A method for evaluating switchgear operation reliability

Abstract

The present invention discloses a method for evaluating the operational reliability of a switch cabinet, which relates to the field of switch cabinets and solves the problem of low accuracy in evaluating the operational reliability of a switch cabinet due to non-targeted testing. The method comprises: collecting rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in a target switch cabinet; performing an electrical variable protection test on each group of drive plug-ins in the target switch cabinet to obtain an electrical variable protection test result of the corresponding drive plug-in; performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain an over-temperature test result of the corresponding power module; performing a phase loss protection test on the target switch cabinet to obtain a phase loss test result corresponding to the target switch cabinet; comprehensively analyzing all test results corresponding to the target switch cabinet and evaluating the reliability of the target switch cabinet based on the test results; the present invention achieves accurate evaluation of the operational reliability of the switch cabinet by performing targeted tests on different accessories in the switch cabinet.

Description

Technical Field

[0001] The invention belongs to the technical field of switch cabinets, and in particular relates to a method for evaluating the operation reliability of a switch cabinet. Background Art

[0002] Switchgear is a key device used in power systems to distribute, control, protect, and monitor electrical energy. It is widely used in power plants, substations, industrial and mining enterprises, and building distribution systems. It integrates multiple electrical components to ensure the safety and reliability of power transmission. The switchgear is equipped with protective devices (such as fuses and circuit breakers) that can quickly disconnect the faulty circuit when an abnormality occurs, preventing the fault from expanding and protecting equipment and personnel. Therefore, it is necessary to accurately determine the reliability of the switchgear.

[0003] However, when evaluating the reliability of switchgear at this stage, the overall performance of the switchgear is usually tested, rather than detailed testing and evaluation of the drive plug-ins and power modules in the switchgear. This results in low accuracy of the evaluation results.

[0004] To this end, the present invention proposes a switch cabinet operation reliability evaluation method. Summary of the Invention

[0005] The purpose of the present invention is to provide a method for evaluating the operation reliability of a switch cabinet to solve the problems raised in the above background technology.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions:

[0007] A method for evaluating the operation reliability of a switch cabinet, the method comprising:

[0008] Step S1, collecting rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in the target switch cabinet;

[0009] Step S2: Perform an electrical variable protection test on each set of driver plug-ins in the target switch cabinet to obtain the electrical variable protection test results of the corresponding driver plug-ins; wherein the electrical variable protection test includes an overcurrent protection test and an overvoltage protection test;

[0010] Step S3, performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain an over-temperature test result of the corresponding power module;

[0011] Step S4, performing a phase loss protection test on the target switchgear to obtain a phase loss test result corresponding to the target switchgear;

[0012] Step S5: Integrate all test results corresponding to the target switchgear and evaluate the reliability of the target switchgear based on the test results.

[0013] Furthermore, the electrical variable protection test includes an overcurrent protection test and an overvoltage protection test. The test process of the overcurrent protection test is as follows:

[0014] Step S211: Select any group of driver plug-ins as test driver plug-ins, obtain the rated current values corresponding to the test driver plug-ins, and set the steady-state overcurrent test current value and the instantaneous overcurrent test current value of the corresponding driver plug-ins based on the rated current values;

[0015] Step S212, connecting the output end of the high current generator to the load terminal of the test drive plug-in, and setting the current waveform of the steady-state overcurrent test current value;

[0016] Step S213: continuously sending an alternating current having a value equal to the steady-state overcurrent test current value to the test driver plug-in, and recording the corresponding time as the steady-state test initial time; measuring the circuit-breaking time of the test driver plug-in, and obtaining the steady-state test response time of the corresponding test driver plug-in by subtracting the steady-state test initial time from the circuit-breaking time;

[0017] Step S214: providing an alternating current having a value of an instantaneous overcurrent test current to the test driver plug-in through a large current generator; and obtaining an instantaneous test response time by subtracting the current injection time from the circuit breaking time.

[0018] Furthermore, the test process of the overcurrent protection test also includes:

[0019] Step S215, calculating the steady-state test duration threshold WYZ and the instantaneous test duration threshold SYZ of the test driver plug-in by using a formula;

[0020] Step S216: Compare the steady-state test response time of the test driver plug-in with the steady-state test response time threshold. If the steady-state test response time is greater than or equal to the steady-state test response time threshold, generate an abnormal signal; if the steady-state test response time is less than the steady-state test response time threshold, obtain a steady-state current response difference by subtracting the steady-state test response time from the steady-state test response time threshold.

[0021] In step S217, the instantaneous test reaction time of the test driver plug-in is compared with the instantaneous test time threshold. If the instantaneous test reaction time is greater than or equal to the instantaneous test time threshold, an abnormal signal is generated; if the instantaneous test reaction time is less than the instantaneous test time threshold, the instantaneous current reaction difference is obtained by subtracting the instantaneous test reaction time from the instantaneous test time threshold. In step S218, the current test score DLF corresponding to the test driver plug-in is calculated. The specific formula is as follows:

[0022] DLF=A1×SDL+A2×WDL; where SDL is the instantaneous current response difference, WDL is the steady-state current response difference, and A1 and A2 are fixed-value weight coefficients;

[0023] In step S219, similarly, the current test score values of all driver plug-ins are obtained.

[0024] Furthermore, the calculation formula of the steady-state test duration threshold is as follows:

[0025] Where K is the time constant, WDL is the steady-state overcurrent test current value of the test driver plug-in, EDL is the rated current value of the test driver plug-in, and a is the curve type coefficient;

[0026] The calculation formula for the instantaneous test duration threshold is as follows:

[0027] Where SDL is the instantaneous overcurrent test current value of the test driver plug-in, and b is the curve type coefficient.

[0028] Furthermore, the test process of the overvoltage protection test is as follows:

[0029] Step S221, obtaining a rated voltage value corresponding to the test driver plug-in, and setting a steady-state overvoltage test voltage value and a transient overvoltage test voltage value of the test driver plug-in based on the rated voltage value; and also setting a steady-state ramp rate of the steady-state overvoltage test voltage value;

[0030] Among them, the transient overvoltage test voltage value> the steady-state overvoltage test voltage value> the rated voltage value;

[0031] Step S222: Connect the input terminal of the programmable power supply to the test drive plug-in to provide the test drive plug-in with a voltage having a rated voltage value;

[0032] Step S223: The voltage of the programmable power supply input is increased based on the steady-state ramp rate until it reaches the steady-state overvoltage test voltage value. The time when the voltage ramp begins is recorded as the voltage steady-state initial time. If the test driver plug-in has not tripped when the steady-state overvoltage test voltage value is reached, an abnormal signal is generated.

[0033] In step S224, if the test driver plug-in is disconnected before reaching the steady-state overvoltage test voltage value, the disconnection time is recorded, and the voltage change duration is obtained by subtracting the voltage steady-state initial time from the disconnection time; the voltage change duration is multiplied by the steady-state climbing rate and then added to the rated voltage value to obtain the actual disconnection voltage of the test driver plug-in.

[0034] Furthermore, the test process of the overvoltage protection test also includes:

[0035] In step S225, the actual trip voltage is compared with a preset trip voltage interval. If the actual trip voltage is within the preset trip voltage interval, the absolute value of the difference between the actual trip voltage and the midpoint of the preset trip voltage interval is calculated and recorded as the steady-state voltage deviation value. If the actual trip voltage is outside the preset trip voltage interval, an abnormal signal is generated. In step S226, a voltage equal to the transient overvoltage test voltage value is directly input to the test driver plug-in via the programmable power supply, and the transient voltage response time from the input voltage value to the tripping of the circuit is recorded.

[0036] Step S227: compare the voltage transient response time with the voltage transient response time threshold.

[0037] If the voltage transient reaction time is greater than or equal to the voltage transient reaction time threshold, an abnormal signal is generated; if the voltage transient reaction time is less than the voltage transient reaction time threshold, the voltage transient reaction deviation value is obtained by subtracting the voltage transient reaction time from the voltage transient reaction time threshold.

[0038] Step S228: Calculate the voltage test score DYF of the test driver plug-in. The formula is as follows:

[0039] DYF = B1 × SDY + B2 × e / WDY; where SDY is the voltage transient response time deviation, WDY is the steady-state voltage deviation, e is a natural constant, and B1 and B2 are fixed-value weight coefficients.

[0040] In step S229, the voltage test scores of all driver plug-ins are calculated similarly.

[0041] Furthermore, the test process of the over-temperature protection test is as follows:

[0042] Step S31, obtaining the rated power of multiple groups of power modules, and recording any group of power modules as a test power module;

[0043] Step S32, transmitting current to the test power module at rated power and setting a steady-state heating rate;

[0044] Step S33, increasing the temperature of the test power module at a steady-state heating rate until the test power module is disconnected, and recording the disconnection temperature value at the disconnection moment;

[0045] Step S34, comparing the circuit breaker temperature value with the circuit breaker temperature threshold. If the circuit breaker temperature value is less than the circuit breaker temperature threshold, an abnormal signal is generated. If the circuit breaker temperature value is greater than or equal to the circuit breaker temperature threshold, a circuit breaker temperature deviation value is obtained by subtracting the circuit breaker temperature threshold from the circuit breaker temperature value.

[0046] Furthermore, the over-temperature protection test further includes the following sub-steps:

[0047] Step S35, recording the actual current value at all times between the heating time and the circuit breaking time; wherein the heating time is the time when the test power module starts to increase the temperature at a steady-state heating rate;

[0048] Step S36: Subtract the rated current value of the tested power module from the actual current value at any moment and take the absolute value to obtain the current deviation value at the corresponding moment. The current deviation values at all moments are added together to obtain the total current deviation value of the tested power module.

[0049] Step S37: Calculate the over-temperature test score of the power module using the formula:

[0050] Overtemperature test score = circuit breaker temperature deviation ÷ total current deviation;

[0051] In step S38, the over-temperature test scores of all power modules are calculated similarly.

[0052] Furthermore, the process of the phase loss protection test is as follows:

[0053] Step S41: Connect a three-phase power supply to the three-phase connection of the target switchgear, adjust it to the test voltage, and record the three-phase power in order as phase A, phase B, and phase C; record the real-time voltage and real-time current values of each phase;

[0054] Step S42: Calculate the calculated voltage and current values for phases A, B, and C; compare the calculated voltage value of each phase with the real-time voltage value, and compare the calculated current value with the real-time current value; if any of the values differ, generate an abnormal signal; if all the values are the same, proceed to the subsequent steps;

[0055] Step S42: disconnect the A phase power and record the A phase failure response time from the time when the A phase power is disconnected to the time when the target switch cabinet is disconnected;

[0056] Step S43: Connect phase A, disconnect phase B, and record the phase B failure response time from the time phase B is disconnected to the time the target switch cabinet is disconnected. Connect phase B, disconnect phase C, and record the phase A failure response time, phase B failure response time, and phase C failure response time from the time phase C is disconnected to the time the target switch cabinet is disconnected. Step S44: Connect phase B, disconnect phase C, and record the phase A failure response time, phase B failure response time, and phase C failure response time from the time phase C is disconnected to the time the target switch cabinet is disconnected.

[0057] The maximum value of the phase response time is compared with the phase loss reaction time threshold; if the maximum value is greater than or equal to the phase loss reaction time threshold, an abnormal signal is generated; if the maximum value is less than the phase loss reaction time threshold, the target switchgear is recorded as a normal phase loss test.

[0058] Furthermore, step S5 includes the following sub-steps:

[0059] Step S51, obtaining the phase loss test result, over-temperature test result, over-voltage test result and over-current test result of the target switchgear;

[0060] Step S52: Compare the voltage test scores of all driver plug-ins with the corresponding voltage test score thresholds. If the voltage test score of any driver plug-in is less than the voltage test score threshold, an abnormal signal is generated.

[0061] If the voltage test score values of all driver plug-ins are greater than or equal to the voltage test score threshold, the target switchgear is marked as having passed the overvoltage test normally;

[0062] Step S53: comparing the current test scores of all driver plug-ins with corresponding current score thresholds. If the current test score of any driver plug-in is less than the current test score threshold, an abnormal signal is generated.

[0063] If the current test score values of all driver plug-ins are greater than or equal to the current test score threshold, the target switchgear is marked as having passed the overcurrent test normally;

[0064] Step S54: comparing the over-temperature test score values of all power modules with corresponding over-temperature test score thresholds. If the over-temperature test score value of any power module is less than the over-temperature test score threshold, an abnormal signal is generated.

[0065] If the over-temperature test scores of all power modules are greater than or equal to the over-temperature test score threshold, the target switchgear is marked as having passed the over-temperature test normally.

[0066] Step S55: If any test result is an abnormal signal, the reliability of the target switchgear is recorded as abnormal;

[0067] If all test results of the target switchgear are normal, the reliability of the target switchgear is recorded as normal.

[0068] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are:

[0069] 1. The present invention first collects the rated voltage and rated current values of multiple groups of driver plug-ins and power modules in the target switchgear; then performs an electrical variable protection test on each group of driver plug-ins in the target switchgear to obtain the electrical variable protection test results of the corresponding driver plug-ins; the present invention implements an electrical performance protection test on the target switchgear;

[0070] 2. The present invention performs an over-temperature protection test on each group of power modules in the target switch cabinet to obtain the over-temperature test results of the corresponding power modules; then performs a phase loss protection test on the target switch cabinet to obtain the phase loss test results corresponding to the target switch cabinet; finally, all the test results corresponding to the target switch cabinet are integrated, and the reliability of the target switch cabinet is evaluated based on the test results. The present invention realizes an accurate evaluation of the operating reliability of the switch cabinet. BRIEF DESCRIPTION OF THE DRAWINGS

[0071] To facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0072] Figure 1 is a flow chart of the overall method of the present invention;

[0073] Figure 2 Schematic diagram of the structure of the switch cabinet in the present invention;

[0074] Figure 3 A schematic diagram of the computer device designed for the present invention. DETAILED DESCRIPTION

[0075] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0076] Example 1, please refer to Figure 1 and Figure 2 As shown, the technical solution provided by the present invention is: a method for evaluating the operational reliability of a switchgear, which sequentially performs overcurrent protection tests, overvoltage protection tests, overtemperature protection tests, and phase loss protection tests on a target switchgear, and evaluates the target switchgear's ability to cope with faults based on the different test results, thereby obtaining a reliability level for the target switchgear;

[0077] like Figure 2 As shown, the target switch cabinet includes load terminals, signal terminals, multiple groups of power modules and multiple groups of drive plug-ins. The power modules provide power to the drive plug-ins through power lines. The drive plug-ins control the start and stop of the power modules according to the signal terminals, and provide stable power to the outside world based on the load terminals connected to the power modules.

[0078] It should be noted that the main power supply line adopts a three-phase five-wire copper busbar, and the drive plug-in adopts an aviation plug-in structure; the power module line adopts a three-phase five-wire copper busbar to the power supply line, and the copper busbar is isolated and protected by acrylic sheet.

[0079] In the present invention, the reliability evaluation method is specifically as follows:

[0080] Step S1: collecting rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in a target switch cabinet.

[0081] Step S2: performing an electric variable protection test on each set of driver plug-ins in the target switch cabinet to obtain the electric variable protection test results of the corresponding driver plug-ins;

[0082] Among them, the electrical variable protection test includes overcurrent protection test and overvoltage protection test

[0083] In this embodiment, the test process of the overcurrent protection test is as follows:

[0084] Step S211: Select any group of driver plug-ins as test driver plug-ins, obtain the rated current values corresponding to the test driver plug-ins, and set the steady-state overcurrent test current value and the instantaneous overcurrent test current value of the corresponding driver plug-ins based on the rated current values;

[0085] Specifically, the steady-state overcurrent test current value may be 1.5 times the corresponding rated current value of the test driver plug-in, and the instantaneous overcurrent test current value may be 10 times the corresponding rated current value of the test driver plug-in;

[0086] Step S212: Connect the output end of the high current generator to the load terminal of the test driver plug-in, and set the current waveform (such as a 50 Hz sine wave) of the steady-state overcurrent test current value;

[0087] Step S213: continuously sending an alternating current having a value equal to the steady-state overcurrent test current value to the test driver plug-in, and recording the corresponding time as the steady-state test initial time; measuring the circuit-breaking time of the test driver plug-in, and obtaining the steady-state test response time of the corresponding test driver plug-in by subtracting the steady-state test initial time from the circuit-breaking time;

[0088] The circuit breaker time is the time when the circuit breaker in the target switch cabinet starts to work. The circuit breaker is an automatic protective device used to cut off the circuit when the circuit is overloaded to prevent equipment damage.

[0089] Step S214: providing an alternating current having a value of an instantaneous overcurrent test current to the test driver plug-in through a high current generator; obtaining an instantaneous test response time by subtracting the current injection time from the circuit breaking time;

[0090] Step S215, calculating the steady-state test duration threshold WYZ and the instantaneous test duration threshold SYZ of the test driver plug-in by using a formula;

[0091] The calculation formula for the steady-state test duration threshold is as follows:

[0092] Where K is the time constant, WDL is the steady-state overcurrent test current value of the test driver plug-in, EDL is the rated current value of the test driver plug-in, and a is the curve type coefficient, which is usually 0.02.

[0093] The calculation formula for the instantaneous test duration threshold is as follows:

[0094] Where SDL is the instantaneous overcurrent test current value of the test driver plug-in, and b is the curve type coefficient, which is usually 1.

[0095] Step S216: Compare the steady-state test response time of the test driver plug-in with the steady-state test response time threshold. If the steady-state test response time is greater than or equal to the steady-state test response time threshold, an abnormal signal is generated. If the steady-state test response time is less than the steady-state test response time threshold, a steady-state current response difference is obtained by subtracting the steady-state test response time from the steady-state test response time threshold. The larger the steady-state current response difference, the more effective the test driver plug-in is in responding to the steady-state overcurrent condition.

[0096] Step S217: Compare the transient test response time of the test driver plug-in with the transient test response time threshold. If the transient test response time is greater than or equal to the transient test response time threshold, an abnormal signal is generated. If the transient test response time is less than the transient test response time threshold, the transient current response difference is obtained by subtracting the transient test response time from the transient test response time threshold. The larger the transient current response difference, the more effective the test driver plug-in is in responding to transient overcurrent conditions.

[0097] Step S218: Calculate the current test score DLF corresponding to the test driver plug-in. The specific formula is as follows:

[0098] DLF=A1×SDL+A2×WDL; where SDL is the instantaneous current response difference, WDL is the steady-state current response difference, and A1 and A2 are fixed weight coefficients. The larger the current test score, the better the corresponding driver plug-in responds to overcurrent testing.

[0099] In step S219, similarly, the current test score values of all driver plug-ins are obtained.

[0100] In this embodiment, the test process of the overvoltage protection test is as follows:

[0101] Step S221, obtaining a rated voltage value corresponding to the test driver plug-in, and setting a steady-state overvoltage test voltage value and a transient overvoltage test voltage value of the test driver plug-in based on the rated voltage value; and also setting a steady-state ramp rate of the steady-state overvoltage test voltage value;

[0102] Among them, the transient overvoltage test voltage value> the steady-state overvoltage test voltage value> the rated voltage value;

[0103] Step S222: Connect the input terminal of the programmable power supply to the test drive plug-in to provide the test drive plug-in with a voltage having a rated voltage value;

[0104] Step S223: The voltage of the programmable power supply input is increased based on the steady-state ramp rate until it reaches the steady-state overvoltage test voltage value. The time when the voltage ramp begins is recorded as the voltage steady-state initial time. If the test driver plug-in has not tripped when the steady-state overvoltage test voltage value is reached, an abnormal signal is generated.

[0105] In step S224, if the test driver module trips before reaching the steady-state overvoltage test voltage value, the tripping time is recorded. The voltage change duration is obtained by subtracting the voltage steady-state initial time from the tripping time. The voltage change duration is multiplied by the steady-state ramp rate, and then added to the rated voltage value to obtain the actual tripping voltage of the test driver module.

[0106] Step S225: The actual trip voltage is compared with a preset trip voltage range. If the actual trip voltage is within the preset trip voltage range, the absolute value of the difference between the actual trip voltage and the midpoint of the preset trip voltage range is calculated and recorded as the steady-state voltage deviation value. If the actual trip voltage is outside the preset trip voltage range, an abnormality signal is generated. The smaller the steady-state voltage deviation value, the more accurate the test driver plug-in's response to a steady-state overvoltage condition.

[0107] Specifically, the left endpoint of the preset circuit breaker voltage interval may be 0.9 times the preset circuit breaker voltage, and the right endpoint of the preset circuit breaker voltage interval may be 1.1 times the preset circuit breaker voltage; the preset circuit breaker voltage is a pre-set value, and when the voltage of the voltage circuit reaches the corresponding value, the circuit is automatically disconnected;

[0108] Step S226, directly inputting a voltage corresponding to a transient overvoltage test voltage value to the test driver plug-in via the programmable power supply, and recording the transient voltage response time from the input voltage value to the circuit breaking;

[0109] Step S227: compare the voltage transient response time with the voltage transient response time threshold.

[0110] If the voltage transient response time is greater than or equal to the voltage transient response time threshold, an abnormal signal is generated. If the voltage transient response time is less than the voltage transient response time threshold, the voltage transient response deviation value is obtained by subtracting the voltage transient response time from the voltage transient response time threshold. The larger the voltage transient response time deviation value, the more timely the test driver plug-in handles the transient overvoltage condition.

[0111] The voltage transient response time threshold is a pre-set parameter, usually set to 200 milliseconds.

[0112] Step S228: Calculate the voltage test score DYF of the test driver plug-in. The formula is as follows:

[0113] DYF = B1 × SDY + B2 × e / WDY; where SDY is the voltage transient response time deviation, WDY is the steady-state voltage deviation, e is a natural constant, and B1 and B2 are fixed-value weight coefficients. The larger the voltage test score, the better the corresponding driver plug-in responds to overvoltage testing.

[0114] In step S229, the voltage test scores of all driver plug-ins are calculated similarly.

[0115] Step S3, performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain an over-temperature test result of the corresponding power module;

[0116] In this embodiment, step S3 includes the following sub-steps:

[0117] Step S31, obtaining the rated power of multiple groups of power modules, and recording any group of power modules as a test power module;

[0118] Step S32: The test power module transmits current at rated power and sets a steady-state heating rate; specifically, the steady-state heating rate may be 1°C / min;

[0119] Step S33, increasing the temperature of the test power module at a steady-state heating rate until the test power module is disconnected, and recording the disconnection temperature value at the disconnection moment;

[0120] Step S34: Compare the trip temperature value with the trip temperature threshold. If the trip temperature value is less than the trip temperature threshold, an abnormal signal is generated. If the trip temperature value is greater than or equal to the trip temperature threshold, a trip temperature deviation value is obtained by subtracting the trip temperature threshold from the trip temperature value. The larger the trip temperature deviation value, the better the high temperature resistance of the power module.

[0121] Step S35, recording the actual current value at all times between the heating time and the circuit breaking time; wherein the heating time is the time when the test power module starts to increase the temperature at a steady-state heating rate;

[0122] Step S36: Subtract the rated current value of the tested power module from the actual current value at any moment and take the absolute value to obtain the current deviation value at the corresponding moment. The current deviation values at all moments are summed to obtain the total current deviation value of the tested power module. The larger the total current deviation value, the more unstable the current output by the power module.

[0123] Step S37: Calculate the over-temperature test score of the power module using the formula:

[0124] The overtemperature test score = the circuit breaker temperature deviation value divided by the total current deviation value. The larger the overtemperature test score, the better the test strategy module responds to the overtemperature test.

[0125] In step S38, the over-temperature test scores of all power modules are calculated similarly.

[0126] Step S4, performing a phase loss protection test on the target switchgear to obtain a phase loss test result corresponding to the target switchgear;

[0127] In this embodiment, the process of the phase loss protection test is as follows:

[0128] Step S41: Connect a three-phase power supply to the three-phase connection of the target switchgear, adjust it to the test voltage, and record the three-phase power in order as phase A, phase B, and phase C; record the real-time voltage and real-time current values of each phase;

[0129] Step S42: Calculate the calculated voltage and current values for phases A, B, and C; compare the calculated voltage value of each phase with the real-time voltage value, and compare the calculated current value with the real-time current value; if any of the values differ, generate an abnormal signal; if all the values are the same, proceed to the subsequent steps;

[0130] The calculation method for the calculated voltage and current values of phases A, B, and C depends on the three-phase power connection method. Specifically, if the three-phase power connection method is star connection, the calculated voltage value of each phase is three times the root of one-third of the line voltage; the calculated current value of each phase is the same as the line current.

[0131] If the three-phase power connection is a delta connection, the calculated voltage value of each phase is the same as the line voltage, and the calculated current value of each phase is three times the root of one-third of the line current;

[0132] The line current and line voltage are the current and voltage values flowing through the power supply line;

[0133] Step S42: disconnect the A phase power and record the A phase failure response time from the time when the A phase power is disconnected to the time when the target switch cabinet is disconnected;

[0134] Step S43: Connect phase A, disconnect phase B, and record the phase B failure response time from the time phase B is disconnected to the time the target switch cabinet is disconnected. Connect phase B, disconnect phase C, and record the phase A failure response time, phase B failure response time, and phase C failure response time from the time phase C is disconnected to the time the target switch cabinet is disconnected. Step S44: Connect phase B, disconnect phase C, and record the phase A failure response time, phase B failure response time, and phase C failure response time from the time phase C is disconnected to the time the target switch cabinet is disconnected.

[0135] The maximum value of the phase response time is compared with the phase loss reaction time threshold; if the maximum value is greater than or equal to the phase loss reaction time threshold, an abnormal signal is generated; if the maximum value is less than the phase loss reaction time threshold, the target switchgear is recorded as a normal phase loss test.

[0136] Step S5: integrating all test results corresponding to the target switchgear and evaluating the reliability of the target switchgear based on the test results;

[0137] In this embodiment, step S5 includes the following sub-steps:

[0138] Step S51, obtaining the phase loss test result, over-temperature test result, over-voltage test result and over-current test result of the target switchgear;

[0139] Step S52: Compare the voltage test scores of all driver plug-ins with the corresponding voltage test score thresholds. If the voltage test score of any driver plug-in is less than the voltage test score threshold, an abnormal signal is generated.

[0140] If the voltage test score values of all driver plug-ins are greater than or equal to the voltage test score threshold, the target switchgear is marked as having passed the overvoltage test normally;

[0141] Step S53: comparing the current test scores of all driver plug-ins with corresponding current score thresholds. If the current test score of any driver plug-in is less than the current test score threshold, an abnormal signal is generated.

[0142] If the current test score values of all driver plug-ins are greater than or equal to the current test score threshold, the target switchgear is marked as having passed the overcurrent test normally;

[0143] Step S54: comparing the over-temperature test score values of all power modules with corresponding over-temperature test score thresholds. If the over-temperature test score value of any power module is less than the over-temperature test score threshold, an abnormal signal is generated.

[0144] If the over-temperature test scores of all power modules are greater than or equal to the over-temperature test score threshold, the target switchgear is marked as having passed the over-temperature test normally.

[0145] Step S55: If any test result is an abnormal signal, the reliability of the target switchgear is recorded as abnormal;

[0146] If all test results of the target switchgear are normal, the reliability of the target switchgear is recorded as normal.

[0147] In this application, if a corresponding calculation formula appears, the above calculation formula is dimensionless and its numerical calculation is performed. The weight coefficient, proportional coefficient and other coefficients in the formula are set to a result value obtained by quantifying each parameter. Regarding the size of the weight coefficient and the proportional coefficient, as long as it does not affect the proportional relationship between the parameter and the result value, it is acceptable.

[0148] Example 2, Figure 3 This is a schematic diagram of the structure of a computer device, which may include: a processor, a communications interface, a memory, and a communications bus, wherein the processor, the communications interface, and the memory communicate with each other via the communications bus. The processor can call logic instructions in the memory to execute a method for evaluating the operational reliability of a switchgear. The method includes: collecting rated voltage and rated current values of multiple groups of driver plug-ins and power modules in a target switchgear; performing an electrical variable protection test on each group of driver plug-ins in the target switchgear to obtain the electrical variable protection test results of the corresponding driver plug-ins; performing an overtemperature protection test on each group of power modules in the target switchgear to obtain the overtemperature test results of the corresponding power modules; performing a phase loss protection test on the target switchgear to obtain the phase loss test results corresponding to the target switchgear; and integrating all test results corresponding to the target switchgear to evaluate the reliability of the target switchgear based on the test results.

[0149] In addition, the logical instructions in the above-mentioned memory can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application, or the part that contributes to the existing technology, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, and other media that can store program code.

[0150] On the other hand, the present application also provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute a switch cabinet operation reliability assessment method provided by the above methods, the method including: collecting the rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in the target switch cabinet; performing an electrical variable protection test on each group of drive plug-ins in the target switch cabinet to obtain the electrical variable protection test results of the corresponding drive plug-ins; performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain the over-temperature test results of the corresponding power modules; performing a phase loss protection test on the target switch cabinet to obtain the phase loss test results corresponding to the target switch cabinet; integrating all the test results corresponding to the target switch cabinet, and evaluating the reliability of the target switch cabinet based on the test results.

[0151] On the other hand, the present application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute a switch cabinet operation reliability assessment method provided above, the method comprising: collecting the rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in the target switch cabinet; performing an electrical variable protection test on each group of drive plug-ins in the target switch cabinet to obtain the electrical variable protection test results of the corresponding drive plug-ins; performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain the over-temperature test results of the corresponding power modules; performing a phase loss protection test on the target switch cabinet to obtain the phase loss test results corresponding to the target switch cabinet; integrating all the test results corresponding to the target switch cabinet, and evaluating the reliability of the target switch cabinet based on the test results.

[0152] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0153] Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented using software plus a necessary general-purpose hardware platform, or of course, hardware. Based on this understanding, the essence of the above technical solution, or the portion that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, or an optical disk, and includes a number of instructions for causing a computer device (such as a personal computer, server, or network device) to execute the methods described in each embodiment or certain portions of the embodiments.

[0154] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A switchgear operation reliability evaluation method, characterized in that: Methods include: Step S1, collecting rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in the target switch cabinet; Step S2: Perform an electrical variable protection test on each set of driver plug-ins in the target switch cabinet to obtain the electrical variable protection test results of the corresponding driver plug-ins; wherein the electrical variable protection test includes an overcurrent protection test and an overvoltage protection test; Step S3, performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain an over-temperature test result of the corresponding power module; Step S4, performing a phase loss protection test on the target switchgear to obtain a phase loss test result corresponding to the target switchgear; The specific process of the phase loss protection test is as follows: Step S41: Connect a three-phase power supply to the three-phase connection of the target switchgear, adjust it to the test voltage, and record the three-phase power in order as phase A, phase B, and phase C; record the real-time voltage and real-time current values of each phase; Step S42: Calculate the calculated voltage and current values for phases A, B, and C; compare the calculated voltage value of each phase with the real-time voltage value, and compare the calculated current value with the real-time current value; if any of the values differ, generate an abnormal signal; if all the values are the same, proceed to the subsequent steps; Step S42: disconnect the A phase power and record the A phase failure response time from the time when the A phase power is disconnected to the time when the target switch cabinet is disconnected; Step S43: Connect phase A, disconnect phase B, and record the phase B failure response time from the time phase B is disconnected to the time the target switch cabinet is disconnected. Connect phase B, disconnect phase C, and record the phase A failure response time, phase B failure response time, and phase C failure response time from the time phase C is disconnected to the time the target switch cabinet is disconnected. Step S44: Connect phase B, disconnect phase C, and record the phase A failure response time, phase B failure response time, and phase C failure response time from the time phase C is disconnected to the time the target switch cabinet is disconnected. The maximum value of the phase response time is compared with the phase loss response time threshold. If the maximum value is greater than or equal to the phase loss response time threshold, an abnormal signal is generated. If the maximum value is less than the phase loss response time threshold, the target switchgear is marked as having passed the phase loss test normally. Step S5: Integrate all test results corresponding to the target switchgear and evaluate the reliability of the target switchgear based on the test results.

2. A switchgear operation reliability evaluation method according to claim 1, characterized in that: The test process of the overcurrent protection test is as follows: Step S211: Select any group of driver plug-ins as test driver plug-ins, obtain the rated current values corresponding to the test driver plug-ins, and set the steady-state overcurrent test current value and the instantaneous overcurrent test current value of the corresponding driver plug-ins based on the rated current values; Step S212, connecting the output end of the high current generator to the load terminal of the test drive plug-in, and setting the current waveform of the steady-state overcurrent test current value; Step S213: continuously sending an alternating current having a value equal to the steady-state overcurrent test current value to the test driver plug-in, and recording the corresponding time as the steady-state test initial time; measuring the circuit-breaking time of the test driver plug-in, and obtaining the steady-state test response time of the corresponding test driver plug-in by subtracting the steady-state test initial time from the circuit-breaking time; Step S214: providing an alternating current having a value of an instantaneous overcurrent test current to the test driver plug-in through a large current generator; and obtaining an instantaneous test response time by subtracting the current injection time from the circuit breaking time.

3. A switchgear operation reliability evaluation method according to claim 2, characterized in that: The test process of the overcurrent protection test also includes: Step S215, calculating the steady-state test duration threshold WYZ and the instantaneous test duration threshold SYZ of the test driver plug-in by using a formula; Step S216: Compare the steady-state test response time of the test driver plug-in with the steady-state test response time threshold. If the steady-state test response time is greater than or equal to the steady-state test response time threshold, generate an abnormal signal; if the steady-state test response time is less than the steady-state test response time threshold, obtain a steady-state current response difference by subtracting the steady-state test response time from the steady-state test response time threshold. Step S217: Compare the transient test response time of the test driver plug-in with the transient test response time threshold. If the transient test response time is greater than or equal to the transient test response time threshold, generate an abnormal signal; if the transient test response time is less than the transient test response time threshold, subtract the transient test response time from the transient test response time threshold to obtain the transient current response difference. Step S218: Calculate the current test score DLF corresponding to the test driver plug-in. The specific formula is as follows: DLF=A1×SDL+A2×WDL; where SDL is the instantaneous current response difference, WDL is the steady-state current response difference, and A1 and A2 are fixed-value weight coefficients; In step S219, similarly, the current test score values of all driver plug-ins are obtained.

4. A switchgear operation reliability evaluation method according to claim 3, characterized in that: The calculation formula of the steady-state test duration threshold is as follows: Where K is the time constant, WDL is the steady-state overcurrent test current value of the test drive plug-in, EDL is the rated current value of the test drive plug-in, and a is the curve type coefficient; The calculation formula for the instantaneous test duration threshold is as follows: Where SDL is the instantaneous overcurrent test current value of the test driver plug-in, and b is the curve type coefficient.

5. A switchgear operation reliability evaluation method according to claim 2, characterized in that: The test process of the overvoltage protection test is as follows: Step S221, obtaining a rated voltage value corresponding to the test driver plug-in, and setting a steady-state overvoltage test voltage value and a transient overvoltage test voltage value of the test driver plug-in based on the rated voltage value; and also setting a steady-state ramp rate of the steady-state overvoltage test voltage value; Among them, the transient overvoltage test voltage value> the steady-state overvoltage test voltage value> the rated voltage value; Step S222: Connect the input terminal of the programmable power supply to the test drive plug-in to provide the test drive plug-in with a voltage having a rated voltage value; Step S223: The voltage of the programmable power supply input is increased based on the steady-state ramp rate until it reaches the steady-state overvoltage test voltage value. The time when the voltage ramp begins is recorded as the voltage steady-state initial time. If the test driver plug-in has not tripped when the steady-state overvoltage test voltage value is reached, an abnormal signal is generated. In step S224, if the test driver plug-in is disconnected before reaching the steady-state overvoltage test voltage value, the disconnection time is recorded, and the voltage change duration is obtained by subtracting the voltage steady-state initial time from the disconnection time; the voltage change duration is multiplied by the steady-state climbing rate and then added to the rated voltage value to obtain the actual disconnection voltage of the test driver plug-in.

6. A switchgear operation reliability evaluation method according to claim 5, characterized in that: The test process of the overvoltage protection test also includes: Step S225: Compare the actual trip voltage with the preset trip voltage interval. If the actual trip voltage is within the preset trip voltage interval, calculate the absolute value of the difference between the actual trip voltage and the midpoint of the preset trip voltage interval and record it as the steady-state voltage deviation value; if the actual trip voltage is outside the preset trip voltage interval, generate an abnormal signal; Step S226, directly inputting a voltage corresponding to a transient overvoltage test voltage value to the test driver plug-in via the programmable power supply, and recording the transient voltage response time from the input voltage value to the circuit breaking; Step S227: compare the voltage transient response time with the voltage transient response time threshold. If the voltage transient reaction time is greater than or equal to the voltage transient reaction time threshold, an abnormal signal is generated; if the voltage transient reaction time is less than the voltage transient reaction time threshold, the voltage transient reaction deviation value is obtained by subtracting the voltage transient reaction time from the voltage transient reaction time threshold. Step S228: Calculate the voltage test score DYF of the test driver plug-in. The formula is as follows: DYF = B1 × SDY + B2 × e / WDY; where SDY is the voltage transient response time deviation, WDY is the steady-state voltage deviation, e is a natural constant, and B1 and B2 are fixed-value weight coefficients. In step S229, the voltage test scores of all driver plug-ins are calculated similarly.

7. A switchgear operation reliability evaluation method according to claim 1, characterized in that: The test process of the over-temperature protection test is as follows: Step S31, obtaining the rated power of multiple groups of power modules, and recording any group of power modules as a test power module; Step S32, transmitting current to the test power module at rated power and setting a steady-state heating rate; Step S33, increasing the temperature of the test power module at a steady-state heating rate until the test power module is disconnected, and recording the disconnection temperature value at the disconnection moment; Step S34, comparing the circuit breaker temperature value with the circuit breaker temperature threshold. If the circuit breaker temperature value is less than the circuit breaker temperature threshold, an abnormal signal is generated. If the circuit breaker temperature value is greater than or equal to the circuit breaker temperature threshold, a circuit breaker temperature deviation value is obtained by subtracting the circuit breaker temperature threshold from the circuit breaker temperature value.

8. A switchgear operation reliability evaluation method according to claim 7, characterized in that: The over-temperature protection test further includes the following sub-steps: Step S35, recording the actual current value at all times between the heating time and the circuit breaking time; wherein the heating time is the time when the test power module starts to increase the temperature at a steady-state heating rate; Step S36: Subtract the rated current value of the tested power module from the actual current value at any moment and take the absolute value to obtain the current deviation value at the corresponding moment. The current deviation values at all moments are added together to obtain the total current deviation value of the tested power module. Step S37: Calculate the over-temperature test score of the power module using the formula: Overtemperature test score = circuit breaker temperature deviation ÷ total current deviation; In step S38, the over-temperature test scores of all power modules are calculated similarly.

9. A switchgear operation reliability evaluation method according to claim 1, characterized in that: The step S5 includes the following sub-steps: Step S51, obtaining the phase loss test result, over-temperature test result, over-voltage test result and over-current test result of the target switchgear; Step S52: Compare the voltage test scores of all driver plug-ins with the corresponding voltage test score thresholds. If the voltage test score of any driver plug-in is less than the voltage test score threshold, an abnormal signal is generated. If the voltage test score values of all driver plug-ins are greater than or equal to the voltage test score threshold, the target switchgear is marked as having passed the overvoltage test normally; Step S53: comparing the current test scores of all driver plug-ins with corresponding current score thresholds. If the current test score of any driver plug-in is less than the current test score threshold, an abnormal signal is generated. If the current test score values of all driver plug-ins are greater than or equal to the current test score threshold, the target switchgear is marked as having passed the overcurrent test normally; Step S54: comparing the over-temperature test score values of all power modules with corresponding over-temperature test score thresholds. If the over-temperature test score value of any power module is less than the over-temperature test score threshold, an abnormal signal is generated. If the over-temperature test scores of all power modules are greater than or equal to the over-temperature test score threshold, the target switchgear is marked as having passed the over-temperature test normally. Step S55: If any test result is an abnormal signal, the reliability of the target switchgear is recorded as abnormal; If all test results of the target switchgear are normal, the reliability of the target switchgear is recorded as normal.

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