Intelligent detection method and device based on upper computer, computer equipment and medium

Abstract

The invention relates to an intelligent detection method and device based on an upper computer, computer equipment and a medium, and the method comprises the steps: receiving a test instruction, obtaining the historical use data of test equipment, judging whether to trigger a maintenance prompt or not according to the historical use data, and triggering a chip test instruction if the state of the test equipment is normal; performing power-on detection on the to-be-tested chip based on the chip test instruction, reading firmware version information of the to-be-tested chip, and generating a radio frequency test instruction under the condition that the firmware version information is matched; executing a radio frequency test according to the radio frequency test instruction, judging whether the to-be-tested chip triggers a parameter compensation program or not according to test data, ending the test when the to-be-tested chip does not need to be compensated or after compensation is completed, and generating a test result; and analyzing a test result, if the test is passed, recording and uploading test data to the MES system, and updating historical use data of the test equipment at the same time. The method has the effect of improving the chip production quality.

Description

Technical Field

[0001] The present application relates to the technical field of chip detection, and in particular, to an intelligent detection method, device, computer device, and medium based on a host computer. Background Art

[0002] Currently, in the electronic manufacturing process, radio frequency testing is a key link to ensure the performance stability of chips and modules. Through radio frequency testing, parameters such as the frequency stability, signal integrity, and transmit power of products can be evaluated, thereby ensuring that the communication performance of the final products meets industry standards.

[0003] Existing radio frequency testing usually relies on specialized test tooling, such as components like test sockets and probes. These test components are continuously used in a high-frequency production environment, and their service lives are limited. Moreover, as the number of uses increases, the physical properties of the components may degrade. For example, poor contact of the test probes may cause fluctuations in test data, leading to misjudgment and affecting the accuracy of the test. In addition, since the usage status of the test equipment needs to be regularly detected, it is difficult to detect the aging problem of the test equipment in a timely manner, which may result in unnecessary rework or misjudgment, thereby reducing production efficiency.

[0004] The above-mentioned existing technical solutions have the following defects: The existing test methods are difficult to monitor the status of the test components, resulting in misjudgment of radio frequency testing caused by component aging, which affects the production quality of products. Therefore, there is room for improvement. Summary of the Invention

[0005] In order to improve the production quality of chips, the present application provides an intelligent detection method, device, computer device, and medium based on a host computer.

[0006] The first invention object of the present application is achieved through the following technical solutions: An intelligent detection method based on a host computer, the method includes: Receiving a test instruction, and obtaining the historical usage data of the test equipment, judging whether to trigger a maintenance reminder according to the historical usage data. If the test equipment is in a normal state, triggering a chip test instruction; Conducting a power-on test on the chip to be tested based on the chip test instruction, and reading the firmware version information of the chip to be tested. If the firmware version information matches, generating a radio frequency test instruction; Performing a radio frequency test according to the radio frequency test instruction, and judging whether the chip to be tested triggers a parameter compensation program according to the test data. After the chip to be tested does not require compensation or the compensation is completed, ending the test and generating a test result; Analyze the test results. If the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment.

[0007] By adopting the above technical solutions, by receiving a test instruction and obtaining the historical usage data of the test equipment to determine whether to trigger a maintenance reminder, it is possible to effectively evaluate the operating status of the equipment before the test, avoid test result deviations caused by aging or failure of the test equipment, and thus improve the accuracy of the test and the reliability of equipment usage; by powering on and detecting the chip to be tested and verifying the firmware version information, it is possible to ensure that the chip is in a normal testable state and the software version running meets the test standards, thus preventing test misjudgment caused by inconsistent firmware; by performing a radio frequency test and determining whether to trigger a parameter compensation program, the test process can have an adaptive ability to compensate for chips with slightly deviated performance but can be corrected, thus improving the test fault tolerance and reducing the misjudgment rate; by analyzing the test results and uploading them to the MES system, and at the same time updating the usage records of the test equipment, it is possible to realize the closed-loop management of test data and equipment status, thus improving the production line quality traceability ability and the timeliness of equipment maintenance decision-making.

[0008] In one example, the present application can be further configured as: receiving the test instruction, obtaining the historical usage data of the test equipment, and judging whether to trigger a maintenance reminder according to the historical usage data, specifically including: Retrieve the cumulative usage times of the test equipment in each test cycle from the MES system as the historical usage data; Analyze the historical usage data based on a preset life threshold and the corresponding abnormal count threshold. When the historical usage data reaches the corresponding threshold, generate a maintenance reminder message and report it to the MES system.

[0009] By adopting the above technical solutions, by retrieving the cumulative usage times of the test equipment from the MES system and analyzing them in combination with the preset life threshold and abnormal count threshold, it is possible to dynamically evaluate the usage status of the test equipment and trigger a maintenance reminder in a timely manner, so as to perform preventive maintenance when the equipment reaches or approaches the failure boundary, effectively reducing test anomalies and product misjudgments caused by equipment failures.

[0010] In one example, the present application can be further configured as: reading the firmware version information of the chip to be tested, and generating a radio frequency test instruction when the firmware version information matches, specifically including: Extract the firmware version information through the communication interface of the chip to be tested, and compare the firmware version information with the preset target firmware version of the current test environment; In the case where the comparison results are inconsistent, download the firmware version that matches the preset target firmware version from the MES system, and the host computer burns the matched firmware version into the chip under test to modify the firmware version information; When the burning operation is completed, perform a read-back verification on the chip under test, and generate the radio frequency test instruction in the case of successful verification.

[0011] By adopting the above technical solution, by extracting the chip firmware version information and comparing it with the preset target version, and automatically completing firmware download, burning, and read-back verification when they are inconsistent, it can ensure that each chip runs in a consistent and controlled software environment before testing, thereby eliminating test differences caused by inconsistent firmware versions and improving the consistency of testing and the comparability of results.

[0012] In one example, this application can be further configured as: execute the radio frequency test according to the radio frequency test instruction, and judge whether the chip under test triggers the parameter compensation program according to the test data, specifically including: Perform a frequency offset detection on the chip under test to obtain the current frequency offset, and then compare the frequency offset with the preset standard frequency offset range to obtain a frequency offset detection result; Perform a transmit power detection on the chip under test to obtain power data, and then perform a difference analysis on the power data and the preset target power value to obtain a transmit power detection result; In the case where the frequency offset detection result and / or the transmit power detection result do not meet the preset conditions, trigger the parameter compensation program, and generate corresponding compensation parameters through the host computer and then send them to the chip under test for compensation.

[0013] By adopting the above technical solution, by performing a frequency offset detection and comparing the frequency offset with the standard range, it is possible to discover the deviation of the chip transmit frequency, thereby identifying chips with frequencies not meeting the standard or determining whether they can be compensated; by performing a transmit power detection and analyzing the difference from the target value, it is possible to quantify the deviation degree of the chip transmit power, thereby providing a basis for subsequent parameter adjustment or abnormality determination; by triggering the parameter compensation program when the test data does not meet the conditions, it is possible to realize the dynamic correction of chip parameters, enabling some test-critical chips to pass the compensation and meet the standards, thereby improving the product yield and reducing production losses.

[0014] In one example, this application can be further configured as: trigger the parameter compensation program, generate corresponding compensation parameters through the host computer and then send them to the chip under test for compensation, specifically including: Based on the frequency offset detection result and historical frequency offset test data, generate frequency compensation parameters according to the frequency offset calibration algorithm; Generate a power gain adjustment parameter based on the detected transmit power result and according to the power gain compensation model; Send the frequency compensation parameter and / or the power gain adjustment parameter to the chip under test through the host computer to modify the oscillation circuit parameter and / or the power amplifier gain parameter.

[0015] By adopting the above technical solution, by generating a frequency compensation parameter based on the frequency offset detection result and historical test data and using a frequency offset calibration algorithm, the precise adjustment of the chip oscillation frequency can be realized, so that the RF output is more stable and meets the communication protocol requirements; by generating a power adjustment parameter based on the detected transmit power result and the power gain compensation model, the target-oriented compensation can be carried out according to the power deviation amount, so as to enhance the power consistency of the chip under different power supply or environmental conditions; by sending the compensation parameter to the chip and modifying its internal circuit parameter, the performance optimization can be completed without replacing the hardware, thus improving the flexibility of the production link and the cost control ability.

[0016] In one example, the present application can be further configured as: analyze the test result, if the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment, and further include: In the case that the test result is a test failure, analyze the failure type according to the test data, and then judge whether the test parameters can be adjusted for retesting; If the failure type is irreparable, mark the test exception and upload it to the MES system.

[0017] By adopting the above technical solution, by analyzing the test data after the test failure and judging whether retesting can be performed through parameter adjustment, a recovery mechanism can be provided for some failures caused by environmental disturbances or correctable deviations, so as to reduce unnecessary misjudgment and repeated rework; by marking the exception and uploading it to the MES system when it is confirmed that the failure type is irreparable, it can ensure that serious defects are accurately identified and recorded, thus improving the traceability of abnormal products and the timeliness of production line quality control.

[0018] The above second invention object of the present application is achieved through the following technical solution: An intelligent detection device based on a host computer, the device includes: A test equipment status determination module, configured to receive a test instruction, obtain the historical usage data of the test equipment, judge whether to trigger a maintenance reminder according to the historical usage data, and if the test equipment status is normal, trigger a chip test instruction; The firmware version verification module is used to perform power-on detection on the chip under test based on the chip test instruction, read the firmware version information of the chip under test, and generate a radio frequency test instruction if the firmware version information matches; The radio frequency test and compensation module is used to perform radio frequency tests according to the radio frequency test instruction, and determine whether the chip under test triggers the parameter compensation program based on the test data. After the chip under test does not require compensation or the compensation is completed, the test ends and a test result is generated; The test result processing module is used to analyze the test result. If the test passes, the test data is recorded and uploaded to the MES system, and the historical usage data of the test equipment is updated at the same time.

[0019] By adopting the above technical solutions, by receiving the test instruction and obtaining the historical usage data of the test equipment to determine whether to trigger the maintenance reminder, it is possible to effectively evaluate the operating status of the equipment before the test, avoid test result deviation caused by the aging or failure of the test equipment, and thus improve the accuracy of the test and the reliability of equipment use; by performing power-on detection on the chip under test and verifying the firmware version information, it is possible to ensure that the chip is in a normal testable state and the software version running meets the test standards, thus preventing test misjudgment caused by inconsistent firmware; by performing radio frequency tests and determining whether to trigger the parameter compensation program, the test process can have an adaptive ability to compensate for chips with slightly deviated but correctable performance, thus improving the test fault tolerance and reducing the misjudgment rate; by analyzing the test result and uploading it to the MES system, and updating the usage record of the test equipment at the same time, it is possible to realize the closed-loop management of test data and equipment status, thus improving the production line quality traceability ability and the timeliness of equipment maintenance decision-making.

[0020] The above object three of the present application is achieved by the following technical solutions: A computer device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the above intelligent detection method based on the upper computer are implemented.

[0021] The above object four of the present application is achieved by the following technical solutions: A computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the steps of the above intelligent detection method based on the upper computer are implemented.

[0022] In summary, the present application includes the following beneficial technical effects: 1. By receiving test instructions and obtaining the historical usage data of the test equipment to determine whether to trigger a maintenance reminder, it is possible to effectively evaluate the operating status of the equipment before testing, avoid test result deviations caused by aging or failure of the test equipment, and thus improve the accuracy of testing and the reliability of equipment use; by performing a power-on test on the chip to be tested and verifying the firmware version information, it is possible to ensure that the chip is in a normal testable state and the software version running complies with the test standard, thus preventing test misjudgments caused by inconsistent firmware; by performing a radio frequency test and determining whether to trigger a parameter compensation program, the test process can have an adaptive ability to compensate for chips with slightly deviated but correctable performance, thus improving the test fault tolerance and reducing the misjudgment rate; by analyzing the test results and uploading them to the MES system, and at the same time updating the usage record of the test equipment, it is possible to achieve closed-loop management of test data and equipment status, thus improving the production line quality traceability ability and the timeliness of equipment maintenance decision-making; 2. By retrieving the cumulative usage times of the test equipment from the MES system and analyzing them in combination with the preset service life threshold and abnormal count threshold, it is possible to dynamically evaluate the usage status of the test equipment and trigger a maintenance reminder in a timely manner, so as to perform preventive maintenance when the equipment reaches or approaches the failure boundary, effectively reducing test anomalies and product misjudgments caused by equipment failures; 3. By extracting the chip firmware version information and comparing it with the preset target version, and automatically completing firmware download, burning, and read-back verification when they are inconsistent, it is possible to ensure that each chip runs in a consistent and controlled software environment before testing, thus eliminating test differences caused by inconsistent firmware versions and improving the consistency of testing and the comparability of results. Description of the Drawings

[0023] Figure 1 is a flowchart of an intelligent detection method based on a host computer in an embodiment of the present application; Figure 2 is an implementation flowchart of step S10 in the intelligent detection method based on a host computer in an embodiment of the present application; Figure 3 is an implementation flowchart of step S20 in the intelligent detection method based on a host computer in an embodiment of the present application; Figure 4 is an implementation flowchart of step S30 in the intelligent detection method based on a host computer in an embodiment of the present application; Figure 5 is an implementation flowchart of step S33 in the intelligent detection method based on a host computer in an embodiment of the present application; Figure 6 is an implementation flowchart of step S40 in the intelligent detection method based on a host computer in an embodiment of the present application; Figure 7It is a principle block diagram of an intelligent detection device based on a host computer in an embodiment of the present application; Figure 8 It is a schematic diagram of the device in an embodiment of the present application. Detailed implementation manner

[0024] The present application will be further described in detail below with reference to the accompanying drawings.

[0025] In one embodiment, as Figure 1 shown, the present application discloses an intelligent detection method based on a host computer, which specifically includes the following steps: S10: Receive a test instruction, obtain the historical usage data of the test device, and determine whether to trigger a maintenance reminder according to the historical usage data. If the status of the test device is normal, trigger a chip test instruction.

[0026] Specifically, parse the test station information in the test instruction, obtain the test device identifier associated with the station, query the historical usage data of the test device, including but not limited to the cumulative usage times, historical test time, and relevant operation logs. After obtaining the historical usage data, determine whether there is an available device status record. If there is, calculate the device operation status, and determine whether the test device is available according to the calculation result. If the status of the test device is normal, trigger a chip test instruction to indicate the execution of the chip test process. Otherwise, mark the test device as unavailable and end the current test task.

[0027] S20: Perform a power-on test on the chip to be tested based on the chip test instruction, and read the firmware version information of the chip to be tested. If the firmware version information matches, generate a radio frequency test instruction.

[0028] Specifically, parse the chip test instruction, and send a power-on control signal to the chip to be tested. After the chip is powered on, call the chip communication interface to request firmware version data. After the chip returns the firmware version data, obtain the preset target firmware version information, and compare the read firmware version data with the target firmware version. If the comparison result is consistent, generate a radio frequency test instruction and enter the radio frequency test process. If the comparison result is inconsistent, terminate the current test task and record the abnormal information of version mismatch.

[0029] S30: Perform a radio frequency test according to the radio frequency test instruction, and determine whether the chip to be tested triggers a parameter compensation program according to the test data. End the test after the chip to be tested does not need compensation or the compensation is completed, and generate a test result.

[0030] Specifically, parse the RF test instructions and start the test process. During the test, obtain the RF output data of the chip under test and perform standardization processing on the data. By comparing the test data with the preset standard range, determine whether the RF parameters meet the specification requirements. If the test data is within the standard range, end the RF test process and generate a qualified test result. If the test data exceeds the standard range, further analyze whether there are adjustable errors in the test data. If the error is adjustable, perform corresponding parameter compensation. After the compensation is completed, re-execute the RF test. Finally, generate a test result after the test process is completed and end the current test process.

[0031] S40: Analyze the test result. If the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment.

[0032] Specifically, parse the test result data. If the test passes, record the current test time, test result, and relevant test parameters, and upload the test data to the MES system. At the same time, update the historical usage data of the test equipment. If the test fails, terminate the data upload process and only record the failure data for subsequent analysis or the formulation of equipment maintenance plans.

[0033] In one embodiment, as Figure 2 shown, in step S10, that is, receive the test instructions and obtain the historical usage data of the test equipment. Determine whether to trigger a maintenance reminder based on the historical usage data, specifically including: S11: Retrieve the cumulative usage times of the test equipment in each test cycle from the MES system as the historical usage data.

[0034] Specifically, parse the test equipment identification information and send a query request to the MES system, specifying to query the usage records of the equipment. After receiving the data returned by the MES system, extract the historical test records of the equipment from the dataset and parse the cumulative usage times field therein. Finally, use the parsed cumulative usage times as the historical usage data for subsequent equipment status evaluation.

[0035] S12: Analyze the historical usage data based on the preset life threshold and the corresponding abnormal count threshold. When the historical usage data reaches the corresponding threshold, generate a maintenance reminder message and report it to the MES system.

[0036] Specifically, after obtaining the historical usage data of the test equipment, read the life threshold parameter and the abnormal count threshold parameter, and compare the cumulative usage times with the life threshold. If the cumulative usage times reach or exceed the life threshold, generate a maintenance reminder message. At the same time, compare the abnormal count with the abnormal threshold. If the abnormal count reaches or exceeds the abnormal threshold, further determine whether the equipment needs to be replaced or maintained. Finally, report the maintenance reminder message or the equipment replacement suggestion to the MES system for the operator to refer to and process.

[0037] In one embodiment, as Figure 3 shown, in step S20, that is, read the firmware version information of the chip under test. When the firmware version information matches, generate a radio frequency test instruction, specifically including: S21: Extract the firmware version information through the communication interface of the chip under test, and compare the firmware version information with the preset target firmware version of the current test environment.

[0038] Specifically, call the chip communication interface to send a firmware version query instruction, and receive the version data returned by the chip. After obtaining the version data, extract the target firmware version information from the set data of the current test environment, and compare the firmware version information returned by the chip with the target version field by field to determine whether they are consistent.

[0039] S22: In the case where the comparison result is inconsistent, download the firmware version that matches the preset target firmware version from the MES system, and the host computer burns the matching firmware version into the chip under test to modify the firmware version information.

[0040] Specifically, when it is detected that the firmware version of the chip does not match the target version, request the MES system to download the matching firmware version data. After receiving the firmware data, perform data integrity verification. If the verification passes, write the firmware data into the chip storage area to complete the firmware burning process. Finally, modify the firmware version information of the chip to make it consistent with the preset target firmware version.

[0041] S23: When the burning operation is completed, perform a read-back verification on the chip under test, and generate a radio frequency test instruction when the verification is successful.

[0042] Specifically, after the firmware burning is completed, send a firmware read instruction to the chip under test, and receive the firmware data returned by the chip. After obtaining the firmware data, compare the read-back firmware version information with the target firmware version information to determine whether they are consistent. If the comparison result is consistent, confirm that the firmware burning is successful and generate a radio frequency test instruction. If the comparison result is inconsistent, determine that the firmware burning fails, record the abnormal status, and stop the test process to avoid performing radio frequency tests in an incorrect firmware environment.

[0043] In one embodiment, as Figure 4 shown, in step S30, that is, performing a radio frequency test according to a radio frequency test instruction and determining whether to trigger a parameter compensation program for the chip under test according to the test data, specifically including: S31: Performing a frequency offset detection on the chip under test to obtain the current frequency offset, and then comparing the frequency offset with a preset standard frequency offset range to obtain a frequency offset detection result.

[0044] Specifically, parsing the radio frequency test instruction, sending a frequency offset detection request to the chip under test, controlling the chip to enter the signal transmission mode to obtain the center frequency of its currently transmitted signal, reading the actual frequency value through an external measurement device or a diagnostic interface built in the chip, and calculating the deviation between this frequency value and the standard signal frequency. After the calculation is completed, comparing the frequency offset with the preset standard frequency offset range. If the offset is within the standard range, it is determined that the frequency offset detection is qualified; if it exceeds the standard range, record the unqualified state of the frequency offset detection and use it as the basis for subsequent compensation.

[0045] S32: Performing a transmission power detection on the chip under test to obtain power data, and then performing a difference analysis on the power data and a preset target power value to obtain a transmission power detection result.

[0046] Specifically, sending a power test instruction to the chip under test, making the chip enter the transmission mode, outputting a radio frequency signal at a specified frequency, reading the current transmission power data of the chip, and measuring it through a power measurement module or an external test device. After the measurement is completed, comparing the measured power data with the target power value and calculating the power deviation between the two. If the power data is within the target range, it is determined that the power detection is qualified; if it exceeds the target range, record the abnormal state of the transmission power and use it as the basis for subsequent compensation.

[0047] S33: When the frequency offset detection result and / or the transmission power detection result do not meet the preset conditions, triggering the parameter compensation program, generating corresponding compensation parameters through the host computer and then sending them to the chip under test for compensation.

[0048] Specifically, when the frequency offset detection or the transmission power detection result is unqualified, parsing the test data, determining whether the deviation is within the compensable range. If it is within the compensable range, calculating the required compensation parameters and generating a corresponding compensation instruction. After the compensation instruction is generated, sending it to the chip under test through the host computer and controlling the chip to apply the corresponding compensation parameters. After the internal parameters of the chip are adjusted, re-performing the corresponding test to verify the compensation effect.

[0049] In one embodiment, as Figure 5As shown, in step S33, the parameter compensation program is triggered, and the corresponding compensation parameters are generated by the host computer and then sent to the chip under test for compensation, specifically including: S331: Generate frequency compensation parameters based on the frequency offset detection result and historical frequency offset test data, and according to the frequency offset calibration algorithm.

[0050] Specifically, when the frequency offset detection result does not meet the standard requirements, obtain the current frequency offset data, retrieve the frequency offset compensation data of the same type of chip in a similar environment from the historical test data, combine the current frequency offset data and historical data, and calculate the frequency compensation parameters applicable to the current chip through the frequency offset calibration algorithm. After the calculation is completed, use the compensation parameters as the basis for adjusting the internal oscillation circuit of the chip to optimize its output frequency to meet the standard requirements.

[0051] S332: Generate power gain adjustment parameters based on the transmit power detection result and according to the power gain compensation model.

[0052] Specifically, when the transmit power detection result does not meet the target power range, analyze the actual power output data of the chip, combine it with the historical test data, calculate the current power deviation amount. After calculating the deviation amount, generate the gain adjustment parameters applicable to the current chip based on the power gain compensation model, and use it as the basis for adjusting the gain of the chip power amplifier to ensure that the output power of the chip meets the standard requirements.

[0053] Furthermore, the power gain compensation model constructs input features based on the test results of the chip radio frequency transmit power, combines auxiliary information such as chip operating temperature and power supply voltage, and uses machine learning algorithms for training, enabling it to predict the optimal power amplifier gain adjustment parameters according to the current power deviation, thereby achieving refined power control; the training data comes from large-scale chip production line test records, including power error values and the actual effects after compensation. Through continuous iterative optimization, the model has high accuracy and generalization ability in the actual production environment.

[0054] S333: Send the frequency compensation parameters and / or power gain adjustment parameters to the chip under test through the host computer to modify the oscillation circuit parameters and / or power amplifier gain parameters.

[0055] Specifically, after calculating the frequency compensation parameters or power gain adjustment parameters, generate a chip parameter adjustment instruction, and send the adjustment instruction to the chip under test through the host computer. After the chip receives the adjustment instruction, modify its internal oscillation circuit parameters to adjust its operating frequency, or modify the power amplifier gain parameters to adjust the radio frequency output power. After the adjustment is completed, the chip enters a stable state and can perform radio frequency tests again to verify the compensation effect.

[0056] In one embodiment, asFigure 6 As shown, in step S40, that is, analyzing the test results, if the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment, further including: S401: In the case where the test result is a test failure, analyze the failure type based on the test data, and then determine whether the test parameters can be adjusted to retest.

[0057] Specifically, in the case where the test result is a failure, parse the test data, obtain the specific test items and corresponding test data of the failure, and analyze the failure type to determine whether the failure is caused by environmental interference, aging of the test equipment, test error, or hardware failure of the chip itself. If the failure reason is an error caused by adjustable parameters, calculate the optimized test parameters based on the failure data, and regenerate the test instructions to perform a new test. If the failure reason is an irreparable physical damage or serious deviation, do not perform a retest, but directly mark it as an abnormal state.

[0058] S402: If the failure type is irreparable, mark the test as abnormal and upload it to the MES system.

[0059] Specifically, after the test failure analysis is completed, if the failure type is an irreparable fault, such as internal damage of the chip, memory abnormality, PLL failure to lock, or power supply problem, it is determined that the chip fails the test. After confirming that the fault is irreparable, mark the test status of the chip as abnormal, record the failure reason and relevant test data, and at the same time upload the abnormal information to the MES system for subsequent defective product analysis and production data traceability. Finally, end the test process and wait for further processing.

[0060] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not mean the order of execution. The order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0061] In one embodiment, an intelligent detection device based on a host computer is provided, and the intelligent detection device based on the host computer corresponds one-to-one with the intelligent detection method based on the host computer in the above embodiment. As Figure 7 shown, the intelligent detection device based on the host computer includes a test equipment status determination module, a firmware version verification module, a radio frequency test and compensation module, and a test result processing module. The detailed description of each functional module is as follows: The test equipment status determination module is used to receive test instructions, obtain the historical usage data of the test equipment, determine whether to trigger a maintenance reminder according to the historical usage data, and if the test equipment status is normal, trigger a chip test instruction; The firmware version verification module is used to perform power-on detection on the chip under test based on chip test instructions, read the firmware version information of the chip under test, and generate radio frequency test instructions if the firmware version information matches; The radio frequency test and compensation module is used to perform radio frequency tests according to radio frequency test instructions, determine whether the chip under test triggers the parameter compensation program based on the test data, end the test after the chip under test does not require compensation or the compensation is completed, and generate test results; The test result processing module is used to analyze the test results. If the test passes, it records and uploads the test data to the MES system and updates the historical usage data of the test equipment at the same time.

[0062] Optionally, the test equipment status determination module specifically includes: The historical data extraction sub-module is used to retrieve the cumulative usage times of the test equipment in each test cycle from the MES system as historical usage data; The threshold analysis sub-module is used to analyze the historical usage data based on a preset lifespan threshold and the corresponding abnormal count threshold, and generate a maintenance reminder message and report it to the MES system if the historical usage data reaches the corresponding threshold.

[0063] Optionally, the firmware version verification module specifically includes: The version information extraction sub-module is used to extract the firmware version information through the communication interface of the chip under test and compare the firmware version information with the preset target firmware version of the current test environment; The version update execution sub-module is used, when the comparison result is inconsistent, to download the firmware version that matches the preset target firmware version from the MES system, and the host computer burns the matching firmware version to the chip under test to modify the firmware version information; The burn result verification sub-module is used to perform a read-back verification on the chip under test when the burn operation is completed, and generate radio frequency test instructions if the verification is successful.

[0064] Optionally, the radio frequency test and compensation module specifically includes: The frequency offset detection sub-module is used to perform frequency offset detection on the chip under test to obtain the current frequency offset, and then compare the frequency offset with the preset standard frequency offset range to obtain the frequency offset detection result; The power detection sub-module is used to perform transmit power detection on the chip under test to obtain power data, and then perform a difference analysis on the power data and the preset target power value to obtain the transmit power detection result; The compensation trigger sub-module is used, when the frequency offset detection result and / or the transmit power detection result do not meet the preset conditions, to trigger the parameter compensation program, generate the corresponding compensation parameters through the host computer and then send them to the chip under test for compensation.

[0065] Optionally, the compensation trigger sub-module specifically includes: A frequency compensation calculation unit, configured to generate frequency compensation parameters based on the frequency offset detection result and historical frequency offset test data, and according to the frequency offset calibration algorithm; A power compensation calculation unit, configured to generate a power gain adjustment parameter based on the transmission power detection result and according to the power gain compensation model; A parameter distribution control unit, configured to distribute the frequency compensation parameter and / or the power gain adjustment parameter to the chip under test through the host computer, so as to modify the oscillation circuit parameter and / or the power amplifier gain parameter.

[0066] Optionally, the test result processing module further includes: An abnormality recognition module, configured to, when the test result is a test failure, analyze the failure type according to the test data, and then determine whether the test parameters can be adjusted to retest; An abnormality reporting module, configured to, if the failure type is uncorrectable, mark the test abnormality and upload it to the MES system.

[0067] For the specific limitations of the intelligent detection device based on the host computer, reference can be made to the limitations of the intelligent detection method based on the host computer in the above text, which will not be elaborated here. Each module in the above intelligent detection device based on the host computer can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in the processor in the computer device in the form of hardware or be independent of it, or can be stored in the memory in the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0068] In one embodiment, a computer device is provided. The computer device can be a server, and its internal structure diagram can be as Figure 8 shown. The computer device includes a processor, a memory, a network interface, and a database connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. The computer program, when executed by the processor, implements an intelligent detection method based on the host computer.

[0069] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, the following steps are implemented: Receive a test instruction, obtain the historical usage data of the test equipment, and determine whether to trigger a maintenance reminder based on the historical usage data. If the test equipment is in normal condition, trigger a chip test instruction; Conduct a power-on test on the chip under test based on the chip test instruction, and read the firmware version information of the chip under test. If the firmware version information matches, generate a radio frequency test instruction; Execute a radio frequency test according to the radio frequency test instruction, and determine whether the chip under test triggers a parameter compensation program based on the test data. End the test after the chip under test does not require compensation or the compensation is completed, and generate a test result; Analyze the test result. If the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment.

[0070] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented: Receive a test instruction, obtain the historical usage data of the test equipment, and determine whether to trigger a maintenance reminder based on the historical usage data. If the test equipment is in normal condition, trigger a chip test instruction; Conduct a power-on test on the chip under test based on the chip test instruction, and read the firmware version information of the chip under test. If the firmware version information matches, generate a radio frequency test instruction; Execute a radio frequency test according to the radio frequency test instruction, and determine whether the chip under test triggers a parameter compensation program based on the test data. End the test after the chip under test does not require compensation or the compensation is completed, and generate a test result; Analyze the test result. If the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment.

[0071] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, storage, database, or other medium used in the embodiments provided in the present application can include non-volatile and / or volatile memories. Non-volatile memories can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memories can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and Rambus dynamic RAM (RDRAM), etc.

[0072] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the above-mentioned division of each functional unit and module is used as an example. In actual applications, the above functions can be allocated to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above.

[0073] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. An intelligent detection method based on a host computer, characterized in that, The method includes: Receiving a test instruction, obtaining historical usage data of the test device, determining whether to trigger a maintenance reminder based on the historical usage data, and if the test device is in a normal state, triggering a chip test instruction; Conducting a power-on test on the chip under test based on the chip test instruction, and reading the firmware version information of the chip under test. If the firmware version information matches, generating a radio frequency test instruction; Performing a radio frequency test according to the radio frequency test instruction, and determining whether the chip under test triggers a parameter compensation program based on the test data. After the chip under test does not require compensation or the compensation is completed, ending the test and generating a test result; Analyzing the test result. If the test passes, recording and uploading the test data to the MES system, and simultaneously updating the historical usage data of the test device.

2. The intelligent detection method based on the host computer according to claim 1, wherein The receiving of the test instruction, obtaining the historical usage data of the test device, and determining whether to trigger a maintenance reminder based on the historical usage data specifically includes: Retrieving the cumulative usage times of the test device in each test cycle from the MES system as the historical usage data; Analyzing the historical usage data based on a preset lifespan threshold and the corresponding abnormal count threshold. When the historical usage data reaches the corresponding threshold, generating a maintenance reminder message and reporting it to the MES system.

3. The intelligent detection method based on the host computer according to claim 1, wherein The reading of the firmware version information of the chip under test and generating a radio frequency test instruction if the firmware version information matches specifically includes: Extracting the firmware version information through the communication interface of the chip under test, and comparing the firmware version information with the preset target firmware version of the current test environment; If the comparison result is inconsistent, downloading the firmware version that matches the preset target firmware version from the MES system, and burning the matching firmware version to the chip under test by the host computer to modify the firmware version information; When the burning operation is completed, performing a read-back verification on the chip under test, and generating the radio frequency test instruction if the verification is successful.

4. The intelligent detection method based on the host computer according to claim 1, wherein The performing of the radio frequency test according to the radio frequency test instruction and determining whether the chip under test triggers a parameter compensation program based on the test data specifically includes: Performing a frequency offset detection on the chip under test to obtain the current frequency offset, and then comparing the frequency offset with the preset standard frequency offset range to obtain a frequency offset detection result; Performing a transmit power detection on the chip under test to obtain power data, and then performing a difference analysis on the power data and a preset target power value to obtain a transmit power detection result; If the frequency offset detection result and / or the transmit power detection result does not meet the preset conditions, triggering the parameter compensation program, generating corresponding compensation parameters by the host computer, and then sending them to the chip under test for compensation.

5. The intelligent detection method based on the host computer according to claim 4, wherein The triggering of the parameter compensation program, generating corresponding compensation parameters by the host computer, and then sending them to the chip under test for compensation specifically includes: Generating frequency compensation parameters based on the frequency offset detection result and historical frequency offset test data, and according to the frequency offset calibration algorithm; Based on the detected transmission power result, generate a power gain adjustment parameter according to the power gain compensation model; Send the frequency compensation parameter and / or the power gain adjustment parameter to the chip under test through the host computer to modify the oscillation circuit parameter and / or the power amplifier gain parameter.

6. The intelligent detection method based on the host computer according to claim 1, characterized in that Analyze the test result. If the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment. It further includes: In the case where the test result is a test failure, analyze the failure type according to the test data, and then determine whether the test parameters can be adjusted to retest; If the failure type is irreparable, mark the test as abnormal and upload it to the MES system.

7. An intelligent detection device based on a host computer, characterized in that, The device includes: A test equipment status determination module, configured to receive a test instruction, obtain the historical usage data of the test equipment, judge whether to trigger a maintenance reminder according to the historical usage data, and if the test equipment status is normal, trigger a chip test instruction; A firmware version verification module, configured to perform a power-on test on the chip under test based on the chip test instruction, read the firmware version information of the chip under test, and generate a radio frequency test instruction when the firmware version information matches; A radio frequency test and compensation module, configured to perform a radio frequency test according to the radio frequency test instruction, judge whether the chip under test triggers a parameter compensation program according to the test data, end the test after the chip under test does not need compensation or the compensation is completed, and generate a test result; A test result processing module, configured to analyze the test result. If the test passes, record and upload the test data to the MES system, and at the same time update the historical usage data of the test equipment.

8. The intelligent detection device based on the host computer according to claim 7, characterized in that The test equipment status determination module specifically includes: A historical data extraction sub-module, configured to retrieve the cumulative usage times of the test equipment in each test cycle from the MES system as the historical usage data; A threshold analysis sub-module, configured to analyze the historical usage data based on a preset lifetime threshold and the corresponding abnormal count threshold, and generate a maintenance reminder message and report it to the MES system when the historical usage data reaches the corresponding threshold.

9. A computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the intelligent detection method based on the host computer according to any one of claims 1 to 6.

10. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, it implements the steps of the intelligent detection method based on the host computer according to any one of claims 1 to 6.

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