Measurement method and device, terminal and computer readable storage medium

Abstract

The invention discloses a measurement method and device and a terminal, and the method comprises the steps that the terminal carries out L1 measurement, and the measurement time delay of the L1 measurement is related to a first factor and / or the number of frequency points; and / or, the terminal performs measurement in a first mode or a second mode, and the measurement comprises L1 measurement and / or L3 measurement; wherein, corresponding to the first mode, the measurement time delay of the L1 measurement is related to the number of cells measured by the L1 and a second factor, and / or the measurement time delay of the L3 measurement is related to the number of cells measured by the L1 and a third factor; corresponding to the second mode, the measurement time delay of the L1 measurement is related to the number of cells measured by the L1 and the number of frequency points measured by the L3, and / or the measurement time delay of the L3 measurement is related to the number of cells measured by the L1 and the number of frequency points measured by the L3.

Description

Technical Field

[0001] This application relates to the field of wireless technologies, and in particular, to a measurement method and apparatus, a terminal, and a computer-readable storage medium. Background Art

[0002] For a wireless mobile communication system, accurate measurement of cell quality and beam quality is the basis for its effective implementation of radio resource management and mobility management. Due to the limitation of the terminal's processing capacity, it is generally considered that the terminal can only receive or measure signals in one beam direction at a time; since the incoming wave directions of different cells are different, the terminal cannot simultaneously receive or measure signals of multiple different cells, which leads to a competition problem for different measurements with overlapping measurement resources. For example: Layer 1 (L1) measurements of different cells cannot be performed simultaneously, Layer 3 (L3) measurements and L1 measurements cannot be performed simultaneously, etc. The terminal cannot determine how to allocate measurements among these measurement scenarios where measurements cannot be performed simultaneously, and thus cannot determine the measurement delay, resulting in the inability of the network to schedule. Summary of the Invention

[0003] To solve the above technical problems, embodiments of this application provide a measurement method and apparatus, a terminal, a chip, and a computer-readable storage medium.

[0004] The measurement method provided by the embodiments of this application includes:

[0005] The terminal performs L1 measurement, and the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points; and / or,

[0006] The terminal performs measurement by a first method or a second method, and the measurement includes L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

[0007] The measurement apparatus provided by the embodiments of this application is applied to a terminal, and the apparatus includes:

[0008] A measurement unit for performing L1 measurements, where the measurement delay of the L1 measurements is related to a first factor and / or the number of frequency points; and / or, measurements are performed by a first method or a second method, where the measurements include L1 measurements and / or L3 measurements; wherein, corresponding to the first method, the measurement delay of the L1 measurements is related to the number of cells of the L1 measurements and a second factor, and / or the measurement delay of the L3 measurements is related to the number of cells of the L1 measurements and a third factor; corresponding to the second method, the measurement delay of the L1 measurements is related to the number of cells of the L1 measurements and the number of frequency points of the L3 measurements, and / or the measurement delay of the L3 measurements is related to the number of cells of the L1 measurements and the number of frequency points of the L3 measurements.

[0009] The terminal provided by an embodiment of this application includes: a processor and a memory. The memory is used to store a computer program, and the processor is used to call and run the computer program stored in the memory to execute any one of the above measurement methods.

[0010] The chip provided by an embodiment of this application includes: a processor for calling and running a computer program from a memory, so that a device installed with the chip executes any one of the above measurement methods.

[0011] The computer-readable storage medium provided by an embodiment of this application is used to store a computer program, and the computer program enables a computer to execute any one of the above measurement methods.

[0012] The technical solution of the embodiment of this application can clarify the measurement delay of the L1 measurements and the measurement delay of the L3 measurements by performing measurement allocation for the L1 measurements between different cells and performing measurement allocation for the L3 measurements and the L1 measurements, providing a basis for network scheduling. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 is a schematic diagram of an application scenario of an embodiment of this application;

[0014] Figure 2 is a schematic flowchart of the measurement method provided by an embodiment of this application;

[0015] Figure 3 is a schematic diagram of a measurement object provided by an embodiment of this application Figure 1 ;

[0016] Figure 4 is a schematic diagram of a measurement object provided by an embodiment of this application Figure 2 ;

[0017] Figure 5 is a schematic diagram of a measurement object provided by an embodiment of this application Figure 3 ;

[0018] Figure 6 It is a schematic diagram of the measurement object provided by the embodiment of the present application Figure 4 ;

[0019] Figure 7 It is a schematic structural composition diagram of the measurement device provided by the embodiment of the present application;

[0020] Figure 8 It is a schematic structural diagram of a communication device provided by the embodiment of the present application;

[0021] Figure 9 It is a schematic structural diagram of the chip of the embodiment of the present application. Specific embodiments

[0022] Next, the technical solutions in the embodiments of the present application will be described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0023] Figure 1 It is a schematic diagram of an application scenario of the embodiment of the present application.

[0024] As Figure 1 shown, the communication system 100 may include a terminal 110 and a network device 120. The network device 120 may communicate with the terminal 110 through the air interface.

[0025] It should be understood that the embodiments of the present application are only exemplified by the communication system 100, but the embodiments of the present application are not limited thereto. That is to say, the technical solutions of the embodiments of the present application can be applied to various communication systems, such as: 5G communication systems (also known as New Radio (NR) communication systems), or future communication systems, etc.

[0026] In Figure 1 the shown communication system 100, the network device 120 may be an access network device that communicates with the terminal 110. The access network device may provide communication coverage for a specific geographical area and may communicate with the terminal 110 (such as a UE) located within the coverage area.

[0027] The network device 120 may be a base station (gNB) in the NR system or a network device in a future evolved Public Land Mobile Network (PLMN), etc.

[0028] The terminal 110 can be any terminal. For example, the terminal 110 can refer to an access terminal, a user equipment (UE), a user unit, a user station, a mobile station, a mobile terminal, a remote station, a remote terminal, a mobile device, a user terminal, a terminal, a wireless communication device, a user agent, or a user device. The access terminal can be a cellular phone, a cordless phone, a Session Initiation Protocol (SIP) phone, an IoT device, a satellite handheld terminal, a Wireless Local Loop (WLL) station, a Personal Digital Assistant (PDA), a handheld device with wireless communication capabilities, a computing device, or other processing devices connected to a wireless modem, a vehicle-mounted device, a wearable device, a terminal in a 5G network, or a terminal in a future evolved network, etc.

[0029] Figure 1 Exemplarily, a base station and two terminals are shown. Optionally, the wireless communication system 100 may include multiple base station devices, and the coverage range of each base station may include other numbers of terminals. The embodiments of the present application do not limit this.

[0030] It should be noted that Figure 1This is only an example to illustrate the system applicable to the present application. Of course, the method shown in the embodiments of the present application can also be applicable to other systems. In addition, the terms "system" and "network" are often used interchangeably in this article. The term "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this article generally represents an "or" relationship between the associated objects before and after. It should also be understood that the "indication" mentioned in the embodiments of the present application can be a direct indication, an indirect indication, or a representation of an association relationship. For example, A indicates B, which can mean that A directly indicates B. For example, B can be obtained through A; it can also mean that A indirectly indicates B. For example, A indicates C, and B can be obtained through C; it can also mean that there is an association relationship between A and B. It should also be understood that the "correspondence" mentioned in the embodiments of the present application can represent a direct or indirect correspondence relationship between the two, or can represent an association relationship between the two, or can also be an indication and being indicated, configuration and being configured, etc. relationships. It should also be understood that the "predefined" or "predefined rule" mentioned in the embodiments of the present application can be implemented by pre-saving corresponding codes, tables or other means that can be used to indicate relevant information in devices (such as including terminals and network devices). The present application does not limit its specific implementation method. For example, predefined can refer to that defined in the protocol. It should also be understood that in the embodiments of the present application, the "protocol" can refer to the standard protocol in the communication field, such as including the NR protocol and related protocols applied to future communication systems. The present application does not limit this.

[0031] To facilitate the understanding of the technical solutions of the embodiments of the present application, the related technologies of the embodiments of the present application are described below. The following related technologies can be arbitrarily combined with the technical solutions of the embodiments of the present application as optional solutions, and they all fall within the protection scope of the embodiments of the present application.

[0032] For 5G NR, currently two major categories of reference signals are mainly considered as measurement reference signals, namely the synchronization signal and the physical broadcast channel block (Synchronization Signal / PBCH Block, SSB) and the channel state information reference signal (Channel-state information, CSI-RS).

[0033] For SSB-based measurements, the network configures the measurement resources of SSB for the terminal through higher-layer signaling for the terminal to perform corresponding measurement operations. Exemplarily, the measurement configuration of SSB includes: SSB frequency point, SSB subcarrier spacing, SSB measurement timing configuration (SMTC), reference signal configuration, etc. Among them, the SSB frequency point is the center frequency point of the SSB to be measured. The SSB subcarrier spacing is the subcarrier spacing of the SSB to be measured. The SMTC configuration is the time-domain resource configuration information for SSB measurement, which is mainly used to configure a set of measurement time windows (referred to as SMTC windows) for SSB-based measurements. The SSB configuration may further include the ssb-ToMeasure, etc. The ssb-ToMeasure uses a bitmap to indicate the location information of the actually transmitted SSB in the SSB burst set. The terminal can clearly know which SSB candidate positions actually transmit SSB and which SSB candidate positions do not transmit SSB through the ssb-ToMeasure. The terminal does not need to perform measurements at positions where SSB is not transmitted, thus achieving energy saving for the terminal.

[0034] SSB includes a Primary Synchronisation Signal (PSS), a Secondary Synchronisation Signal (SSS), and a Physical Broadcast Channel (PBCH). The frequency-domain resources of SSB occupy 20 RBs. In the FR1 frequency band, the subcarrier spacing of SSB is 15 kHz or 30 kHz. In the FR2 frequency band, the subcarrier spacing of SSB is 60 kHz or 120 kHz. The bandwidth corresponding to the frequency-domain resources of SSB is related to the number of RBs it occupies and the subcarrier spacing. Specifically, the bandwidth corresponding to the frequency-domain resources of SSB = the number of RBs occupied by the frequency-domain resources of SSB × the subcarrier spacing of SSB × 12. For example: taking the subcarrier spacing of SSB as 15 kHz as an example, the bandwidth corresponding to the frequency-domain resources of SSB is 3.6 MHz. Another example: taking the subcarrier spacing of SSB as 30 kHz as an example, the bandwidth corresponding to the frequency-domain resources of SSB is 7.2 MHz.

[0035] SSBs appear periodically in the time domain in the form of SSB burst sets, and each SSB burst set can contain one or more SSBs. The terminal performs SSB measurements within the SMTC window, which appears periodically in the time domain. Exemplarily, taking each SSB burst set containing 8 SSBs as an example, the SSB transmission period is the time interval between two adjacent SSBs with the same SSB index. The SSB transmission period, the SMTC window size, and the SMTC window period are all adjustable.

[0036] For CSI-RS based measurements, the network configures one or more CSI-RS resources through higher layer signaling for the terminal to perform measurements. Specifically, first, at the cell level, the higher layer signaling configures cell-level CSI-RS configuration parameters, such as cell ID, the measurement bandwidth of the cell, the measurement density, the measurement resource list, and other information. In addition, since multiple CSI-RS resources can be configured for each cell, the higher layer signaling further configures the configuration information for each CSI-RS resource level, such as the CSI-RS index of the CSI-RS resource, the time domain and / or frequency domain resource information occupied by the CSI-RS resource, the sequence generation method, etc.

[0037] Exemplarily, the configuration information of CSI-RS can include the content shown in Table 1 below:

[0038]

[0039] Table 1

[0040] Among them, subcarrierSpacing is used to configure the subcarrier spacing of CSI-RS. nrofPRBs is used to configure the number of RBs occupied by the frequency-domain resource of CSI-RS. startPRB is used to configure the starting RB occupied by the frequency-domain resource of CSI-RS. In the FR1 frequency band, the candidate values for the subcarrier spacing of CSI-RS are: 15 kHz, 30 kHz, 60 kHz, and the candidate values for the number of RBs occupied by the frequency-domain resource of CSI-RS are: 24, 48, 96, 192, 264. In the FR2 frequency band, the candidate values for the subcarrier spacing of CSI-RS are: 60 kHz, 120 kHz, and the candidate values for the number of RBs occupied by the frequency-domain resource of CSI-RS are: 24, 48, 96, 192, 264. The bandwidth corresponding to the frequency-domain resource of CSI-RS is related to the number of RBs it occupies and the subcarrier spacing. Specifically, the bandwidth corresponding to the frequency-domain resource of CSI-RS = the number of RBs occupied by the frequency-domain resource of CSI-RS × the subcarrier spacing of CSI-RS × 12. For example: taking the number of RBs occupied by the frequency-domain resource of CSI-RS as 24 and the subcarrier spacing of CSI-RS as 15 kHz as an example, the bandwidth corresponding to the frequency-domain resource of CSI-RS is 4.32 MHz.

[0041] In the above solution, the frequency band range corresponding to the FR1 frequency band can be 410 MHz to 7.125 GHz, and the frequency band range corresponding to the FR2 frequency band can be 24.25 GHz to 52.6 GHz. Of course, the frequency band ranges corresponding to the FR1 frequency band and the FR2 frequency band can also be adjusted.

[0042] When the terminal performs adjacent frequency / adjacent cell measurement, it usually needs a measurement gap (MG). During the duration of the measurement gap, the terminal disconnects from the current serving frequency point and tunes to the frequency point of the measurement reference signal for measurement. The measurement gap is configured by the network through higher layer signaling, and the measurement gap configuration includes the measurement gap period, the measurement gap length, and the measurement gap offset. During the duration of a certain measurement gap, the terminal can only tune to one frequency point for measurement of that frequency point. If there are multiple frequency points to be measured, then these frequency points need to compete for this measurement gap. It should be noted that the measurement gap can also be simply referred to as a gap.

[0043] In mobility management, first, the network triggers the terminal to perform handover to a target cell based on the L3 measurement results reported by the terminal; then, based on the L1 measurement results of the target cell reported by the terminal, the network configures the Transmission Configuration Indicator (TCI) state through the RRC reconfiguration message, and the terminal selects an appropriate downlink beam for data reception according to the TCI state configured by the network. Regarding the L1 measurement here, the terminal only performs L1 measurement in the serving cell and does not need to perform L1 measurement on neighboring cells. To reduce the latency and signaling overhead brought by handover, one of the research directions is to develop L1-based inter-cell mobility, and this mechanism requires the terminal to perform L1 measurement on neighboring cells / neighboring frequencies (non-serving cells). Here, the L1 measurement of neighboring cells / neighboring frequencies can also be described as the L1 measurement of non-serving cells, or described as the mobility measurement triggered by L1 / L2.

[0044] The terminal's L1 measurement of neighboring cells / neighboring frequencies increases the complexity of competing for measurement opportunities. Here, for scenarios that require measurement intervals, the measurement opportunity refers to the measurement interval; for scenarios that do not require measurement intervals, the measurement opportunity refers to the measurement duration in the time domain, which can be understood as how long it takes to complete the measurement of the target frequency point. It is necessary to clarify how the terminal handles the competition for measurement opportunities between the L3 measurement of neighboring cells / neighboring frequencies and the L1 measurement of neighboring frequencies / neighboring cells, as well as the competition for measurement opportunities between the L1 measurements of multiple different cells (such as between co-frequency neighboring cells, between different-frequency cells, between neighboring cells and the serving cell). For this reason, the following technical solutions of the embodiments of this application are proposed. Through the following technical solutions of the embodiments of this application, the measurement latency of L1 measurement and L3 measurement can be clarified, that is, it can be clarified how long it takes for the terminal to complete L1 measurement and L3 measurement.

[0045] It should be noted that there is no measurement competition problem between cells in L3 measurement because it is generally considered that the terminal has a dedicated L3 module that can simultaneously complete the measurement of multiple cells with the same frequency point. However, L1 measurement is different. The terminal's usual implementation is that L1 measurement is completed in the data demodulation module, and the data demodulation module is usually based on FFT. Due to limitations such as complexity and cost, the terminal can usually only complete the L1 measurement of 1 cell at a time. In addition, different from the coarse beam used for L3 measurement, the terminal uses a fine beam for L1 measurement, and the number of beams of the fine beam is larger than that of the coarse beam.

[0046] To facilitate the understanding of the technical solutions of the embodiments of this application, the technical solutions of this application are described in detail through specific embodiments below. The above related technologies can be arbitrarily combined with the technical solutions of the embodiments of this application as optional solutions, and they all fall within the protection scope of the embodiments of this application. The embodiments of this application include at least some of the following contents.

[0047] It should be noted that the L1 measurement described in the embodiments of the present application can also be described as the layer 1 measurement of neighboring cells / neighboring frequencies. The L1 measurement includes the same-frequency L1 measurement and / or the different-frequency L1 measurement. Among them, the different-frequency L1 measurement includes the L1 measurement that requires a measurement interval and / or the L1 measurement that does not require a measurement interval.

[0048] It should be noted that the L1 measurement described in the embodiments of the present application refers to the measurement of the L1 - Reference Signal Receiving Power (RSRP) and / or the measurement of the L1 - Signal to Interference plus Noise Ratio (SINR).

[0049] It should be noted that the measurement delay described in the embodiments of the present application can also be described as the measurement period, or described as the measurement duration, or described as the measurement time, and the corresponding English expression can be measurement period or measurement delay.

[0050] It should be noted that the frequency point described in the embodiments of the present application can also be described as the Measurement Object (MO), or described as the frequency.

[0051] Figure 2 is a schematic flowchart of the measurement method provided by the embodiments of the present application, as Figure 2 shown, the measurement method includes one or more of the following steps:

[0052] Step 201: The terminal performs L1 measurement, and the measurement delay of the L1 measurement is related to the first factor and / or the number of frequency points.

[0053] Corresponding to step 201, the technical solution of the embodiment of the present application clarifies the measurement resource allocation for L1 measurements of different cells (the measurement resource allocation can be understood as which measurement the terminal performs if there is a measurement conflict at a certain measurement occasion. The measurement occasion includes at least one of measurement interval, SMTC, and SSB), solves the conflict problem of L1 measurements of different cells, and further can determine the measurement delay. Here, the L1 measurements between different cells can be: L1 measurements of different neighboring cells (for example, the terminal needs to perform L1 measurements on at least 2 neighboring cells. In this case, if the terminal cannot perform L1 measurements on these neighboring cells simultaneously, then based on the technical solution of the present application, it can help the terminal determine how to perform measurements on the neighboring cells (for example, at a certain measurement occasion, with what probability or proportion to perform measurements on certain neighboring cells), and further can determine the L1 measurement delay of the neighboring cells), or it can also be: L1 measurements of a neighboring cell and a serving cell (for example, the terminal needs to perform L1 measurements on the serving cell and a neighboring cell, and the number of neighboring cells for which L1 measurements are performed is at least 1. In this case, if the terminal cannot perform L1 measurements on the serving cell and the neighboring cell simultaneously, then based on the technical solution of the present application, it can help the terminal determine how to perform measurements on the serving cell and the neighboring cell (for example, at a certain measurement occasion, with what probability or proportion to perform measurements on the serving cell and / or with what probability or proportion to perform measurements on the neighboring cell), and further can determine the L1 measurement delay of the neighboring cell and / or the L1 measurement delay of the serving cell).

[0054] Specifically, the technical solution of the embodiment of the present application solves the measurement competition problem caused by the inability to measure simultaneously in the L1 measurement of neighboring cells (including how to allocate the measurement opportunities (or described as measurement resources) for the L1 measurement of a neighboring cell and a serving cell, and how to allocate the measurement opportunities for the L1 measurement between multiple neighboring cells). When performing L1 measurements on neighboring cells, especially L1 measurements on FR2 cells, due to the different beam directions of different cells, the terminal cannot perform L1 measurements on multiple cells simultaneously. Then how the terminal allocates measurement opportunities and how to perform L1 measurements on neighboring cells and serving cells are problems that need to be solved. In addition, the specific measurement execution scheme will affect the measurement delay of L1 measurements.

[0055] In the embodiment of the present application, the measurement delay of L1 measurement is related to the first factor and / or the number of frequency points, or it can also be described as: the measurement delay of L1 measurement includes at least one of the first factor and the number of frequency points, or it can also be described as: the measurement delay of L1 measurement is determined based on the first factor and / or the number of frequency points, or it can also be described as: the calculation formula of the measurement delay of L1 measurement includes at least the first factor and / or the number of frequency points.

[0056] The value of the first factor can be determined by one or more of the following schemes:

[0057] Scenario 1) If the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2.

[0058] In some embodiments, when the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2;

[0059] In some embodiments, when the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent in the time domain, the value of the first factor is 2.

[0060] It should be noted that the number of neighboring cells in the embodiments of the present application can also be described as the number of neighboring cells to be measured.

[0061] Here, if the number of neighboring cells to be measured is 1, and the SSBs of the serving cell and the neighboring cell overlap or are adjacent, then there is a conflict between the L1 measurement of the neighboring cell and the L1 measurement of the serving cell, and the value of the first factor is 2, which means that the measurement opportunity is allocated at a ratio of 50%. That is, at a certain measurement opportunity, there is a 50% probability of performing the L1 measurement of the serving cell, and there is also a 50% probability of performing the L1 measurement of the neighboring cell. Since the influence of the measurement probability on the measurement delay is that the measurement delay will be extended, the first factor will be reflected in the measurement delay of the L1 measurement. Specifically, the measurement delay of the L1 measurement of the serving cell is extended to 2 times, and the measurement delay of the L1 measurement of the neighboring cell is extended to 2 times.

[0062] Scenario 2) If the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of neighboring cells multiplied by 3.

[0063] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, and the number of the first neighboring cells includes the number of co-frequency neighboring cells and / or the number of different-frequency neighboring cells;

[0064] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, and the number of the first neighboring cells includes the number of co-frequency neighboring cells and / or the number of different-frequency neighboring cells that do not require a measurement interval;

[0065] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, and the number of the first neighboring cells is the sum of the number of co-frequency neighboring cells and the number of different-frequency neighboring cells that do not require a measurement interval.

[0066] Here, if the number of neighboring cells to be measured is greater than 1 and the TCI states of the neighboring cells are not in the active TCI state list, then the measurement opportunity is divided into three parts, which are respectively used for the L1 measurement of the serving cell, the neighboring cells configured with TCI states, and other neighboring cells (neighboring cells not configured with TCI states), each accounting for 1 / 3 of the application opportunity. How the other neighboring cells are measured and how many cells are measured depend on the terminal's own implementation. However, the terminal needs to complete the measurement of the serving cell and the neighboring cells configured with TCI states. Therefore, the impact on the L1 measurement time is as follows: the measurement delay of the L1 measurement of the serving cell is extended to 3 times, and the measurement delay of the L1 measurement of the neighboring cells is extended to (3 × the number of neighboring cells) times. The delay of the L1 measurement of the neighboring cells can be further understood as the delay of the L1 measurement of the neighboring cells configured with TCI states.

[0067] Solution 3) If the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the number of neighboring cells with the TCI state in the active TCI state list multiplied by 3.

[0068] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the second number of neighboring cells multiplied by 3, and the second number of neighboring cells is the number of neighboring cells with the TCI state in the active TCI state list. The neighboring cells with the TCI state in the active TCI state list include co-frequency neighboring cells and / or different-frequency neighboring cells. Specifically, the number of neighboring cells with the TCI state in the active TCI state list includes the sum of the number of co-frequency neighboring cells with the TCI state in the active TCI state list and the number of different-frequency neighboring cells with the TCI state in the active TCI state list.

[0069] Here, if the number of neighboring cells to be measured is greater than 1, and the TCI state of the neighboring cell is in the active TCI state list (or it is described that there is a neighboring cell with the TCI state in the active TCI state list), then the measurement opportunity is divided into three parts, which are respectively used for the L1 measurement of the serving cell, the L1 measurement of the neighboring cells with the TCI state in the active TCI state list, and the L1 measurement of other neighboring cells (other neighboring cells include neighboring cells with the TCI state not in the active TCI state list and neighboring cells without the configured TCI state), each accounting for 1 / 3 of the measurement opportunity. Regarding other neighboring cells, how to measure and how many cells to measure depend on the terminal's own implementation. However, the terminal needs to complete the measurement of the serving cell and the neighboring cells with the TCI state in the active TCI state list (the TCI state being in the active TCI state list means that the network configures the terminal to measure this cell for subsequent LTM (L1 / L2-triggered mobility) handover), so the impact on the L1 measurement time is as follows: the measurement delay of the L1 measurement of the serving cell is extended to 3 times, and the measurement delay of the L1 measurement of the neighboring cells is extended to (3 × the number of neighboring cells with the TCI state in the active TCI state list) times. The delay of the L1 measurement of the neighboring cells can be further understood as the delay of the L1 measurement of the neighboring cells with the TCI state in the active TCI state list.

[0070] As an implementation manner, the first factor will be embodied as a product factor in the calculation formula of the measurement delay, and the scaling of the measurement delay can be achieved by adding a product factor (i.e., the first factor) to the calculation formula of the measurement delay.

[0071] In addition, if the SSBs of the serving cell and the neighboring cell do not overlap and are not adjacent, then the value of the first factor is 1. In this scenario, since the SSBs of the serving cell and the neighboring cell do not overlap and are not adjacent, it is not necessary for the terminal to perform the L1 measurement of the neighboring cell and the L1 measurement of the serving cell simultaneously.

[0072] It should be noted that the number of second neighboring cells in the embodiments of this application is a subset of the number of first neighboring cells. The number of second neighboring cells includes co-frequency neighboring cells and / or different-frequency neighboring cells. Further, the number of second neighboring cells includes the number of co-frequency neighboring cells and / or different-frequency neighboring cells with the TCI state in the active TCI state list.

[0073] It should be noted that the neighboring cells described in the embodiments of this application can also be described as cells, or as cells with different physical cell identifiers (Physical Cell Identifier, PCI) from the serving cell, or as cells with different physical cell indexes from the serving cell.

[0074] The number of frequency points in the above solution can be determined by one or more of the following solutions:

[0075] Solution 1) The number of frequency points includes the number of same-frequency points and / or the number of different-frequency points;

[0076] Here, the number of same-frequency points can also be described as the number of same-frequency frequency points, and the number of different-frequency points can also be described as the number of different-frequency frequency points.

[0077] Solution 2) The value of the number of frequency points is the sum of the number of same-frequency points and the number of different-frequency points;

[0078] Solution 3) The number of frequency points includes the number of same-frequency points and / or the number of different-frequency points that do not require a measurement interval;

[0079] Solution 4) The value of the number of frequency points is the sum of the number of same-frequency points used for L1 measurement and the number of different-frequency points that do not require a measurement interval used for L1 measurement.

[0080] The period of L1 measurement in the above solution can be determined by one or more of the following solutions:

[0081] Solution 1) The period of L1 measurement includes at least the neighbor cell SSB period × the number of frequency points;

[0082] Solution 2) The period of L1 measurement includes at least max(neighbor cell SSB period, DRX cycle length) × the number of frequency points;

[0083] Solution 3) The period of L1 measurement includes at least the DRX cycle length × the number of frequency points;

[0084] Solution 4) The period of L1 measurement includes at least the first factor × N, where N = 8;

[0085] Solution 5) The period of L1 measurement includes at least the first factor × N × the neighbor cell SSB period, where N = 8;

[0086] Solution 6) The period of L1 measurement includes at least the first factor × N * max(neighbor cell SSB period, DRX cycle length), where N = 8;

[0087] Solution 7) The period of L1 measurement includes at least the first factor × N × the DRX cycle length, where N = 8.

[0088] It should be noted that in the above solution, the period of L1 measurement includes at least X, which can also be described as the period of L1 measurement is determined based on X, or can also be described as the period of L1 measurement is at least related to X, or can also be described as the calculation formula of the period of L1 measurement includes at least X. Wherein, X = the period of the neighboring cell SSB × the number of frequency points; or, X = max(the period of the neighboring cell SSB, the DRX cycle length) × the number of frequency points; or, X = the DRX cycle length × the number of frequency points; or, X = the first factor × N, N = 8; or, X = the first factor × N × the period of the neighboring cell SSB, N = 8; or, X = the first factor × N * max(the period of the neighboring cell SSB, the DRX cycle length), N = 8; or, X = the first factor × N × the DRX cycle length, N = 8.

[0089] Step 202: The terminal performs measurements through the first method or the second method, and the measurements here include L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of L1 measurement is related to the number of cells of L1 measurement and the second factor, and / or the measurement delay of L3 measurement is related to the number of cells of L1 measurement and the third factor; corresponding to the second method, the measurement delay of L1 measurement is related to the number of cells of L1 measurement and the number of frequency points of L3 measurement, and / or the measurement delay of L3 measurement is related to the number of cells of L1 measurement and the number of frequency points of L3 measurement.

[0090] Corresponding to step 202, the technical solution of the embodiment of the present application clarifies the measurement delay allocation between L1 measurement and L3 measurement, and solves the conflict problem between L1 measurement and L3 measurement. The following describes the first method and the second method.

[0091] The first method

[0092] For the first method, the measurement delay of L1 measurement is related to the number of cells of L1 measurement and the second factor; the measurement delay of L3 measurement is related to the number of cells of L1 measurement and the third factor.

[0093] In some embodiments, the measurement delay of L1 measurement can be determined in the following manner:

[0094] 1-1) The measurement delay of L1 measurement is determined based on the first value and the second factor, wherein the first value is determined based on the number of cells of L1 measurement; or,

[0095] 1-2) The measurement delay of L1 measurement is determined based on the second value, wherein the second value is determined based on the number of cells of L1 measurement and the second factor.

[0096] Furthermore, the measurement delay of L1 measurement is also based on the first duration, and the first duration is related to the period of the reference signal. Taking the reference signal as SSB as an example, the period of the reference signal refers to the SSB period.

[0097] In some embodiments, the measurement delay of the L3 measurement can be determined in the following manner:

[0098] 2-1) The measurement delay of the L3 measurement is determined based on a first value and a third factor, where the first value is determined based on the number of cells of the L1 measurement; or,

[0099] 2-2) The measurement delay of the L3 measurement is determined based on a third value, where the third value is determined based on the number of cells of the L1 measurement and the third factor.

[0100] Furthermore, the measurement delay of the L3 measurement is also determined based on a second duration, and the second duration is related to the period of the measurement window of the reference signal. Taking the reference signal as the SSB as an example, the period of the measurement window of the reference signal refers to the SMTC period.

[0101] In the above solution, the second factor / third factor solves the conflict problem (or described as a competition problem) between the L1 measurement (which can be described as a measurement based on the SSB or CSI-RS) and the L3 measurement (which can be described as a measurement based on the SMTC). The second factor / third factor can also be described as a sharing factor or an allocation factor. For example, if the L1 measurement and the L3 measurement allocate measurement resources according to a ratio of 1:2 (or described as applying the conflicting reference signals according to this ratio), then at this time, the value of the second factor is 3, representing that the measurement delay of the L1 measurement will be extended by 3 times. Correspondingly, the value of the third factor is 1.5, representing that the measurement delay of the L3 measurement will be extended by 1.5 times.

[0102] The first method can be understood as: First, perform the measurement delay allocation between the L1 measurement and the L3 measurement according to the second factor / third factor; then, for the L1 measurement, perform the measurement delay allocation between the L1 measurements of multiple cells according to the first value (related to the number of cells of the L1 measurement).

[0103] As an embodiment: The terminal can first determine the second factor / third factor between the L1 measurement and the L3 measurement, and then determine the first value (related to the number of cells of the L1 measurement). As another embodiment: The terminal can first determine the first value (related to the number of cells of the L1 measurement), and then determine the second factor / third factor between the L1 measurement and the L3 measurement.

[0104] In some embodiments, the above second factor and / or third factor can be obtained in the following manner: The terminal receives the first information sent by the network device, and the first information is used to configure the allocation ratio between the measurement resources of the L1 measurement and the measurement resources of the L3 measurement; the terminal determines the second factor and / or third factor based on the allocation ratio.

[0105] Here, the allocation ratio between the measurement resources for L1 measurement and the measurement resources for L3 measurement configured by the network device is N1:N2; the terminal determines that the second factor is (N1 + N2) / N1 and the third factor is (N1 + N2) / N2 according to this allocation ratio.

[0106] In some other embodiments, the above-mentioned second factor and / or third factor can be obtained in the following manner: the terminal receives the second information sent by the network device, and the second information is used to configure the second factor and / or the third factor.

[0107] Here, the network device directly configures the second factor and the third factor.

[0108] In an example, the measurement delay of L1 measurement is determined based on the first value and the second factor, and the measurement delay of L3 measurement is determined based on the first value and the third factor. Here, the first value is equal to the number of cells of L1 measurement. Specifically, the measurement delay of L1 measurement at least includes SSB period × N × first value × second factor × M, where N = 8 and M = 1 or 3. The measurement delay of L3 measurement at least includes SMTC period × N × first value × third factor × K, where N = 8 and K = 5 or 8.

[0109] In an example, the measurement delay of L1 measurement is determined based on the second value, and the second value is determined based on the number of cells of L1 measurement and the second factor (the second value can be equal to the number of cells of L1 measurement multiplied by the second factor). The measurement delay of L3 measurement is determined based on the third value, and the third value is determined based on the number of cells of L1 measurement and the third factor (the third value can be equal to the number of cells of L1 measurement multiplied by the third factor). Specifically, the measurement delay of L1 measurement at least includes SSB period × N × second value × M, where N = 8 and M = 1 or 3; the measurement delay of L3 measurement at least includes SMTC period × N × third value × K, where N = 8 and K = 5 or 8.

[0110] The following combines Figure 3 and Figure 4 to illustrate the technical solutions of the embodiments of the present application by way of examples.

[0111] Such as Figure 3As shown, f1 and f2 represent two different frequency points. The terminal needs to perform L3 measurements on f1 and f2, and perform L1 measurements on f1. Among them, the terminal needs to perform L1 measurements on cell 1 and cell 2 under f1. The terminal uses the above first method for measurement. The first value = 2 (i.e., the number of cells for L1 measurement), the value of the second factor is 3, and the value of the third factor is 1.5. Then, the measurement delay of the L1 measurement is T × the first value × the second factor = 6T. T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement is T' × the first value × the third factor = 3T'. T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0112] As Figure 4 shown, f1, f2 and f3 represent three different frequency points. The terminal needs to perform L3 measurements on f1 and f2, and perform L1 measurements on f1 and f3. Among them, the terminal needs to perform L1 measurements on cell 1 and cell 2 under f1, and perform L1 measurements on cell 3 under f3. The terminal uses the above first method for measurement. The first value = 3 (i.e., the number of cells for L1 measurement), the value of the second factor is 3, and the value of the third factor is 1.5. Then, the measurement delay of the L1 measurement is T * the first value * the second factor = 9T. T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement is T' × the first value × the third factor = 4.5T'. T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0113] The second method

[0114] For the second method, the measurement delay of the L1 measurement is related to the number of cells for the L1 measurement and the number of frequency points for the L3 measurement; the measurement delay of the L3 measurement is related to the number of cells for the L1 measurement and the number of frequency points for the L3 measurement.

[0115] In some embodiments, the measurement delay of the L1 measurement can be determined by the following method:

[0116] The measurement delay of the L1 measurement is determined based on a third value, where the third value is determined based on the number of cells for the L1 measurement and the number of frequency points for the L3 measurement.

[0117] Furthermore, the measurement delay of the L1 measurement is also determined based on a first duration, and the first duration is related to the period of the reference signal. Taking the reference signal as the SSB as an example, the period of the reference signal refers to the SSB period.

[0118] In some embodiments, the measurement delay of the L3 measurement can be determined in the following manner:

[0119] The measurement delay of the L3 measurement is determined based on a third value, where the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

[0120] Furthermore, the measurement delay of the L3 measurement is also determined based on a second duration, and the second duration is related to the period of the measurement window of the reference signal. Taking the reference signal as the SSB as an example, the period of the measurement window of the reference signal refers to the SMTC period.

[0121] In some embodiments, the third value includes the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, that is, the third value is equal to the sum of the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

[0122] It should be noted that if the frequency point of the L1 measurement and the frequency point of the L3 measurement are the same frequency point, then the third value needs to be counted twice.

[0123] In some embodiments, the third value includes the number of frequency points measured within the measurement interval and the number of cells for which L1 measurements are performed within the measurement interval. Among them, the frequency points measured within the measurement interval refer to the measurement interval length (MGL) that completely covers the SMTC duration of the frequency point after removing the radio frequency (RF) conversion time (i.e., the SMTC duration completely falls within the MGL excluding the RF conversion time) and / or the CSI-RS resource window of the frequency point is completely covered by the MGL after removing the RF conversion time (i.e., the CSI-RS resource window completely falls within the MGL excluding the RF conversion time). The cells for which L1 measurements are performed within the measurement interval refer to the cells for which the SSB duration is completely covered by the MGL after removing the RF conversion time (i.e., the SSB duration completely falls within the MGL excluding the RF conversion time).

[0124] The second method can be understood as: the L1 measurement allocates measurement resources with the cells as the granularity to the frequency points of the L3 measurement. Different from the first method, the second method no longer needs to consider the influence of the second factor / third factor.

[0125] In one example, the measurement delays of the L1 measurement and the L3 measurement are determined based on a third value, where the third value here is equal to the number of cells of the L1 measurement plus the number of frequency points of the L3 measurement. Specifically, the measurement delay of the L1 measurement at least includes SSB period × N × third value × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement at least includes SMTC period × N × third value × K, where N = 8 and K = 5 or 8.

[0126] The following is an example of the technical solution of the embodiments of the present application in conjunction with Figure 5 and Figure 6 to illustrate.

[0127] As Figure 5 shown, f1 and f2 represent two different frequency points. The terminal needs to perform L3 measurements on f1 and f2, and perform L1 measurements on f1. Among them, the terminal needs to perform L1 measurements on cell 1 and cell 2 below f1. The terminal uses the second method described above for measurement. The third value = 4 (that is, the number of cells for L1 measurement + the number of frequency points for L3 measurement). Then, the measurement delay of the L1 measurement is T × the third value = 4T. T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement is T' × the third value = 4T'. T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0128] As Figure 6 shown, f1, f2, and f3 represent three different frequency points. The terminal needs to perform L3 measurements on f1 and f2, and perform L1 measurements on f1 and f3. Among them, the terminal needs to perform L1 measurements on cell 1 and cell 2 below f1, and perform L1 measurements on cell 3 below f3. The terminal uses the second method described above for measurement. The third value = 5 (that is, the number of frequency points for L3 measurement + the number of cells for L1 measurement). Then, the measurement delay of the L1 measurement is T × the third value = 5T. T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement is T' × the third value = 5T'. T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0129] In some embodiments, before step 202, the network device flexibly instructs the terminal whether to use the first method or the second method described above for measurement. Specifically, the terminal receives the third information sent by the network device, and the third information is used to instruct the terminal to use the first method or the second method for measurement.

[0130] Here, for the first method and the second method described above, different methods will result in different measurement delays. Taking Figure 3 and Figure 5 as an example, Figure 3 Based on the implementation of Method 1, the measurement delay of the L1 measurement obtained is 6T; Figure 5Implemented based on Method 2, the measurement delay of the L1 measurement obtained is 4T. Compared with Method 1, Method 2 can reduce the measurement delay of the L1 measurement. Since the principle of Method 2 is to allocate measurement opportunities with the cell granularity of the L1 measurement and the frequency point granularity of the L3 measurement, the cost of Method 2 is an increase in the measurement delay of the L3 measurement. Considering that the L3 measurement has better robustness and the L1 measurement can provide fast feedback, the network device can indicate to the terminal whether to use Method 1 or Method 2 to flexibly change the measurement delays of the L3 measurement and the L1 measurement. If stability is desired, the network device can indicate to the terminal to use Method 1 for measurement. If high speed is required, the network device can indicate to the terminal to use Method 2 for measurement.

[0131] It should be noted that Step 201 and Step 202 of the embodiments of the present application can be executed separately or both. When both Step 201 and Step 202 are executed, the present application does not limit the execution order of Step 201 and Step 202.

[0132] Figure 7 It is a schematic structural diagram of a measurement device provided by an embodiment of the present application, which is applied to a terminal, such as Figure 7 shown, the measurement device includes:

[0133] A measurement unit 701, configured to perform L1 measurement, where the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points; and / or, perform measurement by a first method or a second method, where the measurement includes L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

[0134] In some embodiments, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, specifically:

[0135] The measurement delay of the L1 measurement is determined based on a first value and the second factor, where the first value is determined based on the number of cells of the L1 measurement; or,

[0136] The measurement delay of the L1 measurement is determined based on a second value, where the second value is determined based on the number of cells of the L1 measurement and the second factor.

[0137] In some embodiments, the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor, specifically:

[0138] The measurement delay of the L3 measurement is determined based on a first value and the third factor, where the first value is determined based on the number of cells of the L1 measurement; or,

[0139] The measurement delay of the L3 measurement is determined based on a third value, where the third value is determined based on the number of cells of the L1 measurement and the third factor.

[0140] In some embodiments, the apparatus further includes: a receiving unit 702, configured to receive first information sent by a network device, where the first information is used to configure an allocation ratio between measurement resources of the L1 measurement and measurement resources of the L3 measurement; a determining unit 703, configured to determine the second factor and / or the third factor based on the allocation ratio.

[0141] In some embodiments, the receiving unit 702 is configured to receive second information sent by a network device, where the second information is used to configure the second factor and / or the third factor.

[0142] In some embodiments, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, specifically:

[0143] The measurement delay of the L1 measurement is determined based on a third value, where the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

[0144] In some embodiments, the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, specifically:

[0145] The measurement delay of the L3 measurement is determined based on a third value, where the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

[0146] In some embodiments, the measurement delay of the L1 measurement is further determined based on a first duration, where the first duration is related to the period of a reference signal.

[0147] In some embodiments, the measurement delay of the L3 measurement is further determined based on a second duration, where the second duration is related to the period of a measurement window of a reference signal.

[0148] In some embodiments, the receiving unit 702 is configured to receive third information sent by a network device, where the third information is used to indicate that the terminal performs the measurement in the first manner or in the second manner.

[0149] In some embodiments, the value of the first factor is determined by at least one of the following methods:

[0150] If the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2;

[0151] If the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of neighboring cells multiplied by 3;

[0152] If the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the number of neighboring cells with the TCI state in the active TCI state list multiplied by 3.

[0153] In some embodiments, the value of the first factor is determined by at least one of the following methods:

[0154] When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2;

[0155] When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent in the time domain, the value of the first factor is 2;

[0156] When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, where the number of the first neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells;

[0157] When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, where the number of the first neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells that do not require a measurement interval;

[0158] When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the number of the second neighboring cells multiplied by 3, where the number of the second neighboring cells is the number of neighboring cells with the TCI state in the active TCI state list.

[0159] In some embodiments, the number of frequency points is determined by at least one of the following methods:

[0160] The number of frequency points includes the number of same-frequency points and / or the number of different-frequency points;

[0161] The value of the number of frequency points is the sum of the number of same-frequency points and the number of different-frequency points;

[0162] The number of frequency points includes the number of same-frequency points and / or the number of different-frequency points that do not require a measurement interval;

[0163] The value of the number of frequency points is the sum of the number of same-frequency points for L1 measurement and the number of different-frequency points that do not require a measurement interval for L1 measurement.

[0164] In some embodiments, the period of the L1 measurement is determined by at least one of the following methods:

[0165] The period of the L1 measurement includes at least the period of the neighboring cell SSB × the number of frequency points;

[0166] The period of the L1 measurement includes at least max(period of the neighboring cell SSB, DRX cycle length) × the number of frequency points;

[0167] The period of the L1 measurement includes at least the DRX cycle length × the number of frequency points;

[0168] The period of the L1 measurement includes at least the first factor × N, where N = 8;

[0169] The period of the L1 measurement includes at least the first factor × N × the period of the neighboring cell SSB, where N = 8;

[0170] The period of the L1 measurement includes at least the first factor × N × max(period of the neighboring cell SSB, DRX cycle length), where N = 8;

[0171] The period of the L1 measurement includes at least the first sub × N × the DRX cycle length, where N = 8.

[0172] Those skilled in the art should understand that Figure 7 The implementation functions of the units in the shown measurement device can be understood with reference to the relevant descriptions of the foregoing method. Figure 7 The functions of the units in the shown measurement device can be implemented by a program running on a processor or by specific logic circuits.

[0173] Figure 8 It is a schematic structural diagram of a communication device 800 provided by an embodiment of the present application. This communication device can be a terminal. Figure 8 The shown communication device 800 includes a processor 810. The processor 810 can call and run a computer program from a memory to implement the method in the embodiment of the present application.

[0174] Optionally, asFigure 8 As shown, the communication device 800 may further include a memory 820. Among them, the processor 810 may call and run a computer program from the memory 820 to implement the method in the embodiments of the present application.

[0175] Among them, the memory 820 may be a separate device independent of the processor 810, or may be integrated in the processor 810.

[0176] Optionally, as Figure 8 shown, the communication device 800 may further include a transceiver 830. The processor 810 may control the transceiver 830 to communicate with other devices. Specifically, it may send information or data to other devices, or receive information or data sent by other devices.

[0177] Among them, the transceiver 830 may include a transmitter and a receiver. The transceiver 830 may further include antennas, and the number of antennas may be one or more.

[0178] Specifically, the communication device 800 may be the terminal in the embodiments of the present application, and the communication device 800 may implement the corresponding processes implemented by the terminal in the various methods of the embodiments of the present application. For the sake of brevity, it will not be elaborated here.

[0179] Figure 9 is a schematic structural diagram of a chip in the embodiments of the present application. Figure 9 As shown, the chip 900 includes a processor 910. The processor 910 may call and run a computer program from the memory to implement the method in the embodiments of the present application.

[0180] Optionally, as Figure 9 shown, the chip 900 may further include a memory 920. Among them, the processor 910 may call and run a computer program from the memory 920 to implement the method in the embodiments of the present application.

[0181] Among them, the memory 920 may be a separate device independent of the processor 910, or may be integrated in the processor 910.

[0182] Optionally, the chip 900 may further include an input interface 930. Among them, the processor 910 may control the input interface 930 to communicate with other devices or chips. Specifically, it may obtain information or data sent by other devices or chips.

[0183] Optionally, the chip 900 may further include an output interface 940. Among them, the processor 910 may control the output interface 940 to communicate with other devices or chips. Specifically, it may output information or data to other devices or chips.

[0184] The chip can be applied to the terminal in the embodiments of the present application, and the chip can implement the corresponding processes implemented by the terminal in each method of the embodiments of the present application. For the sake of brevity, details are not described herein again.

[0185] It should be understood that the chip mentioned in the embodiments of the present application may also be referred to as a system-on-chip, system chip, chip system, or system-on-chip, etc.

[0186] It should be understood that the processor in the embodiments of the present application may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method embodiments can be completed by the integrated logic circuit in the hardware of the processor or by instructions in the form of software. The above processor may be a general-purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. It can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of the present application. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc. The steps of the method disclosed in combination with the embodiments of the present application can be directly embodied as being executed by the hardware decoding processor, or executed by a combination of the hardware and software modules in the decoding processor. The software module may be located in a mature storage medium in the art such as a random access memory, flash memory, read-only memory, programmable read-only memory, or electrically erasable programmable memory, register, etc. The storage medium is located in the memory, and the processor reads the information in the memory and combines its hardware to complete the steps of the above method.

[0187] It can be understood that the memory in the embodiments of the present application can be a volatile memory or a non-volatile memory, or can include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory can be a random access memory (RAM), which is used as an external cache. By way of example but not limitation, many forms of RAM are available, such as static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchlink dynamic random access memory (SLDRAM), and direct rambus random access memory (DR RAM). It should be noted that the memory of the systems and methods described herein is intended to include but not be limited to these and any other suitable types of memory.

[0188] It should be understood that the above-mentioned memory is by way of example but not limitation. For example, the memory in the embodiments of the present application can also be a static random access memory (SRAM), a dynamic random access memory (DRAM), a synchronous dynamic random access memory (SDRAM), a double data rate SDRAM (DDR SDRAM), an enhanced SDRAM (ESDRAM), a synch link DRAM (SLDRAM), and a direct rambus random access memory (DR RAM), and so on. That is to say, the memory in the embodiments of the present application is intended to include but not be limited to these and any other suitable types of memory.

[0189] The embodiments of the present application also provide a computer-readable storage medium for storing a computer program. The computer-readable storage medium can be applied to the terminal in the embodiments of the present application, and the computer program enables the computer to execute the corresponding processes implemented by the terminal in the various methods of the embodiments of the present application. For the sake of brevity, details are not repeated here.

[0190] As described above, the above are only specific embodiments of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present application can easily think of changes or substitutions, which should all be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A measurement method, characterized in that, The method includes: The terminal performs layer 1 (L1) measurement, and the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points; and / or, The terminal performs measurement by a first method or a second method, and the measurement includes L1 measurement and / or layer 3 (L3) measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

2. The method according to claim 1, wherein The measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, specifically: The measurement delay of the L1 measurement is determined based on a first value and the second factor, wherein the first value is determined based on the number of cells of the L1 measurement; or, The measurement delay of the L1 measurement is determined based on a second value, wherein the second value is determined based on the number of cells of the L1 measurement and the second factor.

3. The method according to claim 1, characterized in that, The measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor, specifically: The measurement delay of the L3 measurement is determined based on a first value and the third factor, wherein the first value is determined based on the number of cells of the L1 measurement; or, The measurement delay of the L3 measurement is determined based on a third value, wherein the third value is determined based on the number of cells of the L1 measurement and the third factor.

4. The method according to any one of claims 1 to 3, characterized in that The method further includes: The terminal receives first information sent by a network device, and the first information is used to configure the allocation ratio between the measurement resources of the L1 measurement and the measurement resources of the L3 measurement; The terminal determines the second factor and / or the third factor based on the allocation ratio.

5. The method according to any one of claims 1 to 3, characterized in that The method further includes: The terminal receives second information sent by a network device, and the second information is used to configure the second factor and / or the third factor.

6. The method according to claim 1, wherein The measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, specifically: The measurement delay of the L1 measurement is determined based on a third value, wherein the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

7. The method according to claim 1, wherein The measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, specifically: The measurement delay of the L3 measurement is determined based on a third value, wherein the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

8. The method according to claim 2 or 6, characterized in that The measurement delay of the L1 measurement is further determined based on a first duration, and the first duration is related to the period of a reference signal.

9. The method according to claim 3 or 7, characterized in that The measurement delay of the L3 measurement is further determined based on a second duration, and the second duration is related to the period of a measurement window of a reference signal.

10. The method according to any one of claims 1 to 3, characterized in that The method further includes: The terminal receives third information sent by a network device, where the third information is used to instruct the terminal to perform the measurement in the first manner or in the second manner.

11. The method according to claim 1, characterized in that The value of the first factor is determined by at least one of the following methods: If the synchronization signal blocks (SSBs) of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2; If the transmission configuration indication (TCI) state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of neighboring cells multiplied by 3; If the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the number of neighboring cells with the TCI state in the active TCI state list multiplied by 3.

12. The method according to claim 1, wherein The value of the first factor is determined by at least one of the following methods: When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2; When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent in the time domain, the value of the first factor is 2; When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells; When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells that do not require a measurement interval; When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the second number of neighboring cells multiplied by 3, where the second number of neighboring cells is the number of neighboring cells with the TCI state in the active TCI state list.

13. The method according to claim 1, wherein The number of frequency points is determined by at least one of the following methods: The number of frequency points includes the number of co-frequency points and / or the number of inter-frequency points; The value of the number of frequency points is the sum of the number of co-frequency points and the number of inter-frequency points; The number of frequency points includes the number of co-frequency points and / or the number of inter-frequency points that do not require a measurement interval; The value of the number of frequency points is the sum of the number of co-frequency points used for L1 measurement and the number of inter-frequency points that do not require a measurement interval used for L1 measurement.

14. The method according to any one of claims 1, 11 to 13, characterized in that The period of the L1 measurement is determined by at least one of the following methods: The period of the L1 measurement at least includes the period of the neighboring cell SSB × the number of frequency points; The period of the L1 measurement at least includes max(period of the neighboring cell SSB, DRX cycle length) × the number of frequency points; The period of the L1 measurement at least includes the DRX cycle length × the number of frequency points; The period of the L1 measurement at least includes the first factor × N, where N = 8; The period of the L1 measurement at least includes the first factor × N × the period of the neighboring cell SSB, where N = 8; The period of the L1 measurement at least includes the first factor × N × max(period of the neighboring cell SSB, DRX cycle length), where N = 8; The period of the L1 measurement includes at least the first factor × N × DRX cycle length, where N = 8.

15. A measuring device, characterized in that, Applied to a terminal, the device includes: A measurement unit for performing L1 measurement, where the measurement delay of the L1 measurement is related to the first factor and / or the number of frequency points; and / or, performing measurement by a first method or a second method, the measurement including L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

16. A terminal, characterized in that, Includes: A processor and a memory, the memory is used to store a computer program, and the processor is used to call and run the computer program stored in the memory to execute the method according to any one of claims 1 to 14.

17. A chip, characterized in that, Includes: A processor for calling and running a computer program from a memory, so that the device installed with the chip executes the method according to any one of claims 1 to 14.

18. A computer-readable storage medium, characterized in that, For storing a computer program, the computer program causes a computer to execute the method according to any one of claims 1 to 14.

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