Electronic detonator delay calibration method

Abstract

The invention provides an electronic detonator delay calibration method, which comprises the following steps of: starting a first timer based on a high-speed clock, and setting a first calibration time threshold value; synchronously starting a second timer based on a low-speed clock in the chip, and setting a second calibration time threshold value which is greater than the first calibration time threshold value; when the first timer reaches a first calibration time threshold value, stopping the second timer and acquiring an actual count value of the second timer; calculating a theoretical count value corresponding to the first calibration time threshold value; generating a calibration factor based on the ratio of the actual count value to the theoretical count value; dynamically correcting the low-speed clock count value corresponding to the target delay time according to the calibration factor; configuring a second timer by adopting the corrected count value, and executing delay control; by means of high precision of the high-speed clock, the low-speed clock is calibrated before detonation, so that the low-speed clock is more accurate in the current environment, the standard that the delay error is smaller than 1% is achieved, and it is guaranteed that the detonation time of the electronic detonator is accurate and errorless.

Description

Technical Field

[0001] The present invention relates to the technical field of intelligent blasting, and particularly to a method for calibrating the delay of electronic detonators. Background Art

[0002] Earlier, the module of industrial electronic detonators was relatively small, with a diameter of only 6 mm, and the space on the pcb board was limited. On the other hand, considering cost, there is no independent low-speed crystal oscillator of 32.768K on the electronic detonator control module. In this case, after the required processes of the electronic module are completed, when performing timed detonation, it is necessary to use a low-speed clock for timing. After reaching the specified time, the firing control switch is turned on, and the electrical energy on the energy storage element is released through the firing element, thereby generating heat and triggering the ignition of the primer;

[0003] Due to the absence of a very precise low-speed crystal oscillator, this will result in the accuracy of the delay not meeting the requirement of 1% accuracy of electronic detonators. Generally, it can only reach about 5%, that is, for a 15-second delay, there can only be an error of plus or minus 150 ms; and when detonating with a delay, it is necessary to let the control module enter the low-power mode. Therefore, when timing the detonation, only the internal low-speed clock can be used, and the accuracy of the low-speed clock is significantly insufficient;

[0004] And the current electronic detonator technology mainly relies on fixed delay circuits and simple sensors, and usually cannot monitor and adjust the influence of environmental factors on the delay in real time, which limits the performance of electronic detonators under complex or changing environmental conditions;

[0005] Therefore, there is an urgent need in the art for a method for calibrating the delay of electronic detonators to solve the above problems. Summary of the Invention

[0006] The present invention provides a method for calibrating the delay of electronic detonators, aiming to solve the problem that the timing of electronic detonators is inaccurate, the error of the low-speed clock is about 5%, and it cannot meet the accuracy requirement of 1%. By leveraging the high precision of the high-speed clock, the low-speed clock is calibrated before detonation to make it more accurate in the current environment, thereby achieving a standard with a delay error of less than 1% and ensuring the accurate detonation time of electronic detonators.

[0007] The present invention provides a method for calibrating the delay of electronic detonators, including:

[0008] Step 1: Start a first timer based on the high-speed clock inside the electronic detonator chip and set a first calibration time threshold;

[0009] Step 2: Synchronously start a second timer based on the low-speed clock inside the chip, set a second calibration time threshold, and the second calibration time threshold is greater than the first calibration time threshold;

[0010] Step 3: When the first timer reaches the first calibration time threshold, stop the second timer and obtain its actual count value;

[0011] Step 4: Calculate the theoretical count value corresponding to the first calibration time threshold according to the theoretical frequency of the low-speed clock;

[0012] Step 5: Generate a calibration factor based on the ratio of the actual count value to the theoretical count value;

[0013] Step 6: Dynamically correct the count value of the low-speed clock corresponding to the target delay time according to the calibration factor;

[0014] Step 7: Configure the second timer with the corrected count value and perform precise delay control;

[0015] Wherein, the calibration factor reflects the influence of the current environment on the low-speed clock frequency in real time, and compensates for the timing error of the low-speed clock through the accuracy of the high-speed clock.

[0016] According to a method for electronic detonator delay calibration provided by the present invention, the accuracy of the high-speed clock has an error of less than 1% within the general temperature range, and the error of the low-speed clock before calibration is greater than 5%.

[0017] According to a method for electronic detonator delay calibration provided by the present invention, the first calibration time threshold is 1 second, the second calibration time threshold is 2 seconds, the clock source of the first timer is the high-speed clock, and the clock source of the second timer is the low-speed clock.

[0018] According to a method for electronic detonator delay calibration provided by the present invention, the calculation formula of the calibration factor is:

[0019]

[0020] Wherein, TIMF_1S_CONUNT_CLIB is the measured count value of the second timer within the first calibration time threshold, and TIMF_1S_CONUNT is the theoretical count value of the low-speed clock corresponding to the first calibration time threshold under ideal conditions.

[0021] According to a method for electronic detonator delay calibration provided by the present invention, the calculation formula of the theoretical count value TIMF_1S_CONUNT is:

[0022]

[0023] Wherein, TIMF_CLK is the low-speed clock frequency, and the division ratio is the division parameter of the second timer for the low-speed clock.

[0024] A method for calibrating the delay of an electronic detonator provided by the present invention, the dynamic correction process in step six is as follows:

[0025] The corrected count value = TIMF_D_CONUNT * F

[0026] Where D is the target delay time, that is, the detonation delay time set by the user; TIMF_D_CONUNT represents the theoretical count value of the uncalibrated low-speed clock corresponding to the target delay time D.

[0027] A method for calibrating the delay of an electronic detonator provided by the present invention, before step one, further includes:

[0028] S101, obtain user requirements, determine the working environment of the electronic detonator and the corresponding usage requirements based on the user requirements, and determine the sensor installation position according to the working environment and usage requirements.

[0029] A method for calibrating the delay of an electronic detonator provided by the present invention, after step S101, further includes:

[0030] S102, perform the first integration of the superconducting quantum interference device and the processing system of the electronic detonator, perform the second integration of the atomic clock technology and the processing system, and obtain the time reference source according to the first integration and the second integration.

[0031] A method for calibrating the delay of an electronic detonator provided by the present invention, the specific process of obtaining the time reference source includes:

[0032] Determine the noise reference based on the working environment, set the connection port between the superconducting quantum interference device and the electronic detonator according to the noise reference, obtain the output signal of the superconducting quantum interference device from the connection port, calculate the average value of the output signal and subtract it from the output signal to obtain the AC signal part; determine the gain setting corresponding to the amplitude range of the AC signal part according to the history-signal-gain table;

[0033] Conduct a comprehensive performance evaluation on the gain setting, determine the optimal gain setting corresponding to the AC signal part according to the comprehensive performance evaluation value, perform optimization processing on the output signal based on the optimal gain setting, input the optimization processing result into the processing system, and thus complete the first integration with the electronic detonator processing system; determine the required time accuracy based on the usage requirements, determine the stability requirements according to the working environment, select the atomic clock technology in combination with the required time accuracy and stability requirements, output the time signal from the atomic clock to the processing system, and thus complete the second integration; obtain the signal detection result according to the first integration, obtain the time signal according to the second integration, and obtain the time reference source by synthesizing the signal detection result and the time signal.

[0034] A method for delaying calibration of an electronic detonator provided by the present invention, after step S102, further includes:

[0035] S103. Obtain environmental data according to a sensor, determine the environmental conditions of the electronic detonator, and dynamically adjust the target delay time D in combination with the environmental conditions, usage requirements, and time reference source.

[0036] Compared with the prior art, the beneficial effects of the present application are as follows:

[0037] 1. The present invention calibrates a low-speed clock using a high-speed clock inside a chip, and dynamically corrects the low-speed clock count value corresponding to the target delay time by calculating a calibration factor, improving the delay accuracy from about 5% without calibration to nearly 1%, reducing the error of timed detonation, and improving the accuracy of detonation.

[0038] 2. The present invention determines environmental conditions by obtaining environmental data, dynamically adjusts the target delay time in combination with environmental conditions, usage requirements, and time reference source, and monitors and responds to the influence of environmental factors on the delay in real time, solving the problem that the performance of the prior art is limited in complex or changing environments, and ensuring that the electronic detonator can work reliably in different environments.

[0039] 3. The present invention integrates a superconducting quantum interference device and atomic clock technology to form a high-precision time reference source, provides a more accurate time reference for delay calibration, improves the time accuracy and stability of the entire system, and enhances the performance of the electronic detonator.

[0040] 4. The present invention optimizes the output signal of the superconducting quantum interference device. By calculating the average value, determining the gain setting, and comprehensively evaluating the performance and other steps, the signal quality is improved, which helps to more accurately control the detonation time of the electronic detonator, and further improves the reliability and safety of the system.

[0041] Other features and advantages of the present invention will be described in the subsequent description, and, in part, will be obvious from the description, or will be understood by implementing the present invention. The objectives and other advantages of the present invention can be realized and obtained by the structures specifically pointed out in the written description and the drawings.

[0042] The technical solutions of the present invention will be further described in detail below through the drawings and embodiments. Description of the Drawings

[0043] The drawings are used to provide a further understanding of the present invention, and constitute a part of the description. They are used together with the embodiments of the present invention to explain the present invention, and do not constitute a limitation to the present invention.

[0044] In the drawings:

[0045] Figure 1It is a schematic flowchart of a method for calibrating the delay of electronic detonators provided by an embodiment of the present invention. Detailed implementation manners

[0046] The following describes the preferred embodiments of the present invention with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0047] Embodiment 1:

[0048] An embodiment of the present invention provides a method for calibrating the delay of electronic detonators. Please refer to Figure 1 , including:

[0049] Step 1: Start a first timer based on the high-speed clock inside the electronic detonator chip and set a first calibration time threshold.

[0050] Step 2: Synchronously start a second timer based on the low-speed clock inside the chip, set a second calibration time threshold, and the second calibration time threshold is greater than the first calibration time threshold.

[0051] Step 3: When the first timer reaches the first calibration time threshold, stop the second timer and obtain its actual count value.

[0052] Step 4: Calculate the theoretical count value corresponding to the first calibration time threshold according to the theoretical frequency of the low-speed clock.

[0053] Step 5: Generate a calibration factor based on the ratio of the actual count value to the theoretical count value.

[0054] Step 6: Dynamically correct the count value of the low-speed clock corresponding to the target delay time according to the calibration factor.

[0055] Step 7: Configure the second timer with the corrected count value and perform precise delay control.

[0056] Among them, the calibration factor reflects the influence of the current environment on the frequency of the low-speed clock in real time, and compensates for the timing error of the low-speed clock through the accuracy of the high-speed clock.

[0057] The accuracy of the high-speed clock has an error of less than 1% within the general temperature range, and the error of the low-speed clock before calibration is greater than 5%.

[0058] The first calibration time threshold is 1 second, the second calibration time threshold is 2 seconds, the clock source of the first timer is the high-speed clock, and the clock source of the second timer is the low-speed clock.

[0059] The calculation formula of the calibration factor is:

[0060]

[0061] Among them, TIMF_1S_CONUNT_CLIB is the measured count value of the second timer within the first calibration time threshold, and TIMF_1S_CONUNT is the theoretical count value corresponding to the first calibration time threshold of the low-speed clock under ideal conditions.

[0062] The calculation formula for the theoretical count value TIMF_1S_CONUNT is:

[0063]

[0064] Among them, TIMF_CLK is the low-speed clock frequency, and the division factor is the division parameter of the second timer for the low-speed clock.

[0065] The dynamic correction process of Step Six is as follows:

[0066] Corrected count value = TIMF_D_CONUNT * F

[0067] Among them, D is the target delay time, that is, the detonation delay time set by the user; TIMF_D_CONUNT represents the theoretical count value of the uncalibrated low-speed clock corresponding to the target delay time D.

[0068] It should be noted that the delay calibration process is demonstrated through the following example: The clock of the detonation control timer TIMF is 37K and is divided by 16. That is, every 1 second, 37000 / 16 = 2312.5 is required, that is, TIMF_1S_CONUNT = 2312.5 counting cycles. If the TIM of the high-speed clock is used to time for 1 second, when the detonation control timer TIMF reaches the TIM time, the counted number is 2000, that is, = 2000, then F = 2000 / 2312.5 = 0.846846... Suppose the module needs to detonate after timing for 1 second, TIMF_D_CONUNT = * 1 second = 2312.5, and then calculate the calibrated clock count number: 2312.5 * F = 2000, that is, actually needing to time for 1 second, only need to set the TIMF clock count number to 2000.

[0069] If the module sets a 2-second delay, then TIMF_D_CONUNT = * 2 seconds = 4625, and the calibrated count is: TIMF_D_CONUNT * F = 4625 * 0.846846 = 4000, that is, when starting the detonation control timer TIMF, setting the count number to the calibrated value of 4000 will be an accurate 2-second time.

[0070] After receiving a charging instruction, this process can automatically execute this calibration process, which will be calibrated according to the ambient temperature at that time where the module is located, that is, calibrated under the ambient conditions before detonation, effectively solving the problem that the oscillation circuit changes with temperature. Instead of calibrating in one temperature environment and then using it in another different temperature environment. It can also be an independent command. Then the detonator sends an execution command for this calibration control instruction. After the module receives it, it executes this calibration operation. After completing the calibration, the detonator sends a timing detonator command again.

[0071] Embodiment 2:

[0072] Compared with the method of Embodiment 1, this embodiment further includes:

[0073] S101, obtain user requirements, determine the working environment of the electronic detonator and the corresponding usage requirements based on the user requirements, and determine the sensor installation position according to the working environment and usage requirements.

[0074] S102, perform a first integration of the superconducting quantum interference device and the processing system of the electronic detonator, perform a second integration of the atomic clock technology and the processing system, and obtain a time reference source according to the first integration and the second integration.

[0075] Determine a noise reference based on the working environment, set the connection port between the superconducting quantum interference device and the electronic detonator according to the noise reference, obtain the output signal of the superconducting quantum interference device from the connection port, calculate the average value of the output signal and subtract it from the output signal to obtain the AC signal part; determine the gain setting corresponding to the amplitude range of the AC signal part according to the historical-signal-gain table;

[0076] Conduct a comprehensive performance evaluation of the gain setting, determine the optimal gain setting corresponding to the AC signal part according to the comprehensive performance evaluation value, perform optimization processing on the output signal based on the optimal gain setting, input the optimization processing result into the processing system, and thus complete the first integration with the electronic detonator processing system; determine the required time accuracy based on the usage requirements, determine the stability requirements according to the working environment, select the atomic clock technology by combining the required time accuracy and stability requirements, output a time signal from the atomic clock to the processing system, and thus complete the second integration; obtain a signal detection result according to the first integration, obtain a time signal according to the second integration, and obtain a time reference source by synthesizing the signal detection result and the time signal.

[0077] S103, obtain environmental data according to the sensor, determine the environmental conditions of the electronic detonator, and dynamically adjust the target delay time D by combining the environmental conditions, usage requirements, and time reference source.

[0078] In this embodiment, user requirements refer to the specific expectations and requirements of users for the performance, functions, and usage environment of electronic detonators. For example, in terms of accuracy requirements: users require the electronic detonator to detonate accurately within the range of ±0.1 seconds.

[0079] In this embodiment, the working environment is the environmental conditions in which the electronic detonator is located, such as temperature, humidity, vibration, air pressure, etc. For example, electronic detonators used in mining areas need to be resistant to high temperatures and humid environments.

[0080] In this embodiment, usage requirements are the functional requirements and performance requirements of the electronic detonator, such as detonation accuracy, delay range, safety, etc. For example, it is required to detonate precisely within 1 second, and the adjustable delay range is from 0.1 second to 5 seconds.

[0081] In this embodiment, the sensor installation position is the specific installation point of the finally determined sensor inside the electronic detonator. For example, the sensor is installed in the reserved space at the top or side of the electronic detonator to facilitate monitoring of environmental changes.

[0082] In this embodiment, the first integration is to integrate the optimized signal with other systems to achieve functions. For example, the optimized signal is input into the electronic detonator control system to achieve signal monitoring.

[0083] In this embodiment, the processing system is a computing or control system used to receive, analyze, and integrate signals. For example, an embedded microprocessor system is responsible for processing the optimized signal.

[0084] In this embodiment, the second integration is to integrate the time signal output by the atomic clock with the processing system. For example, the time signal of the atomic clock is input into the time control module of the electronic detonator.

[0085] In this embodiment, the time reference source is a reference time source obtained by synthesizing the signal detection result and the time signal. For example, based on the signal detection result and the time signal, the determined time reference source is "December 2, 2024 09:00:00 UTC, signal strength 0.8V".

[0086] In this embodiment, environmental data is the numerical information related to the environment collected in real time by sensors, usually including temperature, humidity, air pressure, light, etc. For example, the temperature collected by the sensor is 25°C, the humidity is 60%, and the air pressure is 1013 hPa; the working environment is specific physical environmental conditions, usually referring to the actual environment in which the electronic detonator operates, including temperature, humidity, air pressure, vibration, etc. The difference between the two is that environmental data is the specific numerical values collected in real time, while the working environment is a comprehensive description of these numerical values. For example, the working environment may be "inside the mine, temperature is 25°C, humidity is 60%".

[0087] In this embodiment, the environmental condition is the comprehensive state reflected by environmental data at a specific time point, which is usually described by key environmental parameters. For example, the current environmental condition is "temperature 25°C, humidity 60%, air pressure 1013 hPa".

[0088] In this embodiment, the delay calibration method is a technique that adjusts the clock count of TIMF to ensure that the electronic detonator detonates accurately within the set delay time. For example, if the set delay D is 5 seconds and the calibration ratio F is 1.05, the TIMF clock count to be set after calibration is: TIMF_5S_COUNT × F, where TIMF_5S_COUNT is the count in the uncalibrated case.

[0089] In this embodiment, environmental data is collected in real time by activating the sensor, key environmental parameters are identified and the current environmental condition is analyzed. By analyzing the relationship between the usage requirements and the environmental condition, potential factors affecting the performance of the electronic detonator are identified. Finally, a delay calibration method is designed based on these factors and the time reference source.

[0090] In this embodiment, the time reference source provides a clock signal for the hardware timer TIM, activates the timer TIM and the detonation control timer TIMF, sets the required delay D. Before and after calibration, the statistical period and the number of counts of TIMF are calculated respectively, and the clock count of TIMF is adjusted by the calibration ratio F to ensure the accuracy of the detonation delay, thereby realizing delay calibration.

[0091] In this embodiment, the delay setting value is the new adjusted delay setting used to update the setting of the detonation control timer. For example, if the original delay setting is 10 seconds and the delay amount to be adjusted is -0.5 seconds, the new delay setting value is 10 - 0.5 = 9.5 seconds.

[0092] In this embodiment, delay calibration is a process of adjusting the setting of the detonation control timer to ensure that the actual detonation time is consistent with the preset target time. For example, if it is calculated that the delay setting value of the detonation control timer needs to be adjusted to 9.5 seconds, the process of delay calibration is to update the setting of the timer to 9.5 seconds to ensure more accurate future detonation times.

[0093] The working principle and beneficial effects of the above technical solution are as follows: By obtaining user requirements and environmental conditions, determining the sensor installation location, integrating the superconducting quantum interference device and atomic clock technology to form a high-precision time reference source, and by obtaining environmental data in real time, combining environmental conditions and usage requirements, dynamically adjusting the delay setting of the electronic detonator to achieve precise delay calibration, thereby achieving higher accuracy of the detonation timing, meeting the requirements of precise control, improving overall safety, and ensuring the reliability of the electronic detonator under complex conditions.

[0094] Obtain user requirements, determine the working environment of the electronic detonator and the corresponding usage requirements based on the user requirements, and determine the sensor installation position according to the working environment and usage requirements, including:

[0095] Segment the user requirements to obtain the working environment and usage requirements of the electronic detonator;

[0096] Set the first screening condition according to the working environment, set the second screening condition according to the usage requirements, and determine the sensors to be installed based on the first screening condition and the second screening condition;

[0097] Obtain the detailed structural drawings of the electronic detonator, determine the feasibility of the sensor installation area according to the internal space layout of the electronic detonator and the positions of key components, and then determine the sensor installation position.

[0098] In this embodiment, the first screening condition (working environment) is to screen the tolerance and adaptability of the sensor according to environmental factors. For example, select waterproof and dustproof sensors to adapt to the humid and dusty mining environment; the second screening condition (usage requirements) is to screen the performance indicators of the sensor according to functional requirements. For example, select sensors with high precision and fast response to meet the detonation accuracy requirements.

[0099] In this embodiment, the sensors to be installed are suitable sensors determined according to the first and second screening conditions. For example, select a sensor with temperature and humidity monitoring functions, which is suitable for use in high-temperature and humid environments.

[0100] In this embodiment, the detailed structural drawings are the design drawings of the electronic detonator, showing its internal structure and component layout. For example, the detailed drawings include circuit boards, initiators, sensor interfaces, etc.

[0101] In this embodiment, the internal space layout and key components are the spatial distribution of each component inside the electronic detonator and their functional positions. For example, the specific positions and relative relationships of the battery, control unit, and initiation device.

[0102] In this embodiment, the feasibility is to evaluate whether the sensor installation area meets the space and function requirements. For example, confirm that the sensor installation position will not interfere with the normal operation of other key components.

[0103] The working principle and beneficial effects of the above technical solution are as follows: By segmenting user requirements, clarifying the working environment and usage requirements of electronic detonators, setting screening conditions to determine the sensors to be installed, analyzing the internal space layout and the positions of key components according to the structural drawings of electronic detonators, and evaluating the feasibility of the sensor installation area, the optimal sensor installation position is determined to ensure that the sensor can effectively monitor environmental changes and be integrated with the electronic detonator system, improving the response ability of electronic detonators to environmental changes and ensuring the accuracy of delay control.

[0104] Perform the first integration of the superconducting quantum interference device with the processing system of the electronic detonator, and perform the second integration of the atomic clock technology with the processing system. Based on the first integration and the second integration, a time reference source is obtained, including:

[0105] Determine the noise reference based on the working environment, set the connection port between the superconducting quantum interference device and the electronic detonator according to the noise reference, obtain the output signal of the superconducting quantum interference device from the connection port, perform optimization processing on the output signal, and input the optimized processing result into the processing system for the first integration;

[0106] Determine the required time accuracy based on the usage requirements. At the same time, determine the stability requirements according to the working environment, select the atomic clock technology by combining the required time accuracy and stability requirements, output the time signal from the atomic clock to the processing system for the second integration;

[0107] Obtain the signal detection result according to the first integration, obtain the time signal according to the second integration, and comprehensively obtain the time reference source based on the signal detection result and the time signal.

[0108] In this embodiment, the noise reference is the noise level measured in a specific working environment and is used as a reference for subsequent signal processing. For example, in a mining area environment, the background noise is 50 dB and is used as the noise reference.

[0109] In this embodiment, the superconducting quantum interference device is a highly sensitive measurement device that uses the quantum effect of superconducting materials to detect weak signals. For example, the SQUID (superconducting quantum interference device) used to measure weak electrical signals inside electronic detonators.

[0110] In this embodiment, the output signal is the electrical signal detected by the superconducting quantum interference device and represents external environmental or internal state information. For example, the voltage signal output by the superconducting quantum interference device represents the detected magnetic field change.

[0111] In this embodiment, the optimization processing is to perform filtering, amplification, or other algorithm processing on the output signal to improve the signal quality. For example, use a digital filter to remove high-frequency noise from the output signal.

[0112] In this embodiment, the required time accuracy is the time measurement accuracy requirement determined according to the usage needs. For example, the time accuracy is required to reach the millisecond level (±1 millisecond).

[0113] In this embodiment, the stability requirement is the requirement for the system to maintain stable performance under specific working environments. For example, within the temperature change range, the atomic clock needs to maintain a stability of ±10^-9 seconds.

[0114] In this embodiment, the signal detection result is the signal analysis result obtained according to the first integration. For example, the detected signal strength is 0.8V, indicating a normal working state.

[0115] In this embodiment, the time signal is the precise time information output from the atomic clock. For example, the output time signal is 09:00:00 UTC on December 2, 2024.

[0116] The working principle and beneficial effects of the above technical solution are as follows: Determine the noise baseline based on the working environment, set the connection port between the superconducting quantum interference device and the electronic detonator, obtain and optimize the output signal, input it into the processing system to complete the first integration, select the appropriate atomic clock technology according to the usage needs and environmental stability, output the time signal to the processing system to complete the second integration, and synthesize the signal detection result and the time signal to form a high-precision time reference source, ensuring the precise control of the electronic detonator and improving the system's adaptability to environmental changes.

[0117] Obtain the output signal of the superconducting quantum interference device from the connection port and perform optimization processing on the output signal, including:

[0118] Calculate the average value of the output signal, subtract the average value from the output signal to obtain the AC signal part;

[0119] Determine the gain setting corresponding to the amplitude range of the AC signal part according to the historical-signal-gain table, and conduct a comprehensive performance evaluation on the gain setting: (It should be noted that the parameters of the following model do not have the same meaning as the parameters in the technical formula in Embodiment 1. The parameter symbols are only codes, and the specific meanings are clearly defined below the model)

[0120] F = w1·A - w2·B - w3·D + w4·E

[0121]

[0122] Among them, F represents the comprehensive performance evaluation value; A represents the signal-to-noise ratio of the AC signal part; B represents the mean square error of the AC signal part; D represents the distortion condition of the AC signal part; E represents the nonlinear penalty term; S(f) represents the spectrum of the AC signal part; f2 represents the upper limit of the AC signal part; f1 represents the lower limit of the AC signal part; N(f) represents the spectrum of the noise; α represents the influence weight of time delay on the signal-to-noise ratio; Δt represents the time delay of the AC signal part; N represents the total number of samples for calculating the mean square error; β i represents the weighted sample coefficient of the i-th sample; y i represents the i-th sample of the AC signal part in calculating the mean square error; represents the i-th sample of the ideal signal part in calculating the mean square error; M represents the total number of samples for calculating the nonlinear penalty term; y j represents the j-th sample of the AC signal part in calculating the nonlinear penalty term; represents the j-th sample of the ideal signal part in calculating the nonlinear penalty term; w1 represents the influence degree coefficient of the signal-to-noise ratio on the comprehensive performance index; w2 represents the influence degree coefficient of the mean square error on the comprehensive performance index; w3 represents the influence degree coefficient of the distortion condition on the comprehensive performance index; w4 represents the influence degree coefficient of the nonlinear penalty term on the comprehensive performance index;

[0123] Determine the optimal gain setting corresponding to the AC signal part according to the comprehensive performance evaluation value, and optimize the output signal based on the optimal gain setting.

[0124] In this embodiment, the average value is the arithmetic mean of all sample values of the output signal, which is usually used to remove the DC component in the signal. For example, if the output signal is [0.5, 0.6, 0.7, 0.8], then the average value is (0.5 + 0.6 + 0.7 + 0.8) / 4 = 0.65.

[0125] In this embodiment, the AC signal part is the part obtained by subtracting the average value from the output signal, which represents the fluctuation or change of the signal. For example, if the output signal is [0.5, 0.6, 0.7, 0.8] and the average value is 0.65, then the AC signal part is [-0.15, -0.05, 0.05, 0.15].

[0126] In this embodiment, the history-signal-gain table is a table that records the gain settings corresponding to different signal amplitude ranges, which is used for reference and adjustment of the gain. For example, the table may contain the following data: the amplitude range [0.1, 0.2] corresponds to the gain setting of 10; the amplitude range [0.2, 0.3] corresponds to the gain setting of 20.

[0127] In this embodiment, the amplitude range is the interval of the amplitude variation of the signal, which is used to determine the gain setting. For example, the amplitude range of the AC signal part is [-0.2, 0.2].

[0128] In this embodiment, the gain setting is the coefficient for amplifying the signal, usually expressed as a multiple. For example, when the gain setting is 15, it means the signal amplitude will be amplified 15 times.

[0129] In this embodiment, the optimal gain setting is the best gain configuration obtained after fitness calculation, which can maximize the signal quality. For example, after calculation, the optimal gain setting is obtained as 12, which can achieve the best signal-to-noise ratio under given conditions.

[0130] In this embodiment, the optimization process is to adjust the output signal based on the optimal gain setting to improve the signal quality. For example, multiplying the output signal [0.5, 0.6, 0.7, 0.8] by the optimal gain setting of 12 gives the optimized signal [6.0, 7.2, 8.4, 9.6].

[0131] The working principle and beneficial effects of the above technical solution are as follows: By calculating the average value of the output signal and subtracting this average value, the AC signal part is extracted. The amplitude range of the AC signal is determined according to the historical signal gain table, and the fitness calculation of the gain setting is performed. Considering the signal-to-noise ratio, mean square error, distortion, and non-linear penalty term comprehensively, the optimal gain setting is determined, and the output signal is optimized based on this optimal gain to improve the signal quality and system performance.

[0132] According to the environmental data obtained by the sensor, the environmental conditions of the electronic detonator are determined, and the delay calibration method of the electronic detonator is set in combination with the environmental conditions, usage requirements, and time reference source, including:

[0133] Start the sensor to collect environmental data in real time, determine the key environmental parameters according to the working environment, and analyze the environmental data based on the key environmental parameters to determine the current environmental conditions;

[0134] Analyze the relationship between the usage requirements and the environmental conditions, and identify the potential factors affecting the performance of the electronic detonator according to the analysis results of the relationship;

[0135] Design the delay calibration method according to the potential factors and the time reference source.

[0136] In this embodiment, the key environmental parameter is an important environmental index that affects the performance of the device in a specific application, usually the most relevant parameter extracted from the environmental data. For example, for an electronic detonator, the key environmental parameters may include temperature, humidity, and air pressure because they directly affect the initiation performance.

[0137] In this embodiment, potential factors are environmental or operating conditions that may affect the performance of electronic detonators, which are usually obtained by analyzing environmental conditions and usage requirements. For example, if the circuit of an electronic detonator may short-circuit in a high-humidity environment, humidity is a potential factor.

[0138] In this embodiment, the relationship analysis result is the result of analyzing the relationship between usage requirements and environmental conditions, which is usually used to identify factors affecting performance. For example, the analysis result shows that when the humidity exceeds 70%, the reliability of the electronic detonator decreases. Therefore, high humidity is a key factor affecting performance.

[0139] In this embodiment, by partitioning factors of usage requirements and environmental conditions, creating a relationship matrix, listing the relationships between the two, and marking the relationship strength, and by analyzing the relationship matrix, the environmental condition factors that have the greatest impact on the usage requirement factors are identified, thereby obtaining the relationship analysis result.

[0140] The working principle and beneficial effects of the above technical solution are as follows: By starting the sensor to collect environmental data in real time, identifying key environmental parameters and analyzing the current environmental conditions, by analyzing the relationship between usage requirements and environmental conditions, potential factors affecting the performance of electronic detonators are identified. Finally, based on these factors and the time reference source, a delay calibration method is designed to improve the reliability and accuracy of electronic detonators, ensure the initiation accuracy, reduce the failure rate, enhance the safety and reliability of the system, and thus improve the operation efficiency and safety guarantee.

[0141] Analyze the relationship between usage requirements and environmental conditions, and identify potential factors affecting the performance of electronic detonators according to the relationship analysis result, including:

[0142] Partition factors of usage requirements and environmental conditions, create a relationship matrix, list the usage requirement factors and environmental condition factors, and mark the relationship strength between the usage requirement factors and environmental condition factors;

[0143] Based on the relationship matrix, analyze the environmental condition factors that have the greatest impact on the usage requirement factors, obtain the relationship analysis result, and identify potential factors affecting the electronic detonator according to the relationship analysis result.

[0144] In this embodiment, factor partitioning classifies and splits usage requirements and environmental conditions to facilitate the analysis of their mutual relationships. Usage requirement factors may include "initiation time accuracy", "safety", "operation simplicity"; environmental condition factors may include "temperature", "humidity", "air pressure".

[0145] In this embodiment, the relationship matrix is used to represent the relationship strength between usage requirement factors and environmental condition factors.

[0146] In this embodiment, the usage requirement factors are the performance requirements related to the operation of electronic detonators. For example, the detonation time accuracy, safety, and ease of operation.

[0147] In this embodiment, the environmental condition factors are the external environmental factors that affect the performance of electronic detonators. For example, temperature: high temperature may cause circuit failures; humidity: high humidity may cause short circuits; air pressure: changes in air pressure may affect the performance of electronic components.

[0148] In this embodiment, the relationship strength is the degree of influence between the usage requirement factors and the environmental condition factors, usually represented by a numerical value. For example, in the relationship matrix, the relationship strength between the detonation time accuracy and humidity is 2, indicating a medium influence.

[0149] In this embodiment, the relationship analysis result is to identify the environmental condition factors that have the greatest impact on the usage requirement factors by analyzing the relationship matrix. For example, if it is found that the influence strength of humidity on "safety" is 3, it may be concluded that humidity is a potential factor affecting the performance of electronic detonators.

[0150] The working principle and beneficial effects of the above technical solution are as follows: By segmenting the usage requirements and environmental conditions into factors, creating a relationship matrix, listing the relationships between the two, and marking the relationship strength, and then by analyzing the relationship matrix, identifying the environmental condition factors that have the greatest impact on the usage requirement factors, so as to obtain the relationship analysis result, identify the potential factors affecting the performance of electronic detonators, improve the reliability of electronic detonators in different environments, and reduce faults and safety hazards.

[0151] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A method for calibrating the delay of an electronic detonator, characterized in that, include: Step 1: starting a first timer based on a high-speed clock inside the electronic detonator chip and setting a first calibration time threshold; Step 2: synchronously start a second timer based on the internal low-speed clock of the chip, and set a second calibration time threshold, wherein the second calibration time threshold is greater than the first calibration time threshold; Step 3: When the first timer reaches the first calibration time threshold, stop the second timer and obtain its actual count value; Step 4: Calculate the theoretical count value corresponding to the first calibration time threshold according to the theoretical frequency of the low-speed clock; Step 5: Generate a calibration factor based on the ratio of the actual count value to the theoretical count value; Step 6: dynamically correct the low-speed clock count value corresponding to the target delay time according to the calibration factor; Step 7: Use the corrected count value to configure the second timer to perform precise delay control; The calibration factor reflects the impact of the current environment on the low-speed clock frequency in real time, and compensates for the timing error of the low-speed clock through the accuracy of the high-speed clock.

2. The method for calibrating the delay of an electronic detonator according to claim 1, wherein, The accuracy of the high-speed clock is less than 1% within a universal temperature range, and the error of the low-speed clock when it is not calibrated is greater than 5%.

3. The method for calibrating the delay of an electronic detonator according to claim 1, characterized in that, The first calibration time threshold is 1 second, the second calibration time threshold is 2 seconds, the clock source of the first timer is a high-speed clock, and the clock source of the second timer is a low-speed clock.

4. A method for electronic detonator delay calibration according to claim 1, characterized in that, The calculation formula of the calibration factor is: Among them, TIMF_1S_CONUNT_CLIB is the measured count value of the second timer within the first calibration time threshold, and TIMF_1S_CONUNT is the theoretical count value of the low-speed clock corresponding to the first calibration time threshold under ideal conditions.

5. A method for electronic detonator delay calibration according to claim 1, characterized in that The calculation formula of the theoretical count value TIMF_1S_CONUNT is: Among them, TIMF_CLK is the low-speed clock frequency, and the division frequency is the frequency division parameter of the second timer for the low-speed clock.

6. A method for electronic detonator delay calibration according to claim 1, characterized in that, The dynamic correction process of step six is ​​as follows: Corrected count value = TIMF_D_CONUNT*F Wherein, D is the target delay time, that is, the detonation delay time set by the user; TIMF_D_CONUNT represents the uncalibrated low-speed clock theoretical count value corresponding to the target delay time D.

7. A method for calibrating the delay of an electronic detonator according to claim 1, characterized in that, Before the step 1, the method further includes: S101, obtaining user needs, determining a working environment and corresponding usage requirements of the electronic detonator based on the user needs, and determining a sensor installation position according to the working environment and usage requirements.

8. A method for calibrating the delay of an electronic detonator according to claim 7, characterized in that, After step S101, the method further includes: S102, performing a first integration of the superconducting quantum interference device and the processing system of the electronic detonator, performing a second integration of the atomic clock technology and the processing system, and obtaining a time reference source based on the first integration and the second integration.

9. A method for electronic detonator delay calibration according to claim 8, characterized in that, The specific process of obtaining the time reference source includes: Determine a noise benchmark based on the working environment, set a connection port between the superconducting quantum interference device and the electronic detonator according to the noise benchmark, obtain an output signal of the superconducting quantum interference device from the connection port, calculate an average value of the output signal and subtract it from the output signal to obtain an AC signal portion; determine a gain setting corresponding to an amplitude range of the AC signal portion according to a history-signal-gain table; Conduct a comprehensive performance evaluation of the gain setting, determine the optimal gain setting corresponding to the AC signal part according to the comprehensive performance evaluation value, perform optimization processing on the output signal based on the optimal gain setting, and input the optimization processing result into the processing system, thereby completing the first integration with the electronic detonator processing system; determine the required time accuracy based on the usage requirements, determine the stability requirements according to the working environment, select the atomic clock technology by combining the required time accuracy and stability requirements, output the time signal from the atomic clock to the processing system, and thus complete the second integration; obtain the signal detection result according to the first integration, obtain the time signal according to the second integration, and synthesize the signal detection result and the time signal to obtain the time reference source.

10. A method for electronic detonator delay calibration according to claim 9, characterized in that, After step S102, it further includes: S103. Obtain environmental data according to the sensor, determine the environmental conditions of the electronic detonator, and dynamically adjust the target delay time D in combination with the environmental conditions, usage requirements, and time reference source.

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