Method and system for detecting contrast and light transmittance of chips based on circular holes in strips

Abstract

The present invention provides a method and system for detecting chips based on a circular hole in a material strip, and relates to the field of automated optical detection technology, including: using backlight and front ring light to illuminate the material strip of a chip mounter, obtaining an image when the material strip is stopped or the speed is stable; pre-processing the image and searching for circular holes, calculating the coordinates of the center of the circular holes; obtaining the chip position range below the material strip based on the coordinates of the center of the circular holes; performing contrast analysis on the processed image within the chip position range, if the contrast is significant, determining that the chip exists, and recording the position information of the chip; if the contrast is not obvious, determining that the chip does not exist, using backlight to illuminate the material strip of the chip mounter for light transmission detection, if the chip position range does not have a light transmission phenomenon, determining that the chip exists, recording chip missing information, otherwise determining that the chip does not exist, and recording the chip position. The present invention improves chip detection efficiency and accuracy, is applied to a chip mounter production line, and can achieve real-time judgment of chips.

Description

Technical Field

[0001] The present invention relates to the field of automated optical detection technology, and in particular to a method and system for detecting a chip based on circular holes in a strip to guide contrast and transmittance. Background Art

[0002] In modern electronic product manufacturing, tape and reel are important carriers for chip packaging. Quality control of the chips on the tape is crucial.

[0003] Traditional methods for detecting the presence of chips on tape typically rely on manual visual inspection or simple presence determination based on mechanical structures, which are inefficient and susceptible to subjective factors. Existing automated optical inspection systems primarily focus on chip size and defect detection, but lack effective solutions for quickly and accurately determining the presence of chips on tape. This is especially true in high-speed SMT placement machine production lines, where real-time determination of chip presence on tape is extremely demanding, making traditional methods difficult to meet.

[0004] Currently, mainstream SMT placement machines rely on mechanical structures or simple sensors to confirm the chip position on the tape. These machines suffer from high misjudgment rates and are unable to cope with complex situations (such as missing or misaligned chips), which seriously affect production efficiency and yield.

[0005] Therefore, how to provide a rapid detection method for strip chips, improve detection accuracy and efficiency, and meet the real-time requirements of high-speed production lines such as SMT placement machines has become an urgent problem to be solved. Summary of the Invention

[0006] In response to the problems in the background technology, the present invention provides a method and system for detecting chips based on the contrast and transmittance of circular holes in the material strip. By using the circular holes on the material strip as precise reference points and combining high-resolution imaging technology and intelligent analysis algorithms, fast and accurate detection of the presence of chips can be achieved, effectively improving the performance of the automated optical inspection system. Real-time, high-precision, and high-reliability chip presence judgment can be achieved in the high-speed production line of SMT placement machines, significantly improving production efficiency and yield rate.

[0007] To achieve the above objectives, the present invention provides a method for detecting contrast and light transmission based on a circular hole in a strip, comprising:

[0008] Use backlight and front ring light to illuminate the placement machine strip to obtain images when the strip is stopped or at a stable speed;

[0009] Preprocessing the image, searching for a circular hole in the processed image, and calculating the center coordinates of the circular hole;

[0010] Obtaining a chip position range below the material strip based on the center coordinates of the circular hole;

[0011] performing contrast analysis on the processed image within the chip position range, and if the contrast is significant, determining that the chip exists, and recording the chip position information;

[0012] If the contrast is not obvious, it is determined that the chip does not exist. The backlight is used to illuminate the placement machine material belt for light transmission detection. If there is no light transmission phenomenon in the chip position range, the chip is determined to exist and the chip missing information is recorded. Otherwise, it is determined that the chip does not exist and the chip position is recorded.

[0013] As a further improvement of the present invention, the rear backlight and the front ring light are stroboscopic light sources, and the camera is controlled to be synchronized with the stroboscopic light sources to acquire images.

[0014] As a further improvement of the present invention, the pre-processing of the image includes noise reduction processing and grayscale processing.

[0015] As a further improvement of the present invention, searching for a circular hole in the processed image and calculating the coordinates of the center of the circular hole include:

[0016] Use the circular feature extraction algorithm based on Hough transform to search for circular holes in the image;

[0017] Based on the obtained circular holes and the predicted sizes of the circular holes in the strip, the precise center coordinates of each circular hole are calculated using the sub-pixel interpolation method.

[0018] As a further improvement of the present invention, the chip position range below the strip is obtained based on the center coordinates of the circular hole; comprising:

[0019] Obtain the hole spacing based on the precise center coordinate data of each hole;

[0020] Based on the pre-measured strip deviation data and the circular hole spacing, the chip position range between the circular holes is calculated.

[0021] As a further improvement of the present invention, performing contrast analysis within the chip position range includes:

[0022] An adaptive threshold segmentation algorithm is used to segment the chip position range in the image, and contrast analysis is performed on the segmented image.

[0023] As a further improvement of the present invention,

[0024] Taking the chip position range R as the center, the background area S is obtained by expanding the distance d;

[0025] The grayscale set of the chip position range R is I R, the grayscale set of the background area S is I S ;

[0026] Calculating the grayscale mean and variance of the chip position range R and the background area S, as well as the covariance between the chip position range R and the background area S;

[0027] Based on the t-test, when the test value is greater than the preset test threshold θ, the contrast is judged to be significant, otherwise the contrast is judged to be insignificant.

[0028] As a further improvement of the present invention, if the contrast is not obvious, it is determined that the chip does not exist, and backlight illumination is used to perform light transmission detection; including:

[0029] Only the backlight is used to illuminate the placement machine tape to determine whether the chip position range has light transmission.

[0030] As a further improvement of the present invention, only the backlight is used to illuminate the mounter strip, and the camera is controlled to be synchronized with the stroboscopic light source used for the backlight illumination to acquire an image;

[0031] The image is segmented based on an adaptive threshold segmentation algorithm and an edge enhancement algorithm to determine whether there is light transmission within the chip position range.

[0032] The present invention also provides a system based on a strip circular hole-guided contrast and light transmittance detection chip, comprising: a backlight stroboscopic light source, a front ringlight stroboscopic light source, a high-resolution camera and lens, and a control unit;

[0033] The back-light stroboscopic light source is arranged on the back of the material strip, the front-light ring-light stroboscopic light source is arranged on the front of the material strip, and the high-resolution camera and lens are arranged above the material strip;

[0034] The backlight stroboscopic light source at the rear side has the same frequency as the front ringlight stroboscopic light source;

[0035] The control unit is communicatively connected to the placement machine controller. When the material belt reaches a stable speed, the control unit simultaneously triggers the back light stroboscopic light source, the front ring light stroboscopic light source and the high-resolution camera to shoot, obtain an image, perform image processing and output a judgment result to the placement machine controller.

[0036] Compared with the prior art, the present invention has the following beneficial effects:

[0037] Compared with the existing method that relies on manual or mechanical structures to determine whether a chip is present, the present invention uses the circular holes on the material strip as precise reference points, combines high-resolution imaging technology and intelligent analysis algorithms, first determines the approximate position of the chip, and then confirms the presence of the chip through contrast / transmittance analysis, thereby achieving fast and accurate detection of the presence of the chip, effectively improving the performance of the automated optical inspection system, and at the same time realizing real-time, high-precision, and high-reliability chip presence judgment in the high-speed production line of the placement machine, significantly improving production efficiency and yield rate.

[0038] The present invention integrates visual inspection into the production process of the SMT placement machine, realizes "zero waiting" real-time judgment, and avoids shutdown and rework caused by chip missing or misalignment.

[0039] The present invention uses an adaptive threshold segmentation algorithm to automatically adjust the contrast threshold to adapt to strips of different colors and brightness conditions. Based on the difference between the chip surface and the strip material, it has a better segmentation effect and more significant contrast.

[0040] The present invention can improve the contrast of the light-transmitting area and reduce the false positive rate through the adaptive threshold segmentation algorithm and edge enhancement algorithm in light-transmitting detection.

[0041] In the present invention, hardware trigger synchronization is used to ensure precise synchronization between the camera and the light source to avoid motion blur; sub-pixel precision positioning is used to improve the accuracy of circular hole positioning; the adaptive threshold segmentation algorithm can automatically adjust the contrast threshold to adapt to material strips with different color and brightness conditions; the material strip deviation compensation algorithm can accurately predict the chip position when there is a slight offset in the material strip; the control unit feeds back the detection results to the SMT placement machine controller in real time, realizing "zero waiting" placement control. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1 This is a flow chart of a method for detecting contrast and light transmission based on a strip circular hole-guided chip, disclosed in one embodiment of the present invention;

[0043] Figure 2 A chip area result obtained through contrast detection according to an embodiment of the present invention;

[0044] Figure 3 An original image of the material strip captured using only backlighting, disclosed in one embodiment of the present invention;

[0045] Figure 4 This is a schematic diagram of the result of predicting the chip location through circular hole positioning disclosed in an embodiment of the present invention. DETAILED DESCRIPTION

[0046] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0047] The present invention will be described in further detail below with reference to the accompanying drawings:

[0048] like Figure 1 As shown, the present invention provides a method for detecting contrast and light transmittance based on a circular hole in a strip, comprising the steps of:

[0049] S1. Use backlight and front ring light to illuminate the mounter strip and obtain images when the strip is stopped or at a stable speed.

[0050] in,

[0051] The backlight and the front ring light are stroboscopic light sources, and the camera is controlled to be synchronized with the stroboscopic light sources to acquire images.

[0052] Further,

[0053] It is better to obtain clear images when the speed is stable.

[0054] S2. Preprocess the image, search for the circular hole in the processed image, and calculate the center coordinates of the circular hole;

[0055] in,

[0056] Image preprocessing includes noise reduction and grayscale processing.

[0057] Use the circular feature extraction algorithm based on Hough transform to search for circular holes in the image;

[0058] Based on the obtained circular holes and the predicted sizes of the circular holes in the strip, the precise center coordinates of each circular hole are calculated using the sub-pixel interpolation method.

[0059] Specifically,

[0060] Accurately locate the center of the circle based on pre-measured parameters such as the strip hole size, distance between circles, and contrast;

[0061] Adopt sub-pixel precision image processing algorithm to improve the accuracy of circular hole positioning.

[0062] S3. Obtain the chip position range below the strip based on the center coordinates of the circular hole;

[0063] in,

[0064] Obtain the hole spacing based on the precise center coordinate data of each hole;

[0065] Based on the pre-measured strip deviation data and the hole spacing, the chip position range between each hole is calculated.

[0066] Specifically,

[0067] The approximate position of the chip below is calculated based on the relative position of the holes. For example, if the holes are arranged at a certain pitch, the chip's position between each hole can be inferred based on the distance between the holes. A strip deviation compensation algorithm is also introduced to accurately predict chip positions even if the strip is slightly offset.

[0068] S4. Perform contrast analysis on the processed image within the chip location range. If the contrast is significant, the chip is determined to be present and the chip location information is recorded.

[0069] in,

[0070] Using backlight and ringlight, analyze the contrast difference between the chip surface and the strip material.

[0071] Further,

[0072] An adaptive threshold segmentation algorithm is used to segment the chip position range in the image, and contrast analysis is performed on the segmented image.

[0073] Specifically,

[0074] Taking the chip position range R as the center, the background area S is obtained by expanding the distance d;

[0075] The grayscale set of the chip position range R is I R , the grayscale set of the background area S is I S ;

[0076] Calculate the chip position range R, the grayscale mean μ and variance of the background area S , and the covariance between the chip position range R and the background area S ; The formula is:

[0077] ;

[0078] ;

[0079] ;

[0080] Based on the t-test, when the test value is greater than the preset test threshold θ, the contrast is judged to be significant, otherwise the contrast is judged to be insignificant. The formula is:

[0081] ;

[0082] S5. If the contrast is not obvious, it is determined that the chip does not exist. The backlight is used to illuminate the placement machine material belt for light transmission detection. If there is no light transmission phenomenon in the chip position range, the chip is determined to exist and the chip missing information is recorded. Otherwise, it is determined that the chip does not exist and the chip position is recorded.

[0083] in,

[0084] Only backlight is used to illuminate the placement machine tape to determine whether the chip position range has light transmission.

[0085] Further

[0086] Only the backlight is used to illuminate the SMT strip, and the camera is controlled to synchronize with the stroboscopic light source used for backlight illumination to acquire the image;

[0087] The image is segmented based on the adaptive threshold segmentation algorithm and edge enhancement algorithm to determine whether there is light transmission within the chip position range.

[0088] The present invention provides a system based on a strip circular hole-guided contrast and light transmittance detection chip, comprising: a backlight stroboscopic light source, a front ringlight stroboscopic light source, a high-resolution camera and lens, and a control unit;

[0089] The backlight strobe light source is located on the back of the strip, the front ringlight strobe light source is located on the front of the strip, and the high-resolution camera and lens are located above the strip;

[0090] The backlight strobe light source on the back has the same frequency as the front ringlight strobe light source;

[0091] The control unit is connected to the placement machine controller for communication. When the material belt reaches a stable speed, the control unit simultaneously triggers the backlight strobe light source, the front ring light strobe light source and the high-resolution camera to take pictures, obtain images, perform image processing and output the judgment results to the placement machine controller.

[0092] Specifically,

[0093] High-resolution cameras and lenses should be selected with high resolution (at least 1 million pixels), wide field of view, and precise focusing capabilities to ensure clear capture of the strip image. Especially for the high-speed motion environment of SMT placement machines, a global shutter camera should be used to avoid motion blur affecting detection accuracy.

[0094] The backlight strobe light source and the front ring light strobe light source adopt strobe light source. The backlight and front ring light strobe are used at the same time. Synchronous imaging is achieved through hardware triggering to eliminate the influence of motion blur. The brightness of the light source can be dynamically adjusted to adapt to strips of different colors and materials.

[0095] The control unit uses a high-performance embedded system, which is responsible for image acquisition, data processing and result output. The control unit communicates with the SMT placement machine controller in real time, provides chip presence / absence judgment results, and adjusts the placement position or triggers an alarm based on the results. Example

[0096] like Figure 1 As shown, the present invention integrates the method and system for detecting chips based on circular holes in the strip to guide contrast and transmittance into the production process of the SMT placement machine. Specifically, the high-resolution camera and lens are selected to have high resolution (at least 1 million pixels), a large field of view, and precise focusing capabilities. The backlight and front ringlight both use stroboscopic light sources, and the backlight and front ringlight strobe simultaneously, achieving synchronous imaging through hardware triggering. The control unit is a high-performance embedded system responsible for image acquisition, data processing, and result output. This unit communicates with the SMT placement machine controller in real time, provides chip presence / absence judgment results, and adjusts the placement position or triggers an alarm based on the results. The chip presence detection process includes:

[0097] Phase 1: System Initialization (AC)

[0098] A: System initialization: Initialize the hardware devices such as camera, light source, control unit, etc., and load preset parameters (circular hole size, spacing, contrast threshold, etc.).

[0099] B: Material belt motion status monitoring: Real-time monitoring of the material belt's motion speed and stability. If the material belt is unstable, the system returns to the initialization stage and waits.

[0100] C: Image acquisition preparation: The camera enters standby mode and prepares for image acquisition.

[0101] Phase 2: Image acquisition and preprocessing (DE)

[0102] D: Hardware-triggered stroboscopic light and camera synchronization: When the strip reaches a stable speed, the control unit sends a signal to trigger the stroboscopic light and camera simultaneously. Backlighting and front ringlighting are used, and a global shutter camera is used to avoid motion blur.

[0103] E: Image preprocessing (denoising, grayscale): Preprocess the collected color images, including noise reduction (such as median filtering) and grayscale conversion, to facilitate subsequent feature extraction and analysis.

[0104] The third stage: hole positioning (FG)

[0105] F: Circular hole location: Use the circular feature extraction algorithm based on Hough transform to search for circular holes in the image.

[0106] G: Calculate the center coordinates of the circular hole (sub-pixel accuracy): If the circular hole is successfully found, the sub-pixel interpolation method is used to calculate the exact center coordinates of the circular hole. If the circular hole cannot be located, an alarm is triggered and the system is paused (H).

[0107] Stage 4: Chip Location Prediction (I)

[0108] I: Calculate chip position range based on hole spacing and strip deviation: Based on the known hole spacing and pre-measured strip deviation, calculate the approximate chip position range between each hole.

[0109] Stage 5: Contrast / Transmittance Testing (JN)

[0110] J: Contrast detection: Perform contrast analysis within the predicted chip location. If the chip exists, its surface will have a significant contrast difference with the tape material (for example, a white chip will appear black on a black tape). Figure 2 As shown, the circular area is the chip position range, and the rectangular area is the chip position obtained by contrast detection.

[0111] K: Record the chip position and pass the placement instruction: If the contrast is significant, it is considered that the chip exists, the chip position information is recorded, and the placement instruction is sent to the SMT placement machine.

[0112] L: Transmittance test: If the contrast is not obvious, perform the transmittance test. Only use backlight illumination, and take an image such as Figure 3 As shown, analyze whether the location of the chip has light transmission.

[0113] M: Record the chip-free position and trigger an alarm / skip placement: If light transmittance exists, it is considered that the chip does not exist, and the position information is recorded. The placement machine sends a skip placement instruction or triggers an alarm.

[0114] N: Record chip missing and trigger alarm / skip placement: If the light transmittance phenomenon does not exist, it is considered that the chip exists (may be blocked), record the chip missing information, and send a skip placement instruction to the SMT placement machine or trigger an alarm, such as Figure 4 The figure shows the result of predicting the chip location through circular hole positioning, where the small circle at the bottom is the predicted location.

[0115] Phase 6: Result Output and Data Analysis (OP)

[0116] O: Result output: Output the detection results (chip position, detection status) to the control unit and SMT placement machine.

[0117] P: Data recording and analysis: Record all test data for subsequent system optimization and fault diagnosis.

[0118] Advantages of the present invention:

[0119] Compared with the existing method that relies on manual or mechanical structures to determine whether a chip is present, the present invention uses the circular holes on the material strip as precise reference points, combines high-resolution imaging technology and intelligent analysis algorithms, first determines the approximate position of the chip, and then confirms the presence of the chip through contrast / transmittance analysis, thereby achieving fast and accurate detection of the presence of the chip, effectively improving the performance of the automated optical inspection system, and at the same time realizing real-time, high-precision, and high-reliability chip presence judgment in the high-speed production line of the placement machine, significantly improving production efficiency and yield rate.

[0120] The present invention integrates visual inspection into the production process of the SMT placement machine, realizes "zero waiting" real-time judgment, and avoids shutdown and rework caused by chip missing or misalignment.

[0121] The present invention uses an adaptive threshold segmentation algorithm to automatically adjust the contrast threshold to adapt to strips of different colors and brightness conditions. Based on the difference between the chip surface and the strip material, it has a better segmentation effect and more significant contrast.

[0122] The present invention can improve the contrast of the light-transmitting area and reduce the false positive rate through the adaptive threshold segmentation algorithm and edge enhancement algorithm in light-transmitting detection.

[0123] In the present invention, hardware trigger synchronization is used to ensure precise synchronization between the camera and the light source to avoid motion blur; sub-pixel precision positioning is used to improve the accuracy of circular hole positioning; the adaptive threshold segmentation algorithm can automatically adjust the contrast threshold to adapt to material strips with different color and brightness conditions; the material strip deviation compensation algorithm can accurately predict the chip position when there is a slight offset in the material strip; the control unit feeds back the detection results to the SMT placement machine controller in real time, realizing "zero waiting" placement control.

[0124] The present invention enables rapid and accurate detection of the presence of chips on a material strip, improving the efficiency and reliability of automated optical inspection systems, reducing production costs, and enhancing product quality. In particular, in SMT placement machine applications, this solution can significantly reduce downtime and rework caused by missing or misaligned chips, improve production yield, reduce manual intervention, and achieve an intelligent and efficient placement process. Compared with existing mechanical structures or simple sensor methods, the present invention reduces the false positive rate by over 50% and increases detection speed by over 30%, bringing revolutionary progress to the SMT industry.

[0125] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations of the present invention are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A method for detecting contrast and light transmission based on a circular hole in a strip, characterized in that: include: Use backlight and front ring light to illuminate the placement machine strip to obtain images when the strip is stopped or at a stable speed; Preprocessing the image, searching for a circular hole in the processed image, and calculating the center coordinates of the circular hole; Obtaining a chip position range below the material strip based on the center coordinates of the circular hole; performing contrast analysis on the processed image within the chip position range, and if the contrast is significant, determining that the chip exists, and recording the chip position information; If the contrast is not obvious, it is determined that the chip does not exist. The backlight is used to illuminate the placement machine material belt for light transmission detection. If there is no light transmission phenomenon in the chip position range, the chip is determined to exist and the chip missing information is recorded. Otherwise, it is determined that the chip does not exist and the chip position is recorded.

2. The method for detecting contrast and light transmission based on a circular hole in a strip according to claim 1, characterized in that: The backlight and the front ring light are stroboscopic light sources, and the camera is controlled to be synchronized with the stroboscopic light sources to acquire images.

3. The method for detecting contrast and light transmittance based on a circular hole in a strip according to claim 1, characterized in that: The image is preprocessed including noise reduction and grayscale processing.

4. The method for detecting contrast and light transmission based on a circular hole in a strip according to claim 1, characterized in that: Search for circular holes in the processed image and calculate the coordinates of the center of the circular holes, including: Use the circular feature extraction algorithm based on Hough transform to search for circular holes in the image; Based on the obtained circular holes and the predicted sizes of the circular holes in the strip, the precise center coordinates of each circular hole are calculated using the sub-pixel interpolation method.

5. The method for detecting contrast and light transmission based on a circular hole in a strip according to claim 1, characterized in that: Obtaining a chip position range below the strip based on the center coordinates of the circular hole; comprising: Obtain the hole spacing based on the precise center coordinate data of each hole; Based on the pre-measured strip deviation data and the circular hole spacing, the chip position range between the circular holes is calculated.

6. The method for detecting contrast and light transmission based on a circular hole in a strip according to claim 1, characterized in that: Perform contrast analysis within the chip position range, including: An adaptive threshold segmentation algorithm is used to segment the chip position range in the image, and contrast analysis is performed on the segmented image.

7. The method for detecting contrast and light transmittance based on a strip circular hole according to claim 1 or 6, characterized in that: Taking the chip position range R as the center, the background area S is obtained by expanding the distance d; The grayscale set of the chip position range R is I R , the grayscale set of the background area S is I S ; Calculating the grayscale mean and variance of the chip position range R and the background area S, as well as the covariance between the chip position range R and the background area S; Based on the t-test, when the test value is greater than the preset test threshold θ, the contrast is judged to be significant, otherwise the contrast is judged to be insignificant.

8. The method for detecting contrast and light transmittance based on a circular hole in a strip according to claim 1, characterized in that: If the contrast is not obvious, it is determined that the chip does not exist and backlight illumination is used for light transmission detection; including: Only the backlight is used to illuminate the placement machine tape to determine whether the chip position range has light transmission.

9. The method for detecting contrast and light transmission based on a circular hole in a strip according to claim 8, characterized in that: Only the backlight is used to illuminate the SMT strip, and the camera is controlled to synchronize with the stroboscopic light source used for backlight illumination to acquire the image; The image is segmented based on an adaptive threshold segmentation algorithm and an edge enhancement algorithm to determine whether there is light transmission within the chip position range.

10. A system based on a strip circular hole-guided contrast and light transmittance detection chip, used to implement the method based on a strip circular hole-guided contrast and light transmittance detection chip according to any one of claims 1 to 9, characterized in that: include: Back-lit strobe light source, front-lit ring-lit strobe light source, high-resolution camera and lens, and control unit; The back-light stroboscopic light source is arranged on the back of the material strip, the front-light ring-light stroboscopic light source is arranged on the front of the material strip, and the high-resolution camera and lens are arranged above the material strip; The backlight stroboscopic light source at the rear side has the same frequency as the front ringlight stroboscopic light source; The control unit is communicatively connected to the placement machine controller. When the material belt reaches a stable speed, the control unit simultaneously triggers the back light stroboscopic light source, the front ring light stroboscopic light source and the high-resolution camera to shoot, obtain an image, perform image processing and output a judgment result to the placement machine controller.

Images