Test fixture and test equipment

Abstract

The invention discloses a test fixture and test equipment, and belongs to the technical field of low-voltage electrical appliances, the test fixture comprises a needle carrier, a plate carrier, an elastic piece and a pressing plate, the needle carrier is provided with a test probe, the plate carrier comprises a first limiting structure, the first limiting structure is used for limiting a PCBA board to be tested, and the plate carrier is slidably arranged on the needle carrier; the elastic piece is arranged between the needle carrier and the plate carrier, and enables the plate carrier to have a trend of sliding away from the needle carrier; the pressing plate is hinged to the needle carrier. According to the test fixture provided by the invention, when the board carrier is located at the first position, the PCBA board on the board carrier is spaced from the test probe; the pressing plate is rotated towards the board carrier to press the PCBA board on the board carrier, the pressing plate pushes the board carrier from the first position to the second position, the PCBA board and the test probe are accurately and stably contacted and conducted, the operation is convenient, the function test efficiency is effectively improved, and the test result is stable and reliable.

Description

Technical Field

[0001] The present invention relates to the technical field of low-voltage electrical appliances, and particularly to a test fixture and a test device. Background Art

[0002] PCBA represents printed circuit board assembly. It refers to making a bare PCB according to the design schematic diagram of an electronic product by a circuit board manufacturer, and then soldering corresponding components on the bare PCB. In some cases, the DIP plug-in process is also required to assist in completing the soldering of components. The PCB board after soldering is collectively referred to as a PCBA board. Currently, PCBA boards are widely used in low-voltage electrical appliances, such as leakage protectors.

[0003] In the related art, for the aging and function testing of PCBA boards in low-voltage electrical appliances, most of them mainly use self-made simple tooling and matching transfer wires, and the test personnel conduct function tests on the PCBA boards and judge the results. However, the simple tooling has low usability and requires manual wiring. In addition, there is a potential risk of unreliable contact in manual wiring, resulting in low test efficiency. Summary of the Invention

[0004] An object of the present invention is to provide a test fixture, which is convenient to operate, has stable and reliable testing, and effectively improves the test efficiency.

[0005] To achieve this purpose, the present invention adopts the following technical solutions:

[0006] Provide a test fixture, including:

[0007] A needle carrier provided with test probes;

[0008] A board carrier including a first limiting structure for limiting the PCBA board to be tested, and the board carrier is slidably arranged on the needle carrier along a first direction; the board carrier slides to a first position where the PCBA board on the board carrier is separated from the test probes; the board carrier slides to a second position where the PCBA board on the board carrier is in contact and conduction with the test probes;

[0009] An elastic member is arranged between the needle carrier and the board carrier, and the elastic member makes the board carrier have a tendency to slide away from the needle carrier along the first direction;

[0010] A pressing plate is hinged to the needle carrier, and the pressing plate can press the PCBA board onto the board carrier and push the board carrier from the first position to the second position.

[0011] Optionally, the test fixture also includes a base plate and a guide assembly arranged on the base plate, the guide assembly is connected to the needle carrier, and the needle carrier can move along a second direction relative to the base plate through the guide assembly, and the first direction and the second direction are perpendicular to each other.

[0012] Optionally, a second limiting structure is provided on the base plate; the needle carrier moves to the installation position, and the needle carrier protrudes from the base plate along the second direction; the needle carrier moves to the test position, and the projection of the needle carrier along the first direction is located within the base plate, and the second limiting structure and the pressure plate form a limiting fit along the first direction, so that the board carrier is maintained in the second position, and the pressure plate presses the PCBA board onto the board carrier.

[0013] Optionally, the second limiting structure includes:

[0014] Two support frames are spaced apart along the third direction, and the pressing plate is located between the two support frames;

[0015] A limiting column is arranged on the support frame, and the limiting column is extended along the third direction; the needle carrier moves to the test position, and the periphery of the limiting column abuts against the side of the pressing plate away from the plate carrier to form a limiting fit along the first direction;

[0016] The first direction, the second direction and the third direction are perpendicular to each other.

[0017] Optionally, the pressure plate is provided with limit plates on both sides along the third direction, and the limit plates include limit surfaces and transition surfaces that are connected to each other; along the direction in which the needle carrier moves from the installation position toward the test position, the limit surfaces and the transition surfaces are arranged in sequence; when the needle carrier moves to the test position, the second limit structure abuts against the limit surface on the corresponding side to form a limit fit along the first direction.

[0018] Optionally, the test fixture further comprises:

[0019] A baffle, the baffle being fixed on one side of the bottom plate along the second direction, and the baffle being provided with a first plug-in terminal;

[0020] A frame, the frame is fixed to a side of the needle carrier facing away from the plate carrier, a clearance cavity is formed between the frame and the needle carrier, and the test probe extends into the clearance cavity;

[0021] An adapter plate, disposed in the yield cavity and electrically connected to the test probe;

[0022] A second plug-in terminal is provided on a side of the frame facing the baffle, and the second plug-in terminal is electrically connected to the adapter board;

[0023] The needle carrier moves to the installation position, and the first plug-in terminal is separated from the second plug-in terminal;

[0024] The needle carrier moves to the test position, and the first plug-in terminal is plugged into the second plug-in terminal.

[0025] Optionally, the test fixture further includes a frame fixed to a side of the needle carrier facing away from the board carrier. A relief cavity is formed between the frame and the needle carrier, and the test probe extends into the relief cavity.

[0026] Optionally, the test fixture further includes:

[0027] A bottom plate;

[0028] A guiding assembly including a sliding rail and a slider connected in a sliding manner. The sliding rail is fixed to the bottom plate;

[0029] A mounting plate fixed to the slider and detachably connected to the frame.

[0030] Optionally, one of the mounting plate and the frame is provided with a positioning pin, and the other is provided with a positioning hole. The positioning pin is detachably plugged into the positioning hole.

[0031] Optionally, the test fixture further includes a first plug-in terminal and a second plug-in terminal plugged into the first plug-in terminal. The second plug-in terminal is fixedly connected to the board carrier and is electrically connected to the test probe.

[0032] Optionally, the test fixture further includes a telescopic rod with adjustable length. One end of the telescopic rod is hinged to the needle carrier, and the other end is hinged to the pressing plate.

[0033] Optionally, the telescopic rod includes a rod barrel and an inner rod inserted into the rod barrel. The inner rod is telescopic relative to the rod barrel and has a tendency to extend out of the rod barrel. One of the rod barrel and the inner rod is hinged to the needle carrier, and the other is hinged to the pressing plate.

[0034] Another object of the present invention is to further provide a test device, including a box body, a signal acquisition module, a temperature control module, and the above-mentioned test fixture. The box body has a test chamber, and the test fixture is arranged in the test chamber;

[0035] Wherein, the test probe of the test fixture is electrically connected to the signal acquisition module. The signal acquisition module can test the tripping information of the PCBA board through the test probe, and the temperature control module is used to adjust the temperature in the test chamber to age the PCBA board.

[0036] Optionally, the test device further includes a host computer disposed in the box body. The host computer is electrically connected to the signal acquisition module, and the host computer is configured to receive the tripping information and determine whether the PCBA board is qualified according to the received tripping information.

[0037] Another object of the present invention is to further provide a test method, which is applied to the above test device and includes:

[0038] Obtain a function test start signal, and start testing the function of the PCBA board based on the function test start signal;

[0039] Send a leakage signal to the PCBA board, obtain tripping information, and determine whether the PCBA board is qualified according to the tripping information.

[0040] Optionally, the test method further includes:

[0041] Obtain an aging test start signal, and start testing the function of the PCBA board during aging based on the aging test start signal;

[0042] Obtain a temperature signal and adjust the temperature in the test chamber of the box body to age the PCBA board. Send the leakage signal to the PCBA board every time period T, and obtain the tripping information. Determine whether the PCBA board is qualified according to multiple pieces of the tripping information.

[0043] Beneficial effects: When testing the function of the PCBA board, the test fixture provided by the present invention first places the PCBA board on the board carrier and limits the PCBA board through the first limiting structure. Then, rotate the pressing plate towards the board carrier so that the pressing plate pushes the board carrier from the first position to the second position, realizing the contact conduction between the PCBA board and the test probe. The PCBA board can meet the test requirements of electrical conduction without connecting to wires, which is convenient to operate and effectively improves the function test efficiency. In addition, the pressing plate can also press the PCBA board tightly on the board carrier, and the PCBA board is limited by the first limiting structure, so that the PCBA board can be in precise and stable contact conduction with the test probe, effectively ensuring the stability and reliability of the function test results.

[0044] In addition, after the PCBA board is tested, rotate the pressing plate away from the board carrier so that the pressing plate disengages from the PCBA board. Under the action of the elastic member, the board carrier slides to the first position, so that the PCBA board is separated from the test probe, which is convenient for the installation of the PCBA board in the next round and effectively avoids damage caused by the contact between the PCBA board and the test probe during installation.

[0045] The test equipment provided by the present invention can achieve the functional test of the PCBA board by the cooperation of the test fixture and the signal acquisition module; the temperature in the test chamber is adjusted by the temperature control module to meet the aging requirements of the PCBA board, so as to realize the aging test of the PCBA board by the test equipment. In addition, by setting the test fixture, the test equipment effectively improves the functional test efficiency and ensures the stability and reliability of the functional test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 is a schematic structural diagram of a feasible implementation manner of the test fixture provided by the present invention Figure 1 ;

[0047] Figure 2 is provided by the present invention Figure 1 The enlarged view at A in

[0048] Figure 3 is a partial structural schematic diagram of the panel provided by the present invention;

[0049] Figure 4 is a structural schematic diagram of the pressing plate provided by the present invention;

[0050] Figure 5 is a schematic structural diagram of another feasible implementation manner of the test fixture provided by the present invention Figure 1 ;

[0051] Figure 6 is a schematic structural diagram of another feasible implementation manner of the test fixture provided by the present invention Figure 2 ;

[0052] Figure 7 is a partial structural schematic diagram of another feasible implementation manner of the test fixture provided by the present invention;

[0053] Figure 8 is a schematic structural diagram of yet another feasible implementation manner of the test fixture provided by the present invention Figure 2 ;

[0054] Figure 9 is a schematic structural diagram of a feasible implementation manner of the test fixture provided by the present invention Figure 2 ;

[0055] Figure 10 is a specific structural schematic diagram of the test equipment provided by the present invention;

[0056] Figure 11 is a flowchart of the test method provided by the present invention;

[0057] Figure 12 is a detailed flowchart of the test method provided by the present invention.

[0058] In the figure:

[0059] 10. Cabinet; 11. Cabinet door; 12. Support platform; 13. Control cabinet; 20. Signal acquisition module; 30. Host computer; 40. Test fixture; 50. Scanning device; 60. Programmable AC voltage source; 70. Temperature control module; 71. Temperature control box; 72. First fan; 73. Second fan; 80. Three-color indicator light; 90. Splint; 91. PCBA board; 92. Components; 93. Perforation

[0060] 100. Needle carrier; 110. Test probe; 120. Sleeve; 130. First hinge seat

[0061] 200. Board carrier; 210. First limiting structure; 211. Limiting groove; 2111. Groove; 212. Limiting pin; 220. Pick-and-place slot; 230. Guide shaft

[0062] 300. Elastic member

[0063] 400. Pressure plate; 401. Connecting plate; 410. Pressing rod; 420. First handle; 430. Limiting plate; 431. Limiting surface; 432. Transition surface; 440. Hinge; 450. Second hinge seat

[0064] 500. Frame; 510. Second handle; 520. Adapter plate; 530. Second plug-in terminal; 540. Fixed plate

[0065] 600. Bottom plate; 610. Second limiting structure; 611. Support frame; 6111. First long hole; 612. Limiting column; 620. Baffle; 621. First plug-in terminal; 630. Reinforcing plate

[0066] 700. Guide assembly

[0067] 800. Mounting plate; 810. Positioning pin

[0068] 900. Telescopic rod; 910. Rod barrel; 920. Inner rod Detailed implementation manners

[0069] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present invention, rather than limiting the present invention. In addition, it should be noted that, for the convenience of description, only parts related to the present invention are shown in the drawings, rather than all the structures.

[0070] In the description of the present invention, unless otherwise clearly defined and limited, the terms "connected", "connected to", and "fixed" shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0071] In the present invention, unless otherwise clearly defined and limited, the first feature being "above" or "below" the second feature may include the direct contact between the first and second features, or may include the situation where the first and second features are not in direct contact but in contact through other features therebetween. Moreover, the first feature being "above", "over", and "on" the second feature includes that the first feature is directly above and obliquely above the second feature, or merely indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature being "below", "under", and "beneath" the second feature includes that the first feature is directly below and obliquely below the second feature, or merely indicates that the horizontal height of the first feature is lower than that of the second feature.

[0072] In the description of this embodiment, the orientation or positional relationships such as "above", "below", "right", etc. are based on the orientation or positional relationship shown in the drawings. It is only for the convenience of description and simplifying the operation, rather than indicating or implying that the device or component referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present invention. In addition, the terms "first" and "second" are only used for distinction in description and have no special meaning.

[0073] Referring to Figures 1 to 4 As shown, this embodiment provides a test fixture, which includes a pin carrier 100, a board carrier 200, an elastic member 300, and a pressing plate 400.

[0074] Specifically, the needle carrier 100 is provided with test probes 110; the board carrier 200 includes a first limiting structure 210 for limiting the PCBA board 91 to be tested. The board carrier 200 is slidably disposed on the needle carrier 100 in a first direction and has a first position and a second position when sliding in the first direction. When the board carrier 200 slides to the first position, the PCBA board 91 on the board carrier 200 is separated from the test probes 110, that is, the PCBA board 91 is not in contact with the test probes 110. When the board carrier 200 slides to the second position, the PCBA board 91 on the board carrier 200 is in contact conduction with the test probes 110. An elastic member 300 is disposed between the needle carrier 100 and the board carrier 200, and the elastic member 300 makes the board carrier 200 tend to slide away from the needle carrier 100 in the first direction. The pressing plate 400 is hinged to the needle carrier 100, and the pressing plate 400 can press the PCBA board 91 onto the board carrier 200 and push the board carrier 200 from the first position to the second position. Wherein, the first direction may be the height direction of the test fixture.

[0075] It can be understood that the needle carrier 100 has a first surface and a second surface opposite to each other in the first direction, and the second surface faces the board carrier 200. The first end of the test probe 110 can penetrate from the first surface to the second surface and protrude from the second surface, so that when the board carrier 200 is in the second position, the PCBA board 91 on the board carrier 200 is in contact conduction with the first end of the test probe 110.

[0076] It can be understood that the test fixture provided in this embodiment can be applied to a test device that takes into account high-temperature aging, inputs relevant electrical signals, and judges the results, such as the judgment of the tripping test results of low-voltage electrical appliances.

[0077] When it is necessary to test the function of the PCBA board 91, first, the PCBA board 91 can be placed on the board carrier 200 and the PCBA board 91 can be limited by the first limiting structure 210. Then, rotate the pressing plate 400 towards the board carrier 200 so that the pressing plate 400 pushes the board carrier 200 from the first position to the second position, realizing the contact conduction between the PCBA board 91 and the test probes 110. The PCBA board 91 can meet the test requirements of electrical conduction without being connected to a wire, which is convenient for operation and effectively improves the function test efficiency. In addition, the pressing plate 400 can also press the PCBA board 91 onto the board carrier 200, and the PCBA board 91 is limited by the first limiting structure 210, so that the PCBA board 91 can be in accurate and stable contact conduction with the test probes 110, effectively ensuring the stability and reliability of the function test results.

[0078] After the PCBA board 91 is tested, the pressing plate 400 is rotated away from the board carrier 200 to disengage the pressing plate 400 from the PCBA board 91. Under the action of the elastic member 300, the board carrier 200 slides to the first position to separate the PCBA board 91 from the test probe 110, facilitating the installation of the next round of PCBA boards 91 and effectively preventing damage to the PCBA board 91 caused by contact with the test probe 110 during installation.

[0079] In this embodiment, referring to Figures 1 to 3 As shown, a plurality of test probes 110 are provided on the needle carrier 100 to meet the test requirements for the electrical conduction of the PCBA board 91. In this embodiment, the elastic member 300 positions the board carrier 200 at the first position, which can prevent the situation where the PCBA board 91 cannot be placed stably due to the height difference of the test probes 110.

[0080] In a feasible implementation manner, the board carrier 200 can carry a panel board 90 composed of a plurality of PCBA boards 91 combined to improve the functional test efficiency.

[0081] Exemplarily, at least one probe group is provided on the needle carrier 100, and the number of probe groups is the same as the number of PCBA boards 91 in the panel board 90, that is, the probe groups correspond to the PCBA boards 91 one by one. Among them, each probe group includes a plurality of test probes 110.

[0082] In this embodiment, the test probe 110 can be electrically connected to the signal acquisition module 20, and the signal acquisition module 20 can be electrically connected to the host computer 30. The signal acquisition module 20 can test the tripping information of the PCBA board 91 through the test probe 110, and the host computer 30 can receive the tripping information and determine whether the PCBA board 91 is qualified according to the received tripping information. In this embodiment, the data of the PCBA board 91 collected by the signal acquisition module 20 at least includes that the PCBA board 91 obtains a leakage signal and transmits the generated tripping signal to the signal acquisition module 20, and the signal acquisition module 20 generates the tripping information of the PCBA board 91. In some embodiments, the signal acquisition module 20 includes a tripping device or is connected to a tripping device to simulate the tripping of a low-voltage electrical product, and whether the tripping device trips is the tripping information. Of course, the tripping of the low-voltage electrical product can also be simulated by a relay or other means, which is not limited in this embodiment.

[0083] In this embodiment, referring to Figure 1 and Figure 2 As shown, a plurality of through holes (not shown) are also provided on the board carrier 200, and the through holes are arranged in one-to-one correspondence with the test probes 110. The test probes 110 pass through the corresponding through holes to prevent contact between the test probes 110 and achieve electrical isolation.

[0084] Exemplarily, the material of the board carrier 200 includes but is not limited to antistatic bakelite or glass fiber epoxy resin (FR-4), which has an ESD protection function.

[0085] In a feasible implementation, a sliding sleeve 120 can be provided on the needle carrier 100, and a guiding shaft 230 is provided on the board carrier 200. The guiding shaft 230 slidably penetrates through the sliding sleeve 120 to achieve the sliding of the board carrier 200 relative to the needle carrier 100, and it is stable and reliable. Exemplarily, a plurality of sliding sleeves 120 can be provided on the needle carrier 100 at intervals, such as four to eight, and the guiding shafts 230 are arranged in one-to-one correspondence with the needle carrier 100. Among them, the sliding sleeve 120 can be set as a sliding bearing.

[0086] In a feasible implementation, the elastic member 300 can be set as a spring. Exemplarily, a plurality of elastic members 300 can be provided at intervals, such as four to eight.

[0087] In this embodiment, referring to Figures 1 to 3 As shown, the first limiting structure 210 and the PCBA board 91 can form a limiting fit along a direction perpendicular to the first direction, and the PCBA board 91 can be attached to the board carrier 200 to form a limiting fit along the first direction. Among them, the direction perpendicular to the first direction can be any direction within the plane where the second direction and the third direction are located. The first direction, the second direction, and the third direction are perpendicular to each other. The second direction can be the length direction of the test fixture, and the third direction can be the width direction of the test fixture.

[0088] Specifically, the specific structure of the first limiting structure 210 when only one PCBA board 91 is loaded on the board carrier 200 is similar to the specific structure of the first limiting structure 210 when a panel board 90 is loaded on the board carrier 200. In this embodiment, taking the case where a panel board 90 is loaded on the board carrier 200 as an example, the description is as follows:

[0089] In some embodiments, the first limiting structure 210 includes a limiting groove 211 opened on the board carrier 200, and the panel board 90 can be placed in the limiting groove 211 to achieve the limiting of the panel board 90 along a direction perpendicular to the first direction, which is convenient for the positioning, disassembly, and assembly of the panel board 90.

[0090] Exemplarily, a groove 2111 is provided at the bottom of the limiting groove 211 to give way to the components 92 on the PCBA board 91, ensuring good attachment between the PCBA board 91 and the board carrier 200. Among them, the minimum clearance distance between the groove 2111 and the PCBA board 91 in the first direction is greater than or equal to 1 mm. In this embodiment, a plurality of grooves 2111 can be provided at intervals along the second direction.

[0091] In some other embodiments, the first limiting structure 210 includes a limiting pin 212 fixed to the board carrier 200. The limiting pin 212 can be inserted into the through hole 93 of the splicing board 90 to achieve the limiting of the splicing board 90 along the direction perpendicular to the first direction, facilitating the positioning, disassembly and assembly of the splicing board 90. Exemplarily, a plurality of limiting pins 212 are provided. By arranging the limiting pins 212 at appropriate positions on the board carrier 200, the situation of incorrect installation of the splicing board 90 can be effectively prevented, that is, the splicing board 90 can be placed on the board carrier 200 in only one suitable posture.

[0092] Exemplarily, the clearance between the limiting pin 212 and the through hole 93 of the PCBA board 91 is less than 0.02 mm, for example, 0.01 mm.

[0093] In a feasible implementation manner, the first limiting structure 210 includes both a limiting groove 211 and a limiting pin 212, wherein the limiting pin 212 is arranged in the limiting groove 211. Of course, the first limiting structure 210 can also be other limiting structures, which are not limited in this embodiment.

[0094] In this embodiment, a pick-and-place groove 220 communicating with the limiting groove 211 is further provided on the board carrier 200 to facilitate the disassembly and assembly of the PCBA board 91. Exemplarily, pick-and-place grooves 220 are provided on both sides of the board carrier 200 along the third direction, and the pick-and-place grooves 220 are provided as open grooves. It can be understood that at least a part of the projection of the PCBA board 91 placed on the board carrier 200 along the first direction is located in the pick-and-place groove 220.

[0095] In this embodiment, referring to Figure 4 As shown, a plurality of pressing rods 410 are provided on the pressing plate 400. The pressing plate 400 presses the PCBA board 91 on the board carrier 200 through the pressing rods 410. By arranging the pressing rods 410 at appropriate positions on the pressing plate 400 to avoid the components 92 on the PCBA board 91, it is ensured that the pressing plate 400 can stably abut against the board body of the PCBA board 91, so as to push the board carrier 200 from the first position to the second position and press the PCBA board 91 tightly on the board carrier 200, effectively preventing the situation that the pressing rods 410 damage the components 92. In addition, the PCBA board 91 is supported by the board carrier 200 and is squeezed by a plurality of pressing rods 410, and the deformation degree of the PCBA board 91 is small, which can ensure that the PCBA board 91 is stably in contact and conducts with the test probe 110.

[0096] Exemplarily, the pressing rods 410 can be fixed on the pressing plate 400 by means of bolt fastening.

[0097] In a feasible implementation manner, a first handle 420 is provided on the pressing plate 400 to facilitate the rotation of the pressing plate 400.

[0098] In this embodiment, referring to Figures 5 to 7As shown, the test fixture further includes a frame 500, which is fixed to the side of the needle carrier 100 away from the board carrier 200. A relief cavity is formed between the frame 500 and the needle carrier 100. The test probe 110 extends into the relief cavity to protect the test probe 110 and facilitate the electrical connection between the test probe 110 and the signal acquisition module 20.

[0099] In this embodiment, continue to refer to Figures 5 to 7 As shown, the test fixture further includes a bottom plate 600 and a guiding component 700 provided on the bottom plate 600. The guiding component 700 is connected to the needle carrier 100, and the needle carrier 100 can move relative to the bottom plate 600 along the second direction through the guiding component 700. It can be understood that the board carrier 200, the pressing plate 400 and the frame 500 can move together with the needle carrier 100. In this embodiment, the rotation axis of the pressing plate 400 relative to the needle carrier 100 can be parallel to the third direction. The test fixture is usually installed inside a box or a cabinet. By moving the needle carrier 100 along the second direction, the pressing plate 400 can extend out of the box or the cabinet, which can make it more convenient to rotate the pressing plate 400 and effectively prevent the pressing plate 400 from interfering with other structures, improving the applicability of the test fixture. Among them, the test fixture can also be installed in an aging chamber or equipment for temperature rise and electrical circuit layout. This embodiment is not limited.

[0100] In this embodiment, the needle carrier 100 is detachably connected to the guiding component 700. By replacing the needle carrier 100, the board carrier 200 and the pressing plate 400, the test fixture can be adapted to the testing of PCBA boards 91 of various specifications.

[0101] In a feasible implementation manner, the test fixture further includes a mounting plate 800 detachably connected to the frame 500, and the guiding component 700 is connected to the mounting plate 800. In this embodiment, the test fixture can be adapted to the testing of PCBA boards 91 of various specifications by replacing the test components, improving the applicability of the test fixture. Among them, the test components include the needle carrier 100, the board carrier 200, the pressing plate 400, the frame 500, and the components fixed on the needle carrier 100, the board carrier 200, the pressing plate 400 and the frame 500. It can be understood that at least the arrangement of the test probes 110 is different in different test components.

[0102] Exemplarily, the guiding component 700 can be a slide rail and slider structure, including a slide rail and a slider connected in a sliding manner. The slide rail is fixed on the bottom plate 600, and the mounting plate 800 is fixedly installed on the slider, which is convenient for assembly and has a stable and reliable connection. Of course, the guiding component 700 can also be a guiding structure in which a sliding bearing cooperates with a optical axis, a lead screw and slide table or other guiding structures. This embodiment is not limited.

[0103] Exemplarily, two slide rails are provided at intervals along the third direction, and two sliders are provided on each slide rail. Of course, the number of slide rails and sliders in the guide assembly 700 can also be other numbers, which is not limited in this embodiment.

[0104] In a feasible implementation, one of the mounting plate 800 and the frame 500 is provided with a positioning pin 810, and the other is provided with a positioning hole (not shown), and the positioning pin 810 can be removably inserted into the positioning hole to facilitate the positioning and disassembly of the test assembly. There can be multiple positioning pins 810, for example, three to six.

[0105] Exemplarily, positioning pins 810 are provided on the mounting plate 800 and positioning holes are provided on the frame 500 to facilitate manufacturing.

[0106] In a feasible implementation manner, a second handle 510 is provided on the frame 500 to facilitate moving the test assembly.

[0107] In this embodiment, refer to Figure 5 and Figure 6 As shown, a second limiting structure 610 is provided on the bottom plate 600, and the needle carrier 100 moves along the second direction to have an installation position and a test position. Among them, the needle carrier 100 moves to the installation position, and the needle carrier 100 protrudes from the bottom plate 600 along the second direction. At this time, the test assembly extends out of the box or cabinet to facilitate the rotation of the pressing plate 400; the needle carrier 100 moves to the test position, and the projection of the needle carrier 100 along the first direction is located in the bottom plate 600, and the second limiting structure 610 and the pressing plate 400 form a limiting match along the first direction, so that the board carrier 200 is maintained in the second position, and the pressing plate 400 stably presses the PCBA board 91 on the board carrier 200 to ensure that the PCBA board 91 and the test probe 110 are stably in contact and conductive, and the functional test results are stable and reliable.

[0108] Specifically, the second limiting structure 610 includes a support frame 611 and a limiting column 612. The support frames 611 are provided with two and are spaced apart along the third direction, and the pressing plate 400 is located between the two support frames 611; the limiting column 612 is provided on the support frame 611, and the limiting column 612 is extended along the third direction. Among them, when the needle carrier 100 moves to the test position, the periphery of the limiting column 612 abuts against the side of the pressing plate 400 away from the board carrier 200 to form a limiting fit along the first direction, so that the board carrier 200 is maintained in the second position, and the PCBA board 91 is pressed against the board carrier 200, which has a simple structure and is easy to assemble.

[0109] In a feasible implementation, the support frame 611 is provided with a first elongated hole 6111 extending along the first direction, and the second limiting structure 610 further includes a screw connection (not shown), which passes through the first elongated hole 6111 and is threadedly connected to the limiting column 612. In this embodiment, the setting of the first elongated hole 6111 can adjust the height of the limiting column 612 relative to the bottom plate 600, so as to adjust the downward pressure of the pressing plate 400 on the PCBA board 91, and ensure that the pressing plate 400 stably presses the PCBA board 91 on the board carrier 200 under the pressure of the limiting column 612, so that the PCBA board 91 and the test probe 110 are stably in contact and conductive.

[0110] For example, in order to ensure that the connection between the limiting column 612 and the supporting frame 611 is stable and reliable, a spring washer may be provided on the screw connection.

[0111] In a feasible embodiment, both sides of the pressing plate 400 along the third direction are provided with a limiting plate 430, and the limiting plate 430 includes a limiting surface 431 and a transition surface 432 connected to each other; along the direction in which the needle carrier 100 moves from the installation position to the test position, the limiting surface 431 and the transition surface 432 are arranged in sequence; when the needle carrier 100 moves to the test position, the second limiting structure 610 abuts against the limiting surface 431 on the corresponding side to form a limiting fit along the first direction, specifically, the limiting column 612 abuts against the limiting surface 431 on the corresponding side to form a limiting fit along the first direction. It can be understood that the limiting plate 430 can be a part of the pressing plate 400. In this embodiment, when the needle carrier 100 is pushed from the installation position to the test position, the limiting column 612 can first abut against the transition surface 432, and after passing through the transition surface 432, abut against the limiting surface 431, and the transition surface 432 can give way to the limiting column 612, effectively preventing jamming.

[0112] In a feasible implementation, a rolling structure (not shown) may be provided on the limiting column 612, and the limiting column 612 abuts against the side of the pressing plate 400 away from the plate carrier 200 through the rolling structure, converting the sliding friction into rolling friction, and the needle carrier 100 may be smoothly pushed from the installation position to the test position. Exemplarily, the rolling structure may be a bearing or a roller made of plastic.

[0113] Exemplarily, the limiting surface 431 and the transition surface 432 are both planes, the limiting surface 431 can be arranged perpendicular to the pressing rod 410, and the transition surface 432 is arranged inclined toward the needle carrier 100. Of course, the transition surface 432 can also be set as an arc surface or a surface of other shapes, which is not limited in this embodiment.

[0114] Exemplarily, the limiting plate 430 may be connected to the pressing plate 400 by welding.

[0115] In this embodiment, the test fixture further includes a first plug-in terminal 621 and a second plug-in terminal 530 plugged into the first plug-in terminal 621, the second plug-in terminal 530 is fixedly connected to the board carrier 200, and the second plug-in terminal 530 is electrically connected to the test probe 110. It can be understood that the first plug-in terminal 621 is used to be electrically connected to the signal acquisition module 20. In this embodiment, the plug-in design of the first plug-in terminal 621 and the second plug-in terminal 530 facilitates the connection and disconnection between the test probe 110 and the signal acquisition module 20, and is stable and reliable.

[0116] In a feasible embodiment, the test fixture also includes an adapter board 520, and the test probe 110 and the second plug-in terminal 530 are both electrically connected to the adapter board 520, that is, the second plug-in terminal 530 can be electrically connected to the test probe 110 through the adapter board 520 to facilitate the electrical connection between the second plug-in terminal 530 and the test probe 110.

[0117] Exemplarily, the adapter plate 520 may be disposed in the clearance cavity to prevent the adapter plate 520 from being bumped.

[0118] Exemplarily, the needle carrier 100 is fixedly connected to a fixing plate 540 , and the second plug-in terminal 530 is arranged on the fixing plate 540 , that is, the needle carrier 100 is fixedly connected to the second plug-in terminal 530 via the fixing plate 540 .

[0119] Exemplarily, the test fixture includes at least one adapter plate 520, for example, the test fixture includes two to three adapter plates 520 arranged at intervals along the first direction; and each adapter plate 520 is electrically connected to at least one second plug-in terminal 530, for example, each adapter plate 520 is electrically connected to two to three second plug-in terminals 530 arranged at intervals along the third direction, so as to improve the compactness of the test fixture. When the test fixture includes two adapter plates 520, the test probe 110 used for powering the PCBA board 91 can be electrically connected to one of the adapter plates 520, and the test probe 110 receiving the leakage signal and sending the tripping signal can be electrically connected to the other adapter plate 520 according to the purpose of the test probe 110, for example, the test probe 110 is used for powering the PCBA board 91, receiving the leakage signal and sending the tripping signal. Of course, the test probe 110 can also be connected to the adapter plate 520 in other layouts, which is not limited in this embodiment.

[0120] In some embodiments, Figure 5 , Figure 6 and Figure 8As shown, the test fixture further includes a baffle 620, which is fixed to one side of the bottom plate 600 along the second direction. A first plug-in terminal 621 is provided on the baffle 620; a second plug-in terminal 530 is provided on the side of the frame 500 facing the baffle 620, and the structure is compact. In this embodiment, when the pin carrier 100 moves to the installation position, the first plug-in terminal 621 is separated from the second plug-in terminal 530. When installing the PCBA board 91, the test probe 110 is not charged, improving safety; when the pin carrier 100 moves to the test position, the first plug-in terminal 621 is plugged into the second plug-in terminal 530 to electrically connect the PCBA board 91 to the signal acquisition module 20, suitable for testing the PCBA board 91. In addition, the baffle 620 also has a limiting effect, enabling the pin carrier 100 to stably move from the installation position to the test position. In other embodiments, the first plug-in terminal 621 can also be fixed to other structural members other than the baffle 620. For example, the first plug-in terminal 621 is fixed to a carrier in an aging chamber or equipment for temperature rise and electrical circuit layout.

[0121] Exemplarily, the test fixture further includes a reinforcing plate 630. One of the two adjacent sides of the reinforcing plate 630 is connected to the bottom plate 600, and the other is connected to the baffle 620 to reinforce and support the baffle 620, preventing the baffle 620 from shifting due to the insertion and extraction of the first plug-in terminal 621 and the second plug-in terminal 530. Exemplarily, reinforcing plates 630 are provided on both sides of the baffle 620 along the third direction.

[0122] In this embodiment, with reference to Figure 1 , Figure 8 and Figure 9 As shown, the test fixture further includes a telescopic rod 900 with adjustable length. One end of the telescopic rod 900 is hinged to the pin carrier 100, and the other end is hinged to the pressing plate 400. In this embodiment, the telescopic rod 900 adaptively adjusts its length as the pressing plate 400 rotates, effectively reducing the speed at which the pressing plate 400 rotates towards the pin carrier 100 due to its own weight, preventing the situation where the pressing plate 400 damages the PCBA board 91 or the fingers of the test personnel due to a rapid fall, and improving safety.

[0123] Specifically, the telescopic rod 900 includes a rod barrel 910 and an inner rod 920 inserted into the rod barrel 910. The inner rod 920 is telescopic relative to the rod barrel 910 and has a tendency to extend out of the rod barrel 910. One of the rod barrel 910 and the inner rod 920 is hinged to the pin carrier 100, and the other is hinged to the pressing plate 400.

[0124] In this embodiment, along the second direction, the first rotation center O1 of the telescopic rod 900 relative to the pressing plate 400 is located between the second rotation center O2 of the telescopic rod 900 relative to the pin carrier 100 and the third rotation center O3 of the pressing plate 400 relative to the pin carrier 100. Among them, the pressing plate 400 rotates with a first angle and a second angle.

[0125] When the first rotation center O1 moves from the side of the line between the second rotation center O2 and the third rotation center O3 close to the needle carrier 100 to the side away from the needle carrier 100, the telescopic rod 900 will push the pressing plate 400 to rotate toward the first angle. When the pressing plate 400 is at the first angle, the board carrier 200 remains at the first position, and the pressing plate 400 is separated from the PCBA board 91, which is convenient for disassembling and assembling the PCBA board 91. It can be understood that when the pressing plate 400 is at the first angle, when the first rotation center O1 is located on the side of the line between the second rotation center O2 and the third rotation center O3 away from the needle carrier 100, the inner rod 920 extends outward from the rod barrel 910 to a limit value, and at this time, the pressing plate 400 can be stably maintained at the first angle.

[0126] When the first rotation center O1 moves from the side of the line between the second rotation center O2 and the third rotation center O3 away from the needle carrier 100 to the side close to the needle carrier 100, the telescopic rod 900 will push the pressing plate 400 to rotate toward the second angle. When the pressing plate 400 is at the second angle, the board carrier 200 remains at the second position, and the pressing plate 400 presses the PCBA board 91 on the board carrier 200, effectively ensuring that the PCBA board 91 and the test probe 110 are stably in contact and conductive, and the functional test results are stable and reliable. It can be understood that when the pressing plate 400 is at the second angle, when the first rotation center O1 is located on the side of the line between the second rotation center O2 and the third rotation center O3 close to the needle carrier 100, the telescopic rod 900 makes the pressing plate 400 have a tendency to rotate toward the board carrier 200, that is, the telescopic rod 900 drives the pressing plate 400 to press the PCBA board 91 on the board carrier 200, thereby keeping the board carrier 200 at the second position.

[0127] Exemplarily, two telescopic rods 900 are provided at intervals along the third direction, and the board carrier 200 is located between the two telescopic rods 900 .

[0128] Exemplarily, the pressing plate 400 can be hinged with the needle carrier 100 through a hinge 440, which is convenient for assembly, and the rotation of the pressing plate 400 is flexible and reliable, which is convenient for taking and placing the PCBA board 91. Among them, the pressing plate 400 extends and bends along the second direction away from the edge of the first handle 420 to form a connecting plate 401, and the connecting plate 401 is connected to the hinge 440. The connecting plate 401 can adjust the position of the pressing plate 400. When the pressing plate 400 is located at the second angle, the pressing rod 410 on the pressing plate 400 can be against the PCBA board 91 along the first direction, that is, the pressure direction of the pressing plate 400 on the PCBA board 91 is vertically downward, effectively ensuring that the PCBA board 91 and the test probe 110 are stably in contact and conductive, and preventing local poor contact. It can be understood that the needle carrier 100 and the pressing plate 400 can be connected to the hinge 440 by bolting.

[0129] Exemplarily, a second long hole through which a bolt can pass is provided on the connecting plate 401 to facilitate the adjustment of the position of the pressing plate 400 and ensure that the pressing rods 410 on the pressing plate 400 can all abut against the PCBA board 91 in the first direction.

[0130] Exemplarily, the inner rod 920 is pivotally connected to the needle carrier 100, and the rod barrel 910 is spherically connected to the pressing plate 400, effectively preventing jamming. In this embodiment, a first hinge seat 130 is provided on the needle carrier 100, the first hinge seat 130 is pivotally connected to the inner rod 920, a second hinge seat 450 is provided on the pressing plate 400, and the second hinge seat 450 is spherically connected to the rod barrel 910. By providing the first hinge seat 130 and the second hinge seat 450, the relative positions of the first rotation center O1 and the second rotation center O2 can be adjusted, and it is convenient to connect with the telescopic rod 900.

[0131] Exemplarily, the inner rod 920 can be connected to the first hinge seat 130 by a mother and son bolt.

[0132] Exemplarily, a ball hinge head is provided on the rod barrel 910. The ball hinge head has a threaded column, and the threaded column passes through the second hinge seat 450 and is threadedly connected to a screw sleeve. A flat washer can be provided on the threaded column.

[0133] Exemplarily, the telescopic rod 900 further includes a spring (not shown) provided in the rod barrel 910, and the spring can make the inner rod 920 tend to extend out of the rod barrel 910. Of course, the telescopic rod 900 can also be a gas spring, a hydraulic rod or other telescopic structures, which are not limited in this embodiment.

[0134] Referring to Figure 10 As shown, this embodiment also provides a testing device. The testing device includes a box body 10, a signal acquisition module 20, a temperature control module 70 and the above-mentioned testing fixture 40. The box body 10 has a testing chamber, and the testing fixture 40 is arranged in the testing chamber; wherein, the testing probe 110 of the testing fixture 40 is electrically connected to the signal acquisition module 20, and the signal acquisition module 20 can test the tripping information of the PCBA board 91 through the testing probe 110. The temperature control module 70 is used to adjust the temperature in the testing chamber to age the PCBA board 91. In this embodiment, the testing fixture 40 and the signal acquisition module 20 cooperate to realize the functional test of the PCBA board 91; by adjusting the temperature in the testing chamber through the temperature control module 70, the temperature in the testing chamber can meet the aging requirements of the PCBA board 91, so as to realize the aging test of the PCBA board 91 by the testing device. In addition, through the setting of the testing fixture 40 of the testing device, the functional test efficiency is effectively improved, and the result of the functional test is ensured to be stable and reliable.

[0135] Exemplarily, both the signal acquisition module 20 and the temperature control module 70 can be arranged in the box body 10.

[0136] Specifically, the test device further includes a host computer 30 disposed in the box body 10. The host computer 30 is electrically connected to the signal acquisition module 20 and is used to receive the tripping information and determine whether the PCBA board 91 is qualified according to the received tripping information. In this embodiment, the test fixture 40 and the signal acquisition module 20 cooperate to realize signal acquisition, processing, and control, and feedback the function test result of the PCBA board 91 to the host computer 30, realizing the automation of the function test of the PCBA board 91.

[0137] It can be understood that during the aging process of the PCBA board 91, the signal acquisition module 20 can send a leakage signal to the PCBA board 91 every time period T. The host computer 30 obtains the tripping information of the tripping device tripping and determines whether the PCBA board 91 is qualified according to a plurality of tripping information. Wherein, the time period T can be 0.5h - 8h, such as 1h, 2h, 5h or 6h. Of course, the time period T can also be other interval times, which are not limited in this embodiment.

[0138] It can be understood that the host computer 30 can be a general computer or an industrial control computer, and has data processing and user interaction capabilities.

[0139] In a feasible implementation manner, the host computer 30 can be connected to a code scanning device 50. An identification code can be provided on the PCBA board 91. The host computer 30 scans the identification code through the code scanning device 50 to input appropriate test parameters to the signal acquisition module 20 and the temperature control module 70, and the test result can be traced. Among them, the test parameters can be the aging temperature value and aging time for aging the PCBA board 91, as well as the voltage value and current value required for the PCBA board 91 to trip.

[0140] In some embodiments, the signal acquisition module 20 includes a tripping device or is externally connected with a tripping device. The PCBA board 91 obtains a leakage signal and generates a tripping signal, and the tripping device receives the tripping signal and triggers the tripping of the tripping device. The tripping information of the tripping device tripping is transmitted to the host computer 30, and the host computer 30 obtains the tripping information and processes it to obtain the test result. In other embodiments, the PCBA board 91 obtains a leakage signal and directly transmits the generated tripping signal to the host computer 30 by the signal acquisition module 20. The tripping signal is the tripping information, that is, the host computer 30 determines whether the PCBA board 91 is qualified by whether it receives the tripping signal.

[0141] In this embodiment, the signal acquisition module 20 further includes a power supply unit, a conversion unit, and a control unit. It can be understood that a trip circuit can be formed among the PCBA board 91, the probe group, the conversion unit, the control unit, and the trip device. In this embodiment, the control unit is electrically connected to the host computer 30. The host computer 30 can control the power supply unit through the control unit to provide the operating power supply voltage for the PCBA board 91, and the host computer 30 can control the conversion unit through the control unit to send a leakage signal to the PCBA board 91, so as to achieve the purpose of transmitting the trip signal generated by the PCBA board 91 obtaining the leakage signal to the signal acquisition module 20.

[0142] Specifically, the conversion unit includes a first relay electrically connected to both the probe group and the control unit. The control unit can control the on / off of the first relay to transmit the leakage signal to the PCBA board 91. Among them, the control unit can simulate the induced current through the electromagnetic structure, that is, the leakage current flowing through the electromagnetic structure can form a leakage signal, thereby realizing the transmission of the leakage signal.

[0143] Exemplarily, the first relay corresponds to the probe group one by one, so that the control unit can transmit the leakage signal to each PCBA board 91. It can be understood that the control unit can send the leakage signal to each PCBA board 91 one by one or send it to multiple PCBA boards 91 at a time, which is not limited in this embodiment.

[0144] Specifically, the power supply unit includes a second relay electrically connected to both the probe group and the control unit. The control unit can control the on / off of the second relay to transmit the power supply voltage to the PCBA board 91.

[0145] Exemplarily, the second relay corresponds to the probe group one by one, so that the power supply unit supplies power to each PCBA board 91.

[0146] In a feasible implementation manner, the control unit can control the on / off of the corresponding first relay according to the number and position information of the PCBA boards 91 on the board carrier 200 input by the host computer 30 to ensure the stability and reliability of the test results.

[0147] In this embodiment, the test device further includes a programmable AC voltage source 60, which is electrically connected to the host computer 30, and the output voltage value and current value of the programmable AC voltage source 60 are adjusted through the host computer 30. Among them, the output voltage range of the programmable AC voltage source 60 covers all voltage values and current values applicable to the test of the PCBA board 91. It can be understood that the programmable AC voltage source 60 can set the leakage current value and the power supply voltage value required for the function test. It can be understood that the programmable AC voltage source 60 is electrically connected to both the power supply unit and the conversion unit to realize the supply of the leakage current and the power supply voltage required for the function test of the PCBA board 91 by the programmable AC voltage source 60. In this embodiment, multiple groups of leakage current and power supply voltage can be set to test the PCBA board 91 with various requirements. Among them, the power supply voltage can be set to three parameter values: undervoltage, overvoltage, or normal. In addition, the programmable AC voltage source 60 can also set time parameters through the host computer 30, such as the supply time period of the leakage current and the power supply voltage.

[0148] Specifically, a main control box (not shown) is further provided on the box body 10. The main control box includes a main control board, and the main control board is electrically connected to the host computer 30. In some embodiments, the main control board is electrically connected to the control unit, and the host computer 30 controls the control unit through the main control board, so that the control unit controls the power supply unit to provide a power supply voltage for the PCBA board 91 and controls the conversion unit to provide a leakage current for the electromagnetic structure.

[0149] Exemplarily, the box body 10 has a control cabinet 13. The main control box and the host computer 30 can both be arranged in the control cabinet 13, and a cabinet door (not shown) is provided on the control cabinet 13 to prevent the circuit from being exposed.

[0150] In this embodiment, the temperature control module 70 includes a heating unit, a temperature sensing unit, and a temperature control box 71. The heating unit is used to increase the temperature in the test chamber, and the temperature sensing unit is used to detect the temperature in the test chamber. Among them, the temperature control box 71 is electrically connected to both the heating unit and the temperature sensing unit. In this embodiment, the temperature control box 71 can control the heating unit to increase the temperature in the test chamber according to the temperature detected by the temperature sensing unit to meet the test requirements.

[0151] Exemplarily, the heating unit may include a heating tube (not shown), and the temperature in the test chamber is increased by the heat dissipation of the heating tube. Among them, the heating tube can be arranged inside the top of the box body 10.

[0152] Exemplarily, the temperature sensing unit has a temperature sensor, and the temperature in the test chamber is detected through the temperature sensor.

[0153] Exemplarily, the temperature control box 71 can adjust the input current of the heating unit, thereby changing the heating power of the heating unit to achieve temperature control.

[0154] Exemplarily, the temperature control box 71 has buttons and a first display screen. After the temperature value can be set through the buttons, the temperature control box 71 can control the heating unit to adjust the heating power according to the set temperature value so as to maintain the temperature of the test chamber at this temperature value. Among them, the first display screen can display the current temperature value in the test chamber. Exemplarily, the first display screen can be a digital display screen.

[0155] In a feasible implementation manner, the temperature control module 70 can further include a first blower 72. The air around the heating unit is discharged into the test chamber through the first blower 72, so as to form a flowing hot air current in the test chamber and make the test chamber have a uniform high-temperature environment. Among them, the first blower 72 can be arranged outside the top of the box body 10. Exemplarily, at least one first blower 72 is provided, for example, two are arranged side by side.

[0156] In a feasible implementation manner, the temperature control module 70 further includes a heat dissipation unit. By adjusting the heat dissipation intensity of the heat dissipation unit and cooperating with the heating unit, the temperature of the test chamber can be better maintained at the set temperature value. Exemplarily, the heat dissipation unit can be arranged outside the top of the box body 10. Among them, the heat dissipation unit can be composed of at least one second blower 73. Exemplarily, when two first blowers 72 are arranged side by side and there is one first blower 72, the second blower 73 can be arranged between the two first blowers 72. Exemplarily, after the test device completes the aging of the PCBA board 91, the high-temperature gas can be discharged from the test chamber by the second blower 73.

[0157] Specifically, the temperature control module 70 can further include an over-temperature alarm unit, such as an EGO over-temperature alarm. When the temperature in the test chamber exceeds the set temperature value, the over-temperature alarm unit will be triggered to alarm, so that the user can be informed and deal with it in time.

[0158] In some embodiments, a three-color indicator light 80 and an emergency stop button (not shown) are arranged on the box body 10 to improve the safety of the test equipment.

[0159] In this embodiment, the main control box further includes a signal monitoring system.

[0160] Exemplarily, the upper computer 30 and the control unit can be electrically connected to the signal monitoring system, and the tripping information of the tripping device can be sequentially transmitted to the signal monitoring system and the upper computer 30 through the control unit.

[0161] Exemplarily, the temperature sensor and the over-temperature alarm module are electrically connected to the signal monitoring system. When the temperature value of the temperature sensor received by the signal monitoring system exceeds the set value, the signal monitoring system transmits the over-temperature signal to the over-temperature alarm module, and the over-temperature alarm module alarms.

[0162] Exemplarily, the three-color indicator light 80 and the emergency stop button are both electrically connected to the signal monitoring system. Among them, the three-color indicator light 80 can be arranged outside the top of the box body 10, and the emergency stop button can be arranged in front of the box body 10.

[0163] In this embodiment, when the temperature value received by the signal monitoring system exceeds the set value or the emergency stop button is triggered, the signal monitoring system controls the three-color indicator light 80 to display red. Exemplarily, the signal monitoring system can be connected to the temperature sensor through the input end of the I / O (Input / Output) board card, and the output end is connected to the three-color indicator light 80 and the over-temperature alarm module. Among them, the I / O board card has a microcontroller. When the temperature value received by the input end of the I / O board card exceeds the set value, the microcontroller can control the three-color indicator light 80 to turn red and the over-temperature alarm module to alarm. Among them, the microcontroller can trigger the three-color indicator light 80 to turn red and the over-temperature alarm module to alarm by the disconnection or suction of the relay.

[0164] In this embodiment, when the signal monitoring system monitors that the test equipment is in standby or not running, the signal monitoring system controls the three-color indicator light 80 to display yellow; when the signal monitoring system monitors that the test equipment is running normally, such as the temperature control module 70 works to age the PCBA board 91 of the test equipment and test the tripping function of the PCBA board 91 of the test equipment, the signal monitoring system controls the three-color indicator light 80 to display green.

[0165] In some embodiments, the heat dissipation unit is electrically connected to the signal monitoring system. The temperature sensor transmits the current temperature value to the signal monitoring system in real time. The heat dissipation intensity of the heat dissipation unit is controlled by the signal monitoring module. For example: if the temperature in the test chamber exceeds the set value, the signal monitoring system will control the heat dissipation unit to increase the heat dissipation intensity to better maintain the temperature in the test chamber at the set value.

[0166] In this embodiment, the main control box further includes a power supply system. The power supply system can be electrically connected to an external power distribution cabinet. For example, the power supply system is electrically connected to the external power distribution cabinet through an aviation plug, that is, the power distribution cabinet supplies power to the entire test equipment through the power supply system. Among them, the power supply system can convert and process the input voltage into the working voltage required by the test equipment. The working voltage is, for example, 230V, 24V, 12V. Exemplarily, the power supply system includes at least an overload protector, a short-circuit protector, and a leakage protector to prevent equipment damage or personal injury caused by electrical faults.

[0167] In this embodiment, the main control box further includes a wireless network system. The wireless network system is electrically connected to the upper computer 30. For example, the wireless network system is electrically connected to the upper computer 30 through an RJ45 wire connector to realize the function of a local area network. In this embodiment, after other devices with network connection functions are connected to the wireless network system, data transmission between the upper computer 30 and other devices is realized, which is convenient for data interaction.

[0168] In this embodiment, a second display screen (not shown) is further provided on the box body 10. The second display screen is electrically connected to the host computer 30. The user can input parameters through the host computer 30 and observe the operating state of the test equipment, the test progress and test results of the PCBA board 91 in real time on the second display screen. Among them, the second display screen can be connected through HDMI (High Definition Multimedia Interface).

[0169] In this embodiment, a plurality of test jigs 40 can be provided in the test chamber to improve the test efficiency. In this embodiment, a plurality of support platforms 12 are arranged at intervals along the first direction in the test chamber, and a plurality of test jigs 40 can be arranged side by side on each support platform 12. Among them, the bottom plate 600 can be fixed on the support platform 12.

[0170] Exemplarily, the test jigs 40 can be arranged in a matrix in the test chamber.

[0171] Specifically, there is a box door 11 in front of the box body 10. When the box door 11 is opened and the test assembly is in the installation position, the test assembly and the pressing plate 400 extend out of the box body 10, which is convenient for disassembling and assembling the PCBA board 91; when the test assembly is in the test position, the test assembly and the pressing plate 400 are both inside the box body 10. At this time, the box door 11 can be closed to test the PCBA board 91. It can be understood that the baffle 620 is located behind the box body 10, and the signal acquisition module 20 can be provided behind the box body 10.

[0172] Exemplarily, the box door 11 can be slidably arranged on the box body 10 for convenient opening and closing.

[0173] Exemplarily, both the box body 10 and the box door 11 can be made of high-strength and corrosion-resistant alloy materials.

[0174] Exemplarily, for convenient observation of the situation inside the test chamber, a double-layer heat-insulating transparent glass can be embedded on the box door 11. Among them, the edge of the double-layer heat-insulating transparent glass can be coated with a circle of high-temperature resistant silica gel to form a seal between the box door 11 and the double-layer heat-insulating transparent glass, and can buffer the impact when the box door 11 is opened and closed.

[0175] Refer to Figure 11 As shown, based on the above content and the same concept, this embodiment also provides a test method. This test method can be applied to the above test equipment. It can also be understood that the above detection device can be controlled based on Figure 11 the test method shown. This test method includes the following steps:

[0176] S100. Obtain a functional test start signal and start testing the functions of the PCBA board 91 based on the functional test start signal.

[0177] In some embodiments, the user can type through the host computer 30 software, so that the host computer 30 obtains the functional test start signal. Based on the functional test start signal, the host computer 30 automatically controls the signal acquisition module 20 to start the test function, realizing automatic testing.

[0178] In some embodiments, the following steps are further included before step S100:

[0179] S101. Load the PCBA board 91 onto the test fixture 40.

[0180] Specifically, place the PCBA board 91 on the board carrier 200 and rotate the pressure plate 400 towards the board carrier 200. Under the extrusion of the pressure rod 410 on the pressure plate 400, the PCBA board 91 pushes the board carrier 200 from the first position to the second position, and the PCBA board 91 on the board carrier 200 comes into contact and conducts with the test probe 110.

[0181] S102. Push the test component into the test chamber and close the chamber door 11.

[0182] In some embodiments, it is also necessary to obtain the set leakage current value and supply voltage value before step S100. Among them, the leakage current value and supply voltage value can be set by the host computer 30 controlling the programmable AC voltage source 60, and the supply voltage and leakage current can be obtained under the control of the main control board. When no problem is detected by the signal acquisition module 20 after the PCBA board 91 receives the supply voltage, step S200 is executed.

[0183] S200. Send a leakage signal to the PCBA board 91, obtain the tripping information, and determine whether the PCBA board 91 is qualified according to the tripping information.

[0184] In this embodiment, the PCBA board 91 obtains the leakage signal sent by the control unit and generates a tripping signal, and the tripping device receives the tripping signal and triggers the tripping of the tripping device. The tripping information of the tripping of the tripping device is transmitted to the host computer 30, and the host computer 30 obtains the tripping information and processes it to obtain the test result to determine whether the PCBA board 91 is qualified.

[0185] In this embodiment, referring to Figure 12 as shown, the test method further includes:

[0186] S300. Obtain an aging test start signal and start testing the functions of the PCBA board 91 during aging based on the aging test start signal;

[0187] In some embodiments, the user can input through the host computer 30 software, so that the host computer 30 obtains an aging test start signal. Based on the aging test start signal, the host computer 30 automatically controls the signal acquisition module 20 to start the test function and the temperature control module 70 to start the aging function, so as to realize automatic testing.

[0188] S400. Obtain the temperature signal and adjust the temperature in the test chamber of the box body 10 to age the PCBA board 91. Send a leakage signal to the PCBA board 91 every time period T, and obtain the tripping information, and judge whether the PCBA board 91 is qualified according to a plurality of tripping information.

[0189] Specifically, the temperature control module 70 obtains the temperature signal transmitted by the host computer 30 and adjusts the temperature in the test chamber of the box body 10 according to the set temperature value to age the PCBA board 91.

[0190] In this embodiment, step S100 and step S200 can be executed first to judge whether the PCBA board 91 is qualified before aging; then step S300 and step S400 are executed to judge whether the PCBA board 91 is qualified during and after aging. It can be understood that if a PCBA board 91 is tested as unqualified by step S100 and step S200, the unqualified PCBA board 91 does not need to be tested in step S300 and step S400.

[0191] It can be understood that for the specific execution process of the test equipment in the above steps, reference can be made to the foregoing relevant introduction, and details are not described herein again.

[0192] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, rather than limiting the implementation manners of the present invention. For those of ordinary skill in the art, various obvious changes, re-adjustments and substitutions can be made without departing from the protection scope of the present invention. It is not necessary and impossible to enumerate all the implementation manners here. Any modification, equivalent replacement and improvement made within the spirit and principle of the present invention shall be included in the protection scope of the claims of the present invention.

Claims

1. A test fixture, characterized in that, include: A needle carrier (100) is provided with a test probe (110); The board carrier (200) comprises a first limiting structure (210), wherein the first limiting structure (210) is used to limit the position of a PCBA board (91) to be tested, and the board carrier (200) is slidably arranged on the needle carrier (100) along a first direction; when the board carrier (200) slides to a first position, the PCBA board (91) on the board carrier (200) is separated from the test probe (110); when the board carrier (200) slides to a second position, the PCBA board (91) on the board carrier (200) is in contact with and conductive with the test probe (110); an elastic member (300) disposed between the needle carrier (100) and the plate carrier (200), wherein the elastic member (300) causes the plate carrier (200) to have a tendency to slide away from the needle carrier (100) along the first direction; A pressure plate (400) is hinged to the needle carrier (100), and the pressure plate (400) can press the PCBA board (91) onto the board carrier (200) and push the board carrier (200) from the first position to the second position.

2. The test fixture according to claim 1, wherein The test fixture further comprises a base plate (600) and a guide assembly (700) arranged on the base plate (600), wherein the guide assembly (700) is connected to the needle carrier (100), and the needle carrier (100) can move along a second direction relative to the base plate (600) through the guide assembly (700), and the first direction and the second direction are perpendicular to each other.

3. The test fixture according to claim 2, wherein A second limiting structure (610) is provided on the base plate (600); the needle carrier (100) moves to the installation position, and the needle carrier (100) protrudes from the base plate (600) along the second direction; the needle carrier (100) moves to the test position, and the projection of the needle carrier (100) along the first direction is located within the base plate (600), and the second limiting structure (610) and the pressure plate (400) form a limiting fit along the first direction, so that the board carrier (200) is maintained at the second position, and the pressure plate (400) presses the PCBA board (91) onto the board carrier (200).

4. The test fixture according to claim 3, characterized in that, The second limiting structure (610) comprises: Two support frames (611) are arranged at intervals along the third direction, and the pressing plate (400) is located between the two support frames (611); A limiting column (612) is arranged on the support frame (611), and the limiting column (612) is extended along the third direction; when the needle carrier (100) moves to the test position, the periphery of the limiting column (612) abuts against a side of the pressing plate (400) away from the plate carrier (200) to form a limiting fit along the first direction; The first direction, the second direction and the third direction are perpendicular to each other.

5. The test fixture according to claim 4, wherein The pressure plate (400) is provided with a limiting plate (430) on both sides along the third direction, and the limiting plate (430) includes a limiting surface (431) and a transition surface (432) that are connected to each other; along the direction in which the needle carrier (100) moves from the installation position to the test position, the limiting surface (431) and the transition surface (432) are arranged in sequence; when the needle carrier (100) moves to the test position, the second limiting structure (610) abuts against the limiting surface (431) on the corresponding side to form a limiting fit along the first direction.

6. The test fixture according to claim 3, wherein, The test fixture further comprises: a baffle (620), the baffle (620) being fixed on one side of the bottom plate (600) along the second direction, and the baffle (620) being provided with a first plug-in terminal (621); A frame (500), the frame (500) being fixed to a side of the needle carrier (100) facing away from the plate carrier (200), a clearance cavity being formed between the frame (500) and the needle carrier (100), and the test probe (110) extending into the clearance cavity; An adapter plate (520) is disposed in the clearance cavity and is electrically connected to the test probe (110); A second plug-in terminal (530), disposed on a side of the frame (500) facing the baffle (620), the second plug-in terminal (530) being electrically connected to the adapter plate (520); The needle carrier (100) moves to the installation position, and the first plug-in terminal (621) is separated from the second plug-in terminal (530); The needle carrier (100) moves to the testing position, and the first plug-in terminal (621) is plugged into the second plug-in terminal (530).

7. The test fixture according to claim 1, characterized in that The test fixture further comprises a frame (500), wherein the frame (500) is fixed to a side of the needle carrier (100) facing away from the board carrier (200), a clearance cavity is formed between the frame (500) and the needle carrier (100), and the test probe (110) extends into the clearance cavity.

8. The test fixture according to claim 7, characterized in that, The test fixture further comprises: Bottom plate (600); A guide assembly (700) comprising a slide rail and a slider that are slidably connected, wherein the slide rail is fixed on the base plate (600); The mounting plate (800) is fixed on the sliding block and is detachably connected to the frame (500).

9. The test fixture according to claim 8, characterized in that One of the mounting plate (800) and the frame (500) is provided with a positioning pin (810), and the other is provided with a positioning hole, wherein the positioning pin (810) can be detachably inserted into the positioning hole.

10. The test fixture according to claim 1, characterized in that The test fixture further comprises a first plug-in terminal (621) and a second plug-in terminal (530) plugged into the first plug-in terminal (621), wherein the second plug-in terminal (530) is fixedly connected to the board carrier (200), and the second plug-in terminal (530) is electrically connected to the test probe (110).

11. The test fixture according to any one of claims 1-10, characterized in that The test fixture further comprises a telescopic rod (900) with adjustable length, one end of the telescopic rod (900) being hinged to the needle carrier (100), and the other end of the telescopic rod (900) being hinged to the pressing plate (400).

12. The test fixture according to claim 11, wherein The telescopic rod (900) includes a rod barrel (910) and an inner rod (920) inserted into the rod barrel (910). The inner rod (920) is telescopic relative to the rod barrel (910) and has a tendency to extend out of the rod barrel (910). One of the rod barrel (910) and the inner rod (920) is hinged to the needle carrier (100), and the other is hinged to the pressing plate (400).

13. A testing device, characterized in that, It includes a box body (10), a signal acquisition module (20), a temperature control module (70), and a test fixture (40) according to any one of claims 1-12. The box body (10) has a test chamber, and the test fixture (40) is arranged in the test chamber; Wherein, the test probe (110) of the test fixture (40) is electrically connected to the signal acquisition module (20). The signal acquisition module (20) can test the tripping information of the PCBA board (91) through the test probe (110). The temperature control module (70) is used to adjust the temperature in the test chamber to age the PCBA board (91).

14. The test device according to claim 13, wherein, It further includes a host computer (30) arranged in the box body (10). The host computer (30) is electrically connected to the signal acquisition module (20). The host computer (30) is used to receive the tripping information and judge whether the PCBA board (91) is qualified according to the received tripping information.

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