Photoelectric switch test camera obscura

Abstract

The invention discloses a photoelectric switch test camera obscura, which belongs to the technical field of photoelectric test and comprises a box body, a distance adjusting rack, an illuminometer, a light source and a test board card, the box body is of a closed structure; the light source is arranged on the distance adjusting rack; a photoelectric switch to be tested is arranged on the test board card; the illuminometer and the test board card are both arranged on the distance adjusting rack, and a light window of a to-be-tested optoelectronic switch is opposite to a window of a probe of the illuminometer and is vertically and symmetrically arranged with the horizontal plane where the light source is located as the symmetry plane; the test board card and the illuminometer approach or are separated along the vertical direction through the distance adjusting rack; and the illuminometer outputs the irradiance to an external test system through the test board card. The irradiance is adjusted by adjusting the distance between the light source and the optoelectronic switch and the distance between the light source and the illuminometer, so that qualitative testing and quantitative testing of the optoelectronic switch are achieved, quality control and new product development of the optoelectronic switch are facilitated, and different application scenes are met according to specific optical conditions.

Description

Technical Field

[0001] The present invention belongs to the technical field of optoelectronic testing, and particularly relates to an optoelectronic switch testing dark box. Background Art

[0002] Optoelectronic switches work based on the principle of the photoelectric effect. When the light window of an optoelectronic switch is irradiated by a light source, a photoelectric effect occurs in the photosensitive semiconductor component inside the optoelectronic switch, generating a tiny current signal. After being amplified by the integrated circuit chip where the optoelectronic switch is located, this current signal realizes the change of the high and low levels output externally. The use of optoelectronic switches is relatively simple: in the dark state, a low level is output through its output terminal; in the bright condition, a high level is output through its output terminal.

[0003] Since different optoelectronic switches use different photosensitive materials, there are significant differences in the responses of different optoelectronic switches to different light bands. Therefore, when the control accuracy requirements for optoelectronic switches are relatively high, it is necessary to quantitatively analyze the conditions of the dark state (triggering the optoelectronic switch to output a low level) and the bright state (triggering the optoelectronic switch to output a high level). This requires accurate measurement of the electrical and optical characteristic indexes of the optoelectronic switch, especially the irradiance of the light source. The irradiance of the light source is closely related to the radiation intensity of the light source and the distance between the light source and the irradiated object, and the radiation intensity of the light source is closely related to the radiation power of the light source.

[0004] Currently, a common method for testing optoelectronic switches is to use a test fixture equipped with a black box. This fixture makes the optoelectronic switch in the dark state by covering the black box and in the bright state by opening the black box, and then observes the output signals of the optoelectronic switch in the dark and bright states, so as to simply test the electrical characteristics of the optoelectronic switch. However, this method can only roughly screen the quality of optoelectronic switches (that is, it can only check whether the optoelectronic switch can be normally triggered to make the optoelectronic switch emit a level signal), cannot adjust the irradiance of the light source, nor can it accurately quantitatively measure the optical characteristic parameters of the light source that triggers the optoelectronic switch (for example, the specific value that triggers the optoelectronic switch). In addition, due to the unreliable setting of the dark and bright conditions by the above test fixture, the test process is easily affected by the working habits of operators and the surrounding environment, resulting in inaccurate testing, low automation level, and inability to perform batch inspection. Summary of the Invention

[0005] In view of this, the present invention provides an optoelectronic switch testing dark box, which adjusts the irradiance by adjusting the distance between the light source and the optoelectronic switch and the distance between the light source and the illuminometer, thereby realizing the qualitative and quantitative testing of optoelectronic switches, facilitating the quality control of optoelectronic switches and the development of new products, and better meeting different application scenarios according to specific optical conditions.

[0006] The present invention is realized through the following technical solutions:

[0007] An optical switch test dark box, comprising: a box body, a distance adjustment bench, an illuminometer, a light source and a test board;

[0008] The box body is of a closed structure for isolating external light;

[0009] The light source is arranged on the distance adjustment bench;

[0010] The photoelectric switch to be tested is arranged on the test board;

[0011] The illuminometer and the test board are both arranged on the distance adjustment bench, and are respectively located above and below the light source;

[0012] The light window of the photoelectric switch to be tested is opposite to the window of the probe of the illuminometer, and is arranged symmetrically up and down with the horizontal plane where the light source is located as the symmetry plane;

[0013] The test board and the illuminometer approach or separate along the vertical direction through the distance adjustment bench;

[0014] The illuminometer is used to measure the irradiance, transmit the value of the irradiance to the test board, and output it to an external test system by the test board.

[0015] Further, the distance adjustment bench includes: a guide rail, a lead screw, an operation wheel and two sliders;

[0016] The guide rail is vertically arranged inside the box body;

[0017] Both ends of the lead screw are respectively supported by bearings at the upper and lower ends of the guide rail, and the axial direction of the lead screw is parallel to the length direction of the guide rail; the lead screw is a bidirectional lead screw with two threads with opposite helix directions;

[0018] The two sliders are arranged up and down and are respectively matched with the two opposite helix threads of the bidirectional lead screw;

[0019] The probe of the illuminometer is fixedly connected to one slider, and the test board is fixedly connected to the other slider.

[0020] Further, the distance adjustment bench further includes an operation wheel;

[0021] The upper end of the lead screw passes through the upper end face of the box body and is fixedly connected to the operation wheel, and the operation wheel is used to operate the rotation of the lead screw.

[0022] Further, a PWM modulation circuit is provided on the test board, and the PWM modulation circuit is electrically connected to the light source for controlling the power of the light source.

[0023] Further, the light source is detachably connected to the distance adjustment bench.

[0024] Further, the illuminometer further includes: a meter head;

[0025] The meter head is arranged on the outer wall surface of the box body, and the meter head is electrically connected to the probe inside the box body through the external interface on the box body;

[0026] The meter header is used to display the irradiance measured by the probe.

[0027] Furthermore, handles are respectively provided on two opposite sides of the box.

[0028] Furthermore, the bottom of the box is provided with more than four supporting legs.

[0029] Furthermore, the inner bottom surface of the box is provided with a wire groove for routing cables inside the box.

[0030] Furthermore, the box body is provided with a door panel.

[0031] Beneficial effects:

[0032] (1) In a photoelectric switch test darkroom of the present invention, the light window of the photoelectric switch to be tested is opposite to the window of the probe of the illuminometer, and the light windows are arranged symmetrically with the horizontal plane where the light source is located as the symmetry plane, and the distance between the light window of the photoelectric switch to be tested and the light source is equal to the distance between the window of the probe and the light source, so that the irradiance measured by the probe of the illuminometer is the real-time irradiance of the photoelectric switch on the test board, so that the test darkroom can quantitatively give the lighting conditions, and the high-precision illuminometer measures the irradiance throughout the whole process, which is conducive to the realization of automated testing; the distance between the light window of the photoelectric switch and the light source, and the distance between the probe of the illuminometer and the light source are adjusted simultaneously by the distance adjustment stand, so as to adjust the irradiance of the light source and accurately measure the light characteristic parameters of the light source (i.e., the critical quantitative conditions for the action of the photoelectric switch), which is conducive to the quality control of the photoelectric switch; the test darkroom cooperates with the external test system to realize automated and batch testing.

[0033] (2) A photoelectric switch test dark box of the present invention has a bidirectional lead screw with two threads of opposite rotation directions, two sliders are arranged up and down, and respectively cooperate with the two threads of opposite rotation directions of the bidirectional lead screw, and the two sliders are respectively fixed with the probe of the illuminance meter and the test board. The two sliders can move away and close synchronously through the bidirectional lead screw, and at the same time, the distance to the light source can be finely adjusted, thereby making fine adjustments to the irradiance, thereby measuring more accurate critical quantitative conditions for the action of the photoelectric switch and identifying slight differences between different photoelectric switches.

[0034] (3) In a photoelectric switch test dark box of the present invention, the upper end of the lead screw passes through the upper end surface of the box body and is fixedly connected to the operating wheel, which is used to operate the lead screw to rotate to achieve distance adjustment, thereby meeting the fine control of the photoelectric switch operation process.

[0035] (4) An optical switch test dark box of the present invention, the PWM modulation circuit is electrically connected to the light source, and the power of the light source is accurately controlled through the PWM modulation circuit, thereby roughly adjusting the irradiance of the light source, and improving the test efficiency.

[0036] (5) An optical switch test dark box of the present invention, the light source is detachably connected to the distance adjustment bench, and the type of the light source can be replaced. Tests under different wavebands are realized through different types of light sources, improving the versatility of the test dark box.

[0037] (6) An optical switch test dark box of the present invention, the head of the illuminometer is arranged on the outer wall surface of the box body, so as to monitor the value of the irradiance measured by the probe in real time.

[0038] (7) An optical switch test dark box of the present invention, handles are respectively arranged on two opposite sides of the box body, which is convenient for carrying the test dark box.

[0039] (8) An optical switch test dark box of the present invention, more than four support feet are arranged at the bottom of the box body to provide stable support for the test dark box.

[0040] (9) An optical switch test dark box of the present invention, a wire groove is arranged on the inner bottom surface of the box body, so that the cables inside the box body can be neatly arranged.

[0041] (10) An optical switch test dark box of the present invention, a door panel is arranged on the box body, which is convenient for arranging the distance adjustment bench inside the box body. Description of the Drawings

[0042] Figure 1 is a schematic diagram of the test main body of the present invention;

[0043] Figure 2 is an external view of the whole dark box of the present invention;

[0044] Among them, 1 - test main body, 1-1 - distance adjustment bench, 1-2 - illuminometer, 1-2.1 - probe, 1-2.2 - head, 1-3 - board card platform, 1-4 - light source, 1-5 - test board card, 1-6 - external interface, 1-7 - test system, 2 - box body, 2-1 - operation wheel, 2-2 - handle, 2-3 - head mounting bracket, 2-4 - wire groove, 2-5 - door panel. Detailed Embodiment

[0045] The present invention will be described in detail below with reference to the accompanying drawings and by way of examples.

[0046] This embodiment provides an optical switch test dark box, as Figure 1 and Figure 2 shown, including: a test main body 1 and a box body 2.

[0047] The housing 2 includes: an operation wheel 2-1, a meter head mounting bracket 2-3, and an external interface 1-6.

[0048] The housing 2 is a black airtight structure that can effectively isolate external light from penetrating into the interior of the housing 2. A door panel 2-5 is provided on the housing 2, and the door panel 2-5 is used to open the housing 2 to place the test subject 1 inside the housing 2.

[0049] In this embodiment, handles 2-2 are provided on two opposite sides of the housing 2 for easy handling of the housing 2; more than four support feet are provided at the bottom of the housing 2 to provide stable support.

[0050] An external interface 1-6 is provided on the side wall surface of the housing 2 for connecting the external test system 1-7 and the external power supply.

[0051] In this embodiment, a wire groove 2-4 is provided on the inner bottom surface of the housing 2 for routing the internal cables of the housing 2.

[0052] The test subject 1 includes: an adjustment platform 1-1, an illuminometer 1-2, a board card platform 1-3, a light source 1-4, a test board card 1-5, an external interface 1-6, and a test system 1-7.

[0053] The adjustment platform 1-1 is used to adjust the distance between the light window of the photoelectric switch and the light source 1-4, and the distance between the illuminometer 1-2 and the light source 1-4; as an example, the adjustment platform 1-1 is a slide rail, including: a guide rail, a lead screw, an operation wheel 2-1, and two sliders.

[0054] The guide rail is vertically arranged inside the housing 2.

[0055] Both ends of the lead screw are respectively supported by bearings at the upper and lower ends of the guide rail. The lead screw is a bidirectional lead screw with two threads with opposite helix directions.

[0056] The two sliders are arranged vertically, and are respectively engaged with the two opposite helix threads of the bidirectional lead screw. When the lead screw rotates, the rotational motion of the lead screw is converted into the synchronous linear motion of the two sliders, causing the two sliders to approach or separate. Let the two sliders be the upper slider and the lower slider from top to bottom in sequence.

[0057] The upper end of the lead screw passes through the upper end surface of the housing 2 and is fixedly connected to the operation wheel 2-1, and the operation wheel 2-1 is used to operate the rotation of the lead screw.

[0058] The light source 1-4 is detachably connected to the guide rail. In this embodiment, the type of the light source 1-4 is replaced according to needs to achieve tests under different wavelength bands.

[0059] The illuminometer 1-2 includes: a meter head 1-2.2 and a probe 1-2.1.

[0060] The meter head 1-2.2 of the illuminometer 1-2 is arranged on the outer wall surface of the box body 2 through the meter head mounting bracket 2-3.

[0061] The probe 1-2.1 is fixedly connected to the upper slider. The window of the probe 1-2.1 is arranged horizontally and faces vertically downward towards the light source 1-4. The probe 1-2.1 is communicated with the meter head 1-2.2 outside the box body 2 through the probe connection interface of the external interface 1-6. The probe 1-2.1 moves linearly along the guide rail with the upper slider.

[0062] The probe 1-2.1 is used to measure the irradiance of the light source 1-4, and the value of the irradiance is displayed through the meter head 1-2.2.

[0063] The board card platform 1-3 is horizontally and fixedly connected to the lower slider.

[0064] The test board card 1-5 is arranged on the board card platform 1-3. The photoelectric switch to be tested is arranged on the test board card 1-5. The light window of the photoelectric switch faces vertically upward towards the light source 1-4 and is opposite to the window of the probe 1-2.1 of the illuminometer 1-2 (that is, the window of the probe 1-2.1 and the light window of the photoelectric switch are symmetrically arranged up and down with the horizontal plane where the light source 1-4 is located as the symmetry plane); the test board card 1-5 is electrically connected to the output end of the photoelectric switch through a cable, so as to read the output signal of the photoelectric switch (that is, the high-level signal and the low-level signal).

[0065] The test board card 1-5 is electrically connected to the light source 1-4 through a cable, which is used to control the lighting and turning off of the light source 1-4 and control the power of the light source 1-4. The test board card 1-5 is electrically connected to the probe 1-2.1 through a cable, which is used to read the irradiance. The test board card 1-5 is electrically connected to the external test system through the external interface 1-6, which is used to receive the electrical parameters such as the supply voltage and driving ability of different photoelectric switches provided by the external test system 1-7 and perform personalized adjustment of the circuit (such as adjusting the power of the light source 1-4), and is also used to transmit the radiance to the external test system 1-7 and store it in the database. In this embodiment, the power of the light source 1-4 is precisely controlled through a PWM modulation (Pulse Width Modulation) circuit.

[0066] The vertical distance between the window of the probe 1-2.1 and the light source 1-4, and the vertical distance between the light source 1-4 and the light window of the photoelectric switch are kept consistent, so that the light source 1-4 is always located at the central position between the window of the probe 1-4 and the light window of the photoelectric switch. The card platform 1-3 carrying the photoelectric switch and the test board 1-5 moves linearly along the length direction of the guide rail with the lower slider, and this linear motion is synchronous and in the opposite direction to the linear motion of the probe 1-2.1, so as to realize a small-range adjustment of the distance from the light source 1-4 to the window of the probe 1-2.1 (i.e., the light source 1-4 to the light window of the photoelectric switch), and thus realize the fine adjustment of the irradiance.

[0067] In this embodiment, the usage method of the photoelectric switch test dark box includes the following steps:

[0068] Step 1, connect the test dark box to the external test system and the external power supply.

[0069] Step 2, open the door panel 2-5 of the box body 2, put in the test board 1-5 with the photoelectric switch to be tested, and electrically connect the probe 1-2.1 and the light source 1-4 to the test board 1-5 through cables, and then close the door of the box body 2.

[0070] Step 3, through the upper computer software equipped with the external test system 1-7, input various test parameters related to the photoelectric switch (such as the power of the light source 1-4, etc.), and start the test after the input is completed.

[0071] Step 4, according to the specified test steps, adjust the operation wheel 2-1 to complete the optical characteristic test. Each index during the test is input through the test board 1-5 and transmitted to the external test system 1-7, and saved to the database through the external test system 1-7. Among them, the power of the light source 1-4 is adjusted through PWM modulation to coarsely adjust the irradiance; then, the distance between the light source 1-4 and the window of the probe 1-2.1 and the photoelectric switch is adjusted by rotating the operation wheel 2-1 to finely adjust the irradiance; during the fine adjustment process, the test board 1-5 reads the irradiance when the electric switch triggers low and high levels, so as to obtain the critical quantitative conditions for the operation of the photoelectric switch. Since this electrical characteristic test automatically completes the reading and recording of data without manual operation, it can realize automated and batch testing.

[0072] In summary, the above is only the preferred embodiment of the present invention and is not used to limit the protection scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A photoelectric switch test dark box, characterized in that: include: A box (2), a distance adjustment stand (1-1), an illuminometer (1-2), a light source (1-4) and a test board (1-5); The box (2) is a closed structure for isolating external light; The light source (1-4) is arranged on a distance-adjusting stand (1-1); The test board (1-5) is provided with a photoelectric switch to be tested; The illuminometer (1-2) and the test board (1-5) are both arranged on the distance adjustment stand (1-1) and are respectively located above and below the light source (1-4); The light window of the photoelectric switch to be tested is opposite to the window of the probe (1-2.1) of the illuminometer (1-2), and is arranged symmetrically up and down with the horizontal plane where the light source (1-4) is located as the symmetry plane; The test board (1-5) and the illuminometer (1-2) are brought close to or separated in a vertical direction via a distance-adjusting stand (1-1); The illuminometer (1-2) is used to measure irradiance, and transmits the value of the irradiance to a test board (1-5), and the test board (1-5) outputs the value to an external test system (1-7).

2. A photoelectric switch test dark box as claimed in claim 1, characterized in that: The distance adjustment stand (1-1) comprises: a guide rail, a lead screw, an operating wheel (2-1) and two slide blocks; The guide rail is vertically arranged inside the box (2); The two ends of the lead screw are supported at the upper and lower ends of the guide rail through bearings respectively, and the axial direction of the lead screw is parallel to the length direction of the guide rail; the lead screw is a bidirectional lead screw with two threads with opposite rotation directions; The two sliders are arranged up and down and respectively cooperate with two opposite rotation direction threads of the bidirectional lead screw; The probe (1-2.1) of the illuminometer (1-2) is fixedly connected to a slider, and the test board (1-5) is fixedly connected to another slider.

3. A photoelectric switch test dark box as claimed in claim 2, characterized in that: The distance adjustment stand (1-1) also includes an operating wheel; The upper end of the lead screw passes through the upper end surface of the box body (2) and is fixedly connected to the operating wheel (2-1); the operating wheel (2-1) is used to operate the lead screw to rotate.

4. A photoelectric switch test dark box as claimed in claim 1, characterized in that: The test board (1-5) is provided with a PWM modulation circuit, which is electrically connected to the light source (1-4) and is used to control the power of the light source (1-4).

5. A photoelectric switch test dark box as claimed in claim 1, characterized in that: The light source (1-4) is detachably connected to the distance adjustment stand (1-1).

6. A photoelectric switch test dark box as claimed in claim 1, characterized in that: The illuminometer (1-2) further comprises: a meter head (1-2.2); The meter head (1-2.2) is arranged on the outer wall surface of the box (2), and the meter head (1-2.2) is electrically connected to the probe (1-2.1) inside the box (2) through the external interface (1-6) on the box (2); The meter head (1-2.2) is used to display the irradiance measured by the probe (1-2.1).

7. A photoelectric switch test dark box as claimed in any one of claims 1 to 6, characterized in that: Handles (2-2) are respectively provided on two opposite sides of the box body (2).

8. A photoelectric switch test dark box as claimed in any one of claims 1 to 6, characterized in that: The bottom of the box body (2) is provided with more than four supporting legs.

9. A photoelectric switch test dark box as claimed in any one of claims 1 to 6, characterized in that: The inner bottom surface of the box body (2) is provided with a wire groove (2-4) for routing cables inside the box body (2).

10. A photoelectric switch test dark box as claimed in any one of claims 1 to 6, characterized in that: The box body (2) is provided with a door panel (2-5).

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