A test system and test method for a flash chip

Abstract

This application discloses a testing system and method for FLASH chips, applied to electronic devices, the electronic devices including FLASH chips; the method includes: acquiring first test environment parameters of the FLASH chip; acquiring test parameters and reference test result parameters of the FLASH chip; performing multiple tests on the FLASH chip according to the first test environment parameters and the test parameters to obtain multiple test result parameters; determining a first test result parameter based on the multiple test result parameters; determining a first deviation between the first test result parameter and the reference test result parameter; and determining that the FLASH chip is qualified when the first deviation is within a first preset range. Using this application can improve the intelligence of FLASH chip testing.

Description

Technical Field

[0001] This application relates to the field of storage technology, specifically to a test system and test method for FLASH chips. Background Technology

[0002] In practical applications, flash memory chips are also known as flash drives, a type of portable storage product. They can be used to store data files of any format, and because they are easy to carry, they are often referred to as personal "data mobility centers." Currently, the testing of flash chips is relatively mechanized; therefore, the issue of how to improve the intelligence of flash chip testing urgently needs to be addressed. Summary of the Invention

[0003] This application provides a testing system and method for FLASH chips, which can improve the intelligence of FLASH chip testing.

[0004] In a first aspect, embodiments of this application provide a testing method for a FLASH chip, applied to an electronic device, the electronic device including a FLASH chip; the method includes:

[0005] Obtain the first test environment parameters of the FLASH chip;

[0006] Obtain the test parameters and reference test result parameters of the FLASH chip;

[0007] The FLASH chip is tested multiple times based on the first test environment parameters and the test parameters to obtain multiple test result parameters.

[0008] The first test result parameter is determined based on the multiple test result parameters;

[0009] Determine the first deviation between the first test result parameter and the reference test result parameter;

[0010] When the first deviation is within the first preset range, the FLASH chip is determined to be qualified for testing.

[0011] Secondly, embodiments of this application provide a testing system for FLASH chips, applied to electronic devices, the electronic devices including FLASH chips; the system includes:

[0012] The acquisition unit is used to acquire the first test environment parameters of the FLASH chip; and to acquire the test parameters and reference test result parameters of the FLASH chip.

[0013] The testing unit is used to perform multiple tests on the FLASH chip according to the first test environment parameters and the test parameters to obtain multiple test result parameters;

[0014] The determining unit is configured to determine a first test result parameter based on the plurality of test result parameters; determine a first deviation between the first test result parameter and the reference test result parameter; and determine that the FLASH chip is qualified when the first deviation is within a first preset range.

[0015] Thirdly, embodiments of this application provide an electronic device, including a processor, a memory, a communication interface, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the processor, and the programs include instructions for performing the steps in the first aspect of embodiments of this application.

[0016] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program for electronic data interchange, wherein the computer program causes a computer to perform some or all of the steps described in the first aspect of embodiments of this application.

[0017] Fifthly, embodiments of this application provide a computer program product, wherein the computer program product includes a non-transitory computer-readable storage medium storing a computer program operable to cause a computer to perform some or all of the steps described in the first aspect of embodiments of this application. The computer program product may be a software installation package.

[0018] Implementing the embodiments of this application has the following beneficial effects:

[0019] As can be seen, the FLASH chip testing system and method described in this application embodiment are applied to electronic devices, the electronic devices including FLASH chips; acquiring first test environment parameters of the FLASH chip; acquiring test parameters and reference test result parameters of the FLASH chip; performing multiple tests on the FLASH chip according to the first test environment parameters and the test parameters to obtain multiple test result parameters; determining a first test result parameter according to the multiple test result parameters; determining a first deviation between the first test result parameter and the reference test result parameter; when the first deviation is within a first preset range, determining that the FLASH chip is qualified. Thus, multiple tests can be performed based on the first test environment parameters and test parameters to determine the first test result parameter (actual test result), and then the first deviation between the first test result parameter and the reference test result parameter (expected test result) can be used to check whether the FLASH chip is qualified. When the first deviation is within the first preset range, it indicates that the FLASH chip is qualified, thereby improving the intelligence of FLASH chip testing. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a flowchart illustrating a testing method for a FLASH chip provided in an embodiment of this application;

[0022] Figure 2 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application;

[0023] Figure 3 This is a functional unit block diagram of a FLASH chip testing system provided in an embodiment of this application. Detailed Implementation

[0024] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0025] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0026] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0027] The embodiments of this application will be described in detail below.

[0028] Please see Figure 1 , Figure 1 This is a flowchart illustrating a testing method for a FLASH chip provided in an embodiment of this application. As shown in the figure, it is applied to an electronic device, which includes a FLASH chip. The testing method for this FLASH chip includes:

[0029] 101. Obtain the first test environment parameters of the FLASH chip.

[0030] The first test environment parameter of the FLASH chip can be understood as the test environment during testing. The first test environment parameter may include hardware test environment parameters and / or software test environment parameters.

[0031] The hardware testing environment parameters may include at least one of the following: CPU parameters, GPU parameters, NPU parameters, memory configuration parameters, etc., which are not limited here.

[0032] The software testing environment parameters may include at least one of the following: test system type, test system model, test network parameters, etc., which are not limited here.

[0033] In practice, the first test environment parameters of the FLASH chip can be obtained during testing.

[0034] 102. Obtain the test parameters and reference test result parameters of the FLASH chip.

[0035] In this embodiment of the application, the test parameters may include test cases and / or test configuration parameters. Different test modes may correspond to different test parameters.

[0036] In practice, different test parameters can be used as different reference test result parameters. The reference test result parameters can be understood as the test result parameters under ideal conditions or under conditions where the test is passed.

[0037] Optionally, step 102 above, obtaining the test parameters and reference test result parameters of the FLASH chip, may include the following steps:

[0038] Determine the test parameters of the FLASH chip corresponding to the first test environment parameters;

[0039] Obtain the first attribute information of the FLASH chip;

[0040] Determine the reference test result parameter corresponding to the test parameter and the first attribute information.

[0041] In a specific implementation, a pre-stored mapping relationship between preset test environment parameters and FLASH chip test parameters can be used to determine the test parameters of the FLASH chip corresponding to the first test environment parameters.

[0042] Next, the first attribute information of the FLASH chip can be obtained. The first attribute information may include at least one of the following: chip type, chip model, chip configuration parameters, etc., which are not limited here.

[0043] In a specific implementation, a pre-stored mapping relationship between the attribute information of the FLASH chip and the test result parameters can be established. Then, based on this mapping relationship, a set of test result parameters corresponding to the first attribute information can be determined. This set of test result parameters can include multiple test result parameters, each corresponding to a sample test parameter. Next, a target sample test parameter corresponding to the test parameter can be determined, and the test result parameter corresponding to the target sample test parameter can be obtained as a reference test result parameter. Thus, on the one hand, the test parameters of the FLASH chip corresponding to the actual test environment can be obtained; on the other hand, the first attribute information characterizes the performance of the FLASH chip, and the corresponding reference test result parameter can be determined based on the test parameters and the performance of the FLASH chip, thereby improving the intelligence of FLASH chip testing.

[0044] 103. Perform multiple tests on the FLASH chip according to the first test environment parameters and the test parameters to obtain multiple test result parameters.

[0045] In this embodiment, the FLASH chip can be tested multiple times according to the first test environment parameters and test parameters to obtain multiple test result parameters. Multiple tests can ensure the consistency of the test result parameters and avoid system errors.

[0046] 104. Determine the first test result parameter based on the multiple test result parameters.

[0047] In this embodiment of the application, the first test result parameter can be determined based on multiple test result parameters, thereby reducing the probability of errors and ensuring the correctness of the test.

[0048] Optionally, each test result parameter corresponds to a test time, and the second deviation between the actual test environment parameter at the test time corresponding to each test result parameter and the first test environment parameter is within a second preset range; step 104 above, determining the first test result parameter based on the multiple test result parameters, may include the following steps:

[0049] Based on each of the multiple test result parameters and the corresponding test time, a fitting is performed to obtain a first fitting straight line and a first fitting curve segment. The horizontal axis of both the first fitting straight line and the first fitting curve segment is time and the vertical axis is the test result parameter. The start time of the first fitting curve segment is the test start time of the multiple tests and the end time of the first fitting curve segment is the test end time of the multiple tests.

[0050] Obtain the first slope of the first fitted line;

[0051] Obtain the extreme values ​​of the first fitted curve segment to obtain multiple extreme values;

[0052] Obtain the mean value of the first fitted curve segment;

[0053] Determine the first standard deviation of the plurality of extreme values;

[0054] Determine the first adjustment parameter corresponding to the first slope;

[0055] Determine the first fine-tuning parameter corresponding to the first standard deviation;

[0056] The first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter.

[0057] The second preset range can be preset or set by the system default. Each test result parameter corresponds to a test time. The second deviation between the actual test environment parameter and the first test environment parameter at the test time corresponding to each test result parameter is within the second preset range. The second deviation is calculated as (actual test environment parameter - first test environment parameter) / first test environment parameter.

[0058] In the specific implementation, fitting can be performed based on each test result parameter and the corresponding test time among multiple test result parameters. Specifically, each test result parameter and the corresponding test time among multiple test result parameters can obtain multiple coordinate points, with the horizontal axis being time and the vertical axis being the test result parameter. Then, fitting is performed based on multiple coordinate points to obtain the first fitted straight line and the first fitted curve segment. Both the first fitted straight line and the first fitted curve segment have the horizontal axis being time and the vertical axis being the test result parameter.

[0059] The start time of the first fitted curve segment is the start time of multiple tests, and the end time of the first fitted curve segment is the end time of multiple tests.

[0060] In practice, the first slope of the first fitted straight line can be obtained, as can the extreme values ​​of the first fitted curve segment, resulting in multiple extreme values, which can include maxima and minima. Next, the average of the first fitted curve segment can be calculated to obtain the mean, and then the standard deviation of the multiple extreme values ​​can be calculated to obtain the first standard deviation.

[0061] Specifically, a pre-stored mapping relationship between slope and adjustment parameters can be used to determine the first adjustment parameter corresponding to the first slope. Similarly, a pre-stored mapping relationship between standard deviation and fine-tuning parameters can be used to determine the first fine-tuning parameter corresponding to the first standard deviation. Then, the first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter. Firstly, the mean reflects the baseline of the test result parameter; secondly, the slope reflects the changing trend of the test result parameter; and thirdly, the standard deviation reflects the stability of the FLASH chip. Therefore, the actual test result parameter can be accurately determined based on the changing trend of the test result parameter and the stability of the FLASH chip, thus ensuring the consistency of the test result parameter and avoiding system errors.

[0062] Optionally, the above steps, in which the first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter, can be implemented in the following manner:

[0063] The first test result parameter is determined according to the following formula, as follows:

[0064] First test result parameter = mean * (1 + first adjustment parameter) * (1 + first fine-tuning parameter).

[0065] The first test result parameter is calculated as mean * (1 + first adjustment parameter) * (1 + first fine-tuning parameter). This means that the actual test result parameter can be accurately determined based on the changing trend of the test result parameter and the stability of the FLASH chip. This ensures the consistency of the test result parameter and avoids system errors.

[0066] 105. Determine the first deviation between the first test result parameter and the reference test result parameter.

[0067] In practice, the first deviation between the first test result parameter and the reference test result parameter can be determined, that is, the first deviation = (first test result parameter - reference test result parameter) / reference test result parameter. The first deviation indicates the degree of difference between the actual test result and the test result under ideal conditions or under qualified test conditions.

[0068] 106. When the first deviation is within the first preset range, the FLASH chip is determined to be qualified for testing.

[0069] The first preset range can be set in advance or be the system default.

[0070] In practice, if the first deviation is within the first preset range, it indicates that the FLASH chip test is qualified; otherwise, if the first deviation is not within the first preset range, it indicates that the FLASH chip test is unqualified.

[0071] Optionally, the following steps may also be included:

[0072] By using big data technology, test result parameters that correspond to the first test environment parameters, the test parameters, and the first attribute information are determined to indicate that the FLASH chip has passed the test, and multiple sample test result parameters are obtained.

[0073] Determine the maximum and minimum values ​​of the parameters of the multiple sample test results;

[0074] Based on the multiple sample test result parameters, determine the number of sample test result parameters for each interval in the multiple intervals, and obtain multiple quantities;

[0075] The mean value of the sample test result parameter in each of the multiple intervals is determined based on the multiple sample test result parameters, thus obtaining multiple mean values;

[0076] Determine the proportion of each of the multiple quantities to obtain multiple proportions;

[0077] The median value is obtained by weighting the multiple means and the multiple percentages.

[0078] The preset range is determined based on the intermediate value.

[0079] In practice, the first preset range can be accurately determined by combining the test results of FLASH chips with the same specifications as the FLASH chip.

[0080] Specifically, big data technology can be used to determine the test result parameters that correspond to the first test environment parameters, test parameters, and first attribute information for the FLASH chip to pass the test, and obtain multiple sample test result parameters. In other words, it is possible to obtain test result parameters that correspond to the current test environment, test parameters, and characteristics of the FLASH chip in depth.

[0081] In specific implementation, the maximum and minimum values ​​of multiple sample test result parameters can be determined. Then, based on the multiple sample test result parameters, the number of sample test result parameters in each interval of multiple intervals can be determined, resulting in multiple quantities. Next, based on the multiple sample test result parameters, the mean value of the sample test result parameters in each interval of multiple intervals can be determined, resulting in multiple means. The proportion of each quantity in the multiple quantities can also be determined, resulting in multiple proportions. Then, a weighted calculation is performed on the multiple means and multiple proportions to obtain the median value. Subsequently, a first preset range can be determined based on the median value. Specifically, the interval range of the first preset range can be preset or defaulted by the system. That is, if the median value is fixed, the first preset range corresponding to the median value and the interval range can be accurately determined. In this way, the first preset range can be accurately determined by combining the test results of FLASH chips of the same specifications as the FLASH chip.

[0082] As can be seen, the FLASH chip testing method described in this application embodiment is applied to an electronic device, which includes a FLASH chip; the method involves: obtaining first test environment parameters of the FLASH chip; obtaining test parameters and reference test result parameters of the FLASH chip; performing multiple tests on the FLASH chip based on the first test environment parameters and the test parameters to obtain multiple test result parameters; determining a first test result parameter based on the multiple test result parameters; determining a first deviation between the first test result parameter and the reference test result parameter; and determining that the FLASH chip is qualified when the first deviation is within a first preset range. Thus, multiple tests can be performed based on the first test environment parameters and the test parameters to determine the first test result parameter (actual test result), and then the first deviation between the first test result parameter and the reference test result parameter (expected test result) can be used to verify whether the FLASH chip is qualified. When the first deviation is within the first preset range, it indicates that the FLASH chip is qualified, thereby improving the intelligence of FLASH chip testing.

[0083] Consistent with the above embodiments, please refer to Figure 2 , Figure 2 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. As shown in the figure, the electronic device includes a processor, a memory, a communication interface, and one or more programs. The one or more programs are stored in the memory and configured to be executed by the processor. In this embodiment, the electronic device also includes a FLASH chip. The programs include instructions for performing the following steps:

[0084] Obtain the first test environment parameters of the FLASH chip;

[0085] Obtain the test parameters and reference test result parameters of the FLASH chip;

[0086] The FLASH chip is tested multiple times based on the first test environment parameters and the test parameters to obtain multiple test result parameters.

[0087] The first test result parameter is determined based on the multiple test result parameters;

[0088] Determine the first deviation between the first test result parameter and the reference test result parameter;

[0089] When the first deviation is within the first preset range, the FLASH chip is determined to be qualified for testing.

[0090] Optionally, regarding the acquisition of test parameters and reference test result parameters of the FLASH chip, the above procedure includes instructions for performing the following steps:

[0091] Determine the test parameters of the FLASH chip corresponding to the first test environment parameters;

[0092] Obtain the first attribute information of the FLASH chip;

[0093] Determine the reference test result parameter corresponding to the test parameter and the first attribute information.

[0094] Optionally, each test result parameter corresponds to a test time, and the second deviation between the actual test environment parameter and the first test environment parameter at the test time corresponding to each test result parameter is within a second preset range;

[0095] In determining the first test result parameter based on the plurality of test result parameters, the above procedure includes instructions for performing the following steps:

[0096] Based on each of the multiple test result parameters and the corresponding test time, a fitting is performed to obtain a first fitting straight line and a first fitting curve segment. The horizontal axis of both the first fitting straight line and the first fitting curve segment is time and the vertical axis is the test result parameter. The start time of the first fitting curve segment is the test start time of the multiple tests and the end time of the first fitting curve segment is the test end time of the multiple tests.

[0097] Obtain the first slope of the first fitted line;

[0098] Obtain the extreme values ​​of the first fitted curve segment to obtain multiple extreme values;

[0099] Obtain the mean value of the first fitted curve segment;

[0100] Determine the first standard deviation of the plurality of extreme values;

[0101] Determine the first adjustment parameter corresponding to the first slope;

[0102] Determine the first fine-tuning parameter corresponding to the first standard deviation;

[0103] The first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter.

[0104] Optionally, in determining the first test result parameter based on the mean, the first adjustment parameter, and the first fine-tuning parameter, the above procedure includes instructions for performing the following steps:

[0105] The first test result parameter is determined according to the following formula, as follows:

[0106] First test result parameter = mean * (1 + first adjustment parameter) * (1 + first fine-tuning parameter).

[0107] Optionally, the above procedure may also include instructions for performing the following steps:

[0108] By using big data technology, test result parameters that correspond to the first test environment parameters, the test parameters, and the first attribute information are determined to indicate that the FLASH chip has passed the test, and multiple sample test result parameters are obtained.

[0109] Determine the maximum and minimum values ​​of the parameters of the multiple sample test results;

[0110] Based on the multiple sample test result parameters, determine the number of sample test result parameters for each interval in the multiple intervals, and obtain multiple quantities;

[0111] The mean value of the sample test result parameter in each of the multiple intervals is determined based on the multiple sample test result parameters, thus obtaining multiple mean values;

[0112] Determine the proportion of each of the multiple quantities to obtain multiple proportions;

[0113] The median value is obtained by weighting the multiple means and the multiple percentages.

[0114] The first preset range is determined based on the intermediate value.

[0115] As can be seen, the electronic device described in this application embodiment includes a FLASH chip; the process involves: acquiring first test environment parameters of the FLASH chip; acquiring test parameters and reference test result parameters of the FLASH chip; performing multiple tests on the FLASH chip based on the first test environment parameters and the test parameters to obtain multiple test result parameters; determining a first test result parameter based on the multiple test result parameters; determining a first deviation between the first test result parameter and the reference test result parameter; and determining that the FLASH chip is qualified when the first deviation is within a first preset range. Thus, multiple tests can be performed based on the first test environment parameters and the test parameters to determine the first test result parameter (actual test result), and then the first deviation between the first test result parameter and the reference test result parameter (expected test result) can be used to verify whether the FLASH chip is qualified. When the first deviation is within the first preset range, it indicates that the FLASH chip is qualified, thereby improving the intelligence of FLASH chip testing.

[0116] Figure 3 This is a functional unit block diagram of a FLASH chip testing system 300 according to an embodiment of this application. The FLASH chip testing system 300 is applied to an electronic device, which includes a FLASH chip; the FLASH chip testing system 300 includes:

[0117] The acquisition unit 301 is used to acquire the first test environment parameters of the FLASH chip; and to acquire the test parameters and reference test result parameters of the FLASH chip.

[0118] Test unit 302 is used to perform multiple tests on the FLASH chip according to the first test environment parameters and the test parameters to obtain multiple test result parameters;

[0119] The determining unit 303 is configured to determine a first test result parameter based on the plurality of test result parameters; determine a first deviation between the first test result parameter and the reference test result parameter; and determine that the FLASH chip is qualified when the first deviation is within a first preset range.

[0120] Optionally, regarding the acquisition of test parameters and reference test result parameters of the FLASH chip, the acquisition unit 301 is specifically used for:

[0121] Determine the test parameters of the FLASH chip corresponding to the first test environment parameters;

[0122] Obtain the first attribute information of the FLASH chip;

[0123] Determine the reference test result parameter corresponding to the test parameter and the first attribute information.

[0124] Optionally, each test result parameter corresponds to a test time, and the second deviation between the actual test environment parameter and the first test environment parameter at the test time corresponding to each test result parameter is within a second preset range;

[0125] In determining the first test result parameter based on the plurality of test result parameters, the determining unit 303 is specifically used for:

[0126] Based on each of the multiple test result parameters and the corresponding test time, a fitting is performed to obtain a first fitting straight line and a first fitting curve segment. The horizontal axis of both the first fitting straight line and the first fitting curve segment is time and the vertical axis is the test result parameter. The start time of the first fitting curve segment is the test start time of the multiple tests and the end time of the first fitting curve segment is the test end time of the multiple tests.

[0127] Obtain the first slope of the first fitted line;

[0128] Obtain the extreme values ​​of the first fitted curve segment to obtain multiple extreme values;

[0129] Obtain the mean value of the first fitted curve segment;

[0130] Determine the first standard deviation of the plurality of extreme values;

[0131] Determine the first adjustment parameter corresponding to the first slope;

[0132] Determine the first fine-tuning parameter corresponding to the first standard deviation;

[0133] The first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter.

[0134] Optionally, in determining the first test result parameter based on the mean, the first adjustment parameter, and the first fine-tuning parameter, the determining unit 303 is specifically used for:

[0135] The first test result parameter is determined according to the following formula, as follows:

[0136] First test result parameter = mean * (1 + first adjustment parameter) * (1 + first fine-tuning parameter).

[0137] Optionally, the FLASH chip testing system 300 is further specifically used for:

[0138] By using big data technology, test result parameters that correspond to the first test environment parameters, the test parameters, and the first attribute information are determined to indicate that the FLASH chip has passed the test, and multiple sample test result parameters are obtained.

[0139] Determine the maximum and minimum values ​​of the parameters of the multiple sample test results;

[0140] Based on the multiple sample test result parameters, determine the number of sample test result parameters for each interval in the multiple intervals, and obtain multiple quantities;

[0141] The mean value of the sample test result parameter in each of the multiple intervals is determined based on the multiple sample test result parameters, thus obtaining multiple mean values;

[0142] Determine the proportion of each of the multiple quantities to obtain multiple proportions;

[0143] The median value is obtained by weighting the multiple means and the multiple percentages.

[0144] The first preset range is determined based on the intermediate value.

[0145] As can be seen, the FLASH chip testing system described in this application embodiment is applied to an electronic device, which includes a FLASH chip. The system acquires first test environment parameters of the FLASH chip; acquires test parameters and reference test result parameters of the FLASH chip; performs multiple tests on the FLASH chip based on the first test environment parameters and the test parameters to obtain multiple test result parameters; determines a first test result parameter based on the multiple test result parameters; determines a first deviation between the first test result parameter and the reference test result parameter; and determines that the FLASH chip is qualified when the first deviation is within a first preset range. Thus, multiple tests can be performed based on the first test environment parameters and test parameters to determine the first test result parameter (actual test result), and then the first deviation between the first test result parameter and the reference test result parameter (expected test result) can be used to verify whether the FLASH chip is qualified. When the first deviation is within the first preset range, it indicates that the FLASH chip is qualified, thereby improving the intelligence of FLASH chip testing.

[0146] It is understood that the functions of each program module of the FLASH chip testing device in this embodiment can be specifically implemented according to the methods in the above method embodiments. The specific implementation process can be referred to the relevant descriptions in the above method embodiments, and will not be repeated here.

[0147] This application also provides a computer storage medium storing a computer program for electronic data interchange, which causes a computer to perform some or all of the steps of any of the methods described in the above method embodiments.

[0148] This application also provides a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program operable to cause a computer to perform some or all of the steps of any of the methods described in the above method embodiments. This computer program product can be a software installation package.

[0149] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0150] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0151] In the several embodiments provided in this application, it should be understood that the disclosed apparatus can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of the units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical or other forms.

[0152] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0153] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0154] If the integrated units described above are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage device (CMD). Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned memory includes various media capable of storing program code, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.

[0155] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, which may include: flash drive, read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.

[0156] The embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A testing method for a FLASH chip, characterized in that, Applied to an electronic device, the electronic device including a FLASH chip; the method includes: Obtain the first test environment parameters of the FLASH chip; Obtain the test parameters and reference test result parameters of the FLASH chip; The FLASH chip is tested multiple times based on the first test environment parameters and the test parameters to obtain multiple test result parameters. The first test result parameter is determined based on the multiple test result parameters; Determine the first deviation between the first test result parameter and the reference test result parameter; When the first deviation is within the first preset range, the FLASH chip is determined to be qualified in the test; Each test result parameter corresponds to a test time, and the second deviation between the actual test environment parameter and the first test environment parameter at the test time corresponding to each test result parameter is within a second preset range. Determining the first test result parameter based on the plurality of test result parameters includes: Based on each of the multiple test result parameters and the corresponding test time, a fitting is performed to obtain a first fitting straight line and a first fitting curve segment. The horizontal axis of both the first fitting straight line and the first fitting curve segment is time and the vertical axis is the test result parameter. The start time of the first fitting curve segment is the test start time of the multiple tests and the end time of the first fitting curve segment is the test end time of the multiple tests. Obtain the first slope of the first fitted line; Obtain the extreme values ​​of the first fitted curve segment to obtain multiple extreme values; Obtain the mean value of the first fitted curve segment; Determine the first standard deviation of the plurality of extreme values; Determine the first adjustment parameter corresponding to the first slope; Determine the first fine-tuning parameter corresponding to the first standard deviation; The first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter.

2. The method according to claim 1, characterized in that, The process of obtaining the test parameters and reference test result parameters of the FLASH chip includes: Determine the test parameters of the FLASH chip corresponding to the first test environment parameters; Obtain the first attribute information of the FLASH chip; Determine the reference test result parameter corresponding to the test parameter and the first attribute information.

3. The method according to claim 1, characterized in that, Determining the first test result parameter based on the mean, the first adjustment parameter, and the first fine-tuning parameter includes: The first test result parameter is determined according to the following formula, as follows: First test result parameter = mean * (1 + first adjustment parameter) * (1 + first fine-tuning parameter).

4. The method according to claim 2, characterized in that, The method further includes: By using big data technology, test result parameters that correspond to the first test environment parameters, the test parameters, and the first attribute information are determined to indicate that the FLASH chip has passed the test, and multiple sample test result parameters are obtained. Determine the maximum and minimum values ​​of the parameters of the multiple sample test results; Based on the multiple sample test result parameters, determine the number of sample test result parameters for each interval in the multiple intervals, and obtain multiple quantities; The mean value of the sample test result parameter in each of the multiple intervals is determined based on the multiple sample test result parameters, thus obtaining multiple mean values; Determine the proportion of each of the multiple quantities to obtain multiple proportions; The median value is obtained by weighting the multiple means and the multiple percentages. The first preset range is determined based on the intermediate value.

5. A testing system for a FLASH chip, characterized in that, The system is applied to an electronic device, which includes a FLASH chip; the system includes: The acquisition unit is used to acquire the first test environment parameters of the FLASH chip; and to acquire the test parameters and reference test result parameters of the FLASH chip. The testing unit is used to perform multiple tests on the FLASH chip according to the first test environment parameters and the test parameters to obtain multiple test result parameters; The determining unit is configured to determine a first test result parameter based on the plurality of test result parameters; determine a first deviation between the first test result parameter and the reference test result parameter; and determine that the FLASH chip is qualified when the first deviation is within a first preset range. Each test result parameter corresponds to a test time, and the second deviation between the actual test environment parameter and the first test environment parameter at the test time corresponding to each test result parameter is within a second preset range. In determining the first test result parameter based on the plurality of test result parameters, the determining unit is specifically used for: Based on each of the multiple test result parameters and the corresponding test time, a fitting is performed to obtain a first fitting straight line and a first fitting curve segment. The horizontal axis of both the first fitting straight line and the first fitting curve segment is time and the vertical axis is the test result parameter. The start time of the first fitting curve segment is the test start time of the multiple tests and the end time of the first fitting curve segment is the test end time of the multiple tests. Obtain the first slope of the first fitted line; Obtain the extreme values ​​of the first fitted curve segment to obtain multiple extreme values; Obtain the mean value of the first fitted curve segment; Determine the first standard deviation of the plurality of extreme values; Determine the first adjustment parameter corresponding to the first slope; Determine the first fine-tuning parameter corresponding to the first standard deviation; The first test result parameter is determined based on the mean, the first adjustment parameter, and the first fine-tuning parameter.

6. The system according to claim 5, characterized in that, Regarding the acquisition of test parameters and reference test result parameters of the FLASH chip, the acquisition unit is specifically used for: Determine the test parameters of the FLASH chip corresponding to the first test environment parameters; Obtain the first attribute information of the FLASH chip; Determine the reference test result parameter corresponding to the test parameter and the first attribute information.

7. The system according to claim 5, characterized in that, In determining the first test result parameter based on the mean, the first adjustment parameter, and the first fine-tuning parameter, the determining unit is specifically used for: The first test result parameter is determined according to the following formula, as follows: First test result parameter = mean * (1 + first adjustment parameter) * (1 + first fine-tuning parameter).

8. The system according to claim 6, characterized in that, The system is also specifically used for: By using big data technology, test result parameters that correspond to the first test environment parameters, the test parameters, and the first attribute information are determined to indicate that the FLASH chip has passed the test, and multiple sample test result parameters are obtained. Determine the maximum and minimum values ​​of the parameters of the multiple sample test results; Based on the multiple sample test result parameters, determine the number of sample test result parameters for each interval in the multiple intervals, and obtain multiple quantities; The mean value of the sample test result parameter in each of the multiple intervals is determined based on the multiple sample test result parameters, thus obtaining multiple mean values; Determine the proportion of each of the multiple quantities to obtain multiple proportions; The median value is obtained by weighting the multiple means and the multiple percentages. The first preset range is determined based on the intermediate value.

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