Satellite navigation reliability assessment methods, devices, equipment, media and products

Abstract

This application relates to a satellite navigation reliability assessment method, apparatus, device, medium, and product. The method includes obtaining a fluctuation range corresponding to a reference reliability level for a current batch of satellite navigation terminals, obtaining a risk probability value and a failure fluctuation ratio based on the fluctuation range, obtaining a failure determination boundary value based on the risk probability value and failure fluctuation ratio, and performing a reliability assessment on the satellite navigation terminal based on the failure probability and failure determination boundary value of the satellite navigation terminal. This method can accurately assess the reliability of satellite navigation terminal products.

Description

Technical Field

[0001] The present application relates to the field of satellite navigation technology, and in particular to a reliability assessment method, device, equipment, medium and product for satellite navigation. Background Art

[0002] Satellite navigation terminal products are usually composed of antenna units, radio frequency units, and baseband processing units. Their performance is easily affected by factors such as electromagnetic interference and device aging, which can lead to reliability fluctuations and thus affect the normal use of the product. During the production process, product quality control usually adopts statistical process control (SPC) methods. Through real-time monitoring of measurable physical parameters such as voltage, current, capacity, and size, random fluctuations are distinguished from abnormal fluctuations to ensure production stability. However, SPC is mainly suitable for monitoring physical indicators parallel to the time axis, while the mean time between failures (MTBF), the core reliability indicator of satellite navigation terminal products, is a statistic perpendicular to the time axis and cannot be directly measured by conventional instruments, making it difficult to monitor its fluctuations in real time during the production process.

[0003] At present, the reliability assessment of satellite navigation terminal products mainly focuses on performance indicators such as positioning accuracy, signal integrity, continuity and availability, but there is a lack of effective monitoring and evaluation system for key reliability indicators such as MTBF fluctuation trend, risk determination and fluctuation ratio. Summary of the Invention

[0004] Based on this, it is necessary to provide a satellite navigation reliability assessment method, device, equipment, medium and product that can accurately assess the reliability of satellite navigation terminal products in response to the above technical problems.

[0005] In a first aspect, the present application provides a satellite navigation reliability assessment method, comprising:

[0006] Obtain the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals;

[0007] According to the fluctuation range, obtain the risk probability value and failure fluctuation ratio;

[0008] Obtain failure judgment boundary value based on risk probability value and failure fluctuation ratio;

[0009] The reliability of the satellite navigation terminal is evaluated based on its failure probability and failure judgment boundary value.

[0010] In one embodiment, the upper limit of the fluctuation range is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0011] In one embodiment, the risk probability value includes a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to the determination that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to the determination that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0012] In one embodiment, the step of obtaining the failure determination boundary value based on the risk probability value and the failure fluctuation ratio includes:

[0013] Obtaining an upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the upper limit of the fluctuation range;

[0014] Obtaining the lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the lower limit of the fluctuation range;

[0015] According to the upper limit failure probability and the lower limit failure probability, a failure expression corresponding to the satellite navigation terminal is obtained, and according to the failure expression, a failure judgment boundary value is obtained.

[0016] In one embodiment, the failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal experiencing a preset number of failures within a preset operating time; and the steps of performing reliability assessment on the satellite navigation terminal based on the failure probability and the failure determination boundary value of the satellite navigation terminal include:

[0017] According to the failure probability, lower limit value and upper limit value of the satellite navigation terminal, the reliability change trend of the satellite navigation terminal is obtained, so as to execute the corresponding production process according to the reliability change trend.

[0018] In one embodiment, the method further comprises:

[0019] Obtain product information of the current batch of satellite navigation terminals and obtain product features based on the product information;

[0020] Obtain the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtain the risk probability value and failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0021] In a second aspect, the present application further provides a satellite navigation reliability assessment device, comprising:

[0022] A first acquisition module is used to obtain a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals;

[0023] The second acquisition module is used to obtain the risk probability value and the failure fluctuation ratio according to the fluctuation range;

[0024] A failure determination module is used to obtain a failure determination boundary value based on a risk probability value and a failure fluctuation ratio;

[0025] The reliability evaluation module is used to evaluate the reliability of the satellite navigation terminal based on the failure probability and failure judgment boundary value of the satellite navigation terminal.

[0026] In a third aspect, the present application further provides a computer device comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements any one of the method steps in the first aspect when executing the computer program.

[0027] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which implements any one of the method steps in the first aspect when the computer program is executed by a processor.

[0028] In a fifth aspect, the present application further provides a computer program product, comprising a computer program, which implements any one of the method steps in the first aspect when executed by a processor.

[0029] The above-mentioned satellite navigation reliability assessment method, device, equipment, medium and product obtain the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals, obtain the risk probability value and failure fluctuation ratio according to the fluctuation range, obtain the failure judgment boundary value based on the risk probability value and failure fluctuation ratio, and perform reliability assessment on the satellite navigation terminal according to the failure probability and failure judgment boundary value of the satellite navigation terminal. It can accurately monitor the fluctuation of the reliability assessment index, thereby accurately assessing the reliability level of the satellite navigation terminal. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following briefly introduces the drawings required for use in the embodiments of the present application or related technical descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying any creative work.

[0031] Figure 1 FIG. 1 is a diagram illustrating an application environment of a satellite navigation reliability assessment method according to an embodiment;

[0032] Figure 21 is a flow chart of a method for evaluating satellite navigation reliability in one embodiment;

[0033] Figure 3 FIG. 1 is a schematic diagram of fluctuation determination of reliability evaluation in one embodiment;

[0034] Figure 4 is a schematic flow chart of a method for assessing satellite navigation reliability in another embodiment;

[0035] Figure 5 is a structural block diagram of a satellite navigation reliability assessment device in one embodiment;

[0036] Figure 6 FIG. 1 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0037] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0038] The satellite navigation reliability assessment method provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown, terminal 102 communicates with server 104 via a network. A data storage system can store data that server 104 needs to process. The data storage system can be integrated with server 104, or located in the cloud or on another network server. Terminal 102 is used to obtain the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals, obtain a risk probability value and a failure fluctuation ratio based on the fluctuation range, and obtain a failure determination boundary value based on the risk probability value and failure fluctuation ratio. Reliability assessment of the satellite navigation terminals is performed based on the failure probability and failure determination boundary value of the satellite navigation terminals. Terminal 102 can be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices. IoT devices can include smart speakers, smart TVs, smart air conditioners, smart car devices, projectors, etc. Portable wearable devices can include smart watches, smart bracelets, head-mounted devices, etc. Head-mounted devices can include virtual reality (VR) devices, augmented reality (AR) devices, smart glasses, etc. The server 104 may be an independent physical server, a server cluster or a distributed system composed of multiple physical servers, or a cloud server that provides cloud computing services.

[0039] In an exemplary embodiment, Figure 2As shown in FIG, a satellite navigation reliability assessment method is provided, and the method is applied to Figure 1 The terminal 102 in the example is used as an example to illustrate the process, including the following steps S202 to S208.

[0040] S202: Obtain a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals.

[0041] Optionally, the reference reliability level of a satellite navigation terminal serves as a benchmark for measuring and evaluating its reliability, typically using the mean time between failures (MTBF) as a reliability evaluation metric. The fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals refers to the range of MTBF values ​​for that batch of products, such as the range defined by the lower and upper limits. Obtaining this range forms the basis for subsequent evaluations and clarifies the possible fluctuation range of the product reliability level.

[0042] S204: Obtain a risk probability value and a failure fluctuation ratio according to the fluctuation range.

[0043] Optionally, after the fluctuation range is determined, a risk probability value and a failure fluctuation ratio are obtained therefrom, wherein the risk probability value includes the true rejection risk α and the false rejection risk β, etc. The true rejection risk α and the false rejection risk β are used to measure the probability of misjudging the product reliability as not meeting the requirements and misjudging it as meeting the requirements, respectively. The failure fluctuation ratio is the ratio of the upper limit to the lower limit of the MTBF, reflecting the degree of reliability fluctuation.

[0044] S206: Obtain a failure determination boundary value based on the risk probability value and the failure fluctuation ratio.

[0045] Optionally, a failure determination boundary value is obtained based on the risk probability value and the failure fluctuation ratio, wherein the failure determination boundary value is a reference standard for measuring product reliability and is used for comparison with actual failure conditions.

[0046] S208: Perform reliability assessment on the satellite navigation terminal based on the failure probability and failure determination boundary value of the satellite navigation terminal.

[0047] Optionally, the actual failure probability of the satellite navigation terminal is compared with a failure determination boundary value to perform a reliability assessment on the satellite navigation terminal. For example, if the actual failure probability is within the boundary value range, the product reliability is determined to be at an acceptable level; if the actual failure probability exceeds the upper limit of the boundary value range, the product reliability is determined to be abnormal.

[0048] In the above-mentioned satellite navigation reliability assessment method, the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals is obtained, and the risk probability value and failure fluctuation ratio are obtained according to the fluctuation range. Based on the risk probability value and failure fluctuation ratio, the failure judgment boundary value is obtained. According to the failure probability and failure judgment boundary value of the satellite navigation terminal, the reliability of the satellite navigation terminal is assessed, which can accurately monitor the fluctuation of the reliability assessment index, thereby accurately assessing the reliability level of the satellite navigation terminal.

[0049] In an exemplary embodiment, the upper limit of the fluctuation range is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0050] Optionally, the expected reliability level of the current batch of satellite navigation terminals, i.e., the upper limit of the fluctuation range, refers to the highest reliability level expected to be achieved by the products in this batch. The lower limit of the fluctuation range, i.e., the required reliability level, refers to the minimum reliability requirement that the products in this batch need to meet.

[0051] For example, assuming that MTBF is used as a reliability evaluation indicator, and the MTBF of the current batch of satellite navigation terminals is represented by θ, then its fluctuation range is expressed as: [θ L ,θ U ], where θ L is the minimum required reliability level of the product in batch production (MTBF lower limit), θ U It is the upper limit of the product reliability level in batch production (MTBF upper limit), that is, the highest expected reliability level that the product is expected to achieve in batch production.

[0052] In this embodiment, by setting the upper limit of the fluctuation range to the expected reliability level of the current batch of satellite navigation terminals, and setting the lower limit of the fluctuation range to the required reliability level of the current batch of satellite navigation terminals, the reliability evaluation index of the satellite navigation terminal can be accurately obtained, thereby improving the accuracy of subsequent reliability evaluations.

[0053] In an exemplary embodiment, the risk probability value includes a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to the judgment that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to the judgment that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0054] For example, the first risk value is the rejection risk α, which means that the MTBF value is not less than the upper limit θ U When the MTBF value is determined to be less than the upper limit θ UThe maximum probability, the second risk value is the pseudo-risk β means that the MTBF value is less than the lower limit θ L When the MTBF value is determined to be not less than the lower limit θ L The maximum probability.

[0055] Specifically, the first risk value refers to when the actual MTBF is not less than θ U However, due to various uncertainties, the MTBF is less than θ U The first risk value measures the possibility of misjudging a truly reliable product (meeting high reliability standards) as unreliable. The second risk value refers to the value when the actual MTBF is less than the lower limit of the fluctuation range θ L , that is, the actual reliability of the product does not meet the basic requirements, but the MTBF is considered to be not less than the lower limit θ L , that is, the maximum probability of misjudging an unreliable product as reliable. The second risk value reflects the degree of MTBF fluctuation. A larger ratio indicates a larger gap between the upper and lower limits of MTBF, and a wider range of product reliability fluctuations; conversely, a smaller ratio indicates a narrower range of fluctuations.

[0056] For example, the failure fluctuation ratio is the upper limit of the fluctuation range θ U and the lower limit θ L The ratio of, that is, D = θ U / θ L .

[0057] In this embodiment, by obtaining the first risk value, the second risk value, and the failure fluctuation ratio, the error probability of the reliability assessment can be accurately obtained, thereby improving the accuracy of the reliability assessment.

[0058] In an exemplary embodiment, the step of obtaining a failure determination boundary value based on a risk probability value and a failure fluctuation ratio includes: obtaining an upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining a lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining a failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value according to the failure expression.

[0059] Alternatively, the risk probability value and the failure fluctuation ratio reflect the uncertainty and fluctuation in the product reliability judgment. Based on these values, the probability of a specific number of failures occurring within a specific time period is determined by the relevant probability model. For example, taking the Poisson distribution as an example, given the upper limit of the mean time between failures θ U , preset working time t and preset number of failures r, the upper limit failure probability is calculated, which represents the probability of a preset number of failures occurring within the preset working time when the actual reliability of the product reaches the expected reliability level.

[0060] Similarly, taking the Poisson distribution as an example, given the lower limit of the mean time between failures θ L , preset working time t and preset number of failures r, the lower limit failure probability is calculated, which represents the probability of a preset number of failures occurring within the preset working time when the actual reliability of the product reaches the required reliability level.

[0061] For example, according to the Poisson distribution, it can be derived that for an exponential product with an unknown MTBF value θ, the probability of r failures occurring within the cumulative working time t is:

[0062]

[0063] Among them, P r (r) is the failure probability, t is the preset working time, θ is the reference reliability level of the satellite navigation terminal (i.e., MTBF value), and r is the number of failures.

[0064] Furthermore, for satellite navigation terminal reliability monitoring, as production continues, it is necessary to prove that the MTBF value of the product is always within the lower limit θ L and the upper limit θ U If the actual MTBF value is equal to the MTBF lower limit value θ L , then the probability of r failures occurring within working time t is:

[0065]

[0066] Similarly, if the actual MTBF value is equal to the MTBF upper limit value θ U , then the probability of r failures occurring within working time t is:

[0067]

[0068] If the MTBF of satellite navigation terminal products is [θ L ,θ U ], then the interval of the number of failures within time t is expressed as:

[0069]

[0070] Among them, the upper limit failure probability and the lower limit failure probability C b is a constant whose value depends on the risk probability value and the failure fluctuation ratio, and its mathematical expression is:

[0071]

[0072]

[0073] Among them, β is the second risk value, D is the failure fluctuation ratio, and α is the first risk value.

[0074] In this embodiment, by obtaining the upper limit failure probability and the lower limit failure probability, and then obtaining the failure determination boundary, it is possible to provide an accurate quantitative standard for satellite navigation terminal reliability determination and improve the accuracy of reliability assessment.

[0075] In an exemplary embodiment, the failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal failing a preset number of times within a preset working time; the step of performing reliability assessment on the satellite navigation terminal based on the failure probability and failure determination boundary value of the satellite navigation terminal includes: obtaining the reliability change trend of the satellite navigation terminal based on the failure probability, lower failure limit value and upper failure limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0076] Optionally, the failure determination boundary value includes a lower failure limit value and an upper failure limit value, which characterizes the reasonable range of failure situations of the satellite navigation terminal under certain conditions. The failure probability refers to the probability of a satellite navigation terminal failing a preset number of times within a preset working time. The failure probability of the satellite navigation terminal is compared with the lower failure limit value and the upper failure limit value. If the failure probability is close to or lower than the lower failure limit value, it means that the actual probability of the product failing is lower than the expected minimum standard, which means that the product reliability is improving and the reliability change trend is positive; if the failure probability is close to or higher than the upper failure limit value, it means that the probability of the product failing exceeds the expected maximum standard, the product reliability is deteriorating, and the reliability change trend is negative; when the failure probability is between the lower failure limit value and the upper failure limit value, the product reliability is relatively stable and within the normal fluctuation range. Different measures can be taken according to the obtained reliability change trend.

[0077] For example, if the failure probability P r (r) Below the lower limit failure probability C b , it means that the reliability of the satellite navigation terminal has an upward trend; if the failure probability P r (r) Failure probability exceeding the upper limit , it means that the reliability of the satellite navigation terminal has a downward trend; if the failure probability P r (r) Failure probability at the lower limit C b and upper limit failure probability If it is between , it means that the reliability of the satellite navigation terminal fluctuates within the normal range and the production process can continue.

[0078] In this embodiment, the reliability change trend of the satellite navigation terminal is obtained based on the failure probability, lower failure limit and upper failure limit of the satellite navigation terminal, so that the corresponding production process is executed according to the reliability change trend, and the fluctuation of the reliability evaluation index can be accurately monitored, thereby accurately evaluating the reliability level of the satellite navigation terminal.

[0079] In an exemplary embodiment, the method further includes: obtaining product information of the current batch of satellite navigation terminals, and obtaining product characteristics based on the product information; obtaining a risk probability value table and a fluctuation ratio value table based on the product characteristics, and obtaining the risk probability value and failure fluctuation ratio based on the risk probability value table and the fluctuation ratio value table.

[0080] Optionally, in actual applications, different fluctuation ratios and risk probability values ​​can be set according to the product characteristics of the satellite navigation terminal. When conducting reliability assessment, the risk probability value table and the fluctuation ratio value table can be directly searched and matched according to the product characteristics to determine the specific risk probability value and failure fluctuation ratio of the current batch of satellite navigation terminals.

[0081] In this embodiment, by obtaining a risk probability value table and a fluctuation ratio value table according to product characteristics, the pertinence of reliability assessment can be improved, and reliability assessment of the satellite navigation terminal can be accurately achieved.

[0082] In an exemplary embodiment, the failure fluctuation ratio can be set as shown in Table 1. The failure fluctuation ratio is the ratio of the upper limit to the lower limit of the fluctuation range. By setting an appropriate failure fluctuation ratio, the range of reliability fluctuation can be limited. In Table 1, K is the slope of the line representing the failure determination boundary value at different values ​​of the risk probability and the failure fluctuation ratio.

[0083] Table 1 Fluctuation ratio value table

[0084]

[0085] For example, as shown in Table 2 and Table 3, Table 2 and Table 3 are respectively the values ​​of C when the first risk value α and the second risk value β are equal, at different failure fluctuation ratios D and different risk values ​​α=β. 上限值 The value of C 下限值 The value of .

[0086] Table 2 C 上限值Value Table

[0087]

[0088] Table 3 C 下限值 Value Table

[0089]

[0090] For example, Figure 3 As shown, Figure 3 A schematic diagram of fluctuation determination for reliability assessment is shown in Figure 1. Figure 3 The horizontal axis is the working time, and the vertical axis is the failure probability. Figure 3 The failure fluctuation ratio selected for the decision diagram shown in FIG is D=2, the first risk value α=the second risk value β=0.2, and the mathematical expression of the slope K of the straight line is:

[0091]

[0092] The intercepts represent the upper limit failure probability C 上限值 and the lower limit failure probability C 下限值 Among them, C 上限值 and C 下限值 The mathematical expression is:

[0093]

[0094]

[0095] In an exemplary embodiment, Figure 4 As shown, a satellite navigation reliability assessment method is provided, the method comprising the following steps:

[0096] S402: Obtain a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals.

[0097] The upper limit of the fluctuation range is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0098] S404: Obtain the risk probability value and failure fluctuation ratio according to the fluctuation range.

[0099] Among them, the risk probability value includes a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to the judgment reference reliability level being not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to the judgment reference reliability level being less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0100] S406: Obtain the upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within the preset working time when the reference reliability level is equal to the upper limit value of the fluctuation range; obtain the lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within the preset working time when the reference reliability level is equal to the lower limit value of the fluctuation range; obtain the failure expression corresponding to the satellite navigation terminal based on the upper limit failure probability and the lower limit failure probability, and obtain the failure judgment boundary value based on the failure expression.

[0101] Among them, the failure judgment boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal failing a preset number of times within a preset working time.

[0102] S408: Obtain the reliability change trend of the satellite navigation terminal according to the failure probability, lower failure limit and upper failure limit of the satellite navigation terminal, so as to execute a corresponding production process according to the reliability change trend.

[0103] S410: Obtain product information of the current batch of satellite navigation terminals, and obtain product characteristics based on the product information; obtain a risk probability value table and a fluctuation ratio value table based on the product characteristics, and obtain the risk probability value and failure fluctuation ratio based on the risk probability value table and the fluctuation ratio value table.

[0104] In this embodiment, by obtaining the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals, obtaining the risk probability value and the failure fluctuation ratio according to the fluctuation range, obtaining the failure judgment boundary value based on the risk probability value and the failure fluctuation ratio, and performing reliability assessment on the satellite navigation terminal according to the failure probability and failure judgment boundary value of the satellite navigation terminal, the fluctuation of the reliability assessment index can be accurately monitored, thereby accurately assessing the reliability level of the satellite navigation terminal.

[0105] It should be understood that, although the steps in the flowcharts of the above embodiments are shown in sequence as indicated by the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be performed in other orders. Moreover, at least a portion of the steps in the flowcharts of the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily to be performed in sequence, but can be performed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0106] Based on the same inventive concept, embodiments of the present application further provide a satellite navigation reliability assessment device for implementing the satellite navigation reliability assessment method described above. The implementation solution provided by the device is similar to the implementation solution described in the above method. Therefore, the specific limitations of one or more satellite navigation reliability assessment device embodiments provided below can be found in the above-mentioned limitations of the satellite navigation reliability assessment method and will not be repeated here.

[0107] In an exemplary embodiment, Figure 5 As shown, a satellite navigation reliability assessment device is provided, comprising: a first acquisition module 10, a second acquisition module 20, a failure determination module 30 and a reliability assessment module 40, wherein:

[0108] The first acquisition module 10 is configured to acquire a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals.

[0109] The second acquisition module 20 is used to acquire the risk probability value and the failure fluctuation ratio according to the fluctuation range.

[0110] The failure determination module 30 is configured to obtain a failure determination boundary value based on the risk probability value and the failure fluctuation ratio.

[0111] The reliability evaluation module 40 is used to perform reliability evaluation on the satellite navigation terminal according to the failure probability and failure judgment boundary value of the satellite navigation terminal.

[0112] In an exemplary embodiment, the upper limit of the fluctuation range involved in the first acquisition module 10 is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0113] In an exemplary embodiment, the risk probability values ​​involved in the second acquisition module 20 include a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to the judgment that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to the judgment that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0114] In an exemplary embodiment, the failure determination module 30 is also used to obtain the upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the upper limit value of the fluctuation range; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the lower limit value of the fluctuation range; based on the upper limit failure probability and the lower limit failure probability, the failure expression corresponding to the satellite navigation terminal is obtained, and based on the failure expression, the failure determination boundary value is obtained.

[0115] In an exemplary embodiment, the failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal failing a preset number of times within a preset working time; the reliability evaluation module 40 is also used to obtain the reliability change trend of the satellite navigation terminal based on the failure probability, lower failure limit value and upper failure limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0116] In an exemplary embodiment, the first acquisition module 10 is further configured to acquire product information of a current batch of satellite navigation terminals, and acquire product features based on the product information;

[0117] Obtain the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtain the risk probability value and failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0118] Each module in the satellite navigation reliability assessment device described above can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in the computer device in the form of software, so that the processor can call and execute the corresponding operations of each module.

[0119] In an exemplary embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as shown in FIG. Figure 6As shown. The computer device includes a processor, memory, an input / output interface, a communication interface, a display unit, and an input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with external terminals via wired or wireless means, and the wireless means can be implemented via Wi-Fi, mobile cellular networks, near-field communication (NFC), or other technologies. When executed by the processor, the computer program implements a method for assessing the reliability of satellite navigation. The display unit of the computer device is used to form a visually visible image, and can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device casing, or an external keyboard, touchpad or mouse.

[0120] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0121] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the following steps when executing the computer program: obtaining a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals; obtaining a risk probability value and a failure fluctuation ratio based on the fluctuation range; obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; and performing a reliability assessment on the satellite navigation terminal based on the failure probability and the failure determination boundary value of the satellite navigation terminal.

[0122] In one embodiment, the upper limit of the fluctuation range involved when the processor executes the computer program is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0123] In one embodiment, the risk probability values ​​involved when the processor executes a computer program include a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0124] In one embodiment, when a processor executes a computer program, the processor obtains a failure determination boundary value based on a risk probability value and a failure fluctuation ratio, including: obtaining an upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining a lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining a failure expression corresponding to the satellite navigation terminal based on the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value based on the failure expression.

[0125] In one embodiment, the failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal failing a preset number of times within a preset working time; when the processor executes a computer program, the reliability assessment of the satellite navigation terminal is performed based on the failure probability and failure determination boundary value of the satellite navigation terminal, including: obtaining the reliability change trend of the satellite navigation terminal based on the failure probability, lower failure limit value and upper failure limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0126] In one embodiment, when the processor executes the computer program, it also implements the following steps: obtaining product information of the current batch of satellite navigation terminals, and obtaining product characteristics based on the product information; obtaining a risk probability value table and a fluctuation ratio value table based on the product characteristics, and obtaining the risk probability value and failure fluctuation ratio based on the risk probability value table and the fluctuation ratio value table.

[0127] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented: obtaining a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals; obtaining a risk probability value and a failure fluctuation ratio based on the fluctuation range; obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; and performing a reliability assessment on the satellite navigation terminal based on the failure probability and the failure determination boundary value of the satellite navigation terminal.

[0128] In one embodiment, the upper limit of the fluctuation range involved when the computer program is executed by the processor is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0129] In one embodiment, the risk probability values ​​involved when a computer program is executed by a processor include a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to a judgment that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to a judgment that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0130] In one embodiment, when a computer program is executed by a processor, the computer program involves obtaining a failure determination boundary value based on a risk probability value and a failure fluctuation ratio, including: obtaining an upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining a lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining a failure expression corresponding to the satellite navigation terminal based on the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value based on the failure expression.

[0131] In one embodiment, the failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal failing a preset number of times within a preset working time; when the computer program is executed by the processor, the reliability assessment of the satellite navigation terminal is performed based on the failure probability and failure determination boundary value of the satellite navigation terminal, including: obtaining the reliability change trend of the satellite navigation terminal based on the failure probability, lower failure limit value and upper failure limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0132] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: obtaining product information of the current batch of satellite navigation terminals, and obtaining product characteristics based on the product information; obtaining a risk probability value table and a fluctuation ratio value table based on the product characteristics, and obtaining the risk probability value and failure fluctuation ratio based on the risk probability value table and the fluctuation ratio value table.

[0133] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps: obtaining a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals; obtaining a risk probability value and a failure fluctuation ratio based on the fluctuation range; obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; and performing a reliability assessment on the satellite navigation terminal based on the failure probability and the failure determination boundary value of the satellite navigation terminal.

[0134] In one embodiment, the upper limit of the fluctuation range involved when the computer program is executed by the processor is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0135] In one embodiment, the risk probability values ​​involved when a computer program is executed by a processor include a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to a judgment that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to a judgment that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value of the fluctuation range and the lower limit value of the fluctuation range.

[0136] In one embodiment, when a computer program is executed by a processor, the computer program involves obtaining a failure determination boundary value based on a risk probability value and a failure fluctuation ratio, including: obtaining an upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining a lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal will fail a preset number of times within a preset working time when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining a failure expression corresponding to the satellite navigation terminal based on the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value based on the failure expression.

[0137] In one embodiment, the failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of a satellite navigation terminal failing a preset number of times within a preset working time; when the computer program is executed by the processor, the reliability assessment of the satellite navigation terminal is performed based on the failure probability and failure determination boundary value of the satellite navigation terminal, including: obtaining the reliability change trend of the satellite navigation terminal based on the failure probability, lower failure limit value and upper failure limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0138] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: obtaining product information of the current batch of satellite navigation terminals, and obtaining product characteristics based on the product information; obtaining a risk probability value table and a fluctuation ratio value table based on the product characteristics, and obtaining the risk probability value and failure fluctuation ratio based on the risk probability value table and the fluctuation ratio value table.

[0139] Those skilled in the art will understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. In particular, any reference to memory, database, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The databases involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the various embodiments provided herein may be, but are not limited to, general-purpose processors, central processing units (CPUs), graphics processing units (GPUs), digital signal processors (DSPs), programmable logic devices (PLDs), quantum computing-based data processing logic devices, artificial intelligence (AI) processors, and the like.

[0140] The technical features of the above embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0141] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A satellite navigation reliability assessment method, characterized in that: The method comprises: Obtain the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals; According to the fluctuation range, a risk probability value and a failure fluctuation ratio are obtained; the risk probability value includes a first risk value and a second risk value; the first risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit of the fluctuation range, and the second risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit of the fluctuation range and the lower limit of the fluctuation range; obtaining an upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability being used to represent a probability that the satellite navigation terminal will experience a preset number of failures within a preset operating time when the reference reliability level is equal to an upper limit of the fluctuation range; Obtaining a lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability being used to represent a probability that the satellite navigation terminal will experience a preset number of failures within the preset operating time when the reference reliability level is equal to a lower limit of the fluctuation range; Obtaining a failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value according to the failure expression; A reliability assessment is performed on the satellite navigation terminal according to the failure probability of the satellite navigation terminal and the failure determination boundary value.

2. The method according to claim 1, characterized in that The upper limit of the fluctuation range is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

3. The method according to claim 1, characterized in that The failure determination boundary value includes a lower failure limit value and an upper failure limit value; the failure probability is used to characterize the probability of the satellite navigation terminal failing a preset number of times within a preset working time; The performing reliability assessment on the satellite navigation terminal according to the failure probability of the satellite navigation terminal and the failure determination boundary value includes: According to the failure probability of the satellite navigation terminal, the lower failure limit value and the upper failure limit value, the reliability change trend of the satellite navigation terminal is obtained, so as to execute a corresponding production process according to the reliability change trend.

4. The method according to claim 1, wherein The method further comprises: Obtain product information of a current batch of satellite navigation terminals, and obtain product features based on the product information; A risk probability value table and a fluctuation ratio value table are obtained according to the product characteristics, and a risk probability value and a failure fluctuation ratio are obtained according to the risk probability value table and the fluctuation ratio value table.

5. A satellite navigation reliability assessment device, characterized in that: The device comprises: A first acquisition module is used to obtain a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals; a second acquisition module, configured to acquire a risk probability value and a failure fluctuation ratio based on the fluctuation range; the risk probability value includes a first risk value and a second risk value; the first risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is not less than an upper limit of the fluctuation range, and the second risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is less than a lower limit of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit of the fluctuation range and the lower limit of the fluctuation range; a failure determination module, configured to obtain an upper limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the upper limit failure probability being used to represent a probability that the satellite navigation terminal will experience a preset number of failures within a preset operating time when the reference reliability level is equal to an upper limit of the fluctuation range; Obtaining a lower limit failure probability of the satellite navigation terminal based on the risk probability value and the failure fluctuation ratio; the lower limit failure probability being used to represent a probability that the satellite navigation terminal will experience a preset number of failures within the preset operating time when the reference reliability level is equal to a lower limit of the fluctuation range; Obtaining a failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value according to the failure expression; The reliability evaluation module is used to perform reliability evaluation on the satellite navigation terminal according to the failure probability of the satellite navigation terminal and the failure judgment boundary value.

6. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 4 are implemented.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

8. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

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