Testing device special for backlight module

Abstract

The invention discloses a testing device special for a backlight module, and relates to the technical field of backlight module tests.The testing device comprises a testboard, a conveying rail is installed on the side wall of the testboard, a supporting frame is fixedly connected to the upper surface of the testboard, a tester is installed on the front side wall of the supporting frame, and a testing head is slidably connected to the interior of the tester; a light interference prevention closing mechanism is arranged in the test board, so that dispersion and leakage of a light source during testing of the tester can be avoided, uniform light distribution during testing is ensured, interference of the light source to a test result is avoided, the accuracy and reliability of the test result are ensured, and the test efficiency is improved. The influence of external factors on the backlight module test can be avoided, and the temperature and humidity of the external environment can be prevented from being changed during the control test through the isolation of the shielding plate and the closed shell, so that the working environment of the backlight module in use can be simulated more practically, and the performance of the backlight module can be evaluated more truly and reliably.

Description

Technical Field

[0001] The present invention relates to the technical field of backlight module testing, and specifically, to a testing device dedicated to backlight modules. Background Art

[0002] The testing device for backlight modules can comprehensively test and evaluate the performance of backlight modules to ensure that their quality meets the requirements. Through the testing device, key indicators such as brightness, uniformity, color accuracy, and response time can be detected, thereby ensuring the performance and stability of backlight modules in actual use. And this device is a small backlight module testing device, mainly for testing new products and testing the above key indicators of backlight modules under development;

[0003] For existing testing devices for backlight modules, in order to prevent light interference, it is usually necessary to adjust the brightness and angle of the device light source before detection to obtain appropriate lighting conditions, or for the staff to actively select a stable environment to avoid direct sunlight or strong light reflection into the test area. However, this method cannot isolate external interference factors such as light, dust, and fans. And due to the lack of a good testing environment provided for it, when the testing equipment is performing tests, the light source of the detector will also have discrete and leakage phenomena, which will further lead to uneven light distribution during testing, that is, there are differences in the brightness of light in different regions. Moreover, the discrete and leaked light will also interfere with the measurement of the detector, resulting in errors in the measurement results, which will affect the evaluation of performance indicators such as the brightness, color accuracy, and response time of backlight modules;

[0004] At the same time, since backlight modules are usually exposed to the air during the production and assembly processes, and there are a large number of dust, particles, and impurities in the air, these particulate matters can deposit on the surface of the backlight module and form dust and impurities. And during the production, assembly, and testing processes of the backlight module, operators will come into contact with the surface of the module, thus bringing impurities such as dust, fingerprints, and oil stains to the module surface. And the dust and impurities will form an uneven covering layer on the surface of the backlight module, affecting the transmission and distribution of light, which results in uneven brightness distribution of the backlight module, that is, some regions are darker or brighter than other regions, affecting the display effect and quality, and resulting in the light of the backlight module not being concentrated and not focused, which leads to blurred images, loss of details, and reduced contrast.

[0005] Therefore, in view of this, the present invention proposes a testing device dedicated to backlight modules to make up for and improve the deficiencies of the existing technology. Summary of the Invention

[0006] To solve the above technical problems, the present invention provides a testing device dedicated to backlight modules to solve the technical problems raised in the above background art.

[0007] To achieve the above object, the technical solution adopted by the present invention is as follows: A test device dedicated to a backlight module, including a test bench, a conveying rail is installed on the side wall of the test bench, a support frame is fixedly connected to the upper surface of the test bench, a tester is installed on the front side wall of the support frame, a test head is slidably connected inside the tester, a light anti-interference closing mechanism is arranged inside the test bench, and a test preprocessing mechanism is arranged above the conveying rail;

[0008] The light anti-interference closing mechanism is used to automatically close when the tester is performing a test, thereby providing a good test environment;

[0009] The test preprocessing mechanism is used to automatically clean the test surface of the tester before the test, thereby ensuring the cleanliness of the test surface.

[0010] Further, the light anti-interference closing mechanism includes a curved rod fixedly connected to the outer wall of the tester, the outer wall of the curved rod is slidably connected to the test bench, a shielding plate is fixedly connected to the outer wall of the curved rod, the shielding plate is sleeved on the outer wall of the test head inside the tester, a sliding sleeve is fixedly connected to the end of the curved rod away from the tester, a rotating shaft is installed on the inner wall of the sliding sleeve, the rotating shaft is rotatably connected to the bottom of the inner cavity of the test bench, a connecting bin is rotatably connected to the outer wall of the rotating shaft, the connecting bin is fixedly connected to the inner side wall of the test bench, a turntable is fixedly connected to the upper surface of the rotating shaft, adjusting shafts are uniformly penetrated and installed on the upper and lower surfaces of the turntable, moving plates are uniformly fixedly connected to the lower surfaces of the adjusting shafts, the moving plates are all slidably connected through the connecting bin, and closing shells are fixedly connected to the upper surfaces of the moving plates.

[0011] Further, cylindrical protrusions are symmetrically fixedly connected to the inner wall of the sliding sleeve, continuous curved grooves are opened at positions corresponding to the cylindrical protrusions on the outer wall of the rotating shaft, and the rotating shaft and the sliding sleeve are slidably connected through an arc-shaped groove and the cylindrical protrusions.

[0012] Further, arc-shaped grooves are penetrated up and down at positions corresponding to the adjusting shafts on the surface of the turntable, the turntable and the adjusting shafts are rotatably connected through the arc-shaped grooves, the closing shell is integrally quarter-circular, and sliding grooves are opened on the upper surface of the test bench corresponding to the positions of the closing shells.

[0013] Further, a fixing plate is fixedly connected to the lower surface of the tester. One end of the fixing plate away from the tester is fixedly connected to a limiting cylinder. A disc with a rod is fixedly connected to the outer wall of the shielding plate. One end of the disc with a rod away from the shielding plate is slidably connected to the inner wall of the limiting cylinder. A sliding rod is fixedly connected to the lower surface of the disc with a rod. One end of the sliding rod away from the disc with a rod is fixedly connected to a trapezoidal plate. A limiting frame is fixedly connected to the outer wall of the limiting cylinder. Adjusting plates are symmetrically and slidably connected to the inner side walls of the limiting frame. Connecting rods are fixedly connected to the lower surfaces of the adjusting plates. Cleaning plates are fixedly connected to the lower ends of the connecting rods.

[0014] Further, a circular hole groove is penetrated through the outer wall of the limiting cylinder at the position corresponding to the disc with a rod. The disc with a rod is initially located at the uppermost position inside the limiting cylinder.

[0015] Further, fixing blocks are arranged on the left and right sides of the trapezoidal plate. Inclined groove is formed in the adjusting plate at the position corresponding to the fixing block of the trapezoidal plate. The trapezoidal plate and the adjusting plate are initially in a fitting state.

[0016] Further, the cleaning plate is located directly above the conveying rail. A cleaning cloth is detachably installed on the side of the cleaning plate close to the conveying rail, and the cleaning cloth is made of high-density cotton cloth.

[0017] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0018] (1) Compared with the existing backlight module detection equipment, by adjusting the brightness and angle of the device light source to obtain appropriate lighting conditions, or by the staff actively selecting a stable environment to avoid strong light direct irradiation or strong light reflection into the test area. The cooperation between the above-mentioned shielding plate and the closing shell provides a good test environment for the device. It can not only directly isolate external light, dust, fans and other interference factors, but also avoid the dispersion and leakage of the light source during the tester's test, thereby ensuring uniform light distribution during the test and avoiding the interference of the light source on the test results. This helps to ensure the accuracy and reliability of the test results, avoid the influence of external factors on the backlight module test. And, through the isolation of the shielding plate and the closing shell, it can also avoid changes in the temperature and humidity of the external environment during the test, and then more closely simulate the working environment of the backlight module in use and conduct a more real and reliable evaluation of its performance;

[0019] (2) Moreover, since the closed shell is initially located in the detection area far from the upper surface of the test bench, when the closed shell keeps moving closer to each other, the position of the backlight module to be detected can also be adjusted. After the closed shell stops moving, it ensures that the backlight module to be detected is accurately corresponding to the directly below of the tester, thereby ensuring that the tester obtains the best receiving angle and distance, improving the test accuracy, and also realizing the consistency and repeatability of multiple tests. The same position adjustment can ensure the consistency of test results conducted at different times and by different operators, and then can achieve fast and accurate automated testing;

[0020] (3) During the movement of the above-mentioned adjustment plate, it will drive the cleaning plate to clean it. Dust and impurities will affect the transmission and distribution of light. By using the cleaning cloth on the lower surface of the cleaning plate to clean and remove dust, the scattering and absorption of light on the surface of the backlight module can be reduced, improving the light transmission efficiency. This can improve the brightness, uniformity, and contrast of the backlight module, enhance the display effect, avoid color distortion caused by the presence of dust and impurities on the surface of the backlight module, and prevent the occurrence of color distortion. This helps to maintain the accurate color performance of the backlight module and improve the display quality. In addition, when dust and impurities exist on the surface of the backlight module, visible particles or spots will be formed, causing visual interference. By cleaning and removing dust, these visual interferences can be eliminated, providing a clear and clean display image. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is the front view three-dimensional structure schematic diagram of the present invention;

[0022] Figure 2 is the three-dimensional structure schematic diagram of the light anti-interference closing mechanism of the present invention;

[0023] Figure 3 is the three-dimensional structure schematic diagram of the internal components such as the test bench of the present invention;

[0024] Figure 4 For the present invention Figure 3 is the enlarged three-dimensional structure schematic diagram of part A in the present invention;

[0025] Figure 5 is the three-dimensional structure schematic diagram of components such as the turntable of the present invention;

[0026] Figure 6 is the side view three-dimensional structure schematic diagram of the present invention;

[0027] Figure 7 is the three-dimensional structure schematic diagram of the test pretreatment mechanism of the present invention;

[0028] Figure 8 is the three-dimensional structure schematic diagram of components such as the trapezoidal plate of the present invention;

[0029] Figure 9 Schematic three-dimensional structure diagram of components inside the limit cylinder of the present invention.

[0030] The reference numerals in the figure are: 1, test bench; 11, conveying rail; 12, support frame; 13, tester; 2, light anti-interference closing mechanism; 21, curved rod; 22, baffle plate; 23, sliding sleeve; 24, rotating shaft; 25, connecting bin; 26, turntable; 27, adjusting shaft; 28, moving plate; 29, closing shell; 3, test preprocessing mechanism; 31, fixing plate; 32, limit cylinder; 33, disc with rod; 3301, sliding rod; 34, trapezoidal plate; 35, limit frame; 36, adjusting plate; 37, connecting rod; 38, cleaning plate. Specific embodiments

[0031] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention;

[0032] Embodiments of the present invention

[0033] Please refer to Figures 1-9 as shown in

[0034] A test device dedicated to a backlight module, including a test bench 1, a conveying rail 11 is installed on the side wall of the test bench 1, a support frame 12 is fixedly connected to the upper surface of the test bench 1, a tester 13 is installed on the front side wall of the support frame 12, a test head is slidably connected inside the tester 13, a light anti-interference closing mechanism 2 is arranged inside the test bench 1, and a test preprocessing mechanism 3 is arranged above the conveying rail 11;

[0035] The light anti-interference closing mechanism 2 includes a curved rod 21 fixedly connected to the outer wall of the tester 13. The outer wall of the curved rod 21 is slidably connected to the test bench 1. A shielding plate 22 is fixedly connected to the outer wall of the curved rod 21. The shielding plate 22 is sleeved on the outer wall of the test head inside the tester 13. One end of the curved rod 21 away from the tester 13 is fixedly connected to a sliding sleeve 23. A rotating shaft 24 is installed on the inner wall of the sliding sleeve 23. The rotating shaft 24 is rotatably connected to the bottom of the inner cavity of the test bench 1. A connecting bin 25 is rotatably connected to the outer wall of the rotating shaft 24. The connecting bin 25 is fixedly connected to the inner side wall of the test bench 1. A turntable 26 is fixedly connected to the upper surface of the rotating shaft 24. Adjusting shafts 27 are uniformly installed through the upper and lower surfaces of the turntable 26. Moving plates 28 are uniformly fixedly connected to the lower surfaces of the adjusting shafts 27. The moving plates 28 are all slidably connected through the inside of the connecting bin 25. Closing shells 29 are fixedly connected to the upper surfaces of the moving plates 28. Cylindrical protrusions are symmetrically fixedly connected to the inner wall of the sliding sleeve 23. Continuous curved grooves are formed at positions corresponding to the cylindrical protrusions on the outer wall of the rotating shaft 24. The rotating shaft 24 and the sliding sleeve 23 are slidably connected through the arc-shaped grooves and the cylindrical protrusions. Arc-shaped grooves are vertically penetrated through the surface of the turntable 26 at positions corresponding to the adjusting shafts 27. The turntable 26 and the adjusting shafts 27 are rotatably connected through the arc-shaped grooves. The closing shell 29 is integrally quarter-circular, and chutes are formed on the upper surface of the test bench 1 at positions corresponding to the closing shell 29;

[0036] Specifically, compared with the existing backlight module detection equipment, by adjusting the brightness and angle of the equipment light source to obtain appropriate lighting conditions, or by the staff actively selecting a stable environment to avoid strong light direct irradiation or strong light reflection into the test area. The cooperation between the above-mentioned shielding plate 22 and the closing shell 29 provides a good test environment for the device. It can not only directly isolate external light, dust, fans and other interference factors, but also avoid the discrete and leakage phenomena of the light source during the test of the tester 13. Furthermore, it ensures uniform light distribution during the test and avoids the interference of the light source on the test results, which helps to ensure the accuracy and reliability of the test results, avoid the influence of external factors on the backlight module test. And, through the isolation of the shielding plate 22 and the closing shell 29, it can also avoid changes in the temperature and humidity of the external environment during the test, and then more closely simulate the working environment of the backlight module in use and conduct a more real and reliable evaluation of its performance;

[0037] The lower surface of the tester 13 is fixedly connected to a fixing plate 31. One end of the fixing plate 31 away from the tester 13 is fixedly connected to a limiting cylinder 32. The outer wall of the shielding plate 22 is fixedly connected to a disc with a rod 33. One end of the disc with a rod 33 away from the shielding plate 22 is slidably connected to the inner wall of the limiting cylinder 32. The lower surface of the disc with a rod 33 is fixedly connected to a sliding rod 3301. One end of the sliding rod 3301 away from the disc with a rod 33 is fixedly connected to a trapezoidal plate 34. The outer wall of the limiting cylinder 32 is fixedly connected to a limiting frame 35. The inner side walls of the limiting frame 35 are symmetrically and slidably connected to adjusting plates 36. The lower surfaces of the adjusting plates 36 are fixedly connected to connecting rods 37. The lower ends of the connecting rods 37 are fixedly connected to cleaning plates 38. A circular hole groove is penetrated through the outer wall of the limiting cylinder 32 at the position corresponding to the disc with a rod 33. The disc with a rod 33 is initially located at the uppermost position inside the limiting cylinder 32. Fixed blocks are arranged on the left and right sides of the trapezoidal plate 34. The adjusting plates 36 are provided with inclined groove at the positions corresponding to the fixed blocks of the trapezoidal plate 34. The trapezoidal plate 34 and the adjusting plates 36 are initially in a fitting state. The cleaning plates 38 are located directly above the conveying rail 11. One side of the cleaning plates 38 close to the conveying rail 11 is detachably installed with a cleaning cloth, and the cleaning cloth is made of high-density cotton cloth material;

[0038] Specifically, during the movement of the above-mentioned adjusting plates 36, the cleaning plates 38 will be driven to clean it. Dust and impurities will affect the transmission and distribution of light. The cleaning cloth on the lower surface of the cleaning plates 38 is used to clean and remove dust, which can reduce the scattering and absorption of light on the surface of the backlight module, improve the light transmission efficiency, which can improve the brightness, uniformity and contrast of the backlight module, enhance the display effect, avoid the occurrence of color distortion caused by the presence of dust and impurities on the surface of the backlight module, prevent the occurrence of color distortion, which helps to maintain the accurate color performance of the backlight module and improve the display quality. In addition, when dust and impurities exist on the surface of the backlight module, visible particles or spots will be formed, causing visual interference. By cleaning and removing dust, these visual interferences can be eliminated, providing a clear and clean display image;

[0039] The following are the complete usage steps and working principles of the above-mentioned embodiments:

[0040] The usage process of this device: When the staff needs to conduct an overall test on the backlight module, first, it is necessary to ensure that the light source and optical system of the test instrument are working properly, calibrate and adjust the parameters and settings of the test instrument. After that, place the backlight module to be tested in the designated test area and the area to be tested above the test bench 1 and the conveying rail 11. According to the specifications of the backlight module to be tested this time, set the parameters of the tester 13, such as the brightness level and the test time. Finally, start the test instrument, trigger the test head in the tester 13 to slowly move downward to the test position, and then start the test operation on the backlight module;

[0041] When the tester 13 is used for testing, the light anti-interference closing mechanism 2 that automatically closes to provide a good testing environment is used as follows:

[0042] Since the outer wall of the test head in the tester 13 is fixedly connected with a curved rod 21, and the curved rod 21 is integrally slidably connected to the inside of the test bench 1, when the test head in the tester 13 moves downward, the curved rod 21 will move downward synchronously with it. Since one end of the curved rod 21 away from the tester 13 is fixedly connected with a sliding sleeve 23, and the inner wall of the sliding sleeve 23 is symmetrically and fixedly connected with cylindrical protrusions, and at the position corresponding to the cylindrical protrusions on the outer wall of the rotating shaft 24, there are continuous curved grooves, and the rotating shaft 24 and the sliding sleeve 23 are slidably connected through an arc groove and the cylindrical protrusions. Therefore, when the sliding sleeve 23 moves downward, the cylindrical protrusions on its inner wall will continuously squeeze the curved grooves on the outer wall of the rotating shaft 24, thereby driving the rotating shaft 24 to keep rotating. Since the upper end of the rotating shaft 24 is fixedly connected with a turntable 26, and the outer wall of the rotating shaft 24 is rotatably connected with a connecting bin 25, and the connecting bin 25 is fixedly connected to the inner side wall of the test bench 1. Therefore, during the rotation of the rotating shaft 24, the connecting bin 25 remains stationary, while the turntable 26 will rotate synchronously with the rotating shaft 24. Since an arc groove is vertically penetrated on the surface of the turntable 26 corresponding to the position of the adjusting shaft 27, and the turntable 26 and the adjusting shaft 27 are rotatably connected through the arc groove. At the same time, the lower ends of the adjusting shafts 27 are fixedly connected with moving plates 28, and the moving plates 28 are integrally penetrated and slidably connected to the inside of the connecting bin 25. Therefore, during the rotation of the turntable 26, the arc groove opened on its surface will continuously squeeze the outer wall of the adjusting shaft 27, thereby driving the moving plate 28 to slide along the outer wall of the connecting bin 25. Since the outer wall of the curved rod 21 is fixedly connected with a shielding plate 22, and the shielding plate 22 is sleeved on the outer wall of the test head inside the tester 13, and the closing shell 29 is integrally quarter-circular, and chutes are opened on the upper surface of the test bench 1 corresponding to the position of the closing shell 29. Therefore, when the detection head in the tester 13 moves downward, the shielding plate 22 will move downward synchronously with it, and drive the closing shell 29 to move along the inner wall of the chute, thereby ensuring that the shielding plate 22 and the closing shell 29 form a completely enclosed circular cylinder;

[0043] Compared with the existing backlight module detection equipment, by adjusting the brightness and angle of the equipment light source to obtain appropriate lighting conditions, or by the staff actively selecting a stable environment to avoid strong light direct irradiation or strong light reflection onto the test area. The cooperation between the above-mentioned baffle 22 and the closed shell 29 provides a good test environment for this device. It can not only directly isolate external interference factors such as light, dust, and fans, but also avoid the dispersion and leakage of the light source during the test of the tester 13. Furthermore, it ensures uniform light distribution during the test and avoids the interference of the light source on the test result, which helps to ensure the accuracy and reliability of the test result, avoid the influence of external factors on the backlight module test. And through the isolation of the baffle 22 and the closed shell 29, it can also avoid the change of the temperature and humidity of the external environment during the test, and then more closely simulate the working environment of the backlight module in use and conduct a more real and reliable evaluation of its performance;

[0044] Moreover, since the closed shell 29 is initially located in the detection area far from the upper surface of the test bench 1, when the closed shell 29 moves closer to each other, the position of the backlight module to be detected can also be adjusted. After the closed shell 29 stops moving, it ensures that the backlight module to be detected is accurately positioned directly below the tester 13, thereby ensuring that the tester 13 obtains the best receiving angle and distance, improving the test accuracy, and also enabling the consistency and repeatability of multiple tests. The same position adjustment can ensure the consistency of the test results obtained at different times and by different operators, and then achieve fast and accurate automated testing;

[0045] When the test pretreatment mechanism 3 for automatically cleaning the test surface of the tester 13 before the test to ensure the cleanliness of the test surface is specifically used:

[0046] Since the limiting cylinder 32 is fixedly connected to the side wall of the tester 13 through the fixed plate 31, and a disc with a rod 33 is fixedly connected to the outer wall of the shielding plate 22, the disc with a rod 33 is slidably connected to the inside of the limiting cylinder 32. At the same time, a circular hole groove is penetrated through the outer wall of the limiting cylinder 32 at the position corresponding to the disc with a rod 33. The disc with a rod 33 is initially located at the uppermost part inside the limiting cylinder 32. Therefore, when the above-mentioned shielding plate 22 moves downward following the detection head, it will drive the disc with a rod 33 to move downward synchronously along the inner wall of the circular hole groove. Since the lower surface of the disc with a rod 33 is fixedly connected to a trapezoidal plate 34 through a sliding rod 3301, the trapezoidal plate 34 will move downward synchronously with the disc with a rod 33. Since a limiting frame 35 is fixedly connected to the outer wall of the limiting cylinder 32, and the inner side walls of the limiting frame 35 are symmetrically slidably connected with adjusting plates 36. At the same time, fixing blocks are arranged on the left and right sides of the trapezoidal plate 34, and inclined surface grooves are opened at the positions of the adjusting plates 36 corresponding to the fixing blocks of the trapezoidal plate 34. The trapezoidal plate 34 and the adjusting plates 36 are initially in a fitting state. Therefore, when the above-mentioned trapezoidal plate 34 moves downward, it will continuously squeeze the adjusting plates 36 through the fixing blocks on both sides, thereby driving the adjusting plates 36 to move away from the trapezoidal plate 34. Since connecting rods 37 are fixedly connected to the lower surfaces of the adjusting plates 36, and the lower ends of the connecting rods 37 are inserted with cleaning plates 38. At the same time, the cleaning plates 38 are located directly above the conveying rail 11. A cleaning cloth is detachably installed on one side of the cleaning plate 38 close to the conveying rail 11, and the lower surface of the cleaning plate 38 is attached to the upper part of the backlight module to be detected. Therefore, during the movement of the above-mentioned adjusting plates 36, the cleaning plates 38 will be driven to clean it. Dust and impurities will affect the transmission and distribution of light. By cleaning the dust through the cleaning cloth on the lower surface of the cleaning plate 38, the scattering and absorption of light on the surface of the backlight module can be reduced, and the light transmission efficiency can be improved. This can improve the brightness, uniformity and contrast of the backlight module, enhance the display effect, and avoid the occurrence of color distortion caused by the presence of dust and impurities on the surface of the backlight module, preventing the occurrence of color distortion. This helps to maintain the accurate color performance of the backlight module and improve the display quality. In addition, when dust and impurities exist on the surface of the backlight module, visible particles or spots will be formed, causing visual interference. By cleaning the dust, these visual interferences can be eliminated, providing a clear and clean display image.

[0047] Although the embodiments of the present invention have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test device specifically for a backlight module, comprising a test bench (1), a conveying rail (11) is installed on the side wall of the test bench (1), a support frame (12) is fixedly connected to the upper surface of the test bench (1), a tester (13) is installed on the front side wall of the support frame (12), and a test head is slidably connected inside the tester (13), characterized in that: Inside the test bench (1), there is a light anti-interference closing mechanism (2), and above the conveying rail (11), there is a test preprocessing mechanism (3). The light anti-interference closing mechanism (2) is used to automatically close when the tester (13) is performing a test, thereby providing a good test environment. The test preprocessing mechanism (3) is used to automatically clean the test surface of the tester (13) before the test, thereby ensuring the cleanliness of the test surface.

2. The test device dedicated to a backlight module according to claim 1, characterized in that: The light anti-interference closing mechanism (2) includes a curved rod (21) fixedly connected to the outer wall of the tester (13). The outer wall of the curved rod (21) is slidably connected to the test bench (1). The outer wall of the curved rod (21) is fixedly connected with a shielding plate (22). The shielding plate (22) is sleeved on the outer wall of the test head inside the tester (13). One end of the curved rod (21) far from the tester (13) is fixedly connected with a sliding sleeve (23). A rotating shaft (24) is installed on the inner wall of the sliding sleeve (23). The rotating shaft (24) is rotatably connected to the bottom of the inner cavity of the test bench (1). The outer wall of the rotating shaft (24) is rotatably connected with a connecting bin (25). The connecting bin (25) is fixedly connected to the inner side wall of the test bench (1). The upper surface of the rotating shaft (24) is fixedly connected with a turntable (26). The upper and lower surfaces of the turntable (26) are uniformly penetrated and installed with adjusting shafts (27). The lower surfaces of the adjusting shafts (27) are uniformly fixedly connected with moving plates (28). The moving plates (28) are all slidably connected through the inside of the connecting bin (25). The upper surfaces of the moving plates (28) are all fixedly connected with closing shells (29).

3. The test device dedicated to a backlight module according to claim 2, characterized in that: Symmetrically fixed cylindrical protrusions are provided on the inner wall of the sliding sleeve (23). Continuous curved grooves are provided at positions corresponding to the cylindrical protrusions on the outer wall of the rotating shaft (24). The rotating shaft (24) and the sliding sleeve (23) are slidably connected through the arc-shaped groove and the cylindrical protrusion.

4. The test device dedicated to a backlight module according to claim 2, wherein: Arc-shaped grooves are penetrated up and down at positions corresponding to the adjusting shafts (27) on the surface of the turntable (26). The turntable (26) and the adjusting shafts (27) are rotatably connected through the arc-shaped grooves. The closing shell (29) is integrally quarter-circular, and chutes are provided on the upper surface of the test bench (1) corresponding to the positions of the closing shells (29).

5. The test device dedicated to a backlight module according to claim 2, characterized in that: The lower surface of the tester (13) is fixedly connected with a fixing plate (31). One end of the fixing plate (31) away from the tester (13) is fixedly connected with a limiting cylinder (32). The outer wall of the shielding plate (22) is fixedly connected with a disc with a rod (33). One end of the disc with a rod (33) away from the shielding plate (22) is slidably connected to the inner wall of the limiting cylinder (32). The lower surface of the disc with a rod (33) is fixedly connected with a sliding rod (3301). One end of the sliding rod (3301) away from the disc with a rod (33) is fixedly connected with a trapezoidal plate (34). The outer wall of the limiting cylinder (32) is fixedly connected with a limiting frame (35). The inner side walls of the limiting frame (35) are symmetrically slidably connected with adjusting plates (36). The lower surfaces of the adjusting plates (36) are fixedly connected with connecting rods (37). The lower ends of the connecting rods (37) are fixedly connected with cleaning plates (38).

6. The test device dedicated to a backlight module according to claim 5, characterized in that: A circular hole groove is penetrated and opened at the position of the outer wall of the limiting cylinder (32) corresponding to the disc with a rod (33). The disc with a rod (33) is initially located at the uppermost part inside the limiting cylinder (32).

7. The testing device dedicated to a backlight module according to claim 5, wherein: Fixed blocks are arranged on the left and right sides of the trapezoidal plate (34). The adjusting plates (36) are provided with inclined surface grooves at the positions corresponding to the fixed blocks of the trapezoidal plate (34). The trapezoidal plate (34) and the adjusting plates (36) are initially in a fitting state.

8. The testing device dedicated to a backlight module according to claim 5, wherein: The cleaning plate (38) is located directly above the conveying rail (11). A cleaning cloth is detachably installed on one side of the cleaning plate (38) close to the conveying rail (11), and the cleaning cloth is made of high-density cotton cloth material.

Images