Preparation device of electron microscope slice sample

Abstract

The invention discloses a preparation device of an electron microscope sheet sample, and belongs to the field of test and measurement. The cutting unit and the grinding unit are integrally arranged, and the feeding unit penetrates through the cutting unit and the grinding unit, so that feeding, cutting and grinding of samples can be sequentially completed by one set of device, the samples do not need to be transferred among different devices, and the sample processing quality is also improved while the sample processing efficiency is improved; in the whole set of preparation device, the working mode that the feeding unit and the grinding unit work simultaneously, the cutting unit and the receiving cavity discharge work simultaneously, and the feeding unit and the grinding unit as well as the cutting unit and the receiving cavity work alternately is achieved, and the adjacent units work alternately; according to the transmission electron microscope slice sample processing device, the preparation cohesion of feeding, cutting, grinding and discharging of a single sample is ensured, and synchronous operation of all unit components in the whole device is also ensured, so that continuous online production of transmission electron microscope slice samples can be realized, and the processing efficiency is favorably improved.

Description

Technical Field

[0001] The present invention belongs to the field of testing and measurement, and relates to sample preparation technology for observation, in particular to a device for preparing electron microscope thin film samples. Background Art

[0002] Electron microscope thin film samples are ultra-thin samples used for transmission electron microscope observation. The transmission electron microscope requires the sample to be very thin, usually with a thickness less than 100 nanometers, so that the electron beam can penetrate the sample and form a high-resolution image.

[0003] Taking the transmission electron microscope thin film sample of metal materials as an example, when using common preparation means, the cutting device and the grinding device are two independent devices. After cutting the raw material, it needs to be temporarily transferred to the grinding and polishing equipment for grinding. This process not only takes a long time and has low efficiency, but also because the sample is thin and small, it is very easy to deviate in position, be placed in a mess or even be lost during the transfer process, which not only reduces the production quality of the sample, but also further reduces the processing efficiency. Summary of the Invention

[0004] The purpose of the present invention is to provide a new device for preparing electron microscope thin film samples, which integrates the cutting unit and the grinding unit, realizes that a set of device can synchronously complete the feeding, cutting and grinding of the sample, and there is no need to transfer the sample between different devices, improving the sample processing efficiency and the sample processing quality at the same time, so as to solve the problems existing in the above-mentioned prior art.

[0005] To achieve the above purpose, the present invention provides the following solutions:

[0006] The present invention provides a device for preparing electron microscope thin film samples, including a feeding unit, a cutting unit and a grinding unit. Among them, the feeding unit is used to provide a directional conveying path for the transmission electron microscope thin film, the cutting unit and the grinding unit are arranged in sequence along the conveying direction of the transmission electron microscope thin film, the cutting unit can cut the transmission electron microscope thin film conveyed by the feeding unit to generate a preliminary sample; the grinding unit can grind the preliminary sample formed by cutting to obtain an electron microscope thin film sample.

[0007] In some embodiments, the feeding unit includes a feeding mechanism and a positioning device. The positioning device includes a conveying cavity, a receiving cavity and a housing. The conveying cavity is fixed in the housing and extends from the front end to the rear end. The front end of the conveying cavity is a feeding area, and an installation groove is opened behind the feeding area of the conveying cavity. The feeding mechanism is embedded in the installation groove and is used to provide conveying power for the transmission electron microscope thin film; the receiving cavity is arranged at the rear end of the conveying cavity and is used to receive the preliminary sample generated by cutting.

[0008] In some embodiments, the feeding mechanism includes a towing rope, a plastic roller, a first gear, a second gear, a third gear, a support shaft, an L-shaped support chassis, and a driving motor. The L-shaped support chassis is fixed to the housing and is located below the conveying cavity. The horizontal bracket of the L-shaped support chassis is parallel to the conveying cavity and is disposed towards the rear end of the conveying cavity. The vertical bracket of the L-shaped support chassis is disposed at the front end of the horizontal bracket and is perpendicular to the horizontal bracket. The vertical bracket is located below the installation groove. The first gear is rotatably mounted at the top of the vertical bracket through a gear shaft. The other end of the gear shaft is connected to the plastic roller, and the top of the plastic roller is embedded in the installation groove so that the plastic roller can contact the transmission electron microscope thin slice on the conveying cavity. The third gear is fixedly mounted on the support shaft and is coaxial with the support shaft. The support shaft is rotatably connected to the bottom end of the vertical bracket. The driving motor is fixedly mounted at the center of the vertical bracket. The second gear is coaxially connected to the output end of the driving motor, and the second gear is located between the first gear and the third gear. The second gear is a half gear. When the driving motor drives the second gear to rotate, the gear area of the second gear can alternately mesh and drive with the first gear and the third gear. The first end of the towing rope is fixed to the support shaft. A fixed pulley is disposed at the rear end of the horizontal bracket. After the second end of the towing rope passes around the fixed pulley, it is connected to the cutting unit. The cutting unit is movably engaged with the housing.

[0009] In some embodiments, the cutting unit includes a cutting machine, a vertical rod, and a first cross plate. The vertical rod is disposed inside the housing and is located at the side of the conveying cavity. The cutting machine is located above the conveying cavity, and the cutting machine is movably engaged with the housing. The second end of the towing rope is connected to the cutting machine. The first cross plate is fixed to the cutting machine, and the first cross plate movably passes through the vertical rod. A return spring is sleeved on the vertical rod, and one end of the return spring is connected or abutted to the bottom of the first cross plate, and the other end of the return spring is fixed to the vertical rod.

[0010] In some embodiments, a knife groove is formed in the conveying cavity, and the knife groove is vertically aligned with the cutting blade of the cutting machine.

[0011] In some embodiments, the area of the conveying cavity behind the knife groove is provided with a ramp structure, and the high end of the ramp structure is connected to the knife groove, and the low end of the ramp structure is connected to the receiving cavity.

[0012] In some embodiments, the preparation device for the electron microscope thin slice sample further includes a pressing mechanism, which is disposed inside the housing and above the feeding mechanism, and the pressing mechanism can limit the transmission electron microscope thin slice between the pressing mechanism and the feeding mechanism.

[0013] In some embodiments, a first rack is provided behind the cutting machine;

[0014] A frame extends horizontally backward from the rear end of the conveying cavity, the receiving cavity is embedded in the frame, and both sides of the middle part of the receiving cavity are rotatably connected to the frame through pin shafts; the pin shafts penetrate through the side wall of the frame and are coaxially fixed to a fourth gear outside the frame; a limiting plate is provided at the rear end of the conveying cavity, the front end of the receiving cavity is located at the bottom of the limiting plate, and a counterweight is provided at the bottom of the rear end of the receiving cavity;

[0015] The grinding unit includes a grinding mechanism and a limiting mechanism. The grinding mechanism includes a horizontal top plate, a grinding machine, a second rack, a magnetic sheet, a first piston rod, a lower edge metal plate, a second piston rod, an L-shaped air cylinder, a prism rod and a third rack. The second rack is disposed at the front end of the horizontal top plate and is parallel to the first rack. The grinding machine and the lower edge metal plate are fixedly installed at the bottom end of the horizontal top plate. The prism rod is fixedly installed at the bottom end of the lower edge metal plate. The top end of the third rack is slidably sleeved on the outer circle of the prism rod. The magnetic sheet is fixedly installed at the front top and the rear top of the third rack. The L-shaped air cylinder is fixedly installed at the front end of the lower edge metal plate. The second piston rod is slidably inserted into the top end interior of the L-shaped air cylinder. The first piston rod is slidably inserted into the rear end interior of the L-shaped air cylinder. When the third rack displaces forward on the prism rod, the third rack can drive the first piston rod into the rear end interior of the L-shaped air cylinder and squeeze the second piston rod to displace upward;

[0016] The limiting mechanism includes a blocking ejector rod, a support base, a fifth gear, and a limiting piece. The support base is connected and installed at the rear end of the housing. The horizontal top plate is located within the support base and is slidably engaged with the support base. The blocking ejector rod is fixedly installed within the support base and is vertically aligned with the second piston rod. The blocking ejector rod can press the second piston rod back into the L-shaped air cylinder. The fifth gear is rotatably installed inside the support base, and the fifth gear is located in front of the blocking ejector rod. The first rack and the second rack are respectively located on the front and rear sides of the fifth gear, and both the first rack and the second rack are engaged with the fifth gear. The limiting piece is fixedly installed at the inner bottom of the support base, and the limiting piece is located behind the fourth gear and below the bottom end of the third rack. A guiding landslide is provided on the front side of the limiting piece. After the bottom end of the third rack contacts the limiting piece, the third rack can slide towards the front end of the prism rod under the action of the guiding landslide to engage with the fourth gear.

[0017] In some embodiments, the bottom end of the third rack is arc-shaped.

[0018] In some embodiments, a collection tray is also movably installed at the inner bottom end of the support base, and the collection tray is located below the front end of the receiving cavity.

[0019] The present invention has achieved the following technical effects compared with the prior art:

[0020] The preparation device for electron microscope thin film samples proposed by the present invention has a reasonable structural design. By integrating the cutting unit and the grinding unit and arranging the feeding unit to penetrate the cutting unit and the grinding unit, it realizes that a set of devices can sequentially complete the feeding, cutting, and grinding of samples. There is no need to transfer the samples between different devices, which improves the processing efficiency of samples and also improves the processing quality of samples. Moreover, in the whole set of preparation devices, the feeding unit, the cutting unit, and the grinding unit are connected and coordinated with each other and can operate synchronously, realizing the continuous production and processing of electron microscope thin film samples.

[0021] In some specific solutions, while realizing the linkage operation between the feeding unit and the cutting unit through the first gear, the second gear, the third gear and the traction rope, the linkage operation between the cutting unit and the grinding unit is also realized through the first rack, the second rack and the fifth gear. Finally, the linkage between the grinding unit and the discharging operation of the receiving cavity is realized through the third rack and the fourth gear. The overall structure of the preparation device is ingeniously designed, and the connection between unit components is compact. The feeding unit and the grinding unit operate simultaneously, and the cutting unit and the discharging of the receiving cavity operate simultaneously, while the feeding unit and the grinding unit, and the cutting unit and the receiving cavity operate alternately. The entire preparation device is penetrated by a conveying cavity throughout the production line, and adjacent units work alternately, which not only ensures the preparation connection of a single sample from feeding, cutting, grinding to discharging, but also guarantees the synchronous operation of each unit component in the whole device, so as to realize the continuous on-line production of transmission electron microscope thin film samples, which is beneficial to improving the processing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required to be used in the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0023] Figure 1 is a schematic diagram of the overall structure of the preparation device for electron microscope thin film samples disclosed in the embodiments of the present invention;

[0024] Figure 2 is a schematic diagram of the structures of the feeding unit and the cutting unit in the preparation device disclosed in the embodiments of the present invention;

[0025] Figure 3 is a schematic diagram of the structure of the feeding mechanism in the feeding unit disclosed in the embodiments of the present invention;

[0026] Figure 4 is a schematic diagram of the structure and installation of the positioning device in the feeding unit disclosed in the embodiments of the present invention;

[0027] Figure 5 is Figure 4 a perspective three-dimensional structure diagram from below;

[0028] Figure 6 is a perspective three-dimensional structure diagram from the front of the grinding unit disclosed in the embodiments of the present invention;

[0029] Figure 7 is a schematic diagram of the structure and installation of the grinding machine in the grinding unit disclosed in the embodiments of the present invention;

[0030] Figure 8 isFigure 7 Partial enlarged schematic view at location A;

[0031] Figure 9 Structural and installation schematic diagram of the limiting mechanism in the grinding unit disclosed in the embodiment of the present invention;

[0032] Figure 10 Structural and installation schematic diagram of the collection tray disclosed in the embodiment of the present invention.

[0033] In the figure, the reference numerals are: 100 - Preparation device for electron microscope thin film samples;

[0034] 1 - Feeding unit; 2 - Cutting unit; 3 - Grinding unit; 4 - Feeding mechanism; 5 - Positioning device; 6 - Traction rope; 7 - Plastic roller; 8 - First gear; 9 - Second gear; 10 - Third gear; 11 - Support shaft; 12 - L-shaped support base; 13 - Driving motor; 14 - First rack; 15 - Cutting machine; 16 - Vertical rod; 17 - First horizontal plate; 18 - Second horizontal plate; 19 - Conveyor cavity; 20 - Contact plate; 21 - Return spring; 22 - Fourth gear; 23 - Counterweight; 24 - Receiving cavity; 25 - Limiting plate; 26 - Grinding mechanism; 27 - Limiting mechanism; 28 - Horizontal top plate; 29 - Grinder; 30 - Special-shaped bracket; 31 - Second rack; 32 - Magnetic sheet; 33 - First piston rod; 34 - Lower edge metal plate; 35 - Second piston rod; 36 - L-shaped air cylinder; 37 - Prismatic rod; 38 - Third rack; 39 - Blocking top rod; 40 - Support base; 41 - Fifth gear; 42 - Limiting piece; 43 - Synchronous rod; 44 - Collection tray; 45 - Outer shell; 46 - Transmission electron microscope thin film. Detailed implementation manners

[0035] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0036] The purpose of the present invention is to provide a new type of preparation device for electron microscope thin film samples. By integrating the cutting unit and the grinding unit, it realizes that a set of devices can synchronously complete the feeding, cutting, and grinding of samples, without the need to transfer samples between different devices, improving the sample processing efficiency and the sample processing quality at the same time.

[0037] To make the above objects, features, and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific implementation manners.

[0038] Embodiment 1

[0039] As shown Figures 1 to 10 in the figure, in this embodiment, a preparation device 100 for electron microscope thin film samples is proposed, which mainly includes three parts: a feeding unit 1, a cutting unit 2, and a grinding unit 3. The feeding unit 1 provides a directional conveying path for the transmission electron microscope thin film 46. The cutting unit 2 and the grinding unit 3 are arranged in sequence along the conveying direction of the transmission electron microscope thin film 46. The cutting unit 2 can cut the transmission electron microscope thin film 46 conveyed by the feeding unit 1. The sample rough cut is sequentially fed into the grinding unit 3 under the action of the feeding unit 1, and after being ground by the grinding unit 3, an electron microscope thin film sample is formed and output. The above-mentioned preparation device 100 for electron microscope thin film samples has a reasonable structural design. By integrating the cutting unit 2 and the grinding unit 3 and arranging the feeding unit 1 to penetrate the cutting unit 2 and the grinding unit 3, it is realized that a set of devices can sequentially complete the feeding, cutting, and grinding of samples without transferring the samples between different devices, improving the sample processing efficiency and the sample processing quality at the same time. Moreover, in the whole set of preparation devices, the feeding unit 1, the cutting unit 2, and the grinding unit 3 are connected and coordinated with each other, and can operate synchronously, realizing the continuous production and processing of electron microscope thin film samples.

[0040] In some embodiments, as Figures 1 to 5 shown in the figure, the feeding unit 1 includes a feeding mechanism 4 and a positioning device 5. The positioning device 5 includes a conveying cavity 19, a receiving cavity 24, and a housing 45. The housing 45 is the installation basis for the entire feeding unit 1, and it is preferably a U-shaped shell. The conveying cavity 19 is fixed in the housing 45 and extends from the front end to the rear end. The front end of the conveying cavity 19 is the feeding area, and the transmission electron microscope thin film 46 can be placed on the upper part of the front end of the conveying cavity 19. The area behind the feeding area of the conveying cavity 19 is the feeding area, and an installation slot is opened in the feeding area. The feeding mechanism 4 is embedded in the installation slot and is used to provide conveying power for the transmission electron microscope thin film 46. The receiving cavity 24 is arranged at the rear end of the conveying cavity 19 and is used to receive the sample rough cut after cutting.

[0041] In some embodiments, as Figure 2 and Figure 3As shown, the feeding mechanism 4 includes a traction rope 6, a plastic roller 7, a first gear 8, a second gear 9, a third gear 10, a support shaft 11, an L-shaped support chassis 12, and a drive motor 13. The L-shaped support chassis 12 is fixed to the housing 45 and is located below the conveying cavity 19. The horizontal bracket of the L-shaped support chassis 12 is parallel to the conveying cavity 19 and is arranged towards the rear end of the conveying cavity 19. The vertical bracket of the L-shaped support chassis 12 is arranged at the front end of the horizontal bracket and is perpendicular to the horizontal bracket. The vertical bracket is located below the aforementioned installation groove. The first gear 8 is rotatably installed at the top of the vertical bracket of the L-shaped support chassis 12 through a gear shaft. The other end of the gear shaft is connected to a plastic roller 7 coaxial with the first gear 8. The top of the plastic roller 7 is embedded in the installation groove, and preferably the top of the plastic roller 7 is flush with or slightly higher than the upper surface of the conveying cavity 19 so that the plastic roller 7 contacts the transmission electron microscope thin slice 46 on the conveying cavity 19. The third gear 10 is fixedly installed on the support shaft 11 and is coaxial with the support shaft 11. The support shaft 11 is rotatably connected to the bottom end of the vertical bracket of the L-shaped support chassis 12. The drive motor 13 is fixedly installed at the center of the vertical bracket of the L-shaped support chassis 12. The second gear 9 is located on the side of the drive motor 13 and is coaxially connected to the output end of the drive motor 13. At this time, the first gear 8, the second gear 9, and the third gear 10 are arranged in an upper, middle, and lower manner. The second gear 9 is located between the first gear 8 and the third gear 10, and the second gear 9 is a half gear. When the drive motor 13 drives the second gear 9 to rotate, the gear area of the second gear 9 can alternately mesh and drive with the first gear 8 and the third gear 10. As Figure 3 shown, the first end of the traction rope 6 is fixed to the outer ring of the support shaft 11. A fixed pulley is arranged at the rear end of the horizontal bracket of the L-shaped support chassis 12. The second end of the traction rope 6 is arranged around the fixed pulley.

[0042] In some embodiments, such as Figure 4As shown, the entire cutting unit 2 is located behind the feeding mechanism 4. The cutting unit 2 includes a first rack 14, a cutting machine 15, a vertical rod 16, and a first horizontal plate 17. The vertical rod 16 is disposed within the housing 45 and is located at the side of the conveying cavity 19. The cutting machine 15 is located above the conveying cavity 19. The cutting machine 15 includes a cutting machine frame and a cutting blade disposed on the frame. The cutting machine frame is movably engaged with the side wall of the housing 45. A knife groove for the cutting blade to extend into is provided directly below the cutting blade on the conveying cavity 19. The knife groove is vertically aligned with the cutting blade to ensure that the cutting blade completely cuts off the transmission electron microscope thin slice 46 on the conveying cavity 19. The first horizontal plate 17 is fixed to the cutting machine frame and movably penetrates through the vertical rod 16. A return spring 21 is sleeved on the vertical rod 16. One end of the return spring 21 on the vertical rod 16 is connected or abutted to the bottom of the first horizontal plate 17, and the other end is fixed to the vertical rod 16. When the return spring 21 is in a natural state without external force, it can hold the first horizontal plate 17 against a position near the top of the vertical rod 16, so that the entire cutting machine 15 is suspended above the conveying cavity 19. To ensure the stability of the installation of the cutting machine 15, it is preferred to provide multiple vertical rods 16. Multiple first horizontal plates 17 can be provided on the outer side of the cutting machine frame and are movably engaged with the respective vertical rods 16 one by one. A return spring 21 is provided on each vertical rod 16. After the second end of the aforementioned towing rope 6 passes around the fixed pulley, it is connected to the cutting machine frame of the cutting machine 15. During use, the towing rope 6 is basically always in a straightened state.When a transmission electron microscope thin slice 46 on the conveying cavity 19 is conveyed to the plastic roller 7, the driving motor 13 can be started at this time to drive the second gear 9 to rotate. First, the second gear 9 meshes with the first gear 8 and drives the plastic roller 7 coaxial with the first gear 8 to rotate, so as to apply a driving force for backward conveying to the transmission electron microscope thin slice 46 through the plastic roller 7. Before the cutting position of the transmission electron microscope thin slice 46 reaches the knife groove, the second gear 9 remains meshed with the first gear 8. At this time, since the second gear 9 has no meshing relationship with the third gear 10, the support shaft 11 and the traction rope 6 both remain stationary. Under the jacking action of the spring on the vertical rod 16, the cutting machine 15 is spaced up and down from the conveying cavity 19 to ensure the smooth conveyance of the transmission electron microscope thin slice 46 to the rear of the knife groove. When the cutting position of the transmission electron microscope thin slice 46 reaches the knife groove, the meshing area of the second gear 9 just completely rotates past the first gear 8 and immediately starts to mesh with the third gear 10 below. At this time, the first gear 8 stops rotating, and the third gear 10 and the support shaft 11 start to rotate (the rotation direction of the third gear 10 is opposite to that of the first gear 8). The support shaft 11 winds the traction rope 6, so that the traction rope 6 pulls the cutting machine 15 downward. During this process, due to the guiding action of the vertical rod 16, it can be ensured that the cutting machine 15 moves vertically downward, and during the downward movement, the spring on the vertical rod 16 is compressed. After the cutting blade contacts the cutting position of the transmission electron microscope thin slice 46, the cutting blade continues to penetrate the knife groove and move downward, thereby completing the accurate cutting of the transmission electron microscope thin slice 46. When the cutting is completed, the meshing area of the second gear 9 just completely rotates past the third gear 10 and immediately starts to mesh with the first gear 8 above. Since the support shaft 11 stops rotating at this time, the spring on the vertical rod 16 can overcome the traction force of the traction rope 6 and push the cutting machine 15 upward. During this process, the traction rope 6 is pulled in the reverse direction by the cutting machine 15 until the cutting machine 15 is reset. During the reset process of the cutting machine 15, the next cutting position of the transmission electron microscope thin slice 46 is already being conveyed to the knife groove. Generally, when the cutting machine 15 just completes the upward reset, the conveying operation of the plastic roller 7 just finishes. After that, since the second gear 9 alternately meshes with the third gear 10 and the first gear 8 in a cycle, the synchronous operation of the conveying process and the cutting process of the transmission electron microscope thin slice 46 can be realized, and there is a good connection between the conveying process and the cutting process. A first rack 14 is arranged at the rear of the cutting frame of the cutting machine 15, and the first rack 14 is fixedly connected to the cutting frame through a straight rod. The first rack 14 is used to be linked with the polishing unit 3 at the rear, so as to realize the linkage operation of the feeding mechanism 4, the cutting unit 2 and the polishing unit 3.

[0043] In some embodiments, it is preferably that the tooth distribution angle on the second gear 9 is 180°, so that every time the second gear 9 rotates 360 degrees, a cycle of alternately meshing with the first gear 8 and the third gear 10 can be completed (within one cycle, the second gear 9 meshes with the first gear 8 and the third gear 10 respectively once).

[0044] In some embodiments, in order to ensure the smooth conveyance of the thin fragments (i.e., the initial samples) cut by the cutting machine 15 to the subsequent grinding unit 3, it is preferred to set the area of the conveyance cavity 19 behind the knife groove as a ramp structure. The high end of this ramp structure is connected to the knife groove, and the low end is connected to the receiving cavity 24. After the initial sample is cut and separated from the transmission electron microscope thin slice 46, it can be conveyed backward along the ramp area of the conveyance cavity 19 under its own gravity. The above-mentioned ramp structure of the conveyance cavity 19 is preferably inclined at an angle of 40° to 60°, with 45° being optimal.

[0045] In some embodiments, in order to ensure the good positioning of the transmission electron microscope thin slice 46 during the conveyance and cutting processes to guarantee the cutting effect and the conveyance effect, a pressing mechanism is also provided. The pressing mechanism is arranged inside the housing 45 and above the feeding mechanism 4. The pressing mechanism can limit the transmission electron microscope thin slice 46 between the pressing mechanism and the feeding mechanism 4, which can ensure good contact between the feeding mechanism 4 and the transmission electron microscope thin slice 46 to achieve the continuous conveyance of the transmission electron microscope thin slice 46; at the same time, the pressing mechanism can also play a role in pressing and positioning the transmission electron microscope thin slice 46 when the cutting unit 2 cuts the thin slice. As Figure 2 and Figure 4As shown in the figure, the pressing mechanism includes a second horizontal plate 18, a contact plate 20, a return spring 21 and a vertical rod 16. The vertical rod 16 of the pressing mechanism is arranged inside the housing 45 and is located at the side of the conveying cavity 19. The vertical rod 16 of the pressing mechanism is in front of the vertical rod 16 of the aforementioned cutting unit 2. The second horizontal plate 18 is located above the conveying cavity 19, and both ends of the second horizontal plate 18 are slidably inserted and fitted with a vertical rod 16 respectively. A return spring 21 is sleeved on the vertical rod 16 of the pressing mechanism. The bottom end of the return spring 21 is fixed to the vertical rod 16, and the top end is connected to the second horizontal plate 18. A contact plate 20 is fixed below the second horizontal plate 18. In the initial state, the second horizontal plate 18 remains stationary under the traction of the lower return spring 21 (at this time, the return spring 21 supports the second horizontal plate 18). At this time, the contact plate 20 is basically in contact with the upper surface of the conveying cavity 19, but there is a gap between the contact plate 20 and the conveying cavity 19 for the film to pass through smoothly. After placing the transmission electron microscope thin slice 46 at the front end of the conveying cavity 19, manually lift the second horizontal plate 18 (the second horizontal plate 18 will not slip off the top end of the vertical rod 16 during the lifting process). At this time, the return spring 21 below the second horizontal plate 18 is stretched, the contact plate 20 moves upward, and the interval between the contact plate 20 and the conveying cavity 19 increases. After passing the end of the transmission electron microscope thin slice 46 through the interval between the contact plate 20 and the conveying cavity 19, release the second horizontal plate 18. The second horizontal plate 18 can move downward along the vertical rod 16 under the retraction and reset action of the lower return spring 21 until the return spring 21 returns to the initial state. The contact plate 20 contacts the transmission electron microscope thin slice 46 above the installation groove. At this time, the contact plate 20 has a downward pressing and limiting effect on the transmission electron microscope thin slice 46, but will not press the transmission electron microscope thin slice 46 so that the transmission electron microscope thin slice 46 cannot move.

[0046] In some embodiments, as Figure 1 shown, the rear end of the conveying cavity 19 extends into the support base 40 of the grinding unit 3, and the support base 40 will be specifically described later. The rear part of the conveying cavity 19 has a slope structure, and the low end of the slope structure is used as the rear end of the entire conveying cavity 19. As Figure 4 and Figure 5 shown, a frame extends horizontally backward from the low end of the slope structure. The receiving cavity 24 is embedded in the frame, and both sides of the middle part of the receiving cavity 24 are rotatably connected to the frame through pin shafts respectively. The pin shaft penetrates the side wall of the frame and is coaxially fixed with the fourth gear 22 outside the frame. A limiting plate 25 is arranged at the low end of the slope structure of the conveying cavity 19. The front end of the receiving cavity 24 is located at the bottom of the limiting plate 25. A counterweight 23 is arranged at the bottom of the rear end of the receiving cavity 24. The front end of the receiving cavity 24 can be lapped with the limiting plate 25 under the gravity traction of the rear counterweight 23. The limiting plate 25 and the counterweight 23 respectively exert reverse forces on the front and rear ends of the receiving cavity 24, so as to keep the receiving cavity 24 in a horizontal stationary state when the fourth gear 22 is not affected by external forces.

[0047] In some embodiments, such as Figure 1 and Figure 6 shown, the grinding unit 3 includes a grinding mechanism 26 and a limiting mechanism 27. The grinding mechanism 26 is slidably inserted into the inner top end of the limiting mechanism 27, and the limiting mechanism 27 can support the up and down displacement of the grinding mechanism 26. Specifically, as Figure 7 and Figure 8 show, the grinding mechanism 26 includes a horizontal top plate 28, a grinding machine 29, a special-shaped bracket 30, a second rack 31, a magnetic sheet 32, a first piston rod 33, a lower edge metal plate 34, a second piston rod 35, an L-shaped air cylinder 36, a prism rod 37 and a third rack 38. The special-shaped bracket 30 is fixedly installed at the front end of the horizontal top plate 28, the second rack 31 is fixedly installed at the front end of the special-shaped bracket 30, and the second rack 31 is parallel to the first rack 14. The grinding machine 29 is fixedly installed at the bottom end of the horizontal top plate 28, the lower edge metal plate 34 is fixedly installed at the bottom end of the horizontal top plate 28, the prism rod 37 is fixedly installed at the bottom end of the lower edge metal plate 34. The third rack 38 can be engaged with the fourth gear 22 that rotates the control receiving cavity 24. The top end of the third rack 38 is slidably sleeved on the outer circle of the prism rod 37, and the prism rod 37 can limit the third rack 38 to rotate around the prism rod 37. The magnetic sheet 32 is fixedly installed at the front top and the rear top of the third rack 38. The L-shaped air cylinder 36 is fixedly installed at the front end of the lower edge metal plate 34. The second piston rod 35 is slidably inserted into the inner top end of the L-shaped air cylinder 36, and the first piston rod 33 is slidably inserted into the rear end of the L-shaped air cylinder 36. When the third rack 38 displaces forward to the limit position on the prism rod 37, the third rack 38 can drive the first piston rod 33 into the rear end of the L-shaped air cylinder 36 and squeeze the second piston rod 35 to displace upward. Keys are symmetrically and fixedly installed at both ends of the horizontal top plate 28, and slots are provided on both sides inside the support base 40. The two ends of the horizontal top plate 28 are slidably matched with the slots of the support base 40 through the keys, which can ensure that the horizontal top plate 28 moves up and down in a straight line. The aforementioned lower edge metal plate 34 includes, but is not limited to, an iron plate.

[0048] As Figure 9As shown in the figure, the limiting mechanism 27 includes a blocking ejector rod 39, a support base 40, a fifth gear 41 and a limiting piece 42. The support base 40 serves as the installation foundation of the entire grinding unit 3, and is integrally in a U-shaped structure. The support base 40 is connected and installed at the rear end of the housing 45. The rear end of the conveying cavity 19 and the receiving cavity 24 are both arranged inside the support base 40. The blocking ejector rod 39 is fixedly installed on both sides inside the support base 40 and is vertically aligned with the second piston rod 35. The blocking ejector rod 39 can press the lifted second piston rod 35 back into the L-shaped air cylinder 36, thereby pushing the first piston rod 33 to reset and causing the third rack 38 to move backward on the prism rod 37. The fifth gear 41 is rotatably installed on both sides inside the support base 40, and the fifth gear 41 is located in front of the blocking ejector rod 39. The first rack 14 and the second rack 31 are respectively located on the front and rear sides of the fifth gear 41, and both the first rack 14 and the second rack 31 are kept meshed with the fifth gear 41. The limiting piece 42 is fixedly installed on the inner bottom of the support base 40, and the limiting piece 42 is located behind the fourth gear 22 and below the bottom end of the third rack 38. A guiding landslide is arranged on the front side of the limiting piece 42, so that after the bottom end of the third rack 38 contacts the limiting piece 42, the guiding landslide is used to drive the third rack 38 to slide parallel to the front end of the prism rod 37.

[0049] It should be noted that the inside of the L-shaped air cylinder 36 is provided in a hollow state, and the second piston rod 35, the L-shaped air cylinder 36 and the first piston rod 33 are arranged in a sealed state. A bracket (which can be deformed along with the internal channel of the L-shaped air cylinder 36) is fixedly installed between the first piston rod 33 and the third rack 38. The blocking ejector rod 39 is vertically aligned with the second piston rod 35. The bottom end of the third rack 38 is provided in an arc state. The limiting piece 42 is vertically aligned with the third rack 38. The front guiding landslide of the limiting piece 42 is preferably arranged at an inclination of 45°. The grinding machine 29 is vertically aligned with the receiving cavity 24, and the receiving cavity 24 provides a place for thin sheet grinding. In this embodiment, the grinding machine 29 mainly includes a grinding disc and a motor for driving the grinding disc to rotate. By contacting the sample preliminary sample on the receiving cavity 24 with the grinding disc and driving the grinding disc to rotate by the motor, grinding can be achieved. The grinding machine 29 is a finished product, and its specific structure and working principle will not be elaborated here.

[0050] Taking the preparation of a transmission electron microscope thin sheet sample of a metal material as an example, the above-mentioned preparation device 100 for an electron microscope thin sheet sample is used to implement the preparation method of the electron microscope thin sheet sample. The specific steps and principles are as follows:

[0051] First, lift the second cross plate 18 first to lift the contact plate 20 away from the installation groove, increasing the interval between the contact plate 20 and the conveying cavity 19. Subsequently, place the TEM thin slice 46 into the front end inside the conveying cavity 19, and ensure that the TEM thin slice 46 passes through the installation groove and the end of the thin slice is close to the cutting machine 15; release the second cross plate 18, so that the return spring 21 can drive the contact plate 20 to press down the TEM thin slice 46 until it fits against the top of the plastic roller 7; then, start the drive motor 13 to make the second gear 9 rotate. When the second gear 9 rotates to mesh with the first gear 8, it can drive the first gear 8 and the plastic roller 7 to rotate synchronously, so that the plastic roller 7 can convey the TEM thin slice 46 backward inside the conveying cavity 19 to complete the intermittent conveying work of the TEM thin slice 46.

[0052] After that, when the second gear 9 rotates past the first gear 8, it can mesh with the third gear 10, causing the third gear 10 to drive the support shaft 11 to rotate. At this time, the support shaft 11 can pull the cutting machine 15 to move downward by winding the traction rope 6, so that the cutting machine 15 can cut the TEM thin slice 46 at the designated cutting position (i.e., the knife groove); it should be noted that when the cutting machine 15 moves downward, it can drive the fifth gear 41 to rotate through the first rack 14, causing the horizontal top plate 28 to move upward. At the same time, when the cutting machine 15 has not moved downward to the limit position, the TEM thin slice 46 can be completely cut, so that the cut thin slice (i.e., the initial sample) can immediately slide down along the slope structure of the conveying cavity 19 to the upper surface of the receiving cavity 24. At the same time, through the knife groove provided on the conveying cavity 19, it is convenient for the cutting machine 15 to continue to move downward after cutting the TEM thin slice 46. Subsequently, the second gear 9 will rotate past the third gear 10, causing the support shaft 11 to lose the meshing force. At this time, the elastic restoring force of the return spring 21 behind the housing 45 can drive the cutting machine 15 to move upward and reset.

[0053] When the cutting machine 15 resets upward, the first rack 14 can drive the fifth gear 41 to rotate again. At this time, the fifth gear 41 will drive the second rack 31 to move downward, so that the horizontal top plate 28 can drive the grinding machine 29 to move downward. By vertically aligning the grinding machine 29 with the top end of the receiving cavity 24, when the grinding machine 29 moves downward, it can grind the transmission electron microscope thin slice 46 above the receiving cavity 24. Moreover, when the horizontal top plate 28 moves downward, it can drive the third rack 38 to move downward synchronously. After the bottom end of the third rack 38 contacts the limiting piece 42, the horizontal top plate 28 continues to move downward. By sliding the third rack 38 on the outer ring of the prism rod 37, when the third rack 38 is blocked by the limiting piece 42, the third rack 38 can displace forward along the surface of the prism rod 37 under the guiding action of the guiding slope of the limiting piece 42 until the magnetic attraction piece 32 is adsorbed and fitted with the inner front end of the lower edge metal plate 34. At this time, the bottom end of the third rack 38 meshes with the fourth gear 22.

[0054] Subsequently, when the second gear 9 passes through the meshing of the first gear 8 and the third gear 10 again, the horizontal top plate 28 can move upward. At this time, when the horizontal top plate 28 moves upward, it can drive the third rack 38 to mesh and drive with the fourth gear 22, so that while the horizontal top plate 28 resets upward, it can drive the fourth gear 22 to rotate. Thus, the fourth gear 22 can drive the receiving cavity 24 to rotate towards the front bottom end. When the receiving cavity 24 is in an inclined state (preferably the maximum inclination angle is 45°), the transmission electron microscope thin slice 46 can slide out along the surface of the receiving cavity 24 from its front end, completing the discharge work of the transmission electron microscope thin slice sample. So far, the preparation process of a transmission electron microscope thin slice sample from feeding, cutting, grinding to discharging is completed.

[0055] During the upward displacement of the horizontal top plate 28, when the third rack 38 completely passes by the fourth gear 22, the fourth gear 22 will lose the restriction of the third rack 38. The counterweight 23 can drive the receiving cavity 24 to rotate downward and reset. Through the setting of the limiting plate 25, when the receiving cavity 24 rotates and resets, it can fit with the bottom end of the conveying cavity 19, so as to ensure that the receiving cavity 24 is placed horizontally again. At the same time, when the horizontal top plate 28 moves upward and resets, the second piston rod 35 can contact the blocking push rod 39. The blocking push rod 39 can push the second piston rod 35 into the L-shaped air cylinder 36, so that the first piston rod 33 can drive the third rack 38 to move backward until the magnetic attraction piece 32 at the top of the rear end of the third rack 38 is adsorbed and fitted with the inner rear of the lower edge metal plate 34; afterwards, the upward reset of the horizontal top plate 28 is completed, and the third rack 38 is completely separated from the limiting piece 42.

[0056] In summary, in this solution, through the driving motor 13, the second gear 9 can be intermittently driven to mesh with the first gear 8, so that the plastic roller 7 can rotate intermittently. Thus, the plastic roller 7 can intermittently convey the transmission electron microscope thin slice on the conveying cavity 19. At the same time, when the second gear 9 passes through the first gear 8, it can mesh with the third gear 10, so that the traction rope 6 can pull the cutting machine 15 to move downward. Thus, the cutting machine 15 can cut the transmission electron microscope thin slice located at the cutting position. And after the transmission electron microscope thin slice is cut, it can slide along the conveying cavity 19 and fall onto the top of the receiving cavity 24, completing the work of intermittently cutting and conveying the transmission electron microscope thin slice. When the cutting machine 15 moves downward, the first rack 14 can drive the second rack 31 and the horizontal top plate 28 to move upward through the fifth gear 41, which is convenient for separating the grinding machine 29 from the receiving cavity 24 by a gap. Subsequently, when the cutting machine 15 moves upward, the horizontal top plate 28 can drive the grinding machine 29 to move downward, so that the grinding machine 29 can grind the transmission electron microscope thin slice located above the receiving cavity 24. And when the horizontal top plate 28 resets upward again, the third rack 38 can pass through the fourth gear 22, so that the receiving cavity 24 can tilt forward, making the ground transmission electron microscope thin slice sample slide and fall along the surface of the receiving cavity 24, completing the work of positioning and grinding the transmission electron microscope thin slice.

[0057] While this solution realizes the linkage operation between the feeding unit 1 and the cutting unit 2 through the first gear 8, the second gear 9, the third gear 10 and the traction rope 6, it also realizes the linkage operation between the cutting unit 2 and the grinding unit 3 through the first rack 14, the second rack 31 and the fifth gear 41. Finally, it realizes the linkage between the grinding unit 3 and the discharging operation of the receiving cavity 24 through the third rack 38 and the fourth gear 22. The overall structure design of the preparation device is ingenious, and the connection between unit components is compact. It realizes the simultaneous operation of the feeding unit 1 and the grinding unit 3, the simultaneous operation of the cutting unit 2 and the discharging of the receiving cavity 24, and the working mode of alternating operation between the feeding unit 1 and the grinding unit 3, and the cutting unit 2 and the receiving cavity 24. The entire preparation device is penetrated by the conveying cavity 19 throughout the production line, and adjacent units work alternately, which not only ensures the preparation connection of a single sample from feeding, cutting, grinding to discharging, but also guarantees the synchronous operation of each unit component in the entire device. Thus, it can realize the continuous online production of transmission electron microscope thin slice samples, which is beneficial to improving the processing efficiency.

[0058] Embodiment 2

[0059] As Figure 10 shown, on the basis of Embodiment 1, this embodiment also sets a collection tray 44 on the support base 40. The collection tray 44 is slidably placed at the inner bottom end of the support base 40 and is located below the front end of the receiving cavity 24 to receive the samples sliding out of the receiving cavity 24. The synchronization rod 43 is fixedly installed at the rear end of the collection tray 44, which is convenient for taking and placing the collection tray 44 in the support base 40.

[0060] When the collection tray 44 is loaded with a certain amount of samples, the user can pull the collection tray 44 backward by holding the synchronization rod 43 until the collection tray 44 is removed from the inside of the support base 40, which is convenient for centrally taking out the processed transmission electron microscope thin film samples. After the transmission electron microscope thin film samples in the collection tray 44 are taken out, the collection tray 44 can be inserted again into the inner bottom end of the support base 40 to perform the sample receiving work.

[0061] Embodiment 3

[0062] This embodiment provides a preparation device 100 for electron microscope thin film samples. On the basis of Embodiment 2, the whole set of devices is set into a symmetrical structure. Specifically, as Figures 1 to 10 shown:

[0063] Two groups of conveying cavities 19 are arranged in parallel and symmetrically within the outer shell 45. Correspondingly, two sets of traction ropes 6, plastic rollers 7, first gears 8, second gears 9, third gears 10, support shafts 11, L-shaped support chassis 12, drive motors 13, first racks 14, cutting blades on the cutting machine 15, vertical rods 16, first cross plates 17, contact plates 20, fourth gears 22, counterweights 23, receiving cavities 24, limit plates 25, grinders 29, special-shaped brackets 30, second racks 31, L-shaped air cylinders 36, third racks 38, blocking ejector rods 39, fifth gears 41, limit pieces 42, collection trays 44, etc. are provided, and are arranged in one-to-one correspondence with the two groups of conveying cavities 19. Based on this, synchronous production of two sample production lines can be realized, and the processing efficiency can be greatly improved.

[0064] It should be noted that the structures, proportions, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those familiar with this technology to understand and read, and are not used to limit the limited conditions under which the present invention can be implemented. Therefore, they do not have technical essential meanings. Any modification of the structure, change of the proportional relationship or adjustment of the size, without affecting the effects that the present invention can produce and the purposes that can be achieved, should still fall within the scope covered by the technical content disclosed in the present invention. At the same time, the terms such as "upper", "lower", "left", "right", "middle" and "one" cited in this specification are only for the convenience of narration and clarity, and are not used to limit the scope under which the present invention can be implemented. The change or adjustment of their relative relationships, without substantial change of the technical content, should also be regarded as the scope under which the present invention can be implemented.

[0065] In the present invention, specific examples are used to illustrate the principles and implementation manners of the present invention. The description of the above embodiments is only used to help understand the method and its core idea of the present invention; at the same time, for those of ordinary skill in the art, according to the idea of the present invention, there will be changes in the specific implementation manners and application scopes. In summary, the content of this specification should not be construed as a limitation to the present invention.

Claims

1. A device for preparing electron microscope thin-section samples, characterized in that: The invention comprises a feeding unit (1), a cutting unit (2) and a grinding unit (3), wherein the feeding unit (1) is used to provide a directional conveying path for a transmission electron microscope sheet (46), the cutting unit (2) and the grinding unit (3) are arranged in sequence along the conveying direction of the transmission electron microscope sheet (46), the cutting unit (2) can cut the transmission electron microscope sheet (46) conveyed by the feeding unit (1) to generate a preliminary sample; and the grinding unit (3) can grind the preliminary sample formed by cutting to obtain a transmission electron microscope sheet sample.

2. The device for preparing electron microscope thin-section samples according to claim 1, characterized in that: The feeding unit (1) comprises a feeding mechanism (4) and a positioning device (5); the positioning device (5) comprises a conveying cavity (19), a receiving cavity (24) and a shell (45); the conveying cavity (19) is fixed in the shell (45) and is arranged to extend from the front end to the rear end; the front end of the conveying cavity (19) is a feeding area; a mounting groove is provided behind the feeding area of ​​the conveying cavity (19); the feeding mechanism (4) is embedded in the mounting groove and is used to provide conveying power for the transmission electron microscope sheet (46); the receiving cavity (24) is arranged at the rear end of the conveying cavity (19) and is used to receive the sample sample generated by cutting.

3. The device for preparing electron microscope thin-section samples according to claim 2, characterized in that: The feeding mechanism (4) comprises a traction rope (6), a plastic roller (7), a first gear (8), a second gear (9), a third gear (10), a support shaft (11), an L-shaped support frame (12) and a driving motor (13); the L-shaped support frame (12) is fixed on the housing (45) and is located below the conveying cavity (19); a horizontal support of the L-shaped support frame (12) is parallel to the conveying cavity (19) and is arranged toward the rear end of the conveying cavity (19); a vertical support of the L-shaped support frame (12) is arranged at the front end of the horizontal support and is perpendicular to the horizontal support; the vertical support is located below the mounting groove; the first gear (8) is rotatably mounted on the top end of the vertical support via a gear shaft; the other end of the gear shaft is connected to the plastic roller (7), and the top of the plastic roller (7) is embedded in the mounting groove so that the plastic roller (7) can be aligned with the transmission electron microscope sheet (46) on the conveying cavity (19). The third gear (10) is fixedly mounted on the support shaft (11) and is coaxial with the support shaft (11). The support shaft (11) is rotatably connected to the bottom end of the vertical bracket. The drive motor (13) is fixedly mounted at the center of the vertical bracket. The second gear (9) is coaxially connected to the output end of the drive motor (13). The second gear (9) is located between the first gear (8) and the third gear (10). The second gear (9) is a half gear. The drive motor (13) drives the second gear (9) to rotate so that the gear area of ​​the second gear (9) is alternately meshed with the first gear (8) and the third gear (10) for transmission. The first end of the traction rope (6) is fixed on the support shaft (11). A fixed pulley is provided at the rear end of the horizontal bracket. The second end of the traction rope (6) is connected to the cutting unit (2) after passing through the fixed pulley. The cutting unit (2) is movably matched with the housing (45).

4. The device for preparing electron microscope thin-section samples according to claim 3, characterized in that: The cutting unit (2) comprises a cutting machine (15), a vertical rod (16) and a first horizontal plate (17); the vertical rod (16) is arranged in the shell (45) and is located on the side of the conveying cavity (19); the cutting machine (15) is located above the conveying cavity (19), and the cutting machine (15) and the shell (45) are movably matched; the second end of the traction rope (6) is connected to the cutting machine (15); the first horizontal plate (17) is fixed to the cutting machine (15), and the first horizontal plate (17) is movably passed through the vertical rod (16); a return spring (21) is mounted on the vertical rod (16), and one end of the return spring (21) is connected or connected to the bottom of the first horizontal plate (17), and the other end of the return spring (21) is fixed to the vertical rod (16).

5. The device for preparing electron microscope thin-section samples according to claim 4, characterized in that: The conveying cavity (19) is provided with a knife groove, and the knife groove is vertically aligned with the cutting blade of the cutting machine (15).

6. The device for preparing electron microscope thin-section samples according to claim 5, characterized in that: The area of ​​the conveying cavity (19) located behind the knife groove is configured as a slope structure, and the high end of the slope structure is connected to the knife groove, and the low end of the slope structure is connected to the receiving cavity (24).

7. The device for preparing electron microscope thin-section samples according to any one of claims 4 to 6, characterized in that: It also includes a clamping mechanism, which is arranged in the housing (45) and located above the feeding mechanism (4), and the clamping mechanism can limit the transmission electron microscope sheet (46) between the clamping mechanism and the feeding mechanism (4).

8. The device for preparing electron microscope thin-section samples according to any one of claims 4 to 6, characterized in that: A first rack (14) is arranged behind the cutting machine (15); A frame is horizontally extended backward from the rear end of the conveying cavity (19), the receiving cavity (24) is embedded in the frame, and both sides of the middle part of the receiving cavity (24) are rotatably connected to the frame through pins; the pins penetrate the side walls of the frame and are coaxially fixed to the fourth gear (22) on the outside of the frame; a limit plate (25) is provided at the rear end of the conveying cavity (19), the front end of the receiving cavity (24) is located at the bottom of the limit plate (25), and a counterweight block (23) is provided at the bottom of the rear end of the receiving cavity (24); The grinding unit (3) comprises a grinding mechanism (26) and a limiting mechanism (27); the grinding mechanism (26) comprises a transverse top plate (28), a grinder (29), a second rack (31), a magnetic sheet (32), a first piston rod (33), a lower metal plate (34), a second piston rod (35), an L-shaped air cylinder (36), a prism rod (37) and a third rack (38); the second rack (31) is arranged at the front end of the transverse top plate (28), and the second rack (31) is parallel to the first rack (14); the grinder (29) and the lower metal plate (34) are fixedly mounted on the bottom end of the transverse top plate (28); the prism rod (37) is fixedly mounted on the bottom end of the lower metal plate (34); The top end of the third rack (38) is slidably sleeved on the outer ring of the prism rod (37), the magnetic sheet (32) is fixedly mounted on the front end top and rear end top of the third rack (38), the L-shaped air cylinder (36) is fixedly mounted on the front end of the lower metal plate (34), the second piston rod (35) is slidably inserted into the top end of the L-shaped air cylinder (36), and the first piston rod (33) is slidably inserted into the rear end of the L-shaped air cylinder (36). When the third rack (38) moves toward the front end on the prism rod (37), the third rack (38) can drive the first piston rod (33) to enter the rear end of the L-shaped air cylinder (36) and squeeze the second piston rod (35) to move upward; The limiting mechanism (27) comprises a blocking top rod (39), a supporting base (40), a fifth gear (41) and a limiting plate (42); the supporting base (40) is connected and installed at the rear end of the housing (45); the transverse top plate (28) is located in the supporting base (40) and is slidably matched with the supporting base (40); the blocking top rod (39) is fixedly installed in the supporting base (40) and is vertically aligned with the second piston rod (35); the blocking top rod (39) can press the second piston rod (35) back into the L-shaped air cylinder (36); the fifth gear (41) is rotatably installed on the inner side of the supporting base (40), and the fifth gear (41) is located in front of the blocking top rod (39). The first rack (14) and the second rack (31) are respectively located at the front and rear sides of the fifth gear (41), and the first rack (14) and the second rack (31) are both meshed with the fifth gear (41); the limiting plate (42) is fixedly mounted on the inner bottom of the supporting base (40), and the limiting plate (42) is located behind the fourth gear (22) and below the bottom end of the third rack (38), and a guide slide is provided on the front side of the limiting plate (42), and after the bottom end of the third rack (38) contacts the limiting plate (42), the third rack (38) can slide toward the front end of the prism rod (37) under the action of the guiding slide to mesh with the fourth gear (22).

9. The device for preparing electron microscope thin-section samples according to claim 8, characterized in that: The bottom end of the third rack (38) is in an arc shape.

10. The device for preparing electron microscope thin-section samples according to claim 8, characterized in that: A collecting tray (44) is also movably mounted on the inner bottom end of the supporting base (40), and the collecting tray (44) is located below the front end of the receiving cavity (24).

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