Method for identifying tolerance degree of wheat to low-temperature cold injury

Abstract

The invention provides a method for identifying the tolerance degree of wheat to low-temperature cold injury, and belongs to the technical field of wheat growth monitoring. A repeated sowing method is designed according to the wheat development process, and the low-temperature cold damage tolerance degree of different wheat varieties can be accurately identified. According to the method, the spike phenotype grading standard after the wheat is influenced by the low-temperature cold damage is formulated, and the wheat spike cold damage index is calculated according to the lightest damage grade and the most serious damage grade; according to the cold injury index range of wheat ears, six types including a highly blunt type, a moderate blunt type, a mild blunt type, a mild sensitive type, a moderate sensitive type and a highly sensitive type are divided. The method is beneficial for wheat breeders or wheat producers to identify the tolerance degree of wheat to cold injury.

Description

Technical Field

[0001] The invention belongs to the technical field of wheat growth monitoring, and in particular relates to a method for identifying the tolerance of wheat to low temperature and chilling damage. Background Art

[0002] Low temperature and chilling damage has a significant impact on the growth and development of wheat. It occurs randomly on certain days in March and April every year. Sometimes the low temperature sensitive period in the wheat development process (wheat pistil differentiation period, interplant period and tetrad period, etc.) will be staggered with the occurrence time of low temperature and chilling damage, and the degree of low temperature and chilling damage is low. Sometimes it will not be staggered, and symptoms of damage will appear when it occurs.

[0003] At present, the identification method of whether wheat has the trait of resistance to low temperature and chilling injury is relatively simple, and it is difficult to distinguish whether it has avoided the occurrence of low temperature and chilling injury or has the trait of resistance to low temperature and chilling injury. In addition, there has been no unified damage classification standard for identifying wheat resistance, and further research is still needed to obtain an identification method with high accuracy. Summary of the invention

[0004] In view of this, the object of the present invention is to provide a method for identifying the tolerance of wheat to low temperature and chilling injury.

[0005] In order to achieve the above-mentioned object of the invention, the present invention provides the following technical solutions:

[0006] A method for identifying the tolerance of wheat to low temperature and chilling injury, the method comprising the following steps:

[0007] 1) Start sowing wheat from September to October, repeat sowing 5 to 15 times, with an interval of 3 to 8 days between repeated sowings;

[0008] 2) Count the damage phenotypes of wheat ears and calculate the wheat low temperature damage index;

[0009] 3) Identify the tolerance of wheat to low temperature and chilling injury based on the wheat low temperature and chilling injury index;

[0010] The ear damage phenotype includes the number of sterile spikelets.

[0011] Preferably, the grading standard for the wheat ear damage phenotype is:

[0012] Level 0: wheat ears have no sterile spikelets;

[0013] Level 1: The number of sterile spikelets in wheat ears is ≤ 1 / 8;

[0014] Level 2: 1 / 8<number of sterile spikelets ≤ 1 / 4;

[0015] Level 3: 1 / 4<number of sterile spikelets ≤ 1 / 2;

[0016] Level 4: 1 / 2 < number of sterile spikelets of wheat ear ≤ 3 / 4;

[0017] Level 5: 3 / 4 < number of sterile spikelets of wheat ear < total number of spikelets;

[0018] Level 6: All spikelets are sterile.

[0019] Preferably, the low-temperature chilling injury index of the wheat is calculated by the following formula:

[0020]

[0021] Preferably, the corresponding grade value is the grade value corresponding to the ear damage phenotype;

[0022] The number of chilling injury ears at each level is the number of sterile spikelets at each level.

[0023] Preferably, the identification criteria in step 3) are:

[0024] When 0.00 ≤ low-temperature chilling injury index of wheat < 16.67, the tolerance of wheat to low-temperature chilling injury is identified as highly insensitive type;

[0025] When 16.67 ≤ low-temperature chilling injury index of wheat < 33.33, the tolerance of wheat to low-temperature chilling injury is identified as moderately insensitive type;

[0026] When 33.33 ≤ low-temperature chilling injury index of wheat < 50.00, the tolerance of wheat to low-temperature chilling injury is identified as slightly insensitive type;

[0027] When 50.00 ≤ low-temperature chilling injury index of wheat < 66.67, the tolerance of wheat to low-temperature chilling injury is identified as slightly sensitive type;

[0028] When 66.67 ≤ low-temperature chilling injury index of wheat < 83.33, the tolerance of wheat to low-temperature chilling injury is identified as moderately sensitive type;

[0029] When 83.33 ≤ low-temperature chilling injury index of wheat ≤ 100.00, the tolerance of wheat to low-temperature chilling injury is identified as highly sensitive type.

[0030] Compared with the prior art, the present invention has the following beneficial effects:

[0031] The present invention designs a method of repeated sowing for the wheat development process, which can accurately identify the tolerance degrees of different wheat varieties to low-temperature cold damage. The present invention also formulates a grading standard for the spike phenotypes of wheat affected by low-temperature cold damage, calculates the "spike cold damage index" according to the lightest and most severe damage levels for each level, and demarcates six types, namely highly insensitive type, moderately insensitive type, slightly insensitive type, slightly sensitive type, moderately sensitive type, and highly sensitive type, based on the range of the spike cold damage index. This method is beneficial for wheat breeders or wheat producers to identify the tolerance degrees of wheat to low-temperature cold damage. Description of the Drawings

[0032] Figure 1 It is a phenotypic diagram of the spike damage of wheat at level 0;

[0033] Figure 2 It is a phenotypic diagram of the spike damage of wheat at level 1;

[0034] Figure 3 It is a phenotypic diagram of the spike damage of wheat at level 2;

[0035] Figure 4 It is a phenotypic diagram of the spike damage of wheat at level 3;

[0036] Figure 5 It is a phenotypic diagram of the spike damage of wheat at level 4;

[0037] Figure 6 It is a phenotypic diagram of the spike damage of wheat at level 5;

[0038] Figure 7 It is a phenotypic diagram of the spike damage of wheat at level 6;

[0039] Figure 8 It is a comparison diagram of the spike damage phenotypes of wheat at each level;

[0040] Figure 9 It is a comparison diagram of the single-spike damage phenotypes of wheat at each level. Detailed Implementation Modes

[0041] A method for identifying the tolerance degree of wheat to low-temperature cold damage, the method comprising the following steps:

[0042] 1) Start sowing wheat from September to October, repeat sowing 5 to 15 times, and the interval between repeated sowings is 3 to 8 days;

[0043] 2) Count the phenotypic damage of wheat spikes and calculate the low-temperature cold damage index of wheat;

[0044] 3) Identify the tolerance degree of wheat to low-temperature cold damage according to the low-temperature cold damage index of wheat;

[0045] The phenotypic damage of the spikes includes the number of sterile spikelets.

[0046] In the present invention, the starting sowing time in step 1) is from September to October, preferably September 30th; the number of repeated sowing is 5 - 15 times, preferably 6 - 10 times, and more preferably 7 times; the interval between repeated sowing is 3 - 8 days, preferably 4 - 7 days, and more preferably 5 days.

[0047] In the present invention, the grading standard for the damaged phenotype of the wheat ear is as follows:

[0048] Grade 0: The wheat ear has no sterile spikelets.

[0049] Grade 1: The number of sterile spikelets in the wheat ear ≤ 1 / 8.

[0050] Grade 2: 1 / 8 < the number of sterile spikelets in the wheat ear ≤ 1 / 4.

[0051] Grade 3: 1 / 4 < the number of sterile spikelets in the wheat ear ≤ 1 / 2.

[0052] Grade 4: 1 / 2 < the number of sterile spikelets in the wheat ear ≤ 3 / 4.

[0053] Grade 5: 3 / 4 < the number of sterile spikelets in the wheat ear < the total number of spikelets.

[0054] Grade 6: All spikelets are sterile.

[0055] In the present invention, the damaged phenotype of the wheat ear at grade 6 is preferably that all spikelets are sterile, specifically, the wheat ear dries and withers inside the flag leaf sheath, or the wheat ear only has a rachis without spikelets, or the spikelets all wither and turn white or transparent or do not set seeds.

[0056] In the present invention, the low - temperature chilling injury index of the wheat is calculated by the following formula:

[0057]

[0058] In the present invention, the corresponding grade value is the grade value corresponding to the damaged phenotype of the wheat ear; the number of chilling - damaged ears at each level is the number of sterile spikelets at each level.

[0059] In the present invention, the identification criteria in step 3) are as follows:

[0060] When 0.00 ≤ the low - temperature chilling injury index of the wheat < 16.67, the tolerance degree of the wheat to low - temperature chilling injury is identified as highly insensitive type;

[0061] When 16.67 ≤ the low - temperature chilling injury index of the wheat < 33.33, the tolerance degree of the wheat to low - temperature chilling injury is identified as moderately insensitive type;

[0062] When 33.33 ≤ the low - temperature chilling injury index of the wheat < 50.00, the tolerance degree of the wheat to low - temperature chilling injury is identified as slightly insensitive type;

[0063] When 50.00 ≤ the low-temperature chilling injury index of wheat < 66.67, the tolerance degree of wheat to low-temperature chilling injury is identified as slightly sensitive type;

[0064] When 66.67 ≤ the low-temperature chilling injury index of wheat < 83.33, the tolerance degree of wheat to low-temperature chilling injury is identified as moderately sensitive type;

[0065] When 83.33 ≤ the low-temperature chilling injury index of wheat ≤ 100.00, the tolerance degree of wheat to low-temperature chilling injury is identified as highly sensitive type.

[0066] The technical solutions provided by the present invention will be described in detail below in conjunction with embodiments, but they cannot be understood as limiting the protection scope of the present invention.

[0067] Source of materials:

[0068] Xinong 511 is from Northwest A&F University;

[0069] Bainong 607 is from Henan Institute of Science and Technology;

[0070] Bainong 207 is from Henan Institute of Science and Technology;

[0071] Henong 4198 is from Hebei Agricultural University;

[0072] Yumai 158 is from Luohe Academy of Agricultural Sciences;

[0073] Fengdecunmai 5 is from Henan Fengdekang Seed Industry Co., Ltd.

[0074] Example 1

[0075] Starting from September 30th, wheat seeds are sown once every 5 days, and the sowing is repeated 7 times. The wheat varieties are Xinong 511, Bainong 607, Henong 4198, Yumai 158, and Fengdecunmai 5. The number of sterile spikelets of different wheat varieties is counted, and the damage phenotypes of wheat ears are classified according to the number of sterile spikelets.

[0076] The classification criteria for the damage phenotypes of wheat ears are as follows:

[0077] Grade 0: There are no sterile spikelets on the wheat ear;

[0078] Grade 1: The number of sterile spikelets on the wheat ear ≤ 1 / 8;

[0079] Grade 2: 1 / 8 < the number of sterile spikelets on the wheat ear ≤ 1 / 4;

[0080] Grade 3: 1 / 4 < the number of sterile spikelets on the wheat ear ≤ 1 / 2;

[0081] Grade 4: 1 / 2 < the number of sterile spikelets on the wheat ear ≤ 3 / 4;

[0082] Level 5: 3 / 4 < number of sterile spikelets of wheat ear < total number of spikelets;

[0083] Level 6: All spikelets are sterile, specifically, the wheat ear dries up in the flag leaf sheath, or the wheat ear only has a rachis without spikelets, or all spikelets wither and turn white or transparent or do not set seeds.

[0084] According to the number of sterile spikelets, design a reasonable calculation formula for the low-temperature chilling injury index of wheat:

[0085]

[0086] Detect the low-temperature chilling injury index of different wheat varieties:

[0087] When 0.00 ≤ low-temperature chilling injury index of wheat < 16.67, the tolerance degree of wheat to low-temperature chilling injury is identified as highly insensitive;

[0088] When 16.67 ≤ low-temperature chilling injury index of wheat < 33.33, the tolerance degree of wheat to low-temperature chilling injury is identified as moderately insensitive;

[0089] When 33.33 ≤ low-temperature chilling injury index of wheat < 50.00, the tolerance degree of wheat to low-temperature chilling injury is identified as slightly insensitive;

[0090] When 50.00 ≤ low-temperature chilling injury index of wheat < 66.67, the tolerance degree of wheat to low-temperature chilling injury is identified as slightly sensitive;

[0091] When 66.67 ≤ low-temperature chilling injury index of wheat < 83.33, the tolerance degree of wheat to low-temperature chilling injury is identified as moderately sensitive;

[0092] When 83.33 ≤ low-temperature chilling injury index of wheat ≤ 100.00, the tolerance degree of wheat to low-temperature chilling injury is identified as highly sensitive.

[0093] For representative varieties with different low-temperature chilling injury indexes, see Table 1.

[0094] Level 0: Xinong 511, Bainong 607;

[0095] Level 1: Bainong 207;

[0096] Level 2: Luomai 906;

[0097] Variety of Level 3: Henong 4198;

[0098] Level 4: Luomai 18;

[0099] Level 5: Jimai 4;

[0100] Varieties of Level 6: Yumai 158, Fengde Cuncunmai 5.

[0101] The 0-6 level damage phenotypes of wheat are shown in detail in Figures 1 to 7 , and the comparison diagrams of damage phenotypes at each level are shown in detail in Figure 8 and Figure 9 .

[0102] Table 1 Representative wheat varieties with different low temperature chilling injury indices

[0103]

[0104] Note: For each selected variety at a representative level, it only has a high probability of being damaged at that level. It does not mean that only the damage degree at that level occurs. There may be damage at other levels, but the probability is lower.

[0105] The above are only the preferred embodiments of the present invention. It should be noted that for those of ordinary skill in the art in this technical field, without departing from the principle of the present invention, several improvements and refinements can be made, and these improvements and refinements should also be regarded as the protection scope of the present invention.

Claims

1. A method for identifying the tolerance degree of wheat to low-temperature chilling injury, characterized in that, The method includes the following steps: 1) Start sowing wheat from September to October, and repeat sowing 5 - 15 times with an interval of 3 - 8 days between repeated sowings; 2) Count the damaged phenotypes of wheat ears and calculate the low - temperature chilling injury index of wheat; 3) Identify the tolerance degree of wheat to low - temperature chilling injury according to the low - temperature chilling injury index of wheat; The damaged phenotypes of the ears include the number of sterile spikelets.

2. The method according to claim 1, characterized in that The grading standard for the damaged phenotypes of wheat ears is as follows: Grade 0: There are no sterile spikelets on the wheat ear; Grade 1: The number of sterile spikelets on the wheat ear ≤ 1 / 8; Grade 2: 1 / 8 < the number of sterile spikelets on the wheat ear ≤ 1 / 4; Grade 3: 1 / 4 < the number of sterile spikelets on the wheat ear ≤ 1 / 2; Grade 4: 1 / 2 < the number of sterile spikelets on the wheat ear ≤ 3 / 4; Grade 5: 3 / 4 < the number of sterile spikelets on the wheat ear < the total number of spikelets; Grade 6: All spikelets are sterile.

3. The method according to claim 2, wherein The low - temperature chilling injury index of wheat is calculated by the following formula:

4. The method according to claim 3, wherein The corresponding grade value is the grade value corresponding to the damaged phenotype of the ear; The number of ears with chilling injury at each level is the number of sterile spikelets at each level.

5. The method according to claim 4, characterized in that, The identification criteria in step 3) are as follows: When 0.00 ≤ the low - temperature chilling injury index of wheat < 16.67, the tolerance degree of wheat to low - temperature chilling injury is identified as highly insensitive; When 16.67 ≤ the low - temperature chilling injury index of wheat < 33.33, the tolerance degree of wheat to low - temperature chilling injury is identified as moderately insensitive; When 33.33 ≤ the low - temperature chilling injury index of wheat < 50.00, the tolerance degree of wheat to low - temperature chilling injury is identified as slightly insensitive; When 50.00 ≤ the low - temperature chilling injury index of wheat < 66.67, the tolerance degree of wheat to low - temperature chilling injury is identified as slightly sensitive; When 66.67 ≤ the low - temperature chilling injury index of wheat < 83.33, the tolerance degree of wheat to low - temperature chilling injury is identified as moderately sensitive; When 83.33 ≤ the low - temperature chilling injury index of wheat ≤ 100.00, the tolerance degree of wheat to low - temperature chilling injury is identified as highly sensitive.

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