Electronic component debugging method and system, electronic equipment and storage medium
By building a digital twin model of electronic components and test equipment, the problems of damage and inaccurate status observation during electronic components debugging are solved, and a safe and efficient debugging process is achieved.
Patent Information
- Application Number
- CN202510235451.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-28
- Publication Date
- 2025-07-22
AI Technical Summary
During the debugging of electronic components, operating errors are prone to occur, resulting in device damage and the state changes cannot be observed accurately and intuitively.
Build a digital twin model of electronic components and test equipment, collect actual data through physical tests, generate a digital twin model and send it to the user for debugging, and realize virtual debugging.
It avoids damage to electronic components during debugging, and can accurately and intuitively observe their status changes, improving the accuracy and safety of debugging.
Smart Images
Figure CN120352709A_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the technical field of device testing, and particularly to a debugging method, system, electronic device and storage medium for electronic components. Background Art
[0002] Electronic components are increasingly widely used in various fields. The quality of electronic components directly affects the reliability of electronic components. Therefore, it is particularly important to test electronic components. However, during the current debugging process of electronic components, there may be phenomena such as device damage caused by operation errors, and it is impossible to accurately and intuitively observe the state changes of electronic components during the debugging process.
[0003] In view of this, how to accurately and intuitively observe the state of electronic components during the debugging process of electronic components has become an urgent technical problem to be solved. Summary of the Invention
[0004] In view of this, the purpose of the present disclosure is to propose a debugging method, system, electronic device and storage medium for electronic components to solve or partially solve the above technical problems.
[0005] Based on the above purpose, the first aspect of the present disclosure proposes a debugging method for electronic components, which is applied to a test program debugging system for electronic components; the system includes an experimental layer, a communication layer and a service layer; the experimental layer includes a physical experimental room and a virtual experimental room; the communication layer includes a server; the service layer includes a client; the method includes:
[0006] The physical experimental room collects the actual data of the electronic components and the test equipment, and sends the actual data to the communication layer;
[0007] The communication layer sends the actual data to the virtual experimental room through the server;
[0008] The virtual experimental room generates a digital twin model of the electronic components and the test equipment according to the actual data, and sends the digital twin model to the communication layer;
[0009] The communication layer sends the digital twin model to the client through the server;
[0010] The client debugs the electronic components through the digital twin model according to the received debugging instructions.
[0011] Based on the same inventive concept, the second aspect of the present disclosure proposes a debugging system for electronic components. The system includes an experimental layer, a communication layer and a service layer; the experimental layer includes a physical experimental room and a virtual experimental room; the communication layer includes a server; the service layer includes a client;
[0012] The physical test room is configured to collect actual data of electronic components and test equipment, and send the actual data to the communication layer;
[0013] The communication layer is configured to send the actual data to the virtual test room through the server;
[0014] The virtual test room is configured to generate digital twin models of electronic components and test equipment according to the actual data, and send the digital twin models to the communication layer;
[0015] The communication layer is configured to send the digital twin model to the client through the server;
[0016] The client is configured to debug the test program in the digital twin model according to the received debugging instruction.
[0017] Based on the same inventive concept, a third aspect of the present disclosure provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable by the processor. When the processor executes the computer program, the method described above is implemented.
[0018] Based on the same inventive concept, a fourth aspect of the present disclosure provides a non-transitory computer-readable storage medium storing computer instructions for causing a computer to execute the method described above.
[0019] As can be seen from the above, the present disclosure provides a method, a system, an electronic device, and a storage medium for debugging electronic components. The physical test room collects actual data of electronic components and test equipment, and sends the actual data to the communication layer. The communication layer sends the actual data to the virtual test room through the server. The virtual test room generates digital twin models of electronic components and test equipment according to the actual data, and sends the digital twin models to the communication layer. The communication layer sends the digital twin model to the client through the server. The client debugs the electronic components through the digital twin model according to the received debugging instruction. In this way, by constructing digital twin models of electronic components and test equipment and debugging the electronic components through the digital twin models, it is possible to avoid damaging the electronic components during the debugging process, and at the same time, it is possible to accurately and intuitively observe the state changes of the electronic components during the debugging process through the digital twin models. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] To more clearly illustrate the technical solutions in the present disclosure or related technologies, the following will briefly introduce the accompanying drawings required for use in the embodiments or the description of related technologies. Obviously, the accompanying drawings in the following description are only embodiments of the present disclosure. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on these drawings.
[0021] Figure 1 It is a flowchart of the debugging method for electronic components according to an embodiment of the present disclosure;
[0022] Figure 2 It is a schematic diagram of the structure of the virtual debugging platform according to an embodiment of the present disclosure;
[0023] Figure 3 It is a schematic diagram of the structure of the electronic component test program debugging system according to an embodiment of the present disclosure;
[0024] Figure 4 It is a schematic diagram of the structure of the debugging system for electronic components according to an embodiment of the present disclosure;
[0025] Figure 5 It is a schematic diagram of the structure of the electronic device according to an embodiment of the present disclosure. Detailed implementation manners
[0026] To make the objectives, technical solutions, and advantages of the present disclosure more clear and understandable, the following further elaborates on the present disclosure in detail in combination with specific embodiments and with reference to the accompanying drawings.
[0027] It should be noted that unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present disclosure should have the ordinary meaning understood by those of ordinary skill in the art to which the present disclosure pertains. The "first", "second", and similar terms used in the embodiments of the present disclosure do not denote any order, quantity, or importance, but are only used to distinguish different components. The terms such as "including" or "comprising" mean that the elements or objects appearing before this word cover the elements or objects listed after this word and their equivalents, without excluding other elements or objects. The terms such as "connected" or "coupled" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The terms such as "upper", "lower", "left", "right", etc. are only used to represent relative positional relationships, and when the absolute position of the object being described changes, the relative positional relationship may also change accordingly.
[0028] Based on the description of the background technology, with the continuous development of electronic technology, electronic components are more and more widely used in various fields. The quality of electronic components directly affects the reliability of electronic components. With the increase in the demand for electronic components, the quality of electronic components on the market is uneven, and the testing technology of electronic components is becoming more and more important. Through the testing of electronic components, the quality problems of electronic components can be found, and the actual situation of electronic components and the difference between actual operation indicators can be analyzed. Test program debugging is a necessary way to test electronic components. In the traditional test program debugging process, there may be operating errors that cause damage to electronic components, and it is impossible to accurately and intuitively observe the state changes of electronic components themselves during debugging or testing.
[0029] Nowadays, automation and intelligent technology are developing rapidly, and digital transformation has become an important trend in today's society. The purpose of digital transformation is to achieve comprehensive digitalization of industries and enterprises through relevant technologies and innovative methods to improve efficiency, reduce costs and enhance competitiveness. In this transformation process, digital twin technology is an important method that cannot be ignored. Digital twin technology has been studied in other industrial fields, but it is still a blank stage in the field of component testing.
[0030] Digital twin technology is an emerging technology that combines the physical world with the digital world. It has received widespread attention in all walks of life in recent years. Digital twin is a new model with the integration of data and models as its core. The virtual entity established based on digital twin can simulate, verify, predict and control the physical entity with the help of historical data, implementation data and various algorithm models, realize the combination of virtual and real, and thus conduct interactive feedback between virtual and physical entities, realizing full closed-loop optimization of the entire business process.
[0031] As mentioned above, how to accurately and intuitively observe the status of electronic components during the debugging process of electronic components has become an important research issue.
[0032] Based on the above description, if Figure 1 As shown, the electronic component debugging method proposed in this embodiment is applied to the test program debugging system of the electronic component; the system includes a test layer, a communication layer and a service layer; the test layer includes a physical test room and a virtual test room; the communication layer includes a server; the service layer includes a user end; the method includes:
[0033] Step 101: The physical test room collects actual data of electronic components and test equipment, and sends the actual data to the communication layer.
[0034] In specific implementation, the physical test room includes: electronic components, test equipment, a multimeter, and an oscilloscope. The physical test room collects the actual data of the electronic components, test equipment, multimeter, and oscilloscope, and sends the actual data to the communication layer.
[0035] Among them, the actual data refers to the size parameters, shape parameters, and position parameters of the electronic components and test equipment.
[0036] Step 102, the communication layer sends the actual data to the virtual test room through the server.
[0037] In specific implementation, the communication layer includes a server and a database. After the physical test room sends the actual data to the communication layer, it sends the actual data to the virtual test room through the server and stores the actual data in the database.
[0038] Step 103, the virtual test room generates digital twin models of the electronic components and test equipment according to the actual data, and sends the digital twin models to the communication layer.
[0039] In specific implementation, the virtual test room generates simulation models of the electronic components and test equipment according to the actual data. The virtual test room processes the simulation models to obtain digital twin models. In this way, users can debug the electronic components through the digital twin models.
[0040] Step 104, the communication layer sends the digital twin models to the user terminal through the server.
[0041] In specific implementation, the communication layer includes a server and a database. After the virtual test room sends the digital twin models to the communication layer, it sends the digital twin models to the user terminal through the server and stores the digital twin models in the database.
[0042] Step 105, the user terminal debugs the electronic components through the digital twin models according to the received debugging instructions.
[0043] In specific implementation, after the user terminal receives the debugging instructions, it debugs the digital twin models according to the debugging instructions, and accurately and intuitively observes the state changes of the electronic components during the debugging process according to the digital twin models.
[0044] Through the above embodiments, the physical test room collects the actual data of electronic components and test equipment, and sends the actual data to the communication layer. The communication layer sends the actual data to the virtual test room through the server. The virtual test room generates digital twin models of the electronic components and test equipment according to the actual data, and sends the digital twin models to the communication layer. The communication layer sends the digital twin models to the user terminal through the server. The user terminal debugs the electronic components through the digital twin models according to the received debugging instructions. In this way, by constructing digital twin models of the electronic components and test equipment and debugging the electronic components through the digital twin models, it is possible to avoid damaging the electronic components during the debugging process, and at the same time, it is possible to accurately and intuitively observe the state changes of the electronic components during the debugging process through the digital twin models.
[0045] In some embodiments, step 103 includes:
[0046] Step 1031, through the simulation algorithm in the virtual test room, generate simulation models of the electronic components and test equipment according to the actual data.
[0047] Step 1032, through the digital twin algorithm in the virtual test room, process the simulation model to obtain the digital twin model.
[0048] Specifically, when implemented, the virtual test room generates a point cloud map file according to the actual data. Through the 3D modeling algorithm in the virtual test room, simulation models of the electronic components and test equipment are constructed according to the point cloud map file. Among them, the simulation models include the component structures and circuit structures of the electronic components and test equipment.
[0049] Through the digital twin module in the virtual test room, the simulation model is optimized to obtain an optimized model. Through the digital twin module in the virtual test room, the structural information of the electronic components and the parameter information of the test equipment are added to the optimized model to obtain the digital twin model.
[0050] Through the above solution, the virtual test room constructs simulation models of the electronic components and test equipment. The simulation models include the important components and circuit layouts of the electronic components and test equipment, and can truly reflect the structures of the electronic components and test equipment. By optimizing the simulation model and adding the structural information of the electronic components and the parameter information of the test equipment to the optimized model, the digital twin model can be accurately obtained, so that the electronic components can be debugged through the digital twin model.
[0051] In some embodiments, step 1031 includes:
[0052] Step 10311, through the virtual test room, generate a point cloud map file according to the actual data.
[0053] Step 10312: Based on the 3D modeling algorithm in the virtual test chamber, construct simulation models of electronic components and test equipment according to the point cloud map file.
[0054] In specific implementation, the virtual test chamber converts actual data into a point cloud map file, which can be viewed, measured, and edited, facilitating the subsequent reproduction of the test environment. Based on the SolidWorks 3D modeling software, construct simulation models of electronic components and test equipment according to the point cloud map file. The simulation models include important components and circuit layouts of electronic components and test equipment, and can truly reflect the structures of electronic components and test equipment. Among them, the simulation models are 3D geometric models.
[0055] In addition, during the process of constructing the simulation models of electronic components and test equipment, behavior modeling and real-time updating are also required. Among them, behavior modeling combines physical laws (such as mechanics) and data-driven models (such as machine learning) to simulate the dynamic behaviors of electronic components and test equipment. Real-time updating dynamically updates the parameters of the simulation models through stream data processing (Apache, Kafka, Flink, etc.) to keep the simulation models synchronized with electronic components and test equipment.
[0056] Through the above solution, the virtual test chamber converts actual data into a point cloud map file that can be viewed, measured, and edited, facilitating the subsequent reproduction of the test environment. The virtual test chamber constructs simulation models of electronic components and test equipment. The simulation models include important components and circuit layouts of electronic components and test equipment, and can truly reflect the structures of electronic components and test equipment.
[0057] In some embodiments, step 1032 includes:
[0058] Step 10321: Through the digital twin module in the virtual test chamber, perform optimization processing on the simulation models to obtain optimized models.
[0059] Step 10322: Through the digital twin module in the virtual test chamber, add the structural information of electronic components and the parameter information of test equipment to the optimized models to obtain digital twin models.
[0060] In specific implementation, import the simulation models into a digital twin system designed based on the underlying logic of the Unreal Engine, perform optimization processing on the simulation models to obtain optimized models. Add the structural information of electronic components and the parameter information of test equipment to the optimized models to obtain digital twin models. The digital twin models are twin models that contain all details of electronic components and test equipment, and can simulate the testing and debugging processes of test equipment in the real environment under working conditions.
[0061] Through the above solution, by optimizing the simulation model and adding the structural information of electronic components and the parameter information of test equipment to the optimized model, a digital twin model can be accurately obtained, so that the electronic components can be debugged through the digital twin model.
[0062] In some embodiments, after step 1032, it further includes:
[0063] Step 1032A, the virtual test room obtains the current operating state of the electronic component at the current moment from the physical test room and maps the current operating state onto the digital twin model.
[0064] Step 1032B, the virtual test room obtains the real-time operating state of the electronic component at the next moment from the physical test room and determines whether the real-time operating state is consistent with the current operating state.
[0065] Step 1032C, in response to determining that the real-time operating state is inconsistent with the current operating state, the digital twin model is updated based on the real-time operating state.
[0066] In specific implementation, the operating states of the electronic components and test equipment in the physical test room are mapped onto the digital twin model in the virtual test room. The server in the communication layer reads the operating states of the electronic components and test equipment, converts the operating signals into signals that can drive or brake the twin digital model to run, and the server in the communication layer sends the operating signals to the digital twin model, enabling the digital twin model to perform the same actions as the electronic components and test equipment, achieving the working effect of virtual-real collaboration.
[0067] By determining whether the real-time operating state is consistent with the current operating state, it is possible to accurately determine whether the state of the electronic component changes at the next moment. When the real-time operating state is inconsistent with the current operating state, it can be accurately determined that the state of the electronic component changes at the next moment, and the digital twin model is updated based on the real-time operating state, so that the digital twin model can follow the state changes of the electronic component, achieving the working effect of virtual-real collaboration.
[0068] The way for the digital twin model in the virtual test room to control the electronic components in the physical test room is as follows: the digital twin model sends the control signal for controlling the electronic components to the physical test room through the server in the communication layer, and the server in the communication layer converts the control signal into a signal that can drive the electronic components, and issues it to the electronic components through the PLC, SCADA system or cloud platform, enabling the electronic components to perform the same actions as the digital twin model.
[0069] Through the above solution, by mapping the current operating state of the electronic components at the current moment onto the digital twin model, the digital twin model is made to perform the same actions as the electronic components and the test equipment, achieving the working effect of virtual-real collaboration. When the real-time operating state is inconsistent with the current operating state, the digital twin model is updated based on the real-time operating state, which can ensure that the actions of the digital twin model are consistent with those of the electronic components.
[0070] In some embodiments, step 105 includes:
[0071] Step 1051, the client visualizes the digital twin model and displays the visualized digital twin model.
[0072] Step 1052, in response to determining that the client has received a debugging instruction, the client extracts debugging parameters from the debugging instruction and sends the debugging parameters to the virtual test room through the server.
[0073] Step 1053, the virtual test room debugs the digital twin model according to the debugging parameters and obtains the model state of the digital twin model after debugging.
[0074] Step 1054, in response to determining that the model state after debugging reaches a preset state, the virtual test room sends the debugging parameters to the physical test room through the server.
[0075] Step 1055, the physical test room debugs the electronic components according to the debugging parameters.
[0076] Specifically, the client visualizes the digital twin model and displays the visualized digital twin model. In this way, the user can intuitively perform real-time operations and monitor the status information through the graphical interface, realizing the mutual feedback between the digital twin model and the user.
[0077] When the client receives a debugging instruction, the client extracts debugging parameters from the debugging instruction and sends the debugging parameters to the virtual test room through the server. The virtual test room debugs the digital twin model according to the debugging parameters. When the model state after debugging reaches a preset state, it means that the debugging of the electronic components can be achieved according to the debugging instruction. The virtual test room sends the debugging parameters to the physical test room through the server, and the physical test room debugs the electronic components according to the debugging parameters. Among them, the preset state is the model state after debugging the digital twin model of the electronic components set in advance.
[0078] The electronic components are virtually debugged through the digital twin model. By changing the input parameters of the digital twin model (input voltage, input current, etc.), the model state of the digital twin model of the electronic components is virtually debugged. The debugging parameters are optimized through virtual output. The optimized debugging parameters are used as the basis for debugging the electronic components and fed back to the electronic components in the physical test room through the server.
[0079] Through the above solution, the user end visualizes the digital twin model and displays the visualized digital twin model. In this way, the user can intuitively perform real-time operations and monitor status information in real time through the graphical interface, realizing mutual feedback between the digital twin model and the user. The virtual test room debugs the digital twin model according to the debugging parameters. When the model state after debugging reaches the preset state, the virtual test room sends the debugging parameters to the physical test room through the server.
[0080] In some embodiments, the communication layer further includes a database;
[0081] After step 101, the method further includes:
[0082] Step 101a: convert the actual data into actual data in a preset format, and store the actual data in the preset format into the database.
[0083] After step 103, the method further includes:
[0084] Step 103a: extract and process the digital twin model to obtain simulation data and state parameters.
[0085] Step 103b: convert the digital twin model, the simulation data and the state parameters into model data in a preset format, and store the model data in the preset format in the database.
[0086] In the specific implementation, the actual data (basic data and status data) of the electronic components in the physical test room are converted into a unified format through a unified interface specification, and the actual data in the unified format is encapsulated in the database of the communication layer. Then, the integrated module port of the Unreal Engine is used to achieve interconnection and communication with the server. By opening up the circular communication between "physical test room-server" and "virtual test room-server", data transmission and information interaction from the physical test room to the virtual test room are realized, thereby realizing the real-time simulation and monitoring functions of the digital twin model.
[0087] After the physical test room sends the actual data to the communication layer, the communication layer converts the actual data into actual data in a preset format, and stores the actual data in the preset format into a database.
[0088] After the virtual test room sends the digital twin model to the communication layer, the communication layer extracts and processes the digital twin model to obtain simulation data and status data, converts the digital twin model, simulation data, and status data into model data in a preset format, and stores the model data in the preset format in the database.
[0089] Through the above solution, by converting the actual data of electronic components into actual data in a preset format, it is convenient to uniformly store the actual data in the preset format in the database, facilitating data transmission and information interaction between the physical test room and the virtual test room, thereby realizing the real-time simulation and monitoring functions of the digital twin model. By converting the digital twin model, simulation data, and status parameters into model data in a preset format, it is convenient to uniformly store the model data in the preset format in the database, facilitating data transmission and information interaction between the physical test room and the virtual test room, thereby realizing the real-time simulation and monitoring functions of the digital twin model.
[0090] Through the above embodiments, the physical test room collects the actual data of electronic components and testing equipment, and sends the actual data to the communication layer. The communication layer sends the actual data to the virtual test room through the server. The virtual test room generates digital twin models of electronic components and testing equipment according to the actual data, and sends the digital twin models to the communication layer. The communication layer sends the digital twin models to the user terminal through the server. The user terminal debugs the electronic components through the digital twin model according to the received debugging instructions. In this way, by constructing digital twin models of electronic components and testing equipment and debugging the electronic components through the digital twin models, it is possible to avoid damaging the electronic components during the debugging process, and at the same time, it is possible to accurately and intuitively observe the state changes of the electronic components during the debugging process through the digital twin models.
[0091] It should be noted that the embodiments of the present disclosure can also be further described in the following ways:
[0092] The present disclosure proposes an electronic component test program debugging platform, which can solve the drawbacks in the traditional test program debugging process of electronic components and improve the test efficiency and quality.
[0093] To achieve the above-mentioned invention objectives, the present disclosure provides an electronic component test program debugging platform, which realizes mapping the debugging process of the electronic component test program in the physical space to the virtual debugging platform constructed based on digital twin. Through the virtual debugging platform, real-time control of the test program debugging process is achieved, with visualization, digitization, and comprehensiveness as the main construction lines, and virtual test scenarios and precise feedback as the implementation paths. A visual electronic component virtual debugging platform is constructed through Unreal Engine, data collection, interconnection, data analysis, etc., to obtain underlying information such as the measured values of component test parameters and the line connection status, and the digital twin technology is used to realize the full-process control of the component debugging process.
[0094] Embodiment 1 Figure 2 is a schematic diagram of the structure of the virtual debugging platform according to an embodiment of the present disclosure. As Figure 2 shown, the virtual debugging platform architecture mainly includes an experimental room layer, a communication layer, and a service layer.
[0095] Experimental room layer: Realize functions such as reproduction, simulation, optimization, and decision-making of production testing, debugging, etc. in the experimental room in the virtual space.
[0096] Communication layer: Realize data transmission and information interaction from the physical experimental room to the virtual experimental room.
[0097] Service layer: Help users remotely master the production testing and debugging dynamics of the experimental room and reasonably optimize the allocation of resources.
[0098] To make the technical solutions and advantages of the present disclosure clearer, the technical solutions in Embodiment 1 of the present disclosure are described clearly and completely.
[0099] Step S1: Collect data such as the actual size, appearance, and position of the test equipment and electronic components in the actual scenario to generate a point cloud map file that can be viewed, measured, and edited, facilitating the subsequent reproduction of the test environment. Based on the collected data, a geometric model is constructed using Solidworks 3D modeling software. The geometric model should include all important components, circuit layouts, etc., to truly reflect the structure of the physical test equipment and electronic components. In addition to physical modeling, behavior modeling and real-time updating are also required. Among them, behavior modeling combines physical laws (such as mechanics) and data-driven models (such as machine learning) to simulate the dynamic behavior of the entity device; real-time updating dynamically updates the model parameters through stream data processing (Apache, Kafka, Flink, etc.) to keep the model synchronized with the entity device.
[0100] Step S2: Import the three-dimensional model into the digital twin system (based on the underlying logic design of the Unreal Engine) and optimize the three-dimensional model. At the same time, input information such as the design parameters of the physical test equipment and the structural design of the electronic components into the twin system, and create a digital twin model containing all the details in the twin system; wherein, the digital twin model simulates the testing and debugging process of the test equipment in a real environment when in working condition.
[0101] Step S3: Convert the various types of basic data and status data in the physical test production factors into a unified format through unified interface specifications, and encapsulate them in a unified format in servers such as cloud databases. Then use the integrated module port of the Unreal Engine to communicate with the server. By opening up the circular communication between "physical test room-server" and "virtual test room-server", data transmission and information interaction from the physical test room to the virtual test room are realized, thereby realizing the real-time simulation and monitoring functions of the digital twin.
[0102] The specific virtual-real mapping relationship of the digital twin system is as follows:
[0103] 1. Map the operating status of the physical equipment in the physical test room to the twin model of the corresponding virtual test room: The physical equipment communication server reads the equipment operation signal stored by the cloud server through the data acquisition module, converts it into a signal that can drive or brake the operation of the twin model, and then sends it to the digital twin system through the communication interface, so that the twin model can perform the same action as the physical equipment, achieving the effect of virtual and real collaborative work.
[0104] 2. The way the twin model of the virtual test room controls the physical equipment in the physical test room: the twin model sends the control signal of the physical equipment to the physical equipment communication server in the physical test room through the cloud database and other servers, and converts it into a signal that can drive the physical equipment. It is then sent to the physical equipment through the PLC, SCADA system or cloud platform, allowing the physical equipment to perform the same actions as the twin model.
[0105] The digital twin system test program debugging working status is as follows:
[0106] Perform virtual debugging through the digital twin model in the digital twin system; virtually debug the digital twin model status of the electronic components by changing the input parameters (voltage, current, etc.) of the digital twin model of the electronic components, optimize the debugging parameters through virtual output, and use the optimized parameter process as the basis for debugging the physical components; and feedback to the physical device through the server.
[0107] Embodiment 2, Figure 3 FIG. 1 is a schematic diagram of the structure of the electronic component test program debugging system according to an embodiment of the present disclosure. Figure 3As shown in the figure, on the basis of Embodiment 1, the present disclosure further provides an electronic component test program debugging system, which includes a data acquisition module, a database module, an algorithm module, a modeling and simulation module, and a human-computer interaction module. Among them, each module communicates with each other to share data.
[0108] The data acquisition module obtains the real-time data of the physical object to provide high-precision physical entity information for the modeling and simulation module. Then, the advanced algorithm of the algorithm module is used to extract and optimize the data, and then a high-fidelity digital twin model is constructed to realize the interconnection of the "physical-virtual" space.
[0109] The database module stores and manages data, including but not limited to past historical data, real-time collected data, and various optimization status information of the digital twin model using these data. Among them, the data includes not only the data collected in the physical test room, but also various data generated by simulation in the virtual test room.
[0110] The algorithm module is responsible for data processing and data analysis. By comparing the actual data and the simulation data, it corrects the simulation optimization under the digital twin model to improve the fidelity of the model, and then improves the performance of the debugging system.
[0111] The modeling and simulation module is mainly responsible for establishing the digital twin models of the test equipment and the electronic components to be tested, and optimizing and adjusting according to the feedback of the algorithm model.
[0112] The human-computer interaction module is used to visualize the digital twin body data. The operator can directly perform real-time operations and monitor the status information through the graphical interface, realizing the mutual feedback between the digital twin body and the operator.
[0113] Through the above embodiments, the electronic component test program debugging platform of the present disclosure uses digital technology to construct a digital twin body for the electronic component test environment in the virtual world, and is interconnected with the real world through information technology and the digital twin platform, exchanging data in real time, and realizing the integration and feedback of the twin project and the physical project. The electronic component test program debugging platform can monitor the self-state of the electronic component in real time to prevent device damage caused by operation errors. It can effectively reduce the phenomenon of device damage caused by the operation errors of developers, and can accurately and intuitively observe the change of the self-state of the electronic component during the debugging or testing process. Compared with the traditional machine test and debugging, it can directly see the internal state of the electronic component and can directly display the settings and data of the test program on one interface. It can remotely debug the test program without being limited to the physical test machine. It is the first time to effectively combine digital twin technology in the professional field of electronic components, which can save costs for electronic component testing and program debugging.
[0114] It should be noted that the method of the embodiments of the present disclosure can be executed by a single device, such as a computer or a server. The method of this embodiment can also be applied to a distributed scenario and completed by multiple devices cooperating with each other. In such a distributed scenario, one of the multiple devices can only execute one or more steps of the method of the embodiments of the present disclosure, and these multiple devices will interact with each other to complete the described method.
[0115] It should be noted that some embodiments of the present disclosure have been described above. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be executed in a different order from those in the above embodiments and still achieve the desired results. Additionally, the processes depicted in the figures do not necessarily require the specific order or sequential order shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0116] Based on the same inventive concept, corresponding to the method of any of the above embodiments, the present disclosure also provides a debugging system for electronic components.
[0117] Reference Figure 4 , the debugging system for electronic components, the system includes an experimental layer 401, a communication layer 402, and a service layer 403; the experimental layer 401 includes a physical test room and a virtual test room; the communication layer 402 includes a server; the service layer 403 includes a client;
[0118] The physical test room is configured to collect the actual data of the electronic components and the test equipment and send the actual data to the communication layer 402;
[0119] The communication layer 402 is configured to send the actual data to the virtual test room through the server;
[0120] The virtual test room is configured to generate a digital twin model of the electronic components and the test equipment according to the actual data and send the digital twin model to the communication layer 402;
[0121] The communication layer 402 is configured to send the digital twin model to the client through the server;
[0122] The client is configured to debug the test program in the digital twin model according to the received debugging instruction.
[0123] In some embodiments, the virtual test room includes:
[0124] The first generation module is configured to generate simulation models of electronic components and test equipment according to the actual data through a simulation algorithm in the virtual test chamber;
[0125] The second generation module is configured to process the simulation model through a digital twin algorithm in the virtual test chamber to obtain a digital twin model.
[0126] In some embodiments, the first generation module is specifically configured to:
[0127] Generate a point cloud map file according to the actual data through the virtual test chamber;
[0128] Construct simulation models of electronic components and test equipment according to the point cloud map file through a 3D modeling algorithm in the virtual test chamber.
[0129] In some embodiments, the second generation module is specifically configured to:
[0130] Optimize the simulation model through a digital twin module in the virtual test chamber to obtain an optimized model;
[0131] Add the structural information of the electronic component and the parameter information of the test equipment to the optimized model through a digital twin module in the virtual test chamber to obtain a digital twin model.
[0132] In some embodiments, after processing the simulation model through the digital twin algorithm in the virtual test chamber to obtain a digital twin model, the virtual test chamber is further configured to:
[0133] The virtual test chamber obtains the current operating state of the electronic component at the current moment from the physical test chamber and maps the current operating state to the digital twin model;
[0134] The virtual test chamber obtains the real-time operating state of the electronic component at the next moment from the physical test chamber and determines whether the real-time operating state is consistent with the current operating state;
[0135] In response to determining that the real-time operating state is inconsistent with the current operating state, update the digital twin model based on the real-time operating state.
[0136] In some embodiments, the client is specifically configured to:
[0137] Visualize the digital twin model and display the visualized digital twin model;
[0138] In response to determining that the client has received a debugging instruction, the client extracts debugging parameters from the debugging instruction and sends the debugging parameters to the virtual test room through the server;
[0139] The virtual test room debugs the digital twin model according to the debugging parameters and obtains the model state of the digital twin model after debugging;
[0140] In response to determining that the model state after debugging reaches a preset state, the virtual test room sends the debugging parameters to the physical test room through the server; for the physical test room to debug the electronic components according to the debugging parameters.
[0141] In some embodiments, the communication layer further includes a database;
[0142] After sending the actual data to the communication layer, it further includes:
[0143] Converting the actual data into actual data in a preset format and storing the actual data in the preset format in the database;
[0144] After sending the digital twin model to the communication layer, it further includes;
[0145] Performing extraction processing on the digital twin model to obtain simulation data and state parameters;
[0146] Converting the digital twin model, the simulation data, and the state parameters into model data in a preset format and storing the model data in the preset format in the database.
[0147] For the convenience of description, when describing the above device, it is divided into various modules according to functions and described separately. Of course, when implementing the present disclosure, the functions of each module can be implemented in the same or multiple software and / or hardware.
[0148] The device in the above embodiment is used to implement the corresponding debugging method of the electronic components in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated here.
[0149] Based on the same inventive concept, corresponding to the method in any of the above embodiments, the present disclosure further provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, and when the processor executes the program, it implements the debugging method of the electronic components in any of the above embodiments.
[0150] Figure 5Fig. shows a more specific schematic diagram of the hardware structure of the electronic device provided in this embodiment. The device may include: a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. Among them, the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040 are communicatively connected to each other inside the device through the bus 1050.
[0151] The processor 1010 can be implemented in the form of a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, etc., and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.
[0152] The memory 1020 can be implemented in the form of a ROM (Read Only Memory), a RAM (Random Access Memory), a static storage device, a dynamic storage device, etc. The memory 1020 can store an operating system and other application programs. When implementing the technical solutions provided in the embodiments of this specification through software or firmware, the relevant program codes are stored in the memory 1020 and are called and executed by the processor 1010.
[0153] The input / output interface 1030 is used to connect to an input / output module to implement information input and output. The input / output module can be configured as a component in the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Among them, the input device can include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device can include a display, a speaker, a vibrator, an indicator light, etc.
[0154] The communication interface 1040 is used to connect to a communication module (not shown in the figure) to implement communication interaction between this device and other devices. Among them, the communication module can implement communication in a wired manner (such as USB (Universal Serial Bus), network cable, etc.) or in a wireless manner (such as mobile network, WIFI (Wireless Fidelity), Bluetooth, etc.).
[0155] The bus 1050 includes a path for transmitting information between various components of the device (such as the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040).
[0156] It should be noted that although the above device only shows the processor 1010, the memory 1020, the input / output interface 1030, the communication interface 1040, and the bus 1050, in the specific implementation process, the device may also include other components necessary for normal operation. In addition, those skilled in the art can understand that the above device may also only include the components necessary to implement the solution of the embodiments of this specification, and does not necessarily include all the components shown in the figure.
[0157] The electronic device of the above embodiment is used to implement the debugging method of the corresponding electronic components in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated here.
[0158] Based on the same inventive concept, corresponding to the method of any of the above embodiments, the present disclosure also provides a non-transitory computer-readable storage medium storing computer instructions for causing the computer to execute the debugging method of the electronic components as described in any of the foregoing embodiments.
[0159] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. The information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory, or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD), or other optical storage, magnetic cassette tapes, magnetic disk storage, or other magnetic storage devices, or any other non-transmission medium that can be used to store information accessible by a computing device.
[0160] The computer instructions stored in the storage medium of the above embodiment are used to cause the computer to execute the debugging method of the electronic components as described in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be elaborated here.
[0161] Based on the same inventive concept, corresponding to the method of any of the above embodiments, the present application also provides a computer program product including computer program instructions, which when run on a computer, cause the computer to execute the debugging method of the electronic components as described in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be elaborated here.
[0162] It is understandable that before using the technical solutions of the various embodiments of the present disclosure, the types, usage scopes, usage scenarios, etc. of the personal information involved will be informed to the user in an appropriate manner, and the user's authorization will be obtained.
[0163] For example, when responding to receiving an active request from the user, a prompt message is sent to the user to clearly prompt the user that the operation requested by the user will require obtaining and using the user's personal information. Thus, the user can autonomously choose whether to provide personal information to software or hardware such as an electronic device, an application program, a server, or a storage medium that performs the operations of the technical solutions of the present disclosure according to the prompt message.
[0164] As an optional but non-limiting implementation manner, the way of sending a prompt message to the user in response to receiving an active request from the user can be, for example, in the form of a pop-up window, and the prompt message can be presented in text in the pop-up window. In addition, the pop-up window can also carry selection controls for the user to choose "agree" or "disagree" to provide personal information to the electronic device.
[0165] It is understandable that the above process of notifying and obtaining the user's authorization is only illustrative and does not constitute a limitation on the implementation manner of the present disclosure. Other ways that meet relevant laws and regulations can also be applied to the implementation manner of the present disclosure.
[0166] Those of ordinary skill in the art should understand that the discussion of any of the above embodiments is only exemplary and is not intended to imply that the scope of the present disclosure is limited to these examples; under the concept of the present disclosure, the technical features between the above embodiments or different embodiments can also be combined, and the steps can be implemented in any order, and there are many other variations in different aspects of the embodiments of the present disclosure as described above. For the sake of brevity, they are not provided in detail.
[0167] In addition, for the sake of simplifying the description and discussion, and in order not to make the embodiments of the present disclosure difficult to understand, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. In addition, the device can be shown in the form of a block diagram to avoid making the embodiments of the present disclosure difficult to understand, and this also takes into account the fact that the details of the implementation manner of these block diagram devices highly depend on the platform on which the embodiments of the present disclosure will be implemented (that is, these details should be completely within the understanding scope of those skilled in the art). In the case of elaborating specific details (such as circuits) to describe the exemplary embodiments of the present disclosure, it is obvious to those skilled in the art that the embodiments of the present disclosure can be implemented without these specific details or with changes to these specific details. Therefore, these descriptions should be considered illustrative rather than restrictive.
[0168] Although the present disclosure has been described in connection with specific embodiments thereof, many alternatives, modifications, and variations of these embodiments will be apparent to those of ordinary skill in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.
[0169] Embodiments of the present disclosure are intended to cover all such alternatives, modifications, and variations that fall within the broad scope of the present disclosure. Accordingly, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present disclosure should be included within the protection scope of the present disclosure.
Claims
1. A debugging method for electronic components, which is applied to a test program debugging system for electronic components; the system includes a test layer, a communication layer, and a service layer; the test layer includes a physical test room and a virtual test room; The communication layer includes a server; the service layer includes a client; characterized in that, The method includes: The physical test room collects the actual data of electronic components and test equipment, and sends the actual data to the communication layer; The communication layer sends the actual data to the virtual test room through the server; The virtual test room generates digital twin models of electronic components and test equipment according to the actual data, and sends the digital twin models to the communication layer; The communication layer sends the digital twin models to the client through the server; The client debugs the electronic components through the digital twin model according to the received debugging instructions.
2. The method according to claim 1, wherein The virtual test room generates digital twin models of electronic components and test equipment according to the actual data, including: Generating simulation models of electronic components and test equipment according to the actual data through the simulation algorithm in the virtual test room; Processing the simulation models through the digital twin algorithm in the virtual test room to obtain digital twin models.
3. The method according to claim 2, characterized in that, The generating simulation models of electronic components and test equipment according to the actual data through the simulation algorithm in the virtual test room includes: Generating a point cloud map file according to the actual data through the virtual test room; Constructing simulation models of electronic components and test equipment according to the point cloud map file through the 3D modeling algorithm in the virtual test room.
4. The method according to claim 2, wherein The processing the simulation models through the digital twin algorithm in the virtual test room to obtain digital twin models includes: Optimizing the simulation models through the digital twin module in the virtual test room to obtain optimized models; Adding the structural information of electronic components and the parameter information of test equipment to the optimized models through the digital twin module in the virtual test room to obtain digital twin models.
5. The method according to claim 2, characterized in that After the processing the simulation models through the digital twin algorithm in the virtual test room to obtain digital twin models, it further includes: The virtual test room obtains the current operating state of the electronic components at the current moment from the physical test room, and maps the current operating state to the digital twin models; The virtual test room obtains the real-time operating state of the electronic components at the next moment from the physical test room, and determines whether the real-time operating state is consistent with the current operating state; In response to determining that the real-time operating state is inconsistent with the current operating state, updating the digital twin models based on the real-time operating state.
6. The method according to claim 1, wherein The client debugs the electronic components through the digital twin model according to the received debugging instructions, including: The client performs visualization processing on the digital twin models, and displays the digitally twin models after visualization processing; In response to determining that the client receives debugging instructions, the client extracts debugging parameters from the debugging instructions, and sends the debugging parameters to the virtual test room through the server; The virtual test room debugs the digital twin model according to the debugging parameters and obtains the model state of the digital twin model after debugging; In response to determining that the model state after debugging reaches a preset state, the virtual test room sends the debugging parameters to the physical test room through the server; The physical test room debugs the electronic components according to the debugging parameters.
7. The method according to claim 1, characterized in that, The communication layer further includes a database; After sending the actual data to the communication layer, it further includes: Converting the actual data into actual data in a preset format and storing the actual data in the preset format in the database; After sending the digital twin model to the communication layer, it further includes; Performing extraction processing on the digital twin model to obtain simulation data and state parameters; Converting the digital twin model, the simulation data, and the state parameters into model data in a preset format and storing the model data in the preset format in the database.
8. A test program debugging system for electronic components, characterized in that, The system includes a test layer, a communication layer, and a service layer; the test layer includes a physical test room and a virtual test room; the communication layer includes a server; the service layer includes a client; The physical test room is configured to collect the actual data of the electronic components and the test equipment and send the actual data to the communication layer; The communication layer is configured to send the actual data to the virtual test room through the server; The virtual test room is configured to generate a digital twin model of the electronic components and the test equipment according to the actual data and send the digital twin model to the communication layer; The communication layer is configured to send the digital twin model to the client through the server; The client is configured to debug the test program in the digital twin model according to the received debugging instruction.
9. An electronic device, characterized in that, It includes a memory, a processor, and a computer program stored on the memory and running on the processor. When the processor executes the program, it implements the method according to any one of claims 1 to 7.
10. A non-transitory computer-readable storage medium, characterized in that, The non-transitory computer-readable storage medium stores computer instructions for causing a computer to execute the method according to any one of claims 1 to 7.