Signal distribution apparatus, apparatus test method, and storage medium

Abstract

The invention is suitable for the technical field of controller detection, and provides signal distribution equipment, an equipment testing method and a storage medium, and the signal distribution equipment is internally provided with a plurality of first transmission channels; the output end of any first transmission channel is used for connecting a tested device; the signal distribution equipment is used for receiving a test signal, and the first test signal is used for testing the performance of the tested equipment; and the signal distribution equipment is also used for obtaining multiple paths of test signals according to the test signals, and distributing each path of test signal to the tested equipment connected with each first transmission channel through the multiple first transmission channels at the same time sequence. As the signal distribution equipment is adopted when the plurality of tested equipment is tested, the plurality of tested equipment can be tested in parallel, the test efficiency is improved, and the resource consumption can be reduced.

Description

Technical Field

[0001] This application belongs to the technical field of controller detection, and particularly relates to a signal distribution device, a testing method for the device, and a storage medium. Background Art

[0002] With the development of technology and the continuous improvement of consumers' demand for automotive intelligence, the hardware systems of in-vehicle domain controllers or central controllers have become increasingly complex, and the software systems relying on these hardware have also become more complex. The increase in system complexity poses higher requirements for testing.

[0003] In the related art, when testing a controller, a one-to-one testing method is adopted, where one set of testing systems corresponds to one electronic control unit (ECU). If multiple ECUs need to be tested, multiple sets of testing systems need to be configured to run simultaneously, and each set of testing systems is responsible for testing one ECU. This requires a large amount of testing equipment and resources, resulting in low testing efficiency and excessive resource consumption. Summary of the Invention

[0004] Embodiments of this application provide a signal distribution device, a testing method for the device, and a storage medium. This solution is used to achieve how to use one set of testing systems to perform parallel testing on multiple devices under test, improve the testing efficiency of the devices under test, and shorten the testing time.

[0005] In a first aspect, embodiments of this application provide a testing method, including: a testing device sends a first test signal to a first signal distribution device, and the first test signal is used to test a first performance of multiple devices under test. The first signal distribution device is configured to obtain multiple paths of first test signals based on the first test signal and distribute them to multiple devices under test in the same time sequence. The testing device acquires first test data of the multiple devices under test, and the first test data is data obtained when the device under test performs testing on itself according to the first test signal. The testing device detects the first performance of each of the multiple devices under test based on the respective first test data of the multiple devices under test.

[0006] As an example, the first signal distribution device may adopt the signal distribution device described in the second aspect or various possible implementation manners of the second aspect.

[0007] In the embodiments of the present application, the test device sends a first test signal to a first signal distribution device, so that the first signal distribution device splits the first test signal into multiple first test signals and sends them to multiple devices under test in parallel at the same time sequence. In this way, multiple devices under test can use the first test signal for testing simultaneously and obtain the output results (first test data) after executing the first test signal respectively. The test device evaluates the first performance of the devices under test by obtaining the first test data of each device under test. The above method can realize simultaneous testing of multiple devices under test. Since there is no need to set up a separate test system for each device under test, the consumption of test resources and time is reduced, and the test time is shortened.

[0008] In a possible implementation manner of the first aspect, the test device detects the first performance of multiple devices under test according to the respective first test data of the multiple devices under test, including: the test device compares the first test data of each device under test with the expected data. If the error between the first test data of any device under test and the expected data is within a preset threshold, the test device determines that the first performance corresponding to the device under test executing the first test signal meets the preset standard. If the error between the first test data of any device under test and the expected data exceeds the preset threshold, the test device determines that the first performance corresponding to the device under test executing the first test signal does not meet the preset standard.

[0009] In the embodiments of the present application, by comparing the first test data of each device under test with the expected data, the first performance of each device under test can be accurately evaluated. This method ensures the objectivity and accuracy of performance evaluation and avoids errors that may be caused by subjective judgment.

[0010] In a possible implementation manner of the first aspect, the test device detects the first performance of multiple devices under test according to the respective first test data of the multiple devices under test, including: the test device compares the first test data of the multiple devices under test to obtain a comparison result of the first test data of the multiple devices under test. The test device determines whether the respective first performance of the devices under test meets the preset standard according to the comparison result of the first test data of the multiple devices under test.

[0011] In the embodiments of the present application, by comparing the first test data of multiple devices under test, the devices under test with abnormal performance can be detected more accurately. If the first test data of a certain device under test is significantly different from that of other devices, this usually indicates that there may be a problem with the first performance of the device under test. This method of comparing multiple devices under test can reduce the possibility of misjudgment and improve the accuracy of anomaly detection.

[0012] In a possible implementation of the first aspect, the test device determines whether the respective first performances of the devices under test meet the preset standards according to the comparison results of the first test data of multiple devices under test, including: if the comparison results of the first test data of multiple devices under test indicate that the first test data of multiple devices under test are the same, the test device determines that the first performances of multiple devices under test corresponding to the first test signal meet the preset standards. If the comparison results of the first test data of multiple devices under test indicate that the first test data of any device under test is abnormal, it is determined that the first performance of any device under test corresponding to the first test signal does not meet the preset standards.

[0013] In the embodiments of the present application, by comparing the first test data of multiple devices under test, if the first test data of all devices under test are the same, it can be determined that the first performances of these devices under test are normal. This ensures the consistent performance of the devices under test under the same conditions, verifying the stability and reliability of the system.

[0014] In a possible implementation of the first aspect, the first signal distribution device is one of multiple signal distribution devices, and the method provided in the embodiments of the present application further includes: the test device sends different second test signals to at least one second signal distribution device among multiple signal distribution devices, the second test signals are used to test the second performances of the devices under test, and different second test signals are used to test different second performances of the devices under test; the second signal distribution device is configured to obtain multiple paths of the second test signals according to the second test signals and distribute them to multiple devices under test in the same time sequence. The test device acquires multiple second test data obtained by testing the second test signals respectively sent by multiple devices under test. The test detects the respective second performances of multiple devices under test according to the multiple second test data output by the respective devices under test.

[0015] In the embodiments of the present application, sending different second test signals to the devices under test can ensure the diversity of test signals. Different test signals can cover more test scenarios and conditions, thereby more comprehensively evaluating the performance of the devices under test.

[0016] In a possible implementation of the first aspect, when the test device also sends different second test signals to at least one second signal distribution device respectively, the method provided by the embodiments of the present application further includes: the test device determines a time sequence, where the time sequence includes multiple signal distribution times, and the multiple signal distribution times correspond to the multiple signal distribution devices one by one; the multiple signal distribution devices include at least one second signal distribution device and a first signal distribution device, and the time sequence is determined by the delays of the multiple signal distribution devices. The test device sends the second test signal according to the signal distribution time corresponding to each of the at least one second signal distribution device in the time sequence, and sends the first test signal according to the signal distribution time corresponding to the first signal distribution device, so that the multiple devices under test receive the different second test signals and the first test signal at the same time or within a preset time error range.

[0017] In the embodiments of the present application, by setting a time sequence to control the time when the test device sends signals to multiple signal distribution devices, it can ensure that the devices under test receive multiple test signals simultaneously. This synchronization guarantees the accuracy and consistency of the test, and avoids test result deviations caused by different signal reception times.

[0018] In a possible implementation of the first aspect, before the test device sends the first test signal to the first signal distribution device, the method provided by the embodiments of the present application further includes: when the test device also sends second test signals to at least one second signal distribution device respectively, the test device obtains the delay corresponding to each of the first signal distribution device and the at least one second signal distribution device. The at least one second signal distribution device and the first signal distribution device are both connected to the multiple devices under test. Based on the delay corresponding to the target signal distribution device among the at least one second signal distribution device and the first signal distribution device, the signal sending time of the first signal distribution device and the signal sending times of other signal distribution devices are determined. The target signal distribution device is the signal distribution device with the longest delay among the multiple signal distribution devices. Correspondingly, sending the first test signal to the first signal distribution device includes: sending the first test signal to the first signal distribution device at the signal sending time of the first signal distribution device, and the signal sending time of the first signal distribution device is later than the time when the target signal distribution device sends the second test signal, and the second test signal is used to test the second performance of the device under test.

[0019] In a possible implementation of the first aspect, determining the signal sending time of the first signal distribution device based on the delay corresponding to the target signal distribution device among the at least one second signal distribution device and the first signal distribution device includes:

[0020] Based on the delay corresponding to the target signal distribution device and the delay amount of the output time of the first signal distribution device on the test device;

[0021] According to the delay amount of the output time of the first signal distribution device on the test device and the time when the target signal distribution device sends the test signal, adjust the signal sending time of the first test signal sent to the first signal distribution device so that any DUT receives the second test signal and the first test signal at the same time.

[0022] In a possible implementation of the first aspect, based on the delay corresponding to the target signal distribution device among at least one second signal distribution device and the first signal distribution device, determine the delay amount of the output time of the second signal distribution device on the test device. According to the delay amount of the output time of other signal distribution devices on the test device and the time when the target signal distribution device sends the test signal, adjust the signal sending time to other signal distribution devices so that any DUT receives the second test signal and the first test signal at the same time.

[0023] In a possible implementation of the first aspect, according to the delay amount of the output time of other signal distribution devices on the test device and the time when the target signal distribution device sends the test signal, adjusting the signal sending time to other signal distribution devices includes: sending the second test signal to the target signal distribution device at a first time. For any other signal distribution device, use the time after delaying the output time delay amount of the other signal distribution device on the test device based on the first time as the signal sending time of the other signal distribution device.

[0024] In a possible implementation of the first aspect, obtaining first test data respectively sent by multiple DUTs includes: obtaining the first test data respectively sent by multiple DUTs from the first signal distribution device, and the multiple DUTs are also connected to multiple data input ends of the first signal distribution device; or, obtaining the first test data respectively sent by multiple DUTs from the acquisition device, the multiple DUTs are also connected to multiple data input ends of the acquisition device, and the acquisition device is also connected to the test device.

[0025] In a possible implementation of the first aspect, obtaining first test data respectively sent by multiple DUTs includes: obtaining the first test data respectively sent by multiple DUTs from the transceiver module, the first signal distribution device is connected to the transceiver module, and the transceiver module is also connected to the multiple DUTs. There are multiple second transmission channels in the transceiver module.

[0026] In a second aspect, a signal distribution device provided by an embodiment of the present application has a plurality of first transmission channels within the signal distribution device; the output end of any one of the first transmission channels is used to connect a device under test; the signal distribution device is used to receive a test signal. The test signal is used to test the performance of the device under test; the signal distribution device is further used to obtain multiple test signals according to the test signal, and distribute each test signal to the device under test connected to each first transmission channel through the plurality of first transmission channels in the same time sequence.

[0027] In a possible implementation manner of the second aspect, the signal distribution device includes: a shunt module, configured to copy the test signal to obtain multiple test signals; the signal distribution device has a plurality of first output ports, and one or more second output ports of the shunt module and the plurality of first output ports form a plurality of first transmission channels. The shunt module is configured to transmit one test signal through each first transmission channel among the plurality of first transmission channels.

[0028] In a possible implementation manner of the second aspect, the signal distribution device further includes a plurality of transmission modules, wherein the plurality of transmission modules are connected to the shunt module, the plurality of transmission modules are located on the first transmission channels, and the plurality of transmission modules are respectively connected to the plurality of second output ports and the plurality of first output ports in a one-to-one correspondence.

[0029] In a possible implementation manner of the second aspect, the signal distribution device is a video splitter, the shunt module is a deserialiser, and the transmission module is a serializer; or, the signal distribution device is a CAN gateway / LIM gateway, the shunt module is a processor, and the transmission module is a first transceiver; or, the signal distribution device is an Ethernet gateway, and the transmission module is a routing module.

[0030] In a possible implementation manner of the second aspect, the signal distribution device is a CAN gateway / LIM gateway, and the signal distribution device further includes: a second transceiver, connected to the shunt module, and the second transceiver is configured to obtain the test signal and send the test signal to the shunt module.

[0031] In a possible implementation manner of the second aspect, the signal distribution device is an IO splitter, and the shunt module is further connected to an IO output module. The IO output module is configured to connect to a test device to obtain the test signal and provide the test signal to the IO splitter.

[0032] In a possible implementation manner of the second aspect, the signal distribution device is an Ethernet gateway, and the Ethernet gateway further has a plurality of second transmission channels inside. The second transmission channels are connected to a device under test, and the Ethernet gateway is further configured to transmit the test data of the device under test connected to each second transmission channel to the test device through the plurality of second transmission channels. The test data is obtained based on the test signal, and the test data is used to determine the performance of the device under test.

[0033] In a possible implementation of the second aspect, the signal distribution device has one or more first input ports, and the multiple first input ports correspond one-to-one to multiple first transmission channels, or multiple first transmission channels are all connected to one first input port; the first input port is used to receive a test signal.

[0034] In a possible implementation of the second aspect, the signal distribution device further has multiple second transmission channels, and any one of the second transmission channels is used to connect a device under test. The signal distribution device is further configured to transmit the test data of the device under test connected to each second transmission channel to the test device through the multiple second transmission channels. The test data is obtained by testing based on the test signal, and the test data is used to determine the performance of the device under test.

[0035] In a possible implementation of the second aspect, the signal distribution device includes: an IO output module, a transceiver module or an Ethernet module. For example, the transceiver module can be a CAN transceiver module or a LIN transceiver module.

[0036] In a third aspect, an embodiment of the present application provides a test system, including at least one signal distribution device and a test device; the signal distribution device is connected to the test device, and at least one of the signal distribution devices is connected to multiple devices under test, and any one of the signal distribution devices is the signal distribution device described in the second aspect or various possible implementations of the second aspect. The test device is configured to implement the test method described in the first aspect or various possible implementations of the first aspect as above.

[0037] In a possible implementation of the third aspect, the types of at least one signal distribution device are different.

[0038] In a possible implementation of the third aspect, the signal distribution device and the test device are different modules in the same test device, or the signal distribution device and the test device are different devices.

[0039] In a possible implementation of the third aspect, the test system further includes: an acquisition device, and the acquisition device is respectively connected to multiple devices under test and the test device.

[0040] The acquisition device is configured to transmit the test data of any one of the multiple devices under test collected to the test device.

[0041] In a possible implementation of the third aspect, the test device is further configured to obtain the test data of each device under test from the signal distribution device.

[0042] Fourthly, an embodiment of the present application provides a testing device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the testing method described in the above first aspect or a possible implementation manner of the first aspect is implemented.

[0043] Fifthly, an embodiment of the present application provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the testing method described in the above first aspect or a possible implementation manner of the first aspect is implemented.

[0044] Sixthly, an embodiment of the present application provides a computer program product. When the computer program product runs on a testing device, the testing device is caused to execute the testing method described in the above first aspect or a possible implementation manner of the first aspect.

[0045] Seventhly, an embodiment of the present application provides a testing device for a device. The device can be a testing device or can also be a device (such as a chip) applied to a testing device. The device includes:

[0046] A signal sending unit, configured to send a first test signal to a first signal distribution device, where the first test signal is used to test a first performance of a plurality of devices under test; the first signal distribution device is configured to obtain multiple paths of first test signals according to the first test signal and distribute them to the plurality of devices under test in the same time sequence; a receiving unit, configured to obtain first test data of the plurality of devices under test, where the first test data is data obtained when the device under test tests itself according to the first test signal;

[0047] A processing unit, configured to detect the first performance of each of the plurality of devices under test according to the output data of each of the plurality of devices under test.

[0048] In a possible implementation manner, the processing unit includes: a comparison module and a determination module. The comparison module is configured to compare the first test data of each device under test with expected data; if the error between the first test data of any device under test and the expected data is within a preset threshold, the determination module is configured to determine that the first performance corresponding to the first test signal executed by the device under test meets the preset standard; if the error between the first test data of any device under test and the expected data exceeds the preset threshold, the determination module is configured to determine that the first performance corresponding to the first test signal executed by the device under test does not meet the preset standard.

[0049] In a possible implementation, the processing unit includes: a comparison module and a determination module. The comparison module is configured to compare the first test data of multiple devices under test to obtain a comparison result of the first test data of the multiple devices under test. The determination module is configured to determine whether the respective first performances of the devices under test meet a preset standard according to the comparison result of the first test data of the multiple devices under test.

[0050] In a possible implementation, if the comparison result of the first test data of the multiple devices under test indicates that the first test data of the multiple devices under test are the same, the determination module is configured to determine that the first performances of the multiple devices under test corresponding to the execution of the first test signal meet the preset standard. If the comparison result of the first test data of the multiple devices under test indicates that there is abnormal first test data for any one of the devices under test, the determination module is configured to determine that the first performance of any one of the devices under test corresponding to the execution of the first test signal does not meet the preset standard.

[0051] In a possible implementation, before the signal sending unit sends a first test signal to the first signal distribution device, the processing unit is further configured to: when the test device also sends second test signals to at least one second signal distribution device respectively, obtain the delays corresponding to the first signal distribution device and the at least one second signal distribution device respectively. Both the at least one second signal distribution device and the first signal distribution device are connected to the multiple devices under test. Based on the delay corresponding to the target signal distribution device among the at least one second signal distribution device and the first signal distribution device, determine the signal sending time of the first signal distribution device. The target signal distribution device is the signal distribution device with the longest delay among the multiple signal distribution devices.

[0052] Correspondingly, the signal sending unit is configured to send the first test signal to the first signal distribution device at the signal sending time of the first signal distribution device. The signal sending time of the first signal distribution device is later than the time when the target signal distribution device sends the second test signal. The second test signal is used to test the second performance of the device under test.

[0053] In a possible implementation, the processing unit is configured to: based on the delay corresponding to the target signal distribution device and the delays corresponding to the multiple signal distribution devices respectively, calculate the output time delay amounts of the other signal distribution devices on the test device. The multiple signal distribution devices include the first signal distribution device and at least one second signal distribution device. And it is configured to adjust the signal sending times to the other signal distribution devices according to the output time delay amounts of the other signal distribution devices on the test device, so that any device under test receives the second test signal and the first test signal at the same time.

[0054] In a possible implementation, a signal sending unit is configured to send a second test signal to a target signal distribution device at a first time; and for any other signal distribution device, use the time obtained by delaying the output time of the other signal distribution device on the test device by a delay amount after the first time as the signal sending time of the other signal distribution device.

[0055] It can be understood that the beneficial effects of the second to seventh aspects described above can be referred to the relevant descriptions in the first aspect, and will not be elaborated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] To more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0057] Figure 1 It is a schematic structural diagram of a test system provided by an embodiment of the present application Figure 1 ;

[0058] Figures 2 to 11 It is a schematic structural diagram of a signal distribution device provided by an embodiment of the present application;

[0059] Figure 12 It is a schematic flowchart of a test method for a device provided by an embodiment of the present application Figure 1 ;

[0060] Figure 13 It is a schematic flowchart of a test method for a device provided by an embodiment of the present application Figure 2 ;

[0061] Figure 14 It is a schematic flowchart of a test method for a device provided by an embodiment of the present application Figure 3 ;

[0062] Figure 15 It is a test system for parallel testing of multiple test signals provided by an embodiment of the present application;

[0063] Figure 16 It is a schematic timing diagram of the delay of each signal distribution device provided by an embodiment of the present application;

[0064] Figure 17 It is a schematic signal sending timing diagram when multiple devices under test are tested in parallel provided by an embodiment of the present application;

[0065] Figure 18 It is a schematic structural diagram of a test device provided by an embodiment of the present application;

[0066] Figure 19 This is a schematic structural diagram of the test device provided by the embodiments of the present application. Detailed implementation manners

[0067] In the following description, specific details such as specific system architectures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. However, those skilled in the art should clearly understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present application.

[0068] It should be understood that when used in the specification of the present application and the appended claims, the term "comprising" indicates the presence of the described features, wholes, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.

[0069] It should also be understood that the term "and / or" used in the specification of the present application and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0070] As used in the specification of the present application and the appended claims, the term "if" can be interpreted as "when", "once", "in response to determining", or "in response to detecting" depending on the context. Similarly, the phrase "if determined" or "if detecting [the described condition or event]" can be interpreted as meaning "once determined", "in response to determining", "once detecting [the described condition or event]", or "in response to detecting [the described condition or event]" depending on the context.

[0071] In addition, in the description of the specification of the present application and the appended claims, the terms "first", "second", "third", etc. are only used for distinguishing descriptions and cannot be understood as indicating or implying relative importance.

[0072] Referring to "one embodiment" or "some embodiments" described in the specification of the present application means that specific features, structures, or characteristics described in connection with the embodiment are included in one or more embodiments of the present application. Thus, statements such as "in one embodiment", "in some embodiments", "in other some embodiments", "in still other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways.

[0073] With the development of technology and the continuous improvement of consumers' demand for vehicle intelligence, the hardware system of in-vehicle domain controllers or central controllers has become increasingly complex, and the software systems relying on these hardware have also become more complex. The increase in system complexity poses higher requirements for testing.

[0074] When testing a controlled device (such as a controller, for example, an ECU) in related technologies, a one-to-one test is adopted, and a set of test systems is used to test the performance of one ECU. If multiple ECUs need to be tested, multiple sets of test systems need to be configured to run simultaneously, and each set of test systems is responsible for testing one ECU. This requires a large amount of test equipment and resources, resulting in low test efficiency and excessive resource consumption.

[0075] To solve the above technical problems, embodiments of the present application provide a signal distribution device, a testing method for the device, a test system, and a storage medium. This method can achieve parallel testing of multiple devices under test. The test device outputs a test signal, and this test signal is distributed by the signal distribution device to obtain multiple identical and independent test signals. Then, the signal distribution device inputs the multiple identical and independent test signals into each device under test in the same timing, so that multiple devices under test can perform tests based on the received test signals. Since this solution realizes simultaneous testing of multiple devices under test in a parallel manner, the test time can be reduced.

[0076] See Figure 1 which is a schematic structure of the test system provided by embodiments of the present application Figure 1 including: a test device 100, and at least one signal distribution device (such as signal distribution devices 200, 300, signal distribution device n). n is an integer greater than or equal to 1. Embodiments of the present application do not limit the value of n.

[0077] Optionally, the at least one signal distribution device can be connected to multiple devices under test. The types of multiple signal distribution devices can be different.

[0078] In a possible embodiment of the present application, the test device 100 can communicate directly with at least one signal distribution device. For example, the test device 100 has one or more first communication ports, and the one or more first communication ports are respectively connected to a signal distribution device. The test device 100 can send different test signals to different signal distribution devices through different first communication ports. For example, the test device 100 can send test signal 1 to a signal distribution device through one communication port, and send test signal 2 to a signal sending device through another communication port. Test signal 1 and test signal 2 are respectively used to test different performances of the same device under test.

[0079] In a possible embodiment of the present application, taking the signal distribution device as a CAN gateway as an example, the test device 100 can communicate with the CAN gateway through other communication modules (such as the following transceiver module), that is, the test device 100 can send a test signal to the transceiver module, and then the transceiver module sends it to the CAN gateway.

[0080] For example, the performance of the device under test may include one or more of the following: the ability of the device under test to process video signals, the ability of the communication rate supported by the device under test, and the performance of the device under test under different loads. It should be noted that the above performance of the device under test is only an example and does not constitute a limitation. The performance of the device under test may also include other performances.

[0081] Among them, any signal distribution device is used to decompose a test signal sent by the test device into multiple identical test signals, and send the multiple identical test signals to different devices under test, so that each test signal is received by a device under test, so as to realize parallel testing of multiple devices under test by a set of control systems.

[0082] In a possible embodiment of the present application, the test device 100 may also have multiple second communication ports, and any one of the second communication ports is used to receive test data output by a device under test. For example, any one of the second communication ports of the test device 100 can receive test data output by a device under test through a transceiver module or a signal distribution device or a collection device.

[0083] In a possible embodiment of the present application, the above test system may further include: a transceiver module or a collection device. Among them, the collection device or the transceiver module is also connected to multiple devices under test.

[0084] As an example, the device under test in the embodiment of the present application may refer to a controller under test. The devices under test in different scenarios may be different. For example, in the in-vehicle domain scenario, the devices under test may be an engine controller, a brake controller, etc.

[0085] Similarly, in different test scenarios, the signal distribution device may also be different. For example, when testing the ability of the device under test (such as the controller under test) to process video signals, the signal distribution device is a video splitter. In the scenario of testing the supported communication rate of the device under test, the signal distribution device is a CAN signal splitter (which can also be called a CAN gateway); in the scenario of testing the performance of the device under test under different loads, the signal distribution device is an IO (Input / Output) splitter, etc. Different splitters are used as signal distribution devices to distribute test signals to different devices under test, so as to realize parallel testing of multiple devices under test.

[0086] In a possible embodiment of the present application, the above-mentioned test device 100 and one or more signal sending devices may be different modules in the same device, or may be different independently deployed devices. The embodiments of the present application do not limit this.

[0087] As Figure 2 shown, Figure 2 is a schematic structural diagram of a signal distribution device provided by an embodiment of the present application. As Figure 2 shown, the signal distribution device has a plurality of first transmission channels. The output end of any one of the first transmission channels is used to connect a device under test. The signal distribution device is used to receive a test signal, and the test signal is used to test the performance of the device under test. The signal distribution device is further used to obtain multiple test signals based on the test signal, and distribute each test signal to the device under test connected to each first transmission channel through the plurality of first transmission channels in the same time sequence.

[0088] Since the signal distribution device has a plurality of first transmission channels, and the output end of any one of the first transmission channels is used to connect a device under test, after the signal distribution device receives the test signal, it can split the test signal through the plurality of first transmission channels, so that a plurality of devices under test can receive the same test signal.

[0089] As Figure 3 shown, Figure 3 is a schematic structural diagram of another signal distribution device provided by an embodiment of the present application. The signal distribution device includes: a splitting module, and the splitting module is used to copy the test signal to obtain multiple test signals. The signal distribution device has a plurality of first output ports, and one or more second output ports of the splitting module and the plurality of first output ports form a plurality of first transmission channels. The splitting module is used to transmit one test signal through each of the plurality of first transmission channels.

[0090] It can be understood that the signal distribution device also has a first input port, and this first input port is used to obtain the test device. For example, the first input port can be connected to the test device. Or the first input port can be connected to the test device through other devices.

[0091] As Figure 3 shown, the signal distribution device can be a video splitter, an Ethernet gateway, a CAN gateway / LIM gateway, an IO splitter.

[0092] Optionally, as Figure 4 shown, the signal distribution device further includes a plurality of transmission modules, wherein the plurality of transmission modules are connected to the splitting module, the plurality of transmission modules are located on the first transmission channels, and the plurality of transmission modules are respectively connected to the plurality of second output ports and the plurality of first output ports in one-to-one correspondence.

[0093] The structures of different signal distribution devices will be introduced separately below.

[0094] As an example, as Figure 5 shown, taking the signal distribution device as a video splitter as an example, the splitting module can be a deserialiser, and the transmission module can be a serializer.

[0095] The input port of the deserialiser serves as the first input port of the signal distribution device for receiving test signals (such as video signals in LVDS format); or the input port of the deserialiser is connected to the first input port of the signal distribution device for receiving test signals. For example, in Figure 5 the shown architecture, the test device is connected to the deserialiser of the video splitter. The multiple MIPI output ports of the deserialiser are connected to the signal input ports of different serializers (such as serializer 1,..., serializer n), and the signal output ports of the serializers are connected to the LVDS input ports of different devices under test. For example, the signal output port of serializer 1 is connected to the device under test 1, the signal output port of serializer 2 is connected to the device under test 2,..., and the signal output port of serializer n is connected to the device under test n. Among them, the MIPI output ports of the deserialiser in the video splitter are configured in mirror mode. That is, the video signal at the input port of the deserialiser will be copied into multiple copies and output through the MIPI output ports of the deserialiser.

[0096] The deserialiser is used to copy the test signal to obtain multiple identical test signals, and to output the multiple identical test signals to the signal input ports of multiple serializers through multiple MIPI output ports respectively; the multiple serializers are used to output test signals to the connected devices under test through the signal output ports of the multiple serializers.

[0097] It can be understood that in Figure 5 the shown structure, the deserialiser and multiple serializers form multiple first transmission channels.

[0098] In a possible embodiment of the present application, if the signal distribution device is a LIN gateway, the first transceiver may refer to the first LIN transceiver, and the second transceiver may refer to the second LIN transceiver. The transceiver module may refer to the LIN transceiver module. The LIN gateway can communicate with the test device through the LIN transceiver module. If the signal distribution device is a CAN gateway, the first transceiver may refer to the first CAN transceiver, and the second transceiver may refer to the second CAN transceiver. The transceiver module may refer to the CAN transceiver module. The CAN gateway can communicate with the test device through the CAN transceiver module.

[0099] As Figure 6As shown, taking the signal distribution device as a CAN gateway as an example, the shunt module is a processor (such as a CPU, MCU, or SOC), and the transmission module is a first CAN transceiver. The output end of the first CAN transceiver serves as or is connected to the first output port. For example, Figure 6 As shown, the CPU, MCU, or SOC is connected to the first transceiver 1, ……, the first transceiver n.

[0100] Such as Figure 6 As shown, the signal distribution device further includes a second CAN transceiver; the signal distribution device is connected to the test device through a CAN transceiver module (which can also be a CAN sending module), and the test device is used to output test signals; the CAN transceiver module is used to forward the test signals to the second transceiver. The second transceiver is used to obtain the test signals from the CAN transceiver module and to send the test signals to the CPU, MCU, or SOC. Among them, the CAN transceiver module is a hardware device for implementing the CAN communication protocol. CAN is a serial communication protocol widely used in fields such as automotive, industrial automation, and medical equipment for efficient and reliable data exchange between different electronic control units (ECUs).

[0101] In Figure 6 In the scenario shown, the test signals sent by the test device can be test signals sent through the Controller Area Network (CAN), and these signals can be used to test the supported communication rate of the device under test, etc.

[0102] In Figure 6 In the structure shown, the test device is directly connected to the CAN transceiver module, and the CAN transceiver module is then connected to the CAN gateway. Inside the CAN gateway, multiple first transmission channels (i.e., CAN channels) are formed through the second transceiver, MCU / SOC, and multiple first CAN transceivers, and then connected to the CAN channels of different devices under test through multiple independent CAN channels. When the test device outputs test signals (such as CAN signals), the CAN gateway is used to copy the original CAN signal into multiple CAN signals in parallel and send them to multiple devices under test. After receiving the CAN signals, the multiple devices under test can perform tests to obtain test data.

[0103] As an example, optionally, the CAN transceiver module has channel 1 and multiple channels (channels 2 to channel n + 1), where channel 1 is used to transmit test signals, and channels 2 to channel n + 1 are used to transmit the test data of the devices under test. For the test data of the devices under test for CAN signals, the CAN channel of each device under test is connected to other independent channels 2 of the transceiver module, and the test data of each device under test is received through the transceiver module and finally the results are sent to the test device.

[0104] For example, Channel 2 is used to transmit the test data of Device Under Test 1, …, Channel n+1 is used to transmit the test data of Device Under Test n.

[0105] As Figure 7 shown, taking the signal distribution device as an IO splitter as an example, as Figure 7 shown, the IO splitter is also connected to an IO output module. The IO output module is used to connect to a test device to obtain a test signal and to provide the test signal to the IO splitter.

[0106] In Figure 7 the architecture shown, the output channels of the IO splitter are connected to the IO input channels of different Devices Under Test. The IO signals (i.e., test signals) output by the test device are copied into multiple paths of IO signals (such as IO Signal 1 to IO Signal n) in parallel by the IO splitter and given to multiple Devices Under Test (such as Device Under Test 1 to Device Under Test n).

[0107] It can be understood that in Figure 7 the architecture shown, the IO splitter internally has multiple first transmission channels, and each first transmission channel is used to transmit an IO signal.

[0108] Optionally, as Figure 7 shown, the IO outputs of multiple Devices Under Test can also be connected to an acquisition device (such as an IO acquisition module), and the IO acquisition module is also connected to a test device. For the test devices output by the Devices Under Test, the output IO of each Device Under Test is independently connected to different input channels of the IO acquisition module, and the test devices of each Device Under Test are acquired by the IO acquisition module and sent to the test device.

[0109] In the embodiments of the present application, by setting an IO splitter, multiple identical IO signals are generated in real time by the IO splitter, the software control is simple, and only one signal is output in the test control unit, and the IO splitter can be used to realize one path splitting into multiple paths of signals.

[0110] As Figure 8 shown, taking the signal distribution device as an Ethernet gateway as an example, the splitting module of the Ethernet gateway is a routing module. The routing module is used to split the test signal into multiple paths of test signals.

[0111] As Figure 8As shown, the routing module has an input port and an input end of a plurality of first transmission channels (channel 1, … channel n) connected to the input port. The input port of the routing module is connected to the input port of the Ethernet gateway. The output ends of the plurality of first transmission channels correspond to the plurality of first output ports of the signal distribution device one by one. The routing module is used to obtain a test signal through the input port of the routing module, and the routing module is used to transmit the test signal to the corresponding device under test through the plurality of first transmission channels in parallel.

[0112] Optionally, as Figure 8 shown, the routing module also has a plurality of second transmission channels (such as channel 1’, … Channel n’). The input ports of the plurality of second transmission channels are respectively connected to the plurality of second input ports of the Ethernet gateway or serve as the plurality of second input ports of the Ethernet gateway to connect to a plurality of devices under test. The output ports of the plurality of second transmission channels are respectively connected to the plurality of second output ports of the Ethernet gateway or serve as the plurality of second output ports to connect to the test device. Any one of the second transmission channels is used to transmit the test data output by the connected device under test and transmit the test data to the test device.

[0113] In another possible embodiment of the present application, the signal distribution device has one or more first input ports. The plurality of first input ports correspond to the plurality of first transmission channels one by one, or the plurality of first transmission channels are all connected to one first input port; the first input port is used to receive a test signal;

[0114] In another possible embodiment of the present application, the signal distribution device also has a plurality of second transmission channels. Any one of the second transmission channels is used to connect to a device under test;

[0115] The signal distribution device is also used to transmit the test data of each device under test connected to the second transmission channel to the test device through the plurality of second transmission channels. The test data is obtained based on the test signal, and the test data is used to determine the performance of the device under test.

[0116] In another possible embodiment of the present application, the signal distribution device includes: an IO output module, a transceiver module or an Ethernet module.

[0117] The following will be combined with Figures 9 to 11 to separately describe the specific structures of different types of signal distribution devices.

[0118] Such as Figure 9As shown, taking the LIN transceiver module and the CAN transceiver module of the signal distribution device as an example, the LIN transceiver module and the CAN transceiver module can be multi-channel transceiver modules, that is, there are multiple first transmission channels in the LIN transceiver module and the CAN transceiver module as CAN / LIN transceiver channels (such as Figure 9 the channels marked as odd numbers in

[0119] . The LIN transceiver module and the CAN transceiver module are connected to the CAN / LIN channels of different devices under test through independent channels. On these independent channels, the test device controls the output of the same CAN signal as the test signal to different devices under test. Figure 9 As shown, there are also multiple second transmission channels in the LIN transceiver module and the CAN transceiver module as CAN / LIN transceiver channels (such as Figure 9 the channels marked as even numbers in

[0120] . For the CAN output signal (i.e., test data) of the device under test, the CAN channel of each device under test is connected to other independent second transmission channels of the transceiver module, and the test data of each device under test is received through the transceiver module and finally the result is sent to the test device.

[0121] It can be understood that for the device under test, it can have one port connected to one second transmission channel and one first transmission channel. Of course, for a device under test, it can also have multiple ports, one of which is used to connect to the second transmission channel and one is used to connect to the first transmission channel. The embodiments of the present application do not make any limitations in this regard.

[0122] In Figure 9 the structure shown, the CAN transceiver module or the LIN transceiver module can have a first input port, and this first input port is connected to the test device to obtain the test signal. This one first input port can be connected to multiple first transmission channels to split one path of test signal into multiple paths of test signals.

[0123] As Figure 10 shown, taking the IO output module of the signal distribution device as an example, this IO output module can have multiple first transmission channels. The test device directly controls the IO output module and outputs the same multiple paths of IO signals to different devices under test at the same time.

[0124] Optionally, as Figure 10 shown, an IO acquisition module is also connected to the IO output of each device under test as the acquisition device. The IO output of each device under test is independently connected to different input channels of the IO acquisition module, and the IO output of each device under test is acquired through the IO acquisition module and the test data is sent to the test device. Figure 10The shown signal distribution device has a simple structure. The IO splitter is omitted, and the multi-channel IO output module is directly used to output IO simultaneously.

[0125] As Figure 11 shown, Figure 11 Taking the signal distribution device as an Ethernet module as an example for description, the Ethernet module includes multiple first transmission channels. The Ethernet module is simultaneously connected to the Ethernet interfaces of different devices under test through different first transmission channels. The test device communicates and interacts with multiple devices under test through multiple first transmission channels. Optionally, multiple devices under test can also be connected to multiple second transmission channels in the Ethernet module to transmit the test data of the devices under test to the test device through the second transmission channels.

[0126] See Figure 12 , which is a schematic flow chart of the test method for the device provided by the embodiments of the present application. As an example rather than a limitation, the method can be executed by the test device or by the control unit in the test device. The embodiments of the present application do not make a limitation on this. The following takes the method being executed by the test device as an example for description. The method includes the following steps:

[0127] S101, the test device sends a first test signal.

[0128] Among them, the first test signal is used to test the first performance of the device under test.

[0129] For example, the test device can send a first test signal to the first signal distribution device. Among them, the first signal distribution device is used to obtain multiple first test signals according to the first test signal and distribute them to multiple devices under test in the same time sequence.

[0130] In an embodiment of the present application, the first signal distribution device can be a module built into the test device. Of course, multiple signal distribution devices can be built into the test device, such as the first signal distribution device and the second signal distribution device.

[0131] In another possible embodiment of the present application, the first signal distribution device can be a device externally connected to the test device and connected between the test device and multiple devices under test.

[0132] As an example, assuming that the input port of the first signal distribution device is connected to the output port of the test device, then the test device can send a first test signal to the input port of the first signal distribution device.

[0133] As another example, assume that the input port of the first signal distribution device is connected to the output port of the test device through other communication modules (such as a transceiver module). Then, the test device can send a first test signal to the transceiver module, and the transceiver module forwards the first test signal to the first signal distribution device.

[0134] As an example, the first signal distribution device can be the structure described in any of the Figures 2 to 11 drawings, and the embodiments of the present application do not limit this.

[0135] In the embodiments of the present application, the test device generates a first test signal, the test device sends the first test signal to the first signal distribution device, and the first signal distribution device sends the first test signal to each DUT through multiple internal first transmission channels in the same time sequence, so that each DUT can receive the same first test signal at the same time. Any DUT can perform a first performance test based on the received first test signal.

[0136] It should be noted that the same time sequence in the embodiments of the present application does not mean that the time is exactly the same, and it can refer to the error in time within a preset error range. Of course, each DUT receiving the same first test signal at the same time does not mean that the time is exactly the same, and it can refer to the time when different DUTs receive the first test signal within the error range.

[0137] S102. The test device obtains first test data output by multiple DUTs.

[0138] For example, the first test data is the data obtained when the DUT is tested according to the first test signal.

[0139] In the embodiments of the present application, after multiple DUTs receive the first test signal, the multiple DUTs parse and process the first test signal, perform corresponding operations, and finally each DUT outputs a first test data. The test device obtains the first test data of multiple different DUTs and analyzes the first test data of each DUT to determine the first performance of the DUT.

[0140] Due to different structures of the first signal distribution device or different scenarios, the specific implementation of the test device obtaining the first test data of multiple DUTs is different. The following will separately describe the specific implementation of S102 in different scenarios.

[0141] For example, if the first signal distribution device adopts the structure shown in Figure 8 or Figure 9 , in one embodiment, step S102 includes:

[0142] The test device obtains first test data respectively sent by multiple devices under test from the first signal distribution device. The multiple devices under test are also connected to multiple data input ends of the first signal distribution device. There is also a second transmission channel in the first signal distribution device. This second transmission channel corresponds to one data input end and is used to transmit the first test data to the test device.

[0143] As an example, when the first signal distribution device is a multi-channel data transmission device with signal transceiver functions, each device under test sends the first test data back to the first signal distribution device through the data input end of the first signal distribution device, and the test device obtains the first test data output by the multiple devices under test from the first signal distribution device.

[0144] For example, if the first signal distribution device adopts a structure such as Figure 5 、 Figure 7 or Figure 10 shown, in one embodiment, step S102 includes:

[0145] The test device obtains output data respectively sent by multiple devices under test from the acquisition device. The multiple devices under test are also connected to multiple data input ends of the acquisition device, and the acquisition device is also connected to the test device.

[0146] As another example, when the first signal distribution device is a single-channel data transmission device that only includes signal sending functions, each device under test sends the output data to an acquisition device through the data input end of the acquisition device, and the acquisition device transmits the first test data of any device under test collected to the test device, and the test device obtains the first test data output by the multiple devices under test from the acquisition device.

[0147] For example, if the first signal distribution device adopts a structure such as Figure 6 shown, in one embodiment, step S102 includes:

[0148] The test device obtains output data respectively sent by multiple devices under test from the transceiver module. The multiple devices under test are also connected to multiple data input ends of the acquisition device, and the acquisition device is also connected to the test device.

[0149] For example, the transceiver module has Channel 1 and Channels 2 to n + 1. Among them, the first test signal is transmitted to the CAN gateway through Channel 1. The final test signal is received by the second transceiver in the CAN gateway and then transmitted to the MCU. The MCU copies the first test signal to obtain multiple first test signals, and then the MCU transmits one first test signal to the device under test through each first transceiver. After any device under test performs a test based on the first test signal to obtain the first test data, it can send the first test data to the transceiver module, and then the transceiver module feeds back the first test data to the test device through one of the Channels 2 to n + 1 connected to the device under test.

[0150] In the embodiments of the present application, according to the differences in the signal distribution devices in different scenarios, the methods for obtaining the first test data of the devices under test are different.

[0151] S103. The test device detects the respective first performances of multiple devices under test according to the respective first test data of the multiple devices under test.

[0152] The first signal distribution device in the embodiments of the present application can be a distribution device with different functions. The following will introduce the first signal distribution device from different aspects:

[0153] For example, as Figure 5 shown, the first signal distribution device is a video splitter, which can be used to detect the performance of the device under test in processing video signals.

[0154] As an example, referring to Figure 5 , which is a schematic diagram of the test system provided by the embodiments of the present application Figure 1 , in this architecture, the test device can output a video signal in Low-Voltage Differential Signaling (LVDS) format as the first test signal. Correspondingly, the deserialiser receives the LVDS-format video signal sent from the test device. The output port of the Mobile Industry Processor Interface (MIPI) of the deserialiser is configured in mirror mode, that is, the input video signal is copied into multiple copies to obtain multiple video signals, and the video signals are output to multiple serialisers through the mipi output port of the deserialiser, so that each serialiser sends the video signal to the device under test for testing. After each device under test tests the video signal, its corresponding first test data is collected by the video acquisition module through its respective corresponding data output channel. The video acquisition module is connected to the test device and sends all the first test data of all channels to the test device.

[0155] Among them, the above LVDS format is a data transmission format in the vehicle domain, which has the advantages of low power consumption, low electromagnetic interference (EMI), high anti-interference ability, and high-speed transmission.

[0156] Combined with Figure 6 , the first signal distribution device is: a CAN gateway or a LIN gateway. The CAN gateway or LIN gateway is connected to the test device through a transceiver module (such as a CAN transceiver module or a LIN transceiver module). The test device sends a first test signal to the first signal distribution device, including: the test device sends a CAN / LIN signal to the transceiver module as the first test signal. The transceiver module receives the CAN signal / LIN signal and sends the CAN signal / LIN signal to the CAN gateway or LIN gateway. The second transceiver receives the CAN signal / LIN signal from the transceiver module and sends it to the MCU / SOC. The MCU / SOC copies the CAN signal / LIN signal to obtain multiple CAN signals / LIN signals. The MCU / SOC sends each CAN signal / LIN signal in the multiple CAN signals / LIN signals to the device under test through a second transceiver.

[0157] The following takes the first signal distribution device as the Figure 7 shown IO splitter as an example to describe the specific process of the test method of the present application. In this scenario, the first test device can be used to detect the performance of the device under test under different loads.

[0158] For example, the first test signal is an IO (Input / Output) signal. This first test signal can test the performance of the device under test under different loads, etc. In this scenario, the test device is connected to an IO output module, and the output IO of the IO output module is connected to the input channel of the IO splitter. The output channels of the IO splitter are connected to the IO input channels of different devices under test. The IO splitter copies one IO signal output by the test device into multiple IO signals, and then the multiple IO signals are parallelly distributed to multiple devices under test by the IO splitter in the same time sequence.

[0159] As Figure 7 shown, multiple devices under test are also connected to an IO acquisition module, and the IO acquisition module is also connected to the test device. The IO acquisition module can acquire the first test data respectively output by multiple devices under test and send the first test data of the multiple devices under test to the test device, so that the test device can obtain the first test data of multiple devices under test.

[0160] As Figure 8 shown, taking the first signal distribution device as the Figure 8Taking the Ethernet gateway shown as an example, the specific process of the test method of this application is described. In the above example, the test device sends an Ethernet signal as the first test signal, and this Ethernet signal enters the Ethernet gateway through the input port of the Ethernet gateway. Then, the routing module in the Ethernet gateway copies the Ethernet signal to obtain multiple Ethernet signals, and then the routing module transmits the multiple Ethernet signals to each DUT (Device Under Test) through different first transmission channels in the same time sequence.

[0161] As Figure 8 shown, there are also multiple second transmission channels in the Ethernet gateway. After any DUT tests the Ethernet signal, it can obtain an Ethernet feedback signal as the first test data, and then transmits the Ethernet feedback signal to the test device through a second transmission channel.

[0162] As Figure 9 shown, taking the first signal distribution device as the transceiver module as an example, the test device sends a CAN signal as the first test signal to the transceiver module, and multiple first transmission channels in the transceiver module respectively transmit a first test signal to each DUT connected to each first transmission channel. As Figure 9 shown, there are also multiple second transmission channels in the transceiver module. After any DUT tests the Ethernet signal, it can obtain the first test data, and then transmits the first test data to the test device through a second transmission channel.

[0163] As Figure 10 shown, taking the first signal distribution device as the IO output module as an example, the test device sends an output instruction as the first test signal to the IO output module, and multiple first transmission channels in the IO output module respectively transmit a first test signal to each DUT connected to each first transmission channel. As Figure 10 shown, multiple DUTs are also connected to an IO acquisition module, and the IO acquisition module is also connected to the test device. After any DUT tests the first test signal, it can obtain the first test data, and then transmits the first test data to the test device through an IO acquisition module.

[0164] As Figure 11 shown, taking the first signal distribution device as the Ethernet module as an example, the test device sends an output instruction as the first test signal to the Ethernet module, and multiple first transmission channels in the Ethernet module respectively transmit a first test signal to each DUT connected to each first transmission channel. As Figure 11As shown, the Ethernet module may also have multiple second transmission channels. Multiple devices under test are also connected to multiple second transmission channels, and these multiple second transmission channels are also connected to a test device. After any device under test tests the first test signal, it can obtain first test data, and then transmit the first test data to the test device through one of the second transmission channels.

[0165] In a possible embodiment, as Figure 13 shown, step S103 provided in the embodiment of the present application can be implemented in the following manner:

[0166] S1031a. The test device compares the first test data of each device under test with the expected data.

[0167] In the embodiment of the present application, after receiving the first test data of multiple devices under test, the test device can compare the first test data of each device under test with the respective corresponding expected data to verify whether the first performance corresponding to the device under test meets the preset standard.

[0168] Among them, the expected data refers to the output data generated by the device under test in the normal working state. For example, when testing the frequency response and dynamic performance of the device under test, that is, the first test signal can be a 5 Hz sine wave, the device under test should be able to follow the frequency change of the first test signal and keep the waveform of the output data consistent with the first test signal, then the waveform of the expected data is consistent with the first test signal.

[0169] S1032a. If the error between the first test data of any device under test and the expected data is within the preset threshold, the test device determines that the first performance corresponding to the device under test for executing the first test signal meets the preset standard.

[0170] In the embodiment of the present application, calculate the difference between the expected data and the output data of each device under test. The preset threshold is a pre-determined error range used to determine whether the performance of the controller is within an acceptable range. If the calculated difference between the output data and the expected data of each device under test is within the preset range, it is determined that the performance of the device under test for executing the first test signal meets the preset standard, and it is considered that the performance of the device under test is normal.

[0171] S1033a. If the error between the output data of the device under test and the expected data exceeds the preset threshold, it is determined that the first performance corresponding to the device under test for executing the first test signal does not meet the preset standard.

[0172] In the embodiments of the present application, similarly, if the difference between the output data and the expected data of a certain device under test exceeds the acceptable range of the device under test, it is determined that the performance of the device under test does not meet the preset performance corresponding to the first test signal and is abnormal. At this time, a series of measures need to be taken for the device under test to diagnose and repair the problem to ensure that the device resumes normal operation.

[0173] In the above method, by comparing the output data of each device under test with the expected data, the first performance of each device under test can be accurately evaluated. This method ensures the objectivity and accuracy of the first performance evaluation and avoids errors that may be caused by subjective judgment.

[0174] In one embodiment, refer to Figure 14 , step S103 in the above embodiment can also be implemented in the following manner:

[0175] S1031b, the test device compares the first test data of multiple devices under test to obtain the comparison result of the first test data of multiple devices under test.

[0176] In the embodiments of the present application, multiple devices under test can be evaluated based on the consistency of the first test data to determine the device under test with performance anomalies. Since the first test signal is the same and the same performance of the device under test is tested, by comparing the first test data output by multiple devices under test, the device under test with performance anomalies can be determined.

[0177] S1032b, the test device determines the respective first performance of the devices under test according to the comparison result of the first test data of multiple devices under test to determine the first performance corresponding to each device under test.

[0178] In one embodiment, step S1032b includes:

[0179] If the comparison result of the first test data output by multiple devices under test indicates that the multiple first test data are the same or the error meets the preset requirements, it is determined that the first performance corresponding to the first test signal executed by the multiple devices under test meets the preset standard; if the comparison result of the first test data output by multiple devices under test indicates that there is abnormal first test data, it is determined that the first performance corresponding to the first test signal executed by the device under test corresponding to the abnormal first test data does not meet the preset standard.

[0180] In the embodiments of the present application, if there are n devices under test, the first test data output by each device under test are s1, s2, …, sn respectively. If s1 = s2 = … = sn, the performance (the first performance) of all devices under test for executing the first test signal is normal and meets the preset standard. If there exists si ≠ sj (where i ≠ j), it is determined that the first performance of the devices under test corresponding to si and sj is abnormal and does not meet the preset standard.

[0181] It should be noted that in practical applications, a fault tolerance mechanism may need to be considered, such as allowing a certain error range.

[0182] In the above method, by comparing the first test data of multiple devices under test, if the first test data of all devices under test are the same, it can be determined that the first performance of these devices under test is normal. This ensures the consistent performance of the devices under the same conditions and verifies the stability and reliability of the system.

[0183] In a possible embodiment of the present application, the above process of using the first test signal to determine the first performance of multiple devices under test is described by taking the test device sending the first test signal to a first signal distribution device as an example. However, in actual processes, in order to reduce the test time and improve the test efficiency, the test device can also test different performances of multiple devices under test.

[0184] For example, the test device can send multiple test signals, including the first test signal and the second test signal, where the first test signal and the second test signal are used to test different performances of the same device under test. The first test signal and the second test signal can be distributed by different signal distribution devices. For example, the first test signal is distributed to multiple devices under test by the first signal distribution device, and the second test signal is distributed to multiple devices under test by the second signal distribution device.

[0185] However, usually, due to the different delays of different signal distribution devices, even if the test device sends different test signals at the same time, the arrival times of these different test signals at the devices under test after being forwarded by different signal distribution devices may also be different. Therefore, the following will describe how the test device adjusts the signal sending times of different test signals so that the arrival times of different test signals at the devices under test after being forwarded by different signal distribution devices are approximately the same.

[0186] In a possible embodiment of the present application, the test device can determine the signal transmission time of different test signals in the following manner: The first signal distribution device is any one of a plurality of signal distribution devices. Before step S101 in the method provided by the embodiment of the present application, the method further includes: When the test device also sends second test signals to at least one second signal distribution device among the plurality of signal distribution devices, the test device obtains the delay corresponding to each signal distribution device. At least one second signal distribution device and the first signal distribution device are both connected to a plurality of devices under test; the second test signal is used to test the second performance of the device under test; the test device determines the signal transmission time of the first signal distribution device based on the delay of the target signal distribution device among the plurality of signal distribution devices; the target signal distribution device is the signal distribution device with the longest delay among the plurality of signal distribution devices.

[0187] Correspondingly, the above step S101 can be implemented in the following manner:

[0188] Send the first test signal to the first signal distribution device at the signal transmission time, and the signal transmission time is later than the time when the target signal distribution device sends the second test signal.

[0189] As an example, the test device determines the signal transmission time of the first signal distribution device based on the delay of the target signal distribution device among the plurality of signal distribution devices, including: The test device calculates the output time delay amount of other signal distribution devices on the test device based on the delay corresponding to the target signal distribution device and the delays corresponding to the plurality of signal distribution devices respectively; the test device adjusts the signal transmission time to other signal distribution devices according to the output time delay amount of other signal distribution devices on the test device, so that any device under test receives the second test signal and the first test signal at the same time.

[0190] As an example, the test device adjusts the signal transmission time to other signal distribution devices according to the output time delay amount of other signal distribution devices on the test device, including: Send the second test signal to the target signal distribution device at the first time; for any other signal distribution device, use the time after delaying the output time delay amount of the other signal distribution device on the test device based on the first time as the signal transmission time of the other signal distribution device.

[0191] In a possible embodiment of the present application, the method provided by the embodiment of the present application may further include:

[0192] Step 30: The test device sends a second test signal to each of the multiple second signal distribution devices according to the signal transmission time corresponding to each second signal distribution device. One second signal distribution device corresponds to one second test signal, and different second test signals are used to test different second performances of the device under test. The second test signal is used to test the second performance of the device under test.

[0193] Step 40: The test device obtains multiple second test data respectively output by the multiple devices under test; each piece of data is the data obtained when the device under test is tested according to each second test signal.

[0194] Step 50: The test device detects the performance of each of the multiple devices under test according to the multiple pieces of data respectively output by the multiple devices under test, so as to determine the second performance corresponding to each device under test.

[0195] In the embodiment of the present application, the manner in which the test device collects the multiple second test data of the multiple devices under test is the same as that in step S102 above, and will not be elaborated here.

[0196] In the embodiment of the present application, the test device analyzes the multiple second test data collected to verify the multiple second performances corresponding to each device under test. For the specific implementation of the performance analysis, please refer to the specific implementation of step S102 above, which will not be elaborated here.

[0197] As an example, as Figure 15 shown, it is a schematic diagram of a system for parallel testing of multiple test signals provided by the embodiment of the present application. As Figure 15 shown, the test system includes: a CAN / LIN gateway, an Ethernet gateway, a video splitter, and an IO splitter connected to the test device. The test device sends multiple test signals, such as Ethernet signals, IO output data, video signals, and CAN signals. Among them, one of the Ethernet signal, the IO output data, the video signal, and the CAN signal can be used as the first test signal, and the remaining signals can be used as the second test signal. For example, the CAN signal is split into multiple CAN signals after passing through the CAN gateway or the LIN gateway and sent to the device under test 1 to the device under test n for testing. The test data output by the device under test 1 to the device under test n is collected by the CAN / LIN transceiver module, and the CAN / LIN transceiver module transmits the collected test data to the test device 100.

[0198] The video signal is split into multiple video signals by a video splitter and sent to the Device Under Test 1 to the Device Under Test n for testing. The Device Under Test 1 to the Device Under Test n are also connected with a video acquisition module, and the video acquisition module is used to acquire the test data respectively output by the Device Under Test 1 to the Device Under Test n. The video acquisition module transmits the acquired test data output by the Device Under Test 1 to the Device Under Test n to the test device 100.

[0199] The IO signal is split into multiple IO signals by an IO splitter and sent to the Device Under Test 1 to the Device Under Test n for testing. The Device Under Test 1 to the Device Under Test n are also connected with an IO acquisition module, and the IO acquisition module is used to acquire the test data respectively output by the Device Under Test 1 to the Device Under Test n. The IO acquisition module transmits the acquired test data output by the Device Under Test 1 to the Device Under Test n to the test device 100.

[0200] The Ethernet signal is transmitted through multiple first transmission channels in the Ethernet gateway to obtain multiple Ethernet signals and sent to the Device Under Test 1 to the Device Under Test n for testing. The test data respectively output by the Device Under Test 1 to the Device Under Test n are transmitted to the test device 100 through the second transmission channel in the Ethernet gateway.

[0201] In one embodiment, in order to ensure that multiple test signals can reach the same Device Under Test simultaneously, the embodiments of the present application may further include:

[0202] S501, the test device determines a signal transmission time sequence, and the signal transmission time sequence is the time for sending test signals to each signal distribution device. For example, the signal transmission time sequence includes multiple signal transmission times, such as the signal transmission time for sending a first test signal to a first signal distribution device and the signal transmission time for sending a second test signal to each second signal distribution device.

[0203] Specifically, the delay generated by different signal distribution devices is determined in advance through experiments and recorded. As Figure 16 shown, it is a schematic diagram of determining the delay time of a signal distribution device provided by the embodiments of the present application, including:

[0204] T_Can_gate_delay: the time delay of the can signal from entering the input channel of the CAN gateway to the CAN gateway outputting the CAN signal (as Figure 16 shown in a in

[0205] T_video_spilt_delay: the time delay of the video signal from entering the input channel of the video splitter to the video splitter outputting the video signal (as Figure 16 shown in b in

[0206] T_io_spilt_delay: The time delay from when an IO signal enters the input channel of the IO splitter to when the IO splitter outputs the IO signal (as shown in c below); Figure 16 as shown in c;

[0207] T_eth_gate_delay: The time delay from when an Ethernet signal enters the Ethernet module to when the Ethernet module outputs data (as shown in d below); Figure 16 as shown in d;

[0208] Based on the signal distribution device with the longest delay as the benchmark, and based on the delay data of each signal distribution device obtained through testing, calculate the output time delay amount of other signal distribution devices on the test device. Assume that T_io_spilt_delay is the largest. On the test device, the delay compensation for each output signal is as follows: CAN signal: T_io_spilt_delay - T_Can_gate_delay; video signal: T_io_spilt_delay - T_video_spilt_delay; Ethernet signal: T_io_spilt_delay - T_eth_gate_delay.

[0209] S502. The test device sends second test signals to each second signal distribution device according to the signal sending time sequence, and sends a first test signal to the first signal distribution device, so that multiple devices under test receive the second test signal and the first test signal simultaneously, for parallel testing of multiple devices under test.

[0210] For example, as Figure 17 shown, it is a schematic diagram for determining timing consistency provided by an embodiment of the present application. If the delay times of the signal separators corresponding to the CAN signal, IO signal, video signal, and Ethernet signal are 8s, 10s, 7s, and 5s respectively, then based on the IO signal with the longest delay time as the benchmark, calculate the compensation time for sending other test signals as 10 - 8 = 2s; 10 - 7 = 3s; 10 - 5 = 5s. Then the second time sequence for the test controller to send second test signals to different splitters is 0s (send IO signal) - 2s (send CAN signal) - 3s (send video signal) - 5s (send Ethernet signal).

[0211] In an embodiment of the present application, the test device respectively sends at least one second test signal and a first test signal to different signal distribution devices according to the signal sending time sequence, to ensure that at least one second test signal and the first test signal are input to multiple devices under test simultaneously, and ensure parallel testing of multiple devices under test.

[0212] In the above method, by setting the signal transmission time sequence to control the transmission times of at least one second test signal and the first test signal, it is possible to ensure that the device under test receives multiple test signals simultaneously. This synchronization guarantees the accuracy and consistency of the test and avoids test result deviations caused by different signal reception times.

[0213] In the above method, the diversity of test signals can be ensured. Different test signals can cover more test scenarios and conditions, thereby more comprehensively evaluating the performance of the device under test.

[0214] In one embodiment, the present application provides a test system, including a test device and one or more signal distribution devices. The test device is used to implement the test method described in any one of the above embodiments.

[0215] Optionally, the test device may further include: a plurality of devices under test, and any device under test is connected to one or more signal distribution devices. Any device under test is used to perform a test based on a received test signal to obtain corresponding test data. If any device under test receives multiple different test signals, then the device under test can perform separate tests based on the different multiple test signals to obtain a plurality of different test data.

[0216] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not imply the order of execution. The execution order of each process should be determined according to its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0217] Those skilled in the art can clearly understand that for the convenience and brevity of description, only the above division of each functional unit and module is used as an example. In actual applications, the above functions can be allocated to different functional units and modules as needed, that is, the internal structure of the device is divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiment can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit. In addition, the specific names of each functional unit and module are only for the convenience of mutual distinction and do not limit the protection scope of the present application. The specific working processes of the units and modules in the above system can refer to the corresponding processes in the foregoing method embodiments and will not be elaborated here.

[0218] As Figure 18 shown, Figure 18The structural schematic diagram of a test device provided by an embodiment of the present application is shown. This test device can be applied to a test equipment, or this test device can be the test equipment. As Figure 18 shown, the test device may include: a signal sending unit 1801, a receiving unit 1802, and a processing unit 1803.

[0219] Among them, the signal sending unit 1801 is configured to send a first test signal to a first signal distribution device, and the first test signal is used to test the first performance of a plurality of devices under test; the first signal distribution device is configured to obtain multiple paths of first test signals according to the first test signal and distribute them to the plurality of devices under test in the same time sequence.

[0220] The receiving unit 1802 is configured to obtain the first test data of the plurality of devices under test, and the first test data is the data obtained when the device under test tests itself according to the first test signal.

[0221] The processing unit 1803 is configured to detect the first performance of each of the plurality of devices under test according to the output data of each of the plurality of devices under test.

[0222] In a possible implementation manner, the processing unit includes: a comparison module and a determination module. Among them, the comparison module is configured to compare the first test data of each device under test with the expected data; if the error between the first test data of any device under test and the expected data is within a preset threshold, the determination module is configured to determine that the first performance corresponding to the first test signal executed by the device under test meets the preset standard. If the error between the first test data of any device under test and the expected data exceeds the preset threshold, the determination module is configured to determine that the first performance corresponding to the first test signal executed by the device under test does not meet the preset standard.

[0223] In a possible implementation manner, the processing unit includes: a comparison module and a determination module. Among them, the comparison module is configured to compare the first test data of the plurality of devices under test to obtain a comparison result of the first test data of the plurality of devices under test; the determination module is configured to determine whether the first performance of each device under test meets the preset standard according to the comparison result of the first test data of the plurality of devices under test.

[0224] In a possible implementation manner, if the comparison result of the first test data of the plurality of devices under test indicates that the first test data of the plurality of devices under test is the same, the determination module is configured to determine that the first performance corresponding to the first test signal executed by the plurality of devices under test meets the preset standard;

[0225] If the comparison result of the first test data of multiple devices under test indicates that the first test data of any device under test is abnormal, the determination module is used to determine that the first performance corresponding to the first test signal executed by any device under test does not meet the preset standard.

[0226] In a possible implementation, before the signal sending unit is used to send a first test signal to the first signal distribution device, the processing unit is further used to: when the test device also sends second test signals to at least one second signal distribution device respectively, obtain the delays corresponding to the first signal distribution device and at least one second signal distribution device respectively. The at least one second signal distribution device and the first signal distribution device are both connected to multiple devices under test.

[0227] Based on the delay corresponding to the target signal distribution device among the at least one second signal distribution device and the first signal distribution device, determine the signal sending time of the first signal distribution device; the target signal distribution device is the signal distribution device with the longest delay among multiple signal distribution devices; correspondingly, the signal sending unit is used to send the first test signal to the first signal distribution device at the signal sending time of the first signal distribution device. The signal sending time of the first signal distribution device is later than the time when the target signal distribution device sends the second test signal, and the second test signal is used to test the second performance of the device under test.

[0228] In a possible implementation, the processing unit is used to: based on the delay corresponding to the target signal distribution device and the delays corresponding to multiple signal distribution devices respectively, calculate the output time delay amount of other signal distribution devices on the test device. The multiple signal distribution devices include the first signal distribution device and at least one second signal distribution device; and is used to adjust the signal sending time to other signal distribution devices according to the output time delay amount of other signal distribution devices on the test device, so that any device under test receives the second test signal and the first test signal at the same time.

[0229] In a possible implementation, the signal sending unit is used to send the second test signal to the target signal distribution device at the first time; and for any other signal distribution device, use the time after delaying the output time delay amount of the other signal distribution device on the test device based on the first time as the signal sending time of the other signal distribution device.

[0230] Figure 19 It is a schematic structural diagram of the test device provided by the embodiments of the present application. As Figure 19 shown, the test device 17 of this embodiment includes: at least one processor 170 ( Figure 19Only one) processor, a memory 191, and a computer program 192 stored in the memory 191 and executable on at least one processor 190 are shown. When the processor 190 executes the computer program 192, the steps in any of the above-described parallel test method embodiments are implemented.

[0231] The test device may be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The test device may include, but is not limited to, a processor and a memory. Those skilled in the art can understand that Figure 19 This is only an example of the test device 17 and does not limit the test device 17. It may include more or fewer components than shown in the figure, or combine some components, or different components. For example, it may also include input / output devices, network access devices, etc.

[0232] The so-called processor 170 may be a central processing unit (CPU). The processor 170 may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0233] In some embodiments, the memory 171 may be an internal storage unit of the test device 17, such as the hard disk or memory of the test device 17. In other embodiments, the memory 171 may also be an external storage device of the test device 17, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the test device 17. Further, the memory 171 may also include both the internal storage unit and the external storage device of the test device 17. The memory 171 is used to store an operating system, application programs, a boot loader, data, and other programs, such as the program code of a computer program. The memory 171 may also be used to temporarily store data that has been output or will be output.

[0234] The embodiments of the present application also provide a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the steps in the above-described method embodiments can be implemented.

[0235] An embodiment of the present application provides a computer program product. When the computer program product runs on a test device, it enables the test device to execute steps implemented in the above-mentioned method embodiments.

[0236] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above-mentioned method embodiments of the present application, a computer program can be used to instruct relevant hardware to complete. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, it can implement the steps in the above-mentioned method embodiments. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable medium can at least include: any entity or device that can carry the computer program code to the device / terminal device, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal, and software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk, or an optical disc, etc. In some jurisdictions, according to legislation and patent practice, the computer-readable medium cannot be an electrical carrier signal and a telecommunication signal.

[0237] In the above embodiments, the descriptions of the various embodiments have their own emphases. For parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0238] Those of ordinary skill in the art can realize that the units and algorithm steps of the examples described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0239] In the embodiments provided in the present application, it should be understood that the disclosed device / terminal device and method can be implemented in other ways. For example, the device / terminal device embodiments described above are merely illustrative. For example, the division of modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of devices or units can be in electrical, mechanical or other forms.

[0240] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0241] The above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit them. Although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features. These modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A signal distribution device, characterized in that: The signal distribution device has a plurality of first transmission channels; an output end of any of the first transmission channels is used to connect to a device under test; The signal distribution device is used to receive a test signal, and the test signal is used to test the performance of the device under test; The signal distribution device is further used to obtain multiple test signals according to the test signal, and distribute the multiple test signals to the tested devices connected to each of the first transmission channels through multiple first transmission channels at the same timing.

2. The signal distribution device according to claim 1, characterized in that: The signal distribution device comprises: a shunting module, the shunting module is used to shun the test signal to obtain multiple first test signals; The signal distribution device has a plurality of first output ports, and one or more second output ports of the diversion module and the plurality of the first output ports form a plurality of the first transmission channels; The shunt module is used to transmit one channel of the test signal through each of the first transmission channels.

3. The signal distribution device according to claim 2, characterized in that: The signal distribution device further comprises a plurality of transmission modules, wherein the plurality of transmission modules are connected to one or more second output ports of the diversion module and a plurality of the first output ports, and the plurality of transmission modules are located on the first transmission channel.

4. The signal distribution device according to any one of claims 2 to 3, characterized in that: The signal distribution device is an Ethernet gateway, the Ethernet gateway further has a plurality of second transmission channels, the second transmission channels are connected to one of the devices under test, and the Ethernet gateway is further used to transmit test data of the device under test connected to each of the second transmission channels to the test device through the plurality of second transmission channels; The test data is obtained based on the test signal test, and the test data is used to determine the performance of the device under test.

5. The signal distribution device according to any one of claims 1 to 3, characterized in that: The signal distribution device has one or more first input ports, and the plurality of first input ports correspond one-to-one to the plurality of first transmission channels, or the plurality of first transmission channels are each connected to one first input port; The first input port is used to receive the test signal.

6. The signal distribution device according to claim 5, characterized in that: The signal distribution device further has a plurality of second transmission channels, and any of the second transmission channels is used to connect to one of the devices under test; The signal distribution device is further used to transmit the test data of the device under test connected to each of the second transmission channels to the test device through the plurality of the second transmission channels; The test data is obtained based on the test signal test, and the test data is used to determine the performance of the device under test.

7. A method for testing a device, characterized in that: The method is applied to a test device, and the method comprises: Sending a first test signal to a first signal distribution device, where the first test signal is used to test first performances of a plurality of devices under test; the first signal distribution device is used to obtain a plurality of first test signals according to the first test signal and distribute the first test signals to the plurality of devices under test in the same timing sequence; Acquire first test data of the plurality of devices under test, where the first test data is data obtained when the device under test tests the device under test according to the first test signal; The first performance of each of the plurality of devices under test is detected according to the first test data of each of the plurality of devices under test.

8. The testing method according to claim 7, characterized in that: The detecting the first performance of each of the plurality of tested devices according to the first test data of each of the plurality of tested devices comprises: Comparing the first test data of each of the tested devices with the expected data; If the error between the first test data of any of the tested devices and the expected data is within a preset threshold, it is determined that the first performance corresponding to the first test signal executed by the tested device meets the preset standard; If the error between the first test data of any of the tested devices and the expected data exceeds a preset threshold, it is determined that the first performance corresponding to the first test signal executed by the tested device does not meet a preset standard.

9. The testing method according to claim 7, characterized in that: The detecting the first performance of each of the plurality of tested devices according to the first test data of each of the plurality of tested devices comprises: Comparing the first test data of the plurality of devices under test to obtain a comparison result of the first test data of the plurality of devices under test; It is determined whether the first performance of each of the tested devices meets a preset standard according to a comparison result of the first test data of the plurality of tested devices.

10. The testing method according to any one of claims 7 to 9, characterized in that: The first signal distribution device is any one of a plurality of signal distribution devices, and before sending the first test signal to the first signal distribution device, the method further includes: In the case where the test device also sends a second test signal to at least one second signal distribution device among the plurality of signal distribution devices, respectively, obtaining the delay corresponding to each of the signal distribution devices, at least one of the second signal distribution devices and the first signal distribution device are connected to the plurality of devices under test; the second test signal is used to test the second performance of the device under test; Taking the delay of a target signal distribution device among the multiple signal distribution devices as a benchmark, determining the signal sending time of the first signal distribution device and the signal sending time of the other signal distribution devices; the target signal distribution device is the signal distribution device with the longest delay among the multiple signal distribution devices; Accordingly, sending the first test signal to the first signal distribution device includes: A first test signal is sent to the first signal distribution device at the signal sending time, and the signal sending time is later than the time when the target signal distribution device sends a second test signal.

11. The testing method according to claim 10, characterized in that: The method further comprises: Based on the delay corresponding to the target signal distribution device and the delays corresponding to the plurality of signal distribution devices, the output time delay of the other signal distribution devices on the test device is calculated; According to the output time delay of other signal distribution devices on the test device, the signal sending time to other signal distribution devices is adjusted so that the time when any of the tested devices receives the second test signal and the first test signal is the same.

12. A test device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 7 to 11 is implemented.

13. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 7 to 11 is implemented.

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