Imaging system using Re-MIBI (rhenium methoxyisobutyl isocyanide) in object and corresponding method of operation
By sending multiple radiation beams in the imaging system using one radiation beam at a time and detecting characteristic X-rays generated by Re-MIBI using a radiation detector, the problem that radiation detectors in the prior art is difficult to distinguish different local characteristic X-rays of objects, and a high-resolution imaging effect is achieved.
Patent Information
- Application Number
- CN202280102434.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-27
- Publication Date
- 2025-07-18
AI Technical Summary
Existing radiation detectors are difficult to effectively distinguish and detect characteristic X-rays in different parts of objects, resulting in insufficient resolution and accuracy of the imaging system.
Multiple radiation beams are sent through multiple parts of the object in a radiation beam at a time, and characteristic X-rays generated by Re-MIBI in each local partition are detected by a radiation detector, and signal separation and detection are performed through the bands of the collimating plate and the radiation detector.
High-resolution imaging of different parts of the object is achieved, the accuracy and resolution of the imaging system are improved, and the characteristic X-rays from different partitions can be effectively distinguished and detected.
Smart Images
Figure CN120344844A_ABST
Abstract
Description
Background Art
[0001] A radiation detector is a device that measures the characteristics of radiation. Examples of such characteristics may include the intensity, phase, and spatial distribution of polarization of the radiation. The radiation measured by the radiation detector may be the radiation transmitted through an object. Alternatively, the radiation measured by the radiation detector may be characteristic X-rays emitted by elements in the object via X-ray fluorescence (XRF). X-ray fluorescence refers to the emission of characteristic X-rays from elements that are excited, for example, due to exposure to high-energy X-rays or gamma rays. The radiation measured by the radiation detector may be electromagnetic radiation such as infrared light, visible light, ultraviolet light, X-rays, or gamma rays. The radiation may also be other types such as alpha rays and beta rays. An imaging system may include one or more image sensors, and each image sensor may have one or more radiation detectors. Summary of the Invention
[0002] Disclosed herein is a method that includes: sending a plurality of radiation beams (i), i = 1,..., M, one radiation beam at a time, through a plurality of local regions (i), i = 1,..., M of the same object, where the object includes Re-MIBI (rhenium methoxyisobutyl isonitrile), and M is a positive integer; and, for each value of i and for j = 1,..., Ni, detecting characteristic X-rays (i, j) generated by Re-MIBI in a partition (i, j) of the local region (i). The radiation beam (i) excites the Re-MIBI in the partition (i, j), causing the Re-MIBI in the partition (i, j) to generate the characteristic X-rays (i, j). Ni, i = 1,..., M are positive integers. In one aspect, a plurality of characteristic X-rays from different partitions are detected separately; in other words, the characteristic X-rays from one partition can be distinguished from the characteristic X-rays from another partition.
[0003] In one aspect, M > 1.
[0004] In one aspect, each of the plurality of radiation beams (i), i = 1,..., M includes X-rays.
[0005] In one aspect, the plurality of radiation beams (i), i = 1,..., M collectively irradiate the entire object.
[0006] In one aspect, each of the plurality of radiation beams (i), i = 1,..., M is a fan beam.
[0007] In one aspect, the detection for all values of i is performed using the same radiation detector, and the plurality of radiation beams (i), i = 1,..., M are perpendicular to the same best-fit plane of all sensing elements of the radiation detector.
[0008] In one aspect, for each value of i, the detection of the plurality of characteristic X-rays (i, j), where j = 1, …, Ni is performed simultaneously.
[0009] In one aspect, the detection for all values of i is performed using the same radiation detector, and for each value of i and for j = 1, …, Ni, the detection of the characteristic X-ray (i, j) includes summing the signals detected by the plurality of sensing elements of the strip (i, j) of the radiation detector.
[0010] In one aspect, for each value of i, the plurality of strips (i, j), where j = 1, …, Ni are separated from each other.
[0011] In one aspect, the detection for all values of i is performed using the same plurality of collimators that are parallel to each other, and for each value of i, the plurality of strips (i, j), where j = 1, …, Ni are parallel to the plurality of collimators.
[0012] In one aspect, for each value of i and for j = 1, …, Ni, the plurality of collimators direct the characteristic X-ray (i, j) onto the strip (i, j) and not onto any of the remaining strips among the plurality of strips (i, j), where j = 1, …, Ni.
[0013] In one aspect, each of the plurality of radiation beams (i), where i = 1, …, M is a fan beam, and for each value of i, the plurality of collimators are perpendicular to the radiation beam (i).
[0014] In one aspect, the detection for all values of i is performed using the same radiation detector, and when performing the detection for all values of i, the radiation detector does not detect the photons that are scattered by the plurality of radiation beams (i), where i = 1, …, M on the object and then reach the radiation detector.
[0015] In one aspect, the radiation detector is configured to distinguish the energy ranges of the plurality of radiation beams (i), where i = 1, …, M and the energy ranges of the plurality of characteristic X-rays (i, j), where i = 1, …, M and j = 1, …, Ni.
[0016] In one aspect, the detection for all values of i is performed using the same radiation detector, and the method further includes blocking any photons that are scattered by the plurality of radiation beams (i), where i = 1, …, M on the object and then travel towards the radiation detector.
[0017] The present invention discloses a device, which includes: a radiation source configured to send a plurality of radiation beams (i), i = 1, ……, M in a one-radiation-beam-at-a-time manner, and the radiation beams (i) respectively pass through a plurality of local parts (i) of the same object, i = 1, ……, M, wherein the object includes Re-MIBI (rhenium methoxyisobutyl isonitrile), and M is a positive integer; and a radiation detector configured to detect characteristic X-rays (i, j) generated by Re-MIBI in a partition (i, j) of the local part (i) for each value of i and for j = 1, ……, Ni. The radiation beam (i) excites the Re-MIBI in the partition (i, j), so that the Re-MIBI in the partition (i, j) generates the characteristic X-rays (i, j), and Ni, i = 1, ……, M are positive integers.
[0018] In one aspect, the plurality of radiation beams (i), i = 1, ……, M commonly irradiate the entire object.
[0019] In one aspect, for each value of i, the radiation detector simultaneously detects the plurality of characteristic X-rays (i, j), j = 1, ……, Ni.
[0020] In one aspect, for each value of i and for j = 1, ……, Ni, the radiation detector detects the characteristic X-rays (i, j) by summing signals detected by a plurality of sensing elements in a zone (i, j) of the radiation detector.
[0021] In one aspect, for each value of i, the plurality of zones (i, j), j = 1, ……, Ni are separated from each other.
[0022] In one aspect, the device further includes a plurality of collimators parallel to each other, and for each value of i, the plurality of zones (i, j), j = 1, ……, Ni are parallel to the plurality of collimators.
[0023] In one aspect, for each value of i and for j = 1, ……, Ni, the plurality of collimators make the characteristic X-rays (i, j) incident on the zone (i, j), and not incident on any of the remaining zones among the plurality of zones (i, j), j = 1, ……, Ni.
[0024] In one aspect, each of the plurality of radiation beams (i), i = 1, ……, M is a fan beam, and for each value of i, the plurality of collimators are perpendicular to the radiation beam (i). BRIEF DESCRIPTION OF THE DRAWINGS
[0025] Figure 1 Schematically shows a radiation detector according to an embodiment.
[0026] Figure 2 Schematically shows a simplified cross-sectional view of a radiation detector according to an embodiment.
[0027] Figure 3 Schematically shows a detailed cross-sectional view of a radiation detector according to an embodiment.
[0028] Figure 4 Schematically shows a detailed cross-sectional view of a radiation detector according to an alternative embodiment.
[0029] Figure 5A and 5B Schematically shows an imaging system in operation according to an embodiment.
[0030] Figure 6 Shows a flowchart depicting the operation of a general imaging system according to an embodiment. Detailed Description
[0031] Radiation Detector
[0032] As an example, Figure 1 Schematically shows radiation detector 100. Radiation detector 100 may include an array of pixels 150 (also referred to as sensing elements 150). The array may be a rectangular array (as Figure 1 shown), a honeycomb array, a hexagonal array, or any other suitable array. Figure 1 The example array of pixels 150 has 4 rows and 7 columns; however, generally, the array of pixels 150 may have any number of rows and any number of columns.
[0033] Each pixel 150 may be configured to detect radiation incident thereon from a radiation source (not shown) and may be configured to measure a characteristic of the radiation (e.g., the energy, wavelength, and frequency of a particle). The radiation may include radiation particles such as photons (X-rays, gamma rays, etc.) and subatomic particles (alpha particles, beta particles, etc.). Each pixel 150 may be configured to count the number of radiation particles incident thereon and having an energy falling within a plurality of energy bins over a period of time. All pixels 150 may be configured to count the number of radiation particles incident thereon and within a plurality of energy bins over the same period of time. When the incident radiation particles have similar energies, pixel 150 may simply be configured to count the number of radiation particles incident thereon over a period of time without measuring the energy of individual radiation particles.
[0034] Each pixel 150 may have its own analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident radiation particle into a digital signal, or to digitize an analog signal representing the total energy of multiple incident radiation particles into a digital signal. The pixels 150 may be configured to operate in parallel. For example, while one pixel 150 measures an incident radiation particle, another pixel 150 may be waiting for a radiation particle to arrive. The pixels 150 may not have to be individually addressable.
[0035] The radiation detector 100 described herein may be applied to, for example, X-ray telescopes, X-ray mammography, industrial X-ray defect detection, X-ray microimaging or microradiography, X-ray cast inspection, X-ray non-destructive inspection, X-ray welding inspection, X-ray digital subtraction angiography, etc. The radiation detector 100 may be suitable for use in place of photographic plates, photographic films, photostimulable phosphor (PSP) plates, X-ray image intensifiers, scintillators, or other semiconductor X-ray detectors.
[0036] Figure 2 Schematically shown is a Figure 1 simplified cross-sectional view of the radiation detector 100 along line 2-2 in accordance with an embodiment. Specifically, the radiation detector 100 may include a radiation absorption layer 110 and an electronic circuit layer 120 (which may include one or more ASICs or application-specific integrated circuits) for processing and analyzing electrical signals generated by incident radiation in the radiation absorption layer 110. The radiation detector 100 may or may not include a scintillator (not shown). The radiation absorption layer 110 may include a semiconductor material such as silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof. The semiconductor material may have a high mass attenuation coefficient for the radiation of interest.
[0037] As an example, Figure 3 schematically shown is a Figure 1 detailed cross-sectional view of the radiation detector 100 along line 2-2 in accordance with an embodiment. Specifically, the radiation absorption layer 110 may include one or more diodes (e.g., p-i-n or p-n), which are composed of one or more discrete regions 114 of a first doped region 111 and a second doped region 113. The second doped region 113 may be separated from the first doped region 111 by an optional intrinsic region 112. The discrete regions 114 may be separated from each other by the first doped region 111 or the intrinsic region 112. The first doped region 111 and the second doped region 113 may have opposite doping types (e.g., the first doped region 111 is p-type and the second doped region 113 is n-type, or the first doped region 111 is n-type and the second doped region 113 is p-type). In Figure 3In the example, each discrete region 114 of the second doped region 113 forms a diode together with the first doped region 111 and the optional intrinsic region 112. That is, in Figure 3 the example, the radiation absorption layer 110 has a plurality of diodes (more specifically, 7 diodes corresponding to Figure 1 7 pixels 150 in a row of the array of Figure 3 ; for simplicity, only 2 pixels 150 are labeled in
[0038] The electronic circuit layer 120 may include an electronic system 121 adapted to process or interpret signals generated by radiation incident on the radiation absorption layer 110. The electronic system 121 may include analog circuits such as filter networks, amplifiers, integrators, and comparators or digital circuits such as microprocessors and memories. The electronic system 121 may include one or more ADCs (analog-to-digital converters). The electronic system 121 may include components shared by the pixels 150 or components dedicated to a single pixel 150. For example, the electronic system 121 may include an amplifier dedicated to each pixel 150 and a microprocessor shared among all the pixels 150. The electronic system 121 may be electrically connected to the pixels 150 through vertical interconnect channels 131. The space between the vertical interconnect channels may be filled with a filling material 130, thereby increasing the mechanical stability of the connection between the electronic circuit layer 120 and the radiation absorption layer 110. Other bonding techniques may also be used to connect the electronic system 121 to the pixels 150 without using the vertical interconnect channels 131.
[0039] When radiation from a radiation source (not shown) impinges on the radiation absorption layer 110 including diodes, the radiation particles can be absorbed and generate one or more charge carriers (e.g., electrons, holes) through various mechanisms. The charge carriers can drift under the action of an electric field to the electrodes of one of these diodes. The electric field can be an external electric field. The electrical contact 119B can include a plurality of discrete portions, each discrete portion being in electrical contact with a discrete region 114. The term "electrical contact" can be used interchangeably with the word "electrode". In one embodiment, the charge carriers can drift in multiple directions such that the charge carriers generated by a single radiation particle are substantially not shared by two different discrete regions 114 (where "substantially not shared" means that less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow to a discrete region 114 different from the discrete region 114 to which the remaining charge carriers flow). The charge carriers generated by radiation particles incident around the footprint of one of these discrete regions 114 are substantially not shared by another of these discrete regions 114. The pixel 150 associated with the discrete region 114 can be the region around the discrete region 114, and substantially all (more than 98%, more than 99.5%, more than 99.9%, or more than 99.99%) of the charge carriers generated by radiation particles incident in this region flow to the discrete region 114. That is, less than 2%, less than 1%, less than 0.1%, or less than 0.01% of these charge carriers flow out of the pixel 150.
[0040] Figure 4 Schematically shows a detailed cross-sectional view along line 2-2 of the radiation detector 100 in accordance with an alternative embodiment. More specifically, the radiation absorption layer 110 can include a resistor of a semiconductor material such as silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof, but does not include diodes. The semiconductor material can have a high mass attenuation coefficient for the radiation of interest. In one embodiment, Figure 1 The electronic circuit layer 120 in is similar in terms of structure and function to the Figure 4 electronic circuit layer 120 in Figure 3
[0041] When radiation strikes the radiation absorption layer 110 that includes a resistor but does not include a diode, the radiation can be absorbed and generate one or more charge carriers through various mechanisms. A single radiation particle can generate from 10 to 100,000 charge carriers. The charge carriers can drift under the action of an electric field to the electrical contacts 119A and 119B. The electric field can be an external electric field. The electrical contact 119B can include a plurality of discrete portions. In one embodiment, the charge carriers can drift in multiple directions such that the charge carriers generated by a single radiation particle are substantially not shared by two different discrete portions of the electrical contact 119B (where "substantially not shared" means that less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow to discrete portions different from those to which the remaining charge carriers flow). The charge carriers generated by radiation particles incident around the occupied space of one of these discrete portions of the electrical contact 119B are substantially not shared by another of these discrete portions of the electrical contact 119B. The pixel 150 associated with the discrete portion of the electrical contact 119B can be the area around the discrete portion, and substantially all (more than 98%, more than 99.5%, more than 99.9%, or more than 99.99%) of the charge carriers generated by radiation particles incident in this area flow to this discrete portion of the electrical contact 119B. That is, less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow out of the pixel associated with this discrete portion of the electrical contact 119B.
[0042] The term "image" in this patent application (including the claims) is not limited to the spatial distribution of the characteristics of radiation (e.g., intensity). For example, the term "image" can also include the spatial distribution of the density of a substance or element.
[0043] Imaging system
[0044] Figure 5A A perspective view schematically shows an imaging system 500 according to an embodiment. In one embodiment, the imaging system 500 can include Figures 1 to 4 the radiation detector 100, a radiation source 510, and a plurality of collimator plates 520 in it. In one embodiment, the plurality of collimator plates 520 can include a material (e.g., tungsten) that blocks and absorbs X-rays. In one embodiment, the plurality of collimator plates 520 can be parallel to each other (as shown).
[0045] In one embodiment, the object 590 may be positioned such that a plurality of collimator plates 520 are disposed between the radiation detector 100 and the object 590 (as shown). In one embodiment, the object 590 may include Re-MIBI (rhenium methoxyisobutyl isonitrile). For example, the object 590 may be a human body part containing Re-MIBI. Note that Re-MIBI has the property of generating and emitting characteristic X-rays in all directions in response to the excitation by suitable radiation.
[0046] Operation of the imaging system
[0047] In one embodiment, referring to Figure 5A , the imaging system 500 may operate as follows. The radiation source 510 may send a first radiation beam 511 through a first portion 591 of the object 590. In one embodiment, the first radiation beam 511 may be a fan beam, and the first portion 591 may be a slice of the object 590 (as shown). The slice is shown as being substantially perpendicular to the radiation detector 100, but the slice may also be substantially parallel to the radiation detector 100 or at any suitable angle with respect to the radiation detector 100. In one embodiment, the radiation detector 100 may include a plurality of zones (e.g., zones 150a, 150b, 150c, and 150d) composed of sensing elements 150.
[0048] Definition of "only seeing"
[0049] Assume that the first portion 591 of the object 590 includes sub-regions 591a, 591b, 591c, and 591d such that: (A) zone 150a only sees sub-region 591a, (B) zone 150b only sees sub-region 591b, (C) zone 150c only sees sub-region 591c, (D) zone 150d only sees sub-region 591d.
[0050] The above description (A) means that: (1) each straight line segment connecting two points respectively located on zone 150a and sub-region 591a does not intersect any of the collimator plates 520; (2) each straight line segment connecting two points respectively located on (i) zone 150a and (ii) any one of the remaining sub-regions 591b, 591c, and 591d of the first portion 591 intersects at least one collimator plate 520.
[0051] Similarly, the above description (B) means that: (1) each straight line segment connecting two points located on the strip 150b and the partition 591b respectively does not intersect any of the quasi-straight plates 520; (2) each straight line segment connecting two points located on (i) the strip 150b and (ii) any one of the remaining partitions 591a, 591c, and 591d of the first part 591 intersects at least one quasi-straight plate 520. The meanings of the above descriptions (C) and (D) are similar to the meanings of the descriptions (A) and (B).
[0052] In one embodiment, the radiation beam 511 can excite the Re-MIBI in multiple partitions 591a, 591b, 591c, and 591d of the first part 591, so that the Re-MIBI in the multiple partitions 591a, 591b, 591c, and 591d respectively generate characteristic X-rays 591ax, characteristic X-rays 591bx, characteristic X-rays 591cx, and characteristic X-rays 591dx that are respectively directed towards the multiple strips 150a, 150b, 150c, and 150d of the radiation detector 100. The characteristic X-rays (here are X-rays 591ax, characteristic X-rays 591bx, characteristic X-rays 591cx, and characteristic X-rays 591dx) from different partitions (here are partitions 591a, 591b, 591c, and 591d) are individually detected by the radiation detector 100. In other words, the radiation detector 100 can distinguish multiple characteristic X-rays from different partitions of the first part 591.
[0053] Images of Re-MIBI in multiple parts
[0054] In one embodiment, the radiation detector 100 can take a first image of the Re-MIBI in the first part 591 by using the multiple strips 150a, 150b, 150c, and 150d to respectively detect the multiple characteristic X-rays 591ax, 591bx, 591cx, and 591dx.
[0055] In one embodiment, referring to Figure 5A and 5B , after taking the first image of the Re-MIBI in the first part 591, the radiation detector 100 can take a second image of the Re-MIBI in the second part 592 ( Figure 5B ) of the object 590 by repeating the above process. The second part 592 can be different from the first part 591.
[0056] Specifically, in one embodiment, referring to Figure 5B, the radiation source 510 can send a second radiation beam 512 through a second portion 592 of the object 590. Assume that the second portion 592 includes partitions 592a, 592b, 592c, and 592d such that: (A) zone 150a only sees partition 592a, (B) zone 150b only sees partition 592b, (C) zone 150c only sees partition 592c, (D) zone 150d only sees partition 592d.
[0057] The second radiation beam 512 excites the Re-MIBI in the multiple partitions 592a, 592b, 592c, and 592d of the second portion 592, causing the Re-MIBI in the multiple partitions 592a, 592b, 592c, and 592d to respectively generate characteristic X-rays 592ax, characteristic X-rays 592bx, characteristic X-rays 592cx, and characteristic X-rays 592dx that are respectively directed towards the multiple zones 150a, 150b, 150c, and 150d. Then, the radiation detector 100 can take a second image of the Re-MIBI in the second portion 592 by respectively detecting the multiple characteristic X-rays 592ax, 592bx, 592cx, and 592dx using the multiple zones 150a, 150b, 150c, and 150d.
[0058] In one embodiment, after taking the second image of the Re-MIBI in the second portion 592, the radiation detector 100 can take other images of the Re-MIBI in other portions (not shown) of the object 590 in a similar manner. Specifically, the radiation source 510 can send other radiation beams (not shown) through the other portions of the object 590 (in a one-radiation-beam-at-a-time manner). Then, the radiation detector 100 can take other images of the Re-MIBI in these other portions by detecting the characteristic X-rays from these other portions as described above.
[0059] Note that for simplicity, in the above example, the detection of the Re-MIBI in the first portion 591 and the second portion 592 of the object 590 involves the same zones 150a, 150b, 150c, and 150d of the radiation detector 100. Generally, this is not always the case. For example, assume that the first portion 591 only includes partitions 591a, 591b, and 591c, while the second portion 592 only includes partitions 592b, 592c, and 592d. Therefore, the detection of the Re-MIBI in the first portion 591 involves zones 150a, 150b, and 150c, while the detection of the Re-MIBI in the second portion 592 involves zones 150b, 150c, and 150d.
[0060] Flowchart summarizing the operation of the imaging system
[0061] Figure 6Shows an overview according to an embodiment Figure 5A and 5B FIG. 600 is a flowchart showing the operation of the imaging system 500 in 5B . In step 610, the operation may include sending a plurality of radiation beams (i), i = 1, ……, M, one radiation beam at a time, through a plurality of local parts (i), i = 1, ……, M of the same object respectively. The object includes Re-MIBI (rhenium methoxyisobutyl isonitrile), and M is a positive integer.
[0062] For example, in the above embodiment, referring to Figure 5A and 5B , the radiation source 510 sends a first radiation beam, a second radiation beam, and other radiation beams, one radiation beam at a time, through the first local part, the second local part, and other local parts of the object 590 respectively. The object 590 includes Re-MIBI.
[0063] In step 620, the operation may include: for each value of i and for j = 1, ……, Ni, detecting characteristic X-rays (i, j) generated by Re-MIBI in the partition (i, j) of the local part (i), wherein the radiation beam (i) excites the Re-MIBI in the partition (i, j), so that the Re-MIBI in the partition (i, j) generates characteristic X-rays (i, j), and Ni, i = 1, ……, M are positive integers.
[0064] For example, in the above embodiment, referring to Figure 5A and 5B , for the first local part 591, the radiation detector 100 detects a plurality of characteristic X-rays 591ax, 591bx, 591cx, and 591dx respectively from a plurality of partitions 591a, 591b, 591c, and 591d of the first local part 591. As another example, for the second local part 592, the radiation detector 100 detects a plurality of characteristic X-rays 592ax, 592bx, 592cx, and 592dx respectively from a plurality of partitions 592a, 592b, 592c, and 592d of the second local part 592.
[0065] Other embodiments
[0066] X-rays for exciting Re-MIBI
[0067] In one embodiment, referring to Figures 5A to 6 , each of the plurality of radiation beams (i), i = 1, ……, M may include X-rays. For example, in the above embodiment, each of the first radiation beam 511, the second radiation beam 512, and other radiation beams that pass through different local parts of the object 590 sent by the radiation source 510 may include X-rays.
[0068] Scanning the entire object
[0069] In one embodiment, referring to Figures 5A to 6 , a plurality of radiation beams (i), where i = 1, ……, M can jointly irradiate the entire object 590. For example, in the above embodiment, the above-mentioned first radiation beam 511, second radiation beam 512 and other radiation beams jointly irradiate the entire object 590. In other words, each point of the object 590 is located in at least one of the above-mentioned first portion 591, second portion 512 and other portions.
[0070] The excitation beam is a fan beam
[0071] In one embodiment, referring to Figures 5A to 6 , each of the plurality of radiation beams (i), where i = 1, ……, M can be a fan beam. For example, in the above embodiment, each of the above-mentioned first radiation beam 511, second radiation beam 512 and other radiation beams can be a fan beam. In addition, in one embodiment, the above-mentioned first radiation beam 511, second radiation beam 512 and other radiation beams can be perpendicular to the same best-fit plane (not shown) of all the sensing elements 150 of the radiation detector 100.
[0072] Simultaneously detecting characteristic X-rays from multiple partitions of each portion
[0073] In one embodiment, referring to Figures 5A to 6 (step 620), for each value of i, the detection of the multiple characteristic X-rays (i, j), where j = 1, ……, Ni can be performed simultaneously. In other words, in the above embodiment, for each of the above-mentioned first portion 591, second portion 512 and other portions, the detection of multiple characteristic X-rays from multiple partitions of each portion can be performed simultaneously. For example, for the first portion 591, the detection of multiple characteristic X-rays 591ax, 591bx, 591cx and 591dx respectively from multiple partitions 591a, 591b, 591c and 591d is performed simultaneously. For another example, for the second portion 592, the detection of multiple characteristic X-rays 592ax, 592bx, 592cx, 592dx respectively from multiple partitions 592a, 592b, 592c and 592d is performed simultaneously.
[0074] Summation of signals in each zone
[0075] In one embodiment, referring to Figures 5A to 6 (step 620), for each value of i and for j = 1, ……, Ni, the detection of the characteristic X-ray (i, j) may include summing the signals detected by multiple sensing elements 150 in the zone (i, j) of the radiation detector 100. For example, for the characteristic X-ray 591ax ( Figure 5AThe detection of ( ) includes summing the signals detected by the multiple sensing elements 150 in the strip 150a of the radiation detector 100. For another example, for the characteristic X-ray 591bx ( Figure 5A The detection of ( ) includes summing the signals detected by the multiple sensing elements 150 in the strip 150b of the radiation detector 100.
[0076] More information about the strip
[0077] In one embodiment, referring to Figures 5A to 6 , for each value of i, the multiple strips (i, j), where j = 1,..., Ni can be separated from each other. For example, in the above embodiment, the 4 strips 150a, 150b, 150c, and 150d can be separated from each other. In other words, any two of the 4 strips 150a, 150b, 150c, and 150d do not share any sensing element 150.
[0078] In one embodiment, for each value of i, the multiple strips (i, j), where j = 1,..., Ni can be parallel to the multiple collimator plates 520. For example, the 4 strips 150a, 150b, 150c, and 150d can be parallel to the multiple collimator plates 520.
[0079] In one embodiment, referring to Figures 5A to 6 , for each value of i and for j = 1,..., Ni, the multiple collimator plates 520 can direct the characteristic X-ray (i, j) onto the strip (i, j) without directing it onto any of the remaining strips among the multiple strips (i, j), where j = 1,..., Ni. For example, for the first portion 591, the multiple collimator plates 520 direct the characteristic X-ray 591ax onto the strip 150a without directing it onto any of the remaining strips 150b, 150c, and 150d. For another example, the multiple collimator plates 520 direct the characteristic X-ray 591bx onto the strip 150b without directing it onto any of the remaining strips 150a, 150c, and 150d.
[0080] The excitation radiation beam is perpendicular to the multiple collimator plates
[0081] In one embodiment, referring to Figures 5A to 6 , each of the multiple radiation beams (i), where i = 1,..., M can be a fan beam; and, for each value of i, the multiple collimator plates 520 can be perpendicular to the radiation beam (i). For example, in the above embodiment, each of the above first radiation beam 511, the second radiation beam, and the other radiation beams can be a fan beam and can be perpendicular to the multiple collimator plates 520.
[0082] The radiation detector does not detect scattered photons
[0083] In one embodiment, referring to Figures 5A to 6 , the detection for all values of i can be performed using the same radiation detector 100; and, when performing the detection for all values of i, the radiation detector 100 may not detect photons that are scattered on the object 590 and then reach the radiation detector 100 from multiple radiation beams (i), where i = 1, ……, M. For example, in the above embodiment, the radiation detector 100 does not detect photons of the radiation beam 511 that are scattered on the object 590 and then reach the radiation detector 100. As another example, in the above embodiment, the radiation detector 100 does not detect photons of the radiation beam 512 that are scattered on the object 590 and then reach the radiation detector 100.
[0084] The radiation detector can distinguish the excitation radiation beam and characteristic X-rays
[0085] In one embodiment, referring to Figures 5A to 6 , the radiation detector 100 can be configured to distinguish the energy ranges of multiple radiation beams (i), where i = 1, ……, M, and the energy ranges of multiple characteristic X-rays (i, j), where i = 1, ……, M and j = 1, ……, Ni. For example, in the above embodiment, the radiation detector 100 can distinguish the energy range of the radiation beam 511 and the energy ranges of the characteristic X-rays 591ax, 591bx, 591cx, and 591dx. Thus, the radiation detector 100 can detect the characteristic X-rays 591ax, 591bx, 591cx, and 591dx without detecting photons of the radiation beam 511 that may (A) travel directly from the radiation source 510 to the radiation detector 100 or (B) be scattered on the object 590 and then reach the radiation detector 100.
[0086] Prevent the excitation radiation beam from reaching the radiation detector
[0087] In one embodiment, referring to Figures 5A to 6 , any photons of the radiation beam (i), where i = 1, ……, M (e.g., the radiation beam 511) that are scattered on the object 590 and then travel toward the radiation detector 100 can be blocked by a filter (not shown), which blocks and absorbs the any photons but allows the characteristic X-rays of Re-MIBI to pass through. In one embodiment, referring to Figure 5A and 5B , the filter can be located between the radiation detector 100 and the object 590.
[0088] Although various aspects and embodiments have been disclosed herein, other aspects and embodiments will be apparent to those skilled in the art. The various aspects and embodiments disclosed herein are for illustrative purposes only and are not intended to limit the invention, the true scope and gist of which are pointed out by the appended claims.
Claims
1. A method, comprising: sending a plurality of radiation beams (i), i = 1, ……, M, one radiation beam at a time, through a plurality of local parts (i), i = 1, ……, M of the same object, wherein the object comprises Re-MIBI (rhenium methoxyisobutyl isonitrile), and wherein M is a positive integer; and for each value of i and for j = 1, ……, Ni, detecting characteristic X-rays (i, j) generated by Re-MIBI in a partition (i, j) of the local part (i), wherein the radiation beam (i) excites the Re-MIBI in the partition (i, j) such that the Re-MIBI in the partition (i, j) generates the characteristic X-rays (i, j), and wherein Ni, i = 1, ……, M are positive integers.
2. The method according to claim 1, wherein, Each of the plurality of radiation beams (i), i = 1, ……, M comprises X-rays.
3. The method according to claim 1, wherein, The plurality of radiation beams (i), i = 1, ……, M together irradiate the entire object.
4. The method according to claim 1, wherein, Each of the plurality of radiation beams (i), i = 1, ……, M is a fan beam.
5. The method according to claim 4, Among them, performing the detection for all values of i using the same radiation detector, and wherein the plurality of radiation beams (i), i = 1, ……, M are perpendicular to the same best-fit plane of all sensing elements of the radiation detector.
6. The method according to claim 1, wherein, For each value of i, the detection of the plurality of characteristic X-rays (i, j), j = 1, ……, Ni is performed simultaneously.
7. The method according to claim 1, Among them, performing the detection for all values of i using the same radiation detector, and wherein for each value of i and for j = 1, ……, Ni, the detection of the characteristic X-rays (i, j) comprises summing signals detected by a plurality of sensing elements in a zone (i, j) of the radiation detector.
8. The method according to claim 7, wherein For each value of i, the plurality of zones (i, j), j = 1, ……, Ni are separated from each other.
9. The method according to claim 7, Among them, performing the detection for all values of i using the same plurality of collimators that are parallel to each other, and wherein for each value of i, the plurality of zones (i, j), j = 1, ……, Ni are parallel to the plurality of collimators.
10. The method according to claim 9, wherein, For each value of i and for j = 1, ……, Ni, the plurality of collimators direct the characteristic X-rays (i, j) onto the zone (i, j) and not onto any of the remaining zones among the plurality of zones (i, j), j = 1, ……, Ni.
11. The method according to claim 9, Among them, each of the plurality of radiation beams (i), i = 1, ……, M is a fan beam, and wherein for each value of i, the plurality of collimators are perpendicular to the radiation beam (i).
12. The method according to claim 1, Among them, performing the detection for all values of i using the same radiation detector, and During the performance of the detection for all values of i, the radiation detector does not detect photons that are scattered by the object and then reach the radiation detector from the plurality of radiation beams (i), where i = 1, …, M.
13. The method according to claim 12, wherein, The radiation detector is configured to distinguish the energy ranges of the plurality of radiation beams (i), where i = 1, …, M, and the energy ranges of the plurality of characteristic X-rays (i, j), where i = 1, …, M and j = 1, …, Ni.
14. The method according to claim 1, Among them, performing the detection for all values of i using the same radiation detector, and wherein the method according to claim 1 further comprises blocking any photons that are scattered by the object and then travel towards the radiation detector from the plurality of radiation beams (i), where i = 1, …, M.
15. An apparatus comprising: a radiation source configured to send a plurality of radiation beams (i), where i = 1, …, M, through respective plurality of local regions (i), where i = 1, …, M, of the same object one radiation beam at a time, wherein the object comprises Re-MIBI (rhenium methoxyisobutylisonitrile), and wherein M is a positive integer; and a radiation detector configured to detect, for each value of i and for j = 1, …, Ni, characteristic X-rays (i, j) generated by Re-MIBI in a partition (i, j) of the local region (i), wherein the radiation beam (i) excites the Re-MIBI in the partition (i, j) such that the Re-MIBI in the partition (i, j) generates the characteristic X-rays (i, j), and wherein Ni, where i = 1, …, M, are positive integers.
16. The device according to claim 15, wherein, The plurality of radiation beams (i), where i = 1, …, M, collectively irradiate the entire object.
17. The apparatus according to claim 15, wherein, For each value of i, the radiation detector simultaneously detects the plurality of characteristic X-rays (i, j), where j = 1, …, Ni.
18. The apparatus according to claim 15, wherein, For each value of i and for j = 1, …, Ni, the radiation detector detects the characteristic X-rays (i, j) by summing signals detected by a plurality of sensing elements in a zone (i, j) of the radiation detector.
19. The apparatus according to claim 18, wherein For each value of i, the plurality of zones (i, j), where j = 1, …, Ni, are separated from each other.
20. The apparatus according to claim 18, further comprising a plurality of quasi-straight plates parallel to each other, wherein, For each value of i, the plurality of zones (i, j), where j = 1, …, Ni, are parallel to the plurality of collimator plates.
21. The apparatus according to claim 20, wherein, For each value of i and for j = 1, …, Ni, the plurality of collimator plates direct the characteristic X-rays (i, j) onto the zone (i, j) and not onto any of the remaining zones among the plurality of zones (i, j), where j = 1, …, Ni.
22. The apparatus according to claim 20, Among them, each of the plurality of radiation beams (i), where i = 1, …, M, is a fan beam, and wherein, for each value of i, the plurality of collimator plates are perpendicular to the radiation beam (i).