Chip rotation test fixture, chip testing device and chip testing machine

Abstract

The present invention provides a chip rotation test fixture, a chip testing device and a chip testing machine. The chip rotation test fixture includes a rotating table, a plurality of trays and a support rack. The plurality of trays are arranged on the rotating table along the circumference of the rotating table, and an upper material position and a lower material position are set on the rotation trajectory of the tray. Each tray includes two limit members and two tightening members, and the two tightening members are respectively arranged horizontally relative to the two limit members and are arranged to be horizontally movable. Each tightening member is connected to a first elastic member, and the first elastic member is used to provide elastic force to make the tightening member move toward the corresponding limit member. A support rack is provided below the upper material position and the lower material position, and the support rack includes a pushing mechanism and a lifting mechanism. The lifting mechanism is connected to the pushing mechanism and is used to drive the pushing mechanism to rise and fall so that the pushing mechanism is connected to or separated from the two tightening members; the pushing mechanism can push the two tightening members to move away from the corresponding limit members. The chip testing device and the chip testing machine include the above-mentioned chip rotation test fixture.

Description

Technical Field

[0001] The present invention relates to the technical field of testing equipment, and in particular to a chip rotation testing fixture, a chip testing device and a chip testing machine. Background Art

[0002] Electronic products typically contain chips, which typically need to be tested after processing. Testing can help identify any issues with the chips, minimizing product defects and improving product reliability by the time they reach consumers.

[0003] The chip testing fixture in the prior art has a relatively complex structure and a high manufacturing cost.

[0004] Therefore, it is necessary to provide a chip rotation test fixture, a chip testing device and a chip testing machine to solve the above technical problems. Summary of the Invention

[0005] The present invention provides a chip rotation test fixture, a chip test device and a chip test machine, which have a simple structure and reduce manufacturing costs.

[0006] The technical solution of the present invention is:

[0007] A chip rotation test fixture, comprising:

[0008] The platform rotating mechanism includes a rotating table arranged to rotate vertically;

[0009] A plurality of trays for carrying chips; the plurality of trays are arranged on the rotating table along the circumference of the rotating table and rotate with the rotating table, and an upper material position and a lower material position are set on the rotation track of the tray; each of the trays includes two limiting members and two tightening members, the two limiting members are respectively used to limit the two adjacent sides of the chip, and the two tightening members are respectively arranged horizontally relative to the two limiting members and are horizontally movable to tighten or loosen the chip; each of the tightening members is connected to a first elastic member, and the first elastic member is used to provide elastic force to make the tightening member move toward the corresponding limiting member to tighten the chip; and,

[0010] A material support rack is provided below the upper material position and the lower material position, and the material support rack includes a pushing mechanism and a lifting mechanism. The lifting mechanism is connected to the pushing mechanism and is used to drive the pushing mechanism to rise and fall so that the pushing mechanism is connected to or separated from the two tightening parts; when the pushing mechanism is connected to the tightening parts, the pushing mechanism can push the two tightening parts away from the corresponding limiting parts to release the chip.

[0011] In the chip rotation test fixture of the present invention, the pushing mechanism includes:

[0012] a connecting plate connected to the lifting mechanism;

[0013] Two pushing assemblies, each comprising a push rod and a lifting rod; the push rod comprising a first rod and a second rod connected in an L-shape, wherein the junction of the first rod and the second rod is rotatably connected to the connecting plate; the lifting rod moves vertically, and the top end of the lifting rod is connected to the end of the second rod; and

[0014] A push driving member is provided on the connecting plate and connected to the bottom end of each lifting rod, and is used to drive each lifting rod to move vertically so that the ends of the two first rods move toward or away from the tightening member in the horizontal direction.

[0015] In the chip rotation test fixture of the present invention, the tray further includes a bottom plate, the two limiting members and the two tightening members are both arranged on the bottom plate, and the bottom plate is detachably connected to the rotating table.

[0016] In the chip rotation test fixture of the present invention, a positioning groove is provided on the bottom plate; the chip rotation test fixture further includes a clamping mechanism, which includes:

[0017] a fixed block connected to the rotating table;

[0018] A movable rod is vertically movable and passes through the fixed block, and the movable rod can rotate vertically and move vertically;

[0019] a buckle connected to the top end of the movable rod and capable of abutting and separating from the bottom plate, wherein when the buckle abuts against the bottom plate, the buckle is inserted into the positioning groove to limit the buckle from rotating; and

[0020] A compression spring is sleeved on the movable rod and is used for providing elastic force to move the movable rod downward so that the buckle presses the bottom plate downward.

[0021] In the chip rotation test fixture described in the present invention, the bottom plate is provided with a avoidance opening; the support rack also includes a support block, which is movably arranged at the avoidance opening along the vertical direction, and the support block is connected to the lifting mechanism, and the two limiting members and the two tightening members are arranged at the avoidance opening. The top surface of the support block is provided with four supporting bars, and the four supporting bars are arranged in an X shape along the diagonal line of the chip, which is used to support the chip and make the four edges of the chip suspended.

[0022] In the chip rotation test fixture of the present invention, the limiting member is horizontally adjustably arranged on the bottom plate so as to be able to move closer to or away from the corresponding tightening member.

[0023] In the chip rotation test fixture of the present invention, the chip rotation test fixture further includes an adjustment mechanism, and the adjustment mechanism includes:

[0024] A cam mechanism, comprising a cam, the cam being arranged on the rotating platform for vertical rotation and located at an end of the limiting member facing away from the chip, with a circumferential surface of the cam abutting against the limiting member;

[0025] a second elastic member connected to the limiting member and configured to provide elastic force so that the limiting member moves away from the chip and maintains contact with the cam; and

[0026] An adjusting drive mechanism is arranged on the supporting rack located at the loading position, and the adjusting drive mechanism includes a cam drive mechanism and a vertical drive mechanism; the vertical drive mechanism is connected to the cam drive mechanism, and can drive the cam drive mechanism to rise and fall and then connect or separate with the cam mechanism; when the cam drive mechanism is connected to the cam mechanism, the cam drive mechanism can drive the cam to rotate.

[0027] In the chip rotation test fixture of the present invention, the cam mechanism further includes:

[0028] a fixed platform connected to the rotating platform;

[0029] A rotating shaft movably penetrates the fixed platform, the top end of the rotating shaft is connected to the cam, and the bottom end of the rotating shaft is provided with two rotating holes; and

[0030] a first compression spring, sleeved on the rotating shaft, for providing a downward elastic force to keep the cam in contact with the fixing platform;

[0031] The cam drive mechanism comprises:

[0032] A transmission block, which is arranged to rotate vertically;

[0033] Two transmission pins are movably arranged on the transmission block in a vertical direction, at least one of the two is located at an eccentric position of the transmission block, and the bottom of the transmission pin is suspended in the air;

[0034] Two second compression springs are respectively sleeved on the two transmission pins to provide an upward elastic force so that the transmission pins protrude upward from the transmission block; and

[0035] A cam driver is connected to the transmission block and is used to drive the transmission block and the two transmission pins to rotate. When the two transmission pins are located in the two rotation holes, the rotation of the transmission block can cause the rotating shaft and the cam to rotate through the two transmission pins.

[0036] Another technical solution of the present invention is:

[0037] A chip testing device, comprising:

[0038] The above-mentioned chip rotation test fixture, the rotation track of the tray is further provided with a marking position, a detection position and a marking position, and the loading position, the marking position, the detection position, the marking position and the unloading position are arranged in a ring in sequence;

[0039] a positioning mechanism, which is arranged at the marking position;

[0040] a detection head, which is disposed at the detection position; and

[0041] The marking mechanism is arranged at the marking position.

[0042] Another technical solution of the present invention is:

[0043] A chip testing machine, comprising:

[0044] The chip testing device mentioned above; and

[0045] The loading and unloading device is used for loading chips onto the tray at the loading position and unloading chips from the tray at the unloading position.

[0046] Compared with the prior art, the present invention has the following beneficial effects: when the chip rotation test fixture of the present invention is in operation, when one of the trays rotates to the upper material position, the lifting mechanism of the support rack located below the upper material position drives the pushing mechanism to rise, the pushing mechanism is connected to the top tightening member, and pushes the two top tightening members away from the corresponding limit members so that there is enough space between the two top tightening members and the two limit members to accommodate the chip. After the chip is placed between the two top tightening members and the two limit members, the pushing mechanism separates from the top tightening member, and the first elastic member causes the top tightening member to move toward the corresponding limit member to tighten the chip. The lifting mechanism drives the pushing mechanism to descend back to the low position, and the above-mentioned tray continues to rotate. At the same time, when one of the trays rotates to the lower material position, the lifting mechanism of the support rack located below the lower material position drives the pushing mechanism to rise, the pushing mechanism is connected to the top tightening member, and pushes the two top tightening members away from the corresponding limit members to loosen the chip so that the chip can be removed. The chip rotation test fixture of the present invention has a support frame located below the upper material position to assist the tightening member in sequentially clamping the chips, and a support frame located below the lower material position to assist the tightening member in sequentially releasing the chips. The structure is simple and the manufacturing cost is reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. The drawings described below are only drawings corresponding to some embodiments of the present invention.

[0048] Figure 1 A schematic structural diagram of a chip testing machine provided in a preferred embodiment of the present invention.

[0049] Figure 2 This is a schematic structural diagram of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0050] Figure 3 for Figure 2 Schematic diagram of the enlarged structure of part B.

[0051] Figure 4 This is a schematic top view of the chip rotation test fixture provided in a preferred embodiment of the present invention.

[0052] Figure 5 for Figure 4 Schematic diagram of the enlarged structure of part A.

[0053] Figure 6 This is a structural schematic diagram of a chip rotation test fixture provided by a preferred embodiment of the present invention, located at a material loading position of a support rack.

[0054] Figure 7 This is a structural schematic diagram of another angle of the support rack of the chip rotation test fixture provided by the preferred embodiment of the present invention, which is located at the loading position.

[0055] Figure 8 A schematic structural diagram of a pushing mechanism of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0056] Figure 9 This is a schematic structural diagram of a push rod of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0057] Figure 10 A schematic structural diagram of a cam drive mechanism of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0058] Figure 11 A schematic structural diagram of a cam mechanism of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0059] Figure 12 A schematic structural diagram of the clamping mechanism of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0060] Figure 13 A schematic structural diagram of a support block of a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0061] Figure 14 A schematic structural diagram of a limiter for a chip rotation test fixture provided in a preferred embodiment of the present invention.

[0062] in,

[0063] 100, Chip,

[0064] 1. Chip rotation test fixture,

[0065] 11. Rotating table,

[0066] 12. Tray, 121. Limiting member, 1211. Extension piece, 122. Tightening member, 123. First elastic member, 124. Bottom plate, 1241. Positioning groove, 1242. Avoidance opening,

[0067] 13. Support rack,

[0068] 131. Push mechanism, 1311. Connecting plate, 1312. Push assembly, 13121. Push rod, 13122. First rod, 13123. Second rod, 13124. First rotating bearing, 13125. Lifting rod, 13126. Second rotating bearing, 13127. Accommodating groove, 1313. Push driving member,

[0069] 132. Lifting mechanism,

[0070] 133, support block, 1331, bearing bar, 1332, perforation,

[0071] 134. Distance measuring device,

[0072] 14. Clamping mechanism, 141. Fixed block, 142. Movable rod, 1421. Clamping piece, 143. Buckle, 144. Compression spring,

[0073] 15. Adjustment mechanism,

[0074] 151. Cam mechanism, 1511. Cam, 1512. Fixed platform, 1513. Rotating shaft, 15131. Rotating hole, 15132. Limit block, 1514. First compression spring,

[0075] 152. A second elastic member,

[0076] 153. Adjust the drive mechanism,

[0077] 1531, cam drive mechanism, 15311, transmission block, 15312, transmission pin, 15313, second compression spring, 15314, cam driver, 15315, groove,

[0078] 1532. Vertical drive mechanism,

[0079] 2. Positioning mechanism,

[0080] 3. Detection of the machine head,

[0081] 4. Marking mechanism,

[0082] 5. Loading and unloading device.

[0083] In the figures, structurally similar elements are denoted by the same reference numerals. DETAILED DESCRIPTION

[0084] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making any creative efforts shall fall within the scope of protection of the present invention.

[0085] Directional terms mentioned in the present invention, such as "up", "down", "front", "back", "left", "right", "inside", "outside", "side", "top" and "bottom", are only used with reference to the directions of the drawings. The directional terms used are used to illustrate and understand the present invention, and are not used to limit the present invention.

[0086] The terms "first" and "second" in the present invention are used for descriptive purposes only and should not be understood as indicating or implying relative importance, and should not be used as a limitation on the order of precedence.

[0087] In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "connect," "fixed," etc. should be understood broadly. For example, they may refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0088] The chip rotation test fixture in the prior art has a relatively complex structure and a high manufacturing cost.

[0089] The following is a preferred embodiment of a chip rotation test fixture 1, a chip testing device and a chip testing machine provided by the present invention that can solve the above technical problems.

[0090] The preferred embodiment of the present invention provides a chip testing machine. Figure 1 and Figure 2 The chip tester includes a chip test device and a loading and unloading device 5. The loading and unloading device 5 is used for loading and unloading the chip 100 on the chip test device.

[0091] Please refer to Figure 1The chip testing device includes a chip rotating test fixture 1, an alignment mechanism 2, a detection head 3 and a marking mechanism 4. The rotation track of the tray 12 is provided with a loading position, a marking position, a detection position, a marking position and an unloading position, and the loading position, the marking position, the detection position, the marking position and the unloading position are arranged in a ring in sequence. The alignment mechanism 2 is set at the marking position, and is used to take a picture of the chip 100 to determine the position of the chip 100. The detection head 3 is set at the detection position, and is used to detect the chip. The marking mechanism 4 is set at the marking position, and is used to mark the chip 100. The loading and unloading device 5 is used to load the chip 100 to the tray 12 at the loading position, and to unload the chip 100 at the tray 12 at the unloading position. In this embodiment, the loading and unloading device 5 completes the loading and unloading of the chip 100 by two manipulators.

[0092] Please refer to Figure 2 、 Figure 4 、 Figure 5 and Figure 6 The chip rotation test fixture 1 includes a platform rotation mechanism, a plurality of trays 12 and a support rack 13. The platform rotation mechanism can drive the plurality of trays 12 to rotate, and the support rack 13 is used to enable the trays 12 to clamp or release the chip 100.

[0093] The platform rotation mechanism includes a vertically rotatable rotating platform 11 and a rotary drive member connected to the rotating platform 11 for driving the vertical rotation of the rotating platform 11. In this embodiment, the rotary drive member is located below the rotating platform 11, while the alignment mechanism 2, the inspection head 3, and the marking mechanism 4 are all located above the rotating platform 11.

[0094] The tray 12 is used to carry chips, and each tray 12 can carry one chip 100. Multiple trays 12 are arranged on the turntable 11 along the circumference of the turntable 11, and rotate with the turntable 11, so that multiple chips move in sequence between the loading position, marking position, detection position, marking position and unloading position. Each tray 12 includes two limiting members 121 and two tightening members 122. The two limiting members 121 are respectively used to limit the two adjacent sides of the chip 100. The two tightening members 122 are respectively arranged horizontally relative to the two limiting members 121 and are arranged to be horizontally movable to tighten or loosen the chip 100. Each tightening member 122 is connected to a first elastic member 123, and the first elastic member 123 is used to provide elastic force so that the tightening member 122 moves toward the corresponding limiting member 121 to tighten the chip. A support frame 13 is provided below both the upper and lower material positions. The support frame 13 includes a push mechanism 131 and a lifting mechanism 132. The lifting mechanism 132 is connected to the push mechanism 131 and is used to drive the push mechanism 131 up and down, thereby connecting or disconnecting the push mechanism 131 from the two holding members 122. When the push mechanism 131 is connected to the holding members 122, the push mechanism 131 can push the two holding members 122 away from the corresponding stop members 121 to release the chip 100.

[0095] When the chip rotation test fixture 1 of the present invention is in operation, when one of the trays 12 rotates to the loading position, the lifting mechanism 132 of the support rack 13 located below the loading position drives the pushing mechanism 131 to rise. The pushing mechanism 131 is connected to the top tightening member 122 and pushes the two top tightening members 122 away from the corresponding limit members 121 so that there is enough space between the two top tightening members 122 and the two limit members 121 to accommodate the chip 100. After the chip 100 is placed between the two top tightening members 122 and the two limit members 121, the pushing mechanism 131 separates from the top tightening member 122, and the first elastic member 123 causes the top tightening member 122 to move toward the corresponding limit member 121 to tighten the chip 100. The lifting mechanism 132 drives the pushing mechanism 131 to return to the low position, and the tray 12 moves to another position under the drive of the rotating table 11. At the same time, when one of the trays 12 rotates to the unloading position along with the rotating table 11, the lifting mechanism 132 of the support rack 13 located below the unloading position drives the pushing mechanism 131 to rise. The pushing mechanism 131 is connected to the top tightening member 122 and pushes the two top tightening members 122 away from the corresponding limit members 121 to loosen the chip 100 so that the chip 100 can be removed. In the chip rotation test fixture 1 of the present invention, the support rack 13 located below the loading position can assist the top tightening member 122 in sequentially clamping the chip, and the support rack 13 located below the unloading position can assist the top tightening member 122 in sequentially loosening the chip. The structure is simple, which reduces manufacturing costs; loading and unloading can be carried out simultaneously, improving detection efficiency.

[0096] Please refer to Figure 6 and Figure 8The pushing mechanism 131 includes a connecting plate 1311, two pushing components 1312 and a pushing driving member 1313. The connecting plate 1311 is connected to the lifting mechanism 132. The pushing component 1312 includes a push rod 13121 and a lifting rod 13125. The push rod 13121 includes a first rod 13122 and a second rod 13123 connected in an L shape, and the junction of the first rod 13122 and the second rod 13123 is rotatably connected to the connecting plate 1311. The lifting rod 13125 moves vertically, and the top end of the lifting rod 13125 is connected to the end of the second rod 13123. The pushing driving member 1313 is arranged on the connecting plate 1311 and is connected to the bottom end of each lifting rod 13125, and is used to drive each lifting rod 13125 to move vertically, so that the ends of the two first rods 13122 move closer to or away from the tightening member 122 in the horizontal direction. By using the L-shaped push rod 13121, the lifting movement of the end of the second rod 13123 can be converted into the horizontal movement of the end of the first rod 13122. The push-driving member 1313 drives the lifting rod 13125 to move upward, which drives the end of the second rod 13123 to move upward. The push rod 13121 rotates, and the end of the first rod 13122 moves closer to the pressing member 122. The push-driving member 1313 drives the lifting rod 13125 to move downward, which drives the end of the second rod 13123 to move downward. The push rod 13121 rotates in the opposite direction, and the end of the first rod 13122 moves away from the pressing member 122. With the above structure, the ends of the two first rods 13122 can be simultaneously controlled by a single push-driving member 1313 to move closer to or away from the corresponding pressing member 122 in different horizontal directions, which facilitates control and saves costs.

[0097] Please refer to Figure 8 A first rotating bearing 13124 is provided at the end of the first rod 13122, and the first rotating bearing 13124 is used to push the pressing member 122 to move. The friction between the first rod 13122 and the pressing member 122 can be reduced, making it easier to push the pressing member 122 to move.

[0098] Please refer to Figure 8 and Figure 9 The end of the second rod 13123 is provided with a receiving groove 13127. The top of the lifting rod 13125 is provided with a second rotating bearing 13126, and the second rotating bearing 13126 is rotatably disposed in the receiving groove 13127. This allows the lifting rod 13125 to push the second rod 13123 to move smoothly.

[0099] Please refer to Figure 14The limiting member 121 is provided with an extension piece 1211 extending downward, which is used to connect or separate with the first rod 13122. When the first rod 13122 is lifted, it can be located on one side of the extension piece 1211 in the horizontal direction and connected to the extension piece 1211. The first rod 13122 pushes the extension piece 1211 to move horizontally, thereby pushing the limiting member 121 away from the corresponding tightening member 122.

[0100] Please refer to Figure 5 The tray 12 further includes a bottom plate 124, two limiting members 121 and two tightening members 122 are all provided on the bottom plate 124, and the bottom plate 124 is detachably connected to the rotating table 11. If the tray 12 is damaged, it can be replaced alone, which can save costs.

[0101] Please refer to Figure 5 and Figure 12 , a positioning groove 1241 is provided on the bottom plate 124. The chip rotation test fixture 1 also includes a clamping mechanism 14, which includes a fixed block 141, a movable rod 142, a buckle 143 and a compression spring 144. The fixed block 141 is connected to the rotating table 11. The movable rod 142 is vertically movable and penetrates the fixed block 141. The movable rod 142 can rotate vertically and move vertically. A clamping piece 1421 is provided at the bottom of the movable rod 142. The buckle 143 is connected to the top of the movable rod 142 and can abut and separate from the bottom plate 124. When the buckle 143 abuts against the bottom plate 124, the buckle 143 is inserted into the positioning groove 1241 to limit the rotation of the buckle 143. The compression spring 144 is sleeved on the movable rod 142, and its two ends abut against the clamping piece 1421 and the fixed block 141 respectively. The compression spring 144 is used to provide elastic force to move the movable rod 142 downward, so that the buckle 143 presses down on the bottom plate 124. Under normal conditions, the buckle 143 is located in the positioning groove 1241. The compression spring 144 causes the movable rod 142 to move downward, and the buckle 143 presses down on the bottom plate 124, thereby locking the tray 12 to the turntable 11. When it is necessary to replace the tray 12, the buckle 143 is pulled upward to remove it from the positioning groove 1241, and then the buckle 143 is rotated so that the buckle 143 and the bottom plate 124 are vertically offset. The tray 12 can then be removed from the turntable 11 as a whole and replaced. The above structure facilitates the replacement and fixing of the tray 12.

[0102] Multiple latching mechanisms 14 can be provided, arranged around the tray 12, to secure the tray 12 securely and prevent it from loosening. The rotating platform 11 can also be provided with a foolproof groove that matches the shape of the bottom plate 124, so that the bottom plate 124 can be mounted on the rotating platform 11, and the two pressing members 122 can be aligned with the two first rods 13122.

[0103] Please refer to Figure 5The bottom plate 124 is provided with a clearance opening 1242. The support rack 13 also includes a support block 133, which is movably arranged vertically at the clearance opening 1242. The support block 133 is connected to the lifting mechanism 132. Two limiting members 121 and two tightening members 122 are provided at the clearance opening 1242. The top surface of the support block 133 is provided with four supporting bars 1331. The four supporting bars 1331 are arranged in an X shape along the diagonal lines of the chip 100, and are used to support the chip 100 and make the four edges of the chip 100 suspended. The two limiting members 121 and the two tightening members 122 clamp the chip 100 at the clearance opening 1242, which can make the chip 100 suspended, facilitating double-sided inspection of the chip 100. At the loading position, the lifting mechanism 132 drives the support block 133 to move upward. After the chip 100 falls on the support block 133, the pressing member 122 presses the chip tightly, and the support block 133 moves downward. At the unloading position, the support block 133 moves upward so that the chip falls on the support block 133. The pressing member 122 releases the chip, and the robot takes the chip 100 away. The support block 133 moves downward, completing the unloading of the chip 100, and the empty tray 12 can continue to move to the loading position. The above structure makes it easy to take and place chips. The four supporting bars 1331 facilitate the two limiting members 121 and the two pressing members 122 to clamp the four edges of the chip and reduce the friction between the chip and the support block 133. The four supporting bars 1331 can avoid the two limiting members 121 and the two pressing members 122, preventing the support block 133 from contacting the limiting members 121 and the pressing members 122.

[0104] Please refer to Figure 13 and Figure 6 The support block 133 is provided with a vertical through-hole 1332. The support frame 13 also includes a distance measuring device 134, which is connected to the connecting plate 1311 so that the distance measuring device 134 and the support block 133 can be raised and lowered together. The distance measuring device 134 is arranged vertically opposite the through-hole 1332. The distance measuring device 134 can determine whether the chip is correctly placed, thereby controlling the movement of the two holding members 122 to accurately clamp the four edges of the chip.

[0105] Please refer to Figure 5 The limiters 121 are horizontally adjustable on the bottom plate 124 so as to be able to move closer to or away from the corresponding pressing members 122. The horizontal positions of the two limiters 121 can be adjusted according to the size of the chip so that the chip can be clamped in the middle position of the retaining opening 1242, facilitating accurate testing.

[0106] More specifically, please refer to Figure 5 、 Figure 7 and Figure 11The chip rotation test fixture 1 also includes an adjustment mechanism 15. The adjustment mechanism 15 includes a cam mechanism 151, a second elastic member 152 and an adjustment drive mechanism 153. The cam mechanism 151 includes a cam 1511, which is arranged on the rotating table 11 to rotate vertically and is located at the end of the limit member 121 away from the chip. The circumferential surface of the cam 1511 abuts against the limit member 121. The second elastic member 152 is connected to the limit member 121 to provide elastic force so that the limit member 121 moves away from the chip and remains in abutment with the cam 1511. When the cam 1511 rotates, the limit member 121 can move horizontally to achieve position adjustment. The adjustment drive mechanism 153 is arranged on the material support rack 13 located at the upper material position, and the adjustment drive mechanism 153 includes a cam drive mechanism 1531 and a vertical drive mechanism 1532. The vertical drive mechanism 1532 is connected to the cam drive mechanism 1531, and can drive the cam drive mechanism 1531 to rise and fall and then connect or separate with the cam mechanism 151. When the cam drive mechanism 1531 is connected to the cam mechanism 151, the cam drive mechanism 1531 can drive the cam 1511 to rotate. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to rise. The cam drive mechanism 1531 is connected to the cam mechanism 151. The action of the cam drive mechanism 1531 can cause the cam 1511 to rotate to adjust the position of the limit member 121. The second elastic member 152 causes the limit member 121 to maintain contact with the cam 1511, so that the limit member 121 remains stationary after the position is adjusted. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to descend without hindering the rotation of the rotating table 11.

[0107] Please refer to Figure 11 The cam mechanism 151 also includes a fixed platform 1512, a rotating shaft 1513, and a first compression spring 1514. The fixed platform 1512 is connected to the rotating platform 11. The rotating shaft 1513 is movably installed on the fixed platform 1512. The top end of the rotating shaft 1513 is connected to the cam 1511. The bottom end of the rotating shaft 1513 is provided with a limit block 15132 and two rotation holes 15131. The first compression spring 1514 is sleeved on the rotating shaft 1513. The two ends of the first compression spring 1514 are respectively in contact with the limit block 15132 and the fixed platform 1512. The first compression spring 1514 is used to provide a downward elastic force to keep the cam 1511 in contact with the fixed platform 1512.

[0108] Please refer to Figure 10The cam drive mechanism 1531 includes a transmission block 15311, two transmission pins 15312, two second compression springs 15313, and a cam driver 15314. The transmission block 15311 is arranged to rotate vertically. The two transmission pins 15312 are arranged to move vertically on the transmission block 15311, with at least one of the two pins located eccentrically with respect to the transmission block 15311. The bottoms of the transmission pins 15312 are suspended in the air. The two second compression springs 15313 are respectively mounted on the two transmission pins 15312 to provide an upward elastic force, causing the transmission pins 15312 to protrude upward from the transmission block 15311. The cam driver 15314 is connected to the transmission block 15311 and is used to drive the transmission block 15311 and the two transmission pins 15312 to rotate. When the two transmission pins 15312 are located in the two rotating holes 15131, the rotation of the transmission block 15311 can cause the rotating shaft 1513 and the cam 1511 to rotate through the two transmission pins 15312.

[0109] The vertical drive mechanism 1532 drives the cam drive mechanism 1531 upward. The two drive pins 15312 are positioned within the two rotation holes 15131. The cam driver 15314 rotates the drive block 15311 and the two drive pins 15312, causing the cam 1511 to rotate. The first compression spring 1514 provides a downward force to maintain contact between the cam 1511 and the fixed base 1512, preventing the cam 1511 from vertically shifting. The two drive pins 15312 are vertically rotatable, with their bottoms suspended in the air, ensuring that they do not get stuck while rotating the cam 1511. The two second compression springs 15313 provide an upward force, causing the drive pins 15312 to protrude upward from the drive block 15311. When the two drive pins 15312 are inserted into the two rotation holes 15131, both the first compression spring 1514 and the second compression spring 15313 compress, providing a cushioning force during contact and preventing damage from rigid contact.

[0110] A retaining spring is provided on the transmission pin 15312, a groove 15315 is provided on the transmission block 15311, and a second compression spring 15313 is provided in the groove 15315. The two ends of the second compression spring 15313 respectively abut against the bottom wall of the groove 15315 and the lower surface of the retaining spring to provide an upward force to the transmission pin 15312 through the retaining spring.

[0111] The working principle of the chip tester of the preferred embodiment of the present invention is as follows:

[0112] The vertical drive mechanism 1532 drives the cam drive mechanism 1531 upward. The two drive pins 15312 are located within the two rotation holes 15131. The cam driver 15314 drives the transmission block 15311 and the two drive pins 15312 to rotate, causing the cam 1511 to rotate, thereby adjusting the position of the stopper 121 to match the size of the chip. The second elastic member 152 maintains contact between the stopper 121 and the cam 1511, ensuring that the stopper 121 remains stationary after the position is adjusted. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 downward without hindering the rotation of the rotary table 11.

[0113] When one of the trays 12 rotates to the loading position, the lifting mechanism 132 of the support rack 13 located below the loading position drives the pushing mechanism 131 and the support block 133 to rise. The driving member 1313 drives the lifting rod 13125 upward, driving the end of the second rod 13123 upward. The push rod 13121 rotates, and the end of the first rod 13122 moves closer to the pressing member 122, pushing the two pressing members 122 away from the corresponding limit members 121, so that there is enough space between the two pressing members 122 and the two limit members 121 to accommodate the chip. The loading and unloading device 5 places the chip on the four supporting bars 1331 of the support block 133. The driving member 1313 drives the lifting rod 13125 downward, driving the end of the second rod 13123 downward. The push rod 13121 rotates in the opposite direction, and the end of the first rod 13122 moves away from the pressing member 122. The first elastic member 123 enables the pressing member 122 to move toward the corresponding limiting member 121 to press the chip.

[0114] The pushing mechanism 131 and the supporting block 133 move downward.

[0115] The rotary table 11 rotates so that the chip passes through the marking position, the detection position, the marking position in sequence from the loading position to the unloading position.

[0116] When one of the trays 12 rotates to the unloading position, the lifting mechanism 132 of the support rack 13 located below the unloading position drives the pushing mechanism 131 and the supporting block 133 to rise. The pushing mechanism 131 is connected to the tightening member 122 and pushes the two tightening members 122 away from the corresponding limiting members 121 to loosen the chip. The chip falls on the supporting block 133, and the loading and unloading device 5 takes the chip away.

[0117] The pushing mechanism 131 and the supporting block 133 move downwards. The rotating table 11 rotates to move the empty tray 12 to the loading position.

[0118] The two brackets 13 at the loading and unloading positions can move simultaneously, and loading and unloading can be carried out simultaneously, thereby improving efficiency.

[0119] This completes the working process of the chip tester of this preferred embodiment.

[0120] The chip rotation test fixture of the present invention is designed such that when one of the trays rotates to the upper material position, the lifting mechanism of the support rack located below the upper material position drives the pushing mechanism to rise, the pushing mechanism is connected to the top tightening member, and pushes the two top tightening members to move away from the corresponding limiting members, so that there is enough space between the two top tightening members and the two limiting members to accommodate the chip. After the chip is placed between the two top tightening members and the two limiting members, the pushing mechanism separates from the top tightening member, and the first elastic member causes the top tightening member to move toward the corresponding limiting member to tighten the chip. The lifting mechanism drives the pushing mechanism to descend back to the low position, and the above-mentioned tray continues to rotate. At the same time, when one of the trays rotates to the lower material position, the lifting mechanism of the support rack located below the lower material position drives the pushing mechanism to rise, the pushing mechanism is connected to the top tightening member, and pushes the two top tightening members to move away from the corresponding limiting members to release the chip so that the chip can be taken away. The chip rotation test fixture of the present invention has a support frame located below the upper material position to assist the tightening member in sequentially clamping the chips, and a support frame located below the lower material position to assist the tightening member in sequentially releasing the chips. The structure is simple and the manufacturing cost is reduced.

[0121] In summary, although the present invention has been disclosed as above in terms of preferred embodiments, the scope of protection of the present invention is not limited thereto. Any technician familiar with the technical field, within the technical scope disclosed by the present invention, who makes equivalent replacements or changes based on the concept of the technical solution of the present invention, should be covered by the scope of protection of the present invention.

Claims

1. A chip rotation test fixture, characterized in that: include: The platform rotating mechanism includes a rotating table arranged to rotate vertically; Multiple trays for carrying chips; The plurality of trays are arranged on the rotating table along the circumference of the rotating table and rotate with the rotating table, and an upper material position and a lower material position are set on the rotating track of the tray; each of the trays includes two limiting members and two tightening members, the two limiting members are respectively used to limit the two adjacent sides of the chip, and the two tightening members are respectively arranged horizontally relative to the two limiting members and are horizontally movable to tighten or loosen the chip; each of the tightening members is connected to a first elastic member, and the first elastic member is used to provide elastic force to make the tightening member move toward the corresponding limiting member to tighten the chip; and, A material support frame is provided below the upper material position and the lower material position, and the material support frame includes a pushing mechanism and a lifting mechanism. The lifting mechanism is connected to the pushing mechanism and is used to drive the pushing mechanism to move up and down so that the pushing mechanism is connected to or separated from the two tightening members. When the pushing mechanism is connected to the tightening members, the pushing mechanism can push the two tightening members to move away from the corresponding limiting members to release the chip. Wherein, the pushing mechanism includes: a connecting plate connected to the lifting mechanism; Two pushing assemblies, each comprising a push rod and a lifting rod; the push rod comprising a first rod and a second rod connected in an L-shape, wherein the junction of the first rod and the second rod is rotatably connected to the connecting plate; the lifting rod moves vertically, and the top end of the lifting rod is connected to the end of the second rod; and A push driving member is provided on the connecting plate and connected to the bottom end of each lifting rod, and is used to drive each lifting rod to move vertically so that the ends of the two first rods move toward or away from the tightening member in the horizontal direction.

2. The chip rotation test fixture according to claim 1, characterized in that: The tray further includes a bottom plate, the two limiting members and the two tightening members are both arranged on the bottom plate, and the bottom plate is detachably connected to the rotating platform.

3. The chip rotation test fixture according to claim 2, characterized in that: The bottom plate is provided with a positioning groove; the chip rotation test fixture further includes a clamping mechanism, which includes: a fixed block connected to the rotating table; A movable rod is vertically movable and passes through the fixed block, and the movable rod can rotate vertically and move vertically; a buckle connected to the top end of the movable rod and capable of abutting and separating from the bottom plate, wherein when the buckle abuts against the bottom plate, the buckle is inserted into the positioning groove to limit the buckle from rotating; and A compression spring is sleeved on the movable rod and is used for providing elastic force to move the movable rod downward so that the buckle presses the bottom plate downward.

4. The chip rotation test fixture according to claim 2, characterized in that: The bottom plate is provided with a avoidance opening; the support rack also includes a support block, which is movably arranged at the avoidance opening along the vertical direction, and the support block is connected to the lifting mechanism. The two limiting members and the two tightening members are arranged at the avoidance opening. The top surface of the support block is provided with four supporting bars, and the four supporting bars are arranged in an X shape along the diagonal line of the chip for supporting the chip, so that the four edges of the chip are suspended.

5. The chip rotation test fixture according to claim 4, characterized in that: The limiting member is adjustably arranged on the bottom plate horizontally so as to be able to move closer to or away from the corresponding tightening member.

6. The chip rotation test fixture according to claim 5, characterized in that: The chip rotation test fixture further includes an adjustment mechanism, which includes: A cam mechanism, comprising a cam, the cam being arranged on the rotating platform for vertical rotation and located at an end of the limiting member facing away from the chip, with a peripheral surface of the cam abutting against the limiting member; a second elastic member connected to the limiting member and configured to provide elastic force so that the limiting member moves away from the chip and maintains contact with the cam; and An adjusting drive mechanism is arranged on the supporting rack located at the loading position, and the adjusting drive mechanism includes a cam drive mechanism and a vertical drive mechanism; the vertical drive mechanism is connected to the cam drive mechanism, and can drive the cam drive mechanism to rise and fall and then connect or separate with the cam mechanism; when the cam drive mechanism is connected to the cam mechanism, the cam drive mechanism can drive the cam to rotate.

7. The chip rotation test fixture according to claim 6, characterized in that: The cam mechanism further comprises: a fixed platform connected to the rotating platform; A rotating shaft movably penetrates the fixed platform, the top end of the rotating shaft is connected to the cam, and the bottom end of the rotating shaft is provided with two rotating holes; and a first compression spring, sleeved on the rotating shaft, for providing a downward elastic force to keep the cam in contact with the fixing platform; The cam drive mechanism comprises: A transmission block, which is arranged to rotate vertically; Two transmission pins are movably arranged on the transmission block in a vertical direction, at least one of which is located at an eccentric position of the transmission block, and the bottoms of the transmission pins are suspended in the air; Two second compression springs are respectively sleeved on the two transmission pins to provide an upward elastic force so that the transmission pins protrude upward from the transmission block; and A cam driver is connected to the transmission block and is used to drive the transmission block and the two transmission pins to rotate. When the two transmission pins are located in the two rotation holes, the rotation of the transmission block can cause the rotating shaft and the cam to rotate through the two transmission pins.

8. A chip testing device, characterized in that: include: The chip rotation test fixture according to any one of claims 1 to 7, wherein a marking position, a detection position and a marking position are further provided on the rotation track of the tray, and the loading position, the marking position, the detection position, the marking position and the unloading position are arranged in a ring in sequence; a positioning mechanism, which is arranged at the marking position; a detection head, which is disposed at the detection position; and The marking mechanism is arranged at the marking position.

9. A chip testing machine, characterized in that: include: The chip testing device according to claim 8; as well as, The loading and unloading device is used for loading chips onto the tray at the loading position and unloading chips from the tray at the unloading position.

Images