested piece, and the signal processing device comprises an attenuation unit used for attenuating the test signal; the control unit is used for providing an adjusting signal matched with the test signal for the attenuation unit so as to adjust the attenuation degree of the test signal; and the output unit is used for amplifying and outputting the attenuated test signal. Through targeted amplitude adjustment of different test signals, the reliability of the test signals is improved, the test signals are enabled to be better matched with impedance of a transmission medium, the transmission efficiency and quality of the signals are improved, and loss and distortion of the test signals in the transmission process are reduced.

Description

Technical Field

[0001] The present invention relates to the field of display technologies, and particularly to a test chamber and a test system. Background Art

[0002] During the actual use of display devices, they may face various environmental conditions such as high temperature, low temperature, and high humidity. In order to verify the performance of display devices under these conditions and ensure their stable operation without failures, it is necessary to conduct environmental adaptability tests on display devices before leaving the factory.

[0003] When conducting environmental adaptability tests, a test chamber is required to provide the corresponding test environment and collect the test signals provided by the display device. These test signals are transmitted to an oscilloscope or other detection devices via corresponding signal lines. For safety reasons, there is usually a long distance between the test chamber and the detection device. If ordinary signal lines are used for long-distance data transmission, the signal lines will have huge parasitic resistances and capacitances, which will attenuate the test signals, especially high-frequency test signals, resulting in test signal distortion. If special signal lines provided by equipment suppliers are used, signal distortion can be reduced to a certain extent, but the special signal lines provided by equipment suppliers are usually short and cannot meet all distance requirements. Moreover, the special signal lines are expensive, and as the transmission distance increases, the test cost will be greatly increased. Summary of the Invention

[0004] In view of the above problems, the purpose of the present application is to provide a test chamber and a test system, which process the test signals through a signal processing device so that the test signals remain intact during long-distance transmission.

[0005] According to one aspect of the present application, a test chamber is provided, which includes: a box body for accommodating a device under test and providing a test environment; and a signal processing device for collecting and processing the test signals provided by the device under test, wherein the signal processing device includes: an attenuation unit for attenuating the test signals; a control unit for providing an adjustment signal adapted to the test signals to the attenuation unit to adjust the attenuation degree of the test signals; and an output unit for amplifying and outputting the attenuated test signals.

[0006] Optionally, the device under test provides N candidate signals, and the signal processing device further includes: a selection unit for selecting M signals from the N candidate signals as the test signals according to the selection signal provided by the control unit, where 1≤M≤N, and M and N are integers.

[0007] Optionally, the control unit includes a wireless signal receiving module for receiving a wirelessly transmitted control signal and providing the corresponding selection signal and adjustment signal according to the control signal. The wireless receiving module includes a radio frequency module, a 2.4G wireless receiving module, or a Bluetooth receiving module.

[0008] Optionally, the output unit includes: a first operational amplifier, the non-inverting input terminal of which receives the attenuated test signal; a first resistor connected between the inverting input terminal and the output terminal of the first operational amplifier; a second resistor connected between the inverting input terminal of the first operational amplifier and the ground; a capacitor connected in parallel with the second resistor; and an output resistor connected to the output terminal of the first operational amplifier for providing an output impedance. Wherein, the bandwidth of the first operational amplifier is greater than the highest frequency of the test signal.

[0009] Optionally, the output unit is communicatively connected to a detection device outside the box body through a signal line, and the output impedance matches the impedance of the signal line and the input impedance of the detection device.

[0010] Optionally, the attenuation unit includes: a first gain resistor through which the test signal is transmitted to the output unit; a plurality of second gain resistors; and a multiplexer, the input terminals of which are respectively connected to the corresponding second gain resistors, and the output terminal is connected to an intermediate node between the first gain resistor and the output unit. The multiplexer adjusts the connected second gain resistor according to the control signal.

[0011] Optionally, it further includes: an isolation unit connected between the device under test and the attenuation unit for impedance isolation of the test signal.

[0012] Optionally, the test environment includes high temperature, low temperature, and high humidity.

[0013] According to a second aspect of the present application, a test system is provided, which includes: the test chamber as described in any one of the above; and a detection device located outside the test chamber, the detection device is connected to the test chamber through a signal line to receive the test signal provided by the output unit.

[0014] Optionally, the signal line includes a coaxial cable.

[0015] Optionally, the detection device includes: a second operational amplifier, the non-inverting input terminal of which receives the test signal provided by the output unit, and the inverting input terminal is connected to the output terminal; and an input resistor connected between the non-inverting input terminal of the second operational amplifier and the ground voltage for providing an input impedance, and the input impedance matches the output impedance of the output unit and the impedance of the signal line.

[0016] Optionally, the bandwidth of the second operational amplifier is greater than the highest frequency of the test signal.

[0017] Optionally, the detection device further includes a control signal sending unit for sending the wirelessly transmitted control signal.

[0018] Optionally, a power supply device is further included for supplying power to the signal processing device and the detection device, and the power supply device includes a linear isolation power supply.

[0019] According to the test chamber and test system provided by the present application, an adjustment signal adapted to the test signal is provided by the control unit, so that the test signal obtains a corresponding attenuation degree, and the output unit is cooperated to achieve targeted amplitude adjustment of different test signals, which is beneficial to improving the reliability of the test signal, making the test signal better match the impedance of the transmission medium, improving the transmission efficiency and quality of the signal, and reducing the loss and distortion of the test signal during transmission.

[0020] Furthermore, by setting a selection unit and selecting M test signals to be transmitted from N candidate signals according to the selection signal provided by the control unit, the transmission resources of the test signals are saved, which is beneficial to reducing the test cost.

[0021] Furthermore, the wireless transmission of the control signal is realized through a wireless controller, which can remotely control the selection and attenuation of the test signal, simplify the test process, and is beneficial to improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Through the following description of the embodiments of the present invention with reference to the drawings, the above and other objects, features and advantages of the present invention will become clearer. In the drawings:

[0023] Figure 1 A schematic structural block diagram of the test chamber according to an embodiment of the present application is shown;

[0024] Figure 2 A schematic structural block diagram of the test system according to an embodiment of the present application is shown;

[0025] Figure 3 A schematic structural block diagram of the detection device according to an embodiment of the present application is shown. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0026] The various embodiments of the present invention will be described in more detail below with reference to the drawings. In each drawing, the same elements are denoted by the same or similar reference numerals. For clarity, the various parts in the drawings are not drawn to scale.

[0027] Meanwhile, in this specification and the claims, certain terms are used to refer to specific components. Those of ordinary skill in the art should understand that manufacturers may use different terms to refer to the same component. This specification and the claims do not use the difference in names as a way to distinguish components, but use the difference in functions of components as the criterion for distinction.

[0028] It should be understood that in the following description, "circuit" may include a single or multiple combined hardware circuits, programmable circuits, state machine circuits, and / or elements capable of storing instructions executed by the programmable circuit. When an element or circuit is said to be "connected to" another element or when an element or circuit is said to be "connected between" two nodes, it can be directly coupled or connected to another element or there may be intermediate elements. The connection between elements can be physical, logical, or a combination thereof. In contrast, when an element is said to be "directly coupled to" or "directly connected to" another element, it means there are no intermediate elements between the two.

[0029] In addition, it should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising one..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the said element.

[0030] This application provides a test chamber for performing environmental adaptability tests on a display panel. The test chamber includes a chamber for accommodating a test piece and providing a test environment, and a signal processing device for collecting and processing test signals of the test piece. Among them, the test signals are, for example, square waves, sawtooth waves, triangular waves, sine waves, etc. The signal processing device can perform different processing according to the type of test signal to achieve high-fidelity transmission of various test signals.

[0031] Figure 1 The schematic structural diagram of the signal processing device is shown. Refer to Figure 1 , the signal processing device 100 includes a control unit 110, a selection unit 120, an isolation unit 130, an attenuation unit 140, and an output unit 150.

[0032] The control unit 110 is configured to provide an adjustment signal adapted to the test signal. In some embodiments, the adjustment signal may be pre-stored in the control unit 110. In a preferred embodiment, the control unit 110 includes a wireless signal receiving module to receive a wirelessly transmitted control signal and provide a corresponding adjustment signal according to the control signal. By replacing wired transmission with wireless transmission, remote control of the signal processing device 100 can be achieved, which is conducive to simplifying the test process and improving the test efficiency. The wireless receiving module may be selected from, for example, a radio frequency module, a 2.4G wireless receiving module, or a Bluetooth receiving module, and the present application does not impose excessive restrictions.

[0033] The attenuation unit 140 adjusts the attenuation parameter according to the adjustment signal to attenuate the test signal to a corresponding degree. Exemplarily, the attenuation unit 140 adjusts the shunt resistance of the output unit 150 to adjust the attenuation degree of the test signal. Refer to Figure 1 , the attenuation unit 140 includes a first gain resistor R1, a plurality of second gain resistors R2, and a multiplexer 141, and in Figure 1 , 4 second gain resistors R2 are taken as an example. The test signal is transmitted to the output unit 150 through the first gain resistor R1. Each input terminal of the multiplexer 141 is respectively connected to a corresponding second gain resistor R2, and the output terminal is connected to the intermediate node between the first gain resistor R1 and the output unit 150. The multiplexer 141 adjusts the connected second gain resistor R2 according to the adjustment signal, thereby adjusting the attenuation degree of the test signal. It should be understood that the resistance values of the second gain resistors R2 may be the same or different, and the present application does not impose excessive restrictions on this.

[0034] The output unit 150 is configured to amplify and output the attenuated test signal. Refer to Figure 1 , the output unit 150 includes, for example, a first operational amplifier A2, a first resistor Rf1, a second resistor Rf2, a capacitor C1, and an output resistor Rout. The non-inverting input terminal of the first operational amplifier A2 receives the attenuated test signal. The first resistor Rf1 is connected between the inverting input terminal and the output terminal of the first operational amplifier A2. The second resistor Rf2 is connected between the inverting input terminal of the first operational amplifier A2 and the ground voltage GND. The capacitor C1 is connected in parallel with the second resistor Rf2. The output resistor Rout is connected to the output terminal of the operational amplifier and is used to provide an output impedance.

[0035] By providing an adjustment signal adapted to the test signal through the control unit, the attenuation degree of the test signal can be flexibly controlled, and the output unit is coordinated to achieve targeted amplitude adjustment of different test signals, which is conducive to improving the reliability of the test signal, making the test signal better match the impedance of the transmission medium, improving the transmission efficiency and quality of the signal, and reducing the loss and distortion of the test signal during transmission.

[0036] Further, the output unit is communicatively connected to a detection device outside the test chamber via a signal line. By adjusting the resistance value of the output resistor Rout, the output impedance is matched with the impedance of the signal line and the input impedance of the detection device, which helps reduce distortion and loss during the transmission of the test signal and improves the integrity of the test signal. In some embodiments, a high-performance first operational amplifier A2 with a bandwidth greater than the highest frequency of the test signal is selected to support impedance matching. By selecting a first operational amplifier A2 with a higher bandwidth, it is beneficial for the flexible selection of the test signal.

[0037] It should be understood that the device under test 200 provides N signals (i.e., the candidate signals in the following text), which requires a huge transmission cost. In some embodiments, the selection unit 120 selects M signals from the N candidate signals as the test signals to be transmitted and provides them to the attenuation unit 140, thereby reducing the transmission cost of the test signals, where 1 ≤ M ≤ N. The selection unit 120 includes, for example, a switch chip or a signal relay, and thus controls the selected transmission channels according to the selection signal to provide the corresponding test signals.

[0038] In some embodiments, the selection signal is pre-stored in the control unit 110. In a preferred embodiment, the control unit 110 provides a matching selection signal and adjustment signal according to the received control signal. It is more beneficial to make real-time adjustments to the test signals according to the test situation.

[0039] In some embodiments, the signal processing device 100 further includes an isolation unit 130 to perform impedance isolation on the test signal before attenuation, thereby avoiding the influence of subsequent circuits on the test signal. Refer to Figure 1 , the isolation unit 130 includes, for example, a third operational amplifier A1. The non-inverting input terminal of the third operational amplifier A1 receives the test signal, and the inverting input terminal is connected to the output terminal.

[0040] This application also provides a test system for performing environmental adaptability tests on a display panel and displaying and / or analyzing the test results. Figure 2 The schematic structural diagram of the test system is shown. Refer to Figure 2 , the test system includes the test chamber 10 provided in various embodiments of this application and a detection device 20 communicatively connected to the test chamber 10 via a signal line 30.

[0041] The test chamber 10 is used to provide a processed test signal processed by the signal processing device 100, and this processed test signal is transmitted to the detection device 20 via the signal line 30. Among them, the signal line 30 is, for example, a coaxial cable.

[0042] Figure 3 The schematic structural diagram of the detection device 20 is shown. Refer to Figure 3, the detection device 20 includes a receiving unit 21, an analysis unit 22, a control signal input unit 23, and a control signal sending unit 24.

[0043] The receiving unit 21 is configured to receive a test signal transmitted via the signal line 30. Refer to Figure 3 , the receiving unit 21 includes a second operational amplifier A3 and an input resistor Rmatch. The non-inverting input terminal of the second operational amplifier A3 receives the test signal, and the inverting input terminal is connected to the output terminal. The input resistor Rmatch is connected between the non-inverting input terminal of the second operational amplifier A3 and the ground voltage GND to provide an input impedance. As described above, in order to improve the transmission quality of the test signal, this input impedance is matched with the output impedance of the output unit 150 and the impedance of the signal line. In some embodiments, the second operational amplifier A3 can also be a high-performance operational amplifier with a bandwidth greater than the highest frequency of the test signal to support impedance matching and flexible selection of the test signal. The analysis unit 22 is configured to display and / or analyze the test signal, so as to determine whether the device under test is operating normally. Exemplarily, the analysis unit 22 includes, for example, an oscilloscope or other conventional data analysis devices, and the present application does not impose excessive limitations. The control signal is input into the detection device 20 via the control signal input unit 23 and is sent to the test chamber 10 via the control signal sending unit 24. As described above, in order to improve the test efficiency, the control signal sending unit 24 includes, for example, a wireless signal sending module to send a wirelessly transmitted control signal.

[0044] In some embodiments, the test system further includes a power supply device for supplying power to the signal processing device and the detection device. The electrical energy provided by the power supply device includes, for example, the positive supply voltage VDD, the negative supply voltage VSS of each operational amplifier, and the ground voltage GND. In a preferred embodiment, the power supply device is a linear isolation power supply to provide a low-noise supply voltage.

[0045] According to the test chamber and test system provided by the present application, by the control unit providing an adjustment signal adapted to the test signal, the test signal can obtain a corresponding attenuation degree, and cooperate with the output unit to achieve targeted amplitude adjustment of different test signals, which is conducive to improving the reliability of the test signal, making the test signal better match the impedance of the transmission medium, improving the transmission efficiency and quality of the signal, and reducing the loss and distortion of the test signal during transmission.

[0046] Furthermore, by providing a selection unit to select M test signals to be transmitted from N test signals according to the control signal, the transmission resources of the test signals are saved, which is conducive to reducing the test cost.

[0047] Furthermore, by using a wireless controller to achieve wireless transmission of the control signal, the selection and attenuation of the test signal can be remotely controlled, simplifying the test process and being conducive to improving the test efficiency.

[0048] As described above with reference to the embodiments of the present application, these embodiments do not describe all the details in detail, nor do they limit the present application to only the specific embodiments. Obviously, many modifications and variations can be made according to the above description. These embodiments are selected and specifically described in this specification in order to better explain the principles and practical applications of the present application, so that those skilled in the art can make good use of the present application and its modifications based on the present application. The protection scope of the present application shall be subject to the scope defined by the claims of the present application.

Claims

1. A test chamber, wherein: include: The box is used to contain the test piece and provide a test environment; as well as A signal processing device, used to collect and process the test signal provided by the DUT, Wherein, the signal processing device comprises: an attenuation unit, used for attenuating the test signal; a control unit, configured to provide an adjustment signal adapted to the test signal to the attenuation unit, so as to adjust the attenuation degree of the test signal; and The output unit is used to amplify and output the attenuated test signal.

2. The test chamber according to claim 1, wherein: The device under test provides N channels of signals to be selected. The signal processing device further includes: a selection unit, configured to select M signals from N signals to be selected as the test signals according to a selection signal provided by the control unit, where 1≤M≤N, and M and N are integers.

3. The test chamber according to claim 2, wherein: The control unit includes a wireless signal receiving module to receive a wirelessly transmitted control signal and provide matching selection signals and adjustment signals according to the control signal. The wireless receiving module includes a radio frequency module or a 2.4G wireless receiving module or a Bluetooth receiving module.

4. The test chamber according to claim 1, wherein: The output unit comprises: a first operational amplifier, wherein a non-inverting input terminal of the first operational amplifier receives the attenuated test signal; A first resistor connected between the inverting input terminal and the output terminal of the first operational amplifier; A second resistor connected between the inverting input terminal of the first operational amplifier and ground; A capacitor connected in parallel with the second resistor; and an output resistor connected to the output terminal of the first operational amplifier and configured to provide output impedance, Wherein, the bandwidth of the first operational amplifier is greater than the highest frequency of the test signal.

5. The test box according to claim 4, wherein: The output unit is communicatively connected with a detection device outside the box via a signal line, and the output impedance matches the impedance of the signal line and the input impedance of the detection device.

6. The test chamber according to claim 1, wherein: The attenuation unit comprises: a first gain resistor, wherein the test signal is transmitted to the output unit via the first gain resistor; a plurality of second gain resistors; and A multiplexer, whose input ends are respectively connected to corresponding second gain resistors, and whose output ends are connected to the first gain resistors and the intermediate node of the output unit, and the multiplexer adjusts the connected second gain resistors according to the control signal.

7. The test chamber according to claim 1, wherein: Also includes: An isolation unit is connected between the device under test and the attenuation unit, and is used to perform impedance isolation on the test signal.

8. The test chamber according to claim 1, wherein: The test environment includes high temperature, low temperature, and high humidity.

9. A test system, wherein: include: The test box according to any one of claims 1 to 8; as well as A detection device is located outside the test box, and is connected to the test box via a signal line to receive a test signal provided by the output unit.

10. The test system according to claim 9, wherein: The signal line includes a coaxial cable.

11. The test system according to claim 9, wherein: The detection device comprises: A second operational amplifier, wherein the non-inverting input terminal receives the test signal provided by the output unit, and the inverting input terminal is connected to the output terminal; and An input resistor is connected between the non-inverting input terminal of the second operational amplifier and the ground voltage, and is used to provide an input impedance, and the input impedance matches the output impedance of the output unit and the impedance of the signal line.

12. The test system according to claim 11, wherein: The bandwidth of the second operational amplifier is greater than the highest frequency of the test signal.

13. The test system according to claim 9, wherein: The detection device further comprises a control signal sending unit for sending the control signal for wireless transmission.

14. The test system according to claim 9, wherein: It also includes a power supply device for supplying power to the signal processing device and the detection device, and the power supply device includes a linear isolated power supply.

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