Device simulation parameter matching degree detection method and device, electronic equipment and medium

Abstract

The invention provides a device simulation parameter matching degree detection method and device, electronic equipment and a medium. The detection method comprises the following steps: extracting device parameter definition information of all devices in each model file according to the model file of at least one piece of target simulation software; generating circuit schematic diagrams of all devices in the parameterized cell library according to the library file of the parameterized cell library; generating a pre-simulation netlist corresponding to the target simulation software according to the schematic circuit diagram; extracting device simulation parameter information of all devices in the parameterized unit library from the front simulation netlist; and for each piece of target simulation software, according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, obtaining a detection result of the parameterized unit library corresponding to the target simulation software. According to the method, the detection efficiency can be remarkably improved, the accuracy of device simulation parameters in the parameterized unit library can be improved, and then the timeliness of circuit design can be improved.

Description

Technical Field

[0001] The present invention relates to the field of semiconductor technology, and particularly to a method, device, electronic device and readable storage medium for detecting the matching degree of device simulation parameters. Background Art

[0002] PDK (Process Design Kit) is a communication bridge between semiconductor manufacturing and design, and is the basis for designers to design circuits and layouts. When designers perform circuit design, they will go through the pre-simulation process. If the pre-simulation results meet the circuit design specifications, they will proceed with layout design; otherwise, they will modify the circuit design until the pre-simulation results meet the circuit design specifications. The pre-simulation results of the circuit are generated by combining the simulation parameters in the pre-simulation netlist of the parameterized cell library (Pcell library) with the SPICE (Simulation Program with Integrated Circuit Emphasis, a circuit simulation software, and the current mainstream circuit simulation software includes Hspice and Spectre, and foundries usually provide Hspice and Spectre model files) model. If the number of pre-simulation parameters set in the parameterized cell library is less than the parameters required to be set for the devices in the SPICE model file, the simulation will use the default parameter settings in the SPICE model file, resulting in inaccurate pre-simulation results and affecting the circuit design efficiency. On the other hand, with the continuous reduction of the process size of integrated circuits, more and more effects affecting circuit performance are emerging, such as the LOD effect (Length of Diffusion effect, also known as the STI stress effect), the WPE effect (well proximity effect), etc. Each effect will introduce 3-4 simulation parameters. Each device needs to calculate more than a dozen parameters, and each device in advanced processes needs to calculate 20-30 parameters. Further, the number of device types included in a set of parameterized cell libraries is generally hundreds, and the BCD (Bipolar-CMOS-DMOS, a monolithic integrated process technology that simultaneously includes the three processes of Bipolar, CMOS, and DMOS) process has 200-300 types; usually, PDK provides at least two mainstream tool models, such as Hspice and Spectre. Therefore, there are approximately up to 3000-6000 device parameters that need to be checked in a set of parameterized cell libraries.

[0003] In the prior art, the inspection of the matching of device simulation parameters in a parameterized cell library is often carried out by manual visual inspection: First, use the parameterized cell library and use a simulation tool to generate the pre-simulation netlist of the device, and then find the corresponding device in the SPICE model file, and manually check whether there is any missing device simulation parameters in the pre-simulation netlist compared with the device parameter definitions in the SPICE model file. However, for a huge amount of data of thousands of device parameters, the traditional manual visual inspection method not only requires high human and time costs and is inefficient, but also is very easy to miss or mis-detect, affecting the accuracy of the circuit pre-simulation results, and further affecting the timeliness of circuit design.

[0004] It should be noted that the information disclosed in the background art of this invention is only intended to deepen the understanding of the general background art of this invention, and should not be regarded as an admission or any form of implication that this information constitutes the prior art known to those skilled in the art. Summary of the Invention

[0005] The purpose of this invention is to provide a method, device, electronic device and readable storage medium for detecting the matching degree of device simulation parameters, aiming at one or more problems such as easy omission or mis-detection and poor timeliness in the prior art when using manual visual inspection to detect the matching degree of device simulation parameters. This invention can not only significantly improve the detection efficiency, but also improve the accuracy of device simulation parameters in the parameterized cell library, and further improve the timeliness of circuit design.

[0006] To achieve the above purpose, this invention is realized through the following technical solutions. A method for detecting the matching degree of device simulation parameters in a parameterized cell library is used to detect the simulation parameters of devices in the parameterized cell library. The detection method includes:

[0007] Receiving model files of at least one target simulation software, and extracting the device parameter definition information of all devices in each of the model files; generating circuit schematics of all devices in the parameterized cell library according to the library file of the parameterized cell library; generating a pre-simulation netlist corresponding to the target simulation software according to the circuit schematics; extracting the device simulation parameter information of all devices in the parameterized cell library from the pre-simulation netlist; for each target simulation software, obtaining the detection result of the parameterized cell library corresponding to the target simulation software according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library.

[0008] Optionally, for each of the target simulation software, after obtaining the detection result of the parameterized cell library corresponding to the target simulation software, the detection method further includes: determining whether there is a device in the detection result whose device parameter simulation information is inconsistent with the device parameter definition information of the target simulation software; if so, modifying the device simulation parameters of all inconsistent devices in the parameterized cell library, and returning to execute the relevant steps from generating the pre-simulation netlist until determining whether there is a device whose device parameter simulation information is inconsistent with the device parameter definition information, until the device parameter simulation information in the parameterized cell library is consistent with the device parameter definition information of the target simulation software, and completing the detection of the matching degree of the device simulation parameters.

[0009] Optionally, the device parameter definition information includes the device name, device parameters, the name of the target simulation software, and the line number of the device in the model file of the target simulation software; the device simulation parameter information includes the device name and device parameters of the device in the parameterized cell library; for each of the target simulation software: after extracting the device parameter definition information of all devices in the model file of the target simulation software, the detection method further includes: storing the device parameter definition information in a first storage area; after extracting the device simulation parameter information of all devices in the parameterized cell library, the detection method further includes: storing the device simulation parameter information in a second storage area.

[0010] Optionally, for each of the target simulation software, obtaining a detection result according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library includes: for each of the target simulation software, detecting whether the device name, device type, and device parameters of the device simulation parameter information in the second storage area are consistent with the device parameter definition information in the first storage area, so as to obtain the detection result of the parameterized cell library corresponding to the target simulation software.

[0011] Optionally, the detection result includes: the device name of the device, the line number of the device in the model file of the corresponding target simulation software, and the parameter comparison result; the parameter comparison result includes passing the detection and failing the detection, and the parameter set of all devices that fail the detection.

[0012] Optionally, the detection method further includes: classifying and outputting the detection result according to passing the detection and failing the detection.

[0013] Optionally, the target simulation software includes Hspice and Spectre.

[0014] To achieve the above object, the present invention further provides a device simulation parameter matching degree detection device for detecting the simulation parameters of devices in a parameterized cell library. The detection device includes: an interaction module for obtaining the library file of the parameterized cell library, the model files of at least one target simulation software, and the storage path for the detection results; an execution module for implementing the device simulation parameter matching degree detection method described in any one of the above according to the library file and the model files, and storing the detection results in the storage path for the detection results.

[0015] To achieve the above object, the present invention further provides an electronic device. The electronic device includes a processor and a memory. A computer program is stored on the memory. When the computer program is executed by the processor, the device simulation parameter matching degree detection method described in any one of the above is implemented.

[0016] To achieve the above object, the present invention further provides a readable storage medium. A computer program is stored in the readable storage medium. When the computer program is executed by a processor, the device simulation parameter matching degree detection method described in any one of the above is implemented.

[0017] Compared with the prior art, a device simulation parameter matching degree detection method, device, electronic device, and readable storage medium provided by the present invention have the following advantages: In the device simulation parameter matching degree detection method provided by the present invention, first, the device parameter definition information of all devices in each of the model files of at least one target simulation software is extracted, which not only realizes the automatic extraction of the parameter information of all devices in the model files of multiple target simulation software, but also lays a good foundation for detecting whether the device parameters in the parameterized cell library match the corresponding target simulation software; then, the circuit schematic diagrams of all devices in the parameterized cell library are generated according to the library file of the parameterized cell library, the pre-simulation netlist corresponding to the target simulation software is generated according to the circuit schematic diagrams, and the device simulation parameter information of all the devices in the parameterized cell library is extracted from the pre-simulation netlist, realizing the automatic extraction of the parameter information of all devices in the parameterized cell library and laying a good foundation for improving the detection efficiency of the matching degree of device parameters in the parameterized cell library; finally, for each of the target simulation software, the detection result of the parameterized cell library corresponding to the target simulation software is obtained according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library, thereby realizing the automatic detection of the device simulation parameter matching degree. It can be seen that the present invention can not only significantly improve the detection efficiency, but also improve the accuracy of the device simulation parameters in the parameterized cell library, and further improve the timeliness of circuit design.

[0018] Since the device simulation parameter matching degree detection device, electronic device, and readable storage medium provided by the present invention belong to the same inventive concept as the device simulation parameter matching degree detection method provided by the present invention, therefore, the device simulation parameter matching degree detection device, electronic device, and readable storage medium provided by the present invention at least have all the advantages of the device simulation parameter matching degree detection method provided by the present invention. For the detailed content of the beneficial effects of the device simulation parameter matching degree detection device, electronic device, and readable storage medium provided by the present invention, please refer to the relevant descriptions of the beneficial effects of the device simulation parameter matching degree detection method provided by the present invention above. Here, it will not be elaborated one by one. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic overall flowchart of the device simulation parameter matching degree detection method provided by the first embodiment of the present invention.

[0020] Figure 2 Schematically shows Figure 1 An example diagram of a part of the device parameter definition information obtained in step S1 in the first storage area.

[0021] Figure 3 Schematically shows Figure 1 An example diagram of a part of the circuit schematic diagram obtained in step S2 in.

[0022] Figure 4 Schematically shows Figure 1 An example diagram of a part of the pre-simulation netlist obtained in step S3 in.

[0023] Figure 5 Schematically shows Figure 1 An example diagram of a part of the device simulation parameter information obtained in step S4 in the second storage area.

[0024] Figure 6 Schematically shows Figure 1 An example diagram of a part of the detection result obtained in step S5 in.

[0025] Figure 7 It is a structural block diagram of the device simulation parameter matching degree detection device provided by the second embodiment of the present invention.

[0026] Figure 8 It is a schematic diagram of the operation interface of the interaction module of a specific example using the device simulation parameter matching degree detection device provided by the present invention.

[0027] Figure 9 It is a schematic block diagram of the electronic device provided by the third embodiment of the present invention.

[0028] Among them, the reference numerals are as follows: interaction module - 110, execution module - 120; processor - 210, memory - 220, communication interface - 230, communication bus - 240. Detailed implementation manners

[0029] The following further elaborates in detail on the device simulation parameter matching degree detection method, device, electronic device, and readable storage medium proposed by the present invention with reference to the accompanying drawings. According to the following description, the advantages and features of the present invention will be clearer. It should be noted that the accompanying drawings are in a very simplified form and all use non-precise scales, only for conveniently and clearly assisting in explaining the purpose of the embodiments of the present invention. In order to make the purpose, features, and advantages of the present invention more obvious and understandable, please refer to the accompanying drawings. It should be known that the structures, scales, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those skilled in this technology to understand and read, and are not used to limit the limiting conditions for the implementation of the present invention. Any modification of the structure, change in the proportional relationship, or adjustment of the size, in the case of being the same or similar to the effects that the present invention can produce and the purposes that can be achieved, should still fall within the scope covered by the technical content disclosed in the present invention. The specific design features of the present invention disclosed herein, such as specific dimensions, directions, positions, and shapes, will be partially determined by the specific application and usage environment. Also, in the embodiments described below, sometimes the same reference numeral is commonly used between different drawings to represent the same part or parts having the same function, and the repeated description thereof is omitted. In this specification, similar reference numerals and letters are used to represent similar items. Therefore, once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings. Additionally, if the method described herein includes a series of steps, and the order of these steps presented herein is not necessarily the only order in which these steps can be executed, and some of the described steps may be omitted and / or some other steps not described herein may be added to the method.

[0030] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising a..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the element. The singular forms "a", "an" and "the" include plural objects, the term "or" is generally used in the sense of "and / or", the term "several" is generally used in the sense of "at least one", the term "at least two" is generally used in the sense of "two or more", and in addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features.

[0031] The core idea of the present invention is to provide a method, device, electronic device and readable storage medium for detecting the matching degree of device simulation parameters. The present invention can not only significantly improve the detection efficiency, but also improve the accuracy of device simulation parameters in the parameterized cell library, and further improve the timeliness of circuit design.

[0032] To achieve the above idea, the first embodiment of the present invention provides a method for detecting the matching degree of device simulation parameters, which is used to detect the simulation parameters of devices in a parameterized cell library. Specifically, please refer to Figure 1 , Figure 1 which is the overall flowchart of the method for detecting the matching degree of device simulation parameters provided in this embodiment. From Figure 1It can be seen that the method for detecting the matching degree of device simulation parameters provided in this embodiment includes the following steps: Step S1: Receive the model files of at least one target simulation software, and extract the device parameter definition information of all devices in each of the model files; Step S2: Generate the circuit schematics of all devices in the parameterized cell library according to the library file of the parameterized cell library; Step S3: Generate a pre-simulation netlist corresponding to the target simulation software according to the circuit schematic; Step S4: Extract the device simulation parameter information of all the devices in the parameterized cell library from the pre-simulation netlist; Step S5: For each of the target simulation software, obtain the detection result of the parameterized cell library corresponding to the target simulation software according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library.

[0033] The method for detecting the matching degree of device simulation parameters provided by the present invention first extracts the device parameter definition information of all devices in each of the model files according to the model files of at least one target simulation software, which not only realizes the automatic extraction of the parameter information of all devices in the model files of multiple target simulation software, but also lays a good foundation for detecting whether the device parameters in the parameterized cell library match the corresponding target simulation software; then generates the circuit schematics of all devices in the parameterized cell library according to the library file of the parameterized cell library, generates a pre-simulation netlist corresponding to the target simulation software according to the circuit schematic, and extracts the device simulation parameter information of all the devices in the parameterized cell library from the pre-simulation netlist, realizing the automatic extraction of the parameter information of all devices in the parameterized cell library and laying a good foundation for improving the detection efficiency of the matching degree of device parameters in the parameterized cell library; finally, for each of the target simulation software, obtain the detection result of the parameterized cell library corresponding to the target simulation software according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library, thereby realizing the automatic detection of the matching degree of device simulation parameters. It can be seen that the present invention can not only significantly improve the detection efficiency, but also improve the accuracy of the device simulation parameters in the parameterized cell library, and further improve the timeliness of circuit design.

[0034] It should be noted that those skilled in the art should be able to understand that the present invention does not make any limitation on the specific quantity and type of the target simulation software. For example, the target simulation software can be one, two or more. Exemplarily, in some preferred embodiments, the target simulation software includes but is not limited to Hspice and Spectre. Among them, Hspice is a classic analog circuit simulation tool, which focuses on describing the circuit model through a circuit netlist; Spectre is also an analog integrated circuit design and simulation tool, which is widely used in the design and verification of CMOS (Metal - Oxide Semiconductor Transistor) analog circuits and mixed - signal circuits, and has a good graphical design interface.

[0035] It can be understood that when the target simulation software is one (such as Hspice), there is a set of device parameter definition information (corresponding to Hspice); when the target simulation software is two (such as Hspice and Spectre), there are two sets of device parameter definition information (for example, one set corresponds to Hspice and the other set corresponds to Spectre). Correspondingly, in step S1, extracting the device parameter definition information of all devices in each of the model files includes extracting the device parameters of all devices in the target simulation software Hspice and the device parameters of all devices in the target simulation software Spectre respectively. For the convenience of understanding the present invention, in this article, the two target simulation software Hspice and Spectre are taken as examples for illustration.

[0036] In addition, the present invention does not overly limit the execution order of step S1 and step S2. For example, in some exemplary embodiments, step S1 can be executed first and then step S2; in some other exemplary embodiments, step S2 can be executed first and then step S1; in other embodiments, step S1 and step S2 can also be executed in parallel.

[0037] Preferably, please continue to refer to Figure 1 , as Figure 1As shown, in some exemplary embodiments, in step S5 for each of the target simulation software, after obtaining the detection result of the parameterized cell library corresponding to the target simulation software, the detection method further includes: step S6: determining whether there is a device in the detection result whose device parameter simulation information is inconsistent with the device parameter definition information of the target simulation software; if so, performing step S7; if not, performing step S8. Step S7: modifying the device simulation parameters of all inconsistent devices in the parameterized cell library, and returning to execute the relevant steps from generating the pre-simulation netlist until determining whether there is a device whose device parameter simulation information is inconsistent with the device parameter definition information (i.e., steps S3 to S6) until the device parameter simulation information in the parameterized cell library is consistent with the device parameter definition information of the target simulation software. Step S8: completing the detection of the matching degree of device simulation parameters.

[0038] Thus, the device simulation parameter matching degree detection method provided by the present invention can further improve the accuracy of device simulation parameters in the parameterized cell library and then improve the timeliness of circuit design by modifying the device simulation parameters of all inconsistent devices in the parameterized cell library and iteratively executing the device simulation parameters of all inconsistent devices in the parameterized cell library. Exemplarily, in some exemplary embodiments, the device parameter definition information includes the device name, device parameters, the name of the target simulation software, and the line number of the device in the model file of the target simulation software; the device simulation parameter information includes the device name and device parameters of the device in the parameterized cell library. Further, for each of the target simulation software: after extracting the device parameter definition information of all devices in the model file of the target simulation software, the detection method further includes: storing the device parameter definition information in a first storage area; after extracting the device simulation parameter information of all devices in the parameterized cell library, the detection method further includes: storing the device simulation parameter information in a second storage area.

[0039] Therefore, the device simulation parameter matching detection method provided by the present invention adopts the device parameter definition information including the device name, device parameters, the name of the target simulation software and the line number of the device in the model file of the target simulation software, and the device simulation parameter information includes the device name of the device in the parameterized unit library and the design method of the device parameters. This not only makes it easier to obtain the detection results according to the device parameter definition information and the device simulation parameter information, but also makes it easier to revise the inconsistent device simulation parameters of the device in the parameterized unit library when there is inconsistency between the device parameter simulation information and the device parameter definition information.

[0040] It should be noted that the present invention does not limit the first storage area and the second storage area. Exemplarily, the first storage area may be a first register, and the second storage area may be a second register.

[0041] In order to more intuitively understand the outputs of each step from step S1 to step S4 in the device simulation parameter matching detection method provided by the present invention. For example, see Figure 2 , Figure 3 , Figure 4 and Figure 5 ,in, Figure 2 It is schematically given Figure 1 An example diagram of a portion of the device parameter definition information obtained in step S1 in the first storage area; Figure 3 It is schematically given Figure 1 An example diagram of a portion of the circuit schematic diagram obtained in step S2; Figure 4 It is schematically given Figure 1 An example diagram of a portion of the contents of the pre-simulation netlist obtained in step S3, Figure 5 It is schematically given Figure 1 An example diagram of a portion of the device simulation parameter information obtained in step S4 in the second storage area. Specifically, Figure 2Among them, "m_n18_4t_rvt" is the device name, "w l sa sb sca scb scc sd as ad pspd nrd nrs nf mr mismod" and "w l sa sb sd as ad ps pd nrd nrs sca scb scc nfmr mismod" are the device parameters of the device m_n18_4t_rvt corresponding to the target simulation software Hspice and Spectre respectively, "hspice_view" and "spectre_view" are the names of the target simulation software Hspice and Spectre respectively, "line_1256" is the line number of the device m_n18_4t_rvt in the model file of the target simulation software Hspice, and "line_2890" is the line number of the device m_n18_4t_rvt in the model file of the target simulation software Spectre. Figure 4 Among them, "m_n18_4t_rvt" is the device name, "w l sa sb sd as ad ps pd nrd nrs nf mr mismod hspice_view" and "w lsa sb sd as ad ps pd nrd nrs sca scb scc nf mr mismod" are the device parameters of the device m_n18_4t_rvt corresponding to the target simulation software Hspice and Spectre respectively, and "hspice_view" and "spectre_view" are the names of the target simulation software Hspice and Spectre respectively.

[0042] Preferably, in some exemplary embodiments, for each of the target simulation software, according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library corresponding to the target simulation software in the parameterized unit library, the detection result is obtained, including: for each of the target simulation software, comparing whether the device name, device type, and device parameters of the device simulation parameter information in the second storage area are consistent with the device parameter definition information in the first storage area to obtain the detection result of the parameterized unit library corresponding to the target simulation software.

[0043] It can be seen that the device simulation parameter matching degree detection method provided by the present invention has clear logic and is easy to implement, and does not require any additional hardware costs.

[0044] Preferably, in some exemplary embodiments, the detection result includes: the device name of the device, the line number of the device in the model file of the corresponding target simulation software, and a parameter comparison result; the parameter comparison result includes the parameter sets of the devices that passed the detection and failed the detection, and all the devices that failed the detection.

[0045] Therefore, the detection result includes the device name, the line number of the device in the model file of the corresponding target simulation software, and the parameter comparison result, and the parameter comparison result includes the parameter set of all devices that failed the detection, which makes it easier for users to quickly locate devices with inconsistent parameters in the parameterized unit library, and lays a good foundation for modifying the device simulation parameters of all inconsistent devices in the parameterized unit library.

[0046] Preferably, in some exemplary embodiments, the detection method further comprises: outputting the detection results according to the categories of passed detection and failed detection, thereby making it easier for users to locate and detect components that have failed detection, thereby further improving detection efficiency.

[0047] In order to more intuitively understand the content of the detection result provided by the device simulation parameter matching degree detection method provided by the present invention in step S5, for example, see Figure 6 , Figure 6 It is schematically given Figure 1 An example diagram of a portion of the detection result obtained in step S5. Figure 6 In the example, hspice_results.cvs is the detection result (detection report file) corresponding to the target simulation software Hspice, and spectre_results.cvs is the detection result (detection report file) corresponding to the target simulation software Spectre. Figure 6 As shown in the figure, all devices that have passed the test are displayed in the "pass" area, and all devices that have not passed the test are displayed in the "fail" area. Figure 6 Taking m_n50_4t_rvt (marked with a dotted box in the figure) as an example, the first column "m_n50_4t_rvt" is the device name, the second column "183" is the line number of the device m_n50_4t_rvt in the model file of the target simulation software Hspice, to facilitate subsequent comparison and correction; the third column "fail" (failed the test) is the parameter comparison result, and the fourth column "sca, scb, scc" are the unmatched parameters.

[0048] It should be noted that although Figure 6The detection results are provided in the.cvs file format and one detection result corresponding to each target simulation software. However, obviously, this is not a limitation of the present invention. In other embodiments, other file formats may also be used to provide the detection results. For example, the.txt format may be used. Further, the detection results of all target simulation software may also be concentrated in the same detection report file.

[0049] The second embodiment of the present invention provides a device simulation parameter matching degree detection device for detecting the simulation parameters of devices in a parameterized cell library. Exemplarily, please refer to Figure 7 , Figure 7 which is a structural block diagram of the device simulation parameter matching degree detection device provided in this embodiment. As can be seen from Figure 7 , the device simulation parameter matching degree detection device provided in this embodiment includes an interaction module 110 and an execution module 120. Exemplarily, the interaction module 110 is used to obtain the library file of the parameterized cell library, the model files of at least one target simulation software, and the detection result storage path; the execution module 120 is used to implement the device simulation parameter matching degree detection method described in any one of the above embodiments according to the library file and the model files, and store the detection results to the detection result storage path. Thus, the device simulation parameter matching degree detection device provided by the present invention includes the interaction module 110, which is convenient for users to use. Further, since the device simulation parameter matching degree detection device provided in this embodiment and the device simulation parameter matching degree detection method provided by the present invention belong to the same inventive concept, the device simulation parameter matching degree detection device provided in this embodiment has at least all the advantages of the device simulation parameter matching degree detection method provided by the present invention. For detailed content, please refer to the relevant description of the beneficial effects of the device simulation parameter matching degree detection method above, and will not be elaborated here one by one.

[0050] Exemplarily, please refer to Figure 8 , Figure 8 which is a schematic diagram of the operation interface of the interaction module of a specific example of using the device simulation parameter matching degree detection device provided by the present invention. Figure 8In [the figure], above the figure's indicated direction, "PDK Instancecheck Tool" schematically gives the name of the device simulation parameter matching degree detection device provided by the present invention, and this name can be set as needed; above the left side of the figure's indicated direction, "PDK_library" (the library file of the parameterized cell library) and "select" above the right side are used to prompt and set the library file of the parameterized cell library. The area between "PDK_library" and "select" is used to display the path of the library file of the parameterized cell library selected by the user; above the upper-middle part of the left side of the figure's indicated direction, "Hspice_File" (the model file of the Hspice simulation software) and "select" above the middle-right part are used to prompt and set the model file of the target simulation software Hspice. The area between "Hspice_File" and "select" is used to display the path of the model file of the target simulation software Hspice selected by the user; above the lower-middle part of the left side of the figure's indicated direction, "Spectre_File" (the model file of the Spectre simulation software) and "select" above the middle-lower part are used to prompt and set the model file of the target simulation software Spectre. The area between "Spectre_File" and "select" is used to display the path of the model file of the target simulation software Spectre provided by the user. Below the left side of the figure's indicated direction, "Run_Directry" (the detection result directory) and "select" below the right side are used to prompt and set the storage path of the detection results. The area between "Run_Directry" and "select" is used to display the storage path of the detection results set by the user; "Run" (execute detection) at the bottom indicates starting the execution module 120 to start performing device simulation parameter matching degree detection.

[0051] To further understand the present invention, in combination with Figure 8 The usage method of the device simulation parameter matching degree detection device provided by the present invention is briefly described as follows:

[0052] First, as Figure 8As shown, the library file of the parameterized cell library is specified through the "select" corresponding to "PDK_library", the model file of the target simulation software Hspice is specified through the "select" corresponding to "Hspice_File", the model file of the target simulation software Hspice is specified through the "select" corresponding to "Hspice_File", the storage path of the detection result is specified through the "select" corresponding to "Run_Directory", and then the detection result is obtained through "Run"; finally, view the detection result (detection report) under the storage path of the detection result specified by "Run_Directory". For the detailed content of the detection result, please refer to the description in the above text regarding Figure 6 . Further, if it is found that Figure 6 there are devices that fail the detection, the above operations can be continued after modifying the device simulation parameters of all inconsistent devices in the parameterized cell library until there are no devices that fail the detection in the detection result (that is, the device parameter simulation information of all devices in the parameterized cell library is consistent with the device parameter definition information of the corresponding devices in the target simulation software).

[0053] Based on the above, it can be seen that the device simulation parameter matching degree detection method provided by the present invention can not only significantly improve the accuracy of device simulation parameters in the parameterized cell library; moreover, relevant statistical data shows that compared with the manual visual inspection method, the device simulation parameter matching degree detection method provided by the present invention can save 99% of the time, significantly improve the detection efficiency, and can greatly save labor and material costs.

[0054] The third embodiment of the present invention provides an electronic device. Exemplarily, please refer to Figure 9 . Figure 9 is the block structure diagram of the electronic device provided in this embodiment. As Figure 9 shown, the electronic device provided in this embodiment includes a processor 210 and a memory 220. A computer program is stored on the memory 220. When the computer program is executed by the processor 210, the device simulation parameter matching degree detection method provided in any of the above embodiments is implemented.

[0055] Since the electronic device provided in this embodiment and the device simulation parameter matching degree detection method provided by the present invention belong to the same inventive concept, therefore, the electronic device provided in this embodiment has at least all the advantages of the device simulation parameter matching degree detection method provided by the present invention. For the detailed content, please refer to the relevant description of the beneficial effects of the device simulation parameter matching degree detection method in the above text, and will not be elaborated here one by one.

[0056] Exemplarily, as Figure 9As shown, the electronic device may further include a communication interface 230 and a communication bus 240. Among them, the processor 210, the communication interface 230, and the memory 220 complete mutual communication through the communication bus 240. For the sake of easy representation, only a thick line is used in the figure, but it does not mean that there is only one bus or one type of bus. The communication interface 230 is used for communication between the above-mentioned electronic device and other electronic devices.

[0057] In the present invention, the so-called processor 210 may be a microcontroller unit (MCU), or may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc. The processor 210 is the control center of the electronic device and connects various parts of the entire electronic device through various interfaces and lines.

[0058] The memory 220 can be used to store the computer program. The processor 210 realizes various functions of the electronic device by running or executing the computer program stored in the memory 220 and calling the data stored in the memory 220.

[0059] The memory 220 may include non-volatile and / or volatile memory. The non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. The volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and Rambus dynamic RAM (RDRAM), etc.

[0060] The fourth embodiment of the present invention provides a readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the method for detecting the matching degree of device simulation parameters described above can be implemented. Since the readable storage medium provided by the present invention and the method for detecting the matching degree of device simulation parameters provided by the present invention belong to the same inventive concept, therefore, the readable storage medium provided by the present invention has at least all the advantages of the method for detecting the matching degree of device simulation parameters provided by the present invention. For the detailed content of the beneficial effects of the readable storage medium provided by the present invention, please refer to the relevant description of the beneficial effects of the method for detecting the matching degree of device simulation parameters provided by the present invention above. Here, it will not be repeated one by one.

[0061] The readable storage medium according to the embodiment of the present invention can adopt any combination of one or more computer-readable media. The readable medium can be a computer-readable signal medium or a computer-readable storage medium. The computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the above. More specific examples (non-exhaustive examples) of the computer-readable storage medium include: an electrical connection having one or more wires, a portable computer hard disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this article, the computer-readable storage medium can be any tangible medium that contains or stores a program, and this program can be used by or in combination with an instruction execution system, apparatus, or device.

[0062] The computer-readable signal medium can include a data signal propagated in a baseband or as part of a carrier wave, in which the computer-readable program code is carried. Such a propagated data signal can take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. The computer-readable signal medium can also be any computer-readable medium other than the computer-readable storage medium, and this computer-readable medium can send, propagate, or transmit a program for use by or in combination with an instruction execution system, apparatus, or device.

[0063] Computer program code for performing the operations of the present invention may be written in one or more programming languages or combinations thereof. The programming languages include object-oriented programming languages such as Java, Smalltalk, C++, and also include conventional procedural programming languages such as the "C" language or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, executed as a stand-alone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., connected through the Internet using an Internet service provider).

[0064] Compared with the prior art, a method, device, electronic device, and readable storage medium for detecting the matching degree of device simulation parameters provided by the present invention have the following advantages: The method for detecting the matching degree of device simulation parameters provided by the present invention first extracts the device parameter definition information of all devices in each of the model files according to at least one target simulation software's model file, which not only realizes the automatic extraction of the parameter information of all devices in the model files of multiple target simulation software, but also lays a good foundation for detecting whether the device parameters in the parameterized unit library match the corresponding target simulation software; then generates the circuit schematic diagrams of all devices in the parameterized unit library according to the library files of the parameterized unit library, generates a pre-simulation netlist corresponding to the target simulation software according to the circuit schematic diagrams, and extracts the device simulation parameter information of all the devices in the parameterized unit library from the pre-simulation netlist, realizing the automatic extraction of the parameter information of all devices in the parameterized unit library and laying a good foundation for improving the detection efficiency of detecting the matching degree of device parameters in the parameterized unit library; finally, for each of the target simulation software, according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, the detection result of the parameterized unit library corresponding to the target simulation software is obtained, thereby realizing the automatic detection of the matching degree of device simulation parameters. Thus, it can be seen that the present invention can not only significantly improve the detection efficiency, but also improve the accuracy of the device simulation parameters in the parameterized unit library, and further improve the timeliness of circuit design.

[0065] It should be noted that the devices and methods disclosed in the embodiments of this article can also be implemented in other ways. The device embodiments described above are merely illustrative. For example, the flowcharts and block diagrams in the accompanying drawings show the possible architectures, functions, and operations of devices, methods, and computer program products according to multiple embodiments of this article. In this regard, each block in the flowchart or block diagram can represent a module, program, or part of code that contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than that marked in the accompanying drawings. For example, two consecutive blocks can actually be executed substantially in parallel, and they can sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, as well as combinations of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system for performing the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

[0066] In addition, the functional modules in each of the embodiments of this article can be integrated together to form an independent part, or each module can exist separately, or two or more modules can be integrated to form an independent part.

[0067] The above description is only a description of the preferred embodiments of the device simulation parameter matching degree detection method, device, electronic device, and readable storage medium provided by the present invention, and does not limit the scope of the present invention in any way. Any changes and modifications made by those of ordinary skill in the field of the present invention based on the above disclosure belong to the protection scope of the present invention. Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations fall within the scope of the present invention and its equivalent technologies, the present invention is also intended to include these modifications and variations.

Claims

1. A method for detecting the matching degree of device simulation parameters, characterized in that, To detect the simulation parameters of devices in a parameterized cell library, the detection method includes: Receiving model files of at least one target simulation software, and extracting the device parameter definition information of all devices in each of the model files; Generating circuit schematics of all devices in the parameterized cell library according to the library files of the parameterized cell library; Generating a pre-simulation netlist corresponding to the target simulation software according to the circuit schematics; Extracting the device simulation parameter information of all devices in the parameterized cell library from the pre-simulation netlist; For each of the target simulation software, obtaining the detection result of the parameterized cell library corresponding to the target simulation software according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library.

2. The method for detecting the matching degree of device simulation parameters according to claim 1, characterized in that For each of the target simulation software, after obtaining the detection result of the parameterized cell library corresponding to the target simulation software, the detection method further includes: Judging whether there are devices in the detection result whose device parameter simulation information is inconsistent with the device parameter definition information of the target simulation software; If so, modifying the device simulation parameters of all inconsistent devices in the parameterized cell library, and returning to execute the relevant steps from generating the pre-simulation netlist until judging whether there are devices whose device parameter simulation information is inconsistent with the device parameter definition information until the device parameter simulation information in the parameterized cell library is consistent with the device parameter definition information of the target simulation software, and completing the detection of the matching degree of device simulation parameters.

3. The device simulation parameter matching degree detection method according to claim 1, characterized in that The device parameter definition information includes the device name, device parameters, the name of the target simulation software, and the line number of the device in the model file of the target simulation software; The device simulation parameter information includes the device name and device parameters of the device in the parameterized cell library; For each of the target simulation software: After extracting the device parameter definition information of all devices in the model file of the target simulation software, the detection method further includes: storing the device parameter definition information in a first storage area; After extracting the device simulation parameter information of all devices in the parameterized cell library, the detection method further includes: storing the device simulation parameter information in a second storage area.

4. The method for detecting the matching degree of device simulation parameters according to claim 3, characterized in that For each of the target simulation software, obtaining the detection result of the parameterized cell library corresponding to the target simulation software according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library includes: For each of the target simulation software, detecting whether the device name, device type, and device parameters of the device simulation parameter information in the second storage area are consistent with the device parameter definition information in the first storage area to obtain the detection result of the parameterized cell library corresponding to the target simulation software.

5. The method for detecting the matching degree of device simulation parameters according to claim 1, characterized in that The detection results include: the device name of the device, the line number of the device in the model file of the corresponding target simulation software, and the parameter comparison result; the parameter comparison result includes passing the detection and failing the detection, and the parameter sets of all devices that fail the detection.

6. The method for detecting the matching degree of device simulation parameters according to claim 5, characterized in that, The detection method further includes: Classifying and outputting the detection results according to passing the detection and failing the detection.

7. The method for detecting the matching degree of device simulation parameters according to any one of claims 1 to 6, characterized in that, The target simulation software includes Hspice and Spectre.

8. A device simulation parameter matching degree detection device, characterized in that For detecting the simulation parameters of devices in a parameterized cell library, the detection device includes: An interaction module, configured to obtain the library file of the parameterized cell library, the model files of at least one target simulation software, and the storage path of the detection results; An execution module, configured to implement the device simulation parameter matching degree detection method according to any one of claims 1 to 7 based on the library file and the model file, and store the detection results in the storage path of the detection results.

9. An electronic device, characterized in that, It includes a processor and a memory, and a computer program is stored on the memory. When the computer program is executed by the processor, the device simulation parameter matching degree detection method according to any one of claims 1 to 7 is implemented.

10. A readable storage medium, characterized in that, A computer program is stored in the readable storage medium. When the computer program is executed by a processor, the device simulation parameter matching degree detection method according to any one of claims 1 to 7 is implemented.

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