Dielectric temperature spectrum automatic test system and test method

Abstract

The invention belongs to the field of automatic material testing, and particularly relates to an automatic dielectric temperature spectrum testing system and method, and the automatic dielectric temperature spectrum testing system comprises a sample table, a feeding device and a testing device; the testing device comprises an annular testing cavity, a sample placing disc, a temperature control mechanism and a plurality of probe mechanisms; the annular test cavity comprises an air injection and exhaust mechanism for injecting air into the annular test cavity; the sample placing disc is arranged in the middle of the bottom of the annular testing cavity; the temperature control mechanism comprises a temperature control table, a refrigerant fluid circulation groove is formed in the upper surface of the temperature control table, and a plurality of heating pieces are arranged on the temperature control table and located below the refrigerant fluid circulation groove; the probe mechanism comprises a probe moving frame and a probe. According to the automatic dielectric temperature spectrum testing system provided by the invention, a multi-channel 24-hour continuous automatic dielectric temperature spectrum test can be formed, full-process automation of the test is realized, the test efficiency is improved, personal errors are reduced, the data repeatability is high, and the accuracy is good.

Description

Technical Field

[0001] The present invention belongs to the field of material testing, and particularly relates to a dielectric temperature spectrum automatic testing system and a testing method. Background Art

[0002] The high and low temperature dielectric constant is an important physical property applicable to various metal oxides, plates, porcelain (pottery), mica, glass, plastics and other substances. By measurement, various factors affecting dielectric loss and dielectric constant can be further understood, providing a basis for improving the performance of materials.

[0003] Most of the current dielectric temperature spectrum testing instruments can only perform single-channel testing, unable to test multiple samples simultaneously, which limits the testing efficiency and is difficult to test dielectric materials in different states simultaneously.

[0004] Chinese Patent Application No. 201910583687.9 discloses a dielectric ceramic and its inspection method and equipment, including a frame and a workpiece handling and loading device, an indexing turntable device, a carrier plate transfer device, a dielectric temperature spectrum tester and a blanking and collecting device installed on the frame; the workpiece handling and loading device, the carrier plate transfer device and the blanking and collecting device are located around the indexing turntable device, corresponding to three mutually perpendicular directions of the indexing turntable device; four workstations are evenly arranged on the circumference of the indexing turntable device; the dielectric temperature spectrum tester is located on the side of the carrier plate transfer device. However, the applicant found that this method is single-channel testing, and there is great room for improvement in testing efficiency. Its automatic device is a three-dimensional robotic arm, and its flexibility needs to be improved. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to provide a dielectric temperature spectrum automatic testing system and a testing method that can simultaneously test multiple and various dielectric materials in different states.

[0006] The present invention provides a dielectric temperature spectrum automatic testing system, including a sample stage, a loading device and a testing device; The sample stage is used to store a plurality of dielectric materials to be tested, and the dielectric materials to be tested can be at least one of solid dielectric materials, gas dielectric materials contained in a container or liquid dielectric materials contained in a container; The loading device is used to transfer the dielectric materials to be tested on the sample stage to the testing device; The testing device includes an annular testing chamber, a specimen placement disc, a temperature control mechanism and a plurality of probe mechanisms arranged in the annular testing chamber; The annular testing chamber is provided with an opening that can be opened and closed, and further includes an injection and exhaust mechanism for injecting gas into the annular testing chamber, and the injection and exhaust mechanism provides an atmosphere for the annular testing chamber; The sample placement disk is arranged in the middle of the bottom of the annular test cavity; The temperature control mechanism includes a temperature control table. The upper surface of the temperature control table is fitted with the lower surface of the sample placement disk. The upper surface of the temperature control table is provided with a refrigerant circulation groove. The open end of the refrigerant circulation groove is hermetically sealed with the bottom surface of the sample placement disk. An inlet and an outlet for communicating with the refrigerant circulation groove are arranged on the side surface of the temperature control table. A plurality of heating elements are arranged below the refrigerant circulation groove on the temperature control table; The probe mechanism includes a probe moving frame and a probe arranged at the output end of the probe moving frame. The probe moving frame is used to drive the probe to contact or leave the dielectric material to be tested on the sample placement disk of the sample holder; A plurality of probe mechanisms are arranged at annular intervals around the axis of the annular test cavity. Furthermore, a temperature measuring column is arranged below the middle of the sample placement disk, and a temperature measuring device is arranged at the end of the temperature measuring column; A positioning hole for cooperating with the temperature measuring column is arranged on the temperature control table.

[0007] Furthermore, an annular partition is arranged in the middle of the annular test cavity. The outer wall of the annular partition cooperates with the inner wall of the annular test cavity, and the inner wall of the annular partition cooperates with the temperature control table; The sample placement disk is arranged above the annular partition. A negative conductive ring and a positive conductive ring are arranged below the annular test cavity and below the annular partition; A plurality of heating elements are arranged in an annular array on the temperature control table. The first end of the heating element extending out of the temperature control table is provided with a positive connecting wire and a negative connecting wire. The positive connecting wire is connected to the positive conductive ring, and the negative connecting wire is connected to the negative conductive ring.

[0008] Furthermore, the probe moving frame includes a housing, a rocker, a guide plate, a movable rod, an XY slide rail structure and a rotation driving mechanism; The rotation driving mechanism, the guide plate and the XY slide rail structure are fixedly arranged in the housing; One end of the rocker is connected to the output rotating shaft of the rotation driving mechanism, and the other end is provided with a chute; A guide groove is arranged on the guide plate. The guide groove includes a horizontal groove and a vertical groove arranged downward on the side of the horizontal groove facing the annular test cavity; The movable rod is fixedly arranged on the output slider of the XY slide rail structure, and a guide rod for cooperating with the guide groove and the chute is arranged at one end of the movable rod. The other end of the movable rod extends out of the housing and extends into the annular test cavity.

[0009] Furthermore, the probe includes a connecting plate, an angle adjusting chuck and a needle body; The connecting plate is detachably arranged at the end of the movable rod; One end of the connecting plate is horizontally provided with an installation platform, and a hinge hole is arranged at the bottom of the installation platform. The angle adjustment chuck is rotatably arranged on the hinge hole, and one end of the needle body is fixedly arranged on the angle adjustment chuck.

[0010] Furthermore, a wire interface is arranged on the side wall of the annular test chamber on the side of the probe, and the needle body is electrically connected to the wire interface through a wire.

[0011] Furthermore, the dielectric temperature spectrum automatic test system further includes a base and a door body; The base includes a disc base and an annular side plate arranged outside the disc base, and the upper part of the annular side plate is open; The door body includes a circular door panel and a door panel driving mechanism, and the door panel driving mechanism is used to drive the circular door panel to block and open the opening; The disc base, the annular side plate and the circular door panel enclose to form the annular test chamber.

[0012] Furthermore, through holes are arranged on the annular side plate; The probe moving frame is arranged outside the annular side plate, and the output end of the probe moving frame is arranged in the annular test chamber through the through hole.

[0013] Furthermore, injection and exhaust mounting holes are arranged on the annular side plate, and the injection and exhaust mechanism includes an air pipe arranged on the injection and exhaust mounting hole.

[0014] The present invention also provides a dielectric temperature spectrum test method. Using the above dielectric temperature spectrum automatic test system, when the dielectric material is solid or liquid, it includes the following steps: S11, open the opening of the annular test chamber, and place a plurality of dielectric materials to be tested on the sample stage on the sample placing disc through the feeding device; S12, close the opening of the annular test chamber, and control the atmosphere in the annular test chamber through the injection and exhaust mechanism; S13, control the probe moving frame to drive the probe to contact the dielectric material on the sample placing disc, and perform dielectric temperature spectrum test; During the test, control the temperature of the sample placing disc and the annular test chamber through the temperature control mechanism; S14, after the test is completed, the probe moving frame drives the probe to leave the dielectric material on the sample placing disc, the injection and exhaust mechanism discharges the gas, open the opening of the annular test chamber, and transfer the measured dielectric material on the sample placing disc to the recovery station through the feeding device; S15, re-enter step S11 to perform cyclic automatic test.

[0015] The beneficial effects of the present invention are as follows. The automatic dielectric temperature spectrum test system provided by the present invention, through the settings of the sample stage, the feeding device and the test device, completely replaces manual labor, can achieve continuous automatic testing for 24 hours, and the automatic testing is efficient and accurate, which can ensure the test quality, can form multi-channel dielectric temperature spectrum testing, improve the test efficiency, and at the same time can test three kinds of dielectric materials, namely solid, liquid and gas, and the three kinds of dielectric materials can be tested simultaneously. In addition, the setting of the temperature control mechanism has a good heat conduction effect on the sample placement disc, and can perform efficient and rapid temperature control on the sample placement disc and the annular test cavity, and then can test the dielectric properties of the dielectric material at different temperatures. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Attached Figure 1 is a schematic structural diagram of the present invention; Attached Figure 2 is a top view of the present invention; Attached Figure 3 is the sectional view taken along the line A-A in the attached Figure 2 ; Attached Figure 4 is the enlarged partial view at C in the attached Figure 3 ; Attached Figure 5 is the sectional view taken along the line B-B in the attached Figure 2 ; Attached Figure 6 is a schematic structural diagram of the probe moving frame in the present invention; Attached Figure 7 is a schematic structural diagram of the present invention after hiding the door body; Attached Figure 8 is the structural diagram at D in the attached Figure 7 ; Attached Figure 9 is a schematic structural diagram of the present invention after hiding the door body and part of the annular partition; Attached Figure 10 is the first-angle exploded view of the sample placement disc and the temperature control table in the present invention; Attached Figure 11 is the second-angle exploded view of the sample placement disc and the temperature control table in the present invention; Attached Figure 12 is the front view of the present invention; Attached Figure 13 is the sectional view taken along the line E-E in the attached Figure 12 ; Attached Figure 14 is the sectional view taken along the line F-F in the attached Figure 12 ;

[0017] In the figure, 1 - annular test chamber; 11 - base; 111 - disc base; 112 - annular side plate; 1121 - through hole; 1122 - injection / venting mounting hole; 12 - door body; 121 - circular door panel; 122 - door panel drive mechanism; 13 - annular partition; 2 - specimen placement disc; 21 - temperature measuring column; 22 - temperature measuring device; 3 - temperature control mechanism; 31 - temperature control table; 311 - refrigerant circulation groove; 312 - liquid inlet; 313 - liquid outlet; 314 - heating element; 32 - positioning hole; 33 - negative conductive ring; 34 - positive conductive ring; 4 - probe mechanism; 41 - probe moving frame; 411 - housing; 412 - rocker; 4121 - chute; 413 - guide plate; 4131 - horizontal groove; 4132 - vertical groove; 414 - movable rod; 4141 - guide rod; 415 - XY slide rail structure; 416 - rotation drive mechanism; 42 - probe; 421 - connecting plate; 4211 - mounting platform; 4212 - hinge hole; 422 - angle adjustment chuck; 423 - needle body; 43 - wire interface; 5 - injection / venting mechanism. Detailed implementation mode

[0018] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0019] It should be noted that all the directional indications (such as up, down, left, right, front, back...) in the embodiments of the present invention are only used to explain the relative positional relationship and movement conditions between components in a specific posture (as shown in the drawings). If the specific posture changes, the directional indications will also change accordingly.

[0020] In addition, the descriptions such as "first" and "second" in the present invention are only for descriptive purposes, and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "a plurality" is at least two, such as two, three, etc., unless otherwise specifically defined.

[0021] In the present invention, unless otherwise clearly specified and defined, terms such as "connection" and "fixation" shall be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection, an electrical connection, a physical connection, or a wireless communication connection; it can be directly connected, or indirectly connected through an intermediate medium, and can be the communication inside two components or the interaction relationship between two components, unless otherwise clearly defined. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0022] In addition, the technical solutions between various embodiments of the present invention can be combined with each other, but it must be based on the ability of those of ordinary skill in the art to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0023] As shown in the Figure 1 - attached Figure 14 accompanying drawings, an automatic dielectric temperature spectrum testing system of the present invention includes a sample stage, a feeding device, and a testing device; The sample stage is used to store a plurality of dielectric materials to be tested. The dielectric materials to be tested can be at least one of solid dielectric materials, gaseous dielectric materials contained in a container, or liquid dielectric materials contained in a container. When it is a gaseous dielectric material contained in a container, both ends of the container are made of conductive materials. At this time, the gas will connect the conductive materials at both ends to test the dielectric temperature spectrum performance of the gas. When it is a liquid dielectric material contained in a container, both ends of the container are made of conductive materials. At this time, the liquid will connect the conductive materials at both ends to test the dielectric temperature spectrum performance of the gas. Preferably, the dielectric materials to be tested are arranged in a rectangular array on the platform of the sample stage to facilitate the extraction by the feeding device; The feeding device is used to transfer the dielectric materials to be tested on the sample stage to the testing device. Preferably, the feeding device uses a manipulator to grab; The testing device includes an annular testing chamber 1, a sample placement disc 2, a temperature control mechanism 3, and a plurality of probe mechanisms 4 arranged in the annular testing chamber 1; The annular testing chamber 1 is provided with an opening that can be opened and closed. When the opening is opened, the feeding device can be used to place the dielectric materials to be tested into the annular testing chamber 1 or take away the tested dielectric materials. After placing the dielectric materials to be tested, the opening can be closed to make the annular testing chamber 1 in a relatively closed state. On the one hand, the atmosphere of the annular testing chamber 1 can be controlled or temperature control operations can be performed, and on the other hand, the safety of high-voltage testing can be ensured. This automatic dielectric temperature spectrum testing system also includes an injection and exhaust mechanism 5 for injecting gas into the annular testing chamber 1, and the injection and exhaust mechanism 5 provides the atmosphere for the annular testing chamber 1; The sample placement disk 2 is arranged in the middle of the bottom of the annular test cavity 1, which is convenient for placing the dielectric material to be tested, and can also ensure that the distance between the sample placement disk 2 and the side wall of the annular test cavity 1 is consistent. Reference Figure 10 The temperature control mechanism 3 includes a temperature control platform 31, the upper surface of the temperature control platform 31 is fitted with the lower surface of the sample placement disk 2, and a cooling liquid circulation groove 311 is provided on the upper surface of the temperature control platform 31. The cooling liquid circulation groove 311 is preferably spiral in shape to increase the contact area, thereby improving the cooling effect on the temperature control platform 31. The cooling liquid circulation groove 311 is used to circulate cooling liquid, and the cooling liquid is preferably liquid nitrogen. The open end of the cooling liquid circulation groove 311 is sealed with the bottom surface of the sample placement disk 2, that is, the cooling liquid circulation groove 311 on the temperature control platform 31 and the bottom wall of the sample placement disk 2 are enclosed to form a cooling liquid circulation channel, thereby allowing the cooling liquid to directly cool the sample placement disk 2, and the portion of the temperature control platform 31 other than the cooling liquid circulation groove 311 is fitted with the lower surface of the sample placement disk 2, which can be used for temperature conduction, and the side of the temperature control platform 31 is provided with a liquid inlet 312 and a liquid outlet 313 connected to the cooling liquid circulation groove 311, and the liquid inlet 312 is used to The liquid inlet pipe is connected, and the liquid outlet 313 is used to connect the liquid outlet pipe. The liquid inlet pipe and the liquid outlet pipe are connected to the refrigerant liquid circulation device to provide the refrigerant liquid that continuously circulates to the refrigerant liquid circulation groove 311. The temperature control platform 31 is located below the refrigerant liquid circulation groove 311 and is provided with a plurality of heating elements 314. The heating element 314 is used to heat the temperature control platform 31. The heating of the heating element 314 and the circulation of the refrigerant liquid in the refrigerant liquid circulation groove 311 are both used at the same time to heat the sample placement disc 2. Specifically, the heating element 314 can heat the temperature control platform 31, and then the part of the temperature control platform 31 other than the refrigerant liquid circulation groove 311 and the part that is in contact with the lower surface of the sample placement disc 2 directly conduct heat to heat the sample placement disc 2. In addition, the heating of the temperature control platform 31 will also conduct heat to the refrigerant in the refrigerant liquid circulation groove 311. The heated refrigerant conducts heat to the lower surface of the sample placement disc 2 to ensure the heating effect of the temperature control platform 31 on the sample placement disc 2. The probe mechanism 4 includes a probe moving frame 41 and a probe 42 arranged on the output end of the probe moving frame 41. The probe moving frame 41 is used to drive the probe 42 to contact or leave the dielectric material to be tested on the sample holding disk 2. A plurality of probe mechanisms 4 are arranged at annular intervals around the axis of the annular test chamber 1. Specifically, the probe moving frame 41 is arranged on the side wall of the cavity of the annular test chamber 1, and the probe 42 can enter or leave the position of the sample placement disc 2. With such a setting, combined with the circular design of the annular test chamber 1 and the sample placement disc 2, when the annular test chamber 1 has a certain diameter, the number of probe mechanisms 4 can be increased as much as possible, thereby increasing the number of tests in one go. Refer to the appendix Figure 2 , in a preferred embodiment, 10 probe mechanisms 4 are provided to form a 10-channel test.

[0024] The dielectric temperature spectrum automatic test system provided by the present invention, through the settings of the sample stage, the feeding device, and the test device, completely replaces manual work, can realize continuous automatic testing for 24 hours, and the automatic testing is efficient and accurate, which can ensure the test quality, can form a multi-channel dielectric temperature spectrum test, improve the test efficiency, and at the same time can test three dielectric materials of solid state, liquid state and gas, and the three dielectric materials can be tested simultaneously. In addition, the setting of the temperature control mechanism 3 has a good heat conduction effect on the sample placement disc 2, and can perform efficient and rapid temperature control on the sample placement disc 2 and inside the annular test chamber 1, so as to test the dielectric properties of the dielectric material at different temperatures. In one embodiment, refer to the appendix Figure 11 , a temperature measuring column 21 is arranged below the middle of the sample placement disc 2, and a temperature measuring device 22 is arranged at the end of the temperature measuring column 21. With such a setting, it is convenient to monitor the real-time temperature of the sample placement disc 2 in real time, and the temperature measuring device 22 can be located away from the annular test chamber 1 to improve the service life of the temperature measuring device 22; A positioning hole 32 matching with the temperature measuring column 21 is arranged on the temperature control table 31. The setting of the positioning hole 32 provides an installation space for the temperature measuring column 21 on the one hand, and on the other hand, can also position the assembly of the sample placement disc 2 and the temperature control table 31 to ensure the assembly accuracy of the temperature control table 31 and the sample placement disc 2.

[0025] In one embodiment, refer to the appendix Figure 3 , an annular partition 13 is arranged in the middle of the annular test chamber 1. The outer wall of the annular partition 13 cooperates with the inner wall of the annular test chamber 1, and the inner wall of the annular partition 13 cooperates with the temperature control table 31. The annular partition 13 divides the annular test chamber 1 into an upper chamber and a lower chamber that are independent of each other. At this time, the injection and exhaust mechanism 5 is used to inject and exhaust air into the upper chamber; The sample placement disc 2 is arranged above the annular partition 13, that is, the sample placement disc 2 is located in the upper cavity. The negative conductive ring 33 and the positive conductive ring 34 are arranged below the annular partition 13 in the annular test cavity 1, that is, the negative conductive ring 33 and the positive conductive ring 34 are located in the lower cavity. With such a setting, the negative conductive ring 33 and the positive conductive ring 34 can be kept out of the atmosphere state, thereby improving their service life. A plurality of heating elements 314 are arranged in an annular array on the temperature control platform 31. The first end of the heating element 314 extending out of the temperature control platform 31 is provided with a positive connection wire and a negative connection wire. The positive connection wire is connected to the positive conductive ring 34, and the negative connection wire is connected to the negative conductive ring 33. In this embodiment, the electrical connection difficulty of the heating element 314 can be greatly simplified, and at the same time, the heating uniformity of the heating element 314 for the temperature control platform 31 and the sample placement disc 2 can be ensured.

[0026] In one embodiment, referring to the appendix Figure 6 , the probe moving frame 41 includes a housing 411, a rocker 412, a guide plate 413, a movable rod 414, an XY slide rail structure 415, and a rotation driving mechanism 416; The rotation driving mechanism 416, the guide plate 413, and the XY slide rail structure 415 are fixedly arranged in the housing 411. The rotation driving mechanism 416 preferably adopts a motor, and the rotation driving mechanism 416 is fixedly arranged on the guide plate 413, and the guide plate 413 is then fixed in the housing 411. The XY slide rail structure 415 includes an X guide rail slider and a Y guide rail slider. The guide rail of the Y guide rail slider is fixedly arranged on the slider of the X guide rail slider, and finally the slider of the Y guide rail slider serves as the output slider of the XY slide rail structure 415; One end of the rocker 412 is connected to the output rotating shaft of the rotation driving mechanism 416. The rotation driving mechanism 416 is used to drive the rocker 412 to swing reciprocally. The other end of the rocker 412 is provided with a chute 4121, and the sliding direction of the chute 4121 is consistent with the length direction of the rocker 412; The guide plate 413 is provided with a guide groove. The guide groove includes a horizontal groove 4131 and a vertical groove 4132 provided downward on one side of the horizontal groove 4131 facing the annular test cavity 1; The movable rod 414 is fixedly arranged on the output slider of the XY slide rail structure 415, thereby providing moving guidance for the movable rod 414, making the movement of the movable rod 414 stable and reliable. One end of the movable rod 414 is provided with a guide rod 4141 that cooperates with the guide groove and the chute 4121, and the other end of the movable rod 414 extends out of the housing 411 and extends into the annular test cavity 1.

[0027] When the rotary drive mechanism 416 drives the rocker 412 to swing towards the annular test chamber 1, the guide rod 4141 of the movable rod 414 slides along the chute 4121 and simultaneously slides from the horizontal groove 4131 towards the vertical groove 4132. At this time, the movable rod 414 drives the probe 42 to horizontally move towards the sample placement disc 2 in the middle of the annular test chamber 1. When the guide rod 4141 moves to the end of the horizontal groove 4131, the guide rod 4141 will move downward to the lower part of the vertical groove 4132. At this time, the movable rod 414 drives the probe 42 to move downward towards the sample placement disc 2 in the middle of the annular test chamber 1, so that the probe 42 abuts against the dielectric material on the sample placement disc 2. When the rotary drive mechanism 416 drives the rocker 412 to swing towards the side away from the annular test chamber 1, the movement direction of the movable rod 414 is just the opposite, first moving upward and then moving to the side wall of the annular test chamber 1.

[0028] The probe moving bracket 41 provided in this embodiment can drive the probe 42 to move from the side wall of the annular test chamber 1 to the middle of the annular test chamber 1 and then move downward towards the sample placement disc 2. On the one hand, it can be far away from the position above the sample placement disc 2 before the probe 42 works, which is convenient for taking and placing the dielectric material on the sample placement disc 2. On the other hand, it can vertically abut against the dielectric material on the sample placement disc 2, reducing the wear on the solid dielectric material. At the same time, the probe moving bracket 41 can achieve the above operations through a single rotary drive mechanism 416, having the advantages of simple and reliable structure.

[0029] In one of the embodiments, referring to the attached Figure 8 , the probe 42 includes a connecting plate 421, an angle adjustment chuck 422 and a needle body 423; The connecting plate 421 is detachably arranged at the end of the movable rod 414; One end of the connecting plate 421 is horizontally provided with a mounting platform 4211, and a hinge hole 4212 is provided at the bottom of the mounting platform 4211. The angle adjustment chuck 422 is rotatably arranged in the hinge hole 4212, and one end of the needle body 423 is fixedly arranged on the angle adjustment chuck 422.

[0030] In this embodiment, the angle of the needle body 423 can be adjusted by adjusting the angle of the angle adjustment chuck 422 itself and the mounting angle with the connecting plate 421, so as to facilitate the accurate docking contact between the needle body 423 and the dielectric material.

[0031] In one of the embodiments, a wire interface 43 is provided on the side wall of the annular test chamber 1 on the side of the probe 42. The needle body 423 is electrically connected to the wire interface 43 through a wire. The wire interface 43 is used to connect the signal wire of the needle body 423 and lead out the test signal.

[0032] In one embodiment, referring to the attached Figure 2 , the automatic dielectric temperature spectrum testing system further includes a base 11 and a door body 12; The base 11 includes a disc base 111 and an annular side plate 112 disposed outside the disc base 111. The annular side plate 112 is open at the top; The door body 12 includes a circular door plate 121 and a door plate driving mechanism 122. The door plate driving mechanism 122 is used to drive the circular door plate 121 to block and open the opening; The disc base 111, the annular side plate 112 and the circular door plate 121 enclose to form the annular test chamber 1. In this embodiment, the outer wall of the annular test chamber 1 is cylindrical, which can reduce the structural size.

[0033] In one embodiment, a through hole 1121 is provided on the annular side plate 112; The probe moving frame 41 is disposed outside the annular side plate 112, and the output end of the probe moving frame 41 is disposed in the annular test chamber 1 through the through hole 1121. This setting can avoid the probe moving frame 41 occupying the internal space of the annular test chamber 1, and at the same time ensure the sealing performance of the annular test chamber 1.

[0034] In one embodiment, an injection / venting installation hole 1122 is provided on the annular side plate 112. The injection / venting mechanism 5 includes a trachea disposed on the injection / venting installation hole 1122. Gas is injected into or exhausted from the annular test chamber 1 through the trachea. The structure is simple and reliable. Specifically, gas is injected after the circular door plate 121 closes the opening, and gas is exhausted before the opening is opened, so as to avoid gas loss through the opening.

[0035] The present invention also provides a dielectric temperature spectrum testing method, using the above-mentioned automatic dielectric temperature spectrum testing system. When the dielectric material is solid or liquid, the method includes the following steps: S11, open the opening of the annular test chamber 1, and place a plurality of dielectric materials to be tested on the sample stage on the sample placement disc 2 through the feeding device; S12, close the opening of the annular test chamber 1, and control the atmosphere in the annular test chamber 1 through the injection / venting mechanism 5; S13, control the probe moving frame 41 to drive the probe 42 to contact the dielectric material on the sample placement disc 2, and perform dielectric temperature spectrum testing; During the testing process, control the temperature of the sample placement disc 2 and the annular test chamber 1 through the temperature control mechanism 3 to achieve continuous testing in multiple temperature ranges; S14. After the test is completed, the probe moving bracket 41 drives the probe 42 to leave the dielectric material on the sample placement disc 2, the gas injection and exhaust mechanism 5 discharges the gas, the opening of the annular test chamber 1 is opened, and the measured dielectric material on the sample placement disc is transferred to the recycling station through the feeding device; S15. Re-enter step S11 to perform cyclic automatic testing.

[0036] As mentioned above, this is only an embodiment of the present invention and does not impose any limitations on the present invention. Any person skilled in the art can make many possible changes, modifications or equivalent changes to the technical solution of the present invention by using the disclosed technical content without departing from the scope of the technical solution of the present invention. Therefore, any simple modification, equivalent change and modification made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention shall fall within the scope of protection of the technical solution of the present invention.

Claims

1. An automatic dielectric temperature spectrum testing system, characterized in that It includes a sample stage, a loading device, and a testing device; The sample stage is used to store a plurality of dielectric materials to be tested, and the dielectric materials to be tested can be at least one of solid dielectric materials, gaseous dielectric materials contained in a container, or liquid dielectric materials contained in a container; The loading device is used to transfer the dielectric materials to be tested on the sample stage to the testing device; The testing device includes an annular testing chamber (1), a specimen placement disc (2), a temperature control mechanism (3), and a plurality of probe mechanisms (4) arranged in the annular testing chamber (1); The annular testing chamber (1) is provided with an openable and closable opening, and further includes an injection and exhaust mechanism (5) for injecting gas into the annular testing chamber (1), and the injection and exhaust mechanism (5) provides an atmosphere for the annular testing chamber (1); The specimen placement disc (2) is arranged in the middle of the bottom of the annular testing chamber (1); The temperature control mechanism (3) includes a temperature control table (31), the upper surface of the temperature control table (31) is attached to the lower surface of the specimen placement disc (2), a refrigerant circulation groove (311) is opened on the upper surface of the temperature control table (31), the open end of the refrigerant circulation groove (311) is hermetically sealed with the bottom surface of the specimen placement disc (2), an inlet (312) and an outlet (313) communicating with the refrigerant circulation groove (311) are arranged on the side surface of the temperature control table (31), and a plurality of heating elements (314) are arranged below the refrigerant circulation groove (311) of the temperature control table (31); The probe mechanism (4) includes a probe moving frame (41) and a probe (42) arranged at the output end of the probe moving frame (41), and the probe moving frame (41) is used to drive the probe (42) to contact or leave the dielectric material to be tested on the specimen placement disc (2); A plurality of probe mechanisms (4) are arranged at annular intervals around the axis of the annular testing chamber (1).

2. The dielectric temperature spectrum automatic test system according to claim 1, characterized in that, A temperature measuring column (21) is arranged below the middle of the specimen placement disc (2), and a temperature measuring device (22) is arranged at the end of the temperature measuring column (21); A positioning hole (32) matching the temperature measuring column (21) is arranged on the temperature control table (31).

3. The dielectric temperature spectrum automatic test system according to claim 1, characterized in that, An annular partition (13) is arranged in the middle of the annular testing chamber (1), the outer wall of the annular partition (13) is matched with the inner wall of the annular testing chamber (1), and the inner wall of the annular partition (13) is matched with the temperature control table (31); The specimen placement disc (2) is arranged above the annular partition (13), and a negative conductive ring (33) and a positive conductive ring (34) are arranged below the annular testing chamber (1) and located below the annular partition (13); A plurality of heating elements (314) are arranged in an annular array on the temperature control table (31), a positive connection wire and a negative connection wire are arranged at the first end of the heating element (314) extending out of the temperature control table (31), the positive connection wire is connected to the positive conductive ring (34), and the negative connection wire is connected to the negative conductive ring (33).

4. The dielectric temperature spectrum automatic test system according to any one of claims 1 to 3, characterized in that, The probe moving frame (41) includes a housing (411), a rocker (412), a guide plate (413), a movable rod (414), an XY slide rail structure (415) and a rotation drive mechanism (416); The rotation drive mechanism (416), the guide plate (413) and the XY slide rail structure (415) are fixedly arranged inside the housing (411); One end of the rocker (412) is connected to the output rotating shaft of the rotation drive mechanism (416), and the other end is provided with a chute (4121); The guide plate (413) is provided with a guide groove, and the guide groove includes a horizontal groove (4131) and a vertical groove (4132) arranged downward on one side of the horizontal groove (4131) facing the annular test chamber (1); The movable rod (414) is fixedly arranged on the output slider of the XY slide rail structure (415), and a guide rod (4141) cooperating with the guide groove and the chute (4121) is arranged at one end of the movable rod (414), and the other end of the movable rod (414) extends out of the housing (411) and extends into the annular test chamber (1).

5. The dielectric temperature spectrum automatic test system according to claim 4, characterized in that, The probe (42) includes a connecting plate (421), an angle adjusting chuck (422) and a needle body (423); The connecting plate (421) is detachably arranged at the end of the movable rod (414); One end of the connecting plate (421) is horizontally provided with a mounting platform (4211), a hinge hole (4212) is arranged at the bottom of the mounting platform (4211), the angle adjusting chuck (422) is rotatably arranged on the hinge hole (4212), and one end of the needle body (423) is fixedly arranged on the angle adjusting chuck (422).

6. The dielectric temperature spectrum automatic test system according to claim 5, characterized in that, A wire interface (43) is arranged on the side wall of the annular test chamber (1) on one side of the probe (42), and the needle body (423) is electrically connected to the wire interface (43) through a wire.

7. The dielectric temperature spectrum automatic test system according to any one of claims 1-3, 5, and 6, characterized in that, It further includes a base (11) and a door body (12); The base (11) includes a disc base (111) and an annular side plate (112) arranged outside the disc base (111), and the upper part of the annular side plate (112) is open; The door body (12) includes a circular door plate (121) and a door plate drive mechanism (122), and the door plate drive mechanism (122) is used to drive the circular door plate (121) to block and open the opening; The disc base (111), the annular side plate (112) and the circular door plate (121) enclose to form the annular test chamber (1).

8. The dielectric temperature spectrum automatic test system according to claim 7, characterized in that, A through hole (1121) is arranged on the annular side plate (112); The probe moving frame (41) is arranged outside the annular side plate (112), and the output end of the probe moving frame (41) is arranged in the annular test chamber (1) through the through hole (1121).

9. The dielectric temperature spectrum automatic test system according to claim 8, characterized in that An air injection / ventilation installation hole (1122) is arranged on the annular side plate (112), and the air injection / ventilation mechanism (5) includes an air pipe arranged on the air injection / ventilation installation hole (1122).

10. A dielectric temperature spectrum testing method, characterized in that When using the dielectric temperature spectrum automatic test system according to any one of claims 1-9, when the dielectric material is solid or liquid, the following steps are included: S11. Open the opening of the annular test chamber (1), and place a plurality of dielectric materials to be measured on the sample stage on the sample placement disc (2) through the feeding device; S12. Close the opening of the annular test chamber (1), and control the atmosphere in the annular test chamber (1) through the injection and exhaust mechanism (5); S13. Control the probe moving frame (41) to drive the probe (42) to contact the dielectric material on the sample placement disc (2) for dielectric temperature spectrum testing; During the testing process, control the temperature of the sample placement disc (2) and the inside of the annular test chamber (1) through the temperature control mechanism (3); S14. After the testing is completed, the probe moving frame (41) drives the probe (42) to leave the dielectric material on the sample placement disc (2), the injection and exhaust mechanism (5) discharges the gas, opens the opening of the annular test chamber (1), and transfers the measured dielectric material on the sample placement disc (2) to the recovery station through the feeding device; S15. Re-enter step S11 for cyclic automatic testing.

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