Independent monitoring storage system and method

Abstract

The invention relates to the technical field of memories, in particular to an independent monitoring storage system and method. A physical parameter acquisition module; a controller; the controller comprises a parameter monitoring module; the controller further comprises a receiving unit; an encoding determination unit; a transmission unit; a reference range determination unit; a determination unit; a first marking unit; a curve generation unit; the prediction unit is used for predicting according to the data volume of the to-be-stored data packet, the data volume of the test packet and the vibration frequency curve and the temperature change curve of each to-be-used sub-memory to obtain a completion temperature parameter and a completion vibration frequency parameter when the transmission of the to-be-stored data packet by the corresponding sub-memory is completed; a second marking unit; the selection unit is used for selecting a final sub-memory according to a second preset condition; and a handshake unit. The method has the advantages that the real-time working condition of each sub-memory can be monitored, and the target data can be accessed more quickly and more losslessly.

Description

Technical Field

[0001] The present invention relates to the technical field of memories, and more particularly to an independently monitored storage system and method. Background Art

[0002] The storage capacity of memories has advanced by leaps and bounds in accordance with Moore's Law. Currently, both consumer-grade memories and server-grade memories often store a vast amount of data information. Existing large-scale storage devices are usually array-based storage devices. Compared with traditional memories, array-based memories use parallel access methods, which can achieve faster write speeds and lower latency. When accessing and storing data on array-based storage devices using parallel access methods, in theory, it is necessary to examine the working status of each individual sub-memory and perform algorithmic scheduling based on the working status of each chip. Each individual sub-memory often has a large number of operating parameters that need to be monitored, including but not limited to storage space, working conditions (temperature, humidity, etc.), clock frequency, fault conditions, etc. In the prior art, it is often difficult to comprehensively monitor these parameters (especially physical parameters), and there is no suitable algorithm to reasonably summarize and utilize the data obtained from these monitors. Summary of the Invention

[0003] In order to monitor the real-time working conditions of each sub-memory, realize reasonable access scheduling based on these monitored data, and achieve faster and lossless access to target data, the present application provides an independently monitored storage system and method.

[0004] The first object of the above invention of the present application is achieved by the following technical solutions:

[0005] An independently monitored storage system and method, comprising:

[0006] A plurality of sub-memories;

[0007] A physical parameter acquisition module, where the physical parameters include decibel information, vibration frequency, and temperature information. The physical parameter acquisition module includes a noise detection unit for collecting decibel information, a vibration detection unit for collecting the vibration frequency of each sub-memory, and a temperature detection unit for collecting the temperature information of each sub-memory;

[0008] A controller, in which an encoding sequence table is stored. The sequence table is a mapping table of the encoding of the sub-memory and the type of the sub-memory;

[0009] The controller includes a parameter monitoring module, and the parameter monitoring module includes a read-write monitoring unit for collecting write speed parameters and a response time monitoring unit for collecting response time parameters;

[0010] The controller further includes:

[0011] A receiving unit, configured to receive a storage request, wherein the storage request carries storage information, and the storage information includes a data volume (data type, etc.) of a data packet to be stored;

[0012] A coding determination unit, used to determine the coding of the sub-memory that can be stored according to the data volume of the data packet to be stored carried by the storage request and the remaining capacity of each sub-memory;

[0013] A sending unit, used for sending the test package to each storable sub-memory, sending a collection start signal to the collection module, and sending a monitoring signal to the parameter monitoring module; after receiving the monitoring start signal, the collection module starts to collect decibel information for a preset monitoring time and vibration frequency and temperature information of each storable sub-memory; after receiving the monitoring signal, the parameter monitoring module starts to collect write speed parameters and response time parameters of each storable sub-memory; the data volume of the test package is determined according to the write speed of each sub-memory and the preset monitoring time;

[0014] An analysis module, used for selecting a final sub-memory according to the types of each storable sub-memory, the amount of data packets to be stored, the amount of data of the test packets and physical parameters;

[0015] The handshake unit is used to establish a connection with the sending end to store the data packet to be stored.

[0016] In a preferred example, the present application can be further configured as follows: the analysis module includes:

[0017] A reference range determination unit, used to determine a reference range of a write speed parameter and a reference range of a response time parameter of each storable sub-memory according to the collected initial temperature value and the type of each storable sub-memory;

[0018] A judging unit, used to judge whether the mean value of the write speed parameter is within the reference range of the write speed parameter of each sub-memory, and whether the response time parameter is within the reference range of the response time parameter of each sub-memory;

[0019] A first marking unit, configured to mark the sub-memory that can store data as a standby sub-memory if the mean value of the write speed parameter of the sub-memory that can store data is within the write speed parameter reference range of each sub-memory and the response time parameter is within the response time parameter reference range of each sub-memory;

[0020] A curve generating unit, used to generate a vibration frequency curve of each storable sub-memory and a temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and to generate a decibel change curve according to the collected decibel information;

[0021] A prediction unit, configured to predict, according to the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curves and temperature change curves of each standby sub-memory, the completion temperature parameter and the completion vibration frequency parameter when the corresponding sub-memory finishes transmitting the data packet to be stored;

[0022] A second marking unit, configured to mark the standby sub-memories whose completion temperature parameter and completion vibration frequency parameter meet the first preset condition as available sub-memories;

[0023] A selection unit, configured to select the final sub-memory according to the second preset condition.

[0024] In a preferred example, the present application can be further configured as: further including:

[0025] An elimination unit, configured to, if there is decibel information exceeding a preset value, infer a faulty sub-memory according to the decibel change curve and the vibration frequency curves of each sub-memory, and eliminate the faulty sub-memory from the standby sub-memories.

[0026] In a preferred example, the present application can be further configured as: the storage request further carries tag information, and the tag information includes an urgent tag and a no-requirement tag;

[0027] The second preset condition includes:

[0028] If an urgent tag is received, select the available sub-memory with the maximum average write speed parameter as the final sub-memory.

[0029] In a preferred example, the present application can be further configured as: the second preset condition further includes:

[0030] If a no-requirement tag is received, select the available sub-memory with the smallest remaining capacity as the final sub-memory.

[0031] In a preferred example, the present application can be further configured as: the sequence list further stores the abnormal temperature threshold and the abnormal vibration frequency threshold of each sub-memory;

[0032] The first preset condition means that the completion temperature parameter of each sub-memory does not exceed the corresponding abnormal temperature threshold, and the completion vibration frequency parameter of each sub-memory does not exceed the corresponding abnormal vibration frequency threshold.

[0033] The second invention object of the present application is achieved by the following technical solutions:

[0034] An independent monitoring storage method for an independently monitored storage system, including:

[0035] receiving a storage request, the storage request carrying storage information, the storage information including a data volume of a data packet to be stored;

[0036] Determine the code of the sub-memory that can be stored according to the data amount of the data packet to be stored carried by the storage request and the remaining capacity of each sub-memory;

[0037] Sending the test package to each storable sub-memory, sending a collection start signal to a collection module, and sending a monitoring signal to a parameter monitoring module;

[0038] Selecting a final sub-memory according to the types of each storable sub-memory, the amount of data of the data packet to be stored, the amount of data of the test packet and the physical parameters;

[0039] Establish a connection with the sender to store the data packets to be stored.

[0040] In a preferred example, the present application can be further configured as follows: selecting a final sub-memory according to the types of each storable sub-memory, the amount of data packets to be stored, the amount of data of the test packets, and the physical parameters, including:

[0041] Determine the writing speed parameter reference range and the response time parameter reference range of each storable sub-memory according to the collected initial temperature value and the type of each storable sub-memory;

[0042] Determine whether the mean value of the write speed parameter is within the write speed parameter benchmark range of each sub-memory, and whether the response time parameter is within the response time parameter benchmark range of each sub-memory;

[0043] If the write speed parameter mean value of the sub-memory that can store data is within the write speed parameter reference range of each sub-memory, and the response time parameter is within the response time parameter reference range of each sub-memory, then the sub-memory that can store data is marked as a standby sub-memory;

[0044] Generate a vibration frequency curve of each storable sub-memory and a temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generate a decibel change curve according to the collected decibel information;

[0045] According to the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curve and temperature change curve of each standby sub-memory, the completion temperature parameter and the completion vibration frequency parameter when the corresponding sub-memory completes the transmission of the data packet to be stored are predicted;

[0046] Marking the standby sub-memory whose completion temperature parameter and completion vibration frequency parameter meet the first preset condition as an available sub-memory;

[0047] Select the final sub - memory according to the second preset condition.

[0048] In a preferred example of the present application, it can be further configured that: before marking the standby sub - memories whose completion temperature parameters and completion vibration frequency parameters meet the first preset condition as available sub - memories, it further includes:

[0049] If there is the decibel information exceeding the preset value, then infer the faulty sub - memories according to the decibel change curve and the vibration frequency curves of each sub - memory, and exclude the faulty sub - memories from the standby sub - memories.

[0050] In a preferred example of the present application, it can be further configured that: selecting the final sub - memory according to the second preset condition includes:

[0051] If an urgent label is received, select the available sub - memory with the maximum average write speed parameter as the final sub - memory;

[0052] If a no - requirement label is received, select the available sub - memory with the smallest remaining capacity as the final sub - memory.

[0053] In a preferred example of the present application, it can be further configured that: the storage method also stores a coding sequence table, and the sequence table is a mapping table of the coding of the sub - memories and the sub - memory types;

[0054] The first preset condition means that the completion temperature parameters of each sub - memory do not exceed the corresponding abnormal temperature threshold, and the completion vibration frequency parameters of each sub - memory do not exceed the corresponding abnormal vibration frequency threshold.

[0055] In summary, the present application includes at least one of the following beneficial technical effects:

[0056] After receiving a storage request, gradually screen multiple sub - memories, evaluate them in turn through capacity, write speed, and response time, and then monitor the state physical parameters during the operation of each sub - memory. Combine multi - factor evaluation, analyze and exclude the sub - memories that may have faults or poor operating states, and select the sub - memories with good operating states for storage, realizing an independent monitoring function, as well as abnormal detection and safety warning. Description of the Drawings

[0057] Figure 1 It is a topological schematic diagram of each module unit of an independently monitored storage system in an embodiment of the present application;

[0058] Figure 2 It is a flowchart of the implementation of an independently monitored storage method in an embodiment of the present application. Detailed Embodiments

[0059] The exemplary embodiments of the present application will be described below in conjunction with the accompanying drawings. Various details of the embodiments of the present application are included to facilitate understanding, and they should be considered merely exemplary. Therefore, those of ordinary skill in the art should recognize that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of the present application. Similarly, descriptions of well-known functions and structures are omitted in the following description for clarity and conciseness.

[0060] It should be noted that the terms "first", "second", etc. in the present invention are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances so that the embodiments of the present disclosure described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure.

[0061] In addition, the term "and / or" herein is merely a description of the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " herein, unless otherwise specified, generally represents an "or" relationship between the associated objects before and after.

[0062] Figure 1 is a topological schematic diagram of each module unit of an independently monitored storage system in an embodiment of the present application, as Figure 1 shown, the independently monitored storage system includes: a plurality of sub-memories, a physical parameter acquisition module, and a controller. Among them, the controller is built-in with a parameter monitoring module, and the parameter monitoring module includes a read-write monitoring unit for acquiring write speed parameters and a response time monitoring unit for acquiring response time parameters. The physical parameters include decibel information, vibration frequency, and temperature information. The physical parameter acquisition module includes a noise detection unit for acquiring decibel information, a vibration detection unit for acquiring the vibration frequency of each sub-memory, and a temperature detection unit for acquiring the temperature information of each sub-memory.

[0063] Among them, the plurality of sub-memories include various memory types, such as solid-state memory, mechanical memory, ROM, RAM, SAM, DAM, optical disk memory, etc.; the read-write monitoring unit uses, for example, the CrystalDiskMark test tool, and the response time monitoring unit uses, for example, the HD Tune test software, etc.; the noise detection unit uses a noise decibel meter, and only one noise detection unit is configured in this system. The vibration detection unit uses a micro vibration sensor, and the temperature detection unit uses a micro temperature sensor; one micro vibration sensor and one micro temperature sensor are configured for each sub-memory to detect the corresponding physical parameters of the corresponding sub-memory.

[0064] The controller stores an encoding sequence table, which is a mapping table of the encoding of sub - memories and the types of sub - memories. The mapping table also stores the abnormal temperature thresholds and abnormal vibration frequency thresholds of each sub - memory correspondingly. That is, in the mapping table, for each sub - memory, there is a corresponding abnormal temperature threshold and abnormal vibration frequency threshold mapped according to its sub - memory type;

[0065] The abnormal temperature threshold of a sub - memory refers to the set temperature at which the memory cannot work properly or may be damaged. For example, the abnormal temperature threshold of a sub - memory of a certain type (such as a solid - state drive) is set to 70 °C, and the abnormal temperature threshold of a sub - memory of a certain type (such as a mechanical hard drive) is set to 55 °C, etc. Similarly, the abnormal vibration frequency threshold is also preset according to the sub - memory type.

[0066] The controller also includes a receiving unit, an encoding determination unit, a sending unit, a reference range determination unit, a judgment unit, a first marking unit, a curve generation unit, a prediction unit, a second marking unit, a selection unit, and a hand - shaking unit.

[0067] Among them, the receiving unit is used to receive a storage request from the sending end. The storage request carries storage information, and the storage information includes the data volume and data type of the data packet to be stored. In one embodiment, the storage request also carries tag information, and the tag information includes an urgent tag and a no - requirement tag;

[0068] The encoding determination unit is used to determine the encoding of the sub - memories that can store data according to the data volume of the data packet to be stored carried in the storage request and the remaining capacity of each sub - memory; specifically, if the remaining capacity of a sub - memory exceeds the data volume of the data packet to be stored, then this memory is a sub - memory that can store data.

[0069] The sending unit is used to send a test packet to each sub - memory that can store data, send a collection start signal to the collection module, and send a monitoring signal to the parameter monitoring module; after receiving the monitoring start signal, the collection module starts to collect decibel information for a preset monitoring time and the vibration frequency and temperature information of each sub - memory that can store data; after receiving the monitoring signal, the parameter monitoring module starts to collect the write speed parameter and response time parameter of each sub - memory that can store data;

[0070] Among them, the preset monitoring duration can be set to 3 s. The data volume of the test packet is determined according to the write speed of each sub - memory and the preset monitoring time. Specifically, according to the write speed of each sub - memory and the preset monitoring time, the data volume that each sub - memory can store within the span of the preset monitoring time is calculated, and the average value of the data volumes that multiple sub - memories can store is taken as the data volume of the test packet.

[0071] The reference range determination unit is used to determine the reference range of the write speed parameter and the reference range of the response time parameter of each storable sub-memory according to the initially collected temperature value and each storable sub-memory type;

[0072] Specifically, the write speed and response time of different sub-memory types are affected by temperature changes. Therefore, for different sub-memory types, there are different reference ranges of write speed parameters and reference ranges of response time parameters for different temperatures. For example, the reference range of the write speed parameter of a certain SSD sub-memory is 400MB / s to 500MB / s at 20-40°C, and the reference range of the write speed parameter is 350MB / s to 400MB / s at 40-50°C; the reference range of the response time parameter is the same.

[0073] The judgment unit is used to judge whether the average value of the write speed parameter is within the reference range of the write speed parameter of each sub-memory, and whether the response time parameter is within the reference range of the response time parameter of each sub-memory;

[0074] The average value of the write speed parameter of the sub-memory is the average value of the write speed parameters of the sub-memory within the preset monitoring time span.

[0075] The first marking unit is used to mark the storable sub-memory as a standby sub-memory if the average value of the write speed parameter of the storable sub-memory is within the reference range of the write speed parameter of each sub-memory, and the response time parameter is within the reference range of the response time parameter of each sub-memory;

[0076] It can be understood that before the memory is damaged, it may show various parameter signs. When reading and writing data, if the speed becomes significantly slower, it may be a sign of problems in the internal circuit or storage unit of the chip. If the response time of the memory increases significantly, it may be a manifestation of the degradation of the chip performance. Therefore, preliminary screening and filtering are first carried out through the write speed parameter and the response time parameter.

[0077] The curve generation unit is used to generate the vibration frequency curve of each storable sub-memory and the temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generate the decibel change curve according to the collected decibel information;

[0078] Specifically, the method of linear fitting with regularization (ridge regression and Lasso regression) is used for fitting, and the decibel information collected within the preset monitoring time span is fitted to generate the decibel change curve.

[0079] The prediction unit is used to predict the completion temperature parameter and the completion vibration frequency parameter of the corresponding sub-memory when the transmission of the data packet to be stored is completed according to the data volume of the data packet to be stored, the data volume of the test packet and the vibration frequency curve and the temperature change curve of each sub-memory to be used;

[0080] Specifically, according to the data volume of the data packet to be stored and the data volume of the test packet, combined with the preset monitoring time, the storage time required for the data volume of the data packet to be stored can be calculated. That is, the product of the ratio of the data volume of the data packet to be stored and the data volume of the test packet and the preset monitoring time is the storage time required for the data volume of the data packet to be stored. The vibration frequency curve and the temperature change curve are curves of parameters with respect to time. Therefore, curve fitting models the time series, and it is only necessary to predict the corresponding parameter value at the node of the storage time when the data volume storage is completed. The curves all have corresponding functions, so the completion temperature parameters and completion vibration frequency parameters of each sub-storage at the corresponding time point can be directly obtained.

[0081] The second marking unit is used to mark the standby sub-memory whose completion temperature parameters and completion vibration frequency parameters meet the first preset condition as an available sub-memory; the first preset condition means that the completion temperature parameters of each sub-memory do not exceed the abnormal temperature threshold corresponding to each sub-memory, and the completion vibration frequency parameters of each sub-memory do not exceed the abnormal vibration frequency threshold corresponding to each sub-memory.

[0082] The selection unit is used to select the final sub-storage according to the second preset condition; the second preset condition includes: if an expedited tag is received, the available sub-storage with the maximum speed of the write speed parameter mean is selected as the final sub-storage. If a no-requirement tag is received, the available sub-storage with the smallest remaining capacity is selected as the final sub-storage.

[0083] The handshake unit is used to establish a connection with the sending end to store the data packet to be stored.

[0084] In one embodiment, the independently monitored storage system also includes a rejection unit, which is used to infer the faulty sub-memory based on the decibel change curve and the vibration frequency curve of each sub-memory if there is decibel information exceeding a preset value, and to remove the faulty sub-memory from the standby sub-memory. The execution of the rejection unit is located before the second marking unit. It can be understood that the noise in the chip output signal has increased significantly, which is due to the decrease in the stability of the internal circuit of the chip or the influence of external interference. Therefore, the decibel change curve and the vibration frequency curve of each sub-memory are input into a pre-trained neural network model to infer whether each sub-memory is faulty; that is, the input is the decibel change curve and the vibration frequency curve of the sub-memory at one time. The model is trained in the following way:

[0085] Perform annotation processing on each group of curve samples in the curve sample training set to annotate whether each group of curves reflects a fault and whether the reflection of the fault is associated with all or part of the information in the curve samples; and train a neural network with the annotated curve sample training set to obtain a model. Each group of curve samples includes a decibel change curve sample and a vibration frequency curve sample.

[0086] Specifically, obtain multiple experimental samples by collecting the decibel change curve during the operation of the memory of the fault and the vibration frequency curve of the sub-memory as a group of curve samples, and the decibel change curve of the memory during normal operation and the vibration frequency curve of the sub-memory as a group of curve samples, and train the neural network. The obtained model can then infer whether the sub-memory is faulty.

[0087] This application also provides an independent monitoring storage method for an independent monitoring storage system, referring to Figure 2 , including:

[0088] S1. Receive a storage request. The storage request carries storage information, and the storage information includes the data volume of the data packet to be stored.

[0089] S2. Determine the encoding of the storable sub-memories according to the data volume of the data packet to be stored carried by the storage request and the remaining capacity of each sub-memory.

[0090] S3. Send test packets to each storable sub-memory, send a collection start signal to the collection module, and send a monitoring signal to the parameter monitoring module.

[0091] S4. Select the final sub-memory according to the types of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters.

[0092] S5. Establish a connection with the sending end to store the data packet to be stored.

[0093] S4 includes:

[0094] S41. Determine the reference range of the write speed parameter and the reference range of the response time parameter of each storable sub-memory according to the initial temperature value collected and the types of each storable sub-memory.

[0095] S42. Judge whether the average value of the write speed parameter is within the reference range of the write speed parameter of each sub-memory and whether the response time parameter is within the reference range of the response time parameter of each sub-memory.

[0096] S43. If the average value of the write speed parameters of the storable sub-memories is within the benchmark range of the write speed parameters of each sub-memory, and the response time parameters are within the benchmark range of the response time parameters of each sub-memory, then mark the storable sub-memory as a standby sub-memory;

[0097] S44. Generate the vibration frequency curve of each storable sub-memory and the temperature change curve of each storable sub-memory based on the collected vibration frequency and temperature information of each storable sub-memory, and generate the decibel change curve based on the collected decibel information;

[0098] S45. Predict the completion temperature parameter and the completion vibration frequency parameter when the corresponding sub-memory finishes transmitting the data packet to be stored based on the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curve and temperature change curve of each standby sub-memory;

[0099] S46. Mark the standby sub-memories whose completion temperature parameter and completion vibration frequency parameter meet the first preset condition as available sub-memories;

[0100] S47. Select the final sub-memory according to the second preset condition.

[0101] In one embodiment, before S46, it further includes:

[0102] S451. If there is decibel information exceeding the preset value, then infer the faulty sub-memories according to the decibel change curve and the vibration frequency curve of each sub-memory, and remove the faulty sub-memories from the standby sub-memories.

[0103] In another embodiment, S47 includes:

[0104] S471. If an urgent label is received, then select the available sub-memory with the maximum average write speed parameter as the final sub-memory;

[0105] S472. If a no requirement label is received, then select the available sub-memory with the smallest remaining capacity as the final sub-memory.

[0106] For the specific limitations of the independent monitoring storage method, reference can be made to the limitations of the independent monitoring storage system in the above text, which will not be elaborated here. Each step of the above independent monitoring storage method can be implemented in whole or in part by software, hardware, and their combination.

[0107] The various embodiments of the systems and techniques described herein can be implemented in digital electronic circuitry, integrated circuit systems, application specific ASICs (application specific integrated circuits), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include: being implemented in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which may be a special-purpose or general-purpose programmable processor that receives data and instructions from, and transmits data and instructions to, a storage system, at least one input device, and at least one output device.

[0108] These computational programs (also referred to as programs, software, software applications, or code) include machine instructions for a programmable processor and can be implemented using high-level procedural and / or object-oriented programming languages and / or assembly / machine languages. As used herein, the terms “machine-readable medium” and “computer-readable medium” refer to any computer program product, apparatus, and / or device (e.g., a disk, optical disk, memory, programmable logic device (PLD)) used to provide machine instructions and / or data to a programmable processor, including a machine-readable medium that receives machine instructions as a machine-readable signal. The term “machine-readable signal” refers to any signal used to provide machine instructions and / or data to a programmable processor.

[0109] For providing interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the computer. Other kinds of devices can also be used for providing interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic, speech, or tactile input).

[0110] The systems and techniques described herein can be implemented in a computing system including backend components (e.g., as a data server), or a computing system including middleware components (e.g., an application server), or a computing system including frontend components (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described herein), or a computing system including any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected to each other by digital data communication in any form or medium (e.g., a communication network). Examples of communication networks include: local area network (LAN), wide area network (WAN), and the Internet.

[0111] It should be understood that various forms of the processes shown above can be used, steps can be reordered, added, or deleted. For example, the steps recited in this application can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions disclosed in this application can be achieved, and this is not limited herein.

[0112] The above specific embodiments do not constitute a limitation on the protection scope of this application. Those skilled in the art should understand that various modifications, combinations, sub - combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principle of this application shall be included within the protection scope of this application.

Claims

1. An independently monitored storage system, characterized in that, Comprising: Multiple sub - memories; A physical parameter acquisition module, where the physical parameters include decibel information, vibration frequency, and temperature information. The physical parameter acquisition module includes a noise detection unit for acquiring decibel information, a vibration detection unit for acquiring the vibration frequency of each sub - memory, and a temperature detection unit for acquiring the temperature information of each sub - memory; A controller, in which an encoding sequence table is stored. The sequence table is a mapping table of the encoding of the sub - memories and the types of the sub - memories; The controller includes a parameter monitoring module, and the parameter monitoring module includes a read - write monitoring unit for acquiring the write speed parameter and a response time monitoring unit for acquiring the response time parameter; The controller further includes: A receiving unit for receiving a storage request. The storage request carries storage information, and the storage information includes the data volume of the data packet to be stored; An encoding determination unit for determining the encoding of the sub - memories that can store according to the data volume of the data packet to be stored carried in the storage request and the remaining capacity of each sub - memory; A sending unit for sending test packets to each sub - memory that can store, sending an acquisition start signal to the acquisition module, and sending a monitoring signal to the parameter monitoring module. After receiving the monitoring start signal, the acquisition module starts to acquire decibel information for a preset monitoring time, as well as the vibration frequency and temperature information of each sub - memory that can store. After receiving the monitoring signal, the parameter monitoring module starts to acquire the write speed parameter and response time parameter of each sub - memory that can store. The data volume of the test packet is determined according to the write speed of each sub - memory and the preset monitoring time; An analysis module for selecting the final sub - memory according to the types of each sub - memory that can store, the data volume of the data packet to be stored, the data volume of the test packet, and the physical parameters; A handshake unit for establishing a connection with the sending end to store the data packet to be stored.

2. The independently monitored storage system according to claim 1, wherein, A processing module, including: A reference range determination unit for determining the reference range of the write speed parameter and the reference range of the response time parameter of each sub - memory that can store according to the initial temperature value acquired and the types of each sub - memory that can store; A judgment unit for judging whether the mean value of the write speed parameter is within the reference range of the write speed parameter of each sub - memory and whether the response time parameter is within the reference range of the response time parameter of each sub - memory; A first marking unit for marking the sub - memory that can store as a standby sub - memory if the mean value of the write speed parameter of the sub - memory that can store is within the reference range of the write speed parameter of each sub - memory and the response time parameter is within the reference range of the response time parameter of each sub - memory; A curve generation unit for generating a vibration frequency curve of each sub - memory that can store and a temperature change curve of each sub - memory that can store according to the vibration frequency and temperature information of each sub - memory that can store acquired, and generating a decibel change curve according to the decibel information acquired; A prediction unit for predicting the completion temperature parameter and completion vibration frequency parameter when the corresponding sub - memory transmits the data packet to be stored according to the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curve and temperature change curve of each standby sub - memory; A second marking unit, configured to mark the standby sub-memories whose completion temperature parameters and completion vibration frequency parameters meet a first preset condition as available sub-memories; A selection unit, configured to select the final sub-memory according to a second preset condition.

3. The independently monitored storage system according to claim 2, wherein It further includes: An elimination unit, configured to, if there is decibel information exceeding a preset value, infer a faulty sub-memory according to the decibel change curve and the vibration frequency curves of the sub-memories, and eliminate the faulty sub-memory from the standby sub-memories.

4. The independently monitored storage system according to claim 2, wherein The storage request further carries label information, and the label information includes an urgent label and a no requirement label; The second preset condition includes: If an urgent label is received, select the available sub-memory with the maximum average write speed parameter as the final sub-memory.

5. The independently monitored storage system according to claim 4, wherein The second preset condition further includes: If a no requirement label is received, select the available sub-memory with the smallest remaining capacity as the final sub-memory.

6. The independently monitored storage system according to claim 2, wherein, The sequence list further stores the abnormal temperature threshold and abnormal vibration frequency threshold of each sub-memory; The first preset condition means that the completion temperature parameter of each sub-memory does not exceed the corresponding abnormal temperature threshold, and the completion vibration frequency parameter of each sub-memory does not exceed the corresponding abnormal vibration frequency threshold.

7. An independently monitored storage method, based on the independently monitored storage system according to any one of claims 1-6, characterized in that, It includes: Receiving a storage request, where the storage request carries storage information, and the storage information includes the data volume of the data packet to be stored; Determining the encoding of the storable sub-memories according to the data volume of the data packet to be stored carried in the storage request and the remaining capacity of each sub-memory; Sending a test packet to each storable sub-memory, sending a collection start signal to the collection module, and sending a monitoring signal to the parameter monitoring module; Selecting the final sub-memory according to the types of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and physical parameters; Establishing a connection with the sending end to store the data packet to be stored.

8. The independently monitored storage method according to claim 7, wherein, Selecting the final sub-memory according to the types of each storable sub-memory, the data volume of the data packet to be stored, the data volume of the test packet, and physical parameters, including: Determining the reference range of the write speed parameter and the reference range of the response time parameter of each storable sub-memory according to the initially collected temperature and the types of each storable sub-memory; Judging whether the average value of the write speed parameter is within the reference range of the write speed parameter of each sub-memory, and whether the response time parameter is within the reference range of the response time parameter of each sub-memory; If the average value of the write speed parameter of the storable sub-memory is within the reference range of the write speed parameter of each sub-memory, and the response time parameter is within the reference range of the response time parameter of each sub-memory, then mark the storable sub-memory as a standby sub-memory; Generating the vibration frequency curve of each storable sub-memory and the temperature change curve of each storable sub-memory according to the collected vibration frequency and temperature information of each storable sub-memory, and generating a decibel change curve according to the collected decibel information; According to the data volume of the data packet to be stored, the data volume of the test packet, and the vibration frequency curve and temperature change curve of each standby sub-memory, the completion temperature parameter and the completion vibration frequency parameter when the corresponding sub-memory completes the transmission of the data packet to be stored are predicted; Marking the standby sub-memory whose completion temperature parameter and completion vibration frequency parameter meet the first preset condition as an available sub-memory; A final sub-memory is selected according to the second preset condition.

9. The independently monitored storage method according to claim 8, wherein, Before marking the standby sub-memory whose completion temperature parameter and completion vibration frequency parameter meet the first preset condition as an available sub-memory, the method further includes: If the decibel information exceeds the preset value, the faulty sub-memory is inferred based on the decibel change curve and the vibration frequency curve of each sub-memory, and the faulty sub-memory is removed from the sub-memory to be used.

10. The independently monitored storage method according to claim 8, wherein, Selecting a final sub-memory according to the second preset condition includes: If an expedited tag is received, an available sub-storage having a maximum speed of the mean writing speed parameter is selected as the final sub-storage.

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