Lighting test fixture

Abstract

The embodiment of the invention provides a lighting test fixture. The lighting test fixture comprises a fixture body; the fixing device is used for fixing a to-be-tested plate which is provided with a light-emitting source. The test tool plate is provided with a photoelectric conversion circuit and an electric signal acquisition circuit, and the photoelectric conversion circuit is used for converting optical signals into electric signals; the electric signal acquisition circuit is connected with the photoelectric conversion circuit and is used for acquiring an electric signal output by the photoelectric conversion circuit; the first end of the light guide piece is connected with the jig body, and the first end is used for being in butt joint with a light emitting source; the second end is butted with the optical input end of the photoelectric conversion circuit; and whether the light-emitting source on the to-be-tested board is normal is determined according to the electric signal on the photoelectric conversion circuit acquired by the electric signal acquisition circuit. The accuracy of LED lamp testing can be improved, and the testing precision is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of server testing, and in particular to a lighting test fixture. Background Art

[0002] To reduce the influence of electromagnetic interference in the server on signal transmission, improve the signal transmission distance, bandwidth, and signal transmission rate, a light-emitting diode (LED) is usually added to the signal transmission link in the hardware settings of the server to convert the electrical signal into an optical signal. To ensure the quality of the entire server and single board, it is necessary to test the added LED lights in the single board test link.

[0003] In the related art, the light of the LED is usually led out to the outer panel through a light guide column, and the light intensity of the LED and whether it is lit are tested by manual visual inspection, visual recognition, or an LED light tester. However, the test method for the LED in the related art has the problem of low test accuracy. Summary of the Invention

[0004] The embodiments of the present application provide a lighting test fixture, which can improve the accuracy of testing the LED and enhance the test precision.

[0005] To achieve the above object, the embodiments of the present application adopt the following technical solutions:

[0006] The embodiments of the present application provide a lighting test fixture, including:

[0007] A fixture body; used to fix the board to be tested, and a light source is provided on the board to be tested;

[0008] A test tool board, provided with a photoelectric conversion circuit and an electrical signal acquisition circuit. The photoelectric conversion circuit is used to convert the optical signal into an electrical signal; the electrical signal acquisition circuit is connected to the photoelectric conversion circuit, and the electrical signal acquisition circuit is used to acquire the electrical signal output by the photoelectric conversion circuit;

[0009] A light guide member, the first end is connected to the fixture body, and the first end is used to dock with the light source; the second end is docked with the optical input end of the photoelectric conversion circuit;

[0010] Determine whether the light source on the board to be tested is normal according to the electrical signal on the photoelectric conversion circuit acquired by the electrical signal acquisition circuit.

[0011] In the embodiments of the present application, by setting an optoelectronic conversion circuit and an electrical signal acquisition circuit on a test tool board, after fixing the board under test to the fixture body, the first end of the light guide member is docked with the light source on the board under test, and the second end of the light guide member is docked with the light input end of the optoelectronic conversion circuit; in this way, the light emitted by the light source can be guided to the light input end of the optoelectronic conversion circuit through the light guide member, the optoelectronic conversion circuit converts the optical signal emitted by the light source into an electrical signal, and the electrical signal acquisition circuit is connected to the optoelectronic conversion circuit, so as to collect the electrical signal generated by the optoelectronic conversion circuit due to the illumination of the light source. In this way, it is possible to determine whether the light source is normal based on the electrical signal collected by the electrical signal acquisition circuit on the optoelectronic conversion circuit. Compared with the method in the related art, in the embodiments of the present application, by converting the optical signal into an electrical signal to test whether the light source is normal, the accuracy and test precision of the light source test are improved, and the test accuracy rate is improved.

[0012] In addition, by converting the optical signal into an electrical signal through the optoelectronic conversion circuit to test whether the light source is normal, full-automatic detection can be performed, and the comprehensiveness of the light source detection is improved. Only the optoelectronic conversion circuit and the electrical signal acquisition circuit need to be arranged on the test tool board, which reduces the occupation of space and saves the test cost.

[0013] In one implementation, the test tool board is provided with a signal transmission interface, and the signal output end of the electrical signal acquisition circuit is connected to the signal transmission interface, and the electrical signal acquisition circuit reports the electrical signal collected on the optoelectronic conversion circuit through the signal transmission interface.

[0014] In the embodiments of the present application, by setting a signal transmission interface on the test tool board, the signal output end of the electrical signal acquisition circuit is connected to the signal transmission interface; in this way, when performing a lighting test on the board under test, the electrical signal acquisition circuit can report the electrical signal collected on the optoelectronic conversion circuit through the signal transmission interface. For example, the electrical signal on the optoelectronic conversion circuit can be reported through wired transmission or wireless transmission, which is convenient for judging whether the light source on the board under test is normal, without manual judgment, and improves the lighting test efficiency and the accuracy of the test result.

[0015] In one implementation, the test tool board is provided with a power supply circuit, and the power supply circuit is connected to the electrical signal acquisition circuit;

[0016] The test tool board is provided with a power supply interface, the power supply circuit is connected to the power supply interface, and the power supply circuit is used to provide working power for the electrical signal acquisition circuit.

[0017] In the embodiment of the present application, a power supply circuit is arranged on the test tool board. The power supply circuit is connected to the electrical signal acquisition circuit, and a power supply interface is arranged on the test tool board. In this way, when it is necessary to perform a lighting test on the board under test, the electrical signal acquisition circuit can be powered through the power supply interface and the power supply circuit connected to the power supply interface, ensuring the power required for the normal operation of the electrical signal acquisition circuit and facilitating the electrical signal acquisition circuit to collect the electrical signals on the optoelectronic conversion circuit.

[0018] In one implementation, the optoelectronic conversion circuit is connected between the electrical signal acquisition circuit and the power supply circuit; the power supply circuit includes:

[0019] A protection component is connected to the power supply input end of the electrical signal acquisition circuit, and the optoelectronic conversion circuit is connected between the protection component and the electrical signal acquisition circuit.

[0020] In the embodiment of the present application, by arranging a protection component in the power supply circuit, the protection component is connected to the power supply input end of the electrical signal acquisition circuit, and the optoelectronic conversion circuit is connected between the protection component and the electrical signal acquisition circuit; in this way, when performing a lighting test on the board under test, the light emitted by the light source on the board under test is guided by the light guide member to irradiate the optoelectronic conversion circuit. The optoelectronic conversion circuit generates an electrical signal under light irradiation, and the protection circuit can protect the power supply circuit and the electrical signal acquisition circuit, improving the stability of the electrical signal acquisition circuit for collecting the electrical signals converted by the optoelectronic conversion circuit and enhancing the accuracy of the lighting test.

[0021] In one implementation, the protection component includes any one of an overvoltage protection component and an overcurrent protection component.

[0022] By arranging any one of an overvoltage protection component and an overcurrent protection component in the power supply circuit, any one of the overvoltage protection component and the overcurrent protection component is connected in series with the electrical signal acquisition circuit, and any one of the overvoltage protection component and the overcurrent protection component can play a role in voltage division and current limiting, effectively protecting the electrical signal acquisition circuit. In addition, when a short circuit or an abnormal increase in current occurs in the power supply circuit, any one of the overvoltage protection component and the overcurrent protection component can be melted due to power overload, thereby cutting off the connection between the power supply circuit, the electrical signal acquisition circuit, and the optoelectronic conversion circuit, protecting the electrical signal acquisition circuit and the optoelectronic conversion circuit from being damaged.

[0023] In addition, in the embodiment of the present application, by arranging any one of an overvoltage protection component and an overcurrent protection component at the power supply input end of the electrical signal acquisition circuit, when performing a lighting test on the board under test, any one of the overvoltage protection component and the overcurrent protection component can suppress or filter out the interference signals received by the electrical signal acquisition circuit when collecting the electrical signals on the optoelectronic conversion circuit, improving the accuracy of the electrical signal acquisition circuit for collecting electrical signals, that is, improving the accuracy of the lighting test on the board under test.

[0024] In one implementation, the optoelectronic conversion circuit includes an optoelectronic conversion element, and the second end is butted against the photosensitive surface of the optoelectronic conversion element.

[0025] In the embodiments of the present application, the light emitted by the light source on the to-be-tested board is optoelectronically converted by the optoelectronic conversion element, which facilitates the butting of the light guide member against the photosensitive surface of the optoelectronic conversion circuit, and improves the efficiency of the lighting test on the to-be-tested board.

[0026] In one implementation, the optoelectronic conversion element includes a plurality of optoelectronic conversion elements, and the plurality of optoelectronic conversion elements are connected in parallel to the acquisition input end of the electrical signal acquisition circuit.

[0027] In the embodiments of the present application, by providing a plurality of optoelectronic conversion elements, in this way, a plurality of light guide members can be butted against a plurality of light sources on the to-be-tested board, and the plurality of light sources on the to-be-tested board can be quickly subjected to a lighting test, improving the efficiency of the lighting test on the to-be-tested board.

[0028] In one implementation, the optoelectronic conversion circuit has a first grounding end, and the first grounding end is grounded; the third ends of the plurality of optoelectronic conversion elements are connected in parallel to the first grounding end;

[0029] The electrical signal acquisition circuit includes a voltage acquisition circuit. The voltage acquisition circuit has a second grounding end, and the second grounding end is grounded. The voltage acquisition circuit is used to acquire the voltage signal of the optoelectronic conversion element.

[0030] In the embodiments of the present application, by grounding the first grounding end of the optoelectronic conversion circuit and connecting the third ends of the plurality of optoelectronic conversion elements in parallel to the first grounding end, in this way, the plurality of optoelectronic conversion elements can be grounded; the second grounding end of the electrical signal acquisition circuit is grounded, in this way, the electrical signal acquisition circuit is connected to both ends of the optoelectronic conversion circuit, in this way, the voltage acquisition circuit can be used as the electrical signal acquisition circuit, and the voltage value at both ends of the optoelectronic conversion circuit can be acquired, which is convenient for determining the lighting condition and lighting intensity of the light source through the voltage value of the optoelectronic conversion circuit, is beneficial to accurately determining the lighting state of the light source on the to-be-tested board, and improves the accuracy of the lighting test.

[0031] In one implementation, when the voltage value of the optoelectronic conversion element acquired by the voltage acquisition circuit is within the preset voltage threshold range, it is determined that the light source on the to-be-tested board is normal.

[0032] In one implementation, the lighting test jig further includes:

[0033] A test tool box body, a test tool board is arranged in the test tool box body. The test tool box body is provided with an orientation structure, and the orientation structure is aligned with the light input end of the optoelectronic conversion circuit. The second end penetrates through the orientation structure to be butted against the optoelectronic conversion circuit through the orientation structure for orientation.

[0034] In the embodiments of the present application, by disposing the test tool board inside the test tool box body, in this way, a stable test environment can be provided by the test tool, the accuracy of the electrical signal acquisition circuit for acquiring electrical signals can be ensured, and the accuracy of the lighting test on the light source of the board under test is improved.

[0035] In addition, a directional structure is provided in the test tool box body. In this way, the second end of the light guide member can be directionally docked with the photoelectric conversion circuit through the directional structure, which is convenient for the second end to be docked with the light input end of the photoelectric conversion circuit, and can effectively improve the accuracy of the photoelectric conversion circuit to accurately convert the light signal emitted by the light source into an electrical signal, and improve the accuracy of the lighting test on the board under test.

[0036] In one implementation, the test tool box body is provided with a through hole that penetrates the inner and outer surfaces of the test tool box body;

[0037] The directional structure includes:

[0038] A directional bushing, the shaft hole of the directional bushing is coaxial with the through hole, the shaft hole is coaxially aligned with the light input end of the photoelectric conversion circuit, and the light guide member is inserted into the shaft hole.

[0039] In the embodiments of the present application, by providing a through hole in the test tool box body and inserting a directional bushing into the through hole. The directional bushing can be coaxially aligned with the light input end of the photoelectric conversion circuit. In this way, after the second end of the light guide member is inserted into the directional bushing, the directional bushing can orient the second end, so that the second end is coaxially aligned with the light input end of the photoelectric conversion circuit, which is convenient for the second end to be docked with the light input end of the photoelectric conversion circuit, and improves the accuracy of the lighting test on the board under test.

[0040] In one implementation, the fourth end of the directional bushing extends towards the light input end of the photoelectric conversion circuit to coaxially orient the light guide member and the light input end of the photoelectric conversion circuit;

[0041] The fifth end of the directional bushing extends outside the test tool box body, and a plurality of notches are axially formed in the fifth end;

[0042] The directional structure further includes:

[0043] A locking member, sleeved on the fifth end, the locking member is threadedly connected to the fifth end, and the locking member is used to reduce the notch so that the fifth end locks the light guide member.

[0044] In the embodiment of the present application, by extending the fourth end of the directional bushing towards the light input end of the photoelectric conversion circuit, in this way, after the second end of the light guide member is inserted through the directional bushing, the second end can extend towards the light input end of the photoelectric conversion circuit through the fourth end of the directional bushing, which can increase the contact area between the directional bushing and the second end, thereby improving the stability of the orientation of the second end, and improving the stability of the axial alignment between the second end and the light input end of the photoelectric conversion circuit, that is, it can improve the accuracy of the photoelectric conversion circuit in converting optical signals into electrical signals.

[0045] In addition, extend the fifth end of the directional bushing outside the test tool box body, and axially open a plurality of slits at the fifth end. In this way, when the second end of the light guide member is inserted into the fifth end, due to the plurality of slits axially opened at the fifth end, the second end of the light guide member can radially outwardly squeeze the bushing wall at the fifth end, so that the fifth end expands outward, facilitating the insertion of the second end of the light guide member into the bushing.

[0046] In addition, in the embodiment of the present application, by sleeving a locking member at the fifth end, the locking member is threadedly connected to the fifth end; after the second end of the light guide member is inserted into the bushing, the threaded connection between the locking member and the fifth end can be used to reduce the slits at the fifth end, and the bushing wall at the fifth end holds the peripheral wall of the second end, thereby locking and fixing the second end in the bushing, facilitating the directional fixing of the light guide member, and improving the efficiency of the lighting test of the light source on the test plate. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 is an overall structural schematic diagram of a lighting test fixture provided by an embodiment of the present application;

[0048] Figure 2 is a circuit structure diagram on a test tool plate in the lighting test fixture provided by an embodiment of the present application;

[0049] Figure 3 is another circuit structure diagram on a test tool plate in the lighting test fixture provided by an embodiment of the present application;

[0050] Figure 4 is yet another circuit structure diagram on a test tool plate in the lighting test fixture provided by an embodiment of the present application;

[0051] Figure 5 is another overall structural schematic diagram of the lighting test fixture provided by an embodiment of the present application;

[0052] Figure 6 is a top view of the test tool box body in the lighting test fixture provided by an embodiment of the present application;

[0053] Figure 7 is Figure 6 a partial enlarged view of part A in

[0054] Figure 8 is a sectional view along Figure 6 section line B-B in it;

[0055] Figure 9 is Figure 8 a partial enlarged view at position C in it.

[0056] Explanation of reference numerals:

[0057] 20 - test board;

[0058] 100 - fixture body; 200 - test tool board; 300 - light guide member; 400 - test tool box body;

[0059] 201 - light source; 210 - photoelectric conversion circuit; 220 - electrical signal acquisition circuit; 230 - signal transmission interface; 240 - power supply circuit; 310 - first end; 320 - second end; 410 - orientation structure; 420 - through hole;

[0060] 211 - light input end; 212 - photoelectric conversion element; 213 - first grounding end; 221 - voltage acquisition circuit; 241 - power supply interface; 242 - protection element; 411 - orientation bushing; 412 - locking member;

[0061] 2121 - third end; 2211 - second grounding end; 4111 - fourth end; 4112 - fifth end. Specific embodiments

[0062] Next, the technical solutions in the embodiments of the present application will be described with reference to the accompanying drawings in the embodiments of the present application. For the convenience of clearly describing the technical solutions in the embodiments of the present application, the first, second, etc. descriptions that appear in the embodiments of the present application are only for schematic and distinguishing the description objects, without order, and do not represent a special limitation on the number of devices in the embodiments of the present application, and cannot constitute any limitation to the embodiments of the present application.

[0063] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0064] It should be noted that many specific details are set forth in the following description to facilitate a full understanding of the present application. However, the present application may also be implemented in other ways different from those described herein. Therefore, the scope of protection of the present application is not limited by the specific embodiments disclosed below.

[0065] In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", "horizontal", "bottom", "inner", "outer" (if any) etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present application. In the present application, unless otherwise clearly specified and defined, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium.

[0066] In the present application, unless otherwise clearly specified and defined, the terms "connected", "connected to", "fixed" etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be directly connected, or indirectly connected through an intermediate medium, and may be the communication inside two elements or the interaction relationship between two elements. However, indicating a direct connection means that there is no connection relationship constructed through an excessive structure between the two connected main bodies, and they are only connected through the connection structure to form a whole. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0067] In the present application, descriptions such as "first", "second" etc. are only for descriptive purposes and should not be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first", "second" may explicitly or implicitly include at least one such feature.

[0068] Figure 1 is an overall structural schematic diagram of a lighting test fixture provided by an embodiment of the present application. Figure 2 is a circuit structure diagram on a test tool board in the lighting test fixture provided by an embodiment of the present application.

[0069] Regarding the problem of low accuracy in lighting tests for server single boards in related technologies, referring to Figure 1 as shown, some examples of embodiments of the present application provide a lighting test fixture. The lighting test fixture may include a fixture body 100.

[0070] In some examples, when performing a lighting test on the board under test 20, the board under test 20 can be placed on the fixture body 100 for fixation.

[0071] In some examples, the fixture body 100 may include a support frame. The support frame may have a positioning groove that matches the contour of the board under test 20. The board under test 20 may be placed and fixed within the positioning groove.

[0072] In some examples, the support frame may be provided with vacuum suction holes. After the board under test 20 is placed on the support frame, the board under test 20 can be adsorbed and fixed to the support frame by evacuating the vacuum suction holes.

[0073] In some examples, the support frame may be provided with magnetic fixing blocks. After the board under test 20 is placed on the support frame, the board under test 20 can be magnetically fixed by the magnetic fixing blocks.

[0074] In some examples, the support frame may be provided with a clamping mechanism. After the board under test 20 is placed on the support frame, the board under test 20 can be clamped by the clamping mechanism, thereby fixing the board under test 20.

[0075] In some examples, the support frame may be provided with a pneumatic pressing mechanism. After the board under test 20 is placed on the support frame, the board under test 20 can be pressed and fixed by the pneumatic pressing mechanism.

[0076] In some examples, the support frame may be provided with electric grippers. After the board under test 20 is placed on the support frame, the board under test 20 can be fixed by the electric grippers.

[0077] In some examples, the fixture body 100 may be the same as, similar to, or like the test fixtures in the related art, mainly serving to fix the board under test 20. For specific details, reference may be made to the detailed description in the related art, and the embodiments of the present application will not elaborate further on this.

[0078] In some examples, a light source 201 may be provided on the board under test 20.

[0079] In some examples, the light source 201 may emit light of different colors and intensities.

[0080] In some examples, the light source 201 may be an LED lamp.

[0081] In some examples, the light source 201 may be a laser diode (abbreviated as LD).

[0082] It can be understood that in some examples of the embodiments of the present application, the specific type of the light source 201 is only shown as some specific examples and does not limit the specific type of the light source 201. In other examples, the light source 201 may also be other types of light sources.

[0083] In some examples, referring to Figure 1As shown, the lighting test fixture may include a test tool board 200.

[0084] In some examples, the test tool board 200 may be disposed on the fixture body 100. That is to say, the test tool board 200 may be fixed on the fixture body 100.

[0085] In some examples, the test tool board 200 may be separately disposed from the fixture body 100. That is to say, the test tool board 200 may be separated from the fixture body 100. For example, the test tool board 200 may be disposed at other parts outside the fixture body 100. In the embodiments of the present application, the connection relationship and the positional relationship between the test tool body and the fixture body 100 are not limited.

[0086] In some examples, referring to Figure 2 As shown, a photoelectric conversion circuit 210 may be provided on the test tool board 200.

[0087] In some examples, the test tool board 200 may be an integrated circuit board. The photoelectric conversion circuit 210 may be integrated on the test tool board 200. In some examples, the test tool board 200 may be a printed circuit board (PCB for short). The photoelectric conversion circuit 210 may be printed on the test tool board 200.

[0088] In some examples, the photoelectric conversion circuit 210 may convert an optical signal into an electrical signal. For example, when the light emitted by the light source 201 irradiates the light input end 211 of the photoelectric conversion circuit 210, the photoelectric conversion circuit 210 may convert the light emitted by the light source 201 into an electrical signal.

[0089] In some examples, referring to Figure 2 As shown, an electrical signal acquisition circuit 220 may be provided on the test tool board 200. The electrical signal acquisition circuit 220 may be connected to the photoelectric conversion circuit 210.

[0090] In some examples, after the light emitted by the light source 201 irradiates the photoelectric conversion circuit 210, the photoelectric conversion circuit 210 generates a current and a voltage under the photoelectric effect.

[0091] In some examples, the electrical signal acquisition circuit 220 may acquire the current on the photoelectric conversion circuit 210.

[0092] In some examples, the electrical signal acquisition circuit 220 may acquire the voltage on the photoelectric conversion circuit 210.

[0093] In some examples, the electrical signal acquisition circuit 220 may include an analog-to-digital converter (ADC for short). After the electrical signal acquisition circuit 220 acquires the analog electrical signal of the photoelectric conversion circuit 210, the ADC can digitalize the analog signal, which is convenient for judging the light-emitting condition of the light source 201.

[0094] In some examples, referring to Figure 1 and Figure 2 as shown, the lighting test fixture may include a light guide member 300.

[0095] In some examples, the first end 310 of the light guide member 300 may be connected to the fixture body 100.

[0096] In some examples, after the board under test 20 is fixed to the fixture body 100, the first end 310 may be docked with the light source 201.

[0097] In some examples, the first end 310 may be connected to the fixture body 100 through a snap structure.

[0098] In some examples, the first end 310 may be connected to the fixture body 100 by means of screw threading.

[0099] In some examples, the first end 310 may be connected to the fixture body 100 through a magnetic interface.

[0100] In some examples, the fixture body 100 may be provided with a waveguide plate (not shown in the figure). The waveguide plate may be provided with through holes. The first end 310 may pass through the through holes.

[0101] In some examples, after the first end 310 passes through the through holes, the first end 310 may be fixed in the through holes by means of adhesion.

[0102] In some examples, the light source 201 on the board under test 20 may be axially aligned with the through holes on the waveguide plate. For example, the position of the board under test 20 on the fixture body 100 may be adjusted by the pneumatic pressing mechanism described in detail in the foregoing embodiments of the present application, so that the light source 201 is axially aligned with the through holes on the waveguide plate. Or, the position of the board under test 20 on the fixture body 100 may be adjusted by the electric gripper described in detail in the foregoing embodiments of the present application, so that the light source 201 is axially aligned with the through holes on the waveguide plate. This improves the alignment accuracy between the light source 201 and the first end 310 of the light guide member 300, which is beneficial to improving the accuracy of the lighting test of the light source 201.

[0103] In some examples, the second end 320 of the light guide member 300 may be docked with the light input end 211 of the photoelectric conversion circuit 210.

[0104] In some examples, the docking manner of the second end 320 with the photoelectric conversion circuit 210 may be the same as, similar to, or close to the docking manner of the first end 310 with the light source 201 in the foregoing embodiments of the present application.

[0105] In some examples, the second end 320 may be docked with the optical input end 211 of the photoelectric conversion circuit 210 by using a standard optical interface.

[0106] In some examples, the light guiding member 300 may be any one of a quartz optical fiber, a polymer optical fiber, or a hollow photonic crystal fiber.

[0107] In some examples, an antireflection layer may be provided on the inner wall of the light guiding member 300, which can reduce the light energy loss during the total reflection process.

[0108] In some examples, when performing a lighting test on the test board 20, the test board 20 may be placed on the fixture body 100, the test board 20 may be docked with the electrical signal interface on the test fixture, and the light source 201 on the test board 20 may be controlled to be aligned with the first end 310 of the light guiding member 300. Then, the light source 201 on the test board 20 is controlled to be lit by the fixture body 100, and the light emitted by the lit light source 201 enters the first end 310 of the light guiding member 300, propagates along the light guiding member 300, and irradiates the optical input end 211 of the photoelectric conversion circuit 210 from the second end 320.

[0109] In some examples, after the light emitted by the light source 201 irradiates the photoelectric conversion circuit 210, the photoelectric conversion circuit 210 generates a photoelectric effect, thereby generating current and voltage. The electrical signal acquisition circuit 220 may acquire at least one of the current or voltage generated on the photoelectric conversion circuit 210, so as to determine whether the light source 201 emits light normally.

[0110] In some examples, the electrical signal acquisition circuit 220 may include a microcontroller unit (MCU for short).

[0111] In some examples, the MCU may determine whether the light source 201 is normal based on the electrical signal generated by the photoelectric conversion circuit 210 acquired through the photoelectric acquisition circuit. For example, it may be determined whether the light emission intensity of the light source 201 is normal, whether the lighting condition of the light source 201 is normal, etc.

[0112] In some examples, the MCU may report or output the judgment result.

[0113] In some examples, the electrical signal acquisition circuit 220 may report the electrical signal acquired from the photoelectric conversion circuit 210 to the host computer, and the host computer determines whether the light source 201 is normal based on the electrical signal acquired by the electrical signal acquisition circuit 220.

[0114] In the embodiments of the present application, by arranging a photoelectric conversion circuit 210 and an electrical signal acquisition circuit 220 on a test tool board 200, after fixing a board under test 20 to a fixture body 100, the first end 310 of a light guide member 300 is docked with a light source 201 on the board under test 20, and the second end 320 of the light guide member 300 is docked with a light input end 211 of the photoelectric conversion circuit 210; in this way, the light emitted by the light source 201 can be guided to the light input end 211 of the photoelectric conversion circuit 210 through the light guide member 300, the photoelectric conversion circuit 210 converts the optical signal emitted by the light source 201 into an electrical signal, and the electrical signal acquisition circuit 220 is connected to the photoelectric conversion circuit 210, so as to acquire the electrical signal generated by the photoelectric conversion circuit 210 due to the illumination of the light source 201. In this way, it is possible to determine whether the light source 201 is normal based on the electrical signal acquired on the photoelectric conversion circuit 210. Compared with the method in the related art, in the embodiments of the present application, by converting the optical signal into an electrical signal to test whether the light source 201 is normal, the accuracy and precision of the test of the light source 201 are improved, and the test accuracy rate is increased.

[0115] In addition, by converting the optical signal into an electrical signal through the photoelectric conversion circuit 210 to test whether the light source 201 is normal, full-automatic detection can be performed, and the comprehensiveness of the detection of the light source 201 is improved. Only by arranging the photoelectric conversion circuit 210 and the electrical signal acquisition circuit 220 on the test tool board 200, the space occupation is reduced, and the test cost is saved.

[0116] Figure 3 It is another circuit structure diagram on the test tool board in the lighting test fixture provided by the embodiments of the present application.

[0117] In some examples, with reference to Figure 3 as shown, the test tool board 200 may be provided with a signal transmission interface 230. The signal transmission interface 230 may be connected to a signal output end of the electrical signal acquisition circuit 220.

[0118] In some examples, the signal output end of the electrical signal acquisition circuit 220 may be connected to the signal transmission interface 230 by routing on the test tool board 200.

[0119] In some examples, the signal output end of the electrical signal acquisition circuit 220 may be connected to the signal transmission interface 230 by means of a flexible circuit ribbon cable.

[0120] In some examples, the signal output end of the electrical signal acquisition circuit 220 may be connected to the signal transmission interface 230 by means of a gold wire bonding lead.

[0121] It can be understood that in some examples of the embodiments of the present application, the connection manner between the signal output end of the electrical signal acquisition circuit 220 and the signal transmission interface 230 is only shown as some specific examples, and is not a limitation on the connection manner between the electrical signal acquisition circuit 220 and the signal transmission interface 230. In some examples, the signal output end of the electrical signal acquisition circuit 220 can also be connected to the signal transmission interface 230 in other ways.

[0122] In some examples, the signal transmission interface 230 can include one of a data communication interface and an I / O port.

[0123] In some examples, the signal transmission interface 230 can include a wired transmission interface. For example, the signal transmission interface 230 can include a universal serial bus (USB), an RJ45 Ethernet port, an HDMI digital interface, etc.

[0124] In some examples, the signal transmission interface 230 can include a wireless transmission interface. For example, it can include a wireless network communication technology (wifi) interface or a Bluetooth interface, etc.

[0125] It can be understood that in some examples of the embodiments of the present application, the specific type of the signal transmission interface 230 is only shown as some specific examples, and is not a limitation on the specific type of the signal transmission interface 230.

[0126] In some examples, the electrical signal acquisition circuit 220 can report the electrical signal collected on the photoelectric conversion circuit 210 through the signal transmission interface 230.

[0127] In some examples, the electrical signal acquisition circuit 220 can report the collected electrical signal to the host computer through the signal transmission interface 230.

[0128] In some examples, the host computer can be a control system on the jig body 100.

[0129] In some examples, the host computer can be other control systems.

[0130] In some examples, the reported electrical signal can be judged by the host computer to determine whether the light source 201 is normal.

[0131] In the embodiments of the present application, by setting a signal transmission interface 230 on the test tool board 200, the signal output end of the electrical signal acquisition circuit 220 is connected to the signal transmission interface 230; thus, when performing a lighting test on the board under test 20, the electrical signal acquisition circuit 220 can report the electrical signals on the optoelectronic conversion circuit 210 collected through the signal transmission interface 230. For example, the electrical signals on the optoelectronic conversion circuit 210 can be reported through wired transmission or wireless transmission, which facilitates the judgment of whether the light source 201 on the board under test 20 is normal, eliminates the need for manual judgment, and improves the efficiency of the lighting test and the accuracy of the test results.

[0132] In some examples, as referred to Figure 3 as described, the test tool board 200 may be provided with a power supply circuit 240. The power supply circuit 240 may be connected to the electrical signal acquisition circuit 220.

[0133] In some examples, the power supply circuit 240 may be printed on the test tool board 200. The power supply circuit 240 may be connected to the electrical signal acquisition circuit 220 in a common ground connection.

[0134] In some examples, the power supply circuit 240 may provide a 3.3V operating voltage to the electrical signal acquisition circuit 220.

[0135] In some examples, the power supply circuit 240 may provide a 5V operating voltage to the electrical signal acquisition circuit 220.

[0136] It can be understood that in some examples of the embodiments of the present application, the operating voltage provided by the power supply circuit 240 to the electrical signal acquisition circuit 220 can be set according to the specific electrical signal acquisition circuit 220, and the embodiments of the present application do not limit this.

[0137] In some examples, as referred to Figure 3 as shown, the test tool board 200 may be provided with a power supply interface 241, and the power supply interface 241 may be connected to the power supply circuit 240.

[0138] In some examples, the power supply interface 241 may be connected to an external circuit, so as to supply power to the electrical signal acquisition circuit 220 through the external circuit.

[0139] In some examples, the power supply interface 241 may be connected to the fixture main body. That is to say, in some examples of the embodiments of the present application, the electrical signal acquisition circuit 220 can be powered through the fixture main body.

[0140] In an embodiment of the present application, a power supply circuit 240 is provided on a test tool board 200. The power supply circuit 240 is connected to an electrical signal acquisition circuit 220, and a power supply interface 241 is provided on the test tool board 200. In this way, when it is necessary to perform a lighting test on the board under test 20, the electrical signal acquisition circuit 220 can be powered through the power supply interface 241 and the power supply circuit 240 connected to the power supply interface 241, ensuring the power required for the normal operation of the electrical signal acquisition circuit 220 and facilitating the electrical signal acquisition circuit 220 to collect electrical signals on the photoelectric conversion circuit 210.

[0141] In some examples, the photoelectric conversion circuit 210 can be connected between the electrical signal acquisition circuit 220 and the power supply circuit 240.

[0142] In some examples, the electrical signal output terminal of the photoelectric conversion circuit 210 can be connected between the electrical signal acquisition circuit 220 and the power supply circuit 240.

[0143] In some examples, the power supply circuit 240 supplies working power to the electrical signal acquisition circuit 220. When performing a lighting test on the light source 201 of the board under test 20, the fixture body can control the light source 201 on the board under test 20 to light up. The light emitted by the lit light source 201 irradiates the photoelectric conversion circuit 210 through the light guide member 300. The photoelectric conversion circuit 210 generates voltage and current due to the photoelectric effect. The voltage and current of the photoelectric conversion circuit 210 act on the electrical signal acquisition circuit 220 and are collected by the electrical signal acquisition circuit 220.

[0144] In some examples, the power supply circuit 240 can include a protection element 242. The protection element 242 can be connected to the power supply input terminal of the electrical signal acquisition circuit 220. The photoelectric conversion circuit 210 is connected between the protection element 242 and the electrical signal acquisition circuit 220.

[0145] In some examples, by providing a protection element 242 in the power supply circuit 240. The photoelectric conversion circuit 210 is connected between the protection element 242 and the electrical signal acquisition circuit 220. In this way, the protection element 242 is in series with the electrical signal acquisition circuit 220 and the photoelectric conversion circuit 210, and the protection element 242 can play a voltage dividing role, capable of reducing the voltage acting on the electrical signal acquisition circuit 220 and the photoelectric conversion circuit 210, and effectively protecting the electrical signal acquisition circuit 220.

[0146] In the embodiments of the present application, by providing a protection component 242 in the power supply circuit 240, the protection component 242 is connected to the power supply input end of the electrical signal acquisition circuit 220, and the photoelectric conversion circuit 210 is connected between the protection component 242 and the electrical signal acquisition circuit 220; thus, when performing a lighting test on the test board 20, the light emitted by the light source 201 on the test board 20 is guided by the light guide member 300 to irradiate the photoelectric conversion circuit 210, and the photoelectric conversion circuit 210 generates an electrical signal under light irradiation. The protection circuit can protect the power supply circuit 240 and the electrical signal acquisition circuit 220, and can improve the stability of the electrical signal acquisition circuit 220 for acquiring the electrical signal converted by the photoelectric conversion circuit 210, and improve the accuracy of the lighting test.

[0147] In some examples, the protection component 242 may include any one of an overvoltage protection component 242 and an overcurrent protection component 242.

[0148] In some examples, the overvoltage protection component 242 can suppress impacts such as voltage spikes and surges, and can prevent the electrical signal acquisition circuit 220 from being damaged due to overvoltage.

[0149] In some examples, the overvoltage protection component 242 may include any one of a varistor, a transient suppression diode, an electrostatic discharge diode, a ceramic gas discharge tube, a semiconductor discharge tube, or a glass discharge tube.

[0150] In some examples, the overcurrent protection component 242 can prevent the circuit from being damaged due to short - circuit or overload current.

[0151] In some examples, the overcurrent protection component 242 may include any one of a fuse, a thermal fuse, and a self - resetting fuse.

[0152] It can be understood that in some examples of the embodiments of the present application, the specific type of the protection component 242 is only shown as some specific examples, and does not limit the specific type of the protection component 242. In other examples, the protection component 242 may also be other types of components.

[0153] In the embodiment of the present application, by providing any one of an overvoltage protection element 242 and an overcurrent protection element 242 in the power supply circuit 240, any one of the overvoltage protection element 242 and the overcurrent protection element 242 is connected in series with the electrical signal acquisition circuit 220, and any one of the overvoltage protection element 242 and the overcurrent protection element 242 can play the role of voltage division and current limiting, and can effectively protect the electrical signal acquisition circuit 220. In addition, when a short circuit occurs in the power supply circuit 240 or the current increases abnormally, any one of the overvoltage protection element 242 and the overcurrent protection element 242 can cause power overload and fuse, thereby cutting off the connection between the power supply circuit 240 and the electrical signal acquisition circuit 220 and the photoelectric conversion circuit 210, so as to protect the electrical signal acquisition circuit 220 and the photoelectric conversion circuit 210 from being damaged.

[0154] In addition, in the embodiment of the present application, any one of the overvoltage protection element 242 and the overcurrent protection element 242 is set at the power supply input end of the electrical signal acquisition circuit 220. When the lighting test is performed on the board to be tested 20, any one of the overvoltage protection element 242 and the overcurrent protection element 242 can suppress or filter out the interference signal received by the electrical signal acquisition circuit 220 when collecting the electrical signal on the photoelectric conversion circuit 210, which can improve the accuracy of the electrical signal acquisition circuit 220 in collecting the electrical signal, that is, the accuracy of the lighting test of the board to be tested 20 can be improved.

[0155] For some examples, refer to Figure 2 and Figure 3 As shown, the photoelectric conversion circuit 210 may include a photoelectric conversion element 212 .

[0156] In some examples, the second end 320 of the light guide 300 may be in contact with the photosensitive surface of the photoelectric conversion element 212 .

[0157] In some examples, the photoelectric conversion element 212 may include any one of a phototube, a photomultiplier tube, a photoresistor, a photodiode, a phototransistor, a phototransistor, and a photocoupler.

[0158] It can be understood that in the embodiment of the present application, the specific types of the photoelectric conversion elements 212 are only shown as some specific examples, and the specific types of the photoelectric conversion elements 212 are not limited.

[0159] In the embodiment of the present application, the light emitted by the light source 201 on the board under test 20 is photoelectrically converted by the photoelectric conversion element 212, which facilitates the connection between the light guide 300 and the photosensitive surface of the photoelectric conversion circuit 210, thereby improving the efficiency of the lighting test of the board under test 20.

[0160] For some examples, refer to Figure 2 and Figure 3As shown, there can be multiple photoelectric conversion elements 212.

[0161] Figure 4 It is another circuit structure diagram on the test tool board in the lighting test fixture provided by the embodiments of the present application.

[0162] In some examples, referring to Figure 4 As shown, there can be multiple electric signal acquisition circuits 220.

[0163] In some examples, one photoelectric conversion element 212 is connected to one electric signal acquisition circuit 220. That is to say, the number of photoelectric conversion elements 212 and electric signal acquisition circuits 220 can be the same. The photoelectric conversion elements 212 and the electric signal acquisition circuits 220 are in one-to-one correspondence. In this way, the lighting tests of multiple light sources 201 on the board under test 20 can be carried out simultaneously, improving the efficiency of the lighting test of the light sources 201 on the board under test 20.

[0164] In some examples, referring to Figure 2 and Figure 3 As shown, there can be one electric signal acquisition circuit 220.

[0165] In some examples, multiple photoelectric conversion elements 212 can be connected in parallel to the acquisition input end of the electric signal acquisition circuit 220.

[0166] In some examples, when performing a lighting test on the light source 201 on the board under test 20, the light source 201 on the board under test 20 can be controlled by the fixture body to be lit in sequence, and the electric signal acquisition circuit 220 can sequentially acquire the electric signals generated by the photoelectric conversion elements 212 corresponding to each light source 201, so as to sequentially determine whether each light source 201 is normal.

[0167] In the embodiments of the present application, by setting multiple photoelectric conversion elements 212, in this way, through multiple light guiding members 300 to dock with multiple light sources 201 on the board under test 20, the lighting test of multiple light sources 201 on the board under test 20 can be quickly carried out, improving the efficiency of the lighting test of the board under test 20.

[0168] In some examples, referring to Figures 2 - 4 As shown, referring to Figures 2 - 4 As shown, the photoelectric conversion circuit 210 can have a first grounding end 213. The photoelectric conversion circuit 210 can be grounded through the first grounding end 213.

[0169] In some examples, the third ends 2121 of multiple photoelectric conversion elements 212 can be grounded through the first grounding end 213.

[0170] In some examples, the third ends 2121 of multiple photoelectric conversion elements 212 can be connected in parallel to the first grounding end 213.

[0171] In some examples, with reference to Figures 2 - 4 As shown, the electrical signal acquisition circuit 220 may include a voltage acquisition circuit 221. The voltage acquisition circuit 221 may have a second grounding terminal 2211. The electrical signal acquisition circuit 220 may be grounded through the second grounding terminal 2211.

[0172] In some examples, the first grounding terminal 213 of the photoelectric conversion circuit 210 and the second grounding terminal 2211 of the electrical signal acquisition circuit 220 may be commonly grounded. In this way, the electrical signal acquisition circuit 220 is equivalent to being connected in parallel across both ends of the photoelectric conversion circuit 210, facilitating the electrical signal acquisition circuit 220 to acquire the voltage across both ends of the photoelectric conversion circuit 210.

[0173] In the embodiments of the present application, by grounding the first grounding terminal 213 of the photoelectric conversion circuit 210, the third terminals 2121 of multiple photoelectric conversion elements 212 are connected in parallel to the first grounding terminal 213. In this way, multiple photoelectric conversion elements 212 can be grounded; the second grounding terminal 2211 of the electrical signal acquisition circuit 220 is grounded. In this way, the electrical signal acquisition circuit 220 is connected across both ends of the photoelectric conversion circuit 210. In this way, the electrical signal acquisition circuit 220 can adopt the voltage acquisition circuit 221, and can acquire the voltage value across both ends of the photoelectric conversion circuit 210, facilitating the determination of the light emission condition and light emission intensity of the light source 201 through the voltage value of the photoelectric conversion circuit 210, which is beneficial to accurately determine the light emission state of the light source 201 on the DUT 20, and improves the accuracy of the lighting test.

[0174] In some examples, when the voltage value of the photoelectric conversion element 212 acquired by the voltage acquisition circuit 221 is within the preset voltage threshold range, it is determined that the light source 201 on the DUT 20 is normal.

[0175] In some examples, when performing a lighting test on the light source 201 on the DUT 20, the preset voltage threshold range can be set through an external monitoring system or the monitoring system of the fixture body 100.

[0176] In some examples, the preset voltage threshold can be set according to the specific type of the light source 201 on the DUT 20. For example, it can be set according to the color or light emission intensity of the light source 201, etc.

[0177] In some examples, the preset voltage threshold can be m, and the preset voltage threshold can be m ± 5%.

[0178] In some examples, the light emitted by the light source 201 is irradiated onto the photoelectric conversion circuit 210 through the light guide member 300. The photoelectric conversion circuit 210 converts the light emitted by the light source 201 into an electrical signal. The voltage acquisition circuit 221 acquires the voltage signal on the photoelectric conversion circuit 210 and converts it into a specific voltage value through ADC.

[0179] In some examples, the MCU in the voltage acquisition circuit 221 can compare the voltage value converted by ADC with a preset voltage threshold.

[0180] In some examples, when the voltage value is within the preset voltage threshold range, the MCU can determine that the light source 201 emits light normally. The MCU can output a test result indicating that the lighting test of the light source 201 passes.

[0181] In some examples, the voltage acquisition circuit 221 can report the voltage value converted by ADC to the host computer through the data transmission interface. The host computer can compare the voltage value with the preset voltage threshold.

[0182] In some examples, when the voltage value is within the preset voltage suppression range, the host computer can determine that the light source 201 emits light normally. The host computer can output a test result indicating that the lighting test of the light source 201 passes.

[0183] In some examples, when the light source 201 irradiates onto the photoelectric conversion circuit 210 and the voltage value acquired by the voltage acquisition circuit 221 on the photoelectric conversion circuit 210 is not within the preset voltage threshold range, it can be determined that the light source 201 emits light abnormally. At this time, it can be determined that the lighting test of the light source 201 fails.

[0184] In some examples, when the voltage value acquired by the voltage acquisition circuit 221 on the photoelectric conversion circuit 210 is 0, it can be determined that the light source 201 is not lit. That is, the lighting test of the light source 201 fails.

[0185] In some examples, when the voltage value acquired by the voltage acquisition circuit 221 on the photoelectric conversion circuit 210 is not 0 and the voltage value is not within the preset voltage threshold range, it can be determined that the light emitted by the light source 201 is dim or bright. At this time, it can be determined that the lighting test of the light source 201 fails.

[0186] Figure 5 It is another overall structural schematic diagram of the lighting test fixture provided by the embodiment of the present application.

[0187] In some examples, referring to Figure 5 as shown, the lighting test fixture may include a test tool box body 400.

[0188] In some examples, the test tool board 200 can be disposed within the test tool box body 400.

[0189] In some examples, a receiving cavity can be provided within the test tool box body 400. The test tool board 200 can be disposed within the receiving cavity. In this way, the test tool box body 400 can protect the test tool board 200 and extend its service life.

[0190] In some examples, the test tool box body 400 can be made of a material capable of shielding electromagnetic signals. In this way, after the test tool board 200 is disposed within the test tool box body 400, the test tool box body 400 can shield the interference of external electromagnetic signals on the electrical signals of the photoelectric conversion circuit 210 and the electrical signal acquisition circuit 220, improving the accuracy and stability of the lighting test for the board under test 20.

[0191] In some examples, the test tool box body 400 can be made of a metal material. For example, the test tool box body 400 can be made of a metal or alloy material such as cast iron, aluminum alloy, stainless steel, etc. It can be understood that in the embodiments of the present application, the specific material of the test tool box body 400 is only shown as some specific examples and is not a limitation on the material of the test tool box body 400.

[0192] Figure 6 It is a top view of the test tool box body in the lighting test fixture provided by the embodiments of the present application. Figure 7 is Figure 6 a partial enlarged view of part A in

[0193] In some examples, referring to Figure 6 as shown, the test tool box body 400 can be provided with an orientation structure 410.

[0194] In some examples, referring to Figure 7 as shown, the orientation structure 410 can be aligned with the light input end 211 of the photoelectric conversion circuit 210.

[0195] In some examples, the orientation structure 410 can be disposed on any one of the side wall, top wall or bottom wall of the test tool box body 400. It can be understood that in the embodiments of the present application, the setting position of the orientation structure 410 on the test tool box body 400 can be specifically set according to the setting manner of the test tool board 200 within the test tool box body 400, and the embodiments of the present application do not limit this.

[0196] In some examples, the second end 320 of the light guide member 300 can pass through the orientation structure 410. The orientation structure 410 can play a role in orienting the light guide direction of the second end 320. In this way, it is convenient to orient and dock the second end 320 with the photoelectric conversion circuit 210 through the orientation structure 410.

[0197] In some examples, an axial hole may be provided in the orientation structure 410. The axial hole may be axially aligned with the light input end 211 of the photoelectric conversion circuit 210. The second end 320 may pass through the axial hole, so that the second end 320 can be axially aligned with the light input end 211 of the photoelectric conversion circuit 210 through the axial hole.

[0198] In some examples, the orientation structure 410 may be a clamping structure. The clamping structure can clamp and fix the second end 320 in an oriented manner and dock the second end 320 with the photoelectric conversion circuit 210 in an oriented manner.

[0199] In some examples, the orientation structure 410 may be fixedly connected to the test tool box body 400 by bolts, screws or studs, etc.

[0200] In some examples, the orientation structure 410 and the test tool box body 400 may be an integral part.

[0201] In the embodiments of the present application, by arranging the test tool plate 200 in the test tool box body 400, in this way, a stable test environment can be provided through the test tool, the accuracy of the electrical signal acquisition circuit 220 for collecting electrical signals can be ensured, and the accuracy of the lighting test for the light source 201 of the to-be-tested board 20 is improved.

[0202] In addition, by arranging the orientation structure 410 in the test tool box body 400, in this way, the second end 320 of the light guide member 300 can be oriented and docked with the photoelectric conversion circuit 210 through the orientation structure 410, which is convenient for the second end 320 to be docked with the light input end 211 of the photoelectric conversion circuit 210, and can effectively improve the accurate conversion of the light signal emitted by the light source 201 into an electrical signal by the photoelectric conversion circuit 210, and improve the accuracy of the lighting test for the to-be-tested board 20.

[0203] Figure 8 is along Figure 6 the sectional view taken along line B-B in Figure 9 is Figure 8 the partial enlarged view at C in

[0204] In some examples, referring to Figure 8 as shown, the test tool box body 400 may be provided with a through hole 420. The through hole 420 can penetrate the inner and outer surfaces of the test tool box body. In this way, it is convenient for the second end 320 of the light guide member 300 to extend into the test tool box body 400 from the through hole 420 and be docked with the photoelectric conversion circuit 210.

[0205] In some examples, referring to Figure 9 as shown, the orientation structure 410 may include an orientation bushing 411.

[0206] In some examples, the orientation bushing 411 can be arranged on the side wall of the test tool box body 400. The shaft hole of the orientation bushing 411 can be coaxial with the through hole 420.

[0207] In some examples, the orientation bushing 411 can be inserted into the through hole 420, so that the shaft hole of the orientation bushing 411 is coaxial with the through hole 420. The second end 320 can be inserted into the orientation bushing 411.

[0208] In some examples, the shaft hole of the orientation bushing 411 can be coaxially communicated with the through hole 420. For example, the orientation bushing 411 and the test tool box body 400 can be an integral part, and the orientation bushing 411 protrudes from the side wall of the test tool box body 400. The orientation bushing 411 can protrude from the hole edge of the through hole 420, so that the shaft hole of the orientation bushing 411 is coaxial with the through hole 420.

[0209] In some examples, the light guide member 300 can be inserted into the shaft hole of the orientation bushing 411.

[0210] In some examples, the second end 320 of the light guide member 300 can be inserted into the shaft hole of the orientation bushing 411. In this way, since the orientation bushing 411 is coaxially aligned with the light input end 211 of the photoelectric conversion circuit 210, the orientation bushing 411 can orient and fix the second end 320 of the light guide member 300, so that the second end 320 is coaxially aligned with the light input end 211 of the photoelectric conversion circuit 210.

[0211] In the embodiments of the present application, by providing the through hole 420 in the test tool box body 400 and inserting the orientation bushing 411 into the through hole 420. The orientation bushing 411 can be coaxially aligned with the light input end 211 of the photoelectric conversion circuit 210. In this way, after the second end 320 of the light guide member 300 is inserted into the orientation bushing 411, the orientation bushing 411 can orient the second end 320, so that the second end 320 is coaxially aligned with the light input end 211 of the photoelectric conversion circuit 210, which is convenient for the second end 320 to be docked with the light input end 211 of the photoelectric conversion circuit 210, and improves the accuracy of the lighting test for the test board 20.

[0212] In some examples, referring to Figure 9 As shown, the fourth end 4111 of the orientation bushing 411 extends towards the photoelectric conversion circuit 210. In this way, the fourth end 4111 of the orientation bushing 411 can be closer to the photoelectric conversion circuit 210, which is convenient for the second end 320 of the light guide member 300 to be oriented and docked with the light input end 211 of the photoelectric conversion circuit 210 after extending towards the photoelectric conversion circuit 210.

[0213] In some examples, referring to Figure 9As shown, the fifth end 4112 of the orientation bushing 411 extends outside the test cartridge. By extending the fifth end 4112 of the orientation bushing 411 outside the test cartridge. In this way, the second end 320 of the light guide member 300 can pass through the fifth end 4112 of the orientation bushing 411 to the fourth end 4111 and be docked with the photoelectric conversion circuit 210, increasing the axial contact area between the orientation bushing 411 and the second end 320, which can protect the second end 320 of the light guide member 300 and improve the stability of the orientation fixation of the second end 320, ensuring that the second end 320 is axially aligned with the light input end 211 of the photoelectric conversion circuit 210 and improving the accuracy of the lighting test.

[0214] In some examples, referring to Figure 7 As shown, a plurality of slots may be axially formed in the fifth end 4112.

[0215] In some examples, the slots may be formed by axially cutting the fifth end 4112 after the fifth end 4112 is machined.

[0216] In some examples of the embodiments of the present application, by axially forming a plurality of slots in the fifth end 4112; in this way, when the second end 320 of the light guide member 300 is sleeved into the orientation bushing 411, the second end 320 of the light guide member 300 can extrude the fifth end 4112 outward, increasing the slots of the second end 320, so that it is convenient to pass the second end 320 through the orientation bushing 411 and improve the connection efficiency between the second end 320 and the orientation bushing 411.

[0217] In some examples, referring to Figure 7 As shown, the orientation structure 410 may include a locking member 412. The locking member 412 may be sleeved on the fifth end 4112.

[0218] In some examples, the locking member 412 may include a nut or a screw nut. The locking member 412 may be threadedly connected to the fifth end 4112. That is to say, external threads may be provided on the fifth end 4112, and internal threads may be provided on the locking member 412, and the locking member 412 is threadedly connected to the external threads of the fifth end 4112 through the internal threads.

[0219] In some examples, when the locking member 412 is connected to the fifth end 4112, since the inner diameter of the locking member 412 remains unchanged, the locking member 412 can squeeze the fifth end 4112 inward, so that the slots of the fifth end 4112 are reduced. In this way, the fifth end 4112 holds the second end 320 of the light guide member 300, thereby fixing the second end 320.

[0220] In the embodiment of the present application, by extending the fourth end 4111 of the orientation bushing 411 towards the light input end 211 of the photoelectric conversion circuit 210, in this way, after the second end 320 of the light guide member 300 is inserted through the orientation bushing 411, the second end 320 can extend towards the light input end 211 of the photoelectric conversion circuit 210 through the fourth end 4111 of the orientation bushing 411, which can increase the contact area between the orientation bushing 411 and the second end 320, thereby improving the stability of orienting the second end 320 and the stability of the axial alignment between the second end 320 and the light input end 211 of the photoelectric conversion circuit 210, that is, it can improve the accuracy of the photoelectric conversion circuit 210 in converting optical signals into electrical signals.

[0221] In addition, extend the fifth end 4112 of the orientation bushing 411 outside the test tool box body 400, and axially form a plurality of slits in the fifth end 4112. In this way, when the second end 320 of the light guide member 300 is inserted into the fifth end 4112, due to the plurality of slits axially formed in the fifth end 4112, the second end 320 of the light guide member 300 can radially extrude the bushing wall of the fifth end 4112, so that the fifth end 4112 expands outwards, facilitating the insertion of the second end 320 of the light guide member 300 into the bushing.

[0222] In addition, in the embodiment of the present application, by sleeving a locking member 412 on the fifth end 4112, the locking member 412 is threadedly connected to the fifth end 4112; after the second end 320 of the light guide member 300 is inserted into the bushing, the threaded connection between the locking member 412 and the fifth end 4112 can be used to reduce the slits of the fifth end 4112, and the bushing wall of the fifth end 4112 holds the peripheral wall of the second end 320, thereby locking and fixing the second end 320 in the bushing, facilitating the orientation and fixation of the light guide member 300, and improving the efficiency of the lighting test of the light source 201 of the test plate 20.

[0223] The above-described embodiments are only specific embodiments of the present application and are not used to limit the protection scope of the present application. Any modifications, equivalent replacements, improvements, etc. made on the basis of the technical solutions of the present application shall be included in the protection scope of the present application.

Claims

1. A lighting test fixture, characterized in that, Comprising: A jig body (100); for fixing a to-be-tested board (20), a light source (201) being provided on the to-be-tested board (20); A test tool board (200), provided with a photoelectric conversion circuit (210) and an electrical signal acquisition circuit (220), the photoelectric conversion circuit (210) being used for converting an optical signal into an electrical signal; the electrical signal acquisition circuit (220) being connected to the photoelectric conversion circuit (210), the electrical signal acquisition circuit (220) being used for acquiring the electrical signal output by the photoelectric conversion circuit (210); A light guide member (300), a first end (310) being connected to the jig body (100), the first end (310) being used for docking with the light source (201); a second end (320) being docked with a light input end (211) of the photoelectric conversion circuit (210); Determining whether the light source (201) on the to-be-tested board (20) is normal according to the electrical signal on the photoelectric conversion circuit (210) acquired by the electrical signal acquisition circuit (220).

2. The lighting test fixture according to claim 1, characterized in that, The test tool board (200) is provided with a signal transmission interface (230), a signal output end of the electrical signal acquisition circuit (220) being connected to the signal transmission interface (230), and the electrical signal acquisition circuit (220) reporting the electrical signal on the photoelectric conversion circuit (210) acquired through the signal transmission interface (230).

3. The lighting test fixture according to claim 1, characterized in that The test tool board (200) is provided with a power supply circuit (240), the power supply circuit (240) being connected to the electrical signal acquisition circuit (220); The test tool board (200) is provided with a power supply interface (241), the power supply circuit (240) being connected to the power supply interface (241), and the power supply circuit (240) being used for providing working power for the electrical signal acquisition circuit (220).

4. The lighting test fixture according to claim 3, wherein The photoelectric conversion circuit (210) is connected between the electrical signal acquisition circuit (220) and the power supply circuit (240); the power supply circuit (240) includes: A protection element (242), connected to a power supply input end of the electrical signal acquisition circuit (220), and the photoelectric conversion circuit (210) being connected between the protection element (242) and the electrical signal acquisition circuit (220).

5. The lighting test fixture according to claim 4, wherein The protection element (242) includes any one of an overvoltage protection element (242) and an overcurrent protection element (242).

6. The lighting test fixture according to any one of claims 1-5, characterized in that, The photoelectric conversion circuit (210) includes a photoelectric conversion element (212), and the second end (320) is docked with a photosensitive surface of the photoelectric conversion element (212).

7. The lighting test fixture according to claim 6, characterized in that, There are multiple photoelectric conversion elements (212), and the multiple photoelectric conversion elements (212) are connected in parallel to an acquisition input end of the electrical signal acquisition circuit (220).

8. The lighting test fixture according to claim 7, characterized in that, The photoelectric conversion circuit (210) has a first grounding end (213), and the first grounding end (213) is grounded; third ends (2121) of the multiple photoelectric conversion elements (212) are connected in parallel to the first grounding end (213); The electric signal acquisition circuit (220) includes a voltage acquisition circuit (221). The voltage acquisition circuit (221) has a second grounding terminal (2211), and the second grounding terminal (2211) is grounded. The voltage acquisition circuit (221) is configured to acquire the voltage signal of the photoelectric conversion element (212).

9. The lighting test fixture according to claim 8, wherein When the voltage value of the photoelectric conversion element (212) acquired by the voltage acquisition circuit (221) is within a preset voltage threshold range, it is determined that the light source (201) on the board under test (20) is normal.

10. The lighting test fixture according to any one of claims 1-9, characterized in that, The lighting test fixture further includes: A test tool box body (400). The test tool board (200) is disposed within the test tool box body (400). The test tool box body (400) is provided with an orientation structure (410). The orientation structure (410) is aligned with the light input end (211) of the photoelectric conversion circuit (210). The second end (320) passes through the orientation structure (410) to be oriented and docked with the photoelectric conversion circuit (210) through the orientation structure (410).

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