A device and method for detecting and analyzing polarization based on dual-polarization modulation in strong light

Abstract

The application discloses a kind of based on dual polarization modulation's anti strong light polarization detection analysis device and method, it is related to optical detection field, device includes: dual polarization modulation imaging system and analysis system;Dual polarization modulation imaging system is arranged on the light path of measured target, dual polarization modulation imaging system is connected with analysis system;Dual polarization modulation imaging system is used to obtain from different detection angle under the receiving measured target's modulated light, and the modulated light of measured target under different detection angle is rotated polarization filtering twice, and obtains the data to be analyzed under different detection angle;Analysis system is used to analyze and screen the data to be analyzed under different detection angle, and obtains target image;The application is realized to the effective suppression of strong light by dual polarization modulation imaging system, by analysis system, the analysis and screening of the image after dual polarization filtering under different detection angle, obtain high-quality target image, improve the accuracy and reliability of detection result.

Description

Technical Field

[0001] This application relates to the field of optical detection, and in particular to a device and method for resisting strong light polarization detection and analysis based on dual polarization modulation. Background Technology

[0002] In target detection, the intensity of light is crucial to image quality, and strong light backgrounds negatively impact detection performance. First, strong light causes overexposure, leading to image distortion and an inability to clearly present the intended information. Second, strong light causes reflections, blurring objects in the image. Finally, strong light can damage the detector, shortening its lifespan. Strong light suppression technology has been widely applied in various fields. In the military, it can be used to reconnoiter military targets such as drones and missiles. In astronomy, it can address space observation in low-light conditions. In daily life, it can be used for security monitoring in smart home systems, ensuring image clarity and realism. In the medical field, it can be used to monitor precision medical instruments, ensuring medical personnel can clearly see the patient's condition. In the transportation field, it can be used for traffic monitoring and vehicle cameras, ensuring image clarity and realism and improving traffic safety.

[0003] Traditional imaging systems suffer from poor detection capabilities, color distortion, and blurriness under strong light, making it difficult to effectively detect and identify targets. Currently, several challenges remain in the field of strong light detection: existing strong light detection technologies largely rely on image processing techniques, which suffer from high algorithmic complexity, susceptibility to environmental influences, and low real-time response capabilities; research on achieving similar results at the hardware level through hardware-based devices is limited; furthermore, the current technological system lacks a comprehensive image quality assessment and screening mechanism, resulting in inconsistent image quality and severely impacting the accuracy and reliability of detection results. Summary of the Invention

[0004] The purpose of this application is to provide a device and method for strong light polarization detection and analysis based on dual polarization modulation, which can effectively suppress complex strong light, obtain high-quality target images, and improve the accuracy and reliability of detection results.

[0005] In a first aspect, this application provides a dual-polarization modulation-based anti-strong light polarization detection and analysis device. The device is positioned on the optical path of the modulated light beam of the target under test in a strong light environment. The strong light includes at least one of coherent light and incoherent light. The dual-polarization modulation-based anti-strong light polarization detection and analysis device comprises: a dual-polarization modulation imaging system and an analysis system. The dual-polarization modulation imaging system is positioned on the optical path of the target under test and connected to the analysis system. The dual-polarization modulation imaging system is used to acquire the modulated light beam of the target under test received from different detection angles, perform two rotation polarization filters on the modulated light beam of the target under test at different detection angles, and acquire the data to be analyzed at different detection angles. The analysis system is used to analyze and filter the data to be analyzed at different detection angles to obtain a target image. The data to be analyzed includes: the intensity of the modulated light beam of the target under test, the intensity of the modulated light beam after dual polarization filtering, the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering.

[0006] Secondly, this application provides a method for anti-strong light polarization detection and analysis based on dual polarization modulation. This method is applied to the aforementioned dual polarization modulation-based anti-strong light polarization detection and analysis device. The dual polarization modulation-based anti-strong light polarization detection and analysis device includes at least an analysis system. The method includes: acquiring data to be analyzed at different detection angles; the data to be analyzed includes: the intensity of the modulated light from the target object, the intensity of the modulated light after dual polarization filtering, the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering; and calculating... Calculate the contrast and standard deviation of the image after dual polarization filtering at each detection angle; calculate the extinction rate at each detection angle based on the intensity of the modulated light of the target object at each detection angle and the intensity of the modulated light after dual polarization filtering at each detection angle; calculate the signal-to-noise ratio of the image after dual polarization filtering at each detection angle using the PG model based on the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering at each detection angle; and filter the images after dual polarization filtering at all detection angles based on the contrast, standard deviation, extinction rate, and signal-to-noise ratio to obtain the target image.

[0007] Based on the specific embodiments provided in this application, the following technical effects are disclosed in this application.

[0008] This application utilizes a dual-polarization modulation imaging system to perform dual-polarization combination modulation on targets under various complex and intense light environments, achieving effective suppression of complex and intense light. By analyzing and filtering images after dual-polarization filtering at different detection angles through an analysis system, high-quality target images are obtained, improving the accuracy and reliability of the detection results. Attached Figure Description

[0009] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0010] Figure 1 A schematic diagram of the structure of a strong light polarization detection and analysis device based on dual polarization modulation provided in this application embodiment. Figure 1 .

[0011] Figure 2 A schematic diagram of the structure of a strong light polarization detection and analysis device based on dual polarization modulation provided in this application embodiment. Figure 2 .

[0012] Figure 3 A schematic diagram of the structure of a strong light polarization detection and analysis device based on dual polarization modulation provided in this application embodiment. Figure 3 .

[0013] Figure 4 This is a flowchart illustrating a method for resisting strong light polarization detection and analysis based on dual polarization modulation, provided in an embodiment of this application.

[0014] Figure 5 The simulation diagram of the background intensity model provided for the embodiments of this application.

[0015] Figure 6 Simulation diagram of the target strength model provided for the embodiments of this application.

[0016] Symbol Explanation: Dual polarization modulation imaging system-1; Analysis system-2; High light scene simulation system-3; Hollow rotating platform-11; LED active illumination unit-12; Dual polarization image acquisition unit-13; Inner rotating platform-14; Outer rotating platform-15; Base control platform-16; First optical power meter-17; First rotating polarization unit-18; Second rotating polarization unit-19; Second optical power meter-110; Detector-111; First polarizer-112; First electric rotating wheel-113; Second polarizer-114; Second electric rotating wheel-115; Integrating sphere unit-31 and High-intensity laser unit-32. Detailed Implementation

[0017] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0018] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0019] Example 1, such as Figures 1-3 As shown, this embodiment provides a dual-polarization modulation-based anti-strong light polarization detection and analysis device. This device is positioned on the optical path of the target light to be modulated in a strong light environment. The strong light includes at least one of coherent light and incoherent light. The dual-polarization modulation-based anti-strong light polarization detection and analysis device includes: a dual-polarization modulation imaging system 1 and an analysis system 2. The dual-polarization modulation imaging system 1 is positioned on the optical path of the target light and is connected to the analysis system 2. The dual-polarization modulation imaging system 1 is used to acquire the target light to be modulated received from different detection angles, performs two rotation polarization filters on the target light to be modulated at different detection angles, and acquires the data to be analyzed at different detection angles. The analysis system 2 is used to analyze and filter the data to be analyzed at different detection angles to obtain a target image. The data to be analyzed includes: the intensity of the target light to be modulated, the intensity of the target light after dual polarization filtering, the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering.

[0020] Optionally, in an experimental environment, the dual polarization modulation imaging system 1 and the analysis system 2 are usually calibrated by simulating strong light. The system simulating strong light is the strong light scene simulation system 3. The strong light scene simulation system 3 is set on the same optical path as the target under test and the dual polarization modulation imaging system 1.

[0021] Optionally, the high-intensity light scene simulation system 3 includes: a high-intensity laser unit 32 and an integrating sphere unit 31; both the high-intensity laser unit 32 and the integrating sphere unit 31 are arranged on the same optical path of the target under test and the dual polarization modulation imaging system 1; (the target under test is located in the direction perpendicular to the incident direction of the main rays of the integrating sphere unit 31 and the high-intensity laser unit 32) the high-intensity laser unit 32 is used to emit coherent light to the target under test, and the integrating sphere unit 31 is used to emit incoherent light to the target under test.

[0022] Optionally, the high-intensity laser unit 32 and the integrating sphere unit 31 can be switched at any time as needed to ensure that the main light beam (coherent light and incoherent light) always illuminates the target under test.

[0023] Optionally, the high-power laser unit 32 is a Haoliang Optoelectronics LBX-450; the integrating sphere unit 31 is a Labsphere FT-2300-W.

[0024] Furthermore, the dual-polarization modulation imaging system 1 includes: a hollow rotating platform 11, an LED active illumination unit 12, and a dual-polarization image acquisition unit 13; the LED active illumination unit 12 is disposed on the inner rotating platform 14 of the hollow rotating platform 11; the dual-polarization image acquisition unit 13 is disposed on the outer rotating platform 15 of the hollow rotating platform 11; the dual-polarization image acquisition unit 13 is connected to the analysis system 2; the hollow rotating platform 11 is used to deflect the LED active illumination unit 12 and the dual-polarization image acquisition unit 13 at different angles.

[0025] Optionally, the hollow rotary platform 11 is the ART-300 precision air-bearing rotary table from Jiangsu Jicui Jingkai High-end Equipment Technology Co., Ltd. The LED active lighting unit 12 is the DSDBA-9SLED from Shanfeng Electric Factory.

[0026] Optionally, the hollow rotating platform 11 is connected to the analysis system 2, and the hollow rotating platform 11 is also used to receive control commands from the analysis system 2 to rotate at a preset angle.

[0027] Furthermore, the hollow rotating platform 11 specifically includes: an inner rotating platform 14, an outer rotating platform 15, and a base control platform 16; the inner rotating platform 14 is nested on the base control platform 16; the outer rotating platform 15 is nested on the outer surface (outer side) of the inner rotating platform 14; the base control platform 16 is used to drive the inner rotating platform 14 and the outer rotating platform 15 to rotate at a preset angle.

[0028] Optionally, the diameter of the inner rotating platform 14 is smaller than the diameter of the outer rotating platform 15.

[0029] Optionally, the base control platform 16 is connected to the analysis system 2. The base control platform 16 is used to receive control commands from the analysis system 2 and drive the inner rotating platform 14 and the outer rotating platform 15 to rotate according to a preset schedule.

[0030] Optionally, the 0 mark of the inner rotating platform 14 and the outer rotating platform 15 is parallel to the optical axis of the target light to be modulated, and the clockwise rotation of the turntable unit is defined as positive and the counterclockwise rotation as negative.

[0031] Optionally, the inner rotating platform 14 can rotate at any angle according to the control commands of the analysis system 2, enabling the device to image under active illumination by the LED active illumination unit 12 at different angles. The outer rotating platform 15 can rotate at any angle according to the control commands of the analysis system 2, enabling the device to image at different detection azimuth angles.

[0032] Furthermore, the dual-polarization image acquisition unit 13 includes a first optical power meter 17, a first rotating polarization unit 18, a second rotating polarization unit 19, a second optical power meter 110, and a detector 111, which are fixedly connected in sequence. The first optical power meter 17, the first rotating polarization unit 18, the second rotating polarization unit 19, the second optical power meter 110, and the detector 111 are all on the same optical path as the reflected light from the target being measured. The first optical power meter 17, the first rotating polarization unit 18, the second rotating polarization unit 19, the second optical power meter 110, and the detector 111 are all connected to the analysis system. The first optical power meter 17 is used to acquire the intensity of the modulated light from the target being measured at different detection angles. The first rotating polarization unit 18 is used to adjust the deflection angle of the modulated light from the target being measured at different detection angles. The first polarization filter is performed to obtain the modulated light of the target under test after the first polarization filter at different detection angles, and the angle of the first polarization filter at different detection angles; the second rotating polarization unit 19 is used to perform a second polarization filter on the modulated light of the target under test at different detection angles by adjusting the deflection angle, to obtain the modulated light of the target under test after the second polarization filter at different detection angles, and the angle of the second polarization filter at different detection angles; the second optical power meter 110 is used to obtain the intensity of the modulated light of the target under test after the second polarization filter at different detection angles; the detector 111 is used to perform imaging processing on the modulated light of the target under test after the second polarization filter at different detection angles to obtain images after double polarization filtering at different detection angles.

[0033] Optionally, the deflection angle is the principal optical axis on the polarizer (first polarizer and second polarizer), which is fully transparent when aligned with the light and completely extinguishes when perpendicular to the light.

[0034] Optionally, the first optical power meter 17 and the second optical power meter 110 are model number: Soleber PM120VA.

[0035] Optionally, the detector 111 is model number: Beijing Lingyun Optical Technology Co., Ltd. Imperx-Bobcat GEV.

[0036] Further, the first rotating polarization unit 18 specifically includes: a first polarizer 112 and a first electric rotating wheel 113; the first polarizer 112 is embedded in the first electric rotating wheel 113; the first electric rotating wheel 113 is used to drive the first polarizer 112 to deflect at an angle, thereby obtaining the angle of the first polarization filter under different detection angles. The second rotating polarization unit 19 specifically includes: a second polarizer 114 and a second electric rotating wheel 115; the second polarizer 114 is embedded in the second electric rotating wheel 115; the second electric rotating wheel 115 is used to drive the second polarizer 114 to deflect at an angle, thereby obtaining the angle of the second polarization filter under different detection angles.

[0037] Optionally, the first rotating polarization unit 18 and the second rotating polarization unit 19 can find the angle combination with the best imaging effect by adjusting the angle of the first polarization filter and the angle of the second polarization filter, based on the influence of different angle polarizer groups on the imaging effect.

[0038] Optionally, the first polarizer 112 and the second polarizer 114 are of the model number: CODIXX VIS (Germany).

[0039] Optionally, the model of the second electric rotary wheel 115 and the first electric rotary wheel 113 is: 8MPR16-1 from Fuguang Precision Instruments Co., Ltd.

[0040] Example 2, as Figure 6 This application also discloses a method for resisting strong light polarization detection and analysis based on dual polarization modulation. The method for resisting strong light polarization detection and analysis based on dual polarization modulation is applied to the above-mentioned device for resisting strong light polarization detection and analysis based on dual polarization modulation. The device for resisting strong light polarization detection and analysis based on dual polarization modulation includes at least an analysis system. The method for resisting strong light polarization detection and analysis based on dual polarization modulation includes the following steps.

[0041] S1. Acquire the data to be analyzed at different detection angles; the data to be analyzed includes: the intensity of the light to be modulated on the target, the intensity of the light to be modulated after dual polarization filtering, the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering.

[0042] In practical applications, when receiving data to be analyzed, it is named and stored as "detection azimuth angle; active illumination azimuth angle; first polarization filter angle; second polarization filter angle". For example, a set of images named "15°; -15°; 45°; 90°" indicates that the image was formed under the conditions of: detection azimuth angle 15°, active illumination azimuth angle -15°, first polarization filter angle 45°, and second polarization filter angle 90°.

[0043] Optionally, after the analysis system completes one storage operation, it sends control signals to the hollow rotating platform and the first and second rotating polarization units. This causes the inner rotating platform to rotate in 1° increments, completing an angle change from 0° to -30°; the outer rotating platform to rotate in 1° increments, completing an angle change from 0° to 30°; and the first and second polarizers to rotate in 1° increments, completing an angle change from 0° to 360°. After each change in rotation angle, the detector is controlled to reacquire images to obtain image information under all conditions and establish a database.

[0044] S2. Calculate the contrast and standard deviation of the image after dual polarization filtering at each detection angle.

[0045] Optionally, the contrast of the image after dual polarization filtering at each detection angle. After the calculation is complete, rename and save the image, and adjust the contrast. The numerical values ​​are added to the name.

[0046] Optionally, after calculating the standard deviation (STD) of the image after dual polarization filtering at each detection angle, the image is renamed and stored, and the value of the standard deviation (STD) is added to the name.

[0047] Optional, image contrast The calculation formula is as follows.

[0048] .

[0049] in, Image contrast; This indicates the brightness of the target area in the image after dual polarization filtering. This represents the overall brightness of the background area of ​​the image after dual polarization filtering.

[0050] Optionally, the formula for calculating the image standard deviation (STD) is as follows.

[0051] .

[0052] .

[0053] in, is the standard deviation of the image; M and N are the number of pixels in the horizontal and vertical directions of the image after dual polarization filtering. It represents the grayscale value of each pixel; It is the average gray level of the image after dual polarization filtering.

[0054] S3. Calculate the extinction rate at each detection angle based on the intensity of the modulated light of the target under each detection angle and the intensity of the modulated light after dual polarization filtering at each detection angle.

[0055] Optionally, extinction rate is used to characterize the ability to suppress strong light.

[0056] Optionally, after the extinction rate is calculated at each detection angle, the image is renamed and stored, and the extinction rate value is added to the name.

[0057] Optionally, the extinction rate can be calculated using the following formula.

[0058] .

[0059] in, Extinction rate; This indicates the intensity of the light to be modulated on the target being measured; This indicates the intensity of the light to be modulated after dual polarization filtering.

[0060] S4. Calculate the signal-to-noise ratio of the image after dual polarization filtering at each detection angle using the PG model, based on the angle of the first polarization filter at each detection angle, the angle of the second polarization filter at each detection angle, and the image after dual polarization filtering at each detection angle.

[0061] Optionally, after calculating the signal-to-noise ratio of the image after dual polarization filtering at each detection angle, the image is renamed and stored, with the signal-to-noise ratio value added to the name.

[0062] Furthermore, such as Figures 5-6 As shown, step S4 specifically includes...

[0063] S41. Calculate the background intensity based on the angle of the first polarization filter at each detection angle and the angle of the second polarization filter at each detection angle.

[0064] Optionally, the formula for calculating background intensity is as follows.

[0065] .

[0066] in, Indicates the signal strength in the background region; The intensity of the light to be modulated on the target being measured; The angle of the first polarization filter. The angle at which the light passes through the second polarization filter; R This refers to the detector aperture.

[0067] S42. Based on the angle of the first polarization filter at each detection angle, the angle of the second polarization filter at each detection angle, and the image after dual polarization filtering at each detection angle, the target intensity of the image after dual polarization filtering is calculated using the PG model.

[0068] Furthermore, the formula for calculating the target intensity is as follows.

[0069] .

[0070] in, For target strength; The Muller matrix represents the specular reflection. Angle of incidence; The angle of reflection; This is the specular reflection component; Divided into polarized diffuse reflection components; The surface roughness constant of the target unit being measured; The intensity of the LED active lighting unit; R This refers to the detector aperture.

[0071] The formula for calculating target intensity is constructed based on the formula for any element value in the model matrix of strong light background (PG model), which is as follows.

[0072] .

[0073] in, It is for any element value in the model matrix with a strong light background, reflecting the intensity information of that element; It is the polarized light scattering component, which can be further divided into the polarized light diffuse reflection component. and polarized light body scattering component ; It is the specular reflection component of polarized light; These are the elements of the Mueller matrix; It is the probability distribution function of the normal direction of the surface of the target unit being measured; Angle of incidence; is the reflection angle; G is the shadow and occlusion function.

[0074] When imaging a target in a bright light scene, the intensity of the polarized light reflected by the target unit can be approximated as the sum of the specular reflection intensity and the diffuse reflection intensity of the target unit, as shown in the following expression.

[0075] .

[0076] In the formula, The intensity of polarized light reflected by the target unit being measured; , These represent the specular reflection and diffuse reflection coefficients, respectively, which can be determined by parameter inversion; and This represents the intensity distribution of specular reflection and diffuse reflection.

[0077] Specular reflection intensity distribution of the specular reflection component in a new model for strong light backgrounds The expression is as follows.

[0078] .

[0079] in, The distribution of the surface, Let be the Mueller matrix for specular reflection. Since imaging targets at a relatively far distance can assume that the surface distribution is relatively uniform, this model uses a Gaussian distribution to represent the probability distribution of the surface normal, as shown in the following expression.

[0080] .

[0081] in, This is the angle between the normal of the micro-element and the macro-normal of the rough surface. When imaging targets at a distance, this angle can be approximated. α It is 0°; denoted as the surface roughness constant of the target unit being measured.

[0082] Shadow and Occlusion Functions G The amount of radiation emanating from the surface illuminated by light is expressed as follows.

[0083] .

[0084] in, The angle between the incident light and the normal of the micro-surface element is approximately equal to the angle between the incident light and the macroscopic surface when imaging targets at a greater distance.

[0085] The Mueller matrix for specular reflection is as follows.

[0086] .

[0087] in, and for and The conjugate matrix; and The reflection coefficients of the target for the transverse and longitudinal components of the incident light are defined as follows.

[0088] .

[0089] .

[0090] in, and Let be a function used to characterize the relationship between the negative refractive index and the reflection coefficient of a target, and its expression is as follows.

[0091] .

[0092] .

[0093] In the formula, Let n be the complex refractive index of the target, n be the refractive index of the exit medium, k be the extinction coefficient of the medium, and i be the imaginary unit. denoted as the refractive index of the incident medium.

[0094] The new model for diffuse reflection component intensity distribution in a strong light background The expression is as follows.

[0095] .

[0096] in, The Mueller matrix for diffuse reflection. i,j The value of is in the range of 0 to 3. Because for imaging targets at a relatively long distance, the diffuse reflection of the surface can be approximated as uniform, therefore, is valid if and only if ... i,j When both are 0, A value of 1 indicates that In all other cases, its value is 0.

[0097] The intensity of the polarized light reflected by the target unit is as follows.

[0098] .

[0099] After adding the LED active lighting unit, the intensity of the polarized light reflected by the target unit is as follows.

[0100] .

[0101] in, The intensity of polarized light reflected by the target unit after adding an LED active illumination unit; The intensity of the LED active lighting unit.

[0102] S43. Calculate the signal-to-noise ratio of each image after dual polarization filtering based on the target intensity and background intensity.

[0103] Optionally, the formula for calculating the signal-to-noise ratio is as follows.

[0104] .

[0105] .

[0106] in, X is the signal-to-noise ratio; X is the signal strength of the target area. Signal strength in the background area The ratio between them.

[0107] At this point, the database has been established and named. The data to be analyzed under each detection angle is named and stored as "Detection azimuth angle; Active illumination azimuth angle; First polarization filter angle; Second polarization filter angle; Contrast ratio; Standard deviation; Extinction rate; Signal-to-noise ratio". For example, a set of images named "15°; -15°; 45°; 90°; 40%; 60 sigma; 90%; 10 dB" indicates that the image was formed under the following conditions: detection azimuth angle 15°, active illumination azimuth angle -15°, first polarization filter angle 45°, and second polarization filter angle 90°, with a contrast ratio of 40%, a standard deviation of 60 sigma, an extinction rate of 90%, and a signal-to-noise ratio of 10 dB.

[0108] S5. Based on contrast, standard deviation, extinction rate, and signal-to-noise ratio, the images after dual polarization filtering at all detection angles are filtered to obtain the target image. The target image is an image with the following characteristics: contrast greater than the preset contrast value, standard deviation less than the preset standard deviation value, extinction rate greater than the preset extinction rate value, and signal-to-noise ratio greater than the preset signal-to-noise ratio value.

[0109] In practical applications, the target image is one with a contrast ratio better than 40%, a standard deviation better than 60 sigma, an extinction rate greater than 90%, and a signal-to-noise ratio greater than 10 dB.

[0110] The technical effects of this application are as follows.

[0111] This application utilizes a dual-polarization modulation imaging system to modulate the target under various complex and intense light environments using a combination of dual polarizers, achieving effective suppression of complex and intense light. By analyzing and filtering images after dual polarization filtering at different detection angles using an analysis system, high-quality target images are obtained, improving the accuracy and reliability of the detection results. This application employs a dual-polarization detection method and polarization imaging technology to achieve clear imaging in complex environments such as strong stray light and strong background light, overcoming the shortcomings of traditional imaging methods and significantly improving the operating range and imaging quality of the visual imaging system under strong interference conditions.

[0112] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0113] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A dual-polarization modulation-based anti-strong light polarization detection and analysis device, wherein the dual-polarization modulation-based anti-strong light polarization detection and analysis device is disposed in the optical path of the modulated light of the target under test in a strong light environment, wherein the strong light includes at least one of coherent light and incoherent light, characterized in that, The dual-polarization modulation-based anti-strong light polarization detection and analysis device includes: a dual-polarization modulation imaging system and an analysis system; The dual-polarization modulation imaging system is positioned on the optical path of the target object and is connected to the analysis system. The dual-polarization modulation imaging system includes a hollow rotating platform, an LED active illumination unit, and a dual-polarization image acquisition unit. The LED active illumination unit is positioned on the inner rotating platform of the hollow rotating platform. The dual-polarization image acquisition unit is positioned on the outer rotating platform of the hollow rotating platform. The dual-polarization image acquisition unit is connected to the analysis system. The hollow rotating platform is used to deflect the LED active illumination unit and the dual-polarization image acquisition unit at different angles. The rotating platform specifically includes: an inner rotating platform, an outer rotating platform, and a base control platform; the inner rotating platform is nested on the base control platform; the outer rotating platform is nested on the outer surface of the inner rotating platform; the base control platform is used to drive the inner and outer rotating platforms to rotate at a preset angle; the inner rotating platform can rotate at any angle according to the control command of the analysis system, enabling the device to image under the active illumination of the LED active illumination unit at different angles; the outer rotating platform can rotate at any angle according to the control command of the analysis system, enabling the device to image at different detection azimuth angles; The dual-polarization modulation imaging system is used to acquire the modulated light rays received from the target under test from different detection angles, perform two rotational polarization filters on the modulated light rays of the target under test at different detection angles, and acquire the data to be analyzed at different detection angles; the analysis system is used to analyze and filter the data to be analyzed at different detection angles to obtain the target image; the data to be analyzed includes: the intensity of the modulated light rays of the target under test, the intensity of the modulated light rays after dual polarization filtering, the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering; In an experimental environment, the dual-polarization modulation imaging system and the analysis system were calibrated using simulated high-intensity light. The system simulating high-intensity light is a high-intensity light scene simulation system. This system is positioned on the same optical path as both the target and the dual-polarization modulation imaging system. The high-intensity light scene simulation system includes a high-intensity laser unit and an integrating sphere unit. Both the high-intensity laser unit and the integrating sphere unit are positioned on the same optical path as both the target and the dual-polarization modulation imaging system. The high-intensity laser unit emits coherent light towards the target, while the integrating sphere unit emits incoherent light. The high-intensity laser unit and the integrating sphere unit can be switched as needed to ensure that the main light beam always illuminates the target. The method for determining the target image includes: calculating the contrast and standard deviation of the image after dual polarization filtering at each detection angle; calculating the extinction rate at each detection angle based on the intensity of the modulated light of the target object at each detection angle and the intensity of the modulated light after dual polarization filtering at each detection angle; calculating the signal-to-noise ratio of the image after dual polarization filtering at each detection angle using the PG model based on the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering at each detection angle; and filtering the images after dual polarization filtering at all detection angles based on the contrast, standard deviation, extinction rate, and signal-to-noise ratio to obtain the target image. Based on the angle of the first polarization filter at each detection angle, the angle of the second polarization filter at each detection angle, and the image after dual polarization filtering at each detection angle, the signal-to-noise ratio of the image after dual polarization filtering at each detection angle is calculated using the PG model. Specifically, this includes: The background intensity is calculated based on the angle of the first polarization filter and the angle of the second polarization filter at each detection angle. Based on the angle of the first polarization filter at each detection angle, the angle of the second polarization filter at each detection angle, and the image after dual polarization filtering at each detection angle, the target intensity of the image after dual polarization filtering is calculated using the PG model. The signal-to-noise ratio of each image after dual polarization filtering is calculated based on the target intensity and background intensity. The formula for calculating the target intensity is as follows: ； in, For target strength; The Mueller matrix represents the specular reflection. Angle of incidence; The angle of reflection; This is the specular reflection component; Divided into polarized diffuse reflection components; The surface roughness constant of the target unit being measured; The intensity of the LED active lighting unit; R The aperture of the detector; The angle between the normal of the micro-element and the macro-normal of the rough surface; G For shadow and occlusion functions.

2. The dual-polarization modulation-based anti-strong light polarization detection and analysis device according to claim 1, characterized in that, The dual-polarization image acquisition unit includes a first optical power meter, a first rotating polarization unit, a second rotating polarization unit, a second optical power meter, and a detector, which are fixedly connected in sequence. The first optical power meter, the first rotating polarization unit, the second rotating polarization unit, the second optical power meter, and the detector are all on the same optical path as the reflected light from the target being measured; the first optical power meter, the first rotating polarization unit, the second rotating polarization unit, the second optical power meter, and the detector are all connected to the analysis system; The first optical power meter is used to acquire the intensity of the modulated light of the target under test at different detection angles; the first rotating polarization unit is used to perform a first polarization filter on the modulated light of the target under test at different detection angles by adjusting the deflection angle, to obtain the modulated light of the target under test after the first polarization filter at different detection angles, and the angle of the first polarization filter at different detection angles; the second rotating polarization unit is used to perform a second polarization filter on the modulated light of the target under test at different detection angles by adjusting the deflection angle, to obtain the modulated light of the target under test after the second polarization filter at different detection angles, and the angle of the second polarization filter at different detection angles; the second optical power meter is used to acquire the intensity of the modulated light of the target under test after the second polarization filter at different detection angles; the detector is used to perform imaging processing on the modulated light of the target under test after the second polarization filter at different detection angles, to obtain images after double polarization filtering at different detection angles.

3. The dual-polarization modulation-based anti-strong light polarization detection and analysis device according to claim 2, characterized in that, The first rotating polarization unit specifically includes: a first polarizer and a first electric rotating wheel; The first polarizer is embedded in the first electric rotating wheel; the first electric rotating wheel is used to drive the first polarizer to deflect at an angle, so as to obtain the angle of the first polarization filter under different detection angles.

4. The dual-polarization modulation-based anti-strong light polarization detection and analysis device according to claim 2, characterized in that, The second rotating polarization unit specifically includes: a second polarizer and a second electric rotating wheel; The second polarizer is embedded in the second electric rotating wheel; the second electric rotating wheel is used to drive the second polarizer to deflect at different angles, so as to obtain the angle of the second polarization filter under different detection angles.

5. A method for resisting strong light polarization detection and analysis based on dual polarization modulation, wherein the method is applied to the dual polarization modulation-based strong light polarization detection and analysis device according to any one of claims 1-4, wherein the dual polarization modulation-based strong light polarization detection and analysis device includes at least an analysis system, characterized in that, The method for resisting strong light polarization detection and analysis based on dual polarization modulation includes: The system acquires data to be analyzed at different detection angles. This data includes: the intensity of the modulated light from the target object, the intensity of the modulated light after dual polarization filtering, the angle of the first polarization filter, the angle of the second polarization filter, and the image after dual polarization filtering. After the analysis system completes one storage operation, it sends control signals to the hollow rotating platform, the first rotating polarization unit, and the second rotating polarization unit. This causes the inner rotating platform to change angles from 0° to -30° in 1° increments, the outer rotating platform to change angles from 0° to 30° in 1° increments, and the first and second polarizers to change angles from 0° to 360° in 1° increments. After each change in rotation angle, the system controls the detector to reacquire images to obtain image information under all conditions and establish a database. Calculate the contrast and standard deviation of the image after dual polarization filtering at each detection angle; after calculating the standard deviation (STD) of the image after dual polarization filtering at each detection angle, rename and store the image, adding the value of the standard deviation (STD) to the name; the image contrast... The calculation formula is as follows: ； in, Image contrast; This indicates the brightness of the target area in the image after dual polarization filtering. This represents the overall brightness of the background area of ​​the image after dual polarization filtering. The formula for calculating the image standard deviation (STD) is as follows: ； ； in, is the standard deviation of the image; M and N are the number of pixels in the horizontal and vertical directions of the image after dual polarization filtering. It represents the grayscale value of each pixel; It is the average gray level of the image after dual polarization filtering; Based on the intensity of the modulated light of the target under test at each detection angle, and the intensity of the modulated light after dual polarization filtering at each detection angle, the extinction rate at each detection angle is calculated. The signal-to-noise ratio of the image after dual polarization filtering at each detection angle is calculated using the PG model based on the angle of the first polarization filter at each detection angle, the angle of the second polarization filter at each detection angle, and the image after dual polarization filtering at each detection angle. The formula for calculating target intensity is constructed based on the formula for any element value in the model matrix of a strong light background (PG model), which is as follows: ： in, It is for any element value in the model matrix with a strong light background, reflecting the intensity information of that element; It is the polarized light scattering component, which can be further divided into the polarized light diffuse reflection component. and polarized light body scattering component ; It is the specular reflection component of polarized light; These are the elements of the Mueller matrix; It is the probability distribution function of the normal direction of the surface of the target unit being measured; Angle of incidence; G is the reflection angle; G is the shadow and occlusion function; When imaging a target in a bright light scene, the intensity of the polarized light reflected by the target unit can be approximated as the sum of the specular reflection intensity and the diffuse reflection intensity of the target unit, as expressed below: ； In the formula, The intensity of polarized light reflected by the target unit being measured; , These represent the specular reflection and diffuse reflection coefficients, respectively, which can be determined by parameter inversion; and This represents the intensity distribution of specular reflection and diffuse reflection; Specular reflection intensity distribution of the specular reflection component in a new model for strong light backgrounds The expression is as follows: ； in, The distribution of the surface, Let be the Mueller matrix for specular reflection. Since imaging targets at relatively far distances can assume a relatively uniform surface distribution, this model uses a Gaussian distribution to represent the probability distribution of the surface normals, as expressed below: ； in, This is the angle between the normal of the micro-element and the macro-normal of the rough surface. When imaging targets at a distance, this angle can be approximated. α It is 0°; The surface roughness constant of the target unit being measured; Shadow and Occlusion Functions G The amount of radiation emanating from the surface illuminated by light is expressed as follows: ； in, The angle between the incident light and the normal of the micro-surface element is approximately equal to the angle between the incident light and the macroscopic surface when imaging targets at a distance. The Mueller matrix for specular reflection is as follows: ； in, and for and The conjugate matrix; and The reflection coefficients of the target for the transverse and longitudinal components of the incident light are defined as follows: ； ； in, and Let be a function used to characterize the relationship between the negative refractive index and the reflection coefficient of the target, expressed as follows: ； ； In the formula, n is the refractive index of the exiting medium, and k is the extinction coefficient of the medium; denoted as the refractive index of the incident medium; The new model for diffuse component intensity distribution against a strong light background The expression is as follows: ； in, The Mueller matrix for diffuse reflection. i,j The value of is in the range of 0 to 3. Because for imaging targets at a relatively long distance, the diffuse reflection of the surface can be approximated as uniform, therefore, is valid if and only if ... i,j When both are 0, A value of 1 indicates that In all other cases, its value is 0; The intensity of the polarized light reflected by the target unit is obtained as follows: ； After adding the LED active illumination unit, the intensity of the polarized light reflected by the target unit is as follows: ； in, The intensity of polarized light reflected by the target unit after adding an LED active illumination unit; The intensity of the LED active lighting unit; Based on contrast, standard deviation, extinction rate, and signal-to-noise ratio, images after dual polarization filtering at all detection angles are filtered to obtain target images. The target image is an image with the following characteristics: contrast greater than a preset contrast value, standard deviation less than a preset standard deviation value, extinction rate greater than a preset extinction rate value, and signal-to-noise ratio greater than a preset signal-to-noise ratio value.

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