Power system test simulation method, device, equipment, storage medium and product

Abstract

The application discloses a power system test simulation method and device, equipment, storage medium and product, and relates to the technical field of power systems. The application obtains impedance values of to-be-tested equipment simulation models at a target frequency by aiming at each to-be-tested equipment simulation model in a to-be-tested simulation system; establishes equivalent substitute circuits according to the corresponding impedance values for each to-be-tested equipment simulation model at the target frequency. Since the impedance data of the equipment is objectively obtained, the equivalent substitute circuits can reflect the real characteristics of the system; each equivalent substitute circuit is connected to a corresponding access position of the to-be-tested equipment simulation model in the to-be-tested simulation system in a one-to-one correspondence, and a substitute simulation system is obtained; the substitute simulation system is tested to obtain the operation stability of the substitute simulation system at the target frequency. Since the equivalent substitute circuits corresponding to multiple devices are simultaneously accessed, the system modeling can be more accurate, and the stability result is more persuasive.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power systems, and particularly relates to a power system test simulation method, device, equipment, storage medium and product. BACKGROUND

[0002] In the related art, the network after the device accesses the power grid is called a collection system. To make the complete collection system run stably, each device must run stably after being connected to the grid, and the related art evaluates the stability of the complete collection system by analyzing the running stability of each device after being connected to the grid.

[0003] However, in the related art, the types of devices accessed in the collection system are more, including source-grid-load-storage, and the number of each type of device is large, and the running stability of each device after being connected to the grid cannot be analyzed alone to reasonably reflect whether the entire system can run stably.

[0004] Therefore, how to more accurately evaluate the overall running stability of the collection system is a problem to be solved at present. SUMMARY

[0005] The main purpose of the present application is to provide a power system test simulation method, device, equipment, storage medium and product, which aims to solve the technical problem of how to more accurately evaluate the overall running stability of the collection system.

[0006] To achieve the above-mentioned purpose, the present application provides a power system test simulation method, which comprises the following steps:

[0007] For each to-be-tested device simulation model in a to-be-tested simulation system, an impedance value of the to-be-tested device simulation model at a target frequency is obtained;

[0008] For each to-be-tested device simulation model at the target frequency, an equivalent replacement circuit is established according to the corresponding impedance value;

[0009] Each equivalent replacement circuit is connected to the access position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system one by one to obtain a replacement simulation system, wherein the running frequency of the power grid to which the replacement simulation system belongs is the target frequency;

[0010] The replacement simulation system is tested to obtain the running stability of the replacement simulation system at the target frequency.

[0011] In some embodiments, the step of obtaining, for each to-be-tested device simulation model in a to-be-tested simulation system, an impedance value of the to-be-tested device simulation model at a target frequency comprises the following steps:

[0012] For each device-under-test simulation model in the simulation system under test, a voltage source is connected at a connection position corresponding to a connection position in the system under test;

[0013] A signal disturbance is superimposed on the voltage source, and the impedance of the device under test at multiple discrete frequencies is collected respectively; or

[0014] The impedance value of the device-under-test simulation model at the target frequency is obtained by:

[0015] According to the topology between each device-under-test simulation model in the simulation system under test, the device parameters of each device-under-test simulation model, and the control strategy, the impedance value of each device-under-test simulation model in the target frequency range is calculated; wherein the device parameters include the parameter values of each electronic component in the device-under-test simulation model, and the control strategy is used to represent the control logic of each electronic component in the device-under-test simulation model, and / or to represent the control logic between each electronic component in the device-under-test simulation model.

[0016] In some embodiments, the equivalent replacement circuit for each device under test at the target frequency is established according to the corresponding impedance value, comprising:

[0017] For each device under test at the target frequency, the admittance of the equivalent replacement circuit is calculated according to the corresponding impedance value and the impedance angle;

[0018] The reciprocal of the real part of the admittance is determined as the resistance value of the equivalent resistance in the equivalent replacement circuit;

[0019] According to the imaginary part of the admittance and the size of the impedance angle, the inductance value of the inductor or the capacitance value of the capacitor in the equivalent replacement circuit is calculated;

[0020] According to the resistance value and inductance value, or according to the resistance value and capacitance value, the equivalent replacement circuit is established.

[0021] In some embodiments, the admittance of the equivalent replacement circuit is represented by expression one:

[0022] Expression one:

[0023] Wherein, is the impedance value, is the target frequency, is the impedance angle, is the admittance, is the real part of the admittance, is the imaginary part of the admittance;

[0024] The inductance value of the inductor or the capacitance value of the capacitor in the equivalent replacement circuit is calculated according to the imaginary part of the admittance and the size of the impedance angle, including:

[0025] When the size of the impedance angle is in a first angle interval, the equivalent replacement circuit includes the inductor in parallel, and the inductance value of the inductor is represented by expression two:

[0026] Expression two:

[0027] When the size of the impedance angle is in a second angle interval, the equivalent replacement circuit includes the capacitor in parallel, and the capacitance value of the capacitor is represented by expression three:

[0028] Expression three:

[0029] Wherein, L is the inductance value of the inductor, C is the capacitance value of the capacitor.

[0030] In some embodiments, the equivalent replacement circuit is established according to the corresponding impedance value for each of the to-be-tested device simulation models at the target frequency, including:

[0031] The admittance of the equivalent replacement circuit is calculated according to the corresponding impedance value and the impedance angle for each of the to-be-tested device simulation models at the target frequency.

[0032] The function relationship between the current and the voltage corresponding to the to-be-tested device is determined according to the control transfer function of PI control, and the function relationship is represented by expression four:

[0033] Expression four:

[0034] Wherein, ω is the target frequency, I is the current, U is the voltage, Kp is a proportional coefficient, Ki is an integral time constant;

[0035] The current is calculated by expression five:

[0036] Expression five:

[0037] The voltage is calculated by expression six:

[0038] Expression six:

[0039] wherein, is the impedance value, is the impedance angle;

[0040] According to the functional relationship of the current and the voltage, a controlled power supply circuit is established as the equivalent replacement circuit.

[0041] In some embodiments, the testing of the replacement simulation system obtains the operation stability of the replacement simulation system at the target frequency, including:

[0042] In the case where the operation frequency of each equivalent replacement circuit in the replacement simulation system is adjusted to the target frequency, the testing is started to obtain the operation stability of the replacement simulation system at the target frequency.

[0043] In addition, to achieve the above object, the present application also proposes a power system test simulation device, which comprises:

[0044] An impedance obtaining module is configured to obtain, for each to-be-tested device simulation model in a to-be-tested simulation system, an impedance value of the to-be-tested device simulation model at a target frequency;

[0045] A circuit construction module is configured to, for each to-be-tested device simulation model at the target frequency, establish an equivalent replacement circuit according to the corresponding impedance value;

[0046] A circuit back substitution module is configured to connect each equivalent replacement circuit to a corresponding to-be-tested device simulation model at an access position in the to-be-tested simulation system in a one-to-one correspondence manner to obtain a replacement simulation system; wherein, the operation frequency of a power grid to which the replacement simulation system belongs is the target frequency;

[0047] An operation test module is configured to test the replacement simulation system to obtain the operation stability of the replacement simulation system at the target frequency.

[0048] In addition, to achieve the above object, the present application also proposes a power system test simulation device, which comprises: a memory, a processor, and a computer program stored on the memory and executable on the processor, the computer program being configured to implement the steps of the power system test simulation method as described above.

[0049] In addition, to achieve the above object, the present application also proposes a storage medium, which is a computer-readable storage medium, and the storage medium stores a computer program, the computer program being executed by a processor to implement the steps of the power system test simulation method as described above.

[0050] In addition, to achieve the above object, the application further provides a computer program product, which comprises a computer program, and the computer program realizes the steps of the power system test simulation method as described above when executed by a processor.

[0051] The one or more technical solutions provided in the application have at least the following technical effects:

[0052] The impedance value of the to-be-tested device simulation model at the target frequency is obtained by targeting each to-be-tested device simulation model in the to-be-tested simulation system. The equivalent substitute circuit is established according to the corresponding impedance value for each to-be-tested device simulation model at the target frequency. Since the impedance data of the device is objectively obtained, the equivalent substitute circuit can reflect the real characteristics of the system. Each equivalent substitute circuit is connected to the access position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system in a one-to-one correspondence, and a substitute simulation system is obtained. The running stability of the substitute simulation system at the target frequency is obtained by testing the substitute simulation system. Since the equivalent substitute circuits corresponding to multiple devices are simultaneously accessed, the system modeling can be more accurate, and the stability result is more persuasive. BRIEF DESCRIPTION OF DRAWINGS

[0053] The accompanying drawings, which are incorporated into and form part of the specification, illustrate embodiments consistent with the application and, together with the specification, serve to explain the principles of the application.

[0054] In order to more clearly illustrate the technical solutions in the embodiments of the application or the prior art, the accompanying drawings needed to be used in the embodiments or prior art description will be briefly introduced. Obviously, for those skilled in the art, other drawings can also be obtained without creative labor based on these drawings.

[0055] Figure 1 A flowchart of a power system test simulation method provided by an embodiment of the application is shown;

[0056] Figure 2 A circuit diagram of an equivalent substitute circuit provided by an exemplary embodiment of the application is shown;

[0057] Figure 3 A circuit diagram of an equivalent substitute circuit provided by another exemplary embodiment of the application is shown;

[0058] Figure 4 A structure diagram of a power system test simulation device provided by an embodiment of the application is shown;

[0059] Figure 5 A structure diagram of a power system test simulation device provided by an embodiment of the application is shown.

[0060] The object, features and advantages of the present application will be further illustrated in conjunction with the embodiments, with reference to the accompanying drawings. DETAILED DESCRIPTION

[0061] It should be understood that the specific embodiments described herein are merely intended to explain the technical solutions of the present application, and are not intended to limit the present application.

[0062] In order to better understand the technical solutions of the present application, the following will be described in detail in conjunction with the accompanying drawings and specific embodiments.

[0063] The main solution of the embodiments of the present application is: for each to-be-tested device simulation model in the to-be-tested simulation system, an impedance value of the to-be-tested device simulation model at a target frequency is obtained; for each to-be-tested device simulation model at the target frequency, an equivalent substitute circuit is established according to the corresponding impedance value; each equivalent substitute circuit is connected one by one to the access position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system, to obtain a substitute simulation system; wherein the operating frequency of the power grid to which the substitute simulation system belongs is the target frequency; the substitute simulation system is tested to obtain the operating stability of the substitute simulation system at the target frequency.

[0064] In the related art, the network after the device is connected to the power grid is called a collection system. In order to make the complete collection system operate stably, it is required that each device must operate stably after being connected to the grid. In the related art, the stability of the complete collection system is evaluated by analyzing the operating stability of each device after being connected to the grid. Usually, the point of connection of a single device to the grid is taken as a division point, and the equivalent impedance of the device and the power grid is observed from the left side and the right side of the division point, respectively. The equivalent impedance includes amplitude-frequency and phase-frequency responses, and the frequency range is several hertz to several kilohertz. Then, whether the device connected to the grid will cause oscillation risk is judged according to the Nyquist or Bode diagram stability criterion.

[0065] The above method has the following disadvantages. First, the stability analysis of the device after being connected to the power grid is only a comparison of the equivalent impedance of the device and the power grid, and the conclusion is only a frequency domain analysis at the theoretical level, without simulation verification in the time domain. Second, the device is directly connected to the power grid, and the stability verification in the time domain can be completed through simulation, but it can only be implemented in a simple aggregation system. There are many types of devices connected to the aggregation system, including source-grid-load-storage, and the number of each type of device is large, which often cannot include all the above devices in the aggregation system modeling process. Usually, the devices other than the measured device are treated as short-circuit or open-circuit, and thus the stability of the aggregation system with the measured device connected thereto cannot be verified in the time domain. Third, the frequency-dependent equivalent network element developed by the existing software (such as PSCAD, RSCAD, etc.) can only complete the analysis of the frequency-impedance data of a linear symmetric simple system through a complex mathematical fitting method, and the fitting effect of the frequency-impedance data of a nonlinear asymmetric complex system is poor, so the equivalent substitution of a complex device cannot be completed. Moreover, the complexity (or node number) of the simulation object is closely related to the computing capacity of the simulation platform. The existing offline simulation software takes hours to complete a slightly complex network, and the real-time simulation software limits the number of nodes of the network to achieve real-time simulation, and cannot complete detailed modeling.

[0066] In summary, how to more accurately evaluate the overall operation stability of the aggregation system.

[0067] Therefore, the present application provides a solution, which can realize the time-domain stability test of a complex aggregation system containing source-grid-load-storage multi-type devices, and avoid the above problems in the related art.

[0068] It should be noted that the execution subject of the present embodiment can be a computing service device with data processing, network communication and program running functions, such as a tablet computer, a personal computer, a mobile phone, etc., or a power system test simulation device capable of realizing the above functions. The present embodiment and the following embodiments will be described below by taking the power system test simulation device as an example.

[0069] Referring to Figure 1 , Figure 1 Fig. 1 shows a flowchart of a power system test simulation method according to an embodiment of the present application. The power system test simulation method can be applied to a power system test simulation device, and includes the following steps S110 to S140.

[0070] In step S110, for each device simulation model in the to-be-tested simulation system, the impedance value of the to-be-tested device simulation model at a target frequency is obtained.

[0071] The to-be-tested simulation system refers to a virtual modeling of the overall architecture of the system to be tested. The to-be-tested simulation system can have multiple to-be-tested device simulation models, which are obtained by modeling the main circuit topology, key parameters, control strategy, etc. of the to-be-tested device on a simulation platform (not limited to this). Through testing in the to-be-tested simulation system, it is verified whether the overall system formed by the to-be-tested device can reliably and stably operate. The to-be-tested simulation system can be a "black box", "gray box", or "white box" model with multiple levels of transparency. The to-be-tested device simulation model can include, but is not limited to, a wind power generation unit, a photovoltaic power generation unit, energy storage, SVG, etc.

[0072] In some embodiments, for each to-be-tested device simulation model in the to-be-tested simulation system, an ideal voltage source can be accessed at an access location (i.e. a grid connection point) in the to-be-tested simulation system; a signal disturbance is superimposed on the ideal voltage source, and the impedance of the to-be-tested device at multiple discrete frequencies is collected respectively. In this embodiment, the target frequency is any one of the multiple discrete frequencies.

[0073] Specifically, an ideal voltage source is accessed at the device grid connection point, and the impedance of the to-be-tested device at multiple discrete frequencies is collected respectively by superimposing a small signal disturbance voltage in series on the ideal voltage source. Similarly, the method of superimposing a small signal disturbance current in parallel can also be considered, which is not limited in this embodiment.

[0074] Among the collected data, if there are singular points, further processing is required, for example, correction by a related linear algorithm, etc.

[0075] In other embodiments, the impedance values of the to-be-tested device simulation models in the target frequency range can also be calculated according to the topological structure between the to-be-tested device simulation models in the to-be-tested simulation system, the device parameters of the to-be-tested devices, and the control strategy. The device parameters include the parameter values of the electronic components in the to-be-tested device simulation model, such as the inductance value of the inductor and the capacitance value of the capacitor, etc. The control strategy is used to represent the control logic of the to-be-tested device simulation model itself, including but not limited to the control logic of each electronic component in the to-be-tested device simulation model and / or the control logic between each electronic component, such as controlling a switch to be turned on at time A and turned off at time B, etc.

[0076] Step S120, for each to-be-tested device simulation model at the target frequency, an equivalent replacement circuit is established according to the corresponding impedance value.

[0077] In some embodiments, the corresponding equivalent replacement circuit can be determined by equivalent impedance as an RLC parallel circuit.

[0078] Specifically, for each of the to-be-tested devices at the target frequency, the admittance corresponding to the equivalent replacement circuit can be calculated according to the corresponding impedance value and the impedance angle.

[0079] For any given angular frequency (i.e., the target frequency), the impedance value can be represented by a complex function of the impedance amplitude (|Z|) and the impedance angle (θ):

[0080]

[0081] Since the admittance is the inverse of the impedance, the admittance expression corresponds to:

[0082]

[0083] wherein, is the impedance value, is the target frequency, is the impedance angle, is the admittance, is the real part of the admittance, is the imaginary part of the admittance.

[0084] In the admittance, the real part refers to the conductance part, i.e., the admittance value of the parallel resistance; the imaginary part refers to the susceptance part, i.e., the admittance value of the parallel capacitance or the parallel inductance.

[0085] The inverse of the real part of the admittance is determined as the resistance value of the equivalent resistance in the equivalent replacement circuit, i.e.:

[0086]

[0087] wherein, is the resistance value of the equivalent resistance.

[0088] The inductance value of the inductor or the capacitance value of the capacitor in the equivalent replacement circuit can be calculated according to the imaginary part of the admittance and the size of the impedance angle.

[0089] Specifically, according to the interval in which the impedance angle is located, it can be divided into the following two cases:

[0090] ① When the size of the impedance angle is in the first angle interval (e.g. ), i.e., it satisfies:

[0091]

[0092] , the equivalent replacement circuit includes a parallel inductor, and the inductance value of the inductor is represented as:

[0093]

[0094] ② the magnitude of the impedance angle is in a second angle interval (for example ), that is, it satisfies:

[0095]

[0096] In the case of

[0097]

[0098] wherein is the inductance value of the inductor, is the capacitance value of the capacitor.

[0099] Finally, based on the calculated resistance value and inductance value, or based on the calculated resistance value and capacitance value, an equivalent replacement circuit as shown in Figure 2 may be established.

[0100] In other embodiments, the method of equivalent impedance to a controlled power circuit can also be used to determine the equivalent replacement circuit.

[0101] Specifically, for each device simulation model to be measured at the target frequency, the corresponding admittance can be calculated according to the corresponding impedance value and impedance angle in the same manner as in the foregoing embodiments.

[0102] In this embodiment, the controlled current and the voltage across the controlled current source should satisfy the relationship:

[0103]

[0104] If the control loop of the controlled current source adopts the PI control principle, its control transfer function can be written as

[0105]

[0106] Further, converting the above formula to the frequency domain, if the voltage and current of the controlled current source are both sinusoidal signals with an angular frequency of , it can be converted to:

[0107]

[0108] wherein is the target frequency, is the current, is the voltage, is the proportional coefficient, is the integral time constant.

[0109] In this embodiment, can be represented as:

[0110]

[0111] may be expressed as:

[0112]

[0113] wherein, is an impedance value, is an impedance angle.

[0114] Finally, based on the finally obtained control transfer function, an equivalent alternative circuit as shown in Figure 3 may be established.

[0115] It should be noted that in the entire to-be-tested simulation system, the type of the equivalent alternative circuit needs to be kept consistent. That is, the equivalent alternative circuits corresponding to all the to-be-tested device simulation models need to be either RLC parallel circuits or controlled power circuits.

[0116] In step S130, the equivalent alternative circuits are connected one by one to the access positions of the corresponding to-be-tested device simulation models in the to-be-tested simulation system, to obtain a replacement simulation system.

[0117] In step S140, the replacement simulation system is tested to obtain the operation stability of the replacement simulation system at the target frequency.

[0118] In the present embodiment, the frequency can be set by the software in which the simulation system is located. Before the simulation test, the operation frequency of each equivalent alternative circuit in the replacement simulation system can be adjusted to the target frequency by the staff, and then the test is started to obtain the overall operation stability of the replacement simulation system at the target frequency.

[0119] Based on steps S110 to S140, the operation stability at the target frequency can be obtained. The steps in the above embodiment can be performed for any one of the discrete frequencies (which can be pre-selected by the staff), so as to realize the full-quantity test in a certain frequency band.

[0120] The embodiment provides a power system test simulation method, which comprises the following steps: acquiring impedance values of each to-be-tested device simulation model in a to-be-tested simulation system at a target frequency; establishing equivalent substitute circuits for each to-be-tested device simulation model at the target frequency according to the corresponding impedance values, so that the equivalent substitute circuits can reflect the real characteristics of the system since the impedance data of the devices are objectively acquired; connecting each equivalent substitute circuit to a connection position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system in a one-to-one manner to obtain a substitute simulation system; and testing the substitute simulation system to obtain the operation stability of the substitute simulation system at the target frequency, so that the system modeling is more accurate and the stability result is more persuasive since the equivalent substitute circuits corresponding to multiple devices are simultaneously connected.

[0121] The application also provides a power system test simulation device, please refer to Figure 4 , the power system test simulation device 100 comprises:

[0122] The impedance acquisition module 110 is configured to acquire impedance values of each to-be-tested device simulation model in a to-be-tested simulation system at a target frequency.

[0123] The circuit construction module 120 is configured to establish equivalent substitute circuits for each to-be-tested device simulation model at the target frequency according to the corresponding impedance values.

[0124] The circuit back substitution module 130 is configured to connect each equivalent substitute circuit to a connection position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system in a one-to-one manner to obtain a substitute simulation system, wherein the operation frequency of the power grid to which the substitute simulation system belongs is the target frequency.

[0125] The operation test module 140 is configured to test the substitute simulation system to obtain the operation stability of the substitute simulation system at the target frequency.

[0126] The power system test simulation device 100 provided by the application adopts the power system test simulation method in the above embodiment, and can solve the technical problem of how to more accurately evaluate the overall operation stability of the integrated system. Compared with the prior art, the power system test simulation device 100 provided by the application has the same beneficial effects as the power system test simulation method provided by the above embodiment, and the other technical features in the power system test simulation device 100 are the same as the features disclosed in the above embodiment method, which will not be repeated here.

[0127] The application provides a power system test simulation device, which comprises at least one processor and a memory connected with the at least one processor; the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the power system test simulation method in the first embodiment.

[0128] Reference will be made to the following Figure 5 which shows a structural diagram of a power system test simulation device suitable for implementing the embodiments of the application. The power system test simulation device in the embodiments of the application can include, but is not limited to, mobile terminals such as mobile phones, notebook computers, digital broadcast receivers, PDAs (Personal Digital Assistant), PADs (Portable Application Description), PMPs (Portable Media Player), vehicle-mounted terminals (for example, vehicle-mounted navigation terminals), and the like, and fixed terminals such as digital TVs, desktop computers, and the like. Figure 5 The power system test simulation device shown is only an example, and should not bring any limitation to the functions and use range of the embodiments of the application.

[0129] As Figure 5As shown, the power system test simulation device 200 can include a processing device 210 (e.g., a central processing unit, a graphics processing unit, etc.) that can perform various appropriate actions and processes according to programs stored in a read-only memory (ROM) 220 or loaded from the storage device 230 into a random access memory (RAM) 240. Various programs and data required for operation of the power system test simulation device are also stored in the RAM 240. The processing device 210, the ROM 220, and the RAM 240 are connected to each other through a bus 250. An input / output (I / O) interface 260 is also connected to the bus. Generally, the following systems can be connected to the I / O interface 260: input devices 270 including, for example, a touch screen, a touch pad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; output devices 280 including, for example, a liquid crystal display (LCD), a speaker, a vibrator, etc.; the storage device 230 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 290. The communication device 290 can allow the power system test simulation device to communicate wirelessly or wired with other devices to exchange data. Although the power system test simulation device with various systems is shown in the figure, it should be understood that all the shown systems are not required to be implemented or possessed. More or less systems can be alternatively implemented or possessed.

[0130] In particular, according to embodiments of the present disclosure, the processes described above with reference to the flowcharts can be implemented as a computer software program. For example, embodiments of the present disclosure include a computer program product comprising a computer program carried on a computer readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network through the communication device, or installed from the storage device 230, or installed from the ROM 220. When the computer program is executed by the processing device 210, the above-mentioned functions defined in the methods of embodiments of the present disclosure are performed.

[0131] The power system test simulation device provided by the present application adopts the power system test simulation method in the above-mentioned embodiments, and can solve the technical problem of how to more accurately evaluate the overall operation stability of the power collection system. Compared with the prior art, the power system test simulation device provided by the present application has the same beneficial effects as the power system test simulation method provided by the above-mentioned embodiments, and other technical features in the power system test simulation device are the same as the features disclosed in the previous embodiment method, which will not be repeated here.

[0132] It should be understood that various aspects of the disclosure can be implemented in hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any appropriate manner in any one or more embodiments or examples.

[0133] The above description is merely illustrative of the application and is not intended to limit the scope of the application. Any modifications or equivalents of the application should be construed as falling within the scope of the application. The scope of the application should be determined by the appended claims.

[0134] The application provides a computer readable storage medium having stored thereon computer readable program instructions (i.e., a computer program) for performing the power system test simulation method in the above embodiments.

[0135] The computer readable storage medium provided by the application may, for example, be a U disk, but is not limited to an electric, magnetic, optical, electromagnetic, infrared, or semiconductor system or device, or any combination thereof. More specific examples of the computer readable storage medium can include, but are not limited to, an electric connection having one or more conductive wires, a portable computer disk, a hard disk, a random access memory (RAM), a read only memory (ROM), an erasable programmable read only memory (EPROM or flash memory), an optical fiber, a portable compact disk read only memory (CD-ROM), an optical storage device, a magnetic storage device, or any appropriate combination thereof. In the present embodiment, the computer readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system or device. The program code contained on the computer readable storage medium can be transmitted by any appropriate medium, including but not limited to an electric wire, an optical cable, an RF (Radio Frequency), etc., or any appropriate combination thereof.

[0136] The above computer readable storage medium can be included in the power system test simulation device; or can exist separately and not be assembled into the power system test simulation device.

[0137] The computer-readable storage medium described above can bear one or more programs, when the one or more programs are executed by the power system test simulation device, the power system test simulation device can be written in one or more programming languages or combinations thereof for executing computer program codes of the operations of the present application, the programming languages include object-oriented programming languages such as Java, Smalltalk, C++, and also include conventional procedural programming languages such as "C" language or similar programming languages. The program code can be executed completely on the user computer, partially on the user computer, as an independent software package, partially on the user computer and partially on a remote computer, or completely on a remote computer or server. In the case involving a remote computer, the remote computer can be connected to the user computer through any kind of network including a local area network (LAN: Local Area Network) or a wide area network (WAN: Wide Area Network), or can be connected to an external computer (for example, through the Internet by using an Internet service provider).

[0138] The flowcharts and block diagrams in the accompanying drawings illustrate the possible implementation architectures, functions and operations of the systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowcharts or block diagrams can represent a module, a program segment or a part of code containing one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions noted in the blocks can occur in different orders than those noted in the accompanying drawings. For example, two blocks represented in succession can actually be executed substantially in parallel, and sometimes they can be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and the combination of blocks in the block diagrams and / or flowcharts, can be implemented by a dedicated hardware-based system performing the specified functions or operations, or can be implemented by a combination of dedicated hardware and computer instructions.

[0139] The modules involved in the embodiments of the present application can be implemented in software or in hardware. In some cases, the name of the module does not constitute a limitation on the unit itself.

[0140] The readable storage medium provided by the application is a computer readable storage medium, which stores computer readable program instructions (i.e. computer programs) for executing the power system test simulation method described above, and can solve the technical problem of how to more accurately evaluate the overall operation stability of the integrated system. Compared with the prior art, the computer readable storage medium provided by the application has the same beneficial effects as the power system test simulation method provided by the above-mentioned embodiments, and will not be repeated here.

[0141] The application also provides a computer program product, comprising a computer program, which, when executed by a processor, implements the steps of the power system test simulation method as described above.

[0142] The computer program product provided by the application can solve the technical problem of how to more accurately evaluate the overall operation stability of the integrated system. Compared with the prior art, the computer program product provided by the application has the same beneficial effects as the power system test simulation method provided by the above-mentioned embodiments, and will not be repeated here.

[0143] The above-mentioned is only part of the embodiments of the application, and does not limit the patent scope of the application, and any equivalent structural transformation, direct / indirect application in other related technical fields within the technical concept of the application, and the contents of the specification and drawings of the application are included in the patent protection scope of the application.

Claims

1. A method of power system test simulation, characterized by, The power system test simulation method comprises: For each to-be-tested device simulation model in the to-be-tested simulation system, impedance values of the to-be-tested device simulation model at a target frequency are obtained; For each to-be-tested device simulation model at the target frequency, an equivalent substitute circuit is established according to the corresponding impedance value; Each equivalent substitute circuit is connected to the access position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system, so as to obtain a substitute simulation system; wherein the operating frequency of the power grid to which the substitute simulation system belongs is the target frequency; The substitute simulation system is tested to obtain the operating stability of the substitute simulation system at the target frequency; The equivalent substitute circuit corresponding to the admittance is calculated according to the impedance value and the impedance angle of each to-be-tested device at the target frequency; The reciprocal of the real part of the admittance is determined as the resistance value of the equivalent resistor in the equivalent substitute circuit; The inductance value of the inductor or the capacitance value of the capacitor in the equivalent substitute circuit is calculated according to the imaginary part of the admittance and the size of the impedance angle; The equivalent substitute circuit is established according to the resistance value and the inductance value, or according to the resistance value and the capacitance value. The impedance values of the to-be-tested device simulation model at the target frequency are obtained for each to-be-tested device simulation model in the to-be-tested simulation system, comprising:

2. The power system test emulation method of claim 1, wherein, For each to-be-tested device simulation model in the to-be-tested simulation system, an ideal voltage source is accessed at the access position in the to-be-tested simulation system; A signal disturbance is superimposed on the ideal voltage source, and the impedance of the to-be-tested device at multiple discrete frequencies is collected respectively; or The impedance values of the to-be-tested device simulation model at the target frequency are obtained for each to-be-tested device simulation model in the to-be-tested simulation system, comprising: According to the topological structure between each to-be-tested device simulation model in the to-be-tested simulation system, the device parameters of each to-be-tested device simulation model and the control strategy, the impedance values of each to-be-tested device simulation model in the target frequency range are calculated; wherein the device parameters include the parameter values of each electronic component in the to-be-tested device simulation model, the control strategy is used to represent the control logic of each electronic component in the to-be-tested device simulation model, and / or is used to represent the control logic between each electronic component in the to-be-tested device simulation model. The admittance corresponding to the equivalent substitute circuit is represented by expression one:

3. The power system test emulation method of claim 1 or 2, wherein, The inductance value of the inductor or the capacitance value of the capacitor in the equivalent substitute circuit is calculated according to the imaginary part of the admittance and the size of the impedance angle, comprising: Expression one: wherein is the impedance value, is the target frequency, is the impedance angle, is the admittance, is the real part of the admittance, is the imaginary part of the admittance; In the case that the size of the impedance angle is in a first angle interval, the equivalent substitute circuit includes the inductor in parallel, and the inductance value of the inductor is represented by expression two: In the case that the size of the impedance angle is in a second angle interval, the equivalent substitute circuit includes the capacitor in parallel, and the capacitance value of the capacitor is represented by expression three: Expression two: ​ Expression three: wherein, L is an inductance value of the inductor, C is a capacitance value of the capacitor.

4. The power system test emulation method of claim 2, wherein, The equivalent replacement circuit of each of the to-be-tested device simulation models at the target frequency is established according to the corresponding impedance value, and the equivalent replacement circuit includes: The admittance of the equivalent replacement circuit of each of the to-be-tested device simulation models at the target frequency is calculated according to the corresponding impedance value and impedance angle. The function relationship between the current and the voltage of the to-be-tested device is determined according to the control transfer function of the PI control, and the function relationship is represented by Expression Four: Expression four: wherein, is the target frequency, is the current, is the voltage, is a proportional coefficient, is an integral time constant; By expression five, we get: Expression five: By expression six, we find that: Expression six: wherein, is the impedance value, is the impedance angle; The controlled power supply circuit is established according to the function relationship between the current and the voltage, as the equivalent replacement circuit.

5. The power system test emulation method of claim 1, wherein, The running stability of the replacement simulation system at the target frequency is obtained by testing the replacement simulation system, and the testing includes: The running stability of the replacement simulation system at the target frequency is obtained by starting the test under the condition that the running frequency of each equivalent replacement circuit in the replacement simulation system is adjusted to the target frequency.

6. An electric power system test simulation apparatus characterized by comprising: The power system test simulation device includes: An impedance acquisition module is configured to acquire the impedance value of each to-be-tested device simulation model in a to-be-tested simulation system at a target frequency. A circuit construction module is configured to establish an equivalent replacement circuit for each to-be-tested device simulation model at a target frequency according to the corresponding impedance value, and the equivalent replacement circuit includes: A circuit replacement module is configured to connect each equivalent replacement circuit to the access position of the corresponding to-be-tested device simulation model in the to-be-tested simulation system to obtain a replacement simulation system, and the running frequency of the power grid to which the replacement simulation system belongs is the target frequency. An operation test module is configured to test the replacement simulation system to obtain the running stability of the replacement simulation system at the target frequency.

7. A power system test simulation apparatus, characterized by comprising: The power system test simulation device includes a memory, a processor, and a computer program stored on the memory and executable on the processor, and the computer program is configured to implement the steps of the power system test simulation method according to any one of claims 1 to 5.

8. A storage medium, characterized by The storage medium is a computer readable storage medium, and the storage medium stores a computer program, and the computer program is executed by the processor to implement the steps of the power system test simulation method according to any one of claims 1 to 5.

9. A computer program product, characterised in that, The computer program product includes a computer program, and the computer program is executed by the processor to implement the steps of the power system test simulation method according to any one of claims 1 to 5.

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