Single board testing device and method thereof

Abstract

The invention provides a single board testing device and a single board testing method. The single board testing device comprises a case and an upper computer, the case comprises a communication control board, an optical signal interface board and a data conversion board which are internally and sequentially connected; the communication control board is in communication connection with the upper computer; the upper computer is used for generating a test command according to the model of the board card to be detected; the display module is also used for receiving and displaying the test result uploaded by the communication control panel; the communication control board is used for generating a control signal according to the test command; the processor is also used for performing signal state judgment on the operation signal sent by the data conversion board to obtain a test result; the optical signal interface board is used for generating a test signal according to the received control signal; the to-be-detected board card is used for controlling the operation of the to-be-detected board card according to the received test signal and generating operation data; and the data conversion board is used for converting the received operation data into operation signals. By adopting the device, independent detection of the to-be-detected board card can be realized, and the consistency of quality inspection of the to-be-detected board card is improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of industrial control, and particularly relates to a test device and method for a single board. Background Art

[0002] High-voltage direct current (HVDC) transmission technology can achieve efficient transmission and utilization of electric power energy. Nearly 40 HVDC transmission projects have been built and put into operation successively, and multiple sending and receiving-end DC groups with dense drop points have been formed. As the core equipment of UHV DC transmission projects, the core control system of the converter valve equipment is the VBE equipment of the valve control system. As shown in Figure 1 wherein, VM is the wave recording host computer, LAN is the network cable, and the VBE equipment internally includes two communication and control chassis A, two communication and control chassis B, a wave recording host computer and a wave recording chassis. The two communication and control chassis A communicate with each other, and the two communication and control chassis B communicate with each other. The wave recording host computer and the wave recording chassis are connected by a network cable. Then, the whole VBE equipment is connected to the converter valve, which can realize the control and protection of the converter valve. At the same time, the VBE equipment itself should have a perfect self-check function.

[0003] To ensure the reliability of the VBE equipment, it is necessary to conduct inspection and testing on the VBE equipment's boards before and after the official commissioning of the boards to screen out early failure devices. The VBE equipment has a large number of boards, and the board testing needs to be mounted on the VBE equipment itself for testing. The testing work is complex, time-consuming, and there are problems such as missed inspections, misinspections, and increased time caused by the restriction of the personnel's quality inspection level. Summary of the Invention

[0004] To overcome the deficiencies of the above-mentioned prior art, in a first aspect, the present invention application proposes a test device for a single board, including: a chassis and a host computer; the chassis includes: a communication control board, an optical signal interface board, and a data conversion board connected in sequence; the communication control board is communicatively connected to the host computer; the host computer and the optical signal interface board are communicatively connected to the board to be detected;

[0005] The host computer is configured to generate a test command according to the model of the board to be detected and send it to the communication control board; and is also configured to receive and display the test result uploaded by the communication control board;

[0006] The communication control board is configured to generate a control signal according to the test command and send it to the optical signal interface board; and is also configured to perform signal state judgment on the operation signal sent by the data conversion board, obtain the test result, and upload it to the host computer;

[0007] The optical signal interface board is configured to generate a test signal according to the received control signal and send it to the board to be detected;

[0008] The board to be detected is used to control its own operation according to the received test signal, generate operation data and send it to the data conversion board;

[0009] The data conversion board is used to convert the received operation data into an operation signal and send it to the communication control board.

[0010] Preferably, the optical signal interface board includes an optical signal receiving board and an optical signal transmitting board;

[0011] The optical signal receiving board is used to receive the control signal;

[0012] The optical signal transmitting board is used to generate a test signal according to the control signal and send it to the board to be detected.

[0013] Preferably, the communication control board is specifically used to compare the received operation signal with the expected detection result; if the operation signal is consistent with the expected detection result, it is determined that the operation signal is a normal signal, otherwise it is determined that the operation signal is an abnormal signal; the fact that the operation signal is a normal signal or an abnormal signal is uploaded to the host computer as a test result.

[0014] Preferably, the chassis further includes a plurality of test interfaces; the plurality of test interfaces are respectively set to different interface shapes for connecting different models of boards to be detected.

[0015] Preferably, the host computer is specifically used to send the test command to the communication control board in the form of a data frame;

[0016] The data frame includes a frame header of the data frame, a total length of the data frame, a model of the board to be detected, a test command of the board to be detected, and test parameters of the board to be detected.

[0017] Preferably, there are multiple types of test commands, and each type of test command includes multiple test contents;

[0018] Each type of test command is represented by a different value; the test commands include electrical signals, frequency signals, pulse signals, and communication signals;

[0019] The electrical signals include a no-operation signal, a high-level signal, and a low-level signal; there are multiple types of frequency signals, and at least one of the intensity, frequency, and pulse width of the multiple frequency signals is different; there are multiple types of pulse signals, and at least one of the intensity, period, and pulse width of the multiple pulse signals is different: there are multiple types of communication signals, and the multiple communication signals are signals output by the board to be detected.

[0020] Preferably, the chassis further includes: a built-in power supply board, which is respectively connected to the communication control board, the optical signal interface board, the multiple test interfaces, and the data conversion board, and the power supply board supplies power to the communication control board, the optical signal interface board, the multiple test interfaces, and the data conversion board respectively.

[0021] Preferably, the device further includes: a drawer, a device switch, a chassis switch, and a host computer switch installed on the front of the device;

[0022] The input of the device switch is connected to industrial electricity, and the output is connected to the power supply board and the host computer;

[0023] The chassis switch is connected between the device switch and the power supply board;

[0024] The host computer switch is connected between the device switch and the host computer.

[0025] In a second aspect, the present invention application also proposes a method for testing a single board, which is applied to the single board testing device described above, and includes:

[0026] Using the host computer of the testing device, generate a test command according to the model of the board to be detected;

[0027] Using the communication control board of the testing device, generate a control signal according to the test command;

[0028] Using the optical signal interface board of the testing device, generate a test signal according to the control signal and send it to the board to be detected that is communicatively connected to the testing device; receive the operation data returned after the board to be detected controls its own operation according to the test signal;

[0029] Using the data conversion board of the testing device, convert the operation data into an operation signal;

[0030] Using the communication control board, judge the signal state of the operation signal to obtain a test result;

[0031] Using the host computer, display the test result.

[0032] Preferably, the step of using the communication control board to judge the signal state of the operation signal to obtain a test result includes:

[0033] Using the communication control board, compare the operation signal with the expected detection result; if the operation signal is consistent with the expected detection result, determine that the operation signal is a normal signal, otherwise determine that the operation signal is an abnormal signal; use the operation signal being a normal signal or an abnormal signal as the test result.

[0034] Preferably, the optical signal interface board includes an optical signal receiving board and an optical signal transmitting board;

[0035] The optical signal interface board using the test device generates a test signal according to the control signal and sends it to the board under test communicatively connected to the test device, including:

[0036] Using the optical signal receiving board to receive the control signal;

[0037] Using the optical signal transmitting board to generate a test signal according to the control signal and send it to the board under test.

[0038] Preferably, the chassis further includes a plurality of test interfaces; the plurality of test interfaces are respectively set to different interface shapes to connect boards under test of different models.

[0039] Preferably, after the host computer using the test device generates a test command according to the model of the board under test, it includes:

[0040] Using the host computer to convert the test command into the form of a data frame;

[0041] The data frame includes a frame header of the data frame, the total length of the data frame, the model of the board under test, the test command of the board under test, and the test parameters of the board under test.

[0042] Preferably, there are multiple types of test commands, and each type of test command includes multiple test contents;

[0043] Each type of test command is represented by a different value; the test commands include electrical signals, frequency signals, pulse signals, and communication signals;

[0044] The electrical signals include a no-operation signal, a high-level signal, and a low-level signal; there are multiple types of frequency signals, and at least one of the intensity, frequency, and pulse width of the multiple frequency signals is different; there are multiple types of pulse signals, and at least one of the intensity, period, and pulse width of the multiple pulse signals is different; there are multiple types of communication signals, and the multiple communication signals are the signals output by the board under test.

[0045] Preferably, the chassis further includes a built-in power supply board, and the power supply board is respectively connected to the communication control board, the optical signal interface board, the plurality of test interfaces, and the data conversion board, and the power supply board supplies power to the communication control board, the optical signal interface board, the plurality of test interfaces, and the data conversion board respectively.

[0046] Preferably, the device further includes: a drawer, a device switch, a chassis switch, and a host computer switch installed on the front of the device;

[0047] The device switch is input-connected to industrial electricity and output-connected to the power supply board and the host computer;

[0048] The chassis switch is connected between the device switch and the power supply board;

[0049] The host computer switch is connected between the device switch and the host computer.

[0050] In a third aspect, the present invention application also proposes an electronic device, including: at least one processor and a memory; the memory and the processor are connected by a bus;

[0051] The memory is used to store one or more programs;

[0052] When the one or more programs are executed by the at least one processor, the test method for a single board described above is implemented.

[0053] In a fourth aspect, the present invention application also proposes a readable storage medium, on which an execution program is stored, and when the execution program is executed, the test method for a single board described above is implemented.

[0054] Compared with the closest prior art, the beneficial effects of the present invention application are as follows:

[0055] A testing device and method for a single board of the present invention include: a chassis and a host computer; the chassis includes: a communication control board, an optical signal interface board, and a data conversion board connected in sequence; the communication control board is communicatively connected to the host computer; the host computer and the optical signal interface board are communicatively connected to a board to be detected; the host computer is configured to generate a test command according to the model of the board to be detected and send it to the communication control board; and is also configured to receive and display the test result uploaded by the communication control board; the communication control board is configured to generate a control signal according to the test command and send it to the optical signal interface board; and is also configured to judge the signal state of the operation signal sent by the data conversion board, obtain the test result and upload it to the host computer; the optical signal interface board is configured to generate a test signal according to the received control signal and send it to the board to be detected; the board to be detected is configured to control its own operation according to the received test signal, generate operation data and send it to the data conversion board; the data conversion board is configured to convert the received operation data into an operation signal and send it to the communication control board. By using this device, the individual detection of the board to be detected can be realized, which is efficient and fast. It does not need to be hung on the VBE device itself for detection. While effectively reducing the input of quality inspection personnel, it improves the consistency of the quality inspection of the board to be detected, making the test work simple, time-consuming less, and there will be no problems of missed inspection, misjudgment, and increased time caused by the restriction of the quality inspection level of personnel. Description of the Drawings

[0056] Figure 1 The architecture diagram of the VBE device for the background technology;

[0057] Figure 2 The architecture diagram of a testing device for a single board provided by the present application;

[0058] Figure 3 Part of the structure of a testing device for a single board provided by the present application Figure 1 ;

[0059] Figure 4 Part of the structure of a testing device for a single board provided by the present application Figure 2 ;

[0060] Figure 5 The front structure diagram of a testing device for a single board provided by the present application;

[0061] Figure 6 The flowchart of a testing method for a single board provided by the present application;

[0062] Figure 7 The operation schematic diagram of an electronic device provided by the present application. Detailed Embodiments

[0063] The following further describes in detail the specific implementation manners of the present invention application in conjunction with the accompanying drawings.

[0064] Embodiment 1:

[0065] As Figure 2 shown, the present invention application provides a test device for a single board, which may include: a chassis 1 and a host computer; the chassis 1 includes: a communication control board, an optical signal interface board, and a data conversion board connected in sequence; the communication control board is communicatively connected to the host computer; the host computer and the optical signal interface board are communicatively connected to a board to be detected;

[0066] The host computer is configured to generate a test command according to the model of the board to be detected and send it to the communication control board; it is also configured to receive and display the test result uploaded by the communication control board;

[0067] The communication control board is configured to generate a control signal according to the test command and send it to the optical signal interface board; it is also configured to perform signal state judgment on the operation signal sent by the data conversion board, obtain the test result and upload it to the host computer;

[0068] The optical signal interface board is configured to generate a test signal according to the received control signal and send it to the board to be detected;

[0069] The board to be detected is configured to control its own operation according to the received test signal, generate operation data and send it to the data conversion board;

[0070] The data conversion board is configured to convert the received operation data into an operation signal and send it to the communication control board.

[0071] As described above, the test device for the single board mainly consists of a chassis 1 and a host computer. The chassis 1 is used as a board detection device, and the chassis 1 is mainly used for the physical access of the board to be detected. The communication control board, the optical signal interface board, and the data conversion board are unified as functional boards, and the chassis 1 is also used for placing the functional boards.

[0072] As described above, the host computer can be a PC (Personal Computer) terminal computer, and standard communication protocols can be used for data exchange and communication with the communication control board. The host computer realizes the control and data display of the communication control board, the optical signal interface board, and the data conversion board. Through the interface of the host computer, selection can be made to output control instructions according to the test requirements of different boards to be detected, and at the same time, receive and display the test results.

[0073] Further, the host computer is specifically configured to send the test command to the communication control board in the form of a data frame;

[0074] The data frame includes: the frame header of the data frame, the total length of the data frame, the model of the board to be detected, the test command of the board to be detected, and the test parameters of the board to be detected.

[0075] Further, there are multiple types of the test commands, and each type of the test command includes: multiple test contents;

[0076] Each type of the test command is represented by a different value; the test commands include: electrical signals, frequency signals, pulse signals, and communication signals;

[0077] The electrical signals include no-operation signals, high-level signals, and low-level signals; there are multiple types of the frequency signals, and at least one of the intensity, frequency, and pulse width of the multiple frequency signals is different; there are multiple types of the pulse signals, and at least one of the intensity, period, and pulse width of the multiple pulse signals is different; there are multiple types of the communication signals, and the multiple communication signals are the signals output by the board to be detected.

[0078] As described above, there are multiple types of the frequency signals, and the intensity, frequency, and pulse width characteristic combinations of the multiple frequency signals are different, and the intensity, period, and pulse width characteristic combinations of the multiple pulse signals are different.

[0079] As described above, the communication protocol between the host computer and the communication control board can adopt the TCP (Transmission Control Protocol) protocol. Specifically, it can be: in the data frame, the frame header (the agreed value is 0x55aa), the total length of the frame (including the frame header, the frame tail, and the intermediate data packet, and the specific length is calculated), the board card number of the board to be detected (occupying 6 parameter bits, the example is 0x0000, and the countable range is 0 to 9999), and the test command (occupying 4 parameter bits, the example is 0x00), totaling four items. Among them: each value of the test command is agreed, and each value corresponds to a test signal and corresponds to a test item in Table 1 below (a total of 22 signals). For example, no operation is represented by 0x00, and the test command output is 0x01, representing a high-level test, and the test result of the high level is transmitted by the test parameter 0x01.

[0080]

[0081] Table 1

[0082] In the above Table 1, the communication protocol between the host computer and the communication control board can adopt the TCP protocol. The parameter value is the content transmitted by the test command in the TCP protocol, representing all signal types to be tested, including electrical signals and optical signals. The electrical signals include three types: no operation, high level, and low level. The optical signals include three types: frequency signal, pulse signal, and communication signal (HDLC, High-level Data Link Control). All 8 frequency signals are output signals of the board under test. These signals are collected by the host computer and sent to the communication control board for judgment.

[0083] Furthermore, the communication control board can specifically be used to compare the received operation signal with the expected detection result; if the operation signal is consistent with the expected detection result, it is determined that the operation signal is a normal signal, otherwise it is determined that the operation signal is an abnormal signal; the fact that the operation signal is a normal signal or an abnormal signal is uploaded to the host computer as the test result.

[0084] The communication control board can transmit the specific detection results using test parameters. The judgment status information of each signal of each board under test is transmitted through test parameters. It can be transmitted in a two-channel manner. The low byte represents channel 1, and the high byte represents channel 2. If the data byte is less than one word, it is supplemented with 0x00. Each channel of the test result corresponds to 1 word, including two states: normal and abnormal. After the operation signal is detected and recognized, if the result is consistent with the expectation, it is judged that the signal is normal, otherwise it is judged as abnormal.

[0085] As described above, the communication control board can also output a control signal according to the model of the board under test, simulate the backplane and optical signals of the board under test, receive the feedback signal, analyze and judge the feedback result, and upload the feedback result to the host computer. The detection function and feedback result are visualized through the host computer, and the interaction and operability are increased.

[0086] Furthermore, the chassis 1 can also include: multiple test interfaces; the multiple test interfaces are respectively set to different interface shapes for connecting different models of boards under test.

[0087] As described above, different interface shapes enable the test positions of the boards under test to have the function of protecting against incorrect insertion of the boards under test, and it is not easy for the boards under test to be damaged by incorrect insertion.

[0088] Furthermore, the optical signal interface board includes: an optical signal receiving board and an optical signal transmitting board;

[0089] The optical signal receiving board is used to receive the control signal;

[0090] The optical signal emission board is used to generate a test signal according to the control signal and send it to the board under test.

[0091] As described above, both the reception and transmission of the optical signal interface board are carried out through optical signals. According to the optical interface signal requirements of different boards under test and the test commands of the host computer, it can simulate the optical reception signal of the board under test. The optical signal reception board is provided with optical reception holes, which can receive the output signal of the board under test, conduct detection and judgment, and transmit the result to the host computer for display.

[0092] As described above, the data conversion board can be used for data interaction between the board under test and the communication control board. The data conversion board can increase the communication data volume by increasing the data interaction type, thereby expanding the types of boards under test that can be accessed.

[0093] Further, the chassis 1 further includes: a built-in power supply board, which is respectively connected to the communication control board, the optical signal interface board, the multiple test interfaces, and the data conversion board, and the power supply board supplies power to the communication control board, the optical signal interface board, the multiple test interfaces, and the data conversion board respectively.

[0094] As described above, the power supply board can be respectively connected to the communication control board, the optical signal interface board, the multiple test interfaces, and the data conversion board by setting communication lines on the backplane of the power supply board. The power supply board can be externally connected to 220V / 110V AC / DC power supply, and the output 5V power supplies the communication control board, the optical signal interface board, the multiple test interfaces, and the data conversion board through the backplane. As Figure 3 shown, from left to right are the power supply board, the communication control board, the data conversion board, the optical signal interface board, and 5 test interfaces, and each test interface can access different types of boards under test.

[0095] Further, as Figure 4 、 Figure 5 shown, the device further includes: a drawer 2, a device switch 3, a chassis switch 4, and a host computer switch 5 installed on the front of the device;

[0096] The input of the device switch 3 is connected to industrial electricity, and the output is connected to the power supply board and the host computer;

[0097] The chassis switch 4 is connected between the device switch 3 and the power supply board;

[0098] The host computer switch 5 is connected between the device switch 4 and the host computer.

[0099] Example: When the device is detecting, it is mainly divided into a module for testing logic and a module for communication protocol according to functions; communication can be carried out between the communication control board, the optical signal interface board, the data conversion board and the upper computer using the communication protocol. The test logic mainly includes two types: detecting signal status and signal timing. The communication methods are optical signal and electrical signal. Each board to be detected is connected to a test interface to achieve independent detection. By simulating the signals required as input for each board to be detected, the normal operation of the board to be detected is ensured. At this time, the board to be detected outputs signals. The data conversion board, the optical signal receiving board, and the optical signal transmitting board all serve as auxiliary test boards; the optical signal receiving board can be simply referred to as the IN (input, receiving) board, and the optical signal transmitting board can be simply referred to as the TRF (Test Report Form, receiving) board; after receiving the command issued by the communication control board, the auxiliary test board performs corresponding operations. The communication control board is connected to the upper computer for real-time communication, and the data transmission frequency can be 100 ms per frame. The communication control board classifies the received data according to the board card number and test items of the board to be detected and sends it to the corresponding auxiliary test board, and then the detection result is transmitted to the communication control board. The communication control board sorts and packages the test results and uploads them to the upper computer.

[0100] The single-board test device of the present invention can realize the individual detection of each board to be detected in the VBE device, which is efficient and fast. It does not need to be hung on the VBE device itself for detection. While effectively reducing the input of quality inspection personnel, it improves the consistency of quality inspection of the board to be detected. All the boards to be detected involved in the VBE device can be detected and analyzed for a single board to be detected in an offline state. Testing no longer has to be carried out with the entire VBE device as the test platform. It breaks through the limitation that the VBE device cannot be tested individually when updating the device at the engineering site.

[0101] Embodiment 2:

[0102] As Figure 6 shown, based on the same concept, the present invention also provides a single-board test method, which is applied to the single-board test device described in Embodiment 1 and may include the following steps:

[0103] Step 1: Use the upper computer of the test device to generate a test command according to the model of the board to be detected;

[0104] Step 2: Use the communication control board of the test device to generate a control signal according to the test command;

[0105] Step 3: Use the optical signal interface board of the test device to generate a test signal according to the control signal and send it to the board to be detected that is communicatively connected to the test device; receive the operation data returned by the board to be detected after controlling its own operation according to the test signal;

[0106] Step 4: Use the data conversion board of the test device to convert the operation data into operation signals;

[0107] Step 5: Use the communication control board to judge the signal state of the operation signal to obtain a test result;

[0108] Step 6: Use the upper computer to display the test result.

[0109] In the above, in Step 1, after generating a test command according to the model of the board to be detected by the upper computer of the test device, it may include:

[0110] Use the upper computer to convert the test command into the form of a data frame;

[0111] The data frame includes: the frame header of the data frame, the total length of the data frame, the model of the board to be detected, the test command of the board to be detected, and the test parameters of the board to be detected.

[0112] In the above, there are multiple types of the test commands, and each type of the test command includes: multiple test contents;

[0113] Each type of the test command is represented by a different value; the test commands include: electrical signals, frequency signals, pulse signals, and communication signals;

[0114] The electrical signals include no-operation signals, high-level signals, and low-level signals; there are multiple types of the frequency signals, and at least one of the intensity, frequency, and pulse width of the multiple frequency signals is different; there are multiple types of the pulse signals, and at least one of the intensity, period, and pulse width of the multiple pulse signals is different; there are multiple types of the communication signals, and the multiple communication signals are the signals output by the board to be detected.

[0115] Among them, the data frame can specifically be: in the data frame, it is agreed that the frame header (agreed value is 0x55aa), the total length of the frame (including the frame header, frame tail, and intermediate data packets, and the specific length is calculated), the board card number of the board to be detected (occupying 6 parameter bits, example is 0x0000, and the countable range is 0 to 9999), and the test command (occupying 4 parameter bits, example is 0x00), totaling four items.

[0116] Furthermore, the chassis 1 may further include: multiple test interfaces; the multiple test interfaces are respectively set to different interface shapes to connect different models of boards to be detected.

[0117] The above-mentioned optical signal interface board includes: an optical signal receiving board and an optical signal transmitting board;

[0118] In step 3, when using the optical signal interface board of the test device to generate a test signal according to the control signal and send it to the board under test that is communicatively connected to the test device, it includes:

[0119] Using the optical signal receiving board to receive the control signal;

[0120] Using the optical signal transmitting board to generate a test signal according to the control signal and send it to the board under test.

[0121] In the above step 5, when using the communication control board to judge the signal state of the operation signal to obtain a test result, it includes:

[0122] Using the communication control board to compare the operation signal with the expected detection result; if the operation signal is consistent with the expected detection result, determine that the operation signal is a normal signal, otherwise determine that the operation signal is an abnormal signal; use the fact that the operation signal is a normal signal or an abnormal signal as the test result.

[0123] In the above, the communication control board can be responsible for transmitting specific detection results using test parameters, and the signal judgment status information of each type of board under test is transmitted through test parameters. Each channel of the test result corresponds to 1 word, including two states: normal and abnormal.

[0124] In the above, the communication control board can also output a control signal according to the model of the board under test, simulate the backplane and optical signal of the board under test, receive a feedback signal, analyze and judge the feedback result, and upload the feedback result to the host computer.

[0125] Further, the chassis 1 further includes: a built-in power supply board, and the power supply board is respectively connected to the communication control board, the optical signal interface board, the multiple test interfaces and the data conversion board, and the power supply board supplies power to the communication control board, the optical signal interface board, the multiple test interfaces and the data conversion board respectively.

[0126] Further, the device further includes: a drawer 2, a device switch 3, a chassis switch 4 and a host computer switch 5 installed on the front of the device;

[0127] The input of the device switch 3 is connected to industrial electricity, and the output is connected to the power supply board and the host computer;

[0128] The chassis switch 4 is connected between the device switch 3 and the power supply board;

[0129] The host computer switch 5 is connected between the device switch 4 and the host computer.

[0130] Example 3:

[0131] As Figure 7 shown, the present invention also provides an electronic device, which may be a computer device, a single-chip microcomputer device, a smart mobile device, etc. The electronic device in this embodiment may include a processor, a memory, a transceiver component, etc. The memory, the processor, and the transceiver component are connected through a bus; the memory can be used to store an execution program, and an exemplary execution program may include instructions; the processor is used to execute the instructions stored in the memory. The memory can also be used to store data, and the data can be called and / or modified when the instructions are executed.

[0132] The processor may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. It is the computing core and control core of the terminal, and is suitable for implementing one or more instructions. Specifically, it is suitable for loading and executing one or more instructions in the storage medium to implement the corresponding method flow or corresponding function, so as to implement the steps of a single-board test method in the above embodiment.

[0133] Embodiment 4:

[0134] Based on the same inventive concept, the present invention also provides a readable storage medium, specifically an electronic device-readable storage medium (Memory). The electronic device-readable storage medium is a memory device in the electronic device, and is used to store programs and data. It can be understood that the storage medium here can include both the built-in storage medium in the electronic device, and of course can also include the extended storage medium supported by the electronic device. The storage medium provides a storage space, and the operating system of the terminal is stored in this storage space. And, one or more instructions suitable for being loaded and executed by the processor are also stored in this storage space. These instructions can be one or more execution programs (including program codes). It should be noted that the storage medium here can be a high-speed RAM memory, or a non-volatile memory, such as at least one disk memory. By loading and executing one or more instructions stored in the storage medium by the processor, the steps of a single-board test method in the above embodiment can be implemented.

[0135] Those skilled in the art should understand that the embodiments of the present invention application can be provided as a method, a system, or a computer program product. Therefore, the present invention application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code.

[0136] The present invention application is described with reference to the flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to the embodiments of the present invention application. It should be understood that each flow and / or block in the flowchart and / or block diagram, as well as the combination of flows and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate means for implementing the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0137] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory generate a manufactured article including instruction means, and the instruction means implement the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0138] These computer program instructions can also be loaded onto a computer or other programmable data processing device, so that a series of operation steps are executed on the computer or other programmable device to generate a computer-implemented process, and thus the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0139] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention application rather than to limit its protection scope. Although the present invention application has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: after reading the present invention application, those skilled in the art can still make various changes, modifications, or equivalent replacements to the specific implementation manners of the application, but these changes, modifications, or equivalent replacements are all within the protection scope of the pending claims of the application.

Claims

1. A testing device for a single board, characterized in that, Including: A chassis and a host computer; The chassis includes a communication control board, an optical signal interface board, and a data conversion board connected in sequence. The communication control board is communicatively connected to the host computer. The host computer and the optical signal interface board are communicatively connected to the board to be tested; The host computer is configured to generate a test command according to the model of the board to be tested and send it to the communication control board; and is also configured to receive and display the test results uploaded by the communication control board; The communication control board is configured to generate a control signal according to the test command and send it to the optical signal interface board; and is also configured to judge the signal state of the operation signal sent by the data conversion board to obtain a test result and upload it to the host computer; The optical signal interface board is configured to generate a test signal according to the received control signal and send it to the board to be tested; The board to be tested is configured to control its own operation according to the received test signal, generate operation data and send it to the data conversion board; The data conversion board is configured to convert the received operation data into an operation signal and send it to the communication control board.

2. The device according to claim 1, wherein The optical signal interface board includes an optical signal receiving board and an optical signal transmitting board; The optical signal receiving board is configured to receive the control signal; The optical signal transmitting board is configured to generate a test signal according to the control signal and send it to the board to be tested.

3. The device according to claim 1, wherein Specifically, the communication control board is configured to compare the received operation signal with the expected detection result; if the operation signal is consistent with the expected detection result, determine that the operation signal is a normal signal, otherwise determine that the operation signal is an abnormal signal; and upload the operation signal being a normal signal or an abnormal signal as a test result to the host computer.

4. The device according to claim 1, characterized in that, The chassis further includes a plurality of test interfaces; the plurality of test interfaces are respectively set to different interface shapes for connecting boards to be tested of different models.

5. The device according to claim 1, characterized in that, Specifically, the host computer is configured to send the test command to the communication control board in the form of a data frame; The data frame includes a frame header of the data frame, the total length of the data frame, the model of the board to be tested, the test command of the board to be tested, and the test parameters of the board to be tested.

6. The device according to claim 5, characterized in that, There are multiple types of test commands, and each type of test command includes multiple test contents; Each type of test command is represented by a different value; the test commands include electrical signals, frequency signals, pulse signals, and communication signals; The electrical signals include a no-operation signal, a high-level signal, and a low-level signal; there are multiple types of frequency signals, and at least one of the intensity, frequency, and pulse width of the multiple frequency signals is different; there are multiple types of pulse signals, and at least one of the intensity, period, and pulse width of the multiple pulse signals is different; there are multiple types of communication signals, and the multiple communication signals are the signals output by the board to be tested.

7. The device according to claim 4, characterized in that The chassis further includes: a built-in power board, which is respectively connected to the communication control board, the optical signal interface board, the multiple test interfaces and the data conversion board, and the power board supplies power to the communication control board, the optical signal interface board, the multiple test interfaces and the data conversion board respectively.

8. The device according to claim 7, wherein, It further includes: A drawer, a device switch, a chassis switch and a host computer switch installed on the front of the device; The input of the device switch is connected to industrial electricity, and the output is connected to the power board and the host computer; The chassis switch is connected between the device switch and the power board; The host computer switch is connected between the device switch and the host computer.

9. A testing method for a single board, applied to the testing device for the single board according to any one of claims 1-8 above, characterized in that, It includes: The host computer using the test device generates a test command according to the model of the board to be detected; The communication control board using the test device generates a control signal according to the test command; The optical signal interface board using the test device generates a test signal according to the control signal and sends it to the board to be detected which is communicatively connected to the test device; receives the operation data returned by the board to be detected after controlling its own operation according to the test signal; The data conversion board using the test device converts the operation data into an operation signal; The communication control board is used to judge the signal state of the operation signal to obtain a test result; The host computer is used to display the test result.

10. The method according to claim 9, wherein The communication control board is used to judge the signal state of the operation signal to obtain a test result, including: The communication control board is used to compare the operation signal with the expected detection result; if the operation signal is consistent with the expected detection result, it is determined that the operation signal is a normal signal, otherwise it is determined that the operation signal is an abnormal signal; the fact that the operation signal is a normal signal or an abnormal signal is used as the test result.

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