A test board card, test system and test method for a hard disk backboard

Abstract

The application relates to the technical field of hardware testing, and discloses a test board card of a hard disk backboard, a test system and a test method, wherein a first transceiving interface on the server side in the test board card is used for receiving a control command sent by a server; a test instruction simulation module is used for generating a first test instruction according to the control command; a second transceiving interface on the server side is used for receiving a second test instruction sent by the server; and a controller is used for sending the first test instruction or the second test instruction to a transceiving interface on the hard disk backboard side, receiving first feedback information or second feedback information of the hard disk backboard, and feeding back to the server. Thus, the test of the hard disk backboard can be realized in two cases that the VPP and the I2C of the server can directly communicate with the hard disk backboard and cannot directly communicate with the hard disk backboard, so that the test board card can be applicable to various types of servers, and the server can be reused when the hard disk backboard is tested by using the test board card.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of hardware testing, in particular to a hard disk backboard test board, a test system and a test method. BACKGROUND

[0002] The hard disk backboard is a key component in servers and storage devices, mainly used to connect hard disks with mainboards or other controllers, while providing various functions to support the normal operation and management of hard disks, ensuring the safe storage and efficient transmission of data, and simplifying the maintenance and management of servers. Hard disk backboards are included in almost all servers, including AI servers. As an important part of the server, it is very important to ensure that the board card functions normally after the PCBA (Printed Circuit Board Assembly) factory production is completed. All types of hard disks supported, RAID (Redundant Array of Independent Disks) functions, indicator lights, temperature monitoring, FRU (Field Replaceable Unit) information, etc. need to be functionally checked to ensure that there are no abnormalities when assembled into a server.

[0003] In related technologies, a server mainboard adapted to the hard disk backboard to be tested is used as a carrier, and the power supply line, MCIO (Multi-Connector I / O) line, SATA (Serial Advanced Technology Attachment) line, I2C (Inter-Integrated Circuit) line, etc. on the hard disk backboard are connected to the corresponding interfaces on the mainboard. Through the test tool running in the OS (Operating System) on the server, it is detected whether the hard disk can be normally recognized, whether the RAID function is normal, whether the indicator light can be normally lit, whether the hard disk backboard temperature and hard disk temperature can be read, and whether the backboard FRU information can be read, etc. If another hard disk backboard to be tested is replaced, if this backboard is not adapted to the previous server mainboard, it cannot be tested on this test environment, and needs to be replaced with a mainboard adapted to the new hard disk backboard for testing. This results in various server mainboards as test tools in the factory, and different server mainboards cannot be reused, causing tooling waste. SUMMARY

[0004] In view of the above, the present application provides a hard disk backboard test board, a test system and a test method to solve the problem of tooling waste caused by the inability to reuse different server mainboards when testing hard disk backboards using server mainboards as carriers.

[0005] In a first aspect, the application provides a test board card of a hard disk backboard, comprising a first server-side transceiving interface, a test instruction simulation module, a second server-side transceiving interface and a controller, wherein the first server-side transceiving interface is configured to receive a control command sent by a server; the test instruction simulation module is connected with the first server-side transceiving interface and is configured to generate a first test instruction according to the control command; the second server-side transceiving interface is configured to receive a second test instruction sent by the server; the controller is connected with the test instruction simulation module and the second server-side transceiving interface and is configured to send the first test instruction to a hard disk backboard-side transceiving interface, receive first feedback information of the hard disk backboard and send the first feedback information to the test instruction simulation module, or send the second test instruction to the hard disk backboard-side transceiving interface, receive second feedback information of the hard disk backboard and send the second feedback information to the second server-side transceiving interface; the test instruction simulation module is further configured to receive the first feedback information sent by the controller and send the first feedback information to the server through the first server-side transceiving interface.

[0006] The test board card of the hard disk backboard provided by the application can realize the test of the hard disk backboard in both cases that the VPP (Virtual Pin Port) and I2C of the server cannot directly communicate with the hard disk backboard and the VPP and I2C of the server can directly communicate with the hard disk backboard, so that the test board card can be applied to various types of servers and the server motherboard can be reused when the hard disk backboard is tested by using the test board card.

[0007] In an optional implementation, the second server-side transceiving interface comprises a first I2C interface (i.e. a first internal integrated circuit interface) and a first VPP interface (i.e. a first virtual pin interface); and the hard disk backboard-side transceiving interface comprises a second I2C interface (i.e. a second internal integrated circuit interface) and a second VPP interface (i.e. a second virtual pin interface).

[0008] Thus, the test of various functions of the hard disk backboard can be realized.

[0009] In an optional embodiment, the test board of the hard disk backboard further comprises a server-side MCIO interface (i.e., a server-side multi-connector input and output interface), a bandwidth expansion module, and a server-side Slimline interface (i.e., a server-side slimline interface), wherein the server-side MCIO interface is configured to receive a first PCIE signal (i.e., a first peripheral component interconnect express signal) sent by the server; the bandwidth expansion module is connected to the server-side MCIO interface and configured to perform bandwidth expansion on the first PCIE signal to obtain a second PCIE signal (i.e., a second peripheral component interconnect express signal) and send the second PCIE signal to a hard disk-side MCIO interface connected to the hard disk backboard; the server-side Slimline interface is configured to receive a sideband signal sent by the server; and the controller is further in communication with the server-side Slimline interface and configured to convert the sideband signal and distribute the converted sideband signal to a hard disk-side Slimline interface connected to the hard disk backboard.

[0010] Thus, the signals of the server are output externally through the MCIO interface, and the signals output by the server are decomposed into the first PCIE signal and the sideband signal. The purpose of decomposition is to adapt to the requirements of different projects on test versions. The output of each server mainboard MCIO interface may have differences in pin definition. Therefore, the input signals are separately decomposed into the PCIE signal and the sideband signal, and are respectively connected to the MCIO X8 interface and the Slimline interface of the test board. This facilitates flexible configuration and enhances the universality of the server platform.

[0011] In an optional embodiment, the test board of the hard disk backboard further comprises a server-side power supply interface and a power supply module; the server-side power supply interface is configured to receive electric energy; and the power supply module is connected to the power supply interface and configured to perform voltage conversion on the received electric energy and provide the voltage-converted electric energy to a hard disk-side power supply interface connected to the hard disk backboard.

[0012] Thus, different power supply requirements of different hard disk backboards can be individually matched with power supply outputs.

[0013] In an optional embodiment, the test board of the hard disk backboard further comprises a hot plug interface. The hot plug interface is connected to the controller and configured to receive a hard disk hot plug instruction; the controller is further configured to generate a first power-on / off instruction after obtaining the first hard disk hot plug instruction; and the power supply management module is located between the power supply module and the hard disk-side power supply interface and configured to control the power supply of the hard disk backboard to power off or power on after receiving the first power-on / off instruction.

[0014] The hot plug interface, the controller, and the power supply management module can complete the power-on and power-off operations of the hard disk backboard and realize the interruption and connection of the PCIE signal of the hard disk backboard.

[0015] In an alternative embodiment, the server-side first transceiver interface is further configured to receive a second hard disk hot plug instruction sent by the server; the test instruction simulation module is further configured to send the second hard disk hot plug instruction to the controller; the controller is further configured to generate a second power-on / off instruction after obtaining the second hard disk hot plug instruction; and the power supply management module is further configured to control the power supply of the hard disk backplane to power off or power on after receiving the second power-on / off instruction.

[0016] Thus, the server and the power supply management module can complete the power-on and power-off operations of the hard disk backplane, and realize the interruption and connection of the PCIE signal of the hard disk backplane.

[0017] In an alternative embodiment, the server-side Slimline interface is further configured to receive a clock signal sent by the server; and the test board of the hard disk backplane further comprises a clock module connected with the server-side Slimline interface, configured to convert the clock signal and distribute the clock signal to the hard disk-side Slimline interface.

[0018] The clock module can convert and distribute the CLK signal from the MCIO X8 interface of the server motherboard according to different hard disk backplanes, so that the test board can be applied to different hard disk backplanes.

[0019] In a second aspect, the application further provides a hard disk backplane test system, comprising a server, a hard disk backplane, and the hard disk backplane test board card of the first aspect and any embodiment of the first aspect, wherein the server and the hard disk backplane are connected with the hard disk backplane test board card.

[0020] In a third aspect, the application further provides a test method of a hard disk backplane, applied to a test board card, comprising the following steps: obtaining a control command sent by a server, generating a first test instruction according to the control command, sending the first test instruction to a hard disk backplane, receiving first feedback information of the hard disk backplane, and sending the first feedback information to the server; or obtaining a second test instruction sent by the server, sending the second test instruction to the hard disk backplane, receiving second feedback information of the hard disk backplane, and sending the second feedback information to the server.

[0021] In an alternative embodiment, the test method of the hard disk backplane further comprises the following steps: obtaining an inputted first hard disk hot plug instruction, generating a first power-on / off instruction according to the first hard disk hot plug instruction, and controlling the power supply of the hard disk backplane to power off or power on according to the first power-on / off instruction; or obtaining a second hard disk hot plug instruction sent by the server, generating a second power-on / off instruction according to the second hard disk hot plug instruction, and controlling the power supply of the hard disk backplane to power off or power on according to the second power-on / off instruction. BRIEF DESCRIPTION OF DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the specific embodiments of the present application or the prior art, the accompanying drawings needed to be used in the description of the specific embodiments or the prior art will be briefly introduced. Obviously, the accompanying drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0023] Figure 1 is a schematic diagram of a test tool used in the related art when a server adapted to the backplane of a hard disk to be tested is used to test the backplane of the hard disk to be tested;

[0024] Figure 2 is a schematic diagram of a test flow when a server adapted to the backplane of a hard disk to be tested is used to test the backplane of the hard disk to be tested in the related art;

[0025] Figure 3 is a schematic diagram of the structure of a hard disk backplane test board card according to an embodiment of the present application;

[0026] Figure 4 is a schematic diagram of the structure of an example of a hard disk backplane test board card according to an embodiment of the present application;

[0027] Figure 5 is a schematic diagram of the flow of a hard disk backplane test method according to an embodiment of the present application;

[0028] Figure 6 is a schematic diagram of the flow of a test method when multiple hard disk backplanes are tested according to an embodiment of the present application;

[0029] Figure 7 is a schematic diagram of the structure of an electronic device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the accompanying drawings of the embodiments of the present application. Obviously, the described embodiments are some embodiments of the present application, but not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0031] As described above, in the related art, a server adapted to a hard disk backboard to be tested is used to test the hard disk backboard to be tested. After the hard disk backboard to be tested is tested, another hard disk backboard to be tested is replaced. If the backboard is not adapted to the server mainboard in the previous test, it cannot be tested in this test environment, and a mainboard adapted to the new hard disk backboard needs to be replaced for testing. This results in that the factory has various server mainboards as test tools, and different server mainboards cannot be reused, causing tool waste. Figure 1 As shown in FIG. 1, a server mainboard A can be used to test hard disk backboard A1, hard disk backboard A2, …, and hard disk backboard An. A server mainboard B can be used to test hard disk backboard B1, hard disk backboard B2, …, and hard disk backboard Bn. A server mainboard C can be used to test hard disk backboard C1, hard disk backboard C2, …, and hard disk backboard Cn.

[0032] In addition, in the related art, when a server adapted to a hard disk backboard to be tested is used to test the hard disk backboard to be tested, the hard disk backboard cannot be directly hot-plugged. Figure 2 As shown in FIG. 2, when a hard disk backboard is tested and another hard disk backboard is replaced, the OS needs to be shut down, the server mainboard AC (Alternating Current, AC power) needs to be powered off, and after the new backboard is replaced, the server mainboard AC needs to be powered on and booted into the OS for testing. This results in that the entire test process takes a very long time and the test efficiency is not high.

[0033] Therefore, in the embodiment, a test board card for a hard disk backboard is provided, as shown in FIG. 3, which includes a server-side first transceiver interface, a test instruction simulation module, a server-side second transceiver interface, and a controller. Figure 3

[0034] The server-side first transceiver interface is configured to receive a control command sent by a server. The test instruction simulation module is connected to the server-side first transceiver interface and is configured to generate a first test instruction according to the control command. The server-side second transceiver interface is configured to receive a second test instruction sent by the server. The controller is connected to the test instruction simulation module and the server-side second transceiver interface and is configured to send the first test instruction to a hard disk backboard-side transceiver interface, receive first feedback information of the hard disk backboard, and send the first feedback information to the test instruction simulation module; or send the second test instruction to the hard disk backboard-side transceiver interface, receive second feedback information of the hard disk backboard, and send the second feedback information to the server-side second transceiver interface. The test instruction simulation module is further configured to receive the first feedback information sent by the controller and send the first feedback information to the server through the server-side first transceiver interface.

[0035] ​Specifically, the server-side second transceiver interface includes a first I2C interface and a first VPP interface; the hard disk backplane-side transceiver interface includes a second I2C interface and a second VPP interface.

[0036] In this embodiment of the application, whether the indicator lights in the hard disk backplane test can be lit normally, whether the hard disk backplane temperature and hard disk temperature can be read, and whether the backplane FRU information can be read are all obtained through I2C and VPP using specific commands.

[0037] I2C is a synchronous serial communication protocol designed for short-distance communication, typically used between different integrated circuits on the same circuit board. The I2C bus requires only two signal lines: a data line (SDA) and a clock line (SCL), both of which are bidirectional.

[0038] VPP is used for hot-swappable PCIe management.

[0039] like Figure 4 As shown, the USB interface on the left side of the test board is the first transceiver interface on the server side; the I2C interface and VPP interface on the left side of the test board are the second transceiver interfaces on the server side; and the I2C interface and VPP interface on the right side of the test board are the transceiver interfaces on the hard drive backplane side. Figure 4 The controller chipset mentioned above refers to the controller.

[0040] During the testing of the hard disk backplane, compatibility issues arose between the server and the hard disk backplane due to inconsistencies in command rules defined by different projects and CPU platforms. These issues included two scenarios: the server's VPP and I2C could communicate directly with the hard disk backplane, while the server's VPP and I2C could not communicate directly with the hard disk backplane.

[0041] When the server's VPP and I2C cannot directly communicate with the hard drive backplane, the server-side first transceiver interface on the test board receives control commands sent by the server. The test command simulation module generates a first test command based on the control commands. The controller sends the first test command to the hard drive backplane-side transceiver interface, receives the first feedback information from the hard drive backplane, and sends the first feedback information to the test command simulation module. The test command simulation module also sends the first feedback information to the server through the server-side first transceiver interface. In other words, the server needs to transmit control commands to the test board via a USB interface, and the test command simulation module simulates VPP and I2C commands based on the control commands, then uses the simulated I2C and VPP commands to access the hard drive backplane.

[0042] When the VPP and the I2C of the server can directly communicate with the hard disk backboard, the server-side second transceiver interface in the test board card receives the second test instruction sent by the server, the controller sends the second test instruction to the hard disk backboard-side transceiver interface, receives the second feedback information of the hard disk backboard, and sends the second feedback information to the server-side second transceiver interface. The controller plays a signal transmission role, and at this time, it is equivalent to that the server directly communicates with the hard disk backboard.

[0043] Therefore, the test board card of the hard disk backboard provided by the embodiment of the application can realize the test of the hard disk backboard in two cases that the VPP and the I2C of the server cannot directly communicate with the hard disk backboard and the VPP and the I2C of the server can directly communicate with the hard disk backboard, so that the test board card can be applicable to various types of servers, and further, the server mainboard can be reused when the test board card is used to test the hard disk backboard.

[0044] Further, the controller is provided with an ADM (Adaptive Diagnostic Module, adaptive diagnostic module).

[0045] The adaptive diagnostic module can analyze the first feedback information and / or the second feedback information, determine whether there is a potential fault (such as a signal integrity problem, a power supply anomaly, a connection failure, etc.), and obtain an analysis result. Further, a diagnostic report can be generated according to the analysis result and uploaded to the server. Therefore, the test board card is no longer a “repeater”, but a “smart agent” with autonomous judgment ability, which can improve fault positioning efficiency and reduce the need for manual intervention.

[0046] In addition, the hard disk backboard to be tested has SATA and NVME two modes of hard disks, the SATA hard disk mode is recognized through a RAID card. The data transmission of the NVME hard disk mode needs a PCIE signal. Based on this, in an optional implementation manner, the test board card of the hard disk backboard further includes a server-side MCIO interface, a bandwidth expansion module, and a server-side Slimline interface.

[0047] The server-side MCIO interface is used to receive the first PCIE signal sent by the server. The bandwidth expansion module is connected with the server-side MCIO interface and is used to perform bandwidth expansion on the first PCIE signal to obtain a second PCIE signal and send the second PCIE signal to a hard disk-side MCIO interface connected with the hard disk backboard. The server-side Slimline interface is used to receive a sideband signal sent by the server. The controller is further in communication with the server-side Slimline interface and is used to convert the sideband signal and distribute the sideband signal to a hard disk-side Slimline interface connected with the hard disk backboard.

[0048] The sideband signal refers to a general term of other signals except PCIE link, CLK clock and the like, and usually contains some low-speed signals of the to-be-tested hard disk backplane such as in-bit signal, I2C, power-on feedback, address signal, ID and the like. The sideband signal from the server is only one group and is fixed, needs to be adapted to the communication with the sideband signal in the MCIO interface expanded in the hard disk backplane, and there is a one-to-many situation and the communication cannot be directly performed. The controller needs to specify the sideband signal from the server to communicate with which MCIO interface first according to the communication requirement, so as to ensure the normal communication of the sideband of all MCIO interfaces.

[0049] As shown in Figure 4 , the MCIO X8 interface on the left side of the test board card is the server-side MCIO interface; the MCIO X8 interface on the right side of the test board card is the hard disk-side MCIO interface; the Slimline interface on the left side of the test board card is the server-side Slimline interface; and the Slimline interface on the right side of the test board card is the hard disk-side Slimline interface. The PEX89072 chip set is a bandwidth expansion module, which can expand the PCIE X8 signal from the server motherboard into PCEI X64 or higher bandwidth through the SW chip, and is used to provide PCIE signal for the standard PCIE interface on the test board and the hard disk backplane.

[0050] As shown in Figure 4 , the server signal is outputted through the MCIO interface, the PCIE signal decomposed through the cable A is connected to the MCIO X8 interface on the left side of the test board card, and the sideband signal decomposed through the cable A is connected to the Slimline interface on the left side of the test board card. The purpose of decomposing through the cable A is to adapt to the requirements of different projects on the test version. The MCIO interface output of each server motherboard may have differences in the pin definition, so the input source signal is separately decomposed into PCIE signal and sideband signal and connected to the MCIO X8 interface and the Slimline interface of the test board card respectively, so as to facilitate flexible configuration and enhance the universality of the server platform. After the bandwidth expansion module expands the PCIE signal, it is also decomposed into MCIO+slimline interface according to the same design idea, and then connected to the to-be-tested hard disk backplane through the cable A, so as to achieve the effect of adapting to the test of different hard disk backplanes.

[0051] In an optional embodiment, the test board card of the hard disk backplane further comprises a server-side power supply interface and a power supply module.

[0052] The server-side power supply interface is used to receive electric energy; the power supply module is connected with the power supply interface and is used to convert the received electric energy into voltage and provide the electric energy converted into voltage to the hard disk-side power supply interface connected with the hard disk backplane.

[0053] As Figure 4 shown, the power supply interface on the left side of the test board card is a server-side power supply interface. The 12V power module, 5V power module, and 3V power module are power supply modules. The server-side power supply interface is connected with a receiving external power supply interface, and can also be connected with a power supply interface of a server mainboard. The power supply modules can convert 12V provided by the external or the server mainboard into 5V and 3V, so as to ensure the normal operation of the test board card when testing the hard disk backplane; and can be personalized to match the power supply output according to the power supply requirements of different hard disk backplanes.

[0054] In addition, in an optional embodiment, the server-side first transceiver interface is further configured to receive a second hard disk hot plug instruction sent by the server; the test instruction simulation module is further configured to send the second hard disk hot plug instruction to the controller; the controller is further configured to generate a second power-on / off instruction after obtaining the second hard disk hot plug instruction; and the power supply management module is further configured to control the power supply of the hard disk backplane to be powered off or powered on after receiving the second power-on / off instruction.

[0055] As Figure 4 shown, the eFuse chip set is the power supply management module.

[0056] Therefore, the server and the power supply management module can complete the power-on and power-off operations of the hard disk backplane, and realize the PCIE signal interruption and connection of the hard disk backplane.

[0057] Further, the test board card of the hard disk backplane further comprises a hot plug interface. The hot plug interface is connected with the controller and is configured to receive a hard disk hot plug instruction; the controller is further configured to generate a power-on / off instruction after obtaining the hard disk hot plug instruction; and the power supply management module is located between the power supply module and the hard disk-side power supply interface, and is configured to control the power supply of the hard disk backplane to be powered off or powered on after receiving the power-on / off instruction.

[0058] As Figure 4 shown, the trigger hot plug button on the left side of the test board card is the hot plug interface. The hot plug button can inform the controller module to complete the power-on and power-off operations of the hard disk backplane, and realize the PCIE signal interruption and connection of the hard disk backplane.

[0059] In an optional embodiment, the test board card of the hard disk backplane further comprises a server-side Slimline interface. The server-side Slimline interface is further configured to receive a clock signal sent by the server. Thus, the clock signal can be provided when the test board card is used to test the hard disk backplane.

[0060] Further, the test board card of the hard disk backplane further comprises a clock module, which is connected with the server-side Slimline interface and is configured to convert the clock signal and distribute the clock signal to the hard disk-side Slimline interface.Figure 4 The CLK chipset in the test board is the clock module. The CLK chipset can convert and distribute the CLK signal from the MCIO X8 interface of the server motherboard according to different hard drive backplanes, so that the test board can be used with different hard drive backplanes.

[0061] In summary, in the hard disk backplane test board provided in this embodiment, the controller can perform the following functions: receive data from the server-side first transceiver interface (e.g., ...). Figure 4 The USB port on the left side of the test board) and the test command simulation module (e.g.) Figure 4 The test board receives I2C or VPP commands from the USB chipset on the left side of the test board, processes the commands, sends them to the hard drive backplane, and receives the first feedback information from the hard drive backplane. This feedback is then relayed to the server motherboard via the server-side first transceiver interface and the test command simulation module. Alternatively, it can be sent directly via the server-side second transceiver interface (e.g., ...). Figure 4 The test board on the left side (using the I2C and VPP interfaces) receives commands from the server, transmits them to the hard drive backplane, and then transmits the second feedback information from the hard drive backplane to the motherboard through the server-side second transceiver interface; it also receives commands from hot-swappable interfaces (e.g., ...). Figure 4 The test board (with the hot-swap button on the left) or the USB module's hot-swap command can be used to power on or off the hard drive backplane, and interrupt or reconnect the PCIe signal; it can also receive hot-swap commands from the server-side first transceiver interface and the test command simulation module to power on or off the hard drive backplane, and interrupt or reconnect the PCIe signal; it can also receive hot-swap commands from the server-side MCIO interface (e.g., the hot-swap button on the left side of the test board) or the USB module's hot-swap command to achieve the same effect. Figure 4 The sideband signal of the MCIO X8 interface on the left side of the test board is converted and distributed according to different hard drive backplanes, and given to the hard drive-side MCIO interface of the hard drive backplane (e.g., Figure 4 The MCIOX8 interface on the right side of the test board (in the test board).

[0062] The server-side first transceiver interface and test command simulation module can achieve the following functions: The server motherboard receives commands through the server-side first transceiver interface (e.g., ...). Figure 4 The USB port on the left side of the test board) and the test command simulation module (e.g.) Figure 4 The USB chipset on the left side of the test board communicates with the controller module of the test board, and then communicates with the hard drive backplane through the controller to trigger the hot-plug operation of the hard drive backplane, realize I2C communication with the hard drive backplane, and realize VPP communication with the hard drive backplane.

[0063] On the basis of the hard disk backboard test board card, the embodiment of the application provides a hard disk backboard test system. The hard disk backboard test system comprises a server, a hard disk backboard and the hard disk backboard test board card. The server and the hard disk backboard are connected with the hard disk backboard test board card.

[0064] Specifically, the server is connected with the server side interface of the test board card. The server side interface comprises a server side first transceiving interface, a server side second transceiving interface, a server side MCIO interface, a server side Slimline interface and a server side power supply interface. The hard disk backboard is connected with the hard disk side interface of the test board card. The hard disk side interface comprises a hard disk backboard side transceiving interface, a hard disk side MCIO interface, a hard disk side Slimline interface and a hard disk side power supply interface.

[0065] On the basis of the hard disk backboard test board card, the embodiment of the application further provides a test method of the hard disk backboard. The test method comprises the following steps: after the hard disk backboard test board card, the server and the current hard disk backboard are connected, the current hard disk backboard is tested; after the current hard disk backboard is tested, a hard disk hot plug instruction is input on the test board card.

[0066] Specifically, the embodiment provides a test method of the hard disk backboard. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a group of computer executable instructions. Although the logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0067] In the embodiment, a test method of the hard disk backboard is provided, which can be used for the test board card. Figure 5 The flowchart of the test method of the hard disk backboard according to the embodiment of the application is shown in FIG. 5, which comprises the following steps: Figure 5

[0068] Step S501: obtaining a control command sent by the server, and generating a first test instruction according to the control command.

[0069] Step S502: sending the first test instruction to the hard disk backboard.

[0070] Step S503: receiving first feedback information of the hard disk backboard, and sending the first feedback information to the server.

[0071] Figure 5 The test method of the hard disk backboard can be replaced by the following steps: obtaining a second test instruction sent by the server; sending the second test instruction to the hard disk backboard; receiving second feedback information of the hard disk backboard, and sending the second feedback information to the server.

[0072] ​In a further embodiment, the method for testing the hard disk backplane further comprises the steps of: obtaining the first hard disk hot plug instruction sent by the input; generating the first power on / off instruction according to the first hard disk hot plug instruction, and controlling the power supply of the hard disk backplane to power off or power on according to the first power on / off instruction.

[0073] In another further embodiment, the method for testing the hard disk backplane further comprises the steps of: obtaining the second hard disk hot plug instruction sent by the server; generating the second power on / off instruction according to the second hard disk hot plug instruction, and controlling the power supply of the hard disk backplane to power off or power on according to the second power on / off instruction.

[0074] In actual testing, after the current hard disk backplane is tested, the method for testing the hard disk backplane further comprises the steps of: determining whether the next hard disk backplane is of the same type as the current hard disk backplane; when the next hard disk backplane is of the same type as the current hard disk backplane, connecting the test board card, the server and the next hard disk backplane, and inputting the hard disk hot plug instruction on the test board card; and when the next hard disk backplane is not of the same type as the current hard disk backplane, replacing the test fixture to fix the next hard disk backplane, connecting the test board card, the server and the next hard disk backplane, and inputting the hard disk hot plug instruction on the test board card.

[0075] As shown in Figure 6 , the method for testing a plurality of hard disk backplanes comprises the following steps:

[0076] (1) If the test device of the present application is used for the first time, the hard disk backplane to be tested, the matching tooling and the corresponding test fixture module are installed first;

[0077] (2) After installation, the server AC is powered on to boot into the OS;

[0078] (3) The function test of the current hard disk backplane is performed under the OS;

[0079] (4) After the test is completed, the operator manually triggers the hard disk backplane hot plug button, or sends a serial port command to the test card in the present application under the OS to trigger the power off and PCIE signal interruption of the hard disk backplane;

[0080] (5) The tested hard disk backplane is removed, and it is determined whether the same type of hard disk backplane or other different types of hard disk backplane is to be tested;

[0081] (6) If it is the same type of hard disk backplane, the hard disk backplane and the matching tooling are installed, the operator manually triggers the hot plug button, or sends a serial port command under the OS to trigger the PCIE signal connection and power on of the hard disk backplane, and the function test is performed;

[0082] (7) If the hard disk backplane is not of the same type, first remove the original hard disk backplane fixture module and replace it with a new hard disk backplane test fixture module, install the hard disk backplane and supporting tooling, and the operator manually triggers the hot plug button or sends a serial port command under the OS to trigger the PCIE signal connection and power-on of the hard disk backplane, and performs function testing;

[0083] (8) Repeat the test steps (3)-(7) above.

[0084] As can be seen, when testing the hard disk backplane using the above test board card, the OS in the server mainboard is always in a powered-on state, and there is no need to power on and off each time the hard disk backplane is replaced, saving test time and improving test efficiency. Moreover, when testing the hard disk backplane using the above test board card, the server mainboard serves as a public module, and can remain stationary when different hard disk backplanes are replaced, only the hard disk backplane related modules need to be replaced, the test tooling has high reusability, the test fixture main body can be reused, only the hard disk backplane related test fixture modules need to be developed when developing subsequent test fixtures, the storage test fixture has low space cost, and the cost of new test fixtures is low.

[0085] In summary, the test board card, test system and test method for the hard disk backplane provided by the embodiments of the present application have the following beneficial effects:

[0086] (1) Various server mainboards are no longer needed, saving tooling costs;

[0087] (2) The server mainboard does not need to be frequently powered on and off to replace the board under test, greatly saving test time and improving test efficiency;

[0088] (3) The reusability of the main part of the FCT (Functional Circuit Test) test fixture is improved, only the hard disk backplane related test fixture modules need to be developed, reducing the design complexity of the test fixture;

[0089] (4) The number of FCT test fixtures is reduced, the cost of test fixtures is reduced, the space occupied by FCT test fixtures is reduced, and the space cost is reduced;

[0090] (5) The number of FCT test fixtures is reduced, the test machine is also reduced, and the cost of the production line test machine is reduced.

[0091] The test board, test system and test method of the hard disk backboard of the application do not need to use various server mainboards and tooling, thereby reducing the test tooling cost; the application realizes hot plugging of the hard disk backboard and matching tooling, realizes that the server mainboard AC does not need to be powered on and off and the server does not need to be started when the hard disk backboard is replaced, thereby saving test time; the server mainboard can be reused, the FCT test fixture main part can be reused, only the FCT test fixture module related to the hard disk backboard needs to be developed, thereby saving the test fixture cost; the application realizes decoupling of the hard disk backboard and the server mainboard, including power supply, I2C, VPP and the like, thereby solving the problem that the server mainboard and the hard disk backboard need to be adapted to be tested; the FCT test fixture reusability is improved, the space utilization is improved, and the storage cost and test machine cost are reduced.

[0092] Through the description of the above embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be realized by means of software and the necessary general hardware platform, of course, it can also be realized by hardware, but in many cases, the former is a better embodiment.

[0093] The embodiment of the application further provides a hard disk backboard test device, and the features of the hard disk backboard test device corresponding to the embodiment are described with reference to the related description of the embodiment of the hard disk backboard test method. Figure 5 The related description of the embodiment of the method is not repeated here.

[0094] The embodiment of the application further provides an electronic device, as shown in the figure, comprising a memory 10 and a processor 20, the memory 10 stores a computer program, and the processor 20 is configured to run the computer program to execute the steps in any of the above hard disk backboard test method embodiments. Figure 7

[0095] The embodiment of the application further provides a computer readable storage medium, which stores a computer program, wherein the computer program is configured to execute the steps in any of the above hard disk backboard test method embodiments when running.

[0096] In an exemplary embodiment, the above computer readable storage medium can include but is not limited to: a U disk, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic or optical disk and various media that can store computer programs.

[0097] The embodiment of the application further provides a computer program product, the above computer program product comprises a computer program, and the computer program is executed by a processor to realize the steps in any of the above hard disk backboard test method embodiments.​

[0098] The embodiment of the present application further provides another computer program product, comprising a nonvolatile computer readable storage medium, and the nonvolatile computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps in any of the above-mentioned hard disk backboard testing method embodiments.

[0099] Those skilled in the art can further realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized in electronic hardware, computer software or a combination of both. In order to clearly illustrate the interchangeability of hardware and software, the components and steps of each example have been described in the above description in a general manner. Whether the functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0100] The above describes in detail the test board card, test system and test method of the hard disk backboard provided by the present application. The principles and implementation manners of the present application are described by applying specific examples in the present application. The above description of the embodiments is only used to help understand the method of the present application and its core idea. It should be pointed out that, for those skilled in the art, without departing from the principles of the present application, some improvements and modifications can be made to the present application, and these improvements and modifications also fall within the protection scope of the claims of the present application.

Claims

1. A test board for a hard drive backplane, characterized in that, include: The first transceiver interface on the server side is used to receive control commands sent by the server. A test command simulation module is connected to the first transceiver interface on the server side and is used to generate a first test command according to the control command. The server-side second transceiver interface is used to receive the second test command sent by the server. The controller, connected to the test command simulation module and the server-side second transceiver interface, is used to send the first test command to the hard disk backplane-side transceiver interface, receive the first feedback information from the hard disk backplane, and send the first feedback information to the test command simulation module; or send the second test command to the hard disk backplane-side transceiver interface, receive the second feedback information from the hard disk backplane, and send the second feedback information to the server-side second transceiver interface. The test instruction simulation module is also used to receive the first feedback information sent by the controller and send the first feedback information to the server through the first transceiver interface on the server side; Also includes: The server-side multi-connector input / output interface is used to receive the first peripheral component interconnection high-speed signal sent by the server. A bandwidth expansion module, connected to the server-side multi-connector input / output interface, is used to expand the bandwidth of the first peripheral component interconnect high-speed signal to obtain a second peripheral component interconnect high-speed signal, and send the second peripheral component interconnect high-speed signal to the hard disk-side multi-connector input / output interface connected to the hard disk backplane; A server-side slim interface is used to receive sideband signals sent by the server, wherein the sideband signals are a general term for signals other than PCIe link and CLK clock; The controller is also connected to the server-side slim interface for converting the sideband signal and distributing it to the hard drive-side slim interface connected to the hard drive backplane. The server-side second transceiver interface includes a first internal integrated circuit interface and a first virtual pin interface; the hard disk backplane-side transceiver interface includes a second internal integrated circuit interface and a second virtual pin interface; the test board can perform testing on the hard disk backplane in both cases where the server's VPP and I2C cannot communicate directly with the hard disk backplane and when the server's VPP and I2C can communicate directly with the hard disk backplane.

2. The test board for the hard disk backplane according to claim 1, characterized in that, Also includes: The server-side power supply interface is used to receive electrical energy. The power supply module, connected to the power supply interface, is used to convert the received electrical energy into voltage and provide the converted electrical energy to the hard drive-side power supply interface connected to the hard drive backplane.

3. The test board for the hard disk backplane according to claim 2, characterized in that, Also includes: A hot-swappable interface, connected to the controller, is used to receive a hot-swappable command for the first hard drive; The controller is further configured to generate a first power-on / off command after receiving the first hard disk hot-swap command; The power management module is located between the power supply module and the power supply interface on the hard drive side. It is used to control the power supply of the hard drive backplane to be turned off or on after receiving the first power-on / off command.

4. The test board for the hard disk backplane according to claim 3, characterized in that: The first transceiver interface on the server side is also used to receive a second hard disk hot-swap command sent by the server; The test command simulation module is also used to send the second hard disk hot-plug command to the controller; The controller is further configured to generate a second power-on / off command after receiving the second hard disk hot-swap command; The power management module is also used to control the power supply of the hard disk backplane to be turned off or on after receiving the second power-on / off command.

5. The test board for the hard disk backplane according to claim 1, characterized in that: The server-side slim interface is also used to receive clock signals sent by the server. The test board also includes: A clock module, which is connected to the server-side slim interface, is used to convert the clock signal and distribute it to the hard disk-side slim interface.

6. A hard disk backplane testing system, characterized in that, include: Test board for hard disk backplane as described in any one of claims 1 to 5; The server is connected to the test board. The hard drive backplane is connected to the test board.

7. A testing method for a hard disk backplane, applied to a test board for the hard disk backplane as described in any one of claims 1-5, characterized in that, include: Obtain the control command sent by the server, and generate a first test instruction based on the control command; Send the first test command to the hard drive backplane; Receive the first feedback information from the hard drive backplane and send the first feedback information to the server; or; Obtain the second test command sent by the server; Send the second test command to the hard drive backplane; The system receives the second feedback information from the hard drive backplane and sends the second feedback information to the server.

8. The method according to claim 7, characterized in that, Also includes: Get the first hard drive hot-swap command input; Generate a first power-on / off command based on the first hard drive hot-swap command, and control the power supply of the hard drive backplane to power off or on based on the first power-on / off command. or; Obtain the second hard drive hot-swap command sent by the server; The second power-on / off command is generated according to the second hard drive hot-swap command, and the power supply of the hard drive backplane is controlled to be turned off or on according to the second power-on / off command.

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