A radio frequency resource dynamic allocation test system and method

Abstract

The present invention discloses a dynamic allocation test system and method for radio frequency resources, which relates to the field of product measurement and control, and is used to improve the utilization rate of test resources and the applicability to different test tasks. The present invention connects the radio frequency signal source on the production line to each workstation via a first optoelectronic link, and each workstation is connected to a spectrum analyzer via a second optoelectronic link. An industrial computer manages the test tasks of each workstation, and a resource control component controls the opening and closing of the relevant first optoelectronic link and the second optoelectronic link according to the test resources required for the test task. The industrial computer calculates the insertion loss value of the attenuator and the compensation gain of the microwave amplifier of the signal receiving terminal based on the tolerance of the test task to the test deviation. The present invention greatly improves the utilization rate of test resources, reduces human resource consumption, and has universal applicability to different test tasks.

Description

Technical Field

[0001] The present invention relates to the technical field of product measurement and control, and in particular to a system and method for dynamically allocating and testing radio frequency resources. Background Art

[0002] With the development of computer technology and testing technology, most large electronic products are able to integrate RF instruments, products to be tested, and computer resources through various buses to form a dedicated automatic test system. The RF instruments (typical instruments such as RF signal sources, spectrum analyzers, etc.) are controlled by computers to test the various performance indicators of the products to be tested, thereby saving human resources and ensuring the consistency of test results.

[0003] Currently, the testing process for large electronic products requires testing resources such as RF signal sources and spectrum analyzers to verify performance indicators. Due to the high procurement cost of these testing resources, it is difficult to equip each workstation with dedicated testing resources. This is especially true for some complex performance indicators, which require multiple RF signal sources to complete. Traditionally, when testing complex indicators, a single workstation would occupy the majority of the production line's testing resources, resulting in low resource utilization. Summary of the Invention

[0004] The purpose of the present invention is to provide a dynamic allocation test system and method for RF resources to address all or part of the above-mentioned problems, so as to flexibly schedule test resources such as RF signal sources and spectrum analyzers at different workstations on the production line, improve the utilization rate of production line test resources, save human resources, and to a certain extent improve the applicability to different test tasks.

[0005] The technical solution adopted in the present invention is as follows:

[0006] A radio frequency resource dynamic allocation test system includes multiple radio frequency signal sources, each of which is connected to a signal combiner corresponding to each test station via a first optoelectronic link; the signal combiner of each test station is connected to the test station via a first signal receiving terminal, and an attenuator is connected between each first signal receiving terminal and the test station; each test station is connected to a spectrum analyzer via a second optoelectronic link; a resource control component is connected to an industrial computer, and according to the resource requirements of the test task provided by the industrial computer, the resource control component performs switching control on each of the first optoelectronic links and the second optoelectronic link, and controls the power compensation of the first optoelectronic link and the second optoelectronic link respectively; the industrial computer determines the insertion loss value of the attenuator when carrying out the test task based on the correlation between the measurement deviation and the insertion loss value of the attenuator.

[0007] Furthermore, the first optoelectronic link includes a first signal transmitting terminal and a signal splitter; the RF signal source is connected to the first signal transmitting terminal, the first signal transmitting terminal is connected to the signal splitter, and each output of the signal splitter is connected to the signal combiner corresponding to each test station via a first signal switch; each of the first signal switches is connected to the resource control component.

[0008] Furthermore, the second optoelectronic link includes a second signal transmitting terminal and a second signal receiving terminal, the test station is connected to the second signal transmitting terminal, the second signal transmitting terminal is connected to the second signal receiving terminal via a second signal switch, the second signal receiving terminal is connected to the spectrum analyzer, and the second signal switch is connected to the resource control component.

[0009] Furthermore, the signal transmitting terminal includes a laser and an electro-optical modulator, the output end of the laser is connected to the carrier signal input end of the electro-optical modulator, the modulation signal input end of the electro-optical modulator is connected to the signal to be transmitted, and the output end of the electro-optical modulator outputs the modulated laser signal.

[0010] Furthermore, the signal receiving terminal includes a photodetector and a microwave amplifier connected in sequence; the microwave amplifier is connected to the resource control component, and the microwave amplifier performs power compensation in response to the digital control signal of the resource control component.

[0011] Furthermore, the measurement deviation includes a receiver sensitivity deviation, and a method for establishing a correlation relationship between the receiver sensitivity deviation and an insertion loss value of an attenuator includes:

[0012] Obtaining the gain G1 and noise figure NF1 of the first optoelectronic link, the gain G2 and noise figure NF2 of the first signal receiving terminal, the gain G3 and noise figure NF3 of the cable + attenuator, and the noise figure NF4 of the microwave front end of the product to be tested;

[0013] The mapping relationship between the receiver sensitivity deviation Err and G3 is constructed according to the following method:

[0014] ,

[0015] In the formula, the function .

[0016] Furthermore, the method for establishing the correlation relationship between the receiver sensitivity deviation and the attenuator insertion loss value further includes:

[0017] Get the gain of the cable;

[0018] Based on the gain of the cable and the mapping relationship between Err and G3, the mapping relationship between Err and the insertion loss value of the attenuator is calculated.

[0019] In another aspect, the present invention further provides a test method based on the above-mentioned radio frequency resource dynamic allocation test system, the test method comprising:

[0020] Connecting the product to be tested on the target test station to the first signal receiving terminal and the second optoelectronic link respectively;

[0021] Using the industrial computer, based on the tolerance of the test task to the measurement deviation and the correlation between the measurement deviation and the insertion loss value of the attenuator, the insertion loss value of the attenuator corresponding to the target test station is obtained;

[0022] Adjusting the insertion loss of the attenuator to the insertion loss value;

[0023] The operating resource control component conducts the first optical-electrical link of the RF signal source required for the test task, and the second optical-electrical link between the target test station and the spectrum analyzer;

[0024] operating the resource control component to perform power compensation on the first optoelectronic link and the second optoelectronic link respectively;

[0025] The spectrum analyzer analyzes the signal received from the second optical-electrical link.

[0026] Furthermore, the spectrum analyzer analyzes the signal received from the second optical-electrical link, including:

[0027] The spectrum analyzer analyzes at least one of frequency, power, bandwidth, and modulation parameters of the signal received from the second optical-electrical link.

[0028] Furthermore, the testing method also includes:

[0029] A report on analysis of the signal received from the second optical-electrical link by the spectrum analyzer is obtained.

[0030] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are:

[0031] The present invention connects the RF signal sources, spectrum analyzers and other test resources at different positions on the production line to each test station respectively, and performs real-time scheduling and on-demand allocation through the resource control component, and realizes multiplexing of the RF signal source through the signal splitter. This changes the traditional mode in which a certain test station occupies test resources for a long time and the deployment requires manual handling. In the system of the present invention, the RF signal source on the production line can cover all stations on the production line, and the RF signal source and spectrum analyzer are deployed through the signal transmission network and signal control network proposed by this system, which changes the mode of manual handling of test resources and greatly improves the utilization rate of production line test resources.

[0032] In addition, the present invention also establishes a correlation between the measurement deviation and the insertion loss value of the attenuator. The insertion loss value actually required by the attenuator can be determined based on the tolerance of different test tasks to the measurement deviation (i.e., the allowable measurement deviation range), thereby reducing the measurement deviation introduced by the first optoelectronic link and improving test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The present invention will now be described by way of example with reference to the accompanying drawings, in which:

[0034] Figure 1 This is a network structure diagram of a radio frequency resource dynamic allocation test system provided in an embodiment of the present application.

[0035] Figure 2 It is a structural diagram of the signal receiving terminal in an embodiment of the present application.

[0036] Figure 3 This is a structural diagram of the radio frequency resource dynamic allocation test system provided in an embodiment of the present application.

[0037] Figure 4 It is a mapping curve diagram of the receiver sensitivity and the “cable + attenuator” gain in the embodiment of the present application.

[0038] Figure 5 Flowchart of the test method provided in the examples of the present application. DETAILED DESCRIPTION

[0039] All features disclosed in this specification, or all steps in the disclosed methods or processes, except mutually exclusive features and / or steps, can be combined in any manner.

[0040] Unless otherwise stated, any feature disclosed in this specification (including any appended claims and abstract) may be replaced by other equivalent or similar features. In other words, unless otherwise stated, each feature is only an example of a series of equivalent or similar features.

[0041] In response to the current phenomenon that large electronic product testing mainly relies on manual handling of test instruments such as RF signal sources and spectrum analyzers, which causes some test resources to be occupied for a long time, resulting in low test resource utilization and high human resource consumption, the embodiments of the present application provide a dynamic allocation test system and method for RF resources, which aims to improve the utilization of production line test resources and is suitable for different test tasks.

[0042] The RF resource dynamic allocation test system provided in the embodiments of the present application includes multiple RF signal sources, each of which is connected to a signal combiner corresponding to each test station via a first optical link. In other words, if a production line includes multiple test stations, there will be multiple signal combiners, with each test station corresponding to a signal combiner. Each RF signal source is connected to each signal combiner via multiple first optical links.

[0043] The first optoelectronic link is responsible for converting the RF signal (electrical signal) emitted by the RF signal source into an optical signal and then transmitting it backward (to the signal combiner).

[0044] Each test station's signal combiner is connected to the test station via a first signal receiving terminal. The first signal receiving terminal converts the optical signal transmitted by the signal combiner into an electrical signal, which is then power-compensated using a microwave amplifier and other methods before being transmitted back to the test station via a cable. An attenuator with a specific gain is connected between each first signal receiving terminal and the test station. Attenuators with different insertion losses have different gains. Each test station is connected to a spectrum analyzer via a second optical-electrical link. The response signal generated by the product under test at the test station, stimulated by the signal transmitted by the first signal receiving terminal, is transmitted via the second optical-electrical link to the spectrum analyzer, which then tests and analyzes the signal transmitted via the second optical-electrical link. The resource control component is connected to an industrial computer, which manages the test tasks for each test station. Different test tasks require different test resources (RF signal sources). Based on the resource requirements of the test tasks provided by the industrial computer, the resource control component switches each first and second optical-electrical link on and off, determining which RF signal sources are connected to each test station and which spectrum analyzer to transmit the response signal to for testing and analysis. The resource control component also controls power compensation for the first and second optical / electrical links, respectively, to compensate for the power attenuation caused by the optical-to-electrical signal conversion when introducing the optical / electrical links for long-distance signal transmission. Based on the correlation between measurement deviation and the attenuator's insertion loss, the industrial computer determines the attenuator's insertion loss during the test task and, therefore, the gain introduced by the attenuator to meet the test task's measurement deviation requirements.

[0045] As an optional embodiment, the first optoelectronic link includes a first signal transmitting terminal and a signal splitter. The first signal transmitting terminal is connected to an RF signal source to convert the RF signal emitted by the RF signal source into an optical signal. The first signal transmitting terminal is connected to the signal splitter to split the optical signal into multiple channels for multiplexing. Each output of the signal splitter is connected to a signal combiner corresponding to each test station via a first signal switch. That is, each RF signal source is connected to a signal combiner at each test station via a signal splitter. Each test station's signal combiner receives the excitation signal from each RF signal source. The first signal switch controls the on / off state between the signal splitter and the signal combiner. Each first signal switch is connected to a resource control component, which determines which RF signal source excitation signals a test station requires. The resource control component turns on the first signal switches corresponding to these excitation signals and turns off the remaining first signal switches. The required excitation signals are determined by the test tasks managed by the industrial computer.

[0046] As an optional embodiment, the second optoelectronic link includes a second signal transmitting terminal and a second signal receiving terminal. The test station is connected to the second signal transmitting terminal, which is then connected to the second signal receiving terminal via a second signal switch. The second signal transmitting terminal converts the response signal generated by the product under test at the test station into an optical signal and transmits it to the second signal receiving terminal. The second signal switch is responsible for opening or closing the link between the second signal transmitting terminal and the second signal receiving terminal. The second signal switch is connected to a resource control component, which controls the switch state. The second signal receiving terminal is connected to a spectrum analyzer, converting the optical signal transmitted by the second signal transmitting terminal into an electrical signal and transmitting it to the spectrum analyzer for testing and analysis. It should be noted that each test station corresponds to a second signal transmitting terminal, but a single second signal receiving terminal can be shared within the same production line. That is, the second signal receiving terminal in each second optoelectronic link can be the same, with the second signal switch determining which second signal transmitting terminal receives the response signal. Of course, if there are more than one spectrum analyzer, the second signal receiving terminals of some second optoelectronic links can be shared, connected to a single spectrum analyzer.

[0047] For example, if Figure 1 As shown in the figure, there are 4 RF signal sources and 1 spectrum analyzer on the production line. The 4 RF signal sources are RF signal source A1, RF signal source B1, RF signal source C1 and RF signal source D1. There are multiple test stations on the production line. Figure 1 Only one test station is used as an example, and the signal transmission links of other stations are designed similarly.

[0048] The four RF signal sources are connected to the four first signal transmitting terminals in a one-to-one correspondence, namely the first signal transmitting terminal A2, the first signal transmitting terminal B2, the first signal transmitting terminal C2 and the first signal transmitting terminal D2. The four first signal transmitting terminals are connected to the four signal splitters in a one-to-one correspondence, namely the signal splitter A3, the signal splitter B3, the signal splitter C3 and the signal splitter D3. Figure 1 Taking the test station shown as an example, four signal splitters are connected to a signal combiner via four first signal switches: first signal switch A4, first signal switch B4, first signal switch C4, and first signal switch D4. The signal combiner is connected to first signal receiving terminal A5, which is the first signal receiving terminal corresponding to this test station.

[0049] In addition, as a transmission link for test signals, the test station is also connected to a second signal transmitting terminal E1, which serves as the second signal transmitting terminal corresponding to the test station. Second signal transmitting terminal E1 is connected to a second signal receiving terminal E3 via a second signal switch E2, which serves as the second signal receiving terminal. Second signal receiving terminal E3 is connected to a spectrum analyzer.

[0050] The first and second signal transmitting terminals have the same structure. As an optional embodiment, the signal transmitting terminals (first and second) include a laser and an electro-optical modulator, acting as an optical transmitter. The laser is connected to the carrier signal input of the electro-optical modulator. The laser generates laser light, which is fed into the electro-optical modulator as a carrier signal. The modulation signal input of the electro-optical modulator receives the signal to be transmitted. For example, for the first signal transmitting terminal, the signal to be transmitted is the excitation signal output by the RF signal source; for the second signal transmitting terminal, the signal to be transmitted is the response signal generated by the product under test. The electro-optical modulator modulates the carrier signal with the signal to be transmitted, and finally outputs the modulated laser signal from the output terminal for transmission to the next stage.

[0051] The structures of the first signal receiving terminal and the second signal receiving terminal are also the same. As an optional implementation, Figure 2 As shown, the signal receiving terminals (first and second signal receiving terminals) consist of a photodetector and a microwave amplifier connected in sequence, forming an optical receiver. The photodetector converts the received optical signal into a radio frequency signal through photoelectric conversion. The microwave amplifier amplifies the radio frequency signal and transmits it to the next stage. For the first signal receiving terminal, the optical signal it receives is the excitation signal transmitted by the signal combiner. For the second signal receiving terminal, the optical signal it receives is the response signal of the product under test transmitted by the second signal transmitting terminal.

[0052] The microwave amplifier is connected to the resource control component and responds to its digital control signals for power compensation. Since the signal power attenuates after the introduction of the signal transmitting and receiving terminals, the resource control component controls the microwave amplifier in the receiving terminal to prevent excessive signal power loss. This compensates for power loss during the conversion between optical and electrical signals. For the first receiving terminal, the compensation value Gx of the microwave amplifier is: Gx = F(L1, L2, L3), where L1 is the RF insertion loss from the RF signal source to the first transmitting terminal, L2 is the RF insertion loss from the first receiving terminal to the test station, and L3 is the insertion loss from the first receiving terminal to the attenuator at the test station. F represents the mapping function between insertion loss and compensation value, which can be fitted based on historical test data. For the second signal receiving terminal, the compensation value Gy of its microwave amplifier is: Gy=F(L4, L5, L6), where L4 is the RF insertion loss from the test station to the second signal transmitting terminal, L5 is the RF insertion loss from the second signal receiving terminal to the spectrum analyzer, and L6 is the insertion loss from the second signal receiving terminal to the spectrum analyzer attenuator.

[0053] Depend on Figure 1 As can be seen from the example, each RF signal source and spectrum analyzer can be set up at different locations on the production line. When each test station needs to use the RF signal source, it does not need to be moved to the test station. In addition, the same RF signal source can be connected to different test stations at the same time. This greatly improves the utilization rate of test resources and saves the human resources required for moving equipment.

[0054] In addition, the test system provided in the embodiment of the present application can calculate the gain required to be introduced according to the allowable range of test deviation for the test tasks arranged at each test station, and change the gain of the RF link by changing the insertion loss of the attenuator or by replacing attenuators with different insertion losses, thereby reducing the measurement deviation caused by the first optoelectronic link.

[0055] As an optional implementation, the measurement deviation includes a receiver sensitivity deviation, that is, the insertion loss value of the attenuator can be determined according to the receiver sensitivity deviation required by the test task.

[0056] like Figure 3 The figure shows the structure of the radio frequency resource dynamic allocation test system in an optional embodiment of the present application. As can be seen from the figure, the test system involves multiple sensitivities, except for the receiver sensitivity. In addition, there is the sensitivity of system 1 (the part of the excitation link except the first photoelectric link, which is the facility included in the traditional test) , the sensitivity of the system 2 (including the entire excitation link of the first optoelectronic link part) of the embodiment of the present application .have:

[0057] ,

[0058] ,

[0059] .

[0060] Where NFx, NFy, and NFz represent the noise figures of the corresponding systems, B represents the bandwidth of the receiver of the product under test, and SNR represents the required signal-to-noise ratio of the product under test. , , The corresponding three systems are in a layer-by-layer inclusion relationship, and the one that finally receives the excitation signal is The corresponding system is the receiver of the product under test, so the values of B and SNR in the above three formulas are the same, which is determined by the bandwidth and signal-to-noise ratio of the specific product under test at the test station. is the value to be evaluated, and its theoretical calculation method is , and usually in actual testing, the calculation method in the embodiment of this application is , the calculation results of the two should be the same, and the difference between the two is the receiving sensitivity deviation.

[0061] Based on the above calculation theory, in some feasible implementations, a method for establishing a correlation between receiver sensitivity deviation and attenuator insertion loss includes:

[0062] Obtain the gain G1 and noise figure NF1 of the first optoelectronic link, the gain G2 and noise figure NF2 of the first signal receiving terminal, the gain G3 and noise figure NF3 of the cable + attenuator, and the noise figure NF4 of the microwave front end of the product to be tested respectively.

[0063] The gain of the first optoelectronic link is the gain of the first signal transmitting terminal plus the first signal switch. The gain of the first signal receiving terminal is the gain of the microwave amplifier. The gain of the cable plus the attenuator is the total gain of the link between the first signal receiving terminal and the test station. The noise figure and gain are inversely proportional. The noise figure of the microwave front-end of the product under test can be determined after the product under test is determined, and is typically 10dB.

[0064] The mapping relationship between the receiver sensitivity deviation Err and G3 is constructed according to the following method:

[0065] .

[0066] In the formula, the function , represents the original value of power. The mapping relationship between Err and G3 is as follows Figure 4 shown.

[0067] The above formula shows that the receiver sensitivity deviation Err is primarily determined by the "cable + attenuator" gain G3 and the microwave front-end noise figure NF4 of the product under test. Once the product under test is determined, NF4 becomes a constant. Therefore, the receiver sensitivity deviation Err is primarily determined by G3, the "cable + attenuator" gain.

[0068] The above mapping relationship can be used as the correlation between the receiver sensitivity deviation and the attenuator insertion loss value. Based on this mapping relationship, when the receiver sensitivity deviation required for the test task is determined, the corresponding G3 can be obtained. G3 is the gain of the cable + attenuator. After the system is set up, the cable gain is determined. The attenuator insertion loss (i.e., gain) can be obtained by combining the cable gain and the required G3.

[0069] Alternatively, based on the mapping relationship between Err and G3, the mapping relationship between the attenuator's insertion loss value and Err can be further calculated. Based on this mapping relationship, the insertion loss value can be directly matched after a given Err, rather than G3, which can further improve test efficiency. Based on this idea, in some optional implementations, the method of establishing the correlation between the receiver sensitivity deviation and the attenuator's insertion loss value also includes:

[0070] Get the gain of the cable;

[0071] Based on the cable gain and the mapping relationship between Err and G3, the mapping relationship between Err and the attenuator's insertion loss is calculated. From the function or curve, the mapping relationship between Err and G3 is shifted left by the cable gain unit.

[0072] By mapping the Err to the attenuator's insertion loss, and using this as the correlation between Err and the attenuator's insertion loss, we can directly match the attenuator's insertion loss to the Err required by the test task (referred to as the receiver sensitivity tolerance). This allows us to adjust the attenuator's insertion loss to the corresponding insertion loss value, or replace the attenuator with the corresponding insertion loss value, to meet the test task requirements. This makes this application applicable to different test tasks.

[0073] On the other hand, the present application provides a test method for the radio frequency resource dynamic allocation test system based on the above embodiment, such as Figure 5 As shown, the method includes the following processes:

[0074] Connect the product under test at the target test station to the first signal receiving terminal and the second photoelectric link, that is, connect the excitation port of the product under test to the RF signal source and the output port to the spectrum analyzer.

[0075] Based on the industrial computer's tolerance for measurement deviation and the correlation between measurement deviation and attenuator insertion loss, the insertion loss value of the attenuator corresponding to the target test station is obtained. For implementations that use the mapping relationship between Err and G3 as the correlation between receiver sensitivity deviation and attenuator insertion loss, G3 is first matched from this mapping relationship, and then the attenuator insertion loss value is calculated based on the cable gain. For implementations that use the mapping relationship between Err and attenuator insertion loss as the correlation between receiver sensitivity deviation and attenuator insertion loss, the attenuator insertion loss value can be directly matched.

[0076] Adjust the insertion loss of the attenuator to the insertion loss value. It should be noted that the so-called adjustment of the insertion loss of the attenuator, in an embodiment using an adjustable attenuator, can directly adjust the insertion loss of the attenuator, while in an embodiment using a fixed attenuator, it means replacing the attenuator with the target insertion loss value.

[0077] The operating resource control component conducts the first photoelectric link of the RF signal source required for the test task, and the second photoelectric link between the target test station and the spectrum analyzer. Figure 1 Taking the embodiment as an example, assuming that the test task of the current test station requires the excitation signals of RF signal source A1, RF signal source B1, and RF signal source C1, the resource control component controls the first signal switch A4, the first signal switch B4, the first signal switch C4 to be turned on, and the second signal switch E2 to be turned on, and controls the first signal switch D4 to be turned off.

[0078] The operating resource control component performs power compensation on the first photoelectric link and the second photoelectric link respectively. Figure 1 For example, the resource control component controls the power compensated by the microwave amplifiers in the first signal receiving terminal A5 and the second signal receiving terminal E3 respectively. The specific method for calculating the compensation value is shown in the above embodiment and will not be repeated here.

[0079] The spectrum analyzer analyzes the signal received from the second optical-electrical link. In some feasible embodiments, the spectrum analyzer analyzes the received signal by analyzing at least one of the following: frequency, power, bandwidth, and modulation parameters. The specific analysis metrics are determined based on the test task and are not an improvement of the present application. Specifically, the metrics analyzed by the spectrum analyzer remain the same as those used in traditional testing methods.

[0080] As an optional implementation, the testing method further includes:

[0081] Obtain a spectrum analyzer report analyzing the signals received from the second optical / electrical link. Summarize and manage these reports to facilitate digital management of the production line.

[0082] The present invention is not limited to the aforementioned specific embodiments, but extends to any new features or any new combination disclosed in this specification, as well as any new method or process steps or any new combination disclosed.

Claims

1. A radio frequency resource dynamic allocation test system, characterized in that: It includes a plurality of radio frequency signal sources, each radio frequency signal source is connected to a signal combiner corresponding to each test station via a first optical-electrical link, wherein the first optical-electrical link includes a first signal transmitting terminal and a signal splitter; The RF signal source is connected to the first signal transmitting terminal, which is connected to the signal splitter. Each output of the signal splitter is connected to a signal combiner corresponding to each test station via a first signal switch. Each first signal switch is connected to a resource control component. The signal combiner of each test station is connected to the test station via a first signal receiving terminal. An attenuator is connected between each first signal receiving terminal and the test station. Each test station is connected to a spectrum analyzer via a second optical fiber link. The second optical fiber link includes a second signal transmitting terminal and a second signal receiving terminal. The test station is connected to the second signal transmitting terminal, which is connected to the second signal receiving terminal via a second signal switch. The second signal receiving terminal is connected to the spectrum analyzer. The second signal switch is connected to the resource control component. The resource control component is connected to an industrial computer and controls the switching of each of the first and second optical fiber links according to the resource requirements of the test task provided by the industrial computer, and controls the power compensation of each of the first and second optical fiber links. The industrial computer determines the insertion loss value of the attenuator when performing the test task based on the correlation between the measurement deviation and the insertion loss value of the attenuator.

2. The radio frequency resource dynamic allocation test system according to claim 1, wherein: The signal transmitting terminal includes a laser and an electro-optical modulator, the output end of the laser is connected to the carrier signal input end of the electro-optical modulator, the modulation signal input end of the electro-optical modulator is connected to the signal to be transmitted, and the output end of the electro-optical modulator outputs the modulated laser signal.

3. The radio frequency resource dynamic allocation test system according to claim 1, wherein: The signal receiving terminal comprises a photoelectric detector and a microwave amplifier which are connected in sequence; the microwave amplifier is connected to the resource control component, and the microwave amplifier performs power compensation in response to a digital control signal of the resource control component.

4. The radio frequency resource dynamic allocation test system according to claim 1, wherein: The measurement deviation includes a receiver sensitivity deviation, and a method for establishing a correlation relationship between the receiver sensitivity deviation and an insertion loss value of an attenuator includes: Obtaining the gain G1 and noise figure NF1 of the first optoelectronic link, the gain G2 and noise figure NF2 of the first signal receiving terminal, the gain G3 and noise figure NF3 of the cable + attenuator, and the noise figure NF4 of the microwave front end of the product to be tested; The mapping relationship between the receiver sensitivity deviation Err and G3 is constructed according to the following method: ， In the formula, the function .

5. The radio frequency resource dynamic allocation test system according to claim 4, wherein: The method for establishing the correlation relationship between the receiver sensitivity deviation and the insertion loss value of the attenuator further includes: Get the gain of the cable; Based on the gain of the cable and the mapping relationship between Err and G3, the mapping relationship between Err and the insertion loss value of the attenuator is calculated.

6. A test method based on the radio frequency resource dynamic allocation test system according to any one of claims 1 to 5, characterized in that: Test methods include: Connecting the product to be tested on the target test station to the first signal receiving terminal and the second optoelectronic link respectively; Using the industrial computer, based on the tolerance of the test task to the measurement deviation and the correlation between the measurement deviation and the insertion loss value of the attenuator, the insertion loss value of the attenuator corresponding to the target test station is obtained; Adjusting the insertion loss of the attenuator to the insertion loss value; The operating resource control component conducts the first optical-electrical link of the RF signal source required for the test task, and the second optical-electrical link between the target test station and the spectrum analyzer; operating the resource control component to perform power compensation on the first optoelectronic link and the second optoelectronic link respectively; The spectrum analyzer analyzes the signal received from the second optical-electrical link.

7. The testing method according to claim 6, wherein: Analyzing, by a spectrum analyzer, a signal received from the second optical-electrical link, including: The spectrum analyzer analyzes at least one of frequency, power, bandwidth, and modulation parameters of the signal received from the second optical-electrical link.

8. The testing method according to claim 6, wherein: The test method also includes: A report on analysis of the signal received from the second optical-electrical link by the spectrum analyzer is obtained.

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