Test bench capable of being used in high vacuum environment and control method thereof

Abstract

The invention provides a test bench capable of being used in a high vacuum environment and a control method thereof, the test bench comprises a rotary table body, the rotary table body comprises a base body, and a first support plate can move on the base body along a first direction; the second supporting plate can move on the first supporting plate in the second direction, the third supporting plate can rotate around the first axis, and the third supporting plate is provided with a mounting station for mounting a to-be-tested piece; the image collecting mechanism is arranged on the third supporting plate and comprises a collecting assembly arranged on the periphery of the mounting station, and the collecting assembly can rotate around the first axis and / or ascend and descend in the third direction. According to the invention, when the test piece to be tested is in a special shape or performs actions such as pitching, the acquisition assembly can flexibly adjust the shooting angle and position through rotation and lifting of the acquisition assembly and rotation of the third supporting plate, so that a shooting blind area is effectively avoided, the shooting comprehensiveness is improved, and comprehensive data support is provided for accurately evaluating the performance of the test piece.

Description

Technical Field

[0001] This application relates to the technical field of vacuum test benches, and particularly relates to a test bench applicable to a high-vacuum environment and a control method thereof. Background Art

[0002] When testing a specimen in a high-vacuum environment, it is often necessary to use an image acquisition mechanism to record relevant information such as the state and performance of the specimen. The patent with the application number 201921568581.3 proposes a high-low temperature turntable for use in a high-vacuum environment, and the image acquisition mechanism is installed on one side of the base. Although it has the functions of lifting and horizontal telescoping, when facing a specimen with a special shape or a specimen performing complex movements such as pitching, this structure cannot flexibly adjust the shooting angle and position, resulting in some areas of the specimen being in the shooting blind area and comprehensive image data not being obtainable, which brings great trouble to accurately evaluating the performance and state of the specimen. For example, when simulating vacuum environment tests on some aircraft parts with special shapes in the aerospace field, after the image acquisition mechanism of this structure descends to the top of the aircraft part, it cannot descend further (blocked by the top), so it is very difficult to capture the area at the bottom on the back of the part, resulting in the inability to completely analyze its state changes during the test process. Summary of the Invention

[0003] In view of the above-mentioned defects or deficiencies in the prior art, this application aims to provide a test bench applicable to a high-vacuum environment and a control method thereof to overcome the problem of limited image acquisition of traditional high-vacuum environment test benches; In a first aspect, this application proposes a test bench applicable to a high-vacuum environment, including a turntable body installed in a vacuum temperature change test tank; The turntable body includes: A base body, which is fixed on a support frame in the vacuum temperature change test tank; A first support plate, which is arranged on the side of the base body away from the support frame, and the first support plate can move on the base body along a first direction; A second support plate, which is arranged on the side of the first support plate away from the base body, and the second support plate can move on the first support plate along a second direction, and the second direction is perpendicular to the first direction; A third support plate, which is arranged on the side of the second support plate away from the first support plate, and the third support plate can rotate around a first axis. There is an installation station for installing a specimen to be tested on the third support plate; the extension direction of the first axis is a third direction, and the third direction is perpendicular to the first direction and the second direction respectively; The image acquisition mechanism is provided on the third support plate. The image acquisition mechanism includes an acquisition component provided on the outer periphery of the installation station, and the acquisition component can rotate around the first axis and / or lift along the third direction.

[0004] According to the technical solution provided by the embodiment of the present application, the acquisition component realizes rotation around the first axis and / or lifting along the third direction through a first driving component; the first driving component includes an annular chute provided on the third support plate, the annular chute is provided on the outer periphery of the installation station, a first slider is provided in the annular chute, a first lifting rod is vertically provided on the first slider, and the acquisition component is provided at the end of the first lifting rod away from the first slider.

[0005] According to the technical solution provided by the embodiment of the present application, a first rotating rod is vertically provided on the second support plate, the first rotating rod is connected with a second driving component for driving it to rotate around the first axis, a second rotating rod is vertically provided at the end of the first rotating rod away from the second support plate, the second rotating rod is connected with a third driving component for driving it to rotate around a second axis, and the side of the second rotating rod away from the first rotating rod is connected to the third support plate; the extending direction of the second axis is the second direction.

[0006] In a second aspect, the present application proposes a control method for a test bench applicable to a high-vacuum environment, which is implemented based on the test bench applicable to a high-vacuum environment as described above; characterized in that: the control method includes the following steps: Obtain the test information of the test piece to be tested, the test information at least includes an environment control sequence and a position control sequence, the environment control sequence includes the environment data in the vacuum temperature change test tank at multiple test times, the environment data includes a target vacuum degree and a target temperature, and the position control sequence includes the first coordinates of the test piece to be tested at multiple test times; According to the position control sequence, obtain the first motion strategy of the turntable body; Control the vacuum temperature change test tank to operate under the environment control sequence, and control the movement of the turntable body with the first motion strategy, so that the test piece on the third support plate reaches the corresponding first coordinates at each test time.

[0007] According to the technical solution provided by the embodiment of the present application, the test information further includes a test type, and the test type at least includes a static test and a dynamic test; After obtaining the test information of the test piece to be tested and before obtaining the first motion strategy of the turntable body according to the position control sequence, the following steps are further included: Judge the test type; If the test type is the static test, collect multiple first initial images of the test piece to obtain a first initial image set; After controlling the movement of the turntable body with the first movement strategy, the following steps are further included: Collect multiple first test images of the test piece to obtain a first test image set; Compare the first test image set with the first initial image set to obtain the test result of the test piece; After determining the test type, the following steps are further included: If the test type is the dynamic test, obtain the target test area corresponding to the dynamic test, and the target test area is the surface area of the test piece; Obtain a second coordinate according to the target test area; Obtain a second movement strategy according to the current position coordinate of the acquisition component and the second coordinate; Before controlling the movement of the turntable body with the first movement strategy, the following steps are further included: Control the movement of the acquisition component with the second movement strategy so that the acquisition component is aligned with the target test area.

[0008] According to the technical solution provided by the embodiment of the present application, after controlling the movement of the acquisition component with the second movement strategy so that the acquisition component is aligned with the target test area, the following steps are further included: Collect a second initial image of the test piece, and the second initial image is an image of the target test area when the test piece is in an initial state; The specific steps of controlling the movement of the turntable body with the first movement strategy include the following: Control the movement of the turntable body with the first movement strategy, and obtain a second test image taken by the acquisition component every first preset time interval, and obtain a second test image set composed of multiple second test images in time sequence; After controlling the movement of the turntable body with the first movement strategy, the following steps are further included: Compare each second test image in the second test image set with the second initial image to obtain the test result of the test piece.

[0009] According to the technical solution provided by the embodiment of the present application, the specific steps of obtaining a second coordinate according to the target test area include the following: Obtain a three-dimensional structure model of the test piece and extract the geometric features of the target test area; Based on the geometric features, determine the exposure type of the target test area, where the exposure type at least includes the recessed type; If the exposure type of the target test area is the recessed type, obtain the point coordinates that make the shooting axis of the acquisition component parallel to the recessed direction according to the recessed direction, and use the point coordinates as the second coordinates.

[0010] According to the technical solution provided by the embodiment of the present application, the exposure type further includes the protruding type; After determining the exposure type of the target test area, the following steps are further included: Extract the protruding height of the target test area and the spatial distribution of adjacent structures; According to the protruding height, calculate the minimum vertical height of the acquisition component, and use the coordinates at the minimum vertical height as the coordinates directly above the target test area; Determine whether the spatial distribution of the adjacent structures will cause occlusion of the coordinates directly above; If not, use the coordinates directly above as the second coordinates.

[0011] According to the technical solution provided by the embodiment of the present application, after determining whether the spatial distribution of the adjacent structures will cause occlusion of the coordinates directly above, the following steps are further included; If so, offset the coordinates directly above according to the lateral exposure direction of the target test area to obtain the second coordinates, so that the included angle between the shooting axis of the acquisition component and the lateral exposure direction is less than the first preset angle.

[0012] According to the technical solution provided by the embodiment of the present application, after controlling the movement of the acquisition component with the second movement strategy, the following steps are further included: After the acquisition component reaches the second coordinates, capture the current image of the target test area through the acquisition component; Extract the feature points of the test piece to be tested in the current image, and calculate the offset vector of the feature points relative to the preset reference position; Generate a dynamic compensation instruction according to the offset vector to adjust the acquisition component until the offset vector is less than the first preset threshold.

[0013] Compared with the prior art, the beneficial effects of the present application are as follows: The acquisition component of the image acquisition mechanism in this solution can rotate around the first axis and / or move up and down along the third direction. In this way, when the shape of the test piece to be tested is special or it performs pitching and other actions, the acquisition component can flexibly adjust the shooting angle and position through its own rotation and lifting as well as the rotation of the third support plate, so as to effectively avoid the shooting blind area. Therefore, it can effectively solve the problem of shooting blind areas caused by the special shape of the test piece or complex movement actions in the traditional method, improve the comprehensiveness of image acquisition, ensure that images can be acquired for all parts and various action states of the test piece to be tested, and provide comprehensive data support for accurately evaluating the performance of the test piece. The structural design of this test bench enables it to be applicable to test pieces to be tested with various different shapes and different test action requirements, greatly broadening the application scope of the test bench in a high-vacuum environment. For example, when simulating vacuum environment tests on some aircraft parts with special shapes in the aerospace field, if it is necessary to photograph the area at the bottom on the back of the part, the acquisition component can be controlled to rotate around the first axis to the back side, and then the image of this area can be obtained by adjusting the height. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 FIG. is a schematic structural diagram of a test bench applicable to a high-vacuum environment provided by an embodiment of the present application; Figure 2 provided by an embodiment of the present application Figure 1 partial schematic view of A in; Figure 3 FIG. is a top-view structural schematic diagram of a test bench applicable to a high-vacuum environment provided by an embodiment of the present application; Figure 4 provided by an embodiment of the present application Figure 3 partial schematic view of B in; Figure 5 FIG. is a step flow chart of a control method for a test bench applicable to a high-vacuum environment provided by an embodiment of the present application.

[0015] The text annotations in the figure are indicated as: 1. Vacuum temperature change experiment tank; 2. Base body; 3. First electric telescopic rod; 4. First support plate; 5. Ball screw; 6. Second support plate; 7. Third support plate; 8. First rotating rod; 9. Second rotating rod; 10. First slider; 11. First sub-rod; 12. Second sub-rod; 13. Acquisition component; 14. First slide rail; 15. Annular chute; 16. Control system. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0016] The present application will be further described in detail below with reference to the accompanying drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the related invention, rather than limiting the invention. Additionally, it should be noted that for ease of description, only the parts related to the invention are shown in the drawings.

[0017] It should be noted that, without conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0018] Embodiment 1 As mentioned in the background art, in view of the problems in the prior art, the present application proposes a test bench that can be used in a high-vacuum environment, including: a turntable body installed in a vacuum temperature-changing test tank 1; Please refer to Figure 1 、 2 Figures 3 and 4 as shown, the turntable body includes: A base body 2, and the base body 2 is fixed on a support frame in the vacuum temperature-changing test tank 1; A first support plate 4, and the first support plate 4 is arranged on the side of the base body 2 away from the support frame, and the first support plate 4 can move on the base body 2 along a first direction; A second support plate 6, and the second support plate 6 is arranged on the side of the first support plate 4 away from the base body 2, and the second support plate 6 can move on the first support plate 4 along a second direction, and the second direction is perpendicular to the first direction; A third support plate 7, and the third support plate 7 is arranged on the side of the second support plate 6 away from the first support plate 4, and the third support plate 7 can rotate around a first axis, and an installation station for installing a test piece is provided on the third support plate 7; the extending direction of the first axis is a third direction, and the third direction is perpendicular to the first direction and the second direction respectively; An image acquisition mechanism, and the image acquisition mechanism is arranged on the third support plate 7. The image acquisition mechanism includes an acquisition component 13 arranged on the periphery of the installation station, and the acquisition component 13 can rotate around the first axis and / or move up and down along the third direction. The acquisition component 13 is a camera or a camera with a shooting function; Specifically, it further includes a control system 16 located outside the vacuum temperature-changing test tank 1, which is used to control the environment in the vacuum temperature-changing test tank 1, control the movement of the turntable body, and collect and process the experimental data in the vacuum temperature-changing test tank 1. The control system 16 is mainly used to execute the control method in Embodiment 2 later, and the control system 16 is electrically connected to each driving device on the turntable body.

[0019] In a preferred embodiment, a first rotating rod 8 is vertically provided on the second support plate 6. The first rotating rod 8 is connected to a second driving assembly for driving it to rotate around the first axis. An end of the first rotating rod 8 away from the second support plate 6 is vertically provided with a second rotating rod 9. The second rotating rod 9 is connected to a third driving assembly for driving it to rotate around a second axis. The extending direction of the second axis is the second direction.

[0020] Specifically, the first rotating rod 8 can also be directly hinged to the third support plate 7 to achieve pitching, or it can achieve pitching through the second rotating rod 9. The side of the second rotating rod 9 away from the first rotating rod 8 is connected to the third support plate 7.

[0021] Specifically, a pair of first electric telescopic rods 3 are provided on the upper surface of the base body 2 and are arranged in parallel. The ends of the pair of first electric telescopic rods 3 are respectively connected to the side edges on one side of the first support plate 4. The pair of first electric telescopic rods 3 drive the first support plate 4 to slide along the first direction on the upper surface of the base body 2. The first direction is the length direction of the base body 2 (rectangular). A ball screw 5 is provided on the first support plate 4. The setting direction of the ball screw 5 is perpendicular to the first electric telescopic rod 3. A connecting member is threadedly connected to the ball screw 5. A second support plate 6 is fixed on the surface of the connecting member away from the ball screw 5. A third support plate 7 is provided above the second support plate 6. A first rotating rod 8 is vertically arranged between the second support plate 6 and the third support plate 7. A second driving assembly for driving the first rotating rod 8 to rotate and a third driving assembly for driving the second rotating rod 9 to rotate are provided on the second support plate 6. The cooperation of the second rotating rod 9 and the first rotating rod 8 can achieve a motion state of both rotation and pitching, and the simulated scenarios can be more diversified. A first slide rail 14 is recessed inward on the surface of the base body 2 corresponding to the first electric telescopic rod 3. Balls are provided on the surface of the first support plate 4 close to the base body 2 corresponding to the first slide rail 14. Balls are respectively provided on both sides of the first support plate 4 corresponding to any one of the first slide rails 14. The balls are rotatably clamped in the first slide rail 14.

[0022] In a preferred embodiment, the acquisition assembly 13 realizes rotation around the first axis and / or lifting along the third direction through a first driving assembly. The first driving assembly includes an annular chute 15 provided on the third support plate 7. The annular chute 15 is provided on the outer periphery of the installation station. A first slider 10 is provided in the annular chute 15. A first lifting rod is vertically provided on the first slider 10. The acquisition assembly 13 is provided at the end of the first lifting rod away from the first slider 10.

[0023] Specifically, an annular slot 15 is provided on the third support plate 7, and a first lifting rod is fixedly connected to the first slider 10 slidably connected to the annular slot 15, and the first lifting rod can be a first sub-rod 11, and the end of the first sub-rod 11 is vertically connected to the second sub-rod 12, the first sub-rod 11 is vertically fixedly connected to the first slider 10, and one end of the first sub-rod 11 away from the first slider 10 is connected to the second sub-rod 12, and the collection component 13 is movably arranged on the second sub-rod 12. The first sub-rod 11 can be raised and lowered, and the second sub-rod 12 can be horizontally extended.

[0024] Specifically, the annular chute 15 can be set to a circular shape, which can provide 360° all-round rotation, so that the acquisition component 13 can shoot around the test piece without dead angles. When the center of the circle coincides with the first axis, it can ensure that the distance between the acquisition component 13 and the test piece is always relatively stable when rotating around the axis, which is conducive to the stability and consistency of image acquisition. It can also be set to an ellipse, which is suitable for the situation where the test piece needs a wider shooting angle or has a special motion trajectory in certain directions. When the motion range of the test piece in a certain direction is large, the elliptical annular chute 15 can give the acquisition component 13 a larger moving space in this direction and better track the motion of the test piece. For small test pieces, the distance between the annular chute 15 and the test piece is relatively close, which can be selected as 100-300 mm. In this way, while ensuring the clarity of the image, the shooting angle of the acquisition component 13 can be fully utilized to obtain more details. For large test pieces, in order to be able to fully capture the full picture and overall motion state of the test piece, the annular chute 15 may need to be 300-1000 mm away from the test piece.

[0025] Based on the test bench that can be used in a high-vacuum environment, multiple shooting modes can be achieved. For example, 360° surround shooting: The acquisition component 13 can rotate around the first axis in the circular annular chute 15, enabling 360° all-round surround shooting of the test piece to be tested, and can completely record the states of the test piece to be tested at various angles. For example, the entire surface of a spherical test piece can be completely photographed. Pitch shooting: By the cooperation of the second rotating rod 9 and the first rotating rod 8, the acquisition component 13 can be made to perform pitch motion, so that the test piece can be photographed from different angles. For example, a test piece in an inclined state can be photographed from multiple angles to simulate observing the test piece from different heights and angles. Multi-angle tracking shooting: When the test piece to be tested moves, the acquisition component 13 can not only rotate around the first axis, but also adjust its position through the annular chute 15, the lifting of the first sub-rod 11 and the horizontal telescoping of the second sub-rod 12, and track the movement of the test piece to be tested from multiple angles. For example, a certain part of a small aircraft model with a complex motion trajectory in the vacuum temperature change test tank 1 can be photographed with multi-angle tracking. Zoom shooting: By the horizontal telescoping of the second sub-rod 12, the distance between the acquisition component 13 and the test piece to be tested can be adjusted to achieve an effect similar to zooming, and the whole or local details of the test piece to be tested can be photographed according to needs. For example, a close-up photograph can be taken of some small parts on the test piece to be tested.

[0026] Based on the test bench that can be used in a high-vacuum environment, the shooting principle of multiple modes can be realized: The first support plate 4 can move along the first direction on the base body 2, and the second support plate 6 can move along the second direction on the first support plate 4, so that the third support plate 7 and the acquisition component 13 thereon can perform two-dimensional position adjustment on the plane and can be aligned with different positions of the test piece to be tested. At the same time, the acquisition component 13 can be lifted and lowered along the third direction through the first lifting rod in the first driving component, realizing position adjustment in three-dimensional space to ensure that a suitable shooting position can be reached. The third support plate 7 can rotate around the first axis, so that the acquisition component 13 mounted thereon can perform angular adjustment in the horizontal direction around this axis. The cooperation of the second rotating rod 9 and the first rotating rod 8 enables the acquisition component 13 to perform pitch motion, further increasing the dimension of angular adjustment and enabling the test piece to be photographed from different inclination angles. When the test piece to be tested moves, the control system 16 can control the movement of the first support plate 4 and the second support plate 6, the rotation of the third support plate 7, and the rotation, lifting and telescoping of the acquisition component 13 according to the movement trajectory of the test piece to be tested and the preset shooting strategy, so that the acquisition component 13 can track the movement of the test piece to be tested in real time and maintain effective shooting of the test piece.

[0027] Embodiment 2 On the basis of Embodiment 1, this embodiment proposes a control method for a test bench that can be used in a high-vacuum environment, which is realized based on the test bench that can be used in a high-vacuum environment as described above; as Figure 5As shown in the figure. The control method includes the following steps: S1. Obtain the test information of the test piece to be tested. The test information at least includes an environment control sequence and a position control sequence. The environment control sequence includes environmental data in the vacuum temperature change test chamber 1 at multiple test times. The environmental data includes a target vacuum degree and a target temperature. The position control sequence includes the first coordinates of the test piece to be tested at multiple test times. S2. Obtain the first motion strategy of the turntable body according to the position control sequence. Specifically, according to the first coordinates in the position control sequence, using a kinematic algorithm and the motion ability of the turntable body, calculate the first motion strategy of the turntable body.

[0028] Exemplarily, when testing a satellite antenna model, the test information shows that at the 1st second, the target vacuum degree is Pa, the target temperature is -50°C, and the first coordinates of the test piece to be tested are (10, 20, 30) (assuming this is the coordinate in a spatial rectangular coordinate system). At the 2nd second, the target vacuum degree is Pa, the target temperature is -60°C, and the first coordinates are (15, 25, 35). According to this information, the control system 16 determines the moving distances of the first support plate 4 and the second support plate 6 and the rotation angle of the third support plate 7 through the difference analysis of the first coordinates, so as to calculate the first motion strategy. For example, the first support plate 4 needs to move 5 units along the first direction, the second support plate 6 moves 5 units along the second direction, and the third support plate 7 rotates a certain angle around the first axis to realize the conversion from the first position (the first coordinates corresponding to the 1st second) to the second position (the first coordinates corresponding to the 2nd second). Similarly, the following is deduced by analogy.

[0029] S3. Control the vacuum temperature change test chamber 1 to operate under the environment control sequence, and control the movement of the turntable body with the first motion strategy, so that the test piece on the third support plate 7 reaches the corresponding first coordinates at each test time.

[0030] Based on the coordinate information in the position control sequence, the control system 16 converts the coordinates into motion commands of each motion component according to the motion ability and motion constraints of each part of the turntable body. For translational motion, calculate the displacement of the corresponding support plate according to the coordinate difference at different times; for rotation, calculate the rotation angle of the third support plate 7 according to the angle change. Ensure that the test piece can accurately reach the predetermined position at different test times, so that the test is carried out under the specified spatial position conditions, improving the accuracy and repeatability of the test.

[0031] In a preferred embodiment, the test information further includes a test type, and the test type includes at least a static test; After obtaining the test information of the test piece to be tested, before obtaining the first motion strategy of the turntable body according to the position control sequence, the following steps are further included: Judge the test type; If the test type is the static test, collect multiple first initial images of the test piece to be tested to obtain a first initial image set; After controlling the movement of the turntable body with the first motion strategy, the following steps are further included: Collect multiple first test images of the test piece to be tested to obtain a first test image set; Compare the first test image set with the first initial image set to obtain the test result of the test piece to be tested.

[0032] Specifically, when it is determined that the test type is a static test, the control system 16 first controls the acquisition component 13 to take pictures of the test piece to be tested at multiple angles when it is stationary (before the vacuum low-temperature test), and stores multiple first initial images in the first initial image set. After the turntable body completes the test according to the first motion strategy, the test piece at the same position is photographed again to obtain a first test image set. The first initial images and the first test images at the corresponding positions in the first test image set and the first initial image set are compared one by one through image feature point matching and pixel value comparison to find the differences between the images and obtain the test result of the test piece to be tested.

[0033] Exemplarily, when performing a static test on a high-precision mechanical part, before the test, the acquisition component 13 takes multiple first initial images of the part from different angles. After the test is completed, the position of the part remains unchanged, and a new first test image set is acquired. If a small deformation occurs in a certain part of the part during the test, when comparing the first test image set with the first initial image set, it will be found that the pixel values or the positions of the feature points of the corresponding first initial image and the first test image of this part have changed. Then, combined with the required precision of the application of this part, the test result is obtained. For example, if the precision requirement is extremely high and there cannot be any degree of deformation when moving in a vacuum low-temperature environment, the obtained test result is unqualified.

[0034] This embodiment provides an implementation manner of collecting images by the acquisition component 13 in a static test scenario, where local images of the test piece to be tested can be collected at multiple angles and stitched into an overall image, or local images that are difficult to capture of the test piece to be tested can be collected. For example, for the local part near the bottom of the test piece to be tested, the third support plate 7 can be controlled to perform a pitching motion to lift this part, and then the first slider 10 is slid to the corresponding direction of this part, and the back that cannot be captured by the traditional solution can be photographed by adjusting the height of the first sub-bar 11 and the extension length of the second sub-bar 12.

[0035] In a preferred embodiment, the test type further includes a dynamic test; After determining the test type, the following steps are further included: If the test type is the dynamic test, the target test area corresponding to the dynamic test is obtained, and the target test area is the surface area of the test piece to be tested; According to the target test area, a second coordinate is obtained; Specifically, three-dimensional modeling is performed on the test piece to be tested or a known geometric model is used, and the geometric information of the test piece to be tested is stored in the control system 16. When it is determined that the target test area is the surface area of the test piece to be tested, its coordinates can be determined by the relative position relationship of this area on the test piece model.

[0036] Further, the obtaining the second coordinate according to the target test area specifically includes the following steps: Obtain the three-dimensional structure model of the test piece to be tested, and extract the geometric features of the target test area; Specifically, the test piece to be tested is scanned in all directions by a laser three-dimensional scanner to obtain accurate three-dimensional point cloud data, and then a three-dimensional structure model is generated. The geometric features include information such as the shape, size, and depth of the target test area.

[0037] Based on the geometric features, the exposure type of the target test area is judged, and the exposure type at least includes the recessed type; Specifically, the rule for judging the exposure type of the target test area is as follows: From a structural perspective, if the test piece to be tested has a recessed groove structure and its target test area is in a similar position inside the groove, it can be judged as the recessed type. From the perspective of the exposure situation: for a test piece with a regular shape, when it is placed at the installation station of the third support plate 7 in a specific manner, if the target test area is not exposed when viewed from directly above, that is, the target test area cannot be photographed due to being blocked by other parts of the test piece itself when photographed from directly above, this situation also belongs to the recessed type.

[0038] If the exposure type of the target test area is the recessed type, then according to the recessed direction, obtain the point coordinates that make the shooting axis of the acquisition component 13 parallel to the recessed direction, and use the point coordinates as the second coordinates; Exemplarily, the test piece to be tested is a cube standing on the third support plate 7 with an edge, and the target test area is a side surface of the cube close to the third support plate 7 at the bottom, and dynamic tests need to be performed on it. Then, through the traditional scheme, shooting can only be carried out above the test piece to be tested. At this time, it is impossible to perform dynamic tests on this target test area because the target test area is blocked by the upper part during shooting and cannot be photographed. Then, in this case, the second coordinates can be set at the point where the shooting axis of the acquisition component 13 is parallel to the recessed direction, that is, shooting on the flush side surface, so as to achieve the technical effect of dynamic tracking shooting and adapt to more diverse test scenarios.

[0039] Furthermore, the exposure type also includes the protruding type; After determining the exposure type of the target test area, the following steps are further included: Extract the protruding height of the target test area and the spatial distribution of adjacent structures; Exemplarily, use modeling software to extract the protruding height of the target test area (the top surface of the small cylinder) and the spatial distribution information of adjacent structures (surrounding irregular structures) in the previously constructed three-dimensional structure model. For example, measure the height of the small cylinder as 5 mm through the software, and at the same time record the position, shape, etc. of the surrounding irregular structures; According to the protruding height, calculate the minimum vertical height of the acquisition component 13, and use the coordinates at the minimum vertical height as the directly above coordinates of the target test area; Specifically, parameters such as the lens view angle and resolution of the acquisition component 13 are known. With the goal of being able to clearly and completely photograph the target test area (the top surface of the small cylinder), calculate the minimum vertical height (this height is obtained based on ensuring imaging quality and coverage). Use the coordinates at the minimum vertical height from the target test area (the top surface of the small cylinder) as the directly above coordinates.

[0040] Judge whether the spatial distribution of the adjacent structures will cause occlusion at the directly above coordinates; Specifically, analyze the model through modeling software to judge whether the surrounding irregular structures will block the shooting line of sight of the acquisition component 13 at the directly above coordinates.

[0041] If not, use the directly above coordinates as the second coordinates; If there is no occlusion, directly use the calculated directly above coordinate as the second coordinate. When actually controlling the movement of the acquisition component 13, according to the second coordinate, precisely control the movement of the acquisition component 13 to the corresponding position through the control system of the test bench.

[0042] Further, after determining whether the spatial distribution of the adjacent structures will cause occlusion of the directly above coordinate, the following steps are also included; If so, offset the directly above coordinate according to the lateral exposure direction of the target test area to obtain the second coordinate, so that the included angle between the shooting axis of the acquisition component 13 and the lateral exposure direction is less than the first preset included angle.

[0043] Exemplarily, in this scenario, the target test area is a marked area on the side of the above-mentioned protruding small cylinder, and there is occlusion at the directly above coordinate of the surrounding adjacent structures. The lateral exposure direction of this marked area is a direction parallel to a certain edge of the specimen to be tested. Assuming the first preset included angle is 30°, through the respective driving elements of the test bench, offset the directly above coordinate along a direction with an included angle less than 30° with the lateral exposure direction. For example, make the included angle between its shooting axis and the lateral exposure direction be 20°, and obtain the offset coordinate as the second coordinate.

[0044] This embodiment can find a suitable shooting angle in the case where the shooting path directly above the target test area of the specimen to be tested is blocked by other structures, ensuring that the shooting line of sight of the acquisition component 13 is not blocked.

[0045] Further, if the exposure type of the target test area is the planar type, generate the directly above coordinate of the geometric center of the target test area as the second coordinate. This situation is the easiest to shoot, and directly move the acquisition component 13 to directly above the target test area for vertical shooting.

[0046] Exemplarily, if the specimen to be tested is a regular cuboid, its center is located at the origin of the spatial rectangular coordinate system, and the length, width, and height are L, W, and H respectively. Assuming the target test area is a face of the cuboid, its coordinate range can be determined according to its position on the cuboid. If the target test area is a part of the top surface of the cuboid, its range can be represented by to Here, and are the planar coordinates of this area on the top surface of the cuboid. Take the center of this target test area as the second coordinate , and the second coordinate can be calculated as , , where H is the height of the top surface of the cuboid, and thus the center coordinate of the target test area, that is, the second coordinate, is obtained.

[0047] Based on the current position coordinates of the acquisition component 13 and the second coordinates, obtain a second motion strategy; Exemplarily, it is known that the current position coordinates are , calculate the difference between the current position coordinates and the second coordinates. The displacement in the x direction is , the displacement in the y direction is , and the displacement in the z direction is .

[0048] Further, based on the displacement and the motion characteristics of the acquisition component 13, determine the motion strategy. For example, if the acquisition component 13 can reach the target position through translational and lifting motions, and the motion speeds in the x, y, and z directions are respectively , , , then the time required for the motion can be calculated , , , use linear interpolation to generate the corresponding motion trajectory. This motion trajectory is the second motion strategy, and the motion trajectory equation is that within the time t , the position of the acquisition component 13 in the x direction can be expressed as , . Similarly, the positions in the y direction and the z direction can be obtained.

[0049] Further, after controlling the motion of the acquisition component 13 with the second motion strategy, the following steps are further included: After the acquisition component 13 reaches the second coordinates, capture the current image of the target test area through the acquisition component 13; Extract the feature points of the test piece to be tested in the current image, and calculate the offset vector of the feature points relative to the preset reference position; Generate a dynamic compensation instruction according to the offset vector to adjust the acquisition component 13 until the offset vector is less than the first preset threshold.

[0050] Specifically, since the first driving components that drive the acquisition component 13 to act are all mechanical transmission components, the gaps and return errors thereof may cause deviations between the actual position of the third support plate and the theoretical coordinates. Therefore, after the acquisition component 13 reaches the second coordinate, it is necessary to first check whether the acquisition component has accurately reached the position where the target acquisition area can be completely photographed through this embodiment. Specifically, during the movement process, the position of the acquisition component is monitored in real time by means of a position feedback sensor (such as an encoder). Once it is detected that the acquisition component reaches the theoretically second coordinate position, the action of the first driving component is immediately stopped. Based on the initial calibration image of the specimen to be tested, at least 3 non-collinear feature points (such as edge intersection points, laser etching marks, etc.) are pre-marked in the target test area. The pixel coordinates of the feature points are extracted from the current image by using the SIFT (Scale-Invariant Feature Transform) algorithm, and the pixel coordinates of the feature points in the current image are converted into three-dimensional space coordinates through the camera calibration parameters (intrinsic matrix, distortion coefficient), and compared with the three-dimensional coordinates of the preset reference position to calculate the offset amounts of each feature point in the X, Y, and Z directions. The average offset vector (including the average offset vector in the X direction, the average offset vector in the Y direction, and the average offset vector in the Z direction) can be obtained according to the offset amounts in the X, Y, and Z directions.

[0051] Specifically, the dynamic compensation instruction includes translation compensation and focusing compensation. If the average offset vector in the X direction or the average offset vector in the Y direction exceeds the threshold (such as ±0.1 mm), translation compensation is performed, specifically, controlling the acquisition component 13 to rotate along the annular chute 15 or the first lifting rod to lift, so that the optical axis of the camera is aligned with the center of the target area. If the average offset vector in the Z direction exceeds the depth of field allowable range (determined by the optical parameters of the lens), focusing compensation is performed, specifically, adjusting the vertical height of the first lifting rod so that the target area is within the clear imaging focal plane.

[0052] Before controlling the movement of the turntable body with the first motion strategy, the following steps are further included: Controlling the movement of the acquisition component 13 with the second motion strategy so that the acquisition component 13 is aligned with the target test area.

[0053] Specifically, since the acquisition component 13 is arranged on the third support plate 7, when the first support plate 4 and the second support plate 6 perform translational movements and the third support plate 7 performs rotational and pitching movements, the acquisition component 13 moves synchronously with the specimen to be tested, so that tracking shooting in a certain direction of the specimen to be tested can be realized. For dynamic testing, first determine the target test area on the surface of the specimen to be tested, such as the surface of a certain vulnerable component. According to the position of this area, the second coordinate is calculated, and then the control system 16 controls the movement of the acquisition component 13 to align it with the target test area.

[0054] Exemplarily, when dynamically testing a flight simulation component, if a certain area on the wing surface is set as the target test area, the second coordinate is obtained by measuring the position of this area in the coordinate system of the test piece to be tested. Assume that the current position of the acquisition component 13 is (100, 100, 100), and the second coordinate of the target test area is (120, 120, 120). The control system 16 calculates the displacements required for the acquisition component 13 in each direction and generates the second motion strategy.

[0055] Further, after controlling the movement of the acquisition component 13 with the second motion strategy to align the acquisition component 13 with the target test area, the following steps are further included: Acquire the second initial image of the test piece to be tested, where the second initial image is an image of the target test area when the test piece to be tested is in the initial state; And controlling the movement of the turntable body with the first motion strategy specifically includes the following steps: Control the movement of the turntable body with the first motion strategy, and at every first preset time interval, obtain the second test image captured by the acquisition component 13, and sequentially obtain a second test image set composed of multiple second test images; After controlling the movement of the turntable body with the first motion strategy, the following steps are further included: Compare each second test image in the second test image set with the second initial image to obtain the test result of the test piece to be tested.

[0056] Specifically, when the acquisition component 13 has aligned with the target test area according to the second motion strategy, the control system 16 triggers the image acquisition mechanism to capture one or more second initial images. These images clearly record information such as the appearance, texture, and structure of the target test area of the test piece to be tested in its initial state. For example, for a satellite solar panel being tested, if the target test area is a certain local area of the panel, the acquisition component 13 will take a picture of this area to obtain an initial state image when it is not affected by any environmental or performance tests. According to the first motion strategy, the control system 16 sends instructions to the driving devices of the turntable body, causing the turntable body to start moving. At the same time, during the movement of the turntable body, every first preset time period (for example, every 0.5 seconds), the acquisition component 13 is triggered to capture a second test image. These images are stored in chronological order to form a second test image set. For example, when testing a rotating mechanical component, the turntable body may drive the component to rotate or translate, and the acquisition component 13 will continuously take timed pictures of the target test area. Using the image analysis algorithms mentioned above, each image in the second test image set is compared with the second initial image. Pixel-based comparison methods can be used, such as calculating the pixel difference between the two images, or feature point matching algorithms (such as SIFT, SURF, or ORB algorithms) can be used to detect changes in the feature points of the images. For the testing of mechanical components, problems such as wear, deformation, and displacement during the movement of the component may be detected; for electronic components, color changes caused by component heating, abnormal circuit connections, etc. may be detected.

[0057] Specifically, the first motion strategy is based on the kinematic principle of the turntable body. According to the position control sequence at different times, by driving the moving parts (such as electric telescopic rods, ball screws 5, rotating rods, etc.) of the first support plate 4, the second support plate 6, and the third support plate 7, precise movement of the turntable is achieved.

[0058] This embodiment can monitor the state changes of the target test area in real-time during the dynamic test process, and promptly discover potential performance problems or abnormal situations. For complex moving parts, it can track their performance evolution in detail, providing accurate data support for product performance evaluation and quality control.

[0059] In a preferred embodiment, the acquisition of multiple first initial images of the test piece to obtain a first initial image set specifically includes the following steps: According to the structural parameters of the test piece, the test piece is divided into multiple total shooting areas; According to the shooting angle of view of the acquisition component 13, each of the total shooting areas is divided into multiple sub-shooting areas; Obtain the third coordinate corresponding to each of the sub - shooting areas according to each of the sub - shooting areas; Arrange the third coordinates according to the position order of the sub - shooting areas to obtain a coordinate sequence; Control the acquisition component 13 to move according to the coordinate sequence, obtain the first initial images taken when the acquisition component 13 is at each of the third coordinates, and further obtain a first initial image set.

[0060] Further, before dividing the test piece to be tested into a plurality of total shooting areas according to the structural parameters of the test piece to be tested, the following steps are included: Judge whether the shooting wide - angle of the acquisition component 13 is sufficient to cover the exposed surface of the test piece to be tested; The step of dividing the test piece to be tested into a plurality of total shooting areas according to the structural parameters of the test piece to be tested specifically includes the following steps: If not, divide the test piece to be tested into a plurality of total shooting areas according to the structural parameters of the test piece to be tested.

[0061] Specifically, the control system 16 obtains the shooting wide - angle parameter of the acquisition component 13, and combines the geometric dimension information of the test piece to be tested to judge whether the acquisition component 13 can cover the exposed surface of the test piece to be tested at one time. The control system 16 calculates whether it can completely shoot the surface of the test piece to be tested according to the length and width of the test piece to be tested and the horizontal and vertical viewing angles of the acquisition component 13.

[0062] If the shooting wide - angle is not sufficient to cover the exposed surface, divide it into a plurality of total shooting areas according to the structural parameters of the test piece to be tested. For a complex mechanical structure with an irregular shape, it can be divided according to its functional components or geometric features. For a structure with a regular shape, it can be evenly divided (for example, a cylinder is evenly divided into 3 total shooting areas from top to bottom). For each total shooting area, according to the shooting wide - angle of the acquisition component 13, it is further divided into a plurality of sub - shooting areas. Considering the angular range of the shooting wide - angle, the total area is divided into several small areas to ensure that each sub - area can be within the shooting range of the acquisition component 13 (for example, for the 3 total shooting areas of a cylinder, each total shooting area is divided into 4 sub - shooting areas). For each sub - shooting area, calculate its corresponding third coordinate according to its position in the total area and the entire test piece to be tested. For example, according to its position in the space rectangular coordinate system, the intersection of the first extension line (the first extension line is perpendicular to the tangent plane of the center point of the sub - shooting area) passing through the center point of the sub - shooting area and the extension plane of the circular track is used as the third coordinate. Arrange the third coordinates of all sub - shooting areas in their position order into a coordinate sequence for the acquisition component 13 to access in sequence. The control system 16 controls the acquisition component 13 to move to each third coordinate in sequence according to the coordinate sequence, shoot the corresponding sub - shooting area, and obtain a first initial image set.

[0063] In this embodiment, for a large or complex-shaped test piece, it is possible to avoid missing some areas due to the limitation of the shooting wide angle, ensure that the initial image set can comprehensively reflect the initial state of the test piece, provide a complete reference for change detection in subsequent tests, and help improve the reliability and integrity of the test.

[0064] In a preferred embodiment, after determining whether the shooting wide angle of the acquisition component 13 is sufficient to cover the exposed surface of the test piece, the following steps are further included: If so, control the acquisition component 13 to move to the fourth coordinate to obtain the first initial images taken at each different shooting parameter, and then obtain the first initial image set; the shooting parameters at least include the exposure time and the aperture size.

[0065] Specifically, when it is determined that the shooting wide angle of the acquisition component 13 is sufficient to cover the exposed surface of the test piece, the control system 16 moves the acquisition component 13 to the fourth coordinate (the position coordinate where the acquisition component 13 can capture the entire view of the test piece) to obtain a panoramic image of the test piece. At the same time, different shooting parameters are adjusted, such as changing the exposure time and the aperture size, to obtain images with different lighting and depth-of-field effects. For example, for a small electronic chip, the acquisition component 13 can be moved to directly above, diagonally above the chip, etc., and at the same time, the exposure time is adjusted from short to long, and the aperture is adjusted from large to small, to capture multiple groups of first initial images. At the fourth coordinate and with different shooting parameters, the acquisition component 13 performs the shooting operation, and stores the captured images as the first initial image set.

[0066] Exemplarily, to test a microprocessor chip, the wide angle of the acquisition component 13 can cover the entire surface of the chip. Move the acquisition component 13 to above the center of the chip (the fourth coordinate), and at the same time set the exposure time to 1 millisecond, 5 milliseconds, 10 milliseconds, and the aperture to different combinations such as f / 2.8, f / 4, f / 5.6, and shoot respectively to obtain multiple groups of first initial images.

[0067] This embodiment can obtain richer initial image data. For some test pieces whose surface details or textures are greatly affected by light, through different combinations of exposure time and aperture, their details can be better presented, providing a more comprehensive reference for subsequent tests, and helping to detect problems that may occur under different lighting conditions, such as tiny scratches on the surface, uneven coating, etc.

[0068] In this article, specific examples are used to illustrate the principles and implementation manners of the present application. The descriptions of the above embodiments are only for helping to understand the method and its core idea of the present application. The above are only the preferred implementation manners of the present application. It should be noted that due to the limited nature of written expression and objectively there are infinite specific structures, for those of ordinary skill in the art in this technical field, without departing from the principles of the present invention, several improvements, refinements or changes can also be made, or the above technical features can be combined in an appropriate manner; these improvements, refinements, changes or combinations, or directly applying the concept and technical solution of the invention to other occasions without improvement, shall all be regarded as the protection scope of the present application.

Claims

1. A test bench that can be used in a high vacuum environment, characterized in that: include: A turntable body installed in a vacuum temperature change test tank (1); The turntable body comprises: A base body (2), the base body (2) being fixed on a support frame in the vacuum temperature change test tank (1); a first support plate (4), the first support plate (4) being arranged on a side of the base body (2) away from the support frame, and the first support plate (4) being movable on the base body (2) along a first direction; a second support plate (6), the second support plate (6) being arranged on a side of the first support plate (4) away from the base body (2), the second support plate (6) being movable on the first support plate (4) along a second direction, the second direction being perpendicular to the first direction; a third support plate (7), the third support plate (7) being arranged on a side of the second support plate (6) away from the first support plate (4), the third support plate (7) being rotatable about a first axis, the third support plate (7) being provided with an installation station for installing a test piece; the extension direction of the first axis is a third direction, the third direction being perpendicular to the first direction and the second direction respectively; An image acquisition mechanism, the image acquisition mechanism being arranged on the third support plate (7), the image acquisition mechanism comprising an acquisition component (13) arranged on the periphery of the installation station, the acquisition component (13) being capable of rotating about the first axis and / or lifting and lowering along the third direction.

2. The test bench that can be used in a high vacuum environment according to claim 1, characterized in that: The collecting component (13) is rotated about the first axis and / or lifted and lowered along the third direction by a first driving component; the first driving component comprises an annular slide groove (15) provided on the third support plate (7), the annular slide groove (15) being provided on the periphery of the installation station, a first slider (10) being provided in the annular slide groove (15), a first lifting rod being vertically provided on the first slider (10), and the collecting component (13) being provided at an end of the first lifting rod away from the first slider (10).

3. The test bench that can be used in a high vacuum environment according to claim 1, characterized in that: A first rotating rod (8) is vertically arranged on the second supporting plate (6), the first rotating rod (8) is connected to a second driving assembly for driving the first rotating rod to rotate about the first axis, a second rotating rod (9) is vertically arranged on the end of the first rotating rod (8) away from the second supporting plate (6), the second rotating rod (9) is connected to a third driving assembly for driving the first rotating rod to rotate about the second axis, and the side of the second rotating rod (9) away from the first rotating rod (8) is connected to the third supporting plate (7); the extension direction of the second axis is the second direction.

4. A control method for a test bench that can be used in a high vacuum environment, based on the test bench that can be used in a high vacuum environment as claimed in any one of claims 1 to 3; characterized in that: The control method comprises the following steps: Acquiring test information of the test object, the test information at least comprising an environment control sequence and a position control sequence, the environment control sequence comprising environment data in the vacuum temperature change test tank (1) at multiple test moments, the environment data comprising a target vacuum degree and a target temperature, the position control sequence comprising first coordinates of the test object at multiple test moments; According to the position control sequence, a first motion strategy of the turntable body is obtained; The vacuum temperature change test tank (1) is controlled to operate under the environmental control sequence, and the turntable body is controlled to move according to the first motion strategy, so that the test piece on the third support plate (7) reaches the corresponding first coordinate at each test time.

5. The control method of the test bench that can be used in a high vacuum environment according to claim 4 is characterized in that: The test information also includes a test type, and the test type includes a static test and a dynamic test; After acquiring the test information of the test piece and before obtaining the first motion strategy of the turntable body according to the position control sequence, the following steps are also included: Determining the test type; If the test type is the static test, collecting a plurality of first initial images of the object to be tested to obtain a first initial image set; After the motion of the turntable body is controlled by the first motion strategy, the following steps are also included: Acquiring a plurality of first test images of the object to be tested to obtain a first test image set; Comparing the first test image set with the first initial image set to obtain a test result of the object to be tested; After determining the test type, the following steps are also included: If the test type is the dynamic test, obtaining a target test area corresponding to the dynamic test, wherein the target test area is a surface area of ​​the object to be tested; According to the target test area, a second coordinate is obtained; Obtaining a second motion strategy according to the current position coordinates of the acquisition component (13) and the second coordinates; Before controlling the movement of the turntable body with the first movement strategy, the following steps are also included: The second motion strategy is used to control the movement of the acquisition component (13) so that the acquisition component (13) is aligned with the target test area.

6. The control method of the test bench that can be used in a high vacuum environment according to claim 5, characterized in that: After controlling the movement of the acquisition component (13) using the second movement strategy so that the acquisition component (13) is aligned with the target test area, the following steps are also included: Acquiring a second initial image of the test piece, where the second initial image is an image of the target test area when the test piece is in an initial state; The method of controlling the movement of the turntable body according to the first movement strategy specifically includes the following steps: Controlling the movement of the turntable body with the first movement strategy, obtaining a second test image captured by the acquisition component (13) at intervals of a first preset time, and obtaining a second test image set consisting of a plurality of the second test images in a time sequence; After the motion of the turntable body is controlled by the first motion strategy, the following steps are also included: Each of the second test images in the second test image set is compared with the second initial image to obtain a test result of the test object.

7. The control method of the test bench that can be used in a high vacuum environment according to claim 5, characterized in that: The obtaining of the second coordinate according to the target test area specifically comprises the following steps: Acquire the three-dimensional structural model of the object to be tested and extract the geometric features of the target test area; Based on the geometric features, determining an exposure type of the target test area, the exposure type at least comprising a recessed type; If the exposure type of the target test area is the recessed type, then based on the recessed direction, the point coordinates that make the shooting axis of the acquisition component (13) parallel to the recessed direction are obtained, and the point coordinates are used as the second coordinates.

8. The control method of the test bench that can be used in a high vacuum environment according to claim 5, characterized in that: The exposure type also includes a protruding type; After determining the exposure type of the target test area, the following steps are also included: Extracting the protrusion height of the target test area and the spatial distribution of adjacent structures; Calculating the minimum vertical height of the collection component (13) according to the protruding height, and using the coordinates at the minimum vertical height as the coordinates directly above the target test area; Determining whether the spatial distribution of the adjacent structures will cause occlusion of the directly above coordinate; If not, the directly above coordinate is used as the second coordinate.

9. The control method of the test bench that can be used in a high vacuum environment according to claim 8, characterized in that: After determining whether the spatial distribution of the adjacent structures will cause the upper coordinate to be blocked, The steps include: If so, the upper coordinate is offset according to the lateral exposure direction of the target test area to obtain the second coordinate, so that the angle between the shooting axis of the acquisition component (13) and the lateral exposure direction is smaller than a first preset angle.

10. The control method of the test bench that can be used in a high vacuum environment according to claim 5, characterized in that: After controlling the movement of the acquisition component (13) using the second movement strategy, the following steps are also included: After the acquisition component (13) reaches the second coordinate, the current image of the target test area is photographed by the acquisition component (13); Extracting feature points of the test object in the current image, and calculating an offset vector of the feature points relative to a preset reference position; A dynamic compensation instruction is generated according to the offset vector to adjust the acquisition component (13) until the offset vector is smaller than a first preset threshold.

Images