Adapter for device for non-destructive testing by electromagnetic radiation
By designing a deformable adapter, the problem that active thermal imaging lossless testing device is difficult to adapt to complex shape components is solved, and the accuracy and safety of automatic adaptation and lossless testing are achieved.
Patent Information
- Application Number
- CN202380076543.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2022-10-31
- Filing Date
- 2023-10-27
- Publication Date
- 2025-06-27
AI Technical Summary
Existing active thermal imaging non-destructive testing devices are difficult to automatically adapt to the complex shapes of the components to be inspected, especially those that are curved or raised, which may cause damage to the components.
An adapter is designed, including a proximal and distal portion, which is equipped with a movable contact element and a deformable optical isolation wall, which can be deformed according to the shape of the component, ensuring good contact and radiation exchange isolation between the device and the component.
The adapter can automatically adapt to complex shapes of components to avoid damage to components while ensuring the accuracy and safety of lossless testing.
Smart Images
Figure CN120225844A_ABST
Abstract
Description
Technical Field
[0001] The present application generally relates to the field of devices and methods for non-destructive testing by means of electromagnetic radiation, and more particularly to the field of devices and methods for non-destructive testing by active thermography. Background Art
[0002] Inspection by active thermography is a traditional non-destructive testing technique. According to this technique, a component to be inspected is irradiated by a heat-providing device (such as a flash lamp), and then the heat flux radiated by the component is acquired by means of a detector (such as an infrared imaging device). Thus, the heat diffusion in the component after irradiation of the component can be displayed. If there is a defect in the component, the display of the heat diffusion exhibits a local heat contrast, thereby enabling the presence of such a defect to be identified. Various spectral domains can be used for the device that provides heat by radiation, such as the infrared domain or the visible light domain.
[0003] Active thermography inspection devices have many drawbacks. Although the parts of these devices that are intended to be placed in contact with the component are flat, the component to be inspected usually has curvatures or protrusions, as in the case of an aircraft fuselage with a convex profile or a storage tank for petrochemical use with a dish-shaped profile. This situation poses difficulties because it is difficult to automatically move the device towards the component to be inspected as the component may be damaged. Summary of the Invention
[0004] An object of the present application is to solve the mentioned drawbacks by proposing an adapter for a device for non-destructive testing by means of electromagnetic radiation, the adapter comprising:
[0005] - a proximal part configured to be attached to a testing device, and
[0006] - a distal part including a contact element that forms a free end and is mounted so that the contact element is movable relative to the proximal part such that the distal part deforms when a force is applied to the contact element.
[0007] Such an adapter is advantageously and optionally supplemented by the following various features individually or in combination:
[0008] - The contact element has a rounded or chamfered edge;
[0009] - The adapter includes a deformable member connected to the contact element to mount the contact element so that the contact element can move relative to the proximal part, preferably, the deformable member is a compression spring element, a single-acting cylinder or a double-acting cylinder;
[0010] - The contact element is rigidly connected to the deformable member, and the contact element has a spherical shape;
[0011] - The contact element is connected to the deformable member by means of a ball-and-socket joint or a pivot joint, and the contact element has a parallelepiped shape;
[0012] - The contact element and the deformable member form a first assembly, and the adapter includes a plurality of assemblies;
[0013] - The contact elements are arranged in pairs and connected, and two connected contact elements are directly connected by an elastic element;
[0014] - The elastic element is a first elastic element, and the two connected contact elements are also directly connected by a second elastic element. The first elastic element and the second elastic element are connected to the contact element by being installed in parallel;
[0015] - The adapter extends in the axial direction from a proximal portion to the distal portion. The adapter is hollow to have a recess in the axial direction, and the recess is presented to the outside of the adapter through the proximal portion and the distal portion. The adapter includes an optical isolation wall surrounding the recess. The wall includes an outer portion that is opaque to electromagnetic radiation and an inner portion that is reflective to electromagnetic radiation. The electromagnetic radiation is intended for the non-destructive test; and
[0016] - The optical isolation wall is deformable. Preferably, the wall includes a fabric, a plastic material, a portion folded in a bellows shape, or segments configured to be nested together in the axial direction.
[0017] The present invention also relates to a system for non-destructive testing by electromagnetic radiation, and the system includes:
[0018] - A device for non-destructive testing by electromagnetic radiation, and the device includes a radiation source and a radiation detector,
[0019] - An adapter as proposed above, and the proximal portion of the adapter is rigidly fixed to the non-destructive testing device.
[0020] Finally, the present invention relates to a method for non-destructively testing a component by radiation, and the method includes the following steps:
[0021] - Placing the contact element of the test system in contact with the component,
[0022] - Applying a force to the contact element, and
[0023] - Move the contact element relative to the rest of the system under the action of a force, and deform the system according to the shape of the component.
[0024] Such a method is advantageously and optionally supplemented by the following steps: emitting radiation from the system towards the component by inspection, and acquiring the time response of the thermal diffusion in the component by the inspection system. Description of the Drawings
[0025] Other features and advantages of the present invention will also become apparent from the following description, which is purely illustrative and non - limiting, and must be read in conjunction with the drawings, in which:
[0026] - Figure 1 is a schematic representation of an adapter according to an embodiment of the present invention;
[0027] - Figure 2 is Figure 1 a schematic representation of a part of the adapter shown in; and
[0028] - Figure 3 and Figure 4 is a schematic representation of a non - destructive testing system according to an embodiment of the present invention. Detailed Description of the Invention
[0029] Device for non-destructive testing by means of electromagnetic radiation
[0030] Referring to Figure 1 、 Figure 3 and Figure 4 ,a device 22 for non - destructive testing by electromagnetic radiation includes a radiation source 24 and a radiation detector 26.
[0031] The radiation source and the radiation detector are located in a housing of the device that is open towards the outside. The housing has an opening 23 of the device. The radiation source and the radiation detector are oriented facing the opening 23 of the device. This orientation thus defines the front face of the device 22. The opening 23 is, for example, a planar surface perpendicular to a first direction, which is the direction corresponding to the axial direction Δ in Figure 1 、 Figure 3 and Figure 4 .
[0032] The source 24 and the detector 26 are oriented towards the outside of the device 22.
[0033] A flash lamp, an incandescent lamp, a halogen lamp, a laser diode or an electronic component can be used as the radiation source 24.
[0034] The radiation source 24 is configured to emit radiation propagating away from the device 22 along the first direction. Then, the emitted radiation passes through the opening 23.
[0035] An infrared camera device, a visible light camera device, or a detector in other spectral domains can be used as the radiation detector 26.
[0036] The radiation detector 26 is configured to detect radiation propagating in a first direction in a manner approaching the device 22. Then, the received radiation passes through the opening 23. In particular, the center of the detector 26 can be located in the first direction.
[0037] The control device 22 can be of the active or multi-spectral thermal imaging type.
[0038] The non-destructive testing device 22 further includes a housing 25 that covers the device except for the opening 23. The housing 25 can be made of a plastic material or metal, and the housing 25 can block electromagnetic radiation that reaches the device and is outside the opening 23.
[0039] The testing device can include a cable channel 27 for supplying to the source 24 and the detector 26 and for transmitting the information measured by the detector 26.
[0040] The cable channel 27 can be provided in the housing 25. For example, the cable channel 27 can be provided in the housing 25 and at the rear of the device 22, that is, the cable channel 27 can be provided in the housing 25 at the rear opposite to the front face of the device 22, and the front face is defined by the opening 23.
[0041] Preferably, the device has a parallelepiped shape and the opening has a rectangular shape.
[0042] Adapter for a device for non-destructive testing by means of electromagnetic radiation
[0043] Reference Figure 1 , an adapter 1 of a device for non-destructive testing by electromagnetic radiation includes: a proximal portion 3 and a distal portion 5. The proximal portion 3 is configured to be attached to a device 22 for non-destructive testing by electromagnetic radiation, and the distal portion 5 is configured to place the distal portion 5 in contact with a component to be tested. The component to be tested is not shown in the figure.
[0044] The adapter 1 extends axially in the direction Δ from the proximal portion 3 as far as the distal portion 5. In this way, when the proximal portion 3 is attached to the testing device 22 and the distal portion 5 is placed in contact with the component to be tested, the adapter is located between the testing device 22 and the component to be tested.
[0045] Preferably, the adapter has a parallelepiped shape, and the proximal portion 3 has a rectangular shape in a cross-section orthogonal to the axial direction Δ. The proximal portion 3 forms a rectangular frame that can be pressed against the non-destructive testing device.
[0046] The adapter 1 can be hollow to have a recess 30 in the axial direction Δ. The recess 30 emerges on the one hand through the proximal part 3 and on the other hand through the distal part 5 to the outside of the adapter 1. In other words, the adapter 1 has a recess 30 that exactly passes through the adapter 1 in the axial direction Δ.
[0047] By attaching the proximal part 3 to the non-destructive testing device 22, the recess 30 can be placed in alignment with the opening 23, so that the first direction coincides with the axial direction Δ. Thus, the radiation emitted by the source 24 in the first direction or respectively the radiation propagating in the first direction in the direction of the detector 26 can pass through the adapter 1 after leaving the source 24 or respectively before reaching the detector 26.
[0048] The adapter 1 can also include an optical isolation wall 28 that surrounds the recess 30. In this way, the radiation reaching the wall 28 will be blocked.
[0049] The wall 28 extends around the axial direction Δ from the proximal part 3 as far as the distal part 5. In this way, when the adapter 1 is hollow to have a recess 30, only the radiation passing through the recess 30 without contacting the wall 28 can be transmitted through the adapter.
[0050] The adapter can for example include a plurality of rod-shaped members, each rod-shaped member being attached to the proximal part 3, and each rod-shaped member extending around the recess 30 in the axial direction Δ. The wall 28 or the protection device surrounds the plurality of rod-shaped members and enables, for example, an axial channel with a rectangular cross-section to be formed, which is visible outside the adapter. This axial channel corresponds to the recess 30. The plurality of rod-shaped members can include four rod-shaped members, each rod-shaped member being attached to the corner of the rectangular shape of the proximal part 3. The plurality of rod-shaped members can include other rod-shaped members parallel to the previous rod-shaped members and distributed on the four sides of the frame.
[0051] It can be sought to isolate the radiation exchange between the device and the component with respect to the external environment, that is, to ensure that the energy emitted by the device towards the component is the only energy received by the component, and vice versa, the energy emitted by the component towards the device is also the only energy received by the device. In particular, it can be sought to isolate the radiation exchange to avoid disturbing the excitation of the component by the device, scattering phenomena, and the signals obtained by the detector from the scattering of the component. It can also be attempted to isolate the radiation exchange to avoid dazzling the operator with flashes of light. For this purpose, the wall 28 can include an external part 281 that is opaque to radiation (such as, for example, the radiation emitted by the source 24). The external part 281 of the wall 28 can be made of an opaque fabric produced by nylon and cotton, or can also be made of polyamide and spandex, or can also be made of synthetic rubber.
[0052] In addition, for example, the wall 28 may include an inner portion 282 that is reflective to radiation, such as the radiation emitted by the source 24. The inner portion 282 of the wall 28 may include a gold-plated or silver-plated coating.
[0053] Contact element
[0054] The adapter 1 includes a contact element 7 that forms a free end. The contact element 7 is included in the distal portion 5 of the adapter. The contact element 7 is intended to be in direct contact with the component to be tested.
[0055] The contact element 7 is mounted such that the contact element 7 can move relative to the proximal portion 3, so that the distal portion 5 deforms when a force is applied to the contact element 7. In particular, when a force is applied in the axial direction Δ, the contact element 7 can move in this direction. Then, at the point on the distal portion 5 occupied by the contact element 7, the distal portion 5 deforms. The length of the distal portion 5 in the axial direction Δ at this point is greater or smaller depending on whether the contact element 7 moves closer to or farther away from the proximal portion 3.
[0056] The adapter includes a contact element that is mounted such that the contact element can move relative to the proximal portion, so that by applying a force to the contact element, the distal portion can deform, thus better pressing against the component to be tested. This deformation depends on the shape of the component, such that the adapter can better adopt the shape of the component. Then the device can be automatically moved towards the component to be tested without damaging the component. For example, the adapter 1 includes a deformable member 11 that is connected to the contact element 7 such that the contact element 7 is mounted such that the contact element 7 can move relative to the proximal portion 3. For example, the deformable member can be first fixed to the proximal portion 3 and then fixed to the contact element 7. Thus, when the deformable member 11 deforms, the distance between the contact element 7 and the proximal portion 3 changes, which enables the contact element 7 to be mounted such that the contact element 7 can move relative to the proximal portion 3.
[0057] In particular, the deformable member 11 can deform in the axial direction Δ.
[0058] The deformable member 11 is advantageously selected from a compression spring element, a single-acting cylinder or a double-acting cylinder. The spring element and the cylinder are advantageously oriented to deform in the axial direction Δ.
[0059] When the adapter includes a plurality of rod-shaped members, at least one of the rod-shaped members can be selected such that the at least one rod-shaped member is deformable in the axial direction Δ. The contact element can be attached to the end of the rod-shaped member.
[0060] Figure 1 、Figure 3 and Figure 4 shows the case of a deformable member in the form of a single-acting cylinder.
[0061] The deformable member 11 can be rigidly attached to the contact element 7, or can be attached to the contact element 7 in a pivotally connected manner, or can also be attached to the contact element 7 in a ball-and-socket connection manner.
[0062] In the first case, there can be no significant movement between the deformable member 11 and the contact element 7.
[0063] In the second case, there can be significant movement between the deformable member 11 and the contact element 7, and this significant movement is a unidirectional rotational movement.
[0064] In the third case, there can be significant movement between the deformable member 11 and the contact element 7, and this significant movement is a rotational movement in three directions in space. This is the case as Figure 2 shown, where both contact elements 7 are connected to the deformable member 11 in a ball-and-socket connection 13.
[0065] The contact element can be made of Teflon, elastomer or aluminum.
[0066] The contact element can be obtained by 3D printing a molten polymer wire (such as polyethylene).
[0067] Advantageously, when the adapter includes a contact element that is mounted to be movable relative to the proximal portion, the adapter can include a deformable optical isolation wall 28. In particular, the wall 28 can be deformed in the axial direction Δ, that is, deformed according to the stress applied to the wall 28, and the length of the wall 28 in the axial direction can change. The wall 28 can be shortened or lengthened in the axial direction. The deformable characteristic of the wall 28 is local, that is, for different angular positions defined around the axial direction Δ, the wall 28 can adopt different lengths in the axial direction Δ.
[0068] The deformation can be achieved by adding fabric, plastic material, pleated portions, and in particular portions folded in an accordion shape or segments configured to be nested together in the axial direction to the wall 28. Figure 4 Shows an example of a wall including a portion folded in an accordion shape in the axial direction Δ. The portion folded in an accordion shape or the segments configured to be nested together in the axial direction have sufficient mechanical clearance to allow the wall 28 to have different lengths at different angular positions around the axial direction Δ in the axial direction Δ.
[0069] The device may only be in partial contact with the component. When the device and the component are placed in contact, more or less large gap effects occur between them. These gaps prevent the isolation of the exchange between the device and the component with respect to the external environment. In other words, the energy emitted by the device towards the component is not the only energy received by the component, and conversely, the energy emitted by the component towards the device is not the only energy received by the device. This can interfere with the excitation of the component by the device, the scattering phenomenon, and the signal obtained by the detector from the scattering of the component. In addition, the flash passing through the gap may dazzle the operator.
[0070] The adapter includes a contact element mounted to be movable relative to the proximal part and a deformable optical isolation wall 28, which makes it possible to reduce the gap between the adapter and the component to be analyzed. By deforming, the distal part causes the deformation of the wall. The distal part conforms to the shape of the component, and the adapter isolates the radiative exchange between the device and the component with respect to the external environment.
[0071] Shape of the contact element
[0072] Advantageously, and as Figure 2 shown in, the contact element 7 has a rounded or chamfered edge 9. Such an edge makes it possible to reduce and limit the scratches caused to the component to be tested when the contact element 7 comes into contact with the component to be tested.
[0073] In the first embodiment, the contact element has a spherical shape. Advantageously, the contact element has this shape when the deformable member 11 is rigidly connected to the contact element 7. This rigid connection can in particular be configured such that the deformable member is aligned in a direction passing through the center of the spherical shape.
[0074] In the second embodiment, the contact element has a parallelepiped shape. In particular, the contact element can conform to a pad shape, as Figure 2 shown in. The parallelepiped shape is defined by three distances: length, width, and depth. The length is greater than the width, and the width is greater than the depth. Preferably, the pad is oriented such that the depth mainly extends along the axial direction Δ, and the length and width extend in directions orthogonal to each other and to the axial direction Δ.
[0075] Advantageously, the contact element has a parallelepiped shape when the deformable member 11 is connected to the contact element 7 in a pivot connection or in a ball-and-socket connection. In this way, when the contact element 7 comes into contact with the component to be tested, the pad is oriented to better conform to the shape of the component, that is, to increase the contact surface between the component and the pad.
[0076] The adapter can be configured so that the deformable member is aligned in a direction passing through the axis of rotation of the pivot connection or the center of rotation of the ball-and-socket connection. This makes it possible to improve the stability of the contact and reduce the play during contact. Advantageously, the pivot connection or the ball-and-socket connection can be placed in the center of the contact element 7.
[0077] Assembly of a plurality of "deformable members" and "contact elements"
[0078] The adapter 1 may comprise a plurality of contact elements 7 , each contact element 7 being mounted such that the contact element 7 is movable relative to the proximal portion 3 .
[0079] The contact elements 7 may all have the same shape, for example a spherical shape or a parallelepiped shape. The contact elements 7 may alternatively also have different shapes.
[0080] Advantageously, each contact element 7 is mounted so as to be movable relative to the proximal portion 3 via a deformable member 11. Thus, the adapter 1 comprises a plurality of deformable members 11, each of which is associated with a contact element 7, to form an assembly of deformable member 11+contact element 7. Thus, the adapter 1 comprises a plurality of “deformable member 11+contact element 7” assemblies.
[0081] The various contact elements can be arranged in various ways, and in particular the contact elements can be aligned along a closed perimeter. The closed perimeter constitutes the shape of the distal portion. The perimeter can be polygonal in shape, such as a square, rhombus, rectangle, parallelogram, hexagon or octagon, or circular or elliptical. Figure 1 , Figure 3 and Figure 4 The case where a perimeter with a square shape is employed is shown.
[0082] Along the closed perimeter, the contact elements may be regularly distributed, i.e. the distance between two adjacent elements (i.e. two contact elements plus the immediately adjacent adjacent elements) is constant from one pair of adjacent contact elements to another pair of adjacent elements. "Constant distance" here is understood to mean a distance that does not vary by more than 5% from one pair of adjacent contact elements to another pair of adjacent elements. Adjacent elements may be defined as being connected when they are in contact with each other or nearly in contact with each other.
[0083] When the contact elements are aligned along a closed perimeter, the perimeter is the distal perimeter. The deformable members are advantageously oriented along an axial square Δ and are fixed to the proximal portion at fixing points distributed along a proximal perimeter having the same shape as the distal perimeter. When the contact elements are regularly distributed along the distal perimeter, the attachment points are advantageously regularly distributed along the proximal perimeter.
[0084] In the case where the perimeter has a polygonal shape and thus defines vertices, two contact elements located at a vertex can be chamfered in a complementary and facing - each - other manner to define the vertex of the polygonal shape. Alternatively, and with reference to Figure 2 , the contact element 7 located at a vertex can have a shape with two sub - parts 7A and 7B on either side of the vertex, and the first sub - part 7A defines an angle relative to the second sub - part 7B, and this angle corresponds to the angular deviation of the perimeter at the vertex. In Figure 2 's example, this angle is a right - angle.
[0085] In the case where the contact elements all have the same parallelepiped shape, the length of each shape can be oriented along the perimeter, and the width can be oriented orthogonally to the perimeter.
[0086] Two adjacent contact elements can be connected by elastic elements. In this way, the movements of the contact elements 7 in contact with the component to be tested are interdependent.
[0087] In the case where the contact elements all have the same parallelepiped shape, the contact elements can advantageously be arranged in pairs and connected, and two connected contact elements are directly connected by an elastic element 17. This supplementary connection makes it possible to maintain the continuity of the perimeter defined by the individual contact elements 7.
[0088] Preferably, each pair of two connected contact elements can be connected by two elastic elements 17, and the elastic elements 17 are connected to the contact elements by being mounted in parallel. This connection between two connected elements also makes it possible to avoid one contact element rotating relative to the other contact element about the elastic element.
[0089] When the adapter 1 includes a plurality of contact elements 7 and the adapter 1 also includes a deformable optical isolation wall 28 surrounding the recess 30, the isolation wall 28 can be fixed to the outer edges of the individual contact elements. In this way, the radiation entering the adapter or the radiation exiting the adapter between the contact elements 7 and the proximal part 3 is restricted.
[0090] System for non-destructive testing of components by means of radiation
[0091] There is also proposed a system for non - destructive testing, which system includes the adapter 1 proposed so far and the device for non - destructive testing by electromagnetic radiation also proposed above. In this system for non - destructive testing by this electromagnetic radiation, the proximal part of the adapter 1 is rigidly fixed to the non - destructive testing device 22.
[0092] The system may also advantageously include a carriage and a robotic arm associated with a control system, the carriage supporting the robotic arm, and the robotic arm supporting the non-destructive testing device. The robotic arm is configured to move and orient the device in space. Thus, the device can be precisely positioned facing the part to be tested. Next, the robotic arm can press the testing device against the part to deform the distal portion of the adapter. Thus, the distal portion fits the shape of the part to be tested. After the measurement is completed, the robotic arm can move the device and position it facing another part of the part to be tested for a second acquisition.
[0093] Method for non-destructive testing of components by means of radiation
[0094] The invention also relates to a method of this type, which includes the following steps:
[0095] - Placing the contact element of the testing system in contact with the part,
[0096] - Applying a force to the contact element, and
[0097] - Moving the contact element relative to the rest of the system under the action of the force and deforming the system according to the shape of the part.
[0098] Advantageously, an adapter including a plurality of contact elements 7 can be used, and the number of contact elements 7 is fixed according to the geometry of the part to be tested.
[0099] The geometry of the part to be tested can be particularly defined by the average length of the part (denoted as L) and the average radius of curvature of the part (denoted as R).
[0100] For this purpose, the method may include the step of determining the average length L and the average radius of curvature R of the part. For example, a rangefinder or a time-of-flight (ToF) camera device can be used to determine the average radius of curvature R by determining the relative distance between the rangefinder and the part. To determine the total length to be tested, a robot can be used.
[0101] The number of contact elements can be fixed according to the average length and the average radius of curvature.
[0102] For example, in the following cases, an increase in the number of contact elements can be selected:
[0103] - When the average radius of curvature decreases, or
[0104] - When the average length increases.
[0105] In particular, this variation can be based on the ratio of the mean radius of curvature to the mean length, and when the ratio of the mean radius of curvature to the mean length decreases, the number of contact elements can be chosen to increase. In this way, the number of cushioning elements can be adjusted according to the structure or geometry of the component to be tested.
[0106] One way to fix the number of contact elements can specifically include the following steps:
[0107] - Determine the integer part of the ratio of the mean radius of curvature to the mean length, and
[0108] - Determine the difference between the number 10 and the integer part,
[0109] The number of contact elements included in the adapter is equal to four times the said difference.
[0110] If E represents the integer part function and N represents the number of contact elements, then the foregoing steps include performing the following calculation: N = 4 × (10 - E(R / L)).
[0111] Optionally, when the contact elements are distributed on the closed perimeter of a square shape, the number of contact elements 7 on each side of the square can also be chosen as 10 - E(R / L).
[0112] For the specific case where the integer part is greater than or equal to 10, eight contact elements may be sufficient, for example one contact element on each side of the square plus one contact element at each corner of the square.
[0113] Finally, the following steps can be added to the non-destructive testing method:
[0114] - Emit radiation towards the component through the testing system, and
[0115] - Obtain the time response of the thermal diffusion in the component through the testing system.
[0116] The acquired image can also be processed to locate any local thermal contrast in the imaging region associated with a defect in the component.
[0117] The method can achieve imaging of a second region, and for this purpose, the retraction of the system relative to the component to be tested and the offset of the system relative to the region that has already been inspected can be specified to inspect a second region on the component.
[0118] The steps previously proposed for imaging and analyzing the first region can be implemented for imaging and analyzing the second region.
[0119] Multiple regions can be imaged and analyzed continuously. The component to be tested can be divided into multiple regions that define its entire surface, enabling a complete scan of the component by imaging and analyzing each region.
[0120] The movement of the system and the emission and acquisition sequences can be automated with the aid of a central control system. The central control system can, for example, include a carriage and a robotic arm associated with the control system, as proposed above.
Claims
1. An adapter (1) for a device for non-destructive testing by means of electromagnetic radiation, the adapter (1) comprising: - a proximal part (3) configured to be attached to the testing device, and - a distal part (5) including a contact element (7) which forms a free end and which is mounted so as to be movable relative to the proximal part (3) such that the distal part (5) deforms when a force is applied to the contact element (7). - a deformable member (11) connected to the contact element (7) for mounting the contact element (7) so as to be movable relative to the proximal part (3), preferably, the deformable member (11) is a compression spring member, a single-acting cylinder or a double-acting cylinder, the contact element (7) is connected to the deformable member via a ball-and-socket joint or a pivot joint (13), and the contact element (7) has a parallelepiped shape.
2. The adapter according to claim 1, wherein, The contact element (7) has rounded or chamfered edges (9).
3. The adapter according to any one of claims 1 to 2, wherein The contact element (7) and the deformable member (11) form a first assembly (15), and the adapter includes a plurality of assemblies (15).
4. The adapter according to claim 3, wherein, The contact elements are arranged in pairs and two connected contact elements are directly connected by an elastic element (17).
5. The adapter according to claim 4, wherein, The elastic element (17) is a first elastic element, and the two connected contact elements are also directly connected by a second elastic element, and the first elastic element and the second elastic element are connected to the contact elements by being mounted in parallel.
6. The adapter according to any one of claims 1 to 5, wherein, The adapter extends in an axial direction (Δ) from the proximal part (3) to the distal part (5), the adapter is hollow to have a recess (30) in the axial direction (Δ), the recess (30) leads to the outside of the adapter (1) through the proximal part (3) and the distal part (5), the adapter (1) includes an optical isolation wall (28) surrounding the recess (30), the wall (28) includes an outer part (281) opaque to electromagnetic radiation and an inner part (282) reflective to electromagnetic radiation, and the electromagnetic radiation is intended for the non-destructive testing.
7. The adapter according to claim 6, wherein, The optical isolation wall (28) is deformable, preferably, the wall includes a fabric, a plastic material, a part folded in an accordion shape, or segments configured to be nested together in the axial direction.
8. A system (20) for non-destructive testing by means of electromagnetic radiation, the system (20) comprising - a device (22) for non-destructive testing by means of the electromagnetic radiation, the device including a radiation source (24) and a radiation detector (26), - an adapter (1) according to any one of claims 1 to 7, the proximal part (3) of the adapter (1) being rigidly fixed to the non-destructive testing device (22).
9. A method for non-destructive testing by means of electromagnetic radiation, the method comprising the following steps: - Place the contact element of the test system in contact with the component, - Apply a force to the contact element, and - Move the contact element relative to the remainder of the system under the action of the force and deform the system according to the shape of the component, the deformation including rotation of the contact element relative to the remainder of the test system.
10. The method according to claim 9, the method comprising the steps of: - Emit radiation to the component through the test system, and - Obtain the time response of heat diffusion in the component through the test system.