Method and device for determining failure duration of laser, equipment and storage medium

Abstract

The invention relates to a laser failure duration determination method and device, equipment and a storage medium. The method comprises the steps of determining at least three test temperatures according to a standard operation temperature and an operation failure mechanism of a target type laser, and performing a timed truncation degradation test on the target type laser at each test temperature to obtain output power degradation data of the target type laser at each test temperature, determining a target failure duration according to the test duration of the degradation test, the standard output power of the target type laser and the output power degradation data of the target type laser at each test temperature; wherein the target failure duration is the duration when the output power of the target type laser degenerates to the failure power when the target type laser operates at the standard operation temperature. By adopting the method, the efficiency of determining the failure duration can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of laser testing, and particularly to a method, device, equipment, and storage medium for determining the failure duration of a laser. Background Art

[0002] With the continuous development of the laser field, fiber lasers have emerged. To ensure the reliability of the operation of fiber lasers, it is necessary to conduct degradation tests on fiber lasers to determine the operating duration of fiber lasers.

[0003] In the related art, the failure duration of a fiber laser can be determined by placing the fiber laser in operation at a specific temperature and timing.

[0004] However, due to the high mechanical stability of the fiber structure, it is not easily affected by external vibrations, impacts, and other factors. Moreover, fiber lasers adopt an all-solid-state structure, without a gas sealing and circulation system like gas lasers, and there are no easily malfunctioning components such as easily worn optical lenses in some solid lasers. Therefore, during long-term operation, fiber lasers can maintain stable laser output. Thus, when using the related art to conduct degradation tests on fiber lasers, there are problems such as a long test cycle and low efficiency. Summary of the Invention

[0005] Based on this, it is necessary to provide a method, device, equipment, and storage medium for determining the failure duration of a laser that can improve the efficiency of determining the failure duration in view of the above technical problems.

[0006] In a first aspect, the present application provides a method for determining the failure duration of a laser, including:[[]]END]]

[0007] Determining at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser;

[0008] Conducting a type-II censored degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature;

[0009] Determining the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; where the target failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the standard operating temperature.

[0010] In one embodiment, determining the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature includes:

[0011] For each test temperature, based on the standard output power, failure power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature, determine the reference failure duration of the target type laser at the test temperature; wherein, the reference failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the test temperature;

[0012] Determine the target failure duration according to the reference failure durations of the target type laser at each test temperature.

[0013] In one embodiment, determining the reference failure duration of the target type laser at the test temperature according to the standard output power, failure power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature includes:

[0014] Determine the power degradation rate of the target type laser at the test temperature according to the standard output power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature;

[0015] Determine the reference failure duration of the target type laser at the test temperature according to the standard output power, failure power of the target type laser, and the power degradation rate of the target type laser at the test temperature.

[0016] In one embodiment, determining the target failure duration according to the reference failure durations of the target type laser at each test temperature includes:

[0017] Determine the power degradation conditions of the target type laser at different temperatures according to the output power degradation data of the target type laser at each test temperature;

[0018] Determine the target failure duration according to the standard operating temperature of the target type laser, the power degradation conditions of the target type laser at different temperatures, each test temperature, and the reference failure durations of the target type laser at each test temperature.

[0019] In one embodiment, determining the target failure duration according to the standard operating temperature of the target type laser, the power degradation conditions of the target type laser at different temperatures, each test temperature, and the reference failure durations of the target type laser at each test temperature includes:

[0020] Determine the product acceleration factor of the target type laser at each test temperature according to each test temperature and the power degradation conditions of the target type laser at different temperatures;

[0021] Determine the target failure duration according to the reference failure duration of the target type laser at each test temperature and the product acceleration factor.

[0022] In one embodiment, determining the product acceleration factor of the target type laser at each test temperature according to each test temperature and the power degradation of the target type laser at different temperatures includes:

[0023] Determine the product activation energy of the target type laser according to the power degradation of the target type laser at different temperatures;

[0024] For each test temperature, determine the product acceleration factor of the target type laser at the test temperature according to the standard operating temperature, the test temperature, and the product activation energy.

[0025] In a second aspect, the present application also provides a device for determining the failure duration of a laser, including:

[0026] A temperature determination module, configured to determine at least three test temperatures according to the standard operating temperature and the operating failure mechanism of the target type laser;

[0027] A power acquisition module, configured to perform a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature;

[0028] A duration determination module, configured to determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; wherein, the target failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the standard operating temperature.

[0029] In a third aspect, the present application also provides a computer device, including a memory and a processor, where the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0030] Determine at least three test temperatures according to the standard operating temperature and the operating failure mechanism of the target type laser;

[0031] Perform a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature;

[0032] Determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; wherein, the target failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the standard operating temperature.

[0033] In a fourth aspect, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0034] Determine at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser;

[0035] Conduct a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature;

[0036] Determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; wherein, the target failure duration is the duration for the output power of the target type laser to degrade to the failure power when operating at the standard operating temperature.

[0037] In a fifth aspect, the present application also provides a computer program product, including a computer program. When the computer program is executed by a processor, the following steps are implemented:

[0038] Determine at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser;

[0039] Conduct a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature;

[0040] Determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; wherein, the target failure duration is the duration for the output power of the target type laser to degrade to the failure power when operating at the standard operating temperature.

[0041] The method, apparatus, device, and storage medium for determining the failure duration of the above-mentioned laser determine at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser, and respectively conduct a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature; then, according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature, determine the target failure duration when the output power of the target type laser degrades to the failure power during operation at the standard operating temperature. Compared with the related technology of directly obtaining the failure duration of the laser, by using the above method, within a fixed test duration, the output power degradation data of the target type laser at each test temperature is obtained, and then based on the test duration, test temperature, and the corresponding output power degradation data, the target failure duration is deduced, which can effectively shorten the time of the laser degradation test, thereby improving the efficiency of determining the failure duration. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the following will briefly introduce the drawings required for use in the description of the embodiments of the present application or the related art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0043] Figure 1 It is a schematic flowchart of the method for determining the failure duration of the laser in one embodiment;

[0044] Figure 2 It is a schematic flowchart of determining the target failure duration in one embodiment;

[0045] Figure 3 It is a schematic flowchart of determining the reference failure duration in one embodiment;

[0046] Figure 4 It is a schematic flowchart of determining the target failure duration in another embodiment;

[0047] Figure 5 It is a schematic flowchart of the method for determining the failure duration of the laser in another embodiment;

[0048] Figure 6 It is a structural block diagram of the device for determining the failure duration of the laser in one embodiment;

[0049] Figure 7 It is an internal structure diagram of a computer device in one embodiment. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0050] In order to make the objectives, technical solutions and advantages of the present application more clear and understandable, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0051] With the continuous development of the laser field, fiber lasers have emerged. In order to ensure the reliability of the operation of fiber lasers, it is necessary to conduct degradation tests on fiber lasers to determine the operating duration of fiber lasers. In the related art, the failure duration of a fiber laser can be determined by placing the fiber laser in operation at a specific temperature and timing.

[0052] However, due to the high mechanical stability of the fiber structure, it is not easily affected by external vibrations, impacts and other factors. And fiber lasers adopt an all-solid-state structure, without a gas sealing and circulation system like gas lasers, nor easily failed components such as easily worn optical lenses in some solid lasers. Therefore, during long-term operation, fiber lasers can maintain stable laser output. Therefore, when using the related art to conduct degradation tests on fiber lasers, there are problems such as long test cycles and low efficiency.

[0053] Based on this, in an exemplary embodiment, as Figure 1 shown, a method for determining the failure duration of a laser is provided. Taking the application of this method to a duration determination device as an example, the specific steps are as follows:

[0054] S101, determine at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser.

[0055] Among them, the so-called target type laser is any fiber laser under the target model. It can be understood that in this embodiment, at least three target type lasers need to be processed. Further, a high-power fiber laser is a laser using a rare-earth element-doped glass fiber as the gain medium. It mainly injects energy into the fiber gain medium through a pump source to cause population inversion, increases the number of photons under the action of stimulated radiation, and then amplifies the photons through a resonant cavity for feedback, and finally outputs laser.

[0056] The so-called standard operating temperature is the temperature that can ensure the stable operation of the target type laser; the so-called operating failure mechanism is the relevant information that causes the operation failure of the target type laser. For example, the operating failure mechanism may include, but is not limited to, the degree to which the operation failure of the laser is affected by temperature, etc.; the so-called test temperature is the temperature for conducting degradation tests on the target type laser, that is, operating the target type laser at the test temperature will accelerate the degradation rate of the laser.

[0057] Optionally, based on the operating failure mechanism of the target type laser, the standard operating temperature can be adjusted to determine at least three different test temperatures. Exemplarily, the operating failure mechanism and the standard operating temperature of the target type laser can be input into a trained temperature determination model at the same time. The temperature determination model outputs at least three test temperatures according to the operating failure mechanism, the standard operating temperature, and the model parameters.

[0058] S102. At each test temperature, a progressive censoring degradation test is performed on the target type laser to obtain the output power degradation data of the target type laser at each test temperature.

[0059] Herein, the so-called test duration is a preset fixed duration; the so-called output power degradation data are the data related to the output power of the target type laser obtained in the degradation test. The so-called progressive censoring degradation test is a test that infers the reliability characteristics of a product by monitoring the degradation process of the product performance (instead of directly observing the failure time) and terminating the test at a predetermined time point, and finally using the censored data.

[0060] Optionally, at each test temperature, a thermal stress method can be used to perform a degradation test on the target type laser for the test duration, so as to obtain the output power degradation data of the target type laser at each test temperature.

[0061] Exemplarily, the inlet and outlet interfaces of the target type laser can be connected to a high-temperature water cooler, where the water temperature of the high-temperature water cooler can be adjusted to above 60 °C; the inlet and outlet interfaces in the laser output head (Quartz Block Head, QBH) are connected to a low-temperature water cooler, where the water temperature of the low-temperature water cooler can reach as low as 15 °C at the lowest; the laser output interface in the QBH is connected to a laser test module, and the test module can perform tests on the output laser for laser power and wavelength.

[0062] After connecting the target type laser to other test equipment, high-temperature water set can be introduced into the target type laser, and the temperature can be adjusted with low-temperature water until the operating temperature of the target type laser is stabilized at the test temperature; then, within the test duration, the target type laser is operated, and the output power degradation data of the target type laser are obtained through the laser test module.

[0063] It can be understood that the operating stop condition of the target type laser can be reaching the test duration or the operation of the target type laser reaching the operating failure condition. Among them, if the operation of the target type laser reaches the operating failure condition, no subsequent processing is required, and the failure duration of the target type laser can be directly determined based on the test degradation time and the test temperature.

[0064] In addition, in this embodiment, the degradation test for the target type laser is at the whole machine level, that is, there is no need to disassemble the target type laser for the test, and the degradation test can be directly carried out based on the whole target type laser.

[0065] S103. Determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature.

[0066] Among them, the so-called standard output power is the output power when the target type laser leaves the factory, that is, the output power of the target type laser before degradation; the so-called target failure duration is the duration when the output power of the target type laser degrades to the failure power when operating at the standard operating temperature, that is, the time that the target type laser can be used at the standard operating temperature.

[0067] In an alternative embodiment, for each test temperature, first, based on the power difference between the output power degradation data of the target type laser at the test temperature and the standard output power, and the test duration, determine the power degradation rate of the target type laser at the test temperature.

[0068] After that, according to the difference between the test temperature and the standard operating temperature, and the power degradation rate of the target type laser at the test temperature, determine the power degradation rate of the target type laser at the standard operating temperature, so as to calculate the target failure duration of the target type laser at the standard operating temperature.

[0069] In another alternative embodiment, the test duration, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature can be directly input into the trained first duration determination model, and the first duration determination model outputs the target failure duration according to the test duration of the degradation test, the standard output power, the output power degradation data at each test temperature, and the model parameters.

[0070] In the method for determining the failure duration of the above-mentioned laser, at least three test temperatures are determined according to the standard operating temperature and operating failure mechanism of the target type laser, and a progressive censoring degradation test is carried out on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature; then, according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature, the target failure duration for the output power of the target type laser to degrade to the failure power when operating at the standard operating temperature is determined. Compared with the related technology of directly obtaining the failure duration of the laser, by using the above method, the output power degradation data of the target type laser at each test temperature is obtained within a fixed test duration, and then based on the test duration, test temperature, and the corresponding output power degradation data, the target failure duration is deduced, which can effectively shorten the time of the laser degradation test, thereby improving the efficiency of determining the failure duration.

[0071] To ensure the accuracy of determining the target failure duration, based on the above-mentioned embodiment, in the embodiment of the present application, an optional method for determining the target failure duration is provided, as Figure 2 shown, which specifically includes the following steps:

[0072] S201. For each test temperature, according to the standard output power, failure power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature, determine the reference failure duration of the target type laser at the test temperature.

[0073] Among them, the reference failure duration is the duration for the output power of the target type laser to degrade to the failure power when operating at the test temperature. Further, for the convenience of subsequent processing, the reference failure duration is associated with the corresponding test temperature.

[0074] In an optional implementation manner, for each test temperature, the degraded output power of the target type laser after the test duration can be obtained from the output power degradation data at the test temperature, and based on the power difference between the standard output power and the degraded output power of the target type laser, and the test duration, the power degradation rate of the target type laser at the test temperature is determined.

[0075] Subsequently, based on the power difference between the standard output power and the failure power of the target type laser, and the power degradation rate of the target type laser at the test temperature, the reference failure duration of the target type laser at the test temperature is determined.

[0076] In another alternative embodiment, the standard output power, failure power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature can be directly input into the trained second duration determination model. The second duration determination model outputs a reference failure duration based on the standard output power, failure power, test duration, output power degradation data at each test temperature, and the model parameters.

[0077] S202. Determine the target failure duration according to the reference failure duration of the target type laser at each test temperature.

[0078] Optionally, for each test temperature, the reference failure duration at the test temperature can be weighted based on the temperature difference between the test temperature and the standard operating temperature to obtain the target failure duration; or, the reference failure duration at the test temperature can be input into the trained third duration determination model, and the third duration determination model outputs the target failure duration according to the reference failure duration at the test temperature and the model parameters.

[0079] In another alternative embodiment, for each test temperature, the above steps can also be referred to. According to the reference failure duration of the target type laser at the test temperature, a candidate failure duration can be obtained; then, the candidate failure durations corresponding to each test temperature are averaged to obtain the target failure duration.

[0080] In the embodiments of the present application, by combining the reference failure durations of the target type laser at each test temperature to determine the target failure duration, the accuracy of determining the target failure duration can be ensured.

[0081] To ensure the accuracy of determining the reference failure duration, based on the above embodiments, in the embodiments of the present application, an alternative method for determining the reference failure duration is provided, as Figure 3 shown, which specifically includes the following steps:

[0082] S301. Determine the power degradation rate of the target type laser at the test temperature according to the standard output power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature.

[0083] Among them, the so-called power degradation rate is used to characterize the speed of the output power degradation of the target type laser.

[0084] In an alternative embodiment, for each test temperature, the degraded output power of the laser of the target type after the test duration can be obtained from the output power degradation data at that test temperature, and based on the ratio of the difference between the degraded output power and the standard output power of the laser of the target type at that test temperature to the test duration, the power degradation rate of the laser of the target type at that test temperature can be determined.

[0085] In another alternative embodiment, for each test temperature, referring to the following formula (1), based on the standard output power of the laser of the target type, the test duration, and the output power degradation data of the laser of the target type at that test temperature, the power degradation rate of the laser of the target type at that test temperature can be determined.

[0086] (1)

[0087] where P T1 is the degraded output power of the laser of the target type after the degradation test at the test temperature T1; P0 is the standard output power of the laser of the target type; exp() is the exponential function; t0 is the test duration; is the power degradation rate of the laser of the target type at the test temperature T1.

[0088] S302. Determine the reference failure duration of the laser of the target type at the test temperature according to the standard output power, the failure power of the laser of the target type, and the power degradation rate of the laser of the target type at the test temperature.

[0089] In an alternative embodiment, for each test temperature, after determining the power degradation rate of the laser of the target type at that test temperature, based on the power degradation difference between the standard output power and the failure power of the laser of the target type, and the power degradation rate at that test temperature, the reference failure duration of the laser of the target type at that test temperature can be determined.

[0090] In another alternative embodiment, for each test temperature, based on the relationship between the parameters in the above formula (1), and performing a logarithmic transformation on the above formula (1) to obtain the following formula (2), then, using the least squares method to calculate the regression coefficients for formula (2), the degradation equation of the laser of the target type at that test temperature can be determined. Subsequently, by solving the degradation equation, the reference failure duration of the laser of the target type at that test temperature can be obtained.

[0091] (2)

[0092] where P X is the failure power of the laser of the target type; P0 is the standard output power of the laser of the target type; is the power degradation rate of the target type laser at the test temperature T1; t T1 is the reference failure duration of the target type laser at the test temperature T1.

[0093] In the embodiment of the present application, by determining the reference failure duration according to the power degradation rate, standard output power, and failure power of the target type laser, the accuracy of determining the reference failure duration can be ensured.

[0094] In order to ensure the accuracy of determining the reference failure duration, based on the above embodiment, in the embodiment of the present application, another optional method for determining the reference failure duration is provided. Specifically, according to the output power degradation data of the target type laser at each test temperature, determine the power degradation situation of the target type laser at different temperatures; according to the standard operating temperature of the target type laser, the power degradation situation of the target type laser at different temperatures, each test temperature, and the reference failure duration of the target type laser at each test temperature, determine the target failure duration.

[0095] Among them, the so-called degradation data is the relevant data used to characterize the gradual degradation of the output power of the target type laser in the degradation test.

[0096] Optionally, the output power degradation data of the target type laser at each test temperature can be respectively subjected to fitting processing to obtain the power degradation situation of the target type laser at different temperatures. Then, for each test temperature, the reference failure duration at the test temperature can be processed according to the power degradation situation of the target type laser at the test temperature to obtain the target failure duration.

[0097] In another implementation manner, according to each test temperature and the power degradation situation of the target type laser at different temperatures, determine the product acceleration factor of the target type laser at each test temperature; according to the reference failure duration and product acceleration factor of the target type laser at each test temperature, determine the target failure duration. Among them, the so-called product acceleration factor is used to characterize the acceleration degree of aging of the target type laser.

[0098] Specifically, based on the power degradation situation of the target type laser at different temperatures, the operating duration characteristics of the target type laser at different temperatures can be determined, and then the operating duration characteristics corresponding to each test temperature can be determined; then, based on the operating duration characteristics corresponding to each test temperature and the temperature difference between each test temperature and the standard operating temperature, the reference failure duration and product acceleration factor of the target type laser at each test temperature can be determined.

[0099] Afterwards, for each test temperature, referring to the following formula (3), based on the product acceleration factor at this test temperature, the reference failure duration at this test temperature is weighted to obtain the target failure duration.

[0100] (3)

[0101] Among them, AF T1 is the product acceleration factor at the test temperature T1; t x is the target failure duration.

[0102] In the embodiments of the present application, by introducing the power degradation of the target type laser at different temperatures and determining the target failure duration based on the power degradation of the target type laser at different temperatures, the accuracy of the target failure duration can be ensured.

[0103] In order to ensure the accuracy of determining the target failure duration, on the basis of the above embodiments, in the embodiments of the present application, another optional method for determining the target failure duration is provided, as Figure 4 shown, which specifically includes the following steps:

[0104] S401, according to the power degradation of the target type laser at different temperatures, determine the product activation energy of the target type laser.

[0105] Among them, the so-called product activation energy is the energy consumed for the occurrence of faults in the Arrhenius model.

[0106] Optionally, according to the power degradation of the target type laser at different temperatures, a failure distribution model can be constructed to characterize the power degradation of the target type laser at different temperatures. Subsequently, based on the failure distribution model, the product activation energy of the target type laser is determined.

[0107] It can be understood that since this embodiment mainly considers the influence of temperature on the laser failure duration, the Arrhenius model can be used for modeling. Exemplarily, referring to the following formula (4), the power degradation of the target type laser at different temperatures is used to train the Arrhenius model to obtain the failure distribution model.

[0108] (4)

[0109] Among them, η is the life characteristic parameter; B is a constant, K is the Boltzmann constant, T is the test temperature, and Ea is the product activation energy.

[0110] After that, a linear transformation is performed on the failure distribution model to obtain the following formula (5), so as to fit and establish the relationship between temperature and characteristic life. At this time, by combining the life characteristic parameters under different temperature conditions with the least squares method, the activation energy of the product can be calculated.

[0111] (5)

[0112] S402. For each test temperature, according to the standard operating temperature, test temperature and product activation energy, determine the product acceleration factor of the target type laser at the test temperature.

[0113] Optionally, for each test temperature, the product acceleration factor of the target type laser at the test temperature can be calculated by referring to the following formula (6) according to the standard operating temperature, test temperature and product activation energy.

[0114] (6)

[0115] where AF T1 is the product acceleration factor at the test temperature T1; T0 is the standard operating temperature.

[0116] In the embodiments of the present application, by determining the product acceleration factor of the target type laser at each test temperature according to the standard operating temperature, test temperature and product activation energy, the accuracy of determining the product acceleration factor can be ensured.

[0117] Figure 5 FIG. is a schematic flow chart of a method for determining the failure duration of a laser in another embodiment. Based on the above embodiments, an optional example of a method for determining the failure duration of a laser is provided in this embodiment. Combining Figure 5 , the specific implementation process is as follows:

[0118] S501. According to the standard operating temperature and operating failure mechanism of the target type laser, determine at least three test temperatures.

[0119] S502. Respectively, at each test temperature, perform a type-II censored degradation test on the target type laser to obtain the output power degradation data of the target type laser at each test temperature.

[0120] S503. According to the standard output power of the target type laser, the test duration of the degradation test and the output power degradation data of the target type laser at each test temperature, respectively determine the power degradation rate of the target type laser at each test temperature.

[0121] S504. Determine the reference failure duration of the target type laser at each test temperature based on the standard output power, failure power of the target type laser, and the power degradation rate of the target type laser at each test temperature.

[0122] Among them, the reference failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the test temperature.

[0123] S505. Determine the power degradation of the target type laser at different temperatures based on the output power degradation data of the target type laser at each test temperature.

[0124] Optionally, a failure distribution model can be constructed based on the output power degradation data of the target type laser at each test temperature to reflect the power degradation of the target type laser at different temperatures.

[0125] S506. Determine the product activation energy of the target type laser according to the power degradation of the target type laser at different temperatures.

[0126] S507. For each test temperature, determine the product acceleration factor of the target type laser at the test temperature according to the standard operating temperature, test temperature, and product activation energy.

[0127] S508. Determine the target failure duration according to the reference failure duration and product acceleration factor of the target type laser at each test temperature.

[0128] Among them, the target failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the standard operating temperature.

[0129] For the specific processes of the above S501 - S508, reference can be made to the descriptions of the method embodiments above. Their implementation principles and technical effects are similar and will not be elaborated here.

[0130] It should be understood that although the steps in the flowcharts involved in the above - mentioned embodiments are shown in sequence according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above - mentioned embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same moment but can be executed at different moments, and the execution order of these steps or stages is not necessarily sequential, but can be executed alternately or in turn with at least a part of other steps or steps or stages in other steps.

[0131] Based on the same inventive concept, an embodiment of the present application further provides a device for determining the failure duration of a laser for implementing the method for determining the failure duration of the laser involved above. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the device for determining the failure duration of the laser provided below can refer to the limitations on the method for determining the failure duration of the laser in the foregoing, and will not be elaborated here.

[0132] In an exemplary embodiment, as Figure 6 shown, a device 1 for determining the failure duration of a laser is provided, including: a temperature determination module 10, a power acquisition module 20, and a duration determination module 30, where:

[0133] The temperature determination module 10 is configured to determine at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser.

[0134] The power acquisition module 20 is configured to perform a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature.

[0135] The duration determination module 30 is configured to determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; where the target failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the standard operating temperature.

[0136] In an exemplary embodiment, the duration determination module 30 includes:

[0137] The first determination unit is configured to, for each test temperature, determine the reference failure duration of the target type laser at the test temperature according to the standard output power, failure power, test duration of the target type laser, and the output power degradation data of the target type laser at the test temperature; where the reference failure duration is the duration when the output power of the target type laser degrades to the failure power during operation at the test temperature.

[0138] The second determination unit is configured to determine the target failure duration according to the reference failure durations of the target type laser at each test temperature.

[0139] In an exemplary embodiment, the first determination unit is specifically configured to:

[0140] Determine the power degradation rate of the target type laser at the test temperature based on the standard output power of the target type laser, the test duration, and the output power degradation data of the target type laser at the test temperature; determine the reference failure duration of the target type laser at the test temperature based on the standard output power, the failure power of the target type laser, and the power degradation rate of the target type laser at the test temperature.

[0141] In an exemplary embodiment, the second determination unit is specifically configured to:

[0142] The first sub-unit is configured to determine the power degradation conditions of the target type laser at different temperatures based on the output power degradation data of the target type laser at each test temperature;

[0143] The second sub-unit is configured to determine the target failure duration based on the standard operating temperature of the target type laser, the power degradation conditions of the target type laser at different temperatures, each test temperature, and the reference failure duration of the target type laser at each test temperature.

[0144] In an exemplary embodiment, the second sub-unit is specifically configured to:

[0145] Determine the product acceleration factor of the target type laser at each test temperature based on each test temperature and the power degradation conditions of the target type laser at different temperatures; determine the target failure duration based on the reference failure duration of the target type laser at each test temperature and the product acceleration factor.

[0146] In an exemplary embodiment, the second sub-unit is further configured to:

[0147] Determine the product activation energy of the target type laser according to the power degradation conditions of the target type laser at different temperatures; for each test temperature, determine the product acceleration factor of the target type laser at the test temperature based on the standard operating temperature, the test temperature, and the product activation energy.

[0148] Each module in the above device for determining the failure duration of the laser can be implemented in whole or in part by software, hardware, and their combination. Each of the above modules can be embedded in the processor of the computer device in hardware form or be independent of it, or can be stored in the memory of the computer device in software form so that the processor can call and execute the operations corresponding to each of the above modules.

[0149] In an exemplary embodiment, a computer device is provided. The computer device can be a server, and its internal structure diagram can be as Figure 7As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O), and a communication interface. Among them, the processor, the memory, and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store output power degradation data. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, it implements a method for determining the failure duration of a laser.

[0150] Those skilled in the art can understand that Figure 7 the structure shown in is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0151] In one embodiment, a computer device is further provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the steps in the above method embodiments are implemented.

[0152] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by the processor, the steps in the above method embodiments are implemented.

[0153] In one embodiment, a computer program product is provided, including a computer program. When the computer program is executed by the processor, the steps in the above method embodiments are implemented.

[0154] It should be noted that the data involved in this application (including but not limited to output power degradation data, etc.) are all information and data authorized by users or fully authorized by all parties, and the collection, use, and processing of relevant data need to comply with relevant regulations.

[0155] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processors, graphics processors, digital signal processors, programmable logic devices, data processing logics based on quantum computing, artificial intelligence (AI) processors, etc., without limitation.

[0156] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered to be within the scope recorded in the present application.

[0157] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all fall within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims

1. A method for determining the failure duration of a laser, characterized in that, The method includes: Determining at least three test temperatures according to the standard operating temperature and operating failure mechanism of the target type laser; Conducting a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature; Determining the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; wherein, the target failure duration is the duration for the output power of the target type laser to degrade to the failure power when operating at the standard operating temperature.

2. The method according to claim 1, characterized in that, The determining of the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature includes: For each test temperature, determining the reference failure duration of the target type laser at the test temperature according to the standard output power of the target type laser, the failure power, the test duration, and the output power degradation data of the target type laser at the test temperature; wherein, the reference failure duration is the duration for the output power of the target type laser to degrade to the failure power when operating at the test temperature; Determining the target failure duration according to the reference failure durations of the target type laser at each test temperature.

3. The method according to claim 2, wherein The determining of the reference failure duration of the target type laser at the test temperature according to the standard output power of the target type laser, the failure power, the test duration, and the output power degradation data of the target type laser at the test temperature includes: Determining the power degradation rate of the target type laser at the test temperature according to the standard output power of the target type laser, the test duration, and the output power degradation data of the target type laser at the test temperature; Determining the reference failure duration of the target type laser at the test temperature according to the standard output power of the target type laser, the failure power, and the power degradation rate of the target type laser at the test temperature.

4. The method according to claim 2, wherein The determining of the target failure duration according to the reference failure durations of the target type laser at each test temperature includes: Determining the power degradation conditions of the target type laser at different temperatures according to the output power degradation data of the target type laser at each test temperature; Determining the target failure duration according to the standard operating temperature of the target type laser, the power degradation conditions of the target type laser at different temperatures, each test temperature, and the reference failure durations of the target type laser at each test temperature.

5. The method according to claim 4, wherein The determining of the target failure duration according to the standard operating temperature of the target type laser, the power degradation conditions of the target type laser at different temperatures, each test temperature, and the reference failure durations of the target type laser at each test temperature includes: Determine the product acceleration factor of the target type laser at each test temperature according to each test temperature and the power degradation of the target type laser at different temperatures; Determine the target failure duration according to the reference failure duration and the product acceleration factor of the target type laser at each test temperature.

6. The method according to claim 5, wherein The determining the product acceleration factor of the target type laser at each test temperature according to each test temperature and the power degradation of the target type laser at different temperatures includes: Determine the product activation energy of the target type laser according to the power degradation of the target type laser at different temperatures; For each test temperature, determine the product acceleration factor of the target type laser at the test temperature according to the standard operating temperature, the test temperature, and the product activation energy.

7. A device for determining the failure duration of a laser, characterized in that, The device includes: A temperature determination module, configured to determine at least three test temperatures according to the standard operating temperature and the operating failure mechanism of the target type laser; A power acquisition module, configured to perform a progressive censoring degradation test on the target type laser at each test temperature to obtain the output power degradation data of the target type laser at each test temperature; A duration determination module, configured to determine the target failure duration according to the test duration of the degradation test, the standard output power of the target type laser, and the output power degradation data of the target type laser at each test temperature; wherein, the target failure duration is the duration for the output power of the target type laser to degrade to the failure power when operating at the standard operating temperature.

8. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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