Memory particle testing device and testing method thereof

Abstract

The invention relates to the field of solid state disks, in particular to a memory particle testing device and a testing method thereof. Intermittent rotation of a driven groove wheel and an eccentric rotating disc is achieved through a driving gear at the same time, so that a placing disc rotates, to-be-tested memory particles on the placing disc rotate to the left side or the right side of the placing disc, meanwhile, the eccentric rotating disc rotates, and a pressing block is moved to the left side or the right side of the placing disc; the to-be-tested memory particles are pushed downwards to be in contact with the vibrating needle for testing, and are rotated to the rear side or the front side of the placing disc after testing, so that testers can take down the tested memory particles conveniently, and meanwhile, the to-be-tested memory particles can be placed again. Therefore, when the memory particles are tested on the left side and the right side of the placing disc, taking and placing of the memory particles to be tested are completed in front of and behind the placing disc, the horizontal pressing block which vertically descends in the testing process can ensure that the stress of the memory particles can be balanced, and the situation that the memory particles are damaged or displaced due to uneven stress is avoided.

Description

Technical Field

[0001] The present invention relates to the field of solid-state drives, and particularly to a memory particle testing device and a testing method thereof. Background Art

[0002] In the field of solid-state drive manufacturing, a very large number of flash memory particles are required for each solid-state drive, and the quality of the flash memory particles directly affects the quality of the solid-state drive. Therefore, during the production and testing of flash memory particles, the particles usually need to be placed in a testing device for various tests such as electrical performance and physical characteristics. To facilitate operation and improve testing efficiency, many testing devices adopt a flip-type structure to position and fix the flash memory particles. The flip-type structure usually consists of two parts, an upper cover that can be flipped open and a lower cover for placing the flash memory particles. When the upper cover is closed, the flash memory particles are fixed to the lower cover by mechanical pressure to ensure their stability during the testing process.

[0003] In the existing flip-type structure, the positioning and fixing of the flash memory particles mainly rely on the pressure exerted by the upper cover. Since the closing of the upper cover is achieved through a mechanical structure, the pressure distribution is often uneven, resulting in unbalanced forces on the flash memory particles during the testing process, thereby increasing the risk of particle damage and reducing the testing accuracy. Summary of the Invention

[0004] Aiming at the deficiencies proposed in the above background art, the present invention provides a memory particle testing device and a testing method thereof.

[0005] The present invention adopts the following technical solutions: A memory particle testing device, the testing device comprising: A base, on the upper surface of the base there is provided an installation groove, above the installation groove there is a spanning bracket, the bracket includes a cross beam and two vertical beams vertically connected to both ends of the cross beam, and the bottom ends of both vertical beams are connected to the upper surface of the base; A placement tray, the placement tray is intermittently rotated in the installation groove, four grooves penetrate through the upper surface of the placement tray, the four grooves are symmetrically arranged, and each groove is provided with a placement plate, the placement plate is connected to the placement tray through an elastic member, the placement plate is used for placing memory particles, and a number of through holes penetrate through the placement plate, and the positions of the through holes correspond to the positions of the memory particle test points; A pressing block, the pressing block is horizontally reciprocatingly moved and lifted above the placement tray, when the pressing block is at the left and right extreme positions, the pressing block pushes the placement plate downward; A reciprocating mechanism, the reciprocating mechanism includes a T-shaped frame, a first connecting rod, a second connecting rod, a third connecting rod, an eccentric turntable, a collar and a fourth connecting rod. The bottom end of the T-shaped frame is connected to the pressing block. The first ends of the first connecting rod and the second connecting rod are respectively hinged to both ends of the T-shaped frame. And the second ends of the first connecting rod and the second connecting rod are both hinged to the side surface of the cross beam. The eccentric turntable is coaxially arranged at the second end of the second connecting rod. The rotating shaft of the eccentric turntable is eccentrically arranged, and the eccentric turntable is arranged on the side surface of the cross beam to rotate intermittently. A collar is sleeved on the outer circumference of the eccentric turntable. The collar is arranged to rotate on the outer circumference of the eccentric turntable. And a fourth connecting rod is connected to the outer circumference of the collar. The fourth connecting rod is hinged to the end of the third connecting rod. The first end of the third connecting rod is coaxially connected to the second end of the first connecting rod; A linkage mechanism, the linkage mechanism includes an intermittent gear, a driving gear, a driving dial and a driven sprocket. The intermittent gear is arranged to rotate on the side surface of the vertical beam. The driving gear is arranged to rotate on the base. The intermittent gear and the driving gear cooperate with each other. The driving gear is used to drive the intermittent gear to rotate intermittently. And the intermittent gear is used to drive the eccentric turntable to rotate. The driven sprocket and the driving dial cooperate with each other and are both arranged to rotate in the base. The driving gear is used to drive the driving dial to rotate. The driving dial is used to drive the driven sprocket to rotate intermittently. And the driven sprocket is coaxially arranged with the placement plate; Wherein, both the intermittent gear and the driving gear are incomplete gears. The part of the intermittent gear lacking teeth forms a first arc surface. The part of the driving gear lacking teeth forms a second arc surface. When the driving gear rotates, when the first arc surface contacts the second arc surface, the intermittent gear stops. When the driving gear meshes with the intermittent gear, the intermittent gear drives the pressing block to move horizontally left and right and up and down through the eccentric turntable; The driven sprocket is provided with a plurality of radial grooves. The driving dial is provided with a cylindrical pin. During the process of the driving gear driving the driving dial to rotate, the cylindrical pin sequentially enters the radial grooves, so that the cylindrical pin pushes the radial grooves to drive the driven sprocket and the placement plate to rotate; A PCB board is arranged in the base, and a main control chip, an interface and a spring pin are installed on the PCB board. The spring pin and the interface are respectively electrically connected to the main control chip. There are two spring pins in the base. The spring pins are fixed at the bottom of the installation groove of the base. The spring pins are arranged corresponding to the through holes and protrude from the through holes when the pressing block moves the placement plate downwards. The spring pins will contact the memory particles placed in the placement plate.

[0006] As a further improvement, guide rods are provided at both ends of the placement plate. The two guide rods pass through the placement plate upward and are each connected to a limit plate. The two ends of the elastic member are respectively connected to the bottom surface of the limit plate and the upper surface of the placement plate, and the elastic member is sleeved on the outer side of the circumference of the guide rod.

[0007] As a further improvement, the transmission ratio between the driving gear and the eccentric rotating disk is 1:2, and the transmission ratio between the driving gear and the driven sheave is 1:4.

[0008] As a further improvement, the linkage mechanism also includes a lever and a paddle. The lever is arranged on a side surface of the intermittent gear close to the driving gear, and the lever is arranged corresponding to the first arc surface. A paddle is provided on the upper surface of the driving gear, and the paddle is arranged corresponding to the second arc surface. When the contact between the first arc surface and the second arc surface ends, the paddle moves the lever to make the driving gear mesh with the intermittent gear.

[0009] As a further improvement, the linkage mechanism also includes a slave synchronous wheel coaxially arranged with the eccentric rotating disk, and a master synchronous wheel coaxially arranged with the intermittent gear, and the master synchronous wheel and the slave synchronous wheel are connected by the same synchronous belt.

[0010] As a further improvement, the linkage mechanism further includes a first linkage gear coaxially arranged with the driving gear, and a second linkage gear coaxially arranged with the active dial, and the second linkage gear is meshingly connected with the first linkage gear.

[0011] As a further improvement, the linkage mechanism also includes a concave locking arc and a convex locking arc. The driven groove wheel is provided with a plurality of the concave locking arcs, and each concave locking arc is provided between adjacent radial grooves. The active dial is provided with the convex locking arc. During the rotation of the active dial, the convex locking arc sequentially clamps the concave locking arc.

[0012] The present invention also discloses a testing method of a memory particle testing device, which is as follows: Placing a memory chip to be tested on the placement plate in the groove on the front side of the placement plate; The driving gear rotates to make the driving dial rotate until the cylindrical pin enters the radial groove, thereby driving the driven sprocket and the placement plate to rotate by [rotation degree] until the memory particles are located on the left side of the placement plate, facing the spring pins. At the same time, the driving gear meshes with the intermittent gear, thereby driving the eccentric turntable to rotate by [rotation degree] until the pressing block moves to the left side of the placement plate, and pushing the placement plate and the memory particles to be tested downward, so that the spring pins contact the memory particles for testing. At the same time, the cylindrical pin leaves the radial groove on the other side. Therefore, the driven sprocket and the placement plate are stationary, so that the memory particles do not rotate relative to the base, and the first arc surface contacts the second arc surface. Therefore, the eccentric turntable is stationary, so that the pressing block does not lift or move relative to the base; When testing the memory particles to be tested, place another memory particle to be tested on the placement plate in the groove at the rear side of the placement plate; The driving gear rotates until the cylindrical pin of the driving dial enters another radial groove of the driven sprocket, and after the driving gear meshes with the intermittent gear again, it drives the driven sprocket and the placement plate to rotate by [rotation degree] again until the tested memory particles are located at the rear side of the placement plate. During this process, another memory particle to be tested moves to the right side of the placement plate, and the eccentric turntable rotates by [rotation degree] again until the pressing block moves to the right side of the placement plate, pushing the placement plate and another memory particle to be tested downward, so that the spring pins contact the memory particles for testing. At the same time, the cylindrical pin leaves the radial groove on the other side. Therefore, the driven sprocket and the placement plate are stationary, so that the memory particles do not rotate relative to the base, and the first arc surface contacts the second arc surface. Therefore, the eccentric turntable is stationary, so that the pressing block does not lift or move relative to the base; When testing another memory particle to be tested, take out the tested memory particles on the rear side of the placement plate, and at the same time place new memory particles to be tested on the placement plate in the groove at the front side of the placement plate.

[0013] From the above description of the structure of the present invention, compared with the prior art, the present invention has the following advantages: The present invention realizes the intermittent rotation of the driven sprocket and the eccentric turntable at the same time through the driving gear, thereby rotating the placement plate, rotating the memory particles to be tested on the placement plate to the left or right side of the placement plate. At the same time, the eccentric turntable rotates, moving the pressing block to the left or right side of the placement plate, and pushing the memory particles to be tested vertically downward to contact the spring pins for testing, and after testing, rotating to the rear or front side of the placement plate to facilitate the tester to remove the memory particles that have completed the test, and at the same time, new memory particles to be tested can be placed again. Thus, it can be seen that the present invention can realize the placement and removal of the memory particles to be tested at the front and rear of the placement plate while testing the memory particles on the left and right sides of the placement plate, and the horizontal pressing block that descends vertically during the testing process can ensure that the memory particles can be balanced in force, ensuring that all detection points of the memory particles are in close contact with all spring pins, and avoiding damage or displacement of the memory particles due to uneven force, resulting in test errors. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 Schematic diagram of the three-dimensional structure after the cover covers the base.

[0015] Figure 2 Schematic diagram of the three-dimensional structure of the present invention.

[0016] Figure 3 It is Figure 2 Schematic diagram of the structure of A in

[0017] Figure 4 Schematic diagram of the three-dimensional structure of the pressing block, reciprocating mechanism and linkage mechanism.

[0018] Figure 5 Schematic diagram of the three-dimensional structure of the pressing block, reciprocating mechanism and linkage mechanism from another perspective.

[0019] Figure 6 Schematic diagram of the three-dimensional structure of the linkage mechanism.

[0020] Figure 7 Schematic diagram of the three-dimensional structure of the placement tray, reciprocating mechanism and linkage mechanism.

[0021] Figure 8 Schematic diagram of the three-dimensional structure when the pressing block moves to the other side. Detailed implementation manners

[0022] The following describes the detailed implementation manners of the present invention with reference to the accompanying drawings.

[0023] As shown in Figure 2 and Figure 3 A memory chip testing device includes a base 1, a placement tray 2, a pressing block 3, a reciprocating mechanism 4 and a linkage mechanism 5. Among them, a PCB board is provided in the base 1, and a main control chip, an interface and a spring pin are installed on the PCB board. The spring pin and the interface are electrically connected to the main control chip respectively. There is a spring pin on each of the left and right sides in the base 1, and the spring pin is fixed at the bottom of the installation groove 11 of the base 1. In addition, the placement tray 2 is intermittently rotated in the installation groove 11. Four symmetrically arranged grooves 21 penetrate the upper surface of the placement tray 2, and a placement plate 22 is provided in each groove 21. The placement plate 22 is connected to the placement tray 2 through an elastic member 224. When in use, the placement plate 22 is used to place the memory chip 6, and a plurality of through holes 221 penetrate the placement plate 22. The positions of the through holes 221 correspond to the positions of the test points of the memory chip 6. At the same time, the spring pins in the installation groove 11 are arranged corresponding to the through holes 221. When the rotation of the placement tray 2 temporarily stops, the placement plate 22 drives the memory chip 6 to rotate to directly above the spring pin. Then when the placement plate 22 moves downward, the spring pin extends out of the through hole 221 and contacts the memory chip 6 placed in the placement plate 22, so that the memory chip 6 installed in the placement tray 2 can be tested through the main control chip. The specific detection method is the prior art and will not be elaborated here in detail.

[0024] Preferably, guide rods 222 are provided at both ends of the placement plate 22. The two guide rods 222 penetrate upward through the placement disk 2 and are each connected to a limit plate 223. Both ends of the elastic member 224 are respectively connected to the bottom surface of the limit plate 223 and the upper surface of the placement disk 2, and the elastic member 224 is sleeved on the outer circumference of the guide rod 222. By using the guiding function of the guide rod 222, the placement plate 22 can be lifted and lowered vertically, ensuring that the memory particles 6 placed on the placement plate 22 can be smoothly contacted and tested by the spring pins.

[0025] Furthermore, finger grooves 23 are provided at both ends of the groove 21, and the two finger grooves 23 communicate with the groove 21. The finger grooves 23 facilitate the insertion of fingers, so as to pick up and place the memory particles 6 on the placement plate 22.

[0026] As shown in the Figure 2 accompanying drawings, the reciprocating mechanism 4 is provided on the base 1 and is used to drive the pressing block 3 to move horizontally left and right and up and down above the placement disk 2. When the pressing block 3 is at the left and right extreme positions, the horizontal pressing block 3 can vertically push the placement plate 22 downward, compress the elastic member 224, and pause for a period of time to make the spring pins contact the memory particles 6 for testing. During the process, the horizontally descending pressing block 3 can ensure that the memory particles 6 are in balanced force, ensuring that all detection points of the memory particles 6 are in close contact with all spring pins, and avoiding damage or displacement of the memory particles 6 due to uneven force, resulting in test errors. After the test is completed, when the pressing block 3 is removed, the placement plate 22 drives the memory particles 6 to reset under the elastic restoring force of the elastic member 224, and then the tested memory particles 6 continue to rotate with the placement disk 2 and can be taken off when the placement disk 2 stops again.

[0027] Specifically, as shown in the Figure 2 and Figure 4As shown, a bracket 12 is disposed across the mounting groove 11, and the bracket 12 includes a crossbeam 122 and two vertical beams 121 vertically connected to the two ends of the crossbeam 122, and the bottom ends of the two vertical beams 121 are connected to the upper surface of the base 1. The reciprocating mechanism 4 includes a T-shaped frame 41, a first connecting rod 43, a second connecting rod 44, a third connecting rod 45, an eccentric rotating disk 46, a collar 47 and a fourth connecting rod 48. The bottom end of the T-shaped frame 41 is connected to the pressing block 3, and the two ends of the T-shaped frame 41 are respectively hinged with the first end of the first connecting rod 43 and the first end of the second connecting rod 44, and the ends of the first connecting rod 43 and the second connecting rod 44 are both hinged to the side of the crossbeam 122. The end of the second connecting rod 44 is coaxially provided with an eccentric rotating disk 46, and the rotating shaft of the eccentric rotating disk 46 is eccentrically arranged. In addition, a collar 47 is sleeved on the outer side of the circumference of the eccentric rotating disk 46, and the collar 47 is arranged on the outer side of the circumference of the eccentric rotating disk 46 for rotation, and a fourth connecting rod 48 is connected to the outer side of the circumference of the collar 47, and the fourth connecting rod 48 is hinged to the end of the third connecting rod 45, and the end of the first connecting rod 43 is coaxially connected to the head end of the third connecting rod 45. When in use, through the coordination and linkage between the first connecting rod 43, the second connecting rod 44, the third connecting rod 45, the eccentric rotating disk 46, the collar 47 and the fourth connecting rod 48, the T-shaped frame 41 moves back and forth and rises and falls with the pressing block 3 located above the placement disk 2. During the process, since the eccentric rotating disk 46 is arranged on the side of the beam 122 and rotates intermittently 180 degrees, the pressing block 3 can stop for a period of time when it is at the left and right extreme positions, leaving enough time for testing the memory particles 6.

[0028] Preferably, the first connecting rod 43 and the second connecting rod 44 are of equal length and arranged in parallel to ensure that the T-shaped frame 41 and the pressure block 3 can move horizontally left and right, thereby ensuring that when the pressure block 3 presses down the memory particle 6 vertically, the memory particle 6 can be subjected to balanced force, thereby avoiding damage or displacement of the memory particle 6 due to uneven force.

[0029] As attached Figure 4 and Figure 6As shown, the intermittent rotation of the placement disk 2 and the eccentric rotating disk 46 are driven by the linkage mechanism 5. Specifically, the linkage mechanism 5 includes an intermittent gear 54, a driving gear 55, an active dial 58 and a driven groove wheel 59. Among them, the intermittent gear 54 is arranged on the side of the vertical beam 121 to rotate, the driving gear 55 is arranged on the base 1 to rotate, the driving motor is fixed in the base 1, the driving motor drives the driving gear 55 to rotate, the intermittent gear 54 and the driving gear 55 cooperate, the intermittent gear 54 cooperates with the eccentric rotating disk 46, the driving gear 55 is used to drive the intermittent gear 54 to rotate intermittently, and the intermittent gear 54 is used to drive the eccentric rotating disk 46 to rotate, so that the eccentric rotating disk 46 rotates intermittently. In addition, the driven groove wheel 59 and the active dial 58 cooperate and are both arranged in the base 1 to rotate, the active dial 58 and the driving gear 55 cooperate, the driven groove wheel 59 is coaxially arranged with the placement disk 2, the driving gear 55 is used to drive the active dial 58 to rotate, and the active dial 58 is used to drive the driven groove wheel 59 to rotate intermittently, so that the placement disk 2 rotates intermittently. Preferably, the present invention can also be configured with a control system, which is used to control the opening and closing of the drive motor. Specifically, a button can be configured outside the base 1, and a signal for controlling the opening and closing of the drive motor is sent to the control system by triggering the button.

[0030] As attached Figure 5 and Figure 6 As shown, the intermittent gear 54 and the driving gear 55 can be matched in such a way that both the intermittent gear 54 and the driving gear 55 are incomplete gears, the part of the intermittent gear 54 lacking a tooth block forms a first arc surface 541, and the part of the driving gear 55 lacking a tooth block forms a second arc surface 551. In addition, a lever 542 is provided on the side of the intermittent gear 54 close to the driving gear 55, and the lever 542 is arranged corresponding to the first arc surface 541. A paddle 552 is provided on the upper surface of the driving gear 55, and the paddle 552 is arranged corresponding to the second arc surface 551. The intermittent gear 54 and the eccentric rotating disk 46 can be matched in such a way that the eccentric rotating disk 46 is coaxially provided with a slave synchronous wheel 51, and the intermittent gear 54 is coaxially provided with a master synchronous wheel 53, and the master synchronous wheel 53 and the slave synchronous wheel 51 are connected through the same synchronous belt 52.

[0031] As attached Figures 6 to 8 As shown, when the driving gear 55 rotates to the point where the first arc surface 541 contacts the second arc surface 551, the intermittent gear 54 stops with the eccentric rotating disk 46 through the main synchronous wheel 53, the synchronous belt 52 and the slave synchronous wheel 51, and the pressing block 3 moves to the left limit or the right limit, and the pressing block 3 presses down the memory particles 6 to keep them still for testing. When the driving gear 55 rotates to the point where the first arc surface 541 and the second arc surface 551 end in contact, the paddle 552 pokes the paddle 542 to mesh the driving gear 55 with the intermittent gear 54, and the intermittent gear 54 rotates with the eccentric rotating disk 46, and the pressing block 3 moves left and right and rises and falls between the left and right limits.

[0032] As shown in the appendix Figure 6 and Figure 7 shown, the cooperation mode between the driven sprocket wheel 59 and the driving dial 58 can be that the driven sprocket wheel 59 is provided with a plurality of radial grooves 591, and the driving dial 58 is provided with cylindrical pins 581. During the process of the driving gear 55 driving the driving dial 58 to rotate, the cylindrical pins 581 sequentially enter the radial grooves 591. The cooperation mode between the driving dial 58 and the driving gear 55 can be that the driving gear 55 is coaxially provided with a first linkage gear 56, the driving dial 58 is coaxially provided with a second linkage gear 57, and the second linkage gear 57 is meshed and connected with the first linkage gear 56.

[0033] As shown in the appendix Figures 6 to 8 shown, when the driving gear 55 drives the driving dial 58 to rotate through the first linkage gear 56 and the second linkage gear 57 until the cylindrical pin 581 enters the radial groove 591, the cylindrical pin 581 pushes the radial groove 591 to drive the driven sprocket wheel 59 to rotate. At this time, the placement disk 2 rotates to realize the position conversion of the memory chip 6. When the cylindrical pin 581 on the driving dial 58 does not enter the radial groove 591 of the driven sprocket wheel 59, the driven sprocket wheel 59 drives the placement disk 2 to stop, and at this time, the memory chip 6 pauses the test.

[0034] It is worth mentioning that the transmission ratio between the driving gear 55 and the eccentric turntable 46 is 1:2, and the transmission ratio between the driving gear 55 and the driven sprocket wheel 59 is 1:4. That is, when the driving gear 55 rotates one circle, the eccentric turntable 46 rotates half a circle, while the driven sprocket wheel 59 only rotates one quarter of a circle. Thus, the eccentric turntable 46 is arranged on the side surface of the cross beam 122 to rotate intermittently by 180 degrees, and the placement disk 2 is located in the installation groove 11 to rotate intermittently by 90 degrees. By using the transmission ratio between the eccentric turntable 46 and the placement disk 2, when the pressing block 3 moves left and right and descends reciprocally, the pressing block 3 can sequentially press the memory chip 6 placed in the groove 21 of the placement disk 2 downward for positioning and testing.

[0035] Further, the linkage mechanism 5 further includes a concave locking arc 592 and a convex locking arc 582. The driven sprocket 59 is provided with a plurality of concave locking arcs 592, and one concave locking arc 592 is provided between adjacent radial grooves 591. The driving dial 58 is provided with a convex locking arc 582. During the rotation of the driving dial 58, the convex locking arc 582 sequentially engages with the concave locking arcs 592. When the cylindrical pin 581 on the driving dial 58 does not enter the radial groove 591 of the driven sprocket 59, since the concave locking arc 592 of the driven sprocket 59 is engaged by the convex locking arc 582 of the driving dial 58, the driven sprocket 59 does not move. When the cylindrical pin 581 just enters the radial groove 591 of the driven sprocket 59, at this time the concave locking arc 592 is just released. Thereafter, the driven sprocket 59 is driven by the cylindrical pin 581 to rotate. When the cylindrical pin 581 leaves the radial groove 591 on the other side, the concave locking arc 592 is engaged again, and the driven sprocket 59 stops moving again. Until the cylindrical pin 581 enters another radial groove 591 of the driven sprocket 59 again, the above-mentioned movement is repeated. Among them, the cooperation of the concave locking arc 592 and the convex locking arc 582 can lock the driven sprocket 59 to prevent the driven sprocket 59 from rotating due to inertia.

[0036] In summary, the testing method of the testing device of the present invention can be as follows: Place a memory particle 6 to be tested on the placement plate 22 in the groove 21 on the front side of the placement plate 2; Drive the driving gear 55 to rotate so that the driving dial 58 rotates until the cylindrical pin 581 enters the radial groove 591, thereby driving the driven sprocket 59 and the placement plate 2 to rotate 90 degrees until the memory particle 6 is located on the left side of the placement plate 2, facing the spring needle. At the same time, the driving gear 55 meshes with the intermittent gear 54, thereby driving the eccentric turntable 46 to rotate 180 degrees until the pressing block 3 moves to the left side of the placement plate 2 and vertically pushes down the placement plate 22 and the memory particle 6 to be tested, so that the spring needle contacts the memory particle 6 for testing. At the same time, the cylindrical pin 581 leaves the radial groove 591 on the other side. Therefore, the driven sprocket 59 and the placement plate 2 are stationary so that the memory particle 6 does not rotate relative to the base 1, and the first arc surface 541 contacts the second arc surface 551. Therefore, the eccentric turntable 46 is stationary so that the pressing block 3 does not move up and down and move relative to the base 1; When the memory particle 6 to be tested is being tested, place another memory particle 6 to be tested on the placement plate 22 in the groove 21 on the rear side of the placement plate 2; When the driving gear 55 rotates until the cylindrical pin 581 of the active dial 58 enters another radial groove 591 of the driven sprocket 59, and after the driving gear 55 meshes with the intermittent gear 54 again, the driven sprocket 59 and the placement plate 2 are driven to rotate 90 degrees again until the tested memory chip 6 is located at the rear side of the placement plate 2. During this process, another memory chip 6 to be tested moves to the right side of the placement plate 2. The eccentric turntable 46 rotates 180 degrees again until the pressing block 3 moves to the right side of the placement plate 2, pushing the placement plate 22 and another memory chip 6 to be tested vertically downward, making the spring pins contact the memory chip 6 for testing. At the same time, the cylindrical pin 581 leaves the radial groove 591 on the other side. Therefore, the driven sprocket 59 and the placement plate 2 remain stationary, so that the memory chip 6 does not rotate relative to the base 1, and the first arc surface 541 contacts the second arc surface 551. Therefore, the eccentric turntable 46 remains stationary, so that the pressing block 3 does not lift or move relative to the base 1; When testing another memory chip 6 to be tested, the tested memory chip 6 on the rear side of the placement plate 2 is taken out, and at the same time, a new memory chip 6 to be tested is placed on the placement plate 22 in the groove 21 on the front side of the placement plate 2.

[0037] From the above working method, it can be seen that the present invention drives the active dial 58 to rotate and the intermittent gear 54 to rotate intermittently by the driving gear 55, realizes the intermittent rotation of the driven sprocket 59 and the eccentric turntable 46, thereby causing the placement plate 2 to rotate, rotating the memory chip 6 to be tested placed on the front or rear side of the placement plate 2 to the left or right side of the placement plate 2. At the same time, the eccentric turntable 46 rotates, moving the pressing block 3 to the left or right side of the placement plate 2, and vertically pushing down the placement plate 22 and the memory chip 6 to be tested, making the spring pins contact the memory chip 6 for testing, and after testing, rotating to the rear or front side of the placement plate 2 to facilitate the tester to remove the memory chip 6 that has completed the test. At the same time, the front or rear side of the placement plate 2 can also place another memory chip 6 to be tested again. Thus, it can be seen that the present invention can realize the testing of the memory chip 6 on the left and right sides of the placement plate 2, while taking and placing the memory chip 6 to be tested at the front and rear of the placement plate 2, and the horizontally pressing block 3 that vertically descends during the testing process can ensure that the memory chip 6 can be balanced in force, ensuring that each detection point of the memory chip 6 and each spring pin are in close contact, and avoiding damage or displacement of the memory chip 6 due to uneven force, resulting in test errors.

[0038] In addition, as shown in the Figure 1 attachment, a cover 13 can be provided above the base 1. The cover 13 covers the base 1, the placement plate 2, the pressing block 3, the reciprocating mechanism 4 and the linkage mechanism 5, playing a role of isolation and protection. At the same time, openings are provided on the front and rear sides of the cover 13, which facilitate the taking and placing of the memory chip 6 on the front and rear sides of the placement plate 2.

[0039] The above are only the specific embodiments of the present invention, but the design concept of the present invention is not limited thereto. Any non-substantive modification of the present invention using this concept shall fall within the scope of infringement of the protection scope of the present invention.

Claims

1. A memory particle testing device, characterized in that, The test device includes: a base, on the upper surface of which there is an installation groove, above which a bracket is spanned. The bracket includes a cross beam and two vertical beams vertically connected to both ends of the cross beam, and the bottom ends of the two vertical beams are both connected to the upper surface of the base; a placement plate, which is intermittently rotated in the installation groove. Four grooves penetrate the upper surface of the placement plate, and the four grooves are symmetrically arranged. And a placement board is provided in each of the grooves. The placement board is connected to the placement plate through an elastic member. The placement board is used for placing memory particles, and a number of through holes penetrate the placement board, and the positions of the through holes correspond to the positions of the memory particle test points; a pressing block, which is horizontally reciprocated left and right and lifted above the placement plate. When the pressing block is at the left and right extreme positions, the pressing block pushes the placement board downward; a reciprocating mechanism, which includes a T-shaped frame, a first connecting rod, a second connecting rod, a third connecting rod, an eccentric turntable, a collar and a fourth connecting rod. The bottom end of the T-shaped frame is connected to the pressing block. The first ends of the first connecting rod and the second connecting rod are respectively hinged to both ends of the T-shaped frame, and the ends of the first connecting rod and the second connecting rod are both hinged to the side surface of the cross beam. An eccentric turntable is coaxially provided at the end of the second connecting rod. The rotating shaft of the eccentric turntable is eccentrically arranged, and the eccentric turntable is intermittently rotated on the side surface of the cross beam. A collar is sleeved on the outer circumference of the eccentric turntable. The collar is rotated on the outer circumference of the eccentric turntable, and a fourth connecting rod is connected to the outer circumference of the collar. The fourth connecting rod is hinged to the end of the third connecting rod. The end of the first connecting rod is coaxially connected to the first end of the third connecting rod; a linkage mechanism, which includes an intermittent gear, a driving gear, a driving dial and a driven sprocket. The intermittent gear is rotated on the side surface of the vertical beam. The driving gear is rotated on the base. The intermittent gear and the driving gear cooperate. The driving gear is used to drive the intermittent gear to rotate intermittently, and the intermittent gear is used to drive the eccentric turntable to rotate. The driven sprocket and the driving dial cooperate and are both rotated in the base. The driving gear is used to drive the driving dial to rotate. The driving dial is used to drive the driven sprocket to rotate intermittently, and the driven sprocket is coaxially arranged with the placement plate; Wherein, both the intermittent gear and the driving gear are incomplete gears. The part of the intermittent gear lacking teeth forms a first arc surface, and the part of the driving gear lacking teeth forms a second arc surface. When the first arc surface contacts the second arc surface during the rotation of the driving gear, the intermittent gear stops. When the driving gear meshes with the intermittent gear, the intermittent gear drives the pressing block to horizontally reciprocate left and right and lift through the eccentric turntable; The driven sprocket is provided with a number of radial grooves, and the driving dial is provided with a cylindrical pin. During the process of the driving gear driving the driving dial to rotate, the cylindrical pin sequentially enters the radial grooves, so that the cylindrical pin pushes the radial grooves to drive the driven sprocket and the placement plate to rotate; A PCB board, a main control chip, an interface and a spring pin are installed on the PCB board in the base. The spring pin and the interface are electrically connected to the main control chip respectively. Two spring pins are arranged in the base. The spring pins are fixed at the bottom of the mounting groove of the base. The spring pins are arranged corresponding to the through holes and extend from the through holes when the pressure block moves the placement plate downward. The spring pins will contact the memory particles placed in the placement plate.

2. The memory die testing device according to claim 1, wherein: Both ends of the placement plate are provided with guide rods, and the two guide rods are connected to a limit plate after passing through the placement plate upward, and the two ends of the elastic member are respectively connected to the bottom surface of the limit plate and the upper surface of the placement plate, and the elastic member is sleeved on the outer side of the circumference of the guide rod.

3. The memory die testing device according to claim 1, wherein: The transmission ratio between the driving gear and the eccentric rotating disk is 1:2, and the transmission ratio between the driving gear and the driven sheave is 1:

4.

4. The memory die testing device according to claim 1, wherein: The linkage mechanism also includes a lever and a paddle. The lever is arranged on a side surface of the intermittent gear close to the driving gear, and the lever is arranged corresponding to the first arc surface. A paddle is provided on the upper surface of the driving gear, and the paddle is arranged corresponding to the second arc surface. When the first arc surface ends contacting with the second arc surface, the paddle moves the lever to make the driving gear mesh with the intermittent gear.

5. The memory die testing device according to claim 1, characterized in that: The linkage mechanism also includes a slave synchronous wheel coaxially arranged with the eccentric rotating disk, and a master synchronous wheel coaxially arranged with the intermittent gear, and the master synchronous wheel and the slave synchronous wheel are connected through the same synchronous belt.

6. The memory die testing device according to claim 1, wherein: The linkage mechanism further includes a first linkage gear coaxially arranged with the driving gear, and a second linkage gear coaxially arranged with the active dial, and the second linkage gear is meshingly connected with the first linkage gear.

7. The memory die testing device according to claim 1, wherein: The linkage mechanism also includes a concave locking arc and a convex locking arc. The driven groove wheel is provided with a plurality of the concave locking arcs, and each of the adjacent radial grooves is provided with a concave locking arc. The active dial is provided with the convex locking arc. During the rotation of the active dial, the convex locking arc sequentially clamps the concave locking arc.

8. The testing method of the memory chip testing device as claimed in claim 1 can be as follows: Placing a memory chip to be tested on the placement plate in the groove on the front side of the placement plate; The driving gear rotates to rotate the active dial until the cylindrical pin enters the radial groove, thereby driving the driven groove wheel and the placement disk to rotate until the memory particle is located on the left side of the placement disk, facing the spring pin, and at the same time the driving gear meshes with the intermittent gear, thereby driving the eccentric turntable to rotate until the pressure block moves to the left side of the placement disk, and pushes the placement plate and the memory particle to be tested downward, so that the spring pin contacts the memory particle for testing, and at the same time the cylindrical pin leaves the radial groove on the other side, so the driven groove wheel and the placement disk are stationary, so that the memory particle does not rotate relative to the base, and the first arc surface contacts the second arc surface, so the eccentric turntable is stationary, so that the pressure block does not rise or fall and move relative to the base; When the memory chip to be tested is being tested, another memory chip to be tested is placed on the placement plate in the groove at the rear side of the placement plate; After the drive gear rotates until the cylindrical pin of the active dial enters another radial groove of the driven sprocket wheel and the drive gear meshes with the intermittent gear again, the driven sprocket wheel and the placement plate are driven to rotate again by a certain degree until the memory particles after testing are located at the rear side of the placement plate. During this process, another memory particle to be tested moves to the right side of the placement plate. The eccentric turntable rotates again by a certain degree until the pressing block moves to the right side of the placement plate, pushing the placement plate and another memory particle to be tested downward so that the spring pins contact the memory particles for testing. At the same time, the cylindrical pin leaves the radial groove on the other side. Therefore, the driven sprocket wheel and the placement plate remain stationary so that the memory particles do not rotate relative to the base, and the first arc surface contacts the second arc surface. Therefore, the eccentric turntable remains stationary so that the pressing block does not lift or move relative to the base; When testing another memory particle to be tested, the tested memory particles on the rear side of the placement plate are taken out, and at the same time, new memory particles to be tested are placed on the placement plate in the groove on the front side of the placement plate.

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