Testing device for server hardware

Abstract

The present application discloses a test device for server hardware, which relates to the technical field of servers. The test device for server hardware includes: a support plate, a test bench, and a clamping assembly. The test bench is rotatably arranged on the support plate, and the clamping assembly is movably arranged on the test bench. The clamping assembly includes: a fixing member and a movable member. The movable member is connected to the fixing member, and the movable member is movable relative to the fixing member in the circumferential direction of the test bench. There are multiple clamping assemblies, and the multiple clamping assemblies are arranged at intervals in the circumferential direction of the test bench. According to the test device for server hardware of the present application, testers can quickly and easily adjust the position and angle of the hardware to be tested, meet different test requirements, reduce the time required for repositioning or installing the hardware, improve the overall test efficiency, can adapt to various types and sizes of server hardware, reduce the need to replace the test device, and further improve the work efficiency.

Description

Technical Field

[0001] This application relates to the technical field of servers, and particularly to a testing device for server hardware. Background Art

[0002] In related technologies, it is pointed out that with the continuous development and complexity of server hardware, the requirements for the testing platform are also constantly increasing. Due to the fixed structure and single function of traditional testing platforms, it has become difficult to meet the current diverse and high-efficiency testing requirements. Especially during the testing process, it is impossible to flexibly adjust the angle and height of the server, which not only affects the testing efficiency but also may increase the work intensity of testers, reducing the accuracy and convenience of the testing work. Summary of the Invention

[0003] This application aims to solve at least one of the technical problems existing in the prior art. For this reason, this application proposes a testing device for server hardware, which improves the testing efficiency, reduces the work intensity of testers, and improves the accuracy and convenience of the testing work.

[0004] The testing device for server hardware according to this application includes: a support plate; a testing table rotatably provided on the support plate; a plurality of clamping components movably provided on the testing table. The clamping components include: a fixed member and a movable member. The movable member is connected to the fixed member, and the movable member is movable relative to the fixed member in the circumferential direction of the testing table. The plurality of clamping components are spaced apart in the circumferential direction of the testing table. Each clamping component is movable along the radial direction of the testing table. The movable member includes a first movable block and a second movable block. The first movable block is slidably connected to the fixed member relatively in the circumferential direction of the testing table, and the second movable block is slidably connected to the first movable block relatively in the circumferential direction of the testing table.

[0005] The testing device for server hardware according to this application, by providing a rotatable testing table and adjustable clamping components, testers can quickly and easily adjust the position and angle of the hardware to be tested, meet different testing requirements, reduce the time required for repositioning or installing the hardware, improve the overall testing efficiency, can adapt to various types and sizes of server hardware, reduce the need to replace the testing device, and further improve the work efficiency. By providing a fixed member, a first movable block, and a second movable block, the adjustability of the clamping component in the radial direction and the circumferential direction is realized, which can adapt to server hardware of various sizes and shapes, improve the versatility and practicality of the testing device for server hardware, reduce the time for reconfiguring the testing area, and enhance the overall testing efficiency.

[0006] In some feasible embodiments of the present application, a first mating portion is formed on the fixing member, a second mating portion is formed on the first movable block, and the first movable block and the fixing member are slidably mated through the first mating portion and the second mating portion.

[0007] In some feasible embodiments of the present application, a third mating portion is formed on the first movable block, a fourth mating portion is formed on the second movable block, and the second movable block and the first movable block are slidably mated through the third mating portion and the fourth mating portion.

[0008] In the above technical solution, the sliding adjustment between the first movable block and the fixing member is realized through the first mating portion and the second mating portion. The first mating portion and the second mating portion also play a guiding role, ensuring that the second movable block and the first movable block are slidably adjusted relative to the fixing member through the third mating portion and the fourth mating portion, solving the problem of poor flexibility in clamping hardware on the traditional test platform, and also improving the stability during the test process.

[0009] In some feasible embodiments of the present application, the test device for server hardware further includes: an adjustment mechanism, the adjustment mechanism is arranged between the support plate and the test bench, and the adjustment mechanism includes: a first transmission mechanism, a second transmission mechanism, an electromagnetic clutch, and a driving mechanism. The driving mechanism is switchably connected to the first transmission mechanism and the second transmission mechanism through the electromagnetic clutch.

[0010] In the above technical solution, by setting the electromagnetic clutch, the driving mechanism can be quickly and stably switched between connecting the first transmission mechanism and connecting the second transmission mechanism, realizing the expansion of functions without adding an additional power source. This not only saves space but also reduces the cost and the structural complexity of the test device for server hardware. The tester can quickly and easily adjust the position and angle of the hardware under test to meet different test requirements.

[0011] In some feasible embodiments of the present application, the electromagnetic clutch has a switchable engaged state and disengaged state. When the electromagnetic clutch is in the engaged state, the driving mechanism is connected to at least part of the clamping components of the plurality of clamping components through the first transmission mechanism, and is used to drive the clamping components to move in the radial direction of the test bench. When the electromagnetic clutch is in the disengaged state, the driving mechanism is connected to the test bench through the second transmission mechanism, and is used to drive the test bench to rotate.

[0012] In the above technical solution, a single driving mechanism can perform multiple functions, that is, it can achieve precise movement in the radial direction through the first transmission mechanism and also achieve the rotation of the test bench.

[0013] In some feasible embodiments of the present application, the first transmission mechanism includes: a first gear set, the first gear set includes a first bevel gear and a second bevel gear, and the first bevel gear meshes with the second bevel gear; a transmission rod, the first bevel gear is connected to the transmission rod, and the transmission rod is connected to the drive shaft of the drive mechanism through the electromagnetic clutch; a lead screw, the lead screw extends along the radial direction of the test bench and is rotatable relative to the test bench, and the second bevel gear is connected to the lead screw; a fitting, the fitting is connected to the fixing member, the fitting is sleeved on the lead screw and is threadedly connected to the lead screw.

[0014] In the above technical solution, by providing a lead screw, the rotational motion is converted into a linear motion to precisely control the position of the fitting. The first bevel gear and the second bevel gear mesh with each other to transmit power and change the transmission direction. The overall design of the first transmission mechanism is simple and the structure is compact, reducing the failure rate of the test device for server hardware.

[0015] In some feasible embodiments of the present application, the lead screws are arranged in one-to-one correspondence with the clamping assemblies.

[0016] In some feasible embodiments of the present application, the test bench is formed with an engaging portion. The second transmission mechanism includes: a second gear set, the second gear set includes a first gear and a second gear, and the second gear meshes with both the first gear and the engaging portion; a telescopic rod, one end of the telescopic rod is connected to the support plate, and the other end of the telescopic rod is connected to the second gear to drive the second gear to move in the up and down directions.

[0017] In the above technical solution, by providing a telescopic rod, the second gear can be moved in the up and down directions. When the test bench needs to be rotated, the electromagnetic clutch is powered off, the drive mechanism is disconnected from the first transmission mechanism, the telescopic rod extends to drive the second gear to move towards the plane where the first gear is located, so that the first gear meshes with the second gear. In this way, the drive mechanism can always be connected to only one of the first transmission mechanism and the second transmission mechanism, avoiding the situation where the drive mechanism is connected to both the first transmission mechanism and the second transmission mechanism at the same time, thereby avoiding accidents.

[0018] In some feasible embodiments of the present application, an installation cavity is defined between the test bench and the support plate, the drive mechanism and the second transmission mechanism are arranged in the installation cavity, and the engaging portion is formed on the peripheral wall of the installation cavity.

[0019] One of the test bench and the support plate is provided with a first sliding portion, and the other of the test bench and the support plate is provided with a second sliding portion. The test bench and the support plate are slidably matched through the first sliding portion and the second sliding portion.

[0020] In the above technical solution, the installation cavity is defined by the test bench and the support plate, making the overall structure of the test device for server hardware more compact, improving the space utilization rate. The test bench and the support plate cooperate and slide through the first sliding part and the second sliding part to achieve stable and accurate guiding, ensuring the smoothness during the rotation of the test bench.

[0021] In some feasible embodiments of the present application, the test device for server hardware further includes: a base disposed below the support plate; a lifting mechanism disposed between the base and the support plate to move the support plate in the up and down direction; a blower disposed on the support plate, and the blower is spaced apart from the test bench.

[0022] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present application. Brief Description of the Drawings

[0023] To more clearly illustrate the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0024] Figure 1 A test device for server hardware provided by an embodiment of the present application;

[0025] Figure 2 For Figure 1 A cross-sectional schematic view of the test device shown in

[0026] Figure 3 For Figure 2 A partial enlarged view of the a position shown in

[0027] Figure 4 For Figure 1 A structural schematic view of the clamping assembly shown in

[0028] Among them, the above-mentioned drawings include the following reference numerals:

[0029] 100. Test device for server hardware;

[0030] 1. Support plate; 11. Second sliding part; 12. Installation cavity;

[0031] 2. Test bench; 21. Guide groove; 22. First sliding part; 23. Engagement part;

[0032] 3. Clamping assembly; 31. Fixing member; 311. First mating portion; 32. First movable block; 321. Second mating portion; 322. Third mating portion; 33. Second movable block; 331. Fourth mating portion; 332. Anti-slip groove;

[0033] 4. First transmission mechanism; 41. First bevel gear; 42. Second bevel gear; 43. Transmission rod; 44. Lead screw; 45. Fitting;

[0034] 5. Second transmission mechanism; 51. First gear; 52. Second gear; 53. Telescopic rod;

[0035] 6. Driving mechanism; 61. Driving shaft;

[0036] 7. Electromagnetic clutch; 8. Base;

[0037] 9. Lifting mechanism; 10. Fan. Detailed implementation manners

[0038] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the protection scope of the present application.

[0039] It should be noted that the orientation or positional relationship indicated by terms such as "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present application. The terms "mounted", "connected", "coupled" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. The terms "parallel", "perpendicular", "equal" include the described situations and situations similar to the described situations, and the range of the similar situations is within an acceptable deviation range, where the acceptable deviation range is determined by those of ordinary skill in the art considering the measurements being discussed and the errors associated with the measurements of specific quantities (i.e., the limitations of the measurement system). For example, "parallel" includes absolute parallel and approximate parallel, where the acceptable deviation range of approximate parallel can be, for example, within 5° deviation; "perpendicular" includes absolute perpendicular and approximate perpendicular, where the acceptable deviation range of approximate perpendicular can also be, for example, within 5° deviation. "Equal" includes absolute equality and approximate equality, where the acceptable deviation range of approximate equality can be, for example, that the difference between the two equal ones is less than or equal to 5% of either one. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific situations.

[0040] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "comprising" and "having" and any variations thereof in the specification and claims of this application and the above description of the drawings are intended to cover non-exclusive inclusion.

[0041] In the description of the embodiments of this application, technical terms such as "first", "second", etc. are only used to distinguish different objects and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity, specific order or primary-secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "a plurality of" is more than two, unless otherwise specifically defined.

[0042] References herein to "embodiments" mean that particular features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0043] In the description of the embodiments of the present application, the term "and / or" is merely a description of the association relationship between associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this article generally represents an "or" relationship between the associated objects before and after.

[0044] In the description of the embodiments of the present application, the term "plurality" refers to two or more (including two).

[0045] It is pointed out in the related art that with the continuous development and complexity of server hardware, the requirements for the test platform are also constantly increasing. Due to the fixed structure and single function of the traditional test platform, it has been difficult to meet the current diverse and high-efficiency test requirements. Especially during the test process, the inability to flexibly adjust the angle and height of the server not only affects the test efficiency but may also increase the work intensity of the test personnel, reducing the accuracy and convenience of the test work.

[0046] Based on the above considerations, in order to meet the current diverse and high-efficiency test requirements, the applicant has designed a test device for server hardware through in-depth research. The following refers to Figures 1 - 4 Describe the test device for server hardware according to the embodiments of the present application.

[0047] As Figures 1 - 4 shown, Figure 1 A test device for server hardware provided by an embodiment of the present application; Figure 2 is Figure 1 A cross-sectional schematic diagram of the test device for server hardware shown in Figure 3 is Figure 2 A partial enlarged view of the a position shown in Figure 4 is Figure 1 A structural schematic diagram of the clamping assembly shown in

[0048] The test device 100 for server hardware according to the embodiments of the present application includes: a support plate 1, a test bench 2, and a clamping assembly 3.

[0049] Specifically, the test bench 2 is rotatably arranged on the support plate 1, and the clamping assembly 3 is movably arranged on the test bench 2. The clamping assembly 3 includes: a fixed member 31 and a movable member. The movable member is connected to the fixed member 31, and the movable member is movable relative to the fixed member 31 in the circumferential direction of the test bench 2. There are multiple clamping assemblies 3, and the multiple clamping assemblies 3 are arranged at intervals in the circumferential direction of the test bench 2. Each clamping assembly 3 is movable along the radial direction of the test bench 2. The movable member includes a first movable block 32 and a second movable block 33. The first movable block 32 is slidably connected to the fixed member 31 relatively in the circumferential direction of the test bench 2, and the second movable block 33 is slidably connected to the first movable block 32 relatively in the circumferential direction of the test bench 2. Thus, through the rotatable test bench 2 and the adjustable clamping assembly 3, the tester can quickly and easily adjust the position and angle of the hardware to be tested, meet different test requirements, reduce the time required for repositioning or installing the hardware, improve the overall test efficiency, be able to adapt to various types and sizes of server hardware, reduce the need for replacing the test device 100 of the server hardware, and further improve the work efficiency; moreover, by setting the fixed member 31, the first movable block 32 and the second movable block 33, the adjustability of the clamping assembly 3 in the radial direction and the circumferential direction is realized, it can adapt to server hardware of various sizes and shapes, improve the versatility and practicability of the test device 100 of the server hardware, reduce the time for reconfiguring the test area, and enhance the overall test efficiency.

[0050] It can be understood that the support plate 1 is the basis of the test device 100 for server hardware. The support plate 1 provides a stable installation position for the test bench 2. The test bench 2 is arranged on the support plate 1 and is rotatable relative to the support plate 1. The clamping assembly 3 is used to fix the server hardware to be tested to ensure that the server hardware remains stable during the test. Each clamping assembly 3 includes a fixed member 31 and a movable member. The movable member is movably connected to the fixed member 31, and the movable member and the fixed member 31 are movable relative to the circumferential direction of the test bench 2. In this way, by adjusting the position of the movable member, it can adapt to server hardware of different sizes and shapes. Moreover, in order to be able to stably clamp the server hardware, multiple clamping assemblies 3 are provided, and the multiple clamping assemblies 3 are evenly arranged at intervals in the circumferential direction of the test bench 2, enhancing the stability and reliability of the clamping.

[0051] For example, referring to Figure 1As shown in the figure, the test bench 2 is arranged on the upper side of the support plate 1. The test bench 2 is connected to the support plate 1. The test bench 2 is formed in a circular shape. The test bench 2 is rotatable relative to the support plate 1 in the circumferential direction of the test bench 2. There are four clamping assemblies 3. The four clamping assemblies 3 are evenly spaced in the circumferential direction of the test bench 2. The four clamping assemblies 3 enclose a test area. The server hardware is placed in the test area. The size and shape of the test area are defined by the four clamping assemblies 3. Specifically, the distance between the four clamping assemblies 3 defines the size of the test area. Each clamping assembly 3 includes a fixed part 31 and a movable part. The relative position of the movable part and the fixed part 31 defines the shape of the test area.

[0052] As Figure 1 and Figure 4 shown in the figure, the clamping assembly 3 includes four. Each of the four clamping assemblies 3 includes a fixed part 31, a first movable block 32 and two second movable blocks 33. The first movable block 32 is slidably connected to the fixed part 31. The first movable block 32 is slidable relative to the fixed part 31 in the circumferential direction of the test bench 2 (such as Figure 1 the A direction shown in the figure). The two second movable blocks 33 are arranged adjacent to each other in the length direction of the first movable block 32. Each second movable block 33 is slidably connected to the first movable block 32. Each second movable block 33 is slidable relative to the first movable block 32 in the circumferential direction. In this way, the clamping assembly 3 can not only be adjusted according to the size of the server hardware, but also be adjusted according to the shape of the server hardware. When clamping hardware with an irregular shape, the position of the second movable block 33 can be adjusted to ensure the best fixing effect.

[0053] According to the test device 100 for server hardware of the embodiment of the present application, by setting the rotatable test bench 2 and the adjustable clamping assembly 3, the tester can quickly and easily adjust the position and angle of the hardware to be tested, meet different test requirements, reduce the time required for repositioning or installing the hardware, improve the overall test efficiency, can adapt to various types and sizes of server hardware, reduce the need to replace the test device 100 for server hardware, and further improve the work efficiency; by setting the fixed part 31, the first movable block 32 and the second movable block 33, the adjustability of the clamping assembly 3 in the radial direction and the circumferential direction is realized, which can adapt to server hardware of various sizes and shapes, improve the versatility and practicability of the test device 100 for server hardware, reduce the time for reconfiguring the test area, and improve the overall test efficiency.

[0054] Further, a first engaging portion 311 is formed on the fixing member 31, a second engaging portion 321 is formed on the first movable block 32, the first movable block 32 and the fixing member 31 are slidably engaged through the first engaging portion 311 and the second engaging portion 321, a third engaging portion 322 is formed on the first movable block 32, a fourth engaging portion 331 is formed on the second movable block 33, and the second movable block 33 and the first movable block 32 are slidably engaged through the third engaging portion 322 and the fourth engaging portion 331. Thus, the sliding adjustment between the first movable block 32 and the fixing member 31 is realized through the first engaging portion 311 and the second engaging portion 321. The first engaging portion 311 and the second engaging portion 321 also play a guiding role, ensuring that the first movable block 32 relative to the fixing member 31 realizes the sliding adjustment between the second movable block 33 and the first movable block 32 through the third engaging portion 322 and the fourth engaging portion 331, solving the problem of poor flexibility when the traditional test platform clamps the hardware, and improving the stability during the test process.

[0055] It can be understood that, as Figure 1 and Figure 4 shown, a first engaging portion 311 is formed on the fixing member 31. The first engaging portion 311 is formed as a first sliding groove, and the first sliding groove extends along the A direction. A second engaging portion 321 is formed on the first movable block 32. The second engaging portion 321 is formed as a first sliding block, and the first sliding block extends along the A direction. The first sliding block is located in the first sliding groove, and the first sliding block is slidable relative to the first sliding groove. Two first sliding grooves are formed on each fixing member 31, and the two first sliding grooves are arranged at intervals in the up-and-down direction. Two first sliding blocks are formed on each first movable block 32, and the two first sliding blocks are arranged at intervals in the up-and-down direction. The two first sliding grooves and the two first sliding blocks correspond to each other one by one. A third engaging portion 322 is formed on the first movable block 32. The third engaging portion 322 is formed as a second sliding groove, and the second sliding groove extends along the A direction. A fourth engaging portion 331 is formed on the second movable block 33. The fourth engaging portion 331 is formed as a second sliding block, and the second sliding block extends along the A direction. The second sliding block is located in the second sliding groove, and the second sliding block is slidable relative to the second sliding groove. Four second sliding grooves are formed on each first movable block 32. The four second sliding grooves are divided into two groups, and the two second sliding grooves in each group are arranged at intervals in the up-and-down direction. Two second sliding blocks are formed on each second movable block 33, and the two second sliding blocks are arranged at intervals in the up-and-down direction. The two second sliding blocks of each second movable block 33 are engaged with the corresponding two second sliding grooves.

[0056] Further, as Figure 4 shown, an anti-slip portion is formed on the surface of the second movable block 33 facing the test area. The anti-slip portion is formed as an anti-slip groove 332, and the anti-slip groove 332 extends in the up-and-down direction. The anti-slip groove 332 includes a plurality of them, and the plurality of anti-slip grooves 332 are arranged in the radial direction.

[0057] In other embodiments of the present application, the first engaging portion 311 and the second engaging portion 321 may also be formed in a form of cooperation between a track and a ball or a form of cooperation between a roller and a guide groove. The third engaging portion 322 and the fourth engaging portion 331 may also be formed in a form of cooperation between a track and a ball or a form of cooperation between a roller and a guide groove. The cooperation form between the first engaging portion 311 and the second engaging portion 321 includes but is not limited to this, and the cooperation form between the third engaging portion 322 and the fourth engaging portion 331 includes but is not limited to this.

[0058] In any one of the embodiments of the present application, the test device 100 for server hardware further includes: an adjusting mechanism. The adjusting mechanism is disposed between the support plate 1 and the test bench 2. The adjusting mechanism includes: a first transmission mechanism 4, a second transmission mechanism 5, an electromagnetic clutch 7, and a driving mechanism 6. The driving mechanism 6 is switchably connected to the first transmission mechanism 4 and the second transmission mechanism 5 through the electromagnetic clutch 7. Thus, by providing the electromagnetic clutch 7, the driving mechanism 6 can be quickly and stably switched between connecting the first transmission mechanism 4 and connecting the second transmission mechanism 5, and the function can be expanded without adding an additional power source. This not only saves space but also reduces the cost and the structural complexity of the test device 100 for server hardware. The tester can quickly and easily adjust the position and angle of the hardware to be tested to meet different test requirements.

[0059] It can be understood that with reference to Figure 2 As shown, the adjusting mechanism is located between the support plate 1 and the test bench 2. The first transmission mechanism 4, the second transmission mechanism 5, the electromagnetic clutch 7, and the driving mechanism 6 are all located between the support plate 1 and the test bench 2. When the electromagnetic clutch 7 is energized, the driving mechanism 6 is connected to the first transmission mechanism 4. The driving mechanism 6 is connected to the first transmission mechanism 4 through the electromagnetic clutch 7 and transmits power to the first transmission mechanism 4. When the electromagnetic clutch 7 is de-energized, the driving mechanism 6 is connected to the second transmission mechanism 5. The driving mechanism 6 is connected to the second transmission mechanism 5 and transmits power to the second transmission mechanism 5.

[0060] Further, the electromagnetic clutch 7 has a switchable engaged state and disengaged state. When the electromagnetic clutch 7 is in the engaged state, the driving mechanism 6 is connected to at least some of the clamping assemblies 3 of the plurality of clamping assemblies 3 through the first transmission mechanism 4 for driving the clamping assemblies 3 to move in the radial direction of the test bench 2. When the electromagnetic clutch 7 is in the disengaged state, the driving mechanism 6 is connected to the test bench 2 through the second transmission mechanism 5 for driving the test bench 2 to rotate. Thus, a single driving mechanism 6 can perform multiple functions, that is, it can achieve precise movement in the radial direction through the first transmission mechanism 4 and can also achieve the rotation of the test bench 2.

[0061] It can be understood that as Figure 2 andFigure 3 As shown, the electromagnetic clutch 7 realizes the switching between the engaged state and the disengaged state by energizing and de-energizing. When the electromagnetic clutch 7 is in the engaged state, the driving mechanism 6 is connected to the four clamping assemblies 3 through the first transmission mechanism 4, and the power of the driving mechanism 6 is transmitted to the clamping assemblies 3, enabling the clamping assemblies 3 to move in the radial direction of the test bench 2 for adjusting the positions of the clamping assemblies 3 to accurately clamp the hardware under test. When the electromagnetic clutch 7 is in the disengaged state, the driving mechanism 6 is connected to the test bench 2 through the second transmission mechanism 5, and the power of the driving mechanism 6 is transmitted to the test bench 2, causing the test bench 2 to rotate about the axis for adjusting the angle of the hardware under test.

[0062] In any embodiment of the present application, the first transmission mechanism 4 includes: a first gear set, a transmission rod 43, a lead screw 44, and a fitting 45. The first gear set includes a first bevel gear 41 and a second bevel gear 42. The first bevel gear 41 meshes with the second bevel gear 42. The first bevel gear 41 is connected to the transmission rod 43. The transmission rod 43 is connected to the drive shaft 61 of the driving mechanism 6 through the electromagnetic clutch 7. The lead screw 44 extends in the radial direction of the test bench 2 and is rotatable relative to the test bench 2. The second bevel gear 42 is connected to the lead screw 44. The fitting 45 is connected to the fixing member 31. The fitting 45 is sleeved on the lead screw 44 and is threadedly connected to the lead screw 44. Thus, by providing the lead screw 44, the rotational motion is converted into a linear motion for accurately controlling the position of the fitting 45. The first bevel gear 41 and the second bevel gear 42 mesh with each other for transmitting power and changing the transmission direction. The overall design of the first transmission mechanism 4 is simple and the structure is compact, reducing the failure rate of the test device 100 for server hardware.

[0063] It can be understood that, referring to Figure 2 As shown, the first bevel gear 41 is connected to the transmission rod 43. The transmission rod 43 extends in the up and down direction. When the electromagnetic clutch 7 is in the engaged state, the transmission rod 43 is connected to the drive shaft 61 of the driving mechanism 6. The lead screw 44 extends in the horizontal direction. The second bevel gear 42 is connected to the lead screw 44. The fitting 45 is sleeved on the lead screw 44. The fitting 45 is connected to the fixing member 31. In this way, when the electromagnetic clutch 7 is in the engaged state, the power provided by the driving mechanism 6 is transmitted from the transmission rod 43 to the first bevel gear 41. The first bevel gear 41 transmits the power to the second bevel gear 42. The second bevel gear 42 transmits the power to the lead screw 44. The lead screw 44 rotates about its own axis, so that the fitting 45 moves in the axial direction of the lead screw 44, driving the clamping assembly 3 to move in the radial direction of the test bench 2.

[0064] Further, the first bevel gear 41 includes one, and the second bevel gear 42 includes four. One first bevel gear 41 meshes with four second bevel gears 42 simultaneously. In this way, the synchronous control of the clamping assembly 3 is achieved, ensuring the synchronous movement of the four clamping assemblies 3 and improving the clamping stability and reliability of the clamping assembly 3.

[0065] Referring to Figure 1 and Figure 2 As shown, the clamping assembly 3 includes four, and the lead screw 44 includes four. The lead screw 44 and the clamping assembly 3 are arranged in one-to-one correspondence. A second bevel gear 42 is connected to each lead screw 44. In this way, each lead screw 44 correspondingly transmits power to one clamping assembly 3, which can ensure the accuracy of the operation, avoid mutual interference between multiple clamping assemblies 3, reduce the failure rate, and facilitate maintenance.

[0066] In any embodiment of the present application, the test bench 2 is formed with a meshing portion 23. The second transmission mechanism 5 includes: a second gear set and a telescopic rod 53. The second gear set includes a first gear 51 and a second gear 52. The second gear 52 meshes with both the first gear 51 and the meshing portion 23. One end of the telescopic rod 53 is connected to the support plate 1, and the other end of the telescopic rod 53 is connected to the second gear 52 to drive the second gear 52 to move in the up and down direction. Thus, by setting the telescopic rod 53, the movement of the second gear 52 in the up and down direction can be realized. When it is necessary to rotate the test bench 2, the electromagnetic clutch 7 is powered off, the driving mechanism 6 is disconnected from the first transmission mechanism 4, and the telescopic rod 53 extends to drive the second gear 52 to move towards the plane where the first gear 51 is located, so that the first gear 51 meshes with the second gear 52. In this way, the driving mechanism 6 can always be connected to only one of the first transmission mechanism 4 and the second transmission mechanism 5, avoiding the situation where the driving mechanism 6 is simultaneously connected to the first transmission mechanism 4 and the second transmission mechanism 5, thereby avoiding accidents.

[0067] It can be understood that, referring to Figure 2 As shown, the meshing portion 23 is formed on the test bench 2. The first gear 51 and the test bench 2 are coaxially arranged. The second gear 52 is located between the first gear 51 and the test bench 2 and meshes with both the first gear 51 and the meshing portion 23. The telescopic rod 53 extends in the up and down direction. The lower end of the telescopic rod 53 is fixedly connected to the support plate 1, and the upper end of the telescopic rod 53 is connected to the second gear 52. The telescopic rod 53 drives the second gear 52 to move in the up and down direction, so that the second gear 52 can mesh with the first gear 51 and the meshing portion 23, or the second gear 52 can be disengaged from between the first gear 51 and the meshing portion 23. A guiding groove 21 is formed on the test bench 2. The guiding groove 21 extends along the radial direction of the test bench 2. The fitting 45 passes through the guiding groove 21 and is connected to the fixing member 31.

[0068] In any embodiment of the present application, an installation cavity 12 is defined between the test bench 2 and the support plate 1. The driving mechanism 6 and the second transmission mechanism 5 are arranged in the installation cavity 12. The meshing portion 23 is formed on the peripheral wall of the installation cavity 12. One of the test bench 2 and the support plate 1 is provided with a first sliding portion 22, and the other of the test bench 2 and the support plate 1 is provided with a second sliding portion 11. The test bench 2 and the support plate 1 cooperate and slide through the first sliding portion 22 and the second sliding portion 11. Thus, the installation cavity 12 is defined by the test bench 2 and the support plate 1, making the overall structure of the test device 100 for server hardware more compact, improving the space utilization rate. The test bench and the support plate 1 cooperate and slide through the first sliding portion 22 and the second sliding portion 11 to achieve stable and accurate guiding, ensuring the smoothness of the test bench 2 during rotation.

[0069] It can be understood that, referring to Figure 2 As shown, the test bench 2 is formed with a first groove that is recessed upward, and the support plate 1 is formed with a second groove that is recessed downward. The first groove and the second groove cooperate to form the installation cavity 12. The driving mechanism 6, the first transmission mechanism 4, and the second transmission mechanism 5 are all arranged in the installation cavity 12. The meshing portion 23 is formed on the peripheral wall of the first groove. The test bench 2 is provided with a first sliding portion 22, and the first sliding portion 22 is formed as a sliding block. The support plate 1 is formed with a second sliding portion 11, and the second sliding portion 11 is formed as a sliding groove. The sliding block is arranged in the sliding groove, and the sliding block is slidable in the sliding groove. The sliding groove extends circumferentially along the test bench 2 to form a ring.

[0070] In any embodiment of the present application, the test device 100 for server hardware further includes: a base 8, a lifting mechanism 9, and a blower 10. The base 8 is arranged below the support plate 1. The lifting mechanism 9 is arranged between the base 8 and the support plate 1 to enable the support plate 1 to move in the up and down direction. The blower 10 is arranged on the support plate 1, and the blower 10 is spaced apart from the test bench 2. Referring to Figure 1 As shown, the base 8 is arranged below the support plate 1, providing a stable support for the test device 100 for server hardware. The lifting mechanism 9 is located between the base 8 and the support plate 1 and is used to drive the support plate 1 to move in the up and down direction, realizing the height adjustment function of the test bench 2. The blower 10 is arranged on the support plate 1, and the blower 10 is used to maintain the temperature stability of the test environment and prevent overheating from affecting the test results.

[0071] Next, the test device 100 for server hardware according to a specific embodiment of the present application will be described with reference to Figures 1 - 4 Referring to

[0072] As shown in Figures 1 - 4 the test device 100 for server hardware includes: a support plate 1, a test bench 2, a clamping assembly 3, a base 8, a lifting mechanism 9, and a blower 10.

[0073] Specifically, the test bench 2 is disposed on the upper side of the support plate 1. The test bench 2 is connected to the support plate 1. The test bench 2 is formed in a circular shape. The test bench 2 is rotatable relative to the support plate 1 in the circumferential direction of the test bench 2. There are four clamping assemblies 3. The four clamping assemblies 3 are evenly spaced in the circumferential direction of the test bench 2. The four clamping assemblies 3 enclose a test area. The server hardware is placed in the test area. The size and shape of the test area are defined by the four clamping assemblies 3. Specifically, the distance between the four clamping assemblies 3 defines the size of the test area. Each clamping assembly 3 includes a fixed member 31 and a movable member. The relative position between the movable member and the fixed member 31 defines the shape of the test area.

[0074] There are four clamping assemblies 3. Each of the four clamping assemblies 3 includes a fixed member 31, a first movable block 32, and two second movable blocks 33. The first movable block 32 is slidably connected to the fixed member 31. The first movable block 32 is slidable relative to the fixed member 31 in the circumferential direction of the test bench 2. The two second movable blocks 33 are arranged adjacent to each other in the length direction of the first movable block 32. Each second movable block 33 is slidably connected to the first movable block 32. Each second movable block 33 is slidable relative to the first movable block 32 in the circumferential direction. In this way, the clamping assembly 3 can not only be adjusted according to the size of the server hardware, but also be adjusted according to the shape of the server hardware. When clamping hardware with an irregular shape, the position of the second movable block 33 can be adjusted to ensure the best fixing effect.

[0075] The fixed member 31 is formed with a first mating portion 311. The first mating portion 311 is formed as a first chute. The first chute extends along the A direction. The first movable block 32 is formed with a second mating portion 321. The second mating portion 321 is formed as a first slider. The first slider extends along the A direction. The first slider is located in the first chute, and the first slider is slidable relative to the first chute. Each fixed member 31 is formed with two first chutes. The two first chutes are spaced apart in the up and down direction. Each first movable block 32 is formed with two first sliders. The two first sliders are spaced apart in the up and down direction. The two first chutes and the two first sliders correspond to each other one by one. The first movable block 32 is formed with a third mating portion 322. The third mating portion 322 is formed as a second chute. The second chute extends along the A direction. The second movable block 33 is formed with a fourth mating portion 331. The fourth mating portion 331 is formed as a second slider. The second slider extends along the A direction. The second slider is located in the second chute, and the second slider is slidable relative to the second chute. Each first movable block 32 is formed with four second chutes. The four second chutes are grouped in pairs. The two second chutes in each group are spaced apart in the up and down direction. Each second movable block 33 is formed with two second sliders. The two second sliders are spaced apart in the up and down direction. The two second sliders of each second movable block 33 cooperate with the corresponding two second chutes.

[0076] On one side surface of the second movable block 33 facing the test area, an anti-slip portion is formed. The anti-slip portion is formed as an anti-slip groove 332. The anti-slip groove 332 extends in the up and down direction. There are a plurality of anti-slip grooves 332, and the plurality of anti-slip grooves 332 are arranged in the radial direction. The adjusting mechanism is located between the support plate 1 and the test bench 2. The first transmission mechanism 4, the second transmission mechanism 5, the electromagnetic clutch 7 and the driving mechanism 6 are all located between the support plate 1 and the test bench 2. When the electromagnetic clutch 7 is energized, the driving mechanism 6 is connected to the first transmission mechanism 4. The driving mechanism 6 is connected to the first transmission mechanism 4 through the electromagnetic clutch 7 and transmits power to the first transmission mechanism 4. When the electromagnetic clutch 7 is de-energized, the driving mechanism 6 is connected to the second transmission mechanism 5 and transmits power to the second transmission mechanism 5.

[0077] The electromagnetic clutch 7 realizes the switching between the engaged state and the disengaged state by means of energization and de-energization. When the electromagnetic clutch 7 is in the engaged state, the driving mechanism 6 is connected to the four clamping assemblies 3 through the first transmission mechanism 4. The power of the driving mechanism 6 is transmitted to the clamping assemblies 3, so that the clamping assemblies 3 can move in the radial direction of the test bench 2 to adjust the positions of the clamping assemblies 3 for accurately clamping the hardware to be tested. When the electromagnetic clutch 7 is in the disengaged state, the driving mechanism 6 is connected to the test bench 2 through the second transmission mechanism 5. The power of the driving mechanism 6 is transmitted to the test bench 2, so that the test bench 2 rotates around the axis to adjust the angle of the hardware to be tested.

[0078] The first bevel gear 41 is connected to the transmission rod 43. The transmission rod 43 extends in the up and down direction. When the electromagnetic clutch 7 is in the engaged state, the transmission rod 43 is connected to the drive shaft 61 of the driving mechanism 6. The lead screw 44 extends in the horizontal direction. The second bevel gear 42 is connected to the lead screw 44. A fitting 45 is sleeved on the lead screw 44, and the fitting 45 is connected to the fixing member 31. In this way, when the electromagnetic clutch 7 is in the engaged state, the power provided by the driving mechanism 6 is transmitted from the transmission rod 43 to the first bevel gear 41. The first bevel gear 41 transmits the power to the second bevel gear 42. The second bevel gear 42 transmits the power to the lead screw 44. The lead screw 44 rotates around its own axis, so that the fitting 45 moves along the axial direction of the lead screw 44 to drive the clamping assembly 3 to move in the radial direction of the test bench 2.

[0079] There are four clamping assemblies 3 and four lead screws 44. The lead screws 44 are arranged in one-to-one correspondence with the clamping assemblies 3. A second bevel gear 42 is connected to each lead screw 44. In this way, each lead screw 44 correspondingly transmits power to a clamping assembly 3, which can ensure the accuracy of operation, avoid mutual interference between multiple clamping assemblies 3, reduce the failure rate, and facilitate maintenance. There is one first bevel gear 41 and four second bevel gears 42. One first bevel gear 41 meshes with the four second bevel gears 42 simultaneously. In this way, synchronous control of the clamping assemblies 3 is achieved, ensuring the motion synchronism of the four clamping assemblies 3 and improving the clamping stability and reliability of the clamping assemblies 3.

[0080] The meshing portion 23 is formed on the test bench 2. The first gear 51 and the test bench 2 are coaxially arranged. The second gear 52 is located between the first gear 51 and the test bench 2 and meshes with both the first gear 51 and the meshing portion 23. The telescopic rod 53 extends in the vertical direction. The lower end of the telescopic rod 53 is fixedly connected to the support plate 1, and the upper end of the telescopic rod 53 is connected to the second gear 52. The telescopic rod 53 drives the second gear 52 to move in the vertical direction, so that the second gear 52 can mesh with the first gear 51 and the meshing portion 23, or the second gear 52 can be disengaged from between the first gear 51 and the meshing portion 23. A guiding groove 21 is formed on the test bench 2, and the guiding groove 21 extends along the radial direction of the test bench 2. The fitting 45 passes through the guiding groove 21 and is connected to the fixing member 31.

[0081] The test bench 2 forms an upwardly concave first groove, and the support plate 1 forms a downwardly concave second groove. The first groove and the second groove cooperate to form an installation cavity 12. The driving mechanism 6, the first transmission mechanism 4, and the second transmission mechanism 5 are all arranged in the installation cavity 12. The meshing portion 23 is formed on the peripheral wall of the first groove. A first sliding portion 22 is provided on the test bench 2, and the first sliding portion 22 is formed as a sliding block. A second sliding portion 11 is formed on the support plate 1, and the second sliding portion 11 is formed as a sliding groove. The sliding block is arranged in the sliding groove and can slide in the sliding groove. The sliding groove extends circumferentially along the test bench 2 to form a ring.

[0082] The base 8 is arranged below the support plate 1, providing a stable support for the test device 100 of the server hardware. The lifting mechanism 9 is located between the base 8 and the support plate 1 and is used to drive the support plate 1 to move in the vertical direction, realizing the height adjustment function of the test bench 2. The blower 10 is arranged on the support plate 1, and the blower 10 is used to maintain the temperature stability of the test environment and prevent overheating from affecting the test results.

[0083] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirits of the present application. The scope of the present application is defined by the claims and their equivalents.

Claims

1. A test device for server hardware, characterized in that Including: Support plate (1); Testing table (2), which is rotatably arranged on the support plate (1); A plurality of clamping assemblies (3), which are movably arranged on the testing table (2). The clamping assembly (3) includes: a fixing member (31) and a movable member. The movable member is connected to the fixing member (31), and the movable member is movable relative to the fixing member (31) in the circumferential direction of the testing table (2). The plurality of clamping assemblies (3) are arranged at intervals in the circumferential direction of the testing table (2). Each clamping assembly (3) is movable along the radial direction of the testing table (2). The movable member includes a first movable block (32) and a second movable block (33). The first movable block (32) is slidably connected to the fixing member (31) relatively in the circumferential direction of the testing table (2), and the second movable block (33) is slidably connected to the first movable block (32) relatively in the circumferential direction of the testing table (2).

2. The test device for server hardware according to claim 1, characterized in that, A first mating portion (311) is formed on the fixing member (31), and a second mating portion (321) is formed on the first movable block (32). The first movable block (32) and the fixing member (31) are slidably mated through the first mating portion (311) and the second mating portion (321).

3. The test device for server hardware according to claim 1, characterized in that A third mating portion (322) is formed on the first movable block (32), and a fourth mating portion (331) is formed on the second movable block (33). The second movable block (33) and the first movable block (32) are slidably mated through the third mating portion (322) and the fourth mating portion (331).

4. The test device for server hardware according to claim 2, wherein, Also including: An adjusting mechanism, which is arranged between the support plate (1) and the testing table (2). The adjusting mechanism includes: a first transmission mechanism (4), a second transmission mechanism (5), an electromagnetic clutch (7), and a driving mechanism (6). The driving mechanism (6) is switchably connected to the first transmission mechanism (4) and the second transmission mechanism (5) through the electromagnetic clutch (7).

5. The test device for server hardware according to claim 4, characterized in that, The electromagnetic clutch (7) has a switchable engaged state and disengaged state. When the electromagnetic clutch (7) is in the engaged state, the driving mechanism (6) is connected to at least part of the plurality of clamping assemblies (3) through the first transmission mechanism (4) for driving the clamping assembly (3) to move in the radial direction of the testing table (2). When the electromagnetic clutch (7) is in the disengaged state, the driving mechanism (6) is connected to the testing table (2) through the second transmission mechanism (5) for driving the testing table (2) to rotate.

6. The test device for server hardware according to claim 5, wherein The first transmission mechanism (4) includes: A first gear set, which includes a first bevel gear (41) and a second bevel gear (42). The first bevel gear (41) meshes with the second bevel gear (42); A transmission rod (43), the first bevel gear (41) is connected to the transmission rod (43), and the transmission rod (43) is connected to the drive shaft (61) of the drive mechanism (6) through the electromagnetic clutch (7); A lead screw (44), the lead screw (44) extends along the radial direction of the test bench (2) and is rotatable relative to the test bench (2), and the second bevel gear (42) is connected to the lead screw (44); A fitting (45), the fitting (45) is connected to the fixing member (31), the fitting (45) is sleeved on the lead screw (44) and is threadedly connected to the lead screw (44).

7. The test device for server hardware according to claim 6, wherein The lead screw (44) and the clamping assembly (3) are arranged in one-to-one correspondence.

8. The test device for server hardware according to claim 5, characterized in that The test bench (2) is formed with an engaging portion (23), and the second transmission mechanism (5) includes: A second gear set, the second gear set includes a first gear (51) and a second gear (52), and the second gear (52) is engaged with both the first gear (51) and the engaging portion (23); A telescopic rod (53), one end of the telescopic rod (53) is connected to the support plate (1), and the other end of the telescopic rod (53) is connected to the second gear (52) to drive the second gear (52) to move in the vertical direction.

9. The test device for server hardware according to claim 8, wherein An installation cavity (12) is defined between the test bench (2) and the support plate (1), the drive mechanism (6) and the second transmission mechanism (5) are arranged in the installation cavity (12), and the engaging portion (23) is formed on the peripheral wall of the installation cavity (12), One of the test bench (2) and the support plate (1) is provided with a first sliding portion (22), and the other of the test bench (2) and the support plate (1) is provided with a second sliding portion (11), and the test bench (2) and the support plate (1) cooperate to slide through the first sliding portion (22) and the second sliding portion (11).

10. The test device for server hardware according to any one of claims 1-9, characterized in that, It further includes: A base (8), the base (8) is arranged below the support plate (1); A lifting mechanism (9), the lifting mechanism (9) is arranged between the base (8) and the support plate (1) to move the support plate (1) in the vertical direction; A blower (10), the blower (10) is arranged on the support plate (1), and the blower (10) is spaced from the test bench (2).

Images