Intelligent digital display power supply test system and method

Abstract

The invention belongs to the technical field of electronic product testing, and particularly relates to an intelligent digital display power supply testing system and method, and the system comprises a single-chip microcomputer minimum system which employs an STC8H4K64TL chip machine as a main control chip; the relay module is used for automatically controlling different combinations of external loads; the display module is used for displaying specific data in real time; the reset circuit is used for accurately positioning the reliability and stability of the electronic system, and when the system breaks down, the reset circuit can forcibly reset the whole system to the initial state of the system so that the system can be restarted and run; the load module is used for simulating the condition of a real load connected with the output of the power supply, and evaluating and verifying the performance and stability of the power supply system under different working conditions by simulating and testing the load; the CH340 communication module is used for connecting the power supply test system with a computer or other equipment; and the power supply module is used for converting 5V power supply voltage into 3.3 V voltage so as to meet the requirements of electronic equipment or modules with 3.3 V level requirements.

Description

Technical Field

[0001] The present invention belongs to, but is not limited to, the technical field of electronic product testing, and particularly relates to an intelligent digital display power supply testing system and method. Background Art

[0002] With the continuous development of electronic products and the strengthening of the intelligent trend, the requirements for the reliability and performance of power supplies are also increasing day by day. Therefore, designing an intelligent digital display power supply testing system has important research significance and functions. As the core component of electronic devices, the power supply is crucial for the stable operation of the devices. However, under the influence of long-term use and environmental changes, the performance and reliability of the power supply may be affected, resulting in device instability and failures. Therefore, conducting power supply aging tests is a key step to ensure the performance and reliability of the power supply. Through power supply aging tests, potential problems of the power supply can be detected in advance, and corresponding improvement measures can be taken to ensure the performance and reliability of the power supply during long-term operation. Before leaving the factory, power supply modules must undergo strict inspection and testing, and one of them is the aging test. The power supply modules that have passed the aging test can ensure product quality, reduce the failure rate after leaving the factory, greatly reduce the probability of failures of the electrical appliances composed of their power supply modules for users, and extend the service life of the power supply modules. As an efficient testing tool, the intelligent digital display power supply testing system provides comprehensive power supply testing functions and data analysis capabilities, providing a feasible solution for power supply aging tests. Therefore, power supply testing plays a very important role and significance in the manufacturing process of electronic products.

[0003] Traditional power supply testing often requires manual setting and adjustment, which is prone to human errors and unstable testing situations. The intelligent digital display power supply testing system can precisely control and measure various parameters of the power supply through digital and automated means, and achieve automated testing and data recording.

[0004] Design lays the foundation for reliability, fine manufacturing ensures reliability, and careful maintenance maintains and extends reliability. After the electronic device is installed and put into operation, it enters the stage of careful maintenance to maintain and extend reliability. The reliability of a product is generally described by the reliability bathtub curve of the product. The reliability bathtub curve is as Figure 1 shown:

[0005] The product failure rate refers to the frequency of product failures during its service life. The failure rate in the product life cycle presents a specific curve, called the bathtub curve. The "bathtub curve" has obvious stages, and the failure rate changes with the use time and is divided into three stages: the early failure period, the accidental failure period, and the wear-out failure period.

[0006] In the early failure period, due to defects in the manufacturing process, the product will malfunction early in its life cycle, so the failure rate increases. In the accidental failure period, the failure rate during the product's service life remains basically constant. Finally, in the aging failure period, due to the aging and wear of components, the failure rate begins to rise. The bathtub curve is an important concept in reliability engineering, and its goal is to change the trend of the bathtub curve and the stage at which failures occur to extend the product's life and improve its reliability. In each stage of the product life cycle, different reliability methods can be applied to change the three stages of the bathtub curve.

[0007] In the design and manufacture of electronic products, power supply testing is a crucial link. It can ensure the stable and reliable power quality of the device and effectively protect the device from voltage fluctuations, current peaks, electromagnetic interference, etc. Therefore, power supply testing plays a very important role and significance in the manufacturing process of electronic products. With the continuous development of electronic products and the strengthening of the intelligent trend, the requirements for the reliability and performance of power supplies are also increasing day by day. Therefore, designing an intelligent digital display power supply testing system has important research significance and value. For high-power power supplies with a large production quantity, an automated testing system is the guarantee for improving testing efficiency. Using a complete set of designed automated testing systems can analyze the performance of power supplies, improve the testing efficiency and accuracy of power supplies. The intelligent digital display power supply testing system can improve the accuracy and efficiency of testing. Traditional power supply testing often requires manual setting and adjustment, which is prone to human errors and unstable testing situations. The development of domestic power supply aging testing will tend to be intelligent and automated. Future power supply aging testing systems will incorporate more chips to achieve more functions and perform more accurate data measurements. The functions that can be tested will be more and more, the measurement accuracy will be more and more precise, and the measurement data will be more and more reliable. Power supply aging testing will be more and more applied in the medical device field and daily life. And the intelligent digital display power supply testing system can precisely control and measure various parameters of the power supply through digital and automated means, and achieve automated testing and data recording.

[0008] In view of the above analysis, the technical problems urgently needed to be solved in the existing technology are: Traditional power supply testing often requires manual setting and adjustment, which is prone to human errors and unstable testing situations. Summary of the Invention

[0009] In view of the problems existing in the prior art, the present invention provides an intelligent digital display power supply testing system and method.

[0010] The present invention is implemented as follows. An intelligent digital display power supply testing system includes

[0011] A minimum single-chip microcomputer system, using the STC8H4K64TL single-chip microcomputer as the main control chip;

[0012] A relay module for automatically controlling different combinations of external loads;

[0013] A display module for real-time display of specific data;

[0014] A reset circuit for precisely positioning the reliability and stability functions of an electronic system. When a system failure occurs, the reset circuit can forcibly reset the entire system to its initial state so that the system can restart and operate;

[0015] A load module for simulating the real load conditions connected to a power supply output. By simulating and testing the load, the performance and stability of the power supply system under different operating conditions are evaluated and verified.

[0016] A CH340 communication module for connecting a power supply test system to a computer or other devices;

[0017] A power supply module for converting a 5V power supply voltage to 3.3V to meet the requirements of electronic devices or modules with 3.3V level requirements.

[0018] Furthermore, the minimum system of the single-chip microcomputer specifically includes:

[0019] STC8H4K64TL is used as the main control chip, supporting features such as high speed, low power consumption, and high integration. The frequency of the crystal oscillator can be selected according to the clock frequency required by the system. Commonly used crystal oscillator frequencies are 11.0592MHz and 12MHz.

[0020] The crystal oscillator is connected to the crystal oscillator circuit through two pins to provide a stable clock signal. The reset circuit is a necessary component to ensure the stability and reliability of the system. Its function is to forcibly restore the system from an uncertain state to a known state when the system power is turned on. The power management circuit includes a voltage stabilization circuit and a filtering circuit. The voltage stabilization circuit and the filtering circuit can ensure that when the chip works under different power conditions, a stable power supply and a clean power supply environment are provided.

[0021] Furthermore, the relay module specifically includes:

[0022] Activating or deactivating the electromagnetic coil through a control signal. It receives a low-level control signal (usually grounded or 0V) from other circuits or devices. When the control signal is received, the electromagnetic coil is activated and the contact state changes.

[0023] Handle higher currents and voltages to make them suitable for circuits and devices that require high power processing. Provide electrical isolation to separate the control circuit and the controlled circuit, thereby providing protection and safety and reducing the mutual influence between circuits. Used in aspects such as power switch control, load simulation, protection and safety measures, multiplex switching, and automation control. Multiple relays are connected to high-power circuits with different resistances, and then different relays are connected to different loads to change the resistance value, achieving automatic testing of the intelligent digital display power test system, which is connected to the STC8H4K64TL microcontroller.

[0024] Furthermore, the load module specifically includes:

[0025] By connecting an external load, simulate the requirements and responses of a real load to the power supply, thereby comprehensively testing and evaluating the power supply system. When the power supply operates under load, it outputs current and voltage. The external load simulates the load to be driven by the power supply, making the output of the power supply in a real working state, so that the test results are more accurate. A high-power resistor is used for connection, with single-stage and bipolar outputs, and the rated power and rated load of the two groups of outputs are different. A relay is used to control the load, and the combination of the load is changed to simulate the power condition of the actual power supply in order to test the power supply.

[0026] Furthermore, the reset circuit specifically includes:

[0027] When a fault, error, or unstable state occurs in the system or circuit, the reset circuit restores the system or circuit to a predetermined normal operating state by triggering a reset signal. The reset circuit cooperates with other components and modules in the system to ensure the normal recovery of the entire system. Once the system or circuit returns to the normal operating state, the reset circuit releases the reset signal to indicate that the system is in a normal operating state. After releasing the reset signal, the system can continue to perform its normal operations.

[0028] The reset circuit provides a protection mechanism for the system. When overvoltage, overcurrent, or other fault conditions occur in the system or circuit, the reset circuit can trigger a reset signal to make the system enter a safe state.

[0029] Furthermore, the display module specifically includes:

[0030] The four-digit LED digital tube is composed of four seven-segment digital tubes. In addition to the common terminal connected to the microcontroller and the series resistor, the resistor connected in series with the digital tube mainly functions to limit the current. The digital tube is a combination of light-emitting diodes (LEDs). When a proper voltage is given, the LEDs emit light.

[0031] When the microcontroller outputs the character code, all digital tubes receive the same character code. Open the strobe control of the digital tube that needs to be displayed, and this digit will display the character, and the digital tubes that are not strobed will not light up.

[0032] Further, the CH340 communication module specifically includes:

[0033] Through the USB interface of CH340, the system communicates and exchanges data with the host computer, facilitating the control and monitoring of the power supply test system. The CH340 chip provides a serial communication interface. The system can use this interface to collect data from the power supply or other devices and transmit the data to the computer or host computer for processing and analysis. With the serial communication interface provided by the CH340 chip, the system can receive instructions from the computer or host computer to achieve the control and configuration of the power supply test system. The CH340 chip supports standard serial communication protocols, including the UART (Universal Asynchronous Receiver-Transmitter) protocol, and exchanges data with other devices through the serial port, such as communicating with single-chip microcomputers, sensors, wireless modules, etc. The operating system automatically recognizes the CH340 chip and loads the corresponding driver.

[0034] Further, the power supply module specifically includes:

[0035] The 5V to 3.3V circuit uses a voltage converter to achieve voltage conversion. The voltage converter adopts a buck-type design and reduces the input voltage and outputs the required 3.3V voltage by controlling the components in the circuit. It consists of a voltage converter or a level converter to provide the required voltage conversion function.

[0036] Another object of the present invention is to provide an intelligent digital display power supply test method applying the intelligent digital display power supply test system, including:

[0037] S1, program initialization;

[0038] S2, determine whether the power supply is connected. If connected, continue to execute; if not connected, return to S1;

[0039] S3, automatically switch the load;

[0040] S4, monitor data;

[0041] S5, display data.

[0042] Another object of the present invention is to provide a computer device. The computer device includes a memory and a processor. When the computer program stored in the memory is executed by the processor, the processor executes the steps of the intelligent digital display power supply test method.

[0043] Another object of the present invention is to provide a computer-readable storage medium storing a computer program. When the computer program is executed by the processor, the processor executes the steps of the intelligent digital display power supply test method.

[0044] Another object of the present invention is to provide an information data processing terminal, and the information data processing terminal includes the intelligent digital display power test system described above.

[0045] Combined with the above technical solutions and the technical problems solved, the advantages and positive effects of the technical solutions to be protected by the present invention are as follows:

[0046] First, the present invention mainly studies the design of the intelligent digital display power test system, aiming to improve the efficiency and accuracy of power test. During the research process, in view of the common power test requirements and problems in the field of electronic information engineering, an intelligent digital display power test system is designed, and its implementation and verification are carried out.

[0047] First of all, the present invention conducts research and analysis on the existing digital display power test system and finds that there are problems such as low test accuracy and complex operation. To solve these problems, an intelligent digital display power test system is designed. This system can automatically complete test execution and the like of power test, and provides a friendly user interface and result display method.

[0048] In terms of system implementation, through reasonable hardware design and software programming, a power test system is designed and the expected functions are realized. The experimental results show that this system has the characteristics of high precision, high efficiency and stability, and can meet the requirements of power test in the field of electronic information engineering. Through the intelligent digital display power test system for power aging test, the present invention evaluates the stability, efficiency and temperature characteristics of the power supply, and proposes corresponding improvement schemes. This is of great significance for improving the reliability and performance of the power supply. The application of the intelligent digital display power test system provides an efficient and reliable tool for power aging test and provides a practical basis for power supply design and production.

[0049] Second, through the microcontroller, the present invention designs an algorithm to simulate the actual working conditions of the power supply, so that the working state during power aging is close to the actual working conditions, which can accelerate the aging process, reduce manual intervention and aging time, and greatly save labor and time costs.

[0050] Through the microcontroller, the present invention effectively simulates the actual working conditions of the power supply by algorithm design, so that the working state during power aging is close to the actual working conditions, filling the technical gap that the aging process of some aging test equipment does not conform to the actual working process.

[0051] Through the microcontroller, the present invention designs an algorithm to simulate the actual working conditions of the power supply, solves the problem that the working state during power aging does not conform to the actual working conditions and the aging effect is not obvious. At the same time, by simulating the actual working conditions, the aging process can be accelerated, manual intervention and aging time are reduced, and labor and time costs are greatly saved. Description of the Drawings

[0052] Figure 1 is the bathtub curve diagram provided by the embodiment of the present invention;

[0053] Figure 2 is the block diagram of the hardware system provided by the embodiment of the present invention;

[0054] Figure 3 is the schematic diagram of the STC8H4K64TL microcontroller provided by the embodiment of the present invention;

[0055] Figure 4 is the schematic diagram of the relay provided by the embodiment of the present invention;

[0056] Figure 5 is the circuit diagram of the single-stage output load design provided by the embodiment of the present invention;

[0057] Figure 6 is the circuit diagram of the double-stage output load design provided by the embodiment of the present invention;

[0058] Figure 7 is the schematic diagram of the reset circuit provided by the embodiment of the present invention;

[0059] Figure 8 is the schematic diagram of the LED digital tube display module provided by the embodiment of the present invention;

[0060] Figure 9 is the schematic diagram of the CH340 communication circuit provided by the embodiment of the present invention;

[0061] Figure 10 is the schematic diagram of the power conversion circuit module provided by the embodiment of the present invention;

[0062] Figure 11 is the development environment diagram provided by the embodiment of the present invention;

[0063] Figure 12 is the program flow chart provided by the embodiment of the present invention;

[0064] Figure 13 is the single-pole state load change curve provided by the embodiment of the present invention;

[0065] Figure 14 is the double-pole state load change curve provided by the embodiment of the present invention. Specific embodiments

[0066] In order to make the objectives, technical solutions and advantages of the present invention more clear and understandable, the present invention will be further described in detail below with reference to the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0067] With the progress of technology, intelligent power test systems have become an important research field. First, understand the working principles, characteristics of different types of power supplies, and different test requirements. Select appropriate test instruments and methods according to these requirements. Second, determine the requirements of the test platform, such as test accuracy, test range, data transmission and processing, etc. Design the hardware circuit and software according to these requirements, and conduct testing and optimization. Evaluate the accuracy, stability, and reliability of the system under different power supply conditions. Use statistical methods and data processing techniques to analyze the experimental results and verify the effectiveness of the system design concept and solution. In actual research, it is necessary to consider the test requirements of different types of power supplies for research and design. At the same time, it is also necessary to combine recognized test standards and specifications to ensure the accuracy and reliability of test results.

[0068] The overall scheme of this system is divided into two major parts: hardware and software. The first part is the hardware circuit design. The hardware circuit consists of a minimum system of a single-chip microcomputer, a relay control module, an LED digital tube display module, a reset circuit module, a power conversion circuit measurement module, and an external load module, etc. The STC8H4K64TL single-chip microcomputer is used as the main control chip; the relay control module automatically controls different combinations of external loads; the LED digital tube display module displays specific data in real time; the reset circuit is used to accurately position the reliability and stability functions of the electronic system. When the system fails, the reset circuit can forcibly reset the entire system to its initial state so that the system can restart and run; the second part is the software part design, which mainly includes the writing, debugging, and running of functional programs. The system design of this topic is completed by combining software and hardware.

[0069] The design of the intelligent digital display power test system takes the STC8H4K64TL single-chip microcomputer as the core, mainly including relays, LED digital tube displays, loads, and other accessories. Among them, the STC8H4K64TL microcontroller, as the core component, realizes the control and data processing functions of the system. Other hardware components are responsible for execution and display tasks respectively, jointly constituting the complete hardware system framework of the system. This research is the design of an intelligent power test system based on the STC8H4K64TL single-chip microcomputer. The automatic test of the power test system is realized through the automatic control of the external load by the relay. It can improve the accuracy, efficiency, and automation level of power testing, realize real-time monitoring, and provide data analysis and statistical functions. The block diagram of its hardware system is as Figure 2 shown.

[0070] The minimum system module is composed of a single-chip microcomputer, a crystal oscillator, a reset, and a power supply module. The circuit schematic diagram is as Figure 3 shown. The present invention selects the STC8H4K64TL as the main control chip, and the following will introduce it in detail.

[0071] The core component of the STC8H4K64TL microcontroller supports features such as high speed, low power consumption, and high integration. The frequency of the crystal oscillator can be selected according to the clock frequency required by the system. Commonly used crystal oscillator frequencies are 11.0592 MHz and 12 MHz.

[0072] The crystal oscillator is connected to the crystal oscillator circuit through two pins to provide a stable clock signal. The reset circuit is a necessary component to ensure the stability and reliability of the system. Its function is to forcibly restore the system from an uncertain state to a known state when the system power is turned on. The power management circuit includes a voltage regulator circuit and a filtering circuit. The voltage regulator circuit and the filtering circuit can ensure that when the chip operates under different power conditions, a stable power supply and a clean power supply environment are provided.

[0073] The STC8H4K64TL has high processing performance, appropriate storage space, rich peripheral interfaces, communication functions, and low power consumption characteristics in the design of the intelligent digital display power test system. Its schematic diagram is as Figure 3 shown.

[0074] The relays used in this research are of the SRA series. The relay module is usually activated or deactivated by a control signal. It receives a low-level control signal (usually grounded or 0V) from other circuits or devices. When the control signal is received, the electromagnetic coil is activated and the contact state changes.

[0075] The relay module can usually handle relatively high currents and voltages, making it suitable for circuits and devices that need to handle high power. It can be used to control the switches of electrical equipment such as motors, lights, and solenoid valves. The relay module can provide electrical isolation, separating the control circuit and the controlled circuit, thereby providing protection and safety and reducing the mutual influence between circuits. Relays can be used in aspects such as power switch control, load simulation, protection and safety measures, multi-channel switching, and automation control in the design of the intelligent digital display power test system.

[0076] They provide flexible and reliable control means to help achieve precise control and testing of the power output. Multiple relays are connected to high-power circuits with different resistance values, and then different relays are connected to different loads to change the resistance value, achieving automatic testing of the intelligent digital display power test system and being connected to the STC8H4K64TL microcontroller. Its schematic diagram is as Figure 4 shown.

[0077] In the intelligent digital display power test system, the external load plays an important role. Its function is to simulate the real load situation connected to the power output. By simulating and testing the load, the performance and stability of the power system under different operating conditions can be evaluated and verified.

[0078] The external load is a very important part because it can simulate real load conditions, making the test results more realistic and reliable. The external load can simulate the load characteristics in actual applications, such as resistance, inductance, capacitance, etc. By connecting the external load, the requirements and responses of the real load to the power supply can be simulated, thus comprehensively testing and evaluating the power supply system. When the power supply works under load, it outputs current and voltage. The external load can simulate the load to be driven by the power supply, making the output of the power supply in a real working state, so that the test results are more accurate.

[0079] This system uses high-power resistors for connection, with single-stage and bipolar outputs. Moreover, the rated power and rated load of the two groups of outputs are different. The relay is used to control the load, and the load combination is changed to simulate the power condition of the actual power supply for testing the power supply. Its schematic diagram is as Figure 5 、 6 shown.

[0080] The reset circuit is a circuit used to restore an electronic system or circuit to its initial state. Its main function is to trigger a reset signal to restore the system or circuit to a predetermined normal working state when the system or circuit experiences a fault, error, or unstable state. The reset signal generally needs to be processed to ensure its effectiveness and stability. The reset circuit usually collaborates with other components and modules in the system to ensure the normal recovery of the entire system. Once the system or circuit returns to the normal working state, the reset circuit releases the reset signal to indicate that the system is in a normal operating state. After releasing the reset signal, the system can continue to perform its normal operations.

[0081] The reset circuit can provide a protection mechanism for the system. When the system or circuit experiences overvoltage, overcurrent, or other fault conditions, the reset circuit can trigger a reset signal to make the system enter a safe state. This helps prevent further damage or faults and protects the system from losses. Its module schematic diagram is as Figure 7 shown.

[0082] The LED four-digit digital tube is a common digital display device composed of four seven-segment digital tubes. In addition to the common terminal and series resistor connected to the single-chip microcomputer, the resistor connected in series with the digital tube mainly functions as a current limiter. The digital tube is a combination of light-emitting diodes (LEDs). When a proper voltage is given, the LEDs will emit light. However, an LED is a current-driven device, and excessive current may cause damage to the LED. The digital tube current-limiting resistor is used to limit the flow of current and protect the digital tube from overcurrent damage.

[0083] When the single-chip microcomputer outputs the character code, all the digital tubes receive the same character code. However, which digital tube will display the character depends on the control of the single-chip microcomputer over the bit selection and gating of the COM terminal circuit. Therefore, in the present invention, as long as the gating control of the digital tube to be displayed is turned on, the character will be displayed at that position, and the digital tubes that are not gated will not light up.

[0084] Generally speaking, LED display is one of the important components in the intelligent digital display power test system. Through the design of the display module, the display of the power test system can be realized, and the present invention can more accurately observe the change parameters of the power supply. Its schematic diagram is as Figure 8 shown:

[0085] The CH340 chip is usually used in scenarios such as embedded systems, electronic devices, and development boards, providing a convenient serial communication interface. As a USB-to-serial chip, the CH340 chip can connect the power test system to a computer or other devices. Through the USB interface of the CH340, the system can communicate and exchange data with the host computer, facilitating the control and monitoring of the power test system. The CH340 chip provides a reliable serial communication interface, and the system can use this interface to collect data from the power supply or other devices and transmit the data to the computer or host computer for processing and analysis. With the serial communication interface provided by the CH340 chip, the system can receive instructions from the computer or host computer to achieve the control and configuration of the power test system. The CH340 chip supports standard serial communication protocols such as the UART (Universal Asynchronous Receiver-Transmitter) protocol. It can exchange data with other devices through the serial port, such as communicating with single-chip microcomputers, sensors, wireless modules, etc. Usually, the operating system will automatically recognize the CH340 chip and load the corresponding driver. The CH340 chip has low power consumption characteristics and is suitable for use in applications with low power consumption requirements. Its schematic diagram is as Figure 9 shown.

[0086] The 5V-to-3.3V circuit is designed to convert the 5V power supply voltage to 3.3V voltage to meet the requirements of electronic devices or modules with 3.3V level requirements. The 5V-to-3.3V circuit uses a voltage converter to achieve voltage conversion. The voltage converter usually adopts a buck-type design, and the input voltage is reduced by controlling the components in the circuit to output the required 3.3V voltage. It usually consists of a voltage converter or a level converter to provide the required voltage conversion function. In circuit design, using the 5V-to-3.3V circuit can provide a certain degree of circuit protection. By converting the 5V power supply to 3.3V voltage, it can ensure that the 3.3V device receives the correct voltage supply and reduce the risk of possible damage or instability to it. Its schematic diagram is as Figure 10 shown.

[0087] As Figure 11As shown, Keil5 is a powerful embedded system development environment designed to simplify and accelerate the process of embedded software development. The object code generated by Keil5 is highly efficient. Most statements generate compact and easily understandable assembly code. The advantages of high-level languages are more evident when developing large-scale software. Keil5 has a powerful software simulation function, and the advantage of this function is that it can check the correctness and feasibility of the program. Keil5 has built-in code optimization tools that can help developers improve the execution efficiency and performance of the program. It can automatically optimize the code, reduce memory occupancy and execution time, and provides various optimization options for developers to choose from. Keil5 is an advanced and comprehensive embedded development environment that can greatly simplify the development, debugging, and testing of strict embedded system applications.

[0088] To achieve the efficient and stable operation of the system, the software system is decomposed into several modules, the relationships and interfaces between the modules, as well as the organizational structure and work process of the entire system are determined, so as to meet the functional and performance requirements of the system. The function implemented by the relay control program is to automatically switch the combination of loads to meet the test requirements. Starting from the power-on, the program first determines whether the power is connected. If the power is detected to be connected, the system enters the function setting. When the power is connected, the relay can automatically switch the load and switch back and forth between load combinations, thus meeting the automatic test requirements of the power system. The program flow chart is as Figure 12 shown.

[0089] Design an intelligent digital display power supply test system for testing and monitoring parameters such as the output voltage, current, and power of the power supply. The system has a digital display function, can intuitively display the test results through the display screen, and supports data recording and analysis. To verify the feasibility and correctness of this system, this study conducted experiments in a test environment. The test environment includes an STC8H4K64TL microcontroller, a relay module, a load module, a reset circuit module, an LED digital tube display module, a CH340 communication module, and a power conversion circuit module, as well as software such as Keil5 and EDA. The test process is as follows:

[0090] (1) Select appropriate hardware platforms and development tools, such as installing Keil5 and EDA software;

[0091] (2) Conduct circuit design and layout;

[0092] (3) Connect the hardware devices;

[0093] (4) Burn the program into the STC8H4K64TL microcontroller;

[0094] (5) Implement the data recording and analysis function;

[0095] (6) Conduct system testing and verification to ensure that the system meets the design requirements, and perform performance and stability testing;

[0096] (7) Finally, optimize and adjust the system to ensure its stability and reliability;

[0097] (8) Analyze the test results and summarize the research achievements.

[0098] The hardware circuit of the intelligent digital display power supply test system is designed through EDA software. The minimum system board of the single-chip microcomputer module is used in the design. Here, only the relay control module and the external load module need to be designed. There are relatively rich component package libraries in the component library brought, but these component package libraries are all common package libraries. In many cases, the components required by the present invention are not in the package library of the present invention. Therefore, the present invention often needs to make the package library of the components required by the present invention by itself. After encapsulation, make a physical object and connect different devices to the board that has been made. The physical object is as Figure 13 shown:

[0099] The relay is connected to the P5.2, P0.3, P0.2, P2.7, P2.6, P2.5, and P2.4 pins of the single-chip microcomputer STC8H4K64TL. Power on the single-chip microcomputer and the relay. The relay is connected to the double-click load. Then the program runs in the circuit, and the display module displays the relevant measured data. The physical diagram of the double-stage output load is as Figure 14 .

[0100] The application embodiment of the present invention provides a computer device, which includes a memory and a processor. The memory stores a computer program. When the computer program is executed by the processor, the processor executes the steps of the intelligent digital display power supply test method.

[0101] The application embodiment of the present invention provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by the processor, the processor executes the steps of the intelligent digital display power supply test method.

[0102] The application embodiment of the present invention provides an information data processing terminal, which includes an intelligent digital display power supply test system.

[0103] As Figure 13 and Figure 14 shown, the present invention provides a device and method for aging test of medical high-frequency electrosurgical unit power supply. By performing segmented and periodic dynamic adjustment on the load resistance value, automatic aging test of the high-frequency electrosurgical unit power supply under different load states is realized. Compared with the traditional scheme that takes 36 hours to complete the aging process, the device of the present invention can shorten the total duration to 24 hours, and no manual intervention is required during the test process, greatly improving the test efficiency and reliability.

[0104] The design of the monopolar load part is as follows Figure 5 shown. The core idea is to allocate a certain proportion of resistance ranges according to the statistical distribution of the electrosurgical unit load resistance values in actual clinical use. Specifically, the monopolar load resistances are set as: 100, 300, 500, 200, 400, 300, 500, 800, 200, 300, 500, 100, 400, 300, 2000, 500, 400, 200, 300, 700. This design can cover multiple resistance levels from 100Ω to 2000Ω, covering the most common load range of medical high-frequency electrosurgical units in monopolar mode.

[0105] The design of the bipolar load part is as follows Figure 14 shown. Another set of resistance combinations that conform to the actual working conditions of the bipolar mode is adopted: 10, 60, 110, 160, 1010, 30, 80, 130, 410. This combination focuses on the range from 10Ω to 1010Ω, and distributes the resistances to different sections according to clinical experience, enabling the electrosurgical unit to also perform multi-condition aging tests under simulated loads in bipolar state.

[0106] In the monopolar and bipolar load schemes, according to the statistical results of clinical use, the present invention makes precise proportion divisions for different resistance ranges: taking the monopolar as an example, the range of 100 - 200Ω accounts for 25%, the range of 300 - 500Ω accounts for 60%, and the range of 800 - 2000Ω accounts for 15%; for the bipolar, it is divided into 10 - 30Ω accounting for 25%, 60 - 160Ω accounting for 60%, and 410 - 1010Ω accounting for 22%. Such a proportion distribution method can simulate the load distribution encountered by the high-frequency electrosurgical unit power supply in the real use environment to the greatest extent, improving the effectiveness of the aging test.

[0107] During the aging test process, through the algorithm designed by the present invention, the load conditions of different resistances can be automatically switched according to the preset time sequence and proportion. This process is completed independently by the device without frequent manual operation, which not only saves labor costs but also ensures the stability and consistency of the test process. Compared with the traditional aging process that takes 36 hours, the present invention can complete an equivalent or even more stringent aging test within 24 hours, accelerating the reliability verification progress of the electrosurgical unit power supply.

[0108] Finally, the load change curves obtained through experimental tests are as follows Figure 13 and Figure 14 shown. It can be seen that the actual values are basically consistent with the design values, indicating that the algorithm and the device have high accuracy and stability in controlling the load change. Based on this, the present invention not only effectively shortens the power supply aging test duration, but also can comprehensively evaluate the working state of the medical high-frequency electrosurgical unit power supply under different resistance loads, having significant practical value and promotion prospects.

[0109] It should be noted that the embodiments of the present invention can be implemented by hardware, software, or a combination of software and hardware. The hardware part can be implemented using dedicated logic; the software part can be stored in a memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated designed hardware. Those of ordinary skill in the art can understand that the above devices and methods can be implemented using computer-executable instructions and / or included in processor control code, for example, such code is provided on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as a read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The devices and modules of the present invention can be implemented by hardware circuits of programmable hardware devices such as very large scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, etc., or field programmable gate arrays, programmable logic devices, etc., can also be implemented by software executed by various types of processors, or can be implemented by a combination of the above hardware circuits and software, such as firmware.

[0110] As described above, the above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, any modifications, equivalent replacements, and improvements made within the spirit and principle of the present invention should be covered by the protection scope of the present invention.

Claims

1. An intelligent digital display power test system, characterized in that Including: The minimum single-chip microcomputer system, using the STC8H4K64TL single-chip microcomputer as the main control chip; The relay module, used to automatically control different combinations of external loads; The display module, used to display specific data in real time; The reset circuit, used to accurately position the reliability and stability functions of the electronic system. When the system fails, the reset circuit can force the entire system to be reset to its initial state so that the system can restart and run; The load module, used to simulate the real load situation connected to the power supply output. Through the simulation and testing of the load, evaluate and verify the performance and stability of the power supply system under different working conditions; The CH340 communication module, used to connect the power supply test system to a computer or other devices; The power supply module, used to convert the 5V power supply voltage to 3.3V voltage to meet the requirements of electronic devices or modules with 3.3V level requirements.

2. The intelligent digital display power supply test system according to claim 1, wherein, The minimum single-chip microcomputer system specifically includes: The frequency of the crystal oscillator can be selected according to the clock frequency required by the system. Commonly used crystal oscillator frequencies are 11.0592MHz and 12MHz; The crystal oscillator is connected to the crystal oscillator circuit through two pins to provide a stable clock signal; the reset circuit is a necessary component to ensure the stability and reliability of the system. Its function is to forcibly restore the system from an uncertain state to a known state when the system power is turned on; the power management circuit includes a voltage stabilization circuit and a filtering circuit; the voltage stabilization circuit and the filtering circuit can ensure that when the chip works under different power conditions, a stable power supply and a clean power supply environment are provided.

3. The intelligent digital display power supply test system according to claim 1, characterized in that, The relay module specifically includes: Activating or closing the electromagnetic coil through a control signal; it receives a low-level control signal from other circuits or devices. When the control signal is received, the electromagnetic coil is activated and the contact state changes; Handling higher currents and voltages to make it suitable for circuits and devices that need to handle high power; providing electrical isolation to separate the control circuit and the controlled circuit, thereby providing protection and safety and reducing the mutual influence between circuits; used in power switch control, load simulation, protection and safety measures, multi-way switching, and automation control; multiple relays are connected to high-power circuits with different resistance values, and then different relays are connected to different loads to change the resistance value, achieving the automatic test of the intelligent digital display power supply test system and being connected to the STC8H4K64TL microcontroller.

4. The intelligent digital display power test system according to claim 1, wherein The load module specifically includes: By connecting an external load, simulating the requirements and responses of the real load to the power supply, thereby comprehensively testing and evaluating the power supply system; when the power supply works under load, outputting current and voltage, and the external load simulates the load to be driven by the power supply, making the output of the power supply in a real working state, so that the test results are more accurate; using high-power resistors for connection, having single-stage and bipolar outputs, and the rated power and rated load of the two groups of outputs are different. Using relays to control the load and changing the combination of the load to simulate the power situation of the actual power supply for testing the power supply.

5. The intelligent digital display power test system according to claim 1, characterized in that, The reset circuit specifically includes: When the system or circuit fails, makes an error, or enters an unstable state, the reset circuit restores the system or circuit to a predetermined normal operating state by triggering a reset signal; the reset circuit collaborates with other components and modules in the system to ensure the normal recovery of the entire system; once the system or circuit returns to the normal operating state, the reset circuit releases the reset signal to indicate that the system is in a normal running state; after releasing the reset signal, the system can continue to perform its normal operations; The reset circuit provides a protection mechanism for the system; when the system or circuit experiences overvoltage, overcurrent, or other fault conditions, the reset circuit can trigger a reset signal to put the system into a safe state.

6. The intelligent digital display power test system according to claim 1, wherein The display module specifically includes: The four-digit LED digital tube consists of four seven-segment digital tubes. In addition to the common terminal and series resistor connected to the microcontroller, the resistor connected in series with the digital tube mainly serves as a current-limiting function. The digital tube is a combination of light-emitting diodes, and when a proper voltage is applied, the LEDs emit light; When the microcontroller outputs the character code, all digital tubes receive the same character code. By turning on the strobe control of the digital tube that needs to display, the digit will show the character, and the digital tubes that are not strobed will not light up.

7. The intelligent digital display power test system according to claim 1, characterized in that, The CH340 communication module specifically includes: Through the USB interface of CH340, the system communicates and exchanges data with the host computer, facilitating the control and monitoring of the power supply test system; the CH340 chip provides a serial communication interface, and the system can use this interface to collect data from the power supply or other devices and transmit the data to the computer or host computer for processing and analysis; with the serial communication interface provided by the CH340 chip, the system can receive instructions from the computer or host computer to achieve the control and configuration of the power supply test system; the CH340 chip supports standard serial communication protocols, including the UART protocol, and exchanges data with other devices through the serial port, such as communicating with the microcontroller, sensors, and wireless modules; the operating system automatically recognizes the CH340 chip and loads the corresponding driver.

8. The intelligent digital display power test system according to claim 1, wherein, The power supply module specifically includes: The 5V to 3.3V circuit uses a voltage converter to achieve voltage conversion. The voltage converter adopts a buck design and reduces the input voltage and outputs the required 3.3V voltage by controlling the components in the circuit. It consists of a voltage converter or a level converter to provide the required voltage conversion function.

9. An intelligent digital display power supply testing method using the intelligent digital display power supply testing system according to any one of claims 1 to 8, characterized in that, Includes: S1, program initialization; S2, determine whether the power supply is connected. If it is connected, continue to execute; if not, return to S1; S3, automatically switch the load; S4, monitor data; S5, display data.

10. An information data processing terminal, the information data processing terminal includes the intelligent digital display power supply test system according to any one of claims 1 to 8.

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